MISRs are commonly used in built-in self-test (BIST) applications. This paper investigates the problem of reducing the MISR so that it samples multiple signals at every stage. Issues like detection probability loss, test length penalty, fault coverage degradation are some of the disadvantages that may arise from the MISR shrinkage.
MISRs are commonly used in built-in self-test (BIST) applications. This paper investigates the problem of reducing the MISR so that it samples multiple signals at every stage. Issues like de…