Welcome to Scribd, the world's digital library. Read, publish, and share books and documents. See more
Download
Standard view
Full view
of .
Save to My Library
Look up keyword or section
Like this
6Activity

Table Of Contents

0 of .
Results for:
No results containing your search query
P. 1
NASA Microelectronics Reliability Physics-Of-Failure Based Modeling

NASA Microelectronics Reliability Physics-Of-Failure Based Modeling

Ratings: (0)|Views: 7,800|Likes:
Published by goldpanr8222

More info:

Published by: goldpanr8222 on Jun 23, 2011
Copyright:Attribution Non-commercial

Availability:

Read on Scribd mobile: iPhone, iPad and Android.
download as PDF, TXT or read online from Scribd
See more
See less

06/08/2013

pdf

text

original

 
 
National Aeronautics and Space Administration
Microelectronics Reliability:Physics-of-Failure Based Modelingand Lifetime Evaluation
Mark WhiteJet Propulsion LaboratoryPasadena, CaliforniaJoseph B. BernsteinUniversity of MarylandCollege Park, Maryland
Jet Propulsion LaboratoryCalifornia Institute of TechnologyPasadena, CaliforniaJPL Publication 08-5 2/08
 
 
 
 
National Aeronautics and Space Administration
Microelectronics Reliability:Physics-of-Failure Based Modelingand Lifetime Evaluation
 NASA Electronic Parts and Packaging (NEPP) ProgramOffice of Safety and Mission Assurance
Mark WhiteJet Propulsion LaboratoryPasadena, CaliforniaJoseph B. BernsteinUniversity of MarylandCollege Park, Maryland
 NASA WBS: 939904.01.11.10JPL Project Number: 102197Task Number: 1.18.5
 
Jet Propulsion Laboratory4800 Oak Grove DrivePasadena, CA 91109http://nepp.nasa.gov

Activity (6)

You've already reviewed this. Edit your review.
1 hundred reads
1 thousand reads
ibust liked this
kidus liked this
kidus liked this
nhlapomj liked this

You're Reading a Free Preview

Download
/*********** DO NOT ALTER ANYTHING BELOW THIS LINE ! ************/ var s_code=s.t();if(s_code)document.write(s_code)//-->