MIL-STD-414

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11 blvs7

~M ORfkMOO$-10

MILITARY SAMbLING

STANDARD TABLES

PROCEDURES AND

FOR INSPECTION

BY VARIABLES

FOR PERCENT DEFECTIVE

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mL-sTD-414 11 JEW 1957

OFFICS

OF TEE

~ANT Wuhlngkm

SECRETARY $5, D. c.

OF DE~

Supply and Logi.ti.. Sarnpflng Varl.bl..
MIL-STD-414

11 JUIU lb7 for fa.p. ctlo. by

Procedures and Table. for Pe=cent Ddectlva

1. Thi. .tandard h.. ~en approved and i. mandatory for . . . by the Departm. q ffectivm 11 June 1957. the M. force, ccordance 2. h q Diwl. im k.. d-.ifp.t.d Air For.. , r.. p.ti..ly, .tandard.

by the De Pru’ne.t of Defense rAto of the Army, the Navy. and

rnth e.tabli.bed proc.dur., the Sfandardi.. ticm Bureau of Ordnance. -d tha Chemical -Carp. . . Amp N.v-Air For.. custodian. .1 thi. correction.. sddltlenn, or deletion. .hould be atior. Divi. iom, Of fic. of the As. imta.t Sec... and Logistic.), Wa.hin@an Z5. D. C.

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qddr . . ..d to the Stanbrdi.
aary of Def.a.e (Su@y

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Recommended

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INTRODUCTION SECTION A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . GENERAL “ii 1

D&9tiRIPT30N

OF tibfPL3t4G

PL.#JS

. . . . .

Table,: Table Table Table

A-1 A-2 A-3

U3LConveraion Table . . . . Sample Size Code tiNers . . . Char.cteri*tie Curve. Operating Plmm of S.ctiOa# B, C, and D San@. Sise tie Letters B

. . . . . . . . . . . . . . . . . . . . . . 10. Sampfiq (Graphfor
though Q) . .

:

5

SECTION

B J

VAR3ABIL1TY UN3U40WK-STANDARD DEV~TION METHOD SINGLE SPECIFICATION LIMIT . . . . . . . . . . . . . . 35

Par:

Ex8mpl. *: Example Example

B- I B-2

Example of Cdcafattoiw:, sPeciflcatiOn fAmil-Form Example of Calculations: Sp*cificatiea Ltmit-l%rm

Simgle 1 . . . . . . . . . . . Sin~le 2 . . . . . . . . . . .

37 38 39 40 41

Table.: Treble E.- I Table B-Z

nd Tighteoed M..ter Tabie for Normal q 3nmpecti0n (Form l-Sinnle fAmit) . . . . . Maater Table for Redueed impection (sOrrnl-singl. LiJnii) . . . . . . . . . . . . . . SPECIFICATION UhUT . . . . . . . . . . , .

Part 1s

H

DOUBLE B-3 B-4

Examplea: Example Exarn@e
T, blem:

tiample of Cdcrdatiomm: Double Specifi. c8tioa LAnit-Cke AQL vai.4 far Upper . . . and Lawe r Specification Limit Combined Example of Calculatinna: Double Specification Umit-DIfferem AC3L values for Upper sud fmwer Specification Umitm . . . . Mmmter Table for Normal Impecti.n (Double Limit
siIl#le LiInif)

43 44

Table I ... Table

B- 3

qnd Tightened
and f%rm 2-

. . . . . . . . . . . .. . . . . .

. . .

45 46 47

B-4 B-5

I

Table

Mssier Table for R=duced faspectiom . . . (Double LImitmnd Form Z-Single Limit) Table for 3SatimatiaEthe Lot P. rcent De fective . . . . . . . . . . . . . . . . . . . . . . . .

Part

f3J

I
I

EST1MATION OF PROCESS AVZSAGE AND FOR RZDUCEL AND TIGHTENED C3UTEINSPECTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B-6 B-? L-8 Value. of T for Tigbtenad k#p8!cti011 . . . . . . of Estimated k; P.rcent ~ts Defective far Roduc=d Inspection . . . . . . . . Value. of F for h4asimum Standard Deviafioa.[MBD) . . . . . . . . . . . . . . . . . . .

5?. 54 56 58 59

Table, : Table Table Table

I APP=dk B . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ‘iii

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xlL-mTb414 11 Juts 1097

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coNTmzTa-caitinmd

SECTION Part

C 1

VASliABILfTY

ZINKNOWN-~S LZMIT

METHOD . . . . . . . . . . . . . . . . 61 .

sU40LSSPECZF1CATION

kxmlfb: E8urlph 3hampie Tsblea : Tsbie Tabi*

c-l C-Z

Simsle Eauanph of Ckicniatidm: S~cificatiOa Umit-FOrm i . . . . . . . . . . Exuriplm of Cakuiati0a9: StnSle Specification Limit. Form 2 . . . . . . . . . . Mast-r Tabie for Normal qnd Tightene4 Inspection (Form I_ Siql. Limit) . . . . . . . Msst.r Tabls for Reduced lnapecUorI (FOrml-SiOgl. LImlt) . . . . . . . . . . . . . . SPEC1IVCATION L3M3T . . . . . . , . . . . . . . .

63 64

C-1 c-z

6S 66 b7

1“

Part

u

DOUBLE C-3 C-4

Exaf+em: Ex.mple Example Table,, Table Table T.ble

Example of Caleulxtioms: Doubl. Sp.eUi catiem LiniIt-Oae AQL value [or Upper and tiwer Spocifieu40m Limit Ckmblaed . , . . Exunple o{ Caiculaiiom: Double Specif{ c-ion Limit-D4ifar8st AQL vahm. for UpPer u8d Lower SPRIcZflcacJon LImitm . . . A.hmI.r Tabl. for fdmnul .md Ti#hte.ed ~P=c~a (-ble Limit 4 Ferm z _ Sias!e Z&nit) . . . . . . . . . . . . . . . . . . . . Maater Tabl@ #or Reduced lmpectiom (Dauble L&nit Fown&Simgle IAnIt) . . . . Ttile for Ectinmiinsthe Lot Percent Dekctive . . . . . . . . . . . . . . . . . . . . . . .

69 70

C-3 C-4 C-5

71 7Z 73

Part Zu

ESTIWTZON OF PROCESS AVIXfAGE AND cRZT3ZRJA PVR REDUCED AND TZOHTSNED INSPECTION . . . . . . . . ., . . . . . . . . . . . . . . . . . . . . c-6 C-7 C-8 Vaium. of T Ior .Tigbtmmd h,pecticm .“. . . . . z-bits Of Eotiated kt S%rcemt . . , . .. . . Defective for R.duced Z.cmp.ectioa Value. of ~ 10, M&um Awe ra~e Rsn#e(w) . . . . . . . . . . . . . . . . . . . . . 80 B2 84 85

Table.: Table Table Tablo

.,.
APWIUUB SEC7WN D C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . WWN . . . . . . . . . . . . . . . .

VARZASZL3TY

P8rt 1

SZNOZ.E SPSCW1GATZON3A3AZT D-l

ST

Exmpleo : Exumple

&urnpZm D-3. Ttbim., Tabic Tmbb

ZZxampta of Caieubtlms: Siasis *c4fkati0n Z.imit-rofm 1 Si+e Example of c+IeuidzioM: Smcification ZAtaia_FOsm Z

. . . . . . . . . . . . . . . . . . . .

89 90 ,9I 9s

D-l D-Z

d Ti#btened Msst*r Table fof Normal Zzmpoeuom {Form 1-Sk+ Umlc) . . . . . . titer Table [or Reducmd tJ1.p~=tiO_ (FOrml-Slr@*LimitJ . . . .. . . . . . . . . . .

1! ~.——

.. . . . .,.— ....=_ “-

comzNls-cOfmffwd

P*T5 u DOUBLE 5PECfF1CAT10N LlhffT . . . . . . . . . . . . . 95

3hampfe*:

3kAmpfe Exunple

D-3 D-4

Esampk af Cdctdationw Double SpecUication L6mit-Oa* AOL vahm UpPar and fmwer Specification. fAmit Combirmd . . . . . Double +pecUi Emmple of .Calculatioms: c-tion L6mit-D3ffereut AOL value- for Limits . . . . UpVr d kwer Specification Master T*le for Normal and Tightened fn. pectim (Double Limit and Form ZSimgleumlt) . . . . . . . . . . . . . . . . . . . . . Master T&ble for Reduced 3nop.ctiom [Ooubk Limit..d Form Z-Single Limit) . . . . T-ble for Estimating the fat Percentage Defective . . . . . . . . . . . . . . . . . . . . . . . .

97

98

Tables: Table T.bla T.ble P*rt Ul

D-3 D-4 D-5

99 101 103

SST1MATION OF PROCB AVESAG!C AND CSJT&R3A FOR REDUCED AND TIGHTENED INSPECTION . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . D-6 D-7 Value. of T for Tightened frt. pection . . . . . . Limit- of Ectinutod IAX Percent Defective for Reduced hmpecfiom . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

104 106 108 110

Tsble#: Table Table

APP*6

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mlL-8’m-414 llhfislm? INTRODUCTION Thi. Stamdardwa. prepmred to meet q growing IIeeo for tbe U. of standard ptmm for Jampection by vari*ble. in ti~rnmatn procurement, DIIpply and .torage, and maintenance ia.pciion opa ratiozm. Tbe variabf.. sampJ&s in@e quality characteristic which can be rnea.tirmd on q coattnplane .pply to q q xpressed in term. cd percent de fectiue. The tm.. scale, and for which quality i. q theory unclerlying the developrne.t of the wari.bte. .aniplim~ plaua, including the oparatiq charact=rimtic curve.. a.awne. that rnea.urem.mt. of tba quattty char. qcteristic q re independent, identicslfy di.tribufed normal random varisblea.

q u’npliq

I

..mpfing pfmn., warlah!es umpfiag plamm 1. comparium with atfributa. dvanta~e of ummfly remdtin~ & cmmide rsble .avinem in #ample q ihave tbe q for .xmnparabl. a..uruice . . to the correctness. of decision. in judging . .in#le quality characteristic, or for the .arne sample size. greater a.mirance is obtained using variable, plan.. Attribute. sampling pfan. have the advantage of greater simplicity, of being applicable to either .ingle or rnuttiple quality characteristi c., and of requiring no knowledge about the distribution of the contlaueu. rn. a.ur. rmenc. of any d the quality cfur. txeridc..
q rm mot to be um.d It 10 imporfsmt to mot. tfut variable. .amptfmp pha. i.di. crirninat.ly, ,impfy bec.u.e. it i. po..ible to obf.in vaxi.bk. tnea.urarnemt q .smnp,data. fn conmlderq appfieatlon. where the rmrmatity or irtde~nde.ce dvi.ed to cm-..ult hi. technical agency to tion. may be que.ticmcd, the user i. q detci-rh in. the fe.. ibility of appfi calion.

Thi8 Srandard 1. divided into four .ectimm. Section A describe. @n. rat procttlur. a of the .amplimg plan.. Secfic.m. B utd C de.crib. .Pcifi. procedure. pplic ation. of the .arnpIing plan. when w.=iability i. unknovr., In Section B and q of lot .%and. rd d.vi.tion i. used .s lh. fn. i. 10. an q .timat. of the the .stirn.te unknc.w. variability, and in Section C the average rams. of the sunpf. 1* used. Section D desc=ibes the plan. when variability is known. Each of Sectiono B. C, and D i. divided into fbree part.: (l) SAMPJIIW PIUM for the Single S~cifieuiom Limit Ca.e, 111)Sampfimg Plans for th. mubl. Spcific. tion Limit Case, and (3JJ) Procedure. JorEsthnation cd Proce.. Average and q rid Reduced Ja. pection. Criteria fer Tighmned ingle s~cification For tba q cceptability trite rio. i. giv=n im two foran.: Form 1 amd Form Z. limit ca. e, Lhe q ii-ici they q rc idettticti a. to .ainple sise -d Either of the fonnc may be u.ed, q cceptability or rejeetabilify. III deciding whether w u.= Form 1 deci ion for lot q or FQrrn Z, the followin~ poiDt . should be bo=n. in mind. Form I provide. the lot qccept ability cri~. rion without q.titn.tirtg 10I percent defective. The Form 2 101 Theme e#li acceptability criterion require. emtirnates of Jot percent defective. verage. mate. at.o .r. ~quimd for e stiznatbn of tha proea q a q Operating Characteristic Curve. fn Table A-3 how fhe r=latioa.ftip betweem for the quality cbaractari.tic quality and percent of lot. expected to be qcce~able inm~et.d. A. stated, the .e Ope rating Characfe ri ‘tic Cur-. are &sed 011tbe raadanalrom a ciorsnti distribution. ..#urnpiari that meam. mment. q re .ekctedat unpfin~ plan. in SectiW. S, C. ~d D w. m mstcbed The corre spending q closely ., po.. ible ~der q .y.tem Of fixed .unpfe .Ise with re. pcct to their Opcraling Characteristic Cu?wes. O~raUng Chsracteristjc Cum. in T.bf. A-3 h..= been computed for the .mpling p]an. b... d orj th. ..timate of lof .tudard deviation ef unknown ..ri.bility, Thy are eqully .pplie.ble ior .arnpllns plan. and theme bam.d hoed on th. averaga range of the .awIpI. of unfmown variability on known variabUity.
q.

C.rtaim cln..cmri.:ic. concerning the sunpliag phm. in S..tiom. B amd C -d tbosa la S9ction D dwufd b, moud. Pkn. baa.d on fba q mtima& ot umk=09m Wariablllty require fe~r .M@e wit. for cm~ra~e . ..”ranca -baa tb q d. Mate of lcM .taadard tiwl.si~ i. “..d than _bg. ib .~..ae rua~. d ffn .-+ in u.ed: on fhe ottwr tid, plan. Vsbg the .W~.gG r~ge of the #AM@. r.quira VII

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of the Iactor f to com~te the maximum average range ruige of the MAR. i. multiplicuion. regarding q imphr I I . the q rnple wk.tng bDOwa w8rIAbuuy.mb61v—414 11 June 19s7 compuuttmm.neral propplicable sectioa for detailed iawtructiom cedure.e. .bfe . lot accept. but doe.t The user 1s. deviation or q verage range of the q q t=ctively.re. deviation of un. md tables for [he Barnpliag plan. The user should become funiliarwith the g. tba roquir=mw.dditina.taa~rd Table C-8 provides vmlue. mot guarmt. &d dIvimion of mwnbera. ymbols and their definition. Plarm umlnn bm=variablltty -qutre con*l&rablT f-r sample tmk far comwrabk amUJrMC* tbaI q ich=r of the plans whw =TIabtuty of k#umII -rkbiUty Is q q rtnsent am. . . .I and 11 of tbe spplkable the . uf Part..ection.tia. ions. or q most. of Sectian A. usin# planm for “ke t wariddlity. The MAR qor. The computathmm irwolve simple q rithmetic operation. give. U it is Iem thm the hfSD or MAR. cornpu. Tath B-8 provids q values of tbe f~ctor F to compute tfia maxfmum standard dewiation hfsD. . 1s uakam: @we wer.pecific.ew m a g de for tbe magnitude of the average do.ed .. Tba edmate of lot qtmdard ave rage range of the cunple of unbam mpk.arimtdUty. the taking of q . dvised to co. the qnmplec . hslps *O immure. and refer to she q q pccific procedure. SimifArly based on the q intimate of lot . ba. q re gimn III tha a-ix to Part JU cd the AU q h Ulumtratim of the com~tiom and proc.bn.milt MS tectalcal~uc~ bdom WPIYLW cunptiaj piano U.quare root of q number. bfllty. The hfSD se-s M q ~uide for the magnitude of tht eatirnate of lot standard de-scion when u-in Plazm for tbm double spcff ication limit c--e.~ed IIJ applicable #*ctim. qubtractio”.durma .unpling plans i. such am . limit .

u. q component of an end product. The unil of product may or may K. a qet. d. A 1. th~ number of unit. that iudeme.ing or m. A criticaf defect i. tic .fectiv-. . pecti4n is that characteristic ef i unit of p.oduct that is actually m. Standard are qpplicable to the insPcof a tfon of q chgfs quality cbaracteri-fke lox of prodv. requirement. such a.auatiorx Number of Aefectivea x 100 Numbs r of dtm . called herein q . t and axmrience indicate coule reeult . A1. c. or the end product itself.4) with the appkabfe requirememla. of defect. wbcontractor or vendor. or in8pcctien in. supply. A3. to determim conformance with q given requirement.t.~14 11 Jmfe 14s7 1. the entity of product in. tic (See AI. Tbe percent d. and aay cbu~c Defects the reto in the contract or order. or bolh upper and lower . reme.PT89. b Specificaticm Limit. arid th.< a PrOCedUr* *h*ch q units of product from q lot which q re to h itmpected. or.~acterimtic of q Ii%.~cifieatiem ~cificmion limit. ns. tiw pro .4 Unit of Product. drawiags. rion Xor aecepfabil ity of the lot.Z Percent f%... A2. I Mtthodof Cia8sifring~fect@.xcted in order to dew rrnine it. 1’ A1. .ificat. of measur. I A3. AZ. ormateritlly reduce the usability of the unit of product for its intended fmrpobe. and main fanaace fL18pection ofm rattom. hundred. Tti A’3. ? III*PC ction.. defects may be plkced k other ciao. be referenced in the specification..~rement may be exprenmd q prc~f ication limit.f. or q t destination. the q rmine ratio. h q .1 =. PERCENT DE FECTTVE co. or 6 lower pacification specification limit.7 Sampli. thaf coutd result in failure. t is recurd. 0. Asf8m .tic divided by the tataf number of unitm of product And q man multidimd by on. Tfm se pfwm may be used whether pracuremrml inspection i. Al. upper req. when . Thim may be a single article. 1. Thi* q n q . CMtfO_ of pro dues 9fnff e$fcnt of nonconformance be expre-scd i. set forth herein shall #ovem. measurable quality charq cteristic. The q peclflcation Iimtt(e) is the requi rerncnt that q quality characleri. A3. production. Expressed Percen: rkfectiv8 . testing. . d according to their irnporfaace. SECTION GENERAL Al. of praduct de fectiwe for that cfuractc ri.e or operation of th@ unit.rn9 unit~of or famba. however. A major defect i8 a defect.5) on a unit of proeuct i. “or unssfe conditions for individual. or thipmer..5 Quality Characteristic. Inspection by AI. riatic for varxablee in. cril.t. CLASSIPTCAITO?f OF DEFECTS unit of product. iwheo. aircraft.“.. peciiies the rmxnber c.ppfyuad stora~. d.c. km’rmd at the plant of q prime coatract?r.~ Plans.88.in~le limit. measured on .a. . q product. m. uzed. AZ. ships.n al defect. . q othe rwise comparing the “unit of product” (See Al .u. of the specifications.cale. A defect 19 q deviation of the unit of product fr-am. a pair. . A 1. other than critical. SCOPE DESCRIPTION A PLANS 1’ 1’ OF SAMPLING Thi 8 Sammkrd =stablimhes All Pur +’ mmplnng P anm and procedures for inopec ticm by variable q for use in Government P*. And q rneamtreme.0 signUi CUIt bOa CinI OrI the effective u..t be the sune q s the unit of purchame. pound-.t”i.ppli cabfe this Standard #hall. ct that could prevent fmrforrnaaco of their tactic-i fumction.q deprfurc atandard9 hating . A2. inspection wherein r+ specified quality characte-ri.cc inspection op8rati0rIm. terms of percent &faetive.r.1 Critical Defeeto. Purcha.2 Major Defects. s. cs.. I. lnmpeclion i.imaining the product.e da~cripfia”.. of the unit of product claasifi.3 Minor Defects. hazardou. called herein a double q limit. A minor defect is on. gaging. variables i. . formajnr end it. Of NO.3 lnspcctiby Variables. -S90 may be uaod when AppTOPrU1O in -d q ppfy and storage. and rnAJltetts. per.feetiwe. that doc n not materially reduce the usability of the unit of product for itm intem&d from qstablislmd Purposa. continuous feet per sec. The unit of product i. xamining. or i.. I.tructic. and the provision. etc. Sampling pfazm desipated in thi.hould meet. normally belong to one of fhe fOllO*g classes. ond. A sampling pfan 1. contrzct. The quality charact.

c ial Reservaticm for Critical CharackrnB1ic8.a particular value other tb& tivme for which oamplhg pfanm q re furniched.athm ified. q unF41rtd plans. material br imapc:kta ddf be detennh. The . tha mm’lfmr of unttm of prodsamph aIws uct drawn frcan q lot.taadamf de rf. f.nt re. Urdesa otkrwi.Pcif ied for q sbigle quUity characteriatic.i. cd product of q .wel arid for lots of given sise .F MIXED VARIABLBSAlTT21BLfTES BA?APLJNG PLANS 8 -- ..2 Dr. two affa mativo met+. .ions of this Standard. baaad ombaowa 4 provide 8 q bvariability.1.uppfier fos critieti etir. Table A.pectim l.vo. fmcftan bared = th Umpacthn romiito of pmeedinc lots are provided in Part uf of dactiorm B.d~tb.e q pcffied.00 parce.. A4.. or cornpo.2 Choice of SarnfAim Plain. method and tbe rinse method.oeiaf. The 8ampf4 sise cod= Iette r“depcitds on the. 1. of a double q for limit.atmd h fbs comtraet q biprnellt. Standard ffied value of the AOL{S).i#r. The tsrrn . it dull he treated q s if it wore mfa2i0c equal to the WdUC of AQL for which q and which i~ bcluded plms q re lu-whed within the AOL range.ingla type. Grtain numeried vaftws o.dure awrage @ criteria for ticbtaned and re dweed in. UnItc of ttn munfdo Aa2i be. q -d=rd dewiafim method b-n variabiUty. of product from which q sample is dram! ad inopec~td to dete rm”me complhrme with fhe acceptability criterion.. and D. SunpUaB ~D u!d PIWCEOU-9 a:e pro-dad in d8C tion B if Variddlity 10 uabnown amd the . size. -’ i. ol product drawn from . Tbo lot Immedlafelyafter GOvemirnent timo rcr:rvee tht right to qampfe fo~ criticmf d.04 to 1S. q defect is fouud.virtcpecti~lot.e. ff~e-~ I I A5.ariabUity is bnown. ~Ass. •f=ctiOale=J~: L U. or order a.iwt of unit. These . and may differ f rem the quantity de. Each la.. d product in q lot. the standard dowiatio. C. and in Secfioa D if . . There q m fiva hothe rwhe q pecffiod Ia-fmctien Ieval IV shali unple . Mk+m+la lx Jlfffe 1957 — .—.ptabiu~ criterion Iqiknitid qbility of a lot of Acce Sabfiity The qcca@- q for q 8tLmatfmg 22n preeomm Proe. AS. A sample 10 om. AS. f.errm’i.wimB of Samples. IV. The lot q im 1.. Tbe Go. un. . A7. criticti da fects. . or mere unit. muaida of bath up~r -d lower specification Umita. Ad. r. lb acc. con.wm thrn refr~ is fo-d to contain ow or more. A7. SAMPLE A7. When the •~c~ted AOL i. I LOT ACCEPTABILITY Criferien.ctc evm ry let aubmittad uppUer arid to reject any I-* if A by tk q sample dr. tha number of unit.2 Specifying AOL1 c.Itafl be . I SELECTION Determination of Sample Sise. NOTICE-5P.1ov hall nmmn . of percaat d8f*c value q tive .hdl be obtained from Table A-2. t-e AOL value. .safity.1.. For tha case of a single cpeeifiea tiatl unlit.ve: and the lot q1=4. tbe rmhl to in smct emryunit mbmkkd hy the . 1 Acce@abZc QUALITT Ouaiil bwl.pec Tbi. which i.al~ct. A6. . fU... a. . e. bared on the e qtfmaia of im qfattdard dovi.1 . q s far q mla practicable. A5.d izi. q ith. Retati~ q m Aesimated by cute letters. enri.c uad to reject the remainder of the te!rimko.rred to .d withO* re#ard to t?bdr q. shall.ho~ m Table A.d byum of ~ of the . SPECIAL PVOCEOURE POR APPLICATION .2 Lot Sise. Tin particular AOL vafue le be used for q q ingle quality charq ctarimtic of a given product must be qpeePcifi. The q cable to the . ranof AOL VUWi.nt am qhO-a i. itkn manufactured under e.. Whe. d Farm 2 (for the 9ic@e specification iimit case) Aaif be used.e cod. for the upper limit and another for the lower Ifmit. ampliag plaa.to be used in q yovi.i in farm.h. atioa and the die r on lb am rqe range of the t-fate. the pP2yihg the AOL.ampling plait. ACCEPTABLE A4. A5. om.. fn the CM. . q lot for prod”ctlar. -d v. LEVEL q Tba =a CBOmlnaf xpr*s. or Ether Purpo. . I lat.Unpl.uion mathd is !mwd.pecified. r an AOL value it #PcUied the total percent de fecti. h Soc ticm C U variability i wunbaewn a?id the range matbod i c uced. AOL r=~img f ram .. letter applik used. lot. a collection of unit. and the q ceef=ablfifv crl terbr.Ily the same conditimit. gssde. are specified. o.r.e. fn the Iatfar can q m provitid. A6.inq=ticm le. SUBJbflmAL OF PRODUCT A6.1 Formation of Lots.pcifi.

oximta Condltlon A.*: ca~qsi!iv.*I.fic. 7bo lot com~i4s cca*bllIty variab14 q q terlm of section B. I I a — . ‘= rm~arded by implication or otherwime q in mY m-e r licerming the tilde r or any otha r pcr*On or corporation. ibility or my obligation wbtcoevcr.Z. Ilmlt(al. 1 U Condition A ia not qatiefied. warrant tb= mttributem •ara~i4is Camdltkm ttn apprsprmta with crl - tbt Other condltiorm adst u.1. or In uIy way q q wcificationa. Z tO meat tfM . mmlready q unple.. Caa6itLm B.pecti. 1 in.r data q re u. pm. of Samplirtc Plans. C.*tL. pro.o r .I i i q lu q ttrlbcuaa prwid=d for -Wunpumg tbOM h . no re. C.m rel=rred to dures for . The Ist cmIPU*s of +tb pragrapb 11. coed iri accordance with tk q tt tibute q oM’l plirig plan to meet Condition B. rights or p rmis.T=tih A-S I I tin Miad w8*bl9Dphmm bon18 ad that az-t W#idk. fnspectioa ttribute. thm Lbit.. .pactlom by Attrlbut8s. tbe A9. ‘- qcceptabif ity crita rkm of bAIL-sTD-!05. A9.t of nqutrnmentm. b..Z Mind Variabla q -Attrib* tion. CodltiaQ B.on .ernnteztt may have form. demad.mom 07 s. f. of q previo.4.3. or conveying any u**.5 Se=rltY of Iaaopaetion. of a . ion to m-nufbctufe.2 lf Condition B ia not cati.1 Select M q ccorduaca the vsrlableo #vnpliag plm with Section B. or other data (* II@ t.a e ki. in ~mgpcction of q q q ddition to inspection by variable.everity in ~rarraph A8 are net qppficsbl.arlablac*-.mtity of product which 1.ao ~o.Z. or D.&.d States Gow rrunent tbe=aby imzur. i. I* inwpectkoa wbardc. O. .] Amptm wwI&mc. inm~ction. pplied the qaid Lrswiags. ‘.attribum.lied.Pclfication A lot me of mcdm Ui* q ccef%abi the fouo’wln’ Comtitiem.latd. the lot doe # not meet the 8ccepabilicy crlte rian.c-bili~ ~ q M ctihmtie. A. tinnd varimhle q -attributes inmp8ction arnfie by stt ributa q .2 Definition.e4 tar UIY prmme other than In connection wltb a definitely relamd Government procurement opa ratloa. for mixed Vaziable. NOTICEWhen Gouerrmtemt drawin#. or qell aay patented invention thu may in mn7 =*T h ra~-td tbreto.2 A9. A9. The A9. tba unit by q of product is Chsdfied simply m defective or mandcfectiwe with reapact to a given re qtiire.IWXiZ creemlng proee q m Ikatlan ltmit(s) by q q f rmn q Iarae r qus. or othc. A9.. not being produced wltbln tba .rnimbed..4. and the fact that the Co. SPedfiCatiOmn. q lnmP8c A9. W tbm produ ct cubmittod for iaapctioa IS q mhctod by Ch #Upfli. The proceu f m. before . att YiS -plmg plan qelected in UCOdUICe with thn stall h fcdlovim~ A9.3 Selection miaad *arlable.

