Small, Low Power, 3-Axis ±3 g i MEMS® Accelerometer ADXL330

FEATURES
3-axis sensing Small, low-profile package 4 mm × 4 mm × 1.45 mm LFCSP Low power 180 µA at VS = 1.8 V (typical) Single-supply operation 1.8 V to 3.6 V 10,000 g shock survival Excellent temperature stability BW adjustment with a single capacitor per axis RoHS/WEEE lead-free compliant

GENERAL DESCRIPTION
The ADXL330 is a small, thin, low power, complete 3-axis accelerometer with signal conditioned voltage outputs, all on a single monolithic IC. The product measures acceleration with a minimum full-scale range of ±3 g. It can measure the static acceleration of gravity in tilt-sensing applications, as well as dynamic acceleration resulting from motion, shock, or vibration. The user selects the bandwidth of the accelerometer using the CX, CY, and CZ capacitors at the XOUT, YOUT, and ZOUT pins. Bandwidths can be selected to suit the application, with a range of 0.5 Hz to 1600 Hz for X and Y axes, and a range of 0.5 Hz to 550 Hz for the Z axis. The ADXL330 is available in a small, low profile, 4 mm × 4 mm × 1.45 mm, 16-lead, plastic lead frame chip scale package (LFCSP_LQ).

APPLICATIONS
Cost-sensitive, low power, motion- and tilt-sensing applications Mobile devices Gaming systems Disk drive protection Image stabilization Sports and health devices

FUNCTIONAL BLOCK DIAGRAM
+3V

VS

ADXL330
OUTPUT AMP 3-AXIS SENSOR CDC AC AMP DEMOD OUTPUT AMP

RFILT

XOUT CX

RFILT

YOUT CY

RFILT OUTPUT AMP

ZOUT CZ
05677-001

COM

ST

Figure 1.

Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2007 Analog Devices, Inc. All rights reserved.

.. 14 REVISION HISTORY 9/06—Rev.............................. 12 Self Test ............... 6 Theory of Operation . 1 Applications..................................................................................................... 2 Specifications................... and CZ ............................................................... 12 Use with Operating Voltages Other than 3 V....................................................................... 5 Typical Performance Characteristics ........ 12 Setting the Bandwidth Using CX.................................................. 0 to Rev................................................. 3 Absolute Maximum Ratings..................................... 12 Design Trade-Offs for Selecting Filter Characteristics: The Noise/BW Trade-Off. 4 Pin Configuration and Function Descriptions................................... A Changes to Ordering Guide ........................ 11 Mechanical Sensor.......................................................................................... 11 Performance.......................................... 11 Applications............................................ 1 Revision History ................................................................................................. 13 Outline Dimensions ........................... 12 Axes of Acceleration Sensitivity ................. 14 3/06—Revision 0: Initial Version Rev................................................................................ CY.......................................................................................................................................................................................................ADXL330 TABLE OF CONTENTS Features .. 1 Functional Block Diagram ............................ 1 General Description ..................................................... 14 Ordering Guide ..... 12 Power Supply Decoupling ......................................... 4 ESD Caution...................................................................................................................................................... A | Page 2 of 16 ..............................................................................................................................................

