You are on page 1of 2

22 05 2013

Detection of Hydrogen-Induced Cracking (HIC)

English (Change) Home About Us Site Map Global Site

Inspection & Measurement Systems


P ro d u ct s

Ap p lica t io n s

Kn o w le d g e

Ne w s

E ve n t s

Su p p o rt
Like 0

C o n t a ct U s
Tw eet 0 0

Home > Applications > Application Notes

Share Send to Friend

Application Notes Applications Support Eddy Current High Speed Video Microscope Solutions Optical Metrology Phased Array Remote Visual Inspection Ultrasound XRF/XRD


Application Notes
Detection of Hydrogen-Induced Cracking (HIC)
General Description of the Application Hydrogen-induced cracking (HIC) can occur in susceptible steels exposed to aqueous environments containing hydrogen sulphides. It is a form of hydrogen-related cracking and can have two distinct morphologies: 1. The first type is commonly referred to as hydrogen-induced cracking (HIC) and can occur where little or no applied or residual tensile stress exists. It is manifested as blisters or blister cracks oriented parallel to the plate surface. 2. The second type produces an array of blister cracks linked together in the through thickness direction by transgranular cleavage cracks. The latter type of cracking is referred to as stress-oriented hydrogen-induced cracking (SOHIC). SOHIC can have a greater effect on serviceability than HIC because it effectively reduces load carrying capabilities to a greater degree. The inspection requires characterization of the defect areas to differentiate between spot inclusions, laminations, and different stages of hydrogen-induced cracking (HIC). The benefit of electronic angle sweeping (S-scans) provided by the OmniScan allows simultaneous scanning from 30 to +30 degrees. The imaging from this scanning technique allows the user to distinguish between spot indications and interconnected defects. Typical Inspection Requirements Heavy wall carbon steel vessels Thickness ranges of 10 mm (0.375 in.) to 150 mm (5.9 in.) Advantages of Phased-Array Technique Imaging giving easy interpretation of links between defects Setup time between inspections decreased due to portability Type of Defects Spot inclusions Laminations Side step cracking (SOHIC) Description of the Solution Manual inspection using an OmniScan and phased-array probe Inspection setup using a 30- to +30-degree LW refracted angle sectorial scan Real-time display of A-scan and S-scan data Capable of storing display screen captures or full data file for offline analysis on computer-based software (TomoView) Equipment Required OmniScan PA 5-MHz 16-element phased-array probe TomoView software for advanced analysis Inspection Method A 0-degree raster scan is used to find the area that has laminations. Then the phased array probe using the 30- to +30-degree Sscan setup is manually scanned over on the areas where defects have been found to determine if there is a link between those defects. Screen shots and reports of the defect can be immediately created for later printouts.

Products used for this application

OmniScan MX
The OmniScan MX is an advanced, multitechnology flaw detector. It offers a high acquisition rate and powerful software features-in a portable, modular instrument to efficiently perform manual and automated inspections. Available with PA and conventional UT modules, and conventional EC and ECA modules.

OmniScan MX2


The OmniScan MX2 now features a new phased array module (PA2) with a UT channel, and a new two-channel conventional ultrasound module (UT2) that can be used for TOFD (Time-of-Flight Diffraction), as well as new software programs that expand the capabilities of the successful OmniScan MX2 platform.


22 05 2013

Detection of Hydrogen-Induced Cracking (HIC)

TomoView Software
TomoView is a powerful and flexible PCbased software used for design, data acquisition, visualization, and analysis of ultrasonic signals.

Advanced NDT Solutions

Weld Inspection Solutions Corrosion Inspection Solutions Composite Inspection Solutions Tube Inspection Solutions Industrial Scanners Aerospace Inspection Solutions

Thickness Gages
45MG 38DL PLUS Magna-Mike 8600 26MG 35RDC Transducers and Accessories

Videoscopes, Borescopes
Industrial Videoscopes Industrial Fiberscope Industrial Rigid Borescopes Light Sources Inspection Assist Software Turning Tools

Application Notes Applications Support Eddy Current High Speed Video Microscope Solutions Optical Metrology Phased Array Remote Visual Inspection Ultrasound XRF/XRD

Flaw Detectors
Ultrasonic Flaw Detectors Phased Array Eddy Current Products Eddy Current Array Products BondMaster Transducers and Probes Pulser-Receivers

Microscope Solutions
Laser Confocal Microscopes Opto-digital Microscopes Semiconductor & Flat Panel Display Inspection Microscopes Upright Metallurgical Microscopes Inverted Metallurgical Microscopes Modular Microscopes Polarizing Microscopes Measuring Microscopes Stereo Microscopes Objective Lenses Digital Cameras Image Analysis Software

High Speed Video Cameras

i-SPEED LT i-SPEED 2 i-SPEED TR i-SPEED 3 i-SPEED FS i-SPEED PL Cyclocam i-SPEED Comparison i-SPEED Videos

Service Centers PDF Library Video Gallery Software Downloads Training Academy Obsolete Products ISO Certifications MSDS Datasheets

Integrated Inspection Systems

Bar Inspection Systems Tube Inspection Systems NDT Systems Instrumentation

XRF and XRD Analyzers

Handheld XRF Portable XRF Benchtop XRF Process XRF Portable XRD Benchtop XRD Alloys and Metals XRF Analyzers Precious Metals XRF Analyzers Scrap and Recycling XRF Analyzers Applications Solutions Key

Optical Metrology
Laser Confocal Microscopes Opto-digital Microscopes Measuring Microscopes

Copyright 2013 OLYMPUS CORPORATION, All rights reserved. Terms Of Use | Privacy Statement