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6599726 Testing of Digital Systems

6599726 Testing of Digital Systems

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Published by Lin Chong

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Published by: Lin Chong on Dec 09, 2010
Copyright:Attribution Non-commercial


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Testing of Digital Systems
Device testing represents the single largest manufacturing expense in the semiconduc-tor industry, costing over $40 billion a year. The most comprehensive and wide rangingbook of its kind,
Testing of Digital Systems
covers everything you need to knowabout this vitally important subject. Starting right from the basics, the authors takethe reader through automatic test pattern generation, design for testability and built-inself-test of digital circuits before moving on to more advanced topics such as
testing, functional testing, delay fault testing, CMOS testing, memory testing, andfault diagnosis. The book includes detailed treatment of the latest techniques includingtest generation for various fault models, discussion of testing techniques at differentlevels of the integrated circuit hierarchy and a chapter on system-on-a-chip testsynthesis. Written for students and engineers, it is both an excellent senior/graduatelevel textbook and a valuable reference.
Niraj K. Jha
is Professor of Electrical Engineering at Princeton University and headof the Center of Embedded System-on-a-Chip Design, where his current research isfocussed on the synthesis and testing of these devices. He is a fellow ofIEEE, associateeditor of 
IEEE Transactions on Computer-Aided Design
and the
Journal of ElectronicTesting: Theory and Applications
) and a recipient of the AT&T Foundationaward and the NEC preceptorship award for research excellence.
Sandeep Gupta
is an Associate Professor in the Department of Electrical Engineering atthe University of Southern California. He is Co-Director of the M.S. Program in VLSIDesign, with research interests in the area of VLSI testing and design. He is a memberof IEEE.