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NOT MEASUREMENT

SENSIUYE
h
MIL-STWI05E
10 MAY 1989
SUPERSEDING
MIL-STD-105D
29 APRIL 1963

MILITARY STANDARD
SAMPLING PROCEDURES AND TABLES
FOR INSPECTION

BY ATTRIBUTES

AMSC N/A

AREA Qcil

~~~

& Approved for public reiesse; dktribution

is Unlimfi

!QL-SID105E

DEPA~
W DEFENSE
Washbgmn, DC 20301

SAT*LDG

P~

T I!NDZABESFOR INSP=TI@JBYMTNBUES

and Jqencies
1. Ttis tilitarystandad is approvedfor use by all Depsmmms
of ~~~
of ~f-
.
Cemmm&tiom.
additions,Wetions) and any
2. Beneficial~.ts
peeine.ntdatawhi~ may beef usein~this~
shouldbe
addressedto:
CnRInancier
Dwelopnent
Amy AmamE!!!Rem-a,
+-king
Ckmer
M-IN: SK?R-BAC-WBM!J . 6
Picatinnytisenal,NJ 07806-5000
Us.

by usi..g
the self-a=-essed&.andardizat
ion Dmmmt
(DD Fom 1426)~L-hq
at the md of this docmmt

ii

and

m~
or

PrepSal
letter.

MZL-SIZ+1C5Z

mRE3m*

ms

providessawling proce&res and referwm

tables for use in

on the pxobabiiis.icrecu.+mce 05 e%.ts when a sa~ies of-iots or bat~s


produ~ ti a stableenvironmrt.

are

of an
This publicationshouldbe-used to guide the user in the ~kpmnt
inspee.ionStratw that providesa co=. eff~ive qroach to attaining
ats. The
te-&%i~ reqJ
cm-:idm~ in pro&t ~liance withca%racaual
user is warned of the assumedrisks relativeto the *sem sanple size and
w-.

~ifications shouldnot contakn requirement


s for use of specific
Q.z?s, !23Z shxld .!y provideAQLs or H?Ds as a -~rmem.
pkns fc= coxinuous, rahr than lot inspection,are contm

iii

~L-.STD-lO5E

GmTmTs
Page
Paragraph
1.
1.1
1.2
2.
2.1
3.
3.1
3.2
3.3
3.4
3.5
2.6
3.7
3.e
3.9
3.10
3.11
3.12
3.13
3.14
3.15
3.16
3.17
3.18
3.19
3.20
3.21
3.22
3.23
4.
4.1
4.2
4.3
4.4
4.4.1
4.4.2
4.4.3

SCOPE...............................................

...........................................
.......................................

-se
*liation

~IxmPEurs-

...............................

qplicable ....................................

=INITIONS .........................................

Acq.able
Qdality Ievel WE) ....................
Average Outgo
~Quality(lQ) ....................
Averaoe OutqoingQualityWt
(AOQIJ
.............
Classificationof Defects.........................
CriticalDefect...................................
CriticalDefective................................
Defect............................................
D@eccive................. ........................
DefectsPer Ru@edUn its... ......................
..................................
~i~......
~aim
by Attribxes ..........................
w&or Batdl......................................
Im or Batch Size.................................
Major Defect......................................
Major Defective...................................
Minor Defect .....................................
Minor Defeaive. ..................................
PercentDefective.................................
~s
Average...................................
Sanple............................................
Sanple Size COde~tt=v ...........................
Salq?ling
Plan.....................................
unit of Procalct
...................................

2
2
2
2
2
2
2
3
3
3
3
3
3
3
3
3
3
4
4
4
4
4
4

W.

~mxm=nm

. . ... ....... ... ... . ... .. .. ......

4
4
5
5
5
5
5

................................
Written ~
NmcVnfozmne ....................................
Fonmticm and Itificatim
of ~
or =Cks. ..
...............................................
........................
ML use...0...........*...
Umkation ........ ...............................
choosingAQU .....................................

iv

mL-sm-lo5E

CcNTmrs

Conttiued.

Page
Paragraph

~B~
Sarrpling.
........................................
..........................
RepresentativeSan@.ing
4.5.1
The of Sanpling.................. ..............
4.5.2
Double or MQtiple Sampling
......................
4.5.3
.................... .......
4.6
~on
P~
.............................
4.7
WitdlirlgP~
....................
Normalto Tightened......0...
4.7.1
4.7.2
...................
Tightto Normal .....0....
..
..............*.....**...**..
4.7.3
Normalto ~
4.7.4
Rduced to Normal................................
4.8
Disconthtion of~on...
.................
4.9
SanplingPlans...................................
4.9.1
~ion
Wvel .................0...............
4.9.2
Co& utters .....................................
4.9.3
~aining San@ing Plan..........................
4.9.4
TYF= of sapling Pkns ..........................
4.10
Determinationof~ability.
..................
4.lC.1
P~Defective~ion.
....................
4.lC.1.A Single Sanql@ Plan.............................
4.1(?.1.2Double Sa@ing Plan.............................
4.10.1.3 FhltipleSanpling.
.......
Plan.......... *........
4.10.1.4 ~
for
Redu*IrqeCtion
.........
p~
4.10.2
............
DefectsPer ?lundmdt?nit s~ion
4.11
Idniting@ality Protection..
....................
4.12
~s
.................*.........................
4.12.1
~t@~merkic
~
..................
A~ge
Sanple Size Comes... ....................
4.12.2

5
5
5:
5

:
6
6
6
6

7
7
7
7
7
8
8
8
8
8
8
8
9
9
9
9
9

5.

...............*..
...........
TABES .............*...*

11

I.

Sa@e Size Coda Mitters..............


o..........
Single San@ing Plans for Normal~im
Naster table)......................
Single Smpliq Plms for Tightewd
~i~
~=t~le)
o..o-oooo=
==oo.=.e....