YOUT. A | Page 3 of 16 . where CX. 6 Self-test response changes cubically with VS. For CX. CZ = 10 µF. YOUT 5 Bandwidth ZOUT5 RFILT Tolerance Sensor Resonant Frequency SELF TEST 6 Logic Input Low Logic Input High ST Actuation Current Output Change at XOUT Output Change at YOUT Output Change at ZOUT OUTPUT AMPLIFIER Output Swing Low Output Swing High POWER SUPPLY Operating Voltage Range Supply Current Turn-On Time 7 TEMPERATURE Operating Temperature Range T T Conditions Each axis % of full scale Min ±3 Typ ±3. 7 Turn-on time is dependent on CX.003 µF. CY.01 µF.6 320 1 −25 +70 Self test 0 to 1 Self test 0 to 1 Self test 0 to 1 No load No load VS = 3 V No external filter V μA ms °C 1 2 Defined as coupling between any two axes.8 1. Typical specifications are not guaranteed.5 +0. CY. Table 1. YOUT.1 2. CX = CY = CZ = 0. acceleration = 0 g.3 ±1 ±0. Sensitivity is essentially ratiometric to VS.8 3. YOUT Noise Density ZOUT FREQUENCY RESPONSE 4 Bandwidth XOUT. bandwidth = 0. CZ and is approximately 160 × CX or CY or CZ + 1 ms. 5 Bandwidth with external capacitors = 1/(2 × π × 32 kΩ × C). ZOUT 0 g Offset vs.6 +2.8 No external filter No external filter 1600 550 32 ± 15% 5. CZ are in µF. Rev. ZOUT Sensitivity Change Due to Temperature 3 ZERO g BIAS LEVEL (RATIOMETRIC) 0 g Voltage at XOUT.2 1.ADXL330 SPECIFICATIONS TA = 25°C. All minimum and maximum specifications are guaranteed.6 kHz. Temperature NOISE PERFORMANCE Noise Density XOUT. bandwidth = 500 Hz. 4 Actual frequency response controlled by user-supplied external filter capacitors (CX. For CX.1 µF. CY = 0. CZ).5 ±1 280 350 Max Unit g % Degrees Degrees % Each axis VS = 3 V VS = 3 V Each axis VS = 3 V 270 330 mV/g %/°C V mg/°C µg/√Hz rms µg/√Hz rms Hz Hz kΩ kHz V V μA mV mV mV V V 1.4 +60 −150 +150 −60 0.015 1. Parameter SENSOR INPUT Measurement Range Nonlinearity Package Alignment Error Interaxis Alignment Error Cross Axis Sensitivity 1 SENSITIVITY (RATIOMETRIC) 2 Sensitivity at XOUT.5 Hz. VS = 3 V.6 ±0. 3 Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature. CY. For CZ = 0. unless otherwise noted. bandwidth = 1.1 ±1 300 ±0. CY.

permanent damage may occur on devices subjected to high energy electrostatic discharges.3 V) Indefinite −55°C to +125°C −65°C to +150°C Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Although this product features proprietary ESD protection circuitry.0 V (COM − 0.ADXL330 ABSOLUTE MAXIMUM RATINGS Table 2. Unpowered) Acceleration (Any Axis. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.000 g 10.3 V to +7. Recommended Soldering Profile Profile Feature Average Ramp Rate (TL to TP) Preheat Minimum Temperature (TSMIN) Maximum Temperature (TSMAX) Time (TSMIN to TSMAX). A | Page 4 of 16 .000 g −0. Therefore. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. proper ESD precautions are recommended to avoid performance degradation or loss of functionality.3 V) to (VS + 0. Powered) VS All Other Pins Output Short-Circuit Duration (Any Pin to Common) Temperature Range (Powered) Temperature Range (Storage) Rating 10. tS TSMAX to TL Ramp-Up Rate Time Maintained Above Liquidous (TL) Liquidous Temperature (TL) Time (tL) Peak Temperature (TP) Time within 5°C of Actual Peak Temperature (tP) Ramp-Down Rate Time 25°C to Peak Temperature Sn63/Pb37 3°C/s max 100°C 150°C 60 s to 120 s 3°C/s max 183°C 60 s to 150 s 240°C + 0°C/−5°C 10 s to 30 s 6°C/s max 6 minutes max Pb-Free 3°C/s max 150°C 200°C 60 s to 180 s 3°C/s max 217°C 60 s to 150 s 260°C + 0°C/−5°C 20 s to 40 s 6°C/s max 8 minutes max ESD CAUTION ESD (electrostatic discharge) sensitive device. Parameter Acceleration (Any Axis. TP RAMP-UP TEMPERATURE tP CRITICAL ZONE TL TO TP TL TSMAX TSMIN tL tS PREHEAT RAMP-DOWN 05677-002 t25°C TO PEAK TIME Figure 2. This is a stress rating only. Recommended Soldering Profile Table 3. functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Rev.