300 3. .80 4.10 ).001 to 300 500 800 1.39 6.79 4. m 4 .5 0.0 801 t“ 6.0 1.40 7.09 1.164 0.165 to to to to 0.65 2.440 to 0.00 11.--.10 0.64 2.301 to to 10.109 0.15 0.200 8.4 10.- .5 1. va3u.eI a236q WiIhin mmu r-got — 0.ZO1 to 15. abze when the indicated inq ptctim levelw are to be “med.O65 0.700 Ie 1.i.699 1.04 0.5 501 to 4.lloto 0.050 0.99 Use thh AQl Vazue 0.ror spd56d A03.070 O.000 Et DFH_j C32GIK DFHJL I EGIKL FHJLM Gl HJMNO Lhi N ample .049 0.e code letter.0 3.00 to to to to m ““” 6610 m Be&c 1JOIB35DF31 111 to 180 I 181 to 301 to Z.9 to 16. given in body of Uble q re appli.0 8.Z5 0.439 0.40 0.000 2z.Z19 0.65 1.Z80 to 0.069 0.

I mL-sm-414 11 Smn 1* TABOpraCinC Clmr. . 4 I -.si.ete. for Sun@iD* D Plan.tic A-S CtMW9. of t%cti~m B. C.

3 OPERAllNG !! a I — .k.f W 4: A. “.llnl ) ii! ..lld* iq.o. +ti 0“4!.wlty “.TABLE CHARACTERISTIC CURVES FOR SAMPLING PLANS BASEO ON STANOARO OEVIATIOM METHOO SAMPLE SIZE COl)E LETTER B I Cures * m?l~s p-i bed ml..V1.

——.4 -0 so 10 30 40 w M ‘m 00 w 100 .. . .3 oPERAnNo WARAC7ERISTIC CURVES FOR SAMPLING PUJ49 SASEO ON STANOARO OEVIATION METHOO . .— ..—— ——. TABLE A.

.U%RATINO CW#fWTERISTIC ii~ CURVES FOR SAMPUNO PLANS BASEO ON STANOARO OEVIATION METHOO .

.. bed m mm.I.3 IYERATINO CHARACTERISTIC CURVES FOR SAMPLING PLANS BASEO ON STANDARD 0EVIA710N METMOD SAMFI-E SIZE CODE LETTER E I b.do”t 1 w bo ‘0 # 10 -0 IQ 30 40 w w !m a 40 loo M. * t9#wq pm.ul 44. I.I.dti q *9k“- ._ TABLE h . - I“tpn.. rq!lmo m- Ut Is#.1..”l* +. m “. 1“1. ”. . __— .W.----- .—.

”(++ .1. “ * “.19..3 OPERAnNG CHARAC~RISTIC CURVES FOR SAMPLING PL. ! OUAU1’V 0? W3Mt?lC0LOTS I 1.uk.- ..tWllrdcfhh-lMhh -rw.. 9A..o .. m..O.”.t! 7ASU BASEO ON STANOARO OWIATION SWR_E SIZE cow LETTER METHOO A. b./.+”.d m .md 4. ) .td ) 1 ..t”b. F :.NS [ corm f“ S*...bm. -94 nM-#An....- hl-.u. d Iuo9 k .4 9.!1. .#t“?wI.- . .

edI .3 OPETiATING CHARACTERISTIC CURVES FO+7 SAMPLING PIANS wu F I Cenfh. SIZE COW $lTER .* TASU QASED ON STANDAm OEVIATION ME I MOO A.

..3 OPERATING CHARAC7ER15TfCCU17VESFOR SAMPLING PLANS 8ASEC ON STfi?!DLRD DEVIIITION METHOD ii SiMFLE G I C.d w <a’. “.IM •.lld+ ~.nl ) S1ZE COOE LETTER :~ * loo Ri 10 0 _— .W1.n.v96.B IV .*..TABLE A .l. . p!ru b.bflllr w....i.~ l.

. OPERATING CHARACTERISTIC CURVES FOR SAMPUNQ PL+W SAMFLE SIZE CODE LETTER G ( Con!lnwd) Ii x w OUUllY Or SWMlllfO 10U %.bl.-. -d hv.k. I B-m.+. 1“910 1. I l___ . TMLE 8ASE0 ON STANOARO OWIATION METMOD A. m”. ( h pod tihdb. .

“. ..+ wI..”.. . b.d.IA ) SIZE CODE LETTER “ .blll!..“i.sd m .h.@h... .. 44 W4 know.* ----TABLE A-3 WERATINQ CHARACTERISTIC CURVES FOR SAMPLING PLANS BASED ON STANDARD OEVIATION METHOO SAMFtE H I tiwl & .

3 OPERATI NO CHARACTERISTIC CURVES FOR SAMPLIN6 PLANS BASEO ON STANDARD OWIATION METHOO .. TABLE A.

.lNO PLANS SASEO ON STANDARD DEVIATIDN METHOD SAMP.-E S1ZE CODE LETTER I I hi la st+q tlmt k..lrd ) A.d m rm~.wI*WI.TASLE CURVES FOR SAMF1.1. u. .m. AA -t h. m e .lhlb H.3 OPERAllNO CIWACTERISTIC -a .

TABLE ON STANOARD OEVIATION METHOD A -3 OPERATINO CHARACTERISTIC CURVES FOR SAMPLIN13PLANS BASED SAMPLE SIZE COOE LETTEfi I ( Contllwl ) ?s ...

. h.d m m.w I f Cnns for ‘u#l. ph..* k-l . qw .. “Al+ b+’.TAME y A-3 OPERATINO CNAIIACTERISTICCURVES FOR SAMPUNO PLANS BASED ON STANOARO OEVIATII?N METMOD E!j SAMW J SIZE COOE LETTER ?& * O.. “.“lMI.

.bill* Um “.—— I TASK CHARACTERISTIC CURVES FOR SAMPLINIJ PL~NS SAMRE J lb.1...3 O~RATINO I I I .-II* Iqwdmf ) (Conm.. AM##Lu..... k M@”.n.O-l.td) SIZE CODE LETTER 8ASErI ON STANDARD DEVIATION METNOD A . b.t Is...). .

bdll.”1.... w. b.4$ qulw. 4.. 2 TABLE y 3 Sf+@LE K { C-w..d m ..1..* “a h.. 3 OPERhTINQ CHARACTERISTICCURVES FOR SAMPLING PLANS BASEO ON STANOARD OEVIATION METHOD g“ !! + !3 ..... * .@q ...W.1.1”1 j SIZE CODE LETTER A. .

.wz .o..9 q ***W+ +!”. TABLE h .t~) { -t b *I p-t h-i m lul\s “4 i.1-1 I ht.w~ . m- “ bm+tl.3 OPERATINO CMbRACTERISTICCURVES FOR SAMPLING PLANS BASED 0:1 STANDARD DEVIATION METHOO SAMFLE SIZE COOE LETTER K ( Cennn..1“.ul.-d .“. ~. dmltt.!. 1...

dn4 -8 invul. cud!+ WIV.TA9LE =!5 CHARACTERISTIC CURVES F(XI SAMPUNG PLANS BASED ON STANDARO DEVIATION METHOO :x SAMFtE S1ZE CODE LETTER L t *8 fWt }1b-d m m.blhtj w..lon!I A-3 c@ERAnNo 1 f .

3 cmmo ..d ) A.o TASLE CMbRACTERNWICCURVES FOR SAMPLING PLANS BASED ON STANDAR5 DEVIATION METHOD SAMFtE SIZE COOE LETTER L t Con!h.

u(v..b .9. ..~.“.A...nil.. ou4m of WBulmo ?& I.npwl.h h “01. c“.s 4 419!?IM-..* hnwm vwl. 1“ ...!. O@.. 8.... m.M } I h. .* $.. .ANOAROOEVIATION METHOD SAMPLE SIZE CO@E LE TTEII !4” .% f.blhl......q.-.: .hns b..w. ) “.. ... f. Lois [ h .remtW...TABLE :!E ~f gln A -3 OIWMTINO ChARACTERISTIC CUfWES FOR SAMPLING PLANS BASED ON ST.w.. ~y Cm$ a Tli+n*d -W!* 9! 91UW * - * mmaItofbl.!h.nwdl. .d m ..... .ll....19 ul ...

. .. 0“.1.9 k+.. mb9md d b.sa ?0?snplhl. .llo.! 1...TABLE A -3’ OPERATING CHARACTERISTIC CURVES FOR SAMPLING PLANS BASEO ON STANDARD DEVIATION METHOO SAMPLE SIZE CODE LETTER M ( Contln.1.0 604 “d i..d ) I W-.t.... il “ q lnwm Wm m. of WSM171C0 1.- .ptm! 4.bnll. L“..079 { 1. ..s b-d m ““..I * .19.rl. 4. “m!h!lf @!mlWd) .*I h+. m+dall?--dtiwr-eh etiti—rti-1.W.l.. ~.. “..* - I .

. -d 94e h .d m . ”l.1..di. M*.TASLE A .t.4 bh -=@-nM-h.“l.th. “. dm#w9*s!h**-t.. b . 4 4M”MI. aumm or woumo w.tq ~. ) thl*....” .....h. .3 OPERATING CHARACTERISTIC CURVES FIX? SAMPLING PLANS BASEO ON STANOARD OEVIAilON METHOO SAMFtE SIZE CODE LETTER N f I&w. - LOU I I I. “Ihd -4 t.udq .”1 .”. Auvl. I “.l.*). “-”.b..bl. nw. 0“.!..9wwnl8 .!1!.b9.”... b.. . t..1“..*..

..m TAGLE A. S OPERAllNQ CHARACTERISTIC CURVES FOR SAMPUNG PLANS GASED ON STANOARO OEVIATION METHOO_.

t-mm.-.w . $. TABLE ON STANDARD DEVIATION METHOD A. .3 DPERATING CHARACTERISTICCURVES FOR SAMPUNG PLANS BASED SAMPLE SIZE COOE LETTER o i G“.4 m . .ar. 1“ a+..bdlt... .....Im.. 44 W.

.d m r9ng.*d) I Cnrm fw “w-q PIM1bm.v“i... .1-l I r5 .4M -4 k.3 OPERAnNG CHARACTERISTIC CURVES FOR SAMPLINO PLANS BhSED ON STANDARD DEVIATION METHOO SAMPtE SIZE CODE LETTER O I Contln. -—— TASLE A .lhl~ qll.bill!... “..— -—-—-—.

.. *ml*4 1..t.qll.. 3 OPERATING CHARACTERISTIC CURVES FOR SAhiPLINQ PLANS BASED ON STANOARO oEVIATION METHOO B W +.~.”1.. *4 d M k ..“ -w..!... 0! unu “.. .. Owl. kr@. .. ..o”.. .i TABLE ~15 gi SAMFtE S! 2E COOE LETTER P t C4WW8 t..+ b!.. &.. **ti .... I MA) f.cu vwl.+ ..b!. d lb .. 4M”MI* 9UALIT7 Of 9u9Ul~D LOTS I 1.. .. .Wcmld It.w..f.d m rq...btit+.TI d. b..-....w...Im.1”1 ) : !/ d: A. t.l).. L...fbti .

.l.1 In... -. 0..1. L“. Wdd-b@--dak$*Mm OUALIW Or SWUl17t0 101S I 1.-I )Iul W m Ire.1!..1..-?-abb ---**”O--*..1 lb.lnl..3 “ lbdat?l-wddbf..r..“kbllllj “.. “oatId+ tq.. I.—— _ _ TABLE CURVES FOR SAMPLING PLANS BASED ON STANOARO OEVIATION METHOO SAMPLE SIZE COOE LETTER P ( e--m 1.-. nw.. “. ..lh. k~..! ) I Conllnwd1 A ..m$ #.... d -4 i“.....

1....MI..*W .....}..bb -.. flpt .”..“i.l.. IWI~ L.4 m f.x. I.......ANDAR0DEVIATION METHOC A -3 opERATING CHARACTERISTIC CURVES .bl... -.woM*ubal -04 d a k * d 41. l.!M! ) a mmkuilm~tibl..m. .I W. 01. b. _“....~.blmy “... .+.pl. k. TASK RA5E0 ON 5T. ...”.. f.$. 1 OUAUW OP $uBMITrCo LOTS ( h .TV. d.) W.W ...wh”.FOR SAMPLING PLY SAMFtE SIZE cooE LETTER Q I Cuml fw t.”9 .1.1 I..

hly “.whb. TASLE BASED ON STANDARO DEVIATION METHOD A..... .S... ... .4+ w@vdcd I ) f- ..+*.d I h.d 01 .. .bin..3 OPERAllNQ CHARACTERli~lC CURVES FOR SAMPLING PIANS SAMPLE S1ZE COOE LETTER Q ‘( Cm fln.. dti mm. b. ....

1 Acceptability Criterion. TtIt following quantity . 3hrm the M &es not meef the •=e~llity criterion. proviaionm of S. the lot meets the =cc~tiIf. p-.c in q ccordance uc. tbe lower specification limit.Z for reduced imspeetioit.. LOT-BY-WT ACCEPTABILITY PROCEDURES WHEN PURIM 1 LS USEI? B3. Z. t31JM3tMRY FOR ~~MNG PLAN OPXRATION WREN FORM OF s m The foLIowfnr ‘soP* =~u. . part Of th.pect to the quality charae%eri.pc. whh plani for q oingle ape . pArl Of the Standard deocribe. the q . d. B 3. +ere U L X . whsther the lot me=t.nd B-Z. B2 SELSCTING THE SAMPLING WHEN FORhf 1 IS USED PM BS. Tbeoe are identified as Form 1 -d Form.n A. 1 Maater sampling Tables. . 1.unt.amplew q hall be drawn in accordance -’th paragraph A7.] and tighter. Th e .pccfion leeel.** (X-f-)1~ ia l. M.ecode lti ter from Table A-2 by uming the let sise and in. Corn tatien. SAMPIJNG PLAN FOR SPECIFICATION LXM!’T I B DEvlAnoN SPEUF3CAT10N LUA3T SINGLE Thi. deviation tic i.cnple qice cute tetter.)/a ia equal to . qusntity (u-XJI* or fl-L)/i. of Sample Size Code B1.I method q re Tables B-1 . B-.ar gre8ter tlun k. To determin. correewmt ple size mentioned ia pnagraph B2. ff (u-x)/m or (x. -riaingle specification bilit~ -MI for ~ q limit vben using the ctaadard deviation Table B. B3.qof Samplem.3 BZ. Generai Description of Samplmg Plan. and de. B1.-. 3 Determination qzce cod q letter q ~. the procedure* for us. .eo. mllowed: •~marise ‘he PrO - (1) Daterrnirw the sxmple .e 8d Cc.m=d ler norm.tandard method ia u#ed.1. -Iue.W1 be judg. unknown q nd the .2.2 Accepu bility brmant.. Table B-1 i. Tbe degree of conformance of q q uafit y cb8ractericti c limit with respecf lo q single specification .SSCTIW VARIABIIJTY uNKNowN-sTANDAmf Parf SINGLE S1.. (x-L)/.mnpl.haff b(“-X)/’ . e in %hi.. tk upper specification limit.gtotbemundility corutaaf k. . ~ qper or lower limit.ed iriapection art< Table B . ii. 1 The m q ~nociafed q sampling plan i.i. .. t. ia indicmed in the column of the nuster table cor re~pmxling to tbe applicable A(2L value. The acc. entered from the fop for normal inopecfion q nd from the bottom for tightened inspection. i.?. given in two equivalent iorm9.pendiagon whether the specification limit i.-d th. B 1. The .1 Use of SamPtinfl PlaJw. .-. eptability COtI. B 2.1 Sam Ie Sise.2. Z* *O abifttywmst-nt k.. . Z.f. The acceptability criterion i.ifiution limit when variability y of fhe lot with re. i.fty criterion: if (U-X)1.2 Drawi. Th= muter qanmlmn tables for mlana based or.st. The #ample .2.. B2. Standard. the sample mean.ise qhoum m tabl .mm Uu8 k or nerative. Z Obtaining the Sa?nPlinK PIan.smpla ha be selected from Table A-Z in q ccordance with parasraph A7.fing ~ t e ma.tirnate of lot qsn&rd Acc ability Crite rfon. the q ccept ability criterion with respect to q particular quality cfuracteristic a. the applicable campling plan shafJ be uced with lb.tig plan cons.i.. Sampling plum for reduced inspection are providd_ in Table B-2.d by th~...2.1 q .ud AQL. in .1.. Cumpare the B3. AfI . obtained from Mater Table B-1 -..unple .rlatioa..

135. inspect q nd record the mea.d from tbe top for normal inspection -d from the bottom lo.. from Mamer or B-z by . 1...fc.unpl. q P.umrnariz.unh of the q (4) Cmnpute3h= sample mean X arid the ectimale of lot . Ex_pie B.rnng step. if q lctwerspec iiication 1.1 is ittdicated in the column of the nm. mnple mice n is 65. (X.iz.L)/t if it is a Io-er Jimit L.. the Sampling Plan. unit. Tab)= B-1 size n and cpecifteation limit.ter table . mAllow8ble Percent De feeq llowable p.pondiytg to the qPplic=ble AOL value.ed in. The rrmxim. the 10I meets c. (3) Select q t random the #ample of n unit.*ified.ific.. (6) Det~rmb-Ic the estimated lot pereent de fecnive pu er pL from Table B-5. Tsble B-3 is used for normal a“dai~htened inmpec eion and Table B-4 . =live M for ample img to the .ampJmg tables for plans based onvariabil ity unknown for a single specification limit when using the m~nd-rd deriatitm method sre Table. B6.ixa n attd the maximum allowable percent defective M.xxre.mpIe mean ~ and dcvistic. W.a cemplete q xample of thb. estimated percent defective below the lower . [e. for q k. th. OF 2 3S the pro- mple .Ize and maximum alk. B-3 i. U PU Or Pl.ng product outsidt the upper or low+r %. or the q thes the (X-L)/.f=~tiin d the upper specification limit.wer . tcr table cortespendin~ 10 each sam>le ... Iorm. q re the q mean q nd e. of n (3) Select at random the sampl= lrorn the let. lsghter. snecif. .=. Z Maxim.pe. The percentage of Macoaforming product is cstimattd by wiieria’ T~le B-5 with the quglity index and the sample q ize.ta”dard devfatian . L)/.ts of .timm e of lot standard deviation.. ma. Z GE-I utatio” of Qtufit ~-lity~-X)~rnpE~ if the specification limit i. prOc*dure. B7.unple size m=nt ioned in pa:agrmph 95.ed. inspect UId record the m. peetion.: defective PU or PL i. . q a upper limit U.i=e code let (1) Determine the q ter from Table A-2 byu. lcIr reduced inspection q rm prov-l d ea . (5) Compute the quality index Q Jfi: limit (U-X)/ * if q n upp. the if Pu lot rneets the acceptability criterion.n .~ the .r reduced. ~a~.tie. Pk.MIL-m-414 11 Jt333e 1957 (2) Obfai.. ent det$ve.... B6. ing the lot size md the inspection level.. (ha--. B 5. eqUf to or leas thn U.w=ble percent sn q ssociated da$eclive. or OL . SELECTING THE SAMPL3NG WNEN FOfUd Z 5S USED P2AN -ii-t-d P. B-3 q nd B-4 of Part If. lot doe’ rwtmeel Iheaccepttii lily criterion. obtained by enterina Tabk B-5 with Ou or QL and the q ppropriate q anple size. ter .. Tbe q stimated Pc*. frmn the Iof.1 Acceptability Criterion.ept.e cedure.negative. then the 10: does not meet \he acceptability criterion.pecifi catian limit. .Z Oblainin~ The sarnpli”~ plan co. obtained from MaDter Table B-3 or B-4.. Sam -li>g plan.bilicy criterion: it’ (u-X)/. .4 Acceptability Criterion.=. for an u per specification limit V or the q~ntity lids 3. respectively. SIJ71SMARY FOR OPERATION SAMPL3NG PL. A-L)/. The samplin~ plm i.ngle specification hall b.eleeting the sample the ac.2. L <.. to be fallc.inspection.k or negative. (4) Cmnp.AN WHEN PORM USED The fellc. :38 . equal co or greater than k. T)M q q hewn m the ma.unple ..?. Gmpare the estimated lot pereent deIectivepU or pL with the maximum allowable percent defective M. ss. z for .elecfi. or OL = (x.ptabill$y constant k. . arnpl. (Z) Obtain plan from Master T=ble B-3 or B-d by . i. or by ?z. code letter. cm each . X q md s. em d.peciticatio~ 15) M the quantity (u-X)/s or (X-W.asurernemt of the quality charact.tn q stimate. The dc~ree of conformance Of a quallty characteristic limit with respect m q ai. 336.. lot qbove ~e S35. Tabl. correspond. Th* quaatitie. rimic ample. B5. or p~ is greaier than M or if Qu or Q is .1 h4asccr Sampling Table. Th. judged hy the percent of rmnem-. i. urernem of she quality characteristic fer each utiit of the sample. ed. and estimate of lot sts”dard q ISO compute the quantity (u-X)1.e ~-. =nt=.te the s. r .2.1 Sample Size.u.

pt~bil$ty criteriom if PU Or PL meet. required.. From Tables A-2 q nd B-1 i! i. mince (U.9 k f2mpare w-X)/O with k 1. The rn.timated lot percerndefective PU Or PL i.s3 1 8 9 10 II lZ of Lat Standard Mean X: ZXln Limit Specification The quantit~ Aecept~iIity Acceptiility (upper): w-X)/c &natant: Criteriozx [209 . Table B-1 See Par&.: 197.205-.t. ml meet the q criterion. e: Information n IX Needed Value Obta{ned 5 975 Explanation Sum of Z. submitted for inspection. cd.195)/S .435 . Line . the =ccept8bility equal to or greafer than k. the lot cc. to be u. . aee : that a marnplc 01 sise 5 i.: Sum of Squared Correction Corrected Variance Estimate Sample Me.. B3.Standard of operation for q cer:aindevic.timum temperature A lot of 40 item.81 S. .125 310 Factor (CF): (I X)z/n (SS): s“X~CF (975)2/5 190. the q~ntilY ~-~)f~ *rii=. obtained are q . pection Z-evel IV. (V): SS/(n-1) 77. 184” . . if (~-Ll/* in is ingle lower spcffieat{on limit L is given.3 The lot rneetm the .53 1.5 Deviation .: fi 8.. i. mum .5.@.?09” F.m.125 310/4 -s 97515 Sum of Sqmre. normal inspection.S.11ow.. ccepmbi r IIY then the lot doe. than the maxi.dlowable percent defective M. 10 be determ%nea.-sm4l4 11 Juoe 19S7 fi) ff the e.. Suppose the measurement.pecifi. ~)/s is ~remt=r than k.1 I 95 u 209 1. the lot meet. Zn. i. with AQL = 1-% i..Mu. ~ud to or 1.59> 1. <c. EXAMPLS Exmnple Single Variability ExAmple B-1 of Calcufatio. ureznentn: XX2 190.d q . and ZOl ‘: and compliance wfth the acceptability criterion i.cceptabiltty NOTE: criterion. 10 -d com~re il with k. 188-.— 1 ~ 3 4 5 6 Sample Si. the q is~reatertl.s Limit-Form Deviation I Method Speci!icatlon Unknown . fhen compufe If q s Iin.ur.190.435 190.an U Orif QuOr C3~ is aepti e.iQn.

%.. it pL is equal to 0? 1C*S lbn M.32% M 2. the lot meets the acceptability criterion..435 190.Standard Detiation I CUmple I The maximum temperature of operation for q certain device is specified q s 209” F.125 lX~CF 310 77. tion.205-.4 ‘ercen’ .32% M.4@I<. 13 Mean X: Specification O~lity ‘“t” Mu. A21mv=ble Percent Criterion: . 184. Table B -5 B-3 B6. M2~-414 11 June 1957 Single Specification Variability Unknown Limit-Form .ize 5 is required. with AOL = 1% in 10 be u. (u-x). and compliance with the acceptability criterion in to be deter rnitied.V.een that a sample of .5 Deria:icm . ! .435 .-.59 % De:. follow.ined 5 975 190. lower specification limit L is Siven. Inforrntiion Sample Size: n XX 1X2 Needed Vmlue Ob:. normal inspecA JOI of 40 items is qubmilted for inspection.ppome the measurements obtained art q . urcme. Compar.81 S. . and 201 ‘.19% < 3. pu is 1.: (CFh (IX)zln (SS): F=ctor (975)2/5 190. D’*”’ 8 9 10 11 1?. Acceptability T3U let rmet.!. 2nspection Uvel IV.nati. ‘f Limit au 2ndmc b’ (Z09-195]/8.: M Pu vilh q6nce Lime — tkpl .3[ Mea.Z.ta: Sum ef Squared Correction Corrected .-—--M . 188-.190.ed. then compute the quality index OL = PL rnth (X-L)/s i“ line 10andobuLn the q .-0 tti NOTE: U a sin@.1Z5 310/4 J-7X5 97515 Sum of Squares (v): of b: SS/(n-11..19% 3.. Table See Para.: 197. Standard ZXln (upPer): .A-2 and B-1 it i. From Table.n J z 3 4 5 6 7 Sum . Estimate Sample Measurement.? Method . M. S.: fl 8. the Compare qcccptablzsty critarion.81 195 u Z09 1.timate of lot percent defective p .

