IEEE Std C57.

113"-2010
(Revision of
EEE Std C57.113-1991)
IEEE Recommended Practice for
PartiaI Discharge Measurement in
Liquid-FiIIed Power Transformers and
Shunt Reactors
IEEE Power & Energy Society
Sponsored by the
Transformers Committee
EEE
3 Park Avenue
New York, NY 10016-5997, USA
20 August 2010
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IEEE Std C57.113-2010
(Revision of
IEEE Std C57.113-1991)

IEEE Recommended Practice for
Partial Discharge Measurement in
Liquid-Filled Power Transformers and
Shunt Reactors
Sponsor
Transformers Committee
of the
IEEE Power & Energy Society
Approved 17 June 2010
IEEE-SA Standards Board

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Abstract: Wideband measurement of the apparent charge of partial discharges (PDs) that may
occur in liquid-filled power transformers and shunt reactors excited by ac test voltages between
40 Hz and 400 Hz are discussed. The major components of the PD measuring circuit including
the calibrator are specified in compliance with IEC 60270. The PD test procedure is described
and recommendations for the evaluation of PD test results are presented.
Keywords: apparent charge, IEEE C57.113, partial discharge (PD), power transformer, shunt
reactor, wideband PD measurement

The Institute of Electrical and Electronics Engineers, Inc.
3 Park Avenue, New York, NY 10016-5997, USA

Copyright 2010 by the Institute of Electrical and Electronics Engineers, Inc.
All rights reserved. Published 20 August 2010. Printed in the United States of America.

IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of Electrical and Electronics
Engineers, Incorporated.

PDF: ISBN 978-0-7381-6383-3 STD96098
Print: ISBN 978-0-7381-6384-0 STDPD96098

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Introduction
This introduction is not part of IEEE Std C57.113-2010, IEEE Recommended Practice for Partial Discharge
Measurement in Liquid-Filled Power Transformers and Shunt Reactors.
The detection of partial discharges (PDs) was introduced for quality assurance tests of high-voltage (HV)
apparatus at the beginning of 1960. Originally this technique was based on the measurement of radio
interference voltages (RIV) in terms of microvolts (V) as recommended by NEMA TR1-1974 [B112],
NEMA 107-1964 [B113], and CISPR 16-1-1993 [B42].
a
This quantity, however, is weighted according to
the acoustical noise impression of the human ear, which is not a measure of the PD activity in the insulation
of HV apparatus. As a consequence, Technical Committee No. 42 of IEC decided to prepare a separate
standard for PD measurements associated with the apparent charge, which was first published in 1968.
Since that time, this technology is considered as an indispensable tool for an enhancement of the reliability
of HV apparatus. IEEE Std C57.113-2010 covers the wideband method for apparent charge measurements
in compliance with the third edition of IEC 60270, published in 2000.
b

Notice to users
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any rights in copyright to this document.

a
The numbers in brackets correspond to those of the bibliography in Annex H.
b
Information on references can be found in Clause 2.
iv
Copyright 2010 IEEE. All rights reserved.
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corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the
document together with any amendments, corrigenda, or errata then in effect. In order to determine whether
a given document is the current edition and whether it has been amended through the issuance of
amendments, corrigenda, or errata, visit the IEEE Standards Association web site at
http://ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously.
For more information about the IEEE Standards Association or the IEEE standards development process,
visit the IEEE-SA web site at http://standards.ieee.org.
Errata
Errata, if any, for this and all other standards can be accessed at the following URL:
http://standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL
for errata periodically.
Interpretations
Current interpretations can be accessed at the following URL: http://standards.ieee.org/reading/ieee/interp/
index.html.
Patents
Attention is called to the possibility that implementation of this recommended practice may require use of
subject matter covered by patent rights. By publication of this recommended practice, no position is taken
with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not
responsible for identifying Essential Patent Claims for which a license may be required, for conducting
inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or
conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing
agreements are reasonable or non-discriminatory. Users of this recommended practice are expressly
advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is
entirely their own responsibility. Further information may be obtained from the IEEE Standards
Association.
v
Copyright 2010 IEEE. All rights reserved.
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vi
Copyright 2010 IEEE. All rights reserved.
Participants
At the time this recommended practice was submitted to the IEEE-SA Standards Board for approval, the
Dielectric TestsTF on PD Measurement Working Group had the following membership:
Bertrand Poulin, Chair


Raymond Bartnikas
Alain Bolliger
Carl Bush
Alan Darwin
Reto Fausch
Marcel Fortin
John Harley
Peter Heinzig
Thang Hochanh
Stephen Jordan
Vladimir Khalin
Eberhard Lemke
Paul Millward
Arthur Molden
Martin Navarro
Ron Nicholas
Mark Perkins
Gustav Preininger
Dirk Russwurm
Hemchandra Shertukde
Charles Sweetser
Juan Luis Thierry
Subash Tuli
Dharam Vir
Loren Wagenaar
Hanxin Zhu
Waldemar Ziomek


Most of the work in writing this document was done by the TF Chair Eberhard Lemke and TF Members
Marcel Fortin, John Harley, Thang Hochanh, Stephen Jordan, Vladimir Khalin, Mark Perkins, Bertrand
Poulin, and Loren Wagenaar.

The following members of the individual balloting committee voted on this recommended practice.
Balloters may have voted for approval, disapproval, or abstention.


Samuel H. Aguirre
Stan Arnot
Carlo Arpino
Javier Arteaga
Ali Al Awazi
Martin Baur
Barry Beaster
Stephen Beattie
W. J. Bill Bergman
Steven Bezner
Wallace Binder
Thomas Blackburn
Thomas Blair
David Blew
William Bloethe
W. Boettger
Paul Boman
Harvey Bowles
Jeffrey Britton
Chris Brooks
Kent Brown
Carl Bush
Donald Cash
Yunxiang Chen
Bill Chiu
Craig Colopy
Tommy Cooper
Jerry Corkran
John Crouse
Alan Darwin
John Densley
Dieter Dohnal
Randall Dotson
Donald Dunn
Fred Elliott
Gary Engmann
Donald Fallon
Rabiz Foda
Joseph Foldi
Bruce Forsyth
Marcel Fortin
Saurabh Ghosh
Jalal Gohari
Eduardo Gomez-Hennig
Edwin Goodwin
James Graham
Randall Groves
Bal Gupta
Kenneth Hanus
David Harris
Robert Hartgrove
Roger Hayes
Peter Heinzig
Gary Heuston
James Huddleston III
Wayne Johnson
James Jones
Stephen Jordan
Lars Juhlin
C. Kalra
Gael Kennedy
Sheldon Kennedy
Vladimir Khalin
Joseph L. Koepfinger
Jim Kulchisky
Saumen Kundu
John Lackey
Chung-Yiu Lam
Stephen Lambert
Thomas La Rose
Raymond Lings
Maurice Linker
Thomas Lundquist
G. Luri
Keith Malmedal
J. Dennis Marlow
John W. Matthews
Joseph Melanson
Gary Michel
Daleep Mohla
Daniel Mulkey
Jerry Murphy
Michael S. Newman
Raymond Nicholas
Miklos Orosz
J. Patton
Brian Penny
Patrick Picher
Paul Pillitteri
Alvaro Portillo
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Bertrand Poulin
Paulette Payne Powell
Gustav Preininger
Iulian Profir
Pierre Riffon
Michael Roberts
Oleg Roizman
Marnie Roussell
Thomas Rozek
Dinesh Sankarakurup
Daniel Sauer
Gregg Sauer
Bartien Sayogo
Hyeong Sim
Tarkeshwar Singh
Charles Smith
James Smith
Jerry Smith
John Stein

John Sullivan
S. Thamilarasan
James Thompson
Subhash Tuli
Joe Uchiyama
John Vergis
Jane Verner
Loren Wagenaar
Barry Ward
Thomas Wier


When the IEEE-SA Standards Board approved this recommended practice on 17 June 2010, it had the
following membership:
Robert M. Grow, Chair
Richard H. Hulett, Vice Chair
Steve M. Mills, Past Chair
Judith Gorman, Secretary

Karen Bartleson
Victor Berman
Ted Burse
Clint Chaplin
Andy Drozd
Alexander Gelman
Jim Hughes

Young Kyun Kim
Joseph L. Koepfinger*
John Kulick
David J. Law
Hung Ling
Oleg Logvinov
Ted Olsen

Ronald C. Petersen
Thomas Prevost
Jon Walter Rosdahl
Sam Sciacca
Mike Seavey
Curtis Siller
Don Wright
*Member Emeritus


Also included are the following nonvoting IEEE-SA Standards Board liaisons:

Satish K. Aggarwal, NRC Representative
Richard DeBlasio, DOE Representative
Michael Janezic, NIST Representative

Don Messina
IEEE Standards Program Manager, Document Development

Matthew J. Ceglia
IEEE Standards Program Manager, Technical Program Development


vii
Copyright 2010 IEEE. All rights reserved.
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Contents
1. Overview.................................................................................................................................................... 1
1.1 Scope ................................................................................................................................................... 1
1.2 Purpose ................................................................................................................................................ 1
2. Normative references.................................................................................................................................. 2
3. Definitions.................................................................................................................................................. 2
4. Specification of PD measuring circuits ...................................................................................................... 3
4.1 General ................................................................................................................................................ 3
4.2 Coupling capacitor............................................................................................................................... 4
4.3 Measuring impedance.......................................................................................................................... 5
4.4 PD measuring instrument .................................................................................................................... 5
4.5 PD calibrator........................................................................................................................................ 7
4.6 Maintaining the specified parameters of PD measuring circuits ......................................................... 8
5. PD test procedure ....................................................................................................................................... 8
5.1 Calibration ........................................................................................................................................... 8
5.2 PD measurement.................................................................................................................................. 9
Annex A (informative) Design of PD coupling units ................................................................................... 12
Annex B (informative) Response of PD measuring instruments.................................................................. 17
Annex C (informative) Calibration of PD measuring circuits ...................................................................... 20
Annex D (informative) Basic sensitivity check............................................................................................ 21
Annex E (informative) Bushing tap ratio measurement ............................................................................... 23
Annex F (informative) Noise identification ................................................................................................. 24
Annex G (informative) PD pattern recognition............................................................................................ 27
Annex H (informative) Bibliography ........................................................................................................... 29


viii
Copyright 2010 IEEE. All rights reserved.
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IEEE Recommended PracticeGuide for
Partial Discharge Measurement in Liquid-
Filled Power Transformers and Shunt
Reactors




IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental
protection. Implementers of the standard are responsible for determining appropriate safety, security,
environmental, and health practices or regulatory requirements.

