Poster for Computation of Charge Coll...
COMPUTATION OF CHARGE COLLECTION PROBABILITY FOR ANY COLLECTING JUNCTION SHAPE / Oka Kurniawan1, Vince
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Computation of Charge Collection Prob...
Abstract—Electron-beam-in duced current (EBIC) of the scanning electron microscopy (SEM) has been widely used for semiconductor devices and material...
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| pauljoseph published a revision of: |
Study of a Single Coaxial Silicon Nan...
Abstract—Nanowires have been identified as a promising / alternative for future electronics. A single coaxial nanowire / photovoltaic device has been...
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