6 V) Supply Voltage (1.325 NC ST COM NC 1 2 3 4 5 ADXL330 TOP VIEW (Not to Scale) +Y +Z +X 6 XOUT NC YOUT NC 0. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Mnemonic NC ST COM NC COM COM COM ZOUT NC YOUT NC XOUT NC VS VS NC Description No Connect Self Test Common No Connect Common Common Common Z Channel Output No Connect Y Channel Output No Connect X Channel Output No Connect Supply Voltage (1.50 MAX 0. A | Page 5 of 16 .65 16 15 14 13 12 11 10 9 7 8 NC NC VS VS 4 0. Pin Function Descriptions Pin No.95 0. Recommended PCB Layout Table 4.6 V) No Connect Rev. Pin Configuration Figure 4.8 V to 3.ADXL330 PIN CONFIGURATION AND FUNCTION DESCRIPTIONS 0.35 MAX 0.65 4 1.8 V to 3.325 05677-029 COM COM COM ZOUT NC = NO CONNECT CENTER PAD IS NOT INTERNALLY CONNECTED BUT SHOULD BE SOLDERED FOR MECHANICAL INTEGRITY 1.95 DIMENSIONS SHOWN IN MILLIMETERS 05677-032 Figure 3.

42 1.46 1.58 OUTPUT (V) OUTPUT (V) Figure 5.52 1.44 1.98 0.97 0.ADXL330 TYPICAL PERFORMANCE CHARACTERISTICS N > 1000 for all typical performance plots.00 1. Y-Axis Zero g Bias at 25°C. VS = 3 V Figure 10.50 1.99 1. VS = 2 V % OF POPULATION 25 20 15 10 05677-004 % OF POPULATION 10 8 6 4 05677-007 5 0 1. X-Axis Zero g Bias at 25°C.48 1.46 1. unless otherwise noted. VS = 3 V Figure 9.48 1.00 1. Z-Axis Zero g Bias at 25°C.03 1.08 1.03 1.09 OUTPUT (V) Figure 6.05 1.02 1.44 1.02 1.04 1. VS = 2 V Rev. 35 30 25 20 15 16 14 12 % OF POPULATION % OF POPULATION 05677-003 10 8 6 4 05677-006 10 5 2 0 0.97 0.07 1.54 1.50 1.42 1.50 1.14 1.98 0.46 1.88 0.94 0.10 1.01 1.96 0.54 1.90 0.44 1. VS = 2 V 25 40 35 20 30 % OF POPULATION 25 20 15 10 % OF POPULATION 05677-005 15 10 5 05677-008 5 0 1.16 OUTPUT (V) Figure 7.04 1.02 1.54 1.04 1.99 1.96 0.06 1. VS = 3 V 40 35 30 16 14 12 Figure 8.58 OUTPUT (V) 2 0 0.08 1. X-Axis Zero g Bias at 25°C.96 0.06 1.01 1. A | Page 6 of 16 .56 1.52 1.92 0.08 1. Z-Axis Zero g Bias at 25°C.52 1.06 1.00 1.12 1.58 OUTPUT (V) 0 0.56 1.48 1.07 1.95 0.95 0.56 1.05 1.42 1.09 0 1.98 1. Y-Axis Zero g Bias at 25°C.