98 + . 2.98 1 v 1.12 1.62 1.50 — .51 6.07 1.72 t.14 7..24 3.61 .06 g I 2.18 I.72 — 2.15 1.42 1.67S .80 Z.35 + 2.70 1.Z4 i.41 1. When nample sise equdt er e=ceedo lot .53 2.17 2.00 2.05 I .1 J K L 2.36 1.89 — 1.886 .64 2.48 1.874 .1! 2.10 l-k $ 2.1s 1.00 k 15.13 2.47 1.45 — 1.53 1.86 — 1.93 1.44 2.73 1.18 1.69 1.65 I .54 2.. [Irst tunpllq plan belcw q rrow.03 1.00 2.765 .27 2.50 1.47 I 2.33 2.33 .065 L --t2. both sample OIZ.96 2.29 .s0 k 1.969 2. 1:::. 1.43 2.55 2.47 2.819 .65 T - .34 1.4o i .46 1.ZI 1.66 — 2.77 — 2. lot must be inspected.?.33 1.5o 2.96 . .946 .24 2.61 2.72 1.00 m k .82n .4s5 .— .723 .51 1.50 k inspection) 4.80 1.l 5 1.31 .69 2.14 2.23 1.26 ! 2. 1 2.. .V.10 .58 2.25 L 5. I B-1 Standard Deviatiom Methc.? .393 .07 1.69s .9 2.fVela i I 5.77 2.61 1.? .955 1.03 1.50 2.65 ?.12 1.00 lightened inspectio! ~~ .58 .03 2. for PlaIJs Based on Variability [Single Specification Limit– Form 1) Acceptable ( Sample size code letter Gik .51 1.7s5 .341 .18 2.746 .55 1.d Unknown I TABLE MIster Table Far Normal &.145 .8.91 1.66 2.97 — .71 2.617 .65 1.1[ .03 2.5s 2.CVCIS (normal m k 7 1..84 2.936 . that is.03 .07 2.29 1.2.15 A21AOL wdue8 ye knpercent de-a.ao4 .26 1.50 11.14 1.58 2.0( — AcceptableC alit.15 2..71.67 1.00 k .45 .774 .516 .00 2. pectlo.39 1.00 1.814 .90 2. 1.51 2.31’ — 2.99 1.25 kk .70 4.79 1.41 1.65 ).53 1.tern hth.00 10..11 2.35 1..0.85 .88 1.42 2.30 1.? 1.50 1.83 i — 2.566 .V .845 I 2.11 2.69 2.89 Z.86 1.4 N o P Q 2.36 2.958 1.?.04 2.73 zoo -t.971 1.22 2.40 allty .3) 1.40 2.98 — 2.92 2.39 1.15 k .01 I .61 2.73 1.85 1.89 1.17 1.664 .58 — 1.d Ti~htened fn.00 k +k B c D 5 7 10 15 20 25 30 35 40 50 75 100 150 E F G 34 t — 2.84 1.3.24 1.12 2.41 2.47 2.611 .6.08 1.2o k 1.S as well ao k va2ue.57 1.29 a.65 1.6o 2.40 1.76 1:76 1.?.917 .18 T .3?.04 1.841 .09 1.

that it.24 All AQLvm3ues q re in percent defective.958 4. T N 0 P Q .11 1.Z4 Z.?.4Z Z.— 1. 1.0.65 — . .96 1.712 ..566 .50 k .00 k .15 — I.50 1.11 2.50 z i Zoo Z.36 ..Z8 — Z.30 1.341 . lot .917 .51 t 1.IZ — 50 * Z.393 — .50 1.84 1.675 .98 (.06S I .50 k .— I Whertaemple oize equal.114 1.41 1..8Z 1.Z4 — .14 2.946 1.51 1.zl 1. both mm-qde nize no well •~ kvalue.90 .455 .936 .00 — Z.165 6.755 .:.)z z.12 1.79 1.566 .. k —.34 — 1.536 .!5 — 2.69 1.47 Z.03 1.n Litnit-F.914 .40 Z.874 .958 .33 1.TABLE 23-2 “Standard Deviallm Method ~E Maater Table for Reduced lnmc.16 Z.LZ4 2.08 2.40 1..11 Lzo Z.61 t-t Z.17 1.72J .61 1.tl..95.46 ..45 —.62 1.664 — 5 7 10 10 15 Zo Zo 25 10 Z.611 II .47 Z.— 1.58 z.g plmbelowtrrow.33 I ..7Z 1.955 1:01 1.91 1.t t.958 .4Z 1.15 k -L — 3 3 4 x . size I m D E T G H Code latter I .04 uality Levelo . e.09 I.12 .7Z .84 —— 1. f2rotdunplln.65 i.40 —. .35 1.80$ .695 .9a — 1.91 :.01 1.986 .141 _— .23 1.41 75 -1-d 1.ectimfor Plana Breed On Varlabilitv Unkmwm (Single Sp’c.lz I. lll”.ZZ 2.lz 1.10 .765 .Z6 2.lz I.11 Z.Y5 -i1 J * K L u I Z.58 k 1.Z4 1.828 .9 1.00 1.9a I 1.$8 2.01 i65i k .141 . or exceed.84 !.m i“ the .27 — J+~~ 1.mpetted..566 .73 — 1.14 1.165 .51 1.55 —1.6S 1.41 1.47 1.96 1. 1.80 1.23 1.141 .617 .51 1.72 1.85 I 1.— .07 1.69 I.828 .58 — 2.ifi.— k — EEE l. rm I ) I I SampIe I “Ac Sunple size .15 1. ~~.06 Z.75 1.53 Z.76$ .lz 1.36 2.695 .86 1.11 — Z.91? .564 .8z 1.

for plum based on variability . The sampling plan to be q inspection shtil be ob-iaed from WSter Table B-3 or B-4.pe cification limit. B 10.10 in shown in the COhmm of the masto the applicable ter table corresponding AQL value(s). contbi.ien q re provided io Table B -4. dding The eotinute p Zhmfzbe determined by q the corresponding ectinuted percent defective.pec. If one AOL is asci~e 3 to both IiAt. A sampling pJa. U L X s is ia is is the upper specification limit.arrml.3. The percentage of manconforrn img product i. B12.sign=d to each . PF w. The aualitv . U different AOL.h QL and f)” md the sample q isc.J”WS: B9.1 Acceptability Criterion. unknown and the standard deviation method is used. Table B-3 i.1. . civ. for the Icxmr.— consists of a .tiuct..i~ted by p~. B 11.hafl be judged by the percent of r.ize.ample . Ita estimate +33 be de.p.ize mentioned ia paragraph f39. with the provisions of Section A.. de.“kt-mwn for a double specification limit when using the standard deviation mctbod are Tables B-3 and B-4. be selected imm Table A-Z in q ccordance with paragraph A7. The . value .arnple i.. tive(s). SAbfPLLNG PLAN SPECIFICATION ~ FOR n 3XM3’I SPEC337CATZ034 DOUBLE This part of the Stan-dard describe.timated by entering Table B-5 with the quality index and fhe’. the procedures for use with plain for q double specification limit when variability of the lot with re.1 be AOL value for Lower s’ ecxlncatson Lwm and . General Description of Sampling Plans. e. The master satnplmg table.Y .ze and the assoeiated maximum allowable perceni defecpplied i.e. T in accord- I Sample# shall ance with paragraph B11. letter. pect to m doubje m pacification limit .Part DOUBLE S8.pL and p“ found in the tible.Stze Code ktter. ificatiori limit.unple #ize o is tablas correape=ding show” in the mater tO each sunple size cod. and those in this part of the Stamdard.ed.3.ilh . be q elected from Table B-3 or B-4 m [C.) the applicable campli”g plan qha31 be used in accordanc. PUO Or P.52ptL upper .a~terms of the lot perc=nt deiecti~c. u. percem *. mad by M for fhe upper limft. of pert. The degree 01 Conformaa Ce or a WlA3ity elaaractcria3fc with re.o. Bfl. Samp3fng pfuu for reduced fnspect. -d P for both . B9. the Lat. TCI determine whether the lot meets the qcceptability criterion with respect to a particular quality characteristic a“d AQL value (. SEIJ2CTI?JG THE SAMPLING PLAN the maxfzmIM tiowable percent de fecfivc by ML for the lower limit.1 use of Sampling Phm. B9.:&-.onconform% P. A sampling da” .3.pec be determined by wIterins + q ble B. Table B -3 i.ed 10. cone letter .. and tkm estimate of lot standard deviation. .mt de fe.Pe. combined.&O ACCEPTABILITY . B9.2. me iadicsten cmifornunce with :::. upper. pee: to fbe lowez . q ntered from 3be 30p for marnul flupection and from the bottom for tisbtaaed fLlWpecffon. S q re a. or both .pecifiutio.cificacion limit. ‘w’ tively +f. normal and tighlened ir.2 M-.. 3 Obtaining Sampling Plan.. ACCEPTABILITY CRITERION SUMMARY FOR OPERATION SAMPLING PLANS both Upper umd. of a lot shall be cx~r. maximum allowable defective for #ample estinuLe. T h. the lower sp. The emtimstea p mid p r=.tllctiorl limit. AND OF B 12. ct to the quality cluracteristic i.hal. The .3 Pere=nt Defective i.ignmfe B 11. for each AOZ.hall.1 Sample Size. lima .n limiteombimed. . B9. Z Maater Sampling Table. corresponding to the sample . DRAwU?G OF SAMPLES be elected A7.imum Allowable Percent Defec. the sample mea.Pecifiati. 1 Determination of Sample . designate the timum Ulowable percerd d-f% by ht.spection amd T=ble B-4 for reduced impectiom B9.

tmer and lower . (3) Select q t random the sample .~t=. than the maximq llowable ptzcen% defective M.@al to or 1. fecfiv.Z. i. 3 {or ..1 Accernability Crit’eria.. ction level.ding rntimum allow. 42 . (5) Compute the quality QU = (u-X)/. 0? 1. not met cceptability criterion. eg where q t erenf AOl. the q B 12. L)/.*s than the larger ‘of ML “and larger of ML (c) p is equal to orlemmthanfbe q nd btU.MI L-STD-414 11 JurIe 1957 B 12.L)/a. Oblain the ample size “ q nd the maximum allowable percent defective M.2 Different AOL Valueo Lower specification Limit.then the lot does not meet both q re n.tamlard deviation s’. and P im . the lot meets the q ccepubi.2 SurnmaryfOr Opertiianal Sampffrt& Plan. fective M.rcem defective. *W Etimple Example xample of ibis proc.tirnated lot percent defective p i. respectively. if p is meet. ne~..n: B-5. A2eodetermi”e the combin.C. Imrn the lot: i.i%e q nd the iriap..llt dd ectives pL and PU with the cm? c. . p. ur.ntple fr.. correspandiag \othe percent defective* shove fhe upper and below the lower .in81e quality characteristic.izecod= letter from Table A-2 by twin. B. the )ot um cceptability criterion.tand=rd dcviatic. ‘(. d. 3n ca. corr=apondi.ampfe .. the q ur. +S.1.rcatt delective P = PW + q llowable p=rcent PL with the maximum qual to or less tfun M. and the maximum allowable percent defective Mu and M’. cmnplete q B. mple rnesn X (4) Compute the q and c.peciIscaticm limit-.dlowin~ corlt.fityc riteria. then the 101doe.pn. or 1..mither QL or Qv or botb are me~tiive. n unite (4) Compute the sample mean X and estimate . q the f.1 random the .1.@ive cceptability criterion. the following mtep. (5) Compute the quality Qff = (u-X)1. I Acceptability Criterion. (7) 11all tbre=of dition.?) Select the sampling plan from Master Table B-3 arB-4... than MII. the upper and lawer .d percent delec tive p = pu 4 p~. and OL = (x. ofhe=wi.tive. (2) Select plan from Master Table B-3 or 8-4.rn tie lot.L + Pu wfth tke%~#~fa?L qual to or Iesn than htL. q PO i. indices tdu.af “ unit. ittdice. ff either OL or Gff or both q re negatiwe.mrIple.: (a) ~ % ‘L. (6) Determine the estimated lot d.r. merit of the quality characteristic on each unit O( the amp]=. abf3ity criteria. value is Plan.. the q criteria. for Upper and (6) Deterrniae tbe estimsted lot percent defective ~ and p~. the q B] 2. equal ~] PL !9 =LNJ81tO 0.5 Gmpare th. equal tc.2 Summary lor Operation of Samplin# m. h. of (3) Select .tirnated 1 01 fJC. and QL= (X. M compare p = F. the lot doe. U . e.. cterimtic on each unit in the . fied. summa rize the procedures to be used (1 ) Delerminc the ample size code letter [rem Table A-2 by “sing the let . ia. If pf. the lot size and fnspectimt level.n s. Obtain the.pec ification limit for q single quality cfuract=r istic.pccifi cation limit combined for q .g to the AOf. fh= lot meet. th=n M Or if either W or QL bolhar. the following steps sunururi’e the procedures to be US=CL (1) Deterrninethe ample .timltc Of lc. P = PU + PL from Table (7) lf the e. then the lot does not tne=t tbe acceptability e=iter ia. BIZ. pe.2. ct and r-cord the mea. then the 101does not meet the acceptability criteria. =qu*: to or le.sp. able p.ize . not nwet the ace~. 10I . e the lot does mat meet the acceptability criteria.dure.. va2ues for the upper and lower specification limft. walue ~stablished le. In cases where a q ~lished for the . 4 Carapare the q stimated lot pe.t and =ecord the meas”remerd of the quality cfur. cceptabifhy are sati. t . B 12.4 lot a cmmpl=te exatnple of thfs procedmre. thll t3UII i.glc ACfl. otberwimm. 11p in q the lot meets the accepmb{lity criterion: if p is grcatertban Mor ii eifher Qu or QLor . and Mu.

re h 209” F. determined. s t~ M. below & La& Da f.125 310/4 m 9?5)5 Explanation Sum 01 Measu. E-+ i I I of Cdcu3ati0nm Ltmtt Zkuiaticm M. Ab0V8 U: L C3udity tid=: Eat. A-2 and B-3 it is neen that s sample of qi=e 5 is zequird 197”..: See Tablm B-5 2.nl (195-180)/8.re.81 195 Limit: LitnAt: U L 209 180 1..435 190. q nd cmnpliuw...32% P . 205”.bbnamn . 188”.59 1. normal in. Ante P s Pu + PL i.1 9% . Mean ~: Specification Lowe r Specification QtuIity Index: Qu . 43 — . Sum of Squared Correction Corrected Variance Estimate Sample Upper Measurement: ICF): (2x)z/n Factor Sum of Squarca (V): SS/(n1\ (SS): XX~C~ of Lot St&rd ~1.19% + .2 (7) ‘3& lot meet. 1M. Nlowable Percent Criterion: p = pu + pL 3.3. of Lot Percent Z)ef. of L9t Percen5 Est. 812.thod Specification. Pu + 2..mprst.180.(U-X)/s OL = & hf. Limit Cmmbined spa Mlutino ?..85% < 3. Pe. I . i. Stutdard and Lower AQ L Value far both Upper E-de 1’ 1’ Line — 1 2 3 4 5 6 7 s 9 10 II 12 13 14 15 16 17 Tbc minimum temperature of operation for a c=rtAtn device 48 speetfied 8.: with the acceptability criterion i.Z41L-STD-414 Ii June 1$S7 I 3SXAZ4PLC Example Double VariabiNty 0. L)I.2% (zo9-1951/a. fof30w. mcntm obtained q re 8.81 .125 310 77. 1=. The masimwnt.435-190.F.%Table B-5 (975)2/5 190.: SX XX2 Needed Value Obtained s 975 190.rcm13 hf.submitted for imopection. s 1% im to be .64% 2. Tataf Max. the qcceptability criterion.?0 % PL 2. A lot of 40 item..85% 3. wtth AOL. w b. 3nmpection Level 3V..pect(on. From Tablam Suppo*e the rne. md 201 -.66% See Table B-3 E81.1.5 Deviation s: & 8.d. Znforrnatian Sample Sise: n mant.4 Acceptability p~ with M Compare See Para.

en that . belsw k.85S [209 -195) /6.m.s9 1. 205”. Total E. The rnu5mumtempQ=a3ure ii 209” F. and Luwer Specification Example The minimum temparamre of optra3foa for q certiin dewice i. BIZ. rcent &f.. .of Percent Def.ot Stam&rd X XXln Limit: Sample Me= 9 10 11 lZ 13 14 is lb 17 la Upp=r Specification Lower Specification Q“ Limit: .5 Deviation s: fi 8.19% . of f. Para. (u-X)/o CluaIity 3ndex: OAity index: (ZL = (X. 188.81 See see Table B-5 Table B-S W75)215 190.435-190.esn 18(s).-. ... . B-3 B-3 Allowfahlc Pereent Allowable Percent Criteria: 9.mp=ctic. Obtain. BIZ.435 190. (b). f.70 U: ~ PL 2.19%.imitc DOnbla Spcffiuti. . Suppcme the measurements obtained is q.6W See Table T*1... 10 be determined. Blz.?% < 9.pecified q . below (s) Comp-rc @) . fJ/.n L=v=l Iv. Value. normal imW=CCICQI.3. Mu... 184”.00% 2. qcceptability criteria.mta: (CF): (ZX)2/n (SSh Factor Sum of Squares (V): SS/(n-1) of Z. PU ~ ~e lot meet. ad 44 . A lot of 40 items in subrnkted for inmpm=3ion. are aa follows: 197.5tsadard Upper AQ3. PU q pL Def.125 lX~CF 310 71. Information Needed Vat. tbE pL<MLsndp<LtL. DA q hove Est.p.1s0” 1.=n Vari&i3fty Different Uakm ior .s1 (195 -180) /n. 3.&4 Percenf Eat. z.180. Z.z(7 )(a) see Psra.m&6w14 11 Jone 1957 EXAMPLE Exampl* B-4 of cazcU2Mf0m Z.: p . and compliuce with the acccpt ability criteria i.. P. . i.64% 2.125 31OI4 m 97515 Explanation ~ 1 z 3 4 5 b 7 k Sample Size: n Sum of Mesmmements: Sum of Squared Correction Corrected Variance Estimate Meaour.80% (c)are See Acceptability See Para. •bov~ U: Def. sample of sise 5 ia required.f (c) Compare Wifh ML & MU ML PU pL p qbe 2. d 5 ZX XXZ 975 190. in Lot.F. of z.5% for tha 10uer specification limit is to be used..imtt Deviation Method l.19% + .--I* ACZL = 1% foI *= upper -d ~~ = From Tables A-Z and 23-3 it 2.80% c 9.bf+ Z.61 195 w L Z09 ..2(7)(bj S. and ZOI.Z(7)IC) •ati~fied.2. Mu.

TABLE Minter Tsble for Norm81 and Tightened tnapcction for Plms Blsed on Variability Unknown (Double Specification Limit and F.rm2-Single Specification Limit) Acceptable ~ .04 M M 7.59 v 1.53 10.9Z 9.80 8.40 1.Z9 6.56 4.09 3.97 z,03 Z,68 1.87 1.88 1.71 1.07 I.oz 0.63 8 0.41 4 “.25 0.63 7 .40 0.949 0.945 x 1.60 1.53 0.68 9 1.43 0.41 3 1.4Z I .00 z.71 Z.49 2,Z9 3.91 3.70 3.72 3.45 1.17 3.ZO 3,07 2..?0 — Z.05 0.447 Z.04 1.50 AcceMabilitv Qualitv Levelt (
qre inpercent defective.

B-3

S1and*rd Devittlon Method

t Inorm.1 in! qctim
I.00 iii~ ~ 1.50 M

Sample cite code letter .065 .10 M M M M .15 .2s .40

B 4 5 ; 7 10 v 0.099 0.13s 2.o5 Zoo 1.98 Z,86 0.155 0.119 0.110 0.17 9 0.16 3 0.14 7 0.14 s 0.13 4 0. ;3 5 .06 5 .10 .15 O.zo 4 0..294 O.zo 3 0.Z9 3 O.zzo 0.31 7 O.zze 0.33 0 0.467 0.7.20 0.Z50 0.36 3 0.503 0.789 0.275 0.401 0.566 0.873 1.z6 0,264 0.388 0.5}5 0,847 1.23 0.280 0.413 0.581 0.079 I ..?9 0.250 0.380 0.:51 0.017 1,29 o.2zn 0.165 0.544 0,846 1.Z9 Z.95 0.186 0.31Z 0.503 0.818 1.31 Z.11 v v 15 Zo Z5 30 35 40 50 75 I00 150 zoo 0.349 0.716 1.30 Z,17 3.26 — 3.0s 4.77 —. 4.31 Z.14 3.5s 5.35 - i + 0.422 1.o6 1.31 3.3Z 5.83 v 5.50 16.45 14.39

3

c

ZZ.8b ZO.19

29.45 Zb.56

36.90 33.99

D

E

‘Zzo
10.54 9.46 6,17 5.97 5.06 5.57 5.5B 5.20 4.87 4.69 8.9Z

I““l 4
15.11 13.71

‘0$0
ZO.14 18.94 Z1. S7 z5.61 12.99 “12..03 Z4.53 13.6311Z.571 17.511 ZL97

r

G

H

I

J

’47I

‘2’61 “024 I “s’
8.10111.871 16.651 Z2.91 s.091 11.85[ 16.61 Iz2.86 7.61 11.Z3 15.87 7.15 10.63 15.13 6.91 z.#9
Z.nl

K

L

M

ZZ.00 21.11 [0.32 4.43 4.40 Z.50 — ;htem 4.00 14.75 6.57 9.86 14.ZO 6.53 9.81 14. IZ 6.5o 10.00 15.00 insrmcticml -5 -. ZO.66 Zo.oz 19.9Z

N

o

P

Q

All AQLandtablcvsluet

a

,—

TABLE Muter Table far Reduced fnvpecclm [m Plan. Bared o Vsrlablllty thkn.awn (Double SpecU{cation Limit -d Form 2- StttgteS !clfic atim Limit) Acceptab = ..?5 1.50 3.4 7.59 7.59
1.59 7.59

23A

~
1.00

10

ample cite :xI* Iettsr .40 , -ii— I
M --

sample 81;0 ziI — 3 }.( t.. .— —

-j

7 —

=2
18,06 16.45 26.94

B

c
3 3 4 — — 1.33 3.32 3.5s 3.26 3.z6 3.05 1.95 — 2.95 ,?.00 ,1.9s 1.17 I .07 0.720 2.86 2.83 4.77 4.31 4.09 — 4.09 3.97 3.91 4.71 5.15 8.40 1.Z9 7.Z9 6,56 6.17 6.17 5.97 3.86 1.Z9 5.83 9.80 0.412 2,14 Z,17 “Z.17 Z.11 “~2.a5 2.05 — , 1.30 1.11 1.29 1.Z9 I,zv 0. I 0.228 0.365 0.365 0.380 0.413 0.363 0.467 0.503 0.789 0.581 0.879 0.551 0..977 0.544 0.946 0.ZZ8 O<Z50 0.280 0.544 0.846 ( 2 i. fllfl 0.s03 0.349 0.716 0.349 1.30 0.716 v 1.06 s 7 10 10 15 Zo Zo Z5 30 v S.50 10.9Z t 1.53 —

3

D

E

F

!
3.45 5.20 3,20 — 4.87
1.15 10.63

G

14.39 I 20.19 I Z6.Sb I 33.99

I

H

A a

1.

J

K

4-4-4-=
9.46 I 13.11 I 18.94 ] Z5.bl

L

I

M.

N

o

1.11
1.6o

Z.49 Z..?9 —

-=l=t+t1s.13 21.11

All AQL and t-ble values qre {a percent defective.

_l-1-LK

0,330

Jy:a,

first ounpllng PIU bdow qrrow, that is, both #unple oize a. well m M value. “When cunplo sise equa2@or exceeds lot e.e~y item in tha lot mumtb. in#pecled,

I

— .—— —. _____ _

TABLE TSWO for Eotkmtlq M#thedl th~ &t Pe, CCIII Defective U#lnS Standard Devl.ilon

B-5

mdard Devlaiion MQ~hod B-5-Conthed 1 . TABLE EZ k!’ Thblofor E!tim....tlng the tit Percent D*(ectlve U#lng S.

..-.. TABLE B-5-Conllm.. .. . . . .wd Deviation Mathod Table for Eotlmatlag tbo bt Percent Deltctive Usln@ S1-d~?d .

J TABLE E Deflation Method k F Tmblcfor Eotlmatln[tho lmt PcrcerIt D6fecllve Uc@Stmdard B-5-ContlnueU s . i. I .

.— TABLE Tatdo for Eattnutlq tho kt Poreant Def*ctlwe UOlag Standard Derlatien . .—.. E .Mothod B-5-Cadimed a “ -“ “.

.fmtitmad whn tha c cti wmpidmd from tfm matid pro. ..3 Tishtaa8d 311spectioa. b order to e. Zimit i.tirnate tbe lot percent dal. lisnit. ‘i. 52 . iw mad from tfm fable. qS a=rage p is se q rifbm.07s + S. imdf. -. nated.tinnted ce.ti_t. p = p .3 of Form L 7FOraXUnP18. L)/a...sk . @em pus.verqe. cIuded only once in q qwr.wmfmrn a .50-0 q SMPZO SCM SO.d lot percent defecfive t. Sr*pb 3511. It the qtulity index OIJ or C3L< a negative ‘numb=. been remtbmifted after prior re&cftcm.r.mtt.. Table B-5 i.kd from f3M for q immpe c.lmed.p.+ PL.or pL 10 mot obta.ip. tbi.. ~ mrquir9d b •ccor~ wttb pr. the.submitted inspection.odmeficm pre.. e decig.7 .L2 Uoubl.. Qu d 0= sti ba e-vu-f.- . iMpactiOn. (hnputmtion of the Est5nuted %0. c.sM1 b. fimit.tinuted lot ~rcenf defectivep’. Th. The qtuf It. obtafned br mzbtractiq the PCrcenuge found i m the” table from 100%. esti5fah*d campfiag tightened.BIL. ction *.cfian Thts S-*rd pfam for normal.3u15 be exeluded frmn the q . cmdr.atfmafed atm t. dfotiaguf.uft. i. eatitrmt. i~t=d by PU -be..uft.enzered q the eor--mpmdQL d the -unP5e qiae.. peetic.”diti.IuI p. .= Of d=~=rdaiag and the ~rremmondtnsedmtid 1c4 +rcud &fOcfiw ~ & p=. cafled the proceoq voragc..fic mea. Spectff~tfon ~ 1.h=. .rin~ the c.am q v8r ~s=. 1. pect to an upper q PL w. B 1 ~.ML-rm-414 11 J5fffa 1957 Pmrt m C5TZMATZON Or PBOC= AV~E REDUCED A35D TIONTU4CD B13. of in. The c &timated Iof percent defecfive q .amptia~ iit. eompufed wifh pee fficatier...pecfficatio. B14.e of . d=. the etiimated procem q q =rage $L it tbe arithmetic mean of the individual q ctfaut9d 30t pareemt &facUwa pL’8..peelot.mpyte.ph B14. tba quality Ucea QU tiler QL shaff be cmn~ted for q ub lot.d w+fh rc.cficm 1.4..3 d n14. entered bvdimrenardins the negative . l%. and reduced B 14.ttrnmted tot perce. ESITbfATfON AGE OF PR~ AVBRAND ~TER3A =PECTION FOR The qverage percent defectiwa..1 Ahn.tely wlfh ~ and Tabfe B-5 i. tbe “octl mafe of 101percextl &feetfve pu.nragm When Form I -Sfngl. of samples dr. peet to a double . r.2 uuf B6.cf in accordance with ~rag..duc8d LrJsp. rm. .d for tba acmptabfflty criterion.pecf to q lower . fi&ated lc.-respectively. of inspection ef product _ufaetured under . D 13. AD. TI~btarnd h. = 1. for the purified number of precedfq up...3. DUCED IkBP33CTfON AND m- q.. 6tmitarly.60.2 ~. b-cd for origfnd = group of let. estimated procem.ie.~ B 14. pro-. f-i---.. 74*.t defective.30. us~ P1. SpecW. tba c0ur9* qhaff be fisbtmnd er ‘r.-. The eatimuted proc. average .v9rity of iacp.muft. .P=c.t percent de fecfive above ftm uppa r limit or below fbe lo=.sr.2 -as Of hmcuon. Originaf imspectimi i. B 13. of the individtuf c. UtImI Limtc.~t*I. the firm im*pecfiOn Of qbmttted ~ -~cb? ety of p~ cceptability a.. ‘h.pu’ c. 9 ~-n -P* 69.q =rmean of fhe . q . U ~ .f.93% = 69.rmA R.071b.ed on the standard deviation method.. by re. The . ult. t e q r thmetic ‘~ ‘h l~t percent defective.qa .timated from flm r.M a. epar. c. 3%. Tbom ~e: C3U = (u-X)/c md QL= (X. =K= i. NORMAL TIGHTENED..Z.) B 13.fuU be .iustinuffag lb pxocem.PU = 100% . q poetfon qbalf b. md by p when computed with re. d.a.termIned from Table B-5 for the pfaim ba. it i* n=c=a~=rr to complete paragrapba B6. ef Uw prw. avera~e.2.etive. may be othetwf.. Wetfon 31W Mrnuz tirncttan D9rtm.. Tbe ectinuted proceco q vcrage ~ i* * ~ifhnwfic meaaef fbe fad3vtdual e.fmordertoewtimate the proc. mot” typfcd of . computed from b . of product wbfch ti. d fag ~ and PL us read f mm the t8ble..3 S cfal Cam. d the pxecedtms ten (10) lcIt.

