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Thesis Msee Afarris 2008

Thesis Msee Afarris 2008

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Published by lordmorgul
M.S. EE Thesis, Andrew Farris, Cal Poly State University
Drop Impact Reliability Testing Lead-free Chip Scale Packages, June 2008; discusses development of a high-speed data acquisition system for drop impact testing handheld electronics.
M.S. EE Thesis, Andrew Farris, Cal Poly State University
Drop Impact Reliability Testing Lead-free Chip Scale Packages, June 2008; discusses development of a high-speed data acquisition system for drop impact testing handheld electronics.

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Published by: lordmorgul on Jan 01, 2009
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05/25/2013

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DROP IMPACT RELIABILITY TESTING LEAD-FREE CHIP SCALEPACKAGESA ThesisPresented tothe Faculty of California Polytechnic State UniversitySan Luis ObispoIn Partial Fulfillmentof the Requirements for the DegreeMaster of Science in Electrical EngineeringbyAndrew FarrisJune 2008
 
AUTHORIZATION FOR REPRODUCTION OF MASTER’S THESISI grant permission for the reproduction of this thesis in its entirety or any of its parts,without further authorization from me.SignatureDateii
 
APPROVAL PAGETITLE: Drop Impact Reliability Testing Lead-free Chip Scale PackagesAUTHOR: Andrew FarrisDATE SUBMITTED: June 2008Dr. Albert LiddicoatAdvisor or Committee Chair SignatureDr. Jianbaio PanCommittee Member SignatureDr. James HarrisCommittee Member Signatureiii

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