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info_iec60747-14-1{ed2.0}b

info_iec60747-14-1{ed2.0}b

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International Standards of the International Electrotechnical Commission (IEC)
International Standards of the International Electrotechnical Commission (IEC)

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Published by: StanVarembe on Feb 26, 2013
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IEC 60747-14-1
Edition 2.0
 
2010-01
INTERNATIONALSTANDARDNORMEINTERNATIONALE
Semiconductor devices –Part 14-1: Semiconductor sensors – Generic specification for sensorsDispositifs à semiconducteurs –Partie 14-1: Capteurs à semiconducteurs – Spécification générique pour lescapteurs
INTERNATIONALELECTROTECHNICALCOMMISSIONCOMMISSIONELECTROTECHNIQUEINTERNATIONALE
S
ICS 31.080.01PRICE CODECODE PRIXISBN 978-2-88910-276-1
 
® Registered trademark of the International Electrotechnical CommissionMarque déposée de la Commission Electrotechnique Internationale
®
 
2 60747-14-1
©
IEC:2010
CONTENTS
FOREWORD...........................................................................................................................3
 
1
 
Scope...............................................................................................................................5
 
2
 
Normative references.......................................................................................................5
 
3
 
Terminology, units, letter symbols, terms and definitions..................................................6
 
3.1
 
Terminology, units and letter symbols......................................................................6
 
3.2
 
Terms and definitions..............................................................................................8
 
4
 
Standard environmental conditions.................................................................................12
 
5
 
Marking..........................................................................................................................12
 
6
 
Quality assessment procedures......................................................................................12
 
6.1
 
General.................................................................................................................12
 
6.2
 
Eligibility...............................................................................................................12
 
6.3
 
Qualification approval procedure...........................................................................13
 
7
 
Test and measurement procedures.................................................................................18
 
7.1
 
Standard conditions and general precautions........................................................18
 
7.2
 
Physical examination.............................................................................................18
 
7.3
 
Climatic and mechanical tests...............................................................................19
 
7.4
 
 Alternative test methods........................................................................................19
 
 Annex A (normative) Sampling procedures..........................................................................20
 
Bibliography..........................................................................................................................21
 
Figure 1 – Output-measurand relationship of a linear-output sensor with an offset..................9
 
Figure 2 – Hysteresis and repeatability.................................................................................11
 
Table 1 Measurands............................................................................................................6
 
 
60747-14-1
©
IEC:2010 3
INTERNATIONAL ELECTROTECHNICAL COMMISSION ____________ 
SEMICONDUCTOR DEVICES –Part 14-1: Semiconductor sensors –Generic specification for sensors
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprisingall national electrotechnical committees (IEC National Committees). The object of IEC is to promoteinternational co-operation on all questions concerning standardization in the electrical and electronic fields. Tothis end and in addition to other activities, IEC publishes International Standards, Technical Specifications,Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IECPublication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interestedin the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closelywith the International Organization for Standardization (ISO) in accordance with conditions determined byagreement between the two organizations.2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an internationalconsensus of opinion on the relevant subjects since each technical committee has representation from allinterested IEC National Committees.3) IEC Publications have the form of recommendations for international use and are accepted by IEC NationalCommittees in that sense. While all reasonable efforts are made to ensure that the technical content of IECPublications is accurate, IEC cannot be held responsible for the way in which they are used or for anymisinterpretation by any end user.4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publicationstransparently to the maximum extent possible in their national and regional publications. Any divergencebetween any IEC Publication and the corresponding national or regional publication shall be clearly indicated inthe latter.5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformityassessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for anyservices carried out by independent certification bodies.6) All users should ensure that they have the latest edition of this publication.7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts andmembers of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) andexpenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IECPublications.8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications isindispensable for the correct application of this publication.9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60747-14-1 has been prepared by subcommittee 47E: Discretesemiconductor devices, of IEC technical committee 47: Semiconductor devices.This second edition cancels and replaces the first edition, published in 2000, and constitutesa technical revision.The major changes with regard to the previous edition are as follows:a) Title change from "Semiconductor sensors - General and classification" to "Semiconductor sensors - Generic specification for sensors";b) Clause 3 has been divided into three Clauses 3, 4 and 5;c) Added new terms from IEC 60747-14-5;d) Added a new Clause relating to Quality assessment procedures;e) Added a Bibliography;f) Added a new Annex for the sampling procedure.

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