Tessent DFTAdvisor™ Reference Manual

Software Version 9.0 June 2010

© 1991-2010 Mentor Graphics Corporation All rights reserved.
This document contains information that is proprietary to Mentor Graphics Corporation. The original recipient of this document may duplicate this document in whole or in part for internal business purposes only, provided that this entire notice appears in all copies. In duplicating any part of this document, the recipient agrees to make every reasonable effort to prevent the unauthorized use and distribution of the proprietary information.

This document is for information and instruction purposes. Mentor Graphics reserves the right to make changes in specifications and other information contained in this publication without prior notice, and the reader should, in all cases, consult Mentor Graphics to determine whether any changes have been made. The terms and conditions governing the sale and licensing of Mentor Graphics products are set forth in written agreements between Mentor Graphics and its customers. No representation or other affirmation of fact contained in this publication shall be deemed to be a warranty or give rise to any liability of Mentor Graphics whatsoever. MENTOR GRAPHICS MAKES NO WARRANTY OF ANY KIND WITH REGARD TO THIS MATERIAL INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. MENTOR GRAPHICS SHALL NOT BE LIABLE FOR ANY INCIDENTAL, INDIRECT, SPECIAL, OR CONSEQUENTIAL DAMAGES WHATSOEVER (INCLUDING BUT NOT LIMITED TO LOST PROFITS) ARISING OUT OF OR RELATED TO THIS PUBLICATION OR THE INFORMATION CONTAINED IN IT, EVEN IF MENTOR GRAPHICS CORPORATION HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. RESTRICTED RIGHTS LEGEND 03/97 U.S. Government Restricted Rights. The SOFTWARE and documentation have been developed entirely at private expense and are commercial computer software provided with restricted rights. Use, duplication or disclosure by the U.S. Government or a U.S. Government subcontractor is subject to the restrictions set forth in the license agreement provided with the software pursuant to DFARS 227.72023(a) or as set forth in subparagraph (c)(1) and (2) of the Commercial Computer Software - Restricted Rights clause at FAR 52.227-19, as applicable. Contractor/manufacturer is: Mentor Graphics Corporation 8005 S.W. Boeckman Road, Wilsonville, Oregon 97070-7777. Telephone: 503.685.7000 Toll-Free Telephone: 800.592.2210 Website: www.mentor.com SupportNet: supportnet.mentor.com/ Send Feedback on Documentation: supportnet.mentor.com/user/feedback_form.cfm

TRADEMARKS: The trademarks, logos and service marks ("Marks") used herein are the property of Mentor Graphics Corporation or other third parties. No one is permitted to use these Marks without the prior written consent of Mentor Graphics or the respective third-party owner. The use herein of a thirdparty Mark is not an attempt to indicate Mentor Graphics as a source of a product, but is intended to indicate a product from, or associated with, a particular third party. A current list of Mentor Graphics’ trademarks may be viewed at: www.mentor.com/terms_conditions/trademarks.cfm.

Table of Contents
Chapter 1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Inputs and Outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . File Redirection Operators . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 11 11 12

Chapter 2 Command Dictionary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Command Line Syntax Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Command Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Command Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 Add Black Box . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 Add Buffer Insertion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 Add Cell Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 Add Clock Groups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 Add Clocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 Add Mapping Definition. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 Add Nofaults. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43 Add Nonscan Instances. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 Add Nonscan Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48 Add Notest Points . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49 Add Output Masks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51 Add Pin Constraints . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53 Add Pin Equivalences . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55 Add Primary Inputs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 Add Primary Outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59 Add Read Controls . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 Add Scan Chains. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61 Add Scan Groups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63 Add Scan Instances . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64 Add Scan Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66 Add Scan Partition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68 Add Scan Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72 Add Seq_transparent Constraints . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77 Add Sub Chains . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79 Add Subchain Clocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84 Add Subchain Group. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87 Add Test Points. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90 Add Tied Signals. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94 Add Write Controls. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96 Alias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97 Analyze Control Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100

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Table of Contents

Analyze Input Control. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Analyze Output Observe. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Analyze Testability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Black Box . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Buffer Insertion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Cell Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Clock Groups. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Clocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Mapping Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Nofaults . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Nonscan Instances . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Nonscan Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Notest Points . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Output Masks. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Pin Constraints. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Pin Equivalences . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Primary Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Primary Outputs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Read Controls . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Scan Chains . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Scan Groups. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Scan Instances . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Scan Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Scan Partitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Scan Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Seq_transparent Constraints . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Sub Chains. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Subchain Clocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Subchain Groups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Test Points . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Tied Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Delete Write Controls . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Dofile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Echo . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Exit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Find Design Names. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Help. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . History. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Insert Test Logic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Printenv . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Read Procfile. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Black Box . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Buffer Insertion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Cell Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Circuit Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Related Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Clock Gating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Clock Groups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Clocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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103 104 105 108 109 111 113 114 115 118 120 122 124 126 127 129 130 132 134 135 136 137 139 140 141 142 143 144 145 146 148 150 151 152 154 155 160 161 163 170 171 172 174 175 177 180 181 183 184

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Report Control Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Dft Check . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report DRC Rules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Environment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Feedback Paths . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Flatten Rules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Gates . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Loops. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Mapping Definition. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Nofaults. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Nonscan Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Notest Points . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Output Masks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Wrapper Cells . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Pin Constraints . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Pin Equivalences . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Primary Inputs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Primary Outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Read Controls . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Scan Cells . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Scan Chains. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Scan Enable. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Scan Groups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Scan Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Scan Partitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Scan Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Seq_transparent Constraints . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Sequential Instances . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Shift Registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Statistics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Sub Chains . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Subchain Clocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Subchain Groups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Test Logic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Test Points. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Testability Analysis. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Tied Signals. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Timeplate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Variables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Report Write Controls. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Reset State. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Ripup Scan Chains . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Run . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Save History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Bidi Gating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Capture Clock . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Command Editing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Contention Check . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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5

Table of Contents

Set Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Dofile Abort . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set DRC Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Fault Sampling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set File Compression . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Flatten Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Gate Level. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Gate Report . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Gzip Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Identification Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Internal Fault. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Internal Name . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Io Insertion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Latch Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Lockup Cell. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Logfile Handling. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Net Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Nonscan Handling. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Scan Enable. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Scan_enable Sharing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Scan Type . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Screen Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Sensitization Checking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Shadow Check . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Stability Check . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set System Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Test Logic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Trace Report . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Transient Detection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Set Tristate Gating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Clock Gating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup EDT. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Naming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Output Masks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Pin Constraints . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Registered IO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Scan Identification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Scan Insertion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Scan Pins. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Shift_register Identification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Test_point Identification. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Test_point Insertion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Tied Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Setup Wrapper Chains . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . System. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Write Atpg Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Write Formal_verification Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Write Loops . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Write Netlist . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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Table of Contents

Write Primary Inputs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Write Primary Outputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Write Procfile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Write Scan Identification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Write Scan Order . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Write Subchain Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Chapter 3 Shell Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Shell Command Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . dftadvisor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . stil2mgc. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

390 391 392 393 395 404 405 405 406 409

Appendix A Using Tessent DFTVisualizer. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 411 Appendix B Getting Help . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 413 Documentation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 413 Mentor Graphics Support. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 413 Index Third-Party Information

End-User License Agreement

Tessent DFTAdvisor Reference Manual, V9.0 June 2010

7

List of Examples
Example 1-1. File Redirection Example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Example 2-1. Add Buffer Insertion Example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Example 2-2. Generated dofile Tracing Back to Primary Input . . . . . . . . . . . . . . . . . . . . . . Example 2-3. Generated dofile Tracing Forward to Primary Input. . . . . . . . . . . . . . . . . . . . Example 2-4. Add Seq_transparent Constraints . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 31 75 76 78

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. . . . . Figure 2-2. . . . . . . . . . . . . . Observe Point Example for -None and -Model. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Figure 2-9. . . . . . . Control Point Example for -None and -Model . . . . . . . . . . . . . . . . . . . . . . . . . V9. . . . . . . . . . Figure 2-7. . . . . . . . . . . . . . . . Control and Observe Point Insertion. . . . . Observe Point Example with -New_scan_cell . . . . . . . . . . . . . . . . . . . . . Control Point Example for -New_scan_cell . . . . . . . . I/O Identification Default Tracing Mode . . . . . . . . . . . . Figure 2-5. . . . . . . Observe Point Example with -Existing_scan_cell . . . . . . . . . . . . . . . Control Example . . . . . . . . . . . . . . . . Figure 2-6. . . . . . . . . . . . . . . . . . . . Observe Example . . . . . . 91 92 366 367 367 368 369 374 375 375 9 Tessent DFTAdvisor Reference Manual. . . . . . . . . . . . . . . . . . . . Figure 2-4. . . . . . . . . . . . . . . . . . . . . . . . All Input Logic Tracing . . . . . . . . . . . . . . . . . . . . . Figure 2-10. . . . . . . . . . . . . .0 June 2010 . . . . . . . . . . . . . . . . . .List of Figures Figure 2-1. . . . Figure 2-3. . . . . . Figure 2-8. . . . . . .

. . . Default Scan Enable Signal Names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Available Information Displays and Arguments . . . Table 2-6. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0 June 2010 10 . . . . . . . . . . Lockup Cell(s) Used Between Different Clock/Edge Transitions . . . . . . . . . . . . Instance Type Prefix Defaults . . . Table A-1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Command Summary . . . . .List of Tables Table 1-1. . Subchain Types . Table 2-3. . . . Conventions for Command Line Syntax . . . . . . . . . . . V9. . . . . . . . . . . . Table 2-2. . . . . . . . . . . Report Gate Types . . . . . . . . . . Command Summary . . . . . . . . . . DFTAdvisor Commands Supporting File Redirection Operators . . . . . . . . . . . . Table 2-8. . . . . . . . . . . . . . . . . . . . . . . DFTVisualizer-Related Commands . . . . . . . . . . . . . . . . . . . . . 12 15 16 87 190 203 240 305 313 339 405 411 Tessent DFTAdvisor Reference Manual. . . . . . . . . . . Table 2-5. . . . . . . . . . . . . . . . . . Table 2-4. Table 3-1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Table 2-9. . . . . . . . . . . . . . . Table 2-1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Table 2-7. . . . . . . . . . . . . . Output Format Codes .

V9. DFTAdvisor reads and writes the Verilog format. It does not alter the original netlist when it inserts test logic. For more information. Clocked-scan. When finished. Contains a powerful design rules checker. and then makes all required modifications to this copy. It performs design rules checking to ensure scan setup and operation are correct. The tool creates an internal copy of the original netlist. including the following: • • • • • Supports both full and partial-scan identification and insertion. clocked-scan. Provides both automatic and manual scan identification capabilities allowing for an optimal partial-scan solution. and LSSD scan types. and LSSD. Displays a variety of information—from design and debugging information to statistical reports for the test set you generate. Tessent DFTAdvisor Reference Manual.Chapter 1 Introduction Use Tessent™ DFTAdvisor to identify and insert scan and test circuitry to your design. DFTAdvisor supports insertion of mux-DFF. • Inputs and Outputs DFTAdvisor requires a gate-level netlist as input. you can analyze your design to ensure it does not contain problems that may impact test coverage. before scan is actually inserted. Supports common scan methodologies including Mux-scan. Features Tessent DFTAdvisor (hereafter referred to as DFTAdvisor) contains many features. Before you add internal scan or test circuitry to your design. DFTAdvisor can then identify sequential elements for conversion to scan cells and then stitch those scan cells into scan chains. Automatically generates the scan setup dofile and the test procedure files for use downstream in your flow with the Tessent FastScan™ and Tessent TestKompress® ATPG tools.0 June 2010 11 . see the “Inserting Internal Scan and Test Circuitry” section in the Scan and ATPG Process Guide. the tool writes out the modified copy as a new scan-inserted gate-level netlist.

V9. • • Outputs • • Design Netlist — a scan version of your design netlist. Test Procedure File — required if you have existing scan circuity in your design. Table 1-1 lists the DFTAdvisor commands supporting redirection operators: Table 1-1.0 June 2010 .Introduction Inputs and Outputs Inputs • • Design Netlist — in Verilog format. See also “Specifying Existing Scan Information”. Alternatively. can be in Verilog format. ATPG Setup Files — the test procedure file defining the operation of the scan circuitry in your design. See “Command Dictionary” for a listing and descriptions of the commands available for your use with DFTAdvisor. DFTAdvisor Commands Supporting File Redirection Operators Echo History Report Black Box Report Circuit Components Report Dft Check Report DRC Rules Report Environment Report Flatten Rules Report Nofaults Report Primary Inputs Report Primary Outputs Report Procedure Report Scan Cells Report Scan Chains Report Scan Groups Report Scan Pins Report Sequential Instances Report Statistics Report Sub Chains Report Test Points Report Tied Signals Report Timeplate 12 Tessent DFTAdvisor Reference Manual. you can enter these commands interactively. The test procedure file defines the operation of existing scan circuitry. Command Dofile File — a set of commands that gives DFTAdvisor information on how the tool inserts scan chains. File Redirection Operators You can redirect the output of selected Report commands to a file. or append an existing file. DFT Library — contains the model descriptions for all library cells used in your design. along with the model descriptions for all the scan replacement cells. and a dofile for setting up the design and scan circuitry information for ATPG.

You add the create and append semantics (“>”.0 June 2010 13 . “>>”) at the end of a command’s argument list. Example 1-1.scan chains ----------" >> my_scan_report //appends my_scan_report report scan chains >> my_scan_report //appends my_scan_report Tessent DFTAdvisor Reference Manual.scan cells ------------" > my_scan_report //creates the my_scan_report file report scan cells >> my_scan_report //appends my_scan_report echo "----------. my_scan_report. V9. The Example 1-1 command sequence redirects the output from the Report Scan Cells and Report Scan Chains commands into a single output file.Introduction Inputs and Outputs DFTAdvisor uses the following mechanisms for redirecting the output of these: • • > file_pathname Creates or replaces an existing file_pathname. >> file_pathname Appends the contents of file_pathname. File Redirection Example echo "----------.

0 June 2010 . V9.Introduction Inputs and Outputs 14 Tessent DFTAdvisor Reference Manual.

An italic font indicates a user-supplied argument. Tessent DFTAdvisor Reference Manual. Do not include the bar in the command. Command names and options are normally case insensitive. Do not enter the braces. Do not include the ellipsis when entering commands. the first two letters of the second word. words.0 June 2010 15 . Conventions for Command Line Syntax Convention UPPercase Example REPort ENvironment (substitute product-specific examples throughout) Usage Required command letters are in uppercase. Commands usually follow the 3-2-1 rule: the first three letters of the first word. in most cases. etc. ADD CLocks off_state primary_input_pin… [-Internal] [-pin_name user_pinname] [-top_name existing_pin [-inverted]] An ellipsis follows an argument that may appear more than once. The vertical bar indicates an either/or choice between items. and the first letter of the third. Do not enter the brackets. -Off | -Vi | -Emacs | -Gmacs EXIt [-Discard] DOFile filename ADD CEll Library library {{-Model name} | -All} ADD CEll Library library {{-Model name} | -All} Square brackets enclose optional arguments. V9. Table 2-1. Command Line Syntax Conventions This manual uses the following command usage line syntax conventions. Braces enclose arguments to show grouping. fourth. Boldface [ ] Italic { } | SET COmmand Editing A boldface font indicates a required argument. Underline … SET DOfile Abort ON | OFf An underlined item indicates either the default argument or the default value of an argument. you may omit lowercase letters when entering commands or literal arguments and you need not enter in uppercase.Chapter 2 Command Dictionary This chapter contains descriptions of the DFTAdvisor commands in alphabetical order.

Specifies the DFT library cells for user-defined test points. Places nofault settings either on a pin or on all pins of a specified instance or module. Command Summary Command Add Black Box Add Buffer Insertion Description Defines black boxes. Overrides the non-scan to scan model mapping defined by DFTAdvisor.Command Dictionary Command Summary Command Summary Table 2-2 contains a summary of the commands described in this manual. Specifies the grouping of scan cells controlled by different clocks onto one chain. or all instances within the specified module. Specifies that DFTAdvisor hold the input pin at a constant state during the rules checking and loop cutting processes. Add Cell Models Add Clock Groups Add Clocks Add Mapping Definition Add Nofaults Add Nonscan Instances Add Nonscan Models Add Notest Points Add Output Masks Add Pin Constraints 16 Tessent DFTAdvisor Reference Manual. and optionally maintain a constant logic level on. all instances controlled by the specified control pin. Specifies the names and inactive states of the primary input pins controlling the clocks in the design. and sets the constrained value on output or bidirectional black box pins. Specifies for DFTAdvisor to ignore the specified instances. Instructs DFTAdvisor to mask. V9. and system-generated test logic. when identifying and inserting the required scan elements and test logic. system-generated test points.0 June 2010 . Table 2-2. Adds circuit points to list for exclusion from testability insertion. Specifies for DFTAdvisor to place buffer cells between the primary input of the specific test pin and the gates driving the test pin. Instructs DFTAdvisor to ignore all instances of the specified sequential DFT library model when identifying and inserting the required scan elements and test logic into the design. the specified primary output pins during the scan identification analysis.

all instances controlled by the specified control pin. or instance within a hierarchical design. library model. Specifies the name of a pre-existing scan chain that exists entirely within a module. Adds an off-state value to specified RAM read control lines. or all instances within the specified module. Specifies a name for a pre-existing scan chain within the design. Adds a primary input to the net. Specifies the enable value of a clock enable that internally gates the clock input of a non-scan cell for sequential transparent scan identification. Specifies that DFTAdvisor is to flag every instance of the named DFT library model for inclusion into the identified scan list. to the scannable instance list. Adds a primary output to the net. the scan clock pin you associate with the chain. scan output pin. and optionally.0 June 2010 17 . Adds one scan chain group to the system. library model. Adds one subchain group to the system. or empty module of a hierarchical design. Specifies that DFTAdvisor add the specified instance. blackbox. Declares the name of a scan chain at the top-level module and assigns the corresponding scan input pin.Command Dictionary Command Summary Table 2-2.) Command Add Pin Equivalences Description Specifies to hold the specified primary input pins at a state either equal to or inverted in relationship to the state of another primary input pin during rules checking. Specifies a grouping of scan cells (a partition) in which scan chains are inserted separately from the remaining scan cells in the design. Specifies the clock pins for a scan chain within a module. V9. Command Summary (cont. instance. Add Primary Inputs Add Primary Outputs Add Read Controls Add Scan Chains Add Scan Groups Add Scan Instances Add Scan Models Add Scan Partition Add Scan Pins Add Seq_transparent Constraints Add Sub Chains Add Subchain Clocks Add Subchain Group Tessent DFTAdvisor Reference Manual.

Specifies the off-state value of the write control lines for RAMs. Specifies the name of the DFT library cell that DFTAdvisor is to remove from the active list of cells that the user can access when adding test points or that DFTAdvisor can access when inserting test logic. Reports general scannability and testability information. along with calculating the controllability and observability values for gates. or any combination of the three. Identifies and optionally defines the primary inputs of control signals. V9. Specifies the name of the group that you want to remove from the clock groups list. Specifies for DFTAdvisor to calculate and display the effects of constraining primary input pins to an unknown value on those pins’ control capability.) Command Add Test Points Description Specifies explicitly where DFTAdvisor places a userdefined test point to improve the design’s testability either through better controllability or observability. UNIX command. Command Summary (cont. Removes primary input pins from the clock list. Removes the no-fault settings from either the specified pin or instance pathnames.0 June 2010 . Returns the non-scan to scan model mapping to the mapping defined by DFTAdvisor.Command Dictionary Command Summary Table 2-2. Add Tied Signals Add Write Controls Alias Analyze Control Signals Analyze Input Control Analyze Output Observe Analyze Testability Delete Black Box Delete Buffer Insertion Delete Cell Models Delete Clock Groups Delete Clocks Delete Mapping Definition Delete Nofaults 18 Tessent DFTAdvisor Reference Manual. Specifies the type of scan test pins on which you want to remove the fanout limit. Specifies for DFTAdvisor to hold the named floating objects (nets or pins) at the given state value. Specifies the shorthand name for a DFTAdvisor command. or existing command alias. Specifies for DFTAdvisor to calculate and display the effects on the observability of masked primary output pins. Undoes the effect of the Add Black Box command.

0 June 2010 19 . Removes the specified. Removes any previously-assigned scan input. Removes the specified sequential models from the scan model list. Removes the specified primary inputs from the current netlist. Deletes a specified subchain clock. Removes the specified scan chain group definitions from the scan chain group list. Removes the specified pins from the list of notest points which the tool cannot use for testability insertion. sequential instances from the useridentified scan instance list. Removes the masking of the specified primary output pins. Removes the read control line off-state definitions from the specified primary input pins. Removes the pin constraints from the specified primary input pins. Removes from the non-scan model list the specified sequential DFT library models. Removes the user specified scan partitions. and clock names from the specified scan chains. Tessent DFTAdvisor Reference Manual. Removes the definition of a pre-existing scan subchain. V9. Removes the pin equivalence specifications for the designated primary input pins.) Command Delete Nonscan Instances Delete Nonscan Models Delete Notest Points Delete Output Masks Delete Pin Constraints Delete Pin Equivalences Delete Primary Inputs Delete Primary Outputs Delete Read Controls Delete Scan Chains Delete Scan Groups Delete Scan Instances Delete Scan Models Delete Scan Partitions Delete Scan Pins Delete Seq_transparent Constraints Delete Sub Chains Delete Subchain Clocks Description Removes the specified sequential instances from the nonscan instance list. Command Summary (cont. output. Removes the pin constraints from the specified DFT library model input pins. Removes the specified primary outputs from the current netlist.Command Dictionary Command Summary Table 2-2. Removes the specified scan chain definitions from the scan chain list.

Prints out the values of the UNIX variables in the environment.) Command Delete Subchain Groups Delete Test Points Delete Tied Signals Delete Write Controls Dofile Echo Exit Find Design Names Help History Insert Test Logic Printenv Read Procfile Report Black Box Report Buffer Insertion Report Cell Models Report Circuit Components Report Clock Gating Description Removes a scan subchain group. Displays design object hierarchical names matched by an input regular expression. Remove the test point definitions at the specified locations. reports the unconnected ports of the specified clock gating cells only. V9. Inserts the test structures that you define into the netlist to increase the design’s testability. Removes the RAM write control line off-state definitions from the specified primary input pins. Displays information on blackboxes and undefined models.0 June 2010 .Command Dictionary Command Summary Table 2-2. Displays a list of all the different scan test pins and the corresponding fanout limit. Reports either the clock gating instances that were identified as having unconnected ports and were connected to either the Scan enable signal or a user-specified signal or. Displays a list of either all cell models or the DFT library models associated with the specified cell type. 20 Tessent DFTAdvisor Reference Manual. Displays a list of previously-executed commands. Command Summary (cont. Reads the specified test procedure file. Removes the assigned (tied) value from the specified floating nets or pins. Terminates the current DFTAdvisor session. Executes the commands contained within the specified file. Issues a user-defined string to the transcript. Displays information about the components of the circuit as either modules or instances. Displays the usage syntax and system mode for the specified command.

Displays information about circuit loops. Displays either a summary of DRC violations (fails) or violation occurrence message(s). Displays a textual report of the currently identified feedback paths. Reports the non-scan to scan model mapping defined in the design. V9. Displays the netlist information for the specified gates. Displays the specified primary outputs. Displays the no-fault settings for the specified pin or instance pathnames. Generates the scannability check results for non-scan instances. Displays the pin constraints of the primary inputs. Displays the current values of all the “set” commands and the default names of the scan type pins. Displays the sequential non-scan model list. Displays the rules checking results for the specified control signals. Displays either a summary of all the flattening rule violations or the data for a specific violation. Displays all of the currently defined read control lines. Displays the specified primary inputs.0 June 2010 21 . Displays all the circuit points for which you do not want DFTAdvisor to insert controllability and observability.Command Dictionary Command Summary Table 2-2. Displays a list of all clock definitions. Displays a list of the currently masked primary output pins. Displays the pin equivalences of the primary inputs. Tessent DFTAdvisor Reference Manual. Command Summary (cont.) Command Report Clock Groups Report Clocks Report Control Signals Report Dft Check Report DRC Rules Report Environment Report Feedback Paths Report Flatten Rules Report Gates Report Loops Report Mapping Definition Report Nofaults Report Nonscan Models Report Notest Points Report Output Masks Report Pin Constraints Report Pin Equivalences Report Primary Inputs Report Primary Outputs Report Procedure Report Read Controls Description Displays a list of all clock group definitions. Displays the specified procedure.

0 June 2010 . Displays all previously assigned scan input. Reports on the scan_enable signal for each scan_chain. Displays the specified timeplate. Displays a detailed report of the design’s statistics. Displays scan partitions.) Command Report Scan Cells Report Scan Chains Report Scan Enable Report Scan Groups Report Scan Models Report Scan Partitions Report Scan Pins Report Seq_transparent Constraints Report Sequential Instances Report Statistics Report Sub Chains Report Subchain Clocks Report Subchain Groups Report Test Logic Report Test Points Description Displays a report or writes a file on the scan cells that reside in the specified scan chains. Displays a report on the subchain groups. Command Summary (cont. Displays information and testability data for sequential instances. V9. Reports on subchain clocks defined for a specified subchain. and clock names. Displays a report on all the current scan chain groups. Reports the identified wrapper cells for each I/O pin that is traced for identification. Displays a report on the scan subchains. Displays the results of the Analyze Testability command. Displays the test point specifications you created with the Add Test Points command and any test points that you enabled DFTAdvisor to automatically identify. Report Testability Analysis Report Tied Signals Report Timeplate Report Variables Related Commands 22 Tessent DFTAdvisor Reference Manual. Displays user-defined variables and values. Displays the sequential scan models currently in the scan model list. output. Displays the test logic that DFTAdvisor added during the scan insertion process. Displays a list of the tied floating signals and pins.Command Dictionary Command Summary Table 2-2. Displays a report on all the current scan chains. Displays the seq_transparent constraints.

Removes all instances from both the scan identification and test point identification lists that DFTAdvisor identified during a run.0 June 2010 23 .) Command Report Write Controls Reset State Description Displays the currently defined write control lines and their off-states. Ripup Scan Chains Run Save History Set Bidi Gating Set Capture Clock Set Command Editing Set Command Editing Set Contention Check Set Display Set Dofile Abort Set DRC Handling Set Fault Sampling Set File Compression Set Flatten Handling Set Gate Level Set Gate Report Tessent DFTAdvisor Reference Manual. Command Summary (cont.Z or . Removes the specified scan chains from the design. Specifies how bidirectional (bidi) pins are controlled during scan chain shifting. Allows processing of all commands in a dofile regardless of an error detection. V9. Assigns a loading factor to the clock specified by the clock_name argument. Specifies how DFTAdvisor globally handles flattening violations. Controls whether the tools read and write files with . Runs the scan or test point identification process. Specifies the additional display information for the Report Gates command. Sets the DISPLAY environment variable from the tool’s command line.gz extensions as compressed files (the default). Specifies the fault sampling percentage for scan identification. Specifies how DFTAdvisor globally handles design rule violations. Specifies whether DFTAdvisor checks the gate types that you determine for contention.Command Dictionary Command Summary Table 2-2. Specifies the hierarchical level of gate reporting and displaying. Saves the command line history file to the specified file. Specifies the capture clock name for random pattern simulation. Sets the command line editing mode.

Specifies how the tool checks the effect of applying the shift procedure on non-scan cells. Inserts I/O buffers. Specifies whether DFTAdvisor will identify sequential elements as “shadow” elements when tracing existing scan chains. Specifies whether DFTAdvisor writes the transcript to the session window.) Command Set Gzip Options Set Identification Model Description Specifies GNU gzip options to use with the GNU gzip command. Assigns scan_enable signals to specific scan chains.Command Dictionary Command Summary Table 2-2. V9. Specifies whether DRC checking attempts to verify a suspected C3 rules violation. Sets DFTAdvisor to automatically insert lockup cells between different clock/edge domains to synchronize the clocks within a scan chain. Specifies for DFTAdvisor to direct the transcript information to a file. Specifies the scan style design. Specifies the simulation model that DFTAdvisor uses to imitate the scan operation during the scan identification process. Specifies whether the tool considers non-transparent latches for scan insertion while test logic is turned on. Specifies whether to delete or keep pin names of library internal pins containing no-fault attributes. Command Summary (cont. Set Internal Fault Set Internal Name Set Io Insertion Set Latch Handling Set Lockup Cell Set Logfile Handling Set Net Resolution Set Nonscan Handling Set Scan Enable Set Scan_enable Sharing Set Scan Type Set Screen Display Set Sensitization Checking Set Shadow Check Set Stability Check 24 Tessent DFTAdvisor Reference Manual. Specifies whether the tool allows faults within or on the boundary of library models. Specifies the behavior of multi-driver nets. Specifies whether to check the non-scan instances for scannability.0 June 2010 . Divides all scan chains into specified groups and assigns a unique scan_ enable signal to each group.

Specifies the number of control and observe test points that DFTAdvisor flags during the identification run. Specifies how tri-state devices are controlled during scan shifting.0 June 2010 25 . Sets up the parameters for the Insert Test Logic command. Specifies the scan identification methodology and amount of scan that DFTAdvisor is to consider during the identification run. Specifies which types of control lines DFTAdvisor makes controllable during the DFT rules checking. Specifies whether the tool detects all zero width events on the clock lines of state elements.) Command Set System Mode Set Test Logic Set Trace Report Set Transient Detection Set Tristate Gating Setup Clock Gating Description Specifies the next system mode for the tool to enter. Registers the primary inputs and outputs of a core design. Enables/disables shift register identification.Command Dictionary Command Summary Table 2-2. Setup EDT Setup Naming Setup Output Masks Setup Pin Constraints Setup Registered IO Setup Scan Identification Setup Scan Insertion Setup Scan Pins Setup Shift_register Identification Setup Test_point Identification Setup Test_point Insertion Tessent DFTAdvisor Reference Manual. Specifies clock gating cells whose unconnected scan enable ports need to be connected to either the Scan Enable signal or a specified signal (pin). Enables the Write ATPG Setup command to write out EDT-specific commands to the ATPG setup files. Specifies whether the tool displays gates in the scan chain trace. V9. Sets the default mask for all output and bidirectional pins. Command Summary (cont. Specifies how DFTAdvisor configures the inputs for the control test points and the outputs for the observe test points. Sets the default pin constraint value for all input and bidirectional pins. Changes the scan-in or scan-out pin naming parameters to index or bus format. Explicitly defines the default names for nets and instances. and reports current or modified settings.

Writes a list of all loops to the specified file. Writes a constraints driver file for the formal verification tool. Writes the test procedure and the dofile for inserted scan chains to the specified files. Writes primary inputs to the specified file. FormalPro. Writes the current design in the specified netlist format to the specified file.) Command Setup Tied Signals Setup Pin Constraints System Write Atpg Setup Write Formal_verification Setup Write Loops Write Netlist Write Primary Inputs Write Primary Outputs Write Procfile Write Scan Identification Write Scan Order Write Subchain Setup Description Changes the default value for floating pins and floating nets that do not have assigned values. V9. Creates specified DEF file. Writes a list of the scan instances that DFTAdvisor has identified or you have defined as scan cells. Specifies the scan chains for wrapper cells. Command Summary (cont. Writes existing procedure and timing data to the named test procedure file. Passes the specified command to the operating system for execution. 26 Tessent DFTAdvisor Reference Manual.Command Dictionary Command Summary Table 2-2. Writes the appropriate Add Sub Chains commands to a file so that DFTAdvisor can understand the pre-existing scan subchains at the top-level of this module.0 June 2010 . Writes primary outputs to the specified file.

Do not enter any of the special notational characters (such as. Tessent DFTAdvisor Reference Manual. or |) when typing the command. Each command description begins on a new page. You can use the line continuation character “\” when application commands extend beyond the end of a line. in alphabetical order. The line continuation character improves the readability of dofiles and helps with the command line entry of multiple-argument commands. []. V9. The notational conventions in use here are the same as those in use in other parts of the manual. {}. the DFTAdvisor commands.Command Dictionary Command Descriptions Command Descriptions The remaining pages in this chapter describe.0 June 2010 27 .

If you issue two Add Black Box commands in tandem.Command Dictionary Add Black Box Add Black Box Scope: Setup mode Usage ADD BLack Box {{{-Instance ins_pathname | -Module module_name} [0 | 1 | X | Z]} [-Pin pinname {0 | 1 | X | Z}]…} | {-Auto [0 | 1 | X | Z]} [-FAUlt_boundary | -NOFAUlt_boundary | -NO_Boundary] Description Defines black boxes. the flatten model command verifies you have blackboxed all undefined models before flattening. Instance-based blackboxing always overrides module-based blackboxing. and sets the constrained value on output or bidirectional black box pins. • 0|1|X|Z An optional literal specifying pin tie values for use with the following switches: 28 Tessent DFTAdvisor Reference Manual. Additionally. V9. but you do not want to include in the next run. DFTAdvisor automatically blackboxes all instances of models the tool considers undefined. • -Module module_name A switch and string pair specifying the name of the module (module_name) for which every instantiation the tool blackboxes. then you can globally blackbox all instances of a particular module while selectively blackboxing a particular instance of the same module with slightly different values. • -Auto A switch specifying blackboxing of all referenced models without a defining netlist module or library model. modules the tool automatically blackboxes drive X on the outputs while the inputs are fault sinks. You can also blackbox modules you have defined. a warning is issued. By default. instances the tool automatically blackboxes drive Xs on their outputs—faults propagating to the black box inputs are classified at ATPG_untestable (AU). Module-Based Black Boxes: By default. DFTAdvisor does not automatically blackbox any instantiated module or component not defined in either the ATPG library or the design netlist. where one is module-based and the other is instance-based. You can also change the output values using the Add Black Box command. The modules contain default output values. Instance-Based Black Boxes: If you use Add Black Box with the -Auto switch. Arguments • -Instance ins_pathname A switch and string pair specifying the full instance pathname (ins_pathname) for the tool to blackbox. You can change the output values by issuing the Add Black Box command.0 June 2010 . When an undefined model in encountered. By default.

This is the default behavior. May be used with -Instance or -Module switches. add black box -module core 0 add black box -instance core1 -pin pin1 1 The following example creates a black box for all undefined models. X. Valid values are 0. • -NO_Boundary A switch specifying to not keep pin pathnames at the boundaries of all blackboxed instances and to not allow boundary pins to become fault sites. Note You must include this switch when you use the Add Black Box command to blackbox macros for Tessent FastScan MacroTest. but nofaults the pins. and Z. -Pin — specifies the tie value for the pin. then core1. V9. add black box -module macro1 -nofault_boundary Related Commands Delete Black Box Report Black Box Tessent DFTAdvisor Reference Manual. Unspecified pins assume the default tie value in effect for the specified instance or module. where X is the default. add black box -auto The following example keeps the pin pathnames at the boundary of all instances of the blackboxed module named “macro1”. Examples The following example creates a black box for module core with a tie value of 0. If you want a different value. -Auto — specifies the tie value for every pin.0 June 2010 29 . If you specify no value for this option. then the application defaults to the Setup Tied Signals command’s value. but not allow boundary pins to become fault sites. • -FAUlt_boundary A switch specifying to keep pin pathnames at the boundaries of all blackboxed instances and allow boundary pins to become fault sites. 1.Command Dictionary Add Black Box o o o -Instance or -Module — specifies the tie value for any undefined pin. then use the -Pin switch and specify the value. • -NOFAUlt_boundary A switch specifying to keep pin pathnames at the boundaries of all blackboxed instances. • -Pin pinname An optional repeatable switch and string pair specifying the tie value of the particular pin.

By default. default name test_clk) — a literal specifying the primary input pin clocking the values DFTAdvisor requires for proper test logic functionality. When a pin has a large fanout. SEN (scan enable.0 June 2010 . The following lists the default pin names for each type of scan pin. the pin’s increased load factor affects the quality of the pin’s output signal. Arguments • max_fanout A required integer specifying the maximum number of gates the test_pin can drive before DFTAdvisor inserts buffers. SSCLK (slave scan clock. TCLK (test logic clock. SMCLK (master scan clock. the scan-related pins (enables and clocks) can fanout to drive multiple gates. When DFTAdvisor inserts the scan circuitry into the design. The value must be greater than 1. V9. You can use the Setup Scan Insertion command to change the default names of the scan pins. you can use the Add Buffer Insertion command. • test_pin A required repeatable literal specifying the type of the primary input scan pin to monitor for the maximum fanout. the tool assumes the test_pin can drive an infinite number of gates. If you want to avoid signal degradation of a primary input scan pin. default name scan_clk) — a literal specifying the primary input pin clocking the scan data through the scan chain when using the clocked-scan type.Command Dictionary Add Buffer Insertion Add Buffer Insertion Scope: All modes Usage ADD BUffer Insertion max_fanout test_pin… [-Model modelname] Description Specifies for DFTAdvisor to place buffer cells between the primary input of the specific test pin and the gates driving the test pin. default name scan_en) — a literal specifying the primary input pin enabling the scan chain. default name test_en) — a literal specifying the primary input pin enabling the operation of the test logic circuitry. default name scan_mclk) — a literal specifying the primary input pin clocking the scan data into the master scan elements of the scan chain when using the LSSD scan type. The fanout limit propagates down the buffer tree the tool inserts. default name scan_sclk) — a literal specifying the primary input pin for clocking the scan data into the slave scan elements of the scan chain when using the LSSD scan type. SCLK (scan clock. 30 Tessent DFTAdvisor Reference Manual. This sets the fanout limit on all buffers used to buffer the specified signal. This value overrides the default value set by the Add Cell Models command. TEN (test logic enable.

0 June 2010 31 . by default. Add Buffer Insertion Example add cell models buf2a -type buf -max_fanout 10 report cell models BUF : buf1a<infinity> buf2a<10> add buffer insertion 5 sen -model buf2a In this example. If you do not use the -Model switch. default name scan_reset) — a literal specifying the new scan reset for the scan cells. The first command explicitly adds the buf2a cell to the buffer model list and defines its fanout to be 10. default name scan_set) — a literal specifying the new scan set for the scan cells. V9. • -Model modelname An optional switch and string pair specifying the name of a buffer in the library DFTAdvisor inserts when the scan pin reaches the maximum fanout. the tool would use the buf1a model. Related Commands Add Cell Models Delete Buffer Insertion Report Buffer Insertion Setup Scan Insertion Tessent DFTAdvisor Reference Manual. Next. This example uses the -Model switch to specify the buf2a model. You must first identify the buffer with either the Add Cell Models command or with the cell_type library attribute.Command Dictionary Add Buffer Insertion SET (scan set. RESET (scan reset. the report shows the two buffers currently in the buffer model list. Examples Example 2-1 explicitly specifies the buffer model to use and sets the maximum fanout for the scan enable pin for a mux-DFF cell. because it is the first in the buffer model list. which you obtain with the Report Cell Models command. the tool uses the first buffer model in the buffer cell model list. Without this switch. you must initially define the buf1a buffer model in the library using the cell_type library attribute with the value of “BUF”. The last command specifies the maximum fanout of the scan enable pin and all buffers inserted to buffer the scan enable signal. Example 2-1.

NAnd — a literal specifying a 2-input NAND gate. V9. multiple models from the DFT library are used. the scan input or scan enable pins). lockup cell. You can use the Add Cell Models command instead of defining the cell_type attribute in the library model description.Command Dictionary Add Cell Models Add Cell Models Scope: All modes Usage ADD CEll Models dftlib_model {-Type {INV | And | {Buf -Max_fanout integer} | OR | NAnd | NOr | Xor | INBuf | OUtbuf | {Mux selector data0 data1} | {Scancell clk data [-Active {High | Low}]} | {DFf clk data [-Active {High | Low}]} | {DLat enable data [-Active {High | Low}]} | {Wrapcell clk data}} [{-Noinvert | -Invert} output_pin] Description The Add Cell Models command specifies DFT library models for user-defined test points. And — a literal specifying a 2-input AND gate. The cell_type attribute in the library model description specifies the components available for use as test logic. • -Type A required switch and argument pair that specifies a model type. or test point insertion. OR — a literal specifying a 2-input OR gate. see cell_type in the Tessent Common Resources Manual for ATPG Products. Arguments • dftlib_model A required string that specifies the name of a cell model in the DFT library used for test logic. and system-generated test logic. Options include: INV — a literal specifying a 1-input inverter gate. system-generated test points. INBuf — a literal specifying a primary input buffer gate DFTAdvisor inserts whenever the tool adds new input pins (for example.0 June 2010 . DFTAdvisor places the buffer between the primary input and the new pin. NOr — a literal specifying a 2-input NOR gate. When adding test logic circuitry. 32 Tessent DFTAdvisor Reference Manual. Buf -Max_fanout integer — a literal with a switch and integer pair specifying a 1-input buffer gate with an optional buffer fanout limit. buffer tree. For more information on the design library attribute. Xor — a literal specifying an exclusive OR gate.

scan enable. By default. you may also use an optional switch and literal to specify the overall inversion on the clock pin. You may also include an optional switch with a literal to specify the inversion on the clock pin. You must specify the names of the enable line and the data pin of the DFT library cell model. master clock. by default. If you are defining this model for use with lockup cells.Command Dictionary Add Cell Models OUtbuf — a literal specifying a primary output buffer gate DFTAdvisor inserts whenever the tool adds new output pins (such as the scan output pin). If you are defining this model for use with lockup cells. You must specify the names of the clock and data pins of the DFT library cell model. • {-Noinvert | -Invert} output_pin An optional switch and string pair you can use with values of the cell model type that are sequential elements. DLat enable data [-Active {High | Low}] — a literal and two strings specifying a D latch with two input pins. data. specifically enable and data. scan in. data. data. scan in. ScanCell. or DLAT model. If you do not explicitly specify an inversion switch. DFf clk data [-Active {High | Low}] — a literal and two strings specifying a D flip-flop with two input pins. and scan enable a LSSD scan cell with the following five inputs: clock. This option works in conjunction with the Add Test Points and the Setup Registered IO commands. scan clock. Wrapcell clk data — literal and two strings specifying a mux-scan cell with five input pins (clock. clock and data. Tessent DFTAdvisor Reference Manual. and scan enable a clocked-scan cell with the following four inputs: clock.0 June 2010 33 . scan in. an active-high polarity clock pin is used. By default. You must specify the names of the clock and data pins of the DFT library cell model. By default. It places the buffer between the new pin and the primary output. DFTAdvisor uses the first output_pin value it identifies on a DFF. and slave clock o o You must specify the name of the clock and data pins of the DFT library cell model. This switch specifies whether the output_pin has an inversion relationship with the data input of the given sequential element. and test enable). V9. Mux selector data0 data1 — a literal and three strings specifying a 2-1 multiplexer and the names of the selector pin and both data pins. This option works in combination with the Add Test Points command or Set Lockup Cell command. Scancell clk data [-Active {High | Low}] — a literal and two strings specifying one of the following scan cells: o a mux-DFF scan cell with the following four input pins: clock. This option is meant to work in combination with the Setup Registered IO command. DFTAdvisor uses an active-high polarity clock pin. DFTAdvisor assumes no inversion relationship between the output_pin and the data input. an active-high polarity clock pin is used. you may also use an optional switch and literal to specify the overall inversion on the clock pin. By default. specifically. data.

DFTAdvisor can usually ensure controllability of sequential elements with model types of And. and then explicitly specifies the buffer model to use and sets the maximum fanout for the scan enable: add cell models buf2a -type buf report cell models BUF : buf1a buf2a add buffer insertion 5 sen -model buf2a Related Commands Add Buffer Insertion Delete Cell Models Report Cell Models Set Io Insertion Set Lockup Cell Set Test Logic Setup Registered IO Setup Scan Identification 34 Tessent DFTAdvisor Reference Manual. add clocks 0 clk set test logic -set on -reset on -clock on set system mode dft report dft check … add cell models and2 -type and add cell models or2 -type or add cell models mux21h -type mux si a b Example 2 The following mux-DFF example adds the buf2a cell to the buffer model list. and clock pins on sequential elements (flip-flops).0 June 2010 .Command Dictionary Add Cell Models Example 1 The following example shows a typical use of test logic involving the set. reset. and. Or. V9. Mux.

you can use the Set Lockup Cell command. and defines the latch DFTAdvisor uses for synchronizing the different clocks: Tessent DFTAdvisor Reference Manual. all_clocks. splits those clocks into two different groups. Every clock is contained in either a user-defined clock group or the default clock group.Command Dictionary Add Clock Groups Add Clock Groups Scope: Dft mode Prerequisites: You must first define all the clocks with the Add Clocks command. DFTAdvisor groups scan cells controlled by the same clock in the chain. If you want to insert lockup cells between the different clock domains of the groups. Usage ADD CLock Groups group_name clk_pin… [-Tclk] Description Specifies the grouping of scan cells controlled by different clocks onto one chain. If you are merging scan cells controlled by multiple shift clocks into one scan chain. V9.0 June 2010 35 . Examples The following example lists the clocks in the current clock list. As you define clock groups. Arguments • • group_name A required string naming the list of clock pins you provide with the clk_pin argument. These latches synchronize the pulses to all the clock inputs of the scan cells within the same scan chain. you can place together scan cells sharing the same shift clock by using the Add Clock Groups command. you cannot specify the actual clock name here. clk_pin A required repeatable string identifying the names of all the clocks controlling the cells you group together. • -Tclk An optional switch specifying the inclusion of the test clock in the clock group. the clocks in these groups are removed from the default clock group. Because DFTAdvisor adds the clock signal during test structure insertion.

Related Commands Add Cell Models Add Clocks Delete Clock Groups Report Clock Groups Set Lockup Cell 36 Tessent DFTAdvisor Reference Manual.0 June 2010 .Command Dictionary Add Clock Groups add clock 1 clk1 clk2 add clock 0 clk3 clk4 clk5 clk6 set system mode dft … add clock groups group1 clk1 clk3 clk4 add clock groups group2 clk2 clk5 clk6 add cell models dlat1a -type dlat enable data add cell models inv -type inv set lockup cell on run insert test logic This example also enables automatic lockup cell insertion. Note This example creates two scan chains and corresponding to the two clock groups. V9. and subsequently performs the scan and latch placement.

If both the -Internal and -Pin_name switches are used. If you use this switch. for DRC analysis only. Arguments • off_state A required literal specifying the pin value that cannot affect the output pin activity of the instance. then DFTAdvisor does not recognize it as a scannable instance. If an instance fails the scannability check. 1 — A literal specifying the off-state value is 1. new primary input pin. and resets) and the signal’s corresponding off-state with the Add Clocks command before entering the Dft mode. • primary_input_pin A required repeatable string that lists the primary input pins that you want controlling the output pins of an instance. DFTAdvisor inserts the clocks into a default clock group. DFTAdvisor also automatically declares all pins that are equal to that pin as control pins. If the -Internal switch is used. Otherwise. primary_input_pin lists internal pin pathnames. As you declare clocks. The list of primary input pins must all have the same off_state. the primary_input_pin argument must be an internal pin. For an edgetriggered control signal. The off-state choices are as follows: 0 — A literal specifying the off-state value is 0. If you declare a control pin with the Add Clocks command. • -Internal An optional switch that specifies primary_input_pin is an internal pin that. You must declare control signals (for example.0 June 2010 37 . V9. clocks. When writing out the modified netlist. should be disconnected from its original driver and treated as if it were a clock primary input. and cannot replace it with the corresponding scan cell. instances outside of the design rules checker’s control fail the scannability check. by looking at the arguments of any Add Pin Equivalences commands. For example. not an actual clock primary input pin. the off–state is the value on the pin that results in the clock inputs being placed at the initial value of a capturing transition. the off-state of an active low reset pin is 1 (high).Command Dictionary Add Clocks Add Clocks Scope: Setup mode Usage ADD CLocks off_state primary_input_pin… … [-internal] [-pin_name user_pinname] [-top_name existing_pin [-inverted]] Description Specifies the names and inactive states of the primary input pins controlling the clocks in the design. primary_input_pin lists internal pin pathnames to merge into a single. sets. this internal clock Tessent DFTAdvisor Reference Manual. all_clocks.

The Write Atpg Setup command will refer to the top level signal instead of the internal net. add clock 0 /pll_block/clock1 -internal -top_name /clock_trigger 38 Tessent DFTAdvisor Reference Manual. and clock pins to be clocks. DFTAdvisor issues a warning message if it cannot automatically trace from the internal node to a primary input pin (the pin must not be a scan signal. a D flip-flop. The user_pinname is a name (wildcards are not allowed) given to the newly-created primary input pin. you do not need to define it using the Add Clocks command. clear. which means they have the ability to control the states on the output pins of that instance.0 June 2010 . The -Pin_name switch is also allowed if the primary_input_pin argument specifies a single. • -inverted An optional switch that must be used in conjunction with the -top_name switch to indicate an inverting path. and must not have any pin constraints). The next two commands declare the preset. V9. Note: Although the top_name switch is optional. this may be necessary if the signals cannot be traced due to a black-boxed module. Example 1 The following example first lists the primary inputs of the design. The top level pin should be a clock signal. Use this switch to define internal clock inputs normally driven by on-chip circuitry. • -top_name existing_pin An optional switch and string pair that specifies the name of an existing top level pin that drives the internal node during scan chain shifting. The -Pin_name switch is only valid when the -Internal switch is also specified.Command Dictionary Add Clocks input is not added to the top level interface. • -PIn_name user_pinname An optional switch and string pair that specifies the name of a new pseudo primary input pin that drives all of the internal pins specified with the primary_input_pin argument. report primary inputs SYSTEM: SYSTEM: SYSTEM: SYSTEM: /CLK_INPUT /D_INPUT /PRE_INPUT /CLR_INPUT add clock 1 /pre_input /clr_input add clock 0 /clk_input Example 2 The following example defines the output of a PLL block as an internal clock and explicitly specifies the top level signal that can be used to generate a clock pulse at the internal node. internal pin pathname which ensures that a known pin name is used for the new primary input pin.

Command Dictionary Add Clocks Related Commands Add Clock Groups Analyze Control Signals Delete Clocks Report Clocks Tessent DFTAdvisor Reference Manual.0 June 2010 39 . V9.

or scan model. then the -Output switch is required. Arguments • object_name A required string that specifies the name of the non-scan model you want to map to a different scan model. The Add Mapping Definition command defines the mapping of non-scan models to scan models. o o • -Instance | -Module An optional switch that specifies the type of the object_name argument. instead of a non-scan model. all instances under a hierarchical instance. then this is that object’s name.0 June 2010 . You can change the scan model for an individual instance. If neither switch is specified. as defined in the library. Usage ADD MApping Definition object_name [-Instance | -Module] [-Nonscan_model nonscan_model_name] [-Scan_model scan_model_name] [-Output scan_ouput_pin_name] Description Overrides the non-scan to scan model mapping defined by DFTAdvisor. module. the -Instance switch is required and the model must be specified with the -Nonscan_model switch or -Scan_model switch. you can change the scan output pin of the scan model in the same manner. then the -Module switch is required and the model must be specified with the -Nonscan_model or -Scan_model switch. If.Command Dictionary Add Mapping Definition Add Mapping Definition Scope: Setup and DFT modes Prerequisites: You can only override the mapping for scan models of the same scan type. a mux-DFF scan model can only be replaced by another mux-DFF scan model. If this argument is a scan model. you can only define the scan output pin mapping. o If this argument is the name of an instance or hierarchical instance. Because you specified a scan model. or all occurrences of the model in the entire design. If this argument is the name of a module. and not to define the mapping. Additionally. For example. hierarchical instance. V9. Refer to “Defining Scan Cell and Scan Output Mapping” in the Scan and ATPG Process Guide for conceptual information on this topic. all instances in all occurrences of a module in the design. you specify an instance. Note Use this command for changing the existing non-scan to scan model mapping. the object_name is a model (the default). 40 Tessent DFTAdvisor Reference Manual.

o o • -Nonscan_model nonscan_model_name A switch and string pair that specifies the name of the non-scan model for which you want to change the mapping. then all instances under that instance matching the -Nonscan_model or (for output mapping) matching the -Scan_model have their mapping changed. V9. The second command maps the fd1 non-scan model to the fd1s2 scan model and changes the scan output pin to “qn” for all matching instances under the hierarchical instance “/top/counter1”. Otherwise. This argument is required if you specify -Instance or -Module switch. and specify the scan model in the object_name argument. • -Scan_model scan_model_name A switch and string pair that specifies the name of the scan model that you want to use for the specified non-scan model. all instances within that module that match the -Nonscan_model or (for output mapping) matching the -Scan_model have their mapping changed. This argument is required except when you are changing the mapping of the scan output pin. then for all occurrences of that module. Examples The following example maps the fd1 non-scan model to the fd1s scan model for all occurrences of the model in the design: add mapping definition fd1 -scan_model fd1s The following example maps the fd1 non-scan model to the fd1s scan model and changes the scan output pin to “qn” for all occurrences of the model in the design: add mapping definition fd1 -scan_model fd1s -output qn The first command in the following example maps the fd1 non-scan model to the fd1s scan model for all matching instances in the “counter” module and for all occurrences of that module in the design.Command Dictionary Add Mapping Definition o If you specify -Instance and the instance is primitive. Note that counter1 is an instance of the module counter changed in the first command. add mapping definition counter -module -nonscan_model fd1 -scan_model fd1s add mapping definition /top/counter1 -instance -nonscan_model fd1 -scan_model fd1s2 -output qn Tessent DFTAdvisor Reference Manual. The port must have been declared as a scan-out port in the scan_definition section of the scan cell. If you specify -Instance and the instance is hierarchical. • -Output scan_ouput_pin_name An optional switch and string pair that specifies the name of the scan output pin to use instead of the DFTAdvisor defined scan output pin. If you specify -Module.0 June 2010 41 . specify the name of the non-scan model in the object_name argument. then only the named instance has its mapping changed.

0 June 2010 .Command Dictionary Add Mapping Definition The following example changes the scan output pin to “qn” for all occurrences of the fd1s scan model in the design: add mapping definition fd1s -output qn Related Commands Delete Mapping Definition Report Mapping Definition 42 Tessent DFTAdvisor Reference Manual. V9.

The Add Nofaults command places a nofault setting on either a single specified pin. • -Module A switch that specifies to interpret the modulename argument as a module pathname. or on all pins of a specified instance or module. DFTAdvisor recognizes the nofault setting on pins and instances through the following two mutually exclusive tagging processes: • • • Interactively using the Add Nofaults command for pins and instances Using the nofault DFT library attribute for pins • Arguments modulename A repeatable string that specifies the name of a module to which you want to assign nofault settings. along with all the pin faults underneath that instance (if it is a hierarchical instance). • • If the pathname is a pin. and the tool adds the nofault for all matching modules or library models. If the pathname is an instance. If the pathname is a module. then DFTAdvisor ignores only the fault on that pin. V9.Command Dictionary Add Nofaults Add Nofaults Scope: Setup mode Usage ADD NOfaults {{{modulename -Module} | {object_expression… [-PIN | -Instance]}} [-Stuck_at {01 | 0 | 1}] [-Keep_boundary]} Description Places nofault settings either on a pin or on all pins of a specified instance or module. then the tool ignores all pin faults on the top-level of the module. Note The nofaults that you create with the Add Nofaults command only exist for the current DFTAdvisor session. You must include the -Module switch when you specify a module name. All instances of the module are affected. along with all the pin faults on all instances and pins underneath that module for every occurrence of that module in the design. Tessent DFTAdvisor Reference Manual.0 June 2010 43 . You can use the asterisk (*) and question mark (?) wildcards for the modulename argument. then the tool ignores all pin faults on the top-level of that instance.

and the question mark matches any single character. By default. pin pathnames are matched first. add clocks 0 clock add nofaults i_1006 -instance add nofaults i_1_16/df0/q set system mode dft run 44 Tessent DFTAdvisor Reference Manual. the tool next tries to match instance pathnames. This option does not apply to nofaults on pin pathnames. the tool ignores it. Choose from one of the following: 01 — specifies the placement of a nofault setting on both the “stuck-at-0” and “stuck-at1” faults. The asterisk matches any sequence of characters (including none) in a name. • -Keep_boundary An optional switch that specifies that nofaults are applied to the pins inside of the specified instance or module. If a pin pathname match is not found. If the object expression specifies a pin within an instance of an ATPG library model. You can force the tool to match only pin pathnames or only instance pathnames by including the -Pin or -Instance switch after the object_expression. the tool will then assign nofault settings to all the pins matched. also referred to as design level pins. The string may include any number of embedded asterisk (*) or question mark (?) wildcard characters. • -Stuck_at 01 | 0 | 1 An optional switch and literal pair identifying the stuck-at values receiving the nofault setting. 1 — specifies the placement of a nofault setting on the “stuck-at-1” faults. • -Instance An optional switch that specifies to use the preceding object expression to match only instance pathnames.Command Dictionary Add Nofaults • object_expression A string representing a list of pathnames of instances or pins for which you want to assign nofault settings. Examples The following example first tags all the pin faults on and below an instance. the tool will then assign nofault settings to all boundary and internal pins of the instances matched (unless you use the -Keep_boundary switch). • -PIN An optional switch that specifies to use the preceding object expression to match only pin pathnames. Pin pathnames must be ATPG library cell instance pins.0 June 2010 . 0 — specifies the placement of a nofault setting on the “stuck-at-0” faults. V9. but faults are still allowed at the boundary pins of the specified instances or modules. This is the default. and then tags the fault on a specific pin.

0 June 2010 45 . V9.Command Dictionary Add Nofaults Related Commands Delete Nofaults Report Nofaults Tessent DFTAdvisor Reference Manual.

Usage ADD NONscan Instances pathname.. If you want to flag all instances of a certain library model as non-scan. then all instances beneath it are also flagged as non-scan. If the instance is hierarchical.0 June 2010 . Also. if these cells are used to hold off sets and resets of other cells so that another cell can be scannable. The string instance_expression is defined as: { string | string * } . or reset signal (primary input) that controls the contents of sequential instances. they are considered for scan. DFTAdvisor will not perform the scannability rule checks on non-scan instances unless you execute the Set Nonscan Handling command.Command Dictionary Add Nonscan Instances Add Nonscan Instances Scope: All modes. | instance_expression [-INStance | -Control_signal | -Module] Description Specifies for DFTAdvisor to ignore the specified instances. DFTAdvisor adds all scannable instances controlled by the control signals to the non-scan instance list. Arguments • pathname A required repeatable string that specifies the pathnames of the sequential instance or control signals (that control instances) which you want DFTAdvisor to ignore. except only Dft mode for the -Control_signal option.. • instance_expression A string representing a list of instances within the design. If TIE0 and TIE1 non-scan cells are scannable. Control pins can be any clock. or all instances within the specified module.. You can use the Report Control Signals command to see the pins that control the sequential instances in the design. set.. you must use this command to make them non-scan. However. The Add Nonscan Instances command causes DFTAdvisor to ignore the specified instances. you can use the Add Nonscan Models command as a shortcut. The asterisk (*) is a wildcard that allows you to match many instances in a design. When adding non-scan instances with control signals. 46 Tessent DFTAdvisor Reference Manual. when identifying and inserting the required scan elements and test logic. all instances controlled by the specified control pin. or all instances within the specified module when you execute both the scan identification process with the Run command and the scan insertion process with the Insert Test Logic command. Any expression that does not contain an asterisk (*) will match exactly zero or one instance. instances controlled by the specified control signals. V9.

V9. pins (control signals). but if the expression specifies a location below the instance level of an ATPG library model. or modules.0 June 2010 47 . …)” where clkgen is the module name. clk_out.Command Dictionary Add Nonscan Instances This argument does not support pathnames to objects below the instance level of an ATPG library model. The default is instances. the tool will issue an error message. You can use a pathname expression to select several instances and the tool will then add nonscan instances for all the pins on those instances. You can only use the -Control_signal option in Dft mode. • -INStance | -Control_signal | -Module An optional switch that specifies whether the pathnames are instances. Examples The following example specifies that DFTAdvisor ignore the sequential i_1006 instance when identifying and inserting the required scan circuitry: add nonscan instances i_1006 Related Commands Delete Nonscan Instances Insert Test Logic Report Sequential Instances Run Set Nonscan Handling Tessent DFTAdvisor Reference Manual. An example Verilog module is “module clkgen (clk.

You must enter the model names as they appear in the DFT library. Examples The following example specifies that DFTAdvisor should not substitute any of the instances of the DFT library model named d_flip_flop with the equivalent scan replacement DFT library model. The Add Nonscan Models command causes DFTAdvisor to ignore the instances of the specified models. you can use the Add Nonscan Instances command. when you execute both the scan identification process with the Run command. If you want to flag individual instances as non-scan. V9.Command Dictionary Add Nonscan Models Add Nonscan Models Scope: All modes Usage ADD NONscan Models model_name… Description Instructs DFTAdvisor to ignore all instances of the specified sequential DFT library model when identifying and inserting the required scan elements and test logic into the design. and the scan insertion process with the Insert Test Logic command. Arguments • model_name A required repeatable string that specifies the model names that you want DFTAdvisor to ignore. unless you specify checking using the Set Nonscan Handling command. add nonscan models d_flip_flop Related Commands Delete Nonscan Models Insert Test Logic Run Report Nonscan Models Set Nonscan Handling 48 Tessent DFTAdvisor Reference Manual. DFTAdvisor does not check the scannability on the instances instantiated from the added nonscan models.0 June 2010 .

excludes specified D input scan cells. Any expression that does not contain an asterisk (*) will match exactly zero or one instance. You can use a pathname expression to select several instances and the tool will then add notest points for all the pins on those instances. • instance_expression A string representing a list of instances within the design. or excludes delay paths from use as controllability and observability insertion points. The string instance_expression is defined as: { string | string * } . This argument does not support pathnames to objects below the instance level of an ATPG library model. The Report Notest Points command displays all the pins in this list or can list the defined critical paths. The format of the file is the same as the file loaded into Tessent FastScan with the Load Paths command. consequently. excludes all output pins on the specified instance.0 June 2010 49 ... The Add Notest Points command excludes the specified cell output pins. The asterisk (*) is a wildcard that allows you to match many instances in a design.Command Dictionary Add Notest Points Add Notest Points Scope: Setup and Dft modes Usage ADD NOtest Points {pin_pathname… | instance_pathname… | instance_expression [-Observe_scan_cell]} | -Path filename Description Adds circuit points to list for exclusion from testability insertion. an error occurs when you issue this command. DFTAdvisor adds no test points to the output of that gate. If the selected pin is already a control or observe point. V9. For more information on the format. If you specify a path file that contains delay paths. refer to “The Path Definition File” in the Scan and ATPG Process Guide. Arguments • pin_pathname A repeatable string that lists the output pins that you do not want to use for controllability and observability insertion. • instance_pathname A repeatable string that lists the instances whose output pins you do not want to use for controllability and observability insertion. but if the expression specifies Tessent DFTAdvisor Reference Manual. DFTAdvisor marks each gate in the path. All output pins within that (hierarchical) instance are added to the list of pins that should be excluded from consideration. This prevents control and observation points from being added to a critical path and thus prevents increasing the load on any of these gates in that path.

• -Observe_scan_cell An optional switch that excludes the instance named in the instance_pathname argument for use as an observation scan cell. For more information on the format of the file. Examples The following example first sets up the test point identification parameters.0 June 2010 . refer to “The Path Definition File” in the Scan and ATPG Process Guide.Command Dictionary Add Notest Points a location below the instance level of an ATPG library model. V9. then specifies output pins tr_io and ts_i that DFTAdvisor cannot use for testability insertion: setup test_point identification -control 9 -obs 20 -patterns 32000 -base simulation setup test_point insertion -cshare 16 -oshare 16 set system mode dft setup scan identification none add notest points tr_io ts_i run Related Commands Delete Notest Points Report Notest Points Setup Test_point Insertion 50 Tessent DFTAdvisor Reference Manual. • -Path filename A switch and filename pair that specifies the pathname to a file that contains critical path information. the tool will issue an error message.

Arguments • primary_output A required repeatable string that specifies the names of the primary output pins to mask. You can set a default mask for all output and bidirectional pins using the Setup Output Masks command. DFTAdvisor also applies and maintains the specified (-Hold) state value on the pins. Tessent DFTAdvisor Reference Manual. When you enter the primary_output argument without the -Hold switch. If you specify the -Hold switch. you can explicitly specify that the output pin is driving the inactive value. -Nohold An optional switch that allows any state value on the specified primary output pin. V9. you inform DFTAdvisor to mark that pin as an invalid observation point during the identification process. 1 — Maintains a high logic state on the primary output pin. To turn off the default masks for all output pins. DFTAdvisor uses primary output pins as the observe points during the scan identification process. There are specific design practices that mask specific primary output pins in order to group the sequential elements associated with those primary outputs (for example. or remove a hold value using the Delete Output Masks command. refer to “Understanding Wrapper Chains” in the Scan and ATPG Process Guide. if you are using wrapper chains). When you mask a primary output pin. you must use the Setup Output Masks command with the Off literal. • • -All A required switch that masks all the primary output pins. in addition to masking the specified pins.0 June 2010 51 . For more information on wrapper chains. The choices for the hold literal value are as follows: 0 — Maintains a low logic state on the primary output pin.Command Dictionary Add Output Masks Add Output Masks Scope: Setup mode Usage ADD OUtput Masks {primary_output… | -All} [-Nohold | -Hold {0 | 1}] Description Masks the specified primary output pins during the scan identification analysis. You can add a hold value to a default mask with the Add Output Masks command. If you use this switch. • -Hold 0 | 1 An optional switch and literal pair that specifies the state to maintain on the primary output pin. This is the default. then. DFTAdvisor marks the specified pins as invalid observation points during the identification process.

DFTAdvisor identifies all the sequential elements that are observable only through the masked primary output pin.Command Dictionary Add Output Masks Examples The following example first sets up DFTAdvisor to recognize only the wrapper cells during the scan identification run. when you issue the Insert Test Logic command. Related Commands Analyze Output Observe Delete Output Masks Report Output Masks Setup Output Masks Setup Scan Identification 52 Tessent DFTAdvisor Reference Manual. Then. V9. DFTAdvisor stitches all those scan cells it previously identified as being wrapper cells into one wrapper chain. Next. The invocation default identification type is sequential scan.0 June 2010 . setup scan identification wrapper_chains add output masks out1 out2 out3 When you issue the Run command later in the session. the example specifies the primary output pins that the Add Output Masks command associates with the wrapper cells.

you may want to hold a test enable pin at the active state to keep the chip in test mode. During the DRC process. C0 | C1 | CZ | CX A literal that specifies the constant value to constrain the primary_input pin to. it adds to the scan candidate list the sequential cells that are controllable through the primary input pin.0 June 2010 53 . refer to “Understanding Wrapper Chains” in the Scan and ATPG Process Guide. You can set a default pin constraint value for all input and bidirectional pins using the Setup Pin Constraints command. such as simulationbased test point selection. those that you constrained to an unknown value. When DFTAdvisor performs the scan identification process during the Run command. For example. you want to hold a pin at a constant state. Note This command affects other commands that relate to fault simulation. DFTAdvisor also uses pin constraints set to unknown as a way to flag primary inputs that are uncontrollable from the higher chip-level primary inputs.Command Dictionary Add Pin Constraints Add Pin Constraints Scope: Setup mode Usage ADD PIn Constraints primary_input_pin {C0 | C1 | CZ | CX} Description Holds the specified input pin at a constant state during the DRC and loop cutting processes. The pin constraints set by the Setup Pin Constraints command are overridden by the values set with the Add Pin Constraints command. DFTAdvisor performs the DRC and loop cutting processes when you issue the Set System Mode Dft command. If you are using the wrapper chain type. V9. You can remove an override of a default pin constraint using the Delete Pin Constraints command. CZ — Applies a constant Z (high-impedance) to the specified primary input pins. C1 — Applies a constant 1 to the specified primary input pins. Tessent DFTAdvisor Reference Manual. CX — Applies a constant X (unknown) to the specified primary input pins. For more information on wrapper chains. Arguments • • primary_input_pin A required string that specifies the primary input pin to hold at the constant_value. You can remove default pin constraint for all input pins. with the Setup Pin Constraints command. The constraint choices are as follows: C0 — Applies a constant 0 to the specified primary input pins.

0 June 2010 . V9.Command Dictionary Add Pin Constraints Example The following example illustrates how to hold two primary input pins to constant values: add pin constraints kgmt c1 add pin constraints dsint c0 Related Commands Add Seq_transparent Constraints Analyze Input Control Delete Pin Constraints Report Pin Constraints Setup Pin Constraints 54 Tessent DFTAdvisor Reference Manual.