Single Sapling Plans for ~
~ia
(Mas@rtable)......................
Double SamplingPlans for Normal
~i~
-a~le)..
oo......o.BOO.......
Dcxble Sapling Plans for Tight~m
~er=e)
......................
Double SamplimgP1.ansfor Reduced
~im
(Mastertable)......................

13

Table
II-A.

II-B.
II-C.
III-A.
III-B.
III-C.

14
15
16
17

18
19

MIL-STW105E

mtnmrs-

Conthued.

Page
Table
Mltiple Sa@ing Plans for Norml
Inspectim M3ster-le) ......................
M.dtipleSanplingPlans for Tightened
IV-B.
~im
(MastertaMe) ......................
Mdtiple SamplingPlans for ReduOed
TV-c.
Inspection(Mastertable)......................
IAmit F~s
for
V-A.
Average Outgoinguty
lwml~on
(Sin@e Zq)
.....-...o..
V-B.
~ge
Outgo* QualityLimit Fa=ors for
TightenedIMpeCtiOn (S=le ~1~).:...-..
%3-A.
uting
Quality (h Perumt Def-iue) for
Wch a Pa = 10% (forNomal Inspemion,
S~le Saxrpling)
....................-..-...-*o
LimitingQuality (inDefectsper ~
V3-3.
Unks) for which the Pa = 10% (forNozmal
Inspection,Single Sanplhg).-..--------------XI-A.
Unliziq Quality (inP~t
mfecti=) fo~
khid. thePa = 5% (forNom@ ~ionl
SingleSawling)................................
LimitingQuality (fiDefectsper Hmdma
VII-B.
Units) for which the Pa = 5% (f= W*
....*..............
Siwle S=@@
~m,
~*~1Li,mitNmbersfor ~
Inspection...
..........
Auerage SampleSize Cumes for DDuble and
IX.
FmltipleS.mpliq .............-...--.-......-.c~ltig
pl= and cparatirq~amic
Cumes (andData) for:
San@e Size ~ktter
A........................
X-A.
X-3 .
Sanple Size ~Utter
B .........................
x-c.
Sanple Size Mkter
C ..........e00-00o.......
X-D.
San@e Size Co& LetterD ........................
X-E.
Sanple Size ~Utter
E ........................
San@e Size Mletter
F ........................
X-F.
Sanple Size MUtter
G ...............--..-..x-G .
X-H.
~le
Size @ckletter H ........................
X-J.
qksM-~
J............*....
X-K.
Sauple Size MIetter
K .......----------------X-L.
~le
S~M~
L ........................
x-M.
Sanple Size M~M
...........e............
X-N.
San@eSizeM E~N
. .......................
Sal@esizeM
wtterP
. . . . . . . . . . . . . . . .......
x-P.
~le
S~Mk=
Q.......*+*.==.*+*..=
x-Q.
X-R.
~le
S@ Mk=R
..................=~
IV-A.

vi

20
22
24
26
27
28
29
33
31
32
33
34
36
38
40
42
44
46
48
50
52
54
56
58
60
62
64

mL-slwlo5E

CCNTS

- Continued.
Page

x-s.

~~e

size ~

~tt~v S ........................

66

Paragraph
6.

6.1
6.2
6.3

........*..............................

. . . .

use...................................
(keyuofi) tist~ ................
Issw . . . . . . . . . . . . . . . . . . . .
~fr~P~im

Intf2nckci

67

SubjectIem

67

mlmsAL. .............................

67

68

F2L-SID-105S

1. ~~~
This ~li=tim
establisheslot or bat~ sapling plans and
1.2 Pqse.
publi=tion shallnot & irfterproceduresfor ~ion
by attributes. 1nis
words
s. m
p.reted
to superm3e or confli= with any amtraCtti ~
to
the
contractors
use
of
refer
only
a~,
acceptable*
e
tc,
awqX,
~anddonotinplyana~
W
the sanplingpkms Writin this
of aqability
by the
-theGove&mmnt to accept any prcdom. Deterfnination
me
Sarfpling
plans
Gwen :=% shall k as desm~
in contractual~ts.
*sdhd
in
Ws
standad
m
awli-le
to Us of .01pe~t
or ~~
and
arethe.ref
ore not suitablefor ++lications where quality1-1s in the defemive
;az.s per million range m be realiz05.
are applicable,

items.
a. ElrIc
b.

Cmponents

c. Qerations
d. Materialsin process.
e.

Su@ies

in storage.

f. Maintenance~ations.
9. Data

or

records.

h. Mmbistrative ~Theseplans are intendedprimarilyto be used for a continuingseries of lots


The plans may also be used for the inspectionof isolatedlots or
0: batches.
Mches, W., in MS
latter=,
m
=
K =i~
to ~t
~
~m
characteristicmrves to find a plan whichwill yieldthe desiredprotectim
(see4.11).
2.
2.1 N&. -liable.
3. =INITICNS

FEL-SIW105E

~able QualityLevel (ML) . When a mntinuous seriesof 10Es is


3.1 z
considered,the AQiiis tbe qualitylevelfib, for the roses
of sa@@
~.ion,
is the limitof a satisfactoryprocessaverage (Se 3.19).
NOTE: A sanpl~ plan and an AQL are chosenin accordanm with the risk assured.
Useofa@ueoflQL
fora a2rtain&!fector group of &fec5s indicam that the
pbded
the
ql~
PM
till acoeptthe -t
majorityof the lots or bata
prooess -X
level of ~
defectiwe (or&fects per huxlred units) in these
Thus,
the AQL is
lots or batchesbe no greaterthan the ~ignated value of A&
a ckignated value of ~
defective (or&facts per hundredunits) for fich
~re
bing used. The
btswill~a~+m~oftk
timbythesaqlingp
of a~
~liw
pl~ prfi~
here~ ~
~ ~
tit ~
p~i~ty
at the ~ignat~
A@ ~ue ~
~
the sanplesize,~
Z~N
~Xr
:0= 1~~ samples -n
for mall ones, for a givenAQL. The AQL alone does not
idelm=if
y the chanoes of aqing
or rejectingindividual10Ls or batches M
m...-y
frun a seriesof lots or batches,
dire~ relates to what might be ~ed
to
prmi- *
steps indi=ted h -s publi~tion aze taken. lt is ~sary
the
relative
~
of
t.te
plan
to
*texmine
=eYer to the operattigdarad.=iscic
risks.

