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Multiple official documents provide a thorough and up-to-date review of the research at the important Center for Nanoscale Science and Technology (CNST). It supports the U.S. nanotechnology enterprise from discovery to production by providing industry, academia, NIST, and other government agencies with access to world-class nanoscale measurement and fabrication methods and technology. The CNST is the only national nanocenter with a focus on commerce. The CNST's shared NanoFab resource gives researchers economical access to and training on a state-of-the-art, commercial tool set required for cutting-edge nanotechnology development. The simple application process is designed to get projects started in a few weeks. Looking beyond the current state of the art, CNST research is creating the next generation of nanoscale measurement instruments and methods, which are made available through collaboration. As the Department of Commerce nanocenter, the CNST provides: A unique user facility offering access to the instrumentation, methods, and technical expertise required to make and measure components at the nanometer scale; A world-class, shared resource for nanoscale measurement and fabrication widely accessible to researchers from both inside and outside NIST; Expertise in a wide variety of disciplines, including physics, chemistry, materials science, molecular biology, computer science, and electrical, mechanical, chemical, and aeronautical engineering; and a hub linking the international nanotechnology community to the comprehensive related measurement expertise throughout NIST.

Resources * NanoFab Capabilities * Next Generation Measurement Research Focus Areas * CNST Organizational Groups * Mission and Metrics * CNST Overview * Reducing Measurement Barriers to Innovation * Key Metrics * Encouraging a Strong Safety Culture * The NanoFab: A Shared National Resource * NanoFab Overview * Establishing a NanoFab Project * NanoFab Costs * NanoFab Operations * NanoFab Capabilities: Tools and Processes * CNST Research: Creating the Next Generation of Nanoscale Measurement Tools * Electron Physics Group * Energy Research Group * Nanofabrication Research Group * Project Highlights * Measuring Quantum Electronic Properties of Graphene * Localization in Graphene Devices Probed by STM * Development of Si-Based Single-Electron Devices (SEDs) for a Fundamental Current Standard and for Quantum Information * Laser Direct Write to Enhance Inter-Chip IO Bandwidth * Measurement of Current Polarization by Doppler-Shifted Spin Waves * The Effect of Disorder on Magnetic Dynamics * Ultra-High-Density Patterned Magnetic Recording Media * Magnetic Nanopillars Fabricated Using Electron Beam Lithography * Imaging 3D Magnetic Nanostructure in Ferromagnetic Multilayers * Measuring Light-Matter Interactions in Chip-Based Optical Cavities * Probing Plasmonic-Photonic Interactions in Periodic Nanowire Arrays * Efficiency Enhancement of Copper Contaminated Radial p-n Junction Solar Cells * Nanoscale Characterization of Organic Photovoltaic Devices * Self-Assembly of Lithographically Patterned Cubic Nanostructures * Line-Edge Roughness Measurements in Diblock Copolymers * The Effect of Resist on the Transfer of Line-Edge Roughness Spatial Metrics from Mask to Water * Measurement Platforms to Facilitate Nanoimprint Lithography * Novel Sources for Focused Ion Beams * In Situ Measurements of Thermodynamics and Reaction Kinetics During Nanomaterials Synthesis and Catalysis * Particle-Tracking Measurements of Nanoparticle Dynamics in Fluids * Atomic-Scale Silicon Surface Control to Enable Atom-Based Dimensional Metrology * Nanoscale Linewidth Standards for AFM Calibration * Developing Nanocalorimetry Techniques and Material Standards for Measuring Properties

Published: Progressive Management on
ISBN: 9781301888566
List price: $9.99
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