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Additive Model of Reliability of Biometric Systems with Exponential Distribution of Failure Probability

Additive Model of Reliability of Biometric Systems with Exponential Distribution of Failure Probability

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Published by ijcsis
Approaches for reliability analysis of biometric systems are subject to a review of numerous scientific papers. Most of them consider issues of reliability of component software applications. System reliability, considering technical and software part, is of crucial importance for users and for manufacturers of biometric systems. In this paper, the authors developed a mathematical model to analyse the reliability of biometric systems, regarding the dependence of components with exponential distribution of failure probability.
Approaches for reliability analysis of biometric systems are subject to a review of numerous scientific papers. Most of them consider issues of reliability of component software applications. System reliability, considering technical and software part, is of crucial importance for users and for manufacturers of biometric systems. In this paper, the authors developed a mathematical model to analyse the reliability of biometric systems, regarding the dependence of components with exponential distribution of failure probability.

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Published by: ijcsis on Jul 07, 2011
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(IJCSIS) International Journal of Computer Science and Information Security,Vol. 9, No. 6, June 2011
Additive model of reliability of biometric systemswith exponential distribution of failure probability
Zoran
Ć
osi
ć
(Author)
 
director Statheros d.o.o.Kaštel Stari, Croatiazoran.cosic@statheros.hr 
Jasmin
Ć
osi
ć
 
(Author)
 
IT Section of Police AdministrationMinistry of Interior of Una-sana cantonBiha
ć
, Bosnia and Hercegovina jacosic@gmail.com
Miroslav Ba
č
a
(Author)
 
 professor Faculty of Organisational and Informational scienceVaraždin, Croatiamiroslav.baca@foi.hr 
 Abstract
 
Approaches for reliability analysis of biometricsystems are subject to a review of numerous scientific papers.Most of them consider issues of reliability of component softwareapplications. System reliability, considering technical andsoftware part, is of crucial importance for users and formanufacturers of biometric systems.In this paper, the authors developed a mathematical model toanalyse the reliability of biometric systems, regarding thedependence of components with exponential distribution of failure probability
.
 
 Keywords- Additive model, Biometric system, reliability,exponential distribution, UML,
I.
 
I
 NTRODUCTION
 The general biometric system, according to [1] Wyman shownin Figure 1, consists of 5 elements which are located in all biometric systems today.Figure 1. [1]Each subsystem consists of the elements that contribute to theoverall system quality.Data collection subsystem consists of a biometric sample,method of sampling, and sensors that are sampled. Signal processing subsystem consists of drainage structures, qualitycontrol and comparison of samples. Decision subsystemconsists of the decision mechanisms and storage subsystems.Schematisation of model described in figure 1 can be shownon figure 2.Figure 2
Schematic presentation of a biometric [1] system is asimplified representation of a system in Figure 1 and showsthe serial configuration of system components dependence
II.
 
T
HE DEFINITION OF THE RELIABILITY OF BIOMETRICSYSTEMS
 Biometric system designers and producers are motivated touse already constructed components and modules. Componentsystem has a high reliability expectations , no matter who is producer. Most of existing reliability models are so generallydescribed to not consider particularity of components andmodules. In this paper authors will describe methodology based on mathematical model which take account of component reliability and connections reliability also. UMLmethodology in describing system and his inner interaction,simplify approach for researchers.UML [2] is also becoming standard in the process of designingand manufacturing systems so production of componentsystems gets benefits from the UML representation.
1http://sites.google.com/site/ijcsis/ISSN 1947-5500
 
