MAN-11100-E101 Rev.

D

SUNRISE TELECOM
I N C O R P O R A T E D

SunSet E20/c

User’s Manual SS266 Version 2.00

Sunrise Telecom ... a step ahead
302 Enzo Drive San Jose, CA 95138 Tel: 1-408-363-8000 Fax: 1-408-363-8313 SunSet E20/c

! WARNING Using the supplied equipment in a manner not specified by Sunrise Telecom may impair the protection provided by the equipment.

Copyright 2003 Sunrise Telecom, Incorportated This device uses software either developed by Sunrise or licensed by Sunrise from third parties. The software is confidential and proprietary. The software is protected by copyright and contains trade secrets of Sunrise or Sunrise’s licensors. The purchaser of this device agrees that it has received a license solely to use the software as embedded in the device, and the purchaser is prohibited from copying, reverse engineering, decompiling, or disassembling the software. SunSet E20/c

SunSet E20/c User’s Manual Table of Contents
Chapter 1 Initial Setup ......................................................... 7 1.1 Important Safety Information ............................................ 7 1.2 Unpacking the Test Set ..................................................... 9 1.3 Software Card Installation ............................................... 10 1.4 Replacing the Battery Pack ............................................ 11 1.5 Notes on Using This Manual ........................................... 12 Chapter 2 Test Set Description ........................................... 13 2.1 Keys ................................................................................ 14 2.1.1 Primary Functions ....................................................... 14 2.1.2 Shift Functions ............................................................ 17 2.2 LEDs .............................................................................. 18 2.2.1 Common LEDs ............................................................ 18 2.2.2 Line 1 and 2 LEDs ....................................................... 19 2.2.3 Datacom (Orange Labeled) LEDs ................................ 20 2.3 Connector Panels ............................................................ 21 2.3.1 Left Side Panel ............................................................ 21 2.3.2 Right Side Panel .......................................................... 22 2.3.3 Top Panel ..................................................................... 22 2.3.3.1 Using the Battery and AC Charger ............................ 23 2.3.3.2 Using the Serial Port ................................................. 24 Chapter 3 Menus ................................................................. 27 3.1 Introduction ..................................................................... 27 3.2 Test Configuration ........................................................... 34 3.2.1 E1SINGL Mode ............................................................ 35 3.2.2 E1DUAL Mode ............................................................. 40 3.2.3 E1-MUX Mode ............................................................. 47 3.2.4 MUXTEST Mode ......................................................... 51 3.3 Test Pattern ..................................................................... 56 3.3.1 Standard Patterns ........................................................ 56 3.3.2 User Test Patterns ....................................................... 57 3.4 Measurement Results ..................................................... 60 3.4.1 E1 Results and General Definitions ............................. 63 3.4.1.1 Line 1 and Line 2 Summary Screens ......................... 66 3.4.1.2 Frequency Screen ...................................................... 66 3.4.1.3 LINE 1 and Line 2 G.821 Screens ............................. 68 3.4.1.4 Line 1 and Line 2 ALM/SIG Screens ......................... 68 3.4.1.5 Line 1 and Line 2 M.2100/550 Screens ...................... 69 3.4.1.6 LINE 1 and Line 2 G.826 Screens ............................. 70 3.4.2 E1-MUX Mode Measurement Results .......................... 71 3.4.3 MUXTEST Mode Results ............................................ 72 3.4.4 DATACOM Mode Measurement Results ....................... 72 SunSet E20/c

3.5 Other Measurements ...................................................... 73 3.5.1 View Received Data ..................................................... 74 3.5.2 View FAS Words .......................................................... 76 3.5.3 View MFAS Words ....................................................... 78 3.5.4 Pulse Mask Analysis ................................................... 79 3.5.4.1 Start New Analysis ................................................... 80 3.5.4.2 View Last Pulse Shape ............................................. 81 3.5.5 C-Bit Analysis .............................................................. 82 3.5.6 Histogram Analysis ..................................................... 84 3.5.6.1 Current Histogram ....................................................... 85 3.5.6.2 Saved Histogram ...................................................... 88 3.5.7 Propagation Delay ....................................................... 89 3.5.8 Channel Loopback ....................................................... 90 3.6 VF Channel Access ........................................................ 91 3.6.1 VF & Noise Measurements .......................................... 92 3.6.2 View Line CAS ............................................................. 96 3.6.3 Call Analysis ................................................................ 97 3.6.3.1 Digit Analysis .......................................................... 101 3.6.4 Call Emulator ............................................................. 103 3.6.4.1 Standard Emulations .............................................. 103 3.6.4.2 Place a Call ............................................................ 105 3.6.4.3 Receive a Call ........................................................ 107 3.6.4.4 User Emulation ....................................................... 109 3.6.5 Supervision Setup ..................................................... 113 3.6.6 Dial Parameters ......................................................... 115 3.6.7 Signal Meanings ........................................................ 117 3.6.8 View/Print Trace Results ............................................ 122 3.7 Other Features .............................................................. 125 3.7.1 Error Injection ............................................................ 126 3.7.2 Alarm Generation ....................................................... 128 3.7.3 View Results Records ................................................ 130 3.7.4 Send Frame Words .................................................... 132 3.8 System Parameters ...................................................... 135 3.8.1 Version/Option ........................................................... 135 3.8.2 System Profiles ......................................................... 136 3.8.3 MEAS Configuration .................................................. 138 3.8.4 General Configuration ................................................ 142 3.8.5 Erase NV Ram ........................................................... 144 3.8.6 Self Test .................................................................... 144 3.8.7 Factory Defaults ........................................................ 144 3.9 Language Selection ...................................................... 145

SunSet E20/c

Chapter 4 Applications ..................................................... 147 4.1 Connecting the Cords ................................................... 147 4.2 Basic Applications ........................................................ 149 4.2.1 Accept a New Circuit ................................................. 149 4.2.2 Monitor an In-Service Circuit ..................................... 151 4.2.3 Checking for Frequency Synchronization ................... 153 4.2.4 Measure Signal Level ................................................ 155 4.2.5 V.54 Channel Loopback Test ...................................... 157 4.2.6 Running a Timed Test ................................................ 158 4.2.6.1 Manual Start ........................................................... 158 4.2.6.2 Auto Start ............................................................... 158 4.2.7 Observe Network Codes or Channel Data .................. 159 4.2.8 Monitor a Voice Frequency Channel ........................... 161 4.2.9 Simple Talk/Listen ..................................................... 162 4.2.10 Send a Tone ............................................................. 163 4.2.11 Nx64 kbit/s Testing .................................................. 164 4.3 Advanced Applications ................................................. 166 4.3.1 In-Service Dual Drop & Insert THRU Testing .............. 166 4.3.2 Testing a Terminal Multiplex ....................................... 169 4.3.3 Emulating a Terminal Multiplex .................................. 171 4.3.4 Emulating an Add/Drop Multiplexer ............................ 173 Chapter 5 Datacom ........................................................... 177 5.1 Technology Overview-Introduction ................................. 177 5.1.1 Communication Components ..................................... 177 5.1.2 Transmission Basics .................................................. 178 5.1.3 Data Networks ........................................................... 179 5.1.4 Call Control Procedure ............................................... 180 5.1.5 Physical Layer Protocol ............................................. 182 5.2 Datacom Menus ........................................................... 183 5.2.1 Datacom Mode Test Configuration ............................. 183 5.2.1.1 Test Configuration ................................................... 183 5.2.2 Datacom Interface ..................................................... 188 5.2.2.1 Live Tracer .............................................................. 189 5.2.3 View/Print Buffer ........................................................ 192 5.2.4 Datacom Measurement Results ................................. 194 5.2.5 Other Measurements ................................................. 196 5.2.5.1 View Received Data ................................................ 197 5.2.5.2 Propagation Delay .................................................. 198 5.2.6 Protocols ................................................................... 198 5.3 Datacom Interface Pin-outs .......................................... 199 5.4 Applications .................................................................. 207 5.4.1 Point-to-Point Datacom Testing .................................. 207 5.4.2 2M Multiplex Datacom Port Testing ........................... 209 5.4.3 Datacom Monitoring ................................................... 210 5.4.4 Fault Location with Remote & Local Loopbacks ........ 211 SunSet E20/c

.3 Converting a Voice Signal ...... 214 6..............2... 234 6........................................... 227 6.......6 Customer Service ....... 237 6........................................... 216 6................ 216 6.1 Standard Test Patterns ....... 214 6.................7 Express Limited Warranty ...... 213 6...............4 Troubleshooting .........................................5 Line Coding .............. 238 6......................................................................................... 225 6......048 Mbit/s Data Rate ............7 2.......2 E1 Technology Overview ...... 240 6.............5 Calibration .............................3 Abbreviations ......................................... 240 Index ................................................2 Basic Definitions ...........2................................................................ 241 SunSet E20/c .......................048 Mbit/s Framing ..............................Chapter 6 Reference .................... 232 6..................2..2..1 Technical Standards .........................2............................................................ 213 6..............8 Certificate of Origin ...................................................................................................................................2............ 219 6.............. 218 6............... 215 6................................................................8 MFR2/DTMF/DP Technology ........ 214 6.2...........4 2.........9 Declaration of Conformity .................2.........6 Signal Levels .............

The SS138D adaptor is rated at 100VAC240VAC.MAX. Operating temperature: 0 to 50° C Storage temperature: -20 to 70° C Humidity: 5% to 90% noncondensing When bringing the test set from an extreme cold to warm environment. Ch. This manual will take you through setting up and using your test set. Operating Environment: This instrument is intended for operation in partly weather protected and temperature controlled locations. Removable Software Cartridges: Insert and remove software cartridges ONLY with the power switched OFF. allow the test set to warm for at least 4 hours prior to use. 1 Initial Setup 7 . Fuses: The test set is equipped with an internal resettable fuse. to avoid injury and to prevent damage to the unit. Do not attempt to replace this fuse. is recommended. SS140.Chapter 1 Initial Setup Welcome to the SunSet E20/E20c. Battery: Use of the Sunrise Telecom replacement NiMH battery. If the equipment is used in a manner not specified by the manufacturer. helping you make full use of its extensive and flexible testing capabilities.1 Important Safety Information Please read and follow these safety recommendations. DO NOT operate this unit in rain. 1. or in a direct water splash environment. software cartridges may become damaged. as per IEC 721-3-7. 2. 50/60 Hz. Class 7K2. Power: Use only the SS138D AC adaptor for charging and AC powered operation. Return the unit to Sunrise Telecom Incorporated.0A. The E20/E20c is rated at 15 VDC. Please dispose of batteries safely.7 amps. Condensation may interfere with the operation of the test set and may result in damage if power is applied. Otherwise. which is rated to trip at 3.6A. the protection provided by the equipment may be impaired. for repair. or its authorized service centers. 1.

per IEC 664. and banana connectors are intended for connection to E1 circuits only.6/5. 8 SunSet E20/c . • Always use the provided power cord.6. Maximum input voltage is ±15 VDC. X. • Do not operate the unit with the cover removed. Input Connectors Warning The BNC. the power cord protective grounding must be connected to ground.21. The unit is grounded through its provided power cord. and G. • Provide good ventilation. RS-232. Refer to qualified personnel. RS-449. The datacom connector is intended fora connection to V.35. • Pollution degree II. Maximum input voltage is 12 VDC. To avoid electric shock. • Do not position the unit in a way that makes it difficult to disconnect it from other equipment or from the power supply. 1.General Precautions and Notes • No operator serviceable parts are inside this instrument. • Overvoltage protection: category II.703 circuits only.

5. 7. 6. For safe storage. it may need to charge for up to 5 minutes before it can run. Inspect all parts and immediately report any damage to both the carrier and to Sunrise Telecom Incorporated. 3. leave the battery charger plugged in while operating the test set. into the test set. Verify that all parts specified on the packing list were received. Or. 8. Ch. put the SunSet and accessories into the carrying case. Plug the AC Battery Charger. 10.2 Unpacking the Test Set Use the following procedure for unpacking your new test set: 1. Remove the packing list from the shipping container. Charge the test set for at least one hour before its first use. Complete the Warranty Registration Card and return it immediately to Sunrise Telecom Incorporated or your national distributor. 1 Initial Setup 9 .1. If the SunSet does not turn on immediately. Switch the set on and verify that it passes the SELF TEST. SS138D. 4. 2. then into an appropriate AC wall outlet: 120 VAC . Note: Sunrise Telecom Incorporated must receive your warranty registration card in order to provide you with updated software releases. Ensure the software cartridge is fully seated in its slot (refer to Figure 1).240 VAC. 9. Remove the test set and accessories from the shipping container.

the card may be damaged.sunrisetelecom. SUNRISE TELECOM Software Card 2 mb INSERT HERE Make sure that the software card is pushed in flush with the top of the ejector button SunSet E20c Serial Number SSE20C0143000017 DC INPUT 15V_ _ _ 2.com http://www. This procedure should performed after inserting a new software card. CA 95138 USA Tel: 1-408-363-8000 Fax: 1-408-363-8313 support@sunrisetelecom.0A + - SunSet E20c Serial Number SSE20C0143000017 SSE20C0143000017 SUNRISE TELECOM Software Card 2 mb INSERT HERE DC INPUT 15V_ _ _ 2.1.com http://www. which may hold an optional SRAM memory card.com Figure 1 Cartridge Installation Notes: • Each software cartridge is mated to a single SunSet. be sure to specify the serial number of the SunSet into which the new cartridge will be installed.3 Software Card Installation The test set’s software can be upgraded via the PCMCIA card. If your SunSet does not start properly.5 for the procedure. Caution! Do not remove or insert the software card while the test set is on. • When ordering software upgrades. verify that the serial number printed on the software cartridge matches the serial number on the back of your SunSet.sunrisetelecom.8. • Please note your SunSet features a second slot. Refer to Figure 1. perform an NV RAM ERASE. CA 95138 USA Tel: 1-408-363-8000 Fax: 1-408-363-8313 support@sunrisetelecom.0A + - 302 Enzo Drive San Jose. • After inserting a new software card. The software card is inserted into the inner card slot of the test set. Refer to Chapter 3. 10 SunSet E20/c . Section 3.com 302 Enzo Drive San Jose.

and out of the test set. 4. SunSet SS140 NiMH UNCLIP HERE Figure 2 Replacing the Battery Pack 2. Pull the SS140 NiMH battery pack off its Velcro backing. Note: Please Recycle Battery Ch. as indicated in Figure 2. replace it against the hook and loop inside the unit.4 Replacing the Battery Pack 1. 1 Initial Setup 11 . 3. hooking the cover clips into the provided slots. and slide the battery cover back on. Unclip the battery pack. in the direction indicated by the arrow in Figure 2. Clip in your new battery pack.1. Push down on the battery cover on the back panel.

some of the screens presented in the manual represent those of the black and white. and some those of the color unit. as OTHER MEASUREMENTS above. Therefore. This manual applies to both the SSE20 and the SSE20c.1. Chapter and section numbers are shown in italics: Chapter 2. This indicates that you need only use the up or down cursor keys to scroll to the next page of configurations. or a key. For example: Press the ESC key (Escape). then press the ENTER key’.1. have more parameters than will fit on one screen. MEAS MEAS CONFIGURATION MEAS DURATION: START : PROG DATE YMD: PROG TIME HMS: CODE CONFIGUR: MEASURE MODE : BLOCK SIZE : PRINT RESULT : PRINT EVENT : TIMED CONTINU CONTINU MANUAL --:--:---:--:-HDB3 BER 1000 LAST DISABLE more 21:59:33 Figure 3 Configuration Screen with More Indicator 12 SunSet E20/c . items on the screens. Keys and functions are sometimes referred to by the partial word present on the key/screen itself. Some configuration screens. See Figure 3. Names in all capital letters. accompanied by up and down arrows. you will see a small ‘more’ indicator at the bottom of the screen. select OTHER MEASUREMENTS > VIEW RECEIVED DATA (in order to see the data on all timeslots). Section 2. An example would be: From the main menu. The > symbol means ‘select with the cursor. such as MEAS CONFIGURATION and ISDN TEST CONFIGURATION. and Select timeslots AUTO (Automatically). match the titles of screens.5 Notes on Using This Manual Certain conventions are used throughout this manual. In these cases.

2 Test Set Description 13 . SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR SunSet E20 12:34:41 PAGE T/S 000 001 002 003 004 005 006 007 VIEW RECEIVED DATA : 01 BINARY HEX ASCII 11011111 DF ( 11000100 C4 (#) 01000010 42 B (B) 00011110 1E (x) 01100101 65 e ( 00101110 2E . and connector panels. Refer to Figure 4 for the front view of the test set. LEDs.Chapter 2 Test Set Description This chapter describes the physical features of the test set: the keys. (t) 11010100 D4 (+) 11000101 C5 ( PAUSE F3 PAGE-UP PAGE-DN F1 F2 PRINT F4 SUNRISE TELECOM I N C O R P O R A T E D A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 PRINT F# AUTO 7 4 * 5 MEAS 8 0 SHIFT ESC ENTER POWER Figure 4 SunSet E20 Front View Ch.

1. 2:30:02 TEST CONFIGURATION TEST MODE : E1SINGL TX SOURCE : FRAMING : CRC-4 : TEST RATE : L1-Rx Port: XMT CLOCK : TESTPAT PCM-30 YES 2. a number of options are typically available for each setup item. In Figure 5. press the SHIFT key again. The desired option may be invoked by pressing the corresponding F-key directly below. The SHIFT key should not be pressed simultaneously with another key. the SHIFT key should be pressed and then released. A SHIFT indicator will be displayed in the upper left-hand corner of the screen. Any other key can now be pressed and released. If the keys are not operating as expected. Instead. 2. check the SHIFT indicator. F3. When you configure a setup screen. the FRAMING is set to PCM-30 by pressing the F1 key. F2.048M TERM INTERN PCM-30 PCM-31 UNFRAME F1 F2 F3 F4 Press the F1 Key to Select PCM-30 F1 F2 F3 F4 Figure 5 F-keys 14 SunSet E20/c .1 Primary Functions F-keys (F1. the SHIFT indicator will appear in the LCD screen header. F4): These keys are used to select choices F1 through F4 at the bottom of the LCD display. The available choices appear on the bottom of the screen. The white label on the key indicates what function will be performed if the key is pressed by itself. and the SunSet will perform the function indicated by the orange label. The orange label above the key shows what function will be performed if the SHIFT key is pressed first.1 Keys Most SunSet keys perform two distinct operations. If the SHIFT indicator indicates the wrong shift status. At this point.2.

This feature is configured in SYSTEM PARAMETERS > GENERAL CONFIG > BACK LIGHT. This timer can be set from 1 to 99 minutes or continuous operation. the cursor will advance to the next line of the display automatically. press the up arrow key. Pressing the F4 key will show the other available options. : This key is used to switch the backlight on and off. To change the settings of a previous line. Keeping the backlight off will allow the test set to run longer. • If more than four F-key options are available. Press the GRAPH key upon completing a TEST CONFIGURATION setup to ensure that you have selected the proper settings. As you change the position of the cursor within a setup screen. such as: TEST CONFIGURATION. The graphic may be invoked during basic menu setups and basic operations. The graphics will update based on your TEST CONFIGURATION settings. a ‘MORE’ indicator will appear in the F4 position. GRAPH: The GRAPH key displays a graphic of the current circuit configuration and status. • The options appearing at the bottom of the screen are associated with a particular setup parameter within that screen. • The test set’s backlight has a programmable timer for automatic shut-off.Notes: • In most instances. SEND TEST PATTERN. PRINT: The PRINT key is used to print any alphanumeric and graphical information appearing on the screen. when the desired F-key is pressed. 2 Test Set Description TERM 15 . then reselect the option using the appropriate F-key. MEAS E1SINGL T 01:34:25 Line 1 Tx R Rx FRAMING : PCM30C CODING : HDB3 PAT: 2e15 TEST RATE: 2048 Kbps Figure 6 Graphic Screen Ch. and VF CHANNEL ACCESS. the F-key options available will also change.

an all 1s signal will mask the presence of HDB3 coding. TERM. The LEDs flash to indicate any error or alarm condition which occurred previously. For instance. MEAS: Press to access MEASUREMENT RESULTS. AUTO: The AUTO key has two functions: 1.Here is a description of some of the elements common to a graphic display. or abbreviations. : This key turns the speaker volume higher or lower via UP and DOWN F-keys. Restarts measurements. or ENTER when finished. but which is no longer present. Boxed words. CODING reports the transmitted coding type. Returning to the keypad description: ERR INJ: This key is used to inject errors into the test set’s transmitted signal. • Arrows denote the direction the signal is travelling. : The CONTRAST key adjusts the contrast of the LCD screen. . it reports AMI coding. 16 SunSet E20/c . Errors are injected according to the current settings in the OTHER FEATURES or Alarms/Errors icon > ERROR INJECTION menu. or MON (monitor) is noted by each line. ESC. . PAT reports the test pattern. Press the key repeatedly until the contrast is as you wish. BRDG. Press EXIT (F3). frame. The test set reports HDB3 coding if it actually sees the code. Refer to Figure 6. TEST RATE reports the full or fractional test rate. and if CRC checking is present. and pattern. Rx: The receive port of the noted line. If the error injection mode is set to rate. 2. T: This is where the test set transmits a test pattern. R: This is where the test set performs its received measurement results. an error inject indicator will appear on the top of the screen when you press this button. LED: The LED key is used to turn off any flashing LEDs. . provide additional information: Tx: The transmit port of the noted line (1 or 2). otherwise. It may not be always possible to determine the line code of a circuit. Allows auto-synch on the received line code. FRAMING reports the framing type. (Cursor Up/Down/Left/Right Arrow): The arrow keys are used to move the cursor in the indicated direction.

pressing the ENTER key is required after the user finishes entering data in a given screen. 3.2 Shift Functions The SHIFT key is pressed to provide access to the functions specified by orange labels. try pressing the ENTER key. the test set will execute the inputs only after the ENTER key has been pressed. C. If the operation you are trying to perform will not begin.1. It is the red key located in the lower left-hand corner of the test set’s keypad. 3. When the ENTER key is used to invoke the operation. If setups are complete in a data entry screen. F#: These keys are used to enter DTMF tones. D. In a few cases. They can also be used to provide labels for user-defined information. Ch. 1. 6. you may need to press ESC to return to the previous menu. POWER: The power key turns the test set ON/OFF. In these cases. 4.2 for details. ENTER: The ENTER key performs three functions: 1. To return to the main menu. A. 9: These keys are used to enter user test patterns and telephone numbers. B. SHIFT: Refer to Section 2. the test set will display the screen for the highlighted menu item. 5. In most of the high usage functions. 0.ESC: The escape key moves you back toward the main menu. pressing ENTER will often return you to the previous menu.1. SHIFT status is displayed in the upper left-hand corner of the screen. it is not necessary to press ENTER to invoke the operation. 2. 7. as well as hexadecimal numbers. 8. 2 Test Set Description 17 . then released before the desired orange-label key is selected. press ESC repeatedly until you arrive at it. 2. 2. The SHIFT key should always be pressed first. When a menu item is highlighted and the ENTER key is pressed. E*. They can also be used to provide labels for user-defined information.

In this case. Note: Connecting the AC Battery Charger will allow you to use the test set indefinitely. However. When the test set is in BER mode. it lights red. A 15 minute countdown (900 seconds) is displayed after the BATTERY LED lights. Blinking lights provide historical information for the circuit condition. This is helpful if you happened to be away from the test set when the error or alarm condition occurred. • Red: Lights red when the test set’s power supply voltage has dropped to a low level. a continuous green light for PCM-30 indicates that the test set has detected PCM-30 framing. The LEDs provide enough diagnostic information at a glance that additional testing may not be required by some users. For example. A continuous red light denotes an alarm condition for the item. the test set may automatically reset itself.2 LEDs The bicolor LEDs provide a visual indication for the condition of the received signal. Pressing the LED key stops the blinking. BIT ERROR • Red: Lights red if a bit error has been detected. • Red: If synchronization is lost. it is best to plug the AC Battery Charger in first.1 Common LEDs PAT SYNC • Green: If the test set has synchronized on the test pattern in the received signal. BATTERY • Green: Lights green when the battery is being charged. if you plan to use the test set for an extended period of time. For example. CRC. the ERROR LED lights red if an error (code. indicating when the test set will automatically shut down. the current measurement results would be lost. framing) has been observed. An LED will be lit green continuously when the particular condition for that LED is detected. bit. The pattern may be observed in MEASUREMENT RESULTS and on the graphic screen.2. 2. the test set will automatically attempt to synchronize on the pattern that is being sent. 18 SunSet E20/c . If the charger is plugged in while a measurement is in process and while the battery is not fully charged. POWER • Green: Lights green when the test set is switched on and has an adequate power source. The received pattern must match the transmitted pattern.2.

2 Test Set Description 19 . PCM-31. • Red: A red LED indicates no signal. the LED lights red. it will continuously search for that type of framing.2. and frame errors are detected when the signal is a framed signal. CODE ERR • Red: Lights red if a coding violation is detected on the received signal. PCM-30 • Green: A green LED indicates that the type of framing chosen in the test configuration has been detected on the received signal. CRC DET • Green: When CRC is enabled in the test configuration. PCM-30 indicates that the MF 16 (Multiframe) pattern has been detected. neither LED will be lit. ERROR • Red: Lights red if frame or E-bit errors have been observed. This LED will also light if CRC-4 errors are detected when CRC error checking has been enabled. but no CRC is detected.2. • Red: If CRC is enabled. • None: When CRC is disabled. CRC-4 and framing are both configured in the test configuration. as well as the basic FAS pattern. A code error is a bipolar violation that is not part of a valid HDB3 substitution.048 Mbit/s signals. • None: If the received signal is unframed.2 Line 1 and 2 LEDs These LEDs provide the same functions for both Line 1 and Line 2 displays: SIGNAL • Green: A green LED indicates that the test set is receiving valid 2. the CRC DET LED lights green if CRC-4 check sequences are detected by the test set. PCM-31 indicates that the basic FAS (Frame Alignment Signal) has been detected. The appropriate LED will light whenever the framing is found. AIS • Red: Lights red if the test set detects an Alarm Indication Signal (unframed all ones) on its receive jack. it is not lit. If the test set is configured for a particular type of framing in the test configuration. Ch. • Red: A red LED indicates that the selected framing has not been detected.

20 SunSet E20/c . RxDTE • Green: Lights green when the test set is receiving data on the DTE port. or AIS T/S-16 alarm. which are dual function with Line 2 LEDs: RxDCE • Green: Lights green when the test set is receiving data on the DCE port.3 Datacom (Orange Labeled) LEDs Datacom LEDs. MFAS ALM. USER1 & USER 2 • Green: These LEDs light when the control lead. CTS • Green: Lights green when the Clear To Send control lead is on.2.ALARM • Red: Lights red if the test set detects FAS ALM. defined as User 1 or User 2 in the test configuration. is on. 2. RTS • Green: Lights green when the Ready To Send control lead is on.

and 64 kbit/s G. shown in Figure 7.1 Left Side Panel HEADPHONE 75W L2-RX 120W 75W L2-TX DATACOM Left Side Connector Panel 75W L1-TX 120W 75W L1-RX 120W Right Side Connector Panel Figure 7 Connector Panels The left side connector panel. X. The following sections describe their use. HEADPHONE: Plug a headphone into this port.24.3 Connector Panels The test set has three connector panels. QSIG. • • When both is specified. the speaker will no longer sound. Both Access dependent on SPEAKER setting ISDN Analysis* Both QSIG Analysis* Both V5. RS449. RS530. The interface cables and datacom option can be purchased as an option.35. Application Output Remarks VF Channel Line 1=Left only or Line 2=Right only. This port uses a SCSI (36-pin connector) interface to connect with other industry standard interfaces such as RS-232/ V.703 codirectional.X Monitor Both GSM Monitor Both * Call emulation is Line 1 only. Line 1 will be outputted to the left side and Line 2 will be outputted to the right side. when the headphone is used. and one the top. Table 1 Headphone Conversion Ch. Stereo to Mono headphone converter should be used for VF. One the left. use stereo to mono converter. 2 Test Set Description 21 .21. one on the right.X applications using Line 1 only. V. 2.2.3. ISDN. In general. has the following ports: DATACOM: This is provided for DATACOM testing. V5.

It has the following line 1 ports: Line 1 TX: These connectors are where the 2. with 75Ω unbalanced and 120Ω balanced.3. The test set may be operated with a discharged battery.3. provided the charger is connected.3. 2.048 Mbit/s line signal is received by the test set. SS138D. 22 SunSet E20/c . shown in Figure 8. in either the 75Ω unbalanced or 120Ω balanced port.2 Right Side Panel The right side connector panel is shown in Figure 7. 1. Line 2 TX: The TX BNC connector is where the 2.6mm ports are available. 1. This port uses an RS-232C DTE configuration with hardware flow control when the 8-pin DIN to 25-pin D-Sub conversion cable is connected (see Section 2.048 Mbit/s line signal is transmitted from the test set.3.6/ 5. simultaneously. has these connectors: SERIAL PORT: The serial port is used for sending information to an optional thermal printer or for operating the remote control option.3.3. The battery will charge while the test set is being operated (see Section 2.2 in this chapter). 2.1 in this chapter). 15 VDC: The test set charger.048 Mbit/s line signal is transmitted from the test set. Line 2 ports are used for DUAL mode.Line 2 RX: The RX BNC and banana connectors are where the 2.048 Mbit/s line signal is received by the test set. Line 1 ports are always used in SINGLE mode. Line1 RX: These connectors are where the 2.6/5.6mm ports are available. Optionally.3 Top Panel SERIAL PORT 15 VDC Memory card slot Software Cartridge Figure 8 SunSet E20 Top Panel The top of the test set. Optionally. is plugged in here.

to ensure it is fully charged when you begin testing. Trickle-charging completes the charging cycle for maximum battery output. Trickle-charging does not damage the battery over long periods of time. the test set’s processor may reset and drop the current test as the charger is plugged in. If you are going to perform extended testing and you are not sure if the battery will last. The charger is powerful enough to run the test set continuously while keeping the battery charged. which is field replaceable. 2 Test Set Description 23 . Recharge the battery between uses. to get maximum life from the battery. This will help maintain a full battery charge when AC power is not available. Extreme temperatures affect battery life. even if the time available for a recharge is short. the charger switches from fast-charge to a trickle-charge.2. The SS138D charger operates at: • 120 VAC-240 VAC.1 Using the Battery and AC Charger Caution! Do not use any charger other than the one provided by Sunrise Telecom with the SunSet E20/c. The test set will fully charged in approximately four hours.3. At this point. plug the charger in at the beginning of the test so the test set will run indefinitely.3. This fast-charging action causes no damage to the battery. Use the Cigarette Lighter Battery Charger (SS104C) when transporting the test set. The battery is charged by a custom-designed charger for optimum performance. disconnect the charger when it is fully charged. and will not fully charge the battery pack in any reasonable length of time. This charger operates at a trickle charge. • • • Ch. The charger contains a fast-charge feature which recharges the battery. The AC Battery Charger’s two-stage design charges the battery to approximately 80% of its full capacity in just a few hours. 50/60 Hz The charger recognizes when the battery is fully charged. Doing so will cause damage to the test set and void the warranty. Let the battery pack charge overnight. The test set is powered by an internal 9-cell NiMH battery pack. However. If you wait until the battery is low during a test to plug the charger in. Here are some tips for obtaining the best performance out of the battery: • • • Use the backlight only if it is need. The battery is designed to provide ample power for portable testing applications.

the SunSet’s serial port settings will need to match the settings of your printer. refer to Table 2 for the correct switch settings. and uses thermal paper (i. however. skip this step. follow this procedure: 1. stop bit.2 Using the Serial Port The test set is equipped with a standard serial port. Figure 9 shows the cable pin assignments of the DB9 Printer Cable. 24 SunSet E20/c .3. for both printing and remote control operations. In general. This printer operates by an 8-bit serial RS-232C method. it has no ink cartridge or ribbon which needs to be replaced). 3. parity. Sunrise Telecom does not warrant the operation of the test set with any printer other than the one supplied by Sunrise Telecom. • If you are using the Sunrise Telecom thermal printer. you may find the SS122B Null Modem Adaptor useful. To begin printing. • • These settings are configured from within SYSTEM PARAMETERS (or the System icon) > GENERAL CONFIG. not all of these printers will operate correctly with the SunSet. If you are using a Sunrise Telecom printer.e. Configuring the SunSet’s serial port is described in detail in the procedures which follow. You are free to use this information to attempt to set up the test set with another printer.2. Many other serial printers are available to the user. Connect the Sunrise Telecom DIN-8 to RS232C Printer Cable (SS115B) to the SunSet. Serial Port Settings The Serial Port is configurable for: baud rate. However. you may need to connect the Sunrise Telecom Null Modem Adapter (SS122B) to the free end of the Printer Cable. If you wish to connect to a mode or other brand of printer.3. 2. • The switches to configure your printer's serial port and print characteristics are usually located on the back or bottom of the printer. Confirm that the test set's serial port settings match those of your printer. Configuring for Printing The test set may be ordered with an optional High Capacity Thermal Printer (SS118B or 118C). • Otherwise. bits/ character and carriage return/line feed.

Pin to Pin Connections DIN 8-Pin DB9 6 3 1 Pin # 2 3 4 5 6 8 4 2 Description DSR TX RX GND CTS DTR 7 8 5 6 Pin # 6 3 2 5 8 4 9 Description DSR TXD RXD GND CTS DTR 1 5 Figure 9 SS115B Printer Cable Pin Assignments Position Dip Switch Setting Dip Switch 1 1 OFF 2 ON 3 ON 4 OFF 5 ON 6 OFF 7 ON 8 ON Dip Switch 2 1 ON 2 ON 3 ON 4 ON 5 6 7 8 ON ON OFF OFF Param eters Param eter Setting Input Printing Speed Auto Loading Auto Line Feed Setting Command Printing Density Printing Density Printing Density Printing Columns User Font Back-Up Character Select Zero International Character Set International Character Set International Character Set International Character Set Data Length Parity Setting Parity Condition Busy Control Baud Rate Select Baud Rate Select Baud Rate Select Baud Rate Select Serial High On Off Enable 100% 100% 100% 40 ON Normal Normal English English English English 8 BITS NO Odd H/W Busy 9600 Bps 9600 Bps 9600 Bps 9600 Bps Dip Switch 3 1 ON 2 ON 3 ON 4 ON 5 OFF 6 ON 7 ON 8 ON Table 2 SS118B/C/D Printer Switch Settings Ch. 2 Test Set Description 25 .

configuration. • 4. Note: See Section 1. Section 3. Select PARITY. Three selections are available: 1200 (F1). • This setting must match the setting on your printer. D.3 for the software card installation procedure. Ensure that the test set is not displaying its GRAPHIC screen. Press PRN SCRN (print screen) on the test set’s keypad. 26 SunSet E20/c . This setting must match the configuration of your printer. Normally this is configured as 1-BIT. check the connections. 2400 (F2). choose the setting opposite of the printer setting. • If it doesn't. 5. From the main menu. Two options are available: 7-BIT (F1) and 8-BIT (F2). Three options are available: NONE (F1). Normally this is configured as 8-BIT. B. and switch settings. This screen is non-printable.8. C.3). Select BITS/CHAR. use the following procedure: A. select SYSTEM PARAMETERS > GENERAL CONFIG and select BAUD RATE. and 9600 (F3). Select STOP BIT. and ODD (F3). This setting must match the configuration of your printer. EVEN (F2). Confirm that the DIP switch settings (or other switch settings) on your printer correspond to those of the test set’s serial port. Set up the printing instructions in SYSTEM PARAMETERS > MEAS CONFIGURATION (see Chapter 3. 8. This setting must match the configuration of your printer. Two options are available: 1-BIT (F1) and 2-BIT (F2). Ensure that the printer is on and on-line. 9. Select CR/LF. If you have changed the DIP switch settings. The current screen should now print. otherwise random characters will appear on your printout. 7. E. switch the printer off and then on before continuing. 6.• The test set’s factory default serial port settings are: BAUD RATE: 9600 PARITY: NONE STOP BIT: 1-BIT BITS/CHAR: 8-BIT If you need to reconfigure the test set's serial port settings to match the settings of your printer.

2 3.2 3. Protocols have individual manuals 2.6 3.5.2.6.7 Notes: 1.6 VF & Noise Measurement 3.3 General Config Erase NV Ram Self Test Factory Defaults 3.4 VF Channel Access 3.3 3.3 3.5 3.3.1 E1 Dual Mode E1-MUX Mode MUXTEST Mode 3.1 3.6.5.2 3.8. the simple action of highlighting an item will execute the selection.5.1 Introduction The SunSet E20 operates by a menu-driven format. In a few specific cases.8.4 3.6.8.5.4 Start New Analysis 3.6.5 3.5.2 3.8 Other Features 3. Before you can select a menu item.1 3.8.5 3.4.7.4. After highlighting the item.1 View Line CAS Call Analysis Digit Analysis Call Emulator Standard Emulations Place a Call Receive a Call User Emulations Supervision Setup Dial Parameters Signal Meanings Measurement Results 3.8 Version/Option System Profile 3.4.4 E1 Results & Definitions E1-MUX Results MUXTEST Mode Results 3.6.5. See Chapter 5 for Datacom Figure 10 Menus Ch.7 3.1 3.8.4 3.1 3.7 Send Test Pattern 3.4.6.4.5 View Received Data View FAS Words View MFAS Words 3.5. highlight the desired item using the arrow keys.6.6.2.4.6.3 Send Frame Words 3.1 3.5. 3 Menus 27 . Test Configuration 3.3 System Parameters 3.6.6 3. you may execute the selection by pressing the ENTER key.6.8.2.4 View Results Records 3.1 View Last Pulse Shape 3.Chapter 3 Menus 3.4.2.2 View/Print Trace Results 3.6.6.1 3.5.3 Standard Patterns User Test Patterns 3.3.8.5.4.3 3.2 3.5.4 3.2 DATACOM Mode Results 3.6.7.4. The following menu tree shows the location of each menu item.7 Error Injection Alarm Generation 3.2 3.3.8 Measurement Config 3.7.5. Some menu items are offered only with certain software options.7.6 3.2 E1 Single Test Mode 3.1 3.1 3.2 Pulse Mask Analysis 3.2 C-Bit Analysis Histogram Analysis Current Histogram Saved Histogram Propagation Delay Channel Loopback 3.3 3.6.4 Other Measurements 3. The SEND TEST PATTERN menu works in this way.4.

Note that the possible screen messages. However. are shown in different colors. such as the ‘Shift’ and ‘Inject’ indicators. Screen 1 Screen 2 Figure 11 Color Main Menu 28 SunSet E20/c . the menu items for datacom and protocols are contained in their own chapters later in this manual. The time of day has moved to the left side of the screen.2 The sections within this chapter provide a detailed explanation for each menu item. See Figure 11 for the menu. F-keys are located at the base of the screen as usual.PROTOCOLS FRAME RELAY SS#7 ANALYSIS ISDN ANALYSIS GSM ANALYSIS V5. or in their own manuals.1/V5. Figure 11 is a sample color screen. The color version of the SunSet E20 (E20c) presents an iconbased main menu.

50 ANALYSIS • V. Use the PAGE-UP/PAGE-DN (F1) key to access both menu screens. Here is a list of what is available under each icon: Setup • TEST CONFIGURATION • TEST PATTERN • SEND FRAME WORDS • X.110 ANALYSIS • CHANNEL LOOPBACK Results • MEASUREMENT RESULTS • VIEW RESULTS RECORDS • VIEW RECEIVED DATA • VIEW FAS WORDS • VIEW MFAS WORDS • HISTOGRAM ANALYSIS • PULSE MASK ANALYSIS • C-BIT ANALYSIS • PROPAGATION DELAY • CHANNEL LOOPBACK • DATACOM INTERFACE (In DATACOM mode) Alarms Errors • ERROR INJECTION • ALARM GENERATION System • VERSION/OPTION • SYSTEM PROFILES • MEAS CONFIGURATION • GENERAL CONFIG • ERASE NV RAM • SELF TEST • FACTORY DEFAULTS • LANGUAGE SELECTION Ch. Setup is highlighted in the sample figure. 3 Menus 29 .Use the keypad arrow keys to select the icon/menu you want to access.

X.110 and V5. SS#7 Refer to SS#7 User’s Manual SS266-4. for each selection. See the corresponding chapters in the User’s Manual.25 User’s Manual SS866-11. GSM Refer to GSM User’s Manual SS266-2.25 Refer to X. 30 SunSet E20/c . or the individual manuals for the protocols such as V. ISDN Refer to ISDN User’s Manual SS266-3.1/V5.2.VF • VF & NOISE MEASUREMENTS • VIEW LINE CAS • CALL ANALYSIS • SUPERVISION SETUP • DIAL PARAMETERS • SIGNAL MEANINGS Frame Relay Refer to Frame Relay User’s Manual SS266-1.