This IEEE document is made available for use subject to important notices and legal disclaimers. These
notices and disclaimers appear in all publications containing this document and may be found under
the heading Important Notice or Important Notices and Disclaimers Concerning IEEE Documents.
They can also be obtained on request from IEEE or viewed at http://standards.ieee.org/IPR/disclaimers.html.



1.Overview



1.1Scope

This recommended practice describes the test procedure for the detection and measurement by the wideband
apparent charge method of partial discharges (PDs) occurring in liquid-filled power transformers and shunt reactors
during dielectric tests, where applicable.

1.2 Purpose

PD Partial discharge measurements in transformers and shunt reactors should preferably be made on the basis
of measurement of the apparent charge. Relevant measuring systems are classified as narrowband or wideband
systems. Both systems are recognized and widely used. Without giving preference to one or the other, it is the
object of this document to describe the wideband method. General principles of PD measurements, including the
narrowband method, are covered in IEEE Std 454-1973 [7]
1
, IEC 270 (1981) [2],60270 and IEC 60076-3 (1980)
[1].[B71].
1,2


1
Information on references can be found in Clause2.
2
The numbers in brackets correspond to those of the bibliography in AnnexH.
1
The numbers in brackets correspond to those of the references in Section 3
2
IEC publications are available from IEC Sales Department, Case Postale 131, 3 rue de Varemb, CH 1211, Genve 20, Switzerland/Suisse. IEC
publications are also available in the United States from the Sales Department, American National Standards Institute, 11 West 42nd Street, 13th
Floor, New York, NY 10036, USA.



2. Normative references

The following referenced documents are indispensable for the application of this document (i.e., they must be
understood and used, so each referenced document is cited in text and its relationship to this document is explained).
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For dated references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments or corrigenda) applies. When the standards referred to in this guide are
superseded by an approved revision, the latest revision shall apply.[1]


IEC 60270, High-voltage test techniquesPartial discharge measurements.
3
[2] IEC 270 (1981), 76-3 (1980), Power transformers; Part 3: Insulation levels and dielectric tests.
2


[3] IEEE Std 4, IEEE Standard Techniques for High Voltage Testing.
4 , 5


IEEE Std C57.12.00-1987, , IEEE Standard General Requirements for Liquid-Immersed Distribution, Power, and
Regulating Transformers (ANSI).
3


IEEE Std C57.12.90-1987, IEEE Standard Test Code for Liquid-Immersed Distribution, Power, and
Regulating Transformers (ANSI).
Transformers; and Guide for Short-Circuit Testing of Distribution and Power Transformers [5]
4-1978, IEEE Standard Techniques for High Voltage Testing (ANSI).
IEEE Std C57.19.00, [6] IEEE Std 21-1976 IEEE Standard General Requirements and Test Procedures for
OutdoorPower Apparatus Bushings.(ANSI).

[7] IEEE Std 454-1973 (Withdrawn), IEEE Recommended Practice for the Detection and Measurement of Partial
Discharges (Corona) During Dielectric Tests.
4



3.Definitions

For the purposes of this document, the following terms and definitions apply. The IEEE Standards
Dictionary: Glossary of Terms & Definitions should be referenced for terms not defined in this clause.
6


partial discharge: An electric discharge that only partially bridges the insulation between conductors.

apparent charge (terminal charge), q: A charge that, if it could be injected instantaneously between the terminals of
the test object, would momentarily change the voltage between its terminals by the same amount as the partial
discharge itself. The apparent charge should not be confused with the charge transferred across the discharging cavity in
the dielectric medium. Apparent charge, within the terms of this document, is expressed in coulombs, abbreviated C.
One pC is equal to 10
-12
C.
apparent charge level: Mean value of the apparent charge of partial discharge (PD) pulse trains measured in terms
of picocoulomb (pC) by means of PD instruments.

NOTEAs specified in 4.5.
7



repetition rate, n: The partial discharge pulse repetition rate, n, is the average number of partial discharge pulses per
second measured over a selected period of time.

acceptable terminal partial discharge level: The specified maximum terminal partial discharge value for which
measured terminal partial discharge values exceeding said value are considered unacceptable. The method of
measurement and the test voltage for a given test object should be specified with the acceptable terminal partial
discharge level.

voltage related to partial discharges: The phase-to-ground alternating voltage whose value is expressed by its peak
divided by 2 .

partial discharge-free test voltage: A test procedure, at which the test object should not exhibit partial
discharges above the acceptable energized background noise level

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calibrating charge: Charge of artificial partial discharge (PD) pulses generated by PD calibrators.

NOTEAs specified in 4.6.

frequency response: Transfer impedance of the partial discharge (PD) measuring instrument versus the frequency
characterized by the lower and upper limit frequency, f
1
and f
2
.

NOTEAs specified voltage, applied in accordance with a4.5.

PD calibrating circuit: Interconnection of the partial discharge (PD) calibrator with the test object and the PD
measuring circuit intended for the determination of the scale factor, S
f
.

NOTEAs specified in 4.6.

energized background noise level: Stated in pC, the residual response of the partial discharge measurement system to
background noise of any nature after the test circuit has been calibrated and the test object is energized at 50% of its
nominal operating voltage.

acceptable energized background noise level: Energized background noise level present during test that is
considered acceptable.

bushing tap: Connection to a capacitor foil in a capacitively graded bushing designed for voltage or power factor
measurement that also provides a convenient connecting point for partial discharge measurement. The tap-to-phase
capacitance is generally designated as C
1
, and the tap-to-ground capacitance is designated as C
2
. See bushing potential
tap, bushing test tap, and capacitance (of bushing) in IEEE Std 21-1976 [6].


3
IEC publications are available from the Central Office of the International Electrotechnical Commission, 3, rue de Varemb, P.O. Box 131,
CH-1211, Geneva 20, Switzerland (http://www.iec.ch/). IEC publications are also available in the United States from the Sales Department,
American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http://www.ansi.org/).
4
IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA
(http://standards.ieee.org).
5
The IEEE standards or products referred to in Clause 2 are trademarks owned by the Institute of Electrical and Electronics Engineers,
Incorporate d.
6
The IEEE Standards Dictionary: Glossary of Terms & Definitions is available at http://shop.ieee.org/.
7
Notes in text, tables, and figures of a standard are given for information only and do not contain requirements needed to implement this standard.


PD measuring circuit: Interconnection of the partial discharge (PD) measuring instrument with the measuring
impedance and the coupling capacitor intended for measuring the apparent charge level.

pulse train response: Reading of the partial discharge (PD) measuring instrument versus the repetition frequency of
injected calibrating pulses.

NOTEAs specified in4.6.

specified apparent charge level: Apparent charge level permitted for the test object if subjected to the partial
discharge (PD) test procedure and conditioning stated in IEEE Std C57.12.90 and EEE Std C57.19.00.



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2
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9

2
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:
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9

-
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.
4. Specification of PD measuring circuits



4.1 General

To measure the apparent charge, the following major circuit components are required:

Coupling unit, which captures the PD signal from the terminals of the test object

Measuring instrument, which processes the captured PD pulses and evaluates the apparent charge level

Associated high-voltage (HV) and low-voltage (LV) leads and measuring cables, which connect the individual
components

Generally the coupling unit contains a coupling capacitor, C
k
, which is connected in series with measuring impedance,
Z
m
. If the test object is equipped with capacitive graded bushings, the capacitance between HV conductor and bushing
tap, C
1
, may substitute the coupling capacitor, C
k
, as illustrated in Figure 1.










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2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

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.
Figure 1PD measuring circuit using the bushing tap coupling mode

C
0
Calibrating capacitor
C
1
Capacitance between HV conductor and bushing tap
C
2
Capacitance between bushing tap and grounded bushing flange
C
a
Virtual capacitance of the test object

D
c
Coupling device
F
i
Noise rejection filter
H
v
Connection to the HV test supply

M
c
Measuring cable
M
i
Measuring instrument
P
c
PD calibrator

T
o
Test object
V
0
Step pulse generator
Z
m
Measuring impedance


The HV connection leads between the test object and coupling capacitor should be PD-free up to the highest
applied ac test voltage level. The ground connection leads should be kept as short as possible in order to reduce the
inductance and thus to minimize the impact of electromagnetic interferences disturbing sensitive PD measurements.
Optional HV and LV filters may also be utilized to reduce the influence of environmental disturbances.



4.2 Coupling capacitor

The coupling capacitor, C
k
, is intended for the decoupling of the high-frequency PD signal from the terminals of the
test object at low attenuation, due to the high-pass filter characteristics of this unit. Additionally the ac test voltage
level appears extremely reduced at the output of C
k
. This response is also achieved, if instead of the coupling
capacitor, C
k
, the capacitance between HV conductor and bushing tap, C
1
, is utilized. To minimize the impact of
stray capacitances on PD test results, the capacitance of C
k
and C
1
should exceed 300 pF. Moreover, these units
should be PD-free up to the maximum applied ac test voltage level.



4.3 Measuring impedance

The measuring impedance, Z
m
, is intended for the conversion of PD current pulses into equivalent voltage pulses.
Using the classical coupling mode by means of a separate coupling capacitor, the measuring impedance, Z
m
, is
generally formed by a parallel connection of a resistor, R
m
, with an inductor, L
m
; see Annex A.

If the bushing tap coupling mode according to Figure 1 is used, the measuring impedance, Z
m
, consists of the parallel
connection of a resistor, R
m
, and an inductor, L
m
. Both elements are additionally shunted by the capacitance
between bushing tap and grounded bushing flange, C
2
; see Annex A.

Moreover, passive and active elements could be utilized for PD signal filtering and overvoltage protection. All these
elements are usually integrated in a terminating box, referred to in IEC 60270 as a coupling device, D
c
.

Due to the high-pass filter characteristics of the series connection of either C
k
or C
1
with the measuring impedance,
Z
m
, care should be taken that the specified lower limit frequency, f
1
, of the complete PD measuring circuit is not
substantially affected by the parameters of the PD coupling unit; see Annex A.
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2
-
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9

2
1
:
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1
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2
9

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5
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.
WARNING

In order to minimize any danger for the operator and the instrumentation, as well as to ensure an optimum signal
transmission, the coupling device should always be located inside the HV test area. The coupling device shall be
attached physically as close as possible to the bushing tap or to the coupling capacitor.



