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Your road map for meeting today's digital testing challenges
Today, digital logic devices are common in products that impactpublic safety, including applications in transportation and humanimplants. Accurate testing has become more critical to reliability,safety, and the bottom line. Yet, as digital systems become moreubiquitous and complex, the challenge of testing them has becomemore difficult. As one development group designing a RISC stated,"the work required to . . . test a chip of this size approached theamount of effort required to design it." A valued reference fornearly two decades, Digital Logic Testing and Simulation has beensignificantly revised and updated for designers and test engineerswho must meet this challenge.
There is no single solution to the testing problem. Organized in aneasy-to-follow, sequential format, this Second Edition familiarizesthe reader with the many different strategies for testing and theirapplications, and assesses the strengths and weaknesses of thevarious approaches. The book reviews the building blocks of asuccessful testing strategy and guides the reader on choosing thebest solution for a particular application. Digital Logic Testingand Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language(STIL) * Practical algorithms written in a Hardware Design Language(HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the manyobstacles encountered and lessons learned in creating this noveltesting approach
Up-to-date and comprehensive, Digital Logic Testing and Simulationis an important resource for anyone charged with pinpointing faultyproducts and assuring quality, safety, and profitability.read more