5.FRAME ELAY 9.ARRANGE (F2) Press this key to access the ARRANGE ICON screen.RESULTS 3. Press DEFAULT (F3) to return the icons to their standard placement. 6. Note that icon 1 corresponds to the upper left corner icon of the first screen. 7. 9.VF 6. Press PROFILE (F4) to save the new arrangement under a label.ISDN 8. then across to icon 4. 2. CURRENT. where you may rearrange the order of the icons on the main menu screens.SYSTEM 5. 8.DEFAULT 1. you can move the corresponding icon to the first screen for easy access. STORE • • Figure 13 Icons Profiles Screen Ch.SETUP 2. You will enter the ICONS PROFILES screen. 4. 10.1/V5. 17:31:55 ARRANGE ICONS 1.V5. 3 Menus 31 .SS#7 7.GSM ICON-UP ICON-DN DEFAULT PROFILE Figure 12 Arrange Icons • • Use the ICON-UP (F1) and ICON-DN (F2) keys to rearrange the order in which the icons are shown. This might be convenient if you frequently do a particular test located on the second screen (such as GSM testing). then finally icons 9 and 10 show on the second menu screen.ALARM / ERRORS 4. then down left to icon 5.2 10. and across again. 3. 15:03:27 ICONS PROFILES 0.

Use the arrow keys to move the cursor indicator to the desired character.Storing an Icon Profile 1. A. Press TOGGLE (F3). 17:03:38 ICON PROFILES LABEL: AF A H O V INSERT B I P W C J Q X D K R Y E L S Z F M T - G N U / SELECT DELETE TOGGLE Figure 14 Icon Profiles Label Screen 3. 32 SunSet E20/c . 2. The letter A will be highlighted in the character grid. as in Figure 14. Repeat until you have the label as desired. 6. 4. With the cursor on CURRENT (Line 0). This will save the current icon order as you have arranged it. 5. press STORE (F1). The character appears next to the label. B. The cursor appears at the LABEL position on the ICON PROFILES label screen. Press TOGGLE (F3) to move out of the character grid and back to the LABEL item. press the F3 key (PROFILES) to enter the ICONS PROFILES screen. On a main menu screen. Press SELECT (F4). Press ENTER to store the pattern and to return to the main menu screen.

select the profile you want to invoke. Note that the F-keys change when you move the cursor off of CURRENT (Line 0). press DEL-ALL (F2). Press ENTER. • You may also access the ICONS PROFILES screen from the main menu. See Storing an Icon Profile. You will return to the main menu. In the ICON PROFILES screen which appears. Press LOAD (F3). A. Deleting an Icon Profile 1. In the ICON PROFILES screen which appears. PROFILES (F3) Save the icon order you have created under a label. B. now organized as per the profile you loaded. B. Ch. Press ENTER. Note that the F-keys change when you move the cursor off of CURRENT (Line 0). Press DELETE (F1). press PROFILE (F3). select the profile you want to invoke. A.Invoking an Icon Profile 1. If you want to delete all of the stored profiles. 2. 2. You will return to the main menu. On a main menu screen. 3 Menus 33 . press PROFILE (F3). On a main menu screen. where it is the F3 key.

To access the TEST CONFIGURATION screen. Press the AUTO key in E1 or E1-MUX modes to automatically detect incoming framing and CRC-4 patterns. The TEST CONFIGURATION menu differs for each mode. Several choices are available: E1SINGL.048M TERM INTERN E1SINGL E1DUAL E1-MUX MORE Figure 15 Test Configuration Menu The first selection in the TEST CONFIGURATION Menu is TEST MODE.2 Test Configuration Before connecting the test set to the circuit. be sure to properly configure the test configuration. Select TEST CONFIGURATION and press ENTER (Setup icon-color test set). 34 SunSet E20/c . the test set immediately alters its configuration to reflect these new settings. To avoid configuration mistakes.3. E1MUX. and DATACOM. press the ESC key until you have reached the main menu. MUXTEST. Refer to Figure 15 for the E1SINGL TEST CONFIGURATION menu. As each F-key is pressed. E1DUAL. F-keys show the options for each setup parameter in this screen. 2. 2:30:02 TEST CONFIGURATION TEST MODE : Tx SOURCE : FRAMING : CRC-4 : TEST RATE : L1-Rx Port: XMT CLOCK : E1SINGL TESTPAT PCM-30 YES 2. use the GRAPH key to graphically confirm any changes to your setup. Note the following: 1.

2. VF.048 Mbit/s BERT (Bit Error Rate Test) applications. MEAS at the top of the screen indicates measurements are being taken.1 E1SINGL Mode • • Use for voice frequency. Configure the following items in the E1 SINGL Mode. During Nx64 or VF CHANNEL ACCESS testing. In this case the signal received on the Rx jack will be transmitted out the Tx jack for Line 1. In this case.3. • FRAMING Options: PCM-30 (F1). Figure 16 shows the graphic associated with the settings in Figure 15. PCM-31: This means the set will synchronize only on Frame Alignment Signal (FAS). TESTPAT: Use for out-of-service bit error rate testing. TESTPAT (F2) • LOOP: Use for full duplex drop and insert testing on an inservice line. PCM-31 (F2). 35 • Ch. an idle code will be inserted on the unused channels. and 2. 3 Menus . • PCM-30: This means the set will synchronize on both Frame Alignment Signal (FAS) and MultiFrame Alignment Signal (MFAS). Press the corresponding F-key to select the desired setting. The Line 1 ports are used for the E1SINGL mode. UNFRAME (F3) Choose the framing appropriate for the circuit under test. a test pattern will be transmitted on the selected Transmit jack. MEAS E1SINGL T 01:34:25 Line 1 Tx R Rx FRAMING : PCM30C CODING : HDB3 PAT: 2e15 TEST RATE: 2048 Kbps TERM Figure 16 E1 SINGL Mode Graphic Tx SOURCE Options: LOOP (F1).

11:41:45 SELECT TIME SLOT RECEIVE 01 09 17 25 01 09 17 25 AUTO 02 10 18 26 02 10 18 26 03 11 19 27 03 11 19 27 04 12 20 28 05 13 21 29 06 14 22 30 06 14 22 30 07 15 23 31 07 15 23 31 08 24 • TRANSMIT 04 05 12 13 20 21 28 29 08 24 SELECT UN-SEL CLR-ALL Figure 17 Select a Timeslot 36 SunSet E20/c .Notes: • If you are unsure of the proper framing. CRC-4 works with PCM-31 and PCM-30 framing only. the test set will force the CRC-4 configuration to NO. CRC-4 Options: YES (F1). • HDB3 is the default line code. push the AUTO key. you will immediately enter the SELECT TIMESLOT. or manually. If UNFRAME has been selected for framing. Use the combination which synchronizes properly and/or allows error free measurement results. screen. If you are not certain about which one to choose. Nx64K (F2) • 2. NO (F2) • Choosing YES allows the test set to measure CRC-4 errors on the incoming signal and also to transmit the CRC-4 bits on the outgoing signal. these can be selected automatically. Upon pressing Nx64. The line code can be configured for AMI or HDB3 in: MAIN MENU > SYSTEM PARAMETERS > MEAS CONFIGURATION. Select each timeslot to test. the test set will display Loss of Frame condition and may display loss of CRC DET. • TEST RATE Options: 2.048M: This configures the test set for full rate testing. A sample screen is shown in Figure 17.048 (F1). • If the framing and CRC-4 state of the received signal do not exactly match the framing and CRC-4 settings.048 Mbit/s. press the F1 key for full rate testing at 2. Nx64: This configures the test set for fractional testing.

They also determine which electrical load will be placed on the circuit by the test set. It will configure the transmit side to be the same as the active timeslots on the receive side. The test set will assume that all incoming data is received byte by byte in ascending channel order.048 Mbit/s signal under a wide range resistive of cable losses. timeslot 16 is used for the multiframe alignment signal. Ch. Selected timeslots remain highlighted. as shown in Figure 17. the quickest method for selecting timeslots is to press the AUTO (F1) key. The test set determines that a timeslot is idle when it finds the line's idle code (specified in the SYSTEM PARAMETERS > MEAS CONFIGURATION > IDLE CHNL CODE). BRIDGE (F2).To Manually Select the Timeslots: 1. • Press CLR-ALL (F4) to clear all selections and to start over. timeslots 1-15 correspond to channels 1-15. The test set determines which timeslots are active by first determining which timeslots are idle. In PCM-30 framing. because framing is required to determine the location of timeslots. 2. There should never be two or more receivers applying a low impedance termination. the test set will automatically configure the timeslots by looking for active data. timeslots 1-31 correspond to channels 1-31. The number of selected timeslots can differ from the Tx side to the Rx side. On a 2. Press ENTER to set your choices. Any timeslot that is not idle is assumed to be active. The timeslots specified for transmit and receive need not be the same. To Automatically Select the Timeslots: 1. there must always be exactly one receiver that applies the low impedance (75/120Ω) termination. and return to the MAIN MENU. 3 Menus 37 . Press AUTO (F1) • If you are receiving a signal which is already formatted in the N (or M) x64 kbit/s fractional E1 format. Repeat until you have selected all the necessary timeslots. These settings let the test set electrically decode a 2. Use the keypad arrow keys to choose the timeslot and then press SELECT (F2).048 Mbit/s circuit. 2. • In AUTO. Press UN-SEL (F3) to deselect a timeslot. These settings have no effect on the transmitters. In PCM30. 3. MONITOR (F3) Configures the Line 1 2. Fractional E1 is not offered with unframed signals. L1-Rx PORT Options: TERM (F1). Note: In PCM-31 framing. and timeslots 17-31 correspond to channels 16-30.048 Mbit/s receiver.

If you are uncertain if a jack is bridged or protected. if a 0 dB signal is received. The signal is provided from the protected MONITOR jack of a network equipment. OFFSET (more.000 hz (25K ppm) and the screen shown in Figure 18 is displayed. Use TERM when you will disrupt the circuit for testing. This timing is not synchronized to the network. Shift up to ± 50. or 1000 Hz steps. choose TERM instead. the CODE ERR LED will light red. In this case. L2-RX (F3). • TERM mode terminates the received signal with a 75 or 120Ω impedance termination. INTERN: INTERN uses the internal timing of the test set. • • L1-Rx: Choose L1-Rx. INTERN (F2). This isolation circuit will protect the signal from any possible disruption. choose bridge.048 mbit/s signal. and the test set uses the timing from the signal received on Line 1 as the clock source. this will protect the 2. TTL-L2 (more. TX CLOCK Options: L1-RX (F1). F2) The TX CLOCK is used to time the transmit signal. • • In MONITOR mode. the test set applies high-impedance isolation resistors to the circuit under test. at a level between -15 and -30 dB. MONITOR mode should be used when a measurement is made at a protected monitoring point. The tested signal has been transmitted over regular cable at a level of approximately +6 and -43 dB. This often happens when the set is plugged into an OUT jack. F1).Caution! If you are uncertain. In BRIDGE mode. 10. You should use internal timing in loopback testing where synchronization is not required. The tested signal has been transmitted over real cable at a level between approximately +6 and -43 dB. OFFSET: The test set uses a digital synthesizer to shift the transmit frequency in 1. L2-Rx: In this mode. timing is received from the signal received on Line 2. try BRIDGE first. 100. • • 38 SunSet E20/c .

MEAS

12:30:55

TEST CONFIGURATION DDS SHIFT: 2.048M+40 SCALE : X10

INC

DEC

Figure 18 DDS Shift

1. Set the DDS SHIFT between 0 and 50,000 Hz by using the INC (F1) and DEC (F2) keys. 2. Set the SCALE of the shift by using the INC (F1) and DEC (F2) keys. Choose among 1, 10, 100, and 1000. For example, a shift of 3 Hz with a SCALE of 10 would shift the frequency 13 Hz. • TTL-L2: In this mode the set uses a G.703 sinusoidal clock plugged into Line 2 RX as its timing source.

Ch. 3 Menus

39

3.2.2 E1DUAL Mode E1DUAL mode allows use of both LINE 1 and LINE 2 ports. Use this mode to perform applications such as full duplex drop and insert and bidirectional monitoring. See Figure 19 for a sample configuration screen, and Figure 20 for a sample graphic screen.
23:22:10 TEST CONFIGURATION TEST MODE : Tx/INSERT : Rx/DROP : Tx SOURCE : FRAMING : CRC-4 : TEST RATE : L1-Rx Port: L2-Rx Port: TX CLOCK : E1SINGL E1DUAL
11:17:42 E1DUAL Line 2 TERM
Rx

E1DUAL L1-Tx L1-Rx TESTPAT PCM-30 YES 2.048M TERM TERM INTERN MORE

E1-MUX

Figure 19 E1DUAL Mode

R

T
T

Line 1
Tx

Tx

R

Rx

TERM

FRAMING: PCM30CRC CODING: HDB3 PAT: 2e15 TEST RATE: 2048 Kbps

Figure 20 E1Dual Graphic Configure the following items: Tx/INSERT Options: L1-TX (F1), L2-TX (F2) Select the 2.048 Mbit/s test line onto which to insert the test signal. • This determines where the 2.048 Mbit/s test pattern, Nx64 kbit/ s test pattern, Nx64 kbit/s multiplexed signal, or voice frequency channel will be inserted. For example, if Tx/INSERT is L2-Tx and you are talking on the test set, then your voice will be inserted on line 2. Select either L1-Tx (F1 selects Line 1) or L2-Tx (F2 selects Line 2). SunSet E20/c

• 40

Rx/DROP Options: L1-RX (F1), L2-RX (F2) Select the received test signal from either L1-Rx or L2-Rx. • This selection configures bit error rate, 2.048 Mbit/s line frequency, E-bit error measurements, M.2100/550 measurements, voice channel frequency, voice channel level, voice channel Rx ABCD, view received data, view FAS words, view MFAS words, etc. For example, if you are doing a bit error rate test on the received signal from line 1, then you should choose Rx/DROP as L1-Rx.

Tx SOURCE Options: LOOP (F1), TESTPAT (F2) • LOOP is used for full duplex drop and insert testing on an inservice line. In this case the signal received on the Rx jack will be transmitted out the Tx jack for Line 1 and Line 2. You will be inserting a signal on one or more channels on the line you chose in Tx/INSERT. The channels and corresponding ABCD bits on that line that are not being used will be passed through the test set unchanged from Rx to Tx. TESTPAT is used for out-of-service bit error rate testing. In this case, a test pattern will be transmitted on the selected Tx/ INSERT jack. During Nx64 or VF CHANNEL ACCESS testing, an idle code will be inserted on the unused channels. On the line that is not selected, the channels and ABCD bits are passed through the test set unchanged from Rx to Tx.

FRAMING Options: PCM-30 (F1), PCM-31 (F2), UNFRAME (F3) Choose the framing that is appropriate for the circuit under test. • • PCM-30 means the set will synchronize on both Frame Alignment Signal (FAS) and MultiFrame Alignment Signal (MFAS). PCM-31 means that the set will synchronize only on Frame Alignment Signal (FAS).

Notes: • If framing and CRC-4 state of the received signal do not exactly match the framing and CRC-4 settings, the test set will display Loss of Frame condition and may display loss of CRC DET. • HDB3 is the default line code. The line code can be configured for AMI or HDB3 in: MAIN MENU > SYSTEM PARAMETERS > MEAS CONFIGURATION. • If you are unsure of the proper framing, push AUTO. Use the combination which synchronizes properly and/or allows error free measurement results.

Ch. 3 Menus

41

CRC-4 Options: YES (F1), NO (F2) • Choosing YES allows the test set to measure CRC-4 errors on the incoming signal and to transmit the CRC-4 bits on the outgoing signal. CRC-4 works with PCM-31 and PCM-30 framing only. If UNFRAME has been selected for framing, the test set will force the CRC-4 configuration to NO.

TEST RATE Options: 2.048 (F1), Nx64K (F2) • • 2.048M configures the test set for full rate testing. If you are unsure which one to choose, select 2.048 Mbit/s. Nx64K configures the test set set for fractional testing. Upon selection, the SELECT TIMESLOT screen is displayed. In this screen, choose each timeslot for testing (see Figure 17).

To Manually Select the Timeslots: 1. Use the keypad arrow keys to choose the timeslot and then press SELECT (F2). 2. Repeat until you have selected all the necessary timeslots. Selected timeslots remain highlighted, as shown in Figure 17. 3. Press UN-SEL (F3) to deselect a timeslot. • Press CLR-ALL (F4) to clear all selections and to start over. To Automatically Select the Timeslots: 1. Press AUTO (F1) • If you are receiving a signal which is already formatted in the N (or M) x64 kbit/s fractional E1 format, the quickest method for selecting timeslots is to press the AUTO (F1) key. 2. Press ENTER to set your choices and return to the MAIN MENU. • In AUTO, the test set will automatically configure the timeslots by looking for active data. It will configure the transmit side to be the same as the active timeslots on the receive side. The test set determines which timeslots are active by first determining which timeslots are idle. Any timeslot that is not idle is assumed to be active. The test set determines that a timeslot is idle when it finds the line's idle code (specified in the SYSTEM PARAMETERS > MEAS CONFIGURATION > IDLE CHNL CODE). Note: In PCM-31 framing, timeslots 1-31 correspond to channels 1-31. In PCM-30 framing, timeslots 1-15 correspond to channels 1-15, and timeslots 17-31 correspond to channels 16-30. In PCM30, timeslot 16 is used for the multiframe alignment signal. Fractional E1 is not offered with unframed signals, because framing is required to determine the location of timeslots. 42 SunSet E20/c

The timeslots specified for transmit and receive need not be the same. The number of selected timeslots can differ from the Tx side to the Rx side. The test set will assume that all incoming data is received byte by byte in ascending channel order. L1-Rx Port and L2-Rx Port Options: TERM (F1), BRIDGE (F2), MONITOR (F3) Configures the two 2.048 Mbit/s receivers. • These settings let the test set electrically decode a 2.048 Mbit/ s signal under a wide range resistive or cable losses. These settings also determine which electrical load will be placed on the circuit by the test set. These settings have no effect on the transmitters. On a 2.048 Mbit/s circuit, there must always be exactly one receiver that applies the low impedance (75/120Ω) termination. There should never be two or more receivers applying a low impedance termination. See the L1-Rx port description for E1SINGL mode for a description of each of these choices.

TX CLOCK Options: RECEIVE (F1), INTERN (F2), SHIFT (F3) The TX CLOCK is used to time the transmit signal. • RECEIVE: Choose RECEIVE, and the test set uses the timing from the signal received on the line set as RX/DROP above as the clock source for both TX lines. The next three figures portray three different timing scenarios possible when RECEIVE is selected. Figure 21 represents slave timing. Here, TX CLK=L1-Rx, but the signal received on L1-Rx is timed off of the L1-Tx source. Thus, there is no true clock source. In this case, the transmit signal may die.

Ch. 3 Menus

43

This network element must be configured to be a master timing source in relation to your signal. Loop timing is necessary when transmitting toward an exchange or other network element that requires synchronous signals. SLAVE SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY MASTER L1-Rx L1-Tx Exchange or other timing source 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR SunSet E20 12:34:41 PAGE T/S 000 001 002 003 004 005 006 007 VIEW RECEIVED DATA : 01 BINARY HEX ASCII 11011111 DF ( ) 11000100 C4 (#) 01000010 42 B (B) 00011110 1E (x) 01100101 65 e ( ) 00101110 2E . lest you have slave to slave timing. (t) 11010100 D4 (+) 11000101 C5 ( ) PAUSE F3 PAGE-UP PAGE-DN F1 F2 PRINT F4 SUNRISE TELECOM I N C O R P O R A T E D A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 PRINT F# AUTO 7 4 * 5 MEAS 8 0 SHIFT ESC ENTER POWER E20 TEST CONFIGURATION Tx/INSERT: L1-Tx Tx SOURCE: TESTPAT XMT CLK: L1-Rx Figure 22 Loop/Slave Timing 44 SunSet E20/c . Tx/INST and TX CLK are set for the same line.SLAVE SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY SLAVE L1-Rx L1-Tx 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR SunSet E20 12:34:41 PAGE T/S 000 001 002 003 004 005 006 007 VIEW RECEIVED DATA : 01 BINARY HEX ASCII 11011111 DF ( ) 11000100 C4 (#) 01000010 42 B (B) 00011110 1E (x) 01100101 65 e ( ) 00101110 2E . (t) 11010100 D4 (+) 11000101 C5 ( ) PAUSE F3 1/0 MUX PAGE-UP PAGE-DN F1 F2 PRINT F4 SUNRISE TELECOM I N C O R P O R A T E D A F1 B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 * PRINT E F# AUTO 4 5 MEAS 7 8 0 SHIFT ESC ENTER POWER TEST CONFIGURATION Tx/INSERT: L1-Tx Tx SOURCE: TESTPAT XMT CLK: L1-Rx Figure 21 Slave to Slave Timing Figure 22 depicts loop or slave timing.

and choose INTERN. The external clock source should be configured for the opposite line from the Rx/ DROP selection. both Lines 1 and 2 pass timing from Rx to Tx. Ch. Exchange or other timing source SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY 1 CODE ERR ERROR SIGNAL MUX 1X0 L2-Rx L2-Tx 2 CODE ERR RxDCE RxDTE ERROR SunSet E20 12:34:41 PAGE T/S 000 001 002 003 004 005 006 007 VIEW RECEIVED DATA : 01 BINARY HEX ASCII 11011111 DF ( ) 11000100 C4 (#) 01000010 42 B (B) 00011110 1E (x) 01100101 65 e ( ) 00101110 2E .000 hz (25K ppm) and the screen shown in Figure 24 is displayed.Figure 23 depicts external timing. 10. Shift up to ± 50. TX CLK is set for Line 1 (L1-Rx). In this case. TxSOURCE has always been set for TESTPAT. 100. the L2-Tx signal will use the timing recovered from L2Rx. The TX CLK setting is ignored if TX SOURCE is set for LOOP. the L1Tx signal will use the internal timing of the test set. • INTERN: This setting uses the internal timing of the test set. (t) 11010100 D4 (+) 11000101 C5 ( ) PAUSE F3 L1-Rx PAGE-UP PAGE-DN F1 F2 PRINT F4 SUNRISE TELECOM I N C O R P O R A T E D E20 TEST CONFIGURATION Tx/INSERT: L2-Tx Tx SOURCE: TESTPAT XMT CLK: L1-Rx A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 PRINT F# AUTO 7 4 * 5 MEAS 8 0 SHIFT ESC ENTER POWER Figure 23 External Timing Note: In Figures 21-23. or 1000 Hz steps. 3 Menus 45 . This timing is not synchronized to the network. External timing uses an external clock source to time the Tx/INSERT signal. You should use internal timing in loopback testing where synchronization is not required. Therefore. If you set TX/INSERT as L1-Tx. In LOOP. Rx/DROP and Tx/INSERT are set for Line 2. • SHIFT: The test set uses a digital synthesizer to shift the transmit frequency in 1. In DUAL mode.

a shift of 3 Hz with a SCALE of 10 would shift the frequency 13 Hz.MEAS 12:30:55 TEST CONFIGURATION DDS SHIFT: 2. 100. and 1000. 46 SunSet E20/c .048M+40 SCALE : X10 INC DEC Figure 24 DDS Shift 1. 2. Set the DDS SHIFT between 0 and 50.000 Hz by using the INC (F1) and DEC (F2) keys. For example. 10. Choose among 1. Set the SCALE of the shift by using the INC (F1) and DEC (F2) keys.

For example. Tx/INSERT Options: L1-TX (F1). etc. 15:35:30 TEST CONFIGURATION TEST MODE : E1-MUX E1 Tx/INSERT :L1-Tx Rx/DROP :L1-Rx FRAMING :PCM-30 CRC-4 :YES L1-Rx Port:TERM L2-Rx Port:TERM Tx CLOCK :L1-Rx L1-Tx L2-Tx DATACOM TYPE : RS449 TxSRC: E1DRP MUX B-LED: E1DRP E1INS: DTCM E1T/S: Nx64K Figure 25 E1-MUX Menu E1 If necessary. View FAS words. View MFAS words.35 from line 1. then it will be inserted on line 2. 47 Ch. This selection configures 2.048 Mbit/s signal to be used for dropping an Nx64 kbit/s signal to the multiport. View received data. • • If you want to drop out a 64 kbit/s signal to V. 3 Menus .048 Mbit/s line frequency. The E1-MUX configuration screen is shown in Figure 25. or an add/drop multiplex.3 E1-MUX Mode E1-MUX provides multiplexing capabilities between the different rate signals. L2-RX (F2) Select the 2.3.2. then choose Rx/DROP as L1-Rx. you may refer to the more detailed descriptions of each E1 configuration selection in Section 3. and you are inserting a received V.35 signal onto the line. Use this mode to make the test set emulate a terminal multiplex. if Tx/INSERT is L2-Tx. E-bit error measurements. Rx/DROP Options: L1-RX (F1).1. L2-TX (F2) Determines where the Nx64 kbit/s multiplexed signal will be inserted.2. This mode allows you to send a test pattern in either direction.

Use the combination which synchronizes properly and/or allows error free measurement results. MONITOR (F3) L1-Rx Port and L2-Rx Port configure the two 2. Choose the framing that is appropriate for the circuit under test.048 Mbit/s line requires exactly one low impedance termination.048 Mbit/s receivers. PCM-31 (F2) • PCM-30 means the test set will synchronize on both Frame Alignment Signal (FAS) and MultiFrame Alignment Signal (MFAS) PCM-31 means the test set will synchronize only on Frame Alignment Signal. BRIDGE (F2).048 Mbit/s signal under a wide range of resistive or cable losses. BRIDGE: The test set applies high-impedance isolation resistors to the circuit under test. If you are unsure of the proper framing. NO (F2) CRC-4 YES allows the test set to measure CRC-4 errors on the incoming signal and to transmit the CRC-4 bits on the outgoing signal. • If you are unsure of the proper framing. This isolation circuit will protect the signal from any possible disruption. The tested signal has been transmitted over real cable at a level between approximately +6 and -43 dB. They determine which electrical load will be placed on the circuit by the test set. The tested signal has been SunSet E20/c • 48 . These settings let the test set electrically decode a 2. the test set will display Loss of Frame condition and may display loss of CRC DET. push the AUTO key L1-Rx Port and L2-Rx Port Options: TERM (F1). Usually. choose bridge. • Notes: • • • • • CRC-4 Options: YES (F1). This will protect the 2. A 2. • TERM: This mode terminates the received signal with a 75 W or 120Ω impedance termination. you should use TERM when you will disrupt the circuit for testing.048 Mbit/s circuit under test. HDB3 is the default line code.FRAMING Options: PCM-30 (F1). Caution! If you are uncertain. The line code is configured in the following menu: MAIN MENU > SYSTEM PARAMETERS > MEAS CONFIGURATION. push the AUTO key. If the framing and CRC-4 state of the received signal do not exactly match the framing and CRC-4 settings. These settings have no effect on the transmitters.

X. • • PATT: Sends a test pattern out the datacom port. In MONITOR mode. DATACOM The datacom settings configure the multiport. E1DRP: Sends the dropped NX64 kbit/s signal out the datacom port. F1). Choosing DTCM means the signal coming from the low speed side will be tested. In this case. this is set at L1-Rx. MUX MUX settings define where the BERT will be performed. This often happens when the set is plugged into an OUT jack.703 (more. The signal is provided from the protected MONITOR jack of a network equipment. E1DRP (F2) Tx Source sets the transmit source for the datacom port.703.35 (F1). the CODE LED will light red. F2) TYPE determines the electrical interface at the datacom port. TX CLOCK Options: None. MONITOR: Use when a measurement is made at a protected monitoring point. etc. at a level between -15 and -30 dB.• transmitted over regular cable at a level of approximately +6 and -43 dB. and the PAT SYNC LED will refer to the E1 synchronization. Ch. TYPE Options: V. if a 0 dB signal is received. If you uncertain if a jack is bridged or protected. try BRIDGE first. DTCM: This is the datacom type selected above: RS232. 3 Menus 49 . DTCM (F2) Determines the side Bit Error Rate Test measurements are performed on and the side the PAT SYNC LED will apply to.21 (F3). choose TERM instead. B-LED Options: E1DRP (F1). RS232S (more. G. • • E1DRP: This means the E1 side will be bit error tested. G. RS449 (F2). TxSRC Options: PATT (F1). and the PAT SYNC LED will refer to the low speed (datacom) side.

Nothing will be inserted. PATT (F3) Determine which signal will be inserted into the 2.2.048 Mbit/s line. • • E1T/S Options: Nx64K Select which Nx64 kbit/s channels to insert or drop the signal on.048 Mbit/s transmit signal. It may be changed only if TxSRC is set to E1DRP. PATT: This means that the TEST PATTERN will be inserted on the 2.048 Mbit/s receive to 2.1 for further details on selecting timeslots. 50 SunSet E20/c . • Nx64K: Press to enter the SELECT TIMESLOT screen.048 Mbit/s transmit.E1 INS Options: LOOP (F1). DTCM (F2).048 Mbit/s transmit. • LOOP: This means all 30 or 31 channels will be looped through from 2. DTCM: This means the low speed Nx64 kbit/s signal will be inserted on the 2. Refer to E1 T/S in Section 3.

3.048 Mbit/s side to the low speed datacom side. Ch.048 Mbit/s side or from the high speed 2. (t) 11010100 D4 (+) 11000101 C5 ( ) PAUSE F3 PAGE T/S 000 001 002 003 004 005 006 007 L1-Tx E1 Side 2.2.2.048Mbps PAGE-UP PAGE-DN F1 F2 PRINT F4 MUX 1X0 Loop Timing SUNRISE TELECOM I N C O R P O R A T E D A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 Datacom Side 64kbps PRINT F# AUTO 7 4 * 5 MEAS 8 0 SHIFT ESC ENTER POWER Transmit Out E1 Port & Transmit Out Datacom Receive from DATACOM & Receive on E1 Port Figure 27 MUXTEST Configuration E1 SIDE Refer to Section 3.4 MUXTEST Mode MUXTEST provides testing through a multiplex from either the low speed datacom side to the high speed 2.1 for a more detailed description of each E1 configuration selection. 3 Menus 51 . Figure 26 shows the MUXTEST configuration screen. 15:35:30 TEST CONFIGURATION TEST MODE : MUXTEST E1 Tx/INSERT :L1-Tx Rx/DROP :L1-Rx FRAMING :PCM-30 CRC-4 :YES L1-Rx Port:TERM L2-Rx Port:TERM Tx CLOCK :INTERN L1-Rx INTERN DATACOM TYPE : RS449 BERT E1T/S: Nx64K B-LED: E1 L2-Rx Figure 26 MUXTEST Menu SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR L1-Rx 12:34:41 SunSet E20 VIEW RECEIVED DATA : 01 BINARY HEX ASCII 11011111 DF ( ) 11000100 C4 (#) 01000010 42 B (B) 00011110 1E (x) 01100101 65 e ( ) 00101110 2E .

L2-TX (F2) Determines where the Nx64 kbit/s multiplexed signal will be inserted.35 from Line 1. push AUTO.Tx/INSERT Options: L1-TX (F1). NO (F2) • • CRC-4 YES to measure CRC-4 errors on the incoming signal and to transmit the CRC-4 bits on the outgoing signal. View Received Data. It will disregard MultiFrame Alignment Signal. E-bit error measurements. View MFAS Words. PCM-31 means the test set will synchronize only on Frame Alignment Signal. and may display loss of CRC DET. the test set will display a LOSS OF FRAME condition. L2-RX (F2) Select the 2. If the framing and CRC-4 state of the received signal do not exactly match the settings. CRC-4 works with PCM-31 and PCM-30 framing only. PCM-31 (F2) Choose the framing that is appropriate for the circuit under test.048 Mbit/s line frequency. • PCM-30 means the test set will synchronize on both Frame Alignment Signal (FAS) and MultiFrame Alignment Signal (MFAS). etc. the test set will force the CRC-4 configuration to NO.048 Mbit/s signal to be used for dropping a Nx64 kbit/s signal to the datacom port. View FAS Words. If you are unsure of the proper framing. if TX/INSERT is L2-Tx and you are inserting a received V. This selection configures 2. • • If you want to drop out a 64 kbit/s signal to V. If UNFRAME has been selected for framing. The line code can be configured for AMI or HDB3 in the following menu: MAIN MENU > OTHER FEATURES > MEAS CONFIGURATION.35 signal onto the line. FRAMING Options: PCM-30 (F1). SunSet E20/c 52 . For example. then it will be inserted on line 2. Use the combination which synchronizes properly and/or allows error free measurement results. HDB3 is the default line code. • Notes: • • • CRC-4 Options: YES (F1). Rx/DROP Options: L1-RX (F1). then choose L1-Rx as Rx/DROP.

MONITOR (F3) L1-Rx Port and L2-Rx Port configure the two 2. Caution! If you are uncertain. These settings have no effect on the transmitters. INTERN (F2). 3 Menus 53 . BRIDGE (F2). These settings also determine which electrical load will be placed on the circuit by the test set.048 Mbit/s receivers.048 Mbit/s signal. L2-RX (F3) The TX CLOCK is used to time the Tx/INSERT signal.048 Mbit/s signal under a wide range of resistive or cable losses. Here. (t) 11010100 D4 (+) 11000101 C5 ( ) PAUSE F3 PAGE T/S 000 001 002 003 004 005 006 007 L1-Tx MUX 1X0 Loop Timing PAGE-UP PAGE-DN F1 F2 PRINT F4 SUNRISE TELECOM I N C O R P O R A T E D A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 Datacom Side 64kbps PRINT F# AUTO 7 4 * 5 MEAS 8 0 SHIFT ESC ENTER POWER Transmit Out E1 Port Receive from DATACOM XMT CLOCK: INTERN Figure 28 Internal Timing Ch. but the source is not synchronized to the network. • INTERN configures the test set for master timing. Datacom MUX Test Mode-Internal Timing DATACOM SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR L1-Rx 12:34:41 SunSet E20 VIEW RECEIVED DATA : 01 BINARY HEX ASCII 11011111 DF ( ) 11000100 C4 (#) 01000010 42 B (B) 00011110 1E (x) 01100101 65 e ( ) 00101110 2E . TX CLOCK Options: L1-RX (F1). choose bridge. the test set supplies the timing source. this will protect the 2. Figure 28 depicts internal timing.L1-Rx Port and L2-Rx Port Options: TERM (F1). • These settings let the test set electrically decode a 2.

35 (F1). set the TX CLOCK for the same line as Tx/INST.Datacom MUX Test Mode-Slave Timing DATACOM SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR L1-Rx 12:34:41 SunSet E20 VIEW RECEIVED DATA : 01 BINARY HEX ASCII 11011111 DF ( ) 11000100 C4 (#) 01000010 42 B (B) 00011110 1E (x) 01100101 65 e ( ) 00101110 2E . • DATACOM SIDE TYPE Options: V. then TX CLOCK should be L2-RX. BERT SIDE E1T/S Options: Nx64 (F1) Select which Nx64 kbit/s channels to insert or drop the signal on. RS232 (more. Figure 17 provides the SELECT TIMESLOT screen for E1 mode. Pressing F1 on this slot will display the SELECT TIMESLOT screen. Select to the desired timeslot and press SELECT (F2). This timeslot will remain highlighted.21 (F3). (t) 11010100 D4 (+) 11000101 C5 ( ) PAUSE F3 PAGE T/S 000 001 002 003 004 005 006 007 L1-Tx E1 Side 2. X. where the MUX supplies the timing source. If Tx/INST is L1-Tx. 54 SunSet E20/c . 1. Pressing CLR-ALL (F4) will clear all of the selections and allow you to start the process over.048 Mbps PAGE-UP PAGE-DN F1 F2 PRINT F4 MUX 1X0 Loop Timing SUNRISE TELECOM I N C O R P O R A T E D A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 Datacom Side 64kbps PRINT F# AUTO 7 4 * 5 MEAS 8 0 SHIFT ESC ENTER POWER Tx/INST: L1-Tx XMT CLOCK: L1-Rx Figure 29 Slave Timing • To configure the test set for slave timing. G. Conversely.703 (more. Refer to Figure 29. F1). if Tx/INST is L2-Tx. You may deselect the timeslot highlighted by the cursor by pressing UN-SEL (F3). RS449 (F2). Continue selecting timeslots as needed. Use it to select transmit/receive timeslots. F2) Determines the electrical interface at the multiport. 2. then TX CLOCK should be L1-Rx.

the test set will perform a mux and a demux test simultaneously. the DATACOM TYPE selected). • • E1DRP: This means the E1 side will be bit error tested. etc. Both the E1 and DATACOM ports will transmit the test pattern and perform a BERT when receiving the test pattern on the other side of the multiplex. 15:35:30 TEST CONFIGURATION TEST MODE : MUXTEST E1 Tx/INSERT :L1-Tx Rx/DROP :L1-Rx FRAMING :PCM-30 CRC-4 :YES L1-Rx Port:TERM L2-Rx Port:TERM Tx CLOCK :INTERN L1-Rx INTERN DATACOM TYPE : RS449 BERT E1T/S: Nx64K B-LED: DTCM L2-Rx Figure 30 MUXTEST Configuration Ch. Choosing DTCM means the signal coming from the low speed datacom side will be tested. Figure 30 displays the configuration associated with the previous graphic.703.B-LED Options: E1DRP (F1). Simply switch the B-LED selection in order to view results for each side. In other words. DTCM (F2) Determines the side Bit Error Rate Test measurements are performed on and the side the PAT SYNC LED will apply to. The B-LED is set to DTCM (RS232. DTCM: This is the datacom type selected above: RS232. and the PAT SYNC LED will refer to the received E1 signal. 3 Menus 55 . and the PAT SYNC LED will refer to the datacom side. G.

2.3 Test Pattern From the main menu (or via the Setup icon). select TEST PATTERN. 3. or LIVE (F2).3. Press INVERT (F2) to send the pattern with an inverted polarity (1s and 0s reversed). 56 SunSet E20/c . the PAT SYNC LED will turn off. Use the arrow keys to highlight the desired pattern. and tests live traffic. where the test set does not look for a pattern. If LIVE is selected. The screen displays a list of the patterns available for transmitting/receiving. Press NORMAL (F2) to send the pattern with a normal polarity. At the MEASURE MODE line in SYSTEM PARAMETERS (System icon-color test set) > MEAS CONFIGURATION. the test set begins transmitting that pattern. • As each pattern is highlighted. you have the option of selecting BER (F1) to have the test set look for a BERT pattern.1 Standard Patterns To send one of the standard patterns: 1. It also reports the received pattern. Figure 31 shows the TEST PATTERN screen. MEAS TEST PATTERN 2e23 2047 1111 QRS 2e20 511 1010 1-4 2e15 127 0000 1-8 15:03:27 20ITU 63 FOX 3-24 PATTERN: 2e23 INVERTED USER NORMAL Figure 31 Test Pattern Screen 3.3. See the Reference chapter for pattern definitions.

3. 7. Ch. To access. 8. press USER (F1) to enter the USER TEST PATTERN screen. In this screen you can create. Press CREATE (F1). press USER (F1) in the TEST PATTERN screen (Figure 31). The letter A will be highlighted in the character grid as shown in Figure 33.2 User Test Patterns In addition to the standard patterns. 2. You will see your selected pattern on the screen (in binary). Press TOGGLE (F3). 10.3. 3 Menus 57 . 4. In the TEST PATTERN screen. CREATE Figure 32 User Test Pattern Screen Sending a User Test Pattern 1. 4.Use the Up/Down arrow keys to select the desired pattern. 9. 3. move the cursor to the desired pattern and press VIEW (F1). From the USER TEST PATTERN screen. send. 3. view. Viewing a User Test Pattern 1. 1. In the SEND TEST PATTERN screen. or delete a pattern. Creating User-Defined Patterns 1. edit. Cursor down to a blank position on the user pattern list. Use the arrow keys to move the cursor to the desired character. you may program and send a user pattern. 15:03:27 USER TEST PATTERN CURRENT- 0. The cursor appears at the LABEL position on the USER TEST PATTERN screen. 2. 3. When finished.3. 5. Press ENTER to send the selected pattern. 6. press USER (F1). 2. 2. 5. The USER TEST PATTERN screen appears listing any stored patterns (Figure 32). The test set will present a list of stored USER patterns. press ESC to return to the USER TEST PATTERN screen.

From the TEST PATTERN screen. A. Move the cursor to the pattern lable and press ENTER to transmit the pattern. 12.) area. Select the desired replacement character and press TYPOVR (F1).6. The new pattern lable will now be displayed in the menu. Select the code lable that you want to edit and press EDIT (F2). Press the SHIFT key. 13. press USER (F1) to move into the USER TEST PATTERN screen. Press TOGGLE (F3) to move out of the character grid and back to the LABEL item. 3. 7. Repeat until you have the label as desired. Editing a User Test Pattern Label Use this procedure to edit the label of a test pattern. 1. select it and press INSERT (F1). When the cursor is on the LABEL code line. 11. Press the ENTER key to store the pattern and to return to the USER TEST PATTERN screen. Verify that the ‘SHIFT’ indicator is no longer displayed. Press the down arrow key to move to the pattern entry (No. 17:03:38 USER TEST PATTERN LABEL: AF No : A H O V INSERT B I P W C J Q X D K R Y E L S Z F M T - G N U / SELECT DELETE TOGGLE Figure 33 User Test Pattern Screen 8. 2. Press the SHIFT key when finished. Press SELECT (F4) and the letter appears next to the label. 9. press TOGGLE (F3). To replace a particular letter. A letter within the character grid will be highlighted. 58 SunSet E20/c . • Use the INSERT (F1) and DELETE (F2) keys if you need to make corrections to the pattern. • You may enter up to 24 bits to make the desired pattern.