4.4 PD measuring instrument

For measuring the apparent charge, either the analog or the digital signal processing can be utilized. Independent from
the measuring principle applied, the instrumentation is generally equipped with the following major units:

Attenuator, to adjust the magnitude of the input PD pulses

Band-pass filter amplifier, to amplify and integrate the captured PD pulses

Peak detector, to evaluate the apparent charge level

To ensure comparable and reproducible PD test results, both the frequency response and the pulse train response of
PD measuring instruments should be specified.


4.4.1 Frequency response

To measure the apparent charge level the captured PD current pulses are integrated. For this purpose usually a
band-pass filter is utilized, characterized by the lower and upper limit frequency, f
1
and f
2
, and the bandwidth, f,
given by Equation (1):



f = f
2
f
1
(1)
To keep the integration error as low as possible, the PD measurement is performed in a frequency range where the
amplitude-frequency spectrum of the PD pulses is nearly constant; see Annex B.

From a practical point of view the lower limit frequency, f
1
, should be located around 100 kHz. Lower values may
minimize the impact of attenuation of PD pulses propagating along transformer windings. However, this may also lead
to serious disturbances, such as iron core related noises as well as harmonics from the ac test facility. To reduce the
impact of interferences in the low-frequency range the high-pass filter characteristics should be such that the
attenuation is about 40 dB for frequencies around 25 kHz and at least 60 dB for frequencies below 15 kHz.

To minimize the integration error, the upper limit frequency, f
2
, should be chosen around 300 kHz. To reduce
interferences of radio broadcast stations, the attenuation should exceed 20 dB for frequencies above 500 kHz and at
least 40 dB for frequencies above one MHz

From the specified frequencies, f
1
and f
2
, it follows that the bandwidth, f, has a value of 200 kHz. A wider
bandwidth would be useful for the localization of PD sites, but this may lead to an increasing measuring error, because
the PD pulses may not be integrated as desired; see Annex B.


4.4.2 Pulse train response

To evaluate the apparent charge level of random distributed PD pulse trains, the pulse magnitudes should be
averaged in compliance with IEC 60270. This is accomplished if the characteristic charging time constant,
1
, and
discharging time constant,
2
, of the peak detector, as part of the PD measuring instrument, satisfy the
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9

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1
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:
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9

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5
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0

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.
condition
1
<<
2
< 440 ms.


NOTE 1If the pulse train response differs significantly from those recommended in IEC 60270 the actual dependence
of the reading, R
i
, versus the pulse repetition rate, N, should be determined in order to judge the evaluation of the apparent charge
level.

NOTE 2To eliminate stochastically appearing noise pulses at comparatively low repetition rate, for instance one pulse per
cycle of the applied ac test voltage, some PD detectors are equipped with special features for noise suppression which
may reject pulses having a repetition rate below 100 Hz. Care should be taken when using this instrumentation because PD pulses
of high magnitude may not be recognized if they do not ignite in each half-cycle of the applied ac test voltage. To avoid such
erroneous measurements, a visualization of the phase-resolved PD pulses is strongly recommended using a suitable display unit,
such as a scope or a computer.

NOTE 3The specified pulse train response is appropriate only for ac test voltages where the frequency may range between 40
Hz and 400 Hz. For dc test voltages or test voltages composed by ac and dc voltages, it is recommended to evaluate the number
versus the magnitude of PD pulses.


4.4.3 Display unit

In addition to the measurement of the apparent charge level by means of analog or digital meters it is strongly
recommended to display the phase-resolved PD patterns by means of a suitable display unit, such as an oscilloscope
or a computer. This may assist not only the identification and classification of harmful PD defects but also the
discrimination of disturbing electromagnetic interferences, which are often not phase-correlated.

4.4.4 Basic sensitivity

The basic sensitivity should be determined by means of calibrating pulses specified in 4.6, which are injected into the
input of the measuring impedance connected to the PD measuring instrument via the associated measuring cable. A
calibrating charge of 50 pC should cause a minimum deflection of 50% of the full reading of the indicating
instrument or of the optional display unit.


4.4.5 Linearity

The linearity should be determined by means of calibrating pulses specified in 4.6, which should be injected
in the measuring impedance connected via the associated measuring cable to the PD measuring instrument. The
measuring sensitivity should be adjusted such that the full reading (100%) is obtained for an injected calibrating
charge of 500 pC. After that the magnitude of the calibrating charge should be reduced stepwise by 100 pC. Under
this condition the values indicated by the PD measuring instrument should not deviate by more than 10% from the
true magnitudes of the injected pulse charges.



4.5 PD calibrator

The PD calibrator is intended for the simulation of the charge transfer from the PD source to the terminals of the test
object; see Annex C. To generate artificial PD pulses required for this purpose, the calibrator is generally equipped
with a pulse generator connected in series with a calibrating capacitor, C
0
; see Figure 1. The pulse generator produces
fast rising step voltages of known magnitudes, V
0
. Therefore the calibrating charge is given by Equation (2):


q
0
= V
0
C
0
(2)
The PD calibrator should meet the requirements of IEC 60270. To adjust the desired magnitude of the
calibrating charge, q
0
, the magnitude of the voltage step, V
0
, and the capacitance of the calibrating capacitor, C
0
, can
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0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

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5
0
0

b
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.
be tuned accordingly. The calibrating charge should be adjustable between 50 pC and 1000 pC. These magnitudes
should not differ by more than 10% from the rated values.

To minimize the measuring error caused by non-controlled distortions of the pulse shape, care has to be taken that the
conditions C
0
< 200 pF and C
0
< 0.1 C
a
are satisfied. A simplified approach for the evaluation of C
a
is
presented in Annex D. To avoid any superposition errors and thus to minimize the impact of the pulse train
response on the reading of the PD measuring instrument, the repetition frequency of the calibrating pulses should be
in the range of 100 Hz to 1000 Hz, inclusive.

The output impedance of the step pulse generator should not exceed 100 . The rise time of the step pulse, which
refers to the 10% and 90% values of the maximum pulse magnitude, should be less than 100 ns. After the peak is
obtained the voltage magnitude should not differ more than 5% from the mean value for a time span not shorter than
50 s. The decay time, which refers to the 90% and 10% values of the pulse magnitude, should either be the same as
the rise time, if bipolar calibrating pulses are created, or it should exceed 200 s if pulses of only positive or negative
polarity are created.

To display the calibrating pulses when the actual PD test under high voltage is running, the calibrating capacitor, C
0
,
which is usually designed only for low voltages, should be substituted by an HV calibrating capacitor, this should be
PD-free up the maximum ac test voltage level. The measuring cable between the step pulse generator and the
terminating box connected to the input of the HV calibrating capacitor should be matched with the characteristic
cable impedance in order to avoid disturbing pulse reflections. Generally the HV calibrating capacitor should be
located as close as possible to the HV terminal of the test object.

The objective of the calibration procedure is to determine the scale factor, S
f
, which represents the ratio between the
calibrating charge, q
0
, injected between the terminals of the test object, and the reading, R
0
, of the PD measuring
instrument [see Equation (3)]:

S
f
= q
0
/ R
0
(3)
To evaluate the apparent charge level, q
a
, under HV test conditions the reading, R
i
, of the PD instrument is multiplied
by the scale factor, S
f
[see Equation (4)]:

q
a
= R
i
S
f
= q
0
R
i
/ R
0
(4)
This means the apparent charge level can be determined if the calibrating charge, q
0
, is multiplied by the
reading,
R
i
, due to PD events, and divided by the reading, R
0
, caused by the calibrating charge.




4.6 Maintaining the specified parameters of PD measuring circuits

To verify the specified technical parameters of the PD measuring circuits including the PD calibrator, performance
checks should be performed at least once a year and after repair. The scale factor, S
f
, of the PD measuring circuit
and the values of the pulse charges, q
0
, created by the PD calibrator shall be kept in a record of performance
established and maintained by the user. Additionally, type tests, routine tests, and performance tests should be
performed in compliance with the recommendations of IEC 60270.




C
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)
.


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d
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n
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d

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n

2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
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3
.

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o

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d
.
5. PD test procedure



5.1 Calibration


5.1.1 PD measuring circuit

Before starting the first HV test, the complete PD measuring circuit according to Figure 1 should be calibrated to
establish the scale factor, S
f
; see 4.6. For calibration, all equipment should be set up exactly as used during the PD
test. If the test object is a three-phase transformer, the calibration should be performed at each terminal in turn, while
making sure that the PD measuring instrument is always connected to each phase using either the bushing tap coupling
mode or a separate coupling capacitor.

The calibrating pulses should be injected between the top of the HV bushing and the transformer tank, as evident from
Figure 1. Generally, a portable battery powered PD calibrator should be used. If desired, a suitable pulse generator
along with a terminating box connected to a suitable HV calibrating capacitor may also be used in order to display the
calibrating pulses during the running HV test, and to adjust the magnitudes of the calibrating charge from the control
room.

The connecting leads between the calibrator and test object should be kept as short as possible in order to avoid pulse
distortions that may cause calibration errors. Therefore, the portable calibrator or the terminating box in
connection with the HV calibrating capacitor should be placed as close as possible to the HV terminals of the test
object. At least four separate calibrating charge levels should be injected to check the linearity of the PD measuring
instrument. For a specified apparent charge level of q
a
= 500 pC, the calibration should be performed with the values
q
01
= 100 pC, q
02
= 200 pC, q
03
= 500 pC, and q
04
=1000 pC.


5.1.2 AC test voltage measuringcircuit

The ac test voltage measuring circuit should be calibrated in accordance with the requirements of IEEE Std 4
as well as in compliance with IEC 60060-1 [B69] and IEC 60060-2 [B70]. If an ac voltage measuring instrument
is connected to the voltage output of the coupling device or to the bushing tap, either the capacitive divider ratio
should be determined as reported in Annex E, or the complete ac measuring circuit should be calibrated using a
reference measuring system.



5.2 PD measurement


5.2.1 PD test circuits

Figure 2 shows a circuit recommended for PD tests under induced voltage, i.e., the HV winding of the single-phase
power transformer is excited through the LV winding. The LV test voltage source should be designed as specified in
IEEE Std C57.12.00 and IEEE Std C57.12.90, which requires simulations of the actual operating configuration.

