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+ =
kT qV
n
p
p
p
n
n
A
e p
L
D
n
L
D
q J
( ) 1
/ 2
(
(
+ =
kT qV
D p
p
A n
n
i
A
e
N L
D
N L
D
qAn I
Lecture 8
Micro Electronic Circuit & Devices 6
Ideal Diode Current
(
(
+ =
D p
p
A n
n
i
N L
D
N L
D
qAn I
2
0
( ) 1
/
0
=
kT qV
A
e I I
( ) 1
/ 2
(
(
+ =
kT qV
D p
p
A n
n
i
A
e
N L
D
N L
D
qAn I
I
V
A
I
0
Lecture 8
Micro Electronic Circuit & Devices 7
Practical Diode Characteristic
Typical Diode characteristics
Forward bias diode current I
D
> 0 with diode
voltage V
D
~ 0.7V
Reverse bias diode current I
D
~ 0
Breakdown diode current I
D
< 0 and the diode
voltage V
D
< V
BD
I
D
+ V
D
-
I
V
A
V
D
V
BD
Lecture 8
Micro Electronic Circuit & Devices 8
Practical Diode Characteristic
v
BR
I
F
(mA)
V
F
v
d
Room Temp
Room Temp + 25
Higher Temp.
- v
d
decreases
- breakdown (v
BR
) earlier
- leakage current increases
(
+
|
|
.
|
\
|
~
D A
D A S CR
BR
N N
N N
q
K E
V
2
0
c
Lecture 8
Micro Electronic Circuit & Devices 9
Diode Depletion Capacitance
Electrostatics of Depletion Region: Generalized
2 / 1
0
) (
) ( 2
(
=
D A D
A A bi s
n
N N N
N
q
V V K
x
c
2 / 1
0
) (
) ( 2
(
=
D A A
D A bi s
p
N N N
N
q
V V K
x
c
2 / 1
0
) ( 2
(
+
=
A D
D A A bi s
N N
N N
q
V V K
W
c
Depletion region width approximation
Depletion region width, W = x
n
+ x
p
-x
p
x
n
x
j
=0
n-bulk p-bulk
Depletion
region
V
A
=0V
V
A
>0V
-x
p
x
n
x
j
=0
n-bulk p-bulk
Depletion
region
V
A
=0V
V
A
<0V
Forward
V
A
>0V
Reverse
V
A
<0V
Lecture 8
Micro Electronic Circuit & Devices 10
Diode Depletion Capacitance
( )
2 / 1
0
0
2
(
=
D A
D A
A bi
S
S
J
N N
N N
V V
q
K
A K
C
c
c
-x
p
x
n
x
j
=0
n-bulk p-bulk
Depletion
region
V
A
=0V
V
A
>0V
-x
p
x
n
x
j
=0
n-bulk p-bulk
Depletion
region
V
A
=0V
V
A
<0V
Forward
V
A
>0V
Reverse
V
A
<0V
C
J
decrease as V
A
become negative
Lecture 8
Micro Electronic Circuit & Devices 11
Diode in Circuits
I
F
+V
F
-
R
+ V -
Forward Bias
I
R
0
R
- V +
- V +
Reversed Bias
Lecture 8
Micro Electronic Circuit & Devices 12
Diode in Circuits
R
v(t)=Asinet
v(t)
I(t)
Lecture 8
Micro Electronic Circuit & Devices 13
Reading Assignment
Howe, R.T. and Sodini, C. G.
Microelectronics: An Integrated
Approach, Prentice Hall, NJ, 1997.
Chapter 3: Section 3.3-3.5 (all)