3.3 Average Qxqoing QualityLimit (ADQL). The M(2L is the maximum ACQ fora
ML tiues are givm M
9L~ a9L~~
-lW
pkn. Factors for ~@?
Tabie V-A for each of ~ singlesaqlimg plans for normal irqection and in
on.
Table V-3 for each of the singlesmpling plans foz tightened~
of defectsis t!! enumerationof
3.4 ClassifimEion of Defects. A classification
of the unit of pxduct
classifiedamrdirq to their seri~.
pcsstiie defects

3.5 Czlti~ DefS&. A criticaldefect is a ~fect that j~


and ~ri=ce
~mte
would result in
hazardousor
unsafeconditionsfor
individualsUS*,
~
ora ~fecttbat~ti
--,
or ~upontheprodwt,
of ttE ~cal
fun-on of a
indicate
is likely to prevent perf~
experim
title.
major *
itm SU* as a Ship, aixuaft # tank, nbsile, or ~
3.6
Critidl Defective. A criticalckfectiveis a unit of prockt uhi~
contti one or mre criti~ defectsti may also contdn mejor and/or minor
defects.

3.7 Defect., A defect is any nonconformanm of the unit of product with


specimTEi%@l=mts
.

laksm-lo5E

3.8 Def-.ive. A def=~ive is a unit of productwhich containsone or mre


defe.s.

Defe.s per HunckedUnits. The nwber of defe=s per hundred units of ~Y


gim quantityof units of productis one hundredtimes the mm&r of &fects
being
possible
in
any
unit of product)
con=zinedtherein (one or mme *fec&s
diviti by the total nunberof units of product,i.e.:
3.5

Defects

hundredunits

Nunberof &fects x
Nmbar of units ~~

100

~gt
3.2C Impaction. Inspectionis the processof ~imt
cr o-.?m.isecmparing the unit of pmdu~. with the reqair-nts.

testmt

T
~io~
by Attribtes. Inspectim by attributesis inspectionwhe~
eizher & unit of productis classifiedsimplyas defectiveor non+ef=eive, or
to a givm
~he number of defe~.sti the unit c= prcdue.is courted,with re~st
~~:i~m
or set or requirements.
7,1i
---

or -t&l. The term lot ox katch shall man inspectionlot or


3.12 tit
i==se.ion batcb.,i.e., a collee.ionof units of product from whi~ a sanple
is EC be dram and i~ed
md may dif5erfrm a mll-~ion of units designated
as a 10= or bat~ for 0= purposes (e.g., production,shipnent,etc.).
3.13 bt or Batch Size. The lot or ~t~
A a lot0:bata.

size is the number of units of prtib

3.14 M3jor Defect. A major defecL is a -fact, other than criti-, that is
liKelyto resultin failure,or to reducemateriallythe usabilityof the unit
of productfor its int~~ajor * f~i~.
A major defectiveis a unit of product whid? containSone
0: mre major defects,* may alSO contain rrtiordefecLsbut containsno aitidefect.
3.15

isnot-yto~
3.16
Minor Defect. Anbm~i.Sa&fti~t
materiallythe usabilityof the unit of productfox its intpuzpose~m is e
~WviIgU*~@m
tkeffeCtiWUSec
fran ~
&par&m
operatim of the unit.
3-17
Minor
- . . . Def-i-.

--ox more minor &facts

A minor defectiveis a unit of P-a


M*
no aititi or major *feet.

mtamtains

!!GL-SB105!2

3.16 Per-m
Defective. The percent &femive of any givm quantityof units
of produe~is one hur&4 tires the n~of defemive units of prda~. contairEd
thereindiviti by the total mmber of units of produa, i.e.:
?ercentDefective

Nmber of &fectives x
~
of lmits ~ed

100

&fective or
3..19ProcessAverage. The Drocess average is the average~t
of product
averagenmber of &fects pez hw@red units (whichever is ~li~le)
szhitted by the sq@ier for originalinspection. Originalinspectionis ~
firstinspectionof a pa.z.zicula.r
quantityof produceas d.istinguis@dfran the
~ion
of productwhi~ has been resu&nittedafterprior rejection.
3.2C Sa~le. A sampleconsi=.sof one or mre u..irsof productdrawn fran a 10=
to their
or &z&, the units of the sem@e being sele~beda= randomwithoutrq~z:icy. ~
nmtx= C: units of product in the sample is the sarplesize.
3.22 SampleSize Coae Utter.
ElO.ngWitihthe WA fcr l-tins

The sanple size code letter is a deviceused


a sapling plan cm a table cf semplingplans.

3.22

A sanplingplan indc!caces
the nunt?erof units of product
Sa?@hg Plan.
ad (sanplesize or seriesof
fromeat.io= or bat&. which m
to be insoect
sa@e sizes)and the criteriafor cke.rmi.%ngthe acceptabilityof the lot or
batch (acceptan02anc rejectionnumbers).
?.23 Unitof Prodxz . The unit of produ~. is the thing inspectedin o-r to
&.emme
lts classif~mtion as defectiveor non-def-hive or to count the ~
of +.fecbs. It my be a single article,a p&ir, a set, a hmgth, an =8
~
operation,a volme, a cmpcmmt of an end product,or tlw end prociuaitself.
SWPIY,
The unit of p~GL
may or my not be the same as the unit of ~,
production,or sh.ipnent.
4. QN=AL

RmJIm=m

are o~ily
davelopedami made
4.1. Written P~
. Written p~
Ves~,lqmnmquast.