=crnrduue with Kr=zr&pb BIXZ i..peclio.eragc D.. Condition F.in.re provibd in Section B. Or 15 Iots. Condition G. Qther condition. 10. The preceding ten [10) lot. B 14. I q teady Cad6tfon rata.tinut. . .pectiom. 1. 1 and U. q Condition E.5 Sampling P18m. irreguI~r or delayed. d that q ll of the following conditionare qatiofied: Condition A.verage computed from 5.vid..& 04h*r rlwn bar of lat. igruted) and nom have been under nornul ia.e NormmI inspection shall he reinstated if the q ver-ge of lots und=r . I: I .. A lot i. rejected. (Ot .. The T vdttbs q re given in Table B-6 far the procea. Condition B. i~ted) 1.tated if any oaac of the following condition.8 tkmn the AQL. . Tightened Or Reduced lmpecthm.I II preceding ten (101 108. ~? ~brrmt that normal inspection . -d when more than A c=rta~ number T of of flx percent dethem lots have e. (gee Table B-?).d preces. Sunplu-ig plan. Reduced ilI. Condition q . TM emtimated prc. XIL-STD414 11 June 19S7 b estimated lot percent defective is eqtnt to =ero for a q pedfied number of conmeeutiwe tot.4 Reduced Im. . de. B 14. de. io 1=. ior tightene d and reduced in.. or km =ertak .hould be reinstated.pecticm .pection may be inmitumd prc. The e ctimated percent defective for each of theme preceding lot. occ..uch other mmnber cd lm. PrOdnctiM is qt a Normal impaction qhall he r. c.timafes fective sxceediq the AQL. Uthe appUcable lower limit shown in Table B-7. has been rejected. tightened i..arnplirIg plan.prction is cqud to or 1. ra undc r reduced inspection. Part. .cem is greater tham tbe AQL.srestcr than the AQL. Production become. (or .

5 10 1s 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 io 15 5 10 15 5 10 15 5 10 15 15 i5 1 9 4 1: 4 I I 1: .wshm9.MIfA3TD-414 11 Jwm 1SS7 Cuve] Z.: 11 4 a 11 : 11 1: 4 a 11 4 a 11 4 8 11 4 e 11 : 11 4 1: 4 8 11 4 8 11 .. 4 1: 4 1: 4 a 11 4 a 11 4 1: 4 8 11 4 8 11 4 1: 4 a 11 4 8 11 -4 a 11 t49mbar Of bta 5 ‘0 5 10 15 5 10 15 5 10 .-.— 4-a “8 11 11 pluu prwuad la thio Staa&rd M far Unse code lctirs 9mp31a# dAO1. —- ..5 4 6 8 4 10. / M I 10 I mm q re m 4. .0 15.0 4 : 9 4 1 10 4 1: 4 1! 4 1: 4 1: 4 1. 4 8 11 4 a 11 4 8 11 L 4 6 a 4 6 9 4 6. 999910 44 7 : 4 8 11 4 8 11 4 s 11 .

unmlTP514 11 Jrmd 19s7 TAB= vdtms of T [or B-6<0nfif=d TiKhtaud Impaction sUmdard D8dmnua U8fbd Th.=. fi-re ~ ‘e Ti@encd ia.. the ~ddfe preceding 10 let. fbe preced~g 5 10C~.=. Or 15 Lets is srester tbmn th= xiveri wdue defective qbove tbm AQL from the precediq of T in lhe table. 10. 10t@ .da tba AQf-.ch ilock refers t. r of lnta wltb e~tfmates of percent 5. required whom tbe numb. N1 estirnatew of the tot percent defective are c. and the boftom fipre to the preceding 15 let-. top figure ia . -. ad tbe pro.btained f rem T8ble B-5.en~ average from them. .pection i.

011 .?6 .5 I 2.000 .2.50 -.00 & 10 — 15 5 E q q * q [25]** [18]** [14]** [11].009 .24 4.74 10.38 5.087 .0s0 .es .043 .00 & 10 15 5 D * [ 9]** q q q * q [31]** [25]** [18]*.66 4.81 .000 .50 1.040 .44 1.369 .3 .40 2.50 1.002 q = .65 . .001 .113 .00 6.50 Z.315 . .00 .00 .50 1.00 & 10 15 .S0 .19 10.010 .136 .071 .15 I .396 . 1.03.00 4.07 15.021 .4> 15.063 1 ..50 & 6.00 A 15 s 1 .133 .001 q . $ -14.039 .40 .96 10.05 3.00 .36o .00 A 12.000 .— —.00 A 11.248 4.077 .65 .25 Acceptable Ouili!y Level.123 1.98 10. .018 .6.000 .65 4.037 .00 A .00 L 10 15 H 7.03.09 15.49 1.?.50 Z. [13]*O 0.64 3.014 .003.005 .909 1.47 15.88 2.10!! .10 .. .006 .089 .06 15.003 .06 I0.266 .000 .02s .00 .5o 1 A 1 .020 .169 .121 .041 .006 .521 1.2s .00 -+.59 6.016 .231 .3s .00 A lZ.A + lz.054 .029 .s0 6.643 1.000 .39 1.017 .011 .40 6.317 .74 1.14 1.00 & 10 15 ? .750 1.65 .214 .33 2.00 4 Is v .000 .23 2.& 5 10 .pection sample tll* code letter . I .151 5 G .000 .31 1.002 .81 6.023 .050 .00 .A 1 15 q Th=i* mrc no mmpliag plain provided Anth!o Standard for these code Ieltero and AOL vduei.s .1s .027 .s0 ).78s too .010 .51 15.012 .65 [ 1.69 15.48 2.003 .5 .50 A Z.00 tool 5 F q 6.083 .550 .10 I .1 .50 1 7.00 i 9.00 .013 .00 10 I .00 h 5 10 J .0s2 .004 .062 .002 .50 .509 .0 [ 1.80 2.96 6.057 .24 10.653 1.14 2.002 1.306 .00 .40 10.40 4.963 I .74 9.000 .005 .56 4.123 .111 .000 .04 I q 23 [ZB]** [IO]** [lZ]** ( 9]** * * q * I c [15]** [IO]** q q q q * [45]** [II]** q q 5 [22]** [ 7]0. TABLE Slmdtrd DevIa440n M!thod B-7 I“ :: Llmlt# 01 &#tim~ttd Lut Percent Defective for Reduced Za.185 .002 .50 & 5.146 .00 .50 .101 .29 6.143 .04.84 2.00 i iO.>06 1.029 .11 z.431 .40 T5.50 4.47 Z.50 1.310 .49 4.445 .146 ..77 15.94 4.044 .

50 .00 A 5.?1 1.00 A 5.1!38 .038 .065 .8.98 10.91 1.099 .50 1 5. 10 1$ 5 8.-—___—_ .08 6..025 .075 .199 .108 .2s 1S.300 .008 .064 .025 .01s .oo & 14.24 4. rcducod inspection for sampling PIMC mmk.? .00 15.25 . la sddltlon.00 & 13.65 ‘ A .10 .05?.50 L .5 1.6.134 .276 1.414 . 3.50 a 9:22 Io.03 15.069 .49 1.00 & 0 .00 b 1.50 4 a..?.102 .25 .25 .40 .01 4.15 .10 .577 .19 4.04 & .50 8 ~.00 3. in Pmt 223 of Section B.345 .235 .52 4.215 .25 1 .14J .1s .017 .00 1.101 .00 & K .50 .40 b . N.017 .19 15.50 . 10.989 1.296 . TABLE Standard DevlaIkIn M.012 .65 .005 .50 i 5.0?2 .038 .00 1 10 15 .00 L P A .0 6.25 .261 .50 b 1.040 .00 k 1.5 5 10 10.2)6 . the m5dd2* figure to tho preceding 10”lott.50 k 3.108 .596 .25 .039 .z9 I 0.00 & 11.157 . .00 A Ml AQL sad t~blo values.10ts.15 15 5 10 Is 5 10 15 5 10 15 5 L .022 .210 .082 .483 .96 6.76 2.36{ .525 .065 .04 .36 4. snd the bottom figure to the prteedlng 15 loto.065 A .507 . or 1S leto it Reduced 6nspectlea IIWY ba Sr@itoted when wary atlmtiod bdow tha flpr* civm tn the tabl*.5._ .065 .40 .07 1s.03.011 .621 .085 .799 1.00 A .ObJ 13.00 A S.50 & 3.00 A 10 15 5 1.961 1.0 15.064 .oo & N .. “ ~ F r? s ~g q ttlrmtd lot P rcsnt defcctivc!from the preccdins S.00 A .830 I .00 .40 .9 .—— —.50 10.137 .091 .065 .10 & . fa qach block tha top (Igure rofcrc to the prccedlos 5.13 2. N1 q aih’natem of the lot parcent defectIv* are Obtained from Table B-5.10 .940 1.t~d Limlto of Cctimalcd Lx P~rcetN Delectl}e for Reduced hwpectim B-’f-ConUnued Sunple OIZR code letter .054 .10 4.67 6. q xe*pt three in the brackets.032 .59 4.876 .959 1. .00 h 4.3Z.00 & 13.014 .65 A 1.01 10.044 . 8re in percent defectlvo.40 A .023 . q ll other cendltlont for roduead Inspection.25 .40 2.d.245 .40 .035 .04 .065 Levels Acceptable @di}y .15 i .21 6.47 1.96 6.0)1 . ?5 .15 .733 1.343 .00 h .. mutt be ostitfi.08 15.0s3 .65 A Q .014 .57 2.50 i 14.453 .044 .1$ A .030 .50 1 1.60 15.50 2. .: . VAf3methe flrot figura In dlraetZom o{ qrrow and corresponding number of Iotm.00 A M .020 .65 .50 1.00 1.120 .016 .10 .0 ! 1.50 6 .186 .01 . 5.058 .045 .082 1.65 2.00 1 9.177 .[49 1.00 1 12.19 2.50 & .136 .081 .058 .0 .04 .153 .15 8.059 .1s .d (**) la fho tlblc raquireo that tha q lot po?cent dcfoctlvo 10 eqttafto saro for the number of conteeulive lots Indicated In bracketo.88 4.40 b .65 .501 .004 .187 .64 2.50 .026 .!iz 6.091 .Z31 1.312 .50 A 8.033 . 10.10 b .5b a 8.008 .5 Numha r of &to 2.04 .00 & 2.065 .389 .1s 10.87 6.069 .92 2.04 .65 A .?.25 A .

21b .248 10 .180 .173 .403 . .4JZ .191 .Z5S .lb6 E F 15 Zo Z5 30 .177 .181 .521 .lb2 ..214 .345 .Z17 .24z Oise 1.238 .Io z — T -.181 m m J5 40 50 75 J K L M N 0 100 P 150 .0b5 .of the qoiimatc of let otaad~rd deviation whtnu81a[ plmc for th* double specification Ilmh came.197 . .170 .369.189 .Z95 .194 .Ilb .Z49 L Q 200 .363 .179 .232 .317 .320 .Zzs .Zlb .197 .e the corresponding vahe of ~.372 .Zbl c 5 7 .318 .4Z5 .?bb .Z84 .Z9S .178 .Z84 .175 . find NOTE: Therm Is s corr*opondlng acccptablllty constud In Tikle 6.Z42 .)73.169 .Z48 .371 .18J .?70 .202 .160 .319 .310 .43Z . helps 10 imure.Z35 .50 — 34 .?Z8 .359 .245 .Z31 — .185 .Z79 ..td en the eatlmat.18?.248 .Z80 .23s .)53 . .Zb6 .251 .241 .189 .184 .176 .386 .27) .374 .207 —.S28 .Z03 .ZJZ .338 .166 .114 . Ipt acceptability.236 .Zlo .215 .Zzo ‘.183 — .323 .290 .Zlz .ZZ7 .192 .346 .Z14 .201 .108 .?49 “.5 .393 )81 .309 .408 .Zbl .Z08 .z16 .2S3 — .185 .170 .191 .45Z .Z7b .348 . .5Z4 .15 Sample leOudity L.04 . 30Z 30Z . For reduced lnopectlen.Zll .1s0 .ZOJ . if it Ic IF-o Ihm the MSD. . bm.IE.211 H I .163 .Z94 . .lb8 G .ZZ9 .1613 .I.Z20 .175 .la7 .Zzz I . but doe.489 .Zb9 .3Z3 .not uuar MIee.255 .341 .112 .119 .1 for qachvdue tbmaccc~tabil!ty commnt of Table B-Z In Table B-1 and u.190 .190 — .z71 .331 .4b0 ..Jz) .2Z4 .M31 .sample tiaa ‘ .198 .345 .174 .262 . . of 108ctandard davlatlea of umbown v~riability.Z19 .344 .399 .302 .156 .172 .151 The MSD msy b.s11 .182 .208 Z06 ..Ibl .47Z .183 .199 .65 I . of F.364 .307 . The estimua of lot otaadard deviation.22J .ZZJ .4z6 .Z91 .386 D .291 .245 .Z30 .416 .Z98 — . obtalmdby muh’iplylmg the factor F by the diNereace balwoen the uppr spaclflc~tlcm Ilmil U and lower spee5fictiian limit L Tha formula lt MSD = F{ U-L).z06 . The MSD s+met m I gulda for the magnitud.3)6 .19s .408 .193 .00 .4Z3 .203 .416 .215 .cvelo (in ercec tepll code Imttr 3 4 — .Z53 .Z66 .399 .442 .

Arithmetic E. q pecificalfiOn limit.d in d. mean Of . B..e.tinute cd lot ctandmrd deviation. T 1’ F p bar p b-r sub U qub L Tbe estimated proce. tant @ven with Table i~ Table.x sum of Ml . ] i.ampl. Table..Mx~14 11 Juno 10S7 APP@Du ~efinitkons B .timate of the lot percent percent defective and B-4. for q . 5!!!!9! m Red Sample X bsr qix. Mmft.. s sveragam wbkb BlverI in Table B-6. the P p bar % Pf. . with Treble B-5. (For uoe when differeot AOL valuea L are specified. ) Bamp3e q intimate of the proceem estinuted procea q qve rage.i=~le Definition lot. q .te rmim. above below U from L from ! I % ‘L Sample q . estimate Table B-S. M==. Deviation i I > < than I .surememm i~~m x . (See &xmpIe* iaSect40n ple measurement [mm a q 33. M e.i~ the ~um (hLSD). Sampl.. m8varage far u The eslimatad procenm sv. ~P1. defective for . of the lot percent defece of the 101 percent p s“b L defective P I .e in determay q xceed tb#AQL pplication O! ti~hteaed inspection.tirnale Table B.. B-5.Ixl. for U and ML M sub L Maximum Alowable percexaf dcfecfive below L given in TableB-3 and B-4.mup3m me. (For we when differenl AQL vtiuea for U & L q re #pacified.Standard deviation of qun insle lot. (For u. eon. ) Upp=r Lower The Q qub U Q qub L p sub U u L k q pecffic~tiOm limit.. Total . B-3 M sub U % Mtimum allowmblc Pcrceat defective q bove U given B-3 and B-4. qcceptability t I I Qu QL Quality Ouality index for u.-pie P = PU + P~ eatinutea Maximum q llowable ~iven in Table.rqe upper specification limit.1 and B-2. The F valu=s are given In Table Greater ham than Standard B-8.1. index for u.qlc lot. percemf defectivw i. for q 10W* r q pacification The maximum number of eattnnted prece. ) mining q A lactez ua.

pl~o ampllng 1Se. compare the q. . The degree of coaormance of a quazmy characteristic :imit with re8pect to q #ingle specification qhaZl be judged by the quantity (u-X)/R or {X. 32ach d die subSro. u*e wilh PlaM for s Si=ule rep..ptability e ritoricm. tbe ACCCptability criterion wJth respect to a particu. bottom for tightened inspection. T he sample sme cod e letter •hd~ =ected from Table A-2 in q ccordance with par~raph A7.m. %we f+ample C-1 f.2.)1X ia less tbm k or m.r rn.n table CC4rrm#p0~ ~ 1 e nla’ter mple . To deterC1. tic M u. rd describes the prO. .c1ficati0n knit whcri variability O{ cbe lot with rempecl 10 the qtmlily cbarseteri.Z Obtining the SunptinS P3an. each q a it tO 3n this Standaqd. The . The matter C* co r DlaM b. lar quality characteristic •~d AQL vaZue. unfkodaro C-1 qnd C-Z.ble corre.“pplic~ble q in .1 mine whether the.ed on varia peef.. Tbe sample .. The -cceptability criteric.1 Master qmplmfi tal CZ.. amplih~ PIq hall be treed the . part of the Sc.MZL-STD-414 11 JufM2 19s9 SEC’ITON VARIABILITY c METBOD UNSNOW7J-3LMJGE Part 1 sZNG LE SPECIFICATION Cl.’afiva. CZ._ .1 impection q md from th. 1..r q cmIIp3eto q bac. poading m the applicable AQL value. is indicated in the column of the master t. e mentioned in paragraph CZ. procedure. Sampling plans for reduced inspection a*e provided in Treble C-Z.fieation blIity u---n for ~ single q Tables limit wbenuakg & raag.rm 1 d Form Z.c. xunple of tbi. mc arc identified as Fo. lower specification IimIt. WT-BY-L&fT ACCEPTA=ITY PROZ CEDURES WffEN FORM 1 IS USED use of SUnpliag Plan.-iimd.unp3im~ plain ccmsastm O{ . sample mean.ndard. Table C-1 i.u.1 Sam le Si=e.xh . SASIPLUJG PLAN FOR SPECIP3CATZON LDdIT SINGLE UT I I ‘This part d the SUmZ.y@ur=~ fOr. 10C meet.m (X.unplimg plain ia obtain.ubgroup obtalwd.. nc. or 7 in which plans with q kgroup q im 19 fh sum as i. except for tbOa* unple qke 3. where U L X ~ im the is fhe is the i. K ia the average range of .ccptab13icy c rito rloix u (u-X)/R or (X.2 Drawing of Sarnp3e. urements must ba formed d the range of . Smkgrwpa af cnumcrmive nn. m accordance wltb paragr@iA7. consists of 5 mea*u*emenl.. 4.2.d from Maater Table C-1 or C-Z.-de rer. Zm wanpufiq K 338= Ord=r Of c=u*t b= Ihc sample meam=rem=iits u .8cant LOrZf (u-XI/X or (X.homa . CZ.raaga mmbod.3 Determination of Sample Size Code Letter. enmred lrom the 10P lo..)lsi.“C’%% L) equal “to or Creater than k.mtity (u . X is the qweraae of bgroup nngea. and qverage range of the #ample..- . Z. :/::1 be draw. tbea the lot deem not met the .p. the upper specification limit.1== e-de Iater. used. General Demcripciou of Sampling pl..ccordance with the provisions of Section A. in thi. AN . Th.h u** fbe q sanw3e sise. Cl.L1 ‘Kwithtbe qbilitv cor.d on varIablltty al .armples sbdl C3.f..ti i# give= in lwo equivalent form. Z. The acceptability COa. 3 AeceptsbIlltY Crite Finn.d for normal q nd ti~htened inspecfi. the lot meats tbe q. correspo~w tithe sunple mi. Samplin~ Tmblec.2. 1. The q X q -d .unple f q m q sociated accepIAbUiv Ctaut. CZ SELECT3NG THE wHEN FORM 1 ls SAMPLINO USED PLAN -i: ‘iw%”%(ilwz Iimi! I depending on whether the specification is = upper or q lower lirnis. Appendix C for definitions of afl cymbolo us id b tbe q uak90wm.t-t k..knowm and the ZWC nmtlmd i. Cl. 1 AccepUbiZity Criterion. tbe individnaZ q C3. b the. Tabia C-1 b . size CZ..bKrmip ranges.m uuf Table C-2 for reduced izupoction. C3.2 Accep-ility Comstit.

c cede let(1) Determine the q ter from Table A-Z byu.Z Maxd8mtm AIIc.. C6.r.f Quality Index.wable Pereent Defective. q re the sample mean and qverage ran~e of tbe sample. (U. pecticm. qxplairted in paragraph C3. the factor c.t=r Table C-3 or c-4. L)/R i. estimated by emtering Table C-5 with the quality iadex and the #ample qi*e. ct out. ed o= varisbil ity unka&n for a single specification litit when u. The q from Ma.ise code lel from Table A-S ~u~inn the lot dae and the iriapecttosi Iov@l.riz. lot doe.3 q nd C-4 of Part IL Table C-3 is used for nc. Table C-3 ii entered from lb. plan from t. The facbar c is provided in Master Tabl=s C. U .ize and an aooo~ik. respectively. 3See 3cxAmple c-z tar a complete example (1) Demwime ihe -ample . ter for plana ba.ti-@d pccificatiort lirnii.t~ of m . I. from the lot: in. SUMMARY OF OPERATTON OF SAMPLING PLAN WHEN FOR3d 2 IS USED qun’unar 3s9 8tepm umun. The madrnwn allowable percemt de=ive M for s-pie eotim. ceat defective M.iq the rang. fn be followed: the pro- ample .o compute the quantity (u.L)c/K if it is a lower limit L. cceptability criteriow if (u. ed by PU.mem al the quazity characteristic on each nut.od. Compare the e.mater Iable C-3 or C-4 by . lower specification limit L.a vided in Table C-4. iq the 101. Computation c.ZC)CIR hall be com puted “if the sp%cificaticm limit i. the Sampltng C5. mit of notlccmfomnirt~ p.rnple mean X and the range of the .pecificstimi limit . ide the upper er lower specific aticm limit.3 an& C-4 corresponding to the . SunP~ Plaru for reduced inspecticm are pr. . qamplmx table.1 i. tic for q=ch uait of the sample. or lot q bov= the upper specification p. .nd record the meamurernenx of the quality charactari. of thim pru.UIWI]e . Uun M. Z Obtaininz Pllrl.hle perceM defective M. The percentage of rmnconforming product i.s1 hall be expre.rnpl.tes corres~ndtied in ing 10 tbe sample qiz= me~tie paragraph C5. X)/11 or the q (X. c6. f.Z. The compmatioa of K i. The quality izidex Or. of the 8sMple.I 3A1L-m-414 11 June 1957 CL f3uMM~Y FOR OP3IRATION SNAP LANG PLAN WHEN FORM USED OF 1 LS CO. method ar= Taidec C. then the lot does not meet the acceptability criterion.2.an level.. ter (Z) Obtmi.4 Acceptability Criterion. mbt~im=d by .pU or pL is equml to or le. The degree of conformance of q qutilty characteristic with respeet CC. equal to or greater thas k.i.n.arnple ~.CfT-BY-LOT ACCEPTABI w P% CEDU3432S WNEN FOR3A 2 3S USED c6. Tbe q“amitie.. indicated tn tbe COIUMII Of the rnmms. the lot meet.mteri+j Table C-5 with Qu or QL . and tbe maximum qllowable pw. Cl.3 fhtimate of Percent The quditv of a 1. ificatiomlirnit V or thequamtity (X. qvera~e (u-X)/R c. the’ q pu or pL is grekter than M or U QU Or QL i~ negative. X q nd R.L)/R for . PL i. of m “nit.. top f-r ~orrnal iaapectian mad from the botfom for ti~htened in. the =. Th q sampling ptan con.ize and the in. The ma. (2) Obtain plan from Mater or C-Z by .. O= QL = (X.timated percent de fe~tive in the limit.tep~ ptwedures to be fallowed: the C5.electirg the -ample sk= n. C6. {ram the 10C inopect and record the meamm. Tha fellowinK . an IIppcr limit U. PU O.nd the q pp.md q l. Z. C5. then the cceptability criterion. (4) Compute the .hafl be judged by tbc p.timated 1 m percent defective PU or pL with the m~imutn aZlew.. Defective in bt. not meet the q (5) ff th= quantity C5. =ntd=fectiv= beloby PL.r. 1 AcceptabUity Criteric. i.L)llf i..r tabte correa pending to the applicable AfZL value.X)IR for am upper qpe.d maximum a310w&le percent amplfq ptam ic obtdncd def qctive .r (X. The q .. ?.dur. Table C-1 qize n and (3) select *1 random the .1 SELECTING THE SAMPLING WHEN FOR64 2 3S USED PLAN Ma#ler Samplinj? Table.elecfin~ the sample the acceptability ccm. if the lot meet.n’nal and tightened inspection qnd Table C-4 for reduced inmpectimi. (3) Select qt random the sample of n unit. cceptmbitity criterion.tima~ed thc lower q Percent de f=cti~. Opri~t= q AMPlt qi*e.q q imgle . pecti. 62 .unple size code letter.taat k. the q . pect .*9 than k or negative. Th$ following cedure.

and compliance with the 619. (Rz = 673 .3 not meet tbe qcceptability criterion.k. tith AOL = .miataace of q certtim qlectricti comInspection ponent is 620 ohm.Range Method The lower . ——— defective PU or pi.tion limit for electrical r.7s0 k Compmm (X.-.638 = 15) i.811 (647-620)/37 &q &e Camsmt: Criterion Tabla’ C-1 ParaLc3. . 10s m. Level IV.en that a sample of size 10 i.619 = 39) 538. kn i- limit U im give. 650.L)/l! . n Needed Value Obtained 10 Sum 01 Measurements: Sample Mean X: XXI. or QL = (X.MI L-sin-414 11 June 1057 unple me-m X 4 (4) timpute the q ample K.. 673. them the lot doe. 651. (R.710< . line 6 q ad cmmpar= it with k the lot meet.. 161Decermirie the q . then compute tb.? 3 4 5 6 7 8 Speckfieatio.r.irIce (X. W1 meet the q cceptqbiliw criterion. 627. to be determined.. From Tablet A-2 ud C.rc. normal inspection. I X 647o 647 37 6470/10 (39+35)/2 Limit (LOwer~ (X.limaled .. . 650. quantity (u-Xl/X U q .- ~PLJl Example Single c-1 of Ca3culati0n* Limit-Form 1 Specification Variability EXarnple Unknown . is submitted for inspection.811 . required. = 658 ..ti. thaa the mdmum azlowable percent defective M. if (U.ra~c raaSe of the q the (7) Uthe q . 3he lot meets the acceptability criterion.1 it i..)f~ is 1c99 than k. to be used. = Sample Site: 3nf. I the q. av.%=_~ -i”. EXP1anatiom qccept ability criterion .PP=r . the acceptabUitY criteriom.Pecificati..-— . Suppose that value. eqtml to or Ie*. it PU or pL img. 67o.L)/It L 620 . follow-: 643.5.pecifie.eater than M or U Ou or O’i.pccificatirm limit L ia .timaled lot pcrcentdelective PU or PL i. from Table C.=lity “ index QU = (5) Comp@= (U-X)c/K M the upper speckfieation limit U iripecified.4% i.rnf~ equal 10 Or greater [ham k. . . Line — 1 .pecif ied.imK1e .L)CIK i3 the lower . The qu~tl~ Accep3AZZity Acceptability with k The lot doe. of the’ sample resistances in the order reading from left to right q re . rrn. A lot of 100 item. 641.

normal in. 650.n m Sum of Measurememtm: sample Average Factor c Limit M. Method Ex. wish AQL .619 = 39) 670. Max. Compare 1. -mpr= PU cceptability criterion. submitl.ver specification limit for electrical re. 620 duns.4 C3L = IX. Level lV.405/37 See Table See Table See Para.. sample reaiatance.14% mat meet the acceptability is gr=ate. C-5 C-3 C6. ‘f Zndex bt (~we. upper specification limit u i. in the order readimg from left m. 10 be determined. A-2 mad Suppo.MIL-ST13-414 11 June 1957 EXAMPLS c-2 12xample 01 Calculation.: M pL with M criterion.knowmi .e of q certain electrical Zaspection ponent i. ific*tiO. A 10 I of 100 item. th=.. sunple of qizc 10 i. From Table. e lh.. Of the C. the q M . (R2 = 673 . mple comA lo. ‘ercent Allowable PerceIIt Criterion: 1.1 is is seen thal . 641. 638. Rive. Value Obtained 10 Line — I z 3 4 5 6 7 8 9 10 Sample Size: Inlorrnati.405 6470110 (39.4% i.ingl.3S)12 See Table C-? Range ~: XRlne. Single Specification Variability Limit-Form Z U. with M: the let meet. Dection.d for inspection.L)CIX “f.14% 2. i. ~hn M.’ PL De f. i. compute the quaii3y frufax QU ~ fU-X)c/3! in line 7 d obtain the eotimate of lot percent defe. -E: U .76 2. U p“ ia q qu~ io or i’z*. x: ZXJ.a2ity ‘ct.638 = 35) qnd compliance with the acceptability Needed criterioo i.54S (647-620)2. IX 6470 647 of subgroup.tan. than M. .Rang.54%> since pL Acceptability The jot doe. 651. = 658 . 37 2. 6S8. v*Iu=.tive PU. (R. m be used.. Q. 627. 619. right are as follows: 643. required. 673. ): L 620 1. Sp=.