Command Dictionary Add Pin Equivalences Add Pin Equivalences Scope: Setup mode Usage ADD PIn Equivalences primary_input_pin… [-Invert] primary_input_pin_ref Description Specifies to hold the specified primary input pins at a state either equal to or inverted in relationship to the state of another primary input pin during rules checking. Rules checking occurs when you use the Set System Mode Dft command. Examples The following example restricts the first primary input (indata2) to have an inverted value with respect to the second primary input (indata4): add pin equivalences indata2 -Invert indata4 Tessent DFTAdvisor Reference Manual. such as simulation-based test point selection. You can immediately precede this string with the -Invert switch to cause DFTAdvisor to hold the primary_input_pin value to the opposite state of the primary_input_pin_ref value. That is.0 June 2010 55 . V9. You cannot specify a constrained pin as an equivalent pin. During these rule checks. • -Invert An optional switch that specifies for DFTAdvisor to hold the primary_input_pin value to the opposite state of the primary_input_pin_ref value. you must first delete the pin equivalence and manually add the pin constraint to each individual pin. Note This command has effects on other commands that relate to fault simulation. you must enter it immediately prior to the primary_input_pin_ref value. Arguments • primary_input_pin A required. repeatable string that specifies a list of primary input pins whose values you want to either equal or invert with respect to primary_input_pin_ref. • primary_input_pin_ref A required string that specifies the name of the primary input pin whose value you want DFTAdvisor to use when determining the state value of primary_input_pin. you cannot specify a constrained pin as either the primary_input_pin or the primary_input_pin_ref arguments. there are times when a pin needs to be held at the same (or opposite) state in reference to another pin. If you want to add a pin constraint to a group of equivalent pins. If you use this switch.

V9.0 June 2010 .Command Dictionary Add Pin Equivalences Related Commands Delete Pin Equivalences Report Pin Equivalences 56 Tessent DFTAdvisor Reference Manual.

0 June 2010 57 . Use the -Cut option to disconnect the original drivers of the net. making the added primary input the only driver of the net. the tool designates them as user-class primary inputs. so that the added primary input becomes the only driver of the net. Otherwise. You can display the user class. The Add Primary Inputs command adds an additional primary input to each specified net path. • -Module An optional switch that specifies addition of the primary input to the specified nets in all modules. the tool treats this net as a wired net. repeatable string that specifies the pathname of the pins to which you want to add primary inputs.Command Dictionary Add Primary Inputs Add Primary Inputs Scope: Setup mode Usage ADD PRimary Inputs net_pathname… [-Cut] [-Module] Description Adds a primary input to the net. Once added. system class. or full classes of primary inputs using the Report Primary Inputs command. which it designates as system-class primary inputs. Only one primary input is added to the design for that net when many occurrences of that net occurs in the modules. V9. Arguments • net_pathname A required. Tessent DFTAdvisor Reference Manual. if there are other drivers besides the newly added primary input. • -Cut An optional switch that specifies disconnection of the original drivers of the net. as opposed to the primary inputs described in the original netlist.

Command Dictionary Add Primary Inputs Examples The following example adds two new primary inputs to the circuit and places it in the user class of primary inputs: add primary inputs indata2 indata4 Related Commands Delete Primary Inputs Report Primary Inputs 58 Tessent DFTAdvisor Reference Manual.0 June 2010 . V9.

The Add Primary Outputs command adds an additional primary output to each specified net.0 June 2010 59 . V9. repeatable string that specifies the nets to which you want to add primary outputs. Examples The following example adds a new primary output to the circuit and places it in the user class of primary outputs: add primary outputs outdata1 Related Commands Delete Primary Outputs Report Primary Outputs Tessent DFTAdvisor Reference Manual. or full classes of primary outputs using the Report Primary Outputs command. The tool defines the primary outputs described in the original netlist as system class primary outputs. Once added. system class. Arguments • net_pathname A required.Command Dictionary Add Primary Outputs Add Primary Outputs Scope: Setup mode Usage ADD PRimary Outputs net_pathname… Description Adds a primary output to the net. the tool defines them as user class primary outputs. You can display the user class.

You cannot use clocks. constrained pins. and to which you are assigning the given off-state value. primary_input_pin A required. V9. repeatable string that lists the primary input pins you want to designate as RAM read control lines. 1 A literal that specifies 1 as the off-state value for the RAM read control lines.Command Dictionary Add Read Controls Add Read Controls Scope: Setup mode Usage ADD REad Controls {0 | 1} primary_input_pin… Description Adds an off-state value to specified RAM read control lines. The off-state value of the pins that you specify must be sufficient to keep the RAM outputs stable. Arguments • • • 0 A literal that specifies 0 as the off-state value for the RAM read control lines. The Add Read Controls command defines the circuit read control lines and assigns their offstate values.0 June 2010 . or equivalent pins as read control lines. Examples The following example assigns an off-state value of 0 to two read control lines. r1 and r2: add clocks 0 clk add read controls 0 r1 r2 set system mode dft run Related Commands Analyze Control Signals Delete Read Controls Report Read Controls 60 Tessent DFTAdvisor Reference Manual.

V9. which you must define prior to issuing this command. If multiple scan chains are in the same scan group. Usage ADD SCan Chains chain_name group_name primary_input_pin primary_output_pin Description Specifies a name for a pre-existing scan chain within the design. the rules checker does perform additional rules checking based on the declaration of pre-existing scan elements that pertain to the checking of the validity and the operation of that scan chain. Because the tool removes the scan cells in the scan chain from the scan candidate list. you need to notify DFTAdvisor of this circuitry. Arguments • chain_name A required string that specifies the name of the pre-existing scan chain you want added to the scan group. primary_output_pin A required string that specifies the primary output pin of the scan chain. • • primary_input_pin A required string that specifies the primary input pin of the scan chain.Command Dictionary Add Scan Chains Add Scan Chains Scope: Setup mode Prerequisites: Prior to using this command. the rules checker does not perform the usual scannability checks on those scan cells. you must load the chains in parallel. If the design does have a pre-existing scan chain that you declare with the Add Scan Chains command. you need to provide information on the operation of that scan chain in a test procedure file. The Add Scan Chains command defines a scan chain that exists in the design. or that you created manually. Tessent DFTAdvisor Reference Manual. • group_name A required string that specifies the name of the scan chain group to which you are adding the scan chain.0 June 2010 61 . When you use this command to notify DFTAdvisor of a pre-existing scan chain. In order for DFTAdvisor to be able to correctly insert scan elements in the remainder of the design or to run rules checking on existing scan circuitry. However. DFTAdvisor removes the scan cells in the scan chain from the eligible scan elements list. you must define the scan chain group with the Add Scan Groups command. so it can treat those elements in the chain differently than the elements in the rest of the design. A scan chain references the name of a scan chain group. A pre-existing scan chain is a serially connected set of scan cells that has been stitched together in a previous scan insertion operation.

Command Dictionary Add Scan Chains Examples The following example defines two scan chains (chain1 and chain2) that belong to the same scan group (group1): add scan groups group1 scanfile add scan chains chain1 group1 indata2 testout2 add scan chains chain2 group1 indata4 testout4 Related Commands Add Scan Groups Delete Scan Chains Report Scan Chains Ripup Scan Chains 62 Tessent DFTAdvisor Reference Manual. V9.0 June 2010 .

Only one group name can be specified per DFTAdvisor session. by using the procedures in the file. Arguments • • group_name A required string that specifies the name for the scan chain group. Note You must also define these same elements as non-scan using the Add Nonscan Instances command. those scan chains must belong to a scan group. you can also use the Add Scan Groups command to provide initialization values for non-scan memory elements. If the design has pre-existing scan chains. which loads and unloads a set of scan chains. within the test procedure file. DFTAdvisor models the non-scan memory elements as a TIE1 or TIE0. The scan group must have a corresponding test procedure file. A sequence of procedures in the test procedure file defines the operation of the scan chains within a scan group. The Add Scan Groups command also specifies the corresponding test procedure file for that scan group. you can use the optional test_setup procedure to initialize the non-scan memory elements. As a result. test_procedure_filename A required string that specifies the name of the test procedure file that contains the information for controlling the scan chains in the specified scan chain group. When needed. Then. V9. group1. you can specify “dummy” as the group_name along with a test_procedure_filename. scanfile: add scan groups group1 scanfile add scan chains chain1 group1 indata2 testout2 add scan chains chain2 group1 indata4 testout4 Related Commands Add Scan Chains Delete Scan Groups Report Scan Groups Tessent DFTAdvisor Reference Manual. If the design does not have pre-existing scan chains and you need to initialize some non-scan memory elements for scannability checking. Examples The following example defines a scan chain group. chain1 and chain2.Command Dictionary Add Scan Groups Add Scan Groups Scope: Setup mode Usage ADD SCan Groups group_name test_procedure_filename Description The Add Scan Groups command specifies a group name for a set of pre-existing scan chains in a design.0 June 2010 Read Procfile Write Procfile 63 .

Control pins can be any clock. If in Dft mode. those S1 violations are reported during the DRC check when you enter Dft mode.Command Dictionary Add Scan Instances Add Scan Instances Scope: All modes Usage ADD SCan Instances pathname… | instance_expression [-INStance | -Control_signal | -Module] [-INPut | -Output | {-Hold {0 | 1}}] Description Adds specified instances to the scannable instance list. or reset signal (primary input or output) that controls the contents of sequential instances. V9. In this case. the Add Scan Instances command can accept scannable instance pathnames. When inserting partial scan. control signal pins. If you force the conversion of an instance while in Setup mode. When you force the conversion. the Add Scan Instances command ensures that DFTAdvisor includes specific sequential instances in the scan list. Scannable instances are sequential instances that pass all the scannability checks run by the Design Rule Checker when entering Dft mode. You can use this command in either Setup or Dft mode to override the default behaviorand mark this cell as a potentially scannable instance. If the specified instance does not pass the rules checking process. set. it is not included in the identified scan list. although the instance is converted back into a non-scan instance. DFTAdvisor chooses sequential instances included in the identified scan list based on the settings specified with the Setup Scan Identification command. If you do not issue the Add Scan Instances command when inserting partial scan. If the specified 64 Tessent DFTAdvisor Reference Manual. The Report Control Signals command displays the control pins for the sequential instances in the design. Arguments • pathname A required repeatable string that specifies the pathnames of the sequential instances or control signals (that control instances) to add to the scan instance list. the effects of its previous unknown state on downstream instances is not reset. You can use the Delete Scan Instances command to remove the exception status that you have attached to an instance with the Add Scan Instances command. Sequential cells that have an S4 violation are not targeted for scan cell conversion. DFTAdvisor generates the scan list during the scan identification process (executed with the Run command in the Dft mode). When adding scan instances with control signals. the instance becomes an unknown value and DFTAdvisor propogates the effects of that change through the circuit looking for additional S1 rule violations. DFTAdvisor adds all scannable instances controlled by the control signals to the identified scannable instance list. or module names as arguments.0 June 2010 .

and then runs the scan identification process. the added scan instances are considered regular scan cells. sets the identification process to use the 50 percent of the eligible scan elements that maximize the fault coverage. You can only use the -Control_signal option in Dft mode. Any expression that does not contain an asterisk (*) will match exactly zero or one instance. then you must also supply a high (1) or low (0) literal to define hold 0 or hold 1 output wrapper cells..0 June 2010 65 . then all sequential instances beneath it are also added to the scan list. or modules. control signal pins. If none of these options are specified.. V9. but if the expression specifies a location below the instance level of an ATPG library model. • -INPut | -Output | {-Hold {0 | 1}} An optional switch that adds scan instances as input or output wrapper cells. The default is -INStance. • -INStance | -Control_signal | -Module An optional switch that specifies whether the specified pathnames are instances. If you specify the -Hold option. The asterisk (*) can be used as a wildcard character. Examples The following example adds two sequential instances to the identified scan list (assuming they pass rules checking). The string instance_expression is defined as: { string | string * } . This argument does not support pathnames to objects below the instance level of an ATPG library model.Command Dictionary Add Scan Instances instance is hierarchical. If you use a pathname expression to select several instances. an error message displays. add scan instances i_1006 i_1007 set system mode dft setup scan identification sequential atpg -percent 50 run The scan identification process chooses the optimal 50 percent of eligible scan instances but always includes i_1006 and i_1007 within that 50 percent. Related Commands Delete Scan Instances Report Sequential Instances Setup Scan Identification Tessent DFTAdvisor Reference Manual. the tool will add scan instances for all the pins on those instances. • instance_expression A required string representing a list of instances within the design.

add scan models dff1a set system mode dft setup scan identification sequential atpg -percent 50 run Because of the previous setup in this example. Scannable instances are those sequential instances previously passing all the scannability checks run by the Design Rule Checker when you placed DFTAdvisor into the Dft mode. then the Add Scan Models command ensures DFTAdvisor includes all instances of a specific sequential DFT library model in the scan list. DFTAdvisor generates the scan list during the scan identification process. If DFTAdvisor is inserting partial scan. it chooses the optimal 50 percent of eligible scan instances. where the Add Scan Instances command only individually flags sequential design instance(s). repeatable string specifying the model names that you want to add to the scan model list. DFTAdvisor chooses the sequential instances it includes in the scan list using the settings you specified with the Setup Scan Identification command. If DFTAdvisor is in the Dft mode. which you initiate with the Run command in the Dft mode. V9.0 June 2010 . Arguments • model_name A required. the default argument values for the command. when DFTAdvisor runs the scan identification process. The Add Scan Models command flags all instances of the specified sequential DFT library model. Enter the model names as they appear in the DFT library. then the Add Scan Models command only flags the scannable instances of the specified library model for inclusion into the scan list. which you initiate with the Insert Test Logic command while you are in Dft mode (Set System Mode). DFTAdvisor omits library model instances from the scan list if the instance fails the design rule checks. ensuring that it includes all eligible instances of the dff1a model in that 50 percent of identified scan instances. 66 Tessent DFTAdvisor Reference Manual. DFTAdvisor subsequently replaces all instances in the scan list with the equivalent DFT library scan model during scan synthesis. If you do not issue the Add Scan Models command with partial scan.Command Dictionary Add Scan Models Add Scan Models Scope: All modes Usage ADD SCan Models model_name… Description Specifies that DFTAdvisor is to flag every instance of the named DFT library model for inclusion into the identified scan list. Examples The following example flags all instances of the specified DFT library model for inclusion into the scan list. alternatively. or.

0 June 2010 67 .Command Dictionary Add Scan Models Related Commands Delete Scan Models Report Scan Models Tessent DFTAdvisor Reference Manual. V9.

If the -Edt switch is used. “Add Edt Block name”. not to the user specified scan partitions. The tool generates a single dofile and testprocedure file even if there are multiple scan partitions defined. V9. and -LIbrary_model switches should be supplied. in the dofile. DFTAdvisor writes out the Tessent TestKompress command. Default scan pin naming for each partition cannot be specified by means of the Setup Scan Pins command..0 June 2010 . by default. The specified group of cells are placed in scan chains based on the number of chains or the maximum chain length option specified with this command. If the number of chains or the maximum chain length is not specified.. all instances of that module and the sequential instances hierarchically under these instances are added to the scan partition. They can also be supplied together in the same command line.. along with the -clock/-edge merge options with the Insert Test Logic command.. If a module name is supplied. The remaining cells are placed into a default scan partition called default_scan_partition. individual scan pin naming per chain can be specified by means of the Add Scan Pins command. [-NUmber integer | -MAx_length integer] [-EDT] [-VErbose] Description Specifies a grouping of scan cells (a partition) in which scan chains are inserted separately from the remaining scan cells in the design.. This gives the control over scan pin naming for each scan partition since scan chains are created in the order the scan partitions are defined and the number of scan chains for each scan partition is known. all instances of this library model are added to the scan partition if this library model is defined for a sequential instance. However. | instance_expression. If a module instance name is supplied in the list of instances..Command Dictionary Add Scan Partition Add Scan Partition Scope: DFT mode Usage ADD SCan PArtition object_name -INstance {pathname. the groups of scan chain declarations are in the same order as the defined scan partitions. The -number and -max_length options of the Insert Test Logic command apply only to the default scan partition. the scan chain declarations of the same scan partition are separated from the other groups of scan chain declarations by a comment line which indicates the scan partition name. where name is the name of the scan partition specified by object_name. At least one of the -INstance. -LIbrary_model library_model_name. 68 Tessent DFTAdvisor Reference Manual.} -MOdule module_name.. all sequential instances hierarchically under this given module instance are added to the scan partition. However. before every group of scan chain declarations. and the clock groups with the Add Clock Groups command. -MOdule.. Also. If a library model name is supplied. a single chain is inserted for the partition.

However. V9. This switch can be used along with the -Instance and -Module switches (and their arguments) in the same command line. all sequential instances hierarchically under that instance are added to the partition.. Final results depend upon the number of scan candidates. If the instance pathname/expression cannot be mapped to any sequential element in the design. The asterisk (*) is a wildcard that allows you to match many instances in a design..} A required switch and a repeatable string that specify the pathname(s) of the sequential instances that you want to place into the scan partition.0 June 2010 69 . Any expression that does not contain an asterisk (*) will match exactly zero or one instance. This is because a subchain container can be a blackbox instance.. If a module instance pathname is specified. subchains can be included in scan partitions by specifying the pathname of their container module instances. all three cannot be omitted. This argument does not support pathnames to objects below the instance level of an ATPG library model. This switch can be used along with the -Module and -Library_model switches (and their arguments) in the same command line. All sequential instances hierarchically under these container instances are added to the partition. The default number of chains is 1.. A required switch and a repeatable string that specify the module name(s) of the instances that are the containers of the sequential instances that you want to place into the scan partition. However.Command Dictionary Add Scan Partition Note The scan cells of subchains cannot be included in scan partitions.. | instance_expression. the tool generates an error message. However. The string instance_expression is defined as: {string | string *} . Arguments • • object_name A required string that specifies a name for the scan partition.. all three cannot be omitted. A required switch and a repeatable string that specify the library model name(s) of the sequential instances that you want to place into the scan partition. -INstance {pathname. The repeatable string can be in the form of an absolute instance pathname or a pathname in regular expression form... or the module name of the container modules. • -MOdule module_name. • -NUmber integer An optional switch and integer pair that specify the exact number of scan chains that you want DFTAdvisor to insert for the scan partition specified... The -number and Tessent DFTAdvisor Reference Manual. the sequential cells of which do not exist in the netlist. Therefore. • -LIbrary_model library_model_name. This switch can be used along with the -Instance and -Library_model switches (and their arguments) in the same command line. all three cannot be omitted.

is defined using exact pathnames of the sequential instances. The -number and -max_length options of the Insert Test Logic command are ignored for the user added scan partitions. as specified by the -number argument of the Insert Test Logic command. and the second partition. Add Edt Block. the pathnames of the sequential cells included in the scan partition are printed in the session transcript. • -MAx_length integer An optional switch and integer pair that specify the maximum number of scan cells that DFTAdvisor can stitch into a scan chain of the scan partition specified.0 June 2010 . is defined by the container module instance of the sequential instances. The -Edt switch is used for partA. in addition to the scan chain declarations. respectively. add clocks 0 clk1 set system mode dft add scan partition partA -instance udff1 umodA/udff32 umodB/udff5 -edt // 1 chain add scan partition partB -instance umodC -number 2 -edt // 2 chains run add scan pins chain1 partA_chain1_si partA_chain1_so add scan pins chain1 partB_chain1_si partB_chain1_so setup scan pins input -indexed -prefix mysi -initial 1 setup scan pins output -indexed -prefix myso -initial 1 insert test logic -number 2 // 2 chains inserted for the default scan partition write atpg setup fscan So. DFTAdvisor evenly divides the scan cells into scan chains that are smaller than the max_length integer. Also. new scan I/O pin names are generated for the remaining chains based on the specified default pin naming. Individual scan I/O pins per chain and default scan I/O pin naming are specified by means of the Add Scan Pins and Setup Scan Pins commands. • -VErbose An optional switch that turns on verbose transcript printing. The order of the groups 70 Tessent DFTAdvisor Reference Manual. A single scan chain is inserted by default for partA. in the dofile. Examples In the following example. After mapping the individual scan I/O pins per chain. allowing the tool to write out the Tessent TestKompress command. • -EDT An optional switch that specifies DFTAdvisor to write out the Tessent TestKompress command “Add Edt Block name” before each group of scan chain declarations in the dofile written out by the tool. a total of five scan chains are inserted. V9. Two scan chains are inserted for the remaining cells in the default scan partition. partB. Final results depend upon the number of scan candidates. the scan chain declarations of the same scan partition are grouped together and separated from the other groups of scan chain declarations by a comment line. Note that the scan chain declarations of each scan partition are denoted by a comment line. In the dofile.Command Dictionary Add Scan Partition -max_length options of the Insert Test Logic command are ignored for the user added scan partitions. The first partition. When specified. The name string in the Tessent TestKompress command is the same as the scan partition name specified by object_name. partA. The dofile generated by the tool looks similar to the one below. two scan partitions are defined. whereas two scan chains are inserted for partB.

testproc // The scan chains of scan partition “partA” add edt block partA add scan chains chain1 grp1 partA_chain1_si partA_chain1_so // The scan chains of scan partition “partB” add edt block partB add scan chains chain2 grp1 partB_chain1_si partB_chain1_so add scan chains chain3 grp1 mysi1 myso1 // The scan chains of scan partition “default_scan_partition” add edt block edt_top_block add scan chains chain4 grp1 mysi2 myso2 add scan chains chain5 grp1 mysi3 myso3 add clocks 0 clk1 Related Commands Delete Scan Partitions Insert Test Logic Report Scan Partitions Add Clock Groups Tessent DFTAdvisor Reference Manual. For the default scan partition.Command Dictionary Add Scan Partition of declarations is the same as the order of the scan partition declarations. Also note that the Tessent TestKompress “Add Edt Block” commands are written out since the -Edt switch is used. the tool generates the name “edt_top_block” to use it as the edt block identifier string in the Add Edt Block command. V9. The default scan partition chains are printed as the last group.0 June 2010 71 . // // Generated by DFTAdvisor at Wed Jul 12 14:09:58 2006 // add scan groups grp1 fscan.

you could use an internal instance pin pathname “/I116/d”. If you do not issue this command. If you specify nonexistent signal names for the scan input or scan output pins. For explicitly defining the primary scan input and scan output pins at the top-level of the design and specifing internal pin pathnames for the scan_input_pin and scan_output_pin arguments. top-level bidirectional pin. Each use of the Add Scan Pins command specifies the naming for a single scan chain. you can also specify an internal instance pin pathname as the scan_input_pin value. scan_in). with the corresponding scan input pin named scan_in1 and the corresponding scan output pin named scan_out1. V9. scan_in2. or an internal signal. • scan_input_pin A required string that specifies the scan input pin name of the scan chain. In addition to a primary input pin name (for example. refer to “Naming Scan Input and Output Ports” in the Scan and ATPG Process Guide. If the specified internal instance pin cannot be traced back to a primary input pin 72 Tessent DFTAdvisor Reference Manual. If DFTAdvisor inserts multiple scan chains. You can optionally use the Setup Scan Pins command to globally set the default naming conventions for scan chains that do not use existing design pins. For example. the default naming increments the numerical suffix of each argument by one for each chain. that pin pathname must be an output pin of an instance.0 June 2010 . If you do so. where “I116” is the instance name of the I/O cell and “d” is the pin name. and optionally. Tip: For information on assigning scan pins to scan chains and the fixed-order file. you must use the -Top switch when you execute the Write Atpg Setup command. The default name of the scan chain is chain1. and scan_out2. DFTAdvisor uses the default names when generating the scan chain. scan clock pin you associate with the chain. This pin can be a top-level input pin.Command Dictionary Add Scan Pins Add Scan Pins Scope: All modes Usage ADD SCan PIns chain_name scan_input_pin scan_output_pin [-CLock pin_name] [-CUt] [-Registered] [-Top primary_input_pin primary_out_pin] Description Declares the name of a scan chain at the top-level module and assigns the corresponding scan input pin. scan output pin. such as chain2. Arguments • chain_name A required string that specifies the name of the scan chain with which you want DFTAdvisor to associate the scan_input_pin and scan_output_pin names. DFTAdvisor generates a warning and adds the appropriate pins when you perform scan synthesis with the Insert Test Logic command.

If -Registered is specified. DFTAdvisor assumes that you configured the pin to operate as an input during the scan test and does not check for correct configuration. the scan_output_pin is the input of the DFF tail register. a warning message is written to the top of the ATPG dofile and the following command is added prior to the Add Scan Chains command referencing the internal scan_input_pin argument: add primary input -cut scan_input_pin Example 1 shows the content written to the ATPG dofile in this case. V9.0 June 2010 73 . If the pin is a top-level bidirectional pin. DFTAdvisor multiplexes this connection with the connection line from the last scan cell of the scan chain. • scan_output_pin A required string that specifies the scan output pin name of the scan chain. You must have predefined this pin as a scan clock using the Add Clocks command. you can also specify an internal instance pin pathname (for example. DFTAdvisor assumes that you configured the pin to operate as an output during the scan test and does not check for correct configuration. • -CLock pin_name An optional switch and string pair that specifies the pin name of the clock that you want DFTAdvisor to assign to the scan chain. In addition to a primary output pin name (for example.Command Dictionary Add Scan Pins through a simple path (only inverters or/and buffers). This pin can be any of the following: o o o a top-level output pin a top-level bidirectional pin (single driver) an internal signal Note If the scan output pin you specify has a functional connection. a warning message is written to the top of the ATPG dofile and the following command is added prior to the Add Scan Chains command referencing the internal scan_output_pin argument: add primary output scan_output_pin Example 2 shows the content written to the ATPG dofile in this case. “/I116/q”) for the scan_output_pin value. when the Write Atpg Setup command is issued. If the specified internal instance pin cannot be traced forward to a primary output pin through a simple path (only inverters or/and buffers). the scan_input_pin is the output of the DFF head register. Tessent DFTAdvisor Reference Manual. If -Registered is specified. providing this pin pathname is an input pin of an instance. when the Write Atpg Setup command is issued. scan_out). If the pin is a top-level bidirectional pin.

Example 1 The following example specifies an internal pin pathname that DFTAdvisor cannot trace back to the primary input. See the resulting dofile contents in Example 2-2 on page 75.v -verilog -r 74 Tessent DFTAdvisor Reference Manual. • -Registered An optional switch that identifies head and tail DFF registers for the scan chain. This option does not add pins to the top-level of the design. • -Top primary_input_pin primary_out_pin An optional switch and two strings that defines the corresponding top-level primary input/output pins for the scan in and scan out ports. V9. refer to “Attaching Head and Tail Registers to the Scan Chain” in the Scan and ATPG Process Guide. Both pin names must be supplied. Refer to the second example for clarification of how the contents of the ATPG dofile are created.Command Dictionary Add Scan Pins • -CUt An optional switch that specifies to remove an existing functional connection.0 June 2010 . if there is one. For additional information. DFTAdvisor uses these names when generating the ATPG dofile. to the specified scan output pin and to connect the last scan cell of the specified scan chain to this scan output pin. add clocks 0 clk setup scan identification full_scan set tri gating bus -control ten set tri gating out1 out4 -control ten set tri gating out3 out2 set bidi gating on add scan pins c1 udff1/Q tbus2_drv1/A add scan pins c2 bidi_1/X tbus1_drv2/A -top io2 out2 set system mode dft report dft check -tri run insert test logic -number 2 report scan chains write atpg setup results/tri_on_ten -r write netlist results/tri_on_ten. DFTAdvisor does not insert new scan cells as head and tail registers if it cannot find them in the circuit.

Command Dictionary Add Scan Pins Example 2-2.v -verilog -r Tessent DFTAdvisor Reference Manual.0 June 2010 75 . V9. Generated dofile Tracing Back to Primary Input // // Generated by DFTAdvisor at Fri Aug 29 18:45:24 2008 // // The generated dofile contains references to internal pins // The file may require editing to make it function properly. add clocks 0 clk setup scan identification full_scan set tri gating bus -control ten set tri gating out1 out4 -control ten set tri gating out3 out2 set bidi gating on add scan pins c1 bidi_2/X tbus2_drv1/A -top io3 out3 add scan pins c2 bidi_1/X udff1/D set system mode dft report dft check -tri run insert test logic -number 2 report scan chains write atpg setup results/tri_on_ten -r write netlist results/tri_on_ten.testproc add primary input -cut udff1/Q // internal input pin add scan chains c1 grp1 udff1/Q out3 add scan chains c2 grp1 io2 out2 add clocks 0 clk add pin constraints test_en C1 Example 2 The following example specifies an internal pin pathname that DFTAdvisor cannot trace forward to the primary output. add scan groups grp1 results/tri_on_ten. See the resulting dofile contents in Example 2-3 on page 76.

0 June 2010 . add scan groups grp1 results/tri_on_ten.testproc add scan chains c1 grp1 io3 out3 add primary output udff1/D // internal output pin add scan chains c2 grp1 io2 udff1/D add clocks 0 clk add pin constraints test_en C1 Related Commands Delete Scan Pins Report Scan Pins Setup Scan Pins Write Atpg Setup 76 Tessent DFTAdvisor Reference Manual. V9. Generated dofile Tracing Forward to Primary Input // // Generated by DFTAdvisor at Fri Aug 29 18:57:57 2008 // // The generated dofile contains references to internal pins // The file may require editing to make it function properly.Command Dictionary Add Scan Pins Example 2-3.

model_name A required string that specifies the DFT library model to whose pin_name you want to apply the specified C0 or C1 constant.Command Dictionary Add Seq_transparent Constraints Add Seq_transparent Constraints Scope: Setup mode Usage ADD SEq_transparent Constraints {C0 | C1} model_name pin_name… Description Specifies the enable value of a clock enable that internally gates the clock input of a non-scan cell for sequential transparent scan identification.0 June 2010 77 . the clock enable must hold at a certain value in order for the cells to behave as sequentially transparent. DFTAdvisor identifies those memory elements for scan during the scan_sequential identification run. In these cases. V9. Designs sometimes contain circuitry where the clock enable signal internally gates the clock input of a non-scan cell. • pin_name A required. The clock enable input of a cell may come from primary inputs or other memory elements. Example Example 2-4 shows an example usage of this command. repeatable string that specifies the clock enable pin name for the model_name specified and that to which DFTAdvisor will apply the specified constant. If the sources of a clock enable input come from the output of other memory elements. Tessent DFTAdvisor Reference Manual. Arguments • • C0 | C1 A required literal that specifies the application of the constant 0 or 1 to the pin_name.

Command Dictionary Add Seq_transparent Constraints Example 2-4. V9. Add Seq_transparent Constraints Related Commands Add Pin Constraints Delete Seq_transparent Constraints Report Pin Constraints 78 Tessent DFTAdvisor Reference Manual.0 June 2010 .

Scannability analysis DRCs: S1. that is. An empty module is a module defined in the netlist without any content. The object_name is the container where the subchain resides. • scan_input_pin A required string that specifies the scan input pin of the scan subchain. S2.Command Dictionary Add Sub Chains Add Sub Chains Scope: Setup mode Usage ADD SUb Chains object_name subchain_name scan_input_pin scan_output_pin length scan_type [-Module | -Library_model | -Instance] [-TEN test_enable_pin {0 | 1}] [-TCLK test_clock_pin {0 | 1}] [-NO_Reordering] Description Specifies a pre-existing scan chain within a module. You can use the Add Sub Chains command to incorporate those scan subchains into the top-level scan chain(s) during the stitching process. You can define subchains with their inputs (scan input and scan enable pins on their subchain container) tied to 0 or 1. Any scan cell that is floating in the subchain block and not part of the subchain is not considered for the top-level scan chain stitching. DFTAdvisor assumes that all scan cells within the subchain blocks are part of the specified subchains. DFTAdvisor removes such connections from the scan input pin and reuses the connection wire to connect the scan output port to the next scan cell. V9.0 June 2010 79 . or empty module in a hierarchical design (subchain). blackbox. instance. and S3 validate the defined subchains when you exit Setup mode. DFTAdvisor can write subchain setup information to a file with the Write Subchain Setup command. Arguments • object_name A required string that specifies either the pathname of an instance. Any buffers lying along such feedback are then retained in scan output connection. the name of a module. • subchain_name A required string that specifies a name for the scan subchain. or the name of a library model. To define clock information for subchains. You can then read in this setup file that contains the Add Sub Chains command as part of the setup and avoid having to manually define the pre-existing scan subchains at the higher design level. You can also define subchains with their scan inputs connected to their scan output either directly or via buffers. it consists of only an input and output port definition. Tessent DFTAdvisor Reference Manual. library model. A unique subchain name should be used for each Add Sub Chains command. see Add Subchain Clocks.

During wrapper chain creation. DFTAdvisor can also insert two more types of scan enable signals if I/O wrapper chains are specified. The scan enable signals inserted for separate input and output wrapper cells are referred to as Sen_in and Sen_out. o Clocked_scan scan_clock — A required literal and string pair that specifies the clocked-scan style of scan cells and the name of the scan clock for the scan subchain. DFTAdvisor inserts one type of scan enable signal. name. length A required integer that specifies the number of scan cells in the scan subchain.0 June 2010 . If this switch is not specified. as described below. A subchain may contain all three types of scan enables. if this literal is not specified in the subchain declaration. Options include: o Mux_scan {-SEN_Core | -SEN_In | -SEN_Out} scan_enable [INVerted] Required switch. If DFTAdvisor cannot determine the top module clock pins. only the first cell clock pin information is used to determine which top-level scan chain the subchain cell is placed in. -Clock pin_name1 pin_name2 — Required switch and string pair that specifies the names of the clock pins on the top module that control the defined subchain. 80 Tessent DFTAdvisor Reference Manual. DFTAdvisor tries to find the top-level clock pins using the sub-clock pins via structural tracing. In a wrapper chain insertion flow.Command Dictionary Add Sub Chains • • • scan_output_pin A required string that specifies the scan output pin of the scan subchain. referred to as Sen_core. and literal that specifies the type. along with other subchains with undetermined top module clock pins. string. Normally. pin_nam2 specifies the name of the clock pin for the last cell (closer to the scan output). in which case you should repeat the triplet for each type of scan enable. The first and the last cell clock pins determine the transition of clock domains when the subchain is placed in a top-level scan chain. scan_type Scan type usage: {Mux_scan{scan_enable [INVerted]} [-CLock pin_name1 pin_name2] }| Clocked_scan scan_clock | Lssd master_clock slave_clock A required literal and multiple argument option that specifies the scan type and control of the scan subchain. so lockup cells are inserted correctly at these transitions. pin_name1 specifies the clocks for the first cell (closer to the scan input). it places the defined subchain in separate scan chains in the top module. The default type of scan enable is -SEN_Core. see the Setup Wrapper Chains command. V9. and internal inversion of the scan enable pin on the subchain container (module or library_model). For more information on I/O wrapper chains.

The default type is -Module. • -Module | -Library_model | -Instance An optional switch that specifies the type of the subchain container specified by the object_name argument.0 June 2010 81 . string. The active value can be 0 or 1. The container can then be a module (-Module). or an instance of a module/model (-Instance). Example 1 The following example defines a subchain on a sub-module: add sub chains addr subc1 /scan_in1 /scan_out1 8 mux_scan -sen_core /scan_en inverted \ -clock /topclk1 /topclk2 report sub chains mux_scan: addr subc1 8 scan_in1 scan_out1 scan_en (inverted) Example 2 The following example defines three subchains on an instance. the subchain's sequential cells are written into a FLOATING section of the corresponding scan chain which allows them to be reordered. for the scan subchain. When this switch is not specified. The off-state value can be 0 or 1.Command Dictionary Add Sub Chains o Lssd master_clock slave_clock — A required literal and two-string triplet that specifies Level-Sensitive Scan Design and the names of the master and slave clocks. • -TEN test_enable_pin {0 | 1} An optional switch. and literal pair that specifies the test clock pin added in the submodule that you want connected to the corresponding pin in the top module. a library model (-Library_model). Note that each subchain has a designated scan enable pin: add sub chains /mytop/u1 subc1 si1 so1 150 mux_scan -sen_in senin add sub chains /mytop/u1 subc2 si2 so2 138 mux_scan -sen_out senout add sub chains /mytop/u1 subc3 si3 so3 1600 mux_scan -sen_core sen report sub chains mux_scan: /mytop subc1 150 si1 so1 senin mux_scan: /mytop subc2 138 si2 so2 senout mux_scan: /mytop subc3 1600 si3 so3 sen Tessent DFTAdvisor Reference Manual. respectively. V9. and literal pair that specifies the test enable pin added in the submodule that you want connected to the corresponding pin in the top module. • -TCLK test_clock_pin {0 | 1} An optional switch. string. • [-NO_Reordering] An optional switch that specifies to keep the order of cells on the specified subchain's scan path intact when writing out the scanDEF file by placing them into an ORDERED section of the corresponding scan chain.

0 June 2010 . 82 Tessent DFTAdvisor Reference Manual.Command Dictionary Add Sub Chains Example 2 The following example shows information written out by the Report Scan Cells command following by the same information as it appears when it is written to the scan DEF file. V9. report scan cells --------------------------------------------------------------------------------Chain Group Clock CellNo Name Name Pathname CellName ScanOut Clock Polarity --------------------------------------------------------------------------------chain1 dummy /lckup1 latch Q clk2 (-) 0 chain1 (schi2) dummy /uB/f3 sff Q clk2 (+) 1 chain1 (schi2) dummy /uB/f2 sff Q clk2 (+) 2 chain1 (schi2 dummy /uB/f1 sff Q clk2 (+) chain1 dummy /lckup2 latch Q clk2 (+) 0 chain2 (schc1) dummy /uWA/uA/f21 sff Q clk (+) 1 chain2 dummy /ud sff Q clk (+) 2 chain2 dummy /us sff Q clk (+) 0 chain3 (scho1) dummy /uWA/uA/f31 sff Q clk (+) chain4 dummy /lckup3 latch Q clk (-) 0 chain4 (schi1) dummy /uWA/uA/f3 sff Q clk (+) 1 chain4 (schi1) dummy /uWA/uA/bb/f2 sff Q clk (+) 2 chain4 (schi1) dummy /uWA/uA/f1 sff Q clk (+) chain4 dummy /lckup4 latch Q clk (+) --------------------------------------------------------------------------------- Contents of the scan DEF file: # # # DESC: Generated by DFTAdvisor at Wed Mar 17 10:50:58 2010 VERSION 5. . SCANCHAINS 1 . UNITS DISTANCE MICRONS 1000 . BUSBITCHARS "[]" .7 . DESIGN top .chain1_sub0 + START lckup2 Q + FLOATING uB/f1 ( IN SI ) ( OUT Q ) uB/f2 ( IN SI ) ( OUT Q ) uB/f3 ( IN SI ) ( OUT Q ) + STOP lckup1 D # Partition for core chain in clock clk2 (pos-edge) domain + PARTITION partition_1 MAXBITS 3 . DIVIDERCHAR "/" .chain2_sub0 + START us Q + FLOATING ud ( IN SI ) ( OUT Q ) + STOP uWA/uA/f21 SI # Partition for core chain in clock clk (pos-edge) domain + PARTITION partition_2 MAXBITS 1 . .

V9. END SCANCHAINS END DESIGN Related Commands Add Clocks Add Subchain Clocks Delete Sub Chains Report Scan Cells Report Sub Chains Setup Wrapper Chains Write Scan Order Write Subchain Setup Tessent DFTAdvisor Reference Manual. #.Command Dictionary Add Sub Chains # The following chain segment with only 1 or 2 scan cells has been commented out for # compatibility with the layout tools. .0 June 2010 83 .chain3_sub0 # + START uWA/uA/f31 SI # + STOP uWA/uA/f31 Q .chain4_sub0 + START lckup4 Q + FLOATING uWA/mux ( IN A1 ) ( OUT Y ) ( BITS 0 ) uWA/uA/f1 ( IN SI ) ( OUT Q ) uWA/uA/bb/f2 ( IN SI ) ( OUT Q ) uWA/uA/f3 ( IN SI ) ( OUT Q ) + STOP lckup3 D # Partition for core chain in clock clk (pos-edge) domain + PARTITION partition_2 MAXBITS 3 .

. When you use the Add Subchain Clocks command to specify subchain clock pins for multiple instantiations of a module. Arguments • subchain_name A required string that specifies the name of a subchain previously defined with the Add Sub Chains command. the clock path must be traceable from the module to the top-level. Sequential instances maintain their state when the clock is at the specified value.} {-Set | -Reset | -First_cell_clock [-LEading_edge | -Trailing_edge] | -LAst_cell_clock [-LEading_edge | -Trailing_edge]} Description Specifies the clock pins for scan chains within modules. instances..Command Dictionary Add Subchain Clocks Add Subchain Clocks Scope: Setup mode Prerequisites: Subchains must be added with the Add Sub Chains command. The Add Sub Chains command adds subchains to a specific instance or all instantiations of a specific module. library models. the timing information is automatically adjusted for each instance based on the: • • • • Off state of the top-level clock Inversions in the clock path to the instance Off state at the edge of the module Timing (rising/falling) at the edge of the module Note In order to specify clock pins with the Add Subchain Clocks command. and S3 validate the defined subchains when you exit Setup mode. blackboxes. S2. The specified clock pins are added relative to the module edge. not the top-level of the design. Usage ADD SUbchain CLocks subchain_name off_state {clock_port_name. Scannability analysis DRCs: S1. Once you specify the clock pins. either 1 or 0. you must use Set Test Logic to enable the insertion of the test logic. V9.0 June 2010 . or empty modules of a hierarchical design. 84 Tessent DFTAdvisor Reference Manual. • off_state A required string that specifies the off state for sequential instances.

add sub chains MULTIBITSFF3 chain1 SI SO 4 mux_scan S library_model add subchain clocks chain1 0 RESET -reset add subchain clocks chain1 0 SET -set add subchain clocks chain1 0 CK -first_cell_clock -leading_edge add subchain clocks chain1 0 CK -last_cell_clock -leading_edge report subchain clocks chain1 // // // // // // clock name type off_state ---------. • -LAst_cell_clock A required switch that specifies the clock pin listed by the clock_port_name argument drives the last cell in the subchain.-----------RESET reset 0 SET set 0 CK first cell clock 0 CK last cell clock 0 edge ----- leading edge leading edge add subchain clocks chain1 1 SET -set Tessent DFTAdvisor Reference Manual. • -Reset A required switch that specifies the clock pins listed by the clock_port_name argument are reset signals for cells in the subchain and should be held in the off state during scan chain shifting. • -LEading_edge An optional switch that specifies the clock pin listed by the clock_port_name argument updates cells on the leading edge of the off-state to on-state transition. This value is used during scan chain stitching and is only valid for defining the first and/or last cell clocks. • -Trailing_edge An optional switch that specifies the clock pin listed by the clock_port_name argument updates cells on the trailing edge of the off-state to on-state transition.Command Dictionary Add Subchain Clocks • clock_port_name A required. This value is used during scan chain stitching and is only valid for defining the first and/or last cell clocks. V9. repeatable string that specifies the clock pins on the subchain that must be controlled during scan chain shifting.0 June 2010 85 . • -Set A required switch that specifies the clock pins listed by the clock_port_name argument are set signals for cells in the subchain and should be held in the off state during scan chain shifting. Example 1 The following example defines a subchain on a library module. • -First_cell_clock A required switch that specifies the clock pin listed by the clock_port_name argument drives the first cell in the subchain.

--------. Related Commands Add Sub Chains Delete Subchain Clocks Report Dft Check Report Sub Chains Report Subchain Clocks Write Subchain Setup 86 Tessent DFTAdvisor Reference Manual. The Analyze Drc Violation command displays the entire macro (with an X on each clock line that requires test logic) and arbitrarily displays the driving gate for only one of the pins that requires fixing.-----reset 0 set 0 first cell clock 0 trailing edge Example 2 The following example reports subchains defined within a blackbox. V9.0 June 2010 . The subchain is treated as a single sequential instance. DFT> report dft check SCANNABLE SUBCHAIN Testlogic Set: T /macro/SET1 SCANNABLE SUBCHAIN Testlogic Set: T /macro/SET2 SCANNABLE SUBCHAIN Testlogic Set: T /macro/SET3 SCANNABLE SUBCHAIN Testlogic Reset: T /macro/RESET1 /macro MULTIBITSFFX (1) /macro MULTIBITSFFX (1) /macro MULTIBITSFFX (1) /macro MULTIBITSFFX (1) All the test logic issues for a specified subchain instance map to a single DRC rule violation. but it is listed once for each clock line that needs fixing.----.Command Dictionary Add Subchain Clocks // Error: Duplicate clock definition for SET delete subchain clocks chain1 CK report subchain clocks chain1 // // // // clock name type off_state edge ---------.-----RESET reset 0 SET set 0 add subchain clocks chain1 0 CK -first_cell_clock -trailing_edge report subchain clocks chain1 // // // // // clock name ---------RESET SET CK type off_state edge ------------.

along with any clock groups you identified with Add Clock Groups. DFTAdvisor partitions the subchains of flexible subchain groups along with the scannable flip-flops of the design according to your Insert Test Logic command’s Clock/Edge merge and -Number/Max_length options. Table 2-3. When using this option. the -Fixed option disallows either other flip-flops and subchains in the subchain group. Subchain Types Subchain Group No subchain group Multiple Chain Support Yes Stitching Partitioning Can be stitched with: • single cells • subchains that are not assigned to any subchain groups • subchains that are assigned to flexible subchain groups Insert Test Logic Clock/Edge merge Number/Max_length Add Clock Groups Tessent DFTAdvisor Reference Manual. The Add Subchain Group command specifies a group of subchains in a design so that DFTAdvisor can stitch these subchains together. -Fixed Option — In contrast. you choose one option from following: • -Flexible Option (default) — DFTAdvisor permits unassigned single flip-flops and subchains in the scan chain for better balancing of the top-level scan chains. your Insert Test Logic command’s -Clock/Edge merge and -Number/Max_length options have no effect on the subchains of fixed subchain groups. DFTAdvisor adds a new scan chain to the design and includes the subchains of a fixed subchain group. Consequently. When adding the subchain groups. or the breaking up the subchain group. V9.Command Dictionary Add Subchain Group Add Subchain Group Scope: Setup mode Usage ADD Subchain Group object_name subchain_name … [-FLexible | -FIxed] Description Adds one subchain group to the system. the Insert Test Logic command chooses which subchains DFTAdvisor stitches together. • Table 2-3 summarizes the types of subchains that can exist in a design.0 June 2010 87 . If you omit a subchain group. You must have added the subchains (using Add Sub Chains) before you specify them as subchains in the argument list. Using this option also permits breaking up the subchain group into multiple scan chains when necessary.

you must add it with Add Sub Chains.. Subchain Types Subchain Group Flexible Multiple Chain Support Yes Stitching Partitioning Can be stitched with: • single cells • subchains that are not assigned to any subchain groups Can be stitched with: • no other cells or subchains Insert Test Logic Clock/Edge merge Number/Max_length Add Clock Groups Fixed No A new scan chain is added per Add Subchain Group command Arguments • • object_name A required string specifying the subchain group name. these subchains need to be added instance-based instead of module-based in order to be assigned a unique subchain name. subchain_name A required repeatable string identifying the subchain name for inclusion into the subchain group. allows in its chain other flip-flops and subchains that are not a member of a subchain group.Command Dictionary Add Subchain Group Table 2-3. DFTAdvisor includes the subchains on all instances of the module in the subchain group when this subchain is specified in the list of subchains of the Add Subchain Group command. If you added a subchain to a subchain group on a module-based basis. You can also report subchain information using Report Sub Chains. If the subchains on different instances of the module are to be put into different subchain groups. Before identifying the subchain.0 June 2010 . • -FLexible | -Fixed An optional switch that specifies the type of the subchain group. and the module is instantiated multiple times.. Also. The default type. Examples The following example defines a pre-existing scan subchain: add sub chain subblockA subchain1 /scan_in1 /scan_out1 250 \ mux_scan /scan_en -module add sub chain subblockC subchain2 /scan_in1 /scan_out1 120 \ mux_scan /scan_en -instance . The subchains of a fixed type subchain group are placed in a single chain and are not partitioned according to Insert Test Logic command options. -Flexible. the subchains of flexible subchain groups are partitioned along with the other flipflops in the design according to the options specified with the Insert Test Logic command. V9. Also. no other flip-flops or subchains are allowed in the scan chain of this group. report sub chains 88 Tessent DFTAdvisor Reference Manual.

V9.0 June 2010 89 .Command Dictionary Add Subchain Group mux_scan: subblockA subchain1 scan_in1 scan_out1 scan_en mux_scan: subblockC subchain2 scan_in1 scan_out1 scan_en add subchain group subchaingroup1 subchain1 subchain2 -fixed Related Commands Add Clock Groups Add Sub Chains Add Subchain Group Delete Sub Chains Delete Subchain Groups Insert Test Logic Report Subchain Groups Report Sub Chains Tessent DFTAdvisor Reference Manual.

BUF. Using the Add Test Points command. NAND. You can also control timing problems on merged scan chains by manually specify the location of lockup cells. Note The Add Test Points command operates independently of the Set Test Logic command. XOR. Additionally. and MUX. you can specify whether to insert a scan cell for control or observe purposes at the test point location. V9. OR.0 June 2010 . input_pin_pathname — An optional string that specifies the pathname of the pin to which you want to connect the other input of the gate specified by the model_name 90 Tessent DFTAdvisor Reference Manual. Arguments • tp_pin_pathname A required string that specifies the location where you want DFTAdvisor to insert the control or observe test point. Before you can use the Add Test Points command. you can manually specify the location of a test point and whether that point is for control or observation. model_name — A required string specifying the DFT library model you want DFTAdvisor to place an instance of at the location specified by tp_pin_pathname. this is in addition to the control logic. • Control model_name [input_pin_pathname] [mux_sel_input_pin] [-New_scan_cell scancell_model_name] The Control test point argument specifies the test point is for control purposes.Command Dictionary Add Test Points Add Test Points Scope: Setup and DFT mode Prerequisites: You must define the model_name with either the Add Cell Models command or the cell_type attribute within the DFT library. Usage ADD TEst Points tp_pin_pathname {{Control model_name [input_pin_pathname] [mux_sel_input_pin] [-New_scan_cell scancell_model_name]} | {Observe [output_pin_pathname] [-New_scan_cell scancell_model_name2]} | {Lockup lockup_latch_model_name clkpin [-INVert | -NOInvert]}} Description Specifies explicitly where DFTAdvisor places a user-defined test point to improve the design’s testability either through better controllability or observability. The valid cell model types include AND. The Add Test Points command also works independently of the automatically system-defined test points—refer to “Understanding Test Points” in the Scan and ATPG Process Guide. INV. NOR. you must use either the Add Cell Models command or the cell_type DFT library attribute to define the DFT library model that corresponds to the model type you want DFTAdvisor to insert.

and then creates a new primary input pin with the specified name during the insertion of the scan chain(s). -New_scan_cell scancell_model_name — An optional switch and string pair that specifies whether DFTAdvisor places a scan cell at the control test point and the DFT library SCANCELL type model that you want inserted. DFTAdvisor determines which clock to use for the new scan cell automatically. Figure 2-1. DFTAdvisor transcripts a message when you issue this command. an internal driver pin. or a currently nonexistent pin. mux_sel_input_pin — An optional string that is needed only when the model_name argument type is a MUX. Figure 2-1 shows how DFTAdvisor automatically connects the new scan cell to the same clock as the scan cell it feeds in the chain. If -New_scan_cell option is specified and this string is not provided. V9. They are connected into chain(s) during insertion of test logic along with the existing sequential elements in the design. not scan replacements for existing sequential elements. If you use this option. you must first define the scancell_model_name with the Add Cell Models command or the cell_type DFT library attribute. Tessent DFTAdvisor Reference Manual.0 June 2010 91 . This argument specifies where DFTAdvisor is to connect the selector input of the multiplexer.Command Dictionary Add Test Points argument. depending on their clock pins. If -New_scan_cell option is specified. this string is used to specify an existing clock pin to be connected to the clock input of the new control point scan cell. The pathname can be either to an existing primary input pin. the test point scan cells are connected into one or more scan chains. Control Example Note that these are new scan cells. If the pin does not currently exist in the design and -New_scan_cell option is not specified. If the design contains no scan.

If -New_scan_cell option is specified and this string is not provided. If the design contains no scan. not scan replacements for existing sequential elements. DFTAdvisor determines which clock to use for the new scan cell automatically. you must first define the scancell_model_name2 with the Add Cell Models command or the cell_type DFT library attribute. If you use this option. Figure 2-2. depending on their clock pins. If -New_scan_cell option is specified. If the primary output pin does not currently exist in the design and -New_scan_cell option is not specified. output_pin_pathname — An optional string that specifies the pathname of the primary output pin that you want DFTAdvisor to connect to the observe point. the test point scan cells are connected into one or more scan chains.0 June 2010 . They are connected into chain(s) during insertion of test logic along with the existing sequential elements in the design. V9.Command Dictionary Add Test Points • Observe [output_pin_pathname] [-New_scan_cell scancell_model_name2] The Observe test point argument specifies for DFTAdvisor to place an observe point at the location specified by the value of the tp_pin_pathname argument. 92 Tessent DFTAdvisor Reference Manual. -New_scan_cell scancell_model_name2 — An optional switch and string pair that specifies whether DFTAdvisor places a scan cell at the observe test point and the DFT library SCANCELL type model that you want inserted. DFTAdvisor creates a new primary output pin with the specified name during the insertion of the scan chain(s). Observe Example Note that these are new scan cells. Figure 2-2 illustrates how DFTAdvisor automatically connects the new scan cell to the same clock as the scan cell it feeds in the chain. this string is used to specify an existing clock pin to be connected to the clock input of the new observe point scan cell.

lockup_latch_model_name — A string that specifies the library latch model name. If the location is a primary input or an instance output pin. -INVert | -NOInvert — A switch that specifies whether to insert an inverter between the specified clkpin and the clock input to the latch. the latch is inserted after the pin. V9. If you use this option. If the location (tp_pin_pathname) is a primary output or an instance input pin. and will drive all fanouts that were originally driven by the pin. The default is -NOInvert. clkpin — A string that specifies the pathname of the clock pin to which the clock pin of the latch is connected. which DFTAdvisor then generates as part of the Insert Test Logic command: add cell models and2a -type and add test point /I_6_16/cp control and2a control1 set system mode dft run insert test logic Related Commands Add Cell Models Delete Test Points Insert Test Logic Report Test Points Set Lockup Cell Set Test Logic Tessent DFTAdvisor Reference Manual. Examples The following example first defines a DFT library model (and2a) of type AND. you must first define the model with the Add Cell Models command. then DFTAdvisor normally inserts lockup cells where necessary to control timing problems between cells in merged scan chains.Command Dictionary Add Test Points • Lockup lockup_latch_model_name clkpin [-INVert | -NOInvert] If you enable Set Lockup Cell on. This Lockup argument lets you specify for DFTAdvisor to add a lockup cell at any specified location.0 June 2010 93 . the latch is inserted in front of the pin. and then defines a control test point.

When you add tied signals or pins. Note The tool does not tie a signal connected to I/O pins. repeatable string that specifies the floating nets or pins to which you want to assign a specific value. If you do not assign a specific value to a floating object. Arguments • • • • • 0 A literal that specifies to tie the floating nets or pins to logic 0 (low to ground). Tip: Use the Setup Tied Signals command for changing the value of a tied object from the default value of unknown (X). X A literal that specifies to tie the floating nets or pins to unknown. 1 A literal that specifies to tie the floating nets or pins to logic 1 (high to voltage source). When the netlist ties signals or pins to a value. the tool places them into the system class. This causes a problem if you are considering VDD as an I/O pin.Command Dictionary Add Tied Signals Add Tied Signals Scope: Setup mode Usage ADD TIed Signals {0 | 1 | X | Z} floating_object_name… [-Pin] Description Specifies for DFTAdvisor to hold the named floating objects (nets or pins) at the given state value.0 June 2010 . The tool assigns the tied value to all floating nets or pins in all modules that have the specified names. Z A literal that specifies to tie the floating nets or pins to high-impedance floating_object_name A required. the tool places them into the user class. DFTAdvisor ties the object to the default value for all tied objects. This includes instance-based blackbox tied signals. 94 Tessent DFTAdvisor Reference Manual. V9. DFTAdvisor creates a tied simulation gate (depending on the tied value) for each tied signal during the design flattening process.

Examples The following example ties all floating signals in the circuit that have the net names vcc and vdd. V9.0 June 2010 95 . If you do specify the -Pin option. If you specify a net pathname. the tool assumes the name is a pin name. the tool assumes the name is a net name. • -Pin An optional switch specifying that the floating_object_name argument that you provide is a floating pin name. you cannot use the -Pin option. to logic 1 (tied to high): add tied signals 1 vcc vdd Related Commands Add Black Box Delete Tied Signals Report Tied Signals Setup Tied Signals Tessent DFTAdvisor Reference Manual.Command Dictionary Add Tied Signals If you do not specify the -Pin option.

constrained pins. V9. You may not use clocks. or equivalent pins as write control lines.0 June 2010 . 1 A literal specifying 1 is the off-state value for the RAM primary_input_pin. primary_input_pin A required. w1 and w2: add write controls 0 w1 w2 set system mode dft run Related Commands Analyze Control Signals Delete Write Controls Report Write Controls 96 Tessent DFTAdvisor Reference Manual. repeatable string specifying the primary input pins that are write control lines for the RAM and to which you want to assign an off-state value.Command Dictionary Add Write Controls Add Write Controls Scope: Setup mode Usage ADD WRite Controls {0 | 1} primary_input_pin… Description Specifies the off-state value of the write control lines for RAMs. The Add Write Controls command defines the circuit write control lines and assigns their offstate values. Examples The following example assigns an off-state to two write control lines. The off-state value of the pins you specify must be sufficient to keep the RAM contents stable. Arguments • • • 0 A literal specifying 0 is the off-state value for the RAM primary_input_pin.

| alias_synonym. intermixing any number of command types. UNIX command. The primary purpose of this file is to execute Alias commands that tailor the tool’s command language to your needs. | tool_command. .Command Dictionary Alias Alias Scope: All modes Usage ALIas [synonym {!unix_command. Issuing the Alias command with no parameters will list the current aliased commands. Your home directory The first startup file encountered will be the only one executed if you have startup files in both locations. or existing command alias. Using the Alias command with a single argument will. that shorthand name can substitute for the command and any arguments you specify.dftadvisor_startup. Using Tessent DFTAdvisor Reference Manual. that contains commands to be executed prior to any other batch or interactive commands. the command strings can be parameterized by using the formal parameters.0 June 2010 97 . Upon invocation. $1 thorough $9. When you issue the synonym as a command. and separating them with semicolons. using Korn-shell syntax: <alias_cmd>=<alias_definition> Issuing the command “Help <aliased_cmd>” will report the name of the command and the definition which you specified via the Alias command when <aliased_cmd> was created. if the argument is an aliased command name. using the same format that the Korn-shell alias commands use: <alias_cmd1>=<alias_definition1> <alias_cmd2>=<alias_definition2> . the tool searches for the startup file in the following locations and in order of precedence: 1.. <alias_cmdN>=<alias_definitionN> If you specify a shorthand name (synonym) and one of the command types. which are substituted into the command prior to its execution.}…] Description Specifies the shorthand name for a DFTAdvisor command. The local invocation directory 2. You utilize the full power of the Alias command when you take advantage of the repeatable nature of the second string. report the name and definition of that command.. V9. inserted in the command string in any order. or any combination of the three. You can also include an optional file. you must supply the actual arguments. In addition.

tool_command — An optional. You could then use that new command within another Alias command that writes out the current design: alias findit write netlist -verilog temp. or script. findlockup This final example defines two aliased commands. which uses a formal parameter. repeatable string that consists of any synonym previously defined with the Alias command. invokes them. -name \*.Command Dictionary Alias the help command with an aliased command name will generate an Alias report of the following format: // alias: <alias_cmd>=<alias_definition> Arguments • synonym {!unix_command. and requests help on them: alias wibble !echo arg1 arg2 $1 $2 $3 $4 alias wobble report black box -undefined wibble one_1 two_2 three_3 four_4 arg1 arg2 one_1 two_2 three_3 four_4 wobble // Undefined Modules: // foo alias wobble 98 Tessent DFTAdvisor Reference Manual. The next line invokes it and supplies the actual parameter: alias watch !ps -e | egrep $1. !unix_command — An optional. You must separate repeated commands with semicolons.v -replace. repeatable string that consists of any well-formed DFTAdvisor command and its arguments. with its arguments. V9. findlockup. repeatable string that consists of any well-formed UNIX command. watch. | tool_command.0 June 2010 . Examples The following example defines an aliased command. watch netscape The result of issuing this alias is to list all the process IDs associated with Netscape processes on the host machine.v -print -exec egrep lckup {} \. synonym.} An optional string with a repeatable string that specifies a shorthand name. The next example defines the new command. You must precede this string with an exclamation point to differentiate it from a tool-specific command. looking for and displaying any “lckup” names: alias findlockup !find . | alias_synonym. which searches the current directory for Verilog files and invokes egrep on each one in turn. alias_synonym — An optional. for the specified UNIX or tool command or for a previously-defined alias synonym (which has the effect of a command).

V9.0 June 2010 99 .Command Dictionary Alias // alias: wobble=report black box -undefined alias // List of aliased commands: // wobble=report black box -undefined // wibble=!echo arg1 arg2 $1 $2 $3 $4 help wobble // alias: wobble=report black box -undefined help wibble // alias: wibble=!echo arg1 arg2 $1 $2 $3 $4 Related Commands Dofile Help History System Tessent DFTAdvisor Reference Manual.

0 June 2010 . You should use this dofile when DFTAdvisor is being used for production scan and test logic insertion. and read-control) of every sequential element (DFF. and so on) and optionally defines its primary input as a control signal. • Because of these types of issues. this command does not identify all clocks. This analysis also considers pin constraints. writecontrol. The purpose of analyzing the control signals is to identify the primary inputs that need to be defined as a clock. These cases include clocks driven by PLLs or clock gaters that require simulating a test setup procedure to obtain a sensitizable path to a top-level pin.Command Dictionary Analyze Control Signals Analyze Control Signals Scope: All modes Usage ANAlyze COntrol Signals [-Report_only | -Auto_fix] [-Verbose] Description Identifies and optionally defines the majority of primary inputs that are control signals. combinational gates. all identified primary inputs of control signals are automatically defined. the tool issues messages indicating why certain control signals are not reported as controllable. the tool cannot identify a top-level pin as a clock. statistical information displays. or writecontrol for DFTAdvisor. you should only use the results of this command as a starting point in creating a dofile that defines the clock control signals. Because it is not possible to completely identify all control signals. RAM. or controls signals. set. therefore. DFTAdvisor cannot accurately predict the off-state of a clock by observing the flip-flops it is driving and. their types. 100 Tessent DFTAdvisor Reference Manual. read and write controls in a design. latch. If the -Verbose option is specified. and additional information. listing the number of primary inputs identified as control signals. reset. their offstates. The Analyze Control Signals command analyzes each control signal (clocks. you should explicitly add the unidentified clocks using the Add Clocks command. Situations where DFTAdvisor may not be able to identify particular control signals include the following: • When DFTAdvisor is unable to trace or simulate through complex logic. read-control. In this case. If the -Auto_fix option is specified. requires the user to verify that the off-state of the clock/set/reset lines is correct. The default for control signals is report only. an implicit Add Clocks command is performed to define the primary input. At the end of the analysis. ROM. V9. For example. but only traces through simple. when a clock is identified.

After examining the transcript. • -Verbose An optional literal that specifies to display information on control signals (whether they are identified or not. If a netlist has a gated clock going to two flip-flops. if executed prior to performing flattening. V9. you can then perform another analysis of the control signals to add them. Caution This command does not support gated clocks. and why) while the analysis is performed. analyze control signals -verbose Tessent DFTAdvisor Reference Manual.0 June 2010 101 . then only provides a verbose report on the control signals in the design. when a clock is identified. • -Auto_fix An optional literal that specifies to define the primary inputs of all identified control signals as control signals. the tool does not recognize the gated clock when using the command the -Auto_fix option. For example. an implicit Add Clocks command is performed to define that primary input.Command Dictionary Analyze Control Signals Note This command performs the flattening process automatically. Examples The following example analyzes the control signals. Arguments • -Report_only An optional literal that specifies to only identify control signals (does not define the primary inputs as control signals). This is the invocation default.

// /IRST (1) with off-state = 0. ----------------------------------------------------------------------analyze control signals -auto_fix -verbose Related Commands Add Clocks Add Read Controls Add Write Controls Report Clocks Report Read Controls Report Write Controls 102 Tessent DFTAdvisor Reference Manual. 0 reads. 0 resets. // /IT23 (5) with off-state = 0. 0 sets . 27 resets. // Total number of controlled internal lines is 25 (17 clocks. . 35 resets. . // -----------------------------------------------------------------------// Warning: Clock line of ‘/cc01/tim_cc1/add1/post_latch_29/WRITEB_reg/r/ (7352)’ is uncontrolled at ‘/IT12 (4)’. // Identified 1 reset control primary inputs. 0 writes). // Total number of uncontrolled internal lines is 80 (18 clocks. 0 reads. 0 writes). // Identified 0 set control primary inputs. 0 reads.0 June 2010 . // /IT12 (4) with off-state = 0. 0 writes). // Identified 2 clock control primary inputs. // Identified 0 read control primary inputs. 0 writes). ----------------------------------------------------------------------// Total number of internal lines is 105 (35 clocks. . V9. // Total number of added primary input controls 0 (0 clocks. 35 sets. 35 sets . 0 sets . 0 reads. // Identified 0 write control primary inputs. 8 resets.Command Dictionary Analyze Control Signals // command: analyze control signals -reports_only -verbose // -----------------------------------------------------------------------// Begin control signals identification analysis.

For more information on wrapper chains. you must constrain uncontrollable primary inputs at the chip-level with the Add Pin Constraints command. Examples The following example adds three pin constraints and then reports the constrained pins in descending order based on controllability gain: add pin constraints data1 cx add pin constraints addr4 cx add pin constraints addr7 cx analyze input control addr4 addr7 data1 Related Commands Add Pin Constraints Analyze Output Observe Report Testability Analysis Setup Scan Identification Tessent DFTAdvisor Reference Manual. Sometimes there is combinational logic between the constrained pin and the sequential element that gets converted to an input wrapper cell. When creating wrapper chains. you should consider making that pin a test point or adding a new scan cell either inside or outside of that wrapper chain to improve fault detection. The Analyze Input Control command determines the controllability factor of an input pin by removing the X constraint.0 June 2010 103 . If a constrained input pin has a significant impact on the fault coverage within that combinational logic. V9. refer to “Understanding Wrapper Chains” in the Scan and ATPG Process Guide. DFTAdvisor reports the results of the analysis with the primary input having the largest controllability gain listed first. constraining the primary input pin can impact the fault detection of this combinational logic. and calculating the controllability improvement on the affected combinational gates. DFTAdvisor then uses the constrained inputs when identifying non-scan cells to place in the input wrapper chains.Command Dictionary Analyze Input Control Analyze Input Control Scope: Dft mode Usage ANAlyze INput Control Description Analyzes and reports the effects of constraining primary input pins to an unknown value.

analyzes the observability. you should consider making that pin a test point or adding a new scan cell either inside or outside of that wrapper chain to improve fault detection. Examples The following example masks three primary outputs. and reports the masked output pins in descending order based on observability gain: add output masks qout1 -hold 1 add output masks addr_res<1> -hold 0 add output masks addr_res<4> -hold 1 analyze output observe addr_res<1> qout1 addr_res<4> Related Commands Add Output Masks Analyze Input Control Report Testability Analysis Setup Scan Identification 104 Tessent DFTAdvisor Reference Manual. The Analyze Output Observe command determines the observability factor of an output pin by removing the mask and calculating the observability improvement on the affected combinational gates.Command Dictionary Analyze Output Observe Analyze Output Observe Scope: Dft mode Usage ANAlyze OUtput Observe Description Analyzes and reports the observabilty effects of masked primary output pins. masking the primary output pin can impact the fault detection of this combinational logic. If a masked output pin has a significant impact on the fault coverage within that combinational logic. refer to “Understanding Wrapper Chains” in the Scan and ATPG Process Guide.0 June 2010 . V9. DFTAdvisor reports the results of the analysis with the primary output put having the largest observability gain listed first. DFTAdvisor then uses the masked outputs when identifying the non-scan cells to place in the output wrapper chains. When creating wrapper chains. When there is combinational logic between the masked pin and the sequential element that gets converted to an output wrapper cell. For more information on wrapper chains. you must mask unobservable primary outputs at the chip-level with the Add Output Masks command.

