PIKE Catalogue 2011

COMPREHENSIVE CATALOG OF
FTIR and UV-Vis Accessories and Supplies
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We are PIKE Technologies, an innovative company growing consistently over our 20 years and focused upon serving customers with their FTIR and spectroscopy applications. We are always looking for new ways to help make your spectroscopy sampling easier and more effective. We think you will see in our new products introduced each year that you, our customers, have helped us to achieve this goal. If you do not see what you need in this catalog, please contact us. Your input may become one of our product offerings in the future. We look forward to serving you with our products and support.
A unique enterprise specializing in the imaginative design and creation of excellent spectroscopic accessories, providing high quality solutions to all customers.
The PIKE Technologies team looks forward to helping you with our spectroscopy sampling accessories and thank you for your business.
6125 Cottonwood Drive Madison, WI 53719 (608) 274-