406 .494 .310 .?5?.647 .539 .360 .424 .336 .25 .807 .654 — .0[ . .46z — 15.216 .rarm I I ml in pectiml - 1 15..111 — .746 .309 — 2.728 — 4.631 .484 .50 Y.431 .90 .178 .610 .Z?b — .40 . TABLE RmIrn Method C-1 Master Ttble far Normat and Tightened Zn$ptctlon for Plans Based an V~riabIllty unknown (Single Specification Llmlt .s03 .06 I . both sample -lie .266 . amplln$ plan below qrrew.405 .~41 .t & a q.50 + Impec m) — S* well as k value.754 — .21 1.791 — .516 .519 .5s3 P 1.~lj .296 .996 .!325 — .43Z .364 #2 Q 230 [ 4 AU AC2Lv~ueo qre in gercent defeciivo.21 I .184 .?3 .50 I I Accepmble Oualify Levels (tlgl med .730 — .loor qxceed@ let i$! 4s ‘i .1b8 .646 .441 .581 .189 .452 .16 1.449 — .510 .460 .689 . #its equa.684 ..552 .421 — .7.65 1.616 — .!21 .401 .371 .577 .65o .398 ..465 .530 .621 .364 .327 K L M + .403 — .644 --1-.116 .591 .932 . .7z6 1.336 . When sunplt 10.105 H 1 J . ——.3SB x . 50?.498 .15 1.734 .780 . c D E F .s15 .668 .“:: tir.321 .307 .87o .450 . _.490 .00 1.701 .658 G .10 .00 ..00 6.063 I . 9wory Item 2a tha lot mnmtbn ln#pected. that {s.SZ5 .s’38 — .34s 24 0’ .)2 .587 k B v .)52 .2?2 .610 .598 .565 .00 T sample t 1se code letter K 2.

10 1.896 .401 k k 2.621 .94.176 .811 .01 1.oz .JIJ .179 — .178 .850 .16 1.371 .581 .654 .141.06 1.196 .10s .360 .50? I .252 .7E0 — .266 .B35 .398 . JJ6 . 25 T 1.569 .5s1 .650 .8[[ — ..276 .904 .565 .398 .179 .184 .08 M 23 + N JO -u-.E43 .178 .441 .50 6. 4 G 5 33 7 1 10 J .IJ 60 1.610 .27?.07 I .521 .701 .424 . 1.34s P 1.684 .951 .216 . .502 .406 .61J ..02 1.959 .4J2 .? 1.734 — .o6 1.01 1.498 I .178 .963 .9 ..899 .296 10.610 5J6 .404 .900 .738 .0s D 3 E 1 .-— .10 1.s2s .7s5 .05 .494 .296 .484 .962 .130 .11 Q I 8s E M i .647 .815 .650 .658 .663 .s71 .189 .00 7 .296 c 3 --1-I .10 1.E85 .703 .99 .964 1.E4e .3s2 .11 1. C-2 Raa[e Mtthod Sample iiaa code latter .958 10 K 15 L.861 .192 .341 .614 .8J9 — I.916 .2s2 .707 .826 .723 .452 .951 .791 — .90J .s11 .490 .5)0 .30$ .Jlo .75s .896 — .40~ .15 -i- I Sarnpls q{SC B 3 EEE * * .0.703 .00 k .00 9 1.178 .S0 k k .579 I . .6.— TABLE :6 Mantar Table for Reduced Tnnpeclion for Plan~ Based on VariabLllty Unknown (Siogle SpeciflcalIon Llmi!-Form i} :ept&l J 1.723 .768 .50 4.17 I.43. .647 .

of the individud Cf 1. TIM 67 . The degree of c. .~d AQL.~~OT-~. rnple qis. C9.2 timputatioa of Ouality bdicei. tion limit hall be Judg. C9.bility c rite rion *ith rcapeet to a partiastar quality char. Genq wJ eral De.. qice Cl 1.ccfion.fmfl with ~raarapb . L ia the lower . C9. ). Z hta-tor SamIIlimX Tabla-.rni.L)c/R cbdl be !o&uted..tiue from Table C. code letter =hfi ~... e in thi.peeificalion c is q iacfor provided in Tables C-3 C-4.nt dof=cfi.unple meamtrernemm q s nude mat be ratahad. 3 Obtaintng Sampling Plan. Tc. the . Cf 1. plim8 P1W9 Sor roduce!ttmpaction — . i. C9.. DRAW7NG aace OF SAMPLES be q lected sample. ICr.. q elected from Table A-Z in accord-ee with paragra~ A7.pmdiag m Is to code letfer. vtiue(. part of the Staadard. 10 UOU. . of 5 meuurement$.. doub_fe .atim lAU.. x i. or 7 in which pduu dtb q ubaro.tirnatec of percent ~tive for cunple def q etiv. R is the >verage rmge of bsroup rauKc& ~cb of tie sti#*0Up9 tba q ex’c=pt for those consimt. The cunplin3 plan to be q kn#pect&a stmfl be ~btied from Maater Table c-3 or c-4. . determine -------. . the Order Of s-pfa fbe .x meet.enta~e of no..3 or C-4 q m . C1O. for the lower.. Table C-3 is entered tram fhe cop for aornul inspection and from tbe bottma for tAIhtamd inspection. The qualify of q lot qhall be exprew~ed SrImrmof the lot ~rc. -.C xl [R and QL= (X.knc. or botb q p. and u i.3 Percent Defective In the Lint. The master munnlinn tablem [or mlam hmed On variabil ity ~fca~wu for a d~ble specification limit wbeo uming the range rn.unple b. ).. -here limit. tbc . .s. .clectcd .tbod q re Tablea C-3 q nd C-4. THE SAMPLING PLAN plaa for q ach AQI.eription d SunplinS PIMa. A q sM@in4 plm Comai. with re. 1 u.eteristic . p with resp.ppli ampliag F. . h th= q ame q e the case flu q q ~e.Orr.able percemtdelecfiveby M.11.pectiom and Table C-4 for ra duced Lrup. 3. K ia the q -erase etch q qubgroup ranges.1 Acceptability Criterion...Plan.N1 SE LECITNG unplhg A q be .mbiaed.ts of q qampfe sise the sl qoctatad maximum attowablo percent dafac pplied in tiw-e(. and The q antple sise . P fOr b o t h spaekfieation limlta combined. designate tbc -urn aflo. C9.. Samq re pr.—-— ~hethe r the 8. q atxe with the pre. The q gtiwta PU iadic*eD contmrmca ~tb respect to tbe UPPG r spockfieatien Mnait.lao q U be used in accordcabl.g producL The per..~cific. ad by MU for the upper limit. . C9. 4. a{ S-. . 3a computing R.peckfi.=.1. . —— . PUO 0? P.bownbiitdl. —”. 3. The maximum-t allowable PC rcrnnt dee. the..d by tbc percent ei wnco.~O in q ccord - A7. peel to .c - b tbh Standard.the qverage range of the sample. Its •c~~** W~ be dosipawed bY P L. The qualify inchcea Q {u . u im the upper specification limit.imm of Section A.C eept.ef to the lower . If ~ AOL i8 88sinmd to bofh limits c. 1 Determination of Sunple Size Code . qpsr. unple each q 10 Si=e..2 Maximum Allowable Percent DeIe c five. cA.. Tsble C-3 is used for norrnaf and tightened im. wm q nd the range method is umed. mmtimum q llowable ~rcemt defectively ML for the lower Iindt.3. Z. T ACCEPTAB1_ C1l. fbe q mple mean.Cwderming product is estimated by entering Table C-5 with the quafity imd=x q nd the ‘ample :Ue. Th q . . I Sun .—— .xf~14 11 Jfffw 19s? Parf 1I DOUBLE SPECIFKATION Lf3d3T C8. SAAfPLDfG PLAN POR SPECIFICATION LtMIT DOUBLE This part Of the Sf-rd describes the procedures for tue with plain [or q double cpecificafioa Iimft when variabttify Of the let with respect to tbe quality characteristic ia u. vialed iii Table G-4.nfo~aracteristi. subgroup of co-ecutive meu urementi mnot be formed and tbe range of ubgreup obtahed.p q is.

(7) 32atl three of the lollowlris dbt~ons: (a) PU is =q-~ ~u.timm~ed lot percent defective. L)C/R. . X q . th= factor c.ses m.. to be used: .mtm tbe accepfAbi21ty criteria. Ihc lot meet8 the *cceplability otheruase.2 Summary for Operation of Sampliag Plain In came. campl. Ihenthe Jot does not meet cceptability criterion..ble A-2 by using ‘the Jot sic and the in.r a sim~ie quality characterthe istic. corre. 33 q ither QL or OU or both q re negative. equal to erlem. & ~. respectively. the q the lot. the sample ai.ingle AQL value 1. -—.re negative. if $h. *h. p8cuLcmU0m fh lot m.e &d.~e ample mea. p . 13) n unit.d (5) Compute the qualiJy imdicec QfJ . PL amd PU found iii the table. Obtain the sample ttie n. em defective.. ecode letter from T. corresponding to the p.value for both Upper b-e r + Cit. MU and ML. limit.n -f ~mPliWf PJan. 4 Compare P .~r Different 4tie ~pk AOL for va. (u. (6) Determine the q .~ for a q .Laad pU q baJl be determined by entering Table C-5.— =.2. Oblain the ampthe m~mum le size K. The =~tim~te ddin~ the co rres p shall he dew rmined by q pcmdimg estimated percent defective. fbe 10Jmeets the acceptability criterion. above the upper and below the lower specificticw limitt. q nd (2) Select the sampJitig plan from Master Table C-3 or C-4. q.re q cliffere. p“ + che eetimamd lot percent delectlve q l10-abl* Prc=nt PL -ilh the maximum dcfcc:ive M. AJSO determine lbe combined percent detectiV= p . respect and record tbe t of the quality characteristic of the sample.t AQL value ~tmblished (or the upper qnd k. th*n MOr if either QU ‘r ‘Lor both . 2f pL ia equal to or 1=6s ~h~ Mb PU is equal to or lees than b4u.h. the following steps summa=i.cenc de fcctive~ Pt. the fol Jmnimg steps qm-. C12. Z. tie. the cos- (4) Compute the sample mean X rmge of tbe q ample R.. MLl.mpacti.X)c/R.c=ptabitity Critdria. 5 timp8re the estimated lot Per.2 “Summary far O~~atic. y-fi=nt OU (6) Determim the emtimtiad lot d= f=ctiv= P * PU + pL frOm T~bl= (7) 2f the eotinuted lot percent defective pi. and OL =(X-L)CfU. ~ P with the corresponding maximum aTiowq nd Mu q lso 8e Ie percent defective M compar. a utit. F = (X. ia aqtml co or I=*w th*m {c) p is equal toor Jesmtin of ML and Mu.dure. . ll)”Dctcrminc the sample si. IU.7be lot does not meet the scce Pl ability criteria. .. or..e*t=..Pec ificatio” limit fc.cirnatc. pondi=g to AOL VaIUeS fo. X)c/K arid QL. q . cceptability criterion. pU amd pL. CIZ.. urem. awt meet tbe acceptability trite rion. (2} Select plan from Maater Table C-3 or C-4.1 Acceptability Criterion. and the maximum mfloumble percent defective M. um~er and lower s~ecifi i=gle quality C~t. . SW *PI= c. If either Oz. IS) -mpt tbe quality indite. PrO=~ur*.er.1. the uPP=r q nd lower Specific atiec. then the lot doe. q re qaticfied.wcr .ch unit average ample of Select m random. procedure. lot meets the q P i.rger tO Or lEM tbu (b) P..catmm Limit Cmnbmed. pL + Pu with tk e larcer Of ML q nd Mu. Mu. the factor c. ample of (3) Select q t random lhe q from the 10C inspect and record the measurement or the quality characteristic on each unil in the . p. r. if p ia graatar lIIM M or U either Ou or QL Or both am negative. lot dw* tit UI**C both q re =gative. -d q llowabJe percent defective.ete a~d d tbi. the acceptability criteria. then the lot does not meet the aeceptabitity c riteri& Cl 2. ACCEPTAB1~ CRZTER20N SUMMARY FOR 0PE2tAlTUN SAMPLING PLANS AND OF q nd Cl 2.r. {4) Ckmpute the q rams-k of tbe q unpJe R. by using the lot q i=c Cl 2.~ + pL. U p is equal to or less than M. where q .mari=e procedures to be used: (1 I Dcternai~e letter from Table A-2 and inspection Jewel. of Ma proc. =blished forth.l~ ‘iJb Qt.UTIPIC.4 C-3 for . pe. the q C12. =om**t* exunpZe q xample -. e.1 O!ie AQt.1 A.1. . lh. thui the maximum d20wable percent defective M. q nd Qu q nd the q ampl* q i=.ori limit cornbin. level.haracleristic.luet for Upper LamIL. C#w. d P is equal to or 1=0s than the larger of btL ~ c ritcri=. from mea. otherdse the lot hew not meet the scc=ptability criteria. or QU or fba.

h fak Max. A210wable Acceptab12ify Pff + PL titb P = Pu + PL M p - + 2.?. IV. 673.L)e/11 ~-t. that q samfle resistance in the order reading frm-n left to ri~ht are q s follows: 643..35s . sum of Mea.MIL-STD4M llJunelDS7 EXAUPIX Example Double Variability One AQL C-3 of Calculations Ltrnit Method Combined Specification Unknown and .89% 1..4% ii to be used.. From Tuble..atien *.armatiom Ne. A-2 and C-3 it of size 10 1. (Rl 67o..o q 30 ohm. U.: .2.54% : 2.lu.405/37 (647-620)2. required.15 1. m.638 c 35) i.405/37 See Table see Tsble . 1 2 3 4 5 6 7 8 9 10 11 Sunpl. 619. A lot of 100 item.clt. q bDef.ded Sise: . Obtti~md 10 xx 6470 647 37 . Znf. 627.76 u: L (680 -64Y)z. 64).%mpl.e98 >1.14s Tbe lot dtm.Z(7) + pL 1~ greater ~ Crtterloa: 64 Carnpare 2.d for In*petiiar& fmspecfi. 630. m be determined. Suppose the vafuea of the q mnp2e is q eer. Parcant Def. Uwe2 65o. u.14% Est.405 680 fawer Ctudity Ouality Specification Index Zndex: Ltmit: L c/R 620 2. 658 . of 3A I 12 13 14 Tota2 Est. wftb AOL . de — ..Aver age Rsnge Lower Value for Both Upper Specification. of Lut p--t Percent D=f. Cfu . 65B.s5s C-5 C-5 6470/10 (39 + 35)/2 See Table C-3 Zcxpla. Limit peclficstioni [or elec:riea2 recisfaace -f a certaiu electrical cOrnponeu5 * The q is qibmitt. normal intpectiea.: SOe Table See P*ra. = 39) s 673 . 651. X: XXI. since p = p“ M. . nut meet tbe q cceptabifify crilerlOn. (R2 and compliance with the acceptability criterion . (U-X) C3L = IX. V . baleu w pL . 65o.54s C-S Percent Def.1.619. CIZ.

: 3 4 5 6 7 . From Tablet A-z and C-3 it i.1 650. SuPrmse the values of the sample resistances in the irder reading fmm left to right “a-re a. =bOv= u: D=f. 2.~we ra~e Range Method Specification Limit- for Upper and Lwer I ZZ. A130wab1= Percent A330wabla Percent U: Mu 3A M’ below See Table I 15 Acceptability Criteria: (a) CDmpmre PU with Mu (b) Compare PL with ML (c) ~t~p~ue p .405 6470/10 (39 + 351/2 See Table C-3 IXf. q ce= that q . in tit: Def. (b) and (cJ q re satisfied.______ .%rnplc Mean X: 1X 647o 647 37 2.5$ far the upper and AQL E 1% far tbc lower specification limit i. 619.aticm. slats 15(-).Z(7)(C) cceptability The 10t rtmetm ttm q MfJ. 658. pL<M~uldp <Mu.405137 (647-620)2. A J*1 of 100 items im q ubmitted for inspection IV.Z3U <7. . 650. clz.am P1.Z.e. Of ~t ~. 673. urcment.3s% + 2. = 6S8 . .z. i. .emt p = PU + PL q bove . Tad ‘=f kt Perce=: p=c.405137 See Table See Table C-5 C-5 ~s~. co be determined. (R.619 = 39) 670. vifb AQ3.t.riab33ity AQL Values Unknown .54s 2.54% S.pectimi 3AV. follows: 643.42% 2.-sTD-4l4 11 Jute 1957 I I ~ph EXAMPLE c+ of Cakuhuom Specfficatlom LimI1 Doub3e I Different V.15 1. of size 10 is reauired.3 C-3 MAX.42s 3.mt Dcf. Per. 641.r electrical reaiscance of q certain electrical cmnpone~t iZn.898 . Def.unple The q pecifi. (Rz = 673 . C12.rrnation Sample Six. 638. rmrmmz impecziou. Z(7)lb) See Pars.z(7)(d See Para. belOw Del. Ie be used. PU < .76 .23% I I 8 9 10 11 lZ 13 14 0ua2ity index OuaIity fndex: Qu = (u-X) QL = fX-L). criter&. 627..xm. of .0 q 30 darns.35% 2.ubgroups specificatio~ Specification Limit: Limit: U L c/R /R FU PL 680 620 Z.Z. Obtained 10 Intc.s4% 2. CIZ. ~: Average Factor Wp=r kwer c Z4. 651. Table C.. f. (680-647)2.: n Needed Value Sum of Me.3s% <7.638 = 35) and compliance with the q cceptability c*iteria i..42s See Pars.89% 1. fA Ems.nge X3tlno. 3.

76 9.26 I $.00 -!Asl.81 2.09 12.10 Sumplc *IS* cede Icller .04 S.s42 — .14 2.00 M 1 .6q 40.73 3.17 1.i.59 ~vv z. B.786 1.42 ‘3.lo .261 .232 . Rtrme Mcihc.44 7.366 .55 22.58 1.43Z — . —_.00 1s.50 10.q7 1.468 — .5 lz.45 ‘ 22.333 2.240 .36 5. s9 5.47 12.B8 1.]s 10.s4 11.47 c 4 29.061 .20 +?.z3q 0.57 5.lbS .313 .79 17.s0 30.sl 5..10 4.210 .169 .61 0.0.8)0 .77 LJ79 .755 .5o6 .504 .53? .03 z3.65 1.s4 I 5.230 .b3 2.23 — parcant dafactlve.06 .133 .?1.Z3 4.58 1.405 .47 6.46 1.65S .76 5.65 14.356 .>36 Z.89 I 4.41 17.1.89 I .17 10.7. ‘“””’---” C-3 Mamer Tbbl. .91 12.1O 19.Z5 1.ZJ — .493 .461 6.98 8.136 .842 .346 L 50 M 60 ++2.!34 G 15 3.82 2.25 1.q2 .q76 .?.0$ t4.05 3.827 1.lz 1.856 .564 .93 3— G 31. (Double Speclficatlon ~lmlt q 4cceptable C mlity Levels (normal in#pectlon] fa:to? MMM M M Z6.JZ 5.391 .303 .a34 t.1561.46 5.30 3.27 (.99 10.Z7 26.00 1.j30 1$.90 D 5 ZO.w.11 11.37 Z.14 20.661 . 230 z.98 1.)81 .358 2..88 s.95 E 7 2).50 Z.85 8.d TABLE lIA.38 16.43 3b.24 5.539 .25 .50 Ssmple *11* mZE-1 10.60 1.4q 33.11 21.41 2.73 4.349 .818 .47 7.96 T I 21.471 2.8Z .31 14.hlltt.14 Z.511 9.47 2.16 I.nd Tlthtencd fnsmctionf.28 3.76 6.86 .42 v .350 N 85 0’ 115 P 113 -t-t .61 1.42 12.4Z7 1 30 It J 35 -tt.90 3.nedmv.11 4.430 3.147 . — .90 19.339 4b 2.0s .40 1..718 .31 1.37 4.51 .Zbl .69 Z.65 .z9 1.972 .r Form Z-Single ~peciflc”~fion Limit.66 r 10 B I 6.125 .40 .9q 8.44 3.64 . fer Nermal . zi 16.91 2.]0 Z.111 . ndf.214 .19 23.Z4Z I .r Plan.79 M M MM M M B ..88 4 w 34 2s iiir!t 3.S6 14.00 T \b.63 15.60 9.375 .13S m 2.74 1.342 2.883 .244 .S9 11.04 4.06S .2.353 2.)60 .2s3 .44 9.ceeptable (3 1.& 4OOI6JOI1OJO dlty Levelo (N:htemd Inspection) -L I4.93 1.zs 1. 50 12.95 Z.q6 .94 lfI.06 2?.02 .474 1.90 2.335 2.q2 3.———— .40 23.i5 19.64 3.36’ 2%92 17.

47 33.93 9.S27 l.17 21.358 .42 17.474 1.786 I.MB .90 20.xc.03 Z3.81 z.90 19.92 5.36 5.1! I 4. f.90 I 10 2.?10 7.47 1.65 I L M[hI’l MIM in-ii40.10 M .94 1.rrtmr.$0 M ~ -!5 I Smnpl* 81SC Samp10 cede letter q IX* .33 1.90 G 5 14.214 Z.42 J .336 .ea~ $ $ II weNa* MvsJu*.144 .15 I 1.69 * MM I .86 26.14 Z.49 z1.48 Z3. JO.48 Z3.4o5 7.82 Z.76 9.54 11.SamPle & S1S.00 MM 1.SO. betb ccmple.8b 29.Z3 Z.ZI 15.do 10.10 3. that.ctlve.883 1.253 . OqU~C or .353 .47 10.JO Z.79 G G 4.530 .537 .504 .11 10” 1..88 8.44 !.350 .40 I .96 2.94 3J069 40. %deZ3rdt #ampNnszdmb.827 1.16 1.47 Z.214 2.Ran[a Method C-4 ~$ TABLE Maamr Table #or Redueed Zmpecticmfor Plan.z4 3.349 .96 5.366 . Z8 1.3Z 8.92 16.69 40.s.?5 I .47 2.63 1.85 8.79 4 -1-Z.94 33.17 7.95 Z. 1.75.64 21. Baoedon VSrlabillty Umkmwn (Doubl* Speclficalion kltand Form ?-Single SptcUicttion LlmII] Acmptablo OuaZ{t IAVCI1 1.z7 1.59 18.42 la.i’ 2.59 18.391 .240 1.J3S . 379 v .l.339 .05 1.05 Q I 05 ML bad table waluec tra in pcrcmt d.06 21.99 3.95 15 z.21 1.910 1.S9 3.30 .65 IZ.77 — 7 2.493 .44 S.S4 Z3.67 2.74 2.50 2.58 Z7.98 2.405 K ..94 33.23 4.95 i Z.3 8.Js 17.47 : H .136 .05 )..356 .21 ..50 12. ‘ WI.97 N I 30 17.30 Z5.Z7 G33.16 14.79 15.98 8.19 2>.65 IZ.’5 2Z.82 17.46 5.234 1.9.564 .430 .242 .10 3.58 l.42 10..47 If?.86 Z6.45 36.29 25 2.065 .09 3.66 10..90 — 3.261 .44 6. S9 3.S56 1.99 18.910 1!59 1.1 1.37 4.06 26.506 .69 40.13 15.910 7.86 26.96 S.8Z M .l Z 1.77 7.53 10.Z7 10. .9Z 17.755 l.T9 L“ZS .506 .42 3.kw’.

- L-. . —-.. — —.— — TABLE Tabh for EcUmatInI lha Lot Percent Defective USIIIg Rans* Methedl C-5 I I I .. .... ...

.. *..n *.” ....TABLE Ttbh Method for E#timatln# tba Let Percent Defective Ualng Rune C-5-ConUINed . .*“ . . . . ... . . . .. ... .. . . . . ..... I. . .s 4... .= . ... . *. .... . m “ 1 I . 6. ... ....* .* i t.. .. .94 .” 1.. .!.” .... ...- . . i . “ .“ . . 9..S “ ...... . . s. 4. “ ..A . .” ...a ml 9. .” . .. ..... .. .... .. . 0.. ...= D.I .9 .. .. . .. . “ . ..” ...a l..“ ...” * .... . . t.... .” . . .“ .** .” ..“ . ... .. .0 .“ .. ...” a ). . . .” A...“ .. ..... ..* . .......s .. .

TABLE Tabh for Estimating tbo Let Par.. I I .ml t3ef@c11veUcla: Ilmte Method C-5-ConUnursl .

— —TABLE :! Table fer Eotlmatlng the l-al Percrn! Defective Uolnc Range Method C-5-Continued ‘-- I .