For example. If you want to use partial scan.Command Dictionary Analyze Testability Analyze Testability Scope: Dft mode Usage ANAlyze TEstability [-Scoap_only] Description Reports general scannability and testability information. along with calculating the controllability and observability values for gates. number of non-scannable sequential elements. Tessent DFTAdvisor Reference Manual. you can use the report to correlate structural criteria with the amount of scan required. • Number of uncontrollable and unobservable scannable sequential elements The information reported is mainly related to the structure of the circuit. The information provided by this report can also give you a measure of how testable the circuit is at any given time. number of scannable sequential elements. The Analyze Testability command reports general scannability and testability information which can help you determine how much partial scan the design may need to achieve high test coverage. V9. The scannability and testability information reported includes: • • • • • Statistics about the total number of sequential elements. if all global loops are broken and the sequential depth is small. which can help you in determining whether more scan needs to be selected. and so on Number of scannable sequential elements that need to be scanned to break all global sequential loops Number of scannable sequential elements with self loops Number of scannable sequential elements required to scan RAM boundaries (if the design contains RAMs) Number of scannable sequential elements required to limit sequential depth and consecutive self loops Note If the design contains sequential loops. For example.0 June 2010 105 . the reported sequential depth is estimated. this indicates that the circuit is likely to achieve high test coverage and that the scan selected thus far may be sufficient. This can help you in determining what parameters to provide to structure-based scan selection. it is recommended that you use the more automated. automatic scan-selection method. you will see a report on how much scan is required to break all sequential loops or to limit sequential depth to a given number. If you are using structure-based scan selection.

The report displays the controllability value for the low logic state (where NC means non-controllable).25%) To 16 = 150 ( 19.00%) = = = = = = = 319 319 319 115 165 98 74 ( 42.39%) To 2 = 104 ( 13.46%) To 4 = 78 ( 10. the primitive gate type. but must be reported using the Report Testability Analysis command (as shown in the next example). but in addition.97%) To 4 = 165 ( 21. The controllability and observability numbers are also calculated. V9.85%) Scan to limit sequential depth: To 64 = 80 ( 10. If you use the -Scoap_only switch. DFT> analyze testability // // // // // // // // // // // // // // // // // // // // // // // // Number of sequential instances: Total Scannable Identified Targets Uncontrollable Unobservable Maximum sequential depth Scannable instances with self loops Scan to break global loops Scan RAM boundaries Scan to limit consecutive self loops: To 32 = 28 ( 3. these numbers are still calculated.Command Dictionary Analyze Testability In addition. scannability and testability information is calculated and reported.85%) The following example shows the flow of displaying only the controllability values.48%) ( 42.97%) To 2 = 248 ( 33. this command only calculates the controllability and observability values.92%) To 8 = 56 ( 7. and the pathname to the gate. If this switch is not specified. Examples The following example shows the default output from the Analyze Testability command. Arguments • -Scoap_only An optional switch that specifies to only compute SCOAP controllability and observability numbers for use with the Report Testability Analysis command. the controllability value for the high logic state.02%) = 751 = 319 ( 42.48%) = 0 ( 0.48%) ( 42.65%) To 32 = 122 ( 16.97%) ( 13.97%) To 8 = 150 ( 19.0 June 2010 .73%) To 16 = 52 ( 6. this command uses SCOAP testability measures to calculate the controllability and observability of individual gates which can be reported using the Report Testability Analysis command.05%) ( 9.48%) ( 21. 106 Tessent DFTAdvisor Reference Manual. the gate identification number.

analyze testability -scoap_only report testability analysis -control -percent 5 0 NC 1 5672 NC 0 7001 1 TIE0 TIE1 INV BUF 32 53 95 382 /addr/U15 /addr/U35 /cntr/U45 /blk1/U85 Related Commands Add Test Points Report Testability Analysis Setup Scan Identification Tessent DFTAdvisor Reference Manual.0 June 2010 107 .Command Dictionary Analyze Testability set system mode dft . V9. .

Command Dictionary Delete Black Box

Delete Black Box
Scope: Setup mode Usage DELete BLack Box -Instance [ins_pathname] | -Module [module_name] | -All Description Undoes the effect of the Add Black Box command. For a module that was originally modeled, removing the effect of the Add Black Box command reinstates the original model. Specified tied values are no longer set on the output pins. For a module that was empty or undefined in the input netlist, the output pins revert to the default tied value of X. Note The tool releases the flattened model if one exists at the time you issue this command.

Arguments • -Instance [ins_pathname] A switch that specifies for the tool to undo the effect of the Add Black Box command on all instance-based blackboxes. This is the default if no ins_pathname is given. You can optionally specify an instance pathname to undo a single instance-based blackbox. • -Module [module_name] A switch that specifies for the tool to undo the effect of the Add Black Box command on all module-based blackboxes. This is the default if no module_name is given. You can optionally specify a module name to undo a single module-based blackbox. • -All A switch that specifies for the tool to undo the effect of the Add Black Box command on all blackboxes. Example The following example adds the black box for module core then undoes all blackboxes that were defined.
add black box -module core 1 delete black box -all

Related Commands Add Black Box Delete Tied Signals Report Black Box

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Command Dictionary Delete Buffer Insertion

Delete Buffer Insertion
Scope: All modes Usage DELete BUffer Insertion test_pin… | -ALL Description Specifies the type of scan test pins on which you want to remove the fanout limit. The default fanout limit on all types of scan test pins is infinity. You can limit the fanout with the Add Buffer Insertion command, and you can remove that limit with the Delete Buffer Insertion command. If you remove the limit, DFTAdvisor resets the limit to the default of infinity. Arguments • test_pin A repeatable literal that specifies the type of the primary input scan pin from which you want DFTAdvisor to remove the fanout limit. The following shows the default pin names for each type of scan pin, but you can change the default names using the Setup Scan Insertion command. SEN (scan enable; default name scan_en) — A literal that specifies the primary input pin that enables the scan chain. SCLK (scan clock; default name scan_clk) — A literal that specifies the primary input pin that clocks the scan data through the scan chain; the clocked scan type uses this pin. TEN (test logic enable; default name test_en) — A literal that specifies the primary input that enables the operation of the test logic circuitry. TCLK (test logic clock; default name test_clk) — A literal that specifies the primary input pin that clocks the values DFTAdvisor requires for proper functionality of the test logic. SMCLK (master scan clock; default name scan_mclk) — A literal that specifies the primary input that clocks the scan data into the master scan elements of the scan chain when using the LSSD scan type. SSCLK (slave scan clock; default name scan_sclk) — A literal that specifies the primary input that clocks the scan data into the slave scan elements of the scan chain when using the LSSD scan type. • -ALL A switch that removes the fanout limits from all the primary input scan pins and returns each to its default setting of infinity.

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Examples The following example changes the default settings for test logic and then removes those settings. The following two reports show the results of each command.
add buffer insertion 5 ten tclk -model buf1a report buffer insertion scan_enable scan_clock test_enable test_clock scan_master_clock scan_slave_clock hold_enable <infinity> <infinity> 5 buf1a 5 buf1a <infinity> <infinity> <infinity>

delele buffer insertion -all report buffer insertion scan_enable scan_clock test_enable test_clock scan_master_clock scan_slave_clock hold_enable <infinity> <infinity> <infinity> <infinity> <infinity> <infinity> <infinity>

Related Commands Add Buffer Insertion Report Buffer Insertion

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Command Dictionary Delete Cell Models

Delete Cell Models
Scope: All modes Usage DELete CEll Models dftlib_model… | {-Type {INV | And | Buf | OR | NAnd | NOr | Xor | INBuf | OUtbuf | Mux | Scancell | DFf | DLat}} | -All Description Specifies the name of the DFT library cell that DFTAdvisor is to remove from the active list of cells that the user can access when adding test points or that DFTAdvisor can access when inserting test logic. You originally added the cells to the active list with either the Add Cell Models command or with the cell_type library attribute. If you remove a cell model from the active list, you only remove the cell from that list and do not change the DFT library. If you accidently delete a DFT library cell from the active list with the Delete Cell Models command, you can add the specified cell back into the active list with the Add Cell Models command. Arguments • dftlib_model A repeatable string that specifies the names of the particular DFT library models that you want DFTAdvisor to remove from the active list. • -Type INV | And | Buf | OR | NAnd | NOr | Xor | INBuf | OUtbuf | Mux | Scancell | DFf | DLat A switch and argument pair that specifies the cell model type of all DFT library models that you want DFTAdvisor to remove from the active list. The valid cell model types are as follows: INV — A literal that specifies a one-input inverter gate. And — A literal that specifies a two-input AND gate. Buf — A literal that specifies a one-input buffer gate. OR — A literal that specifies a two-input OR gate. NAnd — A literal that specifies a two-input NAND gate. NOr — A literal that specifies a two-input NOR gate. Xor — A literal that specifies a exclusive OR gate. INBuf — A literal that specifies a primary input buffer gate. OUtbuf — A literal that specifies a primary output buffer gate. Mux — A literal that specifies a 2-1 multiplexer. Scancell — A literal that specifies a mux-scan D flip-flop.

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Command Dictionary Delete Cell Models

DFf — A literal that specifies a D flip-flop. DLat — A literal that specifies a D latch. • -All A switch that removes all cell models from the active list, including those tagged in the DFT library with the cell_type attribute. This switch does not change the contents of the DFT library, only the active list within DFTAdvisor. Examples The following example removes a DFT library model from the active list:
add clocks 0 clk set test logic -set on -reset on set system mode dft add cell models and2 -type and add cell models or2 -type or add cell models mux21h -type mux s a b add cell models nor2 -type nor delete cell models or2 insert test logic

Related Commands Add Cell Models Report Cell Models Set Test Logic

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Command Dictionary Delete Clock Groups

Delete Clock Groups
Scope: Dft mode Usage DELete CLock Groups group_name… | -All Description Specifies the name of the group that you want to remove from the clock groups list. If you are going to merge multiple shift clocks together to form one scan chain, you can use the Add Clock Groups command to place the shift clocks in the same clock group. If you make a mistake when defining the clocks within a clock group, you can use the Delete Clock Groups command. As you delete clock groups, the specified clocks are returned to the default clock group, all_clocks. Arguments • group_name A repeatable string that specifies the names of the clock groups that you want to remove. The value of the group_name argument is the same as that which you specified with the Add Clock Groups command. • -All A switch that specifies to remove all the clock groups. Examples The following example defines the current clocks, splits those clocks incorrectly into two different groups, removes the clock group that was incorrectly defined, and then continues defining the clock groups:
add clock 1 clk1 clk2 add clock 0 pre1 clr1 pre2 clr2 set system mode dft . . add clock groups group1 clk1 pre2 clr1 delete clock groups group1 add clock groups group1 clk1 pre1 clr1 add clock groups group2 clk2 pre2 clr2

Related Commands Add Clock Groups Add Clocks Report Clock Groups Report Clocks

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Command Dictionary Delete Clocks

Delete Clocks
Scope: Setup mode Usage DELete CLocks primary_input_pin… | -All Description Removes primary input pins from the clock list. The Delete Clocks command removes the specified primary input pins from the clock list. Deleted clocks are also removed from the default clock group, all_clocks. If you remove an equivalence pin from the clock list, DFTAdvisor automatically removes all of the equivalent pins from the clock list. Arguments • primary_input_pin A repeatable string that specifies the list of primary input pins that you want to delete from the clock list. • -All A switch that deletes all pins from the clock list. Examples The following example deletes an incorrect clock from the clock list:
add clocks 1 clock1 add clocks 1 clock2 delete clocks clock1

Related Commands Add Clocks Report Clocks

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Command Dictionary Delete Mapping Definition

Delete Mapping Definition
Scope: Setup and DFT modes Usage DELete MApping Definition -All | {object_name [-Instance | -Module] [-Nonscan_model nonscan_model_name] [-Scan_model scan_model_name] [-Output [scan_ouput_pin_name]]} Description Returns the non-scan to scan model mapping to the mapping defined by DFTAdvisor. The Delete Mapping Definition command deletes the mapping of non-scan models to scan models. Using this command, you can perform the following: • • • • • Remove the scan model mapping for an individual instance. Remove all instances under a hierarchical instance. Remove all instances in all occurrences of a module in the design. Remove all occurrences of the model in the entire design. Remove the mapping the scan output pin of the scan models.

To return the scan mapping back to the library default, you can specify the non-scan model; DFTAdvisor removes the scan mapping and output mapping from the model. When specifying both the non-scan and scan model, DFTAdvisor removes the scan and output mapping for those instances matching the non-scan and scan model. When only removing the scan output pin mapping, you specify the scan model. If you also specify the output scan pin, then only scan candidates matching the scan model and output pin have their output pin mapping removed. Arguments • • -All A switch that specifies to remove all scan and output mapping in the entire design. object_name A string that specifies the name of the non-scan model you want to remove the mapping. You can also specify an instance, hierarchical instance, module, or scan model.
o

If this argument is the name of an instance or hierarchical instance, the -Instance switch is required and the model must be specified with the -Nonscan_model switch or -Scan_model switch. If this argument is the name of a module, then the -Module switch is required, and the model must be specified with the -Nonscan_model or -Scan_model switch.

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Command Dictionary Delete Mapping Definition o

If this argument is a scan model, then the -Output switch is required. Because you specified a scan model, you can only remove the scan output pin mapping.

-Instance | -Module An optional switch that specifies the type of the object_name argument. If neither switch is specified, the object_name is a model (the default).
o

If you specify -Instance and the instance is primitive, then only the named instance has its mapping changed. If you specify -Instance and the instance is hierarchical, then all instances under that instance matching the -Nonscan_model or (for output mapping) matching the -Scan_model have their mapping changed. If you specify -Module, then for all occurrences of that module, all instances within that module that match the -Nonscan_model or (for output mapping) matching the -Scan_model have their mapping changed.

o

o

-Nonscan_model nonscan_model_name An optional switch and string pair that specifies the name of the non-scan model that you want to remove the scan and pin mapping. This argument is required only if you specify -Instance or -Module switch; otherwise, you can specify the non-scan model in the object_name argument.

-Scan_model scan_model_name An optional switch and string pair that specifies the name of the scan model that is mapped to the specified non-scan model. This argument is required only if you want to constrain the removing of the scan mapping or are just removing the scan output pin mapping based on -Instance or -Module.

-Output [scan_ouput_pin_name] An optional switch and optional string pair that specifies to remove the scan output pin. Specifying just the -Output switch removes all changed scan output pins for the specified scan model, while specifying the switch with a pin name removes the mapping for only scan models that use that pin for the scan output.

Examples The following example removes the scan and output mapping for all occurrences of the fd1 nonscan model in the design:
delete mapping definition fd1

The following example removes the scan and output mapping for each occurrence of the fd1 non-scan model that is mapped to the fd1s scan model and has the scan output pin mapped to “qn”:
delete mapping definition fd1 -scan_model fd1s -output qn

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Command Dictionary Delete Mapping Definition

The following example removes the scan and output mapping for each occurrence of the fd1 non-scan model under the hierarchical instance “/top/counter1”:
delete mapping definition /top/counter1 -instance -nonscan_model fd1

The following example removes the scan and output mapping for each occurrence the fd1 nonscan model that is mapped to the fd1s2 scan model in the “counter” module and for all occurrences of that module in the design:
delete mapping definition counter -module -nonscan_model fd1 -scan_model fd1s2

The following example removes the scan output pin mapping and returns it to the library default for all occurrences of the fd1s scan model in the design:
delete mapping definition fd1s -output

The following example removes the scan output pin mapping and returns it to the library default for all occurrences of the fd1s scan model in the design with the scan output pin set to “qn”:
delete mapping definition fd1s -output qn

Related Commands Add Mapping Definition Report Mapping Definition

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Command Dictionary Delete Nofaults

Delete Nofaults
Scope: Setup mode Usage DELete NOfaults {-All | {modulename -Module} | {object_expression… [-PIN | -Instance]}} [-Stuck_at {01 | 0 | 1}] Description Removes the no-fault settings from either the specified pin or instance pathnames. The Delete Nofaults command deletes the nofault settings which were previously specified with the Add Nofaults command. You can optionally specify nofault settings that have a specific stuck-at value. If you do not specify a stuck-at value when deleting a nofault setting, the command deletes both the “stuck-at-0” and “stuck-at-1” nofault settings. If the pathname is a pin, then DFTAdvisor removes the nofault on only that pin. If the pathname is an instance, then the tool removes all pin nofaults on the top-level of that instance, along with all the pin faults underneath that instance (if it is a hierarchical instance). If the pathname is a module, then the tool removes all pin nofaults on the top-level of the module, along with all the pin nofaults on all instances and pins underneath that module for every occurrence of that module in the design. You can use the Report Nofaults command to display all the current nofault settings. Arguments • • -All A switch that deletes all nofault settings. modulename A string that specifies the name of a module from which you want to delete nofault settings. You must include the -Module switch when you specify a module name. • -Module A switch that specifies interpretation of the modulename argument as a module pathname. All instances of these modules are affected. You can use the asterisk (*) and question mark (?) wildcards for the modulename argument, and the tool deletes the nofault for all matching modules or library models. • object_expression A string representing a list of pathnames of instances or pins from which you want to delete nofault settings. The string may include any number of embedded asterisk (*) or question mark (?) wildcard characters. The asterisk matches any sequence of characters (including none) in a name, and the question mark matches any single character. Pin pathnames must be ATPG library cell instance pins, also referred to as design level pins. If the object expression specifies a pin within an instance of an ATPG library model, the tool ignores it. By default, pin pathnames are matched first. If a pin pathname match is not
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Command Dictionary Delete Nofaults

found, the tool next tries to match instance pathnames. You can force the tool to match only pin pathnames or only instance pathnames by including the -Pin or -Instance switch after the object_expression. • -Pin An optional switch that specifies to use the preceding object expression to match only pin pathnames; the tool will then delete nofault settings from all the pins matched. • -Instance An optional switch that specifies to use the preceding object expression to match only instance pathnames; the tool will then delete nofault settings from all boundary and internal pins of the instances matched. • -Stuck_at 01 | 0 | 1 An optional switch and literal pair that specifies the stuck-at values that you want to delete. The valid stuck-at literals are as follows: 01 — A literal that specifies to delete both the “stuck-at-0” and “stuck-at-1” nofault settings. This is the default. 0 — A literal that specifies to only delete the “stuck-at-0” nofault settings. 1 — A literal that specifies to only delete the “stuck-at-1” nofault settings. Examples The following example will delete an extra added no fault instance.
add nofaults i_1006 i_1007 i_1008 -instance report nofaults USER USER USER USER USER USER : : : : : : 01 01 01 01 01 01 i_1006/IN i_1006/OUT i_1007/IN i_1007/OUT i_1008/IN i_1008/OUT

delete nofaults i_1007 -instance report nofaults USER USER USER USER : : : : 01 01 01 01 i_1006/IN i_1006/OUT i_1008/IN i_1008/OUT

Related Commands Add Nofaults Report Nofaults

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Command Dictionary Delete Nonscan Instances

Delete Nonscan Instances
Scope: All modes Usage DELete NONscan Instances {{pathname… | instance_expression [-INStance | -Control_signal | -Module]} | -All} [-Class {User | System | Full}] Description Removes the specified sequential instances from the non-scan instance list. The Delete Nonscan Instances command deletes sequential instances, instances specified by control signals, or all instances within the specified module that were previously added to the non-scan instance list by using either the Add Nonscan Instances command or the Dont_touch property in a Genie netlist. You can delete either a specific list of instance names or all instances. Note If these non-scan instances are ignored for scannability checks and then the Delete Nonscan Instances command is entered in Dft mode, these specified instances will not be eligible for scan. You must go back to the Setup mode and then re-enter Dft mode to have scannability checks performed on these instances, which can make them eligible for scan. To display the current non-scan instance list, use the Report Sequential Instances command. Arguments • pathname A repeatable string that specifies either the pathnames of the instances or signals that control instances that you want DFTAdvisor to delete from the non-scan instance list. • instance_expression A string representing a list of instances within the design. The string instance_expression is defined as:
{ string | string * } ...

The asterisk (*) is a wildcard that allows you to match many instances in a design. Any expression that does not contain an asterisk (*) will match exactly zero or one instance. This argument does not support pathnames to objects below the instance level of an ATPG library model. You can use a pathname expression to select several instances and the tool will then delete nonscan instances for all the pins on those instances; but if the expression specifies a location below the instance level of an ATPG library model, the tool will issue an error message.

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• • -All A switch that specifies to delete all instances from the non-scan instance list. This is the default. then performs a full scan identification run thereby allowing DFTAdvisor to treat the non-scan instance i_1007 as a scan cell during the identification process: set system mode dft add nonscan instances i_1006 i_1007 i_1008 delete nonscan instances i_1007 setup scan identification full_scan run Related Commands Add Nonscan Instances Report Sequential Instances Setup Scan Identification Set Nonscan Handling Tessent DFTAdvisor Reference Manual.0 June 2010 121 .Command Dictionary Delete Nonscan Instances • -INStance | -Control_signal | -Module A switch that specifies whether the pathnames are instances. System — A literal that specifies to only delete the non-scan instances described in the Genie netlist with the Dont_touch property. -Class User | System | Full An optional switch and literal pair that specifies the source (or class) of the non-scan instance that you want to delete. clk_out. The valid literals are as follows: User — A literal that specifies to only delete the non-scan instances entered by the user using the Add Nonscan Instances command. You can only use the -Control_signal option in Dft mode. Examples The following example deletes an extra sequential non-scan instance called i_1007. Full — A literal that specifies to delete all the non-scan instances in the user and system class. pins (control signals). V9. An example Verilog module is “module clkgen (clk. or modules. The default is -Instance. …)” where clkgen is the module name.

then DFTAdvisor is forced to place all available sequential instances into the scan instance list. When you issue the Add Nonscan Models command on a DFT library model. these specified instances (models) will not be eligible for scan.Command Dictionary Delete Nonscan Models Delete Nonscan Models Scope: All modes Usage DELete NONscan Models model_name… | -All [-Class {User | System | Full}] Description Removes from the non-scan model list the specified sequential DFT library models.0 June 2010 . You must go back to the Setup mode and then reenter Dft mode to have scannability checks performed on these instances (models) which can make them eligible for scan. 122 Tessent DFTAdvisor Reference Manual. System — A literal that specifies that the list of non-scan models were added by DFTAdvisor. V9. This is the default class. -Class User | System | Full An optional switch and literal pair that specifies the class code of the non-scan model that you specify. Arguments • model_name A repeatable string that specifies the model names that you want to delete from the non-scan model list. Full — A literal that specifies that the list of non-scan models consist of both the user and system class. The valid literal names are as follows: User — A literal that specifies that the list of non-scan models were previously added by using the Add Nonscan Models command. DFTAdvisor places all instances of that DFT library model into the user-specified. • • -All A switch that specifies to delete all models from the non-scan model list. Note If these non-scan instances (models) are ignored for scannability checks and then the Delete Nonscan Models command is entered in Dft mode. Enter the model names as they appear in the DFT library. DFTAdvisor then has the freedom to decide whether to place those instances of that model in the scan instance list. Once you remove a model from the non-scan model list with the Delete Nonscan Models command. DFTAdvisor decides whether to place individual instances in the scan instance list based on many parameters including the scan setup settings. if the scan setup has been changed to All with the command. non-scan instance list. For example.

V9. then performs a full scan identification run thereby allowing DFTAdvisor to treat the non-scan model d_flip_flop2 as a scan cell during the identification process: set system mode dft add nonscan models d_flip_flop1 d_flip_flop2 delete nonscan models d_flip_flop2 setup scan identification full_scan run Related Commands Add Nonscan Instances Add Nonscan Models Report Nonscan Models Set Nonscan Handling Tessent DFTAdvisor Reference Manual.0 June 2010 123 .Command Dictionary Delete Nonscan Models Examples The following example deletes an extra sequential non-scan model called d_flip_flop2.

0 June 2010 . the no test point restriction is removed. This argument does not support pathnames to objects below the instance level of an ATPG library model.. • instance_pathname A required repeatable string that lists the instances whose output pins you want to delete the circuit points that DFTAdvisor cannot use for testability insertion. but if the expression 124 Tessent DFTAdvisor Reference Manual. • instance_expression A string representing a list of instances within the design. Usage DELete NOtest Points {pin_pathname… | instance_pathname… | instance_expression [-Observe_scan_cell]} | -ALL | {-Path critical_pathname} | -ALL_Paths Description Removes the specified pins from the list of notest points which the tool cannot use for testability insertion. Arguments • pin_pathname A repeatable string that specifies a list of pins for which you want to delete the circuit points that DFTAdvisor cannot use for testability insertion. The Delete Notest Points command deletes the definition of pins. When you delete a critical path. or paths that you have previously added using the Add Notest Points command. You can display a list of these current circuit points and their associated pins by using the Report Notest Points command. The string instance_expression is defined as: { string | string * } . all pins within an instance. All output pins within that (hierarchical) instance are removed from the list of pins that should be excluded from consideration.Command Dictionary Delete Notest Points Delete Notest Points Scope: Setup and Dft modes Prerequisites: You must add circuit points with the Add Notest Points command before you can delete them. These notest circuit points identify output pins of cells or paths within the circuit that DFTAdvisor is not to use for insertion of controllability and observability circuitry. Any expression that does not contain an asterisk (*) will match exactly zero or one instance. which is in no other remaining active paths. the critical path is removed from the list of active paths (paths read in using Add Notest Points). You can use a pathname expression to select several instances and the tool will then delete notest points for all the pins on those instances. scan cell. The asterisk (*) is a wildcard that allows you to match many instances in a design.. V9. For each gate in a removed path.

V9. the tool will issue an error message. Examples The following example deletes an incorrect notest circuit point and corrects it with a new circuit point before performing testability analysis: set system mode dft add notest points tr_i ts_i delete notest points tr_i add notest points tr_io Related Commands Add Notest Points Report Notest Points Tessent DFTAdvisor Reference Manual. You can list the names of the critical paths using the Report Notest Points command with the -Paths switch. refer to “The Path Definition File” in the Scan and ATPG Process Guide. -Path critical_pathname A required switch and name pair that specifies to delete the named critical path. • • -ALL A switch that deletes all previously-added circuit points and critical paths.Command Dictionary Delete Notest Points specifies a location below the instance level of an ATPG library model. • -Observe_scan_cell An optional switch that specifies the scan cell instance named in the instance_pathname argument is to be removed from the no test point list.0 June 2010 125 . For more information on the format of the file. • -ALL_Paths A required switch that specifies to delete all critical paths.

you must use the Setup Output Masks command with the Off literal. Examples The following example first incorrectly chooses two of the design’s primary output pins to mask. the example unmasks the one primary output that was inappropriate.0 June 2010 . To turn off the default masks for all output pins. V9. You can set a default mask for all output and bidirectional pins using the Setup Output Masks command. Then. masks the correct primary output. DFTAdvisor marks that pin as an unobservable primary output during the identification process. add output masks q1 qb3 -hold 1 delete output masks qb3 add output masks qb1 -hold 0 report output masks q1 hold1 qb1 hold0 Related Commands Add Output Masks Analyze Output Observe Report Output Masks Setup Output Masks 126 Tessent DFTAdvisor Reference Manual.Command Dictionary Delete Output Masks Delete Output Masks Scope: Setup mode Usage DELete OUtput Masks primary_output… | -All Description Removes the masking of the specified primary output pins. You can add a hold value to a default mask with the Add Output Masks command. When you mask a primary output pin with the Add Output Masks command. Arguments • primary_output A repeatable string that specifies the names of the primary output pins that you want to unmask. and then displays the complete list of primary output pins that are currently masked from being used as observation points. • -All A switch that specifies to unmask all primary outputs that you previously masked by using the Add Output Masks command. or remove a hold value using the Delete Output Masks command. DFTAdvisor uses primary output pins as the observe points during the scan identification process.

You can set a default pin constraint for all input and bidirectional pins using the Setup Pin Constraints command. The pin constraints set by the Setup Output Masks command can have their values overridden with the Add Pin Constraints command. To remove the default pin constraint for all input pins. Tessent DFTAdvisor Reference Manual. You can delete the pin constraints for specific pins or for all pins. The Delete Pin Constraints command deletes pin constraints that were previously added to the primary inputs with the Add Pin Constraints command. You can remove an override of a default pin constraint using the Delete Pin Constraints command. such as simulation-based test point selection. V9. Arguments • primary_input_pin A repeatable string that specifies a list of primary input pins whose pin constraints you want to delete.Command Dictionary Delete Pin Constraints Delete Pin Constraints Scope: Setup mode Usage DELete PIn Constraints primary_input_pin… | -All Description Removes the pin constraints from the specified primary input pins. Note This command has effects on other commands that relate to fault simulation.0 June 2010 127 . • -All A switch that specifies to delete the pin constraints of all primary input pins. you should use the Setup Pin Constraints command with the None literal.

0 June 2010 . V9.Command Dictionary Delete Pin Constraints Examples The following example adds two pin constraints and then deletes one of them: add pin constraints ph1 c0 add pin constraints ph2 c0 delete pin constraints ph1 Related Commands Add Pin Constraints Report Pin Constraints Setup Pin Constraints 128 Tessent DFTAdvisor Reference Manual.

Note This command has effects on other commands that relate to fault simulation.0 June 2010 129 . The Delete Pin Equivalences command deletes the equivalence specifications that were previously added to the primary inputs with the Add Pin Equivalences command. You can delete pin equivalences for specific pins or for all pins.Command Dictionary Delete Pin Equivalences Delete Pin Equivalences Scope: Setup mode Usage DELete PIn Equivalences primary_input_pin… | -All Description Removes the pin equivalence specifications for the designated primary input pins. Arguments • primary_input_pin A repeatable string that specifies a list of primary input pins whose equivalence specifications you want to delete. V9. • -All A switch that specifies to delete all pin equivalence effects. such as simulation-based test point selection. Examples The following example deletes an incorrect pin equivalence specification and adds the correct one: add pin equivalences indata2 -invert indata4 delete pin equivalences indata2 add pin equivalences indata3 -invert indata4 Related Commands Add Pin Equivalences Report Pin Equivalences Tessent DFTAdvisor Reference Manual.

V9. • primary_input_pin A repeatable string that specifies a list of primary input pins that you want to delete. system class. You can delete either the user class. • -All A switch that deletes all primary inputs. You can specify the class of primary inputs to delete with the -Class switch. 130 Tessent DFTAdvisor Reference Manual. or full classes of primary inputs.Command Dictionary Delete Primary Inputs Delete Primary Inputs Scope: Setup mode Usage DELete PRimary Inputs net_pathname… | primary_input_pin… | -All [-Class {User | System | Full}] Description Removes the specified primary inputs from the current netlist. Arguments • net_pathname A repeatable string that specifies the circuit connections that you want to delete. You can specify the class of primary inputs to delete with the -Class switch. You can display a list of any class of primary inputs by using the Report Primary Inputs command. You can specify the class of primary inputs to delete with the -Class switch.0 June 2010 . the tool deletes the primary inputs from the user class. The Delete Primary Inputs command deletes the primary inputs that you specify from the circuit. If you do not specify a class.

Command Dictionary Delete Primary Inputs • -Class User | System | Full An optional switch and literal pair that specifies the class code of the designated primary input pins. System — A literal specifying that the primary inputs derive from the netlist. The valid class code literal names are as follows: User — A literal specifying that the primary inputs were added using the Add Primary Inputs command. This is the default class. Full — A literal specifying that the primary inputs consist of both user and system classes. Examples The following example deletes an extra added primary input from the user class of primary inputs: add primary inputs indata2 indata4 indata6 delete primary inputs indata4 -class user Related Commands Add Primary Inputs Report Primary Inputs Write Primary Inputs Tessent DFTAdvisor Reference Manual. V9.0 June 2010 131 .

the tool deletes the primary outputs from the user class. You can specify the class of primary outputs to delete with the -Class switch. You can specify the class of primary outputs to delete with the -Class switch. system class. The Delete Primary Outputs command deletes the primary outputs that you specify from the circuit. You can delete either the user class. Full — A literal specifying that the list of primary outputs consists of both the user and system class. Arguments • net_pathname A repeatable string that specifies the circuit connections that you want to delete. If you do not specify a class. This is the default class. or full classes of primary outputs. Examples The following example deletes a primary output from the system class of primary outputs: delete primary outputs outdata1 -class system 132 Tessent DFTAdvisor Reference Manual. The valid literal names are as follows: User — A literal specifying that the list of primary outputs were added using the Add Primary Outputs command. System — A literal specifying that the list of primary outputs derive from the netlist. You can specify the class of primary outputs to delete with the -Class switch.0 June 2010 . • -Class User | System | Full An optional switch and literal pair that specifies the class code of the primary output pins that you specify.Command Dictionary Delete Primary Outputs Delete Primary Outputs Scope: Setup mode Usage DELete PRimary Outputs net_pathname… | primary_output_pin… | -All [-Class {User | System | Full}] Description Removes the specified primary outputs from the current netlist. V9. You can display a list of any class of primary outputs by using the Report Primary Outputs command. • -All A switch that deletes all primary outputs. • primary_output_pin A repeatable string that specifies a list of primary output pins that you want to delete.

0 June 2010 133 . V9.Command Dictionary Delete Primary Outputs Related Commands Add Primary Outputs Report Primary Outputs Write Primary Outputs Tessent DFTAdvisor Reference Manual.

Command Dictionary Delete Read Controls Delete Read Controls Scope: Setup mode Usage DELete REad Controls primary_input_pin… | -All Description Removes the read control line off-state definitions from the specified primary input pins. Arguments • primary_input_pin A repeatable string that specifies a list of primary input pins from which you want to delete any read control line off-state definitions. The Delete Read Controls command deletes the off-state definition of the read control lines previously defined with the Add Read Controls command. You can delete the read control line definitions for specific pins or for all pins. • -All A switch that specifies to delete the read control line off-state definitions for all primary input pins. Examples The following example removes an incorrect read control line off-state definition. V9.0 June 2010 . and then creates the correct off-state for that read control line: add clocks 0 clk add read controls 0 r1 r2 delete read controls r1 add read controls 1 r1 set system mode dft Related Commands Add Read Controls Report Read Controls 134 Tessent DFTAdvisor Reference Manual.

not the scan chain itself.0 June 2010 135 . V9. it is only the definition you are removing. If you need to remove the scan chain itself. • -All A switch that specifies to delete all scan chain definitions. adding them to the scan chain list. then deletes one of the scan chains: add scan chains chain1 group1 indata2 outdata4 add scan chains chain2 group1 indata3 outdata5 add scan chains chain3 group1 indata4 outdata6 delete scan chains chain2 Related Commands Add Scan Chains Report Scan Chains Ripup Scan Chains Tessent DFTAdvisor Reference Manual. you can use the Ripup Scan Chains command.Command Dictionary Delete Scan Chains Delete Scan Chains Scope: Setup Usage DELete SCan Chains chain_name… | -All Description Removes the specified scan chain definitions from the scan chain list. Examples The following example defines several scan chains. When you remove a scan chain definition. You can delete the definitions of specific scan chains or of all scan chains. Arguments • chain_name A repeatable string that specifies the names of the scan chain definitions that you want to delete. The Delete Scan Chains command deletes scan chains previously defined with the Add Scan Chains command.

Examples The following example defines two scan chain groups. You can delete the definitions of specific scan chain groups or of all scan chain groups. the tool also deletes all scan chains within the group. The Delete Scan Groups command deletes scan chain groups previously defined with the Add Scan Groups command. which also automatically causes DFTAdvisor to remove all scan chain definitions. Arguments • group_name A repeatable string that specifies the names of the scan chain group definitions that you want to delete.0 June 2010 . • -All A switch that specifies to delete all the scan chain group definitions. then deletes one of the scan chain groups: add scan groups group1 scanfile1 add scan groups group2 scanfile2 delete scan groups group1 Related Commands Add Scan Groups Report Scan Groups 136 Tessent DFTAdvisor Reference Manual. adding them to the scan chain group list.Command Dictionary Delete Scan Groups Delete Scan Groups Scope: Setup mode Usage DELete SCan Groups group_name… | -All Description Removes the specified scan chain group definitions from the scan chain group list. V9. When you delete a scan chain group.

DFTAdvisor then has the option of including it in the system-identified scan instance list. which you previously selected with the Add Scan Instances command. instances specified by control signals. V9. The asterisk (*) is a wildcard that allows you to match many instances in a design. If you issue a Run command after removing an instance from the user-identified scan list with the Delete Scan Instances command. which allowed DFTAdvisor to convert the instance into a scan cell even though it violated the S4 rule. Arguments • pathname A repeatable string that specifies the pathnames of the instances or control signals (that control instances) that you want DFTAdvisor to delete from the user-identified scan instance list.. the effects of its previous unknown state on downstream instances is not reset. The string instance_expression is defined as: { string | string * } . or all instances within the specified module that were previously added to the scan instance list by using the Add Scan Instances command. The pathnames must be user-identified scan instances or control signals (that control instances).Command Dictionary Delete Scan Instances Delete Scan Instances Scope: All modes Usage DELete SCan Instances {pathname… | instance_expression [-INStance | -Control_signal | -Module]} | -All Description Removes the specified. You can also use this command to remove an exception status from an instance. • instance_expression A string representing a list of instances within the design. sequential instances from the user-identified scan instance list.0 June 2010 137 . that you added using the Add Scan Instances command. You can use a pathname expression to select several instances and the tool will then delete scan instances for all the pins on those instances. although the instance is converted back into a non-scan instance. The Delete Scan Instances command deletes sequential instances. but if the expression Tessent DFTAdvisor Reference Manual. In this case. User-identified scan instances result from using the Add Scan Instances or Add Scan Models commands. DFTAdvisor also selects the sequential instances by using the identification type you specify with the Setup Scan Identification command (system-identified). This argument does not support pathnames to objects below the instance level of an ATPG library model. You can delete either a specific list of instance names or all instances. Any expression that does not contain an asterisk (*) will match exactly zero or one instance..

or modules. • -All A switch that specifies to delete all instances from the user-identified scan instance list. pins (control signals). …)” where clkgen is the module name. V9. the tool will issue an error message. You can only use the -Control_signal option in Dft mode. Examples The following example deletes an extra sequential scan instance that was defined to be treated as a scan cell. An example Verilog module is “module clkgen (clk. clk_out.Command Dictionary Delete Scan Instances specifies a location below the instance level of an ATPG library model. the deleted instance is no longer included in the user-identified scan instance list: set system mode dft add scan instances i_1006 i_1007 i_1008 delete scan instances i_1007 Related Commands Add Scan Instances Report Sequential Instances 138 Tessent DFTAdvisor Reference Manual. thus.0 June 2010 . • -INStance | -Control_signal | -Module A switch that specifies whether the pathnames are instances. This switch does not affect the instances in the system-identified scan instance list. The default is -Instance.

V9. You can explicitly identify scan instances with either the Add Scan Instances or the Add Scan Models commands (user-identified). You can delete a specific list of sequential models or all the models.0 June 2010 139 . Enter the model names as they appear in the DFT library. • -All A switch that specifies to delete all models from the scan model list and all instances from the user-identified scan instance list. The Delete Scan Models command does not remove instances from the system-identified scan instance list. There are two ways that sequential instances can be identified for scan: system and user. DFTAdvisor then has the option of including any of the instances of that model in the system-identified scan instance list. thus. the deleted model is no longer included in the scan model list: set system mode dft add scan models d_flip_flop1 d_flip_flop2 delete scan models d_flip_flop2 Related Commands Add Scan Instances Add Scan Models Report Scan Models Tessent DFTAdvisor Reference Manual.Command Dictionary Delete Scan Models Delete Scan Models Scope: All modes Usage DELete SCan Models model_name… | -All Description Removes the specified sequential models from the scan model list. To display the current scan model list. use the Report Scan Models command. The Delete Scan Models command deletes all instances of the sequential models that you specify. Examples The following example deletes an extra added sequential scan model. This includes removing all instances of the model_name from the user-identified scan instance list. If you issue a Run command after removing a model from the user-identified scan list with the Delete Scan Models command. Arguments • model_name A repeatable string that specifies the model names that you want to delete from the scan model list and user-identified scan instance list. DFTAdvisor also selects the sequential instances by using the identification type you specify with the Setup Scan Identification command.

first partially. then completely. V9. Examples The following example adds three scan partitions. add scan partition part_1 -instance umodA add scan partition part_2 -instance umodB umodC add scan partition part_3 -instance umodD delete scan partitions part_2 report scan partitions ----------------------------------------------------------------------ScanPartitionName TotalNumCells/ScannableCells Members ----------------------------------------------------------------------part_1 150/150 umodA [instance] part_3 330/250 umodD [instance] default_scan_partition 15000/0 <all_remaining_cells> ----------------------------------------------------------------------delete scan partitions -all report scan partitions ----------------------------------------------------------------------ScanPartitionName TotalNumCells/ScannableCells Members ----------------------------------------------------------------------default_scan_partition 15480/400 <all_remaining_cells> ----------------------------------------------------------------------- Related Commands Add Scan Partition Report Scan Partitions 140 Tessent DFTAdvisor Reference Manual. This option does not remove the default scan partition that the tool creates.. default_scan_partition. The sequential cells whose scan partitions are deleted are placed back into the default scan partition.0 June 2010 .Command Dictionary Delete Scan Partitions Delete Scan Partitions Scope: All modes Usage DELete SCan PArtitions {object_name. -All A required switch that specifies to remove all the user specified scan partitions. The scan partitions are then deleted. | -All} Description Deletes the user specified scan partitions. It does not delete the default scan partition.. default_scan_partition. Arguments • • object_name A required repeatable string that specifies the names of the scan partitions to remove.

0 June 2010 141 . You can use the Report Scan Pins command to display all added scan input and output pin names for each scan chain. The Delete Scan Pins command removes user-specified names of the scan input and scan output pins of the scan chains that you previously assigned with the Add Scan Pins command. and clock names from the specified scan chains. Examples The following example removes previously-assigned scan chain input and output names for chain1: add clocks 0 clk set system mode dft run add scan pins chain1 si so add scan pins chain2 si1 so1 delete scan pins chain1 insert test logic Related Commands Add Scan Pins Report Scan Pins Tessent DFTAdvisor Reference Manual. V9. Arguments • chain_name A repeatable string that specifies the names of the scan chains from which you want DFTAdvisor to remove the associated pins. • -All A switch that removes all added scan pin names from all scan chains. output.Command Dictionary Delete Scan Pins Delete Scan Pins Scope: All modes Usage DELete SCan PIns chain_name… | -All Description Removes any previously-assigned scan input.

V9.Command Dictionary Delete Seq_transparent Constraints Delete Seq_transparent Constraints Scope: Setup mode Usage DELete SEq_transparent Constraints {model_name pin_name…} | -All Description Removes the pin constraints from the specified DFT library model input pins.0 June 2010 . • -All A switch that specifies to delete the constraints of all DFT library model pins. The Delete Seq_transparent Constraints command deletes constraints that were added to clock enable pins with the Add Seq_transparent Constraints command. • pin_name A repeatable string that specifies the clock enable pin names of the model_name specified whose constraints you want to delete. You can delete the constraints for all DFT library models or for specific pins of a model. Arguments • model_name A string that specifies the DFT library model from whose pin_name you want to delete the constraints. Examples The following example adds two seq_transparent constraints and deletes one of them: set system mode setup add seq_transparent constraints c1 gdff enable delete seq_transparent constraints gdff enable add seq_transparent constraints c1 gdff en set system mode dft setup scan identification seq_transparent Related Commands Add Seq_transparent Constraints Report Seq_transparent Constraints 142 Tessent DFTAdvisor Reference Manual.

• subchain_name An optional string that specifies the name of a pre-existing scan subchain to delete. If you specify an instance. object_name A string that specifies either the pathname of an instance. • • • -Module An optional switch that specifies the object_name is a module. you must also use the -Library_model switch. V9. -Library_model An optional switch that specifies the object_name is a library model. you must also use the -Instance switch. Examples The following example deletes the subc1 subchain from the blkA module: add sub chains blkA subc1 si1 so1 10 mux_scan -sen_core sen1 -subclock sclk -module add sub chains blkA subc2 si2 so2 30 mux_scan -sen_core sen2 -subclock mclk -module delete sub chains blkA subc1 Related Commands Add Sub Chains Report Sub Chains Tessent DFTAdvisor Reference Manual. If you do not specify a subchain_name.0 June 2010 143 .Command Dictionary Delete Sub Chains Delete Sub Chains Scope: Setup mode Usage DELete SUb Chains -All | {object_name [subchain_name] [-Module | -Instance | -Library_model]} Description Removes scan subchains previously defined with the Add Sub Chains command. all subchains in the specified object_name are deleted. Use the Report Sub Chains command to display the currently defined scan subchains. -Instance An optional switch that specifies the object_name is an instance. If you specify a library model. Arguments • • -All A switch that removes all scan subchains. This is the default. or the name of a module or library model.

V9.----.-----RESET reset 0 SET set 0 Related Commands Add Subchain Clocks Report Subchain Clocks 144 Tessent DFTAdvisor Reference Manual.Command Dictionary Delete Subchain Clocks Delete Subchain Clocks Scope: Setup mode Usage DELete SUbchain CLocks subchain_name clock_name Description Deletes subchain clocks previously defined with the Add Subchain Clocks command.-----------RESET reset 0 SET set 0 CK first cell clock 0 CK last cell clock 0 edge ----- leading edge leading edge delete subchain clocks chain1 CK report subchain clocks chain1 // // // // clock name type off_state edge ---------. reports.0 June 2010 . Examples The following example adds. Arguments • • subchain_name A required string that specifies the name of a subchain.--------. clock_name A required string that specifies the name of a subchain clock. and deletes a subchain clock: add sub chains MULTIBITSFF3 chain1 SI SO 4 mux_scan S library_model add subchain clocks chain1 0 RESET -reset add subchain clocks chain1 0 SET -set add subchain clocks 0 CK -first_cell_clock -leading_edge add subchain clocks 0 CK -last_cell_clock -leading_edge report subchain clocks chain1 // // // // // // clock name type off_state ---------.

Arguments • • subchain_group_name A repeatable string that specifies the names of the subchain group definitions to be deleted. Examples The following example removes a subchain group definition: add subchain group subchaingroup1 subchain1 subchain2 -fixed add subchain group subchaingroup2 subchain3 subchain4 -flexible report subchain groups ----------------------------------------------SubchainGroupName Type ListOfSubchains ----------------------------------------------subchaingroup1 fixed subchain1 subchain2 subchaingroup2 flexible subchain3 subchain4 delete subchain group subchaingroup1 Related Commands Add Subchain Group Add Sub Chains Delete Sub Chains Report Sub Chains Report Subchain Groups Tessent DFTAdvisor Reference Manual. use the Report Subchain Groups command.Command Dictionary Delete Subchain Groups Delete Subchain Groups Scope: All modes Usage DELete Subchain Groups subchain_group_name … | -All Description Removes a scan subchain group. -All A switch that removes all subchain group definitions.0 June 2010 145 . The Delete Subchain Groups command removes subchain groups added by means of the Add Subchain Group command. V9. To determine whether there are any current scan subchain groups.

If you do not specify -Control. The -Full means that DFTAdvisor removes all the control and observe test points and lockup cells at the specifed location(s). This command removes both user-defined and system-defined test points. You can create userdefined test points with the Add Test Points command.Command Dictionary Delete Test Points Delete Test Points Scope: Setup mode Usage DELete TEst Points {-All | testpoint_pin_name…} [-Full | -Control | -Observe | -Lockup] [-Wrapper_chains_identified] Description Removes the specified test point definitions. You can use the -Observe or -Control switches to filter which test points are removed. DFTAdvisor uses the default -Full value. Arguments • • -All A required switch that removes the control and/or observe test points from all locations. -Wrapper_chains_identified An optional switch that removes the test points added automatically during the wrapper chain identification process. Such test points may be added only if the -Test_points switch is specified with the Setup Pin Constraints command. repeatable string that specifies a pathname to the control and/or observe test points to delete. -Observe An optional switch that removes the observe test points from the specified locations. -Observe. By default. or -Lockup with either the testpoint_pin_name or the -All option. You can enable DFTAdvisor to automatically identify test points using a combination of the Setup Scan Identification. V9. • -Full An optional switch that removes both the control and observe test points from the specified locations. and Run commands. Setup Test_point Identification. -Lockup An optional switch that removes the added lockup cells. testpoint_pin_name A required. all test points are removed. 146 Tessent DFTAdvisor Reference Manual. Setup Test_point Insertion. This is the default.0 June 2010 . • • • • -Control An optional switch that removes the control test points from the specified locations.

This example includes both control and observe test points and deletes them by default. not the type. then removes two of the definitions: add cell models and2a -type and add test point /I_6_16/cp control and2a in2 add test point /I_7_16/q observe out1 add test point /I_8_16/cp control and2a in3 delete test points /I_6_16/cp /I_7_16/q The Delete Test Points command only specifies the testpoint_pin_names of the test points. V9. Related Commands Add Test Points Report Test Logic Report Test Points Setup Pin Constraints Setup Scan Identification Setup Test_point Identification Setup Test_point Insertion Tessent DFTAdvisor Reference Manual.Command Dictionary Delete Test Points Examples The following example creates the definitions for three test points (one observe and two control).0 June 2010 147 .

To display a list of any class of tied floating nets or pins. If you specify a full net pathname. use the Report Tied Signals command. Full — A literal that specifies that the list of tied floating nets or pins consist of both the user and system class. 148 Tessent DFTAdvisor Reference Manual. The tool deletes all of the tied values associated with the floating nets or pins in the class of tied floating nets or pins which you specify with the -Class switch.Command Dictionary Delete Tied Signals Delete Tied Signals Scope: Setup mode Usage DELete TIed Signals {floating_object_name… | -All} [-Class {User | System | Full}] [-Pin] Description Removes the assigned (tied) value from the specified floating nets or pins. This also includes all instance-based blackbox tied signals.0 June 2010 . which you specify with the -Class switch. DFTAdvisor reassigns the default tied signal value to that object. You can delete tied values from either user class. • -All A switch that deletes the tied values from all tied floating nets or pins in the class of tied floating nets or pins. and you can change that default with the Setup Tied Signals command. the tool deletes only the specified instance-based blackbox tied signal. the floating_object_name is assumed to be a pin name. This is the default class. the tool deletes the tied values from the user class of floating nets or pins. System — A literal that specifies that the list of tied floating nets or pins are described in the netlist. V9. If you do specify the -Pin option. If you do not specify a class. • -Class User | System | Full An optional switch and literal pair that specifies the class code of the tied floating nets or pins that you specify. When you remove the effects of a tied signal. the floating_object_name is assumed to be a net name. The invocation default for tied objects is the unknown state (X). system class. If you do not specify the -Pin option. The valid literal names are as follows: User — A literal that specifies that the list of tied floating nets or pins were previously added by using the Add Tied Signals command. or full classes of floating nets or pins. The Delete Tied Signals command deletes the tied values that were previously assigned with the Add Tied Signals command. Arguments • floating_object_name A repeatable string that specifies the names of the tied floating nets or pins whose tied values you want to delete.

Examples The following example deletes the tied value from the user-class tied net “vcc”.0 June 2010 149 .Command Dictionary Delete Tied Signals • -Pin An optional switch that specifies that the floating_object_name argument that you provide is a floating pin name. V9. thereby leaving “vcc” as a floating net: add tied signals 1 vcc vdd delete tied signals vcc -class user Related Commands Add Tied Signals Delete Black Box Report Tied Signals Setup Tied Signals Tessent DFTAdvisor Reference Manual.

You can delete the write control line definitions for specific pins or for all pins. The Delete Write Controls command deletes write control line off-state definitions previously defined with the Add Write Controls command. and adds the correct off-state to that write control line: add write controls 0 w1 w2 delete write controls w1 add write controls 1 w1 set system mode dft Related Commands Add Write Controls Report Write Controls 150 Tessent DFTAdvisor Reference Manual.0 June 2010 . V9. Arguments • primary_input_pin A repeatable string that specifies a list of primary input pins from which you want to delete any write control line off-state definitions.Command Dictionary Delete Write Controls Delete Write Controls Scope: Setup mode Usage DELete WRite Controls primary_input_pin… | -All Description Removes the RAM write control line off-state definitions from the specified primary input pins. Examples The following example deletes an incorrect write control line. • -All A switch that specifies to delete the write control line off-state definitions for all primary input pins.

Rather than executing each command separately. An example of a command_file is as follows: add clocks 0 clock set system mode dft run Related Commands History Save History Set Command Editing Set Dofile Abort Tessent DFTAdvisor Reference Manual.Command Dictionary Dofile Dofile Scope: All modes Usage DOFile filename [-History] Description Executes the commands contained within the specified file. DFTAdvisor handles these lines as comments and ignores them. you can place them into a file in their desired order. You can enable the Dofile command to continue regardless of errors by setting the Set Dofile Abort command to Off. V9. By default. This command is especially useful when you must issue a series of commands. in order. If DFTAdvisor encounters an error due to any command.0 June 2010 151 . • -History An optional switch that specifies for the tool to add the commands from a dofile to the command line history list. and then execute them by using the Dofile command. The Dofile command sends each command expression. the Dofile command stops and displays an error message. You can also place comment lines in the file by starting the line with a double slash (//). but the Dofile command itself is added to the list. Examples The following example executes all the commands from the command_file file: dofile command_file The command_file may contain any application command available. The Dofile command sequentially executes the commands that are contained in a file that you specify. the commands in a dofile are not inserted into the history list. to the tool which in turn displays each command from the file before executing it. Arguments • filename A required string that specifies the name of the file that contains the commands you want DFTAdvisor to execute.

V9.0 June 2010 . The string that you want echoed to the transcript.Command Dictionary Echo Echo Scope: All modes Usage ECHo “string” [{> | >>} file_pathname] Description Issues a user-defined string to the transcript. • > file_pathname An optional redirection operator and pathname pair. Note Commands that use either the > or >> file redirection operator are first checked for correctness. used at the end of the argument list. for appending to the contents of file_pathname. The redirection operator does not hide these errors. if you use one of the file redirection operators. • >> file_pathname An optional redirection operator and pathname pair. Arguments • string A required string. Double quotes are required if the string contains spaces or special characters. The Echo command issues a user-defined string to the transcript or to a pathname. for creating or replacing the contents of file_pathname. Syntax errors are reported to the display prior to the command’s execution. 152 Tessent DFTAdvisor Reference Manual. used at the end of the argument list.

The second and following commands append to the same file.scan cells ------------" > my_scan_report report scan cells >> my_scan_report echo "----------. The first command creates or replaces the my_scan_report file. my_scan_report.scan chains ----------" >> my_scan_report report scan chains >> my_scan_report Related Commands History Report Circuit Components Report Dft Check Report DRC Rules Report Environment Report Primary Inputs Report Primary Outputs Report Scan Cells Report Scan Chains Report Scan Groups Report Scan Pins Report Sequential Instances Report Statistics Report Sub Chains Report Test Logic Report Test Points Tessent DFTAdvisor Reference Manual.Command Dictionary Echo Examples The following example redirects output from several commands into a single output file. V9. echo "----------.0 June 2010 153 .

DFTAdvisor displays a warning message.0 June 2010 . The Exit command terminates DFTAdvisor and returns to the operating system. and you can continue the session and save the netlist before exiting. If you are operating in interactive mode (not running a dofile) and you neither saved the current netlist or used the -Discard option.edif -edif exit Related Commands Write Atpg Setup Write Netlist Write Scan Identification 154 Tessent DFTAdvisor Reference Manual. If you plan to load the scan design into Tessent FastScan.Command Dictionary Exit Exit Scope: All modes Usage EXIt [-Discard] Description Terminates the current DFTAdvisor session. You should either save the current netlist design before exiting DFTAdvisor or specify the -Discard switch to not save the netlist. V9. and new netlist for the inserted scan chains: add clocks 1 clk1 add clocks 0 clk0 set system mode dft run insert test logic write atpg setup scan -replace write netlist scan. Examples The following example exits DFTAdvisor after performing scan chain insertion. and saving the test procedure. you may also want to save the ATPG setup to identify the scan chains before exiting. Arguments • -Discard An optional switch that explicitly specifies to not save the current netlist and terminate the DFTAdvisor session. dofile.

-Net An optional switch that matches only net pathnames. This is the default. Arguments • regular_expression A required. a* matches a1/b/c). A question mark matches a single character. -Hier An optional switch that matches the regular expression across hierarchy boundaries (for example. • • -Design An optional switch that matches only pathnames to objects at the topmost library cell level. This is the default. Tessent DFTAdvisor Reference Manual. • • -LIbrary An optional switch that matches objects within any level of library cells. • • -LOcal An optional switch that matches wildcard characters within the current hierarchy level.Command Dictionary Find Design Names Find Design Names Scope: All modes Usage FINd DEsign Names regular_expression [-LOcal | -Hier] [-Design | -NETList | -LIbrary | -All] [-INStance | -Net | -Pin [INPut | OUtput | INOut | ALLIn | ALLOut] -Cell | -Module] [{> | >>} file_pathname] Description Displays design object hierarchical names matched by an input regular expression. -All An optional switch that specifies matches objects at all levels of the design. which may include asterisk (*) or question mark (?) wildcard characters in the pathname string. This is the default. -NETList An optional switch that matches objects from the top of the design down to the topmost library cell. • • -INStance An optional switch that matches only instance pathnames. An asterisk matches one or more characters.0 June 2010 155 . V9. regular expression. which may include asterisk (*) or question mark (?) wildcard characters.

. intreg1_reg_31 add_20 U1_0 ... U33 mul_19 FS U5 . • > file_pathname An optional redirection operator and pathname pair. ALLOut — Match both output and bidirectional pin pathnames...0 June 2010 .... OUtput — Match only output pin pathnames. U278 U5 .. U868 FS U5 . for appending to the contents of file_pathname... for creating or replacing the contents of file_pathname.. ALLIn — Match both input and bidirectional pin pathnames. Examples The following examples display object pathnames for various input wildcard expressions. U12 mul_18 U5 . The following optional pin filters restrict which pins are matched: INPut — Match only input pin pathnames.... U1_3 add_30 U5 . U181 mul_22 U5 . U735 FS 156 Tessent DFTAdvisor Reference Manual. V9. • -Cell An optional switch that finds all library cell (model) names matching the specified regular expression. given a netlist with the following instance hierarchy: / tiny_i U5 ret_i intreg1_reg_0 .Command Dictionary Find Design Names • -Pin An optional switch that matches only pin pathnames (any pin direction). INOut — Match only bidirectional pin pathnames.. used at the end of the argument list. used at the end of the argument list. • >> file_pathname An optional redirection operator and pathname pair. • -Module An optional switch that finds all netlist module names matching the specified regular expression.

) intern(QNT_int) (instance = LSI_LSR2N UD2 (QNT_int. QNT_int).) ) Example 1: SETUP> find design names /ret_i/add_2* -instance -design -hier // Note: Matched 4 names /ret_i/add_20/U1_0 /ret_i/add_20/U1_1 /ret_i/add_20/U1_2 /ret_i/add_20/U1_3 Example 2: SETUP> find design names /ret_i/add_2* -instance -netlist -hier // Note: Matched 5 names /ret_i/add_20 /ret_i/add_20/U1_0 /ret_i/add_20/U1_1 /ret_i/add_20/U1_2 /ret_i/add_20/U1_3 Finds instance add_20 under /ret_i/. SD. and also descends the hierarchy to find all netlist instances under /ret_i/add_20/.Command Dictionary Find Design Names U15 .) intern(QT) (instance = LSI_NOTI UD3 (QT.. RD) () output(Q) (primitive = _buf UP1 (QT. R. SD. Q).0 June 2010 157 . G. R.) intern(QNT) (instance = LSI_NOTI UD4 (QNT. S. and assuming the U5 instances all reference the following library cell: model LSR2BUFA(Q. G. RD) ( input(S. SD. Example 3: SETUP> find design names /ret_i/add_2* -inst -netlist -local // Note: Matched 1 names /ret_i/add_20 This example shows that -Local doesn’t descend the hierarchy to find more matches as the previous example does. S. S. RD). SD. G. QN).. QT_int). G. R. V9. Tessent DFTAdvisor Reference Manual. R.) intern(QT_int) (instance = LSI_LSR2 UD1 (QT_int.) output(QN) (primitive = _buf UP2 (QNT. Example 4: SETUP> find design names /ret_i/add_2* -ins -design -local // Note: Matched 0 names There are no instances of a library cell under /ret_i/ with instance name starting with add_2. RD). QN.

Example 6: SETUP> find design names */U5 -inst -design -hier // Note: Matched 7 names /tiny_i/U5 /ret_i/add_20/U5 /ret_i/mul_18/U5 /ret_i/mul_18/FS/U5 /ret_i/mul_19/U5 /ret_i/mul_19/FS/U5 /ret_i/mul_22/U5 Example 7: SETUP> find design names ret_i/mul*/U5 -ins -des -local // Note: Matched 3 names /ret_i/mul_18/U5 /ret_i/mul_19/U5 /ret_i/mul_22/U5 Example 8: SETUP> find design names ret_i/mul*/U5 -ins -design -hier // Note: Matched 5 names /ret_i/mul_18/U5 /ret_i/mul_18/FS/U5 /ret_i/mul_19/U5 /ret_i/mul_19/FS/U5 /ret_i/mul_22/U5 Example 9: SETUP> find design names ret_i/mul_18/U5* -ins -library -hier // Note: Matched 5 names /ret_i/mul_18/U5 /ret_i/mul_18/U5/UD1 /ret_i/mul_18/U5/UD2 158 Tessent DFTAdvisor Reference Manual. Note /ret_i/gt_68_2 did not match because the ‘?’ in the wildcard expression requires another character after the ‘_2’. V9.Command Dictionary Find Design Names Example 5: SETUP> find design names /ret_i/*_2? -ins -netlist -local // Note: Matched 2 names /ret_i/add_20 /ret_i/mul_22 Found 2 instances under /ret_i/.0 June 2010 .

V9.Command Dictionary Find Design Names /ret_i/mul_18/U5/UD3 /ret_i/mul_18/U5/UD4 Example 10: SETUP> find design names ret_i/mul*/U5/* -pin output -design -local // Note: Matched 6 names /ret_i/mul_18/U5/Q /ret_i/mul_18/U5/QN /ret_i/mul_19/U5/Q /ret_i/mul_19/U5/QN /ret_i/mul_22/U5/Q /ret_i/mul_22/U5/QN Tessent DFTAdvisor Reference Manual.0 June 2010 159 .

Arguments • command_name An optional string that consists of any keyword or command.. the default display is a list of all the valid command names.] legal system modes: ALL 160 Tessent DFTAdvisor Reference Manual. Examples The following example displays the usage and system mode for the Report Primary Inputs command: help report primary inputs // // // Report primary inputs usage: REPort PRimary Inputs [-Class <User|System|Full>] [-All | pin_pathname. • -MANual An optional string that specifies to also display the reference manual description for the specified command. If you type HELp and include only the -MANual switch.. You can display the usage and syntax of a command by typing Help and the command name. You can use minimum typing for the command name. You can display a list of certain groups of commands by entering Help and a keyword such as Add. V9. Delete.0 June 2010 . from the GUI. the tool opens the product bookcase.Command Dictionary Help Help Scope: All modes Usage HELp [command_name] [-MANual] Description Displays the usage syntax and system mode for the specified command. Help > On Commands > Open Reference Page. Save. and so on. If you do not supply a command_name. The effect is the same as if you executed the menu item. giving access to all the manuals for that product group. The Help command displays useful information for a selected command.

Refer to the ksh(1) man page for specifics on the various editing modes. V9. Tessent DFTAdvisor Reference Manual. The Save History command controls where the tool stores the history file. including all arguments associated with each command. you can override the ksh environment variable settings by issuing the Set Command Editing command. Note The HISTFILE and HISTSIZE ksh environment variables do not control the command history of the tool. gmacs. or vi editing.Command Dictionary History History Scope: All modes Usage HIStory [list_count] [-Nonumbers] [-Reverse] [{> | >>} file_pathname] Description Displays a list of previously-executed commands. Arguments • list_count An optional integer that specifies for the tool to display only the specified number (list_count) of the most recently executed commands. This is useful for creating dofiles. By default. • -Nonumbers An optional string that specifies for the tool to display the history list without the leading numbers. this command displays a list of all previously-executed commands. starting with the oldest. used at the end of the argument list. Within the tool. The default displays the leading numbers. the tool displays all previously-executed commands.0 June 2010 161 . • -Reverse An optional switch that specifies for the tool to display the history list starting with the most recent command rather than the oldest. The History command is similar to the Korn shell (ksh) history command in UNIX. Each command line in the history list is preceded by a leading number indicating the order in which the commands were entered. You can perform command line editing if you set the VISUAL or EDITOR ksh environment variable to either emacs. • > file_pathname An optional redirection operator and pathname pair. for creating or replacing the contents of file_pathname. If no list_count is specified.

starting with the oldest command. Examples The following command displays the history list with leading numbers. for appending to the contents of file_pathname.Command Dictionary History • >> file_pathname An optional redirection operator and pathname pair.0 June 2010 . history 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 help hist dof instructor/fault. used at the end of the argument list. V9.do set system mode atpg set fault type stuck add faults -all run report statistics report faults -class ATPG_UNTESTABLE analyze fault /I$20/en -stuck_at 1 set system mode setup set system mode atpg set fault type iddq add faults -all run report statistics history Related Commands Echo Save History Set Command Editing 162 Tessent DFTAdvisor Reference Manual.

DFTAdvisor can also perform two other tasks with the Insert Test Logic command that can increase the design’s testability. For more information on scan replacement. In addition to scan cell replacement and stitching. you must have defined a buffer model with the Add Cell Models command or with a cell_type attribute.0 June 2010 163 . Hierarchical partitioning is recommended over flat partitioning unless the circuit has previously inserted chains and/or test points. This is called flat partitioning and it may cause different instances of a sub-module to have a different number of scan chains. For information on handling pre-inserted scan cells. There are several ways that it can aid in increasing a design’s fault coverage. the “uniquification” of module definitions that originate from flat scan cell partitioning. Usage INSert TEst Logic [filename [-Fixed]] [-Scan {ON | OFf}] [-Test_point {ON | OFf}] [-Ram {ON | OFf}] {[-NOlimit] | [-MAx_length integer] | [-NUmber [integer]]} [-Clock {Nomerge | Merge}] [-Edge {Nomerge | Merge}] [-COnnect {ON | OFf | Tied | Loop | Buffer}] [-Output {Share | New}] [-MOdule {Norename | Rename}] [-Verilog] [-Hierarchical {OFf | ON [-Tolerance integer_percent]}] [-NEw_scan_po] [-Keep_original_net] Description Inserts the test structures that you define into the netlist to increase the design’s testability. turn on the -Hierarchical switch. when the final scan-inserted netlist is written out. and test logic. To use the -Verilog switch. V9. The primary purpose of DFTAdvisor is to identify sequential cells that DFTAdvisor can replace with corresponding scan cells and then stitch together into a scan chain. As a result. refer to “Automatically Choosing Control and Observe Points” in the Scan and ATPG Process Guide. refer to “Specifying Existing Scan Cells” in the Scan and ATPG Process Guide. For information on test point insertion. The purpose of DFTAdvisor is to perform tasks that modify the design to increase the fault coverage (testability) of the design. To decrease.Command Dictionary Insert Test Logic Insert Test Logic Scope: Dft mode Prerequisites: The Write Scan Identification command must be issued before this command is used or files generated by this command will be empty. These previously Tessent DFTAdvisor Reference Manual. DFTAdvisor supports the adding of test points (both system-defined and user-defined). or prevent. The default behavior of DFTAdvisor is to partition the scan cells over the scan chains without considering the hierarchical distribution of the sub-modules in the circuit. test points. Hierarchical partitioning is not deployed when the “filename [-Fixed]” option is used. DFTAdvisor generates unique module definitions for the different instances of the same sub-module. and it supports the automatic adding of test logic. refer to the Scan and ATPG Process Guide.

but within a hierarchical block the scan cell ordering is random. Specifying an integer percentage of tolerance allows DFTAdvisor to create chain lengths shorter or longer than their ideal length (total number of cells divided by the specified number of chains). use the -Tolerance switch. For more information. and. Arguments • filename -Fixed An optional string and associated optional switch that specify the name of the ASCII file that lists the scan instances that you want DFTAdvisor to stitch together. thus. A specified high tolerance can cause the removal or the unwanted lengthening of the last chain.Command Dictionary Insert Test Logic inserted elements can have an arbitrary distribution in the circuit and can therefore cause uniquification of modules. For instance. This file can contain information regarding scan cell ordering along with which instances are to be in each scan chain. which can reduce the number of chains per sub-module. it must contain all instances you want stitched. depending on your design. Note If you use this file. refer to “Naming Scan Input and Output Ports” in the Scan and ATPG Process Guide. which could be an issue for your design. If this is the case. 164 Tessent DFTAdvisor Reference Manual. V9. Hierarchical partitioning can cause an increased number of scan inputs and outputs for the submodules.0 June 2010 . To see the before and after effect of the -Tolerance option. the interconnections between sub-modules. The -Fixed switch specifies for DFTAdvisor to stitch the scan instances in the fixed order that is given in the filename. The default scan cell ordering is based on hierarchical rules. DFTAdvisor stitches all non-scan cells that it has identified and mapped to scan cells into a scan chain using the settings of the other Insert Test Logic arguments. use the Report Scan Chains command. The differences from the ideal length for each chain accumulate at the last chain during the insertion process. it also ignores certain scan input/output mapping performed by the Add Scan Pins command. When using the -Fixed option. flat partitioning places cells that have direct access to primary outputs at the end of the chains. The filename that you specify must list one instance per line and use the following format (all on one line): instance_pathname cell_id chain_id [&sub_chain_name] [{+|-}[lockup_latch_model]] instance_pathname — A string that specifies the name of the non-scan cell that you want DFTAdvisor to put in the scan chain. There could be reasons to use flat partitioning. This can reduce the number of scan output pins that DFTAdvisor creates. One possible result of using a tolerance other than 0 is a variation of the number of scan chains at the top level. If you do not specify a filename.

