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# LESSON PLAN Sub Code & Name : EC2151 - ELECTRIC CIRCUITS AND ELECTRON DEVICES Unit : I Branch : EC Semester: II

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UNIT I CIRCUIT ANALYSIS TECHNIQUES Kirchoffs current and voltage laws series and parallel connection of independent sources R, L and C Network Theorems Thevenin, Superposition, Norton, Maximum power transfer and duality Star-delta conversion. Objective: To study about basic concepts, laws and network theorems.
Topics to be covered Teaching Aids

S.No

Time

Ref

## 1. 2. 3. 4. 5. 6. 7. 8. 9. 10. 11. 12. 13. 14.

Introduction to circuit analysis Kirchoffs current law Kirchoffs voltage law Voltage division and Current division. Series and parallel connection of independent sources R, L and C Network Theorems Thevenin theorem Problems Superposition theorem Nortons theorem Problems Maximum power transfer theorem Duality, Star delta conversion. Problems

50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min

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LESSON PLAN Sub Code & Name : EC2151 ELECTRIC CIRCUITS AND ELECTRON DEVICES Unit : II Branch : EC Semester: II
UNIT II TRANSIENT RESONANCE IN RLC CIRCUITS

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Basic RL, RC and RLC circuits and their responses to pulse and sinusoidal inputs frequency response Parallel and series resonances Q factor single tuned and double tuned circuits. Objective: To study about RL, RC and RLC circuits and their responses and also resonant and tuned circuits frequency responses. S.No Topics to be covered Time Ref Teachin g Aids BB BB BB BB BB BB BB BB BB BB BB BB BB

15. 16. 17. 18. 19. 20. 21.. 22. 23 24 25 26. 27. 28.

Introduction RL circuits Problems RC circuits Problems RLC circuits Problems RL, RC, RLC circuit responses to pulse inputs RL,RC,RLC circuit responses to sinusoidal inputs Frequency response- Parallel resonance , Q factor Frequency response- Series resonance, Q factor Single tuned circuits Double tuned circuits CAT -I

50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min

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LESSON PLAN

LP EC2151

Sub Code & Name : EC2151 ELECTRIC CIRCUITS AND ELECTRON DEVICES Unit : III Branch : EC Semester: II

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UNIT III SEMICONDUCTOR DIODES Review of intrinsic & extrinsic semiconductors Theory of PN junction diode Energy band structure current equation space charge and diffusion capacitances effect of temperature and breakdown mechanism Zener diode and its characteristics. Objective: To introduce the theory behind the operation of semiconductor devices such as PN diode and Zener and their applications.

S.No 29. 30. 31. 32. 33. 34. 35. 36. 37. 38.

Topics to be covered Introduction to insulators, semiconductors and conductors. Review of intrinsic & extrinsic semiconductors Theory of PN junction diode Energy band structure Problems Current equation -Space charge and diffusion capacitances Problems Effect of temperature and breakdown mechanism Zener diode and its characteristics.

Time 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min

Ref

Teaching

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LESSON PLAN

LP EC2151

Sub Code & Name : EC2151 ELECTRIC CIRCUITS AND ELECTRON DEVICES Unit : IV Branch : EC Semester: II

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UNIT IV TRANSISTORS Principle of operation of PNP and NPN transistors study of CE, CB and CC configurations and comparison of their characteristics Breakdown in transistors operation and comparison of N-Channel and P-Channel JFET drain current equation MOSFET Enhancement and depletion types structure and operation comparison of BJT with MOSFET thermal effect on MOSFET. Objective: To learn the operation and characteristics of semiconductor devices such as BJT and FET.
S.No Topics to be covered Time Ref Teaching Aids

39. 40. 41. 42. 43. 44. 45. 46. 47. 48. 49. 50. 51 52.

Introduction, Principle of operation of PNP and NPN transistors Study of CE configuration and its characteristics Study of CB configuration and its characteristics Study of CC configuration and its characteristics Comparison of their characteristics, Breakdown in transistors Problems Operation and of N-Channel and P-Channel JFET Comparison of N-Channel and P-Channel JFET Drain current equation. MOSFET Structure and operation of Enhancement type Structure and operation of depletion type MOSFET Comparison of BJT with MOSFET Thermal effect on MOSFET. CAT - II

50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min

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LESSON PLAN
Sub Code & Name : EC2151 ELECTRIC CIRCUITS AND ELECTRON DEVICES

LP EC2151 Page 05 of 06

Unit : V

Branch : EC

Semester: II

UNIT V SPECIAL SEMICONDUCTOR DEVICES Tunnel diodes PIN diode, varactor diode SCR characteristics and two transistor equivalent model UJT Diac and Triac Laser, CCD, Photodiode, Phototransistor, Photoconductive and Photovoltaic cells LED, LCD. Objective: To study the working and characteristics of special semiconductor devices. S.No 53. 54. 55. 56. 57. 58. 59. 60. 61. 62. 63. Topics to be covered Introduction, Tunnel diodes PIN diode Varactor diode SCR characteristics and two transistor equivalent model UJT Diac and Triac Laser and CCD Photodiode,Phototransistor Photoconductive and Photovoltaic cells LED, LCD. CAT III (Model Exam) Time 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min 50 min Ref 2,3,4,6 2,3,4,6 2,3,4,6 2,3,4,6 2,3,4,6 2,3,4,6 2,3,4,6 2,3,4,6 2,3,4,6 2,3,4,6 Teaching Aids BB BB BB BB BB BB BB BB BB BB

LESSON PLAN
Sub Code & Name : EC2151 ELECTRIC CIRCUITS AND ELECTRON DEVICES

LP EC2151 Page 06 of 06

Unit : I-V

Branch : EC

Semester: II

TEXT BOOKS: 1. Joseph A. Edminister, Mahmood, Nahri, Electric Circuits Shaum series,Tata McGraw Hill, (2001) 2. S. Salivahanan, N. Suresh kumar and A. Vallavanraj, Electronic Devices and Circuits,Tata McGraw Hill, 2nd Edition, (2008). 3. David A. Bell, Electronic Devices and Circuits, Oxford University Press, 5th Edition, (2008). REFERENCES: 4. Robert T. Paynter, Introducing Electronics Devices and Circuits, Pearson Education, 7th Education, (2006). 5. William H. Hayt, J.V. Jack, E. Kemmebly and steven M. Durbin, Engineering Circuit Analysis,Tata McGraw Hill, 6th Edition, 2002. 6. J. Millman & Halkins, Satyebranta Jit, Electronic Devices & Circuits,Tata McGraw Hill, 2nd Edition, 2008.

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