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DATA SHEET
Philips Semiconductors
Product specication
C106D
QUICK REFERENCE DATA
SYMBOL VDRM VRRM IT(AV) IT(RMS) ITSM PARAMETER Repetitive peak off-state voltages Average on-state current RMS on-state current Non-repetitive peak on-state current MAX. 400 2.5 4 38 UNIT V A A A
PINNING - SOT32
PIN 1 2 3 DESCRIPTION cathode anode gate
PIN CONFIGURATION
SYMBOL
Top view
3
MBC077 - 1
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134). SYMBOL PARAMETER VDRM, VRRM Repetitive peak off-state voltages IT(AV) IT(RMS) ITSM Average on-state current RMS on-state current Non-repetitive peak on-state current half sine wave; Tmb 113 C all conduction angles half sine wave; Tj = 25 C prior to surge t = 10 ms t = 8.3 ms t = 10 ms ITM = 10 A; IG = 50 mA; dIG/dt = 50 mA/s CONDITIONS MIN. -40 MAX. 400
1
I2t for fusing Repetitive rate of rise of on-state current after triggering Peak gate current Peak gate voltage Peak reverse gate voltage Peak gate power Average gate power over any 20 ms period Storage temperature Operating junction temperature
1 Although not recommended, off-state voltages up to 800V may be applied without damage, but the thyristor may switch to the on-state. The rate of rise of current should not exceed 15 A/s. 2 Note: Operation above 110C may require the use of a gate to cathode resistor of 1k or less.
July 2001 2 Rev 1.000
Philips Semiconductors
Product specication
C106D
THERMAL RESISTANCES
SYMBOL PARAMETER Rth j-mb Rth j-a CONDITIONS MIN. TYP. MAX. 2.5 95 UNIT K/W K/W Thermal resistance junction to mounting base Thermal resistance in free air junction to ambient
STATIC CHARACTERISTICS
Tj = 25 C unless otherwise stated SYMBOL PARAMETER IGT IL IH VT VGT ID, IR Gate trigger current Latching current Holding current On-state voltage Gate trigger voltage Off-state leakage current CONDITIONS VD = 12 V; IT = 0.1 A VD = 12 V; IGT = 0.1 A VD = 12 V; IGT = 0.1 A IT = 5 A VD = 12 V; IT = 0.1 A VD = VDRM(max); IT = 0.1 A; Tj = 110 C VD = VDRM(max); VR = VRRM(max); Tj = 125 C MIN. 0.1 TYP. 15 0.17 0.10 1.23 0.4 0.2 0.1 MAX. 200 10 6 1.8 1.5 0.5 UNIT A mA mA V V V mA
DYNAMIC CHARACTERISTICS
Tj = 25 C unless otherwise stated SYMBOL PARAMETER dVD/dt tgt tq Critical rate of rise of off-state voltage Gate controlled turn-on time Circuit commutated turn-off time CONDITIONS VDM = 67% VDRM(max); Tj = 125 C; exponential waveform; RGK = 100 ITM = 10 A; VD = VDRM(max); IG = 5 mA; dIG/dt = 0.2 A/s VD = 67% VDRM(max); Tj = 125 C; ITM = 8 A; VR = 10 V; dITM/dt = 10 A/s; dVD/dt = 2 V/s; RGK = 1 k MIN. TYP. 50 2 100 MAX. UNIT V/s s s
July 2001
Rev 1.000
Philips Semiconductors
Product specication
C106D
6 5 4 3 2 1 0
Ptot / W
conduction angle degrees 30 60 90 120 180 form factor
Tmb(max) / C
ITSM / A
110 112.5
40
IT I TSM T time
a
4 2.8 2.2 1.9 1.57
30
Tj initial = 25 C max
20
10
122.5 125 3
0.5
1.5 IF(AV) / A
2.5
1000
Fig.1. Maximum on-state dissipation, Ptot, versus average on-state current, IT(AV), where a = form factor = IT(RMS)/ IT(AV).
1000 ITSM / A
Fig.4. Maximum permissible non-repetitive peak on-state current ITSM, versus number of cycles, for sinusoidal currents, f = 50 Hz.
12 10 8
IT(RMS) / A
6 4 2 0 0.01
IT
10
Fig.2. Maximum permissible non-repetitive peak on-state current ITSM, versus pulse width tp, for sinusoidal currents, tp 10ms.