An optional LV filter may be required to reduce interferences coming from the ac power supply. The HV and LV
connection leads should be kept as short as possible in order to minimize the inductance and thus to reduce the impact
of electromagnetic noises.

The coupling device, which is generally equipped with the measuring impedance and additional elements for signal
filtering and over-voltage protection as well as with the LV arm of the voltage divider, should be placed as close as
possible to the bushing tap. The signal outputs of the coupling device for the PD pulses and the ac test voltage are
C
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o
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a
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b
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,

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.

(
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)
.


T
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c
o
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d
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n
l
o
a
d
e
d

o
n

2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
y

a
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t
h
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i
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d

u
s
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r

C

n
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t
y

C
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D

D
i
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n

3
.

N
o

f
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p
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i
s

p
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r
m
i
t
t
e
d
.
connected via measuring cables to the PD measuring instrument and to an ac voltmeter.




























Figure 2PD measuring circuit for power transformers using induced test voltage

In addition to the reading instrument of the PD measuring instrument a display unit, such as a scope or a
computerized PD measuring system should be utilized, which may be useful not only for the identification and
classification of harmful PD sources (CIGRE TF 15.11/33.03.02 [B34], CIGRE WG 21-03 [B40], CIGRE WG D1.33
[B41], Fuhr [B52], Fuhr et al. [B53], Fryxell et al. [B54]) but also for the discrimination of disturbing noises in the
surroundings.

Figure 3 shows a test circuit recommended for PD tests of power transformers and shunt reactors excited by a step-up
transformer. If an appropriately rated step-up transformer is not available, a series resonant test circuit can also be
used where the inductance of the test object is compensated by a capacitor bank. An optional HV filter may be
required on the HV side in order to minimize the impact of disturbing interferences coming from the step-up
transformer. Additionally a filter may be helpful for noise rejection if positioned on the LV side of the step-up
transformer.


5.2.2 Test procedure

The PD test procedure and the ac test voltage level applied should be as specified in IEEE Std C57.12.00, IEEE Std
C57.12.90, and IEEE Std C57.19.00. For the actual PD test, the ac test voltage level should first be raised up to 50%
of the rated voltage of the test object. The energized background noise should then be evaluated in terms of pC and
recorded for each phase for a time interval of 60 s, where the average energized background noise level should
not exceed a relative value of 50% of the specified apparent charge level. The ac test voltage is then raised up to
the one-hour test value and held constant long enough to verify if there are any PD problems. The ac test voltage is
then raised to the enhancement level and held constant for 7200 cycles. The voltage is next reduced directly back to
the one-hour test level and held constant for 60 min or even more if desired. During the 60 min period for each
bushing terminal, the apparent charge level should be evaluated for a recording time of 60 s, which should be repeated
at subsequent intervals of 5 min.

C
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.

(
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.


T
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d
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o
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d

o
n

2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
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3
.

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b
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n

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s

p
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m
i
t
t
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d
.
































Figure 3PD measuring circuit for shunt reactors energized by a step-up ransformer


5.2.3 Interpretation of PD test results
The PD test results should be considered acceptable and no further PD tests are required under the following
conditions:


a) The apparent charge level, q
a
, measured during the one-hour test does not exceed the specified apparent
charge level, q
s
, stated in IEEE Std C57.12.90 and IEEE Std C57.19.00.

b) The increase in the apparent charge level, q
a
, during the one-hour test does not exceed a value of
q
s
, as stated in IEEE Std C57.12.00, IEEE Std C57.12.90, and IEEE Std C57.19.00.

c) The apparent charge level, q
a
, during the one-our test period does not exhibit any steadily rising trend, and
no sudden sustained increase in the level occurs during the last 20 min of the test.

Judgment should be used on the 5 min test intervals so that momentary excursions of the PD readings caused by
cranes or other ambient sources are not recorded. The test may be extended or repeated until acceptable results are
obtained. A failure to meet the PD acceptance criterion should not warrant immediate rejection but lead to
consultation between the purchaser and manufacturer about further actions.
C
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.

(
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.
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)
.


T
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i
s

c
o
p
y

d
o
w
n
l
o
a
d
e
d

o
n

2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
y

a
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t
h
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i
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d

u
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r

C

n
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t
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C
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X
D

D
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n

3
.

N
o

f
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p
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n

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b
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i
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n

i
s

p
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m
i
t
t
e
d
.

9. Partial Discharge Measurement During Induced Voltage Tests


Partial discharge measurements are normally performed during the induced voltage tests. The duration of the test, the
time sequence for the application of test voltage, connection and grounding of windings, and the test voltage values
should be as specified in IEEE C57.12.90-1987 [4] and IEEE C57.12.00-1987 [3]. Further information on partial
discharge measurement may be found in IEEE Std 454-1973 [7].


9.1 Test Procedure

The voltage should first be raised to 50% of the rated voltage value of the test object, and the energized background
noise should then be measured and recorded on each measured terminal. The acceptable energized background noise
level should not exceed 50% of the acceptable terminal partial discharge level and, in any case, should be below 100
pC. The voltage is then raised to the one-hour test level and held there long enough to verify that there are no
partial discharge problems. The voltage is then raised to the enhancement level and held for 7200 cycles. The voltage is
next reduced directly back to the one-hour test level and held for 60 min or more.

During the 60 min period, partial discharge measurements should be made at 5 min intervals on each terminal of 115 kV
class and above In terms of interpretation of partial discharge measurements, the results should be considered acceptable
and no further partial discharge tests required if

1) The magnitude of the PD level does not exceed the acceptable terminal partial discharge level.
2) The increase in PD levels during the 60 min period does not exceed 39% of the acceptable terminal partial
discharge level.
3) The PD levels during the 60 min period do not exhibit any steadily rising trend and there is no sudden,
sustained increase in levels during the last 20 min of the tests.

If the PD level rises above the specified limit for a significant time and then returns below this level again, the test may
continue without interruption until acceptable readings have been obtained for 60 min. Occasional high readings
should be disregarded. As long as no breakdown occurs, and unless very high levels of partial discharge are sustained
for a long period of time, the test is regarded as nondestructive. A failure to meet the partial discharge acceptance
criteria should not therefore warrant immediate rejection, but should lead to consultation between purchaser and
manufacturer about further investigations.

C
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2
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2
-
1
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0
9

2
1
:
5
1
:
2
9

-
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5
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0

b
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.
Annex A

(informative)

Design of PD coupling units

A.1 Conventional coupling mode


PD measuring circuits in compliance with IEC 60270 are generally equipped with a separate coupling capacitor, C
k
,
which is connected in series with measuring impedance, Z
m
; see Figure A.1. For wideband measurement of the
apparent charge the lower limit frequency, f
1
, should be chosen significantly above 50 kHz in order to minimize
the impact of low-frequency noises, such as harmonics excited by the ac test supply as well as iron core related
noises. Because the PD coupling circuit unit illustrated schematically in Figure A.1 represents a high-pass filter, it
seems obvious to tune the desired lower limit frequency, f
1
, by the relevant circuit parameters C
k
, R
m
, and L
m
.





















Figure A.1Conventional coupling unit using a separate coupling capacitor

C
a
Virtual test object capacitor
C
k
Coupling capacitor
L
m
Shunt inductor
R
m
Measuring resistor
T
o
Test object
Z
m
Measuring impedance

For better understanding a practical example will be considered based on the following parameters:


Lower limit frequency: f
1
= 70 kHz

Capacitance of the HV coupling capacitor: C
k
= 1 nF


The lower limit frequency of the circuit according to Figure A.1 is given by Equation (A.1):

C
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.


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2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
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C

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D
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3
.

N
o

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.

f
1
= 1 / (2 C
k
R
m
)
(A.1)

Therefore the value in Equation (A.2) is required for the measuring resistor:

R
m
= 1 / (2 C
k
f
1
) = 2.27 k
(A.2)
Under practical conditions, however, the ac test voltage applied may cause an HV magnitude across R
m
, which
may become harmful not only for the PD measuring equipment but also for the operator. If, for instance, an
induced test is performed using a frequency of f
ac
= 400 Hz, the capacitive impedance of the coupling capacitor, C
k
,
is given by Equation (A.3):

Z
c
= 1 / (2 C
k
f
ac
) = 1 / (2 1 nF 400 Hz) = 398 k
(A.3)
Based on Equation (A.2) and Equation (A.3) the divider ratio is D
r
= 2.27 k / 398 k = 1 / 174. That means, an
assumed ac test voltage magnitude of 800 kV would cause a peak voltage across R
m
of almost
7000 V. This value
can effectively be reduced if the resistor R
m
is shunted by an inductor L
m
; see Figure
A.1. In this context care has
been taken that the lower cut-off frequency, f
1
, of the PD measuring circuit is not decreased substantially. This
requirement is accomplished by the condition shown in Equation (A.4):

L
m
> 10 R
m
/ (2 70 kHz) = 53 mH
(A.4)

From the previous example, where a test frequency of f
ac
= 400 Hz was assumed, the inductive impedance becomes,
as shown in Equation (A.5):

Z
l
= 2 400 Hz L
m
= 130
(A.5)
Therefore, the divider ratio is given by D
r
=130 / 398 k = 1 / 3060. That means that an ac test voltage level of
800 kV is attenuated from a value of originally 7000 V down to about 400 V, which can well be accepted.
To record the PD pulses in a phase-resolved manner using a display unit, such as a scope or a computer- based PD
measuring system, the PD coupling unit can be configured accordingly, as illustrated in Figure A.2. Here the
LV arm of the capacitive divider is represented by a measuring capacitor designated as C
m
. Due to the very
different frequency spectra of the PD pulses and the ac test voltage, both signals appear completely separated at the
both outputs: PD and ac. The resulting impedance of the parallel connection of the circuit elements R
m
and L
m
is
mainly governed by the inductive impedance Z
l
= 130 ; see Equation (A.5). Consequently the impact of this circuit
on the phase shifting of the ac test voltage can be neglected due to the much higher impedance of C
k
which is
Z
c
= 398 k; see Equation (A.3). Therefore, the desired divider ratio can simply be approximated by D
r
= C
k
/
C
m
. For an assumed voltage divider ratio of D
r
= 1 / 10 000 follows, for instance, a value for the measuring capacitor
Of:










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-
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0
9

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:
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1
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p
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d
.




















