3/26/2012

CHEM 504 SEM & TEM
By Seçkin ÖZTÜRK

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CHEM 504

Microscopes

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CHEM 504

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3/26/2012 Electron Material Interaction Bacscattered Electrons Secondary Electrons Auger Electrons Characteristic X-rays Visible Light Unscattered Transmitted Elastically Scattered Electrons Inelastically Scattered Topographic Morphologic Information BSEI SEI Cristalographic Information EBSD Chemical Information BSEI AES EDS. WDS Cathodoluminescence Bright Fild Imaging Dark Field Imaging Electron Diffraction EF-TEM EELS. EDS. EF-TEM TEM Other 3 SEM CHEM 504 SEM 4 CHEM 504 2 .

C) can be applied .E-SEM mode .3/26/2012 SEM Sample Properties     Conducting .Conductive coatings(Au.Cooling Stage Well polished flat surface (for chemical and crystallographic analysis) 5 CHEM 504 SEM Images Tophologic/Morphologic Informatıon Secondary Electron Image of Ag Nano cubes KOH etched Si single crystal surface 6 CHEM 504 3 .Low Vacuum mode Vacuum Compatible .E-SEM or Low Vacuum mode Stable under Electron-beam . Pd.

Absorption Contrast .Diffraction Contrast .3/26/2012 SEM Images Chemical Information EDS Maps of a metallic alloy EDS Spectrum of glass 7 CHEM 504 TEM  Contrast Mechanisms .Phase Conrast 8 CHEM 504 4 .

powders) * UltraMicrotomy (Biologic and organic materials: tissues.Low dose techniques Electron transparent (~100nm thick) Sample preparation techniques * Film coated Cu Grids (Small sized materials: Nanotubes. nanoparticles.Cryo-holder . polymers) * Cutting-Grinding-Polishing(Metalic.Ceramic samples) 9 CHEM 504 TEM Images Unscattered Electrons (BF image) TEM images of Mithocondries (Absorption Contrast) 10 CHEM 504 5 .3/26/2012 TEM Sample Properties    Vacuum compatible Stable under Electron –Beam .

DF/BF images)  Diffraction Pattern  Bright Field Dark field 11 CHEM 504 TEM Images Diffracted and Non-Diffracted Electrons  High Resolution Image of Au nanoparticles (Lattice Fringes) 12 CHEM 504 6 .3/26/2012 TEM Images Diffracted Electrons (Diff Pattern.

3/26/2012 TEM Images  EDS Map of Sr Ti Crystal 13 CHEM 504 7 .

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