5. The pattern is deleted and you are finished. 7. 4. Correcting a Mistake in the Pattern While Entering the Pattern Use the following procedure to correct any mistakes made while entering the pattern. Enter in the rest of the digits.B. Press ESC to return to the main menu. Repeat until the LABEL is complete. Press the SHIFT key to remove the ‘SHIFT’ indicator. Enter the correct digit. Select the desired character and press SELECT (F4). Ch. Press the SHIFT key to remove the ‘SHIFT’ indicator. 1. press TOGGLE (F3) to return to the character grid. While entering the 1s and 0s. C. 8. Press ENTER to store the pattern. Move the cursor to the end of the line. Press DELETE (F2) to remove a letter. If you need to add characters to the label. 2. press USER (F1) to enter the USER TEST PATTERN screen. 3 Menus 59 . you notice an incorrect digit. Deleting a User Test Pattern Follow this procedure to delete a user test pattern you no longer need: 1. 3. From the TEST PATTERN screen. 4. Select the incorrect digit and press the SHIFT key to display the ‘SHIFT’ indicator. • You can edit the code's label using the same procedure. Press TOGGLE (F3) to move out of the character grid and back to the LABEL line and press ENTER. 2. 6. Select the test you want to delete and press DELETE (F3). Press the SHIFT key again to display the ‘SHIFT’ indicator. This procedure assumes you are starting from step 7 of the Creating User-Defined Patterns procedure.

Measurement results are stored when your press STOP (F3) and when PRINT RESULT is set to LAST in SYSTEM PARAMETERS > MEAS CONFIGURATION. Measurements are automatically restarted every time the configuration is significantly changed. While a measurement is being made. or when a TIMED measurement finishes. however.00E+00 FE .048M LINE 1 . Events are also stored when PRINT EVENT is ENABLED.0 RATE .0.4 Measurement Results To observe measurement results: 1. the ‘MEAS’ status indicator is displayed at the top of the screen.1 dB Hz/PPM:-0. You do not need to access MEASUREMENT RESULTS for results to be compiled.1 dB PAGE-UP PAGE-DN STOP MORE Figure 34 Measurement Results Screen 60 SunSet E20/c .0 RATE .0.0 -RxLVL:-0. The test set continuously performs measurements on received signal(s). The actual measurement results screens and the values displayed depend upon the TEST MODE selected in the TEST CONFIGURATION screen.3. and in MEAS CONFIGURATION. Page-Down through the screens.00E+00 RxCLK:2048009 +RxLVL:-0.0 RATE .00E+00 EBIT.00E+00 BIT .00E+00 CRC . Select MEASUREMENT RESULTS from the main menu (Results icon-color test set) and press START (F3).0 RATE . When the measurement is stopped. 16:47:42 Meas ET : 000:24:37 RT : CONTINU FRM : PCM-30/C TxCk: INTERN PATT: 1-4 RATE: 2.0.00E+00 MFE . 2. some common features in all of the results screens (see Figure 34).0 RATE . The results screens allow you to view the accumulated measurements and restart the measurement process.0.0 RATE .0. There are. 3.0. Press ESC when finished. the indicator will disappear.SUMMARY CODE.

A key concept for the results screens is availability. LOCK/UNLOCK (more. F1): Hold Screen freezes all of the measurement displays so they may be easily observed. the unavailable second counter suddenly decreases by 10 and the error counter increases by the 1 or 2 errors that you inserted. Once a circuit is unavailable. When you have finished viewing the screen. This is useful if you are running a long-term test and do not wish to have the test disturbed. all the counts will decrease back to the values they had before the error injection was started. The following F-keys are shared by all screens: PAGE-UP (F1). HOLDSCR/CONTINU (more. and then insert 1 or 2 errors during the next 5 seconds. but the counts are updated only in memory. and severely errored seconds for the first 9 seconds. Pressing START restarts the measurement process from within this menu. Using this feature will not disturb any measurement results. press CONTINU to view updated measurement results.Measurements often have a count number displayed on the left hand side and the corresponding rate or percentage displayed on the right hand side of the same line. if you turn the severe error injection off. Press UNLOCK to enable the test set’s keypad. F2): Press LOCK to disable the keypad. if you start continuously injecting errors to the test set at a 2x10-3 error rate. A circuit is available for use only when the bit error rate is low enough that the signal can get through and be understood. Therefore. Errors. You may now read the previous counts clearly. errored seconds. and the unavailable counter will increase by 10. 3 Menus 61 . Then at the tenth second. CODE appears on the left and RATE on the right. but keypad strokes have no effect on the test set. you will observe that the unavailable second counter continues to increase for the first 9 seconds while the error counter does not change. and severely errored seconds are not accumulated when the circuit is unavailable. To continue the previous example. Ch. At the tenth second. errored seconds. in Figure 34. The measurement count is still proceeding. it becomes available only after 10 consecutive seconds without severe errors. PAGE-DN (F2): These keys allows you to view all available results pages. A circuit is said to be unavailable at the beginning of 10 consecutive severely errored seconds. you will see increasing bit errors. STOP/START (F3): Press STOP to halt the test. For example. The measurement process continues as usual.

ET: Elapsed Time is the time that has passed since the test was started or restarted.In addition to the actual measurement data. the remaining time will count down to zero during the measurement. in the SYSTEM PARAMETERS > MEAS CONFIGURATION menu. RT: Remaining Time is the time that remains until the end of testing. TxCK: The transmit clock source is displayed here. the following information is displayed in the upper portion of the results screens: CURRENT TIME: The time of day is displayed in the upper righthand corner of the screen. The factory default condition is that the test runs continuously until the user stops it. In this case. FRM: The transmitted framing is displayed here. PATT: The transmitted test pattern is displayed here. CONTINU is displayed in the RT field to denote a continuous test. 62 SunSet E20/c . However. you may specify the length of test time. RATE: The exact test rate is displayed here.

a Code Error is a bipolar violation that is not part of a valid HDB3 substitution. In HDB3 coding. CRC: This is a count of the number of CRC-4 block errors that have occurred since the start of the test. e. is the STATUS screen.1 E1 Results and General Definitions E1 Mode measurement result screens contain several pages of data. Screen 1. BIT: This is a count of bit errors that have occurred since the start of the test. a status message is displayed for both lines 1 and 2. AS equals the length of the total test time minus any Unavailable Seconds. It displays the status of each line in use. BER: Bit Error Rate is the total number of bit errors divided by the total number of bits during available time since the start of the test. and to all Summary errors in the SUMMARY screen. Bit errors are not counted during unavailable time. Measurement Result Definitions The following measurements are displayed in the results screens. SINGL or DUAL. These messages (for example: NO ERRORS. CODE: This is a count of the number of line Code Errors (Bipolar Violations that violate the coding rules) that have occurred since the start of the test. AISS: Alarm Indication Signal Seconds is a count of the number of seconds in which AIS was detected. ERROR DET) represent the condition of the line during testing. SIG LOSS. FRM LOSS. Remember to press START (F3) to begin taking measurements.3.4. (CODE) RATE: This is the average Bipolar Violation error rate since the start of the test. ‘error’ refers to E-Bit errors in the E-BIT screen. which appears when you first enter MEASUREMENT RESULT. AS: This is the count of Available Seconds since the start of the test. In large font.g. CLK SLIP: This is the number of Clock Slips that have occurred since the start of the test. %AS: This is the percentage of Available Seconds since the start of the test. This measurement is reported as N/A when the test set is not synchronized on a received CRC-4 check sequence. etcetera. Which screens are displayed depend on which mode you are in. Ch. The definitions are listed in alphabetical order. Note: Each measurement is proprietary to its screen. 3 Menus 63 .

FE: This is a count of the number of Frame bit Errors that have occurred since the start of the test. A DGRM occurs when there is a 10-6 bit error rate during 60 available. LOFS: Loss Of Frame Seconds is a count of seconds since the start of the test that have experienced a loss of frame. LOSS: Loss Of Signal Seconds is a count of the number of seconds during which the signal has been lost during the test.(CRC) RATE: This is the average CRC-4 block error rate since the start of the test.048 Mbit/s in the received frequency. bit error. or CRC-4 error. ES: This is a count of the number of Errored Seconds that have occurred since the start of the test. DGRM: This is the count of degraded minutes since the start of the test. An ES is any second with at least one BPV. Hz/PPM: The Hertz/Part Per Million count records any variance from 2. %DGRM: This is the percentage of summary Degraded Minutes since the start of the test. EBIT: This count shows the number of E-bit errors since the start of the test. +LVL: Positive Level is the level of positive pulses being received by the test set. FALM: Frame Alarm seconds is a count of seconds that have had far end frame alarm (FAS Remote Alarm Indication. A summary Error Free Second is a second in which the signal is properly synchronized and no errors or defects occur. Measurements are displayed in decibels variance from G. Measurements are displayed in decibels variance from G. %ES: This is the percentage of errored seconds that have occurred since the start of the test.703 specified level (dB). %EFS: This is the percentage of summary Error Free Seconds since the start of the test.703 specified level (dB). 64 SunSet E20/c . EFS: This is a count of number of Error Free Seconds since the start of the test. EBER: This is the average E-bit error rate since the start of the test. An ES is not counted during an Unavailable Second. non-severely bit errored seconds. This measurement is reported as N/A when the test set has not synchronized on a known framing pattern within the received signal. RAI) since the start of the test. This measurement is reported as N/A when the test set is not synchronized on a received FAS or MFAS signal. -LVL: Negative Level is the level of negative pulses being received by the test set. FBE. errored block.

The displayed value of UAS updates after the tenth consecutive severely errored second occurs. This measurement is reported as N/A when there is no framing pattern within the received signal. Unavailable time also begins at a LOS or LOF. %UAS: This is the percentage of unavailable seconds since the start of the test. ± RxLVL: This is the positive or negative level of pulses being received by the test set. Ch. SES is not counted during unavailable time. Measurements are displayed in decibels variance from DSX level (dB). A severely errored second has an error rate of >10-3. SES: This is the count of Severely Errored Seconds since the start of the test. The +WANDR value increases whenever the measured frequency is larger than the reference frequency. Unavailable time begins at the onset of 10 consecutive severely errored seconds. %SES: This is the percentage of seconds since the start of the test that are Severely Errored Seconds. SLIP occurs when the synchronized pattern either loses a bit or has an extra bit stuffed into it.Lpp: Level Peak-to-Peak is the peak-to-peak level of negative and positive pulses being received by the test set. +WANDR: This is the total positive phase difference between the measured frequency and the reference frequency since the start of the test. MFE: This is a count of the number of Multiframe bit Errors that have occurred since the start of the test. RxCLK: This is the received clocking frequency. MIN Hz: This is the minimum frequency measured since the start of the test. MAX Hz: This is the maximum frequency measured since the start of the test. 3 Menus 65 . UAS: This is the count of Unavailable Seconds that have occurred since the start of the test. RCV Hz: This is the current frequency measured during the last second. RAI) since the start of the test. The -WANDR increases whenever the measured frequency is less than the reference frequency. MFAL: Multiframe Alarm seconds is a count of seconds that have had far end multiframe alarm (MFAS Remote Alarm Indication. -WANDR: This is the total negative phase difference between the measured frequency and the reference frequency since the start of the test. SLIP: This is the count of Bit Slips.

048M LINE 1 . if both lines are in use. to meaningfully interpret your graph results.0.00E+00 EBIT. The other (not selected) line is the reference clock.1.0 RATE .0.1 dB Hz/PPM:-0.0.00E+00 MFE . One clock slip occurs when the measured frequency deviates from the reference frequency by one unit interval. SUMMARY screens present the most significant measurement results. Figure 35 displays the SUMMARY screen for Line 1. and multi-framing bit errors.SUMMARY CODE. These screens contain data related to the specific types of impairments. A count of the number of clock slips is kept at the end of the bar.2 Frequency Screen The next screen is FREQUENCY. and the reference clock will be derived from the L2-Rx signal.0.0.4. respectively. RxDROP determines which line the measurements are taken on.00E+00 CRC . like code errors.0 RATE .00E+00 BIT . For example.0 -RxLVL:-0. 16:47:42 Meas ET : 000:24:37 RT : CONTINU FRM : PCM-30/C TxCk: INTERN PATT: 1-4 RATE: 2.0 RATE . which shows relevant frequency information.0 RATE .0.1 Line 1 and Line 2 Summary Screens Screens 2 and 3 contain the summary results for Lines 1 and 2. • The bar graph indicates how fast the signal is slipping in relation to the reference clock. L1 will be measured.The following is a description of the available results screens. At 256 clock slips the graph resets itself. framing. It is important to know the source of the reference clock. if RxDROP is L1-Rx.0 RATE . 3. Note that the bar graph slips most rapidly at the center position and then gradually slows down as the length of the bar increases.00E+00 RxCLK:2048009 +RxLVL:-0.1 dB PAGE-UP PAGE-DN STOP MORE Figure 35 Line 1 Summary Screen (E1 Mode) 3. A unit interval SunSet E20/c • • • • • 66 .00E+00 FE .4. CRC-4 block errors.0 RATE . In the TEST CONFIGURATION screen.1.

and no graph will be shown. for the measurement of MAX. Ch. MIN. the test set will default to its internal clock.FREQUENCY NO LINE 2 REF RCV/Hz: 2048003 MAX/Hz: 2048003 MIN/Hz: 2048002 PAGE-UP PAGE-DN CKSLIP: N/A +WANDR: N/A -WANDR: N/A STOP more Figure 37 Line Frequency/No Ref Signal Note: When no reference clock signal is present. MEAS ET : 000:50:21 FRAM: PCM-30 PATT: P15 17:13:40 RT : CONTINU TxCK: INTERNAL RATE: 2.• • is equal to 488 nano seconds.FREQUENCY NEG 0 POS -+--+--+----+----+--+--+<<<<< 051 RCV/Hz: 2047999 MAX/Hz: 2047999 MIN/Hz: 2047999 PAGE-UP PAGE-DN CKSLIP: 51 +WANDR: 0 -WANDR: 51 STOP more Figure 36 Line Frequency Screen (E1 Mode) MEAS ET : 000:14:19 FRM : PCM-30/C PATT: 1-4 20:50:45 RT : CONTINU TxCK: INTERN RATE: 2. The bar graph is only valid when both L1-Rx and L2-Rx have valid signals. Figures 36 and 37 show the Line Frequency screen used for E1 Mode. and current RCV bit rates of the selected signal. for E1 lines. 3 Menus 67 . If L2-Rx has no signal it will show a NO LINE 2 REF SIGNAL.048M LINE 1 . Refer to the Measurement Result Definitions section as needed.048M LINE 1 .

0. The same applies specifically to the DGRM measurement.4 Line 1 and Line 2 ALM/SIG Screens This screen presents alarm and measurement parameters relating to the E1 signal.000 0 %DGRM.1.ALM/SIG +LVL : -0.G. Note that these screens will only appear if the G.048M LINE 1 . Refer to the Measurement Result Definitions section as needed. MEAS ET : 001:02:26 FRM : PCM-30 PATT: 1-4 LOSS: AISS: LOFS: FALM: MFAL: 0 0 0 0 0 17:25:41 RT : CONTINU TxCK: INTERN RATE: 2. Refer to the Measurement Result Definitions section as needed.821.0e-10 0 %ES : 00.3 LINE 1 and Line 2 G.048 LINE 1 .4.821 Logical Screen 3.3.821 0 BER : 0.4. Figure 38 provides a sample screen.1. MEAS ET : 000:56:49 FRM : PCM-30 PATT : 63 BIT : ES : SES : EFS : AS : UAS : DGRM: 17:20:11 RT : CONTINU TxCK: INTERN RATE: 2.000 PAGE-DN STOP MORE PAGE-UP Figure 38 G.821 item in the SYSTEM PARAMETERS > MEAS CONFIG screen is set to ON.821 Screens These screens present the measurement parameters specified in ITU G.69 dB Lpp : 4.73 dB PAGE-UP PAGE-DN STOP MORE Figure 39 ALM/SIG Screen (E1 Mode) 68 SunSet E20/c .000 3541 %EFS : 100 3541 %AS : 100 0 %UAS : 00.000 0 %SES : 00.69 dB -LVL : -0.

048M LINE 1 . The period interval used in Figure 40 is 2 minutes. 10-3 code error. P/F: This shows whether the test result passed or failed during the test period. %SES: This is the percentage of Severely Errored Seconds since the start of the test.0 01-01 00:29/00:31 P 0.0 0. Frame. The test set makes the M. %ES: This is the percentage of M.5 Line 1 and Line 2 M. Bit. 3 Menus 69 .2100 Severely Errored Second is any second with >10-3 bit error rate. You need only to enter the appropriate percentage that is to be allowed for the line under test.0 0. The definitions following pertain particularly to this screen.2100/550 specifications.2100/550 screen (E1 Mode) PERIOD: Identifies the date and time interval of each of the reported pass or fail results. You may change this interval in the SYSTEM PARAMETERS > MEAS CONFIGURATION.4. An errored second is any second with a Code.3.048 Mbit/s circuit passes through international boundaries. Refer to Figure 40. Multiframe or CRC error.2100/550 Screens This screen provides pass/fail measurements in accordance with ITU M. or loss of signal.33 P 0.2100/550 PERIOD P/F %ES %SES 01-01 00:27/00:29 P 0. loss of frame. synchronization. loss of pattern. This specification is used where a 2. It allocates a certain allowable error rate to each nation that carries the circuit. Valid entries may range from 00 to 99 minutes.0 01-01 00:31/00. Ch.2100 Errored Seconds since the start of the test. multiframe or CRC bit errors.M.1.0 PAGE-UP PAGE-DN STOP more Figure 40 Line 1. excessive frame. An M.M.0 0. page 2.0 01-01 00:33/00:35 P 0.0 0. MEAS 00:34:29 ET : 000:09:07 RT : CONTINU FRAM: PCM-30 TxCK: INTERN PATT: P15 RATE: 2.2100/550 calculations and reports whether the line passed or failed.

826 measurements in SYSTEM PARAMETERS > MEAS CONFIGURATION.1. Refer to Figure 41.6 LINE 1 and Line 2 G.0004 00. 01:19:54 ET : 000:14:25 FRM : PCM-30/C PATT: 1-4 EB BBE ES SES UAS EFS : : : : : : 4 4 4 0 0 1001 Meas RT : CONTINU TxCK: INTERN RATE: 2. EB: An Errored Block is a block containing one or more bit errors. 70 SunSet E20/c . The parameter definitions given in G. This makes in-service measurement convenient.4.826 Screen (E1 Mode) Note: You must turn on G. %SES: This is the percentage of Severely Errored Seconds since the start of the test.0004 00. The following definitions are specific to this screen: BBE: A Background Block Error is an errored block not occurring as part of a SES (Severely Errored Second).G. excluding all blocks during SES and unavailable time. specifies required performance characteristics of 2.826 PAGE-UP PAGE-DN Figure 41 Line 1. %BBE: The percentage of errored blocks since the start of the test.826 Screens The next screen shows the G. %EB: This is the percentage of errored blocks since the start of the test.048M %EB %BBE %ES %SES %UAS %EFS STOP : : : : : : 01.826 are block-based.0000 99. SES: A Severely Errored Second is a one second period which contains greater or equal to 30% errored blocks.93 MORE Line 1 .3.048 Mbit/s lines.1111 00.0000 00. This ITU standard.G.826 results.

2e15 RxDL .0 SLIP.000 00.511 DATACOM BIT ERROR BIT .CONTINU DATACOM-SUMMARY TYPE .2 E1-MUX Mode Measurement Results The E1-MUX mode MEASUREMENT RESULT screen.0 PATL .48000 RxDLS .000 100 100 00.0 BER . Figure 43 shows the DATACOM BIT results.0 PATLS .48k PAT .4.0 PAGE-UP PAGE-DN MODE .3.0 BIT . See Chapter 5.V. Three additional datacom screens are shown in this mode.48k RxHz .0 PAGE-UP PAGE-DN RATE %ES %SES %EFS %AS %UAS 2. show the Line 1 and Line 2 Summary Results. MEAS ET .295 AS . 3 Menus 71 .295 UAS .0 ES .3e-06 00.000:04:55 RT .CONTINU TxHz. Figure 42 shows the Datacom SUMMARY screen. for the results definitions.48001 PAT . See the Measurement Result Definitions section as needed.000:01:27 15:12:46 RT . and Figure 44 shows the BLOCK ERROR screen.35 TxHz .0 EFS .DCE RxHz .0 SES .000 MORE STOP Figure 43 Datacom Bit Error Results Ch. Datacom.0 STOP MORE Figure 42 Datacom Summary Results (E1-MUX Mode) MEAS 06:45:12 ET .

4.0e-05 PAGE-UP PAGE-DN STOP MORE Figure 44 Datacom Block Error Measurement 3.3 MUXTEST Mode Results Measurement results for MUXTEST mode are the same as those of E1-MUX Mode.000:01:27 PAT. The Datacom screens are found in Section 4. 3.2e15 Meas RT . Figures 42 to 44 show sample screens. except for the Datacom results. 72 SunSet E20/c .4.1.CONTINU RxHz .48000 DATACOM BLOCK ERROR MEASUREMENT BLOCK SIZE # OF BLOCK BLOCK ERROR BLK ERR RATE 1000 68688 0 0. E1 Mode.2 and in Chapter 5. See Chapter 5 for further information.15:12:46 ET . for descriptions of all the screens.4 DATACOM Mode Measurement Results The DATACOM results screens contain three pages of data. Refer to Section 4.

50 and V.5 Other Measurements The OTHER MEASUREMENTS menu screen is shown in Figure 45. Ch.50 ANALYSIS C-BIT ANALYSIS HISTOGRAM ANALYSIS PROPAGATION DELAY V. 3 Menus 73 . V.3.110 ANALYSIS CHANNEL LOOPBACK Figure 45 Other Measurements Menu Screen Most of these menu choices are described here in Section 5.110 ANALYSIS have their own manuals. Note that Datacom is described in Chapter 5. X.110 and Channel Loopback are found under the Setup icon. 01:25:25 OTHER MEASUREMENTS VIEW RECEIVED DATA VIEW FAS WORDS VIEW MFAS WORDS PULSE MASK ANALYSIS X. Most of these items are found under the Results icon for the color test set. in a slightly different order.

5. • Press PRINT (F4) to send the data to the serial port for printing. 2. use the following procedure: 1. • Press PAUSE (F3) to trap the current data on the E1 line. In DATACOM mode. In the main menu. the data displayed will be for the received signal in the TEST CONFIGURATION screen. for a typical screen display. When finished. • Press PAGE-UP (F1) or PAGE-DN (F2) to view more data.1 View Received Data Refer to Figure 46. Note the PAGE number in the upper left-hand portion of the screen. This display refers to the Rx/DROP setting in the TEST CONFIGURATION screen. MEAS 12:12:47 VIEW RECEIVED DATA PAGE:01 T/S BINARY 00 00011011 01 10001110 02 01000100 03 11011010 04 01100101 05 00100010 06 10100001 07 00110000 PAGE-UP PAGE-DN HEX 1B 8E 44 DA 65 22 A1 30 PAUSE ASCII ( ) (q) D (”) ([) e ( ) “ (D) ( ) 0 ( ) PRINT Figure 46 View Received Data To view this screen. 74 SunSet E20/c . 64 pages of data are available. press ESC to return to the main menu. select OTHER MEASUREMENTS (Results icon-color test set) > VIEW RECEIVED DATA and view the live presentation of the data.3. which is equal to 16 frames or one multiframe.

HEX: This column shows the hexadecimal representation of the 8 bits being transmitted in each timeslot. • • The character displayed to the left of the parentheses represents the 8-bit framing words translated in their present order. Ch. T/S: Specifies the TimeSlot being viewed. Each line represents the 8-bit timeslot. The character displayed within the parentheses represents the 8 bits translated in reverse order.The following display definitions are used in this screen: PAGE: Indicates which of the available 64 pages of data is currently being displayed. BINARY: This column shows the binary data actually being received on the line. 3 Menus 75 . ASCII: This column displays the ASCII representation of the 8-bit binary framing word which has been received.

08:07:56 FRM 0 2 4 6 8 10 12 14 12345678 c0011011 10011011 00011011 10011011 10011011 00011011 00011011 10011011 10011011 PRINT Meas FRM 1 3 5 7 9 11 13 15 12345678 i1asssss 01011111 01011111 11011111 01011111 11011111 11011111 11011111 11011111 FAS FRAME WORDS RESUME Figure 47 FAS Frame Words The even frames. Press PAUSE (F1) to freeze the presentation of data.2 View FAS Words View FAS Words is accessed via the OTHER MEASUREMENTS menu (Results icon-color test set). The top row of these frames in Figure 47 shows the allocation of bits 1-8 in these frames. The presented data refers to the Rx/DROP selection in the TEST CONFIGURATION screen. 0-14. Timeslots 0 of frames 0 through 15 are displayed in this screen (see Figure 47). The 76 SunSet E20/c . PRINT (F2) will become available when this screen is paused. those not containing the frame alignment signal. Bit 1 is used to transmit the 6-Bit CRC-4 multiframe alignment signal and 2 CRC-4 error indication bits.3. contain the FAS. When the framing is set for PCM-30 Multiframe. in bits 2-8.5. press PRINT to send the screen to the serial port for printing. there is a slight variation in the odd framing bits. Frame Alignment Signal. See Chapter 5Reference for further information. As shown in Figure 47. The figure represents an undisturbed condition. Notes: • • • • Valid framing is required to select this screen. View FAS Words allows viewing of the live presentation of E1 framing binary words. The odd frames do not contain the frame alignment signal. press RESUME (F1) to return to a live FAS word display. This feature is not available for the DATACOM TEST MODE. FAS is represented by 0011011.

the first bits of frames 1-11 (odd) send the pattern 001011.CRC-4 multiframe alignment signal has the form 001011. the CRC-4 multiframe alignment signal. 3 Menus 77 . Ch. MEAS FAS FRAME WORDS FRM 0 2 4 6 8 10 12 14 12345678 c0011011 00011011 10011011 00011011 00011011 10011011 00011011 00011011 00011011 FRM 1 3 5 7 9 11 13 15 12345678 ilasssss 01011111 11011111 11011111 11011111 11011111 01011111 01011111 11011111 07:31:55 PAUSE Figure 48 FAS Words In Figure 48. Figure 48 shows the FAS frame words seen when the framing is set for PCM-30.

Please note that in Figure 49. • Press PAUSE (F1) to freeze the presentation of data. b. MFAS is 0000. From the MAIN MENU. MEAS 13:00:02 MFAS FRAME WORDS LINE #: 1 FRM 12345678 FRM 12345678 0000xyxx ABCDabcd 0 00001011 1 11011101 2 11011101 3 11011101 4 11011101 5 11011101 6 11011101 7 11011101 8 11011101 9 11011101 10 11011101 11 11011101 12 11011101 13 11011101 14 11011101 15 11011101 RESUME Figure 49 MFAS Frame Words In the Multiframe. which contains channels 15 and 30. • PRINT (F2) will become available when this screen is paused. Frames 0-15. The rest of the frames contain signalling channels designated a. press PRINT to send the screen to the serial port for printing. This feature is not available for the DATACOM TEST MODE. As seen in Figure 49. All other frames follow the template shown above the odd frames (ABCDabcd). and d. select OTHER MEASUREMENTS (Results icon-color test set) > VIEW MFAS WORDS. the template for the even frames (0000xyxx) applies only to Frame 0. 78 SunSet E20/c . c. timeslot 16 is used for either common channel or channel associated signalling. To enter View MFAS Words: 1. press RESUME (F1) to return to a live MFAS word display.3 View MFAS Words In View MFAS Words. you may view the live presentation of Timeslot 16. and so forth until frame 15. in frame 0.5. Frame 1 contains channels 1 and 16. The data comes from the Rx/DROP selection in the TEST CONFIGURATION screen.3. frame 2 contains channels 2 and 17. You need to select PCM-30 framing in the TEST CONFIGURATION screen to select this screen (Figure 49). as required.

When Pulse Mask Analysis is complete. • • • • • The Pulse Mask Analysis is performed for any received test pattern or live signal. The test set will store the present pulse shape for later viewing. The PULSE SHAPE ANALYSIS menu is shown in Figure 50. Ch. 3 Menus 79 .5. the test set will restart the measurements. and line interface mode. Note that if you start analysis while measurements are running. View the last analysis made by the test set.3.4 Pulse Mask Analysis The Pulse Mask Analysis option enables you to measure the quality of an E1 waveform. the test set will stop the measurements. The measured results compare favorably with pulse shape measurements obtained from testing with a digital oscilloscope. The signal shape is displayed on the test set’s screen.703 pulse mask can be superimposed for fast inspection. 08:07:06 Meas PULSE SHAPE ANALYSIS LINE 1 START NEW ANALYSIS VIEW LAST PULSE SHAPE Figure 50 Pulse Shape Analysis Menu In the PULSE SHAPE ANALYSIS menu you can: • • Start a new analysis. The ITU G.

1 Start New Analysis Select PULSE SHAPE ANALYSIS > START NEW ANALYSIS to start a new analysis. If the pulse meets the G. This F-key then becomes NO-MASK (F1). Otherwise. RESTART (F2): Starts a new pulse shape capture and analysis. Figure 51 provides a sample screen. A PASS/FAIL message will appear at the top of the screen.703 criteria. in ns Rise Time: in ns Fall Time: in ns Ovr Shoot: Over Shoot. press to remove the G. it fails. percentage Und Shoot: Undershoot.703 mask with the captured signal. the captured pulse shape will be displayed. there are three F-keys: G.4. it passes. PRINT (F3): Press PRINT to send the screen to the serial port for printing. percentage Level: Signal level.0 % Level -0.703 (F1): Displays the ITU G. 15:46:55 Width 240 ns Rise Time 57 ns Fall Time 70 ns Ovr Shoot 0.4 dB 50 ns/div NO-MASK RESTART PRINT Figure 51 Pulse Shape Analysis In three to five seconds.0 % PASS 1 0 - UndShoot 3.703 mask. In this screen.703 mask has been imposed on the received pulse. when a G. Definitions for this screen are: Width:Pulse Width. in dB 80 SunSet E20/c .5.3.

along with the G.5. • The last pulse shape will be displayed on the screen.1 for the results definitions. Follow this procedure: 1.703 and PRINT F-keys. 3 Menus 81 .2 View Last Pulse Shape View the last pulse shape captured by the test set.4. • See Section 3. Ch.3. even after the test set has been turned off for an extended period of time. select OTHER MEASUREMENTS (Results icon-color test set) > PULSE MASK ANALYSIS >VIEW LAST PULSE SHAPE.4.5. In the main menu. You may view this pulse shape at any time.

• • Press NEXT (F1) or PREVIUS (F2) as necessary. 17-31 Select the transmit timeslot on which to send C-bits. To enter C-Bit Analysis: 1. • 82 SunSet E20/c .3. set Tx/INSERT to L2-Tx in the TEST CONFIGURATION screen. select OTHER MEASUREMENTS (Results icon-color test set) > C-BIT ANALYSIS. • C-bits can be received on both Line 1 and Line 2.5. As PCM-30 framing is required for this C-bit analysis. 23:08:38 C-bit ANALYSIS L1-Tx T/S:01 L1-Rx T/S:01 SEND BITS RECEIVED LINE-1 LINE-2 NEXT TRANSMIT :IDLE L2-Rx T/S:01 Meas 123456789012345 S10001000010001 S10001000010001 C-BIT NOT FOUND PREVIUS Figure 52 C-bit Analysis Note: The test set will transmit an IDLE pattern upon entering the C-bit Analysis screen. you may not select timeslot 16. This will be the line set for Tx/ INSERT in the TEST CONFIGURATION screen. but they can be transmitted on only one line. The following programmable fields are available in this screen: L1-Tx T/S Options: 1-15. From the main menu. To send C-bits on Line 2 (and thus.5 C-Bit Analysis The C-Bit Analysis option allows the user to send and receive C-Bit frames. this item changes to L2-Tx T/S).

MFAS. • • IDLE sends logic 1 as bit 2. 3 Menus 83 . Select SEND bits. press SHIFT and enter either 0 or 1 with the numeric keypad. a C-BIT NOT FOUND message will be displayed for that line. When 1 is placed in this spot. framing is required. you may not select timeslot 16. • • Press NEXT (F1). If C-bits are not found on a line. L1-Rx Options: 1-15. B it # 2 ESCAPE 3 2M b Loops 4 Loop 2 or Loop 3 5 L o o p 2 In s tru c tio n 6 L o o p 3 In s tru c tio n 7 H D B3 C om m and 8 L o o p A c k n o w le d g e 9 N o t D e fin e d 1 0 L o c a l F a u lt 1 1 R e m o te /L in e F a u lt 1 2 C F ra m e L o s s 1 3 -1 5 S p a re 0 -A c tiv e 1 -N o n -a c tiv e 0 -A c tiv e 1 -N o n -a c tiv e 0 -A c tiv e 1 -N o n -a c tiv e A s s ig n m e n t 0 -C -F ra m e A c tiv e 1 -C -F ra m e Ig n o re d 0 -S u b s c rib e r 1 -N e tw o r k 0 -S u b s c rib e r 1 -N e tw o r k 0 -A c tiv e 1 -N o n -a c tiv e 0 -A c tiv e 1 -N o n -a c tiv e 0 -A c tiv e 1 -N o n -a c tiv e 0 -A c k n o w le d g e 1 -N o A c k n o w le d g e m e n t Table 3 C-bit Definitions Ch. Cbit framing will be ignored.TRANSMIT Options. IDLE (F2) This setting determines bit 2. USER activates the C-bit framing and sets the programmable bits. information about this C-bit is displayed. Because PCM-30. This screen also shows the received C-bits for both Lines 1 & 2. When the cursor highlights a specific bit. USER (F1). 2. To program the bits use the following procedure: 1. The cursor automatically moves one spot to the right once a bit is entered. At each bit. or PREVIUS (F2) as needed. Definitions of C-bits 2-15 are shown in Table 3. 17-31 Select the Line receive timeslot on which to receive C-bits.

Note: Interrupting a timed measurement to view results will cause a new histogram analysis to start when you return to measuring. Figure 53 shows the HISTOGRAM ANALYSIS menu.3. which appears upon entering this item.6 Histogram Analysis Histogram analysis automaticity starts when E1 or Datacom measurement starts.5. or a previously saved one (if you have an additional memory card). 15:38:29 HISTOGRAM ANALYSIS CURRENT HISTOGRAM SAVED HISTOGRAM Figure 53 Histogram Analysis Menu 84 SunSet E20/c . You can view/ print either the current file.

5. press ESC instead of ENTER at the warning message screen. MEAS 09:28:06 CURRENT HISTOGRAM STARTING TIME STAMP 1998-01-16 08:39:26 ENDING TIME STAMP 1998-01-16 09:29:32 VIEW STORE Figure 54 Current Histogram Menu Ch.6.3. The CURRENT date and time correspond to the last time you entered MEASUREMENT RESULTS. You must have a SRAM card to store data. as depicted in Figure 54. Select VIEW (F1) to view the current histogram. Pressing STORE (F2) will erase any previously stored data. select OTHER MEASUREMENT (Results icon-color test set) > HISTOGRAM ANALYSIS > CURRENT HISTOGRAM. • • • • • • The Current Histogram start and stop date and time will be displayed. Your CURRENT histogram data is also stored.1 Current Histogram From the main menu. but it will be erased the next time you enter MEASUREMENT RESULTS. If you do not want to save the current file and erase the one already saved. Figure 55 shows a sample histogram screen. 3 Menus 85 .

the following error types are available: . • • In Figure 55.The error type is specified in the upper portion of the screen. . the following error types are available: .LOF: Loss of Frame .BERT_LOPS: Loss of Pattern Synchronization .15:30:00 Meas CURRENT HISTOGRAM TYPE: BIT LINE:1 DATE: 2001-04-24 100k 10k 1k 100 10 0 HR 0 TYPE 8 12 18 ZOOM 24 JUMP LINE1/2 Figure 55 View Current Histogram The following F-keys are available for the histogram analysis: TYPE (F1): Press to select from the following measurement types.AIS: Alarm Indication Signal .BERT_BIT: Bit errors For all error types: . . 86 SunSet E20/c . CRC.FASRAI: FAS Remote Alarm Indication .BERT_BIT: Bit errors If the test set is configured for DATACOM mode. E1-MUX or MUXTEST. FAS.MFASRAI: MFAS Remote Alarm Indication . MFAS. CODE: See the Measurement Result Definitions section.EBIT. • If the test set is configured for E1SINGL/E1DUAL.Pressing TYPE automatically changes the type options displayed. BIT error was selected as the error type. .The history of each error type is displayed individually.BERT_LOPS: Loss of Pattern Synchronization .LOS: Loss of Signal .

• Each time MEASUREMENTS RESULT is selected. hour. or day interval as your time period JUMP (more. E1 Line 2.LINE 1/2 (F2): Selects the parameters of either E1 Line 1. F1): Moves the display cursor by 10 steps in the display period. • For each file. the HISTOGRAM ANALYSIS feature will store the most recent 24 hours of data with a display resolution (PERIOD) of 1 minute. the datacom's parameters will automatically be selected and you will not be given the LINE 1/2 option. Notes: • The HISTOGRAM ANALYSIS screen will display either the current or saved results. or E1MUX test mode. • For each file. Ch. or Datacom. ZOOM (F3): Changes the resolution to the next lower time period at the cursor location. MUXTEST. • Select a minute. the test set will replace the file in the CURRENT HISTOGRAM data. 3 Menus 87 . F2): Press to send the results to the serial port. depending on the setup. the HISTOGRAM ANALYSIS screen will store both the present 60 hours and the previous 60 days of histogram data with a resolution (PERIOD) of one hour. • When the test set is configured for DATACOM. • Use the left or right arrow keys on the keypad to move the cursor one period at a time PRINT (more. Highlight the error before pressing ZOOM.

F2): Press LOCK to lock the record. 1. CLR-ALL (more. LABEL START/END TIME 1 . where the new label will be on the record. Press TOGGLE (F3) to access the characters. DELETE (more. F1): Press to delete the highlighted histogram. NONE 1998-12-31 13:03:00 1999-01-01 13:03:00 VIEW PAGE-UP PAGE-DN MORE Figure 56 Saved Histogram Screen F-keys available on this screen are: VIEW (F1): Press to enter the selected record. 3. you will see a warning message. then select the characters by pressing SELECT (F4). 2. Press TOGGLE (F3) when you are done.6. LABEL (more. LOCK/UNLOCK (more.2 Saved Histogram Select SAVED HISTOGRAM to view. so that it may not be deleted or otherwise changed. • Use INSERT (F1) and DELETE (F2) when you need to add or remove a character. See Section 3. F3): Press to enter a screen where you can give the histogram a name. 88 SunSet E20/c . or give a label to a saved Histogram Analysis.5. and you will return to the SAVED HISTOGRAM screen. PAGE-UP/PAGE-DN (F2): Press to scroll through the available screens of saved histograms. Press UNLOCK to unlock the record. MALC 1998-12-31 11:48:10 1998-12-31 12:48:10 2 . F1): Press to delete all unlocked histograms.5. If you attempt to enter SAVED HISTOGRAM without an extra memory card. under the LABEL heading. Press ENTER.3.6.1 for an explanation of the data. See Figure 56 for a SAVED HISTOGRAM screen: 12:37:15 SAVED HISTOGRAM File Size: 2 1K Mem Avail:1002K No. print.

not including the test set. The test set measures the number of unit intervals it takes for the signal to return. and want to re-calibrate the measurement to see the propagation delay between two devices.5. Press RESTART (F1) to stop and restart a propagation delay test. You may enter this screen in a full-rate or Nx64 mode. Continue as necessary to press CALIB to take measurements further down the line. This number is translated into an exact number of microseconds of round trip delay. A unit interval is the amount of time it takes to transmit one bit (488 nS for an E1 signal). The display will be for the Rx/DROP selection in the TEST CONFIGURATION screen.7 Propagation Delay • • • View the propagation delay of a looped back signal (Figure 57).3. 01:44:02 Meas PROPAGATION DELAY ROUNDTRIP DELAY: 460000 ROUNDTRIP TIME: 220000 OFFSET:0 analysis completed UI uS UI RESTART CALIB Figure 57 Propagation Delay • • • Press CALIB (F2) if you have more than one piece of looped equipment on the line. Observe the OFFSET to see the delay between only the two pieces of equipment (taking the test set to Equipment 1 measurement out of the delay measurement). 3 Menus 89 . Ch.

54 Channel Loopback Screen Use LOOP-UP (F1) or LOOP-DN (F2) to send codes as needed.54 channel loopback can locate the faults in the circuit by setting up a loop in the far end modem.8 Channel Loopback With the test set’s E1 V.54 datacom circuits. 1 2 SunSet E20 E1 MUX DATACOM MODEM LOOP A SUNRISE TELECOM I N C O R P O R A T E D Figure 58 V.54 Application The CHANNEL LOOPBACK feature is accessed via OTHER MEASUREMENTS (Setup icon-color test set). you can get detailed information for the maintenance or troubleshooting of V. which allows for local or remote measurements.2/94-003 standard. V. The V. The test set can activate or deactivate the near end device by sending the activation and deactivation code.3. 10:12:18 V. 90 SunSet E20/c .54 channel loopback uses the T1 E1.54 CHANNEL LOOPBACK MODE : LOOP-UP LOOP-UP LOOP-DN Figure 59 V.5.54 channel loopback feature.

listen. The idle channel code and signal can be programmed in the MAIN MENU > SYSTEM PARAMETERS (System icon-color test set) > MEAS CONFIGURATION > IDLE CHNL CODE and IDLE CHNL A/B/C/D menu items. or perform other channelized functions in the absence of frame synchronization. Ch. It is impossible to talk. when the test configuration TxSOURCE is set to TESTPAT. Green LEDs indicate that the framing found on the received signal matches the framing selected in the TEST CONFIGURATION screen. idle channel code and signalling (A/B/C/D bits) will be inserted into the unselected channels. since channels can be identified only within a framed signal. 3 Menus 91 .3. Refer to Figure 60 for the VF CHANNEL ACCESS menu.6 VF Channel Access The VF CHANNEL ACCESS menu performs a variety of talk/listen functions. Note: Do not attempt to enter VF CHANNEL ACCESS if the PCM-31 LED or the PCM-30 LED is not green. 08:22:56 VF CHANNEL ACCESS VF & NOISE MEASUREMENTS VIEW LINE CAS CALL ANALYSIS CALL EMULATOR SUPERVISION SETUP DIAL PARAMETERS SIGNAL MEANINGS VIEW/PRINT TRACE RESULTS Figure 60 VF Channel Access Menu Note: During VF CHANNEL ACCESS.

