Agilent Technologies Advancements in Noise Measurement by Ken Wong, 08-2008.

Advancements in Noise Measurement
by Ken Wong, Senior Member IEEE R&D Principal Engineer Component Test Division Agilent Technologies, Inc.
IEEE IMS SCV Chapter Mtg

Page 1
May 21, 2008
Reproduced with Permission, Courtesy of Agilent Technologies, Inc. by Bob Laughlin.
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Objectives
Noise Figure Measurements
Y-Factor Cold source Noise Parameters Noise Wave Correcting for Source Impedance Mismatch Correcting for Receiver Mismatch and Noise
VNA Noise Figure Measurements

Setup (S) Setting Input (Fwd) and Output (Rev) Powers Choosing Noise Bandwidth Setting Noise Averaging Factor Choosing the Receiver Gain Setting

By Ken Wong Page 2
IEEE IMS SCV Chapter Mtg May 21, 2008
Aerospace EuMw 2007 Agilent Workshop Objectives (cont) and Defense Symposium 2007
Calibration
Noise Source Calibration (S) S-parameter Calibration (S) Noise Tuner Calibration (S)
Verification
Mismatch Line Amp Characteristics Combined S11 Combined Gain Combined Noise Figure

By Ken Wong Page 3
Aerospace EuMw 2007Days Workshop The Early Agilent and Defense Symposium 2007

By Ken Wong Page 4
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Agilents Noise Figure Legacy
340A 1958
8970 1980
8560/90 with NF 1995
85120 1999
SA with NF 2002
NFA 2000

By Ken Wong Page 5
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Definition
DEVICE
Sin Nin
Ga
Sout Nout
Sout = Ga * Sin ; N out = Ga * N in T =T + N add 0 T =T0 ( S / N )in N out N add F (noise factor) = = = 1+ Ga N in ( S / N )out Ga * N in
Ga Available Gain, NF (Noise Figure) 10*log10(F) dB
D. Vondran, Noise Figure Measurement: Corrections Related to Match and Gain, Microwave J., pp 22-38, Mar. 1999 Collantes, J. M., R. D. Pollard, et al. (2002). "Effects of DUT mismatch on the noise figure characterization: a comparative analysis of two Y-factor techniques." Instrumentation and Measurement, IEEE Transactions on 51(6): 1150-1156.
By Ken Wong Page 6
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Definition in Terms of Noise Temperature
DEVICE
T0
Te, Ga
Nout
N in = k * T0 B ; N add = Ga * k * Te * B
T0 290 K ; B bandwidth k Boltzmann's constant = 1.380 650510-23 joule/kelvin Te effective input noise temperature of device
N out Te = 1+ F= Ga * N in T0

By Ken Wong Page 7
Aerospace and Defense EuMw 2007 Agilent Workshop Noise Figure2007 Effective Temperature Versus Symposium
1000.00
100.00
Te (K)
10.00
1.00 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
NF (dB)
By Ken Wong Page 8
Aerospace and Defense Symposium EuMw 2007 Agilent Workshop Parameters 2007 Definition In Terms Of Noise
is
Ys
Noisy two-port
is
Ys
en
in
Noiseless two-port
F = Fmin
Rn + Ys Yopt Gs
= Fmin
opt s 4 Rn + Z0 1 + 2 1 opt s
)
IRE Subcommittee 7.9 On Noise: Representation Of Noise In Linear Two-ports, Proc. IRE, Vol. 48, Pp. 69-74, Jan. 1960
By Ken Wong Page 9
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Definition (cont) Noise parameters Workshop
opt s 2 4 Rn Ys Yopt = Fmin + Z0 1 + 2 1 opt s
2
Rn F = Fmin + Gs
Fmin minimum noise factor Rn noise resistance

Yopt optimum input admittance Ys = source admittance Gs = real part of Ys opt optimum input noise match Z0 = reference impedance s = source match