Figure A.2PD coupling device equipped with a measuring capacitor for displaying the ac test
voltage

AC Output for ac test voltage C
a

Virtual test object capacitor C
k
Coupling
capacitor
C
m
Measuring capacitor
D
c
Coupling device
GD Ground termination
L
m
Shunt inductor
PD Output for PD pulses

A.2 Bushing tap coupling mode

If instead of a separate coupling capacitor, C
k
, the capacitance between the HV conductor and bushing tap, C
1
, is
utilized for capturing the PD transients, it has to be taken into consideration that the capacitance between bushing tap
and grounded bushing flange, C
2
, may affect the frequency response, as will be discussed more in detail in the
following. The main circuit elements of the bushing tap coupling mode are llustrated in Figure A.3. For the following
considerations, first the impact of the shunt inductor, L
m
, shall be neglected. Therefore the lower limit frequency of
this network can be expressed by Equation (A.7):


f
1
= 1 / (2 R
m
(C
1
+ C
2
))
(A.7)
The value of C
1
is given by the bushing utilized for the decoupling of the PD signal. This parameter can therefore
not be varied. Consequently it can only be adjusted by varying the measuring resistor, R
m
, as well as by an
additional capacitor connected parallel to C
2
. For better understanding consider the following practical example:






C
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.


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2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
y

a
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C

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3
.

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o

f
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h
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n

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.
Desired lower limit frequency: f
1
= 70 kHz
Capacitance between HV conductor and bushing tap: C
1
= 500 pF
Capacitance between busing tap and grounded bushing flange: C
2
= 2500 pF























Figure A.3Equivalent circuit of the bushing tap coupling mode

B
u
Bushing
B
t
Bushing tap
C
1
Capacitance between HV conductor and bushing tap

C
2
Capacitance between bushing tap and grounded bushing flange
C
a
Virtual test object capacitance
L
m
Shunt inductor

R
m
Measuring resistor
T
o
Test object
Z
m
Measuring impedance


Inserting these values in Equation (A.7) we get R
m
760 . To avoid a reduction of f
1
by the frequency dependent
impedance of, L
m
, the condition Z
l
> 10 R
m
at f
1
= 70 kHz should be satisfied, which is fulfilled for L
m
> 17 mH.

To estimate the portion of the ac test voltage magnitude appearing across the shunt inductor, L
m
, and thus across the
measuring impedance, Z
m
, a maximum test frequency of f
ac
= 400 Hz should be assumed. Under this condition the
frequency dependent impedances of L
m
and C
1
are given by Z
l
43 and Z
c
795 k, respectively.
Consequently the divider ratio is given by D
r
= 43 / 795 k 1 / 18 000. That means a maximum ac test
voltage level of, for instance, 800 kV is attenuated down to about 45 V, which is harmless for the instrumentation
and the operator as well.
C
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t
y

o
f

V
i
e
t
n
a
m

b
y

T
h
o
m
s
o
n

S
c
i
e
n
t
i
f
i
c
,

I
n
c
.

(
w
w
w
.
t
e
c
h
s
t
r
e
e
t
.
c
o
m
)
.


T
h
i
s

c
o
p
y

d
o
w
n
l
o
a
d
e
d

o
n

2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
y

a
u
t
h
o
r
i
z
e
d

u
s
e
r

C

n
g

t
y

C
P

T
u

V
a
n

X
D

D
i
e
n

3
.

N
o

f
u
r
t
h
e
r

r
e
p
r
o
d
u
c
t
i
o
n

o
r

d
i
s
t
r
i
b
u
t
i
o
n

i
s

p
e
r
m
i
t
t
e
d
.

The bushing tap coupling mode also provides a convenient tool for displaying the ac test voltage, as illustrated in
Figure A.4. For C
1
= 500 pF the measuring capacitance should be C
m
= 5 F, if a voltage divider ratio of D
r
= 1 / 10
000 is desired.


























Figure A.4Bushing tap coupling mode capable for displaying the ac test Voltage

B
u
Bushing
B
t
Bushing tap

C
1
Capacitance between HV conductor and bushing tap
C
2
Capacitance between bushing tap and grounded bushing flange
C
a
Virtual test object capacitance

C
m
Measuring capacitor
GD Ground connection
L
m
Shunt inductor
R
m
Measuring resistor
T
o
Test object

Z
m
Measuring impedance




C
o
p
y
r
i
g
h
t
e
d

m
a
t
e
r
i
a
l

l
i
c
e
n
s
e
d

t
o

E
l
e
c
t
r
i
c
i
t
y

o
f

V
i
e
t
n
a
m

b
y

T
h
o
m
s
o
n

S
c
i
e
n
t
i
f
i
c
,

I
n
c
.

(
w
w
w
.
t
e
c
h
s
t
r
e
e
t
.
c
o
m
)
.


T
h
i
s

c
o
p
y

d
o
w
n
l
o
a
d
e
d

o
n

2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
y

a
u
t
h
o
r
i
z
e
d

u
s
e
r

C

n
g

t
y

C
P

T
u

V
a
n

X
D

D
i
e
n

3
.

N
o

f
u
r
t
h
e
r

r
e
p
r
o
d
u
c
t
i
o
n

o
r

d
i
s
t
r
i
b
u
t
i
o
n

i
s

p
e
r
m
i
t
t
e
d
.
Annex A
(Informative)


(This appendix is not part of IEEE C57.113-1991, IEEE Guide for Partial Discharge Measurement in Liquid-Filled Power
Transformers and Shunt Reactors, but is included for information only.)


A1 Partial Discharge Recognition

One of the greatest advantages of the wide-band method is the ease with which the results can be displayed on a
cathode ray oscilloscope, which means that the PD signal can be observed in terms of the phase of the applied test
voltage. This is of great help in determining whether or not the discharges originate inside the test object. The pulse
polarity can also be identified, and pulses may be counted and sorted according to their amplitude or polarity, or both.
Digital processing of PD signals by computer is also possible.

Examples of the most common oscillographic patterns encountered during partial discharge tests on large transformers
appear in Fig A1 (see also [B95]
6
and [B62] ). Fig A1(a) represents the case of air corona on the high-voltage
electrode. Fig A1(b) is for air corona on a point on the ground side. Such corona can usually be eliminated by selecting a
high-voltage electrode of larger diameter for case (a) and by covering protrusions on and around the transformer with
rounded metallic shields or semiconductive material, such as rubber, for case (b). These corona discharges are usually
very large, but it should be pointed out that they appear only during one half-cycle of the applied voltage. Small
discharges are present on the other half-cycle but are so low in amplitude that they usually cannot be observed.

The case shown in Fig A1(c) occurs when ungrounded metallic objects are present on or near the transformer under
test. The obvious solution in this case is to remove as many of the loose objects from the test area as possible and
ground the rest, especially metallic fences.

The case shown in Fig A1(d) is the result of a bad ohmic contact, usually inside the transformer, although it could also be
from the connections outside. Note that, in this case, the discharges occur on both sides of and at the zero-crossings of
the test voltage.

Figs A1(e) and A1(f) represent PDs occurring within the insulation structure of a transformer. They are usually present
on the increasing voltage slope of both half-cycles and do not normally cross the voltage peaks; although they may
extend down to zero-crossings. There is usually a fair amount of hysteresis present, but excessive hysteresis and
rapidly decreasing inception voltage are indicative of PDs in gas bubbles. Fig A1(e) represents PDs in oil-paper
insulation or in gas bubbles. Fig A1(f) represents creeping discharges, which are usually higher in amplitude but less
numerous than those in case (e).

Figs A1(g) and A1(h) represent two cases of external interference. The first is typical of thyristor interference, the
pulses being equally spaced and of roughly the same amplitude. Since the test voltage frequency for transformers is
usually different from the power frequency, the pulses are not synchronized. The number of pulses appearing during
one cycle of the test voltage depends on the ratio of its frequency to that of the power system and on the particular
design of the equipment producing the interference. Usually a range from two to six pulses is seen, even though fewer
than two pulses may be present at every cycle. This is due to the fact that the eye tends to see many superposed cycles at
the same time.

Fig A1(h) is typical of a periodic signal with a frequency falling inside the bandwidth of the PD detector. One such
source of interference in North America is the navigational system, LORAN C, operating at 100 kHz. Other than the
fact that they are not usually synchronized to the test voltage, interference signals are not usually dependent on the test-
voltage level and do not normally disappear when the test voltage is lowered as PD signals do. In normal situations,
these characteristics suffice to identify the signals as interference.
C
o
p
y
r
i
g
h
t
e
d

m
a
t
e
r
i
a
l

l
i
c
e
n
s
e
d

t
o

E
l
e
c
t
r
i
c
i
t
y

o
f

V
i
e
t
n
a
m

b
y

T
h
o
m
s
o
n

S
c
i
e
n
t
i
f
i
c
,

I
n
c
.

(
w
w
w
.
t
e
c
h
s
t
r
e
e
t
.
c
o
m
)
.


T
h
i
s

c
o
p
y

d
o
w
n
l
o
a
d
e
d

o
n

2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
y

a
u
t
h
o
r
i
z
e
d

u
s
e
r

C

n
g

t
y

C
P

T
u

V
a
n

X
D

D
i
e
n

3
.

N
o

f
u
r
t
h
e
r

r
e
p
r
o
d
u
c
t
i
o
n

o
r

d
i
s
t
r
i
b
u
t
i
o
n

i
s

p
e
r
m
i
t
t
e
d
.
Annex B

(informative)

Response of PD measuring instruments



B.1 Frequency response

Due to the high-pass filter characteristics of the PD coupling unit, see Annex A, the voltage jump appearing across the
terminals of the test object as a result of a PD event is differentiated. Therefore, this signal should be integrated
again in order to evaluate the apparent charge of the captured PD pulses. The integration can be performed at
sufficient accuracy if the measuring frequency is chosen below 500 kHz, where the amplitude frequency spectrum of
the PD pulses is nearly constant (Schon [B132], [B133], [B134]); see Figure B.1. Under this condition the output
signal of the PD measuring instrument is a pulse whose magnitude is a measure of the charge of the input pulse. It
should be noted that the duration of the output pulse to be evaluated is much longer than those of the input PD pulse.






