3. Tx of the other line will be in loop mode. 92 SunSet E20/c .0 PSOP(dBm)=-33. Tx is Line 1.6.6 3K(dBm) =-9. since Tx/INSERT was set for Line 1 in TEST CONFIGURATION.9 NEXT PREVIUS Figure 61 VF Measurements Figure 61 is an example of an E1Dual setup. send a tone. select Tx/INSERT: L2-TX in TEST CONFIGURATION.1 VF & Noise Measurements The VF & NOISE MEASUREMENTS screen lets you choose: • • • • • • • • • which channel to test for both transmitting and receiving whether to talk. Tx-1 is set for timeslot 01.5 1010(dBm)=-68. or place quiet termination on the transmit signal the transmitted frequency and level which signalling bits to send to listen on both or either line the received signalling bits the received 8-bit data the received frequency and level noise measurements on the received frequency It also tells you: Note that there are some differences in setting up for E1SINGL or E1DUAL mode. The MEASUREMENT RESULTS come from the IN/DROP selection further down this menu. To insert on Line 2 (and consequently see Tx2 on this screen). 12:00:00 MEAS VF & NOISE MEASUREMENTS MEASUREMENT SETUP Tx-1 : 01 TxMODE :TONE Rx-1/2:01/01 TxFREQ :1020 TxABCD:1001 TxLVL(dBm):3 IN/DROP:L1/L2 SPEAKER :L1+L2 MEASUREMENT RESULTS RxFREQ =800 OFFSET=+10 Rx(dBm) =01 PEAK =+127/-127 RxABCD =0101 RxDATA=10011001 S/N(dB) =60. Rx-1/2 shows the selected receive timeslot for each line.

approximately three seconds pass before actually inserting on the timeslot. select L2-Rx for the DROP item. Program the IDLE or SEIZE signal in the VF CHANNEL ACCESS/SUPERVISION SETUP. 3 Menus 93 . Rx-1 (E1SINGL) or Rx-1/2 T/S (E1DUAL) Options: 1-31 Choose the receive timeslot for E1 Line 1 (E1SINGL mode) or E1 Lines 1 and 2 (E1DUAL mode). the test set will transmit speech from the microphone. Press SHIFT and use the 1 and 0 keys to enter the signalling bits. • Tx-1 normally should be the same as the Rx-1. • Drop determines which line will report Measurement Results. Ch. • Press TALK to talk on the selected transmit channel. L2 (F2) Determine on which line to Insert and Drop the signal. • Upon selecting a timeslot. These bits will be transmitted only if the test set is using MFAS (PCM-30) framing. TxABCD Options: IDLE (F1). • Press QUIET to place a quiet termination on the transmit signal. • Press TONE to insert a tone on the selected transmit channel. TONE (F4) • Press THRU to pass all of the received channels out on the transmit signal. TALK (F2). • Insert determines the line onto which you insert the test signal. QUIET (F3). To change these bits manually: 1. • Pressing IDLE (F1) or SEIZE (F2) will place that signal onto the A/B/C/D position. Press ENTER to send the ABCD bits. but you do have the option to set them for different channels. IN/DROP (E1DUAL) Options: L1 (F1). If you select TONE. 2.Tx-T/S (E1SINGL) or Tx-1 (E1DUAL) Options: 1-31 Choose the transmit timeslot. TxMode Options: THRU (F1). SEIZE (F2). • Press NEXT (F1) or PREVIUS (F2) as needed. use the next two settings to set the tone frequency and level. • • Use NEXT (F1) or PREVIUS (F2) as needed To receive on Line 2. manually set Change the signalling bits transmitted with the associated transmit channel.

You may select any value from -60 to +3 dBm. L1+L2 (F3) Select the line you want to hear on the speaker. This measurement is updated every second. RxABCD View the received Channel Associated Signalling System (CAS) bits. choose the tone frequency by pressing the SHIFT key and entering the value from the keypad. RxFREQ View the received frequency of the selected channel in hz. This measurement is updated every second. they are for viewing only. and may be neither edited nor changed. L2 (F2). Speaker (E1DUAL) Options: L1 (F1). As the equals sign indicates. Press MINUS (F1) to achieve negative values. Note: These bits are meaningful only if the PCM-30 LED is green. Press L2 to listen on Line 2. choose the transmit tone level by pressing the SHIFT key and entering the value from the keypad. Press L1+L2 to listen on both lines. Ignore these bits if this LED is not green. • • • Press L1 to listen on Line 1. S/N (dB) Observe the Signal to Noise measurement. in decibels. TxLVL Options: -60 to 3 dBm If TONE is selected for TxMode. 3K (dBm) Observe the Noise 3-K Flat measurement. Rx(dBm) View the received level in dBm.TxFREQ Options: 50 Hz-3950 Hz If TONE is selected for TxMode. Measurement Results The last five items pertain to received data. in dBm. 94 SunSet E20/c .

in dBm. PSOP (dBm) Observe the Noise Psophometric measurement in dBm. 1010 (dBm) Observe the Noise 1010 Hz measurement. RxDATA View the live 8-bit channel data as it is received from the selected line.OFFSET Observe the coder Offset. Ch. This measurement is updated every second. PEAK Observe the coder peak from +127 to -127. This measurement is updated every second. 3 Menus 95 . using A-law.

Here are the definitions: IDLE= IDLE SEIZ= SEIZE ACKW= SEIZE ACKNOWLEDGMENT ANSW= ANSWER CLRB= CLEAR BACK CLFR= CLEAR FORWARD BLCK= BLOCK ????= UNKNOWN. as specified in the SUPERVISION SETUP screen. The PCM-30 LED must be green in order for the signalling bits to be displayed. Information will be displayed when a match of state for forward/backward conditions are met. only constant states which are detected when the screen is refreshed will be displayed. etc. Timeslots 1-5 are shown on the first line. Therefore. SunSet E20/c • 96 . Press ABCD (F1) to display the ABCD information.6. See Figure 62 for a sample screen.3. You must select PCM-30 framing in the TEST CONFIGURATION screen.2 View Line CAS • • • • View the signalling bits for all of the 30 channels for either Line 1 (E1SINGL) or Lines 1 and 2 (E1DUAL). 6-10 are shown in the second line. 07:31:55 T/S ABCD L 01 0000 I 06 1101 N 11 1101 E 17 1101 1 22 1101 27 1101 T/S ABCD L 01 0000 I 06 1101 N 11 1101 E 17 1101 2 22 1101 27 1101 STATUS ABCD 1101 1101 1101 1101 1101 1101 ABCD 1101 1101 1101 1101 1101 1101 ABCD 1101 1101 1101 1101 1101 1101 ABCD 1101 1101 1101 1101 1101 1101 ABCD 1101 1101 1101 1101 1101 1101 ABCD 1101 1101 1101 1101 1101 1101 ABCD 1101 1101 1101 1101 1101 1101 ABCD 1101 1101 1101 1101 1101 1101 Figure 62 View Line 1 & 2 CAS Press STATUS (F1) to see a decode of each ABCD state. no state or no match detected • Note that some states will change too quickly for the test set to display and detect.

• Refer to Section 6.50 SETUP press ENTER to start NEXT PREVIUS AUTO Figure 63 Call Analysis In Call Analysis. the test set monitors the digits and states sent between two pieces of equipment. • • • • Use MFR1SS5 to analyze SS5 signalling. PULSE (F4) Select the type of signal you will be analyzing.3 Call Analysis 10:16:30 CALL ANALYSIS TYPE : DTMF Rx-1 T/S : 31 Rx-2 T/S : 31 X. DTMF (F3). Notes: • Supervision setup must be precisely setup for Call Analysis to work properly. Use MFR2 to analyze MFR2 and MFR2 compelled signalling.3. 3 Menus 97 . • The test set must see a Seize and a Seize Acknowledgment before it will capture digits. Ch. • New memory storage cards will be reformatted upon entering this feature. MFR2 (F2). Use DTMF to analyze DTMF signalling.6. using PCM-30 or PCM-31 framing.8 for more information on this technology. Configure the following: TYPE Options: MFR1SS5 (F1). Use PULSE to analyze Pulse signalling. To use this feature the test set must be configured for E1DUAL mode.2.

or AUTO (F3)-MFR2. Select STATE (F2) to have the test set begin capturing information after it sees the selected state. When the test set sees the set ABCD bits. If you select AUTO. You will also be presented with two additional choices. If AUTO is selected. Rx-2 T/S Options: 1-31. 2. DTMF or PULSE only Select the Line 1 timeslot to receive the signal on. Use the SHIFT and number keys to enter the bits you want the test set to match. 12:38:40 CALL ANALYSIS TYPE Rx-1 T/S Rx-2 T/S TRIGGER SUPERVISION : : : : : DTMF AUTO OFF STATE SEIZE • press ENTER to start IDLE SEIZE ACKW MORE Figure 64 Call Analysis. with Trigger 98 SunSet E20/c . 1. • • Use NEXT (F1) and PREVIUS (F2) to select the timeslot. DTMF or PULSE only Select the Line 2 timeslot to receive the signal on. or AUTO (F3)-MFR2. it will report them on the CALL ANALYSIS screen. TRIGGER (available if RX T/S set to AUTO) Options: CAS (F1).Rx-1 T/S Options: 1-31. TRIGGER and SUPERVISION/ABCD. An ABCD line will appear in place of SUPERVISION. You will also be presented with two additional choices. the test set will scan for the Line 2 receive timeslot. TRIGGER and SUPERVISION/ABCD. STATE (F2) • Select CAS (F1) to have the test set start capturing after it detects specific CAS bits. the test set scans all channels for the TRIGGER event (line 4). • • Use NEXT (F1) and PREVIUS (F2) to select the timeslot.

315 1 Digit 1 0000. ANSW (more.200 2 Digit 2 0000. RELATIV (F3): Shows timestamps in Relative mode.200 1 Digit 1 0000. ANSW looks for an answer signal. CLR-FW looks for a Clear-Forward signal. ACKW looks for a backward seize acknowledgment. (F2). 3 Menus 99 . ABSOLUT (F2): Shows timestamps in Absolute mode.027 1001 1001 Idle 0003.426 1101 SeizeAck 0004. Observe the real-time analysis. press again to restart.200 4 Digit 4 0000. SEIZE (F2). F1) Determine what signal trigger state must be met for the unit to start capturing.660 0001 Seize 0011. ACKW (F3). BLOCK (more. the time relative to the last change.200 6 Digit 6 0000. press ENTER. (F2).200 2 Digit 2 STOP ABSOLUT RELATIV Figure 65 DTMF Call Analysis Sample Ch. SEIZE looks for a seizure. When you have determined the settings. BLOCK looks for a Block signal. CLR-FW (more. Figure 65 shows a DTMF analysis screen.200 5 Digit 5 0000. The following F-keys are available: STOP/RESTART (F1): Press to stop the analysis. 03:31:27 CALL ANALYSIS Rx-1 Rx-2 DTMF Time/s TS1 TS1 Label 0000. CLR-BK (more. • • • • • • • IDLE looks for an idle signal.SUPERVISION (STATE only) Options: IDLE (F1). CLR-BK looks for a Clear-Back signal. the absolute time since start. (F2).

200 4 Digit 4 0000. The Label decode will be supplied automatically. (F2): Shows timestamps in Relative mode. the time relative to the last change.200 6 Digit 6 0000. F2): Shows timestamps in Absolute mode.200 1 Digit 1 0000. and Line 2 Rx is in the backward direction.056 0001 Seize 0004. see DIGIT ANALYSIS. PULSE will be displayed before a detected pulse digit sequence of IDLE/SEIZE.200 2 Digit 2 STOP ABSOLUT RELATIV Figure 66 MFR2 Call Analysis Screen The following F-keys are available on a stopped screen: PAGE-UP (F1): Page up one page. Line 1 Rx is in the Forward direction. and the choices will appear. RESTART (more.200 2 Digit 2 0000.Figure 66 shows a MFR2 CALL ANALYSIS screen. ANALYZE (F3): Analyzes the digits. 03:31:27 CALL ANALYSIS Rx-1 Rx-2 MFR2 Time/s TS2 TS2 Label 0000. the absolute time since start. • When MFR2 is selected.345 1 Digit 1 0000. ABSOLUT (more. MFR2 tones will be detected. PAGE-DN (F2): Page down one page.326 1101 SeizeAck 0004. the SS5 tones will be detected. RELATIV (more. Notes: • When SS5 is selected (MFR1SS5). F1): Restarts CALL ANALYSIS. Toggle between the ABSOLUT and RELATIV modes to see the timestamp for each.023 1001 1001 Idle 0003.200 5 Digit 5 0000. 100 SunSet E20/c . • To differentiate between CAS line signalling and PULSE digits in the PULSE CALL ANALYSIS.

press STOP (F1) in the CALL ANALYSIS screen. The digit analysis screen is presented.0/-4.6 DIG# 3 : 3 INTD: 101 ms H/L Hz 770 /1482 PERD: 096 ms dBm -7. dBm: The dBm level of each tone. Ch. TWIST: Twist–the difference in power between the two frequencies.1 Digit Analysis To access the Digit Analysis function. then press ANALYZE (F3).1 PAGE-UP PAGE-DN LINE-2 RETURN Figure 67 DTMF Digit Analysis Screen The following items are displayed in this screen: H/L Hz: The high and low frequencies of the digit.3. • • Digit Analysis will record the last 32 digits for analysis when CALL ANALYSIS is stopped.1 INTD: 101 ms PERD: 102 ms TWST: 1. If a TRIGGER is set (in CALL ANALYSIS). 3 Menus 101 .6.3 DIG# 2 : 2 H/L Hz 699 /1366 dBm -6. 03:31:27 CALL ANALYSIS Line 1# 1 DIG# 1 : 1 INTD: 105 ms H/L Hz 697 /0700 PERD: 102 ms dBm -7. as in Figures 67 and 68. in hz.1/-4.8 TWST: 2. INTD: Interdigit period–the time between digits.9 TWST: 2.7/-5. then up to 32 digits from the stopping point back to the trigger points will be stored and analyzed.3. PERD: Period–the dial period.

RETURN (F4): Press to return to the CALL ANALYSIS screen. 102 SunSet E20/c . DIGIT PPS PPRD %BRK 1 3 8 120 58 2 6 8 120 58 3 3 8 120 58 4 8 8 120 57 5 0 8 120 58 6 0 8 119 57 INDT --510 510 510 512 510 PAGE-UP PAGE-DN LINE-2 RETURN Figure 68 Pulse Digit Analysis The Pulse Digit Analysis screen (Figure 68) definitions also include: PPS: Pulses per second PPRD: Pulse Period This screen also has additional F-keys: LINE-1/2 (F3): Press to toggle between the lines.03:31:27 CALL ANALYSIS Line 1# 1 No.

MFR2 CALL 9.140 SS#5 RECEIVE 4. Notes: • To run the user call emulator. Ch. If you escape from the menu to the CALL EMULATOR menu.441 timer value will be provided for PERD (periodic timer).3. press START in the USER CALL EMULATOR menu. Refer to Figure 70. You need to enter a value according to the Q. See the next section. Note that for DTMF RECEIVE. PULSE RECEIVE 10. Q.140 SS#5 CALL 5. 11:46:23 CALL EMULATOR 1. Q.6. Select one of the 10 predefined sequences.PULSE CALL USER VIEW START Figure 69 Call Emulator List The following F-keys are available: USER (F1): Press to enter the USER CALL EMULATOR screen where you may create. you will emulate the RECEIVE side only. Q. then press the START key. MFR2 RECEIVE 8. 3 Menus 103 .441 spec instead of the one you defined. • When you edit your own sequence. you will be running the Q. edit. DTMF RECEIVE 6. VIEW (F2): Press to enter a screen which shows a sample sequence of the selected emulation.441 MFCR2 RECEIVE 2.1 Standard Emulations In this screen select a standard emulation to use. 3. or use a User emulation sequence. no default Q. Q. or input a user defined sequence.4.441 spec or any other desired value to make the sequence work.441 MFCR2 CALL 3.6. Figure 70 shows sample DTMF sequence screen.4 Call Emulator This menu allows placing and receiving calls. DTMF CALL 7. START (F4): Press to start the highlighted emulation.

12:16:44 DTMF TRACER SEND RECEIVE ABCD=1011/IDLE ABCD=1011/IDLE ABCD=0011/SEIZ-> <-ABCD=1111/ACK DTMF= 03 -> DTMF= 06 -> DTMF= 03 -> Figure 70 DTMF Receive Sequence 104 SunSet E20/c .

Press the CALL (F4) key when you are ready to place the call. 17-31. etc. CHANNEL: Choose the timeslot to place the call on. i.441 (or user defined by the Signal Meanings) Forward Group II. 4. Here is a sample figure: Ch.3.441 MFCR2 CALL CHANNEL: 02 CALL NUMBER 4083638000 CALLING NUMBER CALLING PARTY’S CATEGORY: A=10/0 B=11 C=12 D=13 E=14 F=15 CALL Figure 71 Call Emulation/MFCR2 Call Screen Use this procedure to setup the call: 1. • Use the SHIFT and number keys to enter the digits. 5.6. Here is a sample screen: 11:46:23 Q.4. CALLING PARTY’S CATEGORY: The Calling Party Category deals with the category of the calling party as defined by Q. 3 Menus 105 . The A-F keys. the user can be a subscriber without priority II-1.e. subscriber with priority II-2. corresponding to the digits. are also available. 2. For some emulation sequences the following items will also be available to configure: 3. CALL NUMBER: Use the SHIFT and number keys to enter the digits for the number you want to call. Select from 1-15. you will enter a screen where you setup and place a call. You will enter the appropriate CALL screen. Use the SHIFT and number keys to enter the digits.2 Place a Call For CALL emulation. use the NEXT (F1) and PREVIUS (F2) keys to select the channel. CALLING NUMBER: This is the number you are dialing from.

ABSOLUT (F2): Displays Time stamp in absolute mode. Send: The CAS or Register signalling sent Recv: The CAS or Register signalling received.729 F5 0016. This is especially useful for verifying credit card functionality. or audio response systems.065 1001 1001 0000.11:46:23 PULSE CALL Tx#1 Rx#1 Time/s Send Recv 0000.468 B1 0016. DTMF tones will then be sent when you press the 0-9 digits.668 B1 0016.093 0001 0011.917 F5 0016. enable keypad DTMF dialing by pressing the SHIFT key. The F-keys are available: STOP/RESTART (F1): Stops and restarts the CALL or RECEIVE. Label: The meaning of the sent or received CAS or Register signalling. Keypad Functionality When a MFCR2 or MFR2 call has been established. as defined by Supervision Setup or Signal Meanings.868 B1 STOP ABSOLUT Label Idle Seize Seize AC I-5 A-1 I-5 A-1 I-5 A-1 HANG-UP RELATIV Figure 72 Call Emulation/Sample Call Here is the information on this screen: Time/s: Time Stamp. 106 SunSet E20/c . the time the digits were sent and received.862 1101 0011. HANG-UP (F4): Releases the call in progress. RELATIVE (F3): Displays Time stamp relative to previous event.530 F5 0016.

3. Select YES to request the CALLER ID be sent to the test set. the CALLER ID will show up in the messages. DIGITS EXPECTED: 7 REQUEST CALLER ID: NO REQUEST CATEGORY: YES NO YES RECEIVE Figure 73 Receive Setup Configure the following: CHANNEL • Use the NEXT (F1) and PREVIUS (F2) keys to select from 115. 3 Menus 107 . Here is a sample screen: 11:46:23 Q. 17-31 for the receive channel. Used between central offices for tracking and billing purposes.441 MFCR2 RECEIVE CHANNEL :01 No. Ch. YES (F2) • • Select NO to not request the CALLER ID be sent to the test set. NO (F1). DIGITS EXPECTED • Use the SHIFT and number keys to enter the number of digits you expect the test set to see and capture.6. No.4. Some receive emulations will include the following items to configure: REQUEST CALLER ID Options. The range is from 1-20 digits. When received. a screen where you set up to receive a call is displayed.3 Receive a Call For RECEIVE emulation.

750 1101 Seize Ac STOP ABSOLUT RELATIV HANG-UP Figure 74 Receive Screen Sample The information presented and F-keys available are the same as that for the CALL screen in Section 3.2. Select YES to request the REQUEST CATEGORY be sent to the test set. The test set will display the RECEIVE screens.747 0001 Seize 0007.4. • Press RECEIVE (F4) when you are ready to receive a call. Here is a sample screen: 11:46:23 Q.441 MFCR2 RECEIVE Tx#1 Rx#1 Time/s Send Recv Label 0000. When received.REQUEST CATEGORY Options. or 6.6.597 1001 Idle 0007. where you can see the call trace. 108 SunSet E20/c . YES (F2) • Select NO to not request the REQUEST CATEGORY (such as 2.064 1001 0001 ???? 0007. Subscriber with Priority. the Category will show up in the receive messages. Data Transmission) be sent to the test set. NO (F1).

The cursor will be on the first line. This screen features a list of any stored user emulations and allows creating a new sequence. 5. 2. DTMF1 DTMF2 DP0000 TESTA EDIT DELETE RENAME START Figure 75 User Call Emulator Screen The User Call Emulator Screen has the following F-keys: EDIT (F1): Press to edit your sequence. where you give your call sequence a label (name). DELETE (F2): Press to delete the highlighted sequence. 2.6. Press EDIT (F1) and the Edit Emulator screen is displayed. 00:41:42 USER CALL EMULATOR 1.4. Use the Label procedure further in this section. where you may rename the selected sequence. 3. edit.4 User Emulation Select this screen to create. 4. 8. press USER (F1) and the USER CALL EMULATOR screen is displayed. 6. In the CALL EMULATION screen. 7. LABEL. START (F4): Press to start the selected emulator sequence. Press EDIT (F1) again to display the CALL EMULATOR PROFILES screen. 3 Menus 109 . or use a user emulation sequence. Ch. RENAME (F3): Press to bring up the CALL EMULATOR PROFILES screen. Follow this procedure: 1. 10. 3. 9.3.

press ENTER to return to the EDIT EMULATOR screen (Figure 77). • You may also use the SHIFT key and the alphanumeric digits available on the keypad for entering the label. When finished.TYPE CODE PERD TYPE CODE TOUT 1 CAS 1001 > <CAS 1001 2 CAS 0001 > <CAS 1101 3 MR-F 2 > <MF-B 1 NONE CAS DTMF MORE Figure 77 Edit Emulator 110 SunSet E20/c . 00:52:08 LABEL: MFC CHANNEL 01 SEND RECEIVE No. Continue steps A and B until you have completed the label. If you make a mistake while entering the letters. Use the keypad arrow keys to move the flashing cursor to the desired character and press SELECT (F4). D. then press DELETE (F2). press TOGGLE (F3) to escape from the character screen. F.17:03:38 CALL EMULATOR PROFILES LABEL : M A H O V B I P W C J Q X D K R Y E L S Z F M T - G N U / INSERT DELETE TOGGLE SELECT Figure 76 Call Emulator Profiles Follow this procedure to give the sequence a label: A. Press TOGGLE (F3) to display the character screen. highlight the character with your cursor. C. When the label is complete. B.

4. F1). F3) Determines the type of signalling used. Three items are available for sending: TYPE Options: NONE (F1). SEND Side The Send side refers to the Line or Register signalling which will be sent by the test set on whichever line has been selected as Tx/INSERT in TEST CONFIGURATION. 17-31 range. TOUT Options: NONE (F1). MF-B (more. 3 Menus 111 . four digits maximum for CAS. Note that TYPE and CODE work in the same manner as in the send side. MF-F (more. Ch. 20 digits maximum for all other types. before progressing to the next step. • • • • • • NONE: No signalling CAS: Channel Associated Signalling DTMF: Dual Tone Multi-Frequency MF-F: Multi-frequency-forward MF-B: Multi-frequency-backward DP: Dial Pulse CODE Options: any keypad alphanumeric digits. DP (more. These are the actual bits to be transmitted by the test set. F2). CAS (F2). • Press NEXT (F1) and PREVIUS (F2) to select the timeslot to use (both Rx and Tx) during emulation. • Press the SHIFT key and enter the desired signalling bits PERD Options: up to 999 ms PERD determines the elapsed time before proceeding to the next step in the emulation. Three items are available for the receive side. This determines the length of time which the test set will wait for its received digits/CAS before aborting the signalling sequence. DTMF (F3). up to 999 ms TOUT refers to Time Out. Use the keypad arrow keys to select CHANNEL. in the 1-15. RECEIVE Side The receive side refers to the Line or Register signalling which you require to be received by the test set.

and their label. Press SHIFT and enter the desired number digits up to 999 (ms).066 0000.796 0013. Press ENTER to exit the editor screen and save the settings.796 STOP DTMFA Tx#1 Rx#1 Send Recv 1001 1001 0001 1101 5 5 5 1 2 Label Recv Ok Recv Ok ABSOLUT RELATIV Figure 78 Start User Emulation The Start User Emulation screen contains the following F-keys: STOP/RESTART (F1): Stops and restarts the CALL or RECEIVE.796 0010. select the sequence you want to use in the USER CALL EMULATOR Screen and press START (F4). B.063 0000. The screen shown in Figure 78 is displayed.069 0004. Observe the time digits are sent or received. 5. 112 SunSet E20/c . Press SHIFT when done.To select a time limit: A.766 0016. 6. ABSOLUT/RELATIV (F2): Presents time stamps in absolute or relative mode (view at Time/s line).790 0004.795 0007. 16:08:17 Time/s 0000. To begin an emulation sequence.

• These four supervision bits will be placed on the CAS bits for the timeslot being transmitted when IDLE (F1) is selected in the CALL ANALYSIS screen.422 SUPERVISION DIR ABCD(F) ABCD(B) IDLE F/B 1001 1001 SEIZE F 0001 1001 SEIZE ACK B 0001 1101 ANSWER B 0001 0101 CLEAR BACK B 0001 1101 CLEAR FORW1 F 1001 0101 CLEAR FORW2 F 1001 1101 BLOCK F/B 1001 1101 press ENTER to save Q. 09:52:31 SUPERVISION SETUP NAME : Q. USER1 (F2).422 standard signal definitions. and the test set will use the ITU Q. 3. You may view them on the screen. • Select a USER option. • Select Q. CLEAR BACKWARD and CLEAR FORWARD VF Supervision bits manually. When the entries are complete.6. 2. Ch. ACKNOWLEDGMENT. These definitions are used in the CALL ANALYSIS screen. The supervision definitions: DIR: Direction.422 USER1 USER2 USER3 Figure 79 Supervision Setup Screen Name Options: Q. The incoming end (backward) replies with af=1. • Press ENTER to invoke the settings. Use the keypad arrow keys to move between line items. 3 Menus 113 .422 (F1). and enter the supervision bits manually. or use the ITU Q. SEIZE.5 Supervision Setup In this screen define the IDLE. bf=0.422 standard. if idle.422 or User-defined signalling.422. USER2 (F3).3. Use the SHIFT and number keys to make each entry. 1. Forward or Backward ABCD (F): Forward ABCD signalling bits ABCD (B): Backward ABCD signalling bits IDLE F/B: Idle Forward or Backward bits: • In the idle state the outgoing end (forward) sends af=1. The settings will be saved as well as invoked. press ENTER. USER3 (F4) Select standard ITU Q. bf=0.

Note that there are two conditions. ANSWER B: The answered state must be established on the preceding link immediately after it is recognized. SEIZE ACK B: Backward acknowledgment of a seizure signal.SEIZE F: Forward seizure signal transmitted at the beginning of a call to initiate circuit operation. CLEAR FORW1F/CLEAR FORW2F: Clear Forward sends a cleared condition from the calling subscriber’s line. 114 SunSet E20/c . or it is the release from the calling switching equipment. CLEAR BACK B: Clear Back is an idle condition from the called subscriber’s line telling the incoming switch to release the call. BLOCK F/B: Block an idle circuit from outgoing and incoming calls.

• Press SHIFT and enter the desired value from the keypad. 3 Menus 115 .3. The default value is 100 ms. • Press SHIFT and enter the desired value from the keypad. The default value is 100 ms. • Press SHIFT and enter the desired value from the keypad. TONE LEVEL dbm Options: -20 to -5 dbm Select the tone level.6. DTMF and MF dialing. INTERDIGIT PRD Options: 1 ms to 999 ms Select the interdigit period for pulse dialing. Refer to Figure 80. then use the SHIFT and numeric keys to enter the value. SILENT PERIOD Options: 1 ms to 999 ms Specify the silent period in milliseconds used for MFR2. Ch. • Press MINUS (F1) to attain a negative value. MEAS 15:59:59 DIAL PARAMETERS DIAL PERIOD : SILENT PERIOD : INTERDIGIT PRD: TONE LEVEL : B-BIT : PULSE (10pps): % BREAK : 150 ms 200 ms 500 ms -5 dBm NO 60 Figure 80 Dial Parameters DIAL PERIOD Options: 1 ms to 999 ms Specify the dial period in milliseconds used for DTMF and MF dialing.6 Dial Parameters Use the DIAL PARAMETERS screen to setup the parameters used for VF dialing.

When B-bit dialing is enabled and a call is placed. 60% (F3) Select the desired BREAK percentage. • Percent break is the ratio of the break (IDLE) interval to the total pulse cycle interval. the test set remains in the seizure condition. When the dialing is complete. • Before calling. 116 SunSet E20/c . the B supervision bit of the selected timeslot toggles between 0 and 1. When dialing.B-BIT Options: YES (F1). NO (F2) B-Bit dialing applies to pulse calls. It is used in Pulse dialing. the test set will pulse the B-bit according to the timing selected in %BREAK and INTERDIGIT period. % BREAK Options: 40% (F1). change the transmit CAS bits to the seizure condition. 50% (F2). PULSE (10pps) Dial pulse is permanently set to 10 pps and cannot be changed.

II.441 Q. from Digit 1-Digit 9. on the Group II Forward screen. F3. As different countries may have slight differences in their definitions and/or use of digits. F4) labels.441 Q. Ch. where you can make selections.441 USER1 USER2 USER3 Figure 81 Signal Meanings Screen The following tables and screens present the screens and their corresponding Label tables.441 (F1) standard signal definitions for Groups I. Upon press a USER F-key a setup screen is displayed. this feature allows you to define your own digits.441 Q. 3 Menus 117 . SubWOP corresponds to the Group II Forward labels item Subscriber without Priority.6. A and B or set your own under one of the three USER (F2.441 Q.3. 11:35:11 Meas MEAS CONFIGURATION Group Group Group Group I Forward : II Forward: A Backward: B Backward: Q.7 Signal Meanings Use the ITU-T Q. or to the appropriate label definitions. and Code 10-Code 15. To set a signal. choose the F-key corresponding to your choice. for example.

MEAS GROUP I FORWARD I-1: I-2: I-3: I-4: I-5: I-6: I-7: I-8: I-9: Digit1 Digit1 Digit2 Digit3 Digit4 Digit5 Digit6 Digit7 Digit8 Digit9 Digit2 I-10: I-11: I-12: I-13: I-14: I-15: 11:50:33 Digit10 Code11 Code12 Code13 Code14 Code15 Digit3 MORE Figure 82 Group 1 Forward Signals I-1 I-2 I-3 I-4 I-5 I-6 I-7 I-8 Digit 1 Digit 2 Digit 3 Digit 4 Digit 5 Digit 6 Digit 7 Digit 8 I-9 I-10 I-11 I-12 I-13 I-14 I-15 Digit 9 Digit 0 Code 11 Code 12 Code 13 Code 14 Code 15 Table 4 Group 1 Forward Labels 118 SunSet E20/c .

MEAS GROUP II FORWARD II-1: II-2: II-3: II-4: II-5: II-6: II-7: II-8: II-9: SubWOP SubWOP SubWP Mainteq Spare Operatr DataTrx Subwoft DataTrx Subwp SubWP II-10: II-11: II-12: II-13: II-14: II-15: 11:56:06 Opwftf Spare Spare Spare Spare Spare Mainteq MORE Figure 83 Group II Forward Screen Signal II-1 II-2 II-3 II-4 II-5 II-6 II-7 II-8 II-9 II-10 II-11 II-12 II-13 II-14 II-15 Label Sub w/o p Sub w pri Maint Eqp Spare Operator Data Tran Sub woft Data Tran Sub w pri Opr wftf Spare Spare Spare Spare Spare Meaning Subscriber without priority Subscriber with priority Maintenance equipment Spare Operator Data Transmission Subscriber (or operator without forward transfer facility) Data Transmission Subscriber with priority Operator with forward transfer facility Spare Spare Spare Spare Spare Table 5 Group II Forward Labels Ch. 3 Menus 119 .

set-up speech conditions Send last but two digits (n-2) Send last but three digits (n-3) Spare Spare Send country code indicator Send language or discriminating digit Send nature of circuit Request for information on use of an echo suppressor Congestion in an international exchange or at its output Table 6 Group A Backward Signal Labels 120 SunSet E20/c . info Cong Int Meaning Send next digit (n+1) Send last but one digit (n-1) Address-complete. changeover to reception of Group B signals Congestion in the national network Send calling party’s category Address-complete. charge.MEAS 12:01:09 A-10: A-11: A-12: A-13: A-14: A-15: Spare SENDcci SENDlan SENDnoc REQinfo CONGint GROUP A BACKWARD A-1: A-2: A-3: A-4: A-5: A-6: A-7: A-8: A-9: SENDn+1 SENDn-1 AdrcmpB CONGnat SENDcpc Adrcmp SENDn-2 SENDn-3 Spare SENDn+1 SENDn-1 AdrcmpB MORE Figure 84 Group A Backward Signals Screen Signal A-1 A-2 A-3 A-4 A-5 A-6 A-7 A-8 A-9 A-10 A-11 A-12 A-13 A-14 A-15 Label Send (n+1) Send (n-1) Adr cmp B Cong Nat Send CPG Adr cmp S Send (n-2) Send (n-3) Spare Spare Send CCI Send LoDD Send NOC Req.

3 Menus 121 .MEAS 12:06:07 GROUP B BACKWARD B-1: B-2: B-3: B-4: B-5: B-6: B-7: B-8: B-9: Spare Spare SendSIT SubLB CONgest Unaloc# SubLFC SubLNFC SubLOO Spare SendSIT B-10: B-11: B-12: B-13: B-14: B-15: Spare Spare Spare Spare Spare Spare SubLB MORE Figure 85 Group B Backwards Signals Screen Signal B-1 B-2 B-3 B-4 B-5 B-6 B-7 B-8 B-9 B-10 B-11 B-12 B-13 B-14 B-15 Label Spare Send SIT Sub LB Congestion Unalloc# Sub LFC Sub LFNC Sub LOOO Spare Spare Spare Spare Spare Spare Spare Meaning Spare Send special information tone Subscriber line busy Congestion Unallocated number Subscriber line free. charge Subscriber line free. no charge Subscriber line out of order Spare Spare Spare Spare Spare Spare Spare Table 7 Group B Backward Labels Ch.

the first record is saved the test set’s internal NV RAM memory. indicated by the ‘E20’ marker. print. described in the Edit a Trace Record is displayed. The LABEL screen. View Test Records has the following F-keys. Records are stored via a F-key in most VF screens. or delete previously stored records.8 View/Print Trace Results • • • • Access stored records. CLR (MORE. 122 SunSet E20/c . CLR-ALL (MORE. You must have a memory card in order to have saved traces (as indicated by ‘CARD’ beneath the record number). EDIT (F1): Press to give the selected record a new name.6. Current results are stored in the 001 position. 13:30:20 VIEW TEST RECORD: VF REC NAME TYPE STATUS 001 E20 AAA START STOP VF UNLOCKED 2002-04-24 11:40:20 2002-04-24 11:42:10 002 VFRES01 VF UNLOCKED CARD START 2002-04-01 12:26:56 STOP 2002-04-01 12:27:11 EDIT PAGE-UP PAGE-DN MORE Figure 86 View Test Records As shown in Figure 86. View. VIEW (MORE. F2): Press to lock the selected record. indicated by the ‘CARD’ marker. The rest of the records are stored in the memory card. F3): Press to unlock the selected record. F3): Press to delete all records. UNLOCK (MORE. LOCK (MORE.3. F2): Press to delete the selected record. F1): Press to view the selected record. PAGE-UP (F2). PAGE-DN (F3): Use to scroll through available screens.

Press PRINT (F1) Ch.522 1101 SeizeAck 0009. SAVE (F4): Use to save a trace from the number 1 (stored in NV ram) position to a position on the SRAM memory card. F1). 3 Menus 123 .972 1001 ClrForwd 0009. Follow step 1 of Viewing a Trace 2. Printing a Trace 1.441 MFCR2 RECEIVE Tx#1 Rx#2 Time/s Send Recv Label 0000.512 0001 Seize 0000.822 1001 HangUp PRINT PAGE-UP PAGE-DN SAVE Figure 87 View a Trace In this screen the following F-keys are available: PRINT (F1): Press to send the record to the serial port. Select the desired record from VIEW TEST RECORDS and press VIEW (MORE.Viewing a Trace 1. 03:31:27 Q.982 1001 Idle 0013.812 1101 ClrBack 0013. PAGE-UP (F2)/PAGE-DN (F3): Use to scroll through available screens.108 1001 1001 Idle 0000.

When done. The ‘A’ in the character grid will be highlighted. Note: If no space is available to save the message. 3. 124 SunSet E20/c . press SELECT (F4) to enter the character into the LABEL line. Repeat until the label is complete. and SELECT (F4) will appear. 2. Press TOGGLE (F3). You must then delete a stored trace in order to save a new one. Use the keypad arrow keys to select a character. The label will appear in the VIEW TEST RECORD VF list. you will see a “Delete a Trace to Save”’ message.Edit a Trace Record 17:03:38 VIEW TEST RECORD RECORD: 1 LABEL : VF-01 A H O V INSERT B I P W C J Q X D K R Y E L S Z F M T - G N U / SELECT DELETE TOGGLE Figure 88 Toggle Screen Here you can give a label to the trace you want to save. Use this procedure: 1. press TOGGLE (F3) to exit the character grid and then press ENTER. The selected traces will be saved under the label you have entered.

MEAS OTHER FEATURES ERROR INJECTION ALARM GENERATION VIEW RESULTS RECORD SEND FRAME WORDS 08:22:56 Figure 89 Other Features Menu Ch.3. 3 Menus 125 .7 Other Features Refer to Figure 89 for the OTHER FEATURES Menu.

• • RATE mode applies only to CODE and BIT errors. MODE Options: BURST (F1). If you have test set with a color display. CRC-4 (MORE. If the error injection is set to RATE mode. MEAS ERROR INJECTION TYPE MODE COUNT 11:41:45 : BIT+COD : BURST : 1 CODE BIT BIT+COD MORE Figure 90 Error Injection Screen To start error injection. which injects a set number of errors. F3) This item specifies the type of errors to be inserted. The test set will insert errors as you specify. 126 SunSet E20/c . Other types of errors may be inserted one at a time under BURST mode. F2). press the ERR INJ key. Errors are injected at a constant rate. RATE (F2) This item specifies the mode of error injection. FRAME (MORE. select ERROR INJECTION from the Alarm/Error screen to access this feature. BIT + CODE (F3).1 Error Injection Figure 90 shows the ERROR INJECTION screen. F2). BIT (F2). E-BIT (MORE.7.3. TYPE Options: CODE (F1). an ‘ERR-INJ’ indicator will be displayed on the screen.

The cursor moves to the exponent position. the errors will be inserted at a continuous rate as specified in this entry. Press 6 on the keypad. Press BIT (F2) to select the error type. press SHIFT. All other errors will be injected singly. • • Programming a Burst of 10 Errors 1. Press CODE (F1) to select the error type. 8. and will cause from 1 to 3 errored seconds. 4. The cursor automatically moves to COUNT. The errors will be inserted in approximately 1 second or less. press ERR INJ once. Press SHIFT to display the ‘SHIFT’ indicator. Programming a 10-6 Bit Error Rate 1. The multiplier position shows 1. The cursor automatically moves to MODE. Press ENTER. 3. 4. COUNT should show 10. 7. Press the SHIFT key to turn off the ‘SHIFT’ indicator. 2. • To turn off the error rate injection. 2. 5. choose the error RATE number and exponent • For BURST. then verify that the ‘ERR INJ’ indicator has turned off. For RATE MODE. Select ERROR INJECTION. The cursor automatically moves to MODE. then use the keypad to enter any number between 1 and 9999. Ch. and a ‘ERR-INJ’ display will appear at the top of the screen. 6. 3 Menus 127 . The cursor automatically moves to COUNT. Press SHIFT 5.COUNT Options: 1 to 9999 or 1e-9 to 2e-3 For BURST MODE. 6. you have just programmed the test set to inject 10 CODE errors each time you press the ERR INJ key. Press 1 on the keypad. Select ERROR INJECTION. 3. Press RATE (F2). Applies only to BIT and CODE errors. Press ENTER. 7. For RATE. choose the COUNT of errors to be inserted. Enter 10 using the keypad. Press SHIFT key to remove the ‘SHIFT’ indicator. Press BURST (F1). You have just programmed the test set to inject Bit errors at 1x10-6 rate each time the ERR INJ key is pressed.