By Ken Wong Page 10
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Ratio Noise Source ENR Excess
346C 10 MHz 26.5 GHz Noise source
Th Tc ENR 10 log10 T0
Th = Hot Noise Temperature Tc = Cold Noise Temperature T0 = 290 K Tc = T0 when noise sources are calibrated by reference labs.
By Ken Wong Page 11
Aerospace and Defense Symposium 2007 EuMw 2007Method Workshop Y factor Agilent
DEVICE
Thot Tcold
Te, Ga
Pout
Pout,hot=kBGa(Thot + Te)
Y= Pout ,hot Pout ,cold
Pout,cold=kBGa(Tcold + Te)
Te = Thot YTcold Y 1
N out Te Thot Y * Tcold = 1+ = 1+ F = G a * N in T0 ( Y 1 ) * T0

Assumes ALL Reflections are the same.
Fundamentals of RF and Microwave Noise Figure Measurements, Hewlett-Packard Application Note 57-1, Palo Alto, CA July 1983
By Ken Wong Page 12
Aerospace and Defense Symposium EuMw 2007 Agilent Workshop Calibration 2007 Actual Y factor Measurement
RECEIVER
Receiver Calibration
Thot Tcold
s(hot) s(cold) i(rec)
Te(R) Ga(R)
Nout(R)
Pout
F( R )
N out ( R ) Ga ( R ) * N in
= 1+
Te ( R ) T0
Thot Y * Tcold = 1+ (Y 1) * T0
Assumes s(hot) = s(cold)

By Ken Wong Page 13
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Actual Y factor Measurement
DEVICE RECEIVER
Thot Tcold
s(hot) s(cold)
Te(D) Ga(D)
i(device)
Nout(D)
Te(R) Ga(R)
Nout(all)
Pout
o(device) i(rec)
F( all )
F( device )
Thot Y * Tcold = 1+ (Y 1) * T0
= F( all ) F( R )
o ( device )
Ga ( D )
s
Note that
By Ken Wong Page 14
F( R )
o ( device )
F( R )
Aerospace and Defense Symposium EuMw 2007 Agilent Workshop Assumptions 2007 Some Y factor Measurement
s ( hot ) = s ( cold )
F( R )
o ( device )
= F( R )
Ga ( device ) =
Notes:
N hot ( all ) N cold ( all ) N hot ( R ) N cold ( R )
True only if S11 and S22 are <<1
Ga (available gain) is a function of S11, S22 and s s source reflection of the incident signal

By Ken Wong Page 15
Aerospace and Defense Symposium EuMw Examples OfWorkshop Measurements 2007 Four 2007 Agilent Y-Factor
What you want for good NF accuracy!
Noise source
On-wafer environment
Noise source
1 3
2 4 On-wafer multi-instrument (ATE) environment
Noise source
Automated multi-instrument (ATE) environment

By Ken Wong Page 16
Noise source
Aerospace and Defense EuMwNoise Agilent Workshop 2007 Source Technique Symposium 2007 Cold
Ga
PN
FDut
Pn = 1+ kT0 BG a
Need to know gain very accurately Ga is a function of of S11, S22 and s

By Ken Wong Page 17
Aerospace and Defense Symposium 2007 EuMwNoise Agilent Workshop 2007 Figure Cal and Measurement Cold
kGB = k Gain Bandwidth
Calibrate
PN
T ~ 10,000K
Fr =
kGB =
Phot Pcold Thot Tcold
T = T cal
Thot T0 1 T0 Pnhot 1 Pncold
Measure
T = T meas
s
DUT
i(device) o(device) i(rec)
PN
1 Ga P n Fr + 1 kGB
FDut =

By Ken Wong Page 18
Aerospace EuMw 2007 Agilent Workshop Noise Parameters and Defense Symposium 2007
is
Ys
en
in
Noiseless two-port
opt s 4Rn F = Fmin + 2 Z o 1 + opt 1 s 2
Noise figure varies as a Noise figure varies as a function of source impedance function of source impedance
)
Four noise parameters: Fmin, Rn, opt (mag), opt (phase)

By Ken Wong Page 19
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Definition Noise parameters Workshop
Rn F = Fmin + Gs
opt s 2 4 Rn Ys Yopt = Fmin + Z0 1 + 2 1 opt s
Fmin minimum noise factor Rn noise resistance