DFTAdvisor places the instance having the smallest cell_id closest to the scan chain output. If no lockup cells are defined in this file. OFf — A literal that disables DFTAdvisor from replacing the identified non-scan cells (scan candidates) with the corresponding scan cells. . the first model in the defined latch model list is used. No space is allowed between the ampersand (&) and the sub_chain_name argument. you must specify every location that you want to insert lockup cells. No space is allowed between the +|. lockup_latch_model — Specifies the name of the lockup cell model to use. V9. All instances in the same chain must have unique cell_ids. Note that if you define a lockup cell in this file.— Specifies to use the clock used by the instance_pathname. You need to specify the subchain name when more than one subchain is defined for a sub-module or a hierarchical instance. The next lower cell_id. + — Specifies to use the clock used by the instance_pathname with the next lower cell_id. refers to the a non-scan cell which will be connected to the scan out of the current instance_pathname. In such case. If the lockup_latch_model is not specified. The valid literals are as follows: ON — A literal that enables DFTAdvisor to replace the identified non-scan cells (scan candidates) with the corresponding scan cells. • -Scan ON | OFf An optional switch and literal pair that specifies whether DFTAdvisor replaces the identified non-scan cells (scan candidates) with the corresponding scan cells. if you want DFTAdvisor to automatically insert lockup cells in necessary locations. Tessent DFTAdvisor Reference Manual. This is the default.Command Dictionary Insert Test Logic cell_id — An integer that specifies the placement of the instance_pathname in relation to other instance_pathnames. The specified lockup cell must be defined by the Add Cell Models command or defined in the ATPG library using the cell_type attribute. DFTAdvisor places instances with the same chain_id in the same chain.argument specifies that a lockup cell is to be added to the scan out of the current instance_pathname. you should use the “-Clock/-Edge merge” option(s) with the Insert Test Logic command. The +|. For more information on inserting lockup cells. chain_id — An integer that specifies the scan chain in which you want DFTAdvisor to place the instance_pathname. refer to the Set Lockup Cell command and “Merging Scan Chains with Different Shift Clocks” in the Scan and ATPG Process Guide. {+|-}[lockup_latch_model] — An optional special character and an additional optional string that specifies the location of the lockup cell. &sub_chain_name — An optional special character and string that specifies the name of the sub-scan chain you defined with the Add Sub Chains command. DFTAdvisor uses the settings in the Set Lockup Cell and Insert Test Logic commands.0 June 2010 165 .and the lockup_latch_model name.

Merge — A literal that enables the use of different clocks on the same scan chain. • -MAx_length integer An optional switch and integer pair that specifies the maximum number of scan cells that DFTAdvisor can stitch into a scan chain. Final results depend upon the number of scan candidates. • -CLock Nomerge | Merge An optional switch and literal pair that specifies whether DFTAdvisor uses different clocks on the same scan chain. This is the default. This is the default. The valid literals are as follows: ON — A literal that enables DFTAdvisor to add the identified test logic and test points into the design. 166 Tessent DFTAdvisor Reference Manual. The valid literals are as follows: ON — A literal that enables DFTAdvisor to add the identified test logic gates for RAM write control line access. This is the default.0 June 2010 . • -NUmber integer An optional switch and integer pair that specifies the exact number of scan chains that you want DFTAdvisor to insert. Final results depend upon the number of scan candidates. DFTAdvisor evenly divides the scan cells into scan chains that are smaller than the max_length integer. • -Edge Nomerge | Merge An optional switch and literal pair that specifies whether DFTAdvisor merges stable high chains into stable low chains. This is the default. OFf — A literal that disables DFTAdvisor from adding the identified test logic and test points into the design. OFf — A literal that disables DFTAdvisor from adding the identified test logic gates for RAM write control line access. • -NOlimit An optional switch specifying that the scan chain has no limit on the number of scan cells it contains. V9. The two valid literals are as follows: Nomerge — A literal that disables the use of different clocks on the same scan chain. The two valid literals are as follows: Nomerge — A literal that specifies to not merge stable high chains into stable low chains.Command Dictionary Insert Test Logic • -Test_point ON | OFf An optional switch and literal pair that specifies whether DFTAdvisor adds the identified test logic and test points into the design. • -Ram ON | OFf An optional switch and literal pair that specifies whether DFTAdvisor adds the identified test logic gates that are necessary to allow the ATPG tools access to the write control lines of the RAMs. This is the default. The default number of chains is 1.

• -Output Share | New An optional switch and literal pair that specifies how DFTAdvisor creates scan out ports on modules. New — A literal specifying that DFTAdvisor should always create a new output port for scan out. Loop — A literal that specifies for DFTAdvisor to replace the identified non-scan cells with their corresponding scan replacements. This is the default. Tied — A literal that specifies for DFTAdvisor to replace the identified non-scan cells with their corresponding scan replacements. This option has DFTAdvisor connect the scan_out pin to its own scan_in pin as a self-loop with a buffer in between.0 June 2010 167 . and that the original module is no longer used in the design. V9. This is the default. instead of the -Output switch. • -COnnect ON | OFf | Tied | Loop | Buffer An optional switch and literal pair that specifies whether DFTAdvisor stitches the scan cells together into a scan chain. Note If you want DFTAdvisor to only create new scan output ports on the top-level module. OFf — A literal that specifies for DFTAdvisor to replace the identified non-scan cells with their corresponding scan replacements. if it uses only one type of module modification. This option has DFTAdvisor connect the scan_out pin to its own scan_in pin as a self-loop. but not stitch those scan cells together into scan chains. The valid literals are as follows: Share — A literal specifying that DFTAdvisor may use an existing module output port on modules for scan out. but not stitch those scan cells together into scan chains. but not stitch those scan cells together into scan chains. The valid literals for stitching the scan chain are as follows: ON — A literal that specifies for DFTAdvisor to replace the identified non-scan cells with their corresponding scan replacements and to stitch those scan cells together into a scan chain. if that port is directly connected to the scan out of a scan cell. This option has DFTAdvisor tie the input/output scan pins to ground. The valid literals are as follows: Norename — A literal specifying that DFTAdvisor should use the original module name. Tessent DFTAdvisor Reference Manual.Command Dictionary Insert Test Logic Merge — A literal that specifies to merge stable high chains into stable low chains. but not stitch those scan cells together into scan chains. use the -NEw_scan_po switch. This is the default. • -MOdule Norename | Rename An optional switch and literal pair that specifies how to name the modified module. Buffer — A literal that specifies for DFTAdvisor to replace the identified non-scan cells with their corresponding scan replacements.

so that the instances share the same scan-inserted module definition when the tool generates the scan-inserted netlist. Before using this command and switch. which causes DFTAdvisor to create chains with the ideal length. ON — A literal that specifies for DFTAdvisor to perform hierarchical scan chain segmentation. with an associated optional switch and integer pair. • -Hierarchical {OFf | ON [-Tolerance integer_percent]} An optional switch and literal pair. However. Having the same scan segments on the identical submodule instances allows them to share the same scan-inserted module definition in the scaninserted netlist which may yield a reduced netlist size. However. The valid arguments are as follows: OFf — A literal that specifies to not consider hierarchical scan chain segmentation. Without this switch. if that pin also fans out as the module’s functional output. integer_percent — An integer percentage. DFTAdvisor considers the entire design hierarchy when performing the segmentation and therefore this functionality can be referred to as hierarchical scan chain segmentation. The default value is 0. This is the invocation default. The -Tolerance switch and integer pair can optionally be specified with this option. V9. A non-zero percentage allows DFTAdvisor to vary the chain lengths (shorter or longer).Command Dictionary Insert Test Logic Rename — A literal specifying that DFTAdvisor should always rename a module if it modifies the module. 168 Tessent DFTAdvisor Reference Manual. The tool tries to insert the same scan chain segments into identical submodule instances in the design. that specify whether DFTAdvisor tries to insert the same scan chain segments into the identical sub-module instances in the design. some layout tools do not support the Verilog assign statement. thus the -Verilog switch is required so that DFTAdvisor will use a buffer instantiation and avoid using the assign statement. DFTAdvisor uses the Verilog ‘assign’ statement to generate this scan output signal from the functional output.0 June 2010 . This switch is optionally used when -Hierarchical is set to ON. -Tolerance integer_percent — A switch and integer pair that specifies the percentage deviation that DFTAdvisor can vary from the ideal chain length when creating the scan chains. An allowable percentage variation from the ideal chain length (tolerance) helps in reaching this goal. this may also result in fewer than specified number of scan chains. you must have defined a buffer model with the Add Cell Models command or with a cell_type attribute. which helps in segmenting scan chains for the identical sub-modules in the design. • -Verilog An optional switch that specifies to DFTAdvisor that the final output netlist format will be Verilog. so that DFTAdvisor knows to insert a buffer instance for any scan output pin in any module in the design hierarchy.

V9. as it performs new scan output port creation only on the top-level module.Command Dictionary Insert Test Logic • -NEw_scan_po An optional switch that specifies for DFTAdvisor to create new scan primary output pins even though existing functional outputs are available to use as scan outputs. instead of all modules.0 June 2010 169 . and then uses the Insert Test Logic command to stitch them together into scan chains with a maximum length of 10 scan cells each: add clocks 0 clock set system mode dft setup scan identification sequential atpg -percent 50 run insert test logic -scan on -max_length 10 The following example causes the insertion of three scan chains using hierarchical partitioning with a 5 percent tolerance: insert test logic -clock merge -edge merge -number 3 -hierarchical on -tolerance 5 Related Commands Add Scan Instances Add Scan Pins Add Test Points Report Scan Chains Set Test Logic Setup Scan Identification Setup Scan Insertion Setup Test_point Identification Setup Test_point Insertion Tessent DFTAdvisor Reference Manual. • -Keep_original_net An optional switch that specifies for DFTAdvisor to insert a buffer in the scan path. when the scan cell output has no connection to top-level but has a functional connection to other logic. DFTAdvisor renames the original net same as the primary output pin that it creates as scan output port. When this switch is not specified. Examples The following example identifies 50 percent of the scannable sequential instances during the Run command. The switch is a special case of the -Output switch used with “New” literal. The buffer insertion is done to prevent renaming the original net that the scan cell is connected to the other logic with. between the last scan cell at the top-level and the top-level scan output pin.

and report on a variable’s value. For information on how to define. V9. Examples The following example prints out the values of the UNIX variables in the environment: printenv Related Commands Report Variables 170 Tessent DFTAdvisor Reference Manual. see the Report Variables command.0 June 2010 . reference. The DFTAdvisor Printenv command allows the UNIX printenv command to be available as a common DFT command. UNIX environment variables are automatically available as variable references within DFTAdvisor.Command Dictionary Printenv Printenv Scope: All modes Usage PRIntenv Description Prints out the values of the UNIX variables in the environment. for convenience in displaying UNIX environment variables.

Examples The following example reads the test procedure file specified: read procfile my_file.Command Dictionary Read Procfile Read Procfile Scope: All modes except Setup mode Usage REAd PRocfile proc_filename Description Reads the specified test procedure file. V9. The tool merges the new procedure and timing data contained in the file with the existing data loaded from previously-read test procedure files. Arguments • proc_filename A required path and filename of the test procedure file to read.proc Related Commands Add Scan Groups Report Procedure Report Timeplate Write Atpg Setup Write Procfile Tessent DFTAdvisor Reference Manual. Information loaded with this command is used by the Write Atpg Setup command.0 June 2010 171 . The Read Procfile command specifies for the tool to read the test procedure file.

• -All A switch that specifies for the tool to display information on all defined blackboxes and undefined models. or undefined models that are not yet blackboxed. The Report Black Box command reports on the status of any instance. • -Module [module_name] A switch and optional string that specify for the tool to display information on modulebased blackboxes. X. the name of the pin. module-based blackbox. If you specify an instance pathname. the report replaces the string MODULE with INSTANCE to explicitly declare that it is an instance-based blackbox. SYSTEM declares that the pin is tied to the default value by the system. This is the default. the tool displays either SYSTEM or USER followed by the direction type of the pin (Inout or Output).0 June 2010 . DFTAdvisor displays information on all module-based blackboxes. The report follows the following format. the tool displays the string MODULE followed by the name of the module and the default tie value (0. For instance-based blackboxes. instance-based blackbox.or module-based blackboxes. DFTAdvisor displays information on all instance-based blackboxes. V9. For each pin. it reports on that single. If you do not supply a module_name. 1. 172 Tessent DFTAdvisor Reference Manual. If you do not supply an ins_name. or Z).Command Dictionary Report Black Box Report Black Box Scope: All modes Usage REPort BLack Box -Instance [ins_pathname] | -Module [module_name] | -All | -Undefined [{> | >>} file_pathname] Description Displays information on blackboxes and undefined models. while USER declares that you explicitly tied the pin to the specified value. The tool then displays a list of module pins. and its tied value. MODULE: module_name (default tie value = 0|1|X|Z) SYSTEM: Inout|Output pin pin_name tied to 0|1|X|Z USER: Inout|Output pin pin_name tied to 0|1|X|Z INSTANCE: ins_name (default tie value = 0|1|X|Z) SYSTEM: Inout|Output pin pin_name tied to 0|1|X|Z USER: Inout|Output pin pin_name tied to 0|1|X|Z For module-based blackboxes. If you specify a module_name. Arguments • -Instance [ins_name] A switch and optional string that specify for the tool to display information on instancebased blackboxes. it reports on that single.

Use this switch to determine whether your design is complete.Command Dictionary Report Black Box • -Undefined A switch that specifies for the tool to display information on undefined models which have not yet been blackboxed. or is missing library models. for appending to the contents of file_pathname. used at the end of the argument list. V9.0 June 2010 173 . • > file_pathname An optional redirection operator and pathname pair. then reports on them. for creating or replacing the contents of file_pathname.and instance-based blackboxes. • >> file_pathname An optional redirection operator and pathname pair. Examples The following example defines module. this report allows you to verify that only the intended models are undefined. If you intend to blackbox undefined models. add black box -module core -pin do1 0 -pin io1 1 add black box -instance core1 1 -pin do0 0 -pin io0 0 report black box -all MODULE: core (default tie value = X) SYSTEM: Output pin do0 tied to X USER: Output pin do1 tied to 0 SYSTEM: Inout pin io0 tied to X USER: Inout pin io1 tied to 1 INSTANCE: core1 (default tie value = 1) USER: Output pin do0 tied to 0 SYSTEM: Output pin do1 tied to 1 USER: Inout pin io0 tied to 0 SYSTEM: Inout pin io1 tied to 1 Related Commands Add Black Box Delete Black Box Report Tied Signals Tessent DFTAdvisor Reference Manual. used at the end of the argument list.

Examples The following example changes the fanout limit with the Add Buffer Insertion command. then reports the new setting.Command Dictionary Report Buffer Insertion Report Buffer Insertion Scope: All modes Usage REPort BUffer Insertion Description Displays a list of all the different scan test pins and the corresponding fanout limit. all the remaining settings are left at the default (infinity): add buffer insertion 7 sen -model buf1a report buffer insertion scan_enable scan_clock test_enable test_clock scan_master_clock scan_slave_clock hold_enable 7 buf1a <infinity> <infinity> <infinity> <infinity> <infinity> <infinity> Related Commands Add Buffer Insertion Delete Buffer Insertion 174 Tessent DFTAdvisor Reference Manual. V9. The Report Buffer Insertion command shows either the default setting (infinity) for each type of scan test pin or the new limit you set with the Add Buffer Insertion command.0 June 2010 .

Mux — A literal that specifies a 2-1 multiplexer. DLat — A literal that specifies a D latch with two input pins (enable and data). and scan enable). data. The Report Cell Models command displays the cell models that you either added with the Add Cell Models command. • -Type cell_model_type An optional switch and literal pair that specifies to display a listing of all the cell models of a particular type. master clock. data. and slave clock). scan clock. or described in the DFT library with the cell_type attribute. and scan enable). scan in. Buf — A literal that specifies a one-input buffer gate. OUtbuf — A literal that specifies a primary output buffer gate that DFTAdvisor inserted whenever the tool added new output pins (such as the scan output pin). INBuf — A literal that specifies a primary input buffer gate that DFTAdvisor inserted whenever the tool added new input pins (such as the scan input or scan enable pins). NOr — A literal that specifies a two-input NOR gate. data. Arguments • -All An optional switch that specifies to display all cell model definitions that you added with the Add Cell Models command. scan in. This is the default. clocked scan cell with four inputs (clock.0 June 2010 175 . And — A literal that specifies a two-input AND gate. Tessent DFTAdvisor Reference Manual. OR — A literal that specifies a two-input OR gate. NAnd — A literal that specifies a two-input NAND gate. Xor — A literal that specifies an exclusive OR gate. or LSSD scan cell with five inputs (clock. The valid cell_model_types are as follows (with the minimum typing characters shown in uppercase): INV — A literal that specifies a one-input inverter gate.Command Dictionary Report Cell Models Report Cell Models Scope: All modes Usage REPort CEll Models [-All | {-Type cell_model_type}] Description Displays a list of either all cell models or the DFT library models associated with the specified cell type. Scancell — A literal that specifies a cell with four input pins (clock. DFf — A literal that specifies a D flip-flop with two input pins (clock and data). V9.

V9.0 June 2010 .Command Dictionary Report Cell Models Examples The following example displays a list of all added cell models: add clocks 0 clk set test Logic -set on -re on -clock on set system mode dft report dft check add cell models and2 -type and add cell models or2 -type or add cell models mux21h -type mux s a b add cell models nor2 -type nor report cell models insert test logic Related Commands Add Cell Models Delete Cell Models Set Test Logic 176 Tessent DFTAdvisor Reference Manual.

the command prints out the module names and the number of instantiations of each module. module names. it does not report on library components. Note Report Circuit Components reports only on components in the circuit. -Level — An optional switch and integer pair that specifies to filter the printing based on the hierarchy level specified by integer. Tessent DFTAdvisor Reference Manual. the top level.0 June 2010 177 . that is. When you use the -Modules switch. listing their names and the number of instantiations of each module in the design. This is the invocation default. -Indent is the default. This switch works only with the -Instances switch. and the level of hierarchy at which they exist. integer — An optional integer that specifies the hierarchy level at which you want the report to start. This switch works only with the -Instances switch. levels that are at or lower in the hierarchy than integer.Command Dictionary Report Circuit Components Report Circuit Components Scope: All modes Usage REPort CIrcuit Components {[-INStances] {[-INDent | -Noindent] [-Level integer]}} | [-Modules] [{> | >>} file_pathname] Description Displays information about the components of the circuit as either modules or instances. Note that the tool prints the string -top. the command prints out instance names. The default value for integer is 0. • -Modules An optional switch that specifies to report on the modules.as the name for the top-level instance. The default formatting is Indent. When you use the -Instances switch. -INDent — An optional switch that specifies to print the report using code-like indention. This switch works only with the -Instances switch. based on the design hierarchy. -Noindent — An optional switch that specifies to print the report without using indention. Arguments • -INStances [-INDent | -Noindent] [-Level integer] An optional switch with an optional switch and an optional switch and integer pair that specify to report on the module instances in the design. The report will show all instances whose level number is greater than integer. V9.

in indented format. Example 1 The following example displays a circuit component report. for creating or replacing the contents of file_pathname. V9.0 June 2010 . used at the end of the argument list. • >> file_pathname An optional redirection operator and pathname pair.(m8051) [0] u10 (m3s018bo) [1] u11 (m3s019bo) [1] u5 (m3s006bo) [1] u4 (m3s005bo) [1] u3 (m3s004bo) [1] u14 (m3s025bo) [1] u13 (m3s023bo) [1] u9 (m3s015bo) [1] u4 (m3s016bo) [2] u3 (m3s016bo) [2] u2 (m3s016bo) [2] u1 (m3s016bo) [2] u12 (m3s020bo) [1] u1 (m3s014bo) [2] u7 (m3s008bo) [1] u2 (m3s039bo) [2] u1 (m3s009bo) [2] u6 (m3s007bo) [1] u2 (m3s003bo) [1] u15 (m3s028bo) [1] u8 (m3s010bo) [1] select_program_source_gt_301 (m3s010bo_DW01_cmp2_8_0) u2 (m3s013bo) [2] u1 (m3s011bo) [2] u1 (m3s001bo) [1] [2] 178 Tessent DFTAdvisor Reference Manual. for appending to the contents of file_pathname.Command Dictionary Report Circuit Components • > file_pathname An optional redirection operator and pathname pair. of instances at and below level 0 in the hierarchy: report circuit components -----------------------------------------------------------Output Format: InstanceName (ModuleName) [HierarchyLevel] ------------------------------------------------------------top. used at the end of the argument list.

in non-indented format.0 June 2010 179 . of instances at and below level 1 in the hierarchy: report circuit components -instance -noindent -level 1 -----------------------------------------------------------Output Format: InstanceName (ModuleName) [HierarchyLevel] -----------------------------------------------------------u10 (m3s018bo) [1] u11 (m3s019bo) [1] u5 (m3s006bo) [1] u4 (m3s005bo) [1] u3 (m3s004bo) [1] u14 (m3s025bo) [1] u13 (m3s023bo) [1] u9 (m3s015bo) [1] u4 (m3s016bo) [2] u3 (m3s016bo) [2] u2 (m3s016bo) [2] u1 (m3s016bo) [2] u12 (m3s020bo) [1] u1 (m3s014bo) [2] u7 (m3s008bo) [1] u2 (m3s039bo) [2] u1 (m3s009bo) [2] u6 (m3s007bo) [1] u2 (m3s003bo) [1] u15 (m3s028bo) [1] u8 (m3s010bo) [1] select_program_source_gt_301 (m3s010bo_DW01_cmp2_8_0) [2] u2 (m3s013bo) [2] u1 (m3s011bo) [2] u1 (m3s001bo) [1] Tessent DFTAdvisor Reference Manual.Command Dictionary Report Circuit Components Example 2 The following example displays a circuit component report. V9.

and the number of instantiations of each: report circuit components -module ---------------------------------------------------Output Format: ModuleName [NumberOfinstantiations] ---------------------------------------------------m8051 [0] m3s028bo [1] m3s025bo [1] m3s023bo [1] m3s020bo [1] m3s014bo [1] m3s019bo [1] m3s018bo [1] m3s015bo [1] m3s016bo [4] m3s010bo [1] m3s010bo_DW01_cmp2_8_0 [1] m3s013bo [1] m3s011bo [1] m3s008bo [1] m3s039bo [1] m3s009bo [1] m3s007bo [1] m3s006bo [1] m3s005bo [1] m3s004bo [1] m3s003bo [1] m3s001bo [1] Related Commands Echo 180 Tessent DFTAdvisor Reference Manual. V9.0 June 2010 .Command Dictionary Related Commands Example 3 The following example displays a circuit component report of the design’s modules.

• > file_pathname An optional redirection operator and pathname pair. V9. • -INstance pathname An optional switch and a repeatable string that specify the pathname(s) of the clock gating cell instances to be reported for unconnected ports to be connected to either the scan enable signal or the specified signals. for creating or replacing the contents of file_pathname. reports the unconnected ports of the specified clock gating cells only. Arguments • -LIbrary_model library_model_name An optional switch and a repeatable string that specify the library model name(s) of the clock gating cell instances to be reported for unconnected ports to be connected to either the scan enable signal or the specified signals.0 June 2010 181 . used at the end of the argument list. used at the end of the argument list. Tessent DFTAdvisor Reference Manual. • >> file_pathname An optional redirection operator and pathname pair.Command Dictionary Report Clock Gating Report Clock Gating Scope: Setup mode Usage REPort CLock Gating [-LIbrary_model library_model_name…] [-Module netlist_module_name…] [-INStance pathname…] [{> | >>} file_pathname] Description Reports the clock gating instances that were identified as having unconnected ports and were connected to either the scan enable signal or to a user-specified signal or. for appending to the contents of file_pathname. • -Module netlist_module_name An optional switch and a repeatable string that specify the netlist module name(s) of the clock gating cell instances to be reported for unconnected ports to be connected to the specified signals.

The first instance is connected to the sen1 pin. V9.. ------------------------------------------------------------------------Clock Gating Unconnected Signal Instance Port Driver ------------------------------------------------------------------------clkg1/clkg1/clkgLA SE sen1 clkg2/clkg1/clkgLA SE sen clkg3/clkg1/clkgLA SE sen ------------------------------------------------------------------------.. The results of these commands are shown by the Report Clock Gating command output: set scan enable sen setup clock gating -instance clkg1/clkg1/clkgLA -driver sen1 -active low setup clock gating -instance clkg3/clkg1/clkgLA clkg2/clkg1/clkgLA set system mode dft // Note: The following clock gating instances have unconnected ports that will be connected to a scan enable signal.Command Dictionary Report Clock Gating Examples The following example connects the unconnected scan enable ports of specified clock gating instances. sen.0 June 2010 ... The next two instances are connected to the default scan enable signal.. insert test logic report clock gating -instance clkg1/clkg1/clkgLA clkg2/clkg1/clkgLA clkg3/clkg1/clkgLA ------------------------------------------------------------------------Clock Gating Unconnected Signal Instance Port Driver ------------------------------------------------------------------------clkg1/clkg1/clkgLA SE sen1 clkg2/clkg1/clkgLA SE sen clkg3/clkg1/clkgLA SE sen ------------------------------------------------------------------------- Related Topics Setup Clock Gating 182 Tessent DFTAdvisor Reference Manual. which drives the signal with the active state set to low..

0 June 2010 183 . add clock groups group1 clk1 clr1 pre1 add clock groups group2 clk2 clr2 pre2 report clock groups group2: clk2 clr2 pre2 group1: clk1 clr1 pre1 all_clocks: clk3 Related Commands Add Clock Groups Delete Clock Groups Tessent DFTAdvisor Reference Manual. Examples The following example displays a list of clock groups after they have been added to the clock list: add clocks 1 clk1 clk2 clk3 add clocks 0 clr1 clr2 pre1 pre2 set system mode dft .Command Dictionary Report Clock Groups Report Clock Groups Scope: Dft mode Usage REPort CLock Groups Description Displays a list of all clock group definitions. The Report Clock Groups command displays a list of all clock groups added with the Add Clock Groups command. . V9.

Command Dictionary Report Clocks Report Clocks Scope: All modes Usage REPort CLocks [-Display {DEBug | DESign | DAta | ALl}] Description Displays a list of all clock definitions. V9. The Report Clocks command displays a list of all clocks added with the Add Clocks command. off_state 0 Related Commands Add Clocks Delete Clocks 184 Tessent DFTAdvisor Reference Manual. The choices are as follows: DEBug — Debug window DESign — Design window DAta — Data window ALl— A literal that displays the information in all of the preceding windows.0 June 2010 . See “Using Tessent DFTVisualizer” for more information. off_state 1 clk0. Arguments • -Display {DEBug | DESign | DAta | ALl} A switch and literal that displays the reported information graphically in the specified DFTVisualizer window(s). Examples The following example displays a list of clocks after they have been added to the clock list: add clocks 1 clk1 add clocks 0 clk0 report clocks clk1.

-Reset An optional switch that reports on all reset control signals. -Tristate_enable An optional switch that reports on all tristate enable signals.Command Dictionary Report Control Signals Report Control Signals Scope: Dft mode Usage REPort COntrol Signals {[-All] | {[pin_pathname…] [-Clock] [-Set] [-Reset] [-Write] [-Read] [-Tristate_enable]} [-Verbose] [-NOSTABLE_High] [-NOSTABLE_Low] Description The Report Control Signals command displays the rules checking results for control signals consisting of clocks added with the Add Clocks command and pins identified for gating scannable memory elements with test logic. pin_pathname An optional. repeatable string that specifies the pathnames of control signals to report on. -Write An optional switch that reports on all write control signals. -NOSTABLE_Low An optional switch that disables the report on any stable-low memory elements. -Verbose An optional switch that includes all memory elements associated with each control signal in the report. -Read An optional switch that reports on all read control signals. V9. • • -NOSTABLE_High An optional switch that disables the report on any stable-high memory elements.0 June 2010 185 . Default setting. Tessent DFTAdvisor Reference Manual. Arguments • • • • • • • • • -All An optional switch that outputs all control signals to the report. -Clock An optional switch that outputs clock control signals in the report. -Set An optional switch that reports on all set control signals.

Command Dictionary Report Control Signals Related Commands Add Clocks Delete Clocks Report Dft Check 186 Tessent DFTAdvisor Reference Manual.0 June 2010 . V9.

The displayed or written report includes six columns of information as described here: • • The first column displays whether the DFT Rules Checker identified the non-scan instance as scannable or non-scannable. • instance_pathname An optional string that specifies to report scannability information for the specified instance. This is the default. identified by the scan identification process. or within a specific hierarchical instance.0 June 2010 187 . The fourth column displays the instance name of the non-scan instance. • • • • An example of the output of this command. The fifth column displays the library model name associated with the instance.Command Dictionary Report Dft Check Report Dft Check Scope: Dft mode Usage REPort DFt Check [-All | instance_pathname] [-FUll | -Scannable | -Nonscannable | {-Defined {Scan | Nonscan} | -Identified | -Unidentified | {-RUle {S1 | S2 | S3 | S4}} | -Tristate | -RAm] [{> | >>} file_pathname] Description The Report Dft Check command generates scannability check information for all non-scan instances in the design. or defined as non-scannable or scannable with the Add Nonscan Instances and Add Scan Instances commands. is covered in “Reporting Scannability Information” in the Scan and ATPG Process Guide. The sixth column displays “Stable-high” if the clock inputs of the non-scan instances are at a one-state. The second column displays whether the non-scan instance is unidentified. with respect to the clock primary inputs. The gate index number of the non-scannable instance is also shown. DFTAdvisor generates scannability information for all instances within that hierarchical block. or displays “Test-Logic” to specify that test logic will be added to make the instance scannable. If the non-scan instance is identified as non-scannable. the third column displays the design rule ID number. V9. If the instance pathname specifies a hierarchical instance. The third column displays the clock that is associated with the non-scan instance. along with additional information. If the instance Tessent DFTAdvisor Reference Manual. Arguments • -All An optional switch that specifies to display all non-scan instances for the entire design. as well as the set. where the non-scan instance failed the clock rules. reset or clock primary inputs to the memory element that failed the rules checking. respectively.

• -Nonscannable An optional switch that specifies to display the non-scan instances that DFTAdvisor has identified during the rules checking process to be non-scannable. • -RAm An optional switch that displays the RAM gates identified to be controllable through test logic insertion. For more information on S1. • -Defined Scan | Nonscan An optional switch and literal pair that specifies whether to display user-defined scan or non-scan instances. • > file_pathname An optional redirection operator and pathname pair. Nonscan — A literal that specifies to display non-scan instances defined with the Add Nonscan Instances command. • -Tristate An optional switch that displays the enable lines of tri-state gates connected to the outputs of memory elements.0 June 2010 . and S4 rule violations. -Unidentified An optional switch that displays unidentified non-scan instances. • -Scannable An optional switch that specifies to display the non-scan instances that DFTAdvisor has identified during the rules checking process to be scannable. • -Full An optional switch that specifies to display the full scannability check information for all non-scan instances. • • • -Identified An optional switch that displays identified non-scan instances. The valid literals are as follows: Scan — A literal that specifies to display scan instances defined with the Add Scan Instances command. used at the end of the argument list that for creates or replaces the contents of file_pathname. refer to “Scanability Rules (S Rules)” in the Tessent Common Resources Manual for ATPG Products. 188 Tessent DFTAdvisor Reference Manual. S2.Command Dictionary Report Dft Check pathname specifies a particular sequential instance. DFTAdvisor generates scannability information for only that instance. This is the default. -RUle S1 | S2 | S3 | S4 An optional switch and literal that specifies which non-scannable cell violations to report. V9. S3.

Command Dictionary Report Dft Check • >> file_pathname An optional redirection operator and pathname pair used at the end of the argument list to append to the contents of file_pathname. Examples The following example displays the scannability check for all non-scan instances in the design: add clocks 1 clk1 add clocks 0 clk0 set system mode dft report dft check SCANNABLE DEFINED-NONSCAN /CLK1 /U1 SCANNABLE IDENTIFIED /CLK1 /U2 SCANNABLE UNIDENTIFIED /CLK1 /U3 SCANNABLE DEFINED-SCAN /CLK1 /U4 SCANNABLE UNIDENTIFIED /CLK2 /U5 SCANNABLE IDENTIFIED /CLK2 /U6 NON-SCANNABLE UNIDENTIFIED S1 /U7 Clock #1: /CLK3 (11) Number of non-scannable instances fails on Number of instances found = 1 Number of instances reported = 1 FD1 FD1 FD1 FD1 FD1 FD1 FD2 (34) S1 rule = 1 Related Commands Echo Report DRC Rules Report Sequential Instances Tessent DFTAdvisor Reference Manual.0 June 2010 189 . V9.

the current number of DRC violations (fails).Command Dictionary Report DRC Rules Report DRC Rules Scope: All modes Usage REPort DRc Rules [-Fails_summary | -Summary | rule_id… | rule_id-occurence#… | -All_fails] [{> | >>} file_pathname] C1 Usage: REPort DRc Rules C1 [-EXcluded] D5 Usage: REPort DRc Rules D5 [ { [-TYpe {I0 | I1 | IX | T0 | T1 | TX | TLA}…] [-NOType {I0 | I1 | IX | T0 | T1 | TX | TLA}…] [-EDge_triggered | -LEvel_sensitive] } | -Summary] [{> | >>} file_pathname] Description Displays either a summary of DRC violations (fails) or violation occurrence message(s). V9. Occurrence report — Lists one or more violation occurrence messages that give details of specific DRC violations. one line of data per rule. and a brief description of the rule. The Report DRC Rules command displays data about design rules and DRC violations. Refer to the Arguments subsection for complete details about the arguments. Available Information Displays and Arguments Desired Display Summary report Occurrence report Rules/Occurrences Covered Argument Design rules that resulted in violations (fails) during -Fails_summary DRC All design rules Specific rule. Table 2-4. the violation handling. It can display a report in one of two formats: • Summary report — Lists for each reported design rule. specific occurrence Specific rule. • Table 2-4 summarizes the available information displays and the arguments you use to obtain them.0 June 2010 . all occurrences All occurrences -Summary rule_id-occurence# rule_id -All_fails 190 Tessent DFTAdvisor Reference Manual.

• • • For a complete description of the RAM design rule IDs. For a complete description of the Data design rule IDs. refer to the “RAM Rules” section in the Tessent Common Resources Manual for ATPG Products. Note This switch does not display anything if there are no rule violations or the tool has not yet performed DRC. For a complete description of the Clock design rule IDs. Arguments • -Fails_Summary A switch that specifies to display the following for each user-controllable rule that resulted in a violation (fail) during DRC: o o o o Rule identification (ID) Number of failures of the rule Current handling status of the rule Brief description of the rule This is the command default. 191 Tessent DFTAdvisor Reference Manual. Data. T (trace). refer to the “Design Rule Checking” section in the Tessent Common Resources Manual for ATPG Products. For more information on the design rules.0 June 2010 . and Trace rules violation IDs. and E (extra) rules. V9. refer to the “Clock Rules” section in the Tessent Common Resources Manual for ATPG Products. The design rule violations and their identification literals are divided into the following six groups: RAM. D (data). whether or not it resulted in a violation (fail) during DRC: o o o o Rule identification (ID) Number of failures of the rule Current handling status of the rule Brief description of the rule • rule_id A repeatable string that specifies the identification literal (ID) of a particular design rule for which you want to display all violation occurrence messages. Clock. • -Summary A switch that specifies to display the following for each user-controllable rule. P (procedure). see the “Scan Cell Data Rules” section in the Tessent Common Resources Manual for ATPG Products.Command Dictionary Report DRC Rules You can use the Set DRC Handling command to change the handling of the C (clock). Scannability. A (RAM). Extra.

C1-Only Arguments • • C1 A required literal that specifies reporting C1 DRC rule violations. refer to the “Scan Chain Trace Rules” section in the Tessent Common Resources Manual for ATPG Products. refer to “Scanability Rules (S Rules)” in the Tessent Common Resources Manual for ATPG Products. The tool assigns numbers to occurrences of rule violations as it encounters them. For a complete description of the Trace design rule IDs. -EXcluded An optional switch for use only with a C1 violation.Command Dictionary Report DRC Rules • • • • For a complete description of the Extra design rule IDs. For example. The displayed information can be quite lengthy. This argument must include the specific design rule ID (rule_id). you cannot change the number assigned to a specific occurrence. used at the end of the argument list. rule_id-occurrence# A repeatable string that specifies the identification literal (ID) of a particular design rule and the violation occurrence for which you want to display the occurrence message. V9. 192 Tessent DFTAdvisor Reference Manual. you can analyze the second violation occurrence of the C3 rule by specifying C3-2. and the hyphen between them. refer to the “Extra Rules” section in the Tessent Common Resources Manual for ATPG Products. Specifying this switch reports the C1 violations that have been excluded from the default C1 list because these C1 violations can be handled by the tool without causing potential mismatch. • -All_Fails A switch that specifies to display all occurrence messages for all occurrences of rule violations. the specific occurrence number of the violation. • > file_pathname An optional redirection operator and pathname pair. for creating or replacing the contents of file_pathname. used at the end of the argument list. For a complete description of the Scannability design rule IDs. Use this switch to output a report of all violation occurrences (most likely to a log file) for later analysis.0 June 2010 . for appending to the contents of file_pathname. • >> file_pathname An optional redirection operator and pathname pair. as it is the same information you would get if you consecutively entered a “report drc rules <rule_id>” command for each rule that had a violation.

(INIT-X) T0 — If the element is always at 0 during capture.0 June 2010 193 . V9. (TLA) Tip: Except for TLAs. The default (when neither option is specified) is to display information for both edge-triggered and level-sensitive elements. Next. when performing the rules checking for the clock (C) rules. See the -Edge_triggered and -Level_sensitive switch descriptions for details. (INIT-0) I1 — If the element is at 1 at the beginning of the first capture cycle and may go to any state during capture. (INIT-1) IX — If the element’s state is unknown at the beginning of the first capture cycle and may go to any state during capture.Command Dictionary Report DRC Rules D5-Only Arguments • -TYpe I0 | I1 | IX | T0 | T1 | TX | TLA An optional switch and repeatable literal that displays D5 occurrence messages for only the specified type(s) of non-scan sequential elements. you can also direct the tool to display information for only those D5 elements that are edge-triggered or level-sensitive. The literal choices for the type of element are as follows (the term you will see in occurrence messages for each type is shown in parentheses): I0 — If the element is at 0 at the beginning of the first capture cycle and may go to any state during capture. (TIE-X) TLA — If the element is always transparent when its clock is at its off state. (TIE-1) TX — If the element is always at an unknown state during capture. (TIE-0) T1 — If the element is always at 1 during capture. and also specifies execution of a full test generation analysis. Examples The following example changes the severity of the data rule 7 (D7) from a warning to an error. • -EDge_triggered | -LEvel_sensitive Optional switches that specify to display D5 occurrence messages either for edge-triggered or level-sensitive elements only. • -NOType I0 | I1 | IX | T0 | T1 | TX | TLA An optional switch and repeatable literal that specify not to display occurrence messages for the particular type(s) of D5 violations. the example generates a display of a specific rule failure: set drc handling d7 error atpg_analysis set system mode dft Tessent DFTAdvisor Reference Manual. See the description of the -Type switch for the meaning of the literal choices.

cannot exit SETUP mode. //----------------------------------------------------------// Reading group test procedure file /user/design/tpf.(D7-1) // Error: Rules checking unsuccessfule. memory elements=8.Command Dictionary Report DRC Rules //----------------------------------------------------------//Begin scan chain identification process. // Chain = c1 successfully traced with scan_cells = 8. report drc rules d7-1 //Error: Flipflop /I$3 (16) has clock port set to stable high (D7-1) Related Commands Echo Set DRC Handling 194 Tessent DFTAdvisor Reference Manual. V9. // Error: Flipflop /FF1 (103) has clock port set to stable high.0 June 2010 . // Simulating load/unload procedure in g1 test procedure file.

Arguments • > file_pathname An optional redirection operator and pathname pair. used at the end of the argument list. Using the Report Environment command immediately after invocation.0 June 2010 195 . displays all of the default values of the “set” commands. for appending to the contents of file_pathname. Examples The following example reports the DFTAdvisor invocation defaults: report environment Top Module = /designs/dft/test_design Gate Level = design Gate Report = normal Net Resolution = wire System Mode = setup Tied Signal = x Dofile Abort = on Trace Report = off Scan type = mux_scan Identification Type = sequential:on scan_sequential:off partition_scan:off full_scan:off test_point:off Identification Model = clock:original disturb:on Scan Identification = automatic Internal Full backtrack=30 cycle=16 time=100 control_coverage = 100 observe_coverage = 100 min_detection = 1 Fault Sampling = 100% Scan-in Naming = prefix:scan_in initial:1 modifier:1 suffix: Scan-out Naming = prefix:scan_out initial:1 modifier:1 suffix: Test Enable Name = test_en active = high Test Clock Name = test_clk Scan Enable Name (Core)= scan_en Scan Enable Name (Input wrapper chains)= scan_en_in Scan Enable Name (Output wrapper chains)= scan_en_out Tessent DFTAdvisor Reference Manual. used at the end of the argument list. for creating or replacing the contents of file_pathname. V9.Command Dictionary Report Environment Report Environment Scope: All modes Usage REPort ENvironment [{> | >>} file_pathname] Description Displays the current values of all the “set” commands and the default names of the scan type pins. • >> file_pathname An optional redirection operator and pathname pair.

0 June 2010 . V9.Command Dictionary Report Environment Scan Clock Name = scan_clk Scan Master Clock Name = scan_mclk Scan Slave Clock Name = scan_sclk Hold Enable Name = hold_en Control Input Name = test_cntl Observe Output Name = test_obs Test Logic = set:off reset:off clock:off tristate:off ram:off Screen Display = on lockup cell = off nolast Related Commands Echo Any of the “Set” commands 196 Tessent DFTAdvisor Reference Manual.

V9. repeatable. Note Feedback paths include. • -Display {DEBug | DESign | DAta | ALl} A switch and literal that displays the reported information graphically in the specified DFTVisualizer window(s). Usage REPort FEedback Paths [-All | loop_id#…] [-Display {DEBug | DESign | DAta | ALl}] [{> | >>} file_pathname] Description Displays a textual report of the currently identified feedback paths. non-negative integer that specifies the identification number of a particular feedback path to report. any duplicated gates. This is the default. Tessent DFTAdvisor Reference Manual. By default. by default. starting with 0. See “Using Tessent DFTVisualizer” for more information. Arguments • -ALl An optional switch that specifies to report all currently identified feedback paths.Command Dictionary Report Feedback Paths Report Feedback Paths Scope: Dft mode Prerequisites: Tool must have performed the learning process. Issuing the command with the identification numbers of specific paths of interest will limit the display to just those paths. The tool assigns the numbers consecutively. • loop_id# An optional. Flattening occurs when you first attempt to exit Setup mode. the command displays all currently identified feedback paths and their identification numbers. The Report Feedback Paths command displays any feedback paths the tool identified during the last circuit learning process. The choices are as follows: DEBug — Debug window DESign — Design window DAta — Data window ALl— A literal that displays the information in all of the preceding windows.0 June 2010 197 . which happens immediately after flattening a design to the simulation model.

• >> file_pathname An optional redirection operator and pathname pair for appending to the contents of file_pathname. INV PBUS ZVAL INV TIEX Loop#=1.0 June 2010 . V9. among other things. #gates_in_network=5 /I_962__I_582/ (52) /I_962__I_582/N1/ (95) /I_962__I_582/N1/ (100) /I_962__I_582/ (105) /I_962__I_582/ (27) Related Commands Report Loops 198 Tessent DFTAdvisor Reference Manual. flattens the simulation model and performs the learning process). and displays the identification numbers of any learned feedback paths: set system mode dft report feedback paths Loop#=0.Command Dictionary Report Feedback Paths • > file_pathname An optional redirection operator and pathname pair for creating or replacing the contents of file_pathname. Examples The following example leaves the Setup mode (which. #gates_in_network=5 /I_956__I_582/ (51) /I_956__I_582/N1/ (96) /I_956__I_582/N1/ (101) /I_956__I_582/ (106) /I_956__I_582/ (26) feedback_buffer=27. INV PBUS ZVAL INV TIEX feedback_buffer=26.

Pin flattening violations are described in sections “FP1” through “FP13” of the Tessent Common Resources Manual for ATPG Products. The tool assigns the occurrences of the rules violations as it encounters them. you cannot change either the rule identification number or the ordering of the specific violations. FG4 2. Arguments • rule_id A literal that specifies the flattening rule violation for which you want to display information.Command Dictionary Report Flatten Rules Report Flatten Rules Scope: All modes Usage REPort FLatten Rules [rule_id [{occurence_id | -Verbose}]] [{> | >>} file_pathname] Description Displays either a summary of all the flattening rule violations or the data for a specific violation. pin.0 June 2010 199 . Gate flattening violations are described in sections “FG1” through “FG8” of the Tessent Common Resources Manual for ATPG Products. For example. The flattening rule violations and their identification literals are divided into the following three groups: net. and gate rules. and gate flattening rules. V9. occurence_id A literal that specifies the identification of the exact flattening rule violation (the occurrence) for which you want to display information. you can analyze the second occurrence of the FG4 rule by specifying the rule_id and the occurence_id. • • • • Net flattening violations are described in sections “FN1” through “FN9” of the Tessent Common Resources Manual for ATPG Products. Tessent DFTAdvisor Reference Manual. pin. The Report Flatten Rules command displays the following information for a specific violation: • • • Rule identification number Current number of rule failures Violation handling You can use the Set Flatten Handling command to change the handling of the net.

V9. Example The following example shows the summary information of the FG3 rule: report flatten rules fg3 // FG3: fails=2 handling=warning/noverbose Related Commands Set Flatten Handling 200 Tessent DFTAdvisor Reference Manual. used at the end of the argument list. • >> file_pathname An optional redirection operator and pathname pair. used at the end of the argument list. for creating or replacing the contents of file_pathname.Command Dictionary Report Flatten Rules • -Verbose A switch that displays the following for each flattening rule: o o o o Rule identification number Number of failures of each rule Current handling status of that rule Brief description of that rule • > file_pathname An optional redirection operator and pathname pair.0 June 2010 . for appending to the contents of file_pathname.

You can change the output of the Report Gates command by using the Set Gate Report command. Note You must flatten the netlist before issuing this command. which may include any number of ‘*’ or ‘?’ wildcard characters embedded in the pathname string. the primitive-level is reported. V9.. The format for the primitive level is: instance_name (gate_ID#) gate_type input_pin_name I (data) gate_ID#-pin_pathname.. output_pin_name 0 (data) . and the ‘?’ character matches any single character... this also includes the gate index number of the connecting gate and only includes the pin pathname if one exists at that point. If some circuitry inside the design cell is completely isolated from other circuitry.Command Dictionary Report Gates Report Gates Scope: All modes Prerequisites: The netlist must already have been flattened before you can use this command in either Setup or Dft mode. You can specify the gate by its gate index number. a pathname of a pin connected to a gate. For the primitive-level... You can specify a design cell by a pathname of a pin connected to the design cell. The next time you return to Setup mode. The pin_or_net_pathname and instance_name arguments support regular expressions.... The list associated with the input and output pin names indicates the pins to which they are connected. Usage REPort GAtes {gate_id# | pin_or_net_pathname | instance_name}… | {-Type gate_type}… Description The Report Gates command displays the netlist information for the specified design-level or primitive-level gates. a gate type. Netlist flattening happens when you first attempt to exit Setup mode. output_pin_name O (data) gate_ID#-pin_pathname... you can use the command. pin_pathname... the command only reports the circuitry associated with the pin pathname. If you use a gate index number or gate type. If a wildcard name is specified. pin_pathname. .0 June 2010 201 .. The format for the design level is: instance_name cell_type input_pin_name I (data) . or a net pathname. down to the primitive gates. the command will search for matching instance names from the top library cell level. The ‘*’ character matches any sequence of characters (including none) in a name. There is a limitation on reporting gates at the design-level. . Tessent DFTAdvisor Reference Manual... an instance name (design level only).

SETUP> rep ga 269 // /u1/inst__565_ff_d_1__13 (269) LA // "S" I 14// "R" I 145// SCLK I 4-/clk // D I 265-/u1/_g32/X // ACLK I 2-/scan_mclk // SDI I 20-/u1/inst__565_ff_d_0__dff/Q2 // "OUT" O 26.27- SETUP> b // // /u1/inst__565_ff_d_1__13 (14) "OUT" O 269.75SETUP> b // // // // // // // // BUF /u1/inst__565_ff_d_1__13 (269) LA "S" I 14"R" I 145SCLK I 4-/clk D I 265-/u1/_g32/X ACLK I 2-/scan_mclk SDI I 20-/u1/inst__565_ff_d_0__dff/Q2 "OUT" O 26. V9. first report on a specific gate. you can also use a shortcut to trace forward through the first fanout of the previously reported gate. first report on a specific gate and then enter: SETUP> b The following example shows how to use Report Gate and B commands to trace backward through the first input of the previously reported gate. and then enter: SETUP> f The following example shows how to use Report Gate and F commands to trace forward through the first fanout of the previously reported gate.0 June 2010 .Command Dictionary Report Gates Reporting on the First Input of a Gate Report Gates provides a shortcut to display data on the gate connected to the first input of the previously reported gate.268TIE0 Reporting on the First Fanout of a Gate Similar to tracing backward through circuitry. SETUP> rep gate 26 // /u1/inst__565_ff_d_1__13 (26) // "I0" I 269// "OUT" O 268. To use Report Gates in this manner. To use Report Gates in this manner. This lets you quickly and easily trace backward through circuitry.27SETUP> f // /u1/inst__565_ff_d_1__13 (26) BUF 202 Tessent DFTAdvisor Reference Manual.

• pin_or_net_pathname A repeatable string that specifies the pathnames of pins or nets in the design netlist. For a hierarchical pathname. Report Gate Types gate_type BUF INV AND NAND OR NOR XOR XNOR Description buffer inverter and inverted and or inverted or exclusive-or inverted exclusive-or 203 Tessent DFTAdvisor Reference Manual. instance_name may also be the pathname of a primitive instance. If a valid library instance pathname is given when in primitive level. You may use wildcard characters to match multiple pin or net pathnames. the display will include information describing how that pathname maps to the driving design level pin(s) and gate(s) for which data is displayed. The supported gate_types are listed in Table 2-5.25- Arguments • gate_id# A repeatable integer that specifies the gate identification numbers of the objects for which you want to display gate information.Command Dictionary Report Gates // "I0" // "OUT" SETUP> f // // // // // // I O 269268- 75LA /u1/inst__565_ff_d_1__13 (268) "S" I 14"R" I 145BCLK I 1-/scan_sclk "D0" I 26"OUT" O 24. all pins on that library cell are reported. • -Type gate_type A repeatable switch and name pair that specifies the gate types for which you want to display the gate information. The value of the gate_id# argument is the unique identification number that DFTAdvisor automatically assigns to every gate within the design during the model flattening process. V9. Table 2-5. When in primitive level.0 June 2010 . • instance_name A repeatable string that specifies the hierarchical pathname of an instance of a library cell within the design.

Command Dictionary Report Gates Table 2-5. gives 1 when input is Z The gate report for the design level may look like the following: // // // // /P2.2P/S Description D flip-flop. converts Z to X undetermined wired gate 2-way multiplexor. same as _dff library primitive latch. SETUP> set system mode dft DFT> set gate report error_pattern DFT> set gate level primitive DFT> report gates i_1006/o // // // // /P2.1 B I /M1. Report Gate Types (cont. same as _dlat library primitive primary input primary output tied low tied high tied unknown tied high impedance transparent latch tri-state driver. first input is active low enable line tri-state bus Z converter gate. V9.1 B I 7-/M1.) gate_type DFF LA PI PO TIE0 TIE1 TIEX TIEZ TLA TSH TSL BUS Z2X WIRE MUX RAM ROM XDET ZDET Examples The following example displays the simulated values of the gate and its inputs.0 June 2010 . first line is select line random access memory read only memory X detector.13P (20) NAND A I 10-/LD. gives 1 when input is X Z detector.1 Z O /P2.13P ND2 A I /LD.2P/S 204 Tessent DFTAdvisor Reference Manual. first input is active high enable line tri-state driver.1 Z O 30-/P2.

0 June 2010 205 .Command Dictionary Report Gates The next example demonstrates the use of wildcards: ATPG> report gates /xscan_0_0_cch_scan_32x/ix15* // // // // // // // // /xscan_0_0_cch_scan_32x/ix151 NOR2XL A I /myop1<0> [1] B I /myop2[1] Y O /xscan_0_0_cch_scan_32x/sum_add_0_ix27/A0 /xscan_0_0_cch_scan_32x/ix153 NAND2X1 A I /myop1<0> [0] B I /myop2[0] Y O /xscan_0_0_cch_scan_32x/sum_add_0_ix1/A \ /xscan_0_0_cch_scan_32x/ sum_add_0_ix23/B \ /xscan_0_0_cch_scan_32x/sum_add_0_ix27/A1 /xscan_0_0_cch_scan_32x/ix155 NAND2X1 A I /myop1<0> [1] B I /myop2[1] Y O /xscan_0_0_cch_scan_32x/ix166/B0 \ /xscan_0_0_cch_scan_32x/ sum_add_0_ix27/B0 /xscan_0_0_cch_scan_32x/ix157 NAND2X1 A I /myop1<0> [3] B I /myop2[3] Y O /xscan_0_0_cch_scan_32x/ix174/B0 \ /xscan_0_0_cch_scan_32x/ sum_add_0_ix55/B0 // // // // // // // // ATPG> rep ga /xscan_0_0_cch_scan_32x/ix159 // // // // /xscan_0_0_cch_scan_32x/ix159 NAND2X1 A I /myop1<0> [5] B I /myop2[5] Y O /xscan_0_0_cch_scan_32x/ix188/B0 \ /xscan_0_0_cch_scan_32x/ sum_add_0_ix83/B0 ATPG> set gate level primitive ATPG> report gates /xscan_0_0_cch_scan_32x/ix157 // // // // // // // // // // // // /xscan_0_0_cch_scan_32x/ix157 (43) NAND A I 7-/myop1<0> [3] B I 17-/myop2[3] Y O 60-/xscan_0_0_cch_scan_32x/ix174/B0 \ 75-/xscan_0_0_cch_scan_32x/ sum_add_0_ix55/B0 /xscan_0_0_cch_scan_32x/ix157 (43) NAND A I 7-/myop1<0> [3] B I 17-/myop2[3] Y O 60-/xscan_0_0_cch_scan_32x/ix174/B0 \ 75-/xscan_0_0_cch_scan_32x/ sum_add_0_ix55/B0 /xscan_0_0_cch_scan_32x/ix157 (43) NAND A I 7-/myop1<0> [3] B I 17-/myop2[3] Y O 60-/xscan_0_0_cch_scan_32x/ix174/B0 \ 75-/xscan_0_0_cch_scan_32x/ sum_add_0_ix55/B0 Tessent DFTAdvisor Reference Manual. V9.

0 June 2010 .Command Dictionary Report Gates The next example demonstrates how the output report will change if the input pathname is a hierarchical pin or net. In this case an additional line is output at the top of the report. V9. indicating the mapping that was found: ATPG> set gate level design ATPG> report gate /sub3/in2 // Hierarchical pin /sub3/in2 maps to /sub1/gate4/Y // /sub1/gate4 nand02 // A1 I /in1 // A0 I /sub1/gate2/Y // Y O /sub3/gate1/A1 /sub3/micro1/gate1/A1 /sub2/gate3/A1 // /sub3/gate3/A1 /sub3/micro1/gate2/A1 /sub2/gate1/A1 ATPG> report gate /w2 // Hierarchical net /w2 maps to /sub1/gate4/Y // /sub1/gate4 nand02 // A1 I /in1 // A0 I /sub1/gate2/Y // Y O /sub3/gate1/A1 /sub3/micro1/gate1/A1 /sub2/gate3/A1 // /sub3/gate3/A1 /sub3/micro1/gate2/A1 /sub2/gate1/A1 Related Commands Set Gate Level Set Gate Report 206 Tessent DFTAdvisor Reference Manual.

0 June 2010 207 . The tool assigns loop identification numbers consecutively. loop_id# An optional. Tessent DFTAdvisor Reference Manual. • > file_pathname An optional redirection operator and pathname pair for creating or replacing the contents of file_pathname. positive integer that specifies the identification number of a particular loop to report. Loops that are not broken by duplication are shown as being broken by a constant value. starting with 1. repeatable. • >> file_pathname An optional redirection operator and pathname pair for appending to the contents of file_pathname. • -Display {DESign | DAta} A switch and literal that displays the reported information graphically in the specified DFTVisualizer window(s). the report indicates whether the loop was broken by duplication. The choices are as follows: DESign — Design window DAta — Data window See “Using Tessent DFTVisualizer” for more information. The Report Loops command displays information about currently identified loops in the circuit. This is the default.Command Dictionary Report Loops Report Loops Scope: Dft mode Usage REPort LOops [-All | loop_id#…] [-Display {DESign | DAta}] [{> | >>} file_pathname] Description Displays information about circuit loops. which means the loop is either a coupling loop or has a single multiple fanout gate. Arguments • • -ALl An optional switch that specifies to report all the loops in the circuit. The report also includes the pin pathname and gate type of each gate in each loop. You can write the loops report information to a file by using the command’s redirection operators or the Write Loops command. V9. For each loop.

writing to file my_loop_file Related Commands Report Feedback Paths Write Loops 208 Tessent DFTAdvisor Reference Manual.Command Dictionary Report Loops Examples The following example displays a list of all the loops in the circuit: set system mode dft report loops Loop = 1: not_duplicated (coupling loop) my_design/my_minibus (SBUS) my_design/PAD (BUF) my_design/my_minibus (Z2X) Loop = 2: not_duplicated (coupling loop) ....0 June 2010 . V9.. Loop = 8: not_duplicated (single multiple fanout) my_design/al/pl/padx (BUF) my_design/al/pl/pad (BUF) my_design/pad (WIRE) The next example displays loop 8 only: report loops 8 Loop = 8: not_duplicated (single multiple fanout) my_design/al/pl/padx (BUF) my_design/al/pl/pad (BUF) my_design/pad (WIRE) The next example writes the display information for loop 8 to a new file named my_loop_file: report loops 8 > my_loop_file .

o If this argument is the name of an instance or hierarchical instance. then the -Output switch is required. o If you specify -Instance and the instance is primitive. Optionally. module. o o • -Instance | -Module An optional switch that specifies the type of the object_name argument. You can optionally write it to a file using the -Filename switch. then the -Module switch is required. 209 o Tessent DFTAdvisor Reference Manual. Arguments • • -All A switch that specifies to report all scan and output mapping in the entire design. If you specify -Instance and the instance is hierarchical. you can constrain the report to matching the -Nonscan_model or (for output mapping) matching the -Scan_model. You can report the scan and output mapping for an individual instance. all instances in all occurrences of a module in the design. You can also specify an instance. If this argument is the name of a module.Command Dictionary Report Mapping Definition Report Mapping Definition Scope: Setup and DFT modes Usage REPort MApping Definition -All | {object_name [-Instance | -Module] [-Nonscan_model nonscan_model_name] [-Scan_model scan_model_name] [-Output scan_ouput_pin_name]} [-Filename filename [-Replace]] Description Reports the non-scan to scan model mapping defined in the design. The report is always displayed in the transcript. The Report Mapping Definition command reports the mapping of non-scan models to scan models. If this argument is a scan model. all instances under a hierarchical instance. hierarchical instance. then it reports only the named instance. and you can optionally specify the model with the -Nonscan_model or -Scan_model switch. and you can optionally specify the model with the -Nonscan_model or -Scan_model switch.0 June 2010 . all occurrences of the model in the entire design. you can only report the scan output pin mapping. object_name A string that specifies the name of the non-scan model you want to report on. the -Instance switch is required. the object_name is a model (the default). or scan model. or the entire design. then it reports all instances under that instance. Because you specified a scan model. If neither switch is specified. V9.

• -Output [scan_ouput_pin_name] An optional switch and string pair that specifies the name of the scan output pin. You can use this to constrain the report. V9. you can specify the non-scan model in the object_name argument. • -Filename filename [-Replace] An optional switch and string that specifies that DFTAdvisor writes the scan mapping report to a file.Command Dictionary Report Mapping Definition o If you specify -Module.0 June 2010 . while specifying the switch with a pin name. • -Nonscan_model nonscan_model_name A switch and string pair that specifies the name of the non-scan model that you want to report on. it reports all instances within that module. This argument is required when you want to further constrain the report. except when you are only reporting the mapping of the scan output pin and specify the scan model in the object_name argument. otherwise. Examples The following example reports the scan and output mapping for all occurrences of the fd1 nonscan model in the design: report mapping definition fd1 The following example reports the mapping for each occurrence of the fd1 non-scan model mapped to the fd1s scan model with the scan output pin mapped to “qn”: report mapping definition fd1 -scan_model fd1s -output qn The following example reports the mapping for each occurrence of the fd1s scan model in the design: report mapping definition fd1s -output The following example reports the mapping for all instances under the hierarchical instance “/top/counter1”: report mapping definition /top/counter1 -instance 210 Tessent DFTAdvisor Reference Manual. reports the mapping for only scan models that use that pin for the scan output. Optionally. • -Scan_model scan_model_name A switch and string pair that specifies the name of the scan model to report on. This argument is only required if you specify -Instance or -Module switch and want to constrain the report to objects matching the non-scan model. you can constrain the report to matching the -Nonscan_model or (for output mapping) matching the -Scan_model. then for all occurrences of that module. Specifying just the -Output switch reports all mapped scan output pins for the specified scan model. The -Replace switch specifies that the file should be overwritten if it already exists.

V9.0 June 2010 211 .Command Dictionary Report Mapping Definition The following example reports the mapping for each occurrence of the fd1s scan model with the scan output pin mapped to “qn” for all matching instances in the “counter” module and for all occurrences of that module in the design: report mapping definition counter -module -scan_model fd1s -output qn Related Commands Add Mapping Definition Delete Mapping Definition Tessent DFTAdvisor Reference Manual.

• -Instance An optional switch that specifies that the pathname or -All argument indicates instance pathnames. for creating or replacing the contents of file_pathname. • -Stuck_at 01 | 0 | 1 An optional switch and literal pair that specifies the stuck-at nofault settings that you want to display. The Report Nofaults command displays for pin pathnames or pin names of instances the nofault settings that you previously specified with the Add Nofaults command. 1 — A literal that specifies to only display the “stuck-at-1” nofault settings. The valid stuck-at literals are as follows: 01 — A literal that specifies to display both the “stuck-at-0” and “stuck-at-1” nofault settings. 212 Tessent DFTAdvisor Reference Manual. • > file_pathname An optional redirection operator and pathname pair.0 June 2010 . Arguments • pathname A repeatable string that specifies the pin pathnames or the instance pathnames for which you want to display the nofault settings. If you specify an instance pathname. all pin names of instances. This is the default.Command Dictionary Report Nofaults Report Nofaults Scope: All modes Usage REPort NOfaults {pathname… | -All} [-Instance] [-Stuck_at {01 | 0 | 1}] [{> | >>} file_pathname] Description Displays the no-fault settings for the specified pin or instance pathnames. 0 — A literal that specifies to only display the “stuck-at-0” nofault settings. if you also specify the -Instance switch. used at the end of the argument list. for appending to the contents of file_pathname. • >> file_pathname An optional redirection operator and pathname pair. you must also specify the -Instance switch. • -All A switch that specifies to display the nofault settings on either all pin pathnames or. used at the end of the argument list. V9.

V9.0 June 2010 213 .Command Dictionary Report Nofaults Examples The following example displays all pin names of the instances that have the nofault settings: add nofaults i_1006 i_1007 i_1008 -instance report nofaults Related Commands Add Nofaults Delete Nofaults Tessent DFTAdvisor Reference Manual.

Command Dictionary Report Nonscan Models Report Nonscan Models Scope: All modes Usage REPort NONscan Models [-Class {Full | System | User}] Description Displays the sequential non-scan model list. Examples The following example displays all sequential non-scan models from the non-scan model list: set system mode dft add nonscan models d_flip_flop1 d_flip_flop2 report nonscan models Related Commands Add Nonscan Models Delete Nonscan Models 214 Tessent DFTAdvisor Reference Manual. The valid literals are as follows: Full — A literal that specifies to display all the non-scan sequential models in the user and system class. V9. or that have the Dont_touch property in a Genie netlist. User — A literal that specifies to only display the non-scan sequential models that are the result of the Add Nonscan Models command. Arguments • -Class Full | System | User An optional switch and literal pair that specifies the source (or class) of the sequential nonscan models that you want to display. This is the default. System — A literal that specifies to only display the non-scan sequential models that are a result of the Genie netlist containing the Dont_touch property.0 June 2010 . The Report Nonscan Models command displays sequential models that you added by using the Add Nonscan Models command.

0 June 2010 215 . and list scan cells that are excluded from being used as observation scan cells by using the -Observe_scan_cell switch. Arguments • -Paths An optional switch that displays the definitions for all currently loaded critical paths that have marked notest points. • -Observe_scan_cell An optional switch that specifies to list the instances that cannot be used as an observation scan cell. Examples The following example displays the list of all circuit points that DFTAdvisor cannot use for testability insertion: set system mode dft add notest points tr_io add notest points ts_i report notest points Related Commands Add Notest Points Delete Notest Points Tessent DFTAdvisor Reference Manual. The Report Notest Points command displays the circuit points added using the Add Notest Points command and which therefore. If this switch is not specified. DFTAdvisor cannot use for testability insertion. the tool reports only the resulting notest points.Command Dictionary Report Notest Points Report Notest Points Scope: Setup and Dft modes Usage REPort Notest Points [-Paths] [-Observe_scan_cell] Description Displays all the circuit points for which you do not want DFTAdvisor to insert controllability and observability. V9. You can also list the critical path definitions that added notest points by using the -Paths switch.

The Report Output Masks command displays the primary output pins that you previously masked by using the Add Output Masks command. V9. DFTAdvisor uses all unmasked primary output pins as possible observation points to which the effects of all faults propagate for detection. you inform DFTAdvisor to mark that pin as an invalid observation point during the scan cell identification process. When you mask a primary output pin. Examples The following example masks two primary outputs and then displays the results: add output masks q1 -hold1 add output masks qb1 -hold 0 report output masks q1 hold1 qb1 hold0 Related Commands Add Output Masks Analyze Output Observe Delete Output Masks Setup Output Masks 216 Tessent DFTAdvisor Reference Manual.Command Dictionary Report Output Masks Report Output Masks Scope: All modes Usage REPort OUtput Masks Description Displays a list of the currently masked primary output pins.0 June 2010 .

— Identified internal feedback cells are reported as such with the “(internal feedback)” notation. For information about this switch. see the following Description. — Maximum number of combinational logic levels between the I/O and the sequential cells identified for this I/O. see the following Description. If no arguments are specified. This information is only reported if the Setup Wrapper Chains command has either the -allow_internal_feedback or -test_points option specified. — Total number of sequential cells identified for this I/O. — I/Os that failed the wrapper cell identification and the reason for the failure. — Both the directly-identified and feedback-identified wrapper cells.Command Dictionary Report Wrapper Cells Report Wrapper Cells Scope: All Usage REPort WRapper Cells [-Summary | -Verbose] Arguments • • -Summary An optional switch. -Verbose An optional switch. — Total number of internal feedback gates between the directly-identified wrapper cells and internal-feedback wrapper cells. — Wrapper cells identified. If -Verbose is specified. — Wrapper chain type indicates whether the corresponding identified wrapper cell is part of the Input or Output wrapper chain. This information is only reported if the Setup Wrapper Chains command has either the -allow_internal_feedback or -test_points switch specified. Tessent DFTAdvisor Reference Manual.0 June 2010 217 . the following is reported: — Identified wrapper cell path names for each I/O that succeeded the identification or “new cell” for the I/Os that failed wrapper cell identification and are subject to I/O registration. in addition to the above information. For information about this switch. Description Reports information about the identified wrapper cells for each I/O port subjected to wrapper cell identification. the following information is reported for each I/O: — Primary I/O port name and its direction (Input or Output). V9. — Whether this I/O was subject to the I/O Registration.