These alarms allow you to test the response of various network equipment to alarms. You can continue to transmit alarms while making measurements. To Invoke an Alarm: Select the desired alarm and press ENABLE (F1). be sure to DISABLE (F2) all the alarms first. and thus ensure that the network is performing as expected. etc. 128 SunSet E20/c .3. The test set will transmit the enabled alarm after exiting the ALARM GENERATION screen.2 Alarm Generation For the SunSet E20c. performing talk/listen.7. Figure 91 depicts the ALARM GENERATION screen. 17:31:55 ALARM GENERATION FAS DISTANT MFAS DISTANT AIS T/S-16 AIS : : : : ENABLE ENABLE DISABLE DISABLE ENABLE DISABLE Figure 91 Alarm Generation Screen In this screen you can view a listing of the alarms you may transmit. select ALARM GENERATION from the Alarm/Error screen to access this feature. viewing data. If you do not intend to transmit alarms when you exit this screen. • • • • Some alarms conflict with the transmission of other alarms or selected framing.

generating an AIS alarm will cause the test set to transmit an unframed signal (all ones). • Voice frequency signalling bits can’t be transmitted while sending this alarm. For instance. MultiFrame Alignment Signal. • This alarm overrides the framing choice in the TEST CONFIGURATION menu. • The MFAS distant alarm may be transmitted only with PCM framing. T/S-16 AIS • The test set transmits all ones in timeslot 16 of all frames. even though you have selected MFAS framing. • FAS DISTANT alarm may be transmitted only with PCM-30 or PCM-31 framing. • This alarm should be transmitted only when the test set is configured for FAS framing. AIS • The test set transmits all ones in an unframed signal. • T/S-16 AIS overwrites the MFAS. because the T/S-16 AIS signal overwrites all the channel associated signalling (CAS) information. Ch.Notes on the Alarms: FAS DISTANT • The test set transmits a 1 in every third bit of each timeslot 0 frame that does not contain frame alignment signal. MFAS DISTANT • The test set transmits a 1 in the sixth bit of each time slot 16 in the zero frame. 3 Menus 129 . • A test set or network equipment that receives this alarm will lose PCM-30 framing.

in addition to the current results (record 01.7.3 View Results Records A total of ten Measurement Results with histograms may be stored in this menu. Select the Measurement Result record you want to view. Press VIEW (F1). Records are stored by setting PRINT RESULT to LAST and PRINT EVENT to ENABLE in the SYSTEM PARAMETERS > MEAS CONFIGURATION screen. 2.3. In addition to PAGE-UP (F2) and PAGE-DN (F3). Figure 92 depicts the VIEW TEST RECORD screen. The following screen is displayed: 130 SunSet E20/c . stored in the test set’s memory). MEAS 03:31:27 VIEW TEST RECORD REC NAME 01 NONE E20 START STOP 02 NONE E20 START STOP EDIT TYPE STATUS RECORD UNLOCKED 2002-11-23 11:48:31 2002-11-23 12:10:14 RECORD LOCKED 2002-11-23 17:50:45 2002-11-23 17:55:44 MORE PAGE-UP PAGE-DN Figure 92 View Test Record The Measurement Results numbers are shown in accordance with the events and results that are in memory. Events are errors and alarms. the following Fkeys are available: EDIT (F1): Allows you to label the selected record. 1.

except the current record. Press ESC to return to the VIEW TEST RECORD screen. CLR-ALL (more. so it can not be deleted. DELETE (more. F2): Press to delete all of the records. PRINT (more. F1): Press to view the selected record. The first letter in the character grid will be highlighted. If 10 records are already stored.27:03:10 MEAS VIEW TEST RECORD RECORD: 3 LABEL : TEST-LPBCK A H O V INSERT B I P W C J Q X D K R Y E L S Z F M T G N U / SELECT DELETE TOGGLE Figure 93 Memory Record Label • • • • Press TOGGLE (F3). F3): Press to send the record to the serial port. F1): Press to delete the selected record. and press ENTER. F3): Press to lock the record. Select each letter you want to use with the keypad arrow keys. Use INSERT (F1) and DELETE (F2) if you need to correct an error. F2)/UNLOCK (more. you will need to delete a record before storing a new one. Press ENTER to return to the VIEW RESULTS RECORDS screen. 3 Menus 131 . LOCK (more. Ch. Press UNLOCK to delete the record. The RESULTS screen will be displayed. VIEW (more. Repeat until the label is finished.

7. MEAS 19:27:02 SEND FRAME WORDS CRC: YES E-BIT: 11 FAS WORD C0011011 MFAS WORD 00001011 MFAS ABCD 1101 SET=0 SET=1 NFAS WORD S S S i 1 A a a C 1 0 1 1 C 1 0 1 1 C 1 0 1 1 C 1 0 1 1 C 1 0 1 1 C 1 0 1 1 1 1 0 1 1 1 1 0 1 1 DEFAULT S a 1 1 1 1 1 1 1 1 S a 1 1 1 1 1 1 1 1 S a 1 1 1 1 1 1 1 1 AUTO Figure 94 Send Frame Words • • • • • • You may not change certain items in this screen. The following information is shown on this screen: CRC View the CRC option chosen in the TEST CONFIGURATION screen.3. AUTO is only displayed for E-bit selections. Transmit the desired FAS and MFAS framing information. SET=1 (F2). E-BIT Options: SET=0 (F1). DEFAULT (F3). Use the left/right arrow keys to move the cursor to the desired location. You can only select items that can be changed.4 Send Frame Words • • Manually specify the E and Sa bit states. and the MFAS ABCD. DEFAULT will set the bits to the factory default settings. This line is for viewing only. AUTO (F4) 132 SunSet E20/c . The bits will be sent as soon as the function key is pressed. Reenter the left-hand side of the screen by pressing the left arrow key. • Change the CRC option in the TEST CONFIGURATION screen.

E-bit may be changed only if CRC is activated in the TEST CONFIGURATION screen, and consequently, YES is displayed in the CRC slot in this screen. If E-bit is set to AUTO, the E-bits will be transmitted on the Tx/ INSERT side anytime a CRC error is received on the Tx/ INSERT side Rx (Figure 95).

SIGNAL

PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET

AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM

POWER BATTERY

1

CODE ERR ERROR SIGNAL

L1-Rx L1-Tx

1 CRC Error 1 E-bit Error

2

CODE ERR RxDCE RxDTE ERROR

SunSet E20
12:34:41 PAGE T/S 000 001 002 003 004 005 006 007 VIEW RECEIVED DATA : 01 BINARY HEX ASCII 11011111 DF ( ) 11000100 C4 (#) 01000010 42 B (B) 00011110 1E (x) 01100101 65 e ( ) 00101110 2E . (t) 11010100 D4 (+) 11000101 C5 ( ) PAUSE
F 3

PAGE-UP PAGE-DN
F 1 F 2

PRINT
F 4

SUNRISE TELECOM
I N C O R P O R A T E D

A F1 E

B F2 1

C F3 2 GRAPH

D F4 3 ERR INJ 6 LED 9

PRINT F# AUTO 7 4

*

5 MEAS 8

0 SHIFT ESC ENTER

POWER

E20 TEST CONFIGURATION Tx/INSERT: L1-Tx Rx/DROP: L1-Rx or L2-Rx E-bit: AA

Figure 95 Automatic E-Bit Transmission To Manually Transmit the E-bits: Use the SET=0 (F1) and SET=1 (F2) keys to enter the two bits. • • • 11 is used for no E-bit errors, this is the default setting. 10 or 01 for 500 E-bit errors per second. 00 for 1000 E-bit errors per second.

FAS WORD FAS WORD displays the FAS (Frame Alignment Signal-0011011) Words. This line is for viewing only. MFAS WORD Set bits 5-8 to any combination. • • Bits 5-8 have the pattern xyxx, where x represents spare bits; they should be set to 1 when not used. Y is used for the MFAS remote alarm; it should be set to 1 if MFAS synchronization is lost.

MFAS ABCD These are the default ABCD bits used for channels 1-30 in PCMCh. 3 Menus 133

30 Framing. • • ABCD bits are transmitted in timeslot 16 of frames 2-16 of the MFAS. Avoid using 0000 which will cause false framing for PCM-30.

NFAS WORDS These are the Non Frame Alignment Signal words. See Chapter 6 for the definitions. Press ENTER to send your selections.

134

SunSet E20/c

3.8 System Parameters
Figure 96 shows the SYSTEM PARAMETERS menu.

MEAS

05:28:22

SYSTEM PARAMETERS VERSION/ OPTION SYSTEM PROFILES MEAS CONFIGURATION GENERAL CONFIG ERASE NV RAM SELF TEST FACTORY DEFAULTS

Figure 96 System Parameters Menu

3.8.1 Version/Option Figure 97 shows the software version, type, serial number, and options installed in a test set. Use PAGE-UP (F1) and PAGE-DN (F2) as necessary.
22:09:42 Version 2.00 S/N: 00962 OPTION : AA :SS600 DATACOM module AB :SW600VT RemoteControlVT100 AC :SW600WIN Remote Windows AD :SW601A VF Call Analysis AE :SW601E VF Call Emulation AF :SW602 CBIT Analysis AG :SW603 Frame Relay AH :SW603N Frame Relay NNI AI :SW604 GSM Voice & TRAU AJ :SW605 GSM Abis protocol PAGE-UP PAGE-DN

Figure 97 Version/ Option Screen

Ch. 3 Menus

135

3.8.2 System Profiles You may save up to 10 System Profiles in the test set. These profiles can save time in configuring the test set for an application. The test set can store the current configuration as a system profile. You provide a name for the profile so that it may be conveniently recalled at a later time. Items that are stored in the profile are: TEST CONFIGURATION, TEST PATTERN, ERROR INJECTION, ALARM GENERATION, GENERAL CONFIG (except for date and time), SUPERVISION SETUP, SIGNAL MEANINGS, DIAL PARAMETERS, and MEAS CONFIGURATION. Refer to Figure 98. Note: The SYSTEM PROFILES menu does not operate like the user pattern menus. You may not edit an existing system profile in the SYSTEM PROFILES menu. If you wish to modify an existing profile, use the modification procedure described in this section.
MEAS 03:31:27

SYSTEM PROFILES 0. CURRENT-NONE NONE 1. TEST1 2. 3. 4. 5. 6. 7. 8. 9. 10. DELETE CLR-ALL LOAD PRINT

Figure 98 System Profiles List

Enter a New System Profile 1. From the main menu, select SYSTEM PARAMETERS > SYSTEM PROFILES and select a blank line. 2. Press STORE (F1) and the LABEL screen (Figure 99) is displayed. 3. Type in the LABEL you wish to give the profile. Do this by pressing TOGGLE (F3) to enter the character grid. A. Select the desired letter with the keypad arrow keys and press SELECT (F4). Repeat until the label is completed. B. Press TOGGLE (F3) to exit the character grid. 4. Press ENTER to store the SYSTEM PROFILE. 136 SunSet E20/c

MEAS SYSTEM PROFILES LABEL : SU A H O V B I P W C J Q X D K R Y E L S Z F M T G N U /

12:00:00

INSERT DELETE

TOGGLE

SELECT

Figure 99 System Profiles Label Screen

Invoke a Stored System Profile 1. Select SYSTEM PROFILES and select the desired profile. 2. Press LOAD (F3). Activate the Default Profile This returns the test set to the factory default settings. 1. Select SYSTEM PROFILES and press DEFAULT (F3) 2. Press ENTER and the test set reverts to the default settings. Delete a Profile 1. Select SYSTEM PROFILES and select the desired profile. 2. Press DELETE (F1). • Press CLEAR-ALL (F2) to delete all stored profiles. Modify an Existing Profile 1. Select SYSTEM PROFILES and select the desired profile 2. Press LOAD (F3) to invoke the profile. 3. Move to the other menus within the test set where you will change the setup items. 4. Select SYSTEM PROFILES and press STORE (F2). 5. Give the profile a new name. If you want, you can give this modified profile the same name as the original, but pay close attention to which file number it is stored under so that you will be able to tell which profile is old, which is new. 6. Press ENTER to return to SYSTEM PROFILES and select the old version of the profile which you no longer need. 7. Press DELETE (F1) to delete the old profile. 8. Select the new profile and press LOAD (F3) to finish. Ch. 3 Menus 137

Refer to Figures 100 and 101.3 MEAS Configuration There are two Measurement Configuration screens that you may adjust. SunSet E20/c • 138 . MANUAL (F2) Select the method to begin your test measurements. the Remaining Time (RT) counter shows how much time is left before the end of the test. CONTINU (F2) Set the Measurement Duration. 21:59:33 MEAS MEAS CONFIGURATION MEAS DURATION: START : PROG DATE YMD: PROG TIME HMS: CODE CONFIGUR: MEASURE MODE : BLOCK SIZE : PRINT RESULT : PRINT EVENT : TIMED CONTINU CONTINU MANUAL --:--:---:--:-HDB3 BER 1000 LAST DISABLE more Figure 100 Measurement Configuration Screen MEAS DURATION Options: TIMED (F1). Then enter a number between 1 min to 999 hr using the keypad. you must enter the desired time in the next two items. • PROGRAM: This allows you to program a specified time in the future to begin taking measurements.8. A continuous test will run indefinitely until you press the RESTART key. Once you have selected PROGRAM. MANUAL: In this mode you must manually begin the test measurements at the desired time. • • START Options: PROGRAM (F1). This is useful for making measurements of a specified length.3. When a timed test is in progress. • A timed measurement will stop when the specified amount of time has elapsed. or until you change some other setting on the test set that restarts the test. If you select TIMED. press SHIFT to display the ‘SHIFT’ indicator.

F2) Determines the block size used in the Block Error Ratio measurement. • AUTO: The test set will try to detect the data pattern as in BER mode. 3 Menus 139 . because there is no pattern synchronization. BLOCK SIZE Options: 1000 (F1). HDB3 line coding is used almost everywhere throughout the world in 2. except for bit error measurement. • LIVE: Use to ignore the test pattern and make all measurements. then if the data pattern cannot be detected. Minute. Ch. In this case.048M transmission. in-service circuits. 2e15-1 (F2). and Seconds to begin measurements. Month. • Enter the Year. 2e11-1 (F3). 2e9-1 (MORE. PROG TIME HMS Applies if you have selected PROGRAM for START • Specify the Hour. even when they are monitoring live. F1). An explanation of the related technology is located in Chapter 5. Notes: • Most technicians leave the test set in BER mode. MEASURE MODE Options: BER (F1). AUTO (F3) • BER: Use to search for the test pattern. using the SHIFT and keypad number keys. • If the LIVE mode is selected. One block is typically 1000 bits long. • BLER (Block Error Ratio) is the fraction of blocks in error (the number of blocks received with one or more bit errors divided by the total number of blocks transmitted). they expect the PAT SYNC light to remain RED. and Day to begin measurements. the PAT SYNC LED is turned OFF and the bit error measurement screen is not displayed in MEASUREMENT RESULTS. the test set will turn to LIVE mode. The bit error measurements will also show 100% UAS. AMI (F2) Select the line coding. and make bit error measurements with all other measurements. using the SHIFT and keypad numeric keys.PROG DATE YMD Applies if you have selected PROGRAM for START above. 2e6-1 (MORE. LIVE (F2). CODE CONFIGUR Options: HDB3 (F1).

0 IDLE CHNL CODE : 11010101 IDLE CHNL A/B/C/D: 1001 more ON OFF Figure 101 MEAS Configuration.048 Mbit/s. • PRINT EVENT Options: ENABLE (F1). G.821 Measurement is ON. Press the SHIFT key. Select the second Measurement Configuration screen by pressing the keypad down arrow key . G. G.PRINT RESULT Options: TIMED (F1).2100 : CONFIGURATION ON ON ON ON 00:58:29 M.2100/550 PARAMETERS MEAS PERIOD : 015 min HRP MODEL % : 040.048 Mbit/s transmission. DGRM is shown in MEASUREMENT RESULTS. LAST (F2) • TIMED: Use to have the test results printed every 1 to 999 hours and 99 minutes. This configuration screen relates to ITU standards for 2. OFF (F2) When the G.821. or a continuous test that has ended due to a RESTART. DGRM Options: ON (F1). and M. DISABLE (F2) • • ENABLE: Use to print out a time and date-stamped error message every second that one or more errors occur.821 : DGRM : G.826 : M. MEAS MEAS G.826. DISABLE: Use if you do not want to print out a result each time. 140 SunSet E20/c .821 Options: ON (F1).2100.821. then enter the number of hours and minutes. LAST: The test results are printed only at the end of a timed test.821. G. OFF (F2) When the Degraded Minutes measurement is ON. Screen 2 The first three items relate to ITU standards on measurements and performance characteristics for 2. This Bit Error screen presents the measurement parameters specified in ITU G. the LINE 1 BIT ERROR screen is shown in Measurement Results.

2100 is ON. • • This code is used during VF channel access operations. This G.826 screen is displayed in MEASUREMENT RESULTS.048 Mbit/s circuit passes through international boundaries. OFF (F2) When the M.2100/550. It allocates a certain allowable error rate to each nation that carries the circuit. M.550. when the TxSource is set to the TESTPAT mode. The next two settings refer to the M. M. The factory default.2100/550 measurements: MEAS PERIOD Options: 01-99 min.G. is set in accordance with ITU G. the G. HRP MODEL % Options: .704. 1101. 3 Menus . OFF (F2) When the G. • Use the SHIFT key and the numeric keys to set the period.826 screen presents the measurement parameters defined in G.2100 screen is shown in MEASUREMENT RESULTS. for information on how to select the Hypothetical Reference Performance model percent (HRP %). or to the older M.1 to 99.2100/550.2100 Options: ON (F1). IDLE CHNL CODE Options: Any 8-bit pattern Program the idle code to be any 8-bit pattern.826 Measurement is ON.826. the M. The test set makes the M.9 % Refer to M. LINE 1(2)–M.826 Options: ON (F1). This section refers to ITU specifications used when a 2. IDLE CHNL A/B/C/D Options: Any 4-bit pattern Program the idle channel signalling bits of channels 1-30 in the MFAS framing mode. • • These signalling bits are found in time slot 16 of frames 1-15. This setting controls how often a new result is displayed in MEASUREMENT RESULTS.2100. The technician needs to enter the appropriate percentage allowed for the line. 141 Ch.2100/550 calculations and reports pass/fail in MEASUREMENT RESULTS. The idle code is also used in fractional E1 testing to fill up the unused channels.

CONTINU (F2) This timer controls how long the backlight will stay on when you press the Light key. Set the timer using SHIFT and the numeric keypad. Set printing options.2. Setting range is 1-99 minutes.4 General Configuration • • • Set the correct time and date. BACK LIGHT Options: TIMED (F1). CONTINU is the default setting. TIME (H :M :S) Set the time by using SHIFT and the numeric keypad. Numbers that are out of range will be rejected. • • CONTINU: The backlight will stay on continuously until you press the Light key. Section 2. The test set inserts the hyphens for you. Numbers that are out of range will be rejected. 20:21:11 MEAS GENERAL CONFIGURATION DATE (Y-M-D) : TIME (H:M:S) : BACK LIGHT : PRINTER BAUD RATE : PARITY : STOP BIT : BITS/CHAR : CR/LF INSRT : PRINT FORMAT: PRINTER PC 2002-01-03 20:13:24 CONTINU 9600 NONE 1-BIT 8-BIT CR+LF PC Figure 102 General Configuration Screen The following items are available for configuration: DATE (Y. Set the backlight duration.8.3. The test set inserts the colons for you.3. PRINTER The next six items are for setting up the serial port for printing or remote control.D) Set the current date by using SHIFT and the numeric keypad.3.M . TIMED: The backlight will automatically turn off after the indicated number of minutes. 142 SunSet E20/c . For more information on these features refer to Chapter 2.

is added to the data as an accuracy check. • • • ODD: The total number of ones (including the added parity bit) is odd.BAUD RATE Options: 1200 (F1). • In carriage return and line feed. 19200 (MORE. to configure the printer. PC (F2) • • PRINTER: This sends the results to a printer. NONE: This is the default setting. the stop bit is the last transmitted character which permits the receiver to come into an idle condition before accepting another character. PRINT FORMAT Options: PRINTER (F1). The receiving element checks the parity bit. ODD (F3) An extra bit. PC: This sends results to a PC. which allows results to be transferred to a PC program. CR+LF (F2) CR: Selects carriage return. 2400 (F2). 1200 and 2400 will not support remote control features. CR+LF: Selects carriage return and line feed. this setting is recommended for remote control operations. STOP BIT Options: 1-BIT (F1). and indicates an error if the total number of ones does not add up to the correct total. EVEN (F2). known as a parity bit. EVEN: The total number of ones (including the added parity bit) is even. The default setting is 9600. PARITY Options: NONE (F1). F1). 2-BIT (F2) In asynchronous transmission. CR/LF INSRT Options: CR (F1). signifies no parity checking. 8-BIT (F2) BITS/CHAR determines the number of bits per character. such as HyperterminalTM. F2) The Baud rate determines the number of shortest signalling elements per second on a transmission medium. 143 Ch. 3 Menus . 38500 (MORE. an extra line space is inserted after every line. select one. The default setting is 1-BIT. BITS/CHAR Options: 7-BIT (F1). The test set will send control digits before printing. The test set will not send the control digits. 9600 (F3).

unless you want all the settings to return to the default settings. 1. There is no Factory Defaults screen. This operation should always be performed when inserting a new software cartridge. If this is the case. From the main menu. Making sure that the test set is properly configured for the application being attempted.6 Self Test This performs a hardware test. Follow the on-screen instructions. and this process does not include a second step. initiate Erase NV RAM only after attempting to correct the problem by: 1. Try this if the test set is not performing properly. telephone numbers. 4.3. Upon pressing ENTER at FACTORY DEFAULTS. 3.8. Press ENTER after the warning message is displayed. Select SYSTEM PARAMETERS > SELF TEST and press ENTER. 3.8. All user transmit patterns. Cycle the test set off and on. If an error message is shown after the test is completed. 2.5 Erase NV Ram ERASE NV (Non Volatile) RAM erases all user-stored information.7 Factory Defaults This resets all settings to the factory default settings. 144 SunSet E20/c . and system profiles will be erased. do not press ENTER on the Factory Default selection. 3. then turn the it back on. When the test set is finished with the operation. contact Sunrise Telecom Customer Service at 1-408-363-8000 or 1-408-363-8313 (fax) for assistance. select SYSTEM PARAMETERS (System icon-color test set) > ERASE NV RAM. 3. Use the following procedure to perform ERASE NV RAM: Caution! Performing NV RAM ERASE will erase all the user-stored information. To run the self test: 1. turn the test set off for 5 seconds. 2. the test set resets. Therefore. A WORKING message will be displayed.8. Perform a self test and cycling the test set off and on. Re-configure the test set for the operations you need to perform.

9 Language Selection Select the test set’s display language.: ENGLISH ENGLISH FRENCH ITALIAN SPANISH Figure 103 Language Selection Screen Press the corresponding F-key to select a language: English (F1). 3 Menus 145 . Ch.3. 20:00:39 MEAS SELECTION LANGUAGE SELECTION LANG. French (F2). Italian (F3) or Spanish (F4) • All menu choices and settings will be shown in the language selected.

146 SunSet E20/c .

The next three figures show various ways in which to connect the test set to the circuit. Be sure you are properly trained before proceeding. do not plug into the circuit until you have pre-selected the L1/2-Rx Port = BRIDGE level.1 Connecting the Cords Caution! • Plugging into a live E1 circuit may cause a loss of service for multiple customers. Right Side Connector Panel 75W L1-TX 120W 75W L1-RX 120W SUNRISE MON SUNRISE Tx Rx EQUIPMENT Figure 104 Plugging in-TERM Mode Ch. The SunSet E20 will not place isolation resistors on the line unless this Rx Port is specified. • For BRIDGE access. 4 Applications 147 SUNRISE SUNRISE .Chapter 4 Applications 4.

Figure 106 Plugging in-THRU Mode 148 SunSet E20/c SU .SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR SunSet E20 F1 F2 F3 F4 SUNRISE TELECOM I N C O R P O R A T E D SUNRISE 1 CODE ERR SUNRISE EQUIPMENT SUNRISE A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 EQUIPMENT SUNRISE MON PRINT F# AUTO 7 4 * 5 MEAS 8 MON 0 SHIFT ESC ENTER Tx POWER Tx Rx Rx Figure 105 Plugging in-Monitor Mode SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY ERROR SUNRISE 1 CODE ERR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR 2-Line 1 RX SUNRISE 6-Line 2 RX 5-Line 2 TX SunSet E20 SUNRISE 1-Line 1 TX F1 F2 F3 F4 SUNRISE TELECOM I N C O R P O R A T E D A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 * PRINT 7 SS210 Cable F# AUTO 4 5 MEAS 7 8 3 0 SHIFT ESC ENTER POWER Tx NR ISE SU 4 CROSS CONNECT JACKS ISE NR SU NR ISE SU NR ISE 8 Tx EQUIPMENT Rx EQUIPMENT Rx Notes: L1-Rx Port = TERM Plug in the cords in the order shown.

Ch.2 Basic Applications 4. The setup is illustrated in Figure 107. 4. 3. Select the desired test pattern and press ENTER. Enter the TEST CONFIGURATION screen (Setup icon-color test set). and configure as follows: TEST MODE: E1SINGL Tx SOURCE: TESTPAT FRAMING: as specified by the circuit design CRC-4: as specified by the circuit design TEST RATE: 2.2.048M L1-Rx Port: TERM TX CLOCK: INTERN Press ENTER when configured.4. Connect the test set to the circuit in order as shown in Figure 107. 4 Applications 149 . 5. Verify that the span is not in service. 1.1 Accept a New Circuit Exchange Right Side Connector Panel 75W L1-TX 120W 75W L1-RX 120W MON Customer Premises Multiport OUT IN Loopback Device EQUIPMENT Figure 107 Accept a New Span Here is a procedure for accepting a new span . 2. This acceptance test will disrupt service. From the main menu select TEST PATTERN. Ensure that there is a loopback device at the far end of the span.

150 SunSet E20/c . Remove the loop at the far end of the circuit. 8. Press LED to acknowledge any history lights and verify that the PAT SYNC LED is green. From the main menu select MEASUREMENT RESULTS (Results icon-color test set) and press START (F3). 9. Verify that the circuit performs to your company’s requirements for the service delivered. press ESC to return to the main menu.6. When MEASUREMENT RESULT have been completed. 7. Use PAGE-UP (F1) and PAGE-DN (F2) to access each of the individual measurement screens. 10.

This test may be performed while the span is carrying live customer traffic.2. Press LED to acknowledge any history lights. select TEST CONFIGURATION (Setup icon-color test set). MONITOR should be used when you have a Protected Monitoring Point (PMP) access. The setup is illustrated in Figures 108 and 109.048M L1-Rx PORT: MONITOR or BRIDGE L2-Rx PORT: MONITOR or BRIDGE TX CLOCK: INTERN Press ENTER when configured. From the main menu. and configure as follows: TEST MODE: E1DUAL Tx SOURCE: TESTPAT FRAMING: as specified by the span design CRC-4: as specified by the span design TEST RATE: 2.2 Monitor an In-Service Circuit Here is a procedure for monitoring a span that is in-service. 4.4. Connect the test set to the circuit as shown in Figure 108 or 109. SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR SunSet E20 F1 F2 F3 F4 SUNRISE TELECOM I N C O R P O R A T E D A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 * PRINT F# AUTO 4 5 MEAS E1 Terminal Equipment MON SHIFT POWER 7 8 MON 0 ESC ENTER E1 Terminal Equipment OUT IN OUT IN Figure 108 Monitor an In-Service Circuit-Monitor Mode Ch. 1. Note: If you are not sure what RX Port level to use. then use BRIDGE. 4 Applications 151 . 2. 3.

• A steady ERROR or CODE LED indicates that the circuit is working but is experiencing trouble. Verify that the span performs to your company's requirements for the service delivered. red indicates no signal. • A valid framing type should be indicated. Examine the LEDs for both lines and the GRAPHIC screen for information about the circuit under test: • The SIGNAL LED should be green. • AIS may indicate a trouble condition where a network element transmitting to the test set has lost its incoming signal and has replaced it with the AIS signal. • An ALARM indication will show a problem on the other side of the circuit. 7. To make a basic measurement. select from the main menu. TEST CONFIGURATION (Setup icon-color test set). • The graphic will confirm your test setup. 6. and press START (F3).Right Side Connector Panel 75W L1-TX 120W 75W L1-RX 120W SUNRISE Figure 109 Monitor an In-Service Circuit-Bridge Mode 5. 152 SunSet E20/c .

select TEST CONFIGURATION (Setup icon-color test set).3 Checking for Frequency Synchronization SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR SunSet E20 F1 F2 F3 F4 SUNRISE TELECOM I N C O R P O R A T E D A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 * PRINT F# AUTO 4 5 MEAS E1 Terminal Equipment MON SHIFT POWER 7 8 MON 0 ESC ENTER E1 Terminal Equipment OUT IN OUT IN Figure 110 Frequency Synchronization Frequency synchronization can be a problem when: • • the customer purchases a channelized E1 circuit the customer’s circuit passes through a synchronous network element such as an exchange. one side will usually be known to generate a synchronized signal. On a 2. a major source of service impairment. From the main menu. This side can be used as the reference. PBX. The other side can be measured for frequency synchronization.2. or a digital cross-connect system the E1 circuit passes through more than one carrier.048 Mbit/s reference frequency source. 2. 3.4. This test may be performed while the span is carrying live customer traffic. 4 Applications 153 . Refer to Figure 104 for the setup and use this procedure to identify frequency synchronization problems: 1. Obtain a 2. and configure as follows: TEST MODE: E1SINGL Tx SOURCE: TESTPAT FRAMING: as specified by the span design Ch.048 Mbit/s circuit. • Frequency synchronization problems result in bit slips.

You will see >>> or <<< indicating the rate of frequency slippage. Press PAGE-DN (F2) until the FREQUENCY screen is displayed. 5. this is usually the MONITOR jack of the known synchronized signal.048M L1-Rx PORT: MONITOR TX CLOCK: L2-Rx Press ENTER when configured. • Observe if the frequency value varies from the 2. 7. This will provide an indication of any lowfrequency variation in the E1 signal's frequency. Plug the Line 1 RX jack into the MONITOR jack of the side to be tested. • Note the WNDR value. select MEASUREMENT RESULTS (Results icon-color test set) and press START (F3).CRC-4: as specified by the span design TEST RATE: 2. 6 Press LED to acknowledge any history lights. 8. From the main menu . 154 SunSet E20/c .048 MHz reference frequency. 4 Refer to Figure 110 and plug the reference E1 signal into the Line 2 RX jack.

• An all ones pattern in L1-Rx Port TERM and BRIDGE provides the most accurate results.4 Measure Signal Level Right Side Connector Panel 75W L1-TX 120W 75W L1-RX 120W SUNRISE EQUIPMENT MON Tx EQUIPMENT MON Tx SU N R IS E E1 TERMINAL EQUIPMENT Rx Rx Figure 111 Measuring Signal Level A signal level measurement can be performed by itself or in conjunction with one of the other tests. 4 Applications 155 . MONITOR.2. • MONITOR may be the most convenient mode. 1. or BRIDGE modes. MONITOR measurement should generally show a result of about -20 dB or -30 dB. • TERM will disrupt service. • You can make the measurement in TERM. Select the L1-Rx Port level you want to use.4. • A BRIDGE measurement result may be degraded by a lowquality termination at the network element terminating the E1 line. Ch.

Press LED to acknowledge the blinking history lights. Verify that the span is not in service. Plug the test set into the circuit as shown in Figure 111. Note that separate readings are given for the positive and negative signals so that you can get more accurate information on a faulty regenerator. From the main menu. 4. 3. 7 Press PAGE-DN (F2) until the LINE 1-ALM/SIG screen is displayed 8. 6. 156 SunSet E20/c .2. and configure as follows: TEST MODE: E1SINGL Tx SOURCE: TESTPAT FRAMING: as specified by the circuit design CRC-4: as specified by the circuit design TEST RATE: 2. The rest of this procedure will use the TERM mode for illustrative purposes. Select MEASUREMENT RESULTS (Results icon-color test set) and press START (F3). Read the signal level.048M L1-Rx PORT: TERM TX CLOCK : INTERN Press ENTER when configured. select TEST CONFIGURATION (Setup icon-color test set). 5.

• If the loop up is successful. 3. select OTHER MEASUREMENT (Setup icon-color test set) > CHANNEL LOOPBACK and select MODE: LOOP UP.048M (as required) Press ENTER when configured. From the main menu.4. Ch. 4. • A ‘LOOP DOWN OK’ message is displayed when the loop down has completed. Select from the main menu.2. and configure as follows: TEST MODE: E1 SINGL/ E1 DUAL Tx/INSERT and Tx/DROP: L1/L2 (as required) Tx SOURCE: TESTPAT TEST RATE: Nx64/2. select MEASUREMENT RESULTS (Results icon-color test set) and run a BERT. 5.5 V. Select from the main menu. if not.54 Channel Loopback Test 1. OTHER MEASUREMENT (Setup icon-color test set) > CHANNEL LOOPBACK and select MODE: LOOP DOWN. From the main menu. you will see LOOP UP ERROR. 4 Applications 157 . 1 2 SunSet E20 E1 MUX DATACOM MODEM LOOP A SUNRISE TELECOM I N C O R P O R A T E D Figure 112 V. Stop the test. select TEST CONFIGURATION (Setup icon-color test set).54 Application 2. you will see a LOOP UP OK! message.

and Second you wish the test to begin. In this section you will configure the timer for one of these tests. When done press SHIFT. Select the START line and press PROGRAM (F1). select SYSTEM PARAMETERS (System icon-color test set) > MEAS CONFIGURATION. At the MEAS DURATION line press TIMED (F1) 4. press SHIFT. 10. Use the following procedure: 4.6 Running a Timed Test Many network tests require the use of an exact time period such as 15 minutes. 6. 8. 1 hour. at the MEAS DURATION line. 2. Use the SHIFT and number keys to enter the Hour.2. 158 SunSet E20/c . Enter in the number of hours and minutes that you want the test to run using the keypad. Proceed with the desired application for your test. use the following procedure: 1. 5. Press SHIFT when done. When done.6.2. • The test will now be timed when MEASUREMENT RESULT is performed. 4.4. 2.1 Manual Start 1. press TIMED (F1). 3.6. In MEAS CONFIGURATION. 7. Press SHIFT to display the SHIFT indicator. Select the PROG DATE YMD line. 9. Press ESC until the main menu is displayed. 3. 7. • Observe the remaining time by viewing the RT (Remaining Time) indicator in the upper right-hand portion of the screen. 9. Enter in the number of hours and minutes that you want the test to run using the keypad.2. and Day you wish the timed test to begin. Use a desired application for your test.2 Auto Start To program the test set to begin measuring at a future date and time. Minute. Month. Select the START line and press MANUAL (F2). The test set will begin measuring at your programmed date and time. 8 Select the PROG TIME HMS line. Press SHIFT when done. 5. 4. 6. Select from the main menu. or 24 hours over which to conduct a test. Use the SHIFT and number keys to enter the Year. Press SHIFT to display the SHIFT indicator.

• Scroll down through 64 pages of information • Observe the changes which have occurred over time Ch. 2. select TEST CONFIGURATION (Setup icon-color test set) and configure the interface (L1-Rx. Press LED to acknowledge the history lights. 4 Applications 159 . From the main menu. • You will now receive a live display of the E1 data.2.7 Observe Network Codes or Channel Data Observe live data: • • • • • Binary Hexadecimal ASCII translations Decode E1 network control codes that are in use Verify the content of individual channels MEAS 12:12:47 Refer to Figure 113. VIEW RECEIVED DATA PAGE:01 T/S BINARY 00 00011011 01 10001110 02 01000100 03 11011010 04 01100101 05 00100010 06 10100001 07 00110000 PAGE-UP PAGE-DN HEX 1B 8E 44 DA 65 22 A1 30 PAUSE ASCII ( ) (q) D (”) ([) e ( ) “ (D) ( ) 0 ( ) PRINT Figure 113 View Received Data Use this procedure: 1. The test set must detect valid framing on the received signal. L2-Rx Port-depending on the TEST MODE configuration) using the following guidelines: • If in service use BRIDGE or MONITOR • If out of service use TERM Specify the other TEST CONFIGURATION settings as required. 3.4. Connect the test set to the circuit as shown in Figure 108 or 109. 4. Press ESC to display the main menu and select OTHER MEASUREMENT (Results icon-color test set) >VIEW RECEIVED DATA.

press PAUSE (F3) to trap 64 pages of data. • All other channels (time slots) should contain actual voice/ data signals (or your the received test pattern). • The data is presented as it appears in the E1 bit stream and is broken out into timeslots. Review the live data as it is displayed. B. • View control information in time slots 00 and 16 for MFAS framing. When the codes that you are interested in appear. • View control information in time slot 00 for FAS framing. Press PAGE-DN (F2) to scroll through the data. 160 SunSet E20/c . A.6.

• If this doesn't work. Plug the set into the circuit as shown in Figure 108 or 109.048M L1-Rx Port: MONITOR or BRIDGE TX CLOCK: INTERN Press ENTER when configured. Press LED to acknowledge the blinking history lights. 9. 1. • In FAS framing. access to time slots 00 and 16 is denied. 5. VF & NOISE MEASUREMENTS. This test may be performed while the span is carrying live traffic. Verify that PCM-30 or PCM-31 LED is lit. Press ESC until the main menu is reached. 4 Applications 161 . 4. Note: If you are not able to monitor the channel: • Verify that the AUTO framing of the test set was able to synch on a recognized framing pattern • Press the AUTO key to restart the auto framer if a valid frame pattern is not shown. Use either TALK or TONE for TxMODE and L1 for the IN/DROP items (if you are in E1DUAL mode). select TEST CONFIGURATION (Setup icon-color test set) and configure as follows TEST MODE: E1SINGL Tx SOURCE: TESTPAT FRAMING: as specified by the circuit design CRC-4: as specified by the circuit design TEST RATE: 2. Ch. 2. 7. 8. 10.8 Monitor a Voice Frequency Channel Here is a procedure for monitoring a voice frequency channel within an E1 circuit. Adjust the volume to the desired level by pressing the volume key. try unplugging and re-plugging the receive cord. From the main menu. 11. Select VF CHANNEL ACCESS (VF icon-color test set) and select.2. no access is granted to time slot 00 • In MFAS framing. This will positively verify that there is no recognizable framing at this moment.4. then using the UP (F1) or DOWN (F2) key. • The channel number will bypass any time slots containing the E1 framing information. 6. Enter the desired transmit and receive timeslots.

2. • One of the framing LEDs must light for this procedure to work. your setup may have another test set. 162 SunSet E20/c .3. However. You can now talk and listen on the channel which you have selected. 6.1. a channel bank. 7. Select TALK for the TxMODE. Verify that the span is not in service. Connect the test set to the circuit as shown in Figure 107. Select the receive (listen) and transmit (talk) channels (they are usually the same channel number). If a hitless drop insert is required. From the main menu. Use this procedure: 1. 5. Press ESC to reach the main menu and select VF CHANNEL ACCESS (VF icon-color test set) > VF & NOISE MEASUREMENTS.9 Simple Talk/Listen Here is the simplest procedure for talking and listening on an E1 circuit. 3. read Section 4. a switch. 4. The setup is illustrated in Figure 107. Press LED to acknowledge any blinking history lights. instead of having a loopback at the far end of the circuit. Adjust the volume to the desired level by using the volume key. or other E1 terminating network element.4.048M L1-Rx Port: TERM TX CLOCK: INTERN Press ENTER when configured. This test will disrupt service for all of the channels you are not using. select TEST CONFIGURATION (Setup icon-color test set) and configure as follows: TEST MODE : E1SINGL Tx SOURCE: TESTPAT FRAMING: as specified by the span design CRC-4: as specified by the span design TEST RATE: 2. 2. Notes: • It is not possible to perform talk and listen on an unframed signal.

Select the rest of the menu items as follows: Tx A/B/C/D: change as required TxMODE: TONE TONE FREQ : enter the desired frequency Tx LVL (dBm): enter the desired tone level LISTEN SIDE: L1+L2 (if in E1Dual Mode) • • You are now transmitting a tone on the selected channel.1. 4 Applications 163 . select TEST CONFIGURATION (Setup icon-color test set) and configure as follows: TEST MODE: E1SINGLE Tx SOURCE: TESTPAT FRAMING: as specified by the span design CRC-4: as specified by the span design TEST RATE: 2. 4. Press ESC until you reach the main menu and select VF CHANNEL ACCESS (VF icon-color test set) > VF & NOISE MEASUREMENTS. This is an intrusive test. 7. Be sure the E1 line is not carrying traffic or that it will be able to withstand any hits that this procedure will introduce. 6. 2. Connect the test set to the circuit as in Figure 104. From the main menu.4. If a hitless drop insert is required. read Section 4. 5.048M L1-Rx Port: TERM TX CLOCK: INTERN Press ENTER when configured. Use NEXT (F1) or PREVIUS (F2) to set up the receive and transmit channels (timeslots).2. Ch. View the received Frequency and noise measurements. Press LED to acknowledge any blinking history lights.3.10 Send a Tone 1.