Yopt optimum input admittance Ys = source admittance Gs = real part of Ys opt optimum input noise match Z0 = reference impedance s = source match

By Ken Wong Page 20
Aerospace Definition and Defense EuMw 2007 Agilent Workshop Symposium 2007 Noise parameters
Noise Temperature
Tn = Tmin +
( RnT0 ) Ys Yopt
Gs
opt s 4T0 Rn = Tmin + Z0 1 + 2 1 opt s
Tmin minimum noise Temperature Rn noise resistance T0 290K

Yopt optimum input admittance Ys = source admittance Gs = real part of Ys
By Ken Wong Page 21
opt optimum input noise match Z0 = reference impedance s = source match

Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Parameters
Fmin at opt Plots of noise figure circles versus impedance (at one frequency) Fmin is lowest noise figure and occurs at opt F changes with F changes with device bias
Increasing noise figure
Increasing noise figure

By Ken Wong Page 22
Aerospace and Defense EuMw 2007 Agilent parameters Symposium 2007 Measuring Noise Workshop
VNA
TUNER
DUT
Noise source
NFM
A. C. Davidson, B. W. Leake, et al. (1989). "Accuracy improvements in microwave noise parameter measurements." Microwave Theory and Techniques, IEEE Transactions on 37(12): 1973-1978.

By Ken Wong Page 23
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop S-parameters Noise wave representation
bn2
a1 b1
bn1
[S]
b2 a2
b1 s11 = b2 s 21
s12 a1 bn1 + s 22 a 2 bn 2
b 2 b b* cs12 cs n1 n1 n 2 = 11 Cs = b b* b 2 cs21 cs22 n2 n 2 n1
P. Penfield, Jr "Wave Representation of Amplifier Noise." IRE Transactions On Circuit Theory: Mach (1962) pp. 84-86 K. Hartmann, Noise Characterization of Linear Circuits, IEEE Transactions on Circuits and Systems, Vol. cAS-23, No. 10, Oct. 1976, pp. 581-590 R.P. Meys, A Wave Approach to the Noise Properties of Linar Microwave Devices, IEEE Transactions on Microwave Theory and Techniques, Vol. MTT-26, No. 1, Jan. 1978, pp 34-37 S. W. Wedg ,and D. B. Rutledge (1992). "Wave techniques for noise modeling and measurement." Microwave Theory and Techniques, IEEE Transactions on 40(11): 2004-2012.

By Ken Wong Page 24
Aerospace and Defense Symposium EuMw 2007 Agilent Workshop correlation 2007 Measurement using (S) noise matrix
Noise output power from two-port is
Pout = kBGav (Te + T0 )

1 2 T + 2 X + kB s21 s s s 1 Pout = 2 1 S 1 S 2 X + 2 Re 1 S * X s 11 ( s 11 ) s 21 s 11 2
2
X 1 = bn1 = cs11 ,
2
X2 =
bn 2 S 21
2 2
cs22 S 21
2
* bn1bn 2 cs12 X 12 = * = * S 21 S 21
J. Randa, W. Wiatr, Conte Carlo Estimation of Noise Parameter Uncertainties, IEE Proc. Sci. Meas. Technology, Vol. 149, No. 6, Nov. 2002, pp. 333-337

By Ken Wong Page 25
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise correlation matrix (CS) in terms of noise parameters
2 1 s11 opt 4 Rn opt (1 s11 opt ) F 1 s 2 1 + 4 Rn s21 ( Fmin 1) s11 2 2 ( min ) 11 Z0 1 + Z 0 1 + opt opt Cs = 2 4 Rn opt (1 s11 opt ) 4 Rn opt 2 s21 ( Fmin 1) s11 s21 Fmin 1 2 2 Z 0 1 + opt Z 0 1 + opt