-avaalablefor *
Govemmm
~
writtenp~
indime me of this stmdard, they shall amply with mq111
raErltsof this stmdard arxlZefermce appropriate~
as ~.
ofpro&ct sbaube=rP=4.2 Nonconformance
. he extent of nonconf~
titS.
eitherin terns Of peroentCkfectiveor in term of ckfectsper ~

MIPSTD-105E

4.3 Fo.mationand Identificationof Uts or Bat&es. Theproductshauke


as-led
into i-tifiable lots, -lots, batches,or in otkr manneras
may be paaibed . Ea* lot ox bat~ shall,as far as is practicable,mnsist
of units of prcduct of a singletype, grade, class,size, and composition,
.
manufacturedunder es-tially the sam renditions,and at ~ythesam
tine . The lots or batshall be itified
by the contractorand shallbe ke
intar.in adequateand suitablestoragespace.
4.4

AQL.

4.4.1 AQL use. The AQL, to@ther with the SaupleSize b&
plans p.mcw
herein.
. the sapling

.
~
ln&?Lnc

Letter,is used

for

4.4.2
Iimita:ion. The selectionor use of an AQL shallm. inplythat the
cwcractor has the right to sm@ y any defecEivewilt of product.

4.4.3 Chmshc ?@&. Diff~t


~Ls IllSy
be Chosenfor ~
of &fects
cms.ide.red
colle.+.ivel
y, or for individual&fee&s. An ML for a groupof &fec
my be tiosen in a~cion to AQM for individualdefects,or mkqraps, within
chat group. AQL values of 10.0 or less my be expressedeither in ~t
&fective or *. ~fects ~- hunckd units;those over 10.0 ZhaU be qressed ix
defe.s per h!mdmd

units only.
4.5 Saxlplinq.
4.5.1 Repmsmt ative (Stratified)Satrplinq.When ~ropriate, the rnzr&r of
units in the sanple shall & sel~ed in proportionto the size of subletsor
-bat-,
or -s
of tM lot or bat~, idmtified by q
rationalcriterior
when represemathHaIcpMn
giswad,121e units
franeaal Sublet,sub-batch or
part of the lot or batdi shall be selected
at ranch.
4.5.2 Time of SanPlhq A samplemay be dram after all the units caprising
the lot or batch have bi+enassembled,or sarrple
unitsmay be drawn duringassak
of the lot or bat~, in uhi~ case the size of the lot or M*
till k *te*
kefore any ample units are dram. If tk sampleunits are drawn duringas~l~
oftklot
or batda, mdif tkrejectionnmb2ris
~m!foreth
lotis
Curpleted,that pomim of U
lot almldy cxmpletedshallbe @ected. m
a
oftkdefective ~shall
bedmermined and ammctive actiontaken,after
*.
&ichanewl otorbat*shgd.lk
4.5.3
Double or Mltiple Saup1~
WherI&&le or mkiple sauplingis to be
used, ea~ qle
shall be selecte&Ovar the entire lot or bat~.

IaL-sIwlc5E

~ion
Pr~.
Normal inspectionwink-at
the startof
shall continueundwqed for
inspection. Normal,tightenedor redu~ -bion
an sumsive
lots ox batd7esexq. where the
each class of def~s or &fectiws
*1
givm klw
require -.
m
swit~
P~?
p~
%it~
oz &2f_iveS ~
<Y
be -lied to each class of ckfecSs
4.6

4.7

%?it-

P~es

normal inspectionis in effect,ti@tened


4.7.1 Normal to Tightened. ~
*mim
shallk institutedwhm 2 ouc of 2, 3, 4, or 5 comecutive lots or
tted lots
batches have been rejetted on originalhspection (i.e.,ignoring~
0: btC!!S fOr thiS Fr~)
.
4.?.2 Tig?l:enee
to No.mal. When tightened~ion
is -b effect,no.mbal
inspecuon shailbe instituted*=I 5 consecutive10:s or baccbeshave -n
on.
co.nsidey-a-ptable on original~
4.7.3 No.mal to R@xed.
When normal inspectionis in effect,reducedir++ion
shal1 be -.ituted providedthat all of the followi~ conditionsare satisfied:
(ormre, as indicatedby EYW note tc
6. Tne pretig
20 lots ox batTa5~e VIII) have bee!!on no.mal ~ction
aiidall have ben acceptedon original
inspection;and
(orbf~)
fi ~
~~es
~
~
b. The.total nurber of ckf-i=
p.re
ceding 10 lots or batches (orSU* Ot&r mmber as was used for conditiona
-)
is equal to or less than the a@i-le
nmber given in TableVIII. If
dable or mikiple smpling is in use, all samplesinspectedshouldbe ~ti-,
+les
only; imd
Pro@cLion is at a steadyrate; and
RE!cked~

on is consi&rr

&sirable.

4.7.4 RedWed to Normal. _


~
~ion
follcwingomu
shallbe institutedif any of -

is in effect,normal inspection
on originalinq3acEcion:

a. A lot or bat~ is rejected;or


b. A le. Or batd) is comi4.10.1.4,or

acceptaMe under the procedueS of

c. Productionbecmes -=
d. Other conditims ~ant

or dela~;

or

that normal inspectionshallbe instituted.

MIL-SIW105E

4.8
Discontinuation
of 1~
ion. If the cumulative nmber of lots not
acce~.edin a sequenceof mnsecmive LuLs on originaltightmed inspection
r~achesfive,the acceptan~ prm3dures of this standardshall be discontfiued.
Inqlm
un~- the provisims of *thisstandardshallnot be ~
until
mrrective actionhas ~
takZ7. Tigthened~ion
shall then be used as if
4.7.1had been invoked. .
4.9 SanplinqPlans.

4.9.1 InspectionM.
The inspectionlevel &termines the rela+~onship~
the lo: or &t* size and the sanplesize. Thehspemion levelto be used for
any pa.mieti~-re@~c
will be as prescribedby the contractorswritten
Three
in.spec.ion
levels:I, II, and 111, are g:van in Table I for
--es.