N channels of the E1 line are dedicated to the fractional E1 circuit. and the remaining channels of the E1 line are either filled with an idle code. From the main menu. the fractional SELECT TIME SLOT screen is displayed. L1-Rx Port: TERM TX CLOCK: INTERN Press ENTER when configured. read Section 4. select TEST CONFIGURATION (Setup icon-color test set) and configure as follows: TEST MODE: E1SINGL Tx SOURCE: TESTPAT FRAMING: as specified by the span design CRC-4: as specified by the span design TEST RATE: Nx64K. other revenue traffic or framing information. Manually configure the timeslots or use AUTO configure.3. Use the following procedure: 1. If a hitless drop insert is required. Verify that the fractional circuit is not in service.2. This test will disrupt service.1.4.11 Nx64 kbit/s Testing Fractional E1 circuits are circuits of data rate Nx64 kbit/s. 164 SunSet E20/c . where N can be anywhere from 1 to 31 channels. 2. Note: AUTO configuration may not yield the proper channels if: • Any of the active channels are transmitting an idle code • The idle code (set up in the SYSTEM PARAMETERS > MEAS CONFIGURATION page 2 > IDLE CHNL CODE) item is not the same as the idle code of the circuit being tested.

press ENTER. this will allow double checking the information being transmitted on a channel-by-channel basis.To Observe the Idle and Active Channels: 3. 8. 7. 5. Press LED to acknowledge any blinking history lights. 10 Select MEASUREMENT RESULTS and press START (F3) to perform the acceptance test. Plug-in the test set using the 2. 6. Connect the test set to the circuit as shown in Figure 114. When the TEST CONFIGURATION settings are as desired. Ensure that a loop is in place at the far end of the circuit. Central Office Right Side Connector Panel 75W L1-TX 120W 75W L1-RX 120W MON OUT Multiport IN Loopback Device EQUIPMENT Figure 114 Fractional E1 Testing Ch. 11.048 Mbit/s test rate 4. select OTHER MEASUREMENTS (Results icon-color test set) > VIEW RECEIVED DATA. 4 Applications 165 . From the main menu. 9. This will return you to the TEST CONFIGURATION menu. Verify the fractional service performs to your company’s requirements for the service delivered. Press ENTER when the timeslot settings are as desired.

make sure all the connections are made in accordance with the numbering procedure in Figure 115 to ensure the least amount of interruption on the live circuits. while Figure 116 shows a THRU mode test configured with L1-Rx Port as MONITOR. B.1 In-Service Dual Drop & Insert THRU Testing To conduct a dual drop and insert THRU mode test on a line that is in service.4. From the main menu. 166 SunSet E20/c . Use the following procedure. Figure 115 shows a THRU mode test configured with L1-Rx Port as BRIDGE. this test should disrupt the service for a very short duration. Press GRAPH and verify that the test set is in THRU mode. • Don’t perform this test on battery power. and no errors. 1. Be sure to plug in the cords in the order shown.3. Plug in cords 1 through 6. coding. D. BRIDGE TX CLOCK: L1-Rx 2.3 Advanced Applications 4. Any mistakes will result in a longer service disruption. If performed properly. doing so will cut off service.048M or Nx64K ( fractional E1) L1-Rx Port: MONITOR.048 Mbit/s circuit to pass through the test set. C. or turn off the test set. BRIDGE L2-Rx Port: MONITOR. Verify that the test Line 1 and Line 2 LEDs show proper framing. • THRU mode allows an in-service 2. Plug in cords seven and eight. Be sure to plug in the cords in the order shown. Cautions! • Only experienced technicians should perform this procedure. therefore you should practice the required connection procedure on an out-of-service circuit to reduce the risk of cutting off an in-service circuit. Connect the test set to the circuit as shown in one of the next two figures. A. Note: You may need to modify this procedure to fit the type of connection panels in your network. select TEST CONFIGURATION (Setup icon-color test set) and configure as follows: TEST MODE: E1DUAL Tx/INSERT: L1-Tx Rx/DROP: L2-Rx Tx SOURCE: THRU FRAMING: as specified by the circuit design CRC-4: as specified by the circuit design TEST RATE: 2.

L1-Tx Port MONITOR Ch.048 Mbps Line 1 EQUIPMENT OUT 7 IN IN IN Figure 115 Dual Drop & Insert THRU Mode.048 Mbps Line 1 OUT OUT IN IN IN EQUIPMENT EQUIPMENT Figure 116 Dual Drop & Insert THRU Mode.4 6 SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR SunSet E20 2 5 F1 F2 F3 F4 SUNRISE TELECOM I N C O R P O R A T E D A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 PRINT F# AUTO 7 4 * 5 MEAS 8 0 SHIFT ESC ENTER POWER 1 MON OUT Line 1 2. L1-Tx Port BRIDGE 4 6 SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR SunSet E20 2 5 F1 F2 F3 F4 SUNRISE TELECOM I N C O R P O R A T E D A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 PRINT F# AUTO 4 * 5 MEAS 1 SHIFT POWER 7 8 3 0 ESC ENTER OUT 7 Line 1 2.048 Mbps Line 2 MON 8 Line 2 2. 4 Applications 167 .048 Mbps Line 2 EQUIPMENT 3 8 OUT Line 2 2.

Depending on the test application you may wish to do the following: • For Talk and Listen: A. Use NEXT (F1) or PREVIUS (F2) to set up the receive and transmit channels. 3. To Test Nx64 kbit/s. • • 168 SunSet E20/c . C. Select the receive (listen) and transmit (talk) channels (they are usually the same channel number). and noise measurements. Verify that the fractional E1 service performs to your company’s requirements for the service delivered. Select the rest of the menu items as follows: TxMODE: TONE Tx FREQ: enter desired tone frequency TxLVL (dbm): enter desired tone level Tx ABCD: pick or enter desired supervision bits SPEAKER: L1+L2 • You are now transmitting a tone on the selected channel. C. Select TALK for the TxMODE and L1 (or L1+L2) for the SPEAKER. Fractional E1: A. To Send and Receive a Tone: A. Press ESC to return to the main menu and select VF CHANNEL ACCESS (VF icon-color test set) >VF & NOISE MEASUREMENTS. Press ESC to get to the main menu and select MEASUREMENT RESULTS (Results icon-color test set) and press START to perform your acceptance test. select TEST CONFIGURATION (Setup icon-color test set) and confirm that TEST RATE is set for Nx64K. B. You can now talk and listen on the channel you have selected. Frequency. • You can also view the received Level. From the main menu. C. Press ESC to return to the main menu and select VF CHANNEL ACCESS (VF icon-color test set) >VF & NOISE MEASUREMENTS. B.Note: The circuit will be disrupted for two or more seconds while the cords are moved. B.

F1).048Mbps Datacom Side 64kbps A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 PRINT F# AUTO 7 4 * 5 MEAS 8 0 SHIFT ESC ENTER POWER Test Set Datacom MUX Test Mode = Master Figure 117 MUXTEST Setup 1. Select from the main menu. Here is the procedure. TEST CONFIGURATION (Setup icon-color test set) and for TEST MODE select MUXTEST (more. From Test Set Multiport TX/RX Transmit out E1 Port Receive from Datacom SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY Transmit out Datacom Receive from E1 Port 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR SunSet E20 MUX 1X0 Loop Timing F4 F1 F2 F3 SUNRISE TELECOM I N C O R P O R A T E D E1 Side 2. 15:35:30 TEST CONFIGURATION TEST MODE : MUXTEST E1 Tx/INSERT :L1-Tx Rx/DROP :L1-Rx FRAMING :PCM-30 CRC-4 :YES L1-Rx Port:TERM L2-Rx Port:TERM Tx CLOCK :INTERN L1-Rx INTERN DATACOM TYPE : RS449 BERT E1T/S: Nx64K B-LED: E1 L2-Rx Figure 118 E20 MUXTEST Configuration Ch.3. 4 Applications 169 . Configure the rest as shown in Figure 118. 2.2 Testing a Terminal Multiplex The test set can perform an out-of-service through multiplex test. Connect the test set as shown in Figure 117.4.

You have just injected an error from the E1 side through the multiplex to the datacom port. 170 SunSet E20/c . you may wish to change the test patterns and other settings in TEST CONFIGURATION such as TX CLK. V. Verify that PAT SYNC is green. i.. RS449. You should now see flashing red LEDs for both ERROR and BIT ERROR indicating one bit error has occurred. or X. The Figure 118 uses RS232S as the Datacom Type. Press LED to acknowledge any blinking history lights.048 Mbit/s TX or set the TX CLOCK to L1Rx. You should see flashing red LEDs for both ERROR and BIT ERROR to indicate that a bit error has taken place. The result depends on your B-LED setting. 11 If more comprehensive tests are required.703. Press ERR INJ to insert a bit error. this is the datacom type that you selected in DATACOM TYPE. 3. 7. Check to see if you can inject an error from the datacom port through the multiplex to the E1 side. Inject one bit error by pressing ERR INJ once. Verify that the PAT SYNC LED is green. The test set is DTE. • Set the BERT B-LED to DTCM.e. • The test set transmits an idle code out the multiport. then you are verifying the E1 side with the LED. if the test set should receive timing from the multiplex.21. Set TX CLOCK to INTERN. 6.35. 10 Press LED to acknowledge any blinking history lights. if the B-LED is set to E1. 8. if the multiplex receives timing from the test set’s 2. 9. 5. and vice versa.Notes: • In this procedure the multiplex must be DCE. You may also select G. 4.

Select from the main menu. press SELECT (F2). If necessary. Press LED to acknowledge any blinking history lights. Once the desired timeslot is flashing. C. 3.4. Press Nx64K (F1) to enter the SELECT TIME SLOT screen. D. • Press UN-SEL (F3) to deselect a particular timeslot • Press CLR-ALL (F4) to erase all the selected timeslots and start with a clear screen. Use the following procedure to multiplex one 64kbps signal onto a 2 Mbps signal.3 Emulating a Terminal Multiplex In the E1-MUX Mode. 1. • You may select only one receive and one transmit timeslot at a time. 4 Applications 171 . Ch. 4. 2. B. The receive and transmit timeslots are normally be set to the same number. Verify that the PAT SYNC LED is green. Use the arrow keys to move the flashing cursor to the desired receive timeslot. Connect the test set to the circuit as shown in Figure 119. repeat this procedure for the Transmit timeslot. the test set emulates a 64 kbps to 2 Mbps multiplexer. TxSRC: E1DRP MUX B-LED: E1drp E1INS: DTCM E1T/s: Nx64: Select the 64 kbit/s timeslot to be multiplexed from the datacom to the E1 side: A. TEST CONFIGURATION (Setup icon-color test set) and configure as follows: TEST MODE:E1-MUX E1 Tx/INSERT: L1-Tx Rx/DROP: L1-RX FRAMING: As specified by the span design CRC-4: As specified by the span design L1-Rx Port: TERM L2-Rx Port : TERM TX CLK : L1-RX DATACOM TYPE: Select the datacom interface type that will provide the 64 kbps frame.3.

The 2M signal is passed from the IN to the OUT jack and back to the L1-Rx jack on the test set. which is then transmitted out the E1 L1-Tx jack. This means that the PAT SYNC LED will show information about the signal received on the E1-L1Rx port. 4. This allows you to check the multiplexed signal.SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR Terminal Equipment SunSet E20 DTE Multiport Nx64 kbps F1 F2 F3 F4 L1-Rx L1-Tx OUT IN SUNRISE TELECOM I N C O R P O R A T E D 2. verify you recorded a Bit Error in the Measurement Results Line 1 Summary and Datacom Summary screens. Make sure that the B-LED setting in TEST CONFIGURATION is set to E1DRP. You may also want to check the results for the other side. The following steps outline the procedure for checking the multiplexed 2M signal. 172 SunSet E20/c .048 Mbps D F4 3 ERR INJ 6 LED 9 A F1 E B F2 1 C F3 2 GRAPH PRINT F# AUTO 7 4 * 5 MEAS 8 0 SHIFT ESC ENTER POWER E1-MUX DCE Figure 119 Emulating a Terminal Multiplex The DTE supplies the 64 kbit/s signal. If it does. only this time you insert an error from the 2. you have just verified the proper multiplexing ability of the test set. which is transmitted to the test set through the multiport. In Figure 119 the test set is connected to a IN/ OUT monitor jack. A. B. The test set multiplexes this 64 kbit/s signal onto a 2 Mbit/s signal. To do so.048 Mbit/s terminal equipment. Upon injecting the error. keep the same setup as shown in Figure 119. Change the B-LED setting in TEST CONFIGURATION to DTCM. Inject an error from the Data Terminal Equipment. a red error PAT SYNC LED should light up on the test set.

Plug a second BNC cord to The OUT jack on Equipment 2. SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY Terminal Equipment 2 OUT L2-Rx 4 6 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR SunSet E20 L2-Tx 2 5 Terminal Equipment 1 L1-Rx OUT 3 L1-Tx IN IN F1 F2 F3 F4 1 SUNRISE TELECOM I N C O R P O R A T E D 8 A F1 7 D F4 3 ERR INJ 6 LED 9 B F2 1 C F3 2 GRAPH MON E PRINT F# AUTO 7 4 * MON 5 MEAS 8 Test Pattern 1-4 0 SHIFT ESC ENTER Test Pattern 0000 POWER Figure 120 Emulating an Add/Drop Multiplex A. B. connect this cord to Line 2 RX on the test set. Note: Do not connect either of these cords to the Terminal equipment yet. Connect the test set to two terminal equipments in the order shown in Figure 120. C. Ch. 1. Plug into the OUT jack of Equipment 1.3. Plug a fourth cord into Line 2 TX. Use the following procedure to drop and insert 64 kbit/s timeslots between a datacom device and E1 lines. 4 Applications 173 . Plug your third BNC cord to Line 1 TX of the test set D.4 Emulating an Add/Drop Multiplexer The test set has the capability to emulate an Add/Drop Multiplex. Select TEST CONFIGURATION and configure as follows: TEST MODE: E1 DUAL Tx/INST: L1-TX RX/DROP: L2-RX TxSOURCE: THRU FRAMING: As provisioned CRC-4: As provisioned TEST RATE: Nx64k L1-Rx Port: TERM L2-Rx Port: TERM TX CLOCK: L1-RX 2. connect the same cord to Line 1 RX on the test set.4.

You have just verified the Line 1 signal is being received properly by the test set. Connect the cord from Line 1 TX to the IN jack of Equipment 2. Press ESC to return to the main menu and select OTHER MEASUREMENTS > VIEW RECEIVED DATA (Results iconcolor test set). F. 3. Change Rx/ DROP to L1-Rx. Press GRAPH and verify that you are in THRU Mode. G. You have just verified that Line 2 is being received properly by the test set. Press ESC to return to the main menu and select TEST CONFIGURATION (Setup icon-color test set). • Verify that the pattern sent by Equipment 2 is shown on all the timeslots. According to Figure 120. 4. Note: The circuit will be disrupted for a few seconds while the cords are moved. and no red LEDs. Press LED to acknowledge any blinking LEDs. Configure as follows: TEST MODE: E1-MUX E1 TX/INST: L1-TX RX/DROP: L2-RX FRAMING: as provisioned CRC-4: as provisioned L1-Rx Port: TERM L2-Rx Port: TERM TX CLOCK: L1-RX 174 SunSet E20/c . framing. 6. • Verify that the PAT SYNC LED is green. With reference to Figure 120. Press ESC to return to the main menu and select TEST CONFIGURATION (Setup icon-color test set). 7. • Verify that the pattern transmitted by Equipment 1 is shown on all available timeslots in this screen. and no errors. Connect the cord from Line 2 TX to the IN jack of Equipment 1. you should see the 0000 pattern on all timeslots. H. • You should see green LEDs for CODING.E. Verify that the test set’s LEDs for Line 1 and Line 2 show proper framing. Press ESC to return to the main menu and select OTHER MEASUREMENTS > VIEW RECEIVED DATA (Results iconcolor test set). The data displayed refers to Line 1 Rx. the data displayed refers to Line 2 Rx. Since you selected Rx/DROP= L2-Rx in TEST CONFIGURATION. 8. you should see the 1-4 pattern.

Since you have selected the datacom type for BERT on TEST CONFIGURATION. • Even if you have selected only a few Nx64 timeslots in TEST CONFIGURATION. Ch. Datacom Device DTE Test Pattern 511 SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY Terminal Equipment 2 OUT L2-Rx 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR SunSet E20 Terminal Equipment 1 L1-Rx OUT L1-Tx L2-Tx Multiport IN F1 F2 F3 F4 IN SUNRISE TELECOM I N C O R P O R A T E D A F1 B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 MON E PRINT F# AUTO * MON 4 5 MEAS 7 8 Test Pattern 1-4 0 SHIFT ESC ENTER Test Pattern 0000 POWER Figure 121 Emulating Add/Drop MUX 10. Connect the test set to the datacom device through the multiport as shown in Figure 121. 11.DATACOM TYPE: Interface type of connector TxSRC: E1DRP MUX B-LED : DTCM E1INS: E1DRP E1T/S: as required 9. Press LED to acknowledge any blinking LEDs. Verify that the test set is receiving the DTE’s test pattern on its multiport. Press ESC to return to the main menu and select OTHER MEASUREMENTS > VIEW RECEIVED DATA (Results iconcolor test set). • Verify that the PAT SYNC LED is green and no red error LEDs are present. • For Figure 121. expect to see the datacom pattern on all timeslots here. the pattern received on the multiport should be displayed. you should see 511. 4 Applications 175 .

you will need to plug a second test set into its monitor jack. here ALL ZEROES. For this reason. but it inserts the signal received on the multiport on the Nx64K timeslots selected in TEST CONFIGURATION on L1-Tx. 16.048M L1-Rx Port: MONITOR L2-Rx Port: MONITOR TX CLOCK: INTERN 15. the test set transmits the signal received on L1-Rx. 17. as well as on the TX/multiport. for the main menu select TEST CONFIGURATION and configure as follows: TEST MODE: E1DUAL Tx/INSERT: L1-TX RX/DROP: L1-RX TXSRC: TESTPAT FRAMING: as required CRC-4: as required TEST RATE: 2. 176 SunSet E20/c . 18. you must verify that the test set is inserting the datacom’s signal on the selected timeslots. Equipment 2 is the best place to check the test set’s insert capability. Press LED to acknowledge any blinking LEDs. Connect Line 1 RX to the MON jack of Equipment 2.12. Verify that the Datacom’s pattern is on the selected timeslots and that Equipment 1’s pattern is on the other timeslots. You have just verified the proper insert operation of the test set. In the previous steps. 14. If Test Equipment 2 is not capable of displaying its received data. Press ESC to return to the main menu and select OTHER MEASUREMENTS > VIEW RECEIVED DATA (Results iconcolor test set). on all the other timeslots. Equipment 2 should receive the Datacom’s pattern. on the selected timeslots and Equipment 1’s pattern. On the second test set. here 511. 13. On Line 1. you have verified that the test set is receiving a proper signal on both E1 Line receive jacks. Next.

On the other hand. 5 Datacom 177 . analog logic has a range of possible states. Therefore. When graphed. recent applications of data communication include voice. demodulation is the inverse. These bits can have two defined states. Since the rapid technological development in the areas of ICs (Integrated Circuits). almost every form of communication can be transmitted digitally. data is stored in individual bits. A Modem (as in Modulation/ Ch. 5. while digital signals are square. video and image digitization.Chapter 5 Datacom 5.1 Communication Components DTE Host Computer DCE Analog Facilities DCE DTE Terminal Modem Telephone Line Modem Figure 122 Data Communication Facilities In digital computers. 1 (on) and 0 (off). however. it is important to understand the components and the process in a data communications network.1 Technology Overview-Introduction Data communication touches upon every area of our lives.1. phone lines carry analog signals. since it is always changing. The modem on the other end picks up these tones and turns them back into digital signals that are sent to the receiving computer. is analog. Modulation is the process of converting the digital waveform into an analog signal suitable for phone line transmission. A modem reads the computer’s digital signals and converts them into tones that can be sent over the phone line. Sound. Due to the accuracy and cost effectiveness of digitizing. this data must be converted into an analog signal. analog to digital. analog signals are sine waves. Most people associate data communication with computers. In order for a computer to send its digital data over the phone line.

Demodulation) carries out these processes. Figure 122 depicts the relationship between these data communication terms and your everyday equipment. 5. the channel is half-duplex. The presence of carrier does not necessarily mean that there is data transfer. This is the actual pipeline that allows the data to travel from DCE to DCE. The three major components of data communication are: the terminal. A host computer is a large computer system which is able to run programs from several different users at the same time. A carrier is a continuous sine wave signal that passes over the medium. The terminal equipment is referred to as DTE (Data Terminal Equipment). The Modem is called DCE (Data Communication Equipment) and sometimes Data Set. This digital data is then transmitted to a host computer. The channel’s capacity is equal to the number of bits per second it can carry. A secondary channel is not always present in modems.2 Transmission Basics The communications medium is composed of a primary channel and a secondary channel. 178 SunSet E20/c . A channel has the capacity to transfer data in either direction. and the host computer. one for each direction. the modem. then the channel is called full-duplex. analog information (meaning information from the outside world) is translated into digital format. When only one direction can be active at a time. The secondary channel’s capacity is always less than that of the primary channel. the data must be modulated.1. When both directions can be active simultaneously. In order to send data from DCE to DCE. Another associated concept is that of carrier. At the terminal. each channel actually has two signals.

which sends groups of characters in a single stream. A full-duplex channel can send data in both directions simultaneously. the modems must be in perfect synchronization with each other. The idle time between characters is eliminated. The first bit of a character immediately follows the last bit of the previous character. duration. where they are prepared to be sent in a stream. The Method of Payment In a Switched circuit. however. A start bit is sent by the sending modem to say that it is going to send a character. line maintains a permanent connection between two points. and termination of the call. It then sends the character and follows with a stop bit which states that the transfer is complete. 5 Datacom 179 . Ch. a customer is charged for the setup. For example. there are no start/stop bits. data is coded into a series of pulses with a start and stop bit. data is sent via a bit stream. In order for this stream to be sent.5. a line connecting two modems is Point-to-Point. After transmission of the character. only one direction can be active at a time. A dedicated. Modems gather groups of characters into a buffer. A Point-to-Multipoint circuit can connect several different devices.1. The Number of Connected Devices A Point-to-Point circuit connects two devices. The Method of Transmission In asynchronous transmission. The customer pays a fixed rate for this connection. Circuits can differ in the following ways: • • • • The direction of transmission The number of devices that are connected to the network The method of customer payment The method of transmission The Direction of Transmission A simplex channel transmits data in only one direction. A normal telephone call uses a switched circuit.3 Data Networks Here is a brief introduction to the various options available in data networks. aka leased. In synchronous transmission. A halfduplex channel transmits in either direction. the line can send the next character with start/stop bits or can go into an idle state (here it remains in the mark 1 position).

Since both carriers can be present simultaneously in a full-duplex circuit. CAR_DET. RTS. This procedure pertains to a full-duplex circuit. Clear To Send. indicates that the carrier has been turned on and so the DTE may begin to transmit its data. the West DTE happens to be first. The East DCE senses that the Eastbound carrier from the West DCE is now present. It turns on the Eastbound carrier. The West DTE sends RTS to the West DCE. means that the DCE has sensed an incoming carrier.4 Call Control Procedure Digital RS232 Cable West DTE RTS On West DCE Activate Carrier CTS On Analog Phone Line East DCE CAR_DET On Eastbound Carrier Present Both Carriers Present Demodulate Carrier Modulate Carrier Digital RS232 Cable East DTE RTS On CAR_DET On Tx Data On Rx Data On Tx Data Off RTS Off CTS On Modulate Carrier Rx Data On Tx Data On Rx Data Off Demodulate Modulation Carrier CAR_DET Off Figure 123 Full-Duplex Call Procedure A standard call procedure is outlined in Figure 123 and described below. as shown in Figure 123. it does not matter which side turns on RTS first. For half-duplex circuits.5. the side to transmit first must be arranged beforehand. This alerts the East DTE that it should shortly receive data from the West. tells the modem to activate its outgoing carrier. CTS. it sends CAR_DET to the East DTE. 180 SunSet E20/c . Carrier Detect. RTS results in two steps for the West DCE.1. Consequently. Request To Send. and also sends CTS back to the West DTE. In Figure 123.

where it is demodulated and sent on the Receive data wire. the West DCE begins to modulate its carrier. When the East DTE has finished transmitting its data. 5 Datacom 181 .The East DTE also turns on its RTS. This results in the same steps as outlined above for the West. The East DCE senses the loss of carrier and turns off CAR_DET. they can begin to transmit data on the Transmit Data wire. Ch. The East DTE receives exactly what was sent by the West DTE. the same steps are followed. The East DCE begins modulation and sends the analog information to the West DCE. both carriers are present. The data is sent to the East DTE. The West DCE. The West DCE turns off CTS and deactivates its carrier. recognizing the incoming (Westbound carrier) turns on the CAR_DET to the West DTE. It also sends CTS back to East DTE. it turns off its TX wire and the East DTE turns off its Rx wire. The RTS is received by the East DCE. A similar procedure takes place when the East DTE places data on its Tx wire. both carriers are active. The West DCE demodulates this data and sends it to the West DTE on the Rx wire. but no modulation or data transfer has taken place. At this stage. The East DCE now activates its Westbound carrier and thus. When the West DTE places data on its Tx wire. When the West (or East) DTE has sent all its data. The West DTE turns off RTS. When the West and East DTE recognize that the CTS signal is on.

from the DCE. Pins E & H: When the DCE is powered on. X. S. The OSI standard is commonly used. Pin P. we will use a V. AA. etc.5.1. Pins C & D: The DTE can use RTS (Request to Send) on pin C. it transmits a DTR (Data Terminal Ready) on pin H. T: The DTE transmits data on pins P. T. some frequently used standards are TCP/IP. T. Pin N: Initiates a remote loopback (RL) Pin L: Initiates a local loopback (LL) Pin Y. At the upper layer protocol. T are for the DTE to transmit and receive data. DCE and DTE are represented by a modem and a computer respectively. X are used for clocking purposes. the DTE receives a DSR (Data Set Ready) on pin E. and receives CTS (Clear to Send) on pin D. For discussion. For the physical layer functions. Pin Y. HDLC and X. R.35 is the more dominant standard used internationally. X: Used for the receive clock The following pin connections are required as minimum between a DTE and DCE: P. Figure 124 V. Y.35 interface.35 DB-34 Interface 182 SunSet E20/c . When terminal is ready. AA and V. and B. V. AA: Used for the transmit clock Pin V. S & R. Pin B is the signal ground between the DTE and the DCE. Also for the purpose of discussion. S and R. The physical level also has an extensive suite of standards available. Refer to Figure 124 for a brief description of each pin function: NN JJ DD Z X V T U W S R N P M L J K H F D E C B LL FF BB MM HH CC Y KK EE AA A Pinout & Usage Pin B: Ground Pins P.35 DB-34 pin connector to illustrate the physical layer functions. This is reversed for the DCE.25. Pin F: The modem asserts DCD (Data Carrier Detect) whenever it receives a signal on the telephone line that meets its internal criteria for amount of energy at the carrier frequency. and is not in test mode.5 Physical Layer Protocol Data communication processes involves protocol.and receives data on pins R. V. Figure 124 shows the pin assignment of a V. S.

Ch. F1).2. • • • The 2. X. Figure 125 displays the DATACOM Configuration screen. F3) Type determines the electrical interface at the multiport. Press the F-key corresponding to the desired interface type: • • • RS449 is analogous to V.5. RS449 (F2).21 MORE Figure 125 Test Configuration-DATACOM 5. also select RS449 for an RS530/ EIA530 interface X.048 Mbit/s interfaces are ignored.35. RS232A (more.1 Test Configuration The following items should be configured for the DATACOM Mode: TYPE Options: V. 5 Datacom 183 .2 Datacom Menus 5. You test only the low speed synchronous/asynchronous signal on the DATACOM port.703.21 (F3).35 RS449 : : : : : : : : : DATACOM V. and RS232.36.24.2.4k INTERN NORMAL NORMAL DCD DSR X.1 Datacom Mode Test Configuration The DATACOM Test Mode provides testing using standard protocols V. 15:12:46 TEST CONFIGURATION TEST MODE TYPE MODE TEST RATE TxDATA CLK TxCLK POLAR CLK POLAR USER LED 1 USER LED 2 V.11 RS232S and RS232A is analogous to V. RS449. X.21 is analogous to V. RS232S (more.35 (F1). A is Asynchronous and S is Synchronous. G.21. G. F2).703 (more.35 DCE 38.1.

21/DTE X.4K 48K 300 2400 14.703. X.4K 9600 38.35 adapter without a termination resistor (SS267) with the SunSet E20.4K 48K 300 2400 14. • In some cases the SunSet E20/E20c may overload datacom signals in the bidirectional monitor mode.2K Nx64K Nx56K RECEIVE 1200 600 9600 4800 38. DCE: Use to emulate Data Circuit Equipment. Make sure to use a V.35. select from 01-08 for N 1200 600 9600 4800 38.2K Nx64K Nx56K Nx64K. For G.4K TYPE/MODE V. RS449. Mode is forced to CO-DIRectional. TEST RATE Options: The TEST RATE options available to you depend upon the TYPE and MODE selected.MODE Options: DTE (F1). Refer to Table 8. MON (F3) The MODE options depend upon the specific chosen TYPE.35/DTE or DCE RS449/DTE or DCE F1 300 2400 14. • For V. SS254/Y. TEST RATE F2 F3 1200 600 9600 4800 38. Specifically.2K 1x64K 1x56K 300 150 2400 1200 14.703/CO-DIR RS232S/DTE or DCE MORE RS232A/DTE or DCE MORE Table 8 Type Versus Test Rate 184 SunSet E20/c . For V. DCE (F2).2K Nx64K Nx56K 1200 600 9600 4800 38. Notes: • Make sure to use connectors specific to the SunSet E20 (SS253/Y. SS262-B. other connectors may look similar (such as those provided for the SunSet E8 or SunSet E10). but they can vary considerably.4K 19. do not use the SS252 for SunSet E20/E20c DTE or DCE testing.4K 19.4K 48K 300 2400 14. RS232A/S: • • DTE: Use to emulate Data Terminal Equipment to plug the test set into DCE equipment. and affect signal amplitude. Misuse of the adapter could lead to uncertain results.4K 19.21/DCE MORE G. SS256B. SS255/Y.35 and RS449 monitoring.4K 19. SS267/Y). the test set will present a terminating resistor to the line which could cause a double termination. to plug the test set into DTE equipment.21.4K 48K 50 600 4800 19.2K F4 MORE MORE X.

The test set is then in slave timing.21 (where DTE is automatically receive and DCE is automatically internal). TxDATA CLK Options: INTERN (F1). Notes: • For DCE. This determines the transmit signal clock source. the TxDATA CLK is set by default to RECEIVE. this setting does not apply to RS232 Asynchronous signals.703’ message. Press ENTER to return to TEST CONFIGURATION. 14:52:45 TEST CONFIGURATION SELECT RATE 01 09 17 25 02 10 18 26 03 11 19 27 04 12 20 28 05 13 21 29 06 14 22 30 07 15 23 31 08 16 24 32 Figure 126 Select Fractional Rate Note: If you are in G. Clocking applies only to synchronous transmission. Thus. • RECEIVE: This uses the signal received at the DATACOM port as the transmit signal clock source. 5 Datacom 185 . this item will not appear in the menu. Ch. • INTERN: Use to select the test set’s internal clock. • For DTE.If selecting any of the Nx56K or Nx64K rates the following screen appears. 1. the TxDATA CLK is set by default to INTERN. RECEIVE (F2).703 Mode and you attempt to select a rate of 9 or above you will see a ‘Not valid for G. The test set is the master timing source on the circuit. • For X. Use the keypad arrow keys to select the rate 2.

186 SunSet E20/c . A stop bit signifies the end of a byte. They appear in the menu if the RS232A Mode is selected: 15:12:46 TEST CONFIGURATION TEST MODE INTERFACE MODE TEST RATE BIT/CHAR STOP BITS PARITY USER LED 1 USER LED 2 14.2K Figure 127 Datacom RS232A Configuration Screen BIT/ CHAR Options: 6 (F1).703 interface When the transmit or receive clock polarity is inverted. • The following three items apply only to asynchronous datacom transmission. STOP BITS Options: 1 (F1). 7 (F2). 8 (F3) Determine how many bits will be transmitted for each character of information.CLK POLAR/TX CLK POLAR/ RCV CLK POLAR Options: NORMAL (F1). and the test set will transmit data with 180 degree phase difference with the clock.4k 8 1 NONE DCD DSR 38. When the transmit or receive clock polarity is NORMAL. the test set will receive and transmit data in alignment with the clocking. 2 (F2) Determine how many stop bits will be transmitted for each character of information. the test set will assume data is received with 180 degree phase difference with the clock.4K : : : : : : : : : DATACOM RS232A DTE 38. This applies to the co-directional G.4K MORE 19. INVERT (F2) • • The Clock Polarity affects both TX and RX at the same time.

21 RE449/ V.36 X X X X X X X X EIA530/ RS422 X X X X X X X X X X Table 9 Lead States Ch. An extra bit. NONE: signifies no parity checking USER LED 1/2 Options: Depends on your TYPE and MODE. EVEN: the total number of ones (including the added parity bit) is even. The receiving element checks the parity bit and indicates an error if the total number of ones does not add up to the correct total.35 X X X X X X X X X X X Synchronous X. ODD (F2). Select the lead states you want the USER LEDs to show. • • • ODD: the total number of ones (including the added parity bit) is odd. Parity is a method of checking the accuracy of transmitted or stored data.2 for further explanation. NONE (F3) Determine how many parity bits are transmitted for each character of information. known as a parity bit is added to the data as an accuracy check. DTE/ DCE Leads DSR DTR DCD T (REF) CLK TxCLK RxCLK RL LL C I S Asynchronous RS232 X X X RS232 / V. 5 Datacom 187 .24 X X X X X X X X V. see Table 9 and refer See Section 2.PARITY Options: EVEN (F1).

the DATACOM INTERFACE item appears in the main menu of the SSE20. 15:32:21 SunSet-E20 MAIN MENU TEST CONFIGURATION TEST PATTERN MEASUREMENT RESULT PROTOCOLS DATACOM INTERFACE OTHER FEATURE SYSTEM PARAMETERS LANGUAGE SELECTION Figure 128 Main Menu/Datacom Interface When you enter DATACOM INTERFACE. In color test set’s. you will go into the DATACOM TIMING ANALYSIS screen. 15:40:53 DATACOM TIMING ANALYSIS LIVE TRACER VIEW/PRINT BUFFER Figure 129 Datacom Timing Analysis Menu 188 SunSet E20/c . MUXTEST. or DATACOM Mode in the TEST CONFIGURATION screen.2.2 Datacom Interface When you have selected E1-MUX. the INTERFACE is found in the Results icon.5.

the test set always emulates Data Circuit Equipment (DCE). RS449.35. For example. the test set emulates Data Terminal Equipment. in V. and LL may be set for transmitting For X. the received signals available to monitor are: RTS (Ready To Send). It also allows you to turn on/off the transmit signals.5. the available transmit signals to set are: CTS (Clear To Send). For DCE. in V. and DCD (Data Carrier Detect) For DTE. Signal C. Indication. is the transmit signal for DCE and the receive signal for DTE. when MODE is set to DTE (Figure 130). DSR (Data Set Ready). and RS232. 5 Datacom 189 . DTR. Signal I. when the MODE is set to DTE. and RS232. RTS. as well as the received signals. RL. 22:36:15 DATACOM INTERFACE TYPE . and RS232. is used as the receive signal for DCE MODE and as the transmit signal for DTE MODE. DSR. Thus. CTS.2. and DCD will always be the transmit signals for E1-MUX Mode. The receive and transmit signals are reversed. Note: When the Test Mode is E1-MUX.DTE XMT: RTS: ON DTR: ON RL : ON LL : ON RTS CTS DTR DSR DCD RL LL ON OFF FREEZE MORE Figure 130 Datacom Interface Screen-Graph Signals available in this screen depend on the selected MODE and TYPE. the test set emulates Data Terminal Equipment. DSR. RL (Remote Loopback). Ch.35. and LL (Local Loopback) For V. RS449. the transmit and receive signals change. and DCD are now the receive signals to monitor. Control.21. CTS.RS232 MODE . DTR (Data Terminal Ready).2.35.1 Live Tracer The LIVE TRACER screen displays the MODE and TYPE selected in TEST CONFIGURATION. Refer to Figure 130. RS449.

the test set always emulates Data Terminal Equipment (DTE).473 ON 190 OFF FREEZE MORE SunSet E20/c Figure 131 Datacom Interface-Table . Press ON (F1) or OFF (F2) to change the state. RL. and in which state. FREEZE/RESUME (F3): Use to stop or restart the reporting of lead state data. using the keypad arrow keys. and observe the response time of the system. The arrowhead on the graph line indicates when the test set is capturing traces.473 LL ON 22:36:12. The following F-keys are available: On (F1) and OFF (F2): Use to change the state of the highlighted lead. 2.473 DTR ON 22:36:12. and its On/Off state.473 CTS OFF 22:36:12.DTE XMT: RTS: ON DTR: ON RL : ON LL : ON PAGE : 011 RTS ON 22:36:12. Move the cursor to the control leads you want to change. indicated by the height of the graph line. 1. and LL leads: A. RL. • The leads available to observe depend on your TYPE and MODE settings. The user may also observe how long each datacom lead was active.473 DSR OFF 22:36:12. When G.473 DCD OFF 22:36:12.RS232 MODE . RTS.473 RL ON 22:36:12. DTR. This feature allows the user to change the status the control leads. Refer to Figure 131.703 Type is chosen in the TEST CONFIGURATION screen.When the Test Mode is MUXTEST. Thus. Observe each lead. Datacom Timing The timing in Datacom Analysis is often a critical issue. B. DTR. the Datacom Interface screen is not available. and LL will always be the transmit signals for MUXTEST Mode. You may change the status of the RTS. 22:36:15 MEAS DATACOM INTERFACE TYPE . TABLE/GRAPH (F4): Use to change the presentation of the data (Figure 131).

The word ‘Trig’ will be present at the top of the screen. • When a change of state is found. LL (MORE. For example. F3). a change of state at the DTR falling edge. Press ENTER and the test set will begin to look for a change of state as defined by the LEAD and EDGE parameters above. Ch. Options: RISING (F1). 5 Datacom 191 . you will also see the TIME the state of a lead last changed. TRIGON (more. DCD (MORE. RL (MORE. FALLING (F2) 3. F2). 15:12:46 DATACOM TIMING ANALYSIS TRIGGER LEAD : CTS EDGE : RISING Press Enter to START the TRIGER RISING FALLING Figure 132 Start Trigger Start Trigger 1. indicating the test set is in Trigger mode. 4. DTR (F3). When FREEZE is selected. Press ESC to return to the display without setting a trigger. your trigger could be a loss of data. the test set will present the data.In TABLE mode. F1 ): Press to set a Trigger. LEAD: Determine which Lead you want to capture. CTS (F2). EDGE: Determine which edge to look at for a change of state. new F-keys appear: • Use PREVIUS (F1) and NEXT (F2) to scroll through the pages of data. A page is available for each change of state. DSR (MORE. F1) 2. F1). You will return to the display screen. Options: RTS (F1). this way the test set will only capture the specific data you are looking for.

F3 becomes GRAPH.3 View/Print Buffer Observe or print the stored captured data. including time of each change of lead state.5. Press TABLE (F3) to see a TABLE view of the data.RS449 MOTE . Refer to Figure 133 for a sample screen: 22:36:15 DATACOM TIMING ANALYSIS TYPE . though time.2. In Table mode. See Figure 134 for a sample of each display.DTE RTS CTS DTR DSR DCD RL LL PREV NEXT TABLE PRINT Figure 133 View/Print Buffer-Graph • • • Use PREV (F1) and NEXT (F2) to move the lines. to return to the Graph screen. the last 40 seconds of captured control lead status for Graphic mode. and up to 100 pages of control lead state changes and status with time stamp for Table mode. Press PRINT (F4) to print the results as they are currently displayed on the screen. 192 SunSet E20/c .

SUNRISE TELECOM-DATACOM TESTING SUNSET E20-#00276 SunSet Version 2.0K RTS CTS DTR DSR : 2001-06-25 14:13:21 MODE : DCE DCD RL LL 14:11:02.947 14:11:03.100 CTS RTS RL CTS DCD DSR ON ON ON OFF OFF OFF DSR DTR LL ON ON ON DCD ON 14:11:02.039 Print DATACOM results. 5 Datacom 193 .00 PRINTED AT TYPE : RS449 RATE : 64.099 14:11:04.00 PRINTED AT TYPE : RS449 RATE : 64. Table View Figure 134 Datacom Printouts Ch.0K : 2001-06-25 14:15:25 MODE : DCE STATUS AT STARTING TIME : 14:10:58.099 14:11:04.947 14:11:03.039 Print DATACOM results. Graph View SUNRISE TELECOM-DATACOM TESTING SUNSET E20-#00276 SunSet Version 2.