53 % OF POPULATION 1.0 1.54 % OF POPULATION 1. Temperature—8 Parts Soldered to PCB Rev.5 TEMPERATURE COEFFICIENT (mg/°C) –20 –10 0 10 20 30 40 50 60 70 80 TEMPERATURE (°C) Figure 11.5 –2.5 1.45 –30 05677-012 10 5 0 –2.0 1.51 VOLTS 05677-009 1. Z-Axis Zero g Bias Temperature Coefficient.5 2.47 1.0 1.0 2.46 1. X-Axis Zero g Bias Temperature Coefficient.45 –30 05677-014 5 0 –2.54 25 1.0 –1.5 TEMPERATURE COEFFICIENT (mg/°C) –20 –10 0 10 20 30 40 50 60 70 80 TEMPERATURE (°C) Figure 13.5 TEMPERATURE COEFFICIENT (mg/°C) –20 –10 0 10 20 30 40 50 60 70 80 TEMPERATURE (°C) Figure 12.5 0 0.5 –1. X-Axis Zero g Bias vs.5 1.46 1.0 –0. Temperature—8 Parts Soldered to PCB 1. Temperature—8 Parts Soldered to PCB 40 35 30 1. Y-Axis Zero g Bias Temperature Coefficient.5 2. Z-Axis Zero g Bias vs.52 25 1.49 1.49 1.5 1.55 N=8 1.45 –30 05677-013 5 0 –2.5 –1.49 10 1.55 N=8 1.5 0 0. VS = 3 V Figure 16. VS = 3 V Figure 14.47 1.51 VOLTS 05677-010 20 15 10 1. VS = 3 V 30 Figure 15.50 1.0 2. Y-Axis Zero g Bias vs.5 0 0.5 –2.46 1.50 1.53 1.54 1.47 1.0 –0.48 1.5 –1.52 1.48 1.5 2.0 –1.ADXL330 35 30 1. A | Page 7 of 16 .52 1.0 2.50 1.0 –0.51 % OF POPULATION 20 VOLTS 05677-011 15 1.0 –1.55 N=8 1.48 1.53 25 20 15 1.5 –2.

210 SENSITIVITY (V/g) Figure 17.27 0.178 0.198 0.170 0.31 0.29 0.30 0. X-Axis Sensitivity at 25°C.174 0.186 0.26 0.196 0. VS = 2 V Rev.180 0.198 0.30 0. VS = 3 V 70 40 35 30 Figure 21.27 0.30 0. Z-Axis Sensitivity at 25°C. Z-Axis Sensitivity at 25°C. VS = 3 V Figure 22. VS = 2 V 60 50 40 % OF POPULATION % OF POPULATION 25 20 15 10 30 20 05677-016 0 0.31 0.32 0.176 0.26 0.ADXL330 60 35 30 25 20 50 % OF POPULATION 40 30 % OF POPULATION 05677-015 15 20 10 5 10 0 0.212 SENSITIVITY (V/g) Figure 19.34 SENSITIVITY (V/g) 0 0.202 0.31 0. A | Page 8 of 16 05677-020 5 05677-019 10 5 05677-018 .206 0.182 0.33 0.192 0.29 0.33 SENSITIVITY (V/g) 05677-017 0 0.26 0.28 0.32 0. VS = 3 V 70 40 35 30 Figure 20.186 0.200 0. VS = 2 V 60 50 40 % OF POPULATION % OF POPULATION 25 20 15 10 30 20 10 0 0.174 0.194 0. X-Axis Sensitivity at 25°C.210 SENSITIVITY (V/g) Figure 18.190 0.182 0.29 0.178 0.34 SENSITIVITY (V/g) 0 0.190 0.28 0.206 0. Y-Axis Sensitivity at 25°C.194 0.27 0.204 0.25 0.202 0.170 0.32 0. Y-Axis Sensitivity at 25°C.208 0.33 0.188 0.184 0.28 0.172 0.