P-~
ge-.-erai
use (see4.1). Normally,hspee~ion Level II is us-. Hmmmr,
In~=.ion @vel I my be used whm less dis=wtion
is needed,or Ievel 111
my be used for greaterdiscrtition.
Four additionalspeciallevels:
S-1, S-2, S-3, mti S-4, am gimn in the same tabie and my be used where
relaciveiysmall sanpiesizesace necessaryand large sa@ing risks can or W.
& mlerat~.
In the selectionof inspee.im ievelsS-1 tc S-4, ~
must be exercised
avoidAQii mm.asistent witi.
these ~eion
levels. Lm OLk
words,
the
~
inspemion
levels is to keep sanplessmall when ~saxy.
For
of the
special
in.stanae,
the code iectersunder S-1 go no funk: than D, equivalentto a siql
sanpleof size 8, but it is cf nc use to choose S-1 if the AQL is 0.10 ~.
f
which the mhinm ample is 125.

N3TE:

Sanplesizes are designatedby wck letters..-Table I shal


4.9.2
Co& Letters.
be used to find t& applicableco& letterfor the ~icular
lot or batch size
and the p~iked
impectlon level.
4.3.3retainingSallp
lillgPlan. TTieAQLandthe m& letter shall be usedto
=ain tne sanpl.irq
plan fran Tables II, III, or IV. Whm no sapling plan is
availablefor a given cabination of AQL and code letter,the tables directthe
user tc a differentletter. Thesa@e
size to beusedisgLvm
bythenew co&
letter,not by t& originalletter. If this p~
leads to differentsample
sizes for diff~
classesof &fects, t& code letter m ~tothe .
~
sa@e size derivedmay be used for all Classesof defec+s. & an
alternativeto a sirqle sauplii plan with an ~
~ofo,
the plan
with an a~
ly Mqer sauple size for e
m.mberof lwithitscomeqmmbg
&signated AQL (wkre available), may be ~.

MIL-SID-105E

4.9.4 Types of Sanpling Plans. Three types of sapling plans: Single,Double,


and Wlziple, are givm h Tables II, III, and IV, respectively. Whe!!several
:ypes of plans are availablefor a given AQL and code letter,any one may be used.
A decisionu to t= of plan, either single,double,or titipler ~
~l~le
@
*
letter, will ~ly
&
~
~
*
~ison
bet=
for a given ~
diffitity and the ~ge
sanple sizes of the availableplans.
the administrative
7he averageszmplesize of multipleplans is less than for -Ie
(~
M ~
case co.~
to si@e aqance
n-1) and both of these m
always
less than a si~le qle
size (seeTable IX). US@lY m
~~a~ve
difficultyfor singlesmpling and the cost per unit of the sanple are lessthan
for double or mltiple.
4.lG Daennina:ia of Amsmability.
4.2G.I Pe~nt Defeaive Inspection. To determinea~
ility of a lot or
bate!!mder percentdefectiveinspection,the appli-le. San@@
plan shallbe
used in accodance with 4.10.1.1,4.10.1.2,4.10.1-3,@
4.3~.l.4.
4.IC.I.2 Shgie SanpLingPlan. The n-
of sanpleunits inspecxedshallbe
qua2 tc the sanplesize givm by the plan. If tk n-v
of =f-.if~
the sample is equalto or less than the aqan~
rnmber,t& lot or bat~ shall
m consideredaqable.
If the nmber of &feccives is equal to or great-than
the mjemion nwker, the 10= or bat~ shall be rejected.
4.10.1.2 Double SamplinqPlan. Anuberof
sa@eunkS6S?ud
to the first
sa@e size giw by the plan shallbe inspected. If the mmber of def=ives
found m the firstsanple is equal to or less than the first~
nmber,
the lot or bat- shallbe consia~le.
If tb ~
of W-W
found inthefirst sample is equal toorgmater
than the firSt z@eCtim~l
the lot or batd shallbe rejected. If tb nmber of &fectives fomd in &
firstsanple is betweenthe first~c
and rejectionxnzc&rs,a ~
sanpleof the sane size shallbe ~ed.
TM ~
of a-i=
fin
the fixst and secmd aanpks shallbe ammlated.
If the ~tiw
~
of
mmber, the lot or batd
*fectives isaqualto or less thanthesemnda~
shallh cmsickred a~le.
If the cmdative rnmber of &fectives G equal
toorgreaterthan~~
rejectim~,t&lOtOrk*
aballbe
= jetted.

im. 4.10.1.4
special
P~for~xnSJect
Xed13=d ~im
*
Sanplingpmoadura may t~
or rejectionaiteria
Withult aith=ac=pt==
m--
~
*l~or=*~~be-acceptable,but normal
reinstatedstartingwith the next lot or
batch (see4.7.4.b)
.

8
.

mL-Slmlo5E

a-ability
of a
4.10.2 Defectsw
Hundredunits Inspection. To &temine ~
ion, t& promdure specified
k&feCts ~ hundredunits ~
lot Or batti
for pemem 63feGive inapecxionabove shallbe -, ex~
that the woti
defectsshallbe substitutedfor ckfectives.
4.~1 ~i
mg QualityProtection.The sanplingplans and associated~
given m this @liatim
were designedfor use _
the units of product are
prodmed in a continuingseriesof lots or batches mer a period of tire.~t
the lot or batti is of an isolatedmm,
it is ~irable to limit the
ML mlw, Z
=lec&im of sarrpling
plans to those, associatedwith a ck2signated
prouidenot less than a ~fied
limitingqualitypmtectim
-W
pldns for
this purpose-. be selectedby dmosing a LimitingQuality (L@ and a ~s
risk to be associatedwith it. TablesVI and VII give values of W for the
If a
the cmnonly used bonsmersrisks of 10 ~at
and 5 ~t
~bively.
s risk is recpired,the O.C. cumesandtheirtabutiffe.mc value of co~
lazed valuesmy be used. The conceptof IQ may also be useful in specify+q the
on Levels for a seriesof lots or bat-s, thus fixim mimmm
L-L and ~~.i
s*ie size-vhere there is saw reason for avoiding (withmre than a-gima
corsmers risk)more than & Limking p~rtion
of def-kives (or defects)in any
single lot or bat~..