Figure B.1Selection of the band-pass filter characteristics for PD instruments



A Amplitude-frequency spectrum of PD pulses
B Band-pass filter characteristics of the PD measuring instrument

B.2 Pulse trainresponse
PD events occurring under ac test voltages are characterized by pulse sequences whose magnitudes may randomly be
distributed over an extremely wide range. An example is illustrated in Figure B.2, which reveals that the magnitudes
of the apparent charge pulses scatter between about 100 pC and 3000 pC.
C
o
p
y
r
i
g
h
t
e
d

m
a
t
e
r
i
a
l

l
i
c
e
n
s
e
d

t
o

E
l
e
c
t
r
i
c
i
t
y

o
f

V
i
e
t
n
a
m

b
y

T
h
o
m
s
o
n

S
c
i
e
n
t
i
f
i
c
,

I
n
c
.

(
w
w
w
.
t
e
c
h
s
t
r
e
e
t
.
c
o
m
)
.


T
h
i
s

c
o
p
y

d
o
w
n
l
o
a
d
e
d

o
n

2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
y

a
u
t
h
o
r
i
z
e
d

u
s
e
r

C

n
g

t
y

C
P

T
u

V
a
n

X
D

D
i
e
n

3
.

N
o

f
u
r
t
h
e
r

r
e
p
r
o
d
u
c
t
i
o
n

o
r

d
i
s
t
r
i
b
u
t
i
o
n

i
s

p
e
r
m
i
t
t
e
d
.






































Figure B.2PD signatures of surface discharges in a power transformer displayed for one cycle (a
and b) and for 3000 s (c and d) of the applied ac test voltage




To ensure comparable and well-reproducible PD test results, it seems therefore feasible to average the randomly
distributed PD pulse magnitudes. As a consequence, in IEC 60270 the evaluation of the largest repeatedly occurring PD
magnitude is recommended. This PD quantity is equivalent to the apparent charge level as defined in this
recommended practice; see specified apparent charge level in Clause 3.

As can be seen from Figure B.3, after the maximum PD magnitudes are averaged, the apparent charge level can well
be quantified by a value of approximately 2800 pC. This approach is based on a specified pulse train response of the
PD measuring instrument shown in Figure B.4, where the tolerance band is well fitted for the condition
1
<<
2
<
440 ms. Here is
1
the charging time constant and
2
the discharging time constant of the peak detector as part of the
PD measuring instrument. It should be mentioned that CISPR 16-1-1993 [B42] also recommends an averaging of
random distributed noise pulses where the characteristic time constants are specified by
1
< 1 ms and
2
< 160 ms.







C
o
p
y
r
i
g
h
t
e
d

m
a
t
e
r
i
a
l

l
i
c
e
n
s
e
d

t
o

E
l
e
c
t
r
i
c
i
t
y

o
f

V
i
e
t
n
a
m

b
y

T
h
o
m
s
o
n

S
c
i
e
n
t
i
f
i
c
,

I
n
c
.

(
w
w
w
.
t
e
c
h
s
t
r
e
e
t
.
c
o
m
)
.


T
h
i
s

c
o
p
y

d
o
w
n
l
o
a
d
e
d

o
n

2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
y

a
u
t
h
o
r
i
z
e
d

u
s
e
r

C

n
g

t
y

C
P

T
u

V
a
n

X
D

D
i
e
n

3
.

N
o

f
u
r
t
h
e
r

r
e
p
r
o
d
u
c
t
i
o
n

o
r

d
i
s
t
r
i
b
u
t
i
o
n

i
s

p
e
r
m
i
t
t
e
d
.














a) Maximum magnitudes of subsequent PD pulse sequences



































Figure B.4Maximum and minimum reading, R
max
and R
min
, of PD instruments versus the pulse
repetition rate, N, recommended in IEC 60270

C
o
p
y
r
i
g
h
t
e
d

m
a
t
e
r
i
a
l

l
i
c
e
n
s
e
d

t
o

E
l
e
c
t
r
i
c
i
t
y

o
f

V
i
e
t
n
a
m

b
y

T
h
o
m
s
o
n

S
c
i
e
n
t
i
f
i
c
,

I
n
c
.

(
w
w
w
.
t
e
c
h
s
t
r
e
e
t
.
c
o
m
)
.


T
h
i
s

c
o
p
y

d
o
w
n
l
o
a
d
e
d

o
n

2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
y

a
u
t
h
o
r
i
z
e
d

u
s
e
r

C

n
g

t
y

C
P

T
u

V
a
n

X
D

D
i
e
n

3
.

N
o

f
u
r
t
h
e
r

r
e
p
r
o
d
u
c
t
i
o
n

o
r

d
i
s
t
r
i
b
u
t
i
o
n

i
s

p
e
r
m
i
t
t
e
d
.
Annex C

(informative)
Calibration of PD measuring circuits



The objective of the calibration is to determine the scale factor, S
f
, required for evaluating the apparent charge
level, q
a
, from the reading of the PD measuring instrument, R
i
, as shown in Equation (C.1):


q
a
= R
i
S
f
(C.1)
This
procedure is in principle based on a simulation of the charge transfer from the PD source to the
terminals of the test object. For this purpose artificial PD pulses are injected between the terminals of the
test object by means of a calibrator (Lemke [B92], Lemke et al. [B94]); see Figure 1. The scale factor, S
f
, is
determined from the ratio between the calibrating charge, q
0
, and the reading of the PD measuring
instrument, R
0
. Therefore, S
f
is expressed either in terms of pC/scale of the reading instrument or in terms of pC/div
of the display unit.

For better understanding, consider the following practical example:

Calibrating charge injected between the terminals of the test object:



q
0
= 200 pC Reading of the PD instrument: R
0
= 50
scales
Resulting scale factor: S
f
= q
0
/ R
0
= 4 pC /scale

Reading of the PD instrument during the actual PD test: R
i
= 20 scales

Based on these values, the apparent charge can be calculated as shown in Equation (C.2):


q
a
= R
i
S
f
= (20 scales) (4 pC /scale) = 80 pC
(C.2)
It should
be noted that advanced computerized PD measuring instruments are equipped with a feature to
scale the PD data in terms of pC automatically after the calibration procedure has been performed.






C
o
p
y
r
i
g
h
t
e
d

m
a
t
e
r
i
a
l

l
i
c
e
n
s
e
d

t
o

E
l
e
c
t
r
i
c
i
t
y

o
f

V
i
e
t
n
a
m

b
y

T
h
o
m
s
o
n

S
c
i
e
n
t
i
f
i
c
,

I
n
c
.

(
w
w
w
.
t
e
c
h
s
t
r
e
e
t
.
c
o
m
)
.


T
h
i
s

c
o
p
y

d
o
w
n
l
o
a
d
e
d

o
n

2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
y

a
u
t
h
o
r
i
z
e
d

u
s
e
r

C

n
g

t
y

C
P

T
u

V
a
n

X
D

D
i
e
n

3
.

N
o

f
u
r
t
h
e
r

r
e
p
r
o
d
u
c
t
i
o
n

o
r

d
i
s
t
r
i
b
u
t
i
o
n

i
s

p
e
r
m
i
t
t
e
d
.
Annex D

(informative)

Basic sensitivity check


To check the basic sensitivity of the PD measuring instrument, the circuit shown in Figure D.1 could be utilized. Here
the virtual test object capacitance, C
a
, is simulated by an LV capacitor having a value of
10 000 pF. Furthermore, the capacitance between the HV conductor and the bushing tap, C
1
, and the

capacitance between the bushing tap and the grounded bushing flange, C
2
, are simulated by an LV capacitors
having values of, for instance, C
1
= 500 pF and C
2
= 2500 pF, respectively. The measuring impedance, Z
m
, of the
PD measuring circuit is connected to the junction of C
1
and C
2
, which represents the bushing tap coupling mode.

The sensitivity should be such that when a calibrating charge of 25 pC is injected into C
a
the reading of the PD
measuring instrument exceeds at least twice the internal amplifier noise level. This basic sensitivity check needs only
to be performed when installing a new PD measuring system and at specified time intervals, i.e., after each year and
after repair or modification of the components of the PD measuring circuit.























The circuit illustrated in Figure D.1 could also be utilized for an estimation of the virtual test object capacitance, C
a
, if
the internal capacitance of the calibrator, C
0
, is known. This can be done by the following three steps:


1. With all the equipment configured exactly as it shall be during the PD test, a calibrating charge of
approximately 500 pC should be injected into the terminals of the test object, which is represented in Figure
D.1 by C
a
. The reading, R
1
, of the PD measuring instrument should be noted.

2. After connecting an additional capacitor, C
p
, of 1000 pF in parallel to the output of the calibrator, the
appearing reading, R
2
, should also be noted.

3. A reading ratio of R
2
/ R
1
> 0.8 indicates that C
a
is fairly high, and the procedure should be repeated
with the parallel capacitance, C
p
, increased 10 times, i.e., from originally 1000 pF up to
10 000 pF.
C
o
p
y
r
i
g
h
t
e
d

m
a
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e
r
i
a
l

l
i
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s
e
d

t
o

E
l
e
c
t
r
i
c
i
t
y

o
f

V
i
e
t
n
a
m

b
y

T
h
o
m
s
o
n

S
c
i
e
n
t
i
f
i
c
,

I
n
c
.

(
w
w
w
.
t
e
c
h
s
t
r
e
e
t
.
c
o
m
)
.


T
h
i
s

c
o
p
y

d
o
w
n
l
o
a
d
e
d

o
n

2
0
1
2
-
1
0
-
0
9

2
1
:
5
1
:
2
9

-
0
5
0
0

b
y

a
u
t
h
o
r
i
z
e
d

u
s
e
r

C

n
g

t
y

C
P

T
u

V
a
n

X
D

D
i
e
n

3
.

N
o

f
u
r
t
h
e
r

r
e
p
r
o
d
u
c
t
i
o
n

o
r

d
i
s
t
r
i
b
u
t
i
o
n

i
s

p
e
r
m
i
t
t
e
d
.
The value of the virtual test object capacitance, C
a
, may then be assessed applying the approximation shown in
Equation (D.1):
C
a
= ((C
p
R
2
) / (R
1
R
2
)) C
0
(D.1)





C
o
p
y
r
i
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Annex E

(informative)
Bushing tap ratio measurement


To display phase-resolved PD patterns, a low ac voltage component should be available having the same phase angle
as the applied ac test voltage in order to synchronize the display unit. The most convenient way is to capture the ac
signal from the bushing tap. To evaluate the appearing output voltage magnitude, the ratio of the capacitive divider
formed by the capacitance between the HV conductor of the bushing and the bushing tap, C
1
, and the capacitance
between the bushing tap and grounded bushing flange, C
2
, should be known. From this it can be determined
whether the maximum ac voltage magnitude appearing at the bushing tap can be accepted for the measuring
purpose or if it should be reduced by means of an additional measuring capacitor, C
3
, connected in parallel to C
2
.

