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Monte Carlo Modeling for Electron Microscopy and Microanalysis Oxford Series in Optical and Imaging Sciences

Monte Carlo Modeling for Electron Microscopy and Microanalysis Oxford Series in Optical and Imaging Sciences

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Published by: ceco27 on Jun 16, 2012
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11/07/2012

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Monte Carlo Modeling for ElectronMicroscopy
and Microanalysis
 
OXFORD
SERIES
IN
OPTICAL
ANDIMAGING
SCIENCES
EDITORS
MARSHALL LAPPJUN-ICHINISHIZAWABENJAMIN
B.
SNAVELY
HENRY
STARK
ANDREW
C. TAMTONY WILSON
1.
D. M.
Lubman (ed.).
LasersandMass
Spectrometry
2. D.
Sarid.
Scanning Force Microscopy
With
Applications
to
Electric, Magnetic,and Atomic Forces
3. A. B.
Schvartsburg.
Non-linear Pulses in Integrated and Waveguide Optics
4. C. J.
Chen.
Introduction
to
Scanning Tunneling Microscopy
5. D.
Sarid.
Scanning Force Microscopy
With
Applications
to
Electric, Magnetic,
and
Atomic
Forces,
revised edition
6. S.
Mukamel.
Principles
of
Nonlinear Optical Spectroscopy
1.
A.
Hasegawa
and Y.
Kodama.
Solitons
in
Optical Communications
8. T. Tani.
Photographic Sensitivity: Theory and Mechanisms
9. D.
Joy.
Monte Carlo Modeling
for
Electron Microscopy
and
Microanalysis

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