Philips Semiconductors

Product specification

Dual 4-line to 1-line multiplexer

FEATURES

74F153

PIN CONFIGURATION

Non-inverting outputs
Separate enable for each section
Common select inputs
See 74F253 for 3-State version

DESCRIPTION

Ea

16

VCC

S1

15

Eb

I3a

14

S0

I2a

13

I3b

I1a

12

I2b

I0a

11 I1b

Ya

10

I0b

GND

Yb

The 74F153 is a dual 4-input multiplexer that can select 2 bits of data
from up to four sources selected by common Select inputs (S0,
S1). The two 4-input multiplexer circuits have individual active-Low
Enables (Ea, Eb) which can be used to strobe the outputs
independently. Outputs (Ya, Yb) are forced Low when the
corresponding Enables (Ea, Eb) are High. The 74F153 is the logic implementation of a 2-pole, 4-position

SF00146

ORDERING
INFORMATION

switch where the switch is determined by the logic

levels supplied to the common select inputs.

COMMERCIAL RANGE
VCC = 5V 10%,

DESCRIPTION

Tamb = 0C to +70C
TYPE

TYPICAL
PROPAGATION
DELAY

74F153

7.0ns

TYPICAL
SUPPLY CURRENT
(TOTAL)
12mA

PKG.
DWG. #

16-pin plastic
DIP

N74F153N

SOT38-4

16-pin plastic SO

N74F153D

SOT109-1

INPUT AND OUTPUT LOADING AND FAN-OUT TABLE

PINS

DESCRIPTION

74F (U.L.) HIGH/LOW

LOAD VALUE HIGH/LOW

I0a I3a

Port A data inputs

1.0/1.0

20A/0.6mA

I0b I3b

Port B data inputs

1.0/1.0

20A/0.6mA

Common Select inputs

1.0/1.0

20A/0.6mA

Ea

Port A Enable input (active Low)

1.0/1.0

20A/0.6mA

Eb

Port B Enable input (active Low)

1.0/1.0

20A/0.6mA

S0, S1

Ya, Yb
Port A, B data outputs
50/33
NOTE: One (1.0) FAST unit load is defined as: 20A in the High state and 0.6mA in the Low state.

1.0A/20mA

LOGIC SYMBOL

IEC/IEEE SYMBOL
14
6

I0a
14

S0

S1

Ea

15

Eb

I1a

I2a

I3a

10

I0b

11

I1b

12

13

I2b

I3b

6
5
4
3

Ya

0
1

EN
0
1

0
3

MUX
7

2
3

15
Yb

10
11

12
V = Pin 16
CC = Pin 8
GND

1996 Jan 05

13

SF00148

SF00147

8530100 16187

FUNCTION TABLE
INPUTS

OUTPUT

S0

S1

En

I0n

I1n

I2n

I3n

Yn

H
H = High voltage level
L = Low voltage level
X = Dont care

1996 Jan 05

ABSOLUTE MAXIMUM RATINGS

(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL

PARAMETER

RATING

UNIT

VCC

Supply voltage

0.5 to +7.0

VIN

Input voltage

0.5 to +7.0

IIN

Input current

30 to +5

mA

VOUT

Voltage applied to output in High output state

0.5 to VCC

IOUT

Current applied to output in Low output state

Tamb

Operating free-air temperature range

Tstg

Storage temperature range

40

mA

0 to +70

65 to +150

RECOMMENDED OPERATING CONDITIONS

SYMBOL

LIMITS

PARAMETER

MIN

NOM

MAX

5.0

5.5

UNIT

VCC

Supply voltage

4.5

VIH

High-level input voltage

2.0

VIL

Low-level input voltage

0.8

IIK

Input clamp current

18

mA

IOH

High-level output current

mA

IOL

Low-level output current

20

mA

Tamb

Operating free-air temperature range

+70

DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL

VOH

VOL

LIMITS

TEST CONDITIONS1

PARAMETER

High-level output voltage

Low-level output voltage

MIN

TYP2

MAX

UNIT

VCC = MIN, VIL = MAX

10%VCC

2.5

VIH = MIN, IOH = MAX

5%VCC

2.7

VCC = MIN, VIL = MAX

10%VCC

0.30

0.50

VIH = MIN, IOL = MAX

5%VCC

0.30

0.50

0.73

1.2

100

3.4

VIK

Input clamp voltage

VCC = MIN, II = IIK

II

Input current at maximum input voltage

VCC = MAX, VI = 7.0V

IIH

High-level input current

VCC = MAX, VI = 2.7V

20

IIL

Low-level input current

VCC = MAX, VI = 0.5V

0.6

mA

150

mA

12

20

mA

12

20

mA

IOS

Short-circuit output current

ICC

Supply current (total)

60

VCC = MAX
ICCH

VCC = MAX

En = GND,
Sn=In=4.5V
En=Sn=In=GND

ICCL
NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25C.
3. Not more than one output should be shorted at a time. For testing I OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In
any sequence of parameter tests, IOS tests should be performed last.

AC ELECTRICAL CHARACTERISTICS
SYMBOL

1996 Jan 05

PARAMETER

TEST

LIMITS

UNIT

tPLH
tPHL

Propagation
In to Yn

tPLH
tPHL

Propagation
Sn to Yn

tPLH
tPHL

Propagation delay
En to Yn

AC WAVEFORMS

1996 Jan 05

delay
delay

VCC = +5.0V

VCC = +5.0V 10%

Tamb = +25C

Tamb = 0C to +70C

CONDITION

CL = 50pF, RL = 500
MIN

TYP

MAX

MIN

MAX

Waveform 1

3.0
3.0

4.5
5.0

7.0
7.5

2.5
2.5

8.0
8.0

ns

Waveform 2

5.0
5.0

8.0
8.0

10.5
10.5

4.5
4.5

12.0
12.0

ns

Waveform 2

5.0
4.0

7.5
5.5

9.0
7.0

4.5
3.5

10.5
8.0

ns

CL = 50pF, RL =
500