See Chapter 3 for Measurement Results Definitions.48000 RxDLS .0 STOP MORE Figure 135 Datacom Summary Results-Page 1 Here are the definitions specific to this screen: RxDL: This is a count of the number of occurrences of received Data Loss. and Figure 137 for page 2 block error results. MEAS ET . in hertz.V. RxHz: Received data rate.5. 3 pages of measurement results are available for Datacom.2e15 RxDL .000:01:27 15:12:46 RT .0 BIT .CONTINU DATACOM-SUMMARY TYPE . MODE: Selected mode.0 PATLS .35 TxHz .0 PAGE-UP PAGE-DN MODE . RxDLS: This is the number of seconds during which data was lost. 194 SunSet E20/c . as set in TEST CONFIGURATION.DCE RxHz .48k PAT . in kilohertz. TxHz: Transmitted data rate. as selected in TEST CONFIGURATION.4 Datacom Measurement Results • • • Observe results for both directions of the Datacom signal. See Figure 136 for page 1 bit error results. PATLS: Pattern Loss Seconds indicates the number of seconds during which pattern was lost.0 BER . Figure 135 shows you the Datacom Summary screen. The results screen present some common information: TYPE: Datacom type.0 PATL .2. PATL: This is a count of the number of occurrences of Pattern Loss.

Ch.295 UAS .511 DATACOM BIT ERROR BIT .000 00.000 MORE STOP Figure 136 Datacom Measurement Results-Page 2 Results definitions specific to this screen are: SLIP: This is the number of pattern slips which have occurred.48k RxHz .0 SLIP.48001 PAT .000:01:27 PAT.0e-05 PAGE-UP PAGE-DN STOP MORE Figure 137 Datacom Measurement Results-Page 3 Definitions specific to this screen are: # of BLOCKS: This shows the total number of blocks received BLOCK ERROR: Block error shows the number of blocks which contain any number of bit errors.000 100 100 00.CONTINU TxHz.000:04:55 RT .the number of blocks received with 1 or more bit errors (BLOCK ERROR) divided by the total number of blocks received (# of BLOCKS).2e15 Meas RT .295 AS .0 EFS .3e-06 00.0 SES . BLK ERR RATE: The block error rate refers to the fraction of blocks in error. 5 Datacom 195 . 15:12:46 ET .CONTINU RxHz .MEAS 06:45:12 ET .48000 DATACOM BLOCK ERROR MEASUREMENT BLOCK SIZE # OF BLOCK BLOCK ERROR BLK ERR RATE 1000 68688 0 0.0 ES .0 PAGE-UP PAGE-DN RATE %ES %SES %EFS %AS %UAS 2.

000:01:27 RT .1200 RxPa .Here is the DATAMON Summary screen: MEAS 15:12:46 ET .1200 RxHz .10 RxDL RxDLSPATL PATLSBIT BER STOP 1 2 0 0 0 MORE PAGE-UP PAGE-DN Figure 138 DATAMON Results Here is the measurement specific to this screen: RxPA: This is the received pattern. 5. 196 SunSet E20/c .50 manual for information on using X. 1010 in Figure 138. DATAMON presents you with a G.1010 RxDL RxDLSPATL PATLSBIT BER 1 66 1 10 1 0. for both the DTE and DCE sides.CONTINU DATAMON .1010 TxPa .821 Bit Error screen. similar to Figure 136.2.5 Other Measurements See the X.RS449 DTE DCE RxHz .50.SUMMARY TYPE .

5. MEAS 15:12:46 VIEW RECEIVED DATA INTERFACE .2. Use PAGE-UP (F1) and PAGE-DN (F2) to scroll through the results.DTE PAGE .01 BYTE BINARY 00 00011011 01 00001110 02 01000100 03 11011010 04 01001010 05 00100010 06 10100001 07 00110000 PAGE-UP PAGE-DN PAUSE Figure 139 Datacom View Received Data Ch.5. then press RESUME (F3) to continue the live presentation of data. Press PAUSE (F3) to freeze the results for easy viewing.35 FROM . 5 Datacom 197 .1 View Received Data • • • Observe the digits for each byte.V.

and want to recalibrate the measurement to see the propagation delay between two devices. 2. 5. A UI (Unit Interval) equals 488 µS. representing 10. The unit will be able to measure delays of up to five seconds at a rate of 2. not including the test set.240. The circuit must be looped back at the far end in order for the test set to perform this measurement.2.000 unit intervals at 2.5. 198 SunSet E20/c .5. This number is translated into an exact number of µS of round trip delay. select OTHER MEASUREMENTS > PROPAGATION DELAY (color test set-Results icon). The measurement will automatically be performed and displayed. Press CALIB again to take measurements further down the line.6 Protocols Frame Relay Refer to the Frame Relay user’s manual. 01:44:02 Meas PROPAGATION DELAY ROUNDTRIP DELAY: 460000 ROUNDTRIP TIME: 220000 OFFSET:0 analysis completed UI uS UI RESTART CALIB Figure 140 Propagation Delay The test set measures the number of unit intervals required for a round trip through the line. at 2.048 Mbit/s.048 Mbit/s. • Press CALIB (F2) if you have more than one looped device on the line. From the main menu.2 Propagation Delay The PROPAGATION DELAY screen (Figure 140) displays the propagation delay of a looped back signal.2.048 Mbit/s. Use this procedure: 1. Observe the OFFSET to see the delay between the two devices (taking the test set to Equipment 1 measurement out of the delay measurement). • Press RESTART (F1) to perform another measurement.

19 20.9 21 18 7 Figure 141 RS530 Pin-out Ch.12 13.6 7.20 21.13 8. 5 Datacom 199 .30 3.23 24.12 17.21 (ISO 4903) RS-232 (ISO 2110) RS-530 (ISO 2110) 19 37 13 25 DB-37 1 20 SS262-B 1 DB-25 14 Connections Between Pins RS-530 DCE HDI-30 Pin 2.24 25 26 29 Function TxD RTS DTR T CLK RxD DSR CTS DCD TxCLK RxCLK RL LL GND DB-25 Pin 2.18 19.4 5.12 2.5.16 6.30 3.6 7.22 23.8 13.11 21 18 7 Connections Between Pins RS-530 DTE HDI-30 Pin 2. The available interfaces are: • • • • • • V.9 15.19 20.20 27 28 29 Function RxD CTS DSR DCD RxCLK TxCLK TxD RTS DTR T CLK RL LL GND DB-25 Pin 3.13 6.10 11.16 5.23 24.16 17.10 17.14 15.4 5.14 4.18 19.35 (ISO 2593) G.22 5.3 Datacom Interface Pin-outs Figures 141-148 depict the datacom interface pin-outs.14 4.703 kbit/s co-directional RS-449 (ISO 4902) X.16 17.11 3.22 8.14 15.8 9.10 15.

A DB-37 Male 20 1 B DB-37 Male C DB-37 Female 1 20 SS255Y 37 19 1 20 19 37 19 37 Function Shield Signal Ground RD (a) from DCE RD (b) SD (a) to DCE SD (b) ST (a) from DCE ST (b) RT (a) from DCE RT (b) TT (a) to DCE TT (b) RS (a) to DCE RS (b) CS (a) from DCE CS (b) RR (a) from DCE RR (b) DM (a) from DCE DM (b) TR (a) to DCE TR (b) LL to DCR RL to DCE A DB-37 Male 1 19 6 24 4 22 5 23 8 26 17 35 7 25 9 27 13 31 11 29 12 30 10 14 B DB-37 Male 29 29 14 13 2 30 22 21 24 23 8 7 4 3 16 17 20 19 16 15 6 5 28 27 DB-37 C Female 1 19 6 24 4 22 5 23 8 26 17 35 7 25 9 27 13 31 11 29 12 30 10 14 Figure 142 RS449 Y Cable Pin-out 200 SunSet E20/c .

19 37 13 25 DB-37 1 20 SS254C/T 1 DB-25 14 Connections Between Pins RS-232 DCE DB-37 Pin 2 14 17 4 6 16 8 9 12 27 28 20 29 Function RxD TxD RTS CTS DSR DTR DCD TxCLK RxCLK RL LL REFCLK GND DB-25 Pin 3 2 4 5 6 20 8 15 17 21 18 24 7 DB-37 Pin 2 4 6 8 14 17 16 20 22 24 25 26 29 Connections Between Pins RS-232 DTE Function TxD RTS DTR T CLK RxD CTS DSR DCD TxCLK RxCLK RL LL GND DB-25 Pin 2 4 20 24 3 5 6 8 15 17 21 18 7 Figure 143 RS232 Pin-out Ch. 5 Datacom 201 .

21 Pin-out 202 SunSet E20/c .19 37 9 15 DB-37 1 20 SS253C/T 1 DB-15 10 Connections Between Pins X.21 DCE DB-37 Pin 14 13 2 30 18 17 4 3 6 5 29 Function Tx In (a) Tx In (b) Rx Out (a) Rx Out (b) CTRL In (a) CTRL In (b) IND Out (a) IND Out (b) CLK (a) Out CLK (b) Out GND DB-15 DB-37 Pin Pin 2 9 4 11 3 10 5 12 6 13 8 2 30 14 13 4 3 18 17 16 15 29 Connections Between Pins X.21 DTE Function Tx Out (a) Tx Out (b) Rx In (a) Rx In (b) CTRL Out (a) CTRL Out (b) IND In (a) IND In (b) CLK (a) In CLK (b) In GND DB-15 Pin 2 9 4 11 3 10 5 12 6 13 8 Figure 144 X.

703 Pin-out Ch.703 DTE HDI-30 Pin 25 26 27 28 Function TxTIP TxRIN TxTIP TxRIN Dual DB-3 Pin 1 Plug 1 2 Plug 1 1 Plug 2 2 Plug 2 Figure 145 G.1 36 18 19 1 SCSI-36 DB-3 1 2 3 1 DB-3 1 2 3 1 2 3 19 37 1 DB-3 1 20 DB-37 1 DB-3 1 2 3 Connections Between Pins G. 5 Datacom 203 .

A 34 Pin M-Block Male B DB-37 Male C 34 Pin M-Block Female SS267Y 1 19 37 B F L R V Z DD JJ NN A D E J H K P T U X Y BB CC FF HH LL MM C H M S W AA EE KK 20 C H M S W AA EE KK A E K P U Y CC HH MM D J H T X BB FF LL B F L R V Z DD JJ NN Function Shield Signal GND TD (a) to DCE TD (b) RD (a) from DCE RD (b) SCTE (a) to DCE SCTE (b) SCR (a) from DCE SCR (b) SCT (a) from DCE SCT (b) RTS to DCE CTS from DCE DSR from DCE DTR to DCE LL to DCE RL to DCE DCD from DCE A 34 Pin Male A B P S R T U W V X Y AA C D E H L N F B DB-37 Male 29 29 2 30 14 13 8 7 20 19 18 17 4 22 16 6 28 27 24 34 Pin C Female A B P S R T U W V X Y AA C D E H L N F Figure 146 V.35 Pin-out 204 SunSet E20/c .

20

1

DB-37
37 19

SS267C

34 Pin M-Block Female

C H M S W AA EE KK

A E K P U Y CC HH MM

D J H T X BB FF LL

B F L R V Z DD JJ NN

DB-37 Male 29 29 14 13 2 30 18 17 10 9 8 7 22 4 6 16 28 27 12

Function Shield Signal GND TD (a) to DCE TD (b) RD (a) from DCE RD (b) SCTE (a) to DCE SCTE (b) SCR (a) from DCE SCR (b) SCT (a) from DCE SCT (b) RTS to DCE CTS from DCE DCS from DCE DTR to DCE LL to DCE RL to DCE DCD from DCE

34 Pin Female A B P S R T U W V X Y AA C D E H L N F

Figure 147 V.35 DCE Pin-out Ch. 5 Datacom 205

20

1

DB-37
37 19

SS267T

34 Pin M-Block Male

B F L R V Z DD JJ NN

D J H T X BB FF LL

A E K P U Y CC HH MM

C H M S W AA EE KK

DB-37 Male 29 29 4 22 16 24 6 26 25 2 14 30 13 8 20 7 19 18 17

Function Shield Signal GND RTS to DCE CTS to DCE DCS from DCE DCD from DCE DTR to DCE LL to DCE RL to DCE TD (a) to DCE RD (a) from DCE TD (b) to DCE RD (b) from DCE SCTE (a) to DCE SCR (a) from DCE SCTE (b) to DCE SCR (b) from DCE SCT (a) from DCE SCT (b) from DCE

34 Pin Female A B C D E F H L N P R S T U V W X Y AA

Figure 148 V.35 DTE Pin-out 206 SunSet E20/c

5.4 Applications
5.4.1 Point-to-Point Datacom Testing

SIGNAL

PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET

AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM

POWER BATTERY

SIGNAL

PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET

AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM

POWER BATTERY

1

CODE ERR ERROR SIGNAL

1

CODE ERR ERROR SIGNAL

2

CODE ERR RxDCE RxDTE ERROR

2

CODE ERR RxDCE RxDTE ERROR

SunSet E20

SunSet E20

Test set 1 Datacom Port

F1

F2

F3

F4

Test set 2 Datacom Port

F1

F2

F3

F4

SUNRISE TELECOM
I N C O R P O R A T E D

SUNRISE TELECOM
I N C O R P O R A T E D

A F1 E

B F2 1

C F3 2 GRAPH

D F4 3 ERR INJ 6 LED 9

A F1 E

B F2 1

C F3 2 GRAPH

D F4 3 ERR INJ 6 LED 9

PRINT F# AUTO 7 4

*

PRINT F# AUTO 7 4

*

5 MEAS 8

5 MEAS 8

0 SHIFT ESC ENTER SHIFT ESC

0 ENTER

POWER

POWER

Modem V.35 DTE Interface V.35 DCE Interface

Modem V.35 DCE Interface V.35 DTE Interface

Figure 149 V.35 Datacom Test

Data communication uses a standard interface in order for two equipment elements to communicate with each other. For example, V.35 is a commonly used interface. In this test, we will use the V.35 as the data communication interface. Use the test set to send an receive the signals with another data communication equipment. Use the following procedure: 1. Verify that the datacom circuit is not in service. This test will disrupt the service. 2. Select TEST CONFIGURATION and configure the interface as follows: TEST MODE: DATACOM TYPE: V.35 MODE: DTE TEST RATE: as specified by the span design TxDATA CLK: RECEIVE CLK POLAR: as specified by the span design USER LED 1/2: as desired Ch. 5 Datacom 207

Note: If the test set must supply the clock then select INTERN for TxDATA CLK. If the test set should follow timing from the network select RECEIVE. 3. Connect the two test sets to the circuit as shown in Figure 149. 4. Press ENTER to return to the main menu and select DATACOM INTERFACE > LIVE TRACER (Results icon-color test set). 5. Examine the status of the control leads. The terms are defined as follows: CTS: Clear to Send DSR: Data Set Ready DCD: Data Carrier Detect 6. On the transmit side, turn the following signals ON or OFF, to test whether the other data communication equipment is receiving the test set's signal: RTS: Ready to Send DTR: Data Terminal Ready 7. Verify that the PAT SYNC LED is green on both test sets. 8. Press ESC to return to the main menu and select, MEASUREMENT RESULTS (Results icon-color test set), View the measurement information. • Verify the RxHz matches the TxHz. • Verify there are no slips or errors. 9. Press ERR INJ to verify that you can inject a bit error: • Confirm that the error was received by the far test set.

208

SunSet E20/c

5.4.2 2M Multiplex Datacom Port Testing
To Test Set Datacom Port
SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY

1

CODE ERR ERROR SIGNAL

2

CODE ERR RxDCE RxDTE ERROR

SunSet E20

F1

F2

F3

F4

SUNRISE TELECOM
I N C O R P O R A T E D

2M MUX

A F1 E

B F2 1

C F3 2 GRAPH

D F4 3 ERR INJ 6 LED 9

PRINT F# AUTO 7 4

*

5 MEAS 8

0 SHIFT ESC ENTER

POWER

Figure 150 2M Multiplex Datacom Port Testing

Test the low speed datacom port of a 2M multiplex using the test set in DATACOM mode. 1. From the main menu, select TEST CONFIGURATION (Setup icon-color test set) and configure as follows: TEST MODE: DATACOM TYPE: as required MODE: DTE TEST RATE: as desired TxDATA CLK: RECEIVE USER LED 1/2: as desired TxCLK POLAR: as specified by the span design When your settings are correct, press ENTER. 2. Connect the test set to the circuit as shown in Figure 150. 3. Press the LED key to acknowledge any blinking LEDs. 4. From the main menu, select DATACOM INTERFACE > LIVE TRACER and verify that DATA on the receive side says LIVE. 5. Press ERR INJ to inject an error from the test set. • You can verify that this error returns to the test set by seeing if the BIT ERROR LED lights red. • You may also want to enter MEASUREMENT RESULTS (from the main menu) and make sure that an error has been recorded. 6. You have just checked the low-speed datacom port of the 2M multiplex. Ch. 5 Datacom 209

using a Y cable (SS255Y for RS449). The terms are shown in Figure 151. select DATACOM INTERFACE > LIVE TRACER and observe the control lead changes. From the main menu. and looking at the DTE G. Press TRIGON (F2) to select Trigger states. Repeat the procedure. Verify RxHz. This could cause a double termination and affect signal amplitude. and no errors.5. You should see one Bit Error recorded on the DCE screen. 4. Connect the test set to both the DCE and the DTE equipment. no loss of data. From the main menu.3 Datacom Monitoring SIGNAL PCM-31 PCM-30 CRC DET PCM-31 PCM-30 RTS CTS CRC DET AIS ALARM PAT SYNC BIT ERROR AIS USER1 USER2 ALARM POWER BATTERY 1 CODE ERR ERROR SIGNAL 2 CODE ERR RxDCE RxDTE ERROR DTE DCE To Test Set Datacom Port SunSet E20 F1 F2 F3 F4 SUNRISE TELECOM I N C O R P O R A T E D A F1 E B F2 1 C F3 2 GRAPH D F4 3 ERR INJ 6 LED 9 PRINT F# AUTO 7 4 * 5 MEAS 8 0 SHIFT ESC ENTER POWER Control Lead Terms RTS: Ready to Send CTS: Clear to Send DTR: Data Terminal Ready DSR: Data Set Ready DCD: Data Carrier Detect RL: Remote Loopback LL: Local Loopback Figure 151 Datacom Monitoring This test uses a RS449 interface. as in Figure 151. 2. 210 SunSet E20/c . then press ENTER. Page through the results screens using the F1 and F2 keys. Press ESC to return to the main menu and select MEASUREMENT RESULTS (Results icon-color test set).4. Observe the DTE and DCE results. A terminating resistor will be present in RS449 and V. 3. LEAD and EDGE. C. select TEST CONFIGURATION (Setup icon-color test set) and configure as follows: TEST MODE: DATACOM INTERFACE: RS449 MODE: MON USER LED1/2: as desired When your settings are complete. Observe the Trigger events. this time injecting from the DCE to the DTE.821 screen. A. 5. press ENTER.35 monitoring. such as the DCD lead on a RISING edge to see when Data Carrier Detect goes On. B. Follow this procedure: 1.

If not. Connect the test set to the modem under test. From the main menu. 5 Datacom 211 . then the modem under test is faulty because it can’t transmit the received data back to the test set. From the main menu. 2. Make sure that the transmit leads RTS and DTR are turned on. If the Received data LED of the modem lights up.5. Confirm that the receive and transmit patterns are the same and that the PAT SYNC LED is green.4. A. press AUTO. If there is a discrepancy. the receive data LED should light up. 5. Press ESC to return to the main menu and select MEASUREMENT RESULTS (Results icon-color test set) and verify that the RxHz is equivalent to your Test Rate. your modem has a problem retransmitting the clock. press ENTER. If not. select the lead and press ON (F1).4 Fault Location with Remote & Local Loopbacks This application provides a troubleshooting procedure using the remote and local loopback capabilities of the test set. select TEST CONFIGURATION (Setup icon-color test set) and configure as follows: TEST MODE: DATACOM TYPE: per interface MODE: DTE RATE: per modem TxDATA CLK: INTERN CLK POLAR: NORMAL USER LED 1/2: as desired When your settings are complete. Select LL (Local Loop) and press ON (F1). 4. but not the Transmit data LED. Figure 152 shows a remote and local loopback. B. select DATACOM INTERFACE (Results icon-color test set). If Ch. 3. This activates a loop on your modem. Local Loopback RS-449 Modulator Output DCE Demodulator Output West RS-449 DTE Remote Loopback Phone Line DCE DTE RCV Data DTE East DCE XMT Data Figure 152 Local and Remote Loopback 1.

Now that you have established that the problem is not with the local modem. Press ESC to return to the main menu and select MEASUREMENT RESULTS (Results icon-color test set) and verify that the RxHz is equivalent to the Test Rate. If it is. • Verify that these errors are received by the test set. To test remote loopback. perform a BERT test by pressing the ERR INJ key. • It may also be necessary to set DTR to be always on by using the PC so you don’t drop the line when switching from the PC to test set datacom connector. B. then the local modem is not at fault. it may be necessary to connect a PC to dial out. 8. 7. test the far end modem using a remote loopback. Select RL and press ON (F1). your local modem may have a problem regenerating the pattern. Once the connection is made. If there are problems. Select DATACOM INTERFACE and turn off the Local Loop. A. B. following the procedure outlined in steps 4-8. The BIT ERROR LED should light red and a bit error should be recorded in MEASUREMENT RESULTS.the LED is still red. then the problem is with the phone line. select the lead and press ON (F1). 212 SunSet E20/c . 12. A. 11. then the phone line and the far end modem are working properly. If you have a low RxHz. Verify that these errors come back to you. this indicates a problem with either the phone line or far end modem. 6. and TCLK). If you have completed the above steps successfully. If the BERT test is unsuccessful. B. To test the far end modem. perform a local loopback on that end. Check the PAT SYNC LED. confirm that the far end modem has loopback capability at the interface (confirm that the modem can loop TxDATA to the RxDATA . If there are no problems with this local loopback. Make sure that the transmit leads RTS and DTR are turned on. disconnect the PC and replace it with the test set datacom connector. 9. Press ESC to return to the main menu and select DATACOM INTERFACE (Results icon-color test set). The BIT ERROR LED should be red and a bit error should be recorded in MEASUREMENT RESULTS. 10. If not. RxCLK. A. To use the modem. If this is successful. and also TxCLK. the modem is at fault. 13. It should be green. then the clock is not being received properly from the far end modem. Press ERR INJ to test the validity of your loop.

6. E. D. 6C. 0A. 0C. also known as 2e-9. 32. Here is the pattern: 2A. 1111: This pattern is used for stress testing circuits. and F. 1-4.Chapter 6 Reference 6. 2047: The 2047 code. 04. 9A. 04. CA. in accordance with AMI minimum density requirements. AA. 2A. FOX: The FOX pattern. 22. as shown in its binary form. E2. 8C. 20. 50 QRS: This is the Quasi Random Signal pattern. F2. 8A. The pattern is: f 0101 0101 0000: 0000 is the all zeros pattern. because different feedback mechanisms are used when the patterns are produced by means of shift registers.152. 04. 2. the pattern synch and/or signal will be lost. 7. It is recommended that the pattern be sent with framed signals.1 Standard Test Patterns 2m-1: where m=15. 62. CC. The patterns conform to the ITU O. as an example. 4C. The patterns are frame aligned (‘f’ is the framing bit). AA. 42. 511: The 511 code.153 technical standard. 82. 1. 3. 12. 1-8. 6 Reference 213 . which is used in data communications applications. Hex is a 16-digit number system. A. AC. B2. 4. F2. 8. This pattern conforms to the ITU O. or 3-24: These patterns are used for stress testing circuits.152. 04. This signal is formed from a 20-stage shift register and is not zero-constrained. C. A2. 23: are pseudo random bit sequences. otherwise. 52. 1-4 : f 010 Ch. C2.151 technical standard. 12. ASCII translation is not possible. EA. A2. It is formed from a 20-stage shift register and is zero-constrained for a maximum of 14 consecutive zeros. 4A. Conforms to ITU-T O. as opposed to 14 zeros in 2e20. 04. Conforms to ITU-T O. D2. The ASCII translation of the pattern is the ‘Quick brown fox jumps over the lazy dog 1234567890’ sentence. If the pattern is sent unframed. A2. 20ITU: 20ITU is the 2e20-1 pseudo random bit sequence. it will be interpreted as an AIS (Alarm Indication Signal). 04. The signal is formed from a 15. 72. 4A. 20ITU suppresses consecutive sequences of more than 18 zeros. 5A. 1C. up to 15 consecutive zeros will occur. 9. also known as 2e-11. 1A. 5. The pattern is frame aligned with ‘f’ showing the location of the framing bit. 20 or 23-stage shift register and is not zero-constrained. When transmitted in a framed signal. F2. If the circuit is AMI. 2C. F2. 6A. 9C. These digits are: 0. EC. 04. 1010: This is the alternating ones and zeros pattern. 04. The hexadecimal pattern is frame aligned to ensure proper ASCII translation of the bits. 04. B0. B. This pattern is not identical to 2e20. 92.

and dividing the bitstream into segments (channels).140 Q.2 E1 Technology Overview This E1 Technology Overview covers the fundamental concepts in 2. 214 SunSet E20/c .821 Error performance of an international connection ITU G.2100 Bringing an international connection into service Q. Such standards allow equipment designers and service providers to ensure that various pieces of equipment are compatible and that networks operate in a predictable. The following standards cover many of the important aspects of E1 transmission technology: • • • • • • • • ITU G.826 ITU M.704 Synchronous frame structures ITU G. 6. This section also touches upon the basics of signalling technologies like MFR2 and CAS. reliable manner. converting this information into a bitstream.550/M.703 Physical/electrical characteristics of interfaces ITU G.400 Consult these standards when you need detailed information on particular aspects of E1 transmission technology.6. 6.2.048 Mbit/s technology: sampling a signal.1 Technical Standards E1 transmission technology is defined by a number of technology standards.2.706 Frame alignment and CRC ITU G.2 Basic Definitions Binary Data: A signal which has been converted into a format of 0s and 1s. Bit Stream: Binary Data which has been placed in a sequence at a fixed rate. Channel: A single portion of the bit stream which is available for bidirectional communication.

The purpose of A-law is to provide optimum signal to noise performance over a wide ranger of transmission levels. The companding characteristic is a formula which translates the amplitudes of the samples into the 8-bit code words.3 Converting a Voice Signal To transmit voice in a digital medium. This provides adequate clarity while conserving transmission bandwidth.6. Each amplitude value is expressed as an 8-bit code ‘word’. These 8-bit words occurring 8000 times per second form a 64 kbit/s digital bit stream. Linear encoding provides a poorer signal to noise ratio at the -20 dB level typical of speech. In North America. we first need to encode the analog voice signal in a binary format. for distortion-free transmission.048 Mbit/s line. Therefore. the encoding is done according to the Mu-Law. 6 Reference 215 . For voice signals. the maximum frequency is approximately 4000 Hz. the companding law used for encoding the voice signal must match that for decoding. Ch. such as a 2. The 8-bit code word is formed by comparing the amplitude of the analog sample to a ‘companding characteristic’. Then it must be converted to a bit stream suitable for digital transmission. a companding characteristic known as ‘A-law’ is used. Thus. Refer to Figure 153. we must sample our 4000 Hz voice signal at a frequency of 8000 Hz (8000 samples/second). The amplitude of the analog voice signal is sampled 8000 times per second.2. Voice Signal Volts Time Sampling Pulse Amplitude Modulation Quantization 00101101 10110110 11000100 Volts Time Figure 153 Converting a Voice Signal The Nyquist theorem requires that the signal be sampled at twice the signal's maximum frequency in order for the signal to be reproduced without a loss of information. This conversion can be achieved through Pulse Code Modulation. Internationally.

6.37V 0V -2.2.048 Mbit/s Data Rate The E1 signal (bitstream) is transmitted at a rate of 2.048 Mbit/s This 2.048 Mbit/s transmission because synchronization loss occurs during long strings of data zeros.048 Mbit/s signal is the overall E1 transmission rate.37V Note: This voltage is over a 75W unbalanced connection time HDB3 Line Coding 1 0 1 0 0 0 0 0 time AMI Line Coding Figure 154 AMI & HDB3 Line Codings AMI: This is the simplest of the two line coding formats. a string of four consecutive zeros is replaced with a substitute string of pulses containing an intentional bipolar viola216 SunSet E20/c .37V 0V -2. 6.048 Mbit/s (2 048 000 bits per second). and is used to represent successive 1 values in a bitstream with alternating positive and negative pulses. Figure 154 depicts these alternating pulses.4 2. HDB3 :The HDB3 line coding format was adopted in order to eliminate these synchronization problems occurring with AMI. This transmission rate is achieved by combining 32 individual 64 kbit/s bitstreams: 64 (kbit/s /Channel) x 32 (Channels) = 2048 kbit/s = 2. In the HDB3 format.2. 2. AMI stands for Alternate Mark Inversion.5 Line Coding Two common types of line coding are defined for use in a E1 network: AMI or HDB3. AMI is not used in most 2.37V 1 2.

in the code 1000 0000. The HDB3 code substitutions provide high pulse density so that the receiving equipment is always able to maintain synchronization with the received signal. General rules apply to the substitutions. even if they are not matched to the proper number of pulses since the last substitution. the polarity of B is opposite to that of the bit immediately preceding it and the polarity of V is the same as that of B. Refer to Figure 155 to see the types of HDB3 zero substitution codes. as well as the number of pulses following the previous violation bit. it examines the bit stream for these intentional bipolar code violations. It then extracts the code and reconstruct the original data. As the far end equipment receives the E1 signal. Number of pulses (since last substitution) 1 Even (substitute B00V) Polarity of Previous Pulse 0 0 1 1 0 0 1 0 Odd (substitute 000V) 0 0 1 0 0 0 1 Figure 155 HDB3 Encoding The SunSet E20 is configured to detect the two types of HDB3 substitution codes. 6 Reference 217 . Ch. If there is an odd number of pulses. HDB3 coding substitutes bipolar violations for the string of zeros. The particular substitution made is governed by the polarity of the last inserted bit. the polarity of V is the same as that of the bit immediately preceding it. If there is an even number of pulses. For example.tion. B00V is inserted. 000V is substituted.

the pulses in the bit stream are then converted to actual voltage levels suitable for E1 transmission. Note: For an E1 pulse with 120Ω impedance. Ideal Pulse Actual Pulse G.2. in a real-world situation. each pulse becomes slightly distorted when it is generated and when it travels down the E1 line. This is often determined by comparing it to a specified ‘mask’. An E1 pulse may be required to conform to a standardized pulse shape. A common pulse mask is given by the ITU-T G.6 Signal Levels Once a signal has been encoded into a binary format and assembled into a bit stream. Referring to Figure 154. Ideally.703 Mask Figure 156 Pulse Shape 218 SunSet E20/c . you can see that a typical signal level for an E1 pulse with 75Ω impedance is either ± 2.703 recommendation. However.6. an actual pulse that would be encountered on an E1 line. each pulse transmitted would be perfectly symmetrical. the signal level is either ± 3 volts (for a binary ‘1’ value) or 0 volts (for a binary ‘0’ value) with real world values typically be ± 10%.37 volts (for a binary ‘1’ value) or 0 volts (for a binary ‘0’ value). Real-world signal values would typically be ± 10%. Refer to Figure 156 for the shape of an ‘ideal’ pulse vs.

31 BITS 1 E E Notes Even Frame: Contains Frame Alignment Signal (FAS) Odd Frame: No Frame Alignment Signal (NFAS) Sa: This bit is reserved for national use E: This is the error indication bit A: This is remote alarm indication bit (FAS) 0011011: Frame Alignment Signal 8 bits per timeslot x 8000 frames per second = 2.. As described previously.6.2.048 Mbit/s Frame Time Slot 0 1 .048 Mbps Figure 157 FAS Framing Format Ch. Frame Alignment Signal (FAS) The 2. each time slot consists of an individual 64 kbit/s channel of data.048 Mbit/s Framing E1 transmission utilizes two main types of framing: Frame Alignment Signal (FAS) and MultiFrame Alignment Signal (MFAS). PCM-31 uses FAS framing and PCM-30 uses MFAS framing with FAS framing.7 2. In the FAS format. Alternate frames contain the FAS Distant Alarm indication bit and other bits reserved for National and International use. time slot 0 of every other frame is reserved for the frame alignment signal (FAS) pattern. Framing is necessary so that the equipment receiving the E1 signal is able to identify and extract the individual channels.048 Mbit/s frame consists of 32 individual time slots (numbered 0-31). Hence. there are 31 time slots into which we can place data (Figure 157). 6 Reference 219 2 0 1 3 0 A 4 1 Sa 5 1 Sa 6 0 Sa 7 1 Sa 8 1 Sa . One 2.. PCM-31 uses FAS.

as defined by ITU-T G. Therefore. Bit A is used for the Remote (FAS) Distant Alarm.The FAS format does not accommodate voice channel signalling. these bits depend upon the CRC calculation and should continually change between 0 and 1. When CRC is enabled. bit 1 is used for the Cyclic Redundancy Check-4 performance monitoring. these bits are set to 1. • • • The first bits of frames 13 and 15 transmit the two E-bits. In FAS framing. 220 SunSet E20/c . when not in use. Cyclic Redundancy Check-4. when enhanced performance monitoring is required. The bits are defined as follows: • When CRC is enabled. this bit is set to 0. The first bit (c or Si) of these frames is reserved for international use. A zero in this bit denotes received errored sub-multiframes. Set this bit to 1 to indicate an alarm condition. For undisturbed operation. they should be set to 1 for crossing an international border. the odd frames do not contain the frame alignment signal. when CRC is enabled in the TEST CONFIGURATION screen.704. (bits 4-8): Spare bits. The second bit is always set to 1 to avoid FAS signal simulations. It may be changed when CRC is disabled. a one represents received frames free of errors. It can be used for the CRC-4. this bit may not be changed here. When CRC-4 is not enabled. which are CRC-4 error indication bits.

then dedicating timeslot 16 of the remaining 15 frames to A/B/C/D bits (Figure 158). timeslot 16: (4 signalling bits/channel)(30 Chs) (8 signalling bits/frame timeslot 16) = 15 frames of timeslot 16 signalling Frame 0 TS 16 bits: MFAS=0000 NMFAS=XYXX X=spare bits (=1 if not used) Y=MFAS remote alarm (=1 if MFAS synchronization is lost) Frames are transmitted with 30 voice channels in timeslots 1-15 and 17-31 Timeslot 16 (TS16) contains A/B/C/D bits for signalling (CAS) MFAS multiframe consists of 16 frames Figure 158 MFAS Framing Format Ch.TS 31 BITS 1 0 2 0 3 0 4 0 5 X 6 Y 7 X 8 X 1 2 3 BITS 4 5 6 7 8 1 2 3 BITS 4 5 6 7 8 A B C D Ch 1 (TS-1) A B C D Ch 16 (TS-17) A B C D Ch 15 (TS-15) A B C D Ch 30 (TS-31) Notes Frame 0. It takes 16 frames to make up a MultiFrame.TS 31 TS 0 -------. This method also uses timeslot 16 for the MultiFrame Alignment signal and the Channel Associated Signalling. dedicating timeslot 16 of the first frame to MFAS framing information. When the MFAS frame is transmitted.MultiFrame Alignment Signal (MFAS) MFAS framing provides Channel-Associated Signalling (CAS) to transmit A/B/C/D bit supervision information for each channel.FRM 15 TS 0 -------. all of the individual FAS frames and framing information intact is left intact.TS 16 -------. 6 Reference 221 .TS 31 TS 0 -------. This method uses the 32 timeslot frame format including timeslot 0 for the FAS. The 16 FAS frames are assembled together.TS 16 -------. timeslot 16: 8-bit MFAS signal Frames 1-15.TS 16 -------. FRM 0 FRM 1 FRM 2 FRM 3 --------.

c4: CRC bits Figure 159 CRC-4 Multiframe Format A Cyclic Redundancy Check-4 (CRC-4) is often used in E1 transmission to identify possible bit errors. c3.048 Mbit/s signal while it is in service. CRC-4 allows the detection of errors within the 2. c2. Next it inserts the CRC-4 bits in the CRC-4 positions in the next 222 SunSet E20/c . The equipment which originates the E1 data calculates the CRC-4 bits for one submultiframe. CRC-4 is based on a simple mathematical calculation performed on each submultiframe of data.SMFRM FRM FRM Bit 1 Bit 2 Bit 3 Bit 4 Bit 5 Bit 6 Bit 7 Bit 8 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 c1 0 c2 0 c3 1 c4 0 c1 1 c2 1 c3 E c4 E 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 A 0 A 0 A 0 A 0 A 0 A 0 A 0 A 1 Sa4 1 Sa4 1 Sa4 1 Sa4 1 Sa4 1 Sa4 1 Sa4 1 Sa4 1 Sa5 1 Sa5 1 Sa5 1 Sa5 1 Sa5 1 Sa5 1 Sa5 1 Sa5 0 Sa6 0 Sa6 0 Sa6 0 Sa6 0 Sa6 0 Sa6 0 Sa6 0 Sa6 1 Sa7 1 Sa7 1 Sa7 1 Sa7 1 Sa7 1 Sa7 1 Sa7 1 Sa7 1 Sa8 1 Sa8 1 Sa8 1 Sa8 1 Sa8 1 Sa8 1 Sa8 1 Sa8 TIME SLOT 0 Bits 1 2 Notes SMF-FRM+1: Sub-Multiframe #1 Sa: Spare bit reserved for National Use A: Remote Alarm (FAS Remote Alarm Indication) Frame Alignment Signal Pattern: 0011011 CRC-4 Frame Alignment Signal: 001011 CRC multiframe is not aligned with MFAS timeslot 16 multiframe SM-FRM 2: Sub-Multiframe 2 E: E-bit Errors c1.CRC-4 Error Checking in a MultiFrame Format M.

buffered. If there is a discrepancy in the two values. and inserted into the following submultiframe to be transmitted across the E1 span. as shown in Figure 159. Multiple bit errors within the same submultiframe will lead to only one CRC-4 error for the block. CRC-4 error checking provides a convenient method of identifying bit errors within an in-service system. the CRC-4 multiframe is not necessarily aligned with the MFAS multiframe. CRC-4 also uses a multiframe structure consisting of 16 frames. These are labeled SMF#1 and SMF#2 and consist of 8 frames apiece. Each CRC-4 multiframe can be divided into 2 sub multiframes (SMF). There are two things to remember when using CRC-4 errors to determine the performance of an E1 circuit. It examines the CRC4 bits which were transmitted in the next submultiframe. 6 Reference 223 . thus informing the far end equipment of the error. it is generally not possible to measure the actual bit errors because there is no pattern synch. Bit error measurement is used on an outof-service system because the results are slightly more precise. When the terminating equipment calculates an error using CRC4.submultiframe. it should transmit an E-bit to the far end. On an in-service system. Ch. it is possible that errors could occur such that the new CRC-4 bits are calculated to be the same as the original CRC-4 bits. The receiving equipment performs the reverse mathematical computation on the submultiframe. a CRC-4 error is reported. Also. Each individual CRC4 error does not necessarily correspond to a single bit error. Four bits of CRC information are associated with each submultiframe. then it compares the transmitted CRC-4 bits to the calculated value. The CRC-4 bits are calculated for each submultiframe. However.

E-bit error transmission is a relatively new feature in 2. Ebit performance monitoring of the circuit is now possible. However. it will respond by transmitting an E-bit error toward the other terminal.E-bit Performance Monitoring When the terminal equipment of a 2.048 transmission. alarm indication signal. The test set can see only the E-bit errors transmitted by Terminal B. Note that the test set can not see the actual code errors. the test set will see either loss of signal. Thus. it is likely that the embedded equipment does not transmit the E-bit error information correctly. only a complete circuit failure can be reliably determined at any point on the circuit. shown in Figure 160. framing bit errors and CRC errors introduced at the trouble point. You should check the specifications of your network. will be able to see the Ebit errors by plugging into a protected monitoring point. The terminating equipment transmits an E-bit error on the 2.048 circuit is optioned for CRC-4 transmission. With a complete circuit failure. or remote alarm indication. Therefore. when it receives a CRC-4 error. E-bit transmission may also be enabled. E-bit error transmission allows a 2.048 Mbit/s line. SunSet SSE20 No Errors 1 Protected Monitor Point Trouble Point (Error Source) Network Protected Monitor Point Protected Monitor Point E-bit Error CRC Error T erminal Equipment B T erminal Equipment A 2 SunSet SSE20 E-bit Errors Figure 160 In-service E-bit Performance Monitoring When this type of terminal equipment detects an incoming CRC-4 error. Test set 2.048 Mbit/s in-service circuit to be reliably monitored for transmission performance from any point on the circuit. Refer to Figure 160. 224 SunSet E20/c . Without E-bit error transmission.