27 –30 –20 –10 0 10 20 30 40 50 60 70 80 TEMPERATURE (°C) Figure 25. Z-Axis Sensitivity Drift Over Temperature.29 0. X-Axis Sensitivity Drift Over Temperature.30 10 0.2 1.2 1.2 –0.0 –1.6 2. VS = 3 V Figure 26.0 DRIFT (%) 05677-024 0.29 0 –2.0 1.4 0 0.4 0.27 –30 –20 –10 0 10 20 30 40 50 60 70 80 TEMPERATURE (°C) Figure 23.33 N=8 % OF POPULATION 50 40 30 20 SENSITIVITY (V/g) 05677-021 60 0.28 10 0 –2.0 –0. Z-Axis Sensitivity vs.30 0.28 .6 2.0 DRIFT (%) 0.6 1.2 –0.8 –0. VS = 3 V 0.6 –1.31 0.31 0.6 3. Temperature 8 Parts Soldered to PCB.2 0. VS = 3 V Figure 28.33 Figure 27. Temperature 8 Parts Soldered to PCB.29 5 05677-023 0.2 0.31 0.ADXL330 90 80 0.32 70 0.33 N=8 70 60 50 40 30 20 0.4 0. Temperature 8 Parts Soldered to PCB.4 1.8 –0. X-Axis Sensitivity vs.0 –1. Y-Axis Sensitivity vs.2 2.8 2.8 1. VS = 3 V Rev. VS = 3 V 25 0. A | Page 9 of 16 05677-025 10 0.6 –1.30 0.4 0 0.32 % OF POPULATION 15 SENSITIVITY (V/g) 0. VS = 3 V N=8 20 0. Y-Axis Sensitivity Drift Over Temperature.28 05677-026 0 –1.8 1.32 % OF POPULATION SENSITIVITY (V/g) 05677-022 0.27 –30 –20 –10 0 10 20 30 40 50 60 70 80 TEMPERATURE (°C) Figure 24.6 –0.0 DRIFT (%) 0.

0047 µF.00V BW CH2 500mV CH3 500mV CH4 500mV B W M1. CY. A | Page 10 of 16 . Typical Current Consumption vs. Supply Voltage Figure 30. CZ = 0. Typical Turn-On Time—CX. VS = 3 V Rev.ADXL330 600 T 500 400 CURRENT (µA) 4 300 3 200 2 1 05677-028 100 05677-027 0 0 1 2 3 SUPPLY (V) 4 5 6 CH1 1.00ms T 9.400% A CH1 300mV Figure 29.

shock. Figure 14. Phase-sensitive demodulation techniques are then used to determine the magnitude and direction of the acceleration. Y-. This filtering improves measurement resolution and helps prevent aliasing.ADXL330 THEORY OF OPERATION The ADXL330 is a complete 3-axis acceleration measurement system on a single monolithic IC. Figure 15. the three axes sense directions are highly orthogonal with little cross axis sensitivity. and Z axes. innovative design techniques ensure high performance is built-in to the ADXL330. and Z-axis) soldered to a PCB over a −25°C to +70°C temperature range. The output signals are analog voltages that are proportional to acceleration. The accelerometer can measure the static acceleration of gravity in tilt sensing applications as well as dynamic acceleration resulting from motion. MECHANICAL SENSOR The ADXL330 uses a single structure for sensing the X. It contains a polysilicon surface micromachined sensor and signal conditioning circuitry to implement an open-loop acceleration measurement architecture. Polysilicon springs suspend the structure over the surface of the wafer and provide a resistance against acceleration forces. The demodulator output is amplified and brought off-chip through a 32 kΩ resistor. there is neither quantization error nor nonmonotonic behavior. and Figure 28 demonstrate the typical sensitivity shift over temperature for supply voltages of 3 V. This is typically better than ±1% over the −25°C to +70°C temperature range. PERFORMANCE Rather than using additional temperature compensation circuitry. of course. be calibrated out at the system level. Mechanical misalignment can. or vibration. Acceleration deflects the moving mass and unbalances the differential capacitor resulting in a sensor output whose amplitude is proportional to acceleration. A | Page 11 of 16 . The fixed plates are driven by 180° out-of-phase square waves. As a result. Figure 26. Mechanical misalignment of the sensor die to the package is the chief source of cross axis sensitivity. Figure 27. Rev. and Figure 16 show the zero g output performance of eight parts (X-. The user then sets the signal bandwidth of the device by adding a capacitor. and temperature hysteresis is very low (typically less than 3 mg over the −25°C to +70°C temperature range). The sensor is a polysilicon surface micromachined structure built on top of a silicon wafer. Y. The ADXL330 has a measurement range of ±3 g minimum. Deflection of the structure is measured using a differential capacitor that consists of independent fixed plates and plates attached to the moving mass. As a result.