— Total number of design gates between the newly added wrapper cells and the logic that would have terminated the forward/backward tracing from each PI/PO during wrapper cells identification. Logic Only in5 (I) 0 0 new cell Input clk Yes Max Logic Level in6 (I) 0 0 new cell Input clk Yes Combin.Command Dictionary Report Wrapper Cells — Clocks controlling both the identified wrapper cells and wrapper cells to be added. the following information is reported: — Total number of primary inputs. and the corresponding identified wrapper cells. report wrapper cells -Verbose --------------------------------------------------------------------------------------------------------Primary I/O Max Logic #Wrapper Cells #Internal Wrapper Wrapper Clock New Port Level (Direct/Internal-Feedback)Feedback Cells Chain Regist [32/32] Identified [256/256] Gates Identified Type Cell Added --------------------------------------------------------------------------------------------------------o[1] (O) 2 3 d7 Output clk No d8 Output clk d9 Output clk o[2] (O) 0 1 d9 Output clk No i[3] (I) 3 3/3 4 d2 Input clk No d3 Input clk d10 Input clk i[2] (I) 2 1/2 2 d1 Input clk No --------------------------------------------------------------------------------------------------------- 218 Tessent DFTAdvisor Reference Manual. If -Summary is specified.0 June 2010 . Logic Only --------------------------------------------------------------------------------------------------------- Example 2 The following example shows the output generated when the Report Wrapper Cells command is executed with the -Verbose switch when the -test_points option switch is specified for the Setup Wrapper Chains command. — Total number of primary outputs. — Total number of added wrapper cells. Example 1 The following example shows the output generated when the Report Wrapper Cells command is executed with the -Verbose switch and neither the -allow_internal_feedback or -test_points switch is specified for the Setup Wrapper Chains command. V9. Logic Only out1 (O) 0 0 new cell Output test_clk Yes Input Wrapper Cell out2 (O) 0 0 new cell Output test_clk Yes Combin. report wrapper cells -Verbose --------------------------------------------------------------------------------------------------------Primary I/O Max Logic # Wrapper Cells Wrapper Wrapper Clock New Reason For Port Level Identified Cells Chain Registration Failed [1/32] [256/256] Identified Type Cell Added Identification --------------------------------------------------------------------------------------------------------in2 (I) 1 2 flop3 Input clk No -flop4 Input clk in1 (I) 0 2 flop1 Input clk No -flop2 Input clk in3 (I) 0 0 new cell Input clk Yes Max Logic Level in4 (I) 0 0 new cell Input clk Yes Combin. — Total number of identified wrapper cells. — Total number of design gates between all PI/POs for which the wrapper cells identification has succeeded.

V9. Failed [32/32] Identified[256/256]Gates Identified Type Cell Added Ident. report wrapper cells -----------------------------------------------------------------Primary I/O Max Logic # Wrapper Cells New Port Level Identified Registration [32/32] [256/256] Cell Added -----------------------------------------------------------------o[1] (O) 2 3 No o[2] (O) 0 1 No i[3] (I) 3 3 No i[2] (I) 2 1 No ------------------------------------------------------------------ Example 4 The following example shows the output generated when the Report Wrapper Cells command is executed with the -Verbose switch when the -allow_internal_feedback option switch is specified for the Setup Wrapper Chains command. --------------------------------------------------------------------------------------------------------o[1] (O) 0 1 d2 Output clk No -i[2] (I) 2 1/2 2 d3 Input clk No -d2(int feedb) Output clk d4(int feedb) Output clk i[1] (I) 1 1/1 1 d1 Input clk No -d2(int feedb) Output clk --------------------------------------------------------------------------------------------------------- Related Commands Setup Registered IO Setup Scan Identification Setup Wrapper Chains Tessent DFTAdvisor Reference Manual.0 June 2010 219 . report wrapper cells -Verbose Primary I/O Port Max Logic #Wrapper Cells Internal Wrapper Wrapper Clock New Reason Level (Dir/Int-Feedback) Feedback Cells Chain Registr.Command Dictionary Report Wrapper Cells Example 3 The following example shows the output generated when the Report Wrapper Cells command is executed without the -Verbose switch when the -test_points option switch is specified for the Setup Wrapper Chains command.

such as simulation-based test point selection. This is the default. See “Using Tessent DFTVisualizer” for more information.Command Dictionary Report Pin Constraints Report Pin Constraints Scope: All modes Usage REPort PIn Constraints [-All | primary_input_pin…] [-Display {DEBug | DESign | DAta | ALl}] Description Displays the pin constraints of the primary inputs. • -Display {DEBug | DESign | DAta | ALl} A switch and literal that displays the reported information graphically in the specified DFTVisualizer window(s). The choices are as follows: DEBug — Debug window DESign — Design window DAta — Data window ALl— A literal that displays the information in all of the preceding windows. Note The information this command reports has effects on other commands that relate to fault simulation. Examples The following example displays the cycle behavior constraints of all primary inputs. The Report Pin Constraints command displays the pin constraints that you previously added to the primary inputs with the Add Pin Constraints command. Arguments • -All An optional switch that specifies to display the current constraints for all primary input pins. You can change the constant value constraints of the primary inputs by using the Add Pin Constraints or Setup Pin Constraints commands. • primary_input_pin An optional repeatable string that specifies a list of primary input pins whose constraints you want to display.0 June 2010 . V9. add pin constraints ph1 c0 add pin constraints ph2 c1 report pin constraints -all 220 Tessent DFTAdvisor Reference Manual.

V9.Command Dictionary Report Pin Constraints Related Commands Add Pin Constraints Delete Pin Constraints Setup Pin Constraints Setup Scan Identification Tessent DFTAdvisor Reference Manual.0 June 2010 221 .

which you previously restricted to be at equivalent or complementary values.0 June 2010 . by using the Add Pin Equivalences command. V9. Note The information this command reports has effects on other commands that relate to fault simulation. The Report Pin Equivalences command displays a list of primary inputs. Examples The following example displays all pin equivalences that have been added to the primary inputs: add pin equivalences indata2 indata4 add pin equivalences indata3 -invert indata5 report pin equivalences Related Commands Add Pin Equivalences Delete Pin Equivalences 222 Tessent DFTAdvisor Reference Manual. such as simulation-based test point selection.Command Dictionary Report Pin Equivalences Report Pin Equivalences Scope: All modes Usage REPort PIn Equivalences Description Displays the pin equivalences of the primary inputs.

Related Commands Echo Write Primary Inputs Tessent DFTAdvisor Reference Manual. • >> file_pathname An optional redirection operator and pathname pair. • > file_pathname An optional redirection operator and pathname pair. The Report Primary Inputs command displays a list of either all the primary inputs of a circuit or a specific list of primary inputs that you specify. all primary inputs are of the system-defined class.0 June 2010 223 . for appending to the contents of file_pathname. V9. Examples The following example displays all of the primary inputs: report primary inputs -all SYSTEM: SYSTEM: /clk /datain Note The label “system” means that these are primary inputs that DFTAdvisor automatically recognizes because they were in the netlist.Command Dictionary Report Primary Inputs Report Primary Inputs Scope: All modes Usage REPort PRimary Inputs [-All | primary_input_pin…] [{> | >>} file_pathname] Description Displays the specified primary inputs. Because there is no Add Primary Inputs command in DFTAdvisor as there is in Tessent FastScan. used at the end of the argument list. This is the default. for creating or replacing the contents of file_pathname. Arguments • • -All An optional switch that specifies to display all the primary inputs. primary_input_pin An optional repeatable string that specifies a list of primary input pins that you want to display. used at the end of the argument list.

Arguments • • -All An optional switch that specifies to display all the primary outputs. Related Commands Echo Write Primary Outputs 224 Tessent DFTAdvisor Reference Manual. used at the end of the argument list. The Report Primary Outputs command displays a list of either all the primary outputs of a circuit or a specific list of primary outputs that you specify. This is the default. • >> file_pathname An optional redirection operator and pathname pair. Examples The following example displays all of the primary outputs: report primary outputs -all SYSTEM: SYSTEM: /dataout /dataout1 Note The label “system” means that these are primary outputs that DFTAdvisor automatically recognizes because they were in the netlist. V9. for appending to the contents of file_pathname. for creating or replacing the contents of file_pathname. • > file_pathname An optional redirection operator and pathname pair.Command Dictionary Report Primary Outputs Report Primary Outputs Scope: All modes Usage REPort PRimary Outputs [-All | primary_output_pin…] [{> | >>} file_pathname] Description Displays the specified primary outputs. primary_output_pin An optional repeatable string that specifies a list of primary output pins that you want to display.0 June 2010 . used at the end of the argument list. all primary outputs are of the system-defined class. Because there is no Add Primary Outputs command in DFTAdvisor as there is in Tessent FastScan.

for creating or replacing the contents of file_pathname. This is the default.Command Dictionary Report Procedure Report Procedure Scope: All modes except Setup mode Usage REPort PRocedure {procedure_name [group_name]} | -All [{> | >>} file_pathname] Description Displays the specified procedure. group_name An optional string that specifies a particular scan group from which to display the specified procedure. for appending to the contents of file_pathname. The Report Procedure command displays all procedures or the specified procedure. • • -All A switch that specifies for the tool to display all procedures. V9.0 June 2010 225 . used at the end of the argument list. > file_pathname An optional redirection operator and pathname pair. used at the end of the argument list. • >> file_pathname An optional redirection operator and pathname pair. Related Commands Add Scan Groups Read Procfile Report Timeplate Write Procfile Tessent DFTAdvisor Reference Manual. Arguments • • procedure_name A string that specifies which procedure to display.

Command Dictionary Report Read Controls Report Read Controls Scope: All modes Usage REPort REad Controls Description Displays all of the currently defined read control lines. V9. The display also includes the corresponding off-state with each read control line. The Report Read Controls command displays all the read control lines that you previously specified by using the Add Read Controls command. Examples The following example displays a list of the current read control lines: add read controls 0 r1 r3 add read controls 1 r2 r4 report read controls Related Commands Add Read Controls Delete Read Controls 226 Tessent DFTAdvisor Reference Manual.0 June 2010 .

V9. Scan output port name of the scan cell (if -Filename is not specified). the Clock Polarity column contains the polarity of the first clock in the Clock column and the polarity of the second clock in the Clock column.Command Dictionary Report Scan Cells Report Scan Cells Scope: Dft mode Usage REPort SCan CElls [-All | chain_name…] [-SHift_register_flops] [-Filename filename [-Replace]] [-Display {DEBug | DESign | DAta}] [{> | >>} file_pathname] Description Displays a report or writes a file on the scan cells that reside in the specified scan chains. Tessent DFTAdvisor Reference Manual. • • • • • • • • If you issue the command without specifying any arguments. and also scan cells from the inserted scan chains. then DFTAdvisor displays a report on the scan cells for all scan cells in existing scan chains. The following information is provided in the report for each scan cell: • Chain cell index number (where 0 is the scan cell closest to the scan-out pin). Library model name of the scan cell (if -Filename is not specified). Instance name of the scan cell. The Report Scan Cells command provides a report on the scan cells within specific scan chains. The format of the written file is different than the format of the viewed report.When the scan cell is a sub-chain. When the scan cell is a sub-chain.0 June 2010 227 . Polarity of the global clock. When the scan cell is a sub-chain. If you issue the command with the -Filename switch. Name of the scan chain in which the scan cell resides. then DFTAdvisor writes the scan cells to a file in the format that can be read by the Insert Test Logic command. Global clock for each scan cell (if -Filename is not specified). if reporting scan cells on inserted scan chains). You can optionally edit the scan cell order in the file before reading the file with the Insert Test Logic command. whether the clock is leading or trailing edge (if -Filename is not specified). the CellNo column specifies a range from the first to the last cell in the sub-chain separated by a hyphen. Scan group in which the scan chain resides (dummy is the default group name. the Clock column contains the clock for the first cell in the sub-chain and the clock for the last cell in the sub-chain. Associated lockup cells for each clock domain’s transition and active-high to active-low edge domain’s transition when automatic insertion of lockup cells is enabled (if -Filename is not specified).

• -Display {DEBug | DESign | DAta} A switch and literal that displays the reported information graphically in the specified DFTVisualizer window(s). This is the default.Command Dictionary Report Scan Cells Arguments • -All | chain_name… An optional switch or repeatable string. • >> file_pathname An optional redirection operator and pathname pair. • > file_pathname An optional redirection operator and pathname pair. for appending to the contents of file_pathname. for creating or replacing the contents of file_pathname. used at the end of the argument list. • -Filename filename [-Replace] An optional switch and string that specifies that DFTAdvisor writes the list of scan cells to a file. The repeatable string specifies the scan chains whose scan cells you want to display.0 June 2010 . The format of the written file is different than the format of the viewed report. 228 Tessent DFTAdvisor Reference Manual. V9. The -Replace switch specifies that the file should be overwritten if it already exists. The choices are as follows: DEBug — Debug window DESign — Design window DAta — Data window See “Using Tessent DFTVisualizer” for more information. • -SHift_register_flops An optional switch that specifies to print only the shift register flip-flops that are stitched into scan chains. used at the end of the argument list. The -All switch specifies to display the scan cells for all scan chains.

Command Dictionary Report Scan Cells Example 1 The following example displays a list of all scan cells in the DFT system mode: add scan groups group1 scanfile add scan chains chain1 group1 indata2 outdata4 set system mode dft report scan cells -------------------------------------------------------------------------------Chain Group Clock CellNo Name Name Pathname CellName ScanOut Clock Polarity -------------------------------------------------------------------------------0 chain1 group1 /MQ_I400 sffr Q clk2 (+) 1 chain1 group1 /FH_I400 sffr QB clk2 (+) 2 chain1 group1 /FQ_I10 sffr QB clk2 (+) chain1 group1 /lckup1 latch Q clk1 (-) 3 chain1 group1 /RP_I10 sffr Q clk1 (+) 4 chain1 group1 /IS_I10 sffr Q clk1 (+) 5 chain1 group1 /CZ_I400 sffr QB clk1 (+) -------------------------------------------------------------------------------- • • • • • • • • The first column displays the chain cell index number. The fourth column displays the hierarchical path of the scan cell. report scan cells -------------------------------------------------------------------------------Chain Group ShiftReg Clock CellNo Name Name Pathname ID/CellNo CellName ScanOut Clock Polarity -------------------------------------------------------------------------------0 chain1 dummy /ud5 -/sff Q clk (+) 1 chain1 dummy /ud6 -/sff Q clk (+) 2 chain1 dummy /ud4 1/4 dff Q clk (+) 3 chain1 dummy /ud3 1/3 dff Q clk (+) 4 chain1 dummy /ud2 1/2 dff Q clk (+) 5 chain1 dummy /ud1 1/1 sff QB clk (+) -------------------------------------------------------------------------------- Tessent DFTAdvisor Reference Manual. The eighth column displays the polarity of the clock of the scan cell. Example 2 The following example adds the new column ShiftRegID/CellNo to the report when it identifies a shift register in the netlist. The fifth column displays the library model name for the scan cell. The seventh column displays the clock for the scan cell. The third column displays the group name where the scan cell resides. The sixth column displays the scan out port of the scan cell. This column contains a tool-assigned number for the shift register ID and a cell number that indicates the order in which the flip-flops are originally connected in the shift register structures. The second column displays the chain name where the scan cell resides. V9. The column contains “-/-” for those cells that are not part of a shift register.0 June 2010 229 . where 0-0 is the scan cell closest to the scan-out pin.

-------------------------------------------------------------------------------Chain Group Clock CellNo Name Name Pathname CellName ScanOut Clock Polarity -------------------------------------------------------------------------------0 chain1 grp1 /usf2 SCIFTD11S10 SO sysCLK (+) 1 chain1 grp1 /usf1 SCIFTD11S10 SO sysCLK (+) 0-3 chain2 grp1 /um1 &subchain1 SO sysCLK.MYTCLK (+.0 June 2010 .+) 16-17 chain3 grp1 /uC2 &subchain2 so MYTCLK.+) 4-7 chain3 grp1 /uB2/um2 &subchain1 SO MYTCLK. V9.MYTCLK (+.MYTCLK (+.MYTCLK (+. the clock for the first and last cell in the sub-chain are listed in the Clock column.+) 10 chain2 grp1 /uff2 SCIFTD11S10 SO sysCLK (+) 11 chain2 grp1 /uB1/uff2 SCIFTD11S10 SO sysCLK (+) 0-3 chain3 grp1 /um2 &subchain1 SO MYTCLK.sysCLK (+.Command Dictionary Report Scan Cells Example 3 The following example uses the -shift_register_flops switch to print only the shift register flops in the report: report scan cells -shift_register_flops -------------------------------------------------------------------------------Chain Group ShiftReg Clock CellNo Name Name Pathname ID/CellNo CellName ScanOut Clock Polarity -------------------------------------------------------------------------------2 chain1 dummy /ud4 1/4 dff Q clk (+) 3 chain1 dummy /ud3 1/3 dff Q clk (+) 4 chain1 dummy /ud2 1/2 dff Q clk (+) 5 chain1 dummy /ud1 1/1 sff QB clk (+) -------------------------------------------------------------------------------- Example 4 The following example shows the additional output that is reported when sub-chains are encountered.sysCLK (+.sysCLK (+. and the polarity of each clock is listed in the Clock Polarity column.+) 18 chain3 grp1 /uff1 SCIFTD11S10 SO MYTCLK (+) 19 chain3 grp1 /uB1/uff1 SCIFTD11S10 SO MYTCLK (+) 20 chain3 grp1 /uB2/uff1 SCIFTD11S10 SO MYTCLK (+) 21 chain3 grp1 /uB2/uff2 SCIFTD11S10 SO MYTCLK (+) --------------------------------------------------------------------------------- Related Commands Add Scan Chains Add Scan Groups Report Shift Registers 230 Tessent DFTAdvisor Reference Manual.+) 12-15 chain3 grp1 /uB1/um2 &subchain1 SO MYTCLK. the starting and ending cell in a sub-chain are listed as a range value in the CellNo column.MYTCLK (+. Specifically.+) 8-11 chain3 grp1 /uB2/um1 &subchain1 SO MYTCLK.+) 8-9 chain2 grp1 /uC1 &subchain2 so sysCLK.+) 4-7 chain2 grp1 /uB1/um1 &subchain1 SO sysCLK.

for creating or replacing the contents of file_pathname. The Report Scan Chains command provides the following information in a report for each scan chain: • • • • • Name of the scan chain Name of the scan chain group Scan chain input and output pins Length of the scan chain Arguments > file_pathname An optional redirection operator and pathname pair.0 June 2010 231 .Command Dictionary Report Scan Chains Report Scan Chains Scope: All modes Usage REPort SCan CHains [{> | >>} file_pathname] Description Displays a report on all the current scan chains. • >> file_pathname An optional redirection operator and pathname pair. V9. used at the end of the argument list. Examples The following example displays a report of all the scan chains: add scan groups group1 scanfile add scan chains chain1 group1 indata2 outdata4 add scan chains chain2 group1 indata3 outdata5 report scan chains Related Commands Add Scan Chains Delete Scan Chains Echo Tessent DFTAdvisor Reference Manual. for appending to the contents of file_pathname. used at the end of the argument list.

The following details are reported for each scan enable signal: • • • • Primary input port (top-level scan enable port) Internal connection node (internal instance pin designated as the scan enable signal driver) Associated scan chain(s) Arguments > file_pathname An optional redirection operator and pathname pair. used at the end of the argument list.Command Dictionary Report Scan Enable Report Scan Enable Scope: DFT Usage REPort SCan Enable [{> | >>} file_pathname] Description Reports on scan_enable signals and associated scan chains. • >> file_pathname An optional redirection operator and pathname pair. for appending to the contents of file_pathname. used at the end of the argument list. for creating or replacing the contents of file_pathname.0 June 2010 . V9. // command: report scan enable -------------------------------------------------------Primary Input Internal Connection Node Scan Chain -------------------------------------------------------/scan_en -c3 c4 ------------------------------------------------------------/SEN /I_IOPADS/I_SEN/I0/X c1 c2 ------------------------------------------------------------- Related Commands Set Scan Enable Set Scan_enable Sharing 232 Tessent DFTAdvisor Reference Manual. Examples The following example reports the scan_enable details for each of four scan chains.

• >> file_pathname An optional redirection operator and pathname pair. used at the end of the argument list. which contains the information for controlling the scan chains in the reported scan chain group Arguments • > file_pathname An optional redirection operator and pathname pair. for appending to the contents of file_pathname. for creating or replacing the contents of file_pathname. Examples The following example displays a report of all the scan groups: add scan groups group1 scanfile add scan groups group2 scanfile1 report scan groups Related Commands Add Scan Groups Delete Scan Groups Echo Tessent DFTAdvisor Reference Manual.Command Dictionary Report Scan Groups Report Scan Groups Scope: All modes Usage REPort SCan Groups [{> | >>} file_pathname] Description Displays a report on all the current scan chain groups. The Report Scan Groups command provides the following information in a report for each scan chain group: • • • • Name of the scan chain group Number of scan chains within the scan chain group Number of shifts Name of the test procedure file. V9. used at the end of the argument list.0 June 2010 233 .

0 June 2010 . V9.Command Dictionary Report Scan Models Report Scan Models Scope: All modes Usage REPort SCan Models Description Displays the sequential scan models currently in the scan model list. The Report Scan Models command displays sequential models which you previously added to the scan model list by using the Add Scan Models command. Examples The following example displays all the sequential scan models from the scan model list: set system mode dft add scan models d_flip_flop1 d_flip_flop2 report scan models Related Commands Add Scan Models Delete Scan Models 234 Tessent DFTAdvisor Reference Manual.

. Otherwise. partA. Without this switch. • -Expand An optional switch that specifies to display the pathnames of all the sequential instances placed into the scan partitions. The user specified scan partitions are reported in the same order they are specified with the Add Scan Partition command. including the user specified scan partitions and the default scan partition. is added by using exact pathnames of the sequential instances and by the container module name. -All A required switch that specifies to report all scan partitions. used at the end of the argument list. -Default A required switch that specifies to report the default scan partition. the second Tessent DFTAdvisor Reference Manual.Command Dictionary Report Scan Partitions Report Scan Partitions Scope: All modes Usage REPort SCan PArtitions {object_name. for example.0 June 2010 235 . The first partition. for creating or replacing the contents of file_pathname. V9. Arguments • • • object_name A required repeatable string that specifies the name(s) of the scan partition to report. | -Default | -All} [-Expand] [{> | >>} file_pathname] Description Reports the scan partitions. the sequential instances are not reported unless this option is used. the scan partitions are reported in the same format they are defined. If the instances are added to the partition by their container module instance.. • > file_pathname An optional redirection operator and pathname pair. for appending to the contents of file_pathname. used at the end of the argument list. DFTAdvisor reports the scan partitions in the exact format they are declared with the Add Scan Partition command. the pathnames of all the sequential instances placed into the scan partitions are reported. If -expand option is specified. Examples The following example adds two scan partitions. • >> file_pathname An optional redirection operator and pathname pair.

with and without the expand switch.Command Dictionary Report Scan Partitions partition. add sub chain D subch1 si so 5 mux_scan se -subclock clk add nonscan instances /umodA/udff1 add scan partition partA -instance udff1 umodA/udff1 umodB/udff1 -module modD add scan partition partB -instance umodC -number 3 report scan partitions -expand ----------------------------------------------------ScanPartitionName Members ----------------------------------------------------partA udff1 umodA/udff1 umodB/udff1 umodD/subch1 (subchain) umodE/umodD/subch1 (subchain) partB umodC/umodX/udff1 umodC/umodX/udff2 umodC/udff1 umodC/udff2 default_scan_partition udff2 umodA/udff2 umodB/udff2 ----------------------------------------------------- Note that the subchain cells are not reported. report scan partitions ----------------------------------------------------------------------ScanPartitionName TotalNumCells/ScannableCells Members ----------------------------------------------------------------------partA 13/12 udff1 [instance] umodA/udff1 [instance] umodB/udff1 [instance] modD [module] partB 4/4 umodC [instance] default_scan_partition 3/3 <all_remaining_cells> ----------------------------------------------------------------------- An extra column is printed. is added by the container module instance of the sequential instances. Related Commands Add Scan Partition Delete Scan Partitions 236 Tessent DFTAdvisor Reference Manual.0 June 2010 . V9. Also. the sequential instance /umodA/udff1 is still reported as part of the scan partition. partB. the entire subchain is reported with its container module instance. even though it is declared as a nonscan instance. The sequential instances that have S1/S2 scannability rule failure or that are defined nonscan are not included in the ScannableCells section of this column. TotalNumCells/ScannableCells. The subchain cells are counted based on the length specified with the Add Sub Chain command. partA. when the -expand switch is not specified. The scan partitions are then reported twice. rather.

add clocks 0 clk set system mode dft run add scan pins chain1 si so add scan pins chain2 si1 so1 report scan pins insert test logicinsert test logic Related Commands Add Scan Pins Delete Scan Pins Echo Tessent DFTAdvisor Reference Manual. for appending to the contents of file_pathname. Examples The following example displays all scan input and scan output names for the scan chains and then inserts the scan chains. • >> file_pathname An optional redirection operator and pathname pair.Command Dictionary Report Scan Pins Report Scan Pins Scope: All modes Usage REPort SCan PIns [{> | >>} file_pathname] Description Displays all previously assigned scan input. Arguments • > file_pathname An optional redirection operator and pathname pair.0 June 2010 237 . and clock names. used at the end of the argument list. The Report Scan Pins command displays the user-specific names that you have added to the scan input and scan output pins of the scan chains. used at the end of the argument list. V9. for creating or replacing the contents of file_pathname. output.

The Report Seq_transparent Constraints command displays the constraints that you added to the DFT library model clock enable pins with the Add Seq_transparent Constraints command. Examples The following example displays all the seq_transparent constraints.Command Dictionary Report Seq_transparent Constraints Report Seq_transparent Constraints Scope: All modes Usage REPort SEq_transparent Constraints Description Displays the seq_transparent constraints. report seq_transparent constraints Related Commands Add Seq_transparent Constraints Delete Seq_transparent Constraints Setup Scan Identification 238 Tessent DFTAdvisor Reference Manual. You can change the constant value constraints of the pins by using the Add Seq_transparent Constraints command.0 June 2010 . V9.

The scannability condition of a sequential instance is determined by the DRC rule checker. V9. The total number of reported instances is contained in the footer of the report. When you specify multiple filters. Therefore. Arguments • • -SCannable An optional switch that reports the sequential instances that can be placed into scan chains. there may be cells marked as subchain cells even though they are not physically on the specified subchains.0 June 2010 239 . -DEFINED_Nonscan An optional switch that reports the sequential instances you define as non-scannable. • • • -DEFINED_Scan An optional switch that reports the sequential instances you define as scannable. the command reports only the sequential instances that satisfy every filtering condition. If no filters are specified.. and formatting the output columns.. such as printing header and footer information. the command reports all sequential instances in the design. Note that all the cells under the parent module of a subchain are marked as subchain cells. Tessent DFTAdvisor Reference Manual. -Subchain An optional switch that reports the sequential instances contained in user-defined subchains. You can also control the output of the command.Command Dictionary Report Sequential Instances Report Sequential Instances Scope: All modes Usage REPort SEquential Instances [-SCannable] [-NONscannable] [-DEFINED_Scan] [-DEFINED_Nonscan] [-Subchain] [-IDentified] [-Unidentified] [-STitched] [-Polarity {+ | -}] [-CLock clockname …] [-CHain chainname …] [-Library_model modelname …] [-INstance object_pathname . You can display the sequential instances in the design using various filtering options. | -Module object_name …] [-NOHeader] [-NOFooter] [-NOVerbose] [-Format format_code …] [-DRIVEN_SEN_info] [{> | >>} file_pathname] [-DRIVEN_SCAN_pin_cells] Description The Report Sequential Instances command reports information and testability data for the sequential instances in the design. -NONscannable An optional switch that reports the sequential instances that cannot be placed into scan chains.

• -INstance object_pathname … An optional switch and repeatable string that reports the sequential instances that reside under specified instances. Use the format codes described in Table 2-6 to specify columns. Such instances that cannot hold the scannable or non-scannable conditions. which is all the information except the header and the footer.0 June 2010 . 240 Tessent DFTAdvisor Reference Manual. This is only valid after executing a Run command. Table 2-6. V9. Output Format Codes Format_code PN MN Column Pathname Description Pathname of the sequential instance. The footer information includes the total number of reported instances. • • -NOHeader An optional switch that disables reporting of the header information in the output. • -UNidentified An optional switch that reports sequential instances not identified as scannable by DFTAdvisor. Module Name Library module name of the sequential instance. the specified columns are reported in the specified order. -NOFooter An optional switch that disables reporting of the footer information in the output.Command Dictionary Report Sequential Instances • -IDentified An optional switch that reports the sequential instances identified as scannable by DFTAdvisor. When this switch is used. • -Module object_name … An optional switch and repeatable string that reports the sequential instances that reside under specified modules. • -Polarity + | An optional switch and a sign character that reports the sequential instances clocked by stable_low (+) or stable_high (-) clocks. • -NOVerbose An optional switch that reports the body of the report output. • -Format format_code … An optional switch and repeatable string that specifies which information columns to include in the report. • -STitched An optional switch that reports the sequential instances already placed in scan chains.

Name of the primary input pin that clocks the sequential instance. Test-logic is reported if you issue the Set Test Logic -clock ON reset ON … command and DRC determines that test logic is needed for the sequential element to be scannable. By default. Unknown or Test-logic displays. this column is not included in the output. DFT is listed. V9. Output Format Codes Format_code GI Column Gate ID Description Flattened netlist gate ID of the sequential instance. Sequential instance status: • None (before scan identification process) • Unidentified (before scan identification process) • Identified (after scan identification process) • Defined-scan • Defined-nonscan • Defined-nonscan [Driven-SEN] (scan-enable pin is functionally driven) • Subchain • scan cell number (after test logic insertion) ST Status Tessent DFTAdvisor Reference Manual. If this pin is unidentified.0 June 2010 241 .Command Dictionary Report Sequential Instances Table 2-6. If the sequential instance is either a test logic control/observe point or a lockup cell inserted by DFTAdvisor. the chain name is listed. Type Sequential instance type: • Unknown (if in SETUP mode) • Scannable • Pos-scannable • Non-scannable • Ignored • Trans-latch • Constant • chain name or DFT (after test logic insertion) If the sequential instance is part of a scan chain. Available only in DFT mode when the flattened netlist is not freed in the process (before test logic insertion). CN Clock Name CP TY Clock Polarity Clock polarity information for the sequential instance.

dofile) that can be used to remove the functionally-driven sequential instances from the non-scan cell list and include them back into scan insertion. V9. DFTAdvisor reports the existence of functionally-driven sequential instances to the user when it switches to DFT mode. The driver and driven pins can be at different levels of hierarchy where the buffers and inverters between them are transparent to the tool. • -DRIVEN_SCAN_pin_cells An optional switch that reports sequential instances with functionally-driven scan input pins. The scan enable pin is considered functionally driven if the driving pin is a PI pin or an output pin of a library instance that is not an inverter or buffer. unlike the sequential instances with functionally-driven scan enable pins. The driver and driven pins can be at different levels of hierarchy where the buffers and inverters between them are transparent to the tool. otherwise. they are added to the non-scan instance list and a warning message displays. you can define it as the global scan enable pin with the Set Scan Enable command in a new DFTAdvisor session. the tool disconnects the original connections to the scan input pins and stitches them in new scan chains along with the other scan candidates. • > file_pathname An optional redirection operator and pathname pair used at the end of the argument list to create or replace the contents of a specified file with command output. • >> file_pathname An optional redirection operator and pathname pair used at the end of the argument list to append command output to the contents of a specified file. if the reported global scan enable pin (driving pin) is common to all reported sequential instances. The sequential instances with functionally-driven scan input pins are still considered as scan candidates by default. This provides you with the option of examining instances with this switch and including them in the list of previously inserted scan chains via the Add Scan Chains or Add Sub Chains commands.0 June 2010 . Alternately. 242 Tessent DFTAdvisor Reference Manual. The scan input pin is considered to be functionally driven if the driving pin is a PI pin or an output pin of a library instance that is not an inverter or buffer. This also preserves the original connection to the driving scan enable signal for these sequential instances. This switch also writes out a dofile (delete_nonscan_instances_for_driven_sen.Command Dictionary Report Sequential Instances • -DRIVEN_SEN_info An optional switch that reports sequential instances with functionally-driven scan enable pins. Once defined. it will be used as the scan enable signal during scan insertion. When functionally-driven sequential instances are found.

Command Dictionary Report Sequential Instances Example The following example identifies sequential instances with functionally driven scan enable pins. 1) These scan cells have been added to the non-scan cell list by the tool 2) You can use the Report Sequential Instances command to examine them 3) If a pre-routed global scan enable is used. set system mode dft // // // // // // // // // // Warning: The design includes scan cells whose scan enable pins are driven. report sequential instances ----------------------------------------------------------------------Model Clock Clock PathName Name Name Polarity Type Status -----------------------------------------------------------------------udff4 sff clk (+) Scannable Defined-nonscan [Driven-SEN] uA/udff3 sff clk (+) Scannable Defined-nonscan [Driven-SEN] uA/udff1 sff clk (+) Scannable Defined-nonscan [Driven-SEN] uA/udff2 sff clk (+) Scannable Unidentified ------------------------------------------------------------------------Number of instances: 4 The following command reports on the sequential instances with driven scan enable pins. The following command sets DFT mode. 4) You can also use the Delete Nonscan Instances command to preserve the original scan enable pin driver without specifying a global scan enable pin and a re-evaluation.dofile' // is written out in the current directory. V9. The following command reports all sequential instance types. Tessent DFTAdvisor Reference Manual. you can define it using the 'Setup Scan Insertion' command to have these cells re-evaluated.0 June 2010 243 . runs DRC and returns a warning message when driven scan enable pins are found. and restores the sequential instances to the scannable cell list with the original scan enable connections preserved. report sequential instances -driven_sen_info -------------------------------------------------------------------------------Model Clock Clock Sen SenDriver PathName Name Name Polarity Type Status Pinname PinPathname -------------------------------------------------------------------------------udff4 sff clk (+) Scannable Defined-nonscan SE /sen uA/udff3 sff clk (+) Scannable Defined-nonscan SE /sen uA/udff1 sff clk (+) Scannable Defined-nonscan SE /uA/ux/Y -------------------------------------------------------------------------------Number of instances: 3 // Note: A dofile named 'delete_nonscan_instances_for_driven_sen.

.dofile // // // command: delete nonscan instances udff4 command: delete nonscan instances uA/udff3 command: delete nonscan instances uA/udff1 The following command runs the scan identification process as specified by the Setup Scan Identification command. dofile delete_nonscan_instances_for_driven_sen. insert test logic report sequential instances ---------------------------------------------------Model Clock Clock PathName Name Name Polarity Type Status ---------------------------------------------------udff4 sff clk (+) chain1 0 uA/udff3 sff clk (+) chain1 1 uA/udff1 sff clk (+) chain1 2 uA/udff2 sff clk (+) chain1 3 ---------------------------------------------------Number of instances: 4 244 Tessent DFTAdvisor Reference Manual..Command Dictionary Report Sequential Instances The following command executes the dofile created by the previous example and deletes the instances from the non-scan cell list. run // // // Number of targeted sequential instances = 4 Performing scan identification .0 June 2010 . V9. report sequential instances -----------------------------------------------------------------------Model Clock Clock PathName Name Name Polarity Type Status -----------------------------------------------------------------------udff4 sff clk (+) Scannable Identified [Driven-SEN] uA/udff3 sff clk (+) Scannable Identified [Driven-SEN] uA/udff1 sff clk (+) Scannable Identified [Driven-SEN] uA/udff2 sff clk (+) Scannable Identified -----------------------------------------------------------------------Number of instances: 4 The following commands insert test logic and report on the inserted sequential instances stitched into scan chains. Total sequential instances identified = 4 The following command reports on all sequential instances.

Command Dictionary Report Sequential Instances Related Commands Add Nonscan Instances Delete Nonscan Instances Echo Insert Test Logic Report Circuit Components Report Dft Check Report Scan Cells Run Set Scan Enable Set System Mode Tessent DFTAdvisor Reference Manual. V9.0 June 2010 245 .

ud4 + clk dff // Number of sequential elements in design: 6 // Number of shift register flops recorded for scan insertion: 4 // => 66.Command Dictionary Report Shift Registers Report Shift Registers Scope: DFT mode Usage REPort SHift Registers [-Verbose | -Summary] Description Reports the identified shift registers in the design after switching to DFT mode.0 June 2010 .. Therefore.67% of all sequential elements in design // Number of shift registers recorded for scan insertion: 1 // Longest shift register has 4 flops. V9. -Summary An optional switch that reports a summary text without printing the flip-flops identified in the shift registers. // Shortest shift register has 4 flops.. before and after the execution of the Insert Test Logic command. this command may report the shift registers in the design differently. // Potential number of nonscan flops to be converted to scan cells: 1 // Potential number of scan cells to be converted to nonscan flops: 0 246 Tessent DFTAdvisor Reference Manual. For each identified shift register. The tool tries to preserve the original connections inside the identified shift registers during stitching. this command reports the following information: • • • Length Hierarchical path where the shift register flip-flops reside First and last flip-flop instance name unless the -verbose switch is specified in which case all flip-flops in the shift registers are reported Arguments • • -Verbose An optional switch that reports all of the flip-flops identified in the shift registers. Example 1 The following example shows the output when neither switch is specified: report shift registers -------------------------------------------------------------------Hierarchical SequentialCell Clock Library Id Length Path InstanceName Edge & Name ModelName -------------------------------------------------------------------[1] 4 / ud1 + clk dff .

Command Dictionary Report Shift Registers Example 2 The following example shows the output when the -verbose switch is specified: report shift registers -verbose -------------------------------------------------------------------Hierarchical SequentialCell Clock Library Id Length Path InstanceName Edge & Name ModelName -------------------------------------------------------------------[1] 4 / ud1 + clk dff ud2 + clk dff ud3 + clk dff ud4 + clk dff // Number of sequential elements in design: 6 // Number of shift register flops recorded for scan insertion: 4 // => 66.67% of all sequential elements in design Number of shift registers recorded for scan insertion: 1 Longest shift register has 4 flops.67% of all sequential elements in design // Number of shift registers recorded for scan insertion: 1 // Longest shift register has 4 flops. // Shortest shift register has 4 flops. // Potential number of nonscan flops to be converted to scan cells: 1 // Potential number of scan cells to be converted to nonscan flops: 0 Example 3 The following example shows the output when the -summary switch is specified: report shift registers -summary // // // // // // // // Number of sequential elements in design: 6 Number of shift register flops recorded for scan insertion: 4 => 66. V9.0 June 2010 247 . Potential number of nonscan flops to be converted to scan cells: 1 Potential number of scan cells to be converted to nonscan flops: 0 Related Topics Setup Shift_register Identification Tessent DFTAdvisor Reference Manual. Shortest shift register has 4 flops.

This subgroup may additionally contain total numbers for the following internal patterns sets: basic scan patterns Clock_po patterns Ram_sequential patterns Clock_sequential patterns o o Total patterns currently in the test pattern set Total CPU time If a pattern type has no patterns. used at the end of the argument list. The Report Statistics command displays a detailed statistics report to the screen. it will not display any count. it counts clock_sequential patterns that are also clock_po only as clock_sequential patterns. V9.0 June 2010 . 248 Tessent DFTAdvisor Reference Manual. And.Command Dictionary Report Statistics Report Statistics Scope: All modes Usage REPort STAtistics [{> | >>} file_pathname] Description Displays a detailed report of the design’s statistics. the report does not display the count for that type. The report includes the following information when in Setup and Dft modes: • • • • • • • • • Total number of sequential instances Number of defined non-scan instances Number of non-scan instances identified by the DRC Number of defined scan instances Number of scan instances identified by the DRC Number of identified scan instances Number of scannable instances with test logic Number of pre-existing scan chains The total numbers for the following: o Total patterns simulated in the preceding fault simulation process. Arguments • > file_pathname An optional redirection operator and pathname pair. for creating or replacing the contents of file_pathname. If all patterns are basic patterns.

used at the end of the argument list.50%) =5 (12.Command Dictionary Report Statistics • >> file_pathname An optional redirection operator and pathname pair. for appending to the contents of file_pathname.50%) =10 =5 Related Commands Echo Tessent DFTAdvisor Reference Manual.50%) =5 (12.50%) =5 (12.0 June 2010 249 .50%) =5 (12. Examples The following example displays the statistics report after performing the scan identification process in Dft mode: add clocks 0 clock set system mode dft run report statistics Total number of sequential instances Number of defined nonscan instances Number of nonscan instances identified by drc Number of defined scan instances Number of scan instances identified by drc Number of identified scan instances Number of scannable instances Number of scannable instances with test logic =40 =5 (12. V9.

For LSSD. Arguments • > file_pathname An optional redirection operator and pathname pair. the report includes the scan clock. name of the subchain. For mux-scan. defined length of the subchain.Command Dictionary Report Sub Chains Report Sub Chains Scope: All modes Usage REPort SUb Chains [{> | >>} file_pathname] Description Displays a report on the scan subchains. for creating or replacing the contents of file_pathname. • >> file_pathname An optional redirection operator and pathname pair. used at the end of the argument list. For clocked-scan. Examples The following example generates a report for a scan subchain: add sub chains /instA subch1 /si1 /so1 10 mux_scan -sen_core sen -instance report sub chains mux_scan: instA subc1 10 si1 so1 sen Related Commands Add Sub Chains Delete Sub Chains Echo 250 Tessent DFTAdvisor Reference Manual. the report includes the scan enable of the subchain. and the scan output of the subchain. used at the end of the argument list. scan input of the subchain. for appending to the contents of file_pathname. V9. The Report Sub Chains command transcripts the scan subchain definition(s).0 June 2010 . the report includes the scan master clock and the scan slave clock. module or instance pathname. which includes the scan type.

0 June 2010 251 .Command Dictionary Report Subchain Clocks Report Subchain Clocks Scope: All modes Usage REport SUbchain CLocks subchain_name Description Reports on subchain clocks defined with the Add Subchain Clocks command.--------. Arguments • subchain_name A required string that specifies the name of a subchain.-----------RESET reset 0 SET set 0 CK first cell clock 0 CK last cell clock 0 edge ----- leading edge leading edge delete subchain clocks chain1 CK report subchain clocks chain1 // // // // clock name type off_state edge ---------.----.-----RESET reset 0 SET set 0 Related Commands Add Subchain Clocks Delete Subchain Clocks Tessent DFTAdvisor Reference Manual. V9. Examples add sub chains MULTIBITSFF3 chain1 SI SO 4 mux_scan S library_model add subchain clocks chain1 0 RESET -reset add subchain clocks chain1 0 SET -set add subchain clocks 0 CK -first_cell_clock -leading_edge add subchain clocks 0 CK -last_cell_clock -leading_edge report subchain clocks chain1 // // // // // // clock name type off_state ---------.

The Report Subchain Groups command transcripts the subchain group definitions used in Add Subchain Group command.0 June 2010 . and the type of the subchain group. add subchain group subchaingroup1 subchain1 subchain2 -fixed add subchain group subchaingroup2 subchain3 subchain4 -flexible report subchain groups ----------------------------------------------SubchainGroupName Type ListOfSubchains ----------------------------------------------subchaingroup1 fixed subchain1 subchain2 subchaingroup2 flexible subchain3 subchain4 Related Commands Add Subchain Group Add Sub Chains Delete Sub Chains Delete Subchain Groups Report Sub Chains 252 Tessent DFTAdvisor Reference Manual. the list of subchains. V9.Command Dictionary Report Subchain Groups Report Subchain Groups Scope: All modes Usage REPort Subchain Groups Description Displays a report on the subchain groups. The definitions include the name of the subchain group. Examples The following example illustrates the usage and the output format of the Report Subchain Groups command.

• -Summary An optional switch that displays a summary that contains the number of each module and instance-based DFT library model that DFTAdvisor inserted. for creating or replacing the contents of file_pathname.Command Dictionary Report Test Logic Report Test Logic Scope: All modes Prerequisites: Test logic or test points must be added with the Insert Test Logic command. • >> file_pathname An optional redirection operator and pathname pair. This option also includes a summary of the number of each module-based DFT library model that DFTAdvisor inserted. and the corresponding DFT library models that DFTAdvisor inserted as test logic and test points. Arguments • -Instance An optional switch that displays the list of instance pathnames and the corresponding DFT library model that DFTAdvisor inserted as test logic and test points. Tessent DFTAdvisor Reference Manual. the list of instance pathnames. • -Module An optional switch that displays the list of module names. for appending to the contents of file_pathname. This is the default. Usage REPort TEst Logic [-Instance | -Module | -Summary | -Location] [{> | >>} file_pathname] Description Displays the test logic that DFTAdvisor added during the scan insertion process. • > file_pathname An optional redirection operator and pathname pair. V9. This option also includes a summary of the number of each instance-based DFT library model that DFTAdvisor inserted. used at the end of the argument list. The Report Test Logic command displays information about the test logic that DFTAdvisor added during the scan insertion process as a result of the Set Test Logic and Add Test Points commands. used at the end of the argument list.0 June 2010 253 . • -Location An optional switch that displays the pin pathname where DFTAdvisor inserted test logic and identifies whether it was a result of the test logic settings or test points that you specified.

The report displays the locations where DFTAdvisor inserted the test logic as a result of both the Add Test Point command and the Set Test Logic command: add cell models and2a -type and add cell models inv1a -type inv add cell models mux1a -type mux s a b add test point /I_6_16/cp control and2a control_input set test logic -set on -reset on set system mode dft run insert test logic report test logic -location /I_6_16/reset (test points) /I_7_16/set (scan cell) Related Commands Add Test Points Delete Test Points Echo Report Test Points 254 Tessent DFTAdvisor Reference Manual.0 June 2010 .Command Dictionary Report Test Logic Examples The following example uses both test logic and test points. V9.

You can create user-defined test points with the Add Test Points command.and system-defined) with added lockup cells. You can enable DFTAdvisor to automatically identify test points using a combination of the Setup Scan Identification. However. Arguments • -Full An optional switch that displays all of the information available on both control and observe test points for both the user-defined and the system-defined test points. By default. DFTAdvisor does not actually generate the test point circuitry until you issue the Insert Test Logic command. DFTAdvisor could not force certain state values. The report marks the system-defined test points with “[Selected]” prior to the test point information.Command Dictionary Report Test Points Report Test Points Scope: All modes Usage REPort TEst Points [-Full | -Control | -Observe | -Lockup] [-Wrapper_chains_identified] [{> | >>} file_pathname] [-Wrapper_chains_identified] Description Displays both user-defined and system-defined test points. Such test points may be added only if the -Test_points switch is specified with the Setup Pin Constraints command. This is the default. all the test points are reported. • -Wrapper_chain_identified An optional switch that reports the test points automatically added during the wrapper cell identification process.and system-defined) that are for the purpose of enabling better test coverage in design areas where. • -Lockup An optional switch that displays all test points (both user. Setup Test_point Identification. Setup Test_point Insertion.0 June 2010 255 . previously. The -Control or -Observe switches can be used along with this switch to display either control or observe test points of this type.and system-defined) that are for the purpose of enabling better test coverage by allowing the tester access to certain fault effects. Tessent DFTAdvisor Reference Manual. V9. and Run commands. • -Control An optional switch that displays all the test point definitions (both user. • -Observe An optional switch that displays all the test point definitions (both user.

Examples The following example creates one user-defined control point and one user-defined observe point and then reports their definitions: add test points /I_7_16/q Observe observe_output add cell models and2a -type and add cell models sdff1a -type sdff clk data add test points /I_6_16/reset control and2a tp_clk -new_scan_cell sdff1a insert test logic report test points Control: /I_6_16/reset Control and2a tp_clk -New_scan_cell sdff1a // (internal scan) ctlff1 Observe: /I_7_16/q Observe observe_output The control point report columns consist of the control point pathname. for appending to the contents of file_pathname. used at the end of the argument list. Related Commands Add Test Points Delete Test Points Echo Insert Test Logic Report Test Logic Run Setup Pin Constraints Setup Scan Identification Setup Test_point Identification Setup Test_point Insertion 256 Tessent DFTAdvisor Reference Manual. the library model name used for the control point. the library model name used for the scan cell. The last two columns are not printed if the command is issued before the Insert Test Logic command. V9. and the instance pathname for the scan cell inserted.Command Dictionary Report Test Points • > file_pathname An optional redirection operator and pathname pair.0 June 2010 . The observe point report columns consists of the observe point pathname and the primary output pin created for the observe point. • >> file_pathname An optional redirection operator and pathname pair. for creating or replacing the contents of file_pathname. the top-level clock pin specified for the control point scan cell. used at the end of the argument list. the type of scan chain the test point inserted into.

and Run commands. Setup Test_point Identification. This is the default. Tip: For more information. which allows you access to the controllability and observability values. You can then generate test points (either manually or automatically) based on the results of the testability analysis to help increase the design’s fault coverage. you need to use a combination of the Setup Scan Identification.Command Dictionary Report Testability Analysis Report Testability Analysis Scope: Dft mode Prerequisites: You must first issue the Analyze Testability command to calculate the values on which to report. you need to use the Add Test Points command. Arguments • pathname An optional string that specifies the instance name whose pins for which you want DFTAdvisor to display the controllability or observability values. The Analyze Testability command calculates the controllability and observability values for each gate in the flattened design. • -Controllability An optional switch that specifies for DFTAdvisor to only display the pin controllability values. If you are going to manually investigate the results of the testability analysis and insert userdefined test points. The Report Testability Analysis command displays a columnar list of either the controllability or observability values for each pin in the flattened design. Usage REPort TEstability Analysis [pathname] [-Controllability | -OBservability] [{-Number integer} | {-Percent integer} | {-OVer integer}] Description Displays the results of the Analyze Testability command. The default is all pins for all instances. The -Controllability and -Observability switches determine the column definitions.0 June 2010 257 . If you are going to have DFTAdvisor automatically identify (system-defined) test points. you can re-invoke DFTAdvisor to perform the testability analysis. If the design’s fault coverage in Tessent FastScan is lower than you desire. V9. The controllability report displays the following information in columnar format: o o The controllability value for the low logic state The controllability value for the high logic state Tessent DFTAdvisor Reference Manual. see “Setting Up for Test Point Insertion” in the Scan and ATPG Process Guide.

V9. • -OBservability An optional switch that specifies for DFTAdvisor to only display the pin observability values. the report displays NC (non-controllable) for the corresponding logic state. • -Number integer An optional switch and integer pair that specifies the maximum number of pins whose values you want to display. You determine the total number of available design pins by whether you specify or do not specify the instance pathname argument. If you specify the -Number switch. the report displays NO (non-observable). set system mode dft setup scan identification none analyze testability -scoap_only setup test_point identification -control 1 run 258 Tessent DFTAdvisor Reference Manual.Command Dictionary Report Testability Analysis o o o The primitive gate type The gate identification number The pathname to the gate If DFTAdvisor cannot control the inputs of a gate.0 June 2010 . you must provide the associated integer. Examples The following example displays the controllability values of five percent of all the pins in the design. If you specify the -Over switch. you must provide the associated integer. you must provide the associated integer. • -OVer integer An optional switch and integer pair that specifies the minimum controllability or observability values whose pins you want to display. The observability report displays the following information in columnar format: o o o o The observability value The primitive gate type The gate identification number The pathname to the gate If DFTAdvisor cannot observe the outputs of a gate at any observation point. If you specify the -Percent switch. • -Percent integer An optional switch and integer pair that specifies the percentage of the total number of available design pins whose values you want to display.

Number of control points to be identified = 1 Number of observe points to be identified = 0 1: CV1=16458417 gate_index=3805 INV /CNTR/U783/ZN report testability analysis -controllability -percent 5 NC 0 100 0 NC 1 BUF INV BUF 25 27 39 /I_6_16 /I_7_14 /I_8_21 The report displays the controllability value for the low logic state (where NC means noncontrollable). V9. the controllability value for the high logic state.Command Dictionary Report Testability Analysis // // // // Performing test_point identification .. Related Commands Analyze Testability Tessent DFTAdvisor Reference Manual.. the gate identification number. the primitive gate type. and the pathname to the gate.0 June 2010 259 .

Arguments • -Class Full | User | System An optional switch and literal pair that specifies the source (or class) of the tied floating signals or pins which you want to display. • >> file_pathname An optional redirection operator and pathname pair. If you do not specify a class.Command Dictionary Report Tied Signals Report Tied Signals Scope: All modes Usage REPort TIed Signals [-Class {Full | User | System}] [{> | >>} file_pathname] Description Displays a list of the tied floating signals and pins. This is the default. system class. The Report Tied Signals command displays either the user class. The valid literals are as follows: Full — A literal that specifies to display all the tied floating signals or pins in the user and system class.0 June 2010 . System — A literal that specifies to only display the tied floating signals or pins described in the netlist. or full classes of tied floating signals and pins. for creating or replacing the contents of file_pathname. used at the end of the argument list. add tied signals 1 vcc vdd report tied signals -class user Related Commands Add Tied Signals Delete Tied Signals Report Black Box Setup Tied Signals 260 Tessent DFTAdvisor Reference Manual. used at the end of the argument list. This includes all instance-based blackbox tied signals. V9. User — A literal that specifies to only display the tied floating signals or pins that you created by using the Add Tied Signals command. Examples The following example will display the tied signals from the user class. the command displays all the tied floating signals and pins. • > file_pathname An optional redirection operator and pathname pair. for appending to the contents of file_pathname.

The Report Timeplate command displays all timeplates or the specified timeplate. -All A switch that specifies for the tool to display all timeplates. V9. This is the default. for appending to the contents of file_pathname.Command Dictionary Report Timeplate Report Timeplate Scope: All modes except Setup mode Usage REPort TImeplate timeplate_name | -All [{> | >>} file_pathname] Description Displays the specified timeplate. • >> file_pathname An optional redirection operator and pathname pair. Related Commands Add Scan Groups Read Procfile Report Procedure Write Procfile Tessent DFTAdvisor Reference Manual. Arguments • • • timeplate_name A string that specifies which timeplate to display. used at the end of the argument list. for creating or replacing the contents of file_pathname. used at the end of the argument list.0 June 2010 261 . > file_pathname An optional redirection operator and pathname pair.

Multiple variable references are allowed per tool command. You must define variables before they are referenced. Reporting — Use the Report Variables command to display user-defined variables and values. refers to them within tool commands. This condition behaves like any other syntax error that may be present on the command line or within a dofile. referenced. throughout a dofile.42 run insert test logic write netlist -verilog ${design_base_dir}/${design_base_file}. then use the $variable-name construct as in the following example: insert test logic -max_length $MAX_SCAN_LEN -scan on Variables are not expanded if there has been no definition.0 June 2010 .v report variables 262 Tessent DFTAdvisor Reference Manual. and reported on in the following manner: 1. set system mode dft $design_base_file = scan $design_base_dir = /$USER/dft_scan_designs $max_scan_len = 100 $revision = 1. V9. Variables are defined.. 3.Command Dictionary Report Variables Report Variables Scope: All modes Usage REPort VAriables Description Displays user-defined variables and values. Defining — Use the following syntax to create and set a variable’s value. or from a startup file. ${variable} If a variable is not meant to be concatenated with any other strings. Define variables from the tool’s command line. This list does not include environment variables defined in the parent shell environment. REPort VAriables Examples The following example defines four variables.. The Report Variables command displays the list of user-defined variables and their corresponding values. $variable = value 2. Referencing — To refer to a variable causes its value to be substituted into a command. and displays a list of all variables: .

v -library atpg.0 June 2010 263 .Command Dictionary Report Variables design_base_dir /$USER/dft_scan_designs design_base_file scan revision 1..42 max_scan_len 100 Note As $USER is defined in the parent shell environment.chain.do And the scan. insert $NUM_SCAN_CHAINS scan chains" insert test logic -number $NUM_SCAN_CHAINS report scan chains > reports/${MY_DESIGN}. it is available for use within the tool and in other variable definitions..do file can reference the variables: echo ". V9. processing $MY_DESIGN " analyze control signals -auto_fix set test logic -reset on -set on set system mode dft setup scan identification full_scan run echo ".report write netlist netlists/${MY_DESIGN}_scan. The next example invokes DFTAdvisor with a parameterized dofile: A UNIX script file can contain the variable settings: #!/bin/csh setenv MY_DESIGN m8051 setenv NUM_SCAN_CHAINS 8 dftadvisor -verilog ${MY_DESIGN}..testlogic..report report test logic -summary > reports/${MY_DESIGN}.lib -dofile scan.v -verilog -rep write atpg setup scripts/${MY_DESIGN} -rep exit Related Commands Printenv Tessent DFTAdvisor Reference Manual.

Examples The following example adds four write control lines and then displays a list of the control line definitions: add write controls 0 w1 w3 add write controls 1 w2 w4 report write controls Related Commands Add Write Controls Delete Write Controls 264 Tessent DFTAdvisor Reference Manual.Command Dictionary Report Write Controls Report Write Controls Scope: All modes Usage REPort WRite Controls Description Displays the currently defined write control lines and their off-states. V9. that you previously added by using the Add Write Controls command.0 June 2010 . The Report Write Controls command displays the write control lines. with corresponding offstates.

If.Command Dictionary Reset State Reset State Scope: All modes Usage RESet STate Description Removes all instances from both the scan identification and test point identification lists that DFTAdvisor identified during a run. this command has no effect on these. The Reset State command removes scan instances or test points identified with the Run command.0 June 2010 265 . reset state setup scan identification sequential atpg -percent 75 run report sequential instances . however. . then removes the identified scan instances and performs a 75 percent ATPG scan identification process: set system mode dft setup scan identification full_scan run report sequential instances . Tessent DFTAdvisor Reference Manual. V9. . . . you have stitched the scan chain or inserted test points. Examples The following example performs a full scan identification process.

the instance has only one connected port and that port was declared as the clock/enable port. Arguments • • • -All A switch that specifies to remove all scan chains. You can remove (rip up) either all the scan chains or individual scan chains. b. Normally. Note that lockup cell insertion is optional. If this switch is not specified. chain_name A repeatable string that specifies the names of the scan chains that you want to remove. If you only want to remove a scan chain definition that you previously created with the Add Scan Chains command.0 June 2010 . V9. this command only removes the scan circuitry. lockup cell insertion should be activated during the DFTAdvisor session after placement.Command Dictionary Ripup Scan Chains Ripup Scan Chains Scope: Dft mode Usage RIPup SCan Chains {-All | chain_name…} [-Output] [-Keep_scancell [Off | Tied | Loop | Buffer]] [-Model model_name] Description Removes the specified scan chains from the design.) After chain removal. You can also rip up the scan chain output pin. The connections of all other ports are not altered and the scan cells are not mapped to their non-scan models. Note If the design contains test logic in addition to scan circuitry. • -Keep_scancell [Off | Tied | Loop | Buffer] An optional switch and literal pair that specifies to remove the connection between the scan input/output ports of each scan cell. use the Delete Scan Chains command. -Output An optional switch that specifies that the existing scan chain output pins are to be ripped up together with the scan chains. not the test logic. This command removes any inserted lockup cell under the following conditions: a. The Ripup Scan Chains command removes scan chains that DFTAdvisor placed during the scan insertion process.) The latch is an instance of a cell library model previously defined as a DLAT model. you would not allow lockup cell insertion during the DFTAdvisor session(s) before layout. the default 266 Tessent DFTAdvisor Reference Manual.

Examples The following example illustrates usage of the Ripup Scan Chains command. Buffer —DFTAdvisor disconnects the scan_out pin and scan_in pin and connects them to each other as a self-loop with a buffer in between for each scan cell. Tied — DFTAdvisor disconnects the scan_out pin and scan_in pin and ties them to ground. If you do not specify the -Model switch.testproc add scan chains chain1 group1 scan_in1 scan_out1 set system mode dft report scan chains ripup scan chains -all Related Commands Add Scan Chains Report Scan Chains Tessent DFTAdvisor Reference Manual. Off — DFTAdvisor disconnects the scan_out pin and scan_in pin and leaves them dangling. by default.Command Dictionary Ripup Scan Chains is to remove the connections of all test ports and map the scan cells back to their original non-scan model. V9. This option is only valid if you specify the “-Keep_scancell Buffer”. This is the default. Loop — DFTAdvisor disconnects the scan_out pin and scan_in pin and connects them to each other as a self-loop for each scan cell.0 June 2010 267 . add clocks 0 clock add scan groups group1 scan. You must first identify the buffer with either the Add Cell Models command or with the cell_type library attribute. DFTAdvisor uses the first buffer model in the buffer cell model list—see the Report Cell Models command. • -Model model_name An optional switch and string pair that specifies the name of a buffer in the ATPG library for DFTAdvisor to insert in the self-loop.

if you set the identification type to sequential. the second number indicates the estimated percentage of toggle coverage. The first number indicates the number of instances currently identified for scan (added to the scan candidate list).0 June 2010 . DFTAdvisor displays progress messages. During the observability phase. For example. The Run command performs the scan identification process. The Run command performs the scan or test point identification process in Dft mode depending on the identification type you set with the Setup Scan Identification command.31%) Examples The following example runs a scan identification process: set system mode dft setup scan identification sequential atpg run report sequential instances Related Commands Setup Scan Identification Setup Test_point Identification 268 Tessent DFTAdvisor Reference Manual.Command Dictionary Run Run Scope: Dft mode Usage RUN Description Runs the scan or test point identification process. the tool may display the following for the controllability phase: // Sequential instances identified = 238 (Controllability = 97. and the test point identification process as indicated by the Setup Test_point Identification command. During the controllability phase. During the identification run. this number indicates the estimated observability coverage of stuck-at faults. V9. as indicated by the Setup Scan Identification command (if the identification type is set to -Sequential).

Command Dictionary Save History Save History Scope: All modes Usage SAVe HIstory filename [-Replace] Description Saves the command line history file to the specified file. Examples The following example displays the current history list.0 June 2010 269 . V9. Arguments • filename A required string that specifies the name of the file in which the tool saves the command line history list. if a file by that name already exists. history -nonumbers add clocks 0 clock set system mode dft setup scan identification sequential atpg -percent 50 run setup scan insertion -seb MY_SEN insert test logic -nolimit report scan chains ripup scan chains -all set system mode setup set system mode dft reset state setup scan identification sequential atpg -percent 50 run insert test logic -max_length 100 report scan chains history -nonumbers save history my_history -replace Related Commands Dofile History Set Command Editing Tessent DFTAdvisor Reference Manual. The Save History command saves the list of previously executed commands in the file that you specify. then saves it in a file called my_history. You can then execute the file using the Dofile command. which already exists. • -Replace An optional switch that specifies for the tool to overwrite the contents of filename.

no gating is necessary and a force statement for the primary input is added to the load_unload procedure in the new procedure file. V9.Command Dictionary Set Bidi Gating Set Bidi Gating Scope: Setup mode Usage SET BIdi Gating [OFf | ON | Scan] [-Control {SEn | TEn}] [-Direction {Input | Output}] [-Top {ALl | primary_bidi_pin. When enabled. This behavior can be overridden by using the -Force_gating switch. or by TIE1. see “Enabling Test Logic Insertion” in the Scan and ATPG Process Guide. Options include: Input — bidi pins are gated so they are in input mode.. Arguments • OFf | ON | Scan Required literal that specifies whether to insert test logic to control the enable lines of bidi pins during scan chain shifting. You can also specify which enable signal (TEN or SEN) enables bidi pins. TEn — test_enable signal. when the enable signal of a bidi pin is directly controlled by a primary input. Output — bidi pins are gated so they are in output mode. 270 Tessent DFTAdvisor Reference Manual. Literal options include: OFf — no test logic is inserted to control bidi pins.. • -Control SEn | TEn An optional switch and literal pair that specifies the enable signal used to control bidi pins. Default setting. For more information on scan chain shifting. Scan — inserts test logic on the scan I/O bidi pins to control the direction of the bidi pin for scan shifting and ensure the success of scan chain tracing. Default setting. • -Direction Input | Output An optional switch and literal pair that specifies the direction of the bidi pins specified by the -Top switch. Scan output bidi pins are gated to be in output mode while all other bidi pins are gated to be in input mode (Z state on the tester).}] [-Force_gating] Description Specifies how bidirectional (bidi) pins are controlled during scan chain shifting to prevent potential bus contention or to ensure an on/off state during testing. test logic is inserted for bidi pins as necessary to control the enable signal and/or the input/output direction as specified. by TIE0. ON — test logic is inserted as necessary to control bidi pins. Default setting. By default.0 June 2010 . Options include: SEn — scan_enable signal.

set bidi gating on -control ten -direction input -top dinout[1] -force_gating report dft check -tri Tessent DFTAdvisor Reference Manual. its enable signal is directly controlled by the primary input /io_control1. When the enable line is directly controlled by a primary input. Test logic is inserted to ensure that these bidi pins are controlled as specified. • -Force_gating An optional switch that adds test logic to the enable lines of bidirectional pins that are directly controlled by primary inputs. by TIE1. An optional switch and literal or repeatable string pair that specifies which bidi pins are controlled with the specified enable signal. Example 1 The following example uses the Set Bidi Gating command to insert test logic to control all bidi pins used for scan I/O via the SEN signal. add clocks 0 clk setup scan identification full_scan set tristate gating on set bidi gating scan add scan pins c1 bidi_in1/X blkB1/blkA/utri2/A -top io out1 set system mode dft report dft check -full ------------------------------------------------------------------------Bidi Primitive Control Control Tri-state State Direction Gating ID Signal Driver ------------------------------------------------------------------------/bidi_in1 OFF IN YES 20 SEN /or2/Y /blkB1/blkA/utri3 OFF -YES 15 SEN /udff0/Q /blkB1/blkA/utri2 ON -YES 17 SEN /or2/Y /blkB1/blkA/utri1 OFF -YES 16 SEN /or2/Y ------------------------------------------------------------------------- Example 2 The following example uses the force_gating switch to insert gating logic controlled by the TEN control signal on the enable line of /uio1 and reports the gated tri-state devices. Options include: ALl — all bidi pins. or by TIE0.0 June 2010 271 . Default setting. primary_bidi_pin — a specified primary bidi pin. and reports the gated bidi pin..Command Dictionary Set Bidi Gating • -Top ALl | primary_bidi_pin.. /uio1 is a bidirectional device driving primary inout port dinout[1]. V9. DFTAdvisor adds the force statement for this primary input to the load_unload procedure in the procedure file.

0 June 2010 . V9.Command Dictionary Set Bidi Gating ----------------------------------------------------------------------Bidi Primitive Control Control Tri-state State Direction Gating ID Signal Driver ----------------------------------------------------------------------/uioM OFF IN YES 84 TEN /udff20/QB /uio3 ON OUT YES 77 SEN /io_control /uio2 OFF IN NO 76 SEN /io_control /uio1 OFF IN YES 75 TEN /io_control1 /uio0 OFF IN NO 73 SEN /io_control ----------------------------------------------------------------------- Related Commands Report Dft Check Report Test Logic Report Control Signals Set Test Logic Set Tristate Gating 272 Tessent DFTAdvisor Reference Manual.

Also. If you do not specify a capture clock with this command. • -Atpg An optional switch that specifies for the tool to use the capture clock for all scan patterns it creates during the ATPG process. You can specify the name of either a specific pin or a clock procedure in a test procedure file that identifies the pin. the pin must be a currently defined clock pin.0 June 2010 273 . DFTAdvisor sets the capture clock to none. You can use the Report Environment command to list the capture clock and the Report Clocks command to identify the current list of clocks. DFTAdvisor sets that clock as the capture clock during rules checking and displays a warning message that identifies the capture clock. If there is no capture clock and there is only one clock in the circuit that is not a set or reset line. V9. • clock_procedure_name A string that specifies the name of the clock procedure in the test procedure file that identifies the primary input pin that you want to assign as the capture clock. In either case. and places in the internal pattern set. the capture clock that you specify cannot have a pin constraint.Command Dictionary Set Capture Clock Set Capture Clock Scope: All modes Usage SET CApture Clock primary_input_pin [-Atpg] Description Specifies the capture clock name for random pattern simulation. Examples The following example specifies a capture clock: add clocks 1 clock1 set capture clock clock1 set system mode dft Related Commands Add Clocks Delete Clocks Report Clocks Report Environment Tessent DFTAdvisor Reference Manual. The Set Capture Clock command specifies the name of the capture clock that the tool uses during random pattern simulation. Arguments • primary_input_pin A string that specifies the name of the primary input pin that you want to assign as the capture clock.

