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International Standards of the International Electrotechnical Commission (IEC)
International Standards of the International Electrotechnical Commission (IEC)

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Sampling plans and proceduresfor inspection by attributes
Reference number IEC 60410:1973(E)
INTERNATIONALSTANDARD
IEC60410
 
First edition1973 
This
English-language
version is derived from the original 
bilingual 
publication by leaving out all French-language pages. Missing page numbers correspond to the French-language pages.
 
 
Sampling plans and proceduresfor inspection by attributes
For price, see current catalogue
IEC 1973 Copyright - all rights reserved
 
No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical,including photocopying and microfilm, without permission in writing from the publisher.International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
INTERNATIONALSTANDARD
IEC60410
 
First edition1973 
X
 
Commission Electrotechnique InternationaleInternational Electrotechnical Commission
Международная Электротехническая Комиссия
PRICE CODE
 
3
CONTENTS
Page
FOREWORD
PREFACE
Clause
1.
Scope
2.
Classification of defects and defectives
1
3.
Percent defective and defects per hundred units
1
4.
Acceptable quality level (AQL)
3
5.
Submission of product
5
6.
Acceptance and rejection
5
7.
Drawing of samples
7
8.
Normal, tightened and reduced inspection
7
9.
Sampling plans
9
10.
Determination of acceptability
1
11.
Supplementary information
3
APPENDIX
A — Index of terms with special meanings
7
Tables
I
ample size code letters
9
II-A
ingle sampling plans for normal inspection (master table)
0
II-B
ingle sampling plans for tightened inspection (master table)
1
II-C
ingle sampling plans for reduced inspection (master table)
2
III-A Double sampling plans for normal inspection (master table)
3
III
-B
 
ouble sampling plans for tightened inspection (master table)
4
III-C Double sampling plans for reduced inspection (master table)
5
IV-A Multiple sampling plans for normal inspection (master table)
6-37
IV-B Multiple sampling plans for tightened inspection (master table)
38-39
IV-C Multiple sampling plans for reduced inspection (master table)
40-41
V-A
verage outgoing quality limit factors for normal inspection (single sampling)
2V-B
verage outgoing quality limit factors for tightened inspection (single sampling)
3
VI-A Limiting quality (in per cent defective) for which P. = 10% (for normal inspection,
single sampling)
4
VI-B Limiting quality (in defects per hundred units) for which P
a
= 10% (for normal
inspection, single sampling)
5

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