Table 6. and ZOUT pins. The user should limit bandwidth to the lowest frequency needed by the application to maximize the resolution and dynamic range of the accelerometer.7 0. Z) The tolerance of the internal resistor (RFILT) typically varies as much as ±15% of its nominal value (32 kΩ). The ADXL330 noise has the characteristics of white Gaussian noise. A minimum capacitance of 0. CY.6 ) SETTING THE BANDWIDTH USING CX. The resulting movement of the beam allows the user to test if the accelerometer is functional.01 Often. an electrostatic force is exerted on the accelerometer beam.027 0. With the single-pole. The user must filter the signal at this point to limit aliasing errors.05 0. a single 0. a larger bulk bypass capacitor (1 µF or greater) can be added in parallel to CDC. YOUT. and ZOUT. in applications where noise is present at the 50 kHz internal clock frequency (or any harmonic thereof).6 V.10 0. and CZ is recommended in all cases. The typical change in output is −500 mg (corresponding to −150 mV) in the X-axis. CY. the typical noise of the ADXL330 is determined by rms Noise = Noise Density × ( BW × 1. However. CY. This ST pin may be left open circuit or connected to common (COM) in normal use.27 0. placed close to the ADXL330 supply pins adequately decouples the accelerometer from noise on the power supply. Additionally. given the rms value. roll-off characteristic. Rev.1 µF capacitor. CDC.0047 μF for CX. the peak value of the noise is desired. a 100 Ω (or smaller) resistor or ferrite bead can be inserted in the supply line. DESIGN TRADE-OFFS FOR SELECTING FILTER CHARACTERISTICS: THE NOISE/BW TRADE-OFF The selected accelerometer bandwidth ultimately determines the measurement resolution (smallest detectable acceleration).6 0. then a low VF clamping diode between ST and VS is recommended. Filtering can be used to lower the noise floor to improve the resolution of the accelerometer. YOUT. if there are multiple supply voltages). Filter Capacitor Selection. Resolution is dependent on the analog filter bandwidth at XOUT.ADXL330 APPLICATIONS POWER SUPPLY DECOUPLING For most applications. and the bandwidth varies accordingly. Note that some performance parameters change as the supply voltage is varied. Estimation of Peak-to-Peak Noise Peak-to-Peak Value 2 × rms 4 × rms 6 × rms 8 × rms % of Time that Noise Exceeds Nominal Peak-to-Peak Value 32 4.3 V. The equation for the 3 dB bandwidth is F−3 dB = 1/(2π(32 kΩ) × C(X. CX. AND CZ The ADXL330 has provisions for band limiting the XOUT. The output of the ADXL330 has a typical bandwidth of greater than 500 Hz. however. If this cannot be guaranteed due to the system design (for instance. The analog bandwidth can be further decreased to reduce noise and improve resolution. USE WITH OPERATING VOLTAGES OTHER THAN 3 V The ADXL330 is tested and specified at VS = 3 V. Table 5. 500 mg (or 150 mV) on the Y-axis.47 0. and CZ Bandwidth (Hz) 1 10 50 100 200 500 Capacitor (µF) 4. A | Page 12 of 16 . Never expose the ST pin to voltages greater than VS + 0. which contributes equally at all frequencies and is described in terms of μg/√Hz (the noise is proportional to the square root of the accelerometer bandwidth). Capacitors must be added at these pins to implement low-pass filtering for antialiasing and noise reduction. When this pin is set to VS. Ensure that the connection from the ADXL330 ground to the power supply ground is low impedance because noise transmitted through ground has a similar effect as noise transmitted through VS.8 V or as high as 3. Peak-to-peak noise can only be estimated by statistical methods.006 SELF TEST The ST pin controls the self test feature. additional care in power supply bypassing is required as this noise can cause errors in acceleration measurement. Y. and −200 mg (or −60 mV) on the Z-axis. Table 6 is useful for estimating the probabilities of exceeding various peak values. Z)) or more simply F–3 dB = 5 μF/C(X. it can be powered with VS as low as 1. The analog bandwidth must be no more than half the analog-to-digital sampling frequency to minimize aliasing. If additional decoupling is needed. Y.

