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INTERNATIONALSTANDARD
IEC61788-7
 
Second edition2006-10 
Superconductivity –Part 7:Electronic characteristic measurements –Surface resistance of superconductors atmicrowave frequencies
 
©
IEC 2006
 ⎯ 
Copyright - all rights reserved
 
No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher.International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
 
V
 
For price, see current catalogue
PRICE CODE
Commission Electrotechnique InternationaleInternational Electrotechnical Commission
Международная Электротехническая Комиссия
 
2 61788-7
©
IEC:2006(E)
CONTENTS
FOREWORD...........................................................................................................................4
 
INTRODUCTION.....................................................................................................................6
 
1
 
Scope...............................................................................................................................7
 
2
 
Normative references.......................................................................................................7
 
3
 
Terms and definitions.......................................................................................................7
 
4
 
Requirements...................................................................................................................7
 
5
 
 Apparatus.........................................................................................................................8
 
5.1
 
Measurement system..............................................................................................8
 
5.2
 
Measurement apparatus for 
 R
s................................................................................9
 
5.3
 
Dielectric rods.......................................................................................................11
 
6
 
Measurement procedure.................................................................................................12
 
6.1
 
Specimen preparation...........................................................................................12
 
6.2
 
Set-up...................................................................................................................12
 
6.3
 
Measurement of reference level............................................................................12
 
6.4
 
Measurement of the frequency response of resonators..........................................13
 
6.5
 
Determination of surface resistance of the superconductor and
ε 
’ 
and tan
δ  
 of the standard sapphire rods................................................................................15
 
7
 
Precision and accuracy of the test method......................................................................16
 
7.1
 
Surface resistance................................................................................................16
 
7.2
 
Temperature..........................................................................................................17
 
7.3
 
Specimen and holder support structure.................................................................17
 
7.4
 
Specimen protection..............................................................................................18
 
8
 
Test report......................................................................................................................18
 
8.1
 
Identification of test specimen...............................................................................18
 
8.2
 
Report of 
 R
svalues...............................................................................................18
 
8.3
 
Report of test conditions........................................................................................18
 
 Annex A (informative) Additional information relating to Clauses 1 to 8................................19
 
Bibliography..........................................................................................................................32
 
Figure 1 – Schematic diagram of measurement system for temperature dependence of 
susing a cryocooler.............................................................................................................8
 
Figure 2 – Typical measurement apparatus for 
s................................................................10
 
Figure 3 – Insertion attenuation
IA
, resonant frequency
0
and half power bandwidth
Δ
,measured at T Kelvin............................................................................................................13
 
Figure 4 – Reflection scattering parameters (
S
11
and
S
22
)....................................................15
 
Figure 5 – Term definitions in Table 4...................................................................................17
 
Figure A.1 – Schematic configuration of several measurement methods for the surfaceresistance.............................................................................................................................20
 
Figure A.2 – Configuration of a cylindrical dielectric rod resonator short-circuited atboth ends by two parallel superconductor films deposited on dielectric substrates................22
 
Figure A.3 – Computed results of the
u-
and
W-
relations for TE
01
pmode.........................23
 
Figure A.4 – Configuration of standard dielectric rods for measurement of 
sand tan
δ  
.......24
 
 
61788-7
©
IEC:2006(E) 3 Figure A.5 – Three types of dielectric resonators..................................................................24
 
Figure A.6 – Mode chart to design TE
011
resonator short-circuited at both ends byparallel superconductor films [11].........................................................................................27
 
Figure A.7 – Mode chart to design TE
013
resonator short-circuited at both ends byparallel superconductor films [11].........................................................................................28
 
Figure A.8 – Mode chart for TE
011
closed-type resonator......................................................29
 
Figure A.9 – Mode chart for TE
013
closed-type resonator......................................................30
 
Table 1 – Typical dimensions of pairs of standard sapphire rods for 12 GHz, 18 GHzand 22 GHz..........................................................................................................................11
 
Table 2 – Dimensions of superconductor film for 12 GHz, 18 GHz, and 22 GHz....................12
 
Table 3 – Specifications on vector network analyzer.............................................................16
 
Table 4 – Specifications on sapphire rods.............................................................................16
 

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