The capacitive divider ratio of the bushing may also be measured directly for the applied ac test voltage by means of a
suitable ratio bridge. The value usually ranges between 1:10 000 and 1:50 000. As an option, an appropriate device
specified in IEEE Std 4 for alternating voltage measurement can also be connected directly to the HV bushing
terminal. For this case the bushing tap output voltage should be measured by means of an ac voltmeter having an input
impedance of more than 1 M. After energizing the transformer up to the desired ac test voltage level, the output
voltage is measured. The bushing tap ratio can then be calculated by dividing the magnitude of the low voltage
through the magnitude of the applied ac test voltage.



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Annex F

(informative)
Noise identification


During PD tests of power transformers and shunt reactors, excessive electromagnetic noises may be
encountered, such as pulse-shaped noises due to external PDs and surges of switchgears and power electronics as well
as continuous radio frequency noises radiated from broadcast stations. In this context it should be noted that one of the
greatest advantages of the wideband method is the ease with which the electromagnetic disturbances can be displayed
and thus be discriminated from the PD signal. Characteristic noise signatures are displayed in Figure F.1.

Figure F.1(a) refers to corona discharges ignited from protrusions on the surface of HV electrodes in ambient
air. Such discharges can easily be identified because after exceeding the inception voltage they appear only in one
half-cycle of the applied ac test voltage. If such discharges ignite on HV electrodes they can either be eliminated by
cleaning of the electrode surface or by increasing the electrode curvature radius. To avoid disturbing PD events from
grounded electrodes, the curvature radius should also be enlarged, which could be done by additional metallic
shields or by covering the critical protrusions with semi- conductive material, such as rubber.

The noise signatures shown in the left record of Figure F.1(b) may occur when ungrounded (floating) metallic objects
are present and thus charged and discharged via the stray capacitance coupled to the HV electrode of the test object.
Typically, regular pulse sequences may appear close to the zero-crossing of the est voltage where the pulse
magnitudes in both half-cycles are often well comparable. The obvious solution in this case is to remove as many
loose objects as possible from the surroundings of the test object and grounding the rest, especially metallic fences.
The right record shown in Figure F.1(b) refers to a faulty metallic contact of a connection lead, which may happen
outside or inside the test object due to corrosion. In most cases, the appearance of such discharges is comparable to
those caused by floating electrodes; but the pulse repetition rate may become significantly higher.

Signatures of external interference due to electromagnetic transients in the power network are shown in the left record
of Figure F.1(c). The regular pulses evident from the left figure are caused by power electronics, due to a 6-pulse
thyristor switch of an ac/dc converter. The disturbing pulses can easily be identified because they are equally
spaced and roughly of the same amplitude. If the test voltage frequency is different from the power frequency,
the pulses appear running because they are not synchronized to the ac test voltage. In practice, two to six pulses can
be observed during one ac test voltage cycle, even though fewer than two pulses may occur. This is due to the fact that
the eye tends to see many superimposed cycles at the same time. An example of external interferences due to
permanent occurring radio noises are exemplarily displayed in the right record of Figure F.1(c). To avoid such
disturbances electromagnetically shielded test areas are widely used. In addition, well-grounded metallic grid
structures could be helpful. The grounding impedance in the high-frequency range could be reduced effectively by
means of copper foil.

In some cases, however, the noise level cannot be rejected completely, as illustrated in Figure F.1(d). One kind of
noise remained even if after the grounding condition of a power transformer under test was substantially improved.
The records reveal that the noisy pulses are phase-correlated to the applied ac test voltage, which is also typical for
real PD events. Finally, a xenon lamp installed nearby the test area was identified as the noise source.

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For the identification and localization of electromagnetic noises, the following general rules may be helpful:

1. External noises appear often independent from the applied ac test voltage level and thus do not disappear
if the test voltage level is lowered, as the PD events do.

2. Pulse-shaped noises may appear unsynchronized with the applied ac test voltage, whereas PD
pulses occur always phase-correlated.
In this context it should be noted that advanced computer-based PD measuring systems are equipped with
powerful features for the recognition and rejection of disturbing noises.





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Annex G

(informative)
PD pattern recognition


Characteristic signatures of PDs in liquid-filled power transformers and shunt reactors have been published in many
papers, for instance in (CIGRE TF 15.11/33/03/02 [B34], CIGRE WG 21-03 [B39], CIGRE 21-03 [B40], Fuhr [B52],
Fuhr et al. [B53]). To emphasize the very complex nature of PDs two characteristic measuring examples are presented
in the following.

Figure G.1(a) refers to creeping discharges in a power transformer, which reveals that in the positive half- cycle the
characteristic PD pulse sequences appear at rising ac test voltage and disappear shortly after the positive peak value is
achieved. In the negative half-cycle the PD pulses ignite at falling ac test voltage and disappear after the negative
peak value is reached. Moreover, the PD events ignite simultaneously in both half-cycles after the PD inception
voltage is achieved. This phenomenon is different from corona discharges in air because the positive discharges
appear at a test voltage level significantly above the inception voltage of the negative Trichel discharges; see Figure
F.1(a). Furthermore, the pulse magnitudes scatter over an extremely wide range and differ substantially for both half-
cycles.
























Another measuring example is illustrated in Figure G.1(b) which refers to discharges in gas bubbles in transformer
oil. The PD signatures are very different from those of surface discharges. So the PD inception and extinction
voltages are characterized by an excessive hysteresis, and the PD extinction voltage may substantially decrease after
longer stressing time. Moreover, the PD events may suddenly disappear even if the ac test voltage remains constant.
Finally the PD events may ignite thereafter again. Such very complex PD phenomena have to be taken into account
for assessment of the insulation condition of liquid-filled power transformers and shunt reactors.






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IEEE Std C57.113-2010
IEEE Recommended Practice for Partial Discharge Measurement in
Liquid-Filled Power Transformers and Shunt Reactors
Annex H
(informative)
Bibliography
[B1] Ahmed, A. S., and Zaky, A. A., Calibration of Partial Discharge Detectors for Pulse-Height
Distribution Analysis, IEEE Transactions on Electrical Insulation, vol. EI-14, no. 5, pp. 281284, Oct.
1979.
[B2] ANSI C63.2-1987, American National Standard Specifications for Electromagnetic Noise and Field-
Strength Meters, 10 Hz to 40 GHz.
8

[B3] ANSI C68.3-1976, American National Standard Recommended Practice for the Detection and
Measurement of Partial Discharges (Corona) During Dielectric Tests.
[B4] Arman, A. N., and Starr, A. T., The Measurement of Discharges in Dielectrics, J.IEE 79 (1936),
pp. 6781, 8894.
[B5] AS 1018-1970, Recommendations for Partial Discharge Measurements, Standards Australia.
[B6] Aschwanden, T., et al., Development and Application of New Condition Assessment Methods for
Power Transformers, CIGRE paper 12-207, Session Paris, Aug. 1998.
[B7] ASTM D 1868-73, Detection and Measurement of Discharge (Corona) Pulses in Evaluation of
Insulation Systems.
9

[B8] Austin, J., and James, R. E., On-Line Digital Computer System for Measurement of Partial
Discharges in Insulation Structures, IEEE Transactions on Electrical Insulation, vol. EI-11, no. 4, pp.
129139, Dec. 1976.
[B9] Baehr, R., et al., Diagnostic Techniques and Preventive Maintenance Procedures for Large
Transformers, CIGRE paper 12-13, Sept. 19, 1982.
[B10] Bartnikas, R., Effect of Pulse Rise Time on the Response of Corona Detectors, IEEE Transactions
on Electrical Insulation, vol. EI-7, no. 1, pp. 38, Mar. 1972.
[B11] Bartnikas, R., Use of a Multichannel Analyzer for Corona Pulse-Height Distribution Measurements
on Cables and Other Electrical Apparatus, IEEE Transactions on Instrumentation and Measurement, vol.
IM-22, no. 4, pp. 403407, Dec. 1973.
[B12] Bartnikas, R., and McMahon, E. J., Corona Measurement and Interpretation, Eng. Dielectrics, vol.
1, American Society for Testing and Materials, STP 669, 1979.
[B13] Barutti, A., Measurements and Localization of Partial Discharges: A Step Forward, Technol.
Elettrica (Italy), no. 11, pp. 7679, Nov. 1976 (in Italian).
[B14] Beer, G., et al., Contribution exprimentale ltude de la dgradation produite par des dcharges
partielles dans le papier isolant imprgn lhuile, CIGRE paper 15-02, Aug. 24Sept. 2, 1970.
[B15] Bellaschi, P. L., Power Transformer Corona Testingthe Long-Time Test, Transmission and
Distribution, pp. 4041, June 1972.
[B16] Berg, G., Lundgaard, L.E., and Machazek, L., Discharge Signatures from a Wedge Geometry in
Transformer Insulation, 13th International Symposium on High Voltage Engineering, Paper O.26.06,
Delft, Aug. 2003.

