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Monte Carlo Modeling for Electron Microscopy and Microanalysis Oxford Series in Optical and Imaging Sciences

Monte Carlo Modeling for Electron Microscopy and Microanalysis Oxford Series in Optical and Imaging Sciences

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Published by: ceco27 on Jun 16, 2012
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11/24/2014

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In this chapter we will develop a Monte Carlo model for the interaction of an
electron beam with a solid using the "single scattering" approximation. Within the
limits discussed below, this model is the most accurate representation of the electron
interaction that we can construct, and it is capable of giving excellent results over a
wide range of conditions and materials. This program, together with the faster but
less detailed "plural scattering" model developed in the following chapter, will form
the framework around which specific applications of Monte Carlo modeling to
problems in electron microscopy and microanalysis will be generated in subsequent
chapters.

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