U.S. patent 7444571: Apparatus and method for testing and debugging an integrated circuit. Granted to Azimi et. al. on 2008-10-28 (filed None). Currently involved in at least 1 patent litigation: Marvell Semiconductor, Inc. et. al. v. Freescale Semiconductor, Inc. (Texas). See http://news.priorsmart.com for more info.
Original Title
Apparatus and method for testing and debugging an integrated circuit (US patent 7444571)
U.S. patent 7444571: Apparatus and method for testing and debugging an integrated circuit. Granted to Azimi et. al. on 2008-10-28 (filed None). Currently involved in at least 1 patent litigation: Marvell Semiconductor, Inc. et. al. v. Freescale Semiconductor, Inc. (Texas). See http://news.priorsmart.com for more info.
U.S. patent 7444571: Apparatus and method for testing and debugging an integrated circuit. Granted to Azimi et. al. on 2008-10-28 (filed None). Currently involved in at least 1 patent litigation: Marvell Semiconductor, Inc. et. al. v. Freescale Semiconductor, Inc. (Texas). See http://news.priorsmart.com for more info.