8
ANSI publications are available from the Customer Service Department, American National Standards Institute, 25 W. 43rd Street,
4th Floor, New York, NY 10036, USA (http://www.ansi.org/).
9
ASTM publications are available from the American Society for Testing and Materials, 100 Barr Harbor Drive, West Conshohocken,
PA 19428-2959, USA (http://www.astm.org/).
29
Copyright 2010 IEEE. All rights reserved.
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IEEE Std C57.113-2010
IEEE Recommended Practice for Partial Discharge Measurement in
Liquid-Filled Power Transformers and Shunt Reactors
[B17] Bertula, T., Palva, V., and Talvio, E., Partial Discharge Measurement on Oil-Paper Insulated
Transformers, CIGRE paper 12-07, June 1020, 1968.
[B18] Bertula, T., Saunamaki, Y., and Ostman, N., Vieillissement de lisolation papier huile vue plus
spcialement sous langle de linfluence du champ lectrique sur les impurets contenues dans lhuile,
CIGRE paper 15-06, Aug. 24Sept. 2, 1970.
[B19] Black, I. A., A Pulse Discrimination System for Discharge Detection in Electrically Noisy
Environments, International High-Voltage Symposium, Zurich, Switzerland, Sept. 1975.
[B20] Black, I. A., and Leung, N. K., The Application of the Pulse Discrimination System to
Measurement of Partial Discharges in Insulation under Noisy Conditions, IEEE International Symposium
on Electrical Insulation, Boston, MA, pp. 167170, June 1980.
[B21] Bohdanowicz, A., and Palmer, S., Some Results of Partial Discharge Measurements by Means of
Charge Detectors and Radio Voltage Meter of Simulated Corona Pulses Injected into a Power
Transformer, Canadian Electrical Association Apparatus Meeting, Montreal, Canada, Mar. 17, 1982.
[B22] Borsi, H., et al., Enhanced Diagnosis of Power Transformers Using On- and Off-line
MethodsResults, Examples and Future Trends, CIGRE paper 12-204, Session Paris, Aug. 2000.
[B23] Borsi, H., and Gockenbach, E., Partial Discharge Measurement and Evaluation Techniques for
Transformers, 13th International Symposium on High Voltage Engineering, paper O.24.05, Delft, Aug.
2003.
[B24] Boyles, C. R., and Hinton, R. A., Seven Years of Corona Testing, Paper no. 70 CP120-PWR,
IEEE Winter Power Meeting, New York, NY, Jan. 2530, 1970.
[B25] Brand, U., and Muhr, M., New Investigations on the Measurement of Partial Discharge (PD) and
Radio Interference Voltage (RIV) on High-Voltage Engineering, Paper no. 63.13, Fourth International
Symposium on High Voltage Engineering, Athens, Greece, Sept. 59, 1983.
[B26] Brown, R. D., Corona Measurement on High-Voltage Apparatus Using the Bushing Capacitance
Tap, IEEE Transactions on Power Apparatus and Systems, vol. PAS-84, pp. 667671, Aug. 1965.
[B27] Carter, W. J., Practical Aspects of Apparent Charge Partial Discharge Measurements, IEEE
Transactions on Power Apparatus and Systems, vol. PAS-101, no. 7, pp. 19851989, July 1982.
[B28] Channakeshava, Gururaj, B. I., and Jayaram, B. N., Possibilities of Estimating the Energy of Partial
Discharge at Site in Transformer Windings, Paper no. 63.08, Fourth International Symposium on High-
Voltage Engineering, Athens, Greece, Sept. 59, 1983.
[B29] Channakeshava, Gururaj, B. I., and Jayaram, B. N., Studies on Partial Discharge Measurement in
Transformer Windings, CIGRE paper 12-09, Sept. 19, 1982.
[B30] Cesari, S., and Yakov, S., Partial Discharge Inception Tests on Oil Immersed Insulation
Structures, Paper 22.09, Fourth International Symposium on High-Voltage Engineering, Athens, Greece,
Sept. 59, 1983.
[B31] CIGRE JWG 15.01.04, Characterization of Partial Discharges in Transformer Insulation, Paper
15.01.04, Session Paris, Aug. 2000.
[B32] CIGRE JWG 15/21/33-20, Progress on High-Voltage Monitoring Systems for In-service Power
Apparatus, Session Paris, Aug. 1996.
[B33] CIGRE SC 12, Measurement of Partial Discharges in Transformers, Electra, no. 19, pp. 1365,
Nov. 1971.
[B34] CIGRE TF 15.11/33.03.02, Knowledge Rules for Partial Discharge Diagnosis in Service, Electra
Brochure 226, 2003.
[B35] CIGRE TF 33.03.05, Calibration Procedures for Analog and Digital Partial Discharge Measuring
Instruments, Electra, no. 180, pp. 123-124, Oct. 1998.
[B36] CIGRE WG 03, Elimination of Interference in Discharge Detection, Electra, no. 21, pp. 5572.
30
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IEEE Std C57.113-2010
IEEE Recommended Practice for Partial Discharge Measurement in
Liquid-Filled Power Transformers and Shunt Reactors
[B37] CIGRE WG 12-01, General Report of Group 12-01, Electra, no. 37, pp. 6474, Dec. 1974.
[B38] CIGRE WG 12.01, Measurement of Partial Discharges in Transformers, Electra, no. 47, pp. 37
47, July 1976.
[B39] CIGRE WG 21-03, Significance of Discharge Detection, Electra, no. 11, pp. 5360, Dec. 1969.
[B40] CIGRE WG 21-03, Recognition of Discharges, Electra, no. 11, pp. 6198, Dec. 1969.
[B41] CIGRE WG D1.33, Guide for Electrical Partial Discharge Measurements in compliance to IEC
60270, Technical Brochure 366, Electra, vol. 60, no. 241, Dec. 2008.
[B42] CISPR 16-1-1993, Comit International Spcial des Perturbation Radiolectrique.
10

[B43] Corvo, A. M., Diagnostic Technique and Proceedings of Preventive Maintenance of Large
Transformers, CIGRE paper 12-11, Sept. 19, 1982.
[B44] Dakin, T. W., Works, C. N., and Miller, R. L., Utilization of Peak-Reading Voltmeters and
Recorders for Corona Measurement, IEEE Transactions on Electrical Insulation, vol. EI-2, no. 2, pp. 75
82, Aug. 1967.
[B45] Dembinski, E. M., and Douglas, J. L., Calibration and Comparison of Partial Discharge and Radio-
Interference Measuring Circuits, IEE Proceedings, vol. 115, no. 9, pp. 13321340, Sept. 1968.
[B46] Dietrich, W. An International Survey on Failures in Large Power Transformers in Service,
Electra, no. 88, pp. 2148, May 1983.
[B47] Dolezal, I. F., Dielectric Test Requirements and Factory Test Experiences on High Voltage Power
Transformers, Paper no. C75-147-4, IEEE PES Winter Meeting, New York, NY, Jan. 2631, 1975.
[B48] Douglas, J. L., Calibration of Circuits for Measuring Partial Discharges in EHV Transformers, IEE
Conference on Diagnostic Testing of HV Power Apparatus in Service, London, England, pp. 4047, Mar.
1973.
[B49] Douglas, J. L., Pratt, F. C., and Rushton, F., A Critical Assessment of Methods of Measuring Partial
Discharges in EHV Transformers, CIGRE Conference paper 12-03, Paris, France, 1974.
[B50] Dix, J. W., Hickling, G. H., and Raju, B. P., Partial Discharge Measurement and its Impact on
Alternating Over-Potential Tests on Transformers, IEE Conference on Diagnostic Testing of HV Power
Apparatus in Service, London, England, Conference Digest, pp. 3139, Mar. 68, 1973.
[B51] Fu, M., Chen, G., and Wang, S., Practical Application of On-line Partial Discharge Monitoring
Techniques for 500 kV Shunt Reactors, International Symposium on High Voltage Engineering, paper
O.26.04, Delft, Aug. 2003.
[B52] Fuhr, J., Non-Standard PD-Measurements-Tool for Successful PD-Source Identification in the
Laboratory, International Symposium on High Voltage Engineering, paper P.02.07, Delft, Aug. 2003.
[B53] Fuhr, J., et al., Detection and Localization of Internal Defects in the Insulation of Power
Transformers, IEEE Transaction on Electrical Insulation, vol. 28, no. 6, 1993.
[B54] Fryxell, J., et al., Performance of Partial Discharge Tests on Power Transformers, CIGRE paper
12-04, June 1020, 1968.
[B55] Gailhofer, G., Kury, H., and Rabus, W., Partial Discharge Measurements on Power Transformer
Insulation, Principles and Practice, CIGRE paper 12-15 June, 1020, 1968.
[B56] Gnger, B., and Vorwerk, H. J. Ionization Measurements on Transformers, The Brown Boveri
Review, vol. 54, no. 7, pp. 355367, July 1967.

10
CISPR documents are available from the Central Office of the International Electrotechnical Commission, 3, rue de Varemb, P.O.
Box 131, CH-1211, Geneva 20, Switzerland (http://www.iec.ch/). They are also available in the United States from the Sales
Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA
(http://www.ansi.org/).
31
Copyright 2010 IEEE. All rights reserved.
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IEEE Std C57.113-2010
IEEE Recommended Practice for Partial Discharge Measurement in
Liquid-Filled Power Transformers and Shunt Reactors
[B57] Gao, W., Tan, K., Zheng, Q., Study on Quantification Method of Partial Discharge in Winding of
Power Transformer, International Symposium on High Voltage Engineering, paper P.02.07, Delft, Aug.
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[B58] Gemant, A., and Philippoff, W., Die Funkenstrecke mit Vorkondensator. Zeitschrift fr technische
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[B69] IEC 60060-1, High-voltage test techniquesPart 1: General definitions and test requirements.
11

[B70] IEC 60060-2, High voltage test techniquesPart 2: Measuring systems.
[B71] IEC 60076-3, Power TransformersPart 3: Insulation Levels, Dielectric Tests, and External
Clearances in Air.
[B72] IEEE Committee Report, Guide for Calibration of Test Equipment and Circuits for Measurement of
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12

[B73] IEEE Committee Report, Tests for Damaging Corona on Oil-Insulated Transformers, IEEE
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11
IEC publications are available from the Central Office of the International Electrotechnical Commission, 3, rue de Varemb, P.O.
Box 131, CH-1211, Geneva 20, Switzerland (http://www.iec.ch/). IEC publications are also available in the United States from the
Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA
(http://www.ansi.org/).
12
IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854,
USA (http://standards.ieee.org).
32
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IEEE Std C57.113-2010
IEEE Recommended Practice for Partial Discharge Measurement in
Liquid-Filled Power Transformers and Shunt Reactors
[B74] Ikeda, M., Yanari, T., and Okubo, H., PD and BD Probability Distribution and Equi-Probabilistic
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33
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IEEE Recommended Practice for Partial Discharge Measurement in
Liquid-Filled Power Transformers and Shunt Reactors
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34
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IEEE Std C57.113-2010
IEEE Recommended Practice for Partial Discharge Measurement in
Liquid-Filled Power Transformers and Shunt Reactors
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13

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13
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(http://global.ihs.com/).
35
Copyright 2010 IEEE. All rights reserved.
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IEEE Std C57.113-2010
IEEE Recommended Practice for Partial Discharge Measurement in
Liquid-Filled Power Transformers and Shunt Reactors
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36
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IEEE Recommended Practice for Partial Discharge Measurement in
Liquid-Filled Power Transformers and Shunt Reactors
37
Copyright 2010 IEEE. All rights reserved.
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