Micro-XRF

X-Strata 980
Rapid, non-destructive coating thickness measurement and elemental analysis

Robust / Easy to Use / Total Reliability

X-Strata 980: Improving quality and process control

X-S trata980
Metal Finishing Compliance Testing
Corrosion Resistance Wear/Heat Resistance Cosmetic Finish
ppm Pb ppm Hg ppm Cd ppm Cr ppm Br

Electronics
SAC Ni Ag Ceramic
Top layer: SAC (SnAgCu) alloy composition and coating thickness Second layer: Ni coating thickness Third layer: Ag coating thickness Fourth layer: Substrate
SAC Ni Ag Ceramic Au Ni Cu Epoxy Au/Ag PdNi Ni Cu Ag Cu Epoxy

Metal Alloy
% Au % Ni % Cu % Zn % Cr % Fe % Ni % Mo % Au % Ag % Cu % Zn

Alternative Energy
% Cu % In % Ga % Se Mo Glass % Cu % In % Ga Ceramic % Cd % Te Glass

Solderability

ZnFe Fe TiN Tool-steel

Cr Zn Fe TiAlN W-carbide Cr Ni Cu Al

NiP Fe Cr Fe

ppm Pb

Hazardous Materials
Au NiPPb Cu

Assay and ID
Au Ni Cu SnPb Ni Cu

Photovoltaic Cells

Au Ni Cu-alloy NiP Al

Ni Cu

Electrical Contact

Surface Finish

ZrCN Brass

AuCuCd Ni Cu

High Reliability

Metal alloy composition and identication

Rapid, non-destructive analysis of jewellery and other alloys

Solar panels and fuel cells

Ensure product efciency and uniformity

Electrical and electronic components

Increase productivity with better process control

Metal Finishing
Minimise production cost of the plating process and maximise production output

RoHS/WEEE/ELV* compliance testing

Improve quality control to ensure products meet specications

Component reliability assurance

Simultaneous solder alloy composition and thickness measurement

Speed and simplicity of analysis

Simultaneous single or multi elements coating thickness analysis and coating composition Analysis of up to 4 layers (plus substrate) Plating bath analysis

Determination of hazardous substances from parts per million to high percent levels

Karat analysis Material identication Quantication of impurities

Precious metal alloy assay

Composition analysis of the

thin-lm absorber layer (e.g. CIS, CIGS, CdTe) in thin-lm photovoltaic cells

Optimise electrical
thickness analysis

conductivity through layer

Lifetime product assurance through

optimised quality control Analysis of gold and palladium thickness of electrical contacts Coating thickness of NiP layer on computer hard disc

Quantication of toxic elements

e.g. Cd, Hg, Pb etc. to verify compliance
* Restriction of Hazardous Substances/ Waste Electrical and Electronics Equipment/End of Life vehicles (directives)

Analysis of very thin coatings

(e.g. Au/Pd coatings of < 0.1 m)

X-Strata980

X-Strata980

Micro-XRF Analysis As easy as...

X-Strata980
DTECTEUR COLLIMATEUR

Analysis of large, oddly-shaped samples

Comprehensive analysis
Simple calibration setup for optimised elemental composition and thickness analysis

1 Place samples in large analysis chamber

Outstanding precision, accuracy, and long-term stability:

ECHANTILLON
4

TABLE

Select the best analytical method for your application:

Non-destructive analysis: no sample preparation Easy sample introduction/presentation: large door Safe and secure operation: closed chamber Sample chamber size: 580mm x 510mm x 230mm wdh
2 Optimise camera focus at the click of a button

When few or no standards are available, Fundamental Samples can be measured at variable focal distances
(0.5 to 4 inches): methods set up for sample shape and size one universal calibration is used to measure irregularrange 0.5 to 4 inches)

Parameters (FP) methods provide reliable quantitative results. These use a comprehensive spectrum database, and cover a wide range of concentrations and thicknesses. It only takes a few minutes to setup a working method

Fast and precise analysis: high sensitivity with

Oxford Instruments 100 W X-ray tube

Simple identication and differentiation of

PIN detector

Distance independent measurement: with this option,

shape samples, regardless of focal distance (measurable

elements: high resolution, Peltier-cooled silicon

When standards matching your samples (i.e. matrix, analytes,

range of concentrations) are available, empirical calibrations provide the best accuracy. There again, the intuitive, stepby-step method browser enables users to develop their own calibration methods after minimum training)

Optimised performance across a wide range

of elements: multiple primary beam lters

Quick, precise sample alignment with Auto Range Finder (ARF)

Flexible results reports: Advanced Data Export Option

Focus in

No operator-to-operator results variability:

point- and-click laser focus

Measure samples as small as 150 m in size:

multiple collimators

Clear, pin-point analysis: high-resolution colour video camera with high magnication using the programmable XY stage and Z axis customer pre-dened analysis patterns

Low limits of detection, even in matrices

low-background measurement plate

Unattended operation: single or multiple analysis Simple and quick multi-point analysis:
Focus out

such as plastics: Oxford Instruments unique

Sample mapping for identication of problem areas on sample Pb

Rugged and robust design:

Cu Br

3 Press Go

Stand-alone spectrometer: only one mains

plug needed

Results displayed within seconds Rapid compliance assessment: user-dened

colour-coded Pass/Fail results

Compact workstation: excellent ergonomics

and small footprint

Complete statistical data function including average,

standard deviation, histograms and control charts for rapid statistical report generation

Save, print or send results Pre-dened or customised reports for total exibility
Results

Operation in a lab or by the production line Sturdy, industrial design

Real-time data export or export to Microsoft Excel

for a particular sample with one click

TM

Shortcut keys allow user to choose correct calibration User interface available in nine languages

Analyse qualitatively the sample area of interest in one measurement cycle using the Mapping function Generate an image of the sample with superimposed element maps Using the colour-coded element maps, identify the problem area(s) on the sample Carry out a full quantitative analysis of the area to conrm non-compliance
X-Strata980

X-Strata980

Oxford Instruments

SUPPORT
Oxford Instruments Industrial Analysis For more information please email industrial@oxinst.com
UK High Wycombe Tel: +44 (0) 1494 442255 China Shanghai Tel: +86 21 6132 9688 Finland Espoo Tel: +358 9 329 411 Germany Uedem Tel: +49 (0) 2825 93 83 -0 Latin America Concord MA Tel: +1 978 369 9933 Ext. 220 Singapore Tel: +65 6337 6848 North America Concord MA TOLLFREE: +1 800 447 4717 Tel: +1 978 369 9933

Our global customer support network provides a wide range of services giving total peace of mind, including:

Technical phone support Factory trained personnel Professional training Application support Global spare parts provision Post warranty local service contracts Support in local languages Re-certication and re-calibration
An outstanding track record
For many years Oxford Instruments has been at the centre of innovative science and its practical application worldwide
The rst technology business to spin out from Oxford University fty years ago, Oxford Instruments has been at the forefront of X-ray technology since the early 1970s. The X-Strata980 is the latest model of the XRF coatings product range, and combines Oxford Instruments experience with its products reputation for exibility, reliability and ease of use. Image: Oxford Spires

visit www.oxford-instruments.com/xstrata for more information

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