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Characterization of Technological Processes

Characterization of Technological Processes

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introduction to material characterization, optical microscopy, electron microscopy, scanning probe microscopy. Optical spectroscopy and characterization techniques
introduction to material characterization, optical microscopy, electron microscopy, scanning probe microscopy. Optical spectroscopy and characterization techniques

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Published by: Project Symphony Collection on Feb 14, 2010
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01/31/2012

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The goal of this technique is to collect elastically scattered electrons and

reject inelastically scattered electrons; we must use something similar to the

XFS equipment, using electron probes and detectors instead of X-rays; as

said, we need also some filter: the selecting grid. They can be retarding

grids, which filter inelastically scattered electrons, and accelerating grids,

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which increase the energy of the electrons which are not filtered, exciting in

a better way the fluorescence in the screen.

This equipment is useful in both LEED and RHEED; there are some

little differences: RHEED uses more powerful electron guns in order to give

more energy to the electrons; we must use electromagnetic accelerators in

order to accelerate electrons. Grids are not useful, because elastically and

inelastically scattered electrons have a great difference.

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