By Ken Wong Page 26
Aerospace and Defense Symposium 2007 EuMw NoiseAgilent Workshop 2007 Measurement System New
Noise Receiver Inside
Noise Tuner
DUT
Noise Source
By Ken Wong Page 27
ADAPTER
Aerospace and EuMw as Noise Tuner Defense Symposium 2007 2007 Agilent Workshop ECal
PNA-X varies source match around 50 ohms using an ECal module ECal can provide 7 impedance states
(Z1, F1), (Z2, F2),

By Ken Wong Page 28
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Figure in PNA contributions
Speed and accuracy
Single Connection S-parameters and Noise Figure Fast Step Frequency Sweep Complete Mismatch Correction
Use of ECal or Compatible Impedance Tuner Embedding and De-embedding of Probes in OnWafer Noise Measurements Can Accommodate Coax Noise Source for On-Wafer Noise Measurements

By Ken Wong Page 29
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Calibration of the receiver
1 2 T + 2 X + kB S s s s 1 21 Pout = 2 2 * 1 s S11 1 S X + 2 Re (1 S ) X s 11 s 11 s 2 21
2
i
5 unknowns, linear equation

Note: The PNA-X uses a different form of the above equation.

By Ken Wong Page 30
Aerospace and Calibration of receiver Defense Symposium 2007 EuMw 2007 Agilent Workshop - solution of equations
Require Minimum Of 5 Equations To Solve Can Be Over-determined At Least One Measurement Must Be Made With Different Source Temperature Use Noise Source (Known ENR, Measure Cold, Hot) ECal Module Provides 7 Terminations

By Ken Wong Page 31
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Figure Mode Instrument Default Settings
S-parameter Mode Source Power Noise RF BW Noise IF BW 4 MHz 2 MHz Point to Point (1 = 10K) 30 dB ON -30 dBm
Noise Averaging
Noise Receiver Gain Factory Receiver Cal

By Ken Wong Page 32
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Figure Measurement Instrument Setup

By Ken Wong Page 33
Aerospace and Defense EuMw 2007 Agilent Workshop Noise Measurement Softkeys Symposium 2007

By Ken Wong Page 34
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Set Up

By Ken Wong Page 35
Aerospace and Defense Symposium 2007 EuMw 2007 Up Noise Set Agilent Workshop

By Ken Wong Page 36
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Calibration Noise Figure Measurement

By Ken Wong Page 37
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Cal

By Ken Wong Page 38
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop S-parameters and Noise Calibrations
Noise Tuner
This step provides 2 of the five measurements required.
ADAPTER
Noise Source
Ph, Pc, h, c

By Ken Wong Page 39
Noise Tuner
This step provides the rest of measurements required to calibrate the noise receiver.
By Ken Wong Page 40
ADAPTER
nr
Pnt(i), nt(i)
S-parameter calibration completes the calibration sequence.
Noise Tuner

By Ken Wong Page 41
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Measurement of DUT
Known from Measured S-parameters
1 2 T + 2 X + kB S s s s 1 21 Pout = 2 2 * 1 s S11 1 S X + 2 Re (1 S ) X s 11 s 11 s 2 21
2
4 unknowns, linear equation

By Ken Wong Page 42
Aerospace EuMwS-parameters and Defense Symposium 2007 2007 Agilent Workshop Measurement DUT and Noise
Noise Tuner
DUT
Meas S-parameters Pout(i) @ each nt(i)

By Ken Wong Page 43
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop With On-Wafer Noise Measurement System Probes
Noise Tuner
FULL 2-port Cal
4
1-port Cal
Noise Source
By Ken Wong Page 44
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop 60 m FET
Data sets offset by 1dB
N8975 Y-factor cold corrected
F (1 dB per division) 0
10
15
20
25
Frequency (GHz)

By Ken Wong Page 45
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Measurements Compared
10 20 18 8 16 14 Gain (dB) NF (dB) 6 12 10 4 NFA PNA/NF 0 1 2 3 4 5 6 Frequency (GHz)
By Ken Wong Page 46
8 6
4 2 0
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Figure Uncertainty Example (ATE Setup)
4.500
Amplifier:
Gain = 15 dB Input/output match = 10 dB NF = 3 dB Gamma opt = 0.268 0o Fmin = 1.87 dB Rn = 12 33
4.000
Y-factor with noise source connected to DUT via switch matrix
0.75 dB
3.500 NF (dB)
0.5 dB
Y-factor with noise source directly at DUT input
3.000
PNA-X
0.2 dB
2.500
2.000 0.5 2.5 4.5 6.5 8.5 10.5 12.5 GHz 14.5 16.5 18.5 20.5 22.5 24.5 26.5