4.X2

Cum?es.

The qerathg ~ctaistic


mmes for
4.12.1 @crating Characteristic
~s.
shown in TableX, indi~=e the pe.roentage
of lots or kt~
normal -~ion,
whAti may be ~ed
to be acceptedunder the various sapling plans for a given
pmoess @ity.
The mmes shown are for single sapling; cumes for tile and
mlziple saqling are xmtchedas closelyas p-i-le.
The O.C. cumes shown
for AQIs greaterthan 10.0 are based on the Poisson&ibution
ti are ~li~le fo= defectspax hundredunits i.nsp&tion;those for ~
of 10.0 or less and
sanplesizesof 80 or less are M
on the binanialdistrikmim and azz
applicablefor perdefecLive~-ion;
those for AQE of 10.0 or less and
sarplesizes1-than 80 am based the Poissondistributionand m
~li-le
eim- for defeczsper hundredunits hsoection, or for percent de@ctive
.Onto the
inspection(thePoissm distribution
&&g an ~te
q~
timid
distrih.tim these conditions)
. TaMhted mluas,
selectedvalues or pmhabilitiesof aqanue
(Pa,in ~)
are gif= a&
ofth CUmes -,
an& in addition,for tightenedimpectxon, and for Mperhundred units for ZoflO.
O orlessand sauplesizesof800r
less.
4.~2-2 Amage Sqle SizeOzrves. Averageample size mrves for ~le
@
show the averagesa@e sizes wMA may
mltiple sanplingam in TableIX. =
levelsof prooess
be qed
to omzr un&r the varioussa@ing plans for qcumailmnt of ~im
aml are ~roximte
quality. The
the m-t
tha-m
e=
upon the Poissondistribution,and that the s&e
sizes for double and multiplesamli.ngare assmed to & 0.631n and 0.25n
size.
respectively,
where n is the

MIL-SlW105E

SEXZIC)N
5
TAW3SANOG7E7VES

<ma

<4<

Vvu

C=W

=aa

CODI
LETTEN

1.3

SINGLE
NORMAL

14

s
w

we
la

n
9

SW

..

ns

M
ao

II

#w

to

o
n

Ii

a
s

4
e

Ialu

do.
b.

0
12

r)

1?

01

ldJ

M@

)4

11-6 Single

01

TABLE

0.40

satnpling

/or tighened

01

km
.

I.e

plans
itlspeclitm

(Muster

table)

(s0?

4.9.3

and

MO

4.9.4)

MIb~105E

SINGLE
REDUCED

16

-SK)-105E

17

DOUBJ
NORMI

?
?

*V*?

l,+

---l=

_LL

Idle,

c--

e
Ilu

Il..

II*

hew,+1.,
PI.,

e-a~w

.,.aI,

h,,,*,+ ., ,1,.
- n,,.~,rw. 8d94

,Iti+,

..I,,

VI

.w,I.-.

.h.m.11..l,

11s*w1..*I.

?!
6:

1. Il.

441. . ...1..,+

I,,,b,. . ..l
,..,..,,,8

.h.

w . ..4.!1.1

tm ,.. ,., ,.,, -, ,,,.

$, 1....1.

1-1..

.,,...1. l.. e. tn. wh.,,.

4.

A,.,sl.l.l. 1,..,1.

n
n

.. .

I
n

1.

IIW pha h,

l-k,. urn*I,,,., me

l:. t. II

,I,lbl

, It 1,
*

II

II

61
13 I

1-

. i

t:

II

.
.
;>

11

,,

(5ee4.9.3.ml 4.9.4)

DOUBI
mua
u

MULTIPLE
NORMAL
20

KUF~105E

.1

I
1

.:

..

---*

1.- -----

;
I .8 -----}!-!
H sl~l----1

-.--.w.ei

*----

-------

+ .. *+.-..

C.. --.

s -----

.* -----

-------

-.o===~

Z=Z:

*- *-..:

------

.0

.---

m-.
***-

.. ----

-----

9 .. -.--

.0 ----..---?!

n-----

.--

. . .. ---t

D-

------

1----l
----.- o-a..
4

-00 --------

-m-:=

..-

-----

a---=:~

..-

-*j..-*

.* .0---

.----~~
--.--*3

..0---

=m
. ------

r. ..

-..

. ..0---1

1
..

21

.--

. ..----1.*-*-.
*

I
I

I1.-----

-----

------

-------

*.-

II
!I

--1===---=1A

-o=:~==

aa

-,-

1=
o..-gn
---

*--0--------.--------

0-...=:
.-

l=lsl=l
2

i
:.-

...=

E
m

jz

-------I..-----1------- ----.-~
------I -------

a
a
:

.--

-.*

i-----=:
------~
.- ---0

~
---=:==
--.====
0--.--

=1=1

+1:::::::
:::::::
:::::::1:::::::
-------1-------, -----:=1---;2
!-,. 10 ~
;::::::

i:i
+

-:

I 2 l+

II

.-...,.-

00---.

-----51-------

0---.-

1------

--

-0

i-------

. . ..-

0 .0.=:

I----q

.
d

=
e.i
Iiit

:010

[11

ecw.
:.