When you issue this command.Command Dictionary Set Command Editing Set Command Editing Scope: All modes Usage SET COmmand Editing -Off | -Vi | -Emacs | -Gmacs Description Sets the command line editing mode. V9. -Emacs — Sets emacs as the command line editing mode. -Vi — Sets vi as the command line editing mode. Upon invocation. Arguments • -Off | -Vi | -Emacs | -Gmacs A required switch that specifies the command line editing mode. the tool changes the editing mode without affecting your UNIX environment variables or settings. -Off — Turns command line editing off. -Gmacs — Sets gmacs as the command line editing mode. You can also turn off command line editing. regardless of any VISUAL or EDITOR environment variables. Examples The following example sets the command line editing mode to vi within the tool: set command editing -vi Related Commands History Save History 274 Tessent DFTAdvisor Reference Manual.0 June 2010 . the command line editing mode is set to emacs.

Due to sequential initialization. this switch allows you to begin the contention checking after the design has initialized. The tool identifies any multiple-port latch or flip-flop that has more than one clock. if the circuit enables two bus drivers of opposite logic to drive the bus. The default is time frame 0. However. • -Bus An optional switch that specifies for DFTAdvisor to perform contention checking tri-state driver buses. When contention checking is on. or reset input active (or at X). DFTAdvisor checks for contention during the ATPG-based identification run. Contention checking is set to On upon invocation of the tool.Command Dictionary Set Contention Check Set Contention Check Scope: All modes Usage SET COntention Check OFf | {ON [-ATpg] [-Start frame#]} [-Bus | -Port | -ALl] Description Specifies whether DFTAdvisor checks the gate types that you determine for contention. Arguments • OFf | ON A literal that specifies whether the tool should perform contention checking. The Set Contention Check command specifies whether contention checking is on and the conditions under which the tool performs the checks. This switch allows the tool to identify these conditions and notify you of their existence. without propagating captured data effects. during simulation. Thus. and possible contention may be unavoidable. set. Tessent DFTAdvisor Reference Manual.0 June 2010 275 . V9. This is the default. The invocation default behavior is On. • -Port An optional switch that specifies for DFTAdvisor to perform contention checking for multiple-port flip-flops and latches. the initial states on a bus may be unknown. Tri-state logic allows several bus drivers to time share a bus. • -ATpg An optional switch that specifies for DFTAdvisor to use deterministic fault simulation when identifying non-scan cells. physical damage can happen. • -Start frame# An optional switch and integer pair that specifies the number of timeframes after design initialization when DFTAdvisor begins the contention check.

and displays an error message that will indicate the gate on which the contention occurred: set system mode dft set contention check on -all run 276 Tessent DFTAdvisor Reference Manual.Command Dictionary Set Contention Check • -ALl An optional switch that specifies for DFTAdvisor to perform contention checking for both tri-state driver buses and multiple-port flip-flops and latches.0 June 2010 . V9. stops the simulation if any bus contention occurs. Examples The following example performs contention checking on both multiple-port sequential gates and tri-state buses.

0 Related Commands System Tessent DFTAdvisor Reference Manual.0 system echo $DISPLAY my_workstation:0. V9.0 June 2010 277 . The example also uses the System command to pass a UNIX “echo $DISPLAY” command to the shell in order to check the variable’s setting. The Set Display command sets the DISPLAY environment variable to display_name without exiting the currently running application. Arguments • display_name A required string that specifies a valid display setting for the machine on which the tool is running.Command Dictionary Set Display Set Display Scope: All modes Usage SET DIsplay display_name Description Sets the DISPLAY environment variable from the tool’s command line. system echo $DISPLAY set display my_workstation:0. then the DISPLAY variable is not required in order to use most commands successfully. Note This command effects the DISPLAY setting within the currently running application only. the setting in the invocation shell will be what it was when you invoked the tool. Examples The following example sets the DISPLAY variable. When you exit the tool. If you invoke the tool in command line mode (the default).

V9. The Set Dofile Abort command lets you turn this functionality off so that the tool continues to process all commands in the dofile. • OFf A required literal that forces dofile processing to complete all commands in a dofile regardless of error detection. and the line number of the error in the dofile is reported. Use this setting to prevent a batch job from hanging at the application prompt when an error occurs in a dofile.0 June 2010 .dofile are executed. This is the default upon invocation of the tool. if an error occurs during the execution of a dofile. Examples The following example sets the Set Dofile Abort command off to ensure that all commands in test1. By default.dofile Related Commands Dofile 278 Tessent DFTAdvisor Reference Manual. • Exit A required literal that directs the tool to exit if it detects an error while executing a dofile. set system mode dft set dofile abort off dofile test1. Arguments • ON A required literal that halts execution of a dofile upon detection of an error.Command Dictionary Set Dofile Abort Set Dofile Abort Scope: All modes Usage SET DOfile Abort ON | OFf | Exit Description Lets you specify that the tool complete processing of all commands in a dofile regardless of an error detection. processing stops.

Clock. The verbosity can only be turned on via the optional literal “verbose”. E4. Unlike the other DRC rules. The Atpg_analysis option provides full test generation analysis when performing rules checking for some clock (C) rules. E10. For example. setting the handling type to “Error” does not turn on the transcript verbosity for the S3 rule.) Arguments • rule_id A required literal that specifies a design rule. Extra.0 June 2010 279 . for some data (D) rules. The tool displays the rule identification number in all rules violation messages. the tool requires some additional CPU time and memory to perform the full test generation analysis. and Trace rules. the rule violation occurs when it is possible for the test generator to create a test pattern while that clock input is on. (The Atpg_analysis option is enabled by default for rules C1. Note The Set DRC Handling command does not support the scannability (S) rules except for the S3 and S5 rules. you can disable it for these rules by specifying the Noatpg_analysis option. Use the Set Flatten Handling command to specify how design rule violations are handled for (F) rules. warning. Procedure file. The Set DRC Handling command does not support any (F )rules. Note When you specify Atpg_analysis. E11 and E13. Each design rule has an associated occurrence message and summary message. all defined clocks are set off. Tessent DFTAdvisor Reference Manual. and for some extra (E) rules. The tool displays the occurrence message only for either error conditions or if you specify the Verbose option for that rule. You can specify that the violation messages for these checks be either error. V9. and constrained pins are set to their constrained state. or ignore. note.Command Dictionary Set DRC Handling Set DRC Handling Scope: Setup and Dft modes Usage SET DRc Handling rule_id [Error | Warning | NOTe | Ignore] [NOVerbose | Verbose] [NOAtpg_analysis | Atpg_analysis] [-Mode {Sequential | Combinational}] [-Cross_clock_domain] Description The Set DRC Handling command specifies how design rule violations are handled for RAM. if you specify Atpg_analysis for clock rule C1 and the tool simulates a clock input to be X. Data.

For a complete description of the Data design rule IDs. refer to the “Clock Rules” section in the Tessent Common Resources Manual for ATPG Products. For a complete description of the Procedure design rule IDs. For a complete description of the Trace design rule IDs. • NOTe An optional literal that displays a summary message to indicate how many times the rule was violated. and Trace rules violation IDs. • Warning An optional literal that displays a warning summary message to indicate the number of times the rule was violated. • • • • • For a complete description of the RAM design rule IDs. If you also specify the Verbose option. refer to “Scanability Rules (S Rules)” in the Tessent Common Resources Manual for ATPG Products. For a complete description of the Clock design rule IDs. see the “Scan Cell Data Rules” section in the Tessent Common Resources Manual for ATPG Products. the tool also displays the occurrence message for each occurrence of the rules violation. Clock. 280 Tessent DFTAdvisor Reference Manual. Data. the tool also displays the occurrence message for each occurrence of the rules violation. V9. • Ignore An optional literal that disables the display of any messages when the specified rule is violated. Scannability.0 June 2010 . The tool must still check some rules and they must pass to allow certain functions to be performed later. refer to the “Procedure Rules” section in the Tessent Common Resources Manual for ATPG Products. refer to the “Scan Chain Trace Rules” section in the Tessent Common Resources Manual for ATPG Products. Procedure. If you also specify the Verbose option. Extra. This is the default. refer to the “RAM Rules” section in the Tessent Common Resources Manual for ATPG Products. For a complete description of the Extra design rule IDs. The violation handling for Procedure rules can only be set to ignore or error. • • • Error An optional literal that both displays the error occurrence message and immediately terminates the rules checking. • NOVerbose An optional literal that displays the occurrence message only once for the rules violation.Command Dictionary Set DRC Handling The design rule violations and their identification literals are divided into the following seven groups: RAM. For a complete description of the Scannability design rule IDs. refer to the “Extra Rules” section in the Tessent Common Resources Manual for ATPG Products.

All of the latches found in a back trace must share the same clock. There must also be only a single clocked data port on each cell. C3. Examples The following example specifies rule checking E4 to be an error: add scan groups group1 scanfile add scan chains chain1 group1 indata2 outdata4 add clocks 1 clock1 add clocks 0 clock2 set drc handling e4 error set system mode dft Related Commands Report DRC Rules Set Flatten Handling Tessent DFTAdvisor Reference Manual. This checking differs from rule E4 in that it does not check for this condition during test procedures. This check ensures that there is no connectivity from the cells in the input cone of the sequential cells and enables of the tri-state devices except through the sequential cells. E11. and C5). you need to use the Atpg_analysis option. NOAtpg_analysis An optional literal that disables full test generation analysis when performing rules checking. E10. some D rules (like D6 and D9). Note To use the constraint values during the D6 rule analysis. E5. The Sequential option considers the inputs to a single level of sequential cells behaving as “staging” latches in the enable lines of tri-state drivers. E8. and some E rules (like E4. C4.Command Dictionary Set DRC Handling • • Verbose An optional literal that displays the occurrence message for each violation of a design rules. and both set and reset inputs must be tied (not pin constrained) to the inactive state. and E12). • Atpg_analysis An optional literal that enables full test generation analysis when performing rules checking for clock rules (like C1. • -Mode {Combinational | Sequential} An optional switch and literal for the E10 rule. The Combination option is the default upon invocation of DFTAdvisor. It performs bus contention mutual-exclusivity checking.0 June 2010 281 . • -Cross_clock_domain A switch that specifies to report violations during C6 analysis when the data path of a flipflop is driven by a different top-level clock signal than the clock that is driving the clock port. This is the default. V9.

a sample is randomly selected. The invocation default is 100 percent. Examples The following example performs scan identification with only 50 percent of the internally generated fault list. Arguments • percentage A required positive integer from 1 to 100 that specifies the fault sampling percentage that you want DFTAdvisor to use for scan identification. Fault sampling allows you to use a fraction of the total faults and decrease processing time for large circuits. By default.0 June 2010 . add clocks 0 clock set system mode dft set fault sampling 50 run report sequential instances 282 Tessent DFTAdvisor Reference Manual. V9. all faults (100 percent) in the internally generated fault list for scan identification are used. Once a percentage is specified.Command Dictionary Set Fault Sampling Set Fault Sampling Scope: All modes Usage SET FAult Sampling percentage Description The Set Fault Sampling command specifies the fault sampling percentage used for scan identification.

This is useful in rare cases where files have either of the compressed file extensions. When set to off.Z or .gz as a normal file rather than as a compressed file: set file compression off The next example re-enables compressed file handling. The following example disables compressed file handling so the tool will read testpat.gz extensions as compressed files (the default). but should not be saved or read as compressed files. Files that contain large pattern sets consume a very large amount of disk space. V9.pat in GNU format: set file compression on write netlist verilog.gz -verilog Tessent DFTAdvisor Reference Manual. Examples Suppose the file testpat.gz” specifies to compress the file using the GNU gzip command.ascii.ascii. Arguments • • ON An optional literal that enables compressed file handling. This is the default. a tool will automatically decompress (for reading) or compress (for writing) the specified file. the tools process . To conserve this space.scan.gz files without using compression.0 June 2010 283 . When compressed file handling is enabled and you provide a filename with either of the above extensions.Z or .Command Dictionary Set File Compression Set File Compression Scope: All modes Usage SET FIle Compression [ON | OFf] Description Controls whether the tools read and write files with . The Set File Compression command allows you to turn off the tool’s normal compressed file handling functionality. OFf An optional literal that disables compressed file handling. then saves the file fault. “. Fault lists and the design data itself also take up a lot of disk space.gz is not a compressed file. as follows: • • “.Z” specifies to compress the file using the UNIX compress command. You can control the type of GNU compression with the Set Gzip Options command. the tools normally store files in one of two compressed formats when you provide a filename with the appropriate extension.

0 June 2010 . V9.Command Dictionary Set File Compression Related Commands Set Gzip Options 284 Tessent DFTAdvisor Reference Manual.

the tool also displays the occurrence message for each occurrence of the rules violation. warning. Gate flattening violations are described in sections “FG1” through “FG8” of the Tessent Common Resources Manual for ATPG Products. V9.0 June 2010 285 . You can specify that the violation messages for these checks be either error. • Warning An optional literal that specifies for the tool to display the warning summary message indicating the number of times the rule was violated. pin. the tool also displays the occurrence message for each occurrence of the rules violation. and gate rules. • NOTe An optional literal that specifies for the tool to display the summary message indicating the number of times the rule was violated. and gate flattening. Each rules violation has an associated occurrence message and summary message. The tool displays the occurrence message for error conditions. note. The Set Flatten Handling command specifies the handling of the messages for net flattening.Command Dictionary Set Flatten Handling Set Flatten Handling Scope: All modes Usage SET FLatten Handling rule_id [Error | Warning | NOTe | Ignore] [Verbose | NOVerbose] Description Specifies how DFTAdvisor globally handles flattening violations. Pin flattening violations are described in sections “FP1” through “FP13” of the Tessent Common Resources Manual for ATPG Products. Tessent DFTAdvisor Reference Manual. pin flattening. or if you specify the Verbose option for that rule. The flattening rule violations and their identification literals divide into the following three groups: net. • • • • Net flattening violations are described in sections “FN1” through “FN9” of the Tessent Common Resources Manual for ATPG Products. Error An optional literal that specifies for the tool to both display the error occurrence message and immediately terminate the rules checking. Arguments • rule_id A required literal that specifies the identification of the exact flattening rule violations whose message handling you want to change. If you also specify the Verbose option. If you also specify the Verbose option. The tool displays the rule identification number in all rules violation messages. or ignored.

This is the default. Example The following example changes the handling of the FG7 flattening rule to warning and specifies that each occurrence should be listed: set flatten handling fg7 warning verbose Related Commands Report Flatten Rules Set DRC Handling 286 Tessent DFTAdvisor Reference Manual.Command Dictionary Set Flatten Handling • Ignore An optional literal that specifies for the tool to not display any message for the rule’s violations. V9. • NOVerbose An optional literal that specifies for the tool to only display the occurrence message once for the rules violation and to give a summary of the number of violations.0 June 2010 . The tool must still check some rules and they must pass to allow certain functions to be performed later. • Verbose An optional literal that specifies for the tool to display the occurrence message for each occurrence of the rules violation.

flattened model. You can rebuild the hierarchical gate structure by creating a new. A pseudo-hierarchical gate is a cluster gate that contains primitive gates and is at the lowest hierarchy level in the design library. These are the top level cells of the design library instantiated in your design. V9. These gates only differ from design-level gates if the library contains macro cells. Examples The following example sets the gate report level so that simulated values of the gate and its inputs are shown (assuming a rules checking error occurred when exiting the Setup system mode): add clocks 0 clock set system mode dft set gate level primitive set gate report error_pattern report gates i_1006/o Related Commands Report Gates Set Gate Report Tessent DFTAdvisor Reference Manual. To do so. Whenever you issue a command that invalidates the flattened model.0 June 2010 287 . the tool processes all subsequent report and display commands using the new gate level. Once you set the gate level. the tool also invalidates the hierarchical gate display structure. • Low_design A literal that specifies to display gate information at the pseudo-hierarchical gate level. Design A literal that specifies to display gate information at the design library hierarchical gate level. Arguments • • Primitive A literal that specifies to display gate information at the built-in primitive gate level. enter and exit the Setup mode. The Set Gate Level command specifies the hierarchical gate level at which the tool reports.Command Dictionary Set Gate Level Set Gate Level Scope: All modes Usage SET GAte Level Primitive | Design | Low_design Description Specifies the hierarchical level of gate reporting and displaying. This is the default upon invocation of the tool.

and optional switch triplet that specifies the pattern to use when displaying the value of a gate. By default the gate report contains netlist information. integer. • Error_pattern A literal that adds the inputs and simulated values of the gates for patterns with audit error to the gate report. you may see additional information as follows (use the Report Environment command to check the current gate level): • Primitive level (Set Gate Level Primitive): If a reported sequential element is part of a scan cell. V9. the display shows “Unobs” next to the captured value and explanatory text is included indicating which element is observed for that scan cell and that pattern. • PATtern_index pattern_index [-Internal | -External] A literal. and the value captured by the element is not what is observed/unloaded from the scan cell for that particular pattern.Command Dictionary Set Gate Report Set Gate Report Scope: All modes Usage SET GAte REport {Normal | Trace | Error_pattern | {PATtern_index pattern_index [-Internal | -External]} | {Parallel_pattern pattern_number} | Fault_status | Test_data | TIe_value | Constrain_value | {Drc_pattern {{Test_setup [{{-Cycle | -Time} n1} [n2 | End]]} | Load_unload | SHIft | SKew_load | SHADOW_Control | Master_observe | SHADOW_Observe | STate_stability} [-All | time]} [-False_paths {ON | OFf}] Description The Set Gate Report command customizes the gate report produced by the the Report Gates command. “Unobs” and 288 Tessent DFTAdvisor Reference Manual. Use the Trace option to determine why a scan chain was not properly sensitized during the shift procedure. Note When you exit the Setup system mode. The pattern_index must be a non-negative integer. Depending on whether the tool is set up for primitive or design level gate reporting. Trace A literal that adds the simulated values of the gates for shift patterns to the gate report. Arguments • • Normal A literal that specifies only default information is in the gate report.0 June 2010 . This command allows you to add test pattern and simulation information to the gate report. the trace and any rules-checking error pattern results are unavailable to this command.

be sure to reissue the “set gate report” command. the display shows “Unobs” next to the captured value. for example. and the Set Gate Report command set with the Parallel_pattern option. bogus simulation values may be reported if you enter any other tool command after simulation. • Design level (Set Gate Level Design): If the sequential element reported is a scan cell and an output value resulting from capture does not correspond to what is observed/unloaded from the scan cell for that particular pattern. If. If you use this option. Explanatory text is not displayed for these “Unobs” values. you alter the tool environment (for example by issuing a Set Clock_off Simulation or Set Split Capture_cycle command). for example. but before you report gates. For examples of captured/unload displays for different scan cells and reporting levels (primitive or design). You should use the Pattern_index argument to specify a pattern for the Report Gates command to use when displaying the value of a gate. -Internal — An optional switch that specifies an internal pattern set. This is the default. the tool displays captured/unload values only for the outputs of DFF and LA primitives. • Parallel_pattern pattern_number Note Use this option only if another command directs you to use it. Note When reporting gates at the primitive level. -External — An optional switch that specifies an external pattern set. For 64-bit invocations. the Analyze Bus command might transcript a message that explicitly says to use “set gate report parallel_pattern 0”. ensuring the values reported for a gate are up to date with the latest tool settings. For 32-bit invocations. V9. The second is the value at the leading Tessent DFTAdvisor Reference Manual. Set Split Capture_cycle on. A literal and integer pair that specifies the pattern number from the last simulation pass that you want the Report Gates command to use when displaying the value of a gate.Command Dictionary Set Gate Report extra explanatory text is displayed. Captured/unload values are not reported for transparent latches (TLAs). both scan and non-scan.0 June 2010 289 . the pattern_number must be an integer between 0 and 31. if you report on the slave latch within an LSSD scan cell and the test procedure file includes a master_observe procedure (the slave is not observed when a master_observe procedure exists). the gate report displays three values. With Set Clock_off Simulation on. The first is the result of the analysis for clock_off simulation. This will cause the tool to re-simulate the patterns. see the Examples section. be sure Report Gates is the first command you enter after simulation. the pattern_number must be an integer between 0 and 63. after setting the gate report with this option.

Captured values are not reported for transparent latches (TLAs).0 June 2010 . the third is the trailing edge of the clock (for split capture_cycle analysis). The DFTVisualizer command. Finally. If set up for primitive level gate reporting (Set Gate Level Primitive). reports the fault detection status in the transcript. all fault sites are annotated with fault detection status. V9. the command also displays in a pair of brackets ([ ]) at each output of the element. used for pins created by the flattening process or pins that are not fault sites (for example. but no fault has been added yet N — Site is nofaulted. either due to internal faults being on or off depending on where the fault site is). the pins of an unnamed internal instance of a library cell). the value that resulted from capture. If a schematic is currently displayed in the DFTVisualizer Debug window and you change the gate report data (by issuing the Set Gate Report command). The format of the fault status data is as follows: <sa0-status:sa1-status> where sa0-status and sa1-status are one of the following: DS — Detected by simulation DI — Detected by implication PU — Possible detect untestable PT — Possible detect testable AU — Atpg untestable UC — Undetected uncontrolled UO — Undetected unobserved UU — Untestable unused BL — Untestable blocked TI — Untestable tied RE — Untestable redundant F — Recognized fault site. or because a user has nofaulted it with the Add Nofaults command. the tool displays captured values only for the outputs of DFF and LA primitives. When reporting a sequential element (scan or nonscan).Command Dictionary Set Gate Report edge of the clock. Report Display Instances. • Fault_status A literal that specifies fault detection status of both SA-0 and SA-1 of all gates. “-” — Nothing known about this pin. 290 Tessent DFTAdvisor Reference Manual.

The data is displayed in the following format: (# of times controlled to 0-# of times controlled to 1. constrained pins.0 June 2010 291 . In the test procedure file. or any combination of 01Z). 1. This option is primarily for logic BIST purposes (when inserting control and observation points). Tessent DFTAdvisor Reference Manual. You must specify the Test_data option prior to running design rules checking to make test data available. • Drc_pattern procedure_name [-All | time] Two literals and an optional time triplet that specifies the name of the procedure and the time in the test procedure file that the Report Gates command uses to display a gatessimulated value. These values are the gate constrained value (0. The Report Gates command displays three values which are separated by a slash (/). or Z). the Report Environment command shows “BIST data” as the current gate report setting. Z. The tool uses the entire test_setup procedure unless you restrict the report to a certain portion using the -Cycle or -Time switch. • Constrain_value A literal that adds the simulated values that result from all natural tied gates. the gate forbidden values (-. where B indicates all fault effects of this gate are blocked).or B. how many times it was controllable to 1. 0. • TIe_value A literal that adds the simulated values that result from all natural tied gates and learned constant value non-scan cells to the gate report. and the fault blockage status (. time values are listed vertically in Test_setup gate reports. 1. and constrained cells to the gate report. It is typically used with the Analyze Control Signals and Analyze Output Observe commands. In order to conserve screen width. The valid options for use with Drc_pattern are as follows: procedure_name — A literal that specifies a procedure in the test procedure file for the Report Gates command to use when displaying the value of a gate. # of times observed) Note When the Test_data option is in effect.Command Dictionary Set Gate Report • Test_data A literal that specifies previously-calculated control and observe values. learned constant value non-scan cells. this procedure sets non-scan elements to the state you desire for the load_unload procedure. The valid literals for the procedure_name option are as follows: Test_setup — A literal that specifies the use of the test_setup procedure. and how many times it was observable during the preceding analysis. The data for each pin of a reported gate consists of three integers indicating how many times the pin was controllable to 0. X. V9.

for example. n1 specifies a time.When used with the -Cycle switch. time — An optional positive integer greater than 0 that specifies a time in the test procedure file. to specify the second cycle. -All — An optional switch that specifies to use all times in the test procedure file. Load_unload — this required procedure describes how to load and unload data in the scan chains. The following describes each of the arguments in more detail: -Cycle — A switch that indicates n1 is a cycle number and specifies to start the report at cycle n1. gate reports will show data for only the n1 cycle (or time). n2 — An optional integer that specifies to report from cycle (or time) n1 to cycle (or time) n2 and stop reporting. End — An optional literal that specifies to report from cycle (or time) n1 to the end of the test_setup procedure. When used with the -Time switch. you would use “-cycle 1”. Master_observe — this procedure describes how to place the contents of a master into the output of its scan cell. SHADOW_Control — this optional procedure describes how to load the contents of a scan cell into the associated shadow.0 June 2010 . The tool numbers cycles beginning with 0. so.Command Dictionary Set Gate Report -Cycle | -Time n1 — A switch and integer pair that specifies to use the part of the test_setup procedure that begins either at a particular cycle or at a particular time. if you do not include either the n2 or End argument. SHADOW_Observe — this optional procedure describes how to place the contents of a shadow into the output of its scan cell. SKew_load — this optional procedure describes how to propagate the output value of the preceding scan cell into the master memory element of the current cell (without changing the slave) for all scan cells. n1 — An integer that specifies a cycle or time at which to start reporting. SHIft — this required procedure describes how to shift data one position down the scan chain. Note When using the -Cycle or -Time switch. which by default is 1 nanosecond. The time units are based on the timescale defined in the test procedure file. 292 Tessent DFTAdvisor Reference Manual. V9. n1 specifies a cycle. This is the default. -Time — A switch that indicates n1 is a time and specifies to start the report at time n1.

Th: Indicates points along a false path. In: Indicates points along the intersection of multiple false paths. This option is only effective during non-Setup mode. The two -False_paths options are as follows. When you enable this switch. Example 1 The following example sets the gate report so that simulated values of the gate and its inputs are shown (assuming a rules checking error occurred when exiting the setup system mode): set gate report trace set system mode dft report gates I_1006/O Tessent DFTAdvisor Reference Manual. V9. you can use this argument in conjunction with other Set Gate Report settings.0 June 2010 293 .Command Dictionary Set Gate Report • -False_paths [ON | Off] An optional switch and literal pair that enables or disables the reporting of false path information for the Report Gates command and the DFTVisualizer Debug window. To: Indicates the capture/end point of a false path. Ef: Indicates points in a false path effect cone. Because the -false_paths argument does not reset the previously-specified gate report option. — : Indicates points that are not part of any false path. any subsequent issuance of the Report Gates command can include one or more of the following false path-related keywords: Fr: Indicates the launch/start point of a false path. ON —False path information is reported by the Report Gates command and displayed in the Debug window. OFf — False path information is not reported by the Report Gates command.

19ATPG> f // /ix21 (18) BUF // "I0" I (1-1)(In) 9// Q O (1-1)(To) 28-/fdgd/A 29-/ix19/A ATPG> f // /fdgd (28) NAND // A I (1-1)(To) 18-/ix21/Q // B I (1-0)(--) 1-/s // Z O (0-1)(Ef) 37-/y[2] ATPG> f // /y[2] (37) PO // "I0" I (0-1)(Ef) 28-/fdgd/Z // y[2] O (0-1)(Ef) Related Commands Report Gates Set Gate Level 294 Tessent DFTAdvisor Reference Manual. ATPG> set gate report –false_paths on ATPG> set gate report pattern_index 1 ATPG> report gates /ix21/UD1 ATPG> rep gat /ix21/UD1 // /ix21/UD1 (36) DFF Functional Specification for New ATPG Kernel Rev.Command Dictionary Set Gate Report Example 2 The following example illustrates how to use the Report Gate command to trace the transition of the pattern along the false paths. false path and an internal pattern simulation values are reported. 0.1 Page: 8 Date Modified: 1/20/09 9:49 PM // "S" I (0-0)(--) 6// "R" I (0-1)(--) 20// "C0" I (1-0)(--) 10// "D0" I (1-1)(To) 32// "OUT" O (1-1 [0])(In/Ef) 9// MASTER cell_id=2 chain=chain1 group=grp1 invert_data=FFFT ATPG> f // /ix21/UD1 (9) BUF // "I0" I (1-1)(Fr/Ef) 36// "OUT" O (1-1)(In) 18.0 June 2010 . In this example. V9.

and corresponds to the gzip -1 option. This is the default. V9.gz -verilog Tessent DFTAdvisor Reference Manual. the tool uses GNU gzip when processing files have a . sets gzip compression to the fastest method. The Set Gzip Options command specifies GNU gzip options the tool will use when compressing or decompressing files using the GNU gzip command.Command Dictionary Set Gzip Options Set Gzip Options Scope: All modes Usage SET GZip Options [-Path gzip_path] [-Fast | -Best | -integer] Description Specifies GNU gzip options to use with the GNU gzip command. the greatest amount of compression with -9. Arguments • -Path gzip_path An optional literal that specifies the full path gzip_path to a gzip executable file. then saves a file using the .scan. you can restore the default behavior of using your UNIX path to find gzip by issuing the command with the -Path gzip option. This corresponds to the gzip -9 option. When file compression handling is enabled (as described under the Set File Compression command).gz extension. Examples The following example ensures file compression is enabled. If you have specified a pathname with this option. • -Best An optional switch that specifies to use the slowest compression method.gz file naming extension in order to activate gzip file compression handling: set file compression on set gzip options -fast write netlist verilog. which yields the least compression. which yields the most compression. • -digit An optional switch that specifies an integer from 1 to 9 that the tool passes to gzip to control the rate of compression. The default compression is -6. You obtain the least amount of compression with -1. The following switches all control the speed of compression: • -Fast An optional switch that specifies to use the fastest compression method. You need to provide this pathname only if gzip is not in your normal UNIX search path.0 June 2010 295 .

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regardless of their clock values.Command Dictionary Set Identification Model Set Identification Model Scope: Setup mode Usage SET IDentification Model [-Clock {Original | None | Extra}] [-Disturb {ON | OFf}] Description Specifies the simulation model that DFTAdvisor uses to imitate the scan operation during the scan identification process.0 June 2010 297 . Therefore. you can use the Report Environment command. The three -Clock options are as follows: Original — A literal specifying that scan memory elements operate as their current clock configuration. By default. and the -Clock Extra option for the non-scan cells that do require the extra logic for clock controllability. DFTAdvisor does not yet know its ability to control all the clocks. To achieve this scan cell stability. then DFTAdvisor does not add any extra logic. Tessent DFTAdvisor Reference Manual. after DFTAdvisor loads values into the scan cells. V9. In normal scan operation. scan memory elements can hold their value for one time frame. If you want to display the current settings for the scan identification model. However. DFTAdvisor automatically decides which non-scan cells require extra logic to fix their clock behavior. all the clocks of a scan cell should be at their off-state. a scan memory element should not change its scan-in value until the loaded value is used. because the implementation of scan chains is not done yet. If you specify this option. None — A literal specifying that after scan loading. along with the -Disturb argument. The Set Identification Model command specifies a simulation model needed to imitate scan operation during scan identification. and uses the original clock configuration for each non-scan cell on a global design-wide basis. The scan identification process is performed with the Run command and this is the time when DFTAdvisor selects the non-scan cells that are to be replaced with the corresponding scan cell. When DFTAdvisor performs the scan identification. the scan identification model specifies for DFTAdvisor to use the -Clock Original option for non-scan cells that do not require the extra logic to control its clocks. This is the default for non-scan cells that DFTAdvisor determines do not require extra logic for controllability of that non-scan cell’s clocks. the Set Identification Model command allows you three -Clock options. it processes each non-scan cell separately. to specify how DFTAdvisor is to handle scan operation during the scan identification process. During the scan identification process. Arguments • -Clock Original | None | Extra An optional switch and literal pair that determines the effect of the clocks on scan memory elements values. before real scan chains are inserted.

This is the default.Command Dictionary Set Identification Model Extra — A literal specifying that external controllable clocks replace the original clocks so that the scan cells are capable of holding their scan values right after scan loading. If you specify this option. The two -Disturb options are as follows. ON — A literal specifying that the value of the non-scan memory elements can be disturbed by scan loading operations. • -Disturb ON | OFf An optional switch and literal pair that determines the effect of scan loading on non-scan memory elements. When the disturb option is off.0 June 2010 . Examples The following example forces DFTAdvisor to add extra primary input pins to replace the original clocks on a global design-wide basis: set identification model -clock extra set system mode dft setup scan identification full_scan run Related Commands Report Environment 298 Tessent DFTAdvisor Reference Manual. OFf — A literal specifying that the value of non-scan memory elements cannot be disturbed by scan loading. This option is the default for non-scan cells that DFTAdvisor determines do require extra logic for controllability of that non-scan cell’s clocks. DFTAdvisor sets the states of non-scan memory elements to the unknown (X) state after the scan loading operation. V9. then DFTAdvisor adds extra logic to every non-scan cell on a global design-wide basis. If the disturb option is on. the states of the non-scan memory elements are the same as before the scan loading operation.

Examples The following example invokes the scan identification process such that DFTAdvisor does not take into consideration any internal faults when in calculating the efficiency percentage: set internal fault off set system mode dft setup scan identification full_scan run Tessent DFTAdvisor Reference Manual.Command Dictionary Set Internal Fault Set Internal Fault Scope: Setup mode Usage SET INternal Fault ON | OFf Description Specifies whether the tool allows faults within or on the boundary of library models. The default upon invocation of the tool is to allow faults on the internal nodes of library models. The Set Internal Fault command specifies whether the tool will allow faults on internal nodes of library models or only on the library model boundary. Arguments • ON A literal that specifies to allow faults on the internal nodes of library models. • OFf A literal that specifies to allow faults only on the boundary of the library models. V9.0 June 2010 299 . This is the default upon invocation of the tool.

you should delete these names for memory and performance reasons. The default operation (OFF) upon invocation of DFTAdvisor is to delete these names. even if they have the nofault attribute.0 June 2010 . The Set Internal Name command specifies whether to keep internal library pins with no-fault attributes. V9. Example The following example deletes pin names with the nofault attribute. This is the default upon invocation of DFTAdvisor. • ON A literal that keeps the lowest level pin names. Arguments • OFf A literal that deletes the lowest level pin names if they have the nofault attribute. set internal name off 300 Tessent DFTAdvisor Reference Manual. Normally.Command Dictionary Set Internal Name Set Internal Name Scope: Setup mode Usage SET INternal Name OFf | ON Description Specifies whether to delete or keep pin names of library internal pins containing no-fault attributes.

Ram A literal that specifies to buffer the ram_write_control and ram_read_control pins. If you are not turning On or Off all test signals. If you defined I/O buffers in the ATPG library or used the Add Cell Models command to define them. TClks A literal that specifies to buffer all test clock pins. The specified signals can be internal signals (output port of a library cell) or new pins generated by DFTAdvisor. and reset. DFTAdvisor will automatically insert the I/O buffers during scan insertion. Usage SET IO Insertion ON | OFf | {[TEn] [Ram] [SEn] [TClks] [SIns] [SOuts] [Control] [OBserve] [-Model model_name]} Description Specifies whether to insert I/O buffers. set. You can specify which test control signals should have I/O buffers added. You can specify one or more of the test signal literal arguments. you must specify at least one of the test signal arguments.0 June 2010 301 . The default upon invocation is off. when you set this command to ON. including clock. If you want to remove any existing I/O buffer signals from the list of signals to buffer. SEn A literal that specifies to buffer the scan_enable pin(s). By having automatic I/O buffer insertion turned off (the default). it adds any new options to those already defined. Tessent DFTAdvisor Reference Manual. The Set IO Insertion command is additive. V9. This means that each time you issue the command. or insert the I/O buffers manually after inserting scan at the design level. • • • • TEn A literal that specifies to buffer the test_enable pin.Command Dictionary Set Io Insertion Set Io Insertion Scope: All modes Prerequisites: Input and output buffers must be defined in either the ATPG library or with the Add Cell Models command. The Set IO Insertion command specifies whether DFTAdvisor should insert I/O buffers automatically during scan insertion. you can perform scan insertion at the block level. Arguments • ON | OFf A required literal that specifies whether to insert I/O buffers for all test signals. you turn off I/O buffer insertion (Set IO Insertion off).

or if you have used the -Model switch. Examples The following example shows how to enable the adding of I/O buffers automatically to all test control signals: set io insertion on To enable the adding of I/O buffers to only the scan in.Command Dictionary Set Io Insertion • • SIns A literal that specifies to buffer all scan_in pins of inserted scan chains. You must first identify the buffer with either the Add Cell Models command or with the cell_type library attribute. by default. • -Model model_name An optional switch and string pair that specifies the name of a buffer in the ATPG library for DFTAdvisor to insert on the test pins. The specified model should be the OUTBUF type for scan outputs and the INBUF type for all scan inputs and test signals. V9.0 June 2010 . DFTAdvisor uses the first buffer model in the buffer cell model list (which you can see with the Report Cell Models command). • Control A literal that specifies to buffer all test point control pins. enter: set io insertion sins souts control observe Related Commands Add Buffer Insertion Add Cell Models 302 Tessent DFTAdvisor Reference Manual. If you do not use the -Model switch. scan out. No buffer is inserted unless a buffer has been defined with the “-Type outbuf” option of the Add Cell Models command. and observe signals. if no scan cell is requested with the Setup Test_point Insertion command. if no scan cell is requested with the Setup Test_point Insertion command. • OBserve A literal that specifies to buffer all test point observe pins. and specified a buffer as part of this command. SOuts A literal that specifies to buffer all scan_out pins of inserted scan chains. control.

If you use the Set DRC Handling command to ignore the D6 rule. for scan insertion. DFTAdvisor will consider the non-transparent latches for scan insertion.0 June 2010 303 .Command Dictionary Set Latch Handling Set Latch Handling Scope: Setup mode Usage SET LAtch Handling None | Scan Description Specifies whether the tool considers non-transparent latches for scan insertion while test logic is turned on. DFTAdvisor does not consider the non-transparent latches for scan insertion. The Set Latch Handling command specifies whether the tool can consider non-transparent latches as candidates for scan insertion. By default. Related Commands Set DRC Handling Set Test Logic Tessent DFTAdvisor Reference Manual. If you determine that the tool is to consider nontransparent latches as candidates for scan insertion. whose test logic you turned on. you must turn on the appropriate Set Test Logic command settings before DFTAdvisor performs the rules checking process. then rules checking does not check the non-scannable latches for transparency and DFTAdvisor will automatically consider all non-scannable latches. However. V9. This is the default upon invocation of DFTAdvisor. D6 checks the non-scannable latches for transparency. If you use the Set DRC Handling command to set the D6 rule to error or warning. if they are not transparent and you turned test logic insertion on. • Scan A literal that specifies to consider non-transparent latches for scan insertion when test logic is turned on. if you use the Scan argument with the Set Latch Handling command. Arguments • None A literal that specifies to give no consideration to non-transparent latches for scan insertion.

the overall inversion on the enable pin is active high. Usage SET LOckup Cell {OFf | ON} [-First_clock | -SEcond_clock] [-Type {DLat | DFf}] [-CApture_edge_at_scan_chain_input {LE | TE | ANY}] [-CHange_edge_at_scan_chain_output {LE | TE | ANY | OFF} [{ALL | WRApper}]] Description The Set Lockup Cell command enables the automatic insertion of lockup cells. Also. see the Add Cell Models command. QB). input (D) () input (CLK) (clock = fall_edge. Lockup cells are inserted at each transition of the different clock domains and at the transition of active-high to active-low edge domains.) intern(CLKn) (primitive = _inv (CLK. Q. DFTAdvisor does not examine or simulate the implementation of the lockup model to determine if it is an active high or active low cell. from the clock pin of the scan cell to the top level clock pin. CLKn. V9. The lockup cells are inserted only on the scan path and do not interfere with the functional operation of the design.Command Dictionary Set Lockup Cell Set Lockup Cell Scope: All modes Prerequisites: Lockup cell model(s) must be specified with the Add Cell Models command and an inverter model must be specified with the Add Cell Models command or cell_type model attribute. The inversions on the clock path within the scan cell library model. CLK. QB) ( cell_type = DFF CLK D. You can insert the lockup cells at the beginning/end of each scan chain or between all scan cells in different clock/edge domains. Lockup cell and inverter models must be defined in the DFT library before they can be used in lockup cell insertion. In the following example. a lockup cell model of type DLAT or DFF must be specified using the Add Cell Models command. which is defined by using the clock input attribute statement and/or _inv primitives in the library model definition. Q. You must use the -Active switch to specify the overall signal inversion on the enable pin of the latch (or the clock pin of the flip-flop) inside the library model. The overall inversions along the clock path. D. The edge domain of a scan cell is determined by the combined effect of the following parameters: • • • The off-state value of the feeding top-level clock. model lockup (D. .) ) 304 Tessent DFTAdvisor Reference Manual.0 June 2010 . CLKn). For more information.) output(Q. QB) (primitive = _dff(. which is defined by the Add Clocks command.

see the Insert Test Logic command. Using the Set Lockup Cell command also turns on the reporting of those locations that require lockup cells in theory but are not covered in the the cell order file. In Table 2-7. you must specify the model type using the Add Cell Model command. The second column lists the lockup cell models defined in the DFT library where lat+ is an active-high model and lat. If you are using a DLAT model as a lockup cell.--> (lat+) --> c2c1. Table 2-7. The third column lists the transitions after lockup cell insertion where the lockup cell inserted is listed in the parenthesis.--> c2+ Lockup Cell Models Defined lat+ latlat+.Command Dictionary Set Lockup Cell If a cell order file is used with the Insert Test Logic command. the tool inserts lockup cells automatically at the required locations. latlat+ latlat+.--> (lat.is an active-low model. The tool uses the clock signal of the first cell with the opposite clock edge when a DLAT model is used and with the same clock edge when a DFF model is used for a lockup cell.--> c2+ (no lockup) The first column lists a clock/edge transition where an active high-clock 1 to an active-low clock 2 is shown as c1+ --> c2-. latlat+. The -Capture_edge_at_scan_chain_input switch provides the ability to control the time when the first cell of the scan chain captures a value. Lockup Cell(s) Used Between Different Clock/Edge Transitions Clock/Edge Transition c1+ --> c2+ c1+ --> c2+ c1+ --> c2+ c1.+ inv) --> c2c1+ --> (lat-) --> c2c1. V9. it is assumed that the clock signal is tapped from the clock input of the leading flop. A lockup cell labeled as (lat+ + inv) in the table indicates that a lockup model is inserted in the scan path and an inverter is inserted on the clock line of the lockup cell to provide a half cycle delay. If you are using a DFF model as a lockup cell. To guarantee a capture edge (specified with LE or TE argument) at the first cell in chain.--> c2c1. lockup cells are inserted only at the locations specified in the cell order file. Note that the capture Tessent DFTAdvisor Reference Manual. The inverter is used when an active low model is needed but not defined. at the beginning and at the end of the chain. DFTAdvisor can also insert lockup cells at the non-transition locations in a chain. Table 2-7 illustrates how DFTAdvisor inserts lockup cells at different clock/edge domains. If the ANY argument is specified. latLockup Cell Inserted c1+ --> (lat+ + inv) --> c2+ c1+ --> (lat-) --> c2+ c1+ --> (lat-) --> c2+ c1. you must specify the model type using the Set Lockup Cell command because it is the only way to specify the type of library model to use for lockup cells. DFTAdvisor inserts a lockup cell before the first cell in the chain (closer to the scan chain input) if the first cell has the opposite capture edge. For more information.0 June 2010 305 . namely.--> c2c1+ --> c2c1. If no lockup cell location is specified in the cell order file. DFTAdvisor always inserts a lockup cell at the beginning of the chain with the opposite capture edge of the first cell.

Command Dictionary Set Lockup Cell

and the change edges for a DLAT model are the opposite, whereas for a DFF model, they are the same. For example, for an active high DLAT model, the capture edge is trailing (TE) and the change edge is leading (LE). Similarly, for a leading edge DFF model, the capture and change edges are both leading (LE). The Change_edge_at_scan_chain_output switch provides the ability to control the change time at the output of the last scan cell in the chain. To guarantee a change edge (specified with LE or TE argument) at the last cell in chain, DFTAdvisor inserts a lockup cell after the last cell in the chain (closer to the scan chain output) if the last cell has the opposite change edge. If the ANY argument is specified, DFTAdvisor always inserts a lockup cell at the end of the chain with the opposite change edge of the last cell. The tool uses the clock signal of the last cell with the opposite clock edge regardless of the latch model being used (DLAT or DFF) for a lockup cell. Lockup cells are inserted based on the change edge of the source cell clock and the capture edge of the destination clock. For a lockup cell that will be inserted at the beginning of a scan chain, the source cell does not exist and therefore the capture edge of the destination cell (first cell in chain) is specified. Similarly, for lockup cell that will be inserted at the end of a scan chain, the destination cell does not exist and the change edge of the source cell (last cell in chain) is specified. The lockup cells between two cells within the scan chain are inserted automatically by DFTAdvisor since both source and destination cells are available. For more information on change edge and capture edge, refer to Lockups Between Decompressor and Scan Chain Inputs in the Tessent TestKompress User’s Guide. For more information on inserting lockup cells, refer to Merging Chains with Different Shift Clocks in the Scan and ATPG Process Guide. Arguments • OFf | ON A required literal that determines whether lockup cells are inserted. By default, lockup cells are inserted. • -First_clock | -SEcond_clock An optional switch that determines which clock signal the lockup cells use. Options include: -First_clock — clock signal is tapped from the clock input of the scan cell closer to the scan chain input. By default, the first clock is used. -SEcond_clock — clock signal is tapped from the clock input of the scan cell closer to the scan chain output. • -Type {DLat | DFf} Optional switch and literal pair that specifies the type of model used for a lockup cell. Options include: DLat — Specifies D latch with two input pins (enable and data). DFf — Specifies a D flip-flop with two input pins (clock and data).

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Command Dictionary Set Lockup Cell

-CApture_edge_at_scan_chain_input {LE | TE | ANY} Optional switch and literal pair that determines whether a lockup cell is inserted between the first scan cell and the scan input pin of scan chains. This switch allows you to control the capture edge used by the first scan cell. Options include: LE — lockup cell is inserted to ensure that the first scan cell captures data on the leading edge. TE — lockup cell is inserted to ensure that the first scan cell captures data on the trailing edge. ANY — lockup cell is inserted independently from the capture edge of the first scan cell. If a DFF model is to be used as a lockup cell, the clock signal obtained from the first scan cell in chain is inverted before connecting it to the clock input of the lockup cell. If a DLAT model is used, on the other hand, the clock signal is not inverted.

-CHange_edge_at_scan_chain_output {LE | TE | ANY | OFF} Optional switch and literal that determines whether a lockup cell is inserted between the last scan cell and the output pin of scan chains. This switch allows you to control the capture edge used by the last scan cell. Options include: LE — lockup cell is inserted to ensure that the last scan cell can update its output on the leading edge. TE — lockup cell is inserted to ensure that the last scan cell can update its output on the trailing edge. ANY — lockup cell is inserted independently from the change edge of the last scan cell. OFF — lockup cells are not inserted at the end of any chains (wrapper or core). The clock signal obtained from the last scan cell in chain is always inverted before connecting it to the clock input of the lockup cell whether a DFF model or a DLAT model is used.

{ALL | WRApper} Optional switch that specifies the insertion of lockup cells at the end of all chains or of only wrapper chains. ALL — a lockup cell is inserted at the end of all chains. WRApper — a lockup cell is inserted at the end of all wrapper chains.

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Command Dictionary Set Lockup Cell

Example 1 The following example defines two different groups of clocks, specifies a flop model and inverter model to use for lockup cells, enables lockup cell insertion, and performs the insertions. The -Clock Merge option combines the scan cells associated with each of the specified clock groups into a scan chain when the test logic is inserted.
add clocks 0 clk1 clk2 clk3 add clocks 1 clk4 clk5 clk6 add clock groups group1 clk1 clk2 clk3 add clock groups group2 clk4 clk5 clk6 add cell model dff04 -type dff clk data add cell model inv -type inv set lockup cell on -type dff run insert test logic -scan on -clock merge

In this example, DFTAdvisor creates two scan chains, one for each clock group and inserts lockup cells between the clock domains that are in the same clock group. Example 2 The following example defines a latch model and inverter model to use for lockup cells, turns on the insertion of lockup cells to ensure that the first scan cell captures data on the leading edge, and inserts the test logic.
add cell model dlat1a -type dlat enable data add cell model inv -type inv set lockup cell on -capture_edge_at_scan_chain_input LE -type dlat run insert test logic -scan on

Example 3 The following example inserts lockup cells at the end of all wrapper chains with ANY capture edge and at the end of core chains with a LE capture edge. The following commands must be executed in the order shown because the effect of the switches is cumulative. Note that the second command overrides the capture edge constraint for wrapper chains only which leaves the LE capture constraint to apply to core chains only.
Set Lockup Cells on –change_edge_at_scan_chain_output le all Set Lockup Cells on –change_edge_at_scan_chain_output any wrapper

Related Commands Add Cell Models Add Clock Groups Add Test Points Delete Test Points Insert Test Logic Report Test Points

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Command Dictionary Set Logfile Handling

Set Logfile Handling
Scope: All modes Usage SET LOgfile Handling {[filename] [-Replace | -Append]} Description Specifies for DFTAdvisor to direct the transcript information to a file. The Set Logfile Handling command causes DFTAdvisor to write the transcript information, which includes the commands and the corresponding output (if any), into the file you specify. You can execute the Set Logfile Handling command at any time within DFTA, and you can also execute it multiple times. In the logfile, all commands that DFTAdvisor executes are preceded with the command keyword. You can easily search for the commands you executed, and then you can generate a separate dofile containing those commands which you can re-run within DFTAdvisor. When you set the logfile handling, DFTAdvisor still writes the same information to the session transcript window in addition to the logfile. However, you can disable the writing of the information to the transcript window with the Set Screen Display command. If you want DFTAdvisor to stop writing to a logfile, issue the Set Logfile Handling command with no options, which closes the appropriate files. Arguments • filename An optional string that specifies the name of the file where you want DFTAdvisor to write the transcript output. This string can be a full pathname or a leafname. If you only specify a leafname, the tool creates the file in the directory from which you invoked the tool. • -Replace An optional switch that forces DFTAdvisor to overwrite the file, if a file by that name already exists. • -Append An optional switch that causes DFTAdvisor to begin writing the transcript at the end of the specified file. Examples The following example specifies for DFTAdvisor to write a logfile and to disable the writing of the transcript:
set logfile handling /user/designs/setup_logfile set screen display off add clocks 0 clk add clocks 1 pre clr report clocks

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Command Dictionary Set Logfile Handling

The following information shows what the logfile contains after running the preceding set of commands:
// command: set scr d off // command: add clocks 0 clk // command: add clocks 1 pre clr // command: report clocks PRE, off_state 1 CLR, off_state 1 CLK, off_state 0

Related Commands Set Screen Display

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Command Dictionary Set Net Resolution

Set Net Resolution
Scope: Setup mode Usage SET NEt Resolution Wire | And | Or Description Specifies the behavior of multi-driver nets. The Set Net Resolution command specifies the behavior of non tri-state multi-driver nets. The default upon invocation of the tool is Wire, which requires all inputs be at the same value to achieve a value. If possible, you should specify the And or Or option; otherwise, some loss of test coverage results. Arguments • Wire A literal that specifies for the tool to use unknown behavior for non tri-state multi-driver nets. This requires all inputs to be at the same value to achieve a value other than X. This is the default upon invocation of the tool. • • And A literal that specifies for the tool to use wired-AND behavior. Or A literal that specifies for the tool to use wired-OR behavior. Examples The following example specifies that the behavior of non tri-state multi-driver nets is wiredAND during the scan identification process.
set net resolution and add clocks 0 clock set system mode dft run report sequential instances

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Command Dictionary Set Nonscan Handling

Set Nonscan Handling
Scope: Setup modes Usage SET NOnscan Handling {Check | Nocheck} Description Specifies whether to check the non-scan instances for scannability. The Set Nonscan Handling command specifies whether the added non-scan instances are checked for scannability. Nonscan instances are defined by the Add Nonscan Instances command, Add Nonscan Models command, or the non-scan models due to no scan equivalents. These non-scan instances are not checked because the instances cannot be selected for scan insertion. You can enable checking on non-scan instances by using this command with the Check option. Arguments • Check | Nocheck A required literal that specifies whether to check the non-scan instances for scannability. The default upon invocation is Nocheck. Examples The following example shows how to check all added non-scan instances:
set nonscan handling Check

Related Commands Add Nonscan Instances Add Nonscan Models Set DRC Handling

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Command Dictionary Set Scan Enable

Set Scan Enable
Scope: Setup and DFT modes Prerequisites: mux-DFF scan type Usage SET Scan Enable [scan_enable_pin_pathname [-isolate]] [primary_input] [-Active {High | Low}] [-Chain chain_name... | -Wrapper_chain [chain_name... | -INput | -OUTput] | -Partition partition_name...] [-Clock clock_pin] Description Assigns scan_enable signals to specific scan chains. Scan chains can be specified by either name, wrapper chain type, scan partition, or clock domain. If no scan chains are specified, the specified scan_enable signal is assigned to all scan chains. The Set Scan Enable command uses either the default scan enable signal names or allows you to assign a new scan enable signal name to all or to just the specified scan chains using the scan_enable_pin_pathname argument. Table 2-8 shows the default names for three types of scan enable signals used in DFTAdvisor. Table 2-8. Default Scan Enable Signal Names Default Name scan_en scan_en_in scan_en_out Description Scan enable for mux-DFF type (core scan cells) Scan enable for mux-DFF type (input wrapper cells) Scan enable for mux-DFF type (output wrapper cells)

DFTAdvisor creates three types of scan enable signals: one for core scan cells, one for input wrapper cells, and one for output wrapper cells. You can override the default base names for each scan enable signal type using one of the following commands:
Set Scan Enable <scan_enable_pin_pathname> Set Scan Eanble <scan_enable_pin_pathname> -Wrapper_chain -Input Set Scan Enable <scan_enable_pin_pathname> -Wrapper_chain -Output

The Set Scan Enable command can be issued in a sequence to either refine the scan enable signals assignments or overwrite the previous assignments (see the example section for this command). In general, the following rules are applied to determine how signal assignments are affected by subsequent commands: • • The most recent command that assigns a scan_enable signal takes precedence. If the most recent command operates on a disjoint set of scan chains, then the previous scan enable signal assignments remain intact.

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For more information on distribution modes and creating wrapper chains.. it must trace back to a primary input via a simple path (only inverters or buffers) or the primary_input argument. The specified top-level port must be a primary input port. If an internal instance pin is specified. Wrapper chain creation must be enabled. -OUTput — Specifies all output wrapper chains when two-domain distribution is used. If no scan_enable signal driver is specified. • -Active {High | Low} An optional switch and literal pair that specifies whether the scan_enable signal is active low or high. Arguments • scan_enable_pin_pathname [-Isolate] An optional string that specifies a pin pathname for the scan_enable signal driver. This switch is applicable to a scan enable signal driven by a top-level port or a top-level internal instance pin only. -Isolate — Isolates new fanouts of the specified scan enable signal.0 June 2010 . The specified top-level port is used when generating the ATPG dofile and test procedure files. the specified scan enable signal is assigned to all wrapper chains when one-domain distribution is used. then previous scan_enable signal assignments are overwritten. Options include: chain_name. The specified pin can be either a top-level scan enable port or an internal instance pin (connection node). When the -Wrapper_chain switch is issued without arguments. • -Wrapper_chain [chain_name… | -INPut | -OUTput] An optional switch and a repeatable string or literal pair that identifies the wrapper chains to assign a specified scan_enable signal to. This argument supplies a primary input/top-level port for an internal instance pin specified by the scan_enable_pin_pathname argument. Each new fanout connection is gated by an AND or NOR gate and controlled by the global test enable signal. respectively. V9. — Specifies one or more wrapper chain names. the default scan enable name is used: scan_en. -INPut — Specifies all input wrapper chains when two-domain distribution is used. The -Input | -Output options should be used if the specified scan enable signal will be associated with either all input wrapper chains or all output wrapper chains. If the specified top-level port does not exist. • -CHain chain_name… An optional switch and a repeatable string that identifies individual scan chains to assign the specified scan_enable signal to.. see the Setup Pin Constraints command. it is created. • primary_input An optional string that specifies a top-level scan_enable port.Command Dictionary Set Scan Enable • If the most recent command operates on previously specified scan chains. scan_en_out. 314 Tessent DFTAdvisor Reference Manual. scan_en_in.

A single scan chain is inserted by default for partA and two scan chains are inserted for partB. An error message is issued when this switch is specified with either the -Clock Merge or the filename -Fixed option of the Insert Test Logic command. V9. • -Partition partition_name… An optional switch and repeatable string pair that specifies names of scan partitions added using the Add Scan Partition command. This switch is ignored when it is used in conjunction with the -Chain option. Two scan chains are Tessent DFTAdvisor Reference Manual. and all output wrapper chains controllable via the outsen1 signal. the specified scan enable signal is assigned only to the scan chains that belong to both the specified scan partition and the specified clock domain. each command affects different scan chains and does not override scan_enable assignments made by the previous command. Clock_pin can be either an existing top level port (primary input pin) or an existing internal pin pathname. along with either the -Input or -Output option. can be used in conjunction with the -Clock switch. in which case a unique scan enable signal is generated just for the scan chains that belong to both the specified wrapper chain type or partition and the specified clock domain. This switch can be used in conjunction with either the -Wrapper_chain or -Partition option. In this case. In this case.0 June 2010 315 . This switch can be used in conjunction with the -Edge Merge option of the Insert Test Logic command. • -Clock clock_pin An optional switch and string pair that associates the specified scan enable signal with the specified clock (clock domain). Set Scan Enable insen1 -wrapper_chain -input Set Scan Enable outsen1 -wrapper_chain -output Example 2 The following example defines two scan partitions: partA and partB. All of the commands operate on disjoint sets of scan chains. Use this option to assign a specified scan_enable signal to the scan chains created within one or more partitions. therefore. the specified scan enable signal is assigned only to the wrapper chains that belong to both the specified type of wrapper chains and the specified clock domain. This option can be used in conjunction with the -Clock switch.Command Dictionary Set Scan Enable This switch. Example 1 Assuming two-domain distribution of the identified wrapper cells. the following example uses a sequence of Set Scan Enable commands to make all input wrapper chains controllable via the insen1 signal.

The third Set Scan Enable command further refines the first command and makes scan chains of partB controllable via the senPartB scan enable signal.Command Dictionary Set Scan Enable inserted for the remaining cells in the default scan partition. associated with the primary input. they do not affect previous assignments.0 June 2010 . Since the second and the third Set Scan Enable commands operate on disjoint sets. Example 3 The following example defines two scan partitions: partA and partB. therefore. the scan chains that are in both sets will get the most recent assignment. senPartB. as a driver of the scan enable signal controlling all scan chains of partA. 316 Tessent DFTAdvisor Reference Manual. Set System Mode dft Add Scan Partition partA -instance udff1 umodA/udff2 umodB/udff3 // 1 chain Add Scan Partition partB -instance umodC -number 2 // 2 chains Set Scan Enable sen Set Scan Enable senPartA -partition partA Set Scan Enable senPartB -partition partB Insert Test Logic -number 2 // 2 chains inserted for the default partition The first Set Scan Enable command makes all scan chains controllable via the sen scan enable signal. associated with the primary input. The second Set Scan Enable command specifies an internal pin. Add Clock 0 /clkInput Set System Mode dft Add Scan Partition partA -instance udff1 umodA/udff2 umodB/udff3 // 1 chain Add Scan Partition partB -instance umodC -number 2 // 2 chains Set Scan Enable sen Set Scan Enable /modX/i_sen/x senPartA -partition partA Set Scan Enable /modY/i_sen/x senPartB -partition partB Set Scan Enable senClk -clock clkInput Insert Test Logic -number 2 // 2 chains inserted for the default partition The last Set Scan Enable command specifies that all scan chains in the clkInput clock domain are controllable by the senClk scan enable signal. The second Set Scan Enable command refines the first command and makes scan chains of partA controllable via the senPartA scan enable signal. the scan chains that are in both the first and the third sets get the most recent assignment. The second and the third Set Scan Enable commands overwrite the assignments of the first Set Scan Enable command affecting chains that are in partA and partB. The third Set Scan Enable command specifies an internal pin. V9. The second command operates on a set of scan chains that is entirely within the set specified in the first command. as specified by the -number argument of the Insert Test Logic command. senPartA. as driver of the scan enable signal controlling all scan chains of partB. /modY/i_sen/x. The first Set Scan Enable command makes all scan chains controllable via the sen scan enable signal. The third command operates on a set of scan chains that is disjoint from the set in the second command but is entirely contained within the first set. therefore. /modX/i_sen/x.

therefore. V9. Add Clock 0 clk1 Set System Mode dft Add Scan Partition partA -instance udff1 umodA/udff2 umodB/udff3 // 1 chain Add Scan Partition partB -instance umodC -number 2 // 2 chains Set Scan_enable Sharing -Prefix partSen -Scan_partition Set Scan Enable clkSen -Partiton partB -Clock clock1 Related Commands Add Scan Partition Report Scan Enable Set Scan_enable Sharing Setup Pin Constraints Setup Scan Insertion Tessent DFTAdvisor Reference Manual. certain previous assignments that are subject to the most recent assignment are overwritten. If it is desirable to restrict the clock domain's assignments to a specific partition. The second call operates on a set of scan chains that is the same as the set of scan chains in the first call. Example 4 In this example. This example uses a Set Scan_enable Sharing command to make all scan chains within each scan partition controllable via a unique scan enable signal partSenN where N is a unique number for each partition. to only the scan chains inside the partB scan partition that are also in the clock1 clock domain. the -Partition and -Clock options should be issued in conjunction in the same Set Scan Enable call as shown in Example 4. two scan partitions are defined: partA and partB.0 June 2010 317 . clkSen. the Set Scan Enable command specifies to assign a unique scan enable signal. Next.Command Dictionary Set Scan Enable The fourth command will overwrite some of the assignments of the second and the third commands for scan chains that are in partA and partB and also in the clkInput clock domain.

Command Dictionary Set Scan_enable Sharing Set Scan_enable Sharing Scope: Setup and DFT modes Prerequisites: mux-DFF scan type Usage SET SCan_enable Sharing [-Prefix base_name] [-Active {High | Low}] {[-Max_number_of_chains integer] [-Input_wrapper_chain | -Output_wrapper_chain | -Scan_partition] [-Clock_domain]} Description Divides all scan chains into specified groups and assigns a unique scan_ enable signal to each group. Arguments • -Prefix base_name An optional switch and string pair that specifies a base name (prefix) used in combination with sequential numbers to automatically generate unique top-level scan_enable signals (base_nameN) for specified groups of scan chains. by scan partitions. If the most recent command operates on a disjoint set of scan chains. Scan chains can be grouped by: • • • Specifying a maximum number of chains in each group. by wrapper chain types. or by clock domains. scan_en_out) is used as the base name (prefix). then the previous scan enable signal assignments remain intact. V9. the following rules are applied to determine how signal assignments are affected by subsequent commands: • • • The most recent command that assigns a scan_enable signal takes precedence. 318 Tessent DFTAdvisor Reference Manual. If this option is not specified. then previous scan_enable signal assignments are overwritten. In general. an appropriate default scan enable name (scan_en. If the most recent command operates on previously specified scan chains. • -Active {High | Low} An optional switch and literal pair that specifies whether the scan_enable signal is active low or high. Specifying a maximum number of chains within groups there were created by wrapper chain types. by scan partitions. scan_en_in.0 June 2010 . or by clock domains. Clock domains within groups created by wrapper chain types or by scan partitions. The Set Scan_enable Sharing command can be issued in a sequence to either refine the scan enable signals assignments or overwrite the previous assignments (see the example section for this command).

the number specified by integer is applied to only output wrapper chains. in this case a unique scan enable signal is generated only for each clock domain within the input or output wrapper chains. This switch cannot be used in conjunction with the -Clock Merge or the filename -Fixed switches of the Insert Test Logic command. the number specified by integer is applied only to the specified type of wrapper chains. When the switches are used in conjunction with the -Max_number_of_chains option. For more information. Tessent DFTAdvisor Reference Manual. for scan chains within each partition). see the Setup Pin Constraints command. in this case an error message is issued. A unique scan_enable signal is then generated and assigned to each group. Options include: integer — Groups chains by a specified integer. a unique scan enable signal is generated for every scan partition (that is. respectively. the number specified by integer is applied to only input wrapper chains. When this switch is used in conjunction with the -Max_number_of_chains switch. When this switch is used in conjunction with the -Max_number_of_chains switch. This switch can be used in conjunction with the -Clock_domain switch. When this switch is used in conjunction with the the -Max_number_of_chains switch. -Output_wrapper_chain — Used to specify grouping for output wrapper chains. V9. • -Clock_domain An optional switch that specifies to generate a unique scan enable signal for each clock domain. This switch can be used in conjunction with either the -Input_wrapper_chain or -Output_wrapper_chain option. the number specified by integer is applied to each scan partition. With this switch. For more information. the number specified by integer is applied to each clock domain.Command Dictionary Set Scan_enable Sharing • -Max_number_of_chains integer A required switch and integer or literal pair that divides scan chains into groups. • -Scan_partition An optional switch that specifies groupings for each scan partition added using the Add Scan Partition command. Only valid when output wrapper chains are defined. The generated scan enable signals are treated as SEN_IN or SEN_OUT type. When this switch is used in conjunction with the the Max_number_of_chains switch. Only valid when input wrapper chains are defined. see the Setup Pin Constraints command. • -Input_wrapper_chain | -Output_wrapper_chain Optional switches specifying to generate a unique scan enable signal for either all input wrapper chains or all output wrapper chains. where each group cannot have more than the integer number of scan chains.0 June 2010 319 . These switches can be used in conjunction with the -Clock_domain switch. -Input_wrapper_chain — Used to specify grouping for input wrapper chains.

and every group of 5 output wrapper chains controllable via a unique scan enable_signal. outsenN. chain6. chain13 report scan enable --------------------------------------------------------------------------// command: report scan enable --------------------------------------------------------------------------Primary Input Internal Connection Node Scan Chain --------------------------------------------------------------------------/SENPAR1 -chain12 chain13 --------------------------------------------------------------------------/SENPAR2 -chain1 chain2 --------------------------------------------------------------------------/SENPAR3 -chain3 chain4 chain5 chain6 chain7 chain8 --------------------------------------------------------------------------/SENPAR4 -chain9 chain10 chain11 --------------------------------------------------------------------------- A unique scan_enable signal. chain7. 320 Tessent DFTAdvisor Reference Manual. and 3 scan chains for spar3.0 June 2010 . chain10.Command Dictionary Set Scan_enable Sharing This switch can be used in conjunction with the -Edge Merge switch of the Insert Test Logic command. chain4. chain8 add scan partition spar3 -mod C -number 3 -verbose // 3 chains: chain9. chain2 add scan partition spar2 -ins a1/b2 a1/b1/e2 -max_length 2 -verbose // 6 chains: chain3. spar3. V9. Two scan chains are created in the default scan partition for the remaining cells. Example 1 The following example uses a sequence of Set Scan_enable Sharing commands to make every group of 3 input wrapper chains controllable via a unique scan_enable signal. SENPARN. insenN. chain5. is generated and assigned to all core scan chains. Example 2 The following example defines 3 scan partitions: spar1. 6 scan chains for spar2. as specified by the -number argument of the Insert Test Logic command. Two scan chains are created for spar1. spar2. so the previous assignments remain intact. add scan partition spar1 -ins a2/e* -verbose // 2 chains: chain1. Set Scan_enable Sharing -Prefix insen -Max_number_of_chains 3 -Input_wrapper_chain Set Scan_enable Sharing -Prefix outsen -Max_number_of_chains 5 -Output_wrapper_chain The second command operates on a set of scan chains that is disjoint from the set of scan chains operated on by in the first command. chain11 set scan_enable sharing -prefix SENPAR -scan_partition insert test logic -number 2 // 2 chains for the default partition: chain12.

The Set Scan Enable command operates on a set of scan chains that is the same as the set of scan chains in the Set Scan_enable Sharing command. V9. the Set Scan Enable command specifies to assign a unique scan enable signal. two scan partitions are defined: partA and partB. Example 4 In this example. where N is a unique number of each group.0 June 2010 321 . the previous assignments are not affected by the subsequent assignments. This example uses a Set Scan_enable Sharing command to make all scan chains within each scan partition controllable via a unique scan enable signal partSenN.Command Dictionary Set Scan_enable Sharing Example 3 The following example uses a sequence of Set Scan_enable Sharing commands to make every group of three input wrapper chains controllable via a unique scan enable signal insenN. where N is a unique number for each partition. therefore. and every group of five output wrapper chains controllable via a unique scan enable signal outsenN. clkSen. Next. certain previous assignments that are subject to the most recent assignment are overwritten. Add Clock 0 clk1 Set System Mode dft Add Scan Partition partA -instance udff1 umodA/udff2 umodB/udff3 // 1 chain Add Scan Partition partB -instance umodC -number 2 // 2 chains Set Scan_enable Sharing -Prefix partSen -Scan_partition Set Scan Enable clkSen -Partition partB -Clock clock1 Related Commands Add Scan Partition Report Scan Enable Set Scan Enable Setup Pin Constraints Setup Scan Insertion Tessent DFTAdvisor Reference Manual. where N is a unique number for each group. Set Scan_enable Sharing -Prefix insen -Max_number_of_chains 3 -Input_wrapper_chain Set Scan_enable Sharing -Prefix outsen -Max_number_of_chains 5 -Output_wrapper_chain The second command operates on a set of scan chains that is disjoint from the set of scan chains in the first command. to only the scan chains inside the partB scan partition that are also in the clock1 clock domain. therefore.