Fig.5. Maximum permissible repetitive rms on-state current IT(RMS), versus surge duration, for sinusoidal currents, f = 50 Hz; Tmb 113C.
VGT(Tj) VGT(25 C)
IT(RMS) / A
BT148
1.6
113 C
1.4 1.2 1
0.8
1
0.6
0 50 Tmb / C 100 150
0 -50
0.4 -50
50 Tj / C
100
150
Fig.3. Maximum permissible rms current IT(RMS) , versus mounting base temperature Tmb.
Fig.6. Normalised gate trigger voltage VGT(Tj)/ VGT(25C), versus junction temperature Tj.
July 2001
Rev 1.000
Philips Semiconductors
Product specication
C106D
3 2.5
IGT(Tj) IGT(25 C)
12 10
IT / A Tj = 125 C Tj = 25 C
Vo = 1.26 V Rs = 0.099 ohms
typ
max
50 Tj / C
100
150
0.5
1.5 VT / V
2.5
Fig.7. Normalised gate trigger current IGT(Tj)/ IGT(25C), versus junction temperature Tj.
IL(Tj) IL(25 C)
10
3 2.5
50 Tj / C
100
150
10s
Fig.8. Normalised latching current IL(Tj)/ IL(25C), versus junction temperature Tj.
IH(Tj) IH(25 C)
Fig.11. Transient thermal impedance Zth j-mb, versus pulse width tp.
dVD/dt (V/us)
1000
100
10
0 -50
50 Tj / C
100
150
50 Tj / C
100
150
Fig.9. Normalised holding current IH(Tj)/ IH(25C), versus junction temperature Tj.
Fig.12. Typical, critical rate of rise of off-state voltage, dVD/dt versus junction temperature Tj.
July 2001
Rev 1.000
Philips Semiconductors
Product specication
C106D
MECHANICAL DATA
Dimensions in mm Net Mass: 0.8 g
Plastic single-ended leaded (through hole) package; mountable to heatsink, 1 mounting hole; 3 leads SOT32
P1 P D
L1
1 bp
2 w M
3 c Q e e1
2.5 scale
5 mm
DIMENSIONS (mm are the original dimensions) UNIT mm A 2.7 2.3 bp 0.88 0.65 c 0.60 0.45 D 11.1 10.5 E 7.8 7.2 e 4.58 e1 2.29 L 16.5 15.3 L1(1) max 2.54 Q 1.5 0.9 P 3.2 3.0 P1 3.9 3.6 w 0.254
Note 1. Terminal dimensions within this zone are uncontrolled to allow for flow of plastic and terminal irregularities. OUTLINE VERSION SOT32 REFERENCES IEC JEDEC TO-126 EIAJ EUROPEAN PROJECTION ISSUE DATE 97-03-04
Fig.13. SOT32.
Notes 1. Refer to mounting instructions for SOT32 envelopes. 2. Epoxy meets UL94 V0 at 1/8".
July 2001
Rev 1.000
Philips Semiconductors
Product specication
C106D
DEFINITIONS
DATA SHEET STATUS DATA SHEET STATUS3 Objective data PRODUCT STATUS4 Development DEFINITIONS This data sheet contains data from the objective specification for product development. Philips Semiconductors reserves the right to change the specification in any manner without notice This data sheet contains data from the preliminary specification. Supplementary data will be published at a later date. Philips Semiconductors reserves the right to change the specification without notice, in ordere to improve the design and supply the best possible product This data sheet contains data from the product specification. Philips Semiconductors reserves the right to make changes at any time in order to improve the design, manufacturing and supply. Changes will be communicated according to the Customer Product/Process Change Notification (CPCN) procedure SNW-SQ-650A
Preliminary data
Qualification
Product data
Production
Limiting values Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Where application information is given, it is advisory and does not form part of the specification. Philips Electronics N.V. 2001 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights.
3 Please consult the most recently issued datasheet before initiating or completing a design. 4 The product status of the device(s) described in this datasheet may have changed since this datasheet was published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com.
July 2001 7 Rev 1.000
Contact information For additional information please visit http://www.semiconductors.philips.com. Fax: +31 40 27 24825 For sales ofces addresses send e-mail to: sales.addresses@www.semiconductors.philips.com.
SCA73
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights.
XXXXXX/700/01/pp8
2001
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