..

MULTIPLE
TIGHTENED

22

MULTN
TIGHTEN
23

!
r
:
=

MULTIPLE
REDUCED
24

MULTI
mu
25

20

1?

3is

Soo

Wo

12s)

mo

1%

K
L
M

32
30
20

13

22

SkO

TABLE

1.02!

).014

Ju

.01

1.1?

0.1!

.097 I.
16

.(M

041

1,73

1.%

1.2

O.ai 1.2

1.0( 1.4

0.9( 1,3

).22).33L41

L56

1.6

1.7

l.?

2.0

1.(

0.91 1.6

1.1

1.1

1.0

Q&

~.~:

L40

1.44 ).62

).39 ).63

).42 ).69

).6?

1.2

).60

Lhd

).s2

).24

)21

).27

L74

02s

Qwdity

).46

1.16 MS

1.17

).11
.

).11

).10

.061

074

).12

1.29

L10

1.04( I06s

Otdgoiug

.02!

V.A Average

I.B

1.9

2.1

2.2

2.5

2.4

2.?

2.6

46

1.s

Factors

2.9

3m

33

3.6

4.4

3q

4.3

4i

74

2.s

4.7

C.7

5.2

5.6

6.3

6.1

6.9

6.S

12

4.0

/or

7.3

7,s

9.0
a.2

9.9

9,7
.

11

II

10

6,5

Ntmnd

12

12

13

14

16

Is

17

Ii

to

10

19

21

22

24

24

27

23

1s

29

33

34

4Q

39

46

42

22

46

47

60

63

65

69

40

fwspecjion

73

72

9a

12(

Iw

22(

332

23(

ml

ml

47q

4ot

410

6(M

7a

73

6s

(see

Jam@iwK)

31a
m

la
M
270
Iia t7am

la

10I

Ila Iw

91

62

(Single

in

1m
1la

3.3)

lmPslwlo5E

3-

I
1

Z38

I Ss: I

-. I 0.
==-

Id

A(
TWITEI
.

13

20

32

50

no

125

200

31s

500

8W

r%

II

1
()

2UO0

1250

II

2
3

size

Ntw

Smple

:O&

0.18

0.29

0,53

0.46

0.20 0.27 0.33

0.70

0.31 0.43

I.2

IS(I

0.065 0,10

!mpeclht!,

percent

0,67

0.73

0.040

Norma!

Qua[it y (in

0.49

0.46

0.015 0.025

(/or

VI-A Limiting

0.010

TAULE

1.0
0.77

0.59

1.5

I.9

2.1

2.7

3.1

6.9

0,40

0.9,4 1,2

I,2

I.3

1.7

2,0

4.s

0.25

1.4

1.6

1.9

2.4

2.9

2.3

3,1
2.5

3.7

4.6

5,4

4,3
3.3

6.5

7.6
4.8

11

16

0.65 1.0

w~~ich P& =

sdmi)hg)

for

0,74

o.a4

1.1

I.2

2.0

0.Is

i%t~fp

de/atirv)

3.5

4.0

4.9

5.9

77

13

16

10

37

2.5

14

18

S.6

6.4

7.7

9.0

10

14

16

19

22

27

24

29

34

42

30
25
20

44

54

58

10

36

41

68

6.5

(Sr?r? 4.11)

27

54

4.(J

9.4 12

8.2 11

10

12

25

1.5

10 Percent

r&

Wo

1220

Jam

Soo

125
m
31s

).10

).29

).20

).46

1.2

0.61

0.?1).33D.44 D.5Y D.71

1.0

12

14

1.6

1.9

2.4

2.9

I .9

33

27

43

49

21

3.1

1.2 I .s

1.3

17

20

0.14 0,94

D84

D.7m II

0.31).43D.W

)49

1.2

I .0

2.9
-

)6

2.J

2.s

3.1

37

46

54

6.7

78

w
so
w

90

10

12

Is

19

!1

14

}6

23

25

31

24
19

37

29

46
.

/7

33

20

71

51

41

ul

13

2?

18

04

35

40

48

59

56

63

71

91

120

130

I 10

67

100

25

IJO

49

Is

f7

10

22

65

78

to

l.cwl

Accrpldll?
(JUdily

7.2

).65 I .0

040

0.2!