Command Dictionary Set Scan Type Set Scan Type Scope: Setup mode Usage SET SCan Type {Mux_scan | Lssd | Clocked_scan} Description Specifies the scan style design. If this command is not used.0 June 2010 . V9. Arguments • Mux_scan A literal that specifies for DFTAdvisor to insert mux-DFF type scan elements during the scan insertion process. • Clocked_scan A literal that specifies for DFTAdvisor to insert clocked-signal type scan elements during the scan insertion process. This is the default behavior upon invocation. • Lssd A literal that specifies for DFTAdvisor to insert LSSD type scan elements during the scan insertion process. then during the scan insertion process. DFTAdvisor will use the mux-DFF scan style. Examples The following example uses a mux-DFF scan type design during scan insertion: set scan type mux_scan add clocks 0 clock set system mode dft setup scan identification sequential atpg -percent 50 run insert test logic -max_length 10 322 Tessent DFTAdvisor Reference Manual. The Set Scan Type command specifies the scan style of a design which the scan insertion will create.

including error messages. Examples The following example shows how to use the logfile functionality to capture the transcript in a file and then disable DFTAdvisor from writing to the display: set logfile handling /user/design/setup_file set screen display off Related Commands Report Environment Set Logfile Handling Tessent DFTAdvisor Reference Manual.0 June 2010 323 . This is the default behavior upon invocation. • OFf A literal that specifies to disable the tool from writing any of the session information to the transcript window. Arguments • ON A literal that specifies to enable the tool to write the session information to the transcript window. V9. you may want to disable DFTAdvisor from writing the same information to the session transcript window. If you create a logfile with the Set Logfile Handling command.Command Dictionary Set Screen Display Set Screen Display Scope: All modes Usage SET SCreen Display ON | OFf Description Specifies whether DFTAdvisor writes the transcript to the session window.

V9.0 June 2010 . the DRC reports the C3 violation.Command Dictionary Set Sensitization Checking Set Sensitization Checking Scope: All modes Usage SET SEnsitization Checking OFf | ON Description Specifies whether DRC checking attempts to verify a suspected C3 rules violation. The Set Sensitization Checking command specifies whether the DRC verifies that the path from the source and sink of a suspected C3 violation exists when the source and sink clocks are on and all other clocks are off. Related Commands Set DRC Handling 324 Tessent DFTAdvisor Reference Manual. This is the default behavior upon invocation. Arguments • OFf A literal that disables the C3 DRC sensitization check. If sensitization checking is on and the paths associated with the violation meet these conditions. • ON A literal that enables the C3 DRC sensitization check.

V9. ON A literal that enables shadow checking.0 June 2010 325 . Arguments • • OFf A literal that disables shadow checking. This is the initial state upon invocation of DFTAdvisor. You can use the Set Shadow Check command to disable the checking and avoid corresponding error messages. Examples The following example disables shadow checking. This will prevent identification of any non-scan sequential element as a shadow element. Usage SET SHadow Check OFf | ON Description Specifies whether DFTAdvisor will identify sequential elements as “shadow” elements when tracing existing scan chains.Command Dictionary Set Shadow Check Set Shadow Check Scope: All modes. set shadow check off Related Commands Set DRC Handling Report Environment Tessent DFTAdvisor Reference Manual.

a control register in a test controller. it can significantly increase your run time. such as a JTAG TAP. When non-scan state elements control scan chain operation. When you specify this option. set stability check all_shift 326 Tessent DFTAdvisor Reference Manual. V9. Therefore. you should specify this command with the All_shift option to simulate all applications of the shift procedure or rules checking will not succeed. a shift counter -.0 June 2010 .controls the scan chain shifting. needs to be checked to see that the TAP register holds state during the shift procedure.composed of non-scan elements -. This option should be used with BIST. For example. Or. DFTAdvisor only simulates one shift of the scan chain.Command Dictionary Set Stability Check Set Stability Check Scope: Setup mode. This counter counts from zero to a predetermined number and then resets to zero. The shift procedure is simulated for as many applications as the load_unload procedure calls for. Arguments • All_shift A literal that enables the tool to perform the most detailed level of checking. for a design containing BIST. before design rule checking Usage SET STability Check All_shift Description Specifies how the tool checks the effect of applying the shift procedure on non-scan cells. DFTAdvisor needs to understand the values of these elements in order to perform scan chain tracing. which does not provide enough information about the non-scan elements and how they control scan shifting. Examples The following example shows how to enable the detail checking which simulates the shift procedure more than once. This predetermined number is related to the number of shifts applied by the load_unload procedure. By default.

Command Dictionary Set System Mode Set System Mode Scope: All modes Usage SET SYstem Mode Setup | Dft Description Specifies the next system mode for the tool to enter. Examples The following example will change the system mode so you can perform a scan identification run. DFTAdvisor builds a flat. which includes scan insertion (Dft) or the default system mode of Setup. The Set System Mode command directs DFTAdvisor to a specific system mode. When switching from the Setup mode to the Scan Insertion system mode. if you return to Setup mode.0 June 2010 327 . gate-level simulation model. V9. issue any of the following commands and then switch to Dft mode. add tied signals 1 vcc add tied signals 0 vss add clocks 0 clock set system mode dft run report sequential instances Tessent DFTAdvisor Reference Manual. Dft A literal that specifies for the tool to enter the Scan Insertion system mode. or DFTAdvisor builds a new simulation model: • • • • • • • • • Add Nofaults Add Tied Signals Delete Nofaults Delete Tied Signals Set Internal Fault Set Internal Name Setup Tied Signals Arguments Setup A literal that specifies for the tool to enter the Setup system mode. gate-level simulation model. After the initial building of the flat.

The default setting is off. Arguments • -Set ON | OFf A switch and literal pair that enables the insertion of test logic to make set signals controllable. The default setting is off. clock. no additional test logic is needed to prevent contention due to scan shifting. If all enable signals of a bus are driven purely by combinational logic. The default setting is off. DFTAdvisor fixes a C6 violation by inserting a multiplexer into the data path that feeds the flip-flop generating the violation. • -Clock ON | OFf A switch and literal pair that enables the insertion of test logic to make clock signals controllable. The test mode input of the multiplexer is driven by a nearby scan flip-flop. reset.Command Dictionary Set Test Logic Set Test Logic Scope: Setup mode Usage SET TEst Logic {-Set {ON | OFf} | -REset {ON | OFf} | -Clock {ON | OFf} | -RAm {ON | OFf} | -C6 {ON | OFf}}… Description Inserts test logic to control the set. or write control signals to make them scannable when scan chains are inserted. you must specify the cell models with the Add Cell Models command. • -RAm ON | OFf A switch and literal pair that enables the insertion of test logic to make read and write signals controllable. no test logic is inserted on control signals. By default. This option does not affect the set and reset signals of the RAM. You can use the Report Dft Check command to display the signals where test logic can be inserted to make the signals controllable. When a top-level clock feeds the data input 328 Tessent DFTAdvisor Reference Manual. • -REset ON | OFf A switch and literal pair that enables the insertion of test logic to make set signals controllable. enable. You can use the Report Environment command to display the current test logic settings. • -C6 {ON | OFf} A switch and literal pair that. V9. when enabled.0 June 2010 . You should use the edge_trigger attribute in the library definition of the RAM to specify inserting test logic to control these signals. see the “Attributes of RAM/ROM Primitives” section of the Tessent Common Resources Manual for ATPG Products. instructs DFTAdvisor to add hardware to fix identified C6 violations. For more information. The default setting is off. Before inserting scan chains.

V9.Command Dictionary Set Test Logic of many flip-flops (which results in multiple C6 violations).0 June 2010 329 . This setting is off by default. the multiplexer is inserted at the highest possible level of hierarchy. Note This option cannot be used when the Set Drc Handling -Conservative switch is enabled. The driving scan cells are selected to be in the same clock domain as the flip-flops generating the C6 violations. Example The following example checks the set and clock signals of uncontrollable memory elements and makes them controllable with the addition of test logic: add clocks 0 clk set test logic -set on -clock on set system mode dft report dft check add cell models and2 -type and add cell models or2 -type or add cell models mux21h -type mux s a b add cell models nor2 -type nor report cell models insert test logic Related Commands Add Cell Models Delete Cell Models Report Cell Models Set Latch Handling Tessent DFTAdvisor Reference Manual.

This is the default behavior upon invocation. Examples The following example displays the gates in the scan chain trace during rules checking: add clocks 0 clock add scan groups group1 scanfile add scan chains chain1 group1 indata2 outdata4 set trace report on set system mode dft Related Commands Add Scan Chains Report Scan Chains 330 Tessent DFTAdvisor Reference Manual. The Set Trace Report command controls whether the tool displays all of the gates in the scan chain trace during rules checking. Arguments • OFf A literal that specifies for the tool to not display gates in the scan chain trace.0 June 2010 . • ON A literal that specifies for the tool to display gates in the scan chain trace during rules checking.Command Dictionary Set Trace Report Set Trace Report Scope: All modes Usage SET TRace Report OFf | ON Description Specifies whether the tool displays gates in the scan chain trace. V9.

V9. If Off is specified.Command Dictionary Set Transient Detection Set Transient Detection Scope: All modes Usage SET TRansient Detection OFf | {ON [-Verbose | -NOVerbose]} Description Specifies whether the tool detects all zero width events on the clock lines of state elements. Example To remove the verbose messages during DRC checking. monostable circuits with ideal behavior which is rarely matched in silicon. DRC simulation treats all events on state elements as valid. then the tool sets that state element to X. This is the invocation default. • -NOVerbose An optional switch that specifies the tool not to display a message identifying each time a state element is set to X due to transient detection. If the zero width event causes a change of state in the state element. -Verbose An optional switch that specifies the tool to display a message identifying each time a state element is set to X due to transient detection. This is the invocation default and is only valid when transient detection is enabled. it is possible for DRC to simulate zero width. Because the simulator is a zero-delay simulator. The resulting zero width output pulse from the monostable circuit is also treated as a valid clocking event for other state elements. This switch is only valid when transient detection is enabled. enter: set transient detection on -noverbose Related Commands Report Environment Tessent DFTAdvisor Reference Manual.0 June 2010 331 . ON A literal that specifies for the tool to set transient detection on. The Set Transient Detection command sets the simulator to detect all zero width events on the clock lines of state elements. Arguments • • • OFf A literal that specifies for the tool to set transient detection off.

or by TIE1.. By default. Options include: OFf — no test logic is inserted to control tri-state devices. The default setting is off. V9. | Decoded} [-Control {SEn | TEn}] [-Force_gating] Description Specifies how tri-state devices are controlled during scan chain shifting. This behavior can be overridden by using the -Force_gating switch. Scan — test logic is inserted to control tri-state devices used as scan inputs/outputs. primary_input_or_output — specifies a primary input or output pin.. Decoded — test logic is inserted to control tri-state devices with the TEN signal to ensure test logic structures are valid only in test mode. Busdrivers — test logic is inserted to control tri-state devices driving bus nets. when the enable signal of a tri-state device is directly controlled by a primary input. 332 Tessent DFTAdvisor Reference Manual. Single tri-state gates driving nets (primary net or an internal net) — All single tristate gates are turned on for testing. When enabled. ON — test logic is inserted when necessary to control all tri-state devices. test logic is inserted that controls tri-state devices as follows: • • Multiple tri-state gates driving nets (bus net) — One gate is turned on and the rest are turned off during testing. Default setting. Arguments • {OFf | ON | Busdrivers | Scan | primary_input_or _output. If the necessary test logic already exists.. Test logic is inserted to control the tri-state devices driving the specified primary output pin(s) or driven by the specified primary input pin(s). You can also specify which signal (SEN or TEN) controls the enable lines of tri-state devices. | Decoded} Required literal or repeatable string that specifies which tri-state devices to control during scan shifting.. none is inserted. no gating is necessary and a force statement for the primary input is added to the load_unload procedure in the new procedure file.0 June 2010 . The Set Tristate Gating command ensures tri-state devices are controlled to either prevent bus contention or be turned on during testing.Command Dictionary Set Tristate Gating Set Tristate Gating Scope: Setup mode Usage SET TRistate Gating { OFf | ON | Busdrivers | Scan | primary_input_or_output. by TIE0.

• -Force_gating An optional switch that adds test logic to the enable lines of tri-states devices when these lines are directly controlled by primary inputs. /tpin_2 is a tristate device driving primary output out4. add clocks 0 clk setup scan identification full_scan set tristate gating on set bidi gating scan add scan pins c1 bidi_in1/X blkB1/blkA/utri2/A -top io out1 set system mode dft report dft check -tristate ------------------------------------------------------------------------Bidi Primitive Control Control Tri-state State Direction Gating ID Signal Driver ------------------------------------------------------------------------/bidi_in1 OFF IN YES 20 SEN /or2/Y /blkB1/blkA/utri3 OFF -YES 15 SEN /udff0/Q /blkB1/blkA/utri2 ON -YES 17 SEN /or2/Y /blkB1/blkA/utri1 OFF -YES 16 SEN /or2/Y ------------------------------------------------------------------------- Example 2 The following example uses the force_gating switch to insert test logic controlled by the SEN control signal on the enable line of /tpin_2. DFTAdvisor adds the force statement for this primary input to the load_unload procedure in the procedure file. or by TIE1. its enable signal is directly controlled by the primary input /io_control1. or by TIE0. When the enable line is directly controlled by a primary input. V9. Example 1 The following example uses the Set Tristate Gating command to insert test logic and make all tri-state devices driving bus nets controllable via the SEN signal. TEn — Specifies the test_enable signal. it then reports the gated tri-state devices. Default setting.0 June 2010 333 . Literal options include: SEn — Specifies the scan_enable signal. set tristate gating out4 -force_gating report dft check -tri Tessent DFTAdvisor Reference Manual.Command Dictionary Set Tristate Gating • -Control SEn | TEn An optional switch and literal pair that specifies the enable signal used to control tri-state devices.

Command Dictionary Set Tristate Gating ---------------------------------------------------------------------Bidi Primitive Control Control Tri-state State Direction Gating ID Signal Driver ---------------------------------------------------------------------/tpin_1 ON -NO 44 SEN /io_control /tpin_2 ON -YES 43 SEN /io_control1 /bidi_1 ON OUT NO 45 SEN /io_control /bidi_2 ON OUT NO 46 SEN /io_control /bidi_3 ON OUT NO 41 SEN /io_control ---------------------------------------------------------------------- Related Commands Report Dft Check Report Test Logic Report Control Signals Set Bidi Gating Set Test Logic 334 Tessent DFTAdvisor Reference Manual.0 June 2010 . V9.

connects it to either the scan enable signal or the signal specified by the -Driver pin_pathname argument. -Module. if unconnected. -Instance.Command Dictionary Setup Clock Gating Setup Clock Gating Scope: Setup mode Usage SETup CLock Gating [-LIbrary_model library_model_name…] [-Module netlist_module_name…] [-INStance pathname…] [-Port_to_connect port_name [-INVert]] [-Driver pin_pathname [-Active {High | Low}]] Description Specifies clock gating cells whose unconnected scan enable ports need to be connected to either the scan enable signal or a specified signal (pin). • -INstance pathname A optional switch and a repeatable string that specify the pathname(s) of the clock gating cell instances whose unconnected port is to be connected to either the scan enable signal or to the specified signal. V9. • • -LIbrary_model library_model_name An optional switch and a repeatable string that specify the library model name(s) of the clock gating cell instances whose unconnected port is to be connected to either the scan enable signal or to the specified signal. This occurs when none of the following switches is specified: -Library_model. Automatically checks if the specified port of each specified instance is unconnected and. if unconnected. DFTAdvisor does one of the following: • Automatically checks if the scan enable port of each recognized clock gating instance is unconnected and.0 June 2010 335 . • -Module netlist_module_name An optional switch and a repeatable string that specify the netlist module name(s) of the clock gating cell instances whose unconnected port is to be connected to the specified signal. DFTAdvisor only attempts to connect the specified port of the specified clock gating cell if it determines the port is really unconnected. or Port_to_connect. connects it to either the scan enable signal or the signal specified by the -Driver pin_pathname argument. Tessent DFTAdvisor Reference Manual. This option requires both the -Port_to_connect and -Driver options to be specified as well.

By default. • -Driver pin_pathname [-Active {High | Low}] An optional switch and literal pair that specifies the pin pathname for the signal driver that the unconnected port is to be connected to. The results of these commands are shown by the Report Clock Gating command output: set scan enable sen setup clock gating -instance clkg1/clkg1/clkgLA -driver sen1 -active low setup clock gating -instance clkg3/clkg1/clkgLA clkg2/clkg1/clkgLA set system mode dft // Note: The following clock gating instances have unconnected ports that will be connected to a scan enable signal. DFTAdvisor assumes the active state is High..Command Dictionary Setup Clock Gating • -Port_to_connect port_name [-INVert] An optional switch and a string pair that specifies the unconnected port of the clock gating cell to be connected to either the scan enable signal or to the specified signal. sen. -Active — An optional switch that indicates whether the specified signal is active Low or High. the expected input value for the unconnected port is set to 1 during the shift cycle.. The next two instances are connected to the default scan enable signal. insert test logic 336 Tessent DFTAdvisor Reference Manual. unless it is an existing global signal whose active state is known. When this option is not specified. The first instance is connected to the sen1 pin which drives the signal with the active state set to low... This switch specifies that the expected input value is set to 0 during the shift cycle. ------------------------------------------------------------------------Clock Gating Unconnected Signal Instance Port Driver ------------------------------------------------------------------------clkg1/clkg1/clkgLA SE sen1 clkg2/clkg1/clkgLA SE sen clkg3/clkg1/clkgLA SE sen ------------------------------------------------------------------------. The specified pin_pathname can be either a toplevel port or an internal pin instance. DFTAdvisor assumes the unconnected ports are to be connected to the scan enable signal. Examples The following example connects the unconnected scan enable ports of specified clock gating instances. This option must be specified when the -Module switch is specified.0 June 2010 . This option must be specified when the -Module switch is specified.. -INVert — By default.. V9.

V9.0 June 2010 337 .Command Dictionary Setup Clock Gating report clock gating -instance clkg1/clkg1/clkgLA clkg2/clkg1/clkgLA clkg3/clkg1/clkgLA ------------------------------------------------------------------------Clock Gating Unconnected Signal Instance Port Driver ------------------------------------------------------------------------clkg1/clkg1/clkgLA SE sen1 clkg2/clkg1/clkgLA SE sen clkg3/clkg1/clkgLA SE sen ------------------------------------------------------------------------- Related Topics Report Clock Gating Tessent DFTAdvisor Reference Manual.

Arguments • -Location Internal | External A required switch and literal pair that specifies whether the location of the EDT logic is internal or external to an existing chip. V9. refer to the Tessent TestKompress User’s Guide. setup edt -location internal write atpg setup scan -edt Related Commands Write Atpg Setup 338 Tessent DFTAdvisor Reference Manual. The default is the external flow. Note Tessent TestKompress supports two flows for inserting compression hardware into a netlist: an internal flow and an external flow.Command Dictionary Setup EDT Setup EDT Scope: All modes Usage SETup EDt -Location {External | Internal} Description The Setup EDT command identifies a design that uses the internal flow and enables the Write ATPG Setup command to write out EDT-specific commands for the internal flow to the ATPG setup files.0 June 2010 . Examples The following example writes out EDT-specific commands for an internal flow to the ATPG setup files. For more information on these flows.

Default Prefix Name tcntl xbnd lckup ctlff ctlpt obsff obspt inreg outreg uu Instance Literal Tristate Xbound Lockup CONTROL_Flop CONTROL_Point OBSERVE_Flop OBSERVE_Point IN_register OUt_register Tessent DFTAdvisor Reference Manual. and you can change the default the tool uses to name nets. and reports current or modified settings. The invocation default prefix is net. You can use it to change the default prefix that DFTAdvisor uses to name certain types of added test logic. Table 2-9 shows the invocation defaults for particular logic instance types: Table 2-9.Command Dictionary Setup Naming Setup Naming Scope: All modes Usage SETup NAming [{-Net prefix_name} | {-INStance {[Tristate | Xbound | Lockup | CONTROL_Flop | CONTROL_Point | OBSERVE_Flop|OBSERVE_Point|IN_register|OUt_register] prefix_name}…} {-Scan_chain prefix_name} | {-INPut_wrapper_chain prefix_name} | {-Output_wrapper_chain prefix_name}] Description Explicitly defines the default names for nets and instances.0 June 2010 339 . If you make any changes. Instance Type Prefix Defaults Object Type Tri-state control X bounding lockup cells Control point flip-flop Control point logic Observe point flip-flop Observe point logic Input partition flip-flop Output partition flip-flop Other logic Arguments • -Net prefix_name An optional switch and string pair that specifies the prefix_name you want as the default prefix for naming nets. it automatically reports on the current settings for all prefixes. If you invoke the command without an argument. The Setup Naming command serves two purposes. V9. it reports the modified settings.

At invocation. prefix_name applies to all added test logic not covered by one of the object type literals. IN_register — An optional literal that specifies to apply the prefix_name as the default for the logic object type input partition flip-flop. The default prefix is inreg. the default value for prefix_name is chain. The default prefix for this other logic is uu. The default prefix is xbnd. repeatable literal and string pair. OBSERVE_Flop — An optional literal that specifies to apply the prefix_name as the default for the logic object type observe-point flip-flop. The default prefix is ctlff. V9. OUt_register — An optional literal that specifies to apply the prefix_name as the default for the logic object type output partition flip-flop. OBSERVE_Point — An optional literal that specifies to apply the prefix_name as the default for the logic object type observe-point logic. At invocation. Tristate — An optional literal that specifies to apply the prefix_name as the default for the logic object type tri-state control. the default value for prefix_name is chain.Command Dictionary Setup Naming • -INStance [Tristate | Xbound | Lockup | CONTROL_Flop | CONTROL_Point | OBSERVE_Flop | OBSERVE_Point] prefix_name An optional switch. If you do not specify an object type literal. the default value for prefix_name is chain. CONTROL_Flop — An optional literal that specifies to apply the prefix_name as the default for the logic object type control-point flip-flop. CONTROL_Point — An optional literal that specifies to apply the prefix_name as the default for the logic object type control-point logic. Lockup — An optional literal that specifies to apply the prefix_name as the default for the logic object type lockup cell. At invocation. that specifies the prefix_name you want as the default prefix for the object type specified by the literal. The default prefix is outreg.0 June 2010 . The default prefix is obsff. • -Scan_chain prefix_name An optional switch and string pair that specifies a new default prefix for naming scan chains of any scan chain type. • -INPut_wrapper_chain prefix_name An optional switch and string pair that specifies a new default prefix for naming input wrapper chains. The default prefix is lckup. Example 1 The following example resets the default prefix name for tri-state control logic to “tric” and for lockup cells to “lockl”: setup naming -instance tristate tric lockup lockl 340 Tessent DFTAdvisor Reference Manual. Xbound — An optional literal that specifies to apply the prefix_name as the default for the logic object type X bound control. • -Output_wrapper_chain prefix_name An optional switch and string pair that specifies a new default prefix for naming output wrapper chains. The default prefix is obspt. The default prefix is ctlpt. The default prefix is tcntl. with an optional.

.Command Dictionary Setup Naming DFTAdvisor will change the prefix names and issue the following report: // // // // // // // // // // // // Setup naming prefixes: nets : net tristates : tric xbounding : xbnd lockup cells : lockl observe flops : obsff observe points : obspt control flops : ctlff control points : ctlpt input registers : inreg output registers : outreg other instances : uu Example 2 The following example overrides the default scan chain name assignments for all three scan chain types and applies the new default prefixes to the newly created chains of each type. V9. setup naming -scan_chain coreChain setup naming -input_wrapper_chain inputWrapper setup naming -output_wrapper_chain outputWrapper .0 June 2010 341 . report scan chains Input wrapper chains: ------------------------------------------------------------------------chain = inputWrapper1 group = group1 input = /scan_in1 output = /out1 length = 3 scan_enable = /se_in clock = /clk chain = inputWrapper2 group = group1 input = /scan_in2 output = /scan_out1 length = 3 scan_enable = /se_in clock = /clk chain = inputWrapper3 group = group1 input = /scan_in3 output = /scan_out2 length = 2 scan_enable = /se_in clock = /clk Output wrapper chains: ------------------------------------------------------------------------chain = outputWrapper1 group = group1 input = /scan_in4 output = /out2 length = 1 scan_enable = /se_out clock = /test_clk Default scan partition chains: ------------------------------------------------------------------------chain = coreChain1 group = group1 input = /scan_in5 output = /scan_out3 length = 1 scan_enable = /scan_en clock = /clk Related Commands Insert Test Logic Set Test Logic Report Scan Chains Setup Registered IO Tessent DFTAdvisor Reference Manual..

Arguments • OFf | ON A required string that specifies to set or remove the current default mask setting for all primary output pins. This default mask is present on the output pin. You can also use the Add Output Masks command to add a mask to any of the output pins excluded with the Setup Output Masks command. you can exclude pins from the mask. and any specified pins. You use the Off literal to remove all default masks defined with this command. DFTAdvisor uses primary output pins as the observe points during the scan and test point identification process. • • -Bidi_exclude An optional switch that specifies to exclude bidirectional pins from the mask setting. When you mask a primary output pin. or remove a hold value using the Delete Output Masks command. V9. The Setup Output Masks command masks all the output and bidirectional pins specified.0 June 2010 . you inform DFTAdvisor to mark that pin as an invalid observation point during the scan and test point identification process. 342 Tessent DFTAdvisor Reference Manual. You can exclude bidirectional pins. • -Exclude primary_output_pin An optional switch and repeatable string that specifies to exclude the specified primary output pins from the mask setting.Command Dictionary Setup Output Masks Setup Output Masks Scope: Setup mode Usage SETup OUtput Masks OFf | {ON [-Bidi_exclude] [-Lbist_exclude] [-Exclude primary_output_pin…]} Description Sets the default mask for all output and bidirectional pins. When turning masking on. The tool invocation default setting is no masks. LBISTArchitect scan output pins. -Lbist_exclude An optional switch that specifies to exclude LBISTArchitect scan output pins from the mask setting. unless overridden by the Add Output Masks command. You can add a hold value to a default mask with the Add Output Masks command.

0 June 2010 343 . then adds two additional pin masks with a hold value of 1: setup output masks on -lbist_exclude add output masks out1 out2 -hold 1 Related Commands Add Output Masks Delete Output Masks Report Output Masks Tessent DFTAdvisor Reference Manual.Command Dictionary Setup Output Masks Examples The following example defines the default mask for all but the LBISTArchitect scan output pins. V9.

resets. • C0 | C1 | CZ | CX A literal that specifies the default constant value constraint for the primary_input pins. 344 Tessent DFTAdvisor Reference Manual. LBISTArchitect-related control and data pins. unless overridden by the Add Pin Constraints command. RAM/ROM write signals. and any specified pin. • • -Bidi_exclude An optional switch that specifies to exclude bidirectional pins from the setup setting. C1 — A literal that specifies application of the constant 1 to the chosen primary input pins. This is the tool invocation default.Command Dictionary Setup Pin Constraints Setup Pin Constraints Scope: Setup mode Usage SETup PIn Constraints None | {{C0 | C1 | CZ | CX} [-Bidi_exclude] [-Lbist_exclude] [-Exclude primary_input_pin…]} Description Sets the default pin constraint value for all input and bidirectional pins.0 June 2010 . and known scan inputs. The Setup Pin Constraints command constrains all input and bidirectional pins to the specified default value. Arguments • None A required string that specifies to remove all the current default constraints for all primary input and bidirectional pins. except for any pins excluded by the specified exclude options. CZ — A literal that specifies application of the constant Z (high-impedance) to the chosen primary input pins. -Lbist_exclude An optional switch that specifies to exclude LBISTArchitect-related input pins from the setup setting. This default value is present on the input pin. You must specify this literal or one of the “C” literals. You must specify one of these literals or the None literal. sets. CX — A literal that specifies application of the constant X (unknown) to the chosen primary input pins. V9. The constraint choices are as follows: C0 — A literal that specifies application of the constant 0 to the chosen primary input pins. RAM/ROM read signals. You can exclude bidirectional pins. You use the None literal to remove all default settings defined with this command. These pins include clocks.

then adds two additional pin constraints that override the default: setup pin constraints c0 -lbist_exclude add pin constraints kgmt c1 add pin constraints ckgmt c1 Related Commands Add Pin Constraints Add Seq_transparent Constraints Analyze Input Control Delete Pin Constraints Report Pin Constraints Tessent DFTAdvisor Reference Manual.Command Dictionary Setup Pin Constraints • -Exclude primary_input_pin An optional switch and repeatable string that specifies to exclude the specified primary input pins from the setup setting.0 June 2010 345 . Examples The following example defines the default pin constraints for all but the LBISTArchitect related control and data pins. V9.

I/Os that are designated as scan-in/scan-out pins or are driving/driven by scanin/scan-out pins are not registered unless they are explicitly added to the -Include list of this command. unconnected I/Os are not registered. The -Include switch cannot be used in conjunction with the -Exclude switch. You can specify that combinational feed-throughs should be registered by doing one of the following: • Specify the -REG_Comb_feedthrough switch for this command. DFTAdvisor will report scan-in/scan-out related I/Os that are not explicitly listed with the -Include switch as not being registered. the output registration cells and the output wrapper cells are placed in the same scan chains.. The registered cells are also placed into scan chains.]} [-INPUT_Model model_name] [-OUTPUT_Model model_name] [-INPUT_Clock pin_pathname] [-OUTPUT_Clock pin_pathname] [-REG_Floating] [-REG_Comb_feedthrough] [-REG_Seq_feedthrough] Description Turns on the automatic registration of the primary I/O pins of the design. The specified I/O pins are registered with scan cells defined through the Add Cell Models command. You can specify that specific clocks are used for the registration cells by using the -Input_clock and -Output_clock switches. Specify the unconnected I/Os in the -Include list of this command. Usage SETup REgistered IO {[-Exclude pin_names…] | [-INClude pin_names. and the inserted scan cells can be included in the same scan chains along with the existing cells of the design. By default. 346 Tessent DFTAdvisor Reference Manual. You can specify that unconnected I/Os should be registered by doing one of the following: • • Specify the -REG_floating switch for this command. If clocks are not specified.0 June 2010 . By default. Similarly. The user-defined clocks and scan-related I/O pins are automatically excluded from registration. V9. the clocks of adjacent cells in the chain or new test clock signals will be used for the registration cells. The input registration cells and the input wrapper cells are then placed in the same scan chains.. To place the input and output registration cells in separate scan chains. the Setup Wrapper Chains command can be used in conjunction with this command to specify different number of chains and scan enable pins for the input and output registration cells. combinational feed-throughs are not registered.Command Dictionary Setup Registered IO Setup Registered IO Scope: All modes Prerequisites: A scan model must be defined with the Add Cell Models command before using this command. During I/O registration. By default.

You can specify that sequential feedthroughs should be registered by doing one of the following: • • Specify the -REG_Seq_feedthrough switch for this command. sequential feed-throughs are not registered. The specified pin pathname should either be a primary input or a top-level instance output pin. DFTAdvisor uses the clock of the neighboring cell in the output wrapper chain (when wrapper chains are inserted) or a test clock (when neighboring cell does not exist). • -Input_model model_name An optional switch and string pair that uses model_name cells for registering primary inputs. Specify the PI/POs of the sequential feed-throughs in the -Include list of this command. Note that clock and scan-related pins are automatically excluded. Clock and scan-related pins are automatically excluded from registration. If this switch is not specified. Note This feature does not address the stitching of multiple cores. Tessent DFTAdvisor Reference Manual. This switch cannot be used with the -Include switch. You must first define model_name with the Add Cell Models command. This switch cannot be used with the -Exclude switch. • -Output_clock pin_pathname An optional switch and string pair that specifies to use the pin_pathname clock to control registration cells inserted for output pins. If this switch is not specified.0 June 2010 347 . • -Input_clock pin_pathname An optional switch and string pair that specifies to use pin_pathname clock to control registration cells inserted for input pins. The specified pin pathname should either be a primary input or a top-level instance output pin.Command Dictionary Setup Registered IO • Specify the PI/POs of the combinational feed-throughs in the -Include list of this command. Arguments • -Exclude pin_names An optional switch and repeatable string that specifies primary I/O pins to exclude from registration. DFTAdvisor uses the clock of the neighboring cell in the input wrapper chain (when wrapper chains are inserted) or a test clock (when neighboring cell does not exist). but rather the insertion of wrapper chains in a single core. V9. • -Output_model model_name An optional switch and string pair that uses model_name cells for registering primary outputs You must first define model_name with the Add Cell Models command. Be default. • -Include pin_names An optional switch and repeatable string that specifies which primary I/O pins to register.

sequential defaults are not registered. Four I/O pins are excluded from identification by the Setup Wrapper Chains command and explicitly included for I/O registration by the Setup Registered IO command. V9. By default. combinational feed-throughs are not registered. Examples The following example illustrates how scan-based I/O registration can be used along with wrapper chains: add cell model FDSQ -type scancell CLK D setup wrapper chains -exclude in1 in2 out1 out2 -input_number 1 -output_number 1 setup registered IO -include in1 in2 out1 out2 set system mode dft run report wrapper cells insert test logic In this example. For more information. • -REG_Comb_feedthrough An optional switch that specifies to register combinational feed-throughs. A sequential feedthrough is a path between PI and PO that has only one sequential cell and contains no combinational logic other than buffers and inverters. A combinational feed-through is a path between a PI and PO that is either through combinational logic only or no logic at all. Note that this registration allows inserting registration cells along with the identified wrapper cells. unconnected I/Os are not registered. By default. • -REG_Seq_feedthrough An optional switch that specifies to register sequential feed-throughs. see the Setup Wrapper Chains command. By default. Note: A multi fan-out PI is considered a combinational feed-through only when all of its fan-outs are combinational feed-throughs. Note: A multi fan-out PI is considered a sequential feed-through only when all of its fan-outs are sequential feed-throughs. The following figure shows a scan cell that is used as a control and observe point. When used as an observe point.Command Dictionary Setup Registered IO • -REG_Floating An optional switch that specifies to register unconnected I/Os. it can capture data by means of the feedback 348 Tessent DFTAdvisor Reference Manual.0 June 2010 . The scan cell used for registration can be modeled in many ways as long as it has the same input and output pins as a scan cell. DFTAdvisor identifies the input and output wrapper cells upon issuing the Run command. The input registration cells are placed into the input wrapper chains and output registration cells are placed into the output wrapper chains.

note that the input registration cell uses the input wrapper chain scan enable signal.Command Dictionary Setup Registered IO connection.0 June 2010 349 . V9. whereas the output registration cell uses the output wrapper chain scan enable signal. Also. Related Commands Add Cell Models Related Commands Setup Naming Setup Wrapper Chains Tessent DFTAdvisor Reference Manual.

Clock Sequential Arguments • Clock_sequential A required literal that enables clock sequential techniques for scan identification.Command Dictionary Setup Scan Identification Setup Scan Identification Scope: All modes Usage • SETup SCan Identification {Full_scan | {Clock_sequential [-Depth integer]} | {SEQ_transparent [-Reconvergence {ON | OFf}]} | {Wrapper_chains [-Input_threshold {integer | Nolimit}] [-Output_threshold {integer | Nolimit}]} | [-Internal |-External filename] [-COntrollability integer] [-Observability integer] [-Backtrack integer] [-CYcle integer] [-Time integer] [-Min_detection floating_point]} | {AUtomatic [{-Percent integer} | {-Number integer}] {SCoap [-Percent integer | -Number integer]} | {STructure [-Percent integer | -Number integer] [-Loop {ON | OFf}] [-Self_loop {integer | Nolimit}] [-Depth {integer | Nolimit}]}} | None} [-MAx_length integer | -NUmber integer] Description Specifies the scan identification methodology and amount of scan to consider during the identification run. For more information on full scan. For more information on clock sequential scan. The default depth is 16. V9. • -Depth integer An optional switch and integer pair that specifies the maximum sequential depth on any sequential path. refer to “Understanding Full Scan” in the Scan and ATPG Process Guide. converting all scannable sequential elements to scan. This method selects scannable cells by cutting sequential loops and limiting sequential depth based on the -Depth switch. refer to “Tessent FastScan Handling of Non-Scan Cells” in the Scan and ATPG Process Guide. Full Scan Arguments • Full_scan A required literal that enables full scan for scan identification. 350 Tessent DFTAdvisor Reference Manual. Full scan is the fastest identification method. The maximum depth is 255.0 June 2010 . You can use Tessent FastScan for ATPG on full scan designs. This is the default upon invocation of the tool.

When DFTAdvisor reaches the specified threshold for a given primary input or primary output. • -Output_threshold {integer | Nolimit} An optional switch and integer or literal pair that specifies the maximum number of wrapper cells for any given unobservable output.Command Dictionary Setup Scan Identification Sequential Transparent Arguments • SEQ_transparent A required literal that enables the sequential transparency identification method for scan. The default is nolimit. The default is ON. refer to “Tessent FastScan Handling of Non-Scan Cells” in the Scan and ATPG Process Guide. • -Input_threshold {integer | Nolimit} An optional switch and integer or literal pair that specifies the maximum number of wrapper cells for any given uncontrollable input. Sequential Using ATPG Arguments • -Internal An optional switch that bases scan identification on the internally-generated fault list. you maintain control over the trade-off of whether to scan these wrapper cells or. overhead extremes may occur when DFTAdvisor identifies a large number of wrapper cells for a given uncontrollable primary input or unobservable primary output. Note that this technique is useful for data path circuits. For more information on sequential transparent scan. insert a controllability/observability scan cell. it terminates the wrapper chain identification process on that primary input or primary output and unmarks any wrapper cell identified for that pin. Scan cells are selected such that all sequential loops. Tessent DFTAdvisor Reference Manual. For more information on wrapper chains. V9. including self loops.0 June 2010 351 . By setting the wrapper cell threshold limit for primary inputs (-Input_threshold switch) and primary outputs (-Output_threshold switch). refer to “Understanding Wrapper Chains” in the Scan and ATPG Process Guide. You can also set threshold limits to control the overhead sometimes associated with wrapper cell identification. • -Reconvergence {ON | OFf} An optional switch and literal pair that removes sequential reconvergent paths by selecting a scannable instance on the sequential path for scan. The default is nolimit. are cut. This is the default. For example. instead. Wrapper Chain Arguments • Wrapper_chains A required literal that enables wrapper chains for controllability and observability of wrapper cells.

This method selects scan cells using a combination of several scan selection techniques. • -COntrollability integer An optional switch and integer pair that specifies the percentage of controllability test coverage. The default upon invocation of DFTAdvisor is 100 percent.Command Dictionary Setup Scan Identification • -External filename An optional switch and string pair that specifies a fault file to base scan identification. DFTAdvisor continues the scan identification process until it either reaches the specified test coverage or no productive scan candidates are available. The goal is to select the minimum set of best scan candidates needed to achieve high fault coverage. The default upon invocation of DFTAdvisor is 0. • -Min_detection floating_point An optional switch and floating point pair that specifies the minimum percentage of test coverage that a scan cell must provide. The default upon invocation of DFTAdvisor is 100 percent. The default upon invocation of DFTAdvisor is 100 seconds of CPU time. • -Observability integer An optional switch and integer pair that specifies the percentage of observability test coverage. The file must contain the user-defined fault list for identifying critical flip-flops that you want to convert to scan flip-flops. The default upon invocation of DFTAdvisor is 16 test cycles. Sequential Using Automatic Arguments • AUtomatic An optional literal that enables the automatic technique for partial scan selection. If a scan cell does not detect at least the specified minimum percentage of faults. DFTAdvisor does not select the cell for scan. • -Time integer An optional switch and integer pair that specifies the CPU time in seconds that DFTAdvisor uses before aborting the target fault. V9. 352 Tessent DFTAdvisor Reference Manual.01 percent. • -CYcle integer An optional switch and integer pair that specifies the number of test cycles DFTAdvisor encounters before aborting the target fault. • -Backtrack integer An optional switch and integer pair that specifies the number of conflicts DFTAdvisor encounters before aborting the target fault. The default upon invocation of DFTAdvisor is 30 conflicts.0 June 2010 . DFTAdvisor continues the scan identification process until it either reaches the specified test coverage or no productive scan candidates are available.

you should use the default to allow the tool to determine the amount of scan needed. based on the ATPG results and how they compare to the required test coverage criteria. Sequential Using SCOAP Arguments • SEQUential A required literal that enables partial scan for scan identification. Partial scan requires that you specify the SCOAP algorithm and how many scan elements to identify. if a limit is set using either of those two switches. Then. During the first scan selection and ATPG iteration. • STructure An optional literal that enables structure-based scan selection techniques. However. The amount of scan selected in the first (default) ATPG iteration can be used as a reference point for determining how much more or less scan to select in subsequent iterations (such as what limit to specify). and limiting the design’s sequential depth. Tessent DFTAdvisor Reference Manual. the number of scan cells the tool selects is 50 percent. For more information on partial scan. Sequential Using Structure Arguments • SEQUential A required literal that enables partial scan for scan identification. • SCoap An optional literal that enables the SCOAP-based technique for partial scan selection. self-loop breaking. SCOAP-based selection is typically faster than ATPG-based selection. and produces an optimal set of scan candidates. refer to “Understanding Partial Scan” in the Scan and ATPG Process Guide. Partial sequential scan results in a subset of scannable sequential elements being converted to scan. These techniques include loop breaking. V9. • {-Percent integer} | {-Number integer} An optional switch and integer pair that specifies the percentage of scan based on the total number of sequential elements in the design or absolute number of sequential instances that you want to treat as scan instances.0 June 2010 353 . Partial sequential scan results in a subset of scannable sequential elements being converted to scan. DFTAdvisor attempts to select the best scan cells within the limit. automatic scan selection analyzes the circuit and attempts to identify the minimum amount of scan needed to achieve high fault coverage. By default. you can specify the exact amount of scan to select. Partial scan requires that you specify the Structure algorithm and how many scan elements to identify.Command Dictionary Setup Scan Identification • {-Percent integer} | {-Number integer} An optional switch and integer pair that specifies the maximum percentage of scan based on the total number of sequential elements in the design or absolute number of sequential instances that you want to identify as scan. By default.

-NUmber integer Specifies the exact number of scan chains that you want DFTAdvisor to insert. 354 Tessent DFTAdvisor Reference Manual.Command Dictionary Setup Scan Identification • {-Percent integer} | {-Number integer} An optional switch and integer pair that specifies the maximum percentage of scan based on the total number of sequential elements in the design or absolute number of sequential instances that you want to identify as scan. you should always do the scan identification before the test point identification to ensure an optimal test point selection. For more information on test points. No Scan Identification Argument • None A literal that disables scan identification. The default is 8. Often. Final results depend upon the number of scan candidates. Use this option in combination with the Add Test Points or Setup Test_point Identification command to insert test points (and not scan) in your design. you are providing DFTAdvisor an absolute maximum percentage of scan cells it can choose. • -Depth {integer | Nolimit} An optional switch and integer or literal pair that specifies the maximum sequential depth allowed to remain on any sequential path. When specifying the percentage. The default is 16.0 June 2010 . • -Loop {ON | OFf} An optional switch and literal pair that cuts global loops by inserting scan instances. it will choose less than you specify if it can do so and still meet the other criteria of selection. General Arguments • -MAx_length integer | -NUmber integer Two optional. The default number of chains is 1. refer to “Understanding Test Points” in the Scan and ATPG Process Guide. V9. Final results depend upon the number of scan candidates. the number of scan cells the tool can select is 100 percent (which means that there is no limit). DFTAdvisor evenly divides the scan cells into scan chains that are smaller than the max_length integer. mutually-exclusive switch and integer pairs that specify one of the following: -MAx_length integer Specifies the maximum number of scan cells that DFTAdvisor can stitch into a scan chain. By default. • -Self_loop {integer | Nolimit} An optional switch and integer or literal pair that specifies the maximum number of consecutive self-loops allowed to remain on any sequential path. If you want to insert both test points and scan. The default is ON.

V9.Command Dictionary Setup Scan Identification Examples The following example sets up for full scan: setup scan identification full_scan run The following example sets up for a test point only run: setup scan identification none setup test_point identification -control 10 -observe 5 run Related Commands Add Test Points Report Sequential Instances Run Setup Pin Constraints Setup Test_point Identification Write Scan Identification Tessent DFTAdvisor Reference Manual.0 June 2010 355 .

inverters. one is created using the specified name. an existing clock pin from the design is used. DFTAdvisor uses the write control and read control pins when inserting test logic for RAMs. Set Bidi Gating. or you must manually develop the test procedure file and the dofile before running ATPG.Command Dictionary Setup Scan Insertion Setup Scan Insertion Scope: Setup Usage SETup SCan INsertion [-TEn pathname] [-TClk pathname] [-SClk pathname] [-SMclk pathname] [-SSclk pathname] [-SET pathname] [-RESet pathname] [-Write pathname] [-REAd pathname] [-Muxed | -Disabled | -Gated] [-Active {High | Low}] Description Specifies the pin parameters used by the Insert Test Logic command. Use the -Active switch to specify whether the test enable pin is active low or active high. The clock pin is selected at random. Arguments • -TEn pathname An optional switch and string pair that specifies a name for the test enable pin. If no test clock pin exists. If the new scan design is intended for Tessent FastScan/Tessent TestKompress. By default. DRC verifies whether the RAMs can be held off when the write control pin is off. By default. it is traced back to a predefined scan clock. and Set Tristate Gating commands. The instance pathnames must trace back through a simple path (inverters or buffers only) to a primary input/output of the design. • -TClk pathname An optional switch and string pair that specifies a pathname for the test clock pin for all scan types. You can use instance pin pathnames to define the test enable and clock pin names. and buffers. If a predefined scan clock is found. If no test clock pin is specified. and the write clock input of the RAM is not controllable. the new test clock pin is named test_clk. 356 Tessent DFTAdvisor Reference Manual. This tracing can only be performed along a single path that consists of only straight wire. Additional pin parameters are specified with Set Scan Enable. No test logic is inserted in RAMs that can be held off. it is multiplexed out by a new write clock.0 June 2010 . a new one is created and named test_clk. the off-state value is used for test logic insertion. If no clock pins are found. If an internal pin is specified as the test clock pin. Eligible clock pins must be defined with the Add Clocks command and capable of capturing data in a sequential cell without test logic in the clock path. the test enable pin is named test_en. The selector to the mux is the test enable pin. V9.

Tessent DFTAdvisor Reference Manual. • -REAd pathname An optional switch and string pair that specifies a pathname for the read control pin used for RAM when inserting test logic. -Write. the scan slave clock pin is named scan_sclk. reset. By default. These options can only be used with -Set. write control. the set pin is named scan_reset. A scan clock pin is only created for the scan clock port in the dual-port type mux scan.0 June 2010 357 . • -Write pathname An optional switch and string pair that specifies a pathname for the write control pin used for RAM when inserting test logic. -Disabled — Uses an AND gate with the test enable signal to disable the set and reset inputs of flip-flops and the SEN type scan enable signal to disable the write and read clocks. Use the -Active switch to specify whether the set pin is active high or low.Command Dictionary Setup Scan Insertion Use the -Active switch to specify whether the test clock pin is active high or low. or read control lines are gated. By default. • -SClk pathname An optional switch and string pair that specifies a pathname for the clock pin in clock-scan type scan. the scan master clock pin is named scan_mclk. Options include: -Muxed — Multiplexes all set and reset pins with the original signal. the set pin is named scan_set. By default. • -Muxed | -Disabled | -Gated An optional switch that determines how the specified set. V9. Use the -Active switch to specify whether the reset pin is active high or low. • -SSclk pathname An optional switch and string pair that specifies a pathname for the scan slave clock pin in LSSD type scan. By default. By default. • -SET pathname An optional switch and string pair that specifies a pathname for the set pin used for the flipflop or latch when inserting test logic. the write control pin is named write_clk. By default. This value is used to verify the off-state value on the scan clock found by tracing back from a specified internal pin. • -RESet pathname An optional switch and string pair that specifies a pathname for the reset pin used for the flip-flop or latch when inserting test logic. and -Read switches specified in the same command. the read control pin is named read_clk. • -SMclk pathname An optional switch and string pair that specifies a pathname for the scan master clock pin in LSSD type scan. Default setting. Only set and reset pins defined as clocks are affected. the new scan clock pin is named scan_clk. -Reset. By default.

setup scan insertion -ten TEST_MODE -active high setup scan insertion -reset RESET_L -active low setup scan insertion -write ATPG_WRT_INH -read ATPG_READ_INH setup scan insertion -set ATPG_SET -disabled Related Commands Insert Test Logic Related Commands Report Scan Pins Set Bidi Gating Set Scan Enable Set Scan_enable Sharing Set Tristate Gating 358 Tessent DFTAdvisor Reference Manual. add clocks 0 clock set system mode dft run setup scan insertion -ten modxyz/nand02/test_en_L -active low insert test logic -number 8 Example 2 The following example shows how to set different controls with successive Setup Scan Insertion commands. Within a single command. or reset pins on high or low. The -Active switch applies to any of the following pins specified in the command: -Ten. and makes it active low during the scan insertion process. set.Command Dictionary Setup Scan Insertion -Gated — Uses either the set and reset pins defined as clocks or the write and read clocks to disable the set and reset inputs of flip-flops. all these signals are active on high. V9. By default.0 June 2010 . Example 1 The following example renames the test enable pin name to test_en_L. -Tclk. connects it to an internal node. you can only use the -Active switch once. and -Reset. -Set. • -Active High | Low An optional switch and literal pair that determines whether the scan clock activates the specified test enable.

Once you have inserted scan chains. This is the default. The Setup Scan Pins command specifies the index or bus naming conventions for scan-in or scan-out pins. you can use the Report Scan Chains command to display the chosen index or bus naming convention for the scan-in pins and/or scan-out pins. The default name is scan_in. -INDexed An optional switch specifying that DFTAdvisor apply the index format to the scan-in or scan-out pin names. Indexed names are in the form: base_name + index# + suffix_name Bused names are in the form: base_name + [index#] Arguments • • • Input A literal specifying that DFTAdvisor apply the index or bus format on the scan-in pins. • -Prefix base_name An optional switch and string pair that specifies the root name of the scan-in or scan-out pin.0 June 2010 359 . V9. • -Bused An optional switch specifying that DFTAdvisor apply the bus format to the scan-in or scanout pin names. The default value is 1. Tessent DFTAdvisor Reference Manual. Output A literal specifying that DFTAdvisor apply the index or bus format on the scan-out pins. • -INItial index# An optional switch and integer pair that specifies the initial index value of the scan-in or scan-out pin name.Command Dictionary Setup Scan Pins Setup Scan Pins Scope: All modes Usage SETup SCan Pins {Input | Output} [-INDexed | -Bused] [-Prefix base_name] [-INItial index#] [-Modifier incr_index#] [-Suffix suffix_name] Description Changes the scan-in or scan-out pin naming parameters to index or bus format. The Report Environment command displays the names and values that DFTAdvisor uses for scan-in and scan-out pins when inserting scan chains.

• -Suffix suffix_name An optional switch and string pair that specifies the name that you want to place after the index#.Command Dictionary Setup Scan Pins • -Modifier incr_index# An optional switch and integer pair that specifies the incremental value that to add to the index# when creating additional names with the same base_name. Examples The following example configures scan insertion to use bus names for the scan-in pins and scanout pins. with the index number starting at 5 and incrementing by 2 for scan-in pins. and the index number starting at 4 and incrementing by 2 for scan-out pins: add clocks 0 clock set system mode dft run setup scan pins input -bused -prefix scin -initial 5 -modifier 2 setup scan pins output -bused -prefix scout -initial 4 -modifier 2 insert test logic -number 7 Related Commands Insert Test Logic 360 Tessent DFTAdvisor Reference Manual. DFTAdvisor only uses this for indexed naming. The default is null. The default is 1. V9.0 June 2010 .

see “Automatic Recognition of Existing Shift Registers” in the Scan and ATPG Process Guide. Arguments • • ON A required literal that enables shift registration identification. For more information about automatic identification of shift registers. This is the default. setup shift_register identification off Related Topics Report Scan Cells Report Shift Registers Tessent DFTAdvisor Reference Manual. V9. Example The following example disables automatic shift register identification.Command Dictionary Setup Shift_register Identification Setup Shift_register Identification Scope: Setup mode Usage SETup SHift_register Identification ON | OFF Description Enables/disables shift register identification. The default is ON. OFf A required literal that disables shift registration identification.0 June 2010 361 .

Command Dictionary Setup Test_point Identification Setup Test_point Identification Scope: Setup and Dft modes Prerequisites: If you only want test points (and not scan) identified.0 June 2010 . use the Setup Scan Identification command’s None option. After successfully entering Dft mode. which changes the fault from an unobservable (undetected) fault to a detected fault. A fault cannot be detected unless one or more primary outputs shows the fault effect. 362 Tessent DFTAdvisor Reference Manual. Once you enable DFTAdvisor to identify the optimum test point locations (with the Setup Scan Identification command) and set the number of each type of test point that DFTAdvisor is to locate (with the Setup Test_point Identification command). By creating a test point at that location. based on the SCOAP pin selection technique. Usage SETup TEst_point IDentification [-COntrol integer] [-OBserve integer [-Primary_outputs [-EXClude pins…]]] [-Verbose | -NOVerbose] [-Internal | {-External filename}] Description Specifies the number of control and observe test points that DFTAdvisor flags during the identification run. V9. which then gives the tool the ability to force (control) the necessary combination of input values to detect the previously undetectable faults. Tip: See “Analyzing the Design for Controllability and Observability of Gates” in the Scan and ATPG Process Guide. with the Run command. you give the ATPG tool direct control over the input values of that gate. DFTAdvisor lists the test point locations that it identifies. you perform the test point analysis. By creating a test point at that location. With observability problems. Observe test points allow you to gain access to the outputs of a gate (or multiple gates) where faults are undetectable. you allow direct access to the fault effect. Test points may translate into additional input or output pins or scan cells at the chip level. you need to enter Dft mode (with the Set System Mode command). which increases the design’s fault coverage. Control test points allow you to gain access to the inputs of a gate (or multiple gates) where faults are undetectable. Test points allow you to gain access into the design to aid in detecting the undetectable faults. Usually the reason these faults are undetectable is because the ATPG tool cannot simultaneously force the correct combination of values onto the inputs. usually the reason these faults are undetectable is because the effects of this fault never propagate to a primary output or other observation point. While performing the analysis.

• -Verbose | -NOVerbose An optional switch that specifies the amount of information that DFTAdvisor displays during test point generation. This is the default. V9. this fault list file is saved after running ATPG. The implementation of this option depends on the settings in the Setup Test_point Insertion command. and it is used by all SCOAP test point selection methods until it is changed (with -Internal or -External).Command Dictionary Setup Test_point Identification Arguments • -COntrol integer An optional switch and integer pair that specifies how many test points you want DFTAdvisor to identify to aid in increasing the controllability of the design. -External filename — A switch and string that specifies to use only those faults listed in the specified faults list file for evaluating the benefit of a test point. This file only needs to be set once. -EXClude pins — An optional switch and repeatable string that excludes the specified primary output pins from use as observe points.0 June 2010 363 . Detected. -Primary_outputs — An optional switch that specifies to add an observe point to primary outputs. -Internal — A switch that specifies to consider all faults. The default upon invocation of DFTAdvisor for identifying test points for controllability is 0. Tessent DFTAdvisor Reference Manual. The default upon invocation of DFTAdvisor for identifying test points for observability is 0. • -OBserve integer [-Primary_outputs [-EXClude pins…]] An optional switch and integer pair that specifies how many test points you want DFTAdvisor to identify to aid in increasing the observability of the design. Typically. redundant. • -Internal | {-External filename} An optional switch or switch and string that specifies which faults to use when performing SCOAP-based test point selection. Any other faults previously loaded are discarded. and unused fault found in the file are ignored.

Number of control points to be identified = 2 Number of observe points to be identified = 0 insert test logic -test_point on report test points Control [Selected]: /CNTR/U783/ZN Control [Selected]: /ADDR/U23/D1 or2a or2a test_cntl1 test_cntl2 Related Commands Add Cell Models Add Test Points Insert Test Logic Report Test Points Setup Scan Identification Setup Scan Insertion 364 Tessent DFTAdvisor Reference Manual.. V9..Command Dictionary Setup Test_point Identification Examples The following example shows the flow of having DFTAdvisor automatically identify and insert two test points for controllability: set system mode dft setup scan identification none setup test_point identification -control 2 run // // // Performing test_point identification .0 June 2010 .

V9. If DFTAdvisor cannot find a nearby chain. When you specify that you want new scan cells inserted for test points (-Model or New_scan_cell switch). DFTAdvisor inserts these new scan cells locally on the module where the test point resides. The clock for each new scan cell is the same as the clock of the scan cell it feeds in the chain. After DFTAdvisor identifies the optimum test points. you can use the Setup Scan Identification command in combination with the Setup Test_point Identification and Run commands. If you specify that you want an XOR tree. DFTAdvisor analyzes the list of new observe points and groups them based on hierarchical information. the Insert Test Logic command creates a primary input for the control test points named “test_cntrl” and a primary output for the observe test points named “test_obs”. you then insert those test points with the Insert Test Logic command. You can change these default names with the pin_pathname argument. If you want DFTAdvisor to automatically identify test points. The tool then inserts the resulting observe scan cell in the module where the XOR tree emerges. Usage Control Point Usage SETup TEst_point INsertion [-Control [{pin_pathname -None} | -New_scan_cell | {-Model model_name}]] [-REconvergence {OFf | ON}] [-CShare integer] Observe Point Usage SETup TEst_point INsertion [-Observe [{pin_pathname -None} | {observe_enable -Existing_scan_cell} | -New_scan_cell | {-Model model_name}]] [-REconvergence {OFf | ON}] [-OShare integer] Description Specifies how DFTAdvisor configures the inputs for the control test points and the outputs for the observe test points. with the Add Cell Models command before using the -Model or -New_scan_cell switch. The Setup Test_point Insertion command modifies how the Insert Test Logic command inserts test points. Tessent DFTAdvisor Reference Manual. By default. Each of the new scan cells is fitted into nearby existing scan chains that do not exceed the chain length limit.Command Dictionary Setup Test_point Insertion Setup Test_point Insertion Scope: All modes Prerequisites: You must identify model_name. and the models for use with the -New_scan_cell option.0 June 2010 365 . Arguments • -Control An optional switch that specifies how to configure the inputs for control test points. it drops the test point.

instead controlling the test point it inserts with the pin specified by the “prefix” name. 366 Tessent DFTAdvisor Reference Manual. If you use the -New_scan_cell switch in combination with the -Control switch. Control Point Example for -None and -Model If you use the -Model switch in combination with the -Control switch. The clock for each new scan cell is the same as the scan cell it feeds in the chain. If DFTAdvisor cannot find a nearby chain. DFTAdvisor chooses the new cell to be edge-compatible with the existing scan cells in the chain. Each of the new scan cells is fitted into a nearby existing scan chain that does not exceed the chain length limit. DFTAdvisor does not use a scan cell.Command Dictionary Setup Test_point Insertion If you use the -None switch (the default) in combination with this switch. DFTAdvisor controls the test point by adding an additional scan cell when the test logic is synthesized (Figure 2-4). defined by model_name. as shown in Figure 2-3. V9. when the test logic is synthesized (Figure 2-3). it drops the control point. The clock for each new scan cell is the same as the scan cell it feeds in the chain.0 June 2010 . If DFTAdvisor cannot find a nearby chain. The new scan cell is fitted into a nearby existing scan chain that does not exceed the chain length limit. it drops the control point. pin_pathname. DFTAdvisor controls the test point by adding an additional scan cell. Figure 2-3.

If you use the -None switch (the default) in combination with this switch. pin_pathname. Control Point Example for -New_scan_cell • -Observe An optional switch that specifies how to configure the outputs for observe test points. Figure 2-5. DFTAdvisor controls the test point by adding an additional scan cell when the test logic is synthesized. V9. Observe Point Example for -None and -Model If you use the -Model switch in combination with the -Observe switch.Command Dictionary Setup Test_point Insertion Figure 2-4. as shown in Figure 2-5. Each of the new scan cells is fitted into a nearby existing scan chain Tessent DFTAdvisor Reference Manual.0 June 2010 367 . DFTAdvisor controls the test point it inserts with the pin specified by the “prefix” name. as shown in Figure 2-5.

it behaves much the same as when using -Model. as shown in Figure 2-7. DFTAdvisor controls the test point by adding multiplexing to an existing nearby scan cell when the test logic is synthesized. The clock for each new scan cell is the same as the scan cell it feeds in the chain. The observe_enable specifies the name of the observe enable signal that controls the input to the scan cell. Observe Point Example with -New_scan_cell If you use the -Existing_scan_cell switch in combination with the -Observe switch. it drops the observe point. 368 Tessent DFTAdvisor Reference Manual. it drops the observe point. This matching of the rising/falling edge attribute will prevent D7 type DRC violations. The clock for each new scan cell is the same as the scan cell it feeds in the chain. Figure 2-6. except DFTAdvisor will choose the new cell to be edgecompatible with the existing scan cells in the target scan chain when the test logic is synthesized (Figure 2-6). If you use the -New_scan_cell switch in combination with -Observe.0 June 2010 . V9.Command Dictionary Setup Test_point Insertion that does not exceed the chain length limit. If DFTAdvisor cannot find a nearby chain. Each of the new scan cells is fitted into nearby existing scan chains that do not exceed the chain length limit. If DFTAdvisor cannot find a nearby chain.

as shown in Figure 2-3 and Figure 2-5. You must identify the type of the scan cell models with the Add Cell Models command or have the type assigned in the library models before using this switch. The specified model must be of type SCANCELL. • -New_scan_cell — An optional switch that specifies for DFTAdvisor to determine the rising/falling edge of scan cells in use in the nearby target scan chain. Observe Point Example with -Existing_scan_cell • pin_pathname -None An optional string and switch pair that specifies for DFTAdvisor to only insert the test point without inserting an additional scan cell. • -Existing_scan_cell observe_enable An optional switch and string pair that specifies for DFTAdvisor to use nearby scan cells for observation points. You must identify the type of the modelname with the Add Cell Models command or have the type assigned in the library model before using this switch. you must specify the “data_in” parameter in the scan_definition section of the model for all scan cells used in the design. This option is only valid with the -Observe switch. observe_enable — The observe_enable specifies the name of the observe enable signal that controls the input to the scan cell. This is the default. as shown in Figure 2-7. In this case. as shown in Figure 2-3 and Figure 2-5. See Figure 2-4 and Figure 2-6. V9.0 June 2010 369 . and to use an edgecompatible scan cell model for the new scan cell. The observe point is propagated to a nearby scan cell and multiplexed with the functional path D input of the cell. -Model modelname An optional switch and string pair that specifies for DFTAdvisor to insert a cell along with the test point.Command Dictionary Setup Test_point Insertion Figure 2-7. • Tessent DFTAdvisor Reference Manual.

the default maximum number of observe points that DFTAdvisor will allow to share a single scan cell or primary output is 16. they must use separate scan cells.Command Dictionary Setup Test_point Insertion • -REconvergence {OFf | ON} An optional switch and literal pair that enables the sharing of test points based on reconvergence analysis. This may result in less than the maximum number of control points sharing any given scan cell. This may result in less than the maximum number of observe points sharing any given scan cell. If you enable the -Reconvergence option and the forward trace of any two control points intersect. they must use separate scan cells. V9. If the backward cones of observe points or the forward cones of control points intersect. a nearby scan chain may be used for the new scan cell created by the shared tree of test points. the default maximum number of control points that DFTAdvisor will allow to share a single scan cell or primary input is 16. • -OShare integer An optional switch and integer pair that specifies the maximum number of observe points you want DFTAdvisor to share with a primary output or a single scan cell.0 June 2010 . DFTAdvisor performs reconvergence analysis to determine which test points can share the same pin and scan cell. The default is Off. Not all observe points can share a single scan cell. the test points are not shared. Not all control points can share a single scan cell. 370 Tessent DFTAdvisor Reference Manual. When you issue the Setup Test_point Insertion command. When you issue the Setup Test_point Insertion command. When this option is On. The sharing is also influenced by the existence of scan chains inside of modules when new scan cells are used for testpoints. If you enable the -Reconvergence option and the backward trace of any two observe points intersect. In this case. which guarantees that no fault masking can occur due to sharing (often a negligible phenomenon). the amount of sharing is limited. • -CShare integer An optional switch and integer pair that specifies the maximum number of control points that can share a primary input or a single scan cell.

Command Dictionary Setup Test_point Insertion Examples The following example shows the flow of having DFTAdvisor automatically identify and insert two test points for controllability: set system mode dft setup scan identification none setup test_point identification -control 2 run // // // // // Performing test_point identification .. V9..0 June 2010 371 . Number of control points to be identified = 2 Number of observe points to be identified = 0 1: CV1=16458424 gate_index=3805 INV /CNTR/U783/ZN 2: CV1=16458417 gate_index=1058 BUF /ADDR/U23/D1 add cell models dffslp -type scancell CK D SDI SE add cell models or2a -type Or add cell models and2a -type and setup test_point insertion -control test_cntrl1 -model dffslp insert test logic -test_point on report test points Control [Selected]: /CNTR/U783/ZN Control [Selected]: /ADDR/U23/D1 and2a or2a test_cntl1 test_cntl1 Related Commands Add Cell Models Insert Test Logic Setup Scan Identification Setup Test_point Identification Tessent DFTAdvisor Reference Manual.

The Setup Tied Signals command specifies the default value that the tool ties to all floating nets and floating pins that are not specified with the Add Tied Signals command. Arguments • • • • 0 A literal that specifies to tie the floating nets or pins to logic 0 (low to ground). then performs a scan identification run. Examples The following example ties floating net vcc to logic 1 and ties the remaining unspecified floating nets and pins to logic 0. you must delete and recreate the flattened model. the tool assumes the default value is unknown. 1 A literal that specifies to tie the floating nets or pins to logic 1 (high to voltage source).Command Dictionary Setup Tied Signals Setup Tied Signals Scope: Setup mode Usage SETup TIed Signals 0 | 1 | X | Z Description Changes the default value for floating pins and floating nets that do not have assigned values. if you do not assign a specific value. Upon invocation of the tool. X A literal that specifies to tie the floating nets or pins to unknown. Z A literal that specifies to tie the floating nets or pins to high-impedance.0 June 2010 . If the model is already flattened and then you use this command. setup tied signals 0 add tied signals 1 vcc set system mode dft run Related Commands Add Tied Signals Delete Tied Signals Report Tied Signals 372 Tessent DFTAdvisor Reference Manual. V9.

and -nolimit arguments of the Insert Test Logic command.Command Dictionary Setup Wrapper Chains Setup Wrapper Chains Scope: Setup mode Prerequisites: At-speed test cells must be specified with the Add Cell Models command or cell_type model attribute. Wrapper cells are sequential elements used as input/output registration cells (cells only accessible via combinational logic from primary inputs or primary outputs). wrapper cells are identified and distributed to scan chains in either one-domain or two domains. Depending on the specified switches. • One-domain distribution — Wrapper cells are distributed to scan chains as specified by the -number. Output_number.0 June 2010 373 . Tessent DFTAdvisor Reference Manual. one-domain distribution is used. If none are specified. If any of these switches are specified. the Setup Wrapper Chains command performs both wrapper chain and core chain insertion in a single run. -max_length. Usage SETup WRapper Chains [-EXClude pin_names…] [{-INPUT_NUMber integer} | {-INPUT_MAX_length integer}] [{-OUTPUT_NUMber integer} | {-OUTPUT_MAX_length integer}] [-INPUT_Flops_reached {integer | Nolimit}] [-OUTPUT_Flops_reached {integer | Nolimit}] [-INPUT_Gates_level integer] [-OUTPUT_Gates_level integer] [{-No_internal_feedback | -Allow_internal_feedback | -Test_points}] [-IO_registration {ON | OFf}] [-AT_SPEED_TEST_FLOP_Insertion {ON | OFf}] [-AT_SPEED_TEST_FLOP_Model modelname] Description Specifies wrapper chains for scan insertion as follows: • • • • Setup Pin Constraints CX -Lbist_exclude Setup Output Masks On -Lbist_exclude Set Scan Type mux_scan Setup Scan Identification Wrapper_chains Note In the 2009_2 release and all subsequent releases. Wrapper cell distribution is determined by the switches: -Input_number. two-domain distribution is used. V9. or -Output_max_length. This is a change in behavior from previous releases and is not backward-compatible. -Input_max_length.

