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06/16/2009

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ElectricalTestingofBaBar  SiliconVertexDetectorModules  (ShortVersion)  
UCSBGrouUniversityofCaliforniSantaBarbara,CA9310May24,199
 
1QConmodulesduringassembly   
Testingwillbeakeypartofmoduleassembly.Wearecurrentlydesigningandconstructing computer-automatedteststands,andwehavebeenevaluatingourtestsindetailusing double-sidedsiliconwafersleftoverfromconstructionofthesiliconvertexdetectorforCLEOAllofourtestswillbeperformedundercomputercontrol,usingGPIBandVMEinstrumentcontrolledwithLabViewand/orVxWorkssoftware.Thetestingisdescribedindetailinseparatedocument;hereweoutlinethemainelementsBecausethehybridswillnotbeavailableuntiloverayearaftermoduleassemblyhas begun,muchofthetestingwillbeperformedusingaspecial,multipinprobe.Thisprobewhichwillbeloweredontotheextensionportionoftheupilex,enablesustoaccess25channelsontheupilexatonetime.Wehavebuiltamultiplexercircuit(theprobemultiplexer)thatismounteddirectlyontheprobe;thissystemprovidesaccesstoeachreadout stripindependentlyundercomputercontrol.Aftergluingandwire-bondingthehybridstthewafers,electricaltestingwillbeperformedbyreadingoutthehybridthroughVMEThefailuremodesthatweconsidermostlikelyar
 
Excessivedetectorleakagecurrentatthenominalbiasvoltage
 
Pinholes,ordefectsintheoxidelayerbetweenthereadoutandimplantstrips;thescouldbeintroducedbydetectorhandlingorbywire-bonding.Pinholescanalsoformeduringthefabricationofthewafer,andwewillhaveamapfromearliertestsshowing thestripsthatalreadyhavepinholes
 
Wirebondsthatareshortedtoaneighbor(leaningbonds)
 
Interruptedsignaltracesonthedetector(due,forexample,tomechanicaldamage)
 
Wirebondsthatfailtoconnect(broken,misaligned,ornonstickingbonds)
 
Interruptedtracesontheupilex(mechanicaldamage)
 
Failureofthedetectortodepleteproperly. 
 
Failureofthehybrid. Figure1showsthemaincomponentsofthepre-hybridtestsystem,whichwehavepro- totypedandevaluatedusingCLEOsiliconwafers.Thesystemincludestheprobe;probe multiplexer,whichconsistsoffour64-channelrelaycards;anInstrumentSwitchingandRelayBoardControlcard(thiscardisphysicallyontopofthefourrelaycards);andaRelay Controller/Display,whichallowsforeithermanualorcomputercontroloftherelays.The powersuppliesforallofthesecomponentsarerunfromhighqualityisolationtransformersandtheInstrumentSwitchingandRelayBoardControlCardisopto-isolatedfromtheRelay Controller/Display.TheinstrumentswitchingportionoftheInstrumentSwitchingandRelayBoardControlallowsonetoperformawidevarietyofmeasurementswithouthavingtre-cableinstruments.TheoutputsoftherelayboardscanbeswitchedtoaKeithley48picoammeter,toanHP4284ALCRmeter,ortoaLeCroyHQV820-MchargepreamplierThisboardalsoallowsonetoaccessthebuslinetowhichnonselectedstripsareconnected. 
 
fromtheshortingbarsthatcanbeplacedovertheupilexstrips.Theupilexshortingbar showninthegureprovidesasimplemechanismtoshorttogetherallACstripsononeside ofthedetector
64 ch.relayboard64 ch.64 ch.relayboard64 ch.64 ch.relayboardrelayboardBed-of-nails probePC-LabViewPC-parallel IORelay ControllerDisplayManualControlInstrument SwitchingRelay Board ControlandUpilex ExtensionUpilex ExtensionSilicon WaferShorting bar264646464Keithley(s)HP-LCR meterAlternate bias supplyBias LinesShorting barCharge Preamp256G10 PlateControlSelectedStrips2All otherStrips
Figure1:Schematicoftestsystemshowingthedetectorwaferwithupilex,multipinprobe, probemultiplexer,andcomputercontrolInmanyways,thebesttestofthedetectormodulesatanystageofassemblyafterthe individualstripshavebeenwire-bondedistopulsethedetectorwithaninfraredLED.WhavefoundthataSeimensSFH450infraredLEDisinexpensive,worksextremelywell,and canbepurchasedinacasethatallowseasycouplingtoanopticalber.Theelectricalsignal totheLEDhasbeencontrolledintwoways,rstbysimplydrivingitwithanHP8116pulser(withacurrentlimitingresistorinseries),andsecond,usinganLEDdrivercircuithatwebuilt.Thiscircuitcanproduceveryfasthighcurrentpulsesofvariablewidththat maybeusefulwhenwewanttoinvestigatetimingissuesassociatedwiththehybrid. Theassemblyandtestingsequencegoesasfollows
 
ImmediatelyafterreceivingtheDetector-Fanout-Assemblies(DFAs),andbeforebegin- ningthewire-bondingprocess,wewillchecktheintegrityoftheupilexfanoutcircuitAtthisstageweareonlyabletocheckforshortsbetweenupilextraces.Thisisaccomplishedbymeasuringtheinterstripresistance.Notethatasimilartestwillhave alreadybeenperformedaspartofamorecomprehensiveupilextestingprocedure.The 

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