By Ken Wong Page 47
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Figure Uncertainty Example (Wafer Setup)
Amplifier:
4.500
1.1 dB
4.000
Gain = 15 dB Input/output match = 10 dB NF = 3 dB Gamma opt = 0.268 0o Fmin = 1.87 dB Rn = 12 33
Y-factor with noise source Y-factor with noise source connected connected to DUT via switch matrix to probe via switch matrix
3.500 NF (dB)
Y-factor with noise source connected to DUT input Y-factor with noise source 0.75 dB connected to probe input PNA-X PNA-X
0.3 dB
3.000
Amplifier:
2.500
Gain = 15 dB Input/output match = 10 dB NF = 3 dB Gamma opt = 0.268 0o Fmin = 1.87 dB Rn = 12 33 Wave model correlation = 50%
2.000 0.5 2.5 4.5 6.5 8.5 10.5 12.5 GHz 14.5 16.5 18.5 20.5 22.5 24.5 26.5

By Ken Wong Page 48
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Verification approach
Need To Avoid Using An Active Device
Cannot Guarantee Behavior Over Time Dependence On Temperature Noise May Be Injected Through Bias Supply
Use Mismatched Transmission Line, Passive Device

Noise Parameters, Noise Figure Are Calculated From Sparameters Can Cascade With Any Amplifier And De-embed

By Ken Wong Page 49
Aerospace and Defense Symposium 2007 EuMw 2007Transmission Line Characteristics Mismatch Agilent Workshop

By Ken Wong Page 50
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise wave representations
50 25 50
AMP
[TL], [CL]
anL a1L b1L bnL
[TA], [CA]
anA b2L a1A a2L b1A bnA
[TL]
a 2 nL CtL = b a* nL nL
[TA]
* anAbnA 2 bnA
b2A a2A
* a 2 anLbnL ; C = nA tA 2 b a* bnL nA nA

By Ken Wong Page 51
Aerospace and Defense Symposium 2007 EuMw 2007 S-parameters of Amplifier Measured Agilent Workshop

By Ken Wong Page 52
Aerospace and Defense Symposium EuMw 2007 Agilent Workshop Calculated vs. Measured Combined |S11| 2007

By Ken Wong Page 53
Aerospace and Defense Symposium EuMw 2007 Agilent Workshop Calculated vs. Measured Combined Gain 2007

By Ken Wong Page 54
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Calculated vs. Measured Combined Noise Figure
Uncertainty Bar k=2