\. . . .. . .. ._— TABLE T*Mo for Estimatlq ttm Lot Percm! Defective U#inS Raa[t Method C-5-Contlaued .

and reduced IEmpectk.. particular quantity Of product .. a q verase.pecific.L)c/IL (See parwraph Cl 1. based ~POa q group of lot. thi...3. imspoctian (&85 tibteaed or reduced iMmcc?ion io not -itb” paragrmpfu r. e. of the i..n limit. Z ZturirIg 3aspection. igriated by p“ wbem cwnpuc.p.n.tirnated proce. of ic!. . of delerminiag .tic. C13.. tightened. e de. P ... OrigiM1 im. fig~MATION OF PROCESS AVER- corresponding e. d. d ~* Ific.dnutfri~ chm proc.rrespohdi:g Pu PL q re read from the table.ce. diati~uiah. ante (m rt. “DUCED IkSPECTION AND RE- qu’nplfng Tbia Standard esmblisbed P(U far normal. pectiert imthe fir. Th e estmuted pracemm q vmr .. 18 the a%hrnetic mean of 4(I.tmf production hall b. q rithmetic mea.l In. C-S forth #_ ti. Sim q. Cl 3. by (JL -b.pecifi.2. excluded from the emtimaled proctm. for the pur PO.t. ub rnisted after prior rejection. .rcem defective. pectiom. If the quality iade. e cd q co=t?.7.t inspection of . OU and OL shall be computed.d from Tabl.d ia. pectitin of product rnamuf.ampfe .lirnated proce.ct in aecordaace with paragraph C14.everity of imapection durimg the .rwise dacignated. Qurimgfhe courm &xctio. .ub Cr.our. method. entered bydi. pectioa re. e-hated lot percent d.ubmitted from the le.ted lot percem defective i. tion of praducl which hambeen re. average i.d tuetbod.. Average. cor p . C14.ted lot percent d.tion limit..ult.. and by p when computed with respect to q double . rempecfivel~. . the lot p. q vera~e shall be e. d . tbe estimti. Cl 4. PU + P .timat=d lot perce.cting fh~ percentage lc. ufto of the precedlmg ten ( 10) lot. cifi. Th.d proces8 i. is red from Uve p the ta~)e.Iarmin.4.ver. C14. q n upper .hd3 be used q t the start of ias PeeU& uateoc otb.. i.. Tb..timate of thepmcc. & order to eatim.3 Special C. cmred under ccanditions aot typica3 of u. regarding the negative . ... obthic..divid. ceditq lot. NORMAL TIGHTENED. Normal inspection . and the c.acc. The q sti-d m.ri~iii. = (X.3 d C14. ig matad. may be otberwi. Howcwer . Z..=r8ge PL itarly. The pr..4dTd Lm q ccordume C14.timated from the remdtm drawn from . T& qdity M-x Ou on the r~c 6 % i~ the -it f-=*ic M-= Of the individu~ -.cuictiom ulmlL T&l* c-s b tirti dfb C)uor QL q nd (h* qrnfla qti=. amber. fectiva. .ubmttted for c.d with rempect tc. ve shall be determi~ed {mm Table C-5 fc. p. the . q verage.ESTIMATION OF R=UCED PROCUS AV~GfZ AN(3 T1Gf4TENE0 AND CRfTERfA f=OR 3NSPECTION C 13. The e.verag. sbdl be of iwrnctiim. ua: Ou = (u-X)C r X and Ot.r the Plan.d #.ted rnth respect to a lower . ra. fecti. fbe srifhmetic mean of the individual estimated lot perceot defective.limated lot prcent dcf. i. e. C14. of tbe EsUnmted ProCe. Q“ andlcw OL 9ball be Coin q d for aach lot. pu’s. the qua3ity hdie.tlmi Mrnft er Q~ ler q bd k uood for tbae~e ti u-r •~. qcceptability . er q .. percent defective..und in the table from 100%. 1 At Start of fa. Uied numb.1 S&l* Specific& 3An& Tbe emilmuea lot percent d q 1 eetlva qbQ b. tir q p.d ia9D0ct10m 91M31 be ttmtituted wbem tbe estj J td &t&f procemi qverage computed from tb8 cu.m defective above the uppar limit or below the lower limit i.nl de fcct. Ay lot . lhen Table C-5 i.uble e.1 Abnormal R. c-.ed by .~e Tbe . normal Coaiitimms are quch UDd vba. ii.. . avera~c.?.. uft.titn.izc. pe.. t of pr. C13. Tishw.2 Dc. pectmn.bdl be incitided md. q verage p i.. aegativ. ct+ q Tb..af ..timateii lot pe..mP.2 Compufatio. de. Spccificatioa Umit.iar.=m computed from tbe qampliag i. The quality iridice.parately with Cfu ad QL q nd the .tinuted 10I percemt defective. pL’. . Tk .t ion Ilmft.. peetion of qmple. The C13. Table C-5 is cmter.=. called [be prc. ) C13..3 Tisbtened fxukmcfion.pec of im.. Ou or 01. baaed cm the rmt~.

.a G.pecxic. eccvra A M k rejected. Iled=ced inCl 4.. ..di.give. Tba T-values qr.ltwtated.r age compted from 5.r D.ith para~raph Cl 3-Z is greater than th= AQL. 1.m rejected.ted i[ the q verane of Iota her e. condition E..i~nat. Normal Iaspectlen one of the following reduced ia. or delayed.8 r40rmal in.. The ecttnu:ed pereemt defective for each d theme preceding Ietm ile. I Qa . COmdItkl c.prec.. M ‘my ti. T of sod when mere than q cc. .. thmdicioa B.tinuted proces. the q stimat.. bauld Cl 4.d im. C.d or Re dimed LompeCroon. tkn the AQ t. in Table C-7.n is qqtd to or le.. Sam #w P~ i or tightened -d reduced in@p@ctioa q re provided in Sectio.. . F.5 SPling PIUIO for Tfuhta. Production i- qt q qteady rata. . ha.~ vclfied ~r of towauto sero for b q tiv.a rrmy b. 10 or 15 101*. r..dl in q ccmrdaoee .rlaln ~r theme hats have emtimatea O! the percem delecctve . ln Table c-6 for tbeprocem qwer. p. irregular Camdittc. 10CC(see Table C-?). w impaetio. The preceding ten {10) lot8 (or . under norm81 inspection and non. . . than tbe applicable lower limit #bow. de. greater tbao tite ML tkmditi. Tbe q ettmatad procema age 1.. Cmditbm qva q hall be reinstated cooditiea. Partm 1 aad U.4 Reduced ln9PccUon. or for certain qampiius plar.a.. be. qpecti..# t. Prehcttom Dtber become.d lot percent defective i. ( 10) lots (or quch other aember of lot.uch other number of Iota deaigrmted) have bee. may warrant b. . Umt normal condition. uutitutad providd that all of the following conditions q rc catiafied: Conditioa A..xecedisg the AQL. .~ctiOU. Cightea..ctioa hall be reiiut.

0 . . -3 5 7 3 b 7 4 6 0 4 6 8 4 6 9 4 7 9 4 7 91 4 1:1 : 3 b 7 4 6 8 4 6 8 4 6 8 4 6 9 4 : 4 7 01 . . . 4 7 9 4 7 0 4 7 10 4 : 1.0 of Wm 6.10 .04 . z 4 5 T -L q 3 5 2 4 6 3 5 7 23 44 56 3 5 7 4 :7 89 2 8 — 4 6 9 44 77 99 44 7 :9 4 7 +9 4 7 10 — 4 7 10 — 4 7 10 — . -t--t 4 n 11 4 -8 11 . . q .e. 10 — 4 1! — 4 7 10 — 4 7 10 4 7 10 — 4 1: — 4 7 10 — 4 e 11 4 a L1 — 4 . 4 11 44 80 11 44 67 99 11 : 11 4 8 11 4 8 11 G . Acceptable DIM .ned Sy Lewd .4 7 10 4 7 10 1: 4 11 4 8 11 4 8 11 : 11 4 5 10 1: 4 8 11 4 8 11 4 8 11 4 8 11 4 a 11 4 8 11 4 8 11 5 10 5 10 15 5 10 15 5 1s 5 10 15 5 10 15 5 10 15 5 10 15 D q . E . . 1.25 . c q .spcction ‘ectke] Range Me3b0d of T for Ti~ht.? d4.4 44 7 10 44 7 10 1: 1: 4 78 10. q q . Sample code #ix.6s . T?.4 :1 ! 4 6 e 4 6 8 4 6 9 4 : 4 7 9 4 . q .5 : 8 : 9 4 1 F10 4 ‘7 10 44 78 10 4 : :8 10 . z > 4 3 4 5 z 4 s 3 5 6 F . q . 3 : .15 . C-6 k.065 . 4 :1 : 4 6 s .0 44 15. letter B . .MIL-sTD-414 11 Jme 19s7 TABLE VA.4( . .4 6 9 4 : 4 . 7 : 7 4 6 8 4 6 a 4 6 9 4 7 9 4 Ii : 10 4 1: — 4 7 JO — : 10 — 4 a 11 — 4 8 11 — K : 7 4 6 a 4 6 a 4 7 9 4 7 9 $ 11 44 a 11 1: 44 88 11 4 8 11 11 : 11 : 11 : 11 4 8 11 4 a 11 4 8 11 4 a 11 10 15 10 15 L M N $ 4 8 11 4 8 11 4 8 11 4 8 11 5 5 10 15 5 10 15 0 * 44 80 11 11 15 uid MLvm3umm. .H 1: 3 : ! “3’ . Number 10. m ---- .1 4 7 0.1 3 5 7 J .

m z z IT Vale.MlL%Tn414 11 Juna 10S7 TABLE C-6-CooUfoJad Lmspcuoa R. and the pr-. .40 5A .5 “4 4 788 10 11 w 11 44 f5a 11 11 44 a8 II 11 I I 1 44 laa 11 11 : : 11 11 11 4 a !1 + : 11 4 a 11 4 a 11 45 10 15 to the 1: the middle li~rc of percent Tightened inspection i.-g.15 44 77 10 10 4 7 10 : 10 of the lot The S-D 5 lot. exceeds the AQL.fiiwm in each block refers to the precedim preceding 10 lots and lhc bottom figure to the pre&ding I S-lot.. required when the number of lots with q .?5 . ce ble Ouatit . Method Q-lx Aff estimates ‘=%!7 . al .e=m averaae from these lat. or 15 lots i.6s 4 1. 10... ~rester fhan the given vtiue of T in the table.d A..timatem defective above th= AOL from the precedin~ 5. percem defective are obtained from Table C-5.1s [ill 1. d T for Ti@t-..10 .0 .

004 .281 .00 .10 o q q code letter * . 50 3.50 1.20 4.50 .00 1.42 4.s2 10.061 .003 .51b .131 .00 i 12.96 10.230 .151 .2.40 1.37.008 .2 .?..00 1.004 .04Z .74 b.755 1.174 .00 L 4.35 1.060 .000 .52 6.50 1.OO A 5 4.45 J5.s0 2.075 .002 .40 I .19 5. 10 15 5 Jo Is 9. [ 9]** 6..112 .148 .91 10.14 .5 10.449 .50 G [loI** [12]** [ 8)** .202 .24B .34 1.0.861 I .00 A 12.00 A 12.037 . 4.41 3.50 A 6.00 .00 A 10 15 q Th-rc ~rc no tunpllng plmo provided In this Standard for the-e code Iettera and A(3L vduos. [IO}** .65 .27 .00 3.?2 .0 [28]** [18]** [121.47 2.028 .600 1.00 6.13 I 5.00 & I .009 .00 .00 1 10 15 5 2.25 .000 .68 I 0.27 6.90 1.007 .199 .00 4.069 .* [18].00 .40 10.110 .042 .004 .014 .65 . 10 15 5 H .)4 2. .01 15.s0 2.42 2.30 .39 1.00 & 10 I 5.00 .00 .50 A 7.015 .0 or z.ato Number Ssrnple *ize .pectk Levels 1.014 ..65 15.65 .011 . . .006 .06 6.39 ?.025 .199 ..466 .?52 .40 .104 .000 .66 E q q q q [JO]** [23]** [17/.oo D q q q q * q [)1]** [25].12 2.b5 B q s 10 & s Is c q q q 4 q q q [45]** (31)** [221.691 1.017 .00 .s3 3. .06 15.1$ .020 .50 .40 6.522 I .067 .Z48.?.63 4.000 ..74 9.094 ..26 1.S7 4.40 .50 a 7.010 .27 2.84 4.01’ 4.19z .158 .032 .50 .Jsb .101 .43 15.000 .015 .50 .0 .001 .?0 .001 .04 .00 b 4.002 .052 .00 i 5 15 r * [191** [141** q a [II]** .00 .017 ..TABLE RWISQMethod Llmit# of htimxcd Acceptable Oudity .040 .00 A 10 15 5 1 .209 .5)6 1...002 .s0 1.498 .00 b 8.000 .oo & 11.006 .422 .478 .5 15.84 0. [13].16.* [II]** [ 9]** 0.021 .326 .5 4.010 .0.065 ! q q q q C-7 Lot Percent Defective (or f2educcdfn. .0 [42]*.079 .11 6.096 .s0 1.50 1.000 .047.042 .118 .044 .17 I S.90 .30 to.94 2.04 6.061 1. [15j** [[O]** ( 7]** .92 10.

00 A — 1.4044A /.648 1.15 .968 1.012 .40 . In Part 221 et Sactlom C.144 . or 15 IotmIc bdew the figure @iven la the labl~ raduced impectlea (or sunpllng plum marked I*.013 .00 b 5 10 15 5 10 15 L .0 It .15 10.103 1 .7Z Z. in e~eh bl~ck tho top (Inure prccodkng 3 Iota.g g$ obtained from T.40 2.015 .00 k’ .016 .o~ 19.00 1.119 1.15 . Reduc~d Impaction may bo Inotltuted when every emtlmmed lot percent defectlv~ from the preceding 5.246 . q re q re 5.OZ 5 15.093 .069 .062 .1s .50 & 4:00 i .94. 9.mthtued .00 N .332 .088 .190 .08 .1Z9 .1) .oz9 .581 . ref.Z88 .06s .07.140 .0s9 .021 .0Z4 .Z)a .112 .09Z .Z7 10. r# to the :! !.46 4.z16 .109 1.010 .04 2.19 4.50 b 1.065 .139. :tke.1s” 3.08 Z.09? .562 .40 .434 . tht (Irml flsu?o In diractlon O( arrow aad corree~adin~ number of Iotn.010 5.10 333 3.Z5 6.04 .5o l&A 9.010 . the mlddlo Npre ‘to tho preceding 10 Iott. btlnmtem of tbe lot percent defective ~1 q 1 .ble C-5.50 & 3.023 .0)8 .so b .00 10 1s 14.Ozfl #.99 4.149 El&E!! Ipt tholI In the bracketm.01 8.013 .146 .65 .47 1.6.00 14.BO 6..0Z6 .174 .076 .033 .857 1.?.s0 1.65 5.15 2.064 .078 .391 .002 .036 .10 T y TF .32 4.2Z 6.0 z .064 . dt other condltiom for r-ducad lnapection.50 A 2.00 i l.65 .06S .50 & P .o4l 1.15 .2Z6 .50 1.051 .z06 .Ozz .007 .144 1.10 .00s .25 .90 Z.326 .00 Z.004 . mumtbe q attmii*d.00 A 5 Q k .15 1S.036 .636 .65 . 10.056 .00 1 5.6o4 .049 .00 .50 A .00 11 10 Is N] AQ T# Wm.11 10.020 .? 2.5 .378 .? 1.041 .1OZ .86 4.) in tbe table requires that the e8tImated lot percent defecllve la equa2to -ero. in tddltlam.5o 1 tt-t- 8.48 10.50 A h percent clef. I TABLE RUIIO Method Llmltc of ZZctlm~tedLX Pereent Defective for Reduced fmpectimi C-’I-C.6 .00 1 & AA 15 .5 .s0 & 2.389 .04Z .00 k 11.00 bd 13.087 .87 2<50 A . .Izz . z7 15.09 .509 . and the bottom figure to the precedlal 15 lots.50 A 1.25 .40 5.90 6.046 .014 .35Z .92i 1.Olz .Z5 .54 4.00 b . for the number of comecutive Io!* iadlcsted !n br~cket~.

434 .694 .517 .529 I I 442!3 .478 .004 * I 1 % K .907 .949 .708 I .64z .417 . abiflty.26j E 1 695 727 765 . tht q .618 I I .412 .197 .556 .486 .923 .572 .49? .454 .MAR .908 N 115 85 .444 . The formuh 1. TABLE Vducs Of f for h{dmum :ceptable Ouallty Le !It (in perct .490 0’ 175 230 .I md u-e the corre~pmtding value or f. Tha werap ruge of the .J8Z .469 .399 .64S .78. bd doe.684 .6OO .934 .525 .an limit u .442 .pecificati.555 .463 n .not [utrantee.mbm.460 .00 I 10. based on the average range of the munpla of .4JZ .4[6 .764 .503 .nd lew.480 .455 .542 10 . lot accept.43.3 .396 .785 I . helpc to inoure.96) M it- .481 . find NOT&: There h t eorreopoadkg occepfablllty constant In Table C.504 .4’?2 L .846 r 15 .480 .985 1.369 .666 .wn varlabUity.503 .426 .677 .50 de/cctive) 4.621 .6)7 j .68.447 .419 .843 .ls Ieoo than the 5dAR.405 .537 .5)8 . I for eqch .811 + .509 .740 .756 — .594 .531 .699 .593 .857 !801 1.507 .580 .637 .s08 ] .384 .384 .517 .56o .516 .180 c D --t-% + .628 I .412 .548 .464 .194 I .720 I .441 .564 .4?.477 .441 .816 .6OZ .533 .04 .910 I .540 .567 .50 ’77 .416 .748 .028 I 1.411 .455 + .19) .588 .730 -t.649 I .ca#e.637 .542 .752 .9 .426 .402 .879 I 1.190 .427 44’I 470I 497 .923 . lIU-L).804 .442 .371 .438 .830 .406 .408 .421 — ..707 .642 I .411 .00 115.118 I 1.129 I .865 6.065 2.891 .454 .505 .? . of Iha ounpla when uaia# plant for the double opecUicatian Ilmit .41z .011 I 1.434 .457 .6OZ I .398 .608 .519 .676 G 15 30 35 40 50 60 .9 .smple.958 .411 . tl It. The htAR serveB as a guide for the magnitude Of the average rang.aZue of f.300 .96S .00 Average Range (hfARl C-8 $ample #lz* Slrnple CO* 3 4 5 Ienor 91s* B 1.49J .)92 .463 .0s6 .486 .656 .527 . ccepttbillty comtant of T-ble C-Z in T~ble C.318 P -1+ For a i--l-- The MAR may ba obtdaod by multlplyin~ the factor f by the difference between the upper .573 . reduced hirpection. r speciflcallon Ilmif L.

qmple mea.ingle lat.er4ea w~cb The mmay exceed the AOL given in Table C-6. pro . U Mtitun allowable C-> scuf C-4. t subgroup. in size. The difference betweer.. Sample q. S-pi. different AQL value. . U L Ouafiry Ouafiry fmdex for “. . bgroup.ampl.t C-3 and C-4. . ~uxn mflowmble pert.em in Tables use wbem differenf AOL valuca for U and ML de f. R bar Aver. Upper faumx spec Uication apecificstien limit.ed in determinizi~the quality index when using the range method.rm Range.rc. fecfive above U gi.nta [ram q single lat. fF~r u. . for U ad f.etic mean of the rug. . Cbe proce. The estimumd The q stimated p.t mea. Arithmetic from .. cd the lot percent of the 101percenl percent and C-4.= wijh Table C-5.ur. (For L q re specified.?! m Read Definition.cti. 4: er 7.b The acc.pecific.tion um number of emtin’tated proces.. q re cp=dfied.pcability A factor u.) percent d. t and qrnalle.—.ub. blew f..tinut. average. estinmt=d prc. values of the subgroups ef tbc sample measurcm.. a.o. 3. (For use in deffr_ WW+fiCafiL= U fi~ht=aod Ampeefloa) 8s . Siv. the qubgroup i.d C-Z I u L k c O Q qub q. the Iarge... defective above U from Qu QL fndex for use with Table I I Pu p . C-3 and C-4. conctanr given in Tables C. the #ubg. limit.. .~e ruag.ub U Sample estimate Table C-5. The arifhn-.1 nc.tixnale Table C-5. & this Smitdard. r.e.s SY@. Range d the qecond subgroup.f mL-SlW414 . . @f the p. in which m .e -ha. the same a. . defective defective for below L from Totti SUTIple estimate M&imum given q llowable p = Pu + PL.era~e q verage for UI upper qpecUication for a lower lf-mit.11 June 19s7 APPENDIX C mMlmitfO.. The c values q re given is Table.p site <s 5 except for them= plan.) p bar p bar #ub V p bar suh L P $U FL T .... of the let percent ‘L P p qub f. meam of x R %rnple mean.m in Tabfe. C-5. sample X bar q ike far q single lot..ece. ths . q mtimam. mests in .m defective. I M defective sample in Tablmm C-3 % M.m. i. which ea. limit.ee. Range e: the fir.

1 U.rdmce with paragraph A7. =d on v8ria imsle qeetfkattc$m ltmlt bttlcy ~ k? q q q re Tables D-1 and D-z.Az4wmz OPERATION’ N?onu OF 12s 8ampffnR PtM.L)/. 91ZC code. peetion q nd from tbe bottom for tightened im. the applicable . u upper Or q 10wer limit. and ACIL value. The dearof a quality characseri. dependins on whether the . qccarrJa. with para#rmph Com.2 timputation. variability of the lot with rcapecl to the quality chbracteri. with tba qcceptqmantity qbifity coaatant L M (U-X)1. tfmbg=-e~ ~ . are identified am Form 1 q nd Form 2.the upper specification qpecKicatioa is the low-r i. q nd lhose in Description of S.3 Determination of Sample Size Cod.peciftcac ion limit whe. each qampl.e. quantity {u-X)/_ or qhail A7. tic with re. Is 18** tbn k or Decative... qamplms btlltv Criterion. corrcapOd@f D3..L X e i.amding to the q Table D-1 i. r normal i.. tbb.letter . SUMMARY PUR 8mAuNGm..niph she qhowa in t e mamter table correspoadhs AOL. pect to a •in~le specification limit hall be judged by lb. im i-dicated in the column of the maater tabl* pplicable AOf. or ~. The rzm.I. q nd is the bnown variability.1 PLAN D3.apectioo q re provided in Table D-Z. known. used in tba sunptiQz prO=eda.)/. fo [1) Determine [be sample sise coda letter from Table A-Z by u-lr. 1 Acceptability of conformance (x. the sample mean. D-z for rod. qhe code leffer & lS.fficatiom limit i.unpl* Tbe s~moclated qcceptability conmtant. SAMPLfNG PLAN FOR sPEC1 nCATfON LfhffT SINGLE This part of the Stand~rd de. I fo. WT-BY-~T CEDURES ACCEPTAEfl-~ PROWNEN FORM 1 IS fJSEf# D3.. timpar.omd (m -rmsl Ind tightened tnapectiom and T&l.ced icupectioa. mentioned in paracraph DV. t.2 Drawing of Sag. SELECTING THE SAMPLING wHEN FORM 1 IS USED DZ. Mntlt. Ior planm ba.a Appcadis m i.p. D1. n A. p. llmit. D-I q nd D-Z.L)le i.. ~pfe Sise. . Sampling plan.a.I Ibc lot qiM ad tba tipecftoa lee:.pection. Criterion.cted from Table A-2 tn 8ce. vafue.pf. the . D4. iom of Sectic. Tablo D-1 i.te r samplimg plan ia ebtahed DZ.nmmtm 01 q .)l. for reduced ic. T he m-pie Letter. D2.2. tic Tbc acceptability criterion i.L.ampling plan shall be umed in accordance with the prcwi. or (X.fOr q qin81= .quf ’te ox sroater qcc*pfabfflfy crtsertcud If (U-w..ntered from the t. q Z~-~PIe COmpfete . =* fer u*= with plan. be dramt i.2.. I D1.1. from k. The .mpling thi. To determine the qcceptability whether the lot meets criterion with respect to q particular qtmtity chsracteristi.ce “All -ample. The folio witas qu~tifY q ball be compute& (u-X)1. General Plan. tin tbe lot dOa* mt mat tbo 8cc*pfAbtltty c rlterioa. i. psrt of the Standard. Master Sampliq Table-. PIUU bned oavar~U~ D for d= finicia=u al all qpnbals D. givcm in two equivalent form. I.2 LIMIT Acceptability 01.. Z Obtdmimr q Table DLL.tribes tbe prOc=<u.. corre. wd M pli8* ph.c of Samplinu Plan..r fabJe. qbility comstaut k.tant. Th= q=c=Ptto the SUTIple is. D1. Tbo Qu81i. where U .sunpf’e Of tti 67 . C.L)I.hdf ~.MIL-STD-414 11 Jffffa 10s? SECTfON vARIABIIJ’I-s Part 1 SINGLE D KNOWN SPEC1fICATION Dz. or (X.2. The.

peciiicatiaa limit L {f- qlso compute (5) lf the quatitity (U-X)/.f q quality eha~aeterimtic .ug plan . DE.X}v/U q . (4) Compute tbe sample meX. equal to or greater lhas k.unpfe size. . . cedures D5.4 Acceptability Criterion. e M.hown in the rnasler table .137. [U-X) VI. The rnaxirnum q llowable corr.. The ma. q.unpl.. provided in Tables D-3 and D-4 corre.amplimg plan is obtained from Master Table O-3 or D-4. obtaizted cmte.. q re the . the estimated percent delective in the lot q bove the upper . sampl. able P.Cceptabitity Coti.unple ef u (3) Seleti units from the lot: inspect q nd record the tn. the lC. respectively.. O. acceptability crxterior. The laclor v i.r m. the acceptability criterion.imamd b~ qnfcrTablt D-5 with the quality index. exunple I -—— .i%e rI qnd the . D. The of Oualilv D6.hdl be judpd by the prc=a of ~~conformimg producl nutside tbe upper Or lm. pect and record the nma.armaf inopecfioh and frc.cuon.onsi. from Mater Table D-3 i=e U. for q lower . img Table D-5 with OU or Cfti D6. Tabl..t. limit. Z Computation quality ic. 88 precedure.. %ai% Db. X. D5.timalc.ing the lot . The .md tip. . D-3 qnd D-4 of Part IL Table D-3 is used {or normal . if il is s lower limit L. I Master Samplirm T. the lot meet. U (u-X)1. . fbe or D-4 by qelecting lhe qunple q df. 16) Determine the qmtimsted lot prcasd defective PU or pL fram Table D-5. ~ and . Z Obtainin~ the Samplinff Plan. or (X. q Pecificalion limit. 141and (2) Obtaia plmr.mtag.wable perfbctor . Sunplirig plans for reduced Iamfmctima.unple of n umits from the 10G irs.mplc mean and known variability. ed on vari.. merit of the quality characteristic Ior each unit of the q ample.de= QtI ..ampl. The quzc.nmnt 01 the qualhty charutari9tic on each umit of tbe qempl. maximum q ti. than M. r-wr~pb D5. complete quality index f2u .1 Sample Sise. The . amur.ise the in. [5) Compute the ( U. If q . lade-.rc. atio~ limit with respect m q . SELECTING THE SAMPL3NG WHEN FORM 2 3S USED PLAN D5. 1 I* irtdicated in the Colwn. qnd maximum qllowable perccnl an qssociated defective.ptabillty criserbn.3 Estimnte of Pert. . poadkmg b tbe sample qi.ingle specification q rc Table. [4) Cornput. . pecliem level. SUMMARY SAMPLZNG USED FOR OPERATION PLAN WNEN FOffhf the OF 2 IS at random ~ha .F%%%$. or C3L = fX-L) v/. t cificatimn limit U = (FL)v/. ~h=n th= 10t do= C@ IIWCt cn..er ‘S=.x. The quality of q lot qhall be exprem.z.are provided io Table D-4. i~ve M for 9UTIP1. Iirnil bilily knc.ad tightened inspection and Table D-4 for reduced inspection.e meatlomed i.ur. ef nomc.m’nple size code cer from TabIe A-Z by . EXamPI. rninethe . from Master Table 33-I or D-Z by sel=ctitag the qample . D-2 far . upper puted if the 8pe. The de~ree of con>ormae. The p.h..pecifi.pfar .peeified. ed from tbe t.rcecIt De~ereent fe<tive.mL-snb414 11 June 1957 (21 Obtain PI*. D5. me.iagi.i=e code letter. ~T-BY-WT CEDURES ACCEPTABILITY PROWNEN FORM Z IS USED 3 steps summarice The following tO be followed: Pro- (1) Dele. rreaportdine to each s~mple . l-” owcr specific alior.ta-t k.-* i. (x. ed by Pu. qnd the quantity (u-X)/e for an u per specification limit U or the quamtity L)/. bles.L)/W is Icaa :han k c.litie.I meet. ts c. or the qstimated percetit defective below by P ih. Z Maximum Allnr. the .ce c. Z.{ q ample .nt Defective in Lot.i=e ~ i.ading to the . ification limit U.m tbc bottom let tight.un (~r q .rnpling tables for plans ba..pecificstmn limit. The D5.r eesative.lf be corn. The citimated by percent de~ective PU or pL i. of thl. 1 is acte. D6. them the 101do=. the acceptability criteriotx if PU or PL is ~reater than M or U QU or ‘L ~S negative. limit im u.2. qnd the mulmum cent defeefiwe M.iz.L)/a i. not meal the acc. (3) S4ect st ramdom tbe . lf pu or pL i’ equal to or le. Compare the” estimated 101 p=rcent defective p~ or pL llowable percent de fcc with th.nferming product i’ q . 1 Acceptability Criterion. . pc. upper . of the mseter table corrempoadiag to the ~PP1ic~hle AOL value..

