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Memory Test

Built-In Self Test (BIST)

Introduction for Memory Test

Built-In Self Test (BIST)


a) Mscan Test

Built-In Self Test (BIST)


b) Marching Test

Built-In Self Test (BIST)


c) Transparent BIST Test

Transparent Built-In Self Test is a test


algorithm that is periodically executed on the field in order to verify the integrity of large amounts of critical data stored on mass memory systems

Built-In Self Test (BIST)


c) Transparent BIST Test
Main characteristics:

1) Minimum area overhead: this approach is one of the best choices found in the literature in terms of area overhead and types of faults detected in memory structures. E.g., authors claim an area overhead of 1.2% due to the inclusion of Transparent BIST in a 128Kbytes X 8bytes SRAM (this value decreases as the RAM size increases).

Built-In Self Test (BIST)


c) Transparent BIST Test

Main characteristics: 2) High capability of fault detection: by indicating the occurrence of stuck-at faults, transition faults,coupling faults, decoder faults and read/write logic faults.

Built-In Self Test (BIST)


c) Transparent BIST Test
Main characteristics: 3) Short down times: that are periodically required to check the functionality of mass memory systems used in real-time applications. The Transparent BIST approach presents the incomparable advantage of preserving the contents of the RAM memory after testing. Thus, this approach is very suitable for periodic testing since we do not need to save the memory contents before the test session and to restore them at the end of this session.

Built-In Self Test (BIST)


c) Transparent BIST Test

execution time

Table 1. Transparent BIST Algorithm

Built-In Self Test (BIST)


c) Transparent BIST Test

S1
R1 R2 ... ... Rn

S2
R1 R1 R2 R2 ... ... Rn Rn

S3

S4

R1 R1 R1 R2 R2 R2 ... ... ... ... Rn Rn Rn

execution time

Table 2. Signature Prediction Algorithm

The data read during execution of sequences S1 through S4 of the Signature Prediction Algorithm (Table 1) are sometimes inverted in order to match the data read during the execution of sequences S1 through S4 of the Transparent BIST Algorithm (Table 1).