V9. SEN_IN type for input. -Allow_internal_feedback. Inserted at-speed flip-flops are reported as part of the wrapper chain by the Report Scan Cells command. You can specify how wrapper cells are identified with the -No_internal_feedback. Figure 2-9 shows the gate inputs with feedback connections marked as a and b. and SEN for core chains. at-speed test flip-flop.0 June 2010 . use the Allow_internal_feedback switch. Figure 2-8. When two-domain distribution is enabled. and -Test_points switches. • Two-domain distribution — Input and output wrapper cells are distributed separately to input wrapper chains and output wrapper chains. the order of stitching is: scan input. If you specify to insert both an at-speed test flip-flop at the beginning of each wrapper chain (-AT_SPEED_TEST_FLOP_Insertion option) and a lockup cell at the end of each wrapper chain (Set Lockup Cells command’s argument (-CApture_edge_at_scan_chain_input option). Figure 2-8 illustrates the default tracing where the traced logic and identified wrapper cells are shown in bold. By default.Command Dictionary Setup Wrapper Chains The SEN type scan_enable signal is used for both one-domain wrapper chains and core chains. the -Number. SEN_OUT type for output. lockup cell. I/O Identification Default Tracing Mode To control all the inputs of the combinational logic traced from the primary inputs. Tracing backward from these inputs identifies one additional cell from the second level of memory cells to include in the input wrapper chains. 374 Tessent DFTAdvisor Reference Manual. and first wrapper chain cell. and -Nolimit arguments of the Insert Test Logic command are ignored and separate. You can modify the scan enable signals with the Set Scan_enable Sharing command and the Set Scan Enable command. traces backward from the primary outputs until the last level of memory cells is reached. dedicated scan enable signals are used. DFTAdvisor identifies the wrapper cells by structurally tracing forward from the primary inputs until the first level of memory cells is reached and then. -Max_length.

the gate output marked as c cannot be observed when the testing of core cells is active and the testing of input wrapper cells is inactive. The identified test points are scheduled for insertion automatically. the test point locations are identified along with the wrapper cell candidates. In that case. tracing such internal feedback may include an impractical number of core cells (not first or last level memory cells). At this point. DFTAdvisor uses SEN_OUT type scan enable for the control points and SEN_IN type scan enable for the observe points.Command Dictionary Setup Wrapper Chains Figure 2-9. an observe point may be necessary at the gate output c.e. where possible. The automatic insertion of such control and observe points can be specified using the -Test_points switch. Figure 2-10. you can examine and modify the scheduled test points with the following commands: Report Test Points. and Delete Test Points. Upon issuing the Run command.0 June 2010 375 . All Input Logic Tracing Depending on the circuit topology. Control and Observe Point Insertion Tessent DFTAdvisor Reference Manual. hierarchical at-speed testing at a higher level of the design). you can control the feedback inputs on the logic gates by means of control points. In the above circuit. In that case. only the gate input b requires a control point because gate input a is controlled from its driver gate which is an identified input wrapper cell. Add Test Points. Figure 2-10 highlights the logic DFTAdvisor adds as the control and observe points. V9. The actual insertion of the test points occurs later when the Insert Test Logic command is issued. In a multiple-phase testing of wrapper cells and core cells (i.

Command Dictionary Setup Wrapper Chains

Arguments • -Exclude pin_names An optional switch and a repeatable string that specifies the primary input/output pins to exclude from the wrapper cell identification process. The system clock pins (set, reset, clock, etc.) and test-related pins such as scan I/O, scan enable and test enable pins are excluded from the identification process automatically. • -INPUT_NUMber integer An optional switch and an integer pair that enables two-domain distribution and specifies the number of scan chains for input wrapper cells. The default value for the number of input wrapper chains is 1. • -INPUT_MAX_length integer An optional switch and an integer pair that enables two-domain distribution and specifies the maximum length of scan chains for input wrapper cells. The default value for the maximum length of the input wrapper chains is unlimited. • -OUTPUT_NUMber integer An optional switch and an integer pair that enables two-domain distribution and specifies the number of scan chains for output wrapper cells. The default value for the number of output wrapper chains is 1. • -OUTPUT_MAX_length integer An optional switch and an integer pair that enables two-domain distribution and specifies the maximum length of scan chains for output wrapper cells. The default value for the maximum length of the output wrapper chains is unlimited. • -INPUT_Flops_reached {integer | Nolimit} An optional switch and integer or literal pair that specifies the maximum number of sequential elements allowed to be reached during the forward tracing from a primary input. Default is 256. • -OUTPUT_Flops_reached {integer | Nolimit} An optional switch and integer or literal pair that specifies the maximum number of sequential elements to be reached during the backward tracing from a primary output. Default is 256. • -INPUT_Gates_level integer An optional switch and integer pair that specifies the maximum number of levels of combinational gates to be traversed during the forward tracing from a primary input until the first sequential element is reached. Default is 32. • -OUTPUT_Gates_level integer An optional switch and integer pair that specifies the maximum number of levels of combinational gates to be traversed during the backward tracing from a primary output until the first sequential element is reached. Default is 32.

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{-No_internal_feedback | -Allow_internal_feedback | -Test_points} An optional switch that specifies the identification mode for input wrapper cells. Options include: -No_internal_feedback — Identifies the first level of registration cells by forward tracing from the primary inputs. This is the default mode. -Allow_internal_feedback — Identifies additional cells with outputs fed back into the combinational logic between the primary inputs and the first level of registration cells. -Test_points switch — Inserts control and observe points at the feedback connections instead of identifying additional cells from these feedback connections.

-IO_registration {ON | OFf} An optional switch and literal pair that specifies whether to automatically use the current I/O registration mechanism to add wrapper cells for the primary inputs and outputs that fail wrapper cell identification. Wrapper cell identification will fail in the following cases:
o o

If tracing limits are exceeded during wrapper cell identification for an I/O. If you have specified the identified sequential cell to be a non-scan instance or if DRC has marked it as a non-scan instance. If the identified sequential cell is part of an existing scan chain. If a blackbox is encountered during the wrapper cell identification for an I/O. If no sequential cells were identified during wrapper cell identification for an I/O. If the currently identified sequential cell is already identified as a wrapper cell for an I/O of the opposite direction.

o o o o

Options include: ON — A new wrapper cell is inserted for each failed primary input and output. OFF — A wrapper cell is not automatically inserted for each failed primary input and output. This is the default. • -AT_SPEED_TEST_FLOP_Insertion {ON | OFf} An optional switch and literal pair that specifies whether to automatically insert an at-speed test flip-flop at the beginning of each wrapper chain. Default is On. If a preferred model is not specified with the -AT_SPEED_TEST_FLOP_Model switch, DFTAdvisor uses the first DFF model declared by the Add Cell Models command; • -AT_SPEED_TEST_FLOP_Model modelname An optional switch and literal pair that specifies the DFF model to use for an at-speed test flip-flop when more than one DFF model is declared via the Add Cell Models command.

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Examples The following example excludes the primary I/O pins a and b from wrapper cell identification; sets up four input wrapper scan chains and eight output wrapper scan chains; sets sen1 and sen2 for the scan enable pin names of the input and output wrapper chains and reports the sequential cells identified per I/O pin.
add cell model LATX -type dlat G D add cell model INVX -type inv setup wrapper chains -input_num 4 -output_num 8 -exclude a b set scan enable sen1 -wrapper_chain -input set scan enable sen2 -wrapper_chain -output set system mode dft run report wrapper cells insert test logic -clock merge -edge merge

Related Commands Add Test Points Delete Test Points Related Commands Report Test Points Run Set Lockup Cell Setup Output Masks Setup Registered IO Setup Scan Identification Set Scan Enable Set Scan_enable Sharing Write Netlist

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Command Dictionary System

System
Scope: All modes Usage SYStem os_command Description Passes the specified command to the operating system for execution. The System command executes one operating system command without exiting the currently running application. Arguments • os_command A required string that specifies any legal operating system command. Examples The following example performs a scan identification run, then displays the current working directory without exiting DFTAdvisor:
set system mode dft run system pwd

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Command Dictionary Write Atpg Setup

Write Atpg Setup
Scope: Dft mode Prerequisites: Scan chains must be inserted. Usage WRIte ATpg Setup basename [-Replace] [-Procfile] [-NO_merge] [-Edt] [-All_internal_clocks] Description The Write Atpg Setup command writes a test procedure file and the dofile file for the existing scan chains. You can use these files to identify the scan chains when loading the scan design into Tessent FastScan. By default, the test procedure and the dofile for newly inserted scan chains are merged with those for existing scan chains. The order of the commands in the test procedure file determine the different levels of test procedure file information produced by this command. • If you execute Write ATPG Setup without first using the Read Procfile command, a test procedure file that contains default timeplates and the procedures needed for ATPG setup (for example, shift, load_unload, and test_setup) are created. If you run Read Procfile and load a test procedure file that contains timeplate definitions, non-scan procedure definitions (capture, ram_sequential, and others), and empty or template scan procedures, and then execute the Write Atpg Setup command, a more complete test procedure file is created. Note If the test procedure file loaded with the Read Procfile command contains scan procedures (for example, shift and load_unload), they are replaced by ones generated with the Write Atpg Setup command based on test logic inserted during the current session. DFTAdvisor issues a W14 warning each time it replaces a procedure. However, it uses timeplates specified in the original procedure file for the newly-generated procedures. The only exceptions are for the test_setup procedure. Instead of being replaced, the events created by the Write Atpg Setup command are appended to the end of the test_setup procedure. Arguments • basename A required string that specifies the root name for the test procedure and dofile. The files produced are basename.testproc and basename.dofile. • -Replace An optional switch that replaces the contents of a file that already exists. By default, files are not replaced.

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-Procfile An optional switch that creates the test procedure file. By default, a test procedure file is created.

-No_merge An optional switch that prevents merging the test procedure and the dofile of the newly inserted scan chains with those of the existing scan chains. By default, the test procedures and dofiles are merged.

-Edt An optional switch that writes EDT-specific commands to the ATPG setup files. For more information, see the Setup EDT command.

-All_internal_clocks An optional switch that specifies to write all internally defined clocks to the timeplate, to the ATPG dofile, and to the shift procedure.

Example 1 The following example writes the test procedure, the dofile, and the new netlist for the inserted scan chains to the specified filenames:
add clocks 1 clk1 add clocks 0 clk0 set system mode dft run insert test logic write atpg setup scan -replace write netlist scan.v -verilog

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Example 2 The following example uses the ‘write atpg setup -all_internal_clocks’ switch on a design with a single internal clock (output net is pll/out1) and a single top-level clock (clk1) to specify to write out the internally defined clock as shown in the following generated test procedure file.
... procedure shift = scan_group grp1 ; timeplate gen_tp1 ; // cycle 1 starts at time 0 cycle = force_sci ; measure_sco ; pulse clk1 ; pulse pll/out1 ; //internal PLL output net is pulsed during scan chain shifting end; end; procedure load_unload = scan_group grp1 ; timeplate gen_tp1 ; // cycle 1 starts at time 0 cycle = force clk1 0 ; force pll/out1 0 ; //internal PLL output initialized at start of scan unload sequence force scan_en 1 ; end ; apply shift 4; end;

Related Commands Insert Test Logic Read Procfile Setup EDT Write Netlist Write Procfile

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Command Dictionary Write Formal_verification Setup

Write Formal_verification Setup
Scope: Dft mode Usage WRIte FOrmal_verification Setup constraint_filename [-Replace] Description Writes a constraints driver file for the formal verification tool, FormalPro. You can use the constraints file with FormalPro to verify that any DFTAdvisor additions have not functionally changed the design. The output file describes the DFTAdvisor changes that FormalPro needs to ignore when comparing against the non-scan (reference) design. The constraints file will contain the following constraints: • • • • Force all scan inputs to 1 Ignore all scan outputs (including scan-outs shared with primary output pins) Force scan enables to be in functional mode Constrain test_en, lbist_en, and test_obs to their inactive states

When you enable observe point sharing and sink the tree into a new scan cell, FormalPro automatically ignores the extra registers (observe point registers) found in the modified design. You can perform formal verification after any DFTAdvisor step. FormalPro always compares the original non-scan design to the current output of DFTAdvisor. Arguments • constraint_filename A required string that specifies the name of the file to which DFTAdvisor writes the formal verification constraints file. • -Replace An optional switch that specifies for DFTAdvisor to replace the contents of the file, constraint_filename, if the file already exists.

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constraints -replace exit -d #shell script to run FormalPro <Path_to_FormalPro_Tree>/bin/formalpro -a -verilog m8051_core. V9.v \ -b -verilog m8051_scan.constraints -overwrite Related Commands Write Netlist 384 Tessent DFTAdvisor Reference Manual.Command Dictionary Write Formal_verification Setup Examples The following example writes out a constraints file named scan.v -replace write formal_verification setup scan.v -common -lib lcbg10p_atpg.0 June 2010 .constraints and also includes a shell script to invoke FormalPro: //scan dofile //perform scan analysis and test logic synthesis write netlist m8051_scan.lib \ -constraintfile scan.

info -replace Related Commands Report Loops Tessent DFTAdvisor Reference Manual. Loops that are not broken by duplication are shown as being broken by a constant value.0 June 2010 385 . Arguments • filename A required string that specifies the name of the file to which DFTAdvisor writes the loop report information. or has a single multiple fanout gate. You can display the loops report information to the transcript by using the Report Loops command. For each loop. • -Replace An optional switch that specifies for DFTAdvisor to replace the contents of the file.Command Dictionary Write Loops Write Loops Scope: Dft mode Usage WRIte LOops filename [-Replace] Description Writes a list of all loops to the specified file. which means the loop is either a coupling loop. V9. The Write Loops command writes all loops in a circuit to a file. if the file already exists. the report indicates whether the loop was broken by duplication. The report also includes the pin pathname and gate type of each gate in each loop. Examples The following example writes a list of all loops to a file: set system mode dft write loops loop.

Command Dictionary Write Netlist Write Netlist Scope: All modes Usage WRIte NEtlist filename [-Replace] [-User_setup] [-Split_bus] [{-BLock module_name.. If the -Split_bus switch is used. a[1]. An optional switch and a repeatable string that specifies the names of the modules whose netlists are redirected to a separate file. . This command can be used to write out: • • • • • • A complete design netlist to a specified file.ex_bport ({a[3]... Depending on the process. {-FUll | -CHildren} -FIle block_filename}] [-PREserve_assign] Description Writes the current design to a Verilog netlist. bus pins are written as follows: ex_mod ex_inst (. Arguments filename A required string that specifies a pathname for the Verilog netlist.. V9. a[2]. Module definitions redirected to the separate file are not written out to the file specified by the filename argument..ex_bport (a[3:0]). . For example: By default. • -Block module_name. A netlist for the children of particular modules to a specified file. all pins are listed together. 386 Tessent DFTAdvisor Reference Manual. The output is written to the file specified by the -File switch and block_filename string pair. A netlist for particular modules and all of their children to a specified file. a[0]}).0 June 2010 . By default. the current design is either the one used to invoke DFTAdvisor or the one created by the scan insertion process. with respect to Add Black Box and Delete Black Box commands. The output content is determined by the specification of the -Full | -Children switch.. -User_setup An optional switch that writes the design netlist based on the state of the current design.. -Replace An optional switch that overwrites the contents of the specified file if it already exists. bus pins are written as follows: ex_mod ex_inst (. • -Split_bus An optional switch that writes out mapped buses as individual pins in the port mapping..

Command Dictionary Write Netlist If -Block is used..scan Tessent DFTAdvisor Reference Manual. Neither of these required switches can be used without -Block. add clocks 0 clock set system mode dft setup scan identification sequential atpg -percent 50 run insert test logic -max_length 10 write netlist verilog. • -PREserve_assign An optional switch that specifies not to replace assign statements in the incoming netlist with supply statements when writing out the netlist. By default. whether the netlist for the modules’s complete hierarchy (module_name) is redirected to a separate file or only its children modules are redirected. V9. Nets defined with the supply statement in the incoming netlist are written out unchanged (using supply) but none of the original assign statements are modified. [{-BLock module_name. it is invalid when -Block is not specified. Example 1 The following example adds scan and writes out a Verilog netlist named verilog. nets assigned to a constant 0 or 1 via an assign statement are replaced with supply nets. This option is useful if you are using a layout tool that does not recognize supply0 and supply1 nets when identifying nets that are part of the power grid as part of an automatic flow. {-FUll | -CHildren} -File block_filename}] • -FUll | -CHildren A switch that specifies.0 June 2010 387 .. for each module_name string. • -FIle block_filename A switch and string that specifies the file to which the separate netlists are written.scan. the -Full | -Children and -File switches are required as shown. it is invalid when -Block is not specified. This switch is required when -Block is specified. This switch is required when -Block is specified.

C uC (.clk ( clk ) . scan_out1 ). wire Y . scan_in1 .v -block A -full -file results/blockA.v Given the following input: module C (clk). input clk. V9.clk(clk)).CLK ( clk ) . . dff udff (. endmodule The following output is written to results/blockA.D () . module C ( clk . output scan_out1 .scan_in1 ( scan_in1 ) .sen ( Y )). endmodule module top (clk. The remainder of the output is written to results/c_scan. buf02 ubuf (. output scan_out1 . .v. A uA (. endmodule 388 Tessent DFTAdvisor Reference Manual. scan_in1 . sff udff (.Y()).0 June 2010 . endmodule module A (clk. . sen. endmodule module A ( clk . C uC (. .Command Dictionary Write Netlist Example 2 The following example writes out the A module and its sub-blocks to one file and writes the remaining netlist to the main output file. sen). . sen ). input clk. buf02 ubuf(.Y ( Y )). add clock 0 clk set scan enable /uA/ubuf/Y set system mode dft run insert test logic report scan chains write netlist results/c_scan. sen.clk(clk).SE ( sen ) . . sen . sen .A(sen). .CLK(clk)). input clk .Q ( scan_out1 )). . input clk .v. scan_in1 . . scan_out1 . input clk.SI ( scan_in1 ) .sen(sen)).scan_out1 ( scan_out1 ) .A ( sen ) . sen . . scan_in1 . sen).

. scan_in1 . .v -block A -children -file results/blockA.v: module C ( clk . scan_in1 .v Given the same input as shown in the previous example. udff (.Q ( scan_out1 )).D () .Command Dictionary Write Netlist Example 3 This example writes out the child hierarchy of the specified A module. endmodule sff Related Commands Write Atpg Setup Add Black Box Delete Black Box Tessent DFTAdvisor Reference Manual. input clk .SE ( sen ) . V9. output scan_out1 .v. scan_out1 . The remainder of the output is written to results/c_scan.0 June 2010 389 .SI ( scan_in1 ) .CLK ( clk ) . the remaining netlist including module A is written to the main netlist. sen . sen ). the following output is written to results/blockA. add clock 0 clk set scan enable /uA/ubuf/Y set system mode dft run insert test logic report scan chains write netlist results/c_scan. . .

This command is identical to the Report Primary Inputs command except the data is written into a file. • -All An optional switch that specifies to write all the primary inputs to the file. V9. • -Replace An optional switch that specifies for DFTAdvisor to replace the contents of the file. if the file already exists. Arguments • filename A required string that specifies the name of the file to which DFTAdvisor writes the primary inputs. Examples The following example writes all primary inputs to a file: write primary inputs inputfile Related Commands Report Primary Inputs 390 Tessent DFTAdvisor Reference Manual. The Write Primary Inputs command writes a list of either all the primary inputs of a circuit or a specific list of primary inputs that you specify into a file where it can be reviewed.0 June 2010 .Command Dictionary Write Primary Inputs Write Primary Inputs Scope: All modes Usage WRIte PRimary Inputs filename [-Replace] [-All | primary_input_pin…] Description Writes primary inputs to the specified file. • primary_input_pin An optional repeatable string that specifies a list of primary input pins that you want to write to the file. This is the default.

V9. • -All An optional switch that specifies to write all the primary outputs to the file. This is the default. Arguments • filename A required string that specifies the name of the file to which DFTAdvisor writes the primary outputs.0 June 2010 391 . • primary_input_pin An optional repeatable string that specifies a list of primary output pins that you want to write to the file. The Write Primary Outputs command writes a list of either all the primary outputs of a circuit or a specific list of primary outputs that you specify into a file where it can be reviewed. • -Replace An optional switch that specifies for DFTAdvisor to replace the contents of the file. Examples The following example writes all primary outputs to a file: write primary outputs outputfile Related Commands Report Primary Outputs Tessent DFTAdvisor Reference Manual. if the file already exists.Command Dictionary Write Primary Outputs Write Primary Outputs Scope: All modes Usage WRIte PRimary Outputs filename [-Replace] [-All | primary_output_pin…] Description Writes primary outputs to the specified file. This command is identical to the Report Primary Outputs command except the data is written into a file.

proc Related Commands Add Scan Groups Read Procfile Report Procedure Report Timeplate 392 Tessent DFTAdvisor Reference Manual.Command Dictionary Write Procfile Write Procfile Scope: DFT mode Usage WRIte PRocfile proc_filename [-Replace] [-Full] Description Writes existing procedure and timing data to the named test procedure file. -Full An optional switch that causes the tool to parse the ATPG pattern list (if any) and create all needed non-scan procedures before writing the procedure file data. The Write Procfile command writes out existing procedure and timing data to the named test procedure file. V9. Note The -Full option can cause the Write Procfile command to take more time if there are a large number of ATPG-generated patterns in the internal pattern list.0 June 2010 . Examples The following example writes the existing procedure and timing data to the specified file: write procfile myprocfile. Arguments • proc_filename A required string that specifies the name of the file to which you want to write existing procedure and timing data. • • -Replace An optional switch that replaces the contents of the file if the proc_filename already exists.

The -Full option specifies to write both identified and defined scan instances. You must issue this command before executing the Insert Test Logic command or the files generated by Insert Test Logic will be empty. Arguments • filename A required string that specifies the name of the file to which DFTAdvisor writes the scan instances. • -Full | -Identified | -Defined An optional switch that specifies at what level to write the file. The Write Scan Identification command writes scan cell instances that either DFTAdvisor identified during the identification process or that you defined by using the Add Scan Instances or Add Scan Models commands. This is the default. the Write Scan Identification command displays the sequential loops that DFTAdvisor cuts after you perform the identification process with the Run command.0 June 2010 393 . The -Identified option specifies to write only scan instances that DFTAdvisor identified during the identification process. • -Replace An optional switch that specifies for DFTAdvisor to replace the contents of the file. the command writes out both identified and defined scan instances. with the first instance being the most critical scan instance. The Write Scan Identification command lists the scan instances in descending order.Command Dictionary Write Scan Identification Write Scan Identification Scope: All modes Usage WRIte SCan Identification filename [-Replace] [-Full | -Identified | -Defined] [-DOfile | -Backannotation] Description Writes a list of the scan instances that DFTAdvisor has identified or you have defined as scan cells. Tessent DFTAdvisor Reference Manual. If you issue the command without specifying -Backannotation or -Dofile options. the Write Scan Identification command displays the partition cells that DFTAdvisor flagged during the identification process performed with the Run command. V9. if the file already exists. If you are identifying partition scan. The -Defined option specifies to only write scan instances that you defined by using the Add Scan Instances or Add Scan Models commands. If you are identifying scan sequential.

In dofile format the file is written as a list of lines that can be executed by the Dofile command. V9.Command Dictionary Write Scan Identification • -DOfile | -Backannotation An optional switch that specifies to write the scan instances in dofile or back annotation format.0 June 2010 . For example: add scan instances instance_pathname Examples The following example writes all scan instances to a file after performing a full scan identification run: set system mode dft setup scan identification full_scan run write scan identification scanfile -identified The following is an example of the files contents: Type Instance ------------------------------------defined /I_1_16 identified /I_1_16 identified /I_6_16 identified /I_8_16 Related Commands Report Sequential Instances 394 Tessent DFTAdvisor Reference Manual.

Options include: -Scandef — scan chain definitions only.Command Dictionary Write Scan Order Write Scan Order Scope: All modes Usage WRIte SCan Order [-Scandef | -Def] filename [-Replace] [-No_segmentation] [-Keep_short_segments] Description Creates the DEF file specified by the filename argument. if it exists. V9. Note Each shift register is written into a separate ORDERED section of the DEF file. This file can be quite large. In this case. When DFTAdvisor successfully traces through a subchain. cells comprising such subchains are considered to be floating cells and can be written to the START and STOP sections. If you specify existing/non-existing scan I/O with this command. If there is not a scan cell available that is not part of a subchain. Tessent DFTAdvisor Reference Manual. • • filename A required string that specifies the name of the DEF file. This default behavior can be overridden when adding subchains with the Add Sub Chains command by using the –Allow_reordering switch. DFTAdvisor inserts lockup cells at the boundaries of the scan chains. Arguments • -Scandef | -Def An optional switch that determines the type of DEF file output. DFTAdvisor tries to avoid having any subchain cells at scan chain boundaries during scan chain stitching in order to prevent the cells comprising the subchain from being written to the START and STOP sections. -Def — entire flattened netlist. -Replace An optional switch that replaces the specified file. After scan chain insertion. filename. Default setting. the specified names are used in the scan chain START and STOP point definitions. The Add Scan Pins command affects the scan definitions in the DEF file. the cells that comprise the subchain are written to the ORDERED section of the generated scan DEF file by default.0 June 2010 395 . You can generate either the entire netlist or only the scan definition part of the netlist in the DEF file. the Write Scan Order command creates a DEF representation of the scan chains in a design.

This prevents the reordering of scan flip-flops along the scan chains and across the scan chains. Example 1 Assume the following in this example: 1. 4. • -Keep_short_segments An optional switch that specifies that scan chains that contain only one or two scan cells and contain no lockup latches are written to the scan DEF file and are not commented out.Command Dictionary Write Scan Order • -No_segmentation An optional switch that disables the segmentation of scan chains in the DEF file. All flip-flops in the design will be included in a single scan chain at the top level.0 June 2010 . . 3. By default. scan chains of this type are written to the scan DEF file and are commented out. scan chains with different clocks/edges are segmented into separate chains. The following command generates the default scan DEF file with a segmented scan chain as shown. SCANCHAINS 2 . BUSBITCHARS "[]" . cells of scan chains with different clock/edge domains are written out into a single ORDERED list and the PARTITION and MAXBITS information is not written out for these scan chains in the DEF file.chain1_sub0 + START pad/buf1 Z + FLOATING subA/flop1 ( IN SI ) ( OUT QN ) subA/flop2 ( IN SI ) ( OUT QN ) subA/flop3 ( IN SI ) ( OUT QN ) + STOP subA/lockup D # Partition for clock clockA (pos-edge) + PARTITION partition_1 MAXBITS 3 . DESIGN top .7 . pad/buf1/Z and pad/buf2/A are the scan input and output pins. write scan order -scandef deffile VERSION 5. by default. DIVIDERCHAR "/" . respectively. 396 Tessent DFTAdvisor Reference Manual. The user specifies internal scan input/output pins using the Add Scan Pins command. 2. The flip-flops in subA and in subB are clocked with clockA and clockB. 5. The user turns on lockup cell insertion between clock domains in a chain. each having three D-type flip-flops. subA and subB. The design has two sub-modules. V9. respectively. If you disable the segmentation of scan chains.

DESIGN top . 2. subA and subB. V9. each having three D-type flip-flops. DIVIDERCHAR "/" . All flip-flops in the design will be included in a single scan chain at the top level. END SCANCHAINS END DESIGN ( ( ( ( ( ( OUT OUT OUT OUT OUT OUT QN QN QN QN QN QN ) ) ) ) ) ) Tessent DFTAdvisor Reference Manual.0 June 2010 397 . The flip-flops in subA and the flip-flops in subB are clocked with clockA and clockB.7 . END SCANCHAINS END DESIGN Example 2 Assume the following in this example: 1. 3.chain1_sub1 + START subB/flop1 QN + FLOATING subB/flop2 ( IN SI ) ( OUT QN ) subB/flop3 ( IN SI ) ( OUT QN ) + STOP pad/buf2 A # Partition for clock clockB (neg-edge) + PARTITION partition_2 MAXBITS 2 .Command Dictionary Write Scan Order . The following command generates an unsegmented scan DEF file as follows. The design has two sub-modules. BUSBITCHARS "[]" . . write scan order -scandef deffile -no_segmentation VERSION 5. respectively. SCANCHAINS 1 .chain1 + START PIN scan_in1 + FLOATING subA/flop1 ( IN SI ) subA/flop2 ( IN SI ) subA/flop3 ( IN SI ) subB/flop1 ( IN SI ) subB/flop2 ( IN SI ) subB/flop3 ( IN SI ) + STOP PIN scan_out1 .

write scan order results/scandef -replace s Note Regular flip-flops and shift register flip-flops within the same domain are separated by FLOATING and ORDERED segments. the following command generates the scan DEF file that follows. V9. 398 Tessent DFTAdvisor Reference Manual. report scan cells --------------------------------------------------------------------------------Chain Group ShiftReg Library Clock Clock CellNo Name Name Pathname ID/CellNo ModelName ScanOut Pinname Polarity --------------------------------------------------------------------------------0 chain1 dummy /ud5 -/sff QB clk1 (+) 1 chain1 dummy /ud4 1/4 dff QB clk1 (+) 2 chain1 dummy /ud3 1/3 dff Q clk1 (+) 3 chain1 dummy /ud2 1/2 dff Q clk1 (+) 4 chain1 dummy /ud1 1/1 sff Q clk1 (+) 5 chain1 dummy /ud10 3/2 dff Q clk1 (+) 6 chain1 dummy /ud9 3/1 sff Q clk1 (+) 7 chain1 dummy /ud8 -/sff QB clk1 (+) 0 chain2 dummy /ud11 -/sff Q clk1 (+) 1 chain2 dummy /ud7 2/2 dff QB clk1 (+) 2 chain2 dummy /ud6 2/1 sff Q clk1 (+) 3 chain2 dummy /ud12 -/sff Q clk1 (+) 4 chain2 dummy /ud13 -/sff Q clk1 (+) 5 chain2 dummy /ud14 -/sff Q clk1 (+) 6 chain2 dummy /ud15 -/sff Q clk1 (+) --------------------------------------------------------------------------------- The tool identifies three shift registers as shown in the following output generated by the Report Shift Registers command. respectively. report shift registers -verb ----------------------------------------------------------------Hierarchical SequentialCell Clock Library Id Length Path InstanceName Edge & Name ModelName ----------------------------------------------------------------[1] 4 / ud1 + clk1 sff ud2 + clk1 dff ud3 + clk1 dff ud4 + clk1 dff [2] 2 / ud6 + clk1 sff ud7 + clk1 dff [3] 2 / ud9 + clk1 sff Given this input. Each shift register is written out in a separate ORDERED list.0 June 2010 .Command Dictionary Write Scan Order Example 3 This example illustrates the information reported with the Report Scan Cells command and written to the scanDEF file.

END SCANCHAINS END DESIGN Similarly.7 .Command Dictionary Write Scan Order # # # DESC: Generated by DFTAdvisor at Thu Apr 15 15:54:34 2010 VERSION 5. UNITS DISTANCE MICRONS 1000 . DIVIDERCHAR "/" .def Tessent DFTAdvisor Reference Manual. . BUSBITCHARS "[]" . the following command generates the scan DEF file that follows: write scan order –no_segmentation scan. given the same input. SCANCHAINS 2 .0 June 2010 399 .chain2_sub0 + START ud15 Q + FLOATING ud14 ( IN SI ) ( OUT Q ) ud13 ( IN SI ) ( OUT Q ) ud12 ( IN SI ) ( OUT Q ) + ORDERED ud6 ( IN SI ) ( OUT Q ) ud7 ( IN D ) ( OUT QB ) + STOP ud11 SI # Partition for core chain in clock clk1 (pos-edge) domain + PARTITION partition_1 MAXBITS 5 . V9. DESIGN A .chain1_sub0 + START ud8 QB + ORDERED ud9 ( IN SI ) ( OUT Q ) ud10 ( IN D ) ( OUT Q ) + ORDERED ud1 ( IN SI ) ( OUT Q ) ud2 ( IN D ) ( OUT Q ) ud3 ( IN D ) ( OUT Q ) ud4 ( IN D ) ( OUT QB ) + STOP ud5 SI # Partition for core chain in clock clk1 (pos-edge) domain + PARTITION partition_1 MAXBITS 6 . .

DESIGN A . SCANCHAINS 1 .Command Dictionary Write Scan Order Note In the following output: 1.0 June 2010 .7 . V9. All flip-flops are written out in one ORDERED list because chain1 contains cells in different clock edge domains. VERSION 5. the BITS field is not printed. END SCANCHAINS 400 Tessent DFTAdvisor Reference Manual.chain1 + START u5 Q + ORDERED u1 ( IN SI ) ( OUT Q ) u2 ( IN D ) ( OUT Q ) u3 ( IN D ) ( OUT Q ) u4 ( IN D ) ( OUT Q ) u6 ( IN SI ) ( OUT Q ) u7 ( IN D ) ( OUT Q ) u8 ( IN SI ) ( OUT Q ) u9 ( IN D ) ( OUT Q ) u10 ( IN D ) ( OUT Q ) u11 ( IN SI ) ( OUT Q ) u12 ( IN D ) ( OUT Q ) u13 ( IN SI ) ( OUT Q ) u14 ( IN D ) ( OUT Q ) u15 ( IN SI ) ( OUT Q ) lckup1 ( IN D ) ( OUT Q ) sub1 ( IN sci1 ) ( OUT sco1 ) ( BITS 2 ) + STOP sub2 sci2 . BUSBITCHARS "[]" . . The scan DEF includes this length in the BITS field. 2. For regular cells of length 1. UNITS DISTANCE MICRONS 1000 . DIVIDERCHAR "/" . sub1 and sub2 are instances of library cell libsubchmodel which contains a subchain of length 2.

report scan cells --------------------------------------------------------------------------------Chain Group Clock CellNo Name Name Pathname CellName ScanOut Clock Polarity --------------------------------------------------------------------------------chain1 dummy /lckup1 latch Q clk2 (-) 0 chain1 (schi2) dummy /uB/f3 sff Q clk2 (+) 1 chain1 (schi2) dummy /uB/f2 sff Q clk2 (+) 2 chain1 (schi2) dummy /uB/f1 sff Q clk2 (+) chain1 dummy /lckup2 latch Q clk2 (+) 0 chain2 (schc1) dummy /uWA/uA/f21 sff Q clk (+) 1 chain2 dummy /ud sff Q clk (+) 2 chain2 dummy /us sff Q clk (+) 0 chain3 (scho1) dummy /uWA/uA/f31 sff Q clk (+) chain4 dummy /lckup3 latch Q clk (-) 0 chain4 (schi1) dummy /uWA/uA/f3 sff Q clk (+) 1 chain4 (schi1) dummy /uWA/uA/bb/f2 sff Q clk (+) 2 chain4 (schi1) dummy /uWA/uA/f1 sff Q clk (+) chain4 dummy /lckup4 latch Q clk (+) write scan order # # # DESC: Generated by DFTAdvisor at Wed Mar 17 10:50:58 2010 VERSION 5. .chain1_sub0 + START lckup2 Q + FLOATING uB/f1 ( IN SI ) ( OUT Q ) uB/f2 ( IN SI ) ( OUT Q ) uB/f3 ( IN SI ) ( OUT Q ) + STOP lckup1 D # Partition for core chain in clock clk2 (pos-edge) domain + PARTITION partition_1 MAXBITS 3 . DIVIDERCHAR "/" . . BUSBITCHARS "[]" .chain2_sub0 + START us Q + FLOATING ud ( IN SI ) ( OUT Q ) + STOP uWA/uA/f21 SI # Partition for core chain in clock clk (pos-edge) domain + PARTITION partition_2 MAXBITS 1 . SCANCHAINS 1 .0 June 2010 401 . DESIGN top .Command Dictionary Write Scan Order Example 4 This example illustrates the information reported with the Report Scan Cells command and written to the scanDEF file when traceable subchains are present in the design. Tessent DFTAdvisor Reference Manual. UNITS DISTANCE MICRONS 1000 . V9.7 .

END SCANCHAINS END DESIGN Example 5 Note This example is a modification of Example 4. .chain1_sub0 + START lckup2 Q + ORDERED uB/f1 ( IN SI ) ( OUT Q ) uB/f2 ( IN SI ) ( OUT Q ) uB/f3 ( IN SI ) ( OUT Q ) + STOP lckup1 D 402 Tessent DFTAdvisor Reference Manual. UNITS DISTANCE MICRONS 1000 . uWA/uA/bb. V9. In this example. SCANCHAINS 1 . DIVIDERCHAR "/" . therefore. #. the Set Bidi Gating command assigns the attribute hard_macro to the module blackBox. the -no_reordering switch was used with the Add Sub Chains command when defining subchains. DESIGN top . Additionally. set attribute blackBox -name hard_macro -value true # # # DESC: Generated by DFTAdvisor at Fri Mar 26 17:48:50 2010 VERSION 5.7 . BUSBITCHARS "[]" .chain4_sub0 + START lckup4 Q + FLOATING uWA/mux ( IN A1 ) ( OUT Y ) ( BITS 0 ) uWA/uA/f1 ( IN SI ) ( OUT Q ) uWA/uA/bb/f2 ( IN SI ) ( OUT Q ) uWA/uA/f3 ( IN SI ) ( OUT Q ) + STOP lckup3 D # Partition for core chain in clock clk (pos-edge) domain + PARTITION partition_2 MAXBITS 3 . is written to the scanDEF file unexpanded and the number of scan cells on its scan path appears in the BITS statement. An instance of this module. the flip-flops contained within the subchains are written to the ORDERED sections.Command Dictionary Write Scan Order # The following chain segment with only 1 or 2 scan cells has been # commented out for compatibility with the layout tools. .chain3_sub0 # + START uWA/uA/f31 SI # + STOP uWA/uA/f31 Q .0 June 2010 .

. END SCANCHAINS END DESIGN Related Commands Add Scan Pins Add Sub Chains Tessent DFTAdvisor Reference Manual.Command Dictionary Write Scan Order # Partition for core chain in clock clk2 (pos-edge) domain + PARTITION partition_1 MAXBITS 3 . V9. . # # ## # The following chain segment with only 1 or 2 scan cells has been commented out for compatibility with the layout tools.chain2_sub0 + START us Q + FLOATING ud ( IN SI ) ( OUT Q ) + STOP uWA/uA/f21 SI # Partition for core chain in clock clk (pos-edge) domain + PARTITION partition_2 MAXBITS 1 .chain4_sub0 + START lckup4 Q + ORDERED uWA/mux ( IN A1 ) uWA/uA/f1 ( IN SI uWA/uA/bb ( IN si uWA/uA/f3 ( IN SI + STOP lckup3 D ( ) ) ) OUT Y ( OUT ( OUT ( OUT ) ( BITS 0 ) Q ) so ) ( BITS 1 ) Q ) # Partition for core chain in clock clk (pos-edge) domain + PARTITION partition_2 MAXBITS 3 .0 June 2010 403 . chain3_sub0 + START uWA/uA/f31 SI + STOP uWA/uA/f31 Q .

By using this command to specify for DFTAdvisor to write the subchain setup information at the lower-level and then reading in the setup file as part of the scan subchain setup.setup The following example shows the contents of the module1.0 June 2010 . V9. Examples The following example writes the scan chain setup information for this module so that you can later use the module1.Command Dictionary Write Subchain Setup Write Subchain Setup Scope: Dft mode Usage WRIte Subchain Setup filename -Replace Description Writes the appropriate Add Sub Chains commands to a file so that DFTAdvisor can understand the pre-existing scan subchains at the top-level of this module. Arguments • filename A required string that specifies the name of the file to which DFTAdvisor writes the scan subchain setup information. The Write Subchain Setup command is useful if you are performing a block-by-block test synthesis at the lower design level.setup file: add sub chains /user/designs/sub1 subc1 scan_in1 scan_out1 7 mux_scan scan_en Related Commands Add Sub Chains Insert Test Logic Report Sub Chains 404 Tessent DFTAdvisor Reference Manual. For information on this file format. refer to the Insert Test Logic command.setup file at the top-level to define the pre-existing scan subchain: insert test logic write subchain setup /user/designs/module1. you can avoid having to define the pre-existing scan subchain at the higher design level with the Add Sub Chains command. if the file already exists. • -Replace An optional switch that specifies for DFTAdvisor to replace the contents of the file.

Translates STIL Test Procedure (STP) files into Tessent FastScan. Tessent DFTAdvisor Reference Manual.Chapter 3 Shell Commands The DFTAdvisor shell commands are described in this chapter. and DFTAdvisor dofiles and test procedure files. V9. Shell Command Summary Table 3-1 contains a summary of the shell commands available in DFTAdvisor.0 June 2010 405 . FlexTest. Command Summary Command dftadvisor stil2mgc Description Invokes DFTAdvisor in either a graphical or commandline session. Table 3-1.

] [-INSENsitive | -SENsitive] [-LOg filename [-Replace]] [-TOp module_name] [-Dofile dofile_name [-HIstory]] [-LICense retry_limit] [-32 | -64]} | [-Load_warnings] [-TCL] | [-HElp | -USAGE | -MANUAL | -VERSion] [-LIBRARY_ARRAY_DELIMITER {square | angle}] Description Invokes DFTAdvisor in a command-line session. DFTAdvisor searches for include files in the following order of precedence: a.Shell Commands dftadvisor dftadvisor Prerequisites: Verilog netlist and cell library containing descriptions of the cells used in the design. only object names are treated as case-sensitive. Arguments • • design_name.. 406 Tessent DFTAdvisor Reference Manual. An optional switch and repeatable string pair that specifies the directories to search for files included in a Verilog design with the ‘include compiler directive.0 June 2010 . Usage dftadvisor {design_name. -LIBrary filename A required switch and repeatable string pair that specifies the files containing the ATPG library descriptions for all cell models in design_name. UNIX/Linux wildcard characters may be used to specify multiple library files. By default. and net pathnames are case-sensitive.... enter the required arguments on the shell command line.. repeatable string that specifies the pathname to a Verilog netlist... DFTAdvisor uses the first occurrence of a specified file and ignores others with the same name. This argument is not required if all primitives are fully defined in your netlist. Directory the tool was invoked from (current directory) • -INSENsitive | -SENsitive Optional switch that specifies whether pin. A required. Absolute pathnames specified by ‘include directives in the Verilog design b.}} [-INCDIR include_directory. instance. {-LIBrary {filename. Directories specified with the -Incdir invocation switch c.. To invoke DFT. The specified directories must be either a pathname relative to the current (tool invocation) directory or an absolute pathname. Directories are searched in the order they are specified. The design and library load and DFTAdvisor invokes in Setup mode... Directory where the calling file is located d. • -INCDIR include_directory. V9.

V9. • -TOp model_name An optional switch and string pair that specifies the name of the top-level model in the netlist. This switch is only valid for batch mode. • -HElp An optional switch that displays the version and usage syntax for DFTAdvisor. • -TCL An optional switch that invokes the tool in Tcl scripting mode. DFTAdvisor checks for a license every minute until the specified retry_limit is reached. the commands in a dofile are not inserted into the history list. See “Using the Tcl Scripting Interface” in the Tessent Common Resources Manual for ATPG Products for complete information. If the platform does not support the specified version.Shell Commands dftadvisor • -LOg filename An optional switch and string pair that determines whether a session log file is saved to a specified file. • -32 | -64 An optional switch that invokes the 32-bit or 64-bit version of the software. • -Dofile dofile_name An optional switch and string pair that specifies the name of a dofile to execute upon invocation. By default.0 June 2010 407 . the invocation process exits when no license is available. No other arguments can be specified with this switch. If the retry_limit equals 0 (zero). but the dofile command itself is added to the list. Tessent DFTAdvisor Reference Manual. The default is 64-bit. the tool gives a warning message and ignores the switch. only a summary message for most warnings and notes is reported. If no license is available. By default. • -Replace An optional switch that enables DFTAdvisor to overwrite an existing logfile with the same name. By default. • -HIstory An optional switch that adds commands from a dofile to the command line history list. • -LICense retry_limit An optional switch and integer pair that specifies how long DFTAdvisor should check for an available license before exiting the invocation process. session information is only sent to the terminal display. By default. DFTAdvisor continues checking for a license until one is obtained. By default. the first top-level module is assumed to be the top module. • -LOAd_warnings An optional switch that reports any warnings and notes returned while loading the netlist and library.

v. • • -MANUAL An optional switch that displays the DFT documentation set in an HTML browser.log that is overwritten if it already exists. • -LIBRARY_ARRAY_DELIMITER {square | angle} An optional switch that sets the default array delimiter for library parsing to either square brackets “[]” or angle brackets “<>”. V9.log -replace 408 Tessent DFTAdvisor Reference Manual. The default is “[]”. with no descriptions. <Tessent_Tree_Path>/bin/dftadvisor design1. This design contains library parts that are specified in a file called mitsu_lib10.0 June 2010 .v -library mitsu_lib10 \ -log design1_scan. No other arguments can be specified with this switch. Examples The following example invokes DFTAdvisor on a netlist named design1.Shell Commands dftadvisor • -USAGE An optional switch that displays a message that contains the DFTAdvisor invocation switches. A session log is saved to a file named design1_scan. -VERSion An optional switch that displays the version of the DFTAdvisor software currently available.

and so on) is translated into that Mentor Graphics procedure. The tool translates STIL signal groups used in timeplates or procedures into “alias” statements in the test procedure file. Tessent DFTAdvisor Reference Manual. Usage stil2mgc {-STil stil_filename [-TPf tpf_filename] [-DOfile dofile_name] [-FLex_dofile dofile_name] [-ALias Min | All] [-CApture NOne | Single | NAmed] [-LOgfile logfile_name [-REplace]]} | {-Version | -Help | -Usage} Description The stil2mgc utility translates STIL test procedure files into Tessent FastScan. • -DOfile dofile_name An optional switch and string pair that specifies a name for the generated dofile. The stil2mgc utility produces: • • Dofiles — that define clocks. By default. and shift scan procedures. and pin constraints Test procedure files — that define a timeplate and the test_setup. any procedure or macro in the STIL file that has “capture” in its name is translated into a named capture procedure if the “-Capture named” switch is used.Shell Commands stil2mgc stil2mgc Prerequisites: STIL test procedure file.0 June 2010 409 . exactly matching the timing specified in the STIL file. load_unload. • -TPf tpf_filename An optional switch and string pair that specifies a name for the translated test procedure file.dof appended. the translated file assumes the name of the STIL test procedure with . the dofile assumes the name of the STIL test procedure with . and DFTAdvisor dofiles and test procedure files. scan groups. By default. It also produces a test procedure file timeplate definition for each WaveformTable in the STIL file. Any procedure or macro whose name matches a Mentor Graphics procedure type (load_unload. V9. Any other macro whose name does not match Mentor Graphics names is translated into an unused sub-procedure. Arguments • -STil stil_filename A required switch and string pair that specifies the name of the input STIL test procedure file.proc appended. FlexTest. Also. • -FLex_dofile dofile_name An optional switch and string pair that generates an additional dofile for the FlexTest tool. scan chains. master_observe.

Options include: NOne — Produces no capture procedures. • -LOgfile logfile_name An optional switch and string pair that specifies the name of the file to write all session information. NAmed— Produces a named capture procedure for each capture Macro found in the STIL test procedure file.Shell Commands stil2mgc • -ALias Min | -ALl An optional switch that specifies how alias statements are applied during conversion.do 410 Tessent DFTAdvisor Reference Manual. Default. • -REplace An optional switch that enables stil2mgc to overwrite an existing logfile with the same name.0 June 2010 . Single — Produces a single unnamed capture procedure.stp -tpf new_design. -ALl — Produces alias statements for all signal groups found in the STIL test procedure file. -Help An optional switch that displays the stil2mgc switches and a brief description of each. Options include: -ALias Min — Produces the minimum required alias statements in the MGC procedure file. -Usage An optional switch that displays the usage syntax for the stil2mgc command. • -CApture {NOne | Single | NAmed} An optional switch and literal pair that determines how named capture procedures are applied in the MGC procedure file. V9. Examples The following example executes the stil2mgc utilty on design. • • • • -Version An optional switch that displays the version of the stil2mgc utility. Default. stil2mgc -stil design.tpf -dofile new_dofile. -MANual An optional switch that displays the DFT documentation in an HTML browser.stp.

Opens the DFTVisualizer main window. Removes data columns from the Browser window of DFTVisualizer. Table A-1. see “Getting Started with DFTVisualizer” in the Tessent Common Resources Manual for ATPG Products. DFTVisualizer-Related Commands Command Add Browser Data Add Display Data Add Display Instances Description Adds data columns to the Browser window of DFTVisualizer. Table A-1 lists the DFTVisualizer-related DFTAdvisor commands available for your use. Lists netlist information for specified instances displayed in the Debug window. V9. Generates a netlist of the portion of the design involved with the specified rule violation number. Applies a different color to instances in the Debug window. Reads a DFTVisualizer preferences file and sets current preferences as described in the file. Closes the DFTVisualizer window.0 June 2010 411 .Appendix A Using Tessent DFTVisualizer Tessent DFTVisualizer (hereafter know as DFTVisualizer) is a graphical debugging and analysis schematic viewing tool you can use with DFTAdvisor. Tip: For complete DFTVisualizer documentation. Displays instances in DFTVisualizer and enables you to trace visually through the design using the Debug or Design window. Removes the specified design instances from a DFTVisualizer display window. Analyze Drc Violation Close Visualizer Delete Browser Data Delete Display Data Delete Display Instances Load Visualizer Preferences Mark Open Visualizer Report Display Instances Tessent DFTAdvisor Reference Manual. Adds data columns to the Data window of DFTVisualizer. Removes a data column from the Data window of DFTVisualizer.

and Data windows. and Design. DFTVisualizer-Related Commands Command Save Visualizer Dofile Save Window Select Object Set Visualizer Preferences Unmark Write Visualizer Preferences Description Writes a dofile containing commands needed to recreate current instance and data displays. Removes color highlighting and/or marking from instances in the Debug window.Using Tessent DFTVisualizer Table A-1. Writes the current DFTVisualizer preference settings to a file. Browser. Saves a screen capture of a DFTVisualizer window. V9.0 June 2010 . Controls a subset of DFTVisualizer preferences for the Debug. Selects the specified objects in the Debug and/or Design window. 412 Tessent DFTAdvisor Reference Manual.

access to comprehensive online services with SupportNet. view documentation. see the “Using Tessent Documentation” chapter in the Managing Mentor Graphics Tessent Software manual.cfm All customer support contact information can be found on our web site at: http://supportnet.mentor.mentor. user guides.mentor.mentor. help is available from documentation. or open a Service Request online at: http://supportnet. Documentation A comprehensive set of reference manuals.Appendix B Getting Help There are several ways to get help when setting up and using Tessent™ software tools. Mentor Graphics Support Mentor Graphics software support includes software enhancements. you can register for SupportNet by filling out the short form at: http://supportnet. V9.com For more information on setting up and using Tessent documentation.0 June 2010 413 .com If your site is under current support and you do not have a SupportNet login. and the optional On-Site Mentoring service.com/user/register. and release notes is available in two formats: • • HTML for searching and viewing online PDF for printing The documentation is available from each software tool and online at: http://supportnet. and Mentor Graphics Support. you can log in to SupportNet and search thousands of technical solutions.cfm Tessent DFTAdvisor Reference Manual.com/about/ If you have questions about a software release. For details.mentor.com/contacts/supportcenters/index. see: http://supportnet. online command help. Depending on your need.

Getting Help Mentor Graphics Support 414 Tessent DFTAdvisor Reference Manual. V9.0 June 2010 .

115 Delete Nofaults. 55 Add Primary Inputs. V9. 174 415 —C— Command Dictionary. 113 Delete Clocks. 118 Delete Nonscan Instances. 140 Delete Scan Pins. 152 Exit. 129 Delete Primary Inputs. 87 Add Test Points. 51 Add Pin Constraints. 134 Delete Scan Chains. 126 Delete Pin Constraints. 32 Add Clock Groups. 136 Delete Scan Instances. 15 Commands Add Black Box. 84 Add Subchain group. 171 Report Black Box. 163 Printenv. 154 F. 63 Add Scan Instances. 66 Add Scan Partition. 72 Add Seq_transparent Constraints. 40 Add Nofaults. 145 Delete Test Points. 172 Report Buffer Insertion. 142 Delete Sub Chains. 170 Read Procfile. 143. 104 Analyze Testability. 43 Add Nonscan Instances. 30 Add Cell Models. 251 Delete Subchain Groups. 100 Analyze Input Control. 103 Analyze Output Observe. 105 B. 130 Delete Primary Outputs. 144. 148 Delete Write Controls. 151 Echo. 146 Delete Tied Signals. 108 Delete Buffer Insertion. 46 Add Nonscan Models. 90 Add Tied Signals. 35 Add Clocks. 141 Delete Seq_transparent Constraints. 96 Alias. 114 Delete Mapping Definition. 139 Delete Scan Partitions. 53 Add Pin Equivalences.0 June 2010 . 135 Delete Scan Groups. 28 Add Buffer Insertion. 120 Delete Nonscan Models. 94 Add Write Controls. 122 Delete Notest Points. 49 Add Output Masks. 202 Find Design Names. 59 Add Read Controls. 137 Delete Scan Models. 155 Help. 111 Delete Clock Groups. 68 Add Scan Pins.A B C D E F G H I J K L M N O P Q R S T U V W X Y Z Index —B— B command. 79. 57 Add Primary Outputs. 60 Add Scan Chains. 150 Dofile. 161 Insert Test Logic. 37 Add Mapping Definition. 64 Add Scan Models. 160 History. 124 Delete Output Masks. 61 Add Scan Group. 109 Delete Cell Models. 202 Tessent DFTAdvisor Reference Manual. 48 Add Notest Points. 97 Analyze Control Signals. 202 Delete Black Box. 127 Delete Pin Equivalences. 77 Add Sub Chains. 132 Delete Read Controls.

326 Set System Mode. 235 Report Scan Pins. 209 Report Nofaults. 380 Write Formal_verification Setup. 237 Report Seq_transparent Constraints. 279 Set Fault Sampling. 386 416 Tessent DFTAdvisor Reference Manual. 273 Set Command Editing. 190 Report Environment. 260 Report Timeplate. 253 Report Test Points. 226 Report Scan Cells. 214 Report Notest Points. 325 Set Stability Check. 379 Write Atpg Setup. 275 Set Dofile Abort. 223 Report Primary Outputs.A B C D E F G H I J K L M N O P Q R S T U V W X Y Z Report Cell Models. 231 Report Scan Groups. 295 Set Identification Model. 239 Report Statistics. 185 Report Dft Check. 330 Set Transient Detection. 323 Set Sensitization Checking. 303 Set Lockup Latch. 255 Report Testability Analysis. 346 Setup Scan Identification. 225 Report Read Controls. 311 Set Nonscan Handling. 224 Report Procedure. 220 Report Pin Equivalences. 309 Set Net Resolution. 324 Set Shadow Checking. 184 Report Control Signals. 219 Report Write Controls. 328 Set Trace Report. 199 Report Gates. 268 Save History. 266 Run. 261 Report Variables. 338 Set File Compression. 327 Set Test Logic. 350 Setup Scan Insertion. 372 Stil2mgc. 252 Report Test Logic. 342 Setup Pin Constraints. 201 Report Loops. 312 Set Scan Type. 362 Setup Test_point Insertion. 265 Ripup Scan Chains. 216 Report Pin Constraints. 262 Report Wrapper Cells. 297 Set Internal Fault. 195 Report Feedback Paths. 365 Setup Tied Signals. 385 Write Netlist. 238 Report Sequential Instances. 356 Setup Scan Pins. 339 Setup Output Masks. V9. 383 Write Loops. 304 Set Logfile Handling. 270 Set Capture Clock. 207 Report Mapping Definition. 359 Setup Test_point Identification. 257 Report Tied Signals. 227 Report Scan Chains. 331 Set Tristate Gating. 248 Report Sub Chains. 269 Set Bidi Gating. 264 Reset State. 177 Report Clock Groups. 282. 332 Setup Naming. 283 Set Flatten Handling. 285 Set Gzip Options. 409 System. 274 Set Contention Check. 183 Report Clocks. 250 Report Subchain Groups.0 June 2010 . 278 Set Drc Handling. 322 Set Screen Display. 222 Report Primary Inputs. 233 Report Scan Models. 212 Report Nonscan Models. 187 Report Drc Rules. 197 Report Flatten Rules. 299 Set Io Insertion. 234 Report Scan Partitions. 344 Setup Registered Io. 301 Set Latch Handling. 215 Report Output Masks. 175 Report Circuit Components.

11 —R— Reporting report gate format. 46 Tessent DFTAdvisor Reference Manual. 11 —N— Non-scan initialization values. 11 —F— F command. 11 to DFTAdvisor. 46 TIE1.A B C D E F G H I J K L M N O P Q R S T U V W X Y Z Write Primary Inputs. 392 Write Scan Identification.0 June 2010 417 . 391 Write Procfile. V9. 201 —S— stil2mgc script. 63 —O— Outputs to DFTAdvisor. 404 —D— DFTAdvisor Inputs. 393 Write Scan Order. scannable. 390 Write Primary Outputs. scannable. 11 Outputs. 409 —T— TIE0. 395 Write Subchain Setup. 202 —I— Inputs.

V9.A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 418 Tessent DFTAdvisor Reference Manual.0 June 2010 .

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INCLUDING. and distribute this software and its documentation for any purpose is hereby granted without fee.I. provided that the above copyright notice appear in all copies and that both that copyright notice and this permission notice appear in supporting documentation. Lie-Quan Lee. OR CONSEQUENTIAL DAMAGES (INCLUDING. © 2006 Michael Drexl Permission to use. distribute and sell this software and its documentation for any purpose is hereby granted without fee. © 2005 JongSoo Park Permission to use. copy. It is provided "as is" without express or implied warranty. Some concepts based on versions from the MTL draft manual and Boost Graph and Property Map documentation. distribute and sell this software and its documentation for any purpose is hereby granted without fee. modify. copy. INDIRECT. LOSS OF USE. © 1994 Hewlett-Packard Company This product includes software developed at the University of Notre Dame and the Pervasive Technology Labs at Indiana University. OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY. STRICT LIABILITY. DATA. and sell this software and its documentation for any purpose is hereby granted without fee. We make no representations about the suitability of this software for any purpose. written prior permission. It is provided "as is" without express or implied warranty. the SGI Standard Template Library documentation and the Hewlett-Packard STL. and Andrew Lumsdaine Permission to use. modify. 2001 University of Notre Dame du Lac © 2000 Jeremy Siek. Andrew Lumsdaine © 1996-1999 Silicon Graphics Computer Systems. and that the name of M. provided that the above copyright notice appears in all copies and that both that copyright notice and this permission notice appear in supporting documentation. 2002 Indiana University © 2000. Silicon Graphics makes no representations about the suitability of this software for any purpose. not be used in advertising or publicity pertaining to distribution of the software without specific. Michael Drexl makes no representations about the suitability of this software for any purpose. It is provided "as is" without express or implied warranty. .T. © 2000 Jeremy Siek. provided that the above copyright notice appears in all copies and that both that copyright notice and this permission notice appear in supporting documentation.THIS SOFTWARE IS PROVIDED BY THE AUTHOR ``AS IS'' AND ANY EXPRESS OR IMPLIED WARRANTIES. Indiana 46202. For administrative and license questions contact the Advanced Research and Technology Institute at 351 West 10th Street.I. PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES. It is provided "as is" without express or implied warranty. copy. fax 317-274-5902. copy. distribute and sell this software and its documentation for any purpose is hereby granted without fee. THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE DISCLAIMED. modify. SPECIAL. makes no representations about the suitability of this software for any purpose. modify. OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE. BUT NOT LIMITED TO. under the following license: Permission to use. modify. Jeremy Siek makes no representations about the suitability of this software for any purpose. EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE. provided that the above copyright notice appears in all copies and that both that copyright notice and this permission notice appear in supporting documentation. EXEMPLARY. INCIDENTAL. phone 317-278-4100. It is provided "as is" without express or implied warranty. OR PROFITS. WHETHER IN CONTRACT. Indianapolis. BUT NOT LIMITED TO. provided that the above copyright notice appears in all copies and that both that copyright notice and this permission notice appear in supporting documentation. Lie-Quan Lee. © 1991 Massachusetts Institute of Technology Permission to use. M. © 2001. Inc. distribute.T. IN NO EVENT SHALL THE AUTHOR BE LIABLE FOR ANY DIRECT. For technical information contact Andrew Lumsdaine at the Pervasive Technology Labs at Indiana University. copy.

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CUSTOMER ACKNOWLEDGES IT IS SOLELY RESPONSIBLE FOR TESTING ITS PRODUCTS USED IN APPLICATIONS WHERE THE FAILURE OR INACCURACY OF ITS PRODUCTS MIGHT RESULT IN DEATH OR PERSONAL INJURY (“HAZARDOUS APPLICATIONS”). INCIDENTAL. unauthorized modification or improper installation. PROVIDED CUSTOMER HAS OTHERWISE COMPLIED WITH THIS AGREEMENT. NEITHER MENTOR GRAPHICS NOR ITS LICENSORS SHALL BE LIABLE FOR ANY DAMAGES RESULTING FROM OR IN CONNECTION WITH THE USE OF MENTOR GRAPHICS PRODUCTS IN OR FOR HAZARDOUS APPLICATIONS. IN NO EVENT SHALL MENTOR GRAPHICS’ OR ITS LICENSORS’ LIABILITY UNDER THIS AGREEMENT EXCEED THE AMOUNT RECEIVED FROM CUSTOMER FOR THE HARDWARE. MENTOR GRAPHICS MAKES NO WARRANTIES WITH RESPECT TO: (A) SERVICES. LIMITED WARRANTY. Mentor Graphics will pay costs and damages finally awarded against Customer that are attributable to the action. THE PROVISIONS OF THIS SECTION 9 SHALL SURVIVE THE TERMINATION OF THIS AGREEMENT.

EXPORT. Mentor Graphics Corporation. (b) the modification of the Product other than by Mentor Graphics. 13. Mentor Graphics may terminate this Agreement and/or any license granted under this Agreement upon 30 days written notice if Customer fails to cure the breach within the 30 day notice period.1 Mentor Graphics may. CONTROLLING LAW. or (h) infringement by Customer that is deemed willful. duplication and disclosure of the Software by or for the U. Termination of this Agreement or any license granted hereunder will not affect Customer’s obligation to pay for Products shipped or licenses granted prior to the termination. Mentor Graphics shall bear the expense of any such review unless a material non-compliance is revealed. 12. pursuant to US FAR 48 CFR 12. Customer shall reimburse Mentor Graphics for its reasonable attorney fees and other costs related to the action. Customer shall ensure that all use of the affected Products ceases.S.2. THIS SECTION 12 IS SUBJECT TO SECTION 9 ABOVE AND STATES THE ENTIRE LIABILITY OF MENTOR GRAPHICS AND ITS LICENSORS FOR DEFENSE. 12. and certify in writing to Mentor Graphics within ten business days of the termination date that Customer no longer possesses any of the affected Products or copies of Software in any form. and shall return hardware and either return to Mentor Graphics or destroy Software in Customer’s possession. The Products provided hereunder are subject to regulation by local laws and United States government agencies. or sells. With prior written notice and during Customer’s normal business hours. All Software is commercial computer software within the meaning of the applicable acquisition regulations.S. TERMINATION AND EFFECT OF TERMINATION.2. Government subcontractor is subject solely to the terms and conditions set forth in this Agreement. and (c) grant Mentor Graphics sole authority and control of the defense or settlement of the action.212 and DFAR 48 CFR 227. 12. In the case of (h). uses. Accordingly. U.S. (a) replace or modify the Product so that it becomes noninfringing.4. USA. AND CUSTOMER’S SOLE AND EXCLUSIVE REMEDY. Upon termination of this Agreement. all disputes in Asia arising out of or in relation to this Agreement shall be resolved by arbitration in Singapore before a single arbitrator to be appointed by the chairman of the Singapore International . the rights and obligations of the parties shall cease except as expressly set forth in this Agreement. Mentor Graphics may engage an internationally recognized accounting firm to review Customer’s software monitoring system and records deemed relevant by the internationally recognized accounting firm to confirm Customer’s compliance with the terms of this Agreement or U. Customer shall make records available in electronic format and shall fully cooperate with data gathering to support the license review. or (b) becomes insolvent. GOVERNMENT LICENSE RIGHTS. If a claim is made under Subsection 12. files a bankruptcy petition. (g) any software provided by Mentor Graphics’ licensors who do not provide such indemnification to Mentor Graphics’ customers. (c) the use of other than a current unaltered release of Software. Mentor Graphics may terminate this Agreement and/or any license granted under this Agreement immediately upon written notice if Customer: (a) exceeds the scope of the license or otherwise fails to comply with the licensing or confidentiality provisions of this Agreement. Mentor Graphics has no liability to Customer if the action is based upon: (a) the combination of Software or hardware with any product not furnished by Mentor Graphics. or Dublin. JURISDICTION AND DISPUTE RESOLUTION. SETTLEMENT AND DAMAGES. THIRD PARTY BENEFICIARY. such license will automatically terminate at the end of the authorized term. or other local export laws. Ireland when the laws of Ireland apply. use. (d) the use of the Product as part of an infringing process. Customer will monitor the access to and use of Software. Oregon when the laws of Oregon apply. WITH RESPECT TO ANY ALLEGED PATENT OR COPYRIGHT INFRINGEMENT OR TRADE SECRET MISAPPROPRIATION BY ANY PRODUCT PROVIDED UNDER THIS AGREEMENT.1. Software was developed entirely at private expense. 15. The owners of certain Mentor Graphics intellectual property licensed under this Agreement are located in Ireland and the United States. which amounts shall be payable immediately upon the date of termination.7202. Such review may include FLEXlm or FLEXnet (or successor product) report log files that Customer shall capture and provide at Mentor Graphics’ request. (f) any Beta Code or Product provided at no charge. Upon termination. at its option and expense. For any other material breach of any provision of this Agreement. 13. which prohibit export or diversion of certain products and information about the products to certain countries and certain persons.S. Government or a U. this Agreement shall be governed by and construed under the laws of the State of Oregon. including all copies and documentation. REVIEW OF LICENSE USAGE. Mentor Graphics shall treat as confidential information all information gained as a result of any request or review and shall only use or disclose such information as required by law or to enforce its rights under this Agreement. (e) a product that Customer makes. Notwithstanding the foregoing. All disputes arising out of or in relation to this Agreement shall be submitted to the exclusive jurisdiction of the courts of Portland. Mentor Graphics (Ireland) Limited. If a Software license was provided for limited term use. if Customer is located in North or South America. Customer agrees that it will not export Products in any manner without first obtaining all necessary approval from appropriate local and United States government agencies.to settle or defend the action. less a reasonable allowance for use. Microsoft Corporation and other licensors may be third party beneficiaries of this Agreement with the right to enforce the obligations set forth herein.3. 16. 13. 14. 17. or (c) require the return of the Product and refund to Customer any purchase price or license fee paid. The provisions of this Section 17 shall survive the termination of this Agreement. and the laws of Ireland if Customer is located outside of North or South America. disputes shall be resolved as follows: excluding conflict of laws rules. 18. To promote consistency around the world. institutes proceedings for liquidation or winding up or enters into an agreement to assign its assets for the benefit of creditors. (b) procure for Customer the right to continue using the Product. except for provisions which are contrary to applicable mandatory federal laws.

Rev. including but not limited to any purchase order terms and conditions. which rules are deemed to be incorporated by reference in this section. Some Software may contain code distributed under a third party license agreement that may provide additional rights to Customer. This Agreement contains the parties’ entire understanding relating to its subject matter and supersedes all prior or contemporaneous agreements. waiver or excuse. unenforceable or illegal. 19. This section shall not restrict Mentor Graphics’ right to bring an action against Customer in the jurisdiction where Customer’s place of business is located. in accordance with the Arbitration Rules of the SIAC in effect at the time of the dispute. MISCELLANEOUS. invalid. Part No. 20. The United Nations Convention on Contracts for the International Sale of Goods does not apply to this Agreement.Arbitration Centre (“SIAC”) to be conducted in the English language. such provision shall be severed from this Agreement and the remaining provisions will remain in full force and effect. Waiver of terms or excuse of breach must be in writing and shall not constitute subsequent consent. If any provision of this Agreement is held by a court of competent jurisdiction to be void. 246066 . 100615. This Agreement may only be modified in writing by authorized representatives of the parties. Please see the applicable Software documentation for details. SEVERABILITY.

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