It uses two tones. a common signalling method is DTMF.O. The methods are divided between the local loop and interoffice signalling. MF MFC SS7 C. The frequency chart is indicated in Figure 162.O. a high and a low. 6 Reference 225 . Referring to Figure 161. High Frequency 1209 1336 1477 697 770 Low Frequency 852 941 7 8 0 9 1 4 2 5 3 6 * # Figure 162 DTMF Frequency Keypad Ch.6. to represent a digit.8 MFR2/DTMF/DP Technology There are a number of signalling methods used by public telephone networks. Local Loop Interoffice Local Loop Figure 161 Local Loop & Interoffice Signalling Method Local Loop In the local loop environment.2. the signalling applied for each environment is as follows: LOCAL LOOP: • Pulse • DTMF (Dual Tone Multi-Frequency) • ISDN (Integrated Services Digital Network) INTEROFFICE: • MFR2 (Multi-Frequency) • MFC (Multi-Frequency Compelled) • SS7 (Signalling System #7) Pulse DTMF ISDN C.

The switch will interpret the number of IDLE/SEIZURE signals. the wheel will send 3 IDLE/SEIZURE signals with a specific interdigit timing between the digits. and toggle 3 times. However. DTMF registers. If the number 463 is dialled. frequencies of 1336 Hz and 770 Hz are generated.For example. rest again. converters. If a number 3 is dialed. Interoffice Signalling MFR2 is a common signalling method used in the interoffice environment. When a number is dialled. The references can be found in the following standards tables: • ITU Q. usually 10 pulses per second. or receivers then recognize these tones as representing the digit 5 and translate them into digital signals. the B supervision bit is toggled (ABCD ˆ ABCD). ISDN provides digital services to end users with regular phone lines. Pulse signalling is an older technology than DTMF. MFR2 uses two tones for each digit being dialled. and the inter-digit duration to determine the digit that has been dialled. a series of short IDLE/SEIZURE signals are created with specific timing. if the number 5 button is pressed. then rest for approximately one second. 226 SunSet E20/c . the B bit will flash 4 times. Similar to DTMF. and was originally used for rotary phone sets. toggle six times. In the seizure state.441 Tables 5-9 MFC (Multi Frequency Compelled) dialling allows the two exchanges to send digits to each other in both the forward and backward direction. these tones are selected from a group of only six frequencies. B-bit dialing is used to toggle the B-bit when seizing the line. This helps ensure accurate transmission of the digits in a noisy environment. A and B bit signalling is used to seize and acknowledge the line.

AS: Available Second AVBER: Average Bit Error Rate AVCER: Average CRC-4 block Error Rate B B Channel: Bearer Channel is a 64 kbit/s ISDN user channel which carries digital data. BUFF: Buffer. contains the radio link with the Mobile Station. manages the radio resources for one or more BTS. BSN: Backward Sequence Number. Occurs when the synchronized pattern either loses a bit or gains an extra bit through stuffing. BIT: Bit Error BPV: Bipolar Violation BRI: Basic Rate Interface BSC: Base Station Controller. AISS: Alarm Indication Signal Seconds. AFBER: Average Framing Bit Error Rate AIS: Alarm Indication Signal. Ch. A major component of the GSM network. BTS: Base Transceiver Station. 6 Reference 227 . BSS: Base Station Subsystem.3 Abbreviations A ACK: Acknowledge. in which successive ‘marks’ are of alternating polarity. BERT: Bit Error Rate Testing BIB: Backward Indicator Bit.6. Part of the GSM network. BTSLP: Bit Slip. The count of the number of seconds in which AIS was detected. Bit inverted for the negative acknowledgment of the BSN message. or a mixture of lower-speed data traffic. Indication of the last message received. ALM: Alarm AMI: Alternate Mark Inversion. A control character signalling that the receiver is ready to accept the next block. A device that stores data temporarily from a faster device. Indicates an all ones signal on the active receive jack. Part of the BSS. A method of transmitting binary digits. contains the radio transmitters and receivers. PCM-encoded digital voice.

CK: Checksum. carries signalling information DASS2: Digital Access Signalling System 2 dBdsx: decibel referenced to G. A field bit indicating whether the frame transmitted is a command or response.C CAS: Channel Associated Signalling CC: Connection Confirm CCH: Control Channels CER: CRC-4 Error Rate CIC: Circuit Identification Code is a label for circuit-related messages. CRC-4: Cyclic Redundancy Check Code-4 D D Channel: Demand Channel. The total of a group of data items used for error checking purposes.703 power level DCE: Data Circuit Equipment DCS: Digital Cross-connect System DET: Detected DGRM: Degraded Minute DIG: Digital DPNSS: Digital Private Network Signalling System DTE: Data Terminal Equipment DTMF: Dual Tone Multi Frequency E E1: 2. CLKSLP: Clock Slip COD: Code CONFIG: Configuration CR: Connection Request. C/R: Command/ Response.048 Mbit/s signal EBER: E-bit Error Rate EBIT: E-bit EIR: Equipment Identity Register ERR INJ: Error Injection ES: Errored Second ESF: Extended Super Frame 228 SunSet E20/c .

6 Reference 229 .F FALM: Frame Alarm FAS: Frame Alignment Signal FBE: Framing Bit Error FBER: Framing Bit Error Rate FE: Frame Error FRM: Frame G GSM: Global System for Mobile communications H HDB3: High Density Bipolar Three HEX: hexadecimal HOLDSCRN: Hold Screen HLR: Home Location Register I INV: Inverted ISDN: Integrated Services Digital Network ISUP: ISDN User Part K Kbit/s: One thousand bits per second L LAP-B: Link Access Protocol .Balance LBO: Line Build Out LOFS: Loss of Frame Second LOG: Logical Error (BIT error) LOS: Loss of Signal LOSS: Loss of Signal Second Lpp: Level peak-to-peak LVL: Level Ch.

M Mbit/s: One million bits per second MFAL: Multiframe Alarm Seconds MFAS: Multiframe Alignment Signal MFC: Multi-Frequency Compelled MFE: Multiframe Bit Error MIN: Minimum MSC: Mobile Switching Centre MON: Monitor msec: 1 millisecond (1/1000 of a second) µ-law: mu-law. voice companding law µsec: 1 microsecond (1 millionth of a second) N nsec: nano second (one billionth of a second) NE: Network Element NT: Network Termination NV RAM: Non Volatile Random Access Memory P P/F: Pass/Fail PAT: Pattern PBX: Private Branch Exchange ppm: parts per million PRBS: Pseudo Random Bit Sequence PRI: Primary Rate Interface PRN SCRN: Print Screen Q QRS: Quasi Random Signal R RAI: Remote Alarm Indication RCV: Receive REF: Reference RESYNCH: Resynchronization RLL: Radio Link Layer RT: Remaining Time RX: Receive 230 SunSet E20/c .

Synchronized T T: Transmit TCH: Traffic Channels TE: Terminal Equipment TEI: Terminal Endpoint Identifier TERM: Terminated T/S: Time Slot TS-16: Time Slot 16 TERM: Terminated TRAU: Transcoder and Rate Adaptation Unit TX: Transmit U UAS: Unavailable Second UI: Unit Interval V VF: Voice Frequency W WNDR: Wander X XMT: Transmit Ch.S SABME: Set Asynchronous Balanced Mode Extended SAPI: Service Access Point Identifier SCCP: Signalling Connection Control Part SES: Severely Errored Second SF: Super Frame SIG: Signal SLIPS: Clock Slips SYNC . 6 Reference 231 .

even though the received code is HDB3. Verify shift status by pressing and releasing the SHIFT key. Verify that the TEST CONFIGURATION screen is setup properly. you may manually configure the line code in SYSTEM PARAMETERS > MEAS CONFIGURATION > CODE CONFIGUR. Check the cords. Do not press SHIFT simultaneously with another key. 4.6. Check that cords are connected properly to the right jacks. Press and release the SHIFT key until the SHIFT status indicator in the upper left hand side of the screen achieves the desired condition. try turning the power off. If it is. 232 SunSet E20/c . try ERASE NVRAM. 4. 1.5 for the procedure. BRIDGE. Or. press F2 to UNLOCK the keypad. 3. from MEASUREMENT RESULTS. Problem: CODE ERR LED is lit continuously for no apparent reason. Verify the LOCK indicator is not on. 5. Refer to Chapter 3. 2. Problem: CODE LED. then on. frame loss LED and other error LEDs are on. TERM. If the test set still does not behave as expected. Here are some helpful suggestions for specific problems which might occur. If the test set still does not behave properly. Problem: Keys do not work properly. TEST CONFIGURATION-MODE may be wrong. Check the manual for instructions on how to perform the desired procedure. The test set may not have registered it the first time. 1. MONITOR. 1. Try pressing the AUTO key to automatically reconfigure the line code. 3. Try. Press the key again.8. 2. Section 3. 3. 2. Try reversing the TX and RX cords. The Line Code might accidentally be set to AMI. but there should be no problem. they may be loose or dirty.4 Troubleshooting Here are some helpful suggestions for when your test set is not performing as expected. General troubleshooting procedure 1.

6 Reference 233 . Verify that all jacks are connected properly.8. 1. no Pattern Synch). then switch it on. Use VIEW RECEIVED DATA to examine the pattern being received. contact your distributor directly or refer to Section 6. Problem: Test Patterns will not synchronize. Section 3. 2. Verify in SEND TEST PATTERN that the desired pattern is being sent. and line Coding type.Problem: Test set will not power up properly. 2. Verify that PATTERN INVERSION is DISABLED in TEST PATTERN. 1. Problem: Test set shows Security Violation when switched on. Try switching the test set off. Try ERASE NVRAM. Make sure the software cartridge is inserted firmly and seated correctly. 2. Refer to Chapter 3. 2. 1. 2. Press AUTO to force the test set to resynchronize on the Pattern. 3. Ch. Make sure the serial number of the software cartridge matches the serial number of the test set. Problem: Test patterns will not synchronize with another test set. Twist the connectors inside of the jacks and ensure that all connectors are fully inserted. Make sure the battery is charged or the charger is plugged in. If you are still having difficulty. according to the circuit graphic. Verify signal interface and mode settings in the TEST CONFIGURATION screen. 1.5 for the procedure.6 of this chapter. Problem: Measurements are not working properly (Loss of Signal. 1. Framing type. 1. Problem: Test set performs improperly.

A. CRC DET. Refer to Chapter 3. E. 2. Section 3. B. Error codes should not be displayed in the upper left hand corner of the screen during power-up. contact Sunrise Telecom Customer Service or your national distributor for further advice about possible repairs. press ESC to return to the main menu.FREQUENCY screen. Error codes should not be displayed on the SELF TEST COMPLETE screen. Page down to the LINE 1 . Select SEND TEST PATTERN. 5. Confirm that all LED's function correctly. Perform ERASE NVRAM. • Verify that line 1 LEDs.6. • Verify that 3 code errors were detected. If the test set fails any part of this procedure. This acceptance test procedure may be used as part of an equipment maintenance program. Verify that the backlight and contrast controls work. Select TEST CONFIGURATION (Setup icon-color test set) and configure as follows: TEST MODE: E1SINGL TxSOURCE: TESTPAT FRAMING: PCM-30 CRC-4: YES TEST RATE: 2. 3.5 for the procedure. A. PCM-30. D. Select SYSTEM PARAMETERS > SELF TEST (System icon-color test set). 4. • Verify that RCV/hz is 2048000.5 Calibration The SunSet E20/c calibrates every time a full self test is performed. However. Select MEASUREMENT RESULT (Results icon-color test set) and press ERR INJ 3 times. select 2e23 and press ENTER.8. and PAT SYNC are green (press LED if necessary) all other LED's should be off. 234 SunSet E20/c . once per year the test set may also be given the following calibration test procedure. C. They should turn green first and then red during the self test (except POWER and BATTERY). Connect a cable from LINE 1 Tx to LINE 1 Rx.048M L1-Rx Port: TERM Tx CLOCK: INTERN When finished. 1. SIGNAL. This auto calibration should take care of all the adjustment that the test set will need during normal operation.

B. Page down to the LINE 1-G.821 screen. • Verify that 3 BIT errors were detected. C. Page down to the LINE 1-ALM/SIG screen. • FOR BNC (75Ω) CONNECTORS ONLY: Verify that +LVL and -LVL are both ± 1 db. 6. Press ESC to return to the main menu, select OTHER MEASUREMENTS > PULSE MASK ANALYSIS > START NEW ANALYSIS and press G.703 (F1). • Verify that the pulse shape does not fall outside the template boundaries by more than 2 pixels. 7. Press ESC to return to the main menu and select SEND TEST PATTERN. Select FOX. • Verify that the LED's are as they were in step 4. 8. Press ESC to return to the main menu and select > OTHER MEASUREMENTS >VIEW RECEIVED DATA. Press PAUSE (F3), then press PAGE-DN several times. • Verify that the FOX pattern is displayed correctly in the ASCII column inside the parentheses. (THE QUICK BROWN FOX JUMPS OVER THE LAZY DOG 1234567890). Note that the message is not displayed in time slots 00 and 16. 9. Press ESC to return to the main menu and select VF CHANNEL ACCESS > VF & NOISE MEASUREMENTS. Change TxMODE to TONE and listen to the speaker and verify that the volume control keys work. • Verify that Rx-1 FRQ is between 1019 and 1021 (working withe the default 1020 hz tone), and that Rx-1 LVL is between -00.5 and +00.5. 9. Change INSERT TYPE to TALK and check the microphone by talking into it and hearing your voice on the speaker. 10. Connect a cable from LINE 2 TX to LINE 2 RX. 11. Press ESC to return to the main menu and select TEST CONFIGURATION (Setup icon-color test set), configure as follows: TEST MODE: E1DUAL Tx/INSERT: L2-Tx Tx SOURCE: L2-Rx TxSource: TESTPAT FRAMING: PCM-30 CRC-4: YES TEST RATE: 2.048M L1-Rx PORT: TERM L2-Rx PORT: TERM Tx CLOCK: INTERN Ch. 6 Reference 235

12. Verify that line 2 LEDs; SIGNAL, PCM-30, and CRC DET are green; all other line 2 LED's should be off (press LED if necessary). • Verify that the PAT SYNC LED is green and the BIT ERROR LED is off, line 1 LED's don't matter. 13. Obtain another, known good SunSet E20/c. Connect an SCSI36 to DB37 (female) interface cable to the first test set, which should be configured for DCE. A. To this cable, connect an RS449/V.36 DCE adapter cable (DB37 male to DB37 female). B. To this cable, connect a Sunrise Telecom RS449/V.36 DTE adapter cable (DB37 male to DB37 male). C. Make sure that the ends of the cables with the labels are together (they should be the ends without the nuts). D. Finally, connect another SCSI-36 to DB37 (female) cable between the second SunSet E20/E20c and the other cables. E. The PAT SYNC LED should be green; all other LED's should be off (press LED if necessary). 14. Select MEASUREMENT RESULT (Results icon-color test set) for both test sets and press START (F3) on each. 15. Inject 3 errors, using ERR INJ, from each test set and verify that both test sets report 3 BIT's. 16. Press ESC to return to the main menu. 17. If you purchased a printer with the test set, plug the printer into the test set and press PRINT. Observe the main menu being printed on the printer. 18. The procedure is now complete.

236

SunSet E20/c

6.6 Customer Service
Sunrise Telecom Customer Service is available from 7:30 AM to 5:00 PM Pacific Standard Time (California). Customer Service performs the following functions: • • • Answers customer questions over the phone on such topics as product operation and repair Repairs malfunctioning test sets promptly Provides information about product upgrades

The warranty period covering the SunSet E20/c is 1 year from the date of shipment. A Return Merchandise Authorization (RMA) number is required before any product may be shipped to Sunrise Telecom for warranty repair. All test sets are ‘burn-in’ tested for 24 hours after repair. All repairs are warranted for 90 days. Out-ofwarranty repairs require both an RMA and a Purchase Order before the test set is returned. Customer Service Sunrise Telecom Incorporated 302 Enzo Drive San Jose, CA 95138-1860 U.S.A. 7:30 AM to 5:00 PM Pacific Standard Time (California) Tel: 408-363-8000 or 1-800-701-5208 Fax: 408-363-8313 Technical Support (24 hours) 1-800-701-5208 E-mail: support@sunrisetelecom.com Internet: http://www.sunrisetelecom.com

Ch. 6 Reference

237

6.7 Express Limited Warranty
A. Hardware Coverage. COMPANY warrants hardware products against defects in materials and workmanship. During the warranty period COMPANY will, at its sole option, either (i) refund of CUSTOMER’S purchase price without interest, (ii) repair said products, or (iii) replace hardware products which prove to be defective; provided, however, that such products which COMPANY elects to replace must be returned to COMPANY by CUSTOMER, along with acceptable evidence of purchase, within twenty (20) days of request by COMPANY, freight prepaid. B. Software and Firmware Coverage. COMPANY warrants software media and firmware materials against defects in materials and workmanship. During the warranty period COMPANY will, at its sole option, either (i) refund of CUSTOMER’S purchase price without interest, (ii) repair said products, or (iii) replace software or firmware products which prove to be defective; provided, however, that such products which COMPANY elects to replace must be returned to COMPANY by CUSTOMER, along with acceptable evidence of purchase, within twenty (20) days of request by COMPANY, freight prepaid. In addition, during the warranty period, COMPANY will provide, without charge to CUSTOMER, all fixes, patches, new releases and updates which COMPANY issues during the warranty period. COMPANY does not warrant or represent that all software defects will be corrected. In any case where COMPANY has licensed a software product ‘AS-IS’, COMPANY’S obligation will be limited to replacing an inaccurate copy of the original material. C. Period. The warranty period for Hardware, Software and Firmware will be One (1) Year from date of shipment to CUSTOMER. The COMPANY may also sell warranty extensions or provide a warranty term of three years with the original sale, which provide a longer coverage period for the test set chassis, software and firmware, in which case the terms of the express limited warranty will apply to said specified warranty term. D. Only for CUSTOMER. COMPANY makes this warranty only for the benefit of CUSTOMER and not for the benefit of any subsequent purchaser or licensee of any merchandise. E. LIMITATION ON WARRANTY. THIS CONSTITUTES THE SOLE AND EXCLUSIVE WARRANTY MADE BY COMPANY WITH RESPECT TO HARDWARE, SOFTWARE AND FIRMWARE. THERE ARE NO OTHER WARRANTIES, EXPRESS OR IMPLIED. COMPANY SPECIFICALLY DISCLAIMS THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. COMPANY’S LIABILITY UNDER THIS AGREEMENT WITH RESPECT TO A PRODUCT, INCLUDING COMPANY’S LIABILITY FOR FAIL238 SunSet E20/c

URE AFTER REPEATED EFFORTS TO INSTALL EQUIPMENT IN GOOD WORKING ORDER OR TO REPAIR OR REPLACE EQUIPMENT, SHALL IN NO EVENT EXCEED THE PURCHASE PRICE OR LICENSE FEE FOR THAT PRODUCT, NOR SHALL COMPANY IN ANY EVENT BE LIABLE FOR ANY INCIDENTAL, CONSEQUENTIAL, INDIRECT, OR SPECIAL DAMAGES OF ANY KIND OR NATURE WHATSOEVER, ARISING FROM OR RELATED TO THE SALE OF THE MERCHANDISE HEREUNDER, INCLUDING BUT NOT LIMITED TO DAMAGES ARISING FROM OR RELATED TO LOSS OF BUSINESS, LOSS OF PROFIT, LOSS OF GOODWILL, INJURY TO REPUTATION, OVERHEAD, DOWNTIME, REPAIR OR REPLACEMENT, OR CHARGE-BACKS OR OTHER DEBITS FROM CUSTOMER OR ANY CUSTOMER OF CUSTOMER. F. No Guaranty, Nonapplication of Warranty. COMPANY does not guaranty or warrant that the operation of hardware, software, or firmware will be uninterrupted or error-free. Further, the warranty shall not apply to defects resulting from: (1) Improper or inadequate maintenance by CUSTOMER; (2) CUSTOMER-supplied software or interfacing; (3) Unauthorized modification or misuse; (4) Operation outside of the environmental specifications for the product; (5) Improper site preparation or maintenance; or (6) Improper installation by CUSTOMER.

Ch. 6 Reference

239

SUNRISE TELECOM I N C O R P O R A T E D 6.8 Certificate of Origin To Whom It May Concern: We.. with principle location of business at 302 Enzo Dr.9 Declaration of Conformity 240 SunSet E20/c . San José CA 95138. Model Name SSE20 SunSet E20 SSE20c SunSet E20c All versions of software. do hereby certify that the following product is manufactured in the United States of America.6. Sunrise Telecom.

166 Measure Signal Level. 171 Emulating an Add/Drop Multiplexer. 213 Alarm Alarm Generation. 157 ASCII. 20 Alarms AIS. 129 MFAS DISTANT. 129 ALM/SIG Screen.54 Channel Loopback Test. 211 In Service Dual Drop & Insert THRU Testing. 155 Monitor a Voice Frequency Channel. 129 FAS DISTANT. 207 Datacom Monitoring. 207 Running a Timed Test. 153 Connecting the Cords. 210 Emulating a Terminal Multiplex. 226 Backlight. 215 Index 241 . 159 Point-to-Point Datacom Testing. 147 Datacom. voice channel. 173 Fault Location with Loopbacks. 158 Send a Tone. 68 AMI. 216 Applications Accept a New Circuit. 128 Error Injection. 129. 75 Automatic configuration. 139. 16 Availability. default. 133 Acceptance Test. 169 V. 128 Alarm Error icon Alarm Generation. 162 Testing a Terminal Multiplex. 161 Monitor an In-Service Circuit. 163 Simple Talk/Listen. 151 Nx64 kbit/s Testing. 126 ALARM LED. 129 T/S-16 AIS. 61 B B-bit dialing. 164 Observe Network Codes or Channel Data. 149 Checking for Frequency Synchronization.Index A ABCD bits. 234 AIS. 15 Bandwidth.

95 Coding. 144. 75 Binary Data. 180 Call Emulation. 94. 48. 234 Call Analysis. 114 Clock Slips. 139. 221 Cautions. 90 Clear Back. Block Size. 215 Channel Data. 214 BLOCK. 89 Calibration. 66 Code Error. 38. 142 Connector Panel. 109 CAS. 103 User emulation. 66 Battery Charger. 83 CALIB. 147 Certificate of Origin. 107 Standard Emulations. 216 Coder Offset. 143 BINARY. 95 Channel Loopback. 97 Call Control Procedure. 216 Configuration. 114 Clear Forward. 113 CASS. 139 BREAK percentage. 53. 240 Channel. 214 Bipolar Violation. 216 Bit Stream. 11 Using. 21 CONTINU. 61 CRC DET. 22 Replacing. General. 18 Charger Port. 9.Bargraph. 116 C C-Bit Definitions. 214 Channel Bandwidth. 23. 36 242 SunSet E20/c . 23 BAUD RATE. 95 Peak. 114 Block Error Ratio. 103 Receive a Call.

183 Test Mode. 52. 132 CRC-4. 210 PATL. 196 SLIP. 194 RxDL. 20.CRC continued Send Frame Words. 194 RxHz. 49 CLK POLAR. point to point. 194 RxDLS. 191 View Received Data. 183 Testing. 179 Data Rate. 194 PATLS. 186 DL. 182 Live Tracer. 195 BLK ERR RATE. 189 Monitoring. 191 Summary Results. 194 Technology. 194 Point to Point Testing. 194 RxPA. 42. 190 Trigger. 195 TxHz. 194 Equipment. 88 Customer Service. 177 Test Configuration. 21 Propagation Delay. 177 Interface. 207 Timing. 198 SLIP. 194 Index 243 . 207 port. 237 Cyclic Redundancy Check Code. 195 BLOCK ERROR. 180 Current Histogram. 85. 197 View/Print Buffer. 195 PATL. 220. 216 Datacom. 36. 222 D Data Networks. 192 Datacom Measurement Results # of BLOCKS. 48. 222 CTS. 188 Interface pins. 76. 195 Start Trigger.

116 INTERDIGIT PRD. 71 Mux Mode MUX side. 79 Test Mode. 40 Fractional. 97 Dialing. 50. 45 244 SunSet E20/c . 62 External Timing. 115 % BREAK. 50 E1T/S. 16 LED. 49 MUX Mode Configuration. 144 Error Injection configuration. Basic. 116 DIAL PERIOD. 126 ERR INJ Key. 116 B-BIT. 168 MUX. 115 Dial pulse. 214 Dial Parameters. 111 Send Side. 49. 115 SILENT PERIOD. 111 Erase NV Ram. 36 DUAL Mode Configuration.Date. 49 Pulse Quality. 115 Digit Analysis. 115 TONE LEVEL dbm. 16 Programming Burst of 10 Errors. 47 MUX Mode Measurement Results. 142 DDS Shift. BERT. 47 Mux Mode Datacom Side. 35 E1DRP. 127 ET. 39 Definitions. 224 Send Frame Words. 101 DTMF. 54 Edit Emulator Receive Side. 106 E E-Bit Error Transmission. 223 Performance Monitoring. 49 Mux Mode E1 Side. 132 E1 CRC-4.

821 Logical Screen. 40 021 Slave to Slave Timing. 44 023 External Timing. 67 038 G. 54 030 MUXTEST Configuration. 36 018 DDS Shift. 219 FAS DISTANT. 55 031 Test Pattern Screen. 60 035 Line 1 Summary Screen (E1 Mode).M. 46 025 E1-MUX Menu. 40 020 E1 Dual Graphic. 34 016 E1 SINGL Mode Graphic. 68 039 ALM/SIG Screen (E1 Mode). 69 Index 245 . 28 012 Arrange Icons. 14 006 Graphic Screen. 27 011 Color Main Menu. 57 033 User Test Pattern Screen. 47 026 MUXTEST Menu.2100/550 screen (E1 Mode). 45 024 DDS Shift. 51 027 MUXTEST Configuration. 144 FAS. 25 010 Menus. 22 009 SS115B Printer Cable Pin Assignments. 68 040 Line 1. 10 002 Replacing the Battery Pack.F Factory Defaults. 21 008 SunSet E20 Top Panel. 13 005 F-Keys. 66 036 Line Frequency Screen (E1 Mode). 31 013 Icons Profiles Screen. 12 004 SunSet E20 Front View. 67 037 Line Frequency/No Ref Signal. 133 Figures 001 Cartridge Installation. 129 FAS WORD. 51 028 Internal Timing. 15 007 Connector Panels. 53 029 Slave Timing. 44 022 Loop/Slave Timing. 39 019 E1DUAL Mode. 56 032 User Test Pattern Screen. 31 014 Icon Profiles Label Screen. 35 017 Select a Timeslot. 32 015 Test Configuration Menu. 58 034 Measurement Results Screen. 11 003 Configuration Screen with More Indicator.

108 075 User Call Emulator Screen. 113 080 Dial Parameters. 103. 117 082 Group 1 Forward Signals. 86 056 Saved Histogram Screen. 85 055 View Current Histogram. 109 076 Call Emulator Profiles. 92 062 View Line 1 & 2 CAS. 96 063 Call Analysis. 90 060 VF Channel Access Menu.54 Channel Loopback Screen. with Trigger. 82 053 Histogram Analysis Menu. 105 072 Call Emulation/Sample Call. 100 067 DTMF Digit Analysis Screen. 71 044 Datacom Block Error Measurement. 103 070 DTMF Receive Sequence. 91 061 VF Measurements.G. 74 047 FAS Frame Words. 88 057 Propagation Delay. 71 043 Datacom Bit Error Results. 115 081 Signal Meanings Screen. 76 048 FAS Words. 110 078 Start User Emulation. 99 066 MFR2 Call Analysis Screen. 118 083 Group II Forward Screen. 102 069 Call Emulator List. 72 045 Other Measurements Menu Screen.Figures continued 041 Line 1. 70 042 Datacom Summary Results (E1-MUX Mode).826 Screen (E1 Mode). 104 071 Call Emulation/MFCR2 Call Screen. 98 065 DTMF Call Analysis Sample. 110 077 Edit Emulator. 119 084 Group A Backward Signals Screen. 78 050 Pulse Shape Analysis Menu. 90 059 V. 79 051 Pulse Shape Analysis. 80 052 C-bit Analysis. 106 073 Receive Setup. 77 049 MFAS Frame Words.54 Application. 120 085 Group B Backwards Signals Screen. 73 046 View Received Data. 121 246 SunSet E20/c . 89 058 V. 112 079 Supervision Setup Screen. 97 064 Call Analysis. 101 068 Pulse Digit Analysis. 84 054 Current Histogram Menu. 107 074 Receive Screen Sample.

173 121 Emulating Add/Drop MUX. 188 129 Datacom Timing Analysis Menu. 159 114 Fractional E1 Testing. 128 092 View Test Record. 123 088 Toggle Screen. 148 107 Accept a New Span. 189 Index 247 . 136 099 System Profiles Label Screen. 186 128 Main Menu/Datacom Interface. 169 118 E20 MUXTEST Configuration. 125 090 Error Injection Screen. 180 124 V. 147 105 Plugging in-Monitor Mode. 138 101 MEAS Configuration. 149 108 Monitor an In-Service Circuit-Monitor Mode. 145 104 Plugging in-TERM Mode. 153 111 Measuring Signal Level. 169 119 Emulating a Terminal Multiplex. 182 125 Test Configuration-DATACOM. L1-Tx Port BRI. 131 094 Send Frame Words. 183 126 Select Fractional Rate. 148 106 Plugging in-THRU Mode. 133 096 System Parameters Menu. 188 130 Datacom Interface Screen-Graph. 151 109 Monitor an In-Service Circuit-Bridge Mode. 140 102 General Configuration Screen. Screen 2. 142 103 Language Selection Screen. 132 095 Automatic E-Bit Transmission. 135 097 Version/ Option Screen.35 DB-34 Interface. 155 112 V. 152 110 Frequency Synchronization. 167 116 Dual Drop & Insert THRU Mode. 172 120 Emulating an Add/Drop Multiplex. 130 093 Memory Record Label. 185 127 Datacom RS232A Configuration Screen.54 Application. L1-Tx Port MON. 122 087 View a Trace. 135 098 System Profiles List. 177 123 Full-Duplex Call Procedure. 165 115 Dual Drop & Insert THRU Mode. 167 117 MUXTEST Setup. 126 091 Alarm Generation Screen. 137 100 Measurement Configuration Screen.Figures continued 086 View Test Records. 175 122 Data Communication Facilities. 157 113 View Received Data. 124 089 Other Features Menu.

37. 76.703 Pin-out. 191 133 View/Print Buffer-Graph. 195 138 DATAMON Results. 216 155 HDB3 Encoding. 203 146 V. 205 148 V. 196 139 Datacom View Received Data.21 Pin-out. 202 145 G. 211 153 Converting a Voice Signal. 207 150 2M Multiplex Datacom Port Testing. 35. 218 157 FAS Framing Format. 37. 219 158 MFAS Framing Format. 42 PCM-31. 41. 200 143 RS232 Pin-out. 210 152 Local and Remote Loopback. 132 Framing. 195 137 Datacom Measurement Results-Page 3.35 DCE Pin-out. 190 132 Start Trigger. 62 Multiframe. 225 Frame Alignment Signal. 204 147 V. 206 149 V. 192 134 Datacom Printouts. 219 FRM. 194 136 Datacom Measurement Results-Page 2.35 Pin-out. 219 Frame Words Send frame words. 197 140 Propagation Delay. 209 151 Datacom Monitoring. 199 142 RS449 Y Cable Pin-out. 193 135 Datacom Summary Results-Page 1. 201 144 X.35 Datacom Test. Results. 198 141 RS530 Pin-out. 66 248 SunSet E20/c . 52. 225 162 DTMF Frequency Keypad. 42 VF Analysis. 215 154 AMI & HDB3 Line Codings. 78 PCM-30. 222 160 In-service E-bit Performance Monitori.35 DTE Pin-out. 217 156 Pulse Shape. 221 159 CRC-4 Multiframe Format. 48. 224 161 Local Loop & Interoffice Signalling Method. 91 Frequency Screen-Meas.Figures continued 131 Datacom Interface-Table.

52. 29 Setup. 142 PARITY.706.D).M . 61 HRP MODEL % Configuration. 214 Measurement Results. 68. 80. 68 G. 214 Pulse Mask. 33 Menus. 80 G. 16 Graphic Screen. 48. 34 Storing an Icon Profile. 85. Datacom Mode Test Configuration. 70 BBE. 143 TIME (H :M :S). 143 PRINT FORMAT. 21 HEX. 32 System. 143 STOP BIT. 143 BITS/CHAR. 183 Setup. 70 Measurement Results. 143 CR/LF INSRT. Erase NV Ram. 139 HDLC. 141 I Icon. 142 BAUD RATE.821. 70 SES.704. 143 DATE (Y.826 %BBE. Channel Loopback. 70 General Configuration BACK LIGHT. 214 G. 35 H HDB3.703. 144 Index 249 . 142 Graphic Display. 88 HOLDSCR. Test Configuration.G G. 17 Histogram Analysis. 182 HEADPHONE. 70 EB. 90 Setup. 84 Current Histogram. 28 Deleting an Icon Profile. 75 Hexadecimal keys. 79. 214 G. 33 Invoking an Icon Profile.

138 System Profiles. 16.Icon continued System. F#. 199 Internal Timing. 115 VF Signal Meanings. 1. 7. 141 Signal. 216 Interdigit Period. 182. 16 250 SunSet E20/c . 14–26 0. 135 VF & Noise Measurements. General Configuration. Self Test. 16 ESC. MEAS Configuration. 17 A. 16 POWER. B. 34 Contrast. Factory Defaults. 141 Code. 142 System. 117 VF Supervision Setup. View Line CAS. 14 Volume. 91 VF Dial Parameters. 4. 38. 15 MEAS. 144 System. 16 ENTER. 92 VF Call Analysis. D. 97 VF Call Emulator. 103 VF Channel Access. 14 GRAPH. 144 System. 15 SHIFT. 113 VF. 117 K Keypad Keys. 9.441. 17 PRINT. 6. 2. E*. 136 System. 91 Intentional BPV. Version/Option. 56 ITU-T Q. 17 ERR INJ. 17 F-keys. 45 INVERT. 8. 3. 15 Light. C. 17 Arrows. 16 AUTO. 96 Idle. 115 Interface Pins. 113 Channel Signalling. 5.

18 AIS. 20 Code error. 20 Datacom. 22 Live Tracer. 19 CRC Detect. 36 M M. 69 MEAS Configuration BLOCK SIZE. 18 RTS. 18 PCM-30. 69 P/F.2100/550. 48. 69 M. 216 LINE FREQUENCY screen. 19 CTS. 19 USER1 & USER 2. 145 LEDs. 20 RxDCE. 20 User1/User2. 18 Red.550. 19 PCM-31.2100. 139 DGRM. 38 Language. 67 Line1 RX. 22 Line code. 38 PORT. 69 %ES. 187 Line 1 TX.L L1+L2. 19 POWER. 189 Local Loop. 69 %SES. 37 L2-Rx. 69 PERIOD. 214 M. 20 Green. 20 Signal. 61 Loss of Frame. 19 Alarm. 94 L1-Rx. 18 Power. 52 Line Coding. 140 Index 251 . 225 LOCK/UNLOCK. 139 CODE CONFIGUR. 214 M2100/500 Screen.

141 M. 64 FALM. 65 MAX Hz. 64 LOSS. 64 Lpp. 64 ES.821. 64 %EFS. 139 PRINT EVENT. 63 DGRM. 64 %SES. 64 -WANDR. 63 CODE. 63 CRC. 65 AISS. 65 %UAS.826. 141 IDLE CHNL A/B/C/D. 140 Measurement Result Definitions %AS. 65 (CODE) RATE. 64 +WANDR. 64 EBER. 140 G. 64 FE. 64 LOFS. 65 MFAL.M2100/500 Screen continued G. 64 EFS. 63 BIT. 64 +LVL. 63 %DGRM. 141 MEAS DURATION. 63 BER. 64 %ES. 65 MFE. 64 Hz/PPM. 65 ± RxLVL. 64 EBIT. 138 MEASURE MODE.2100. 140 PRINT RESULT. 65 252 SunSet E20/c . 65 -LVL. 65 MIN Hz. 141 IDLE CHNL CODE. 63 (CRC) RATE. 63 CLK SLIP. 63 AS.

226 More Indicator. 215 Index 253 . 54 E1 side. 54 Datacom side. 65 UAS. 97. SRAM. 221 DISTANT. 138 Memory Card. 10. 78 WORD.Measurement Result Definitions continued RCV Hz. 65 RxCLK. 71 MUXTEST mode. 138 Start. 129 DISTANT Alarm. 47 MUXTEST mode. 72 Timing. 219 Multiplexing Capabilities. 51 BERT side. 65 SLIP. 94 Measurements Duration of. 65 SES. 27 MFAS. 95 Noise Psophometric Measurement. 12 MultiFrame Alignment Signa. Send Frame Words. 106. 51 Measurement Results. 226 MFR2. 65 Measurement Results DATACOM. 53 N NFAS WORDS-Send Frame Words. 95 Nyquist Theorem. 129 Framing Bits. 221 MultiFrame Alignment Signal. 72 VF. 219. 84 Menu Tree. 133 MFC. 134 Noise 1010 Hz Measurement. 194 E1-MUX mode.

188 Datacom Menus. 135 OSI Standard. 82 Datacom Interface. 18 PCM. 79 View Last Pulse Shape. 66 Replacing the Battery. 24 Profiles. 143 Settings. 24 Port. 43 e1-mux. 19. 182 Other Features. 73 P PARITY. 226 OFFSET. 213 R Receiver. 182 Printer. 113 Q. 213 Quasi. 102 Pulse Mask Analysis. 183 Histogram Analysis. 226 QRS. 81 Pulse Signalling. 33 Propagation Delay.441. 11 Results Icon C-Bit Analysis. 48 Reference Clock.O OC-48. 219 Physical Layer Protocol. 38 Options. 219 PCM-31. 84 254 SunSet E20/c . 143 PAT SYNC. 97 Q Q. 22 Print Format.422. 116 Pulse Code Modulation. 215 PCM-30. 215 Pulse Digit Analysis. 28 Off Hook Signalling. 125 Other Measurements. 37 Receivers. 142 Printing. 89 Pulse. 18 Pattern Synchronization.

180 Rx/DROP. 117 Signal-to-Noise measurement.Results Icon continued Measurement Results. 136 Stored. 10 Version. 7 Cartridge. 41. 43 Software. 97 Stop Bit. 94 Signalling. 144 Serial Number. 135 System Profiles. 135 SS#5. 66 Supervision. 62 RTS. 20 S Seizure. 113 Slave Timing. 24 Signal Level. 137 Enter a New Profile. 113 System Parameters. 132 Serial Port. 137 Delete. 218 Signal Meanings. 47. 168 Send Frame Words. 22 Settings. 36. 9. 144 Send and Receive a Tone. 60 Other Measurements. 114 Select Timeslot Screen. 52 RxDTE. 136 Default. 132 View FAS Words. 96. 42 Self Test. 73 Propagation Delay. 137 Index 255 . 89 Send Frame Words. 74 View Results Records. 76 View MFAS Words. 20. 237 RS-232 Interface. 78 View Received Data. 130 RMA (Return Merchandise Authorization). 143 Summary Screens. 22 RT.

121 08 Type Versus Test Rate.T T/S. 213 1010. 191 Troubleshooting. 120 07 Group B Backward Labels. 2e15. 56. 34 Test Pattern. 182 Technical Standards. 57 Viewing a User Test Pattern. 43 Tone Level. 58 FOX. 57 Test Rate. 36. 213 0000. 178 Trigger. 213 511. 213 1111. 57 Delete a User Test Pattern. 187 TCP/IP. 213 20ITU. 57 User Test Patterns. 75 T/S-16. 118 05 Group II Forward Labels. 57 Standard Patterns. 119 06 Group A Backward Signal Labels. 213 2e23. 21 02 SS118B/C/D Printer Switch Settings. 2e20. 56 User. 111 Transmission Basics. 219 Timing. 184 09 Lead States. 213 2047. 25 03 C-bit Definitions. 83 04 Group 1 Forward Labels. 59 Editing a User Pattern. 191 TRIGON. 214 Test Configuration. 213 Create a User Pattern. 213 1-4. 129 Tables 01 Headphone Coversion. 142 Time slots. 232 256 SunSet E20/c . 214 Technology Overview. 213 3-24. 115 TOUT. AIS Alarm. 42 Time. 213 Sending a User Test Pattern.

91 Dial Parameters. 94 frequency.35. 47. 215 W Warnings. 102 PPS. 95 RxABCD. 101 PERD. 49 U Unit Interval (UI). 94 level. 9 User Emulation. 198 Unpacking. 20 V V. 95 S/N (dB). 115 View CAS. 101 H/L Hz. 92 3-K Flat measurement. 95 PEAK. 35. 207 V. 94 OFFSET. 237 Registration. 89. 95 PSOP (dBm). 101 PPRD. 94 VF Channel Access.TTL-L2. 52 TYPE. 101 VF Meas. 43 Tx SOURCE. 90 VF & Noise Measurements. 8 Warranty. 94 Voice bandwidth. 95 3K (dBm).54. 101 INTD. 102 TWIST. 54 e1 mux. 182. Results 1010 (dBm). 41 Tx/INSERT. 94 RxDATA. 38 dual E1. 39 TX CLOCK. 109 USER1 & USER 2 LEDs. 96 VF Digit Analysis dBm. 9 Index 257 .

189 XMT CLOCK.X X. 45 258 SunSet E20/c . 53 INTERN.21 Datacom Interface.

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