b 7 8 (63. SUPW9C fhe Table.cceptabiiify lbequal to or greater tbui k. if ( u-X)k I I I 89 .000.to be determined.000. im wubmicted for inspection.riabitity: Sum af Mes.000 58. From with AOL .L)le CoLI. 1.67 k Compare (X. to be u.I D>.000-5. yield point..000 1.000.~ u ‘u h ‘r “ “ ““”=’ ‘. thea the deem the =ccopMbUitY criterion. X: ZXln L 63.500. tbe quaatlfy (U-X)1.. is le. of the qunple specimen. 6z. th= ~ tm i.000 I 2 3 4 5 Known V.L)/.500.5.500.let M “ ad ‘f ‘4Z QL nesattve.ded Lint — 1 Sample Sise: Information n .70 6J. S6.000.000. Value Obtained io 3. cricerla~ the lot meata thm qccaptabiii..5S i.MUA7D-414 11 Juoa 1SS7 (7) U the emthrmtcd lot percent de f.3 mot meet the =eceptabi3ity critmriom.00(h 59.500.000110 Speeificatioo The Quantity: Acceptability Acceptability with k The lot does Llmlc (Luwer): (X. the . dnce (X-L)!. Expluulion with the acce?tabilitv Ne.autred. 61 . A lot of 500 item. 69.seen that q mample of qkc iO io re. 68. normal Ia. i.c UW* pU or pL im eqtml W or Ie*a ttmo tbe maximum atlowable percent defective M. q re: 6Z. 64. knowm te be 3000 p-i..000 IX 630.70 1. D. taat: Criter- I I I .000 psi. criterion i.rcmcnt. The variability . 65. 1. crit=rio.d. EXAMPLE &Ample D-1 of Ca3ctiiiam Form 1 SiaCle Spec51ictii0a L%iitVariabiIlfy t(cw-n Example The qpecif ied minimum yield point for certain qt4el c~-ttags is 50. and rompliame 60. I I NOTE: — ksie upper specUiCatiOn ltrrdt u i.: Sample Mm.67 c 1. A-Z and D-1 it i. tbeh compute If q q b d compu~ it with k the 10C meet.poction.000)/3000 See T-ble see Para. SWen. lo bpection Level IV.

tion Iii-nit ff i. upper . ff . 65.teel casting.000.054 Know.*S than Mwith W.76 3. 1.: Acceptability with M Critcrian: 3.5% is to be u. From Table. .000. The variability e is known to be 3000 psi.054 OL : (X. Par.4 .500.L)v/o ‘“1 ‘L M pL ‘Crcent Max. given. is submitted ror inspection.000. 60.in S8. Percem Def. normal lnspectlon.a.92% a 3. with AQL = 1.SuPpa. the qcceptability criterion F- 90 I ------- .. sin 1.54flL-sl’13-414 11 Jumd 1957 E~LE fkampfe D-2 of Cafcuhtfonm L4mit .000. e the are: yield points of the sample mpecimen.awabl. 64. Explanation Line — I 2 3 4 biforr?mtirm Needed sample size: n c xx Value Obtaimed 10 3.000-58. (63. Table D-5 D-3 D6. .63% See Table S=. . A lot or 500 item.urerncIll’: sample MeFactor. and compliance with the qcceptability criterion is m be determined.000. Ouality fnder: ‘m’” ‘f “ ltiwe r): f- S8.abifity criterion.927.Form Known 2 Single Specification VariabUity Example The specified mimimum yield poiuf f-r certain . Variability: sun-l of Mr. e$ the qccepf. .000 Se. .. .500: 62. et. Compare The lot d~es not rn. ~E since PL is great=r than M.000 !.000. 62.. 58. the 1.pecific.500.s rn. compare PU (U. . 61 .63% 3.000 psi.000 63.ed. the.500: 68. A-2 and D-1 it is . 59. required. compute the qu~lity index Qu = defective PU.- . XIV . m lme 7 and ebtain the sstimale -f $he perceml if pu i. v X: TXln 630.cI that q sample of q ize 10 i. A1l.000/10 5 b 7 8 9 10 sp=cific aliOn ~mi.000 1. q qual 10. 69. inspection Level Iv.000 6>0.0.- .000)1 3.

01 13 26 I I I 23 30 44 59 2.21 2.o7 2.64 2.25 2.33 2.77 2.39 4 2.40 n k k n a k .54 2.46.2.45 t 5.13 2.58 3 4 2.69 2.96 1. 49 2.81 2.63 4 2.94 .58 -1 2..41 Z.7? 2.4J 2.35 Z.29 2.03 2.80 2.04 I [ I ak .s0 6 2.37 I ? 8 9 II 2.?. 2.TABLE D-1 Matter Table for Normal and Tlghtenad Inspection for Planr Baoed on Varlablllty Known (Single Specification Lkmlt-Form 1) ccepttble Ouallty Level? (norma2 Inopaction] .21 2..62 2.10 ‘E r1= Acceptable Oua21ty Levalo (tightened lnopectlon) .S4 2. 5 2.1s [ [nklnklnkl .34 .11 2.7? 2.14 2.3s 2. M N o 27 2.la 2.63 8 2.25 ?.05 6Z.0* I I 5 1.29 2.15 2.69 2.12 1.54 11 15 20 .063 .57 2.12 2.71 .4 6 2.30 4 2.?.14 — .72 2.‘“ 1.59 12 1? 2)34 45 2.06S .18 i .88 2.41 2.62 .95 G’ 4 3 ++” I I 1 ‘? 10 1 H 5 6 6 7 8 9 11 16 22 31 42 2.16 2.96 10 2. 1 1 .10 .97 ~ ..13 2.92 x 8 10 14 19 1 5.49 8 9 10 12 14 I I I 21 27 40 %4 2.59 2.48 ~o 1 6 .65 I 8 10 1.26 2.5s S 2.49 2.31 2.4s 2.12 2.29 I I 13 19 25 31 49 I 62.00 J“ 2. I I I ..65 I 2.99 11 “2.’ 37 2.65 Sample 91*c code letter B c — — D E F F — 2.25 .

I t I 127 1.17 .00 I I When S~ptO site equa20or q xctads tot I AI I!fi::v.79 22 [.964 27 ..906 ..53 1.9.28 .75 1.89 61 t--I 70 93 1.9 I .38 J. at cunplkag plm baZowqrrow.38 1.11 1. Acceptable I 1.44 1. 75 .00 !ty Lavelo (tightened Incpeclhm) 15.13 1.48 1.07 I .924 .20 6 7 1.00 n . .877 .tlon Limit-Form II =s ?1 .69 1. 55 I.00 Acceptable O 36 48 25 20 1.65 t 1.83 .36 d z ~~ * B c I v v Vlvlvlvl D I E 3 1. --- TABLE D-1-Conl[nud Maoler Table [or Normal and Ti~htenid Znopectionfor PlarJI Based On Variablllty l(nown (Single Speclflc. M N —— o =-b-t=-.10 1.68 1.11 I [ 9 11 13 IS 1.00 n k l== v 2 z z 3 4 5“ 1.r.942 I I 12 lb ..35 1.57 1.89 El 36 1.s6 I I --+-H%1.00 49 65 2.00 10. 8 ...5o 15.42 1.719 H 1.50 82 109 1.? J 4 6 B 1..67 1.56 I 18 1.29 95 1.685 .49 10 1.$9 . 1.045 I 1.45 8 1.62 1..51 6.86 42 1. idol k ’ . item in nzuat be kmpected.84 32 1.s0 10 1 — I “1 f l-- K Ill 24 .50 I 10.04 ?1 1..61 1.34 1.03 54 1.197 I .50 4<00 I I I k]ak 3 n 1 1 kink 6.8I9 I P 2.07 Ill .93 39 3.25 2 1.50 Z.51 13 1.05 ] . I ..841 Q ..991 I 7 9 12 Is lZI 20 1.50 2.S6 12 1.29 1.70 4.28 5 1.75 1.33 1.53 Is 1.97 28 1.88 14 1.649 . AQL VdUS* q?E In Bercent dafectlve.. .09 . that ln.20 24 .737 L. 147 .09 Is 1.01 11 14 17 21 7 9 II 12 14 10 17 25 31 2.51 1.42 1.706 .— nk 31ty Level# (normal Inmpeetim) Sample q Ic* code Ietlar I .15 1.46 1.S84 1.31 1.72 1.28 4 .Z~ ] 64 1. both aunple site *8 well amk value.

04 .25 I 3 1.91 J’ 39 I 2.59 b 2.65 Z.3O 2.25 .40 .08 2.13 2.46 2.S.b9 II 3 1.58 7 2.01 3 1. I TABLE Msomr ~nbte for Reduced Zn8pectionfmr Plant Baiedon Variability bon (Sinlle SpecUicaIlon Limit.34 2.6 1 3 4 Y.b5 1 D-2 Sample aico coda Inttmr .s4 5 5 6 4 6 ‘k 7 2.94 z .19 1 2.J8 2.35 9 14 Z.12 2.99 I II M -=-H-i =-l-=-i * 19 N 0 1.07 2..77 16 11 2.13 5 l.19 3 I 1 3 2.41 21 2.07 2.’ 914 L 4 2.49 2.7a II K 132.05 2.065 } 8 k m 25 c D E — r Z 1.49 2.21 10 [.14 2.86 I P Q I 15 z.21 4* .23 2.59 F1 R 3 1..ss 5 r a 13 a 4 2.23 2.91 s b b 8 2.3b G z 1.0% 2.34 2.55 5 6 6 11 2.581.42 I 34 z 1. z 1..46 2.Form 1) ble Quality Levelo— .aa b 1.37 7 la I 17 2.10 .50 2.15 I k n k n knk n knk .26 2.

79 1.:.46 18 29 42 1.755 1.31 8 1.53 1.1 1 1 11 14 14 17 21 33 49 . Breed On Variability IGI.991 9 11 12 15 1.4 18 56 .49 1.21 1.42 1.24 1.60 1.44 t. .61 \s 13 10 1.5 2.31 10 1. E F 1.atm 1) D-2-ConUnued .34 1.? I?lan.01 1.17 2 1.685 .706 .8.584 .11 1.50 “ n k ‘Smple Siso code letter 1 B c D..919 .35 25 I 36 1.641 .?2 P E Q .13 1.Wm (Sin@Speciflcatlon Limit -F.1.01 .515 z .936 1.770 .50 4.5j 5 I 7 1.03 0 8 !2 16 16 20 2.877 .11 5 6 6 1.4 .942 .49 1.719 .0 6.20 3 .ZO 1.70 9 9 L S 10 a 11 13 22 I 32 M N I o 12 19 28 1.1?.584 .9?.8 G 53 =--l 6 . TABLE :s :8 Masltr Table {m Reduced kicpectbn f.649 .39 I 51.62 4 5 1 I 2 I 3 I J .906 .00 I n ! ! I k n n k n k k m k 1.65 1.53 b 1.09 a a 9 4 41.797 .— Acecptable C2uaIityLevelt 1.45 1.685 .991 .573 .15 1.995 1.906 .35 .803 I J K II 1.11 1.797 .28 4 1 3 1.2s .84 1.28 5.33 1.51 I 1.39 5 4 1.60 1.

bfi b~.: ~Iv* .&-T-Y~O I D1l. K dKferemtAQLos applicable AQ3. the 10wer qpeeificmion a facsor providsd in Table* D. = ~ t e master ZAb3e. 1 U. qball be ~omputed. The . known. D-4.g P1_ A qunpliag q 2*.IJaforzniq product La estimated by enterkg I . demtsuua th8 -tmmm tile-able percent defective by ULIOZ es .d. 01 q qmple .cte. i Determination Of S=mple Sise Code Letter. D9.r use with pftis for q double Specific-tiom limit when variabttlty of the lot =ith reopact to the qtmfky c~rscteristic i.unple mean. D9. Z Master SamPlinE Table. . D9. m aa~isad w qxb speckficatlon Umlt. SELECTWG A sampling . u one AOZ.s plans for redoced imcpeczion sre prOvided in Table D-4. m ito Table D-5 wAzh Z& quality M-x. sample D9. Si.of dafeectwe for table eorreaponding co tba wdte(s]. the applicable qampliag plan shall bc u. limit.3. 3 is entered tipeczton and from from the zop for uornuz tbe bosom for ttghtened imopectdon. T In accord- I q nce Samples #ball with parasraph #. TO determine w%the r the lot meets the qcceptability cri qu~i~ le.3.e.. d M q s80plaa Celia. ed on wuiabi3Itit q r= ity known for q double cpecific-tti T=bleD-3 and D-4. Table D-3 11 u~ed for .* percent th4 Imr.” -- D9.ihll be judged . Table D. 1 Sun 1. eerr*mpOndbs fa qize memfiomed in parasrmpb tb. i.unpte . #ho_ in the cdunm of the W18mter for .qssigned to bath l~ltc combined. DRAWING OF SWLES be selected A7. D 11. ..ion. md those in this part of the Standard. M4 by MU for tb= UPWr limit. nppe?. i. demipte tbe maximum A31.bility criterion. The q unple qi. The quf@ins inspection shall be ebtahed from 3dmcter Table D-3 or D-4..cleri~ tic et conformance al q qutiltY c with respect to a do~le sF&c Ification limit al ~con. where U L “ X .h.-ion with ?=*PCCX co q XrtiCtIISr characleri~ tic and AOL v’azuels). Gea eral DeacriptiOm of SkrqdiW Plmns. DE.$ection A.O rmal amd tightened izupection ud Tmblc D-4 for reduced inspect. sAM’PU?JG PLAN sPECIF3CAT10N _ FOR DO CfBCE This part Of the Standard describma the procedures f.11 be selected [0110-s: THE fMkfPLfNG PLAN the lover Itrnlt. 1.3 ~d tk .nm cd .. ACC~PTABIIXl%’ plan for esch AQI. Tbe degree r.by tbe perce~ The ~TCeIIUSS Of Wafarmiog product.dated maximum aflowsble ~rc=m defecPIti be qpp3Aed Jo tively). Z. 0rb04b cp*ctfication limits co~ta.ake from Tab)e D-3 or D-4 q D! 1.L)v/c. D1O.. D9. is iis is ia the upper specification limit. The maater SUnpl-es ier w bs. and zbe ksowm wariabifizy.d [ram Treble A-Z in mecordamce with paragraph A7.sunpli. (U-xwi e and OL= qua3ity iadices Q (X. . .wable p-rcerd defective by M.kUL-sm-414 llJums 106? Psrt n DOUBLE SP3ZC3SXATZON Lfb4ZT DE.2 Computation of Quality lndice s . T he qample q ma cade letter . 1. eorrecpondlag each qunple qtxe code letter -d AOL. mt.1 Accepi. Sampli. > Obtaining .e #how.ed in accordance with the prwimic.* Of SUnplimc Plan.8Unut.

procedtwe.ize and the in.ed: (1) Determine the sunple qise code letter from Table A-2 by u.fov/.nlL-s’nk414 11 JuIIe 1957 t.ingle AOLvtiue ~ ~bliohed for tbe upper and lower qpacififwle quality cation limit cornbim.tkm limit.%].dfowtbe prmcedurem fn be u.e. ample . (5) Compute the q~ty = (U. upper and b. the factor .ctivec tie tb. tbe lot me.U.cter . mquaf 1.e n.rceas defective M.r Dlff8remt AOL Values ..am Mater D-3 or D-4.Z. combined percent de f. . satiaficd.af d. mple of 13) Select at random the q n unit. q A to or lam than the larger of ML aad Mu. ts Or Ie*#fzlamthe u.c tive p = p“ + p~ .rceat de fectl. Z summaryc. lot umato the ~C~tdiii~ criterk other+se. ttmeatat of tbe quality characcerimtic on q . tbe acceptability criterion: if p is sreater than M or if Qu or OL o. +b *= s-Am . Za em=. . fective p i. (b) pL i. of (3) . for 1# e apper and lower specificatiea limit. QU .. from the lot.ise tI ...ad the I. from tbe 10C irIap.) %.L)v/&.. la caoe. t.rit.&e {Z] Select tbe san-tpliag plan front Mate.unple (s) compute the quality ad QL .cb unit of the sample.unpla si.3baa U ff the Id meeb the qccep3abUIty crUeri~ p ic ‘re=ter tbm M or if Of) or Of. q mum allowable p. respectively. in.ptiifiiy —--- . Zf either OL O* O“ or both ar.=bI= Perta=t de f==ttvew M d Mfj alao =Omi=r.inuted lot percent dequal to er le.t the qccep3abUtty criteria. f.aUOO LiInlL for Upper and @t (6) Determine the q. pect and record the m. mean X. the lot does MC meet the “’=~ or both am “’’”’A’* aesativ~ tbeo ‘*’ * criterb lot%::% m. lot (6) Determine the q. f. UMrI the 10. 5 COirtfu*e the qstdnuted 1 ot pmrc~t defeetivem m.1. h the cerro@omd4ng PU dth ~ -a. qnd M corresponding to the AOL va ‘Y ue.pecific.U. tbe qecepbility (CJ p b equaf of ML and Mu..lmw the lower . dal. the tolZowinS steps 8umma.f operation ef sPlan. or both ml meet the .ing the lot .te rmine th.. Obtti tbe . P . the 105.n of Sunplia Plan.ed: (1) Determlae letter from Table A-Z d in. Obtaio tb. ffun D1 2-2. (7) u all three of tbe fallowing diuolta : l. (X.8mpIe mean indiee.es ins to tha pa rc. = (U-x)vl. k. Umn the lot &es acceptabffity criteriam D12. and CZL = (X.peetio.tcp. Pfi + PU wittt k larger d ML mmdMu.. P ic 9qtmf to or Ie*m tbul Mu. Z Suna~ryef OP erati.arrtple.podirq to the lar~erof lb. ~ctabliched f.tImued p“ mud pL. eorre.. to be u. ri. code the qunple q by uefa. than the maxi. ae*. tbe .* Itapfive.Sp. ad p i. where a . ct q l ra=dem the .am~le n unit. tfI*n *let doa . two AQLva3ue. criterk the lot meat. . (4) COmpute the . tbe 10I doe.. L)v/. wtmre q diflereot AOL -d lower t~c. or lR.t tbe acc. e th. lf pL sequmt taarle*attmm ML. percent D-5.. indicem Qu Pi : D12.Ywable percerit delecgive. ria. pectioa level. Table (Z) Select plan fr. the “p-r Aficatiom limit for a •in~le qtmii17 character . pu + pL from TabIe (7) M tbe e. x.d (or a q characterimtlc. &e. Afmo d.tinmxed defective p .pl ability . 25 p u equaf to or lea.. urnnmrime imtic. o the maximum .. Table D-3 or D-4... and the rruximurn allowable perced defective M. ct qmd record the mcaauremcm of the quality characteristic on each unit in the ... level. rat meet tb. correspond p.eUi.. DIz.not meet ~e mccapc-bility criterion. z &w.. qce.ntbma i’ equaf to or 1. both q xe =S~~V~. athrwi. 1 Aceap4abflUy Crit9ria.8 Mu larger ~u cc.Uew*Ie ‘P~z~ti delceuve M. th. (4) compute tie . 03%rpe.

41 l. Upper Mean X: v Specification sXln 630. Size: n with the qcceptability Needed criteriom V.500. 3 4 Sample Know. 69. of Lot Percen: 12tc..054/3.1.: M n .unpl.000 psi.Z. 68. Pu + P~ Max. of q i.000 56. Frati . q the qccepzcbiflty + PL io sreater 97 ------ . s9. 6z.92% 11. — 1 ?..).92% Seo T*1c See Para.000-58.OOO 1.ct30n &val ZV.e is to b. seem fzut a variability c is &o-n to be 3.ite rioa: pu + “pL with M The 3ot doe not met cmn~r= . Z3L .mtple @ mitdmnun yield 3.5% 1. 61 . -— . rucpceUvel y.to be . (~. lnIornutio.4 than ~ A310w~ble Percent AcceotablI1tv C.500.000 630.000-61.000. bn~14 11*2ES7 EXAMP= D-S fsxanlpze of Cdcufat..000.000 p. Above D*I.93% 1. A lot of 500 items is q tbmitted for impec tloa. 60. determined. required.0311u[m cemd.054 Untie: Limiti U L 67. D-3 D13. 3nop. .000 See Table See Table D-5 D-5 Est.63S 11. of &t TelaJ ~*t.000)1. da. D-fBelow ~ ~~ (67.[. . 65.85% D. T& ?abka A-2 qnd D-> it i.63% criterion. p = pu Variability: Sum of Meaaurem6ats: Sample Factor.d maximum ad 67. I.85% > 3.ioms DOEbh sp4c3d&az10a ZAm2t XmOwm &w.000.. 10 o ZX 3.000: 58..: 11 J2 13 14 IA P& P - 7.4.054/3. PerccnI P=r=e=t . e the yi. aornd insPct3aa. SuPpu.000 psi.93% + 3.ld point.000)1. o0O 1. Obtaim. AC3L Vahie for Seth Upper E. Def. of the qample specimens q re: 6z.000 (63.e 10 i.000.000. 64.r SpeeUiea320a 2AMA1 Combined varhbmfy Dm. SOO.?b U: pu 7. i and 58.d Explanation. W3UI AQL = 1. steel rutimzN are The qpeclfie. qnd compliance Lb.000/10 See Table D-3 I 5 6 7 8 9 10 Zmwer Specific=cion QuaIity Quality Index: Lufex: Qu = fU-X)V/.000 63.500. 3.

000.e U: % ‘L 3.itis d the q 67.000. is AOZ. .S% i.000. 60.60% ~ 2.000.500: 6Z.e.10% Del. S.000 Ix 67.ise code letter.049 u L 67. Percent Pz. is submitted for inspeeknspctinn with ML = 1%.000. not meet fied.rnple . 62.59% s. B=lmu k (al Compare See Table Acceptabilit~ Criteriw PLI PI.64.59s Tabl.631. 60.> it i..000 pi.648)1. Z. A-Z qd D.000 and cmnplisnce Lime — I ~ 3 Sample with the qcceptability Needed criteria Value 1. 63.131 61. m be 3. p = pu + 3.unple cd ais. 11 14 15 . h bt: T. (b) - see Par*.rkatduty Difiere.10% >5. 59.05% > 5. Z(7)lb) s. 65.609 crIterl.**... q re The .1. A lot d S00 item. Z17)(C) (c) q re the mccep~bUity qnd p wM~ Dot q*- 08 .%rnple Mean X: Factc.500.60% 13. be u. of bt Percent Def.07 1. . qnd the AQL value Of 2. 4 5..~ ‘f (67. kcuaw.000 (61. 11 c~rre. pu q64U..Z.tl~o psi -d 58.03% Se..9 1. to be determined. Abo.. poridir.07% + 10.t KaOwt! AQL.000 58. that q .000 6Z..tnce 15(a). P. Obtained 11 Expl-ation Information Size-: n o Kn~wn Variability: Sum .07s - rernen:. pL > Mb 10. uarnuf The vari..000 1..: XXIC.d. . Allowabi. A31.um=slv-414 11 Jnne 19S7 EXAMPLK Exampte ml= of D-4 Cafcutatimu ZAmtt sp0dfka3A9n V. 3.28 u: Pu pL 3. D-3 D-3 - De[.r & lmwer SpeeUicDtinm ZAmlt. 61. 68. Frern Table.. . mple specimenq re: required. See Table See T-ble D-5 D-5 oOO = (X.131/11 See Table D-3 UPPe r Specific atiort Lirnic faw. 0 with Mu (b] Compare with ML (c) Cemoare with “ML The 10: dins. Z(7)(a) see Para. i.0491J.000-61. DIZ.01% 13.000 psi..L)*/a Def” -’e ‘“’cent E. 1.049/3. Quslity Ou-lity =.000)l. 2. D12.bilicy .5% for the lower tipecificuiom lkmit im m. for the uPP8r aad UO. Selow b Del. Vti.mt Pe rcest 2.atal Cat.. r: v 678.000. r Speci[ieatiea Index htdex: ‘t au QL Limit: = (u-X)v/.— . *CI IV.g to the s. Mu. 1312. znspctko.9.pecified maximum and minintum yield p0&39 for cer3mim oteel ca. 6 7 8 9 10 11 17. -.ppc.f Me..648 -SB. Z..ss for Upp.07% 10.wable Pe r.: -. reapectivdy. e the yield Pc.500: 64.

. q firm sunpllq plan balow arrow..tb.—. bath mmpsa 01*4 as well as M valua. . TABLE nd Tightened Ioapectlon ~or Plain Bamadon Known Vtriabllity Table for Normti q (Doubla 5pec{flcatlon Llmlt and Form Z-Single Specification Llmlt] D-fl. SrIlpocied. B c D E I r a n a 1 J K L M N o ..— . lot I . —. P Q I l! J!LJ__ When q ample q Is* equdo or q xe*sd* IJ 1 AU AQ L id tabl~ who q m In pmcaat defective. that Id. I:la. ‘Mm .. Matter ImpI* -I*E ode letter —... rnu. @v*r.—.. tba 10.

