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Table Of Contents

AdvancedTechnology Platform
D8 DISCOVERfor Thin Film Analysis
Detectors for XRD
XRD3 –Diffraction Space Viewer
LEPTOS Material Database
Introduction XRD in the Semiconductor Field
Semiconductor Applications
Raman –Principles
Metrology Techniques – High Resolution X-ray Diffraction
XRR –X-ray Reflectometry
Industrial Applications Measurement Schemes
X-ray Reflectometry
Pattern or Product Wafers
Measurement Scheme (I)
Pattern Recognition
SiGe on Si
SOI
DIFFRACplusLEPTOS 3
D8FABLINE Automated Operation and Analysis
Texture Measurements on Cu Lines
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Comprehensive Thin Film Analysis by XRD

Comprehensive Thin Film Analysis by XRD

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Published by: Ángela Idárraga Vélez on Oct 26, 2010
Copyright:Attribution Non-commercial

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05/16/2013

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