By Ken Wong Page 55
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Additional References:
[1] D. Vondran, Noise Figure Measurement: Corrections Related to Match and Gain, Microwave J., pp 22-38, Mar. 1999 [2] Collantes, J. M., R. D. Pollard, et al. (2002). "Effects of DUT mismatch on the noise figure characterization: a comparative analysis of two Y-factor techniques." Instrumentation and Measurement, IEEE Transactions on 51(6): 1150-1156. [3] Fundamentals of RF and Microwave Noise Figure Measurements, Hewlett-Packard Application Note 571, Palo Alto, CA July 1983 [4] IRE Subcommittee 7.9 On Noise: Representation Of Noise In Linear Two-ports, Proc. IRE, Vol. 48, Pp. 69-74, Jan. 1960 [4] A. C. Davidson, B. W. Leake, et al. (1989). "Accuracy improvements in microwave noise parameter measurements." Microwave Theory and Techniques, IEEE Transactions on 37(12): 1973-1978. [5] R.Q. Lane, The Determination of Device Noise Parameters, Proceedings of the IEEE, Aug. 1969, pp. 1461-1462 [6] P. Penfield, Jr "Wave Representation of Amplifier Noise." IRE Transactions On Circuit Theory: Mach (1962) pp. 84-86 [7] K. Hartmann, Noise Characterization of Linear Circuits, IEEE Transactions on Circuits and Systems, Vol. cAS-23, No. 10, Oct. 1976, pp. 581-590 [8] R.P. Meys, A Wave Approach to the Noise Properties of Linar Microwave Devices, IEEE Transactions on Microwave Theory and Techniques, Vol. MTT-26, No. 1, Jan. 1978, pp 34-37 [9] S. W. Wedg ,and D. B. Rutledge (1992). "Wave techniques for noise modeling and measurement." Microwave Theory and Techniques, IEEE Transactions on 40(11): 2004-2012. [10] J. Randa, W. Wiatr, Conte Carlo Estimation of Noise Parameter Uncertainties, IEE Proc. Sci. Meas. Technology, Vol. 149, No. 6, Nov. 2002, pp. 333-337 [11] E.C. Valk, D. Routledge, J.F. Vaneldik, T.L. Landecker, De-Embedding Two-Port Noise Parameters Using a Noise Wave Model, IEEE Transactions on Instrumentation and Measurement, vol. 37, no. 2, June 1988, pp 195-200
By Ken Wong Page 56
Aerospace and Defense EuMw 2007 Agilent Workshop Noise Option Block Diagram Symposium 2007
Source 1
OUT 1 OUT 2 OUT 1
Source 2
OUT 2
24V DC
Rear panel Noise receivers
R1 A
35 dB 65 dB 65 dB
10 MHz 3 GHz
3 - 26.5 GHz
R2 B
35 dB
Test port 1
Source 2 Output 1
DU T
Source 2 Output 2
Test port 2
Noise Source
By Ken Wong Page 57

Agilent Technologies Advancements in Noise Measurement by Ken Wong, 08-2008.

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Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg

May 21, 2008

Reproduced with Permission, Courtesy of Agilent Technologies, Inc. by Bob Laughlin.

VNA Noise Figure Measurements

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

8560/90 with NF 1995

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

IEEE IMS SCV Chapter Mtg May 21, 2008

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

IEEE IMS SCV Chapter Mtg May 21, 2008

Fmin minimum noise factor Rn noise resistance

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

346C 10 MHz 26.5 GHz Noise source

IEEE IMS SCV Chapter Mtg May 21, 2008

N out Te Thot Y * Tcold = 1+ = 1+ F = G a * N in T0 ( Y 1 ) * T0

IEEE IMS SCV Chapter Mtg May 21, 2008

Assumes s(hot) = s(cold)

IEEE IMS SCV Chapter Mtg May 21, 2008

N hot ( all ) N cold ( all ) N hot ( R ) N cold ( R )

True only if S11 and S22 are <<1

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

2 4 On-wafer multi-instrument (ATE) environment

Automated multi-instrument (ATE) environment

IEEE IMS SCV Chapter Mtg May 21, 2008

Need to know gain very accurately Ga is a function of of S11, S22 and s

IEEE IMS SCV Chapter Mtg May 21, 2008

Phot Pcold Thot Tcold

Thot T0 1 T0 Pnhot 1 Pncold

Advancements in Noise Measurement

opt s 4Rn F = Fmin + 2 Z o 1 + opt 1 s 2

Four noise parameters: Fmin, Rn, opt (mag), opt (phase)

opt s 2 4 Rn Ys Yopt = Fmin + Z0 1 + 2 1 opt s

Fmin minimum noise factor Rn noise resistance

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

opt s 4T0 Rn = Tmin + Z0 1 + 2 1 opt s

Tmin minimum noise Temperature Rn noise resistance T0 290K

opt optimum input noise match Z0 = reference impedance s = source match

Increasing noise figure

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

b 2 b b* cs12 cs n1 n1 n 2 = 11 Cs = b b* b 2 cs21 cs22 n2 n 2 n1

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

Pout = kBGav (Te + T0 )

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

Advancements in Noise Measurement

IEEE IMS SCV Chapter Mtg May 21, 2008

Noise Receiver Inside

(Z1, F1), (Z2, F2),