at VS = 3. when ratiometricity of sensitivity is factored in with supply voltage. A | Page 13 of 16 05677-031 XOUT = 0g YOUT = 0g ZOUT = 1g XOUT = 0g YOUT = 0g ZOUT = –1g 05677-030 . the X. the output sensitivity (or scale factor) varies proportionally to the supply voltage.and Y-axis noise density is typically 350 μg/√Hz.6 V. while at VS = 2 V. The output noise is not ratiometric but is absolute in volts. the output sensitivity is typically 360 mV/g. Corresponding Output Voltage Increases When Accelerated Along the Sensitive Axis TOP GRAVITY XOUT = 0g YOUT = 1g ZOUT = 0g XOUT = 0g YOUT = –1g ZOUT = 0g TOP TOP TOP XOUT = 1g YOUT = 0g ZOUT = 0g TOP Figure 32. The supply current decreases as the supply voltage decreases. +275 mV for the Y-axis. the self test response is approximately −60 mV for the X-axis. At VS = 2 V. This is because the scale factor (mV/g) increases while the noise voltage remains constant.6 V. the noise density decreases as the supply voltage increases.6 V. the self test response for the ADXL330 is approximately −275 mV for the X-axis. therefore. so the zero g output is nominally equal to VS/2 at all supply voltages. the self test response in volts is roughly proportional to the cube of the supply voltage. XOUT = –1g YOUT = 0g ZOUT = 0g TOP At VS = 2 V. and −25 mV for the Z-axis. +60 mV for the Y-axis. The zero g bias output is also ratiometric. Orientation to Gravity Rev. Axes of Acceleration Sensitivity. Self test response in g is roughly proportional to the square of the supply voltage. and typical current consumption at VS = 2 V is 200 µA. and −100 mV for the Z-axis. the X.6 V is 375 µA. the output sensitivity is typically 195 mV/g. Output Response vs. At VS = 3. therefore. Typical current consumption at VS = 3. However. AXES OF ACCELERATION SENSITIVITY AZ AY AX Figure 31. For example.ADXL330 The ADXL330 output is ratiometric. At VS = 3.and Y-axis noise density is typically 230 µg/√Hz.

85 0.20 MIN 13 16 1 PIN 1 INDICATOR 2. Thick Quad (CP-16-5a*) Dimensions shown in millimeters ORDERING GUIDE Model ADXL330KCPZ 1 ADXL330KCPZ–RL1 EVAL-ADXL330Z1 1 Measurement Range ±3 g ±3 g Specified Voltage 3V 3V Temperature Range −25°C to +70°C −25°C to +70°C Package Description 16-Lead LFCSP_LQ 16-Lead LFCSP_LQ Evaluation Board 072606-A Package Option CP-16-5a CP-16-5a Z = Pb-free part.08 PIN 1 INDICATOR TOP VIEW 4.15 4.55 0.00 SQ 3.25 COPLANARITY 0. A | Page 14 of 16 .40 SEATING PLANE 0.20 MIN 0.50 0.35 0. 16-Lead Lead Frame Chip Scale Package [LFCSP_LQ] 4 mm × 4 mm Body.ADXL330 OUTLINE DIMENSIONS 0. Figure 33.30 0.45 1.02 NOM 0.50 1.75 SQ 1.95 BSC *STACKED DIE WITH GLASS SEAL.43 1. Rev.05 MAX 0.45 1.65 BSC 12 BOTTOM VIEW 9 8 5 4 0.05 1.

A | Page 15 of 16 .ADXL330 NOTES Rev.

D05677-0-6/07(A) Rev. A | Page 16 of 16 . Trademarks and registered trademarks are the property of their respective owners.ADXL330 NOTES ©2007 Analog Devices. Inc. All rights reserved.

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