42

0.73

10 1 Is

Lti! )

).011 ).01! .02! w

tuer

100

120

150

190

220

40

220

MI

230

ml

3W

z
310

140

350

410

610

Slo
400

iii

Zio

la) 150

24a

310

RI

65

61(

77(

94[

13M

lot

iii

MO

Iw

xi

I-MO

w
o

&

00

12s

200

315

500

800

1230

20

13

so

32

Qlze

semph

0.24

0.010

0.30

0,015

TABLE Vii-A

leuet

Q ~

Qwdity

0.24

O.tw

o.%

2.4

0.10

0.62

0,53

0.50

0.39
0.32

0.59 0.79

1.5

0,065

7.7

3.4
2.7
2.4

2.6
2.1
1.8

2.1

1.6

1.6
0.97 1.3
O.ty 1.1

0.66 o.rL5 1.1

1.5

4.2
3.3
2.5

2.0

1.4

5.3

1.3

14

31

I .s

3.8

4,4

5.4

6.6

8.4

9.4

9.1 12

21

1.0

S.o* 6.2

5.8

14

0.65

3.9

3.fl

8,9

0,40

3.2

5.8

0.25

Pa

2.4
1.s
-

3.7

0.15

lAvel

dtfeciile)
\nr which
Shgle $dmplivlg)

Acceptable Quality

Inspection,

(iti fwcmt

0,30

0.95

0.025 0.040

(for iVoWnal

Limiting

6.1

7.0

8.S

11

13

15

18

22

45

2.5

Percent

9.6

11

14

16

26

23

28

32

63

4.0

15

18

20

2s

30

34

41

47

6.5

24

32
26

37

46

so

60

66

10

(:;W7 4.11)

13

20

32

so

60

IS

31s

Soo

Wo

12s0

II

IU

Imtt

Saaqh

Lkde

0.24

0.011

0.36

k24

0,60

).01sm!

0s0

0.s9

1.5

0.6,

0,71

0.9!

2.4

0.06!0.1(

L32 0.39 B.sj

Mm

L9S

I.ol{

1.3

1.6

),66

O.(M 1.1

0,9

1,3

1.s 2.0

2.6

6.0

0.2s

3.8

0.1!

..

1.1

1.4

1.6

?.1

2.s

3.2

3.0

9,4

0.40

1.s

1.8

2,1

2.6

3.3

3.9

S.o

S.9

15

0.6.5

2.4

2.7

3A

4.2

3.8

4.4

5.4

6.6

8.4

6.2
5.3

9.7

13

Is

36

1.5

Odity

7.9

9s

23

I .0

Accqmble

6.1

7.0

8.5

II

13

16

20

24

60

2.5

I.?vrl

9.6
<

II

14

16

21

24

32

31

100

4.0

is

18

2t

26

33

39

46

S9

Isa

6.5

24

27

34

41

!i3

44

S3

66

81

97

79

144

IM

u)

61

66

6s

100

lM

160

210

260

Is a

10

I10 1s0

9s

Im

164 21C
KM

S30

270

340

3s( 449

39(

6s

210 26a

2tM

J2a

40

.310 ua

3na sla

44a 610

1s0(

Ooo

14a

710

8]0 IIa

moo

IWO

4006M

Ma Ilm

s7fJ m

66a

l!ilm

1?44

e
o

Q
I
4

t
o

,oom. IMW
1.320. law

Ym.

mo . w

moo. wQ

Iao .1440

Wo .

$n.lw

2n.4w

.
*

S4. n

28.4Q

b
*

n.m

Q4. 12?
IJO .194
200. m

Ion I01s Boa

0
t
?

8
@

*
*

IN

s
14

16
N

2
t

24

?J

1
?
IJ

s
t

.
.

0
?

11s
106
..

m
Ill

40

bl

)2

1$

.
.

*
.
#

0M

u
0?

14

0
0

00

N
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X-K Tabfes

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(Curwo f- &No ad .lllplo Su+lq
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TABLE

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130

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66

6.

NvrEE

6.1
.Mtended use.
sapling
p~
and tables for ~i~
by
aztrh.es are titendedto be used in the acquisitionof Defensematerial.
6.2

subject
-able

Tam

(Key

word)

Wzing

QualityLeVel (AQL)

AverageWtgoing Quality (J@)


Defect

Lo: or Eat&.

%-s

Average

San@e
SaTphlg

Plan

6.3
Changes from PreviousIssue. Verticallines or aste=isksare not used in
this revisionto identify-ges
with respaGLto the previous issuedue to
*theextensivenessof the ~.

67

MIL-STW105E
mum.%

MATERXAL

PreparingActivity:
Army-Al?

Cusmdiam
:
Amy
- m

Na\y- CS
fir Force - 23
Review ?kcceivities:
~MI, EA, TE, AV, ER
Navy - As, ECr FZ, CM, S&
Slitm, YD
DW - Es, Gs, Ss
OSD-IP, SO

(Pro-

User Ac+.i\-ities:
ArTIT-m
DLA - Es, Ss

68

CCIC-0085)

imu

)EPARTMEN7

OF

w)

THE ARMY

111111
p
UWTEO -AT,

,
>FFOCtAL SuEt~
WNALTV

OR RIVATE

USE ~

BUSINESS
FIRE?

CL-

REPLY MAIL

PERMtT No

ts

WASHINGTON

D C

PO=AGE

WILL

SE AtD BY THE DEPARTMEN7

PICATnwY ~,

NJ

OF THE

ARMY

07806-5000

STANDARDIZATION

DOCUMENT
(&e Inmucnms

IMPROVEMENT

PROPOSAL

- RmwxSi&)

Iu

VEUOOR

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