(IJCSIS) International Journal of Computer Science and Information Security,Vol. 9, No. 6, June 2011
Assessment of [3] generic biometric system reliability in UMLis given in Figure 3, which describes the use of Use Casediagram:Figure 3 [3]q1 and q2 represent the probability that users u1 and u2 willaccess the system using some of its functionality.P11 and P12 represent the probability that user u1 will use thefunctionality of f1 and f2, and P21 and P22 represent the same probability for the user u2.The probability of execution of use case x, is defined by theexpression:
(1)
m is number of users.If we are able to join a no uniform distribution to Diagram of sequences in a given use case then (1) can be expressed as:(2)Where the fj (k) - frequency of the k-th transition of sequencediagram in the j-th case. P (kj) – presents a probability of default scenarios.Figure 4 Sequence diagram [3]Diagrams sequences play an important role in assessing thereliability of the system because they give information on howmany components are involved in the execution of a scenario.Through sequence diagrams it is simple to count the periods of availability of components in the given scenarios as shown infigure (3). The probability of failure of components withknown busy periods, can be given by the followingexpression:(3)In witch is:- - probability of component failure i in the scenario j- - occupancy time of component i in the scenario jThe expression (3) applies only if the following conditions aremet:
-
 
Independence of failure: the probability of failure of one component does not depend on other components
-
 
Regularity of failure: the probability of failure of onecomponent is equal throughout the execution of occupation period of the component
 
You can also show every moment of occupancy of anycomponent of the system considering the method to beexecuted at that moment in the scenarioIf we replace with a set of method of failure probabilitywhere is then equation (3) becomes:(4)During system operation, components interact and exchangeinformation. Then it is necessary to take into considerationoccupation period of the component:(5)Where is
θ
ij- the probability of failure of system componentsand bp-busy period of the system.(6)Where is
Ψ
lmj
- the probability of failure connections betweenthe components and-the number of interactions between system components.(7)The reliability of the system taking into account the probability of failure can be expressed as:
2http://sites.google.com/site/ijcsis/ISSN 1947-5500
 
(IJCSIS) International Journal of Computer Science and Information Security,Vol. 9, No. 6, June 2011
(7a)(7b)III.
 
ELIABILITY PREDICTION OF THE COMPONENTS SERIALDEPENDENCE WITH EXPONENTIAL DISTRIBUTION
 Based on the above assumptions [4], [5] system reliability can be calculated according to the law of exponential distribution:(8)In wich are:
s
- System reliability
λ
- Intensity of system faultt - Required time of reliable operation of systemProof:In a serial dependence between of all parts of the system thefailure of any part of the system may cause the failure of theentire system.Failure intensity function
λ
s
in the case of a serial dependenceof system elements is calculated by the expression:(9)Where is
λ
i
- failure intensity of the i-th part of the system.Failure intensity function
λ
s
is equal to the ratio between thenumber of failures in the time-frame and the correct number of elements in the system, until the beginning of this interval:(10)Where is:
λ
s
-function of failure intensity of system
Δ
- failure time of an system elementn
2
(
Δ
) - number of failures in certain time interval
Δ
 n
1
(
t
Δ
) – the non failed number of elements at the end of the interval
Δ
, or until
t
Δ
 The intensity of the element failure is calculated by theexpression:
11
 EL
nn
λ 
Θ= =Θ
 )
(11)Where is:n- number of usable parts of the confidence interval
(1)0,75
α 
=
 
Θ
- lower limit of confidence for the mean time betweenfailuresThe total intensity of failure taking into consideration thenumber of elements that are not failed in a given time iscalculated by formula:(12)Where is:n
EL
- number of elements of subsystems that are not failedMean time between failures MTBFs can be calculated usingthe expression:(13)Calculation of reliability [6] of some element is based onempirical data on the time of functioning and eventual failureof the element.Problem [7], [8] becomes more complex when the informationabout the failure doesn't exist. In case that part worked perfectly, and information about the exploitation are available.If one assumes that the given part can apply the rule of theexponential distribution, it is possible to determine the upper limit of confidence for the intensity of failure, in the cases of continuous operation or one or more failures.Lower limit of confidence for the mean time betweenfailures
Θ
 )
, for confidence interval
(1)
α 
is calculated usingthe formula:
3http://sites.google.com/site/ijcsis/ISSN 1947-5500

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