15s m M B c 1.010 54 2.038 13 5.27 1.021 6.67 v ~ 4 31.2$ 1.010 1<008 1.00 I .00s 54 1 2.9Z l.019 1.000 1 Iz 3.n8 1.29 1.016 1.48 [11 19.s0 10.095 11 I 7. well .s9 1.68 1.m Umit -nd 5’orm Z-Single Speci[icztlm Limit) Acceptable Quality Level# [normal In#pectio.68 1.035 18 18 5.008 11 ‘1.009 1.34 1.027 N s 2. .022 1.50 I I I Accepluble Qu4Zlty Zmvela (tichtened 10spQcll.080’ 3 10.64 1..77 56 20.007 3 2.51 M 2a 3.045 14 3.51 1. sampling plan bet..76 1.00 1..04s 16 23.00 1.022 1. D-3-Con(lnued MmIar mpl* 01: oda ldtt 1.025 1.19 1.031 1.026 1. .81 64 14.72 1.023 39 10.11 1.013 1.003 1.75 1.S M WIZ.)..90 1.414 v v ?.038 1! 1.00 1.88 I .s2 Q I 2.79 1.62 1.018 42 I.00 m M v n 64 v Mv v ?.035 1.50 I 1 v 1.016 36 42 4.35 1.43 24 23..414 D t Z.unp.48 I .80 l.080 9 5.155 v 9.155 6 28.U5 1.90 ?5 20.9S 1.50 1.’bZ 1.~c::it hd tabla vaheo qrt 18 percmt defective.04 1.0.ZZ5 3 1.095 9 12.54 1.038 17 17.49 L 4 2.033 20 23.21 1.049 14 17.onl A33 ML .77 1.069 b 2.s5 1.02 15.ZZ5 5 15.0! 1.04s 15 12.ao 1. 3.02! o I.095 f5 2b.118 7 19.i) 31 Z2.76 r 4 2.14 1.414 1.43 1.50 4.019 1.414 6 3 Z4.rrc$w.155 5 6.061 10 ).225 4 22.054 II J 1.00 6.60 1.36 1. Specllic8tl.006 93 I 4.014 P 9 7..56 1.12 1.57 1.lia 9..011 8.99 1.90 1.05 1.014 6..13 1.061 12 12.024 25 32 4.414 v 3 {1.e v-ry item In the 101muot bs hmpecled.73 1.093 6 1.00 1.13 21 u.008 70 81 4.?.006 4 5 B 8.ooq 1. both .061 10 5.88 1.00s 12 24. TABLE Tcble for Normal and TI$ht~ned hmpectlon for Plma Baaed on Known VarlabIllty (Doubl.50 5 2.225 4 6.50 10.93 1. IS6 Cqualc or •xceod~ lot When *ample q .041 15 9 2.9~ 1.b@ 1.00 6.03 21 16.s8 * 7 5.5b 1.46 1.?9 Zo z?.61 1$ 5.00 13.s9 1.011 1.b4 1.069 B..IJ5 5 Zo.34 1.09 1.43 1.OIE 1.041 8..045 I 2.049 K z 2.0b9 E 3 2.34 1.00s 109 9.110 n he v n M v n M v m “ 2.61 49 14.001 1.13 1.054 e.012 48 61 4. that f.63 1.012 5s 10.118 6 13.2Z 1.003 I Z7 14.049 13 G s }.03s la I l.83 1.3s 1.60 1..z7 3~ 1S.OZb 7.031 19 3. .71 Z4 16.Ooq 6.s7 1. ct.o16 31 2.82 9.s8 95 14.029 7.51 30 21.91 1.029 20 11.97 1.40 1.88 1.03s — — 1 2.35 1. 6.01 1.46 1.23 Z1 16.96 1.98 1.004 I I 47 19.13 1.o26 z] 11.23 T 4 33.007 82 6. 4.84 1.155 4 1 2 1 .?Z5 3 15.17 1.

1s I .40 I .m Limit) Acceptable (lualhy I . that I*.10 I . .. q well qs M vahie.065 [ . both mnv.04 B c D E r a H i J 2( L M 1! o ? Q k qs AU AOL Ad Iabh VdUCi i?o in PO?CQ84 dafactlvc. I US* flrol mmPlkIs Plan hlOW qrrow.25 I . ——.&< Levels D-4 mph Dim ode letter . — TABLE Matter Table for Reduced Znopectlonfar Plan@ Based on Known Varhbllliy fDmhlo Specillcmion Limit and Form 2–Single Specllicatl..le slsa T*?F Itim k~ha lot mutt ba inspected. When mmplo tlse q quala o? azewdc lot . {DISC.

0.0$9 K b 5.033 1.b8 11 13 22 32 4.58 I.016 M 21.77 F T 1.64 1.155 H 3 3.96 Z3.080 8 8.05 16.118 5 8.Z1 11.79 1 1.ZZ3 1.61 1.95 5.olz 49 14.93 lZ.b4 1.05 1.81 I.27 v 6.414 1.061 11 17.n lor PlarM Bated on Known Vsrisbllity (Doub18 Specillcmtion Umit and Form Z-Single Specl{~cItiOn Umit] ACCI 1.be M 8 3.43 1.13 + 1.08 1.01 6 36 4.038 1.89 13.lqtt@r 2. a l.095 ? 5 4 15.90 1.43 23.035 14 17 1.36 17.095 1 4 1.62 1.bO 1.045 1.lb 17.02 7 1.2z5 1.68 1.92 5 6.11 1.041 6 5 ) J k 1.035 “18 P 19 3.0.88 1.155 1.35 12.045 1.98 1.11.5 7.40 — i i .118 1.04 s 1.63 0 1z L61 1.080 8 t4.d Zn*p.049 1z 24.91 1.05 1.26 0 28 3.118 1.15s 1.414 1. .04 1 15 8.6o 1.43 1.77 1.Z25 i 4 IJ. 1 D 12 t 1.ctl.92 4 6.46 1.013 I.50 v n M a M n M B ~.34 6.069 1.155 4 )l.46 1.87 19.97 3 7.?$ Z4 z3.06 1.095 9 Iz IZ 15 12.225 3 10.05 5.O1 1.029 z! 17.5b 1.35 12.061 10 8.02 4 7.0699 1.90 T 9.033 1.13 1.80 ). TABLE .118 1.414 2 1 v 3..01 8 1 $ 5 .0699 1.O1O 56 ?.-.88 IZ.68 5.05i 1.155 6.Mmter Tsb2e for Redue.04 9 13 8.71 1.054 1.13 5.74 15.0) 5.59 1.50 v “ II D-4-Continued Ssmplo BI*9 cod.1s5 4 9.095 1.67 1.58 1.018 31 1S.9.ZZ5 1.68 N 10 3.080 8 zi.00 1.05 4 1.81 7 I 19.oz 1 .99 1.225 G 2 3.64 1.022 1.116b 1.014 4Z 10. .009 L.414 17.o38 1.Z?.96 23.045 14 1.069 J 4 3.026 1.?9 10.3 6 28...85 ZO.061 10 8.031 16 16 Zo 1.5 3 1.04 11.

. —— . __ —— –-— ——- TABLE D-5 TabIc for CotlmstInS the lat Percentage Defective for Plans Bared on tiowa Varllbilityl 1 .

r limit i* obtained by q ubtract ~~~~ Per==at=ge found in the table from 1.pectiom SW b.tinuted frc.uble . th= qrithmetic rn.s 0 and QL shall b.3 Tight=imd 31W Spectltl. by r.*S ecberwim de#$gm4ted. pe. of i.Part Ill ESTIMATION OF PROCESS AVDLAOE REDuCED AND TIGNTENW A34D CRfTER3A 1NSPECTION ~31 D 13.d proce..att the corr. The qverage pu i. tit.6z6&. . metic m-u. of the preceding tea (10) low or S* may be . 1 At Start of Inspection. q. J. . is read from #he ~bIe. 74.alhenvi. qpecifi.30.~~ter=d by-di.ma re.eragc rnirted pose of decermis. u m ebtaiaed..Z Double Specification lAmit. Th.m~e. Pu’ q . wampling pl*rsh for normal. m qverage computed from’<he hall be us. Any Iot. ..tion limit. ha. Z.mti- Th.a. thenpu = 100IL .the carre. Th q e.er qge p i. re. 0[ irmpectior.. Th. In order to estimate the lot percerat dsf. P L. ifQ ..miS uated. them Table DY5 i. Sp. The quality Indic.timtied ict percemt defective fable. AL TXGZiTENED. n the emti naat.) D13.. and by p when cmnput=d with re. ‘ra. pect to q n upper q PL wb=n cOmp~t=d rnth r=~p=ct tO q 10w=r specification Iirnit..timated iot q bove the upper limit or P. ?*spectively. AND RE- This S$azidard e. is designated by $u what computed with pecific. is p = pU + pL. S af hrm 2. Sinaihrly. and QL = (X. The e.. of product manufactured umdcr conditions not typical cd tmual production.r QLlor the c. -. TC.tfngui. case the e. Theme q re: (3u . regarding the negative si~n.mof the individual =atimsced lot percent defective. I SiI@.idual e. and reduced D14. . D13.854% = 69. the quality kdicem Ou &\. cmaditioo.4.ticm limit. ub after prior rajectimm.. (S8.tmuted proce. shall be excluded from the estitrmted pre cemm’ average. 5 ter the plum hawed O. tion of wampl.ubmitted from the [or .. q ve rage percent defecti*e.pec iiic. q re much tbt t6sht. UOa IU13C. Table D-5 ien Y ered separately with QU and OL ad. wed q t the qtart of inapec.~y to eornpiete paragraphs D6. ~h= a~tis~di=utia d. pecttoa.r q e uumction shall be of In9puctia. pectian of product which ba. called Sbc proceaa average. the arithe.nt defective below the Jow.s a nt~atm.htil be included OUZY once io e.60. rn tbe re. bnowa varbbi3ity. Z d D6. ult.. lot percent ~_~l. ult. or Q. qge M the qr~thrnetic mean of tbe estimated from the 10t pe rcem def qctive computed . -rmal used when taapeecio. for the pur- defective Pu 0. . Z. Tbe q-am3ityiadex Q“ D13.ti percent defective. Tiuhtermd tnD1 4. procea. ututed wb.eceptahslity q . with Q or QL 4 muted Y et perce.ced lot percent dciectzve qhall be . qt?.hed in.d far tbe ea.aphs D14.P 0[ 10U q in.cim.-— ---- . ~:S#fATfON OF PROCESS AVER- !.1 Abtmrrr.tinuted proces.cifieatlon Z. of aocJppr . spondin~ .img severity cd inspection during lhe tour.swa.e number.d murnber of preceding lot.nod O.xctiou During the co. e d. e of q contract in accordance with paragraph D14. p’.d pro . i. computed. pect W. J46%. pecticm. U the quazity index 0. a Avers e. e of a 10X..146% + &S . (U-X)WI. . ed on variability b.a) Remult.tabli.timatitig tbe proce.unpling itt*pecti. bm.e. a q ver average.ar QL q lmfl be computed for each lot.determim.W1 be in. D1 3.LWIO.3 Special Case. tightened.. nuted procems average p is the arithmetic meof tbeiadividdemt~atcd lot percemt de fect%ve. a. shall be . The estimate of the prec.?. 10 order to emtinmte the procems qveraga.2 Ccmputatiem d the Esf.. b=cm re.50and O = 1.. Table D-5 ii entered 6Wbem Form rnste Of crltariO=.tion Of q prticular quantity 01 product .cti. mdrawn from . . PL’. However.timated lot the e.d from Table D-5 for the pluI.tmit ti a-cd (0? Czu ue*ptabi3~ty defective pzz or pL i.lml% 6 The estimated 1ot percent dof ecu-e q bal-1 b deCennined frarn Table D. paragraph D] I. a dc..tirnat. of the Itidi.Z OuriaS fn. it ia aecea.pecificaciOm Iimit. baoed tbmitmd for or~imal UPOn A 8r0.tiom limit c. q peeifi. D13. D14. ‘“ %%% dWPECITC)N i-peetioa. Z. Normal in. pL = %4g% ~ P “ 69. redncad iaapection is not rqufred fn accordance with prmS.3 and D14.inuted prcaverce. io thi. OrlgirIal inspection is the fir-t Inope. .. di.pomding pu snd pLare read frOm the The e. Tbe e.

acua average is computed from 5. loumr limit cbown q i. greaur thaa the AQL. or delay=d. 10.. than tightemed iiwpectio.. .linuted percent lots is defective for qach of these preceding Iesm than MUAID-414 11 Jftfld 10s7 the qpplicable D-7. Reduce4 bcpectien may be instituted provided that all of the following cOndiliOn. . Pr0dmct50n is t q Nonnsf impecthm *baff be retostate4 eondftiom occurm one of tbe foIlowing redueed tic wctlon: U my tiad~r Condition . P.. or 15 lots. D14.5 Sarnplin~ Plans for Tightened or Reduced k. S~PIIDS Pl~S fOr *lghl e~ed and reduced inspection q re provided in Section D.!’ prece4iag [e.Table Caufitiom qtcD4y rak. ~re.rrnsl i.erage D. c. . A Iot-ic rejected. .n G. 8 Normal inspection still be reimtmted if the .ter tbn the AQL.stinnted pro .c.a irregular Dthe r ccmditiom u COtisti. (1OJ Iot# (. are SiWeaI in Table D-b when tbe pr.2 i. equaf tc. the AQ L.C.ts (or such other mmnberof have be.4 Reduced fnsp=ctior. that normti inspection should may wtarrwt be reinstated.m -d no. The e.e has been rejected.. and when more thao q certAn number T Of these 10ta ‘have qstimmen of the percent deiective exceeding ctaeADL. Tb* T-value.under r. lem. The preceding tea (10) lots designated) lc.erage of Iota under c.. plwJce~- fkradiiinm E.oductiom be=om. Parts I and 11 I 10s .~=CtLOIl. Comditiom F.. Condition B. The estiunkd i. D1 4. . i. pecti. ..r much other smmwith ber of lma demig=atedl in qccordmce paragraph D1 3. q re satisf ied: Condition A.

: 3 4 b 3 5 b 3 5 7 : 8 : 8 4 b a 3 4 6 3 5 7 4 6 a 3 5 7 3 b 7 4 b 8 3 5 7 3 6 8 4 6 b 8 G : 7 4 6 a 4 6 9 H 2 9 4 7 99 1 4 4 7 7 9 I.65 . q 2 4 5 3 : 3 4 6 3 : 4 6 8 : 8 4 6 8 4 7 9 4 7 10 3 F .25 q T for Ti+t. .. . q . c q . q q .antplimg 44’5 4 8 8 8 11 11 . 10 4 1: 10 44 88 11 4 1! II 445 en 11 11 445 88 11 11 10 1s 10 L I I I 11 4 l.: 44d -l-J-15 — .oed tavels — OustIty letter B . 4 7 10 4 7 10 : 7 4 b 9 4 7 9 4 7 9 4 7 la 4 7 10 D q q q .a3nOS.I TABLE v. 1.10 .J-t Acceptable D-U k+spsctbon mof . (in percent deft!. .iu.e — .11 plMM provided in this Standard fer these code letters 8nd AOL. . Sample code size .5 q-o q q q q i. q 3 4 b 3 5 7 4 6 8 4 6 8 4 7 9 4 7 ! 4 7 9 — 4 7 9 4 7 10 7F 10.15 q .9 4 7 9 3 5 6 3 : 3 5 7 4 6 a 4 6 9 4 .5 2. .There are no .065 .40 .0 * Nu13160r of bm w 445 88 11 11 445 88 II 11 -++445 88 11 11 E . .5 — q .0 q 15.101 4 4 7 7 10110 4 7 10 — 4 8 11 — 4 8 11 4 8 11 — 4 a 11 — 4 8 11 — 4 8 11 — 4 a II 10 15 10 15 10 15 J 4 4 4 b b b : a 181819119101 4 b 8 4 6 q 444444 77 :1:1: K u 44= a 9 4 6 9 9 t 1: 9 4 7 9 4 7 9 9 4 7 9 4 1: 9 4 7 10 4 1: 10 4 7 10 4 1: 10 4 7 10 4 1: 10 .0 1. q 3 5 6 3 : 3 6 7 4 6 8 4 ‘1 . . I& +E 10 Is 10’ 15 445 88 11 11 — .

15 4 7 10 4 s 11 letter P I . I 107 . to tbe precedi~ 5 lot..065 4 7 10 4 7 10 Accepmkle .4 1 10 4“ 8 lJ . rquir.0 4 1: 4 1: 4445 888 11 11 10 11 15 m the 4 1: 4 1: J: 4 . preceding 10 lot. e lat. Sample code D4-CmtJmd f519~Cti00 (in PC rcemt ttefe 1. pectiom i..10 .b5 4 i! 4 8 11 qL. N] estinutea of the lot p.hfnATD-414 11 June 1951 TABLE VAM.5 v qriab.5 2. and the proceos qverage from th.0 4 17 . qnd the bottom figure to the precedi~~ the rniddlc figure Tightemed i.rcemt de fectiws q re Obtaimed from Table D-5.4 1..d wbem the aurnber af lotm with .4 1: 4.40 4 1: 4 s 11 Lavelo . 10.ble.bMc7 ~ of T for Tl@umd Ouatlty .25 4 If< 4 8 11 . or 15 Iotm i.tea of percent defective qbove the AQL from the preceding 5.. 15 lots. e=c=ed. .04 4 7 10 4 1 10 . greater thaa the Eiven value Of T iu tbe t. Q I The top rigure in cacb block refer.stirn. th= AOL.

197 .643 J.806 10.427 15.5o A 12.086 .164 .22 . 1$ I 4 q There q re no aampllng .081 .002 .00 .10 .001 .50 A 8.449 2.092 .064 .9z4 4.057 .3Z5 5.564 .166 3.002 .014 .114 .010 .04 * — * 35 q J .004 .00 A 11.40 .50 1. e :ode letter.16b .50 A 1 2( plant provided .5o A 1.093 .J59 2.00 & 10 Is 12.2.z91 I 5.252 .b5 C1.50 1. .00 .850 1.00 5 .065 15.090 .046 1. . .2s .375 ..0b7 .874 1.50 1.540 . 5 10 Is .65 .052 .045 .227 .141 2.50 1.204 .051 018 0s1 082 .18B .758 3.00 A 1 5.290 E q * q * .693 15.004 .00 A 1$ .00 9.987 4.847 .718 .051 OZJ 0s8 090 .225 2.005 .Z70 1.08Z .00 a 12.124 .02.013 .10’9 .167 .718 1.958 6.558 ! 1.50 Z. f.011 .9 l-l .004 .00 .00 4.00 .145 I I z.006 .419 15..00 c q * q q q q * .09n .50 % Z.008 .250 4.J94 1.001 .892 1.669 I ~ 4 * J- q .?5 1.7 V.69? 6.00 A in lhh Standard far lhe.298 .3!7 .719 6.384 .342 6.110 .412 2.? .129 .6OZ .461 Z.003 . .b5 — TF .051 .453 6.025 .064 .386 8.65 .50 I 5.178 .014 .40 — .TABLE Llmlto o{ Estimated Lot PerceIII D.103 .036 .0 .00 4.00 .714 14.385 .144 .867 1.056 .c!Ivr ior Reduced Inspection *r Acceptable .205 10.021 .070 .009 .769 Z.00 A G : .)57 .252 .142 .5Z8 .50 1.309 .50 53” .369 I.382 .508 .010 .94z 4.00 4.154 9.50 6. 12.316 . I .09 I .00 J 10 IS 5 7.53J I.5..9 .05s 10.64J 2.JZ6 .880 2.645 4.85J 1.89! .021 .470 15.346 1.021 .q37 5.109 .001 .50 .347 .011 .01.631 1.40J 3.194 .62Z 1.354 3.00 10.209 D q * q q q q .1)6 Z.Jz Z .Z17 2.114 9.147 .093 10.049 .50 2.0 * q q q D.009 6. ?2 .4z7 1.177 .038 .054 I 5.311 .033 .00 013 041 071 .J13 .908 1.451 .15 .016 .Z17.027 .s02 10.056 .0Z6 .100 .011 . fIablllI~ Known ~~ Sample size .330 I 0.677 1.147 .021 .030 .ZZ3 .s0 1.910 1.00 A and AQL va5ue#.030 .09b + .029 .436 5 15.011 .562 2.698 4.011 .017 .00 .008 .00 5 5.549.8JI 4. .049 10.40 .033 1.909 b.140 .109 .222 .o45 6.244 — .25 8.009 .171 .025 .558 .773 .50 2.00 10 b 1$ 5 t. &litv Levels code letter .050 .418 .1S .848 15.15.-1007 027 055 .40 — .326 z.50 4.00 4.00 A J 10’ 15 5 10 1 .298 .Z48 2.011 .028 .00 .078 .560 3.b5 .50 1.00 i -L ~ [’015 5 .641 2.018 .IJ9 1.786 10.496 6.4.

I.5o - 3u15 — 5 10 15 5 10 14 5 10 15 -1- 5 .120 .277.00 & 14. III c.107 .146 .093 4.00 b 5.00 1 13.-.3Z8 ko.65 — .586 .211 ..705 .5 4.546 6.65 .50 * .00 A 10 15 s T 8.40 b .25 h . 10. All A(3L q bUmethe flrot fl#ure In dlrectlon of arrow and correepondin~ number of 10M.40 .392.Z14 . ._—— .50 i . we u“alftv 2.41Z‘ b * .Z5 .40 T ---1I -1_ 13-238 I S.6zl .tnalituled when every emtlmaled lot percent defective from the preceding 5. =H II .732 Z.Z51 .054 .134 .10 .o1O 1. .io A 8.2s .934 I .50 8.383 .017 I +5.030 .232 .40 .03 5 10 1115 5 .0 La C19 .440 1. In each block the top (Igura reform to the precedlm[ 5 lott. or 15 lot.299 .03Z .173 15. TABLE V~rIabIllty Knows Llmlto of thtimited Lat Percent Defective lor Reduced fnnpectim D-7-Conllnued .04 .50 .113 1.oo & 14.080 .0 1 .0z2 10.316 .959 2.310 6.017 .00 .635 .608 .S — 10.25 . fn addition.588 15.50 ha.191 .191 .348 .50 z.049 .oo h 3.0 6.00 A 13.959 I .15 .in of Sectloa D.086 . .40 3.801 I 5. q re AN entknmteoof the lot percent defective Obtained lrom ‘Table D-5.1s0 .00 5.00 A N A A 1. In Part 323 dtiltfled.b5 . * m 1 nd tsble vduec ~r. In percent defective.034 I S. Numb-r of I/As “X . .501 .994 1. must bc bdow the flsure glvon In the table.ther conditiom for reduced impection.Z5 .821 2.25 ? . the middle figure to the preceding IO lots.344 .38Z . and Ihe bottom figure 10 the preceding 15 lots.516 10. Rw!uc813 impectkon may b.203 .00 A 13.00 1.Z7Z 4.406 2.249 .241 .40 .96Q 4.(41 .435 ..50 1.131 b.06S .00 1.934 1.00 5.557 .415 1.

Sample escinute Table D-5.b u lor sample Mu Maxfmum allowable percent defective qbove U ~ivem h Table. the unlit. {For u. U =d P P“ ‘L T p bar ub U p bar q p bo defective. givem in Table. Upper specification Lawmr spectficatian The .ceeptabi3ity Iimtit. Umit.xeoa q veragewhich of emttnuted given in Table D-6. D-3 -d D-4.blcpercent defective below Maximum q D-3 and D-4. D-5.—. ) L.baL-sTD-414 11 June 1957 APPENDIX Defhiflmu D Sz@!s!! n Read Def intt.v81uec for W and L q re spactfjed. mean of q unple x .eom than. giv== in T~b10. ify cbaract. e. The estimated Tbe maximum may exceed ‘L ub L M q 1. eatimatea Maxdmum dfowable given in T@bles D-3 M q. indices when ua ing The v vafues.ariabifify qcceptabfltfy plus.. k constant v A factor tw. D-3 and D-4. . 1 and D-z.ctive QL C3uality Index for use with Table Sample estinute .af tbe 101percent defective percent and D-4. Tbe qmfimuod pw. ) llow.ub U .. -n upper Spectficstlom qub L process number for a lower q pecf3icatlon tbe AQL =1< > I Less Greater than applic~t~a pr.- ---- ---- . @em value.—— . q re u 1. Greater than. D.ub L Quality Index for use with Table D-5. defective p = p“ + PL.Table D-5.s Sunple site for + qingle lot.d in determining the quality the bnowLI variability acceptability plan. defective @ef.e indetnr Of ti8bt=n=d i=~p=ctiOa. The predetermined variability of the quaf bow. X bar S-pie rnemn. rneawaremento from Sigma fbowa variability.Verq. Arithmetic 8 tingle lot. i.. IForuce when different AQf. Total qunple 0[ m PL P M“ p sub U ub 1.ristic which vill be u. p q the Iot percent qbove below U front L fr.s.am of the lot percent em firnsfe . Q O Q“ . limit.ed rntb the . average [*. tbM SLunof 110 .io. (For usawhen different Mf) L qre q~edfted. for ia Table. Sunpfe ewtdnnte Of the procemw merceut amfimated procema average.

m# thb lhn.P. DEPARTMENT OF THE NAVY Ih” It”.FOM d. lFOM k-.fi[&. KO 20660 .I I -.~M. .100 n No PGE?AOe wscE!EEAmv 1S UAILEO 1947MC STATU BUSINE:SNOR~. ) 111111 UNITED OFFKIAL q ENALTV qkrJNE5 FOm q RIv ATC USC E. rlnsl CLAW POSfAGE WILL BE PAID BY THE DEPARTMENT OF THE NAVY Co@xuanding Officer Naval Ordcmce Station StandardizationlDocumen tatiop Divieion (Code 524 Indian had .M.

. .. --?r . DDa??”1426 ..I .

OS AMSC N/A AREA QCIC DISTRIBUTION STATEMENT A. Approved for public release. distribution is unlimited. dated 11 June 1957. dated 8 May 1968.9-1993 from the Standardization Document Order Desk. ASampling Procedures and Tables for Inspection by Variables for Percent Nonconforming.NOTICE OF CANCELLATION NOT MEASUREMENT SENSITIVE MIL-STD-414 NOTICE 2 2 February 1999 MILITARY STANDARD SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY VARIABLES FOR PERCENT DEFECTIVE MIL-STD-414. The private sector and other Government agencies may purchase copies from the American Society for Quality Control.9-1993.OS Air Force . and Notice 1.10 Preparing activity: Navy . 700 Robbins Avenue.@ (DoD activities may obtain copies of ANSI/ASQC Z1.) Custodians: Army . .AR Navy . are hereby cancelled. PA 19111-5094. Building 4D. Milwaukee. 611 East Wisconsin Avenue. Future acquisitions should refer to an acceptable non-Government standard on sampling procedures and tables for inspection by variables for percent defective such as the American National Standards Institute (ANSI)/American Society for Quality Control (ASQC) Z1. WI 53202-4606. Philadelphia.

NOTICE OF CANCELLATION NOT MEASUREMENT SENSITIVE MIL-STD-414 NOTICE 2 2 February 1999 MILITARY STANDARD SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY VARIABLES FOR PERCENT DEFECTIVE MIL-STD-414. WI 53202-4606. Approved for public release. Building 4D. Future acquisitions should refer to an acceptable non-Government standard on sampling procedures and tables for inspection by variables for percent defective such as the American National Standards Institute (ANSI)/American Society for Quality Control (ASQC) Z1. 700 Robbins Avenue.@ (DoD activities may obtain copies of ANSI/ASQC Z1.) Custodians: Army . The private sector and other Government agencies may purchase copies from the American Society for Quality Control. distribution is unlimited.OS Air Force .AR Navy . and Notice 1. Milwaukee. are hereby cancelled.10 Preparing activity: Navy .9-1993 from the Standardization Document Order Desk. dated 8 May 1968. 611 East Wisconsin Avenue. ASampling Procedures and Tables for Inspection by Variables for Percent Nonconforming. Philadelphia.9-1993. dated 11 June 1957. PA 19111-5094.OS AMSC N/A AREA QCIC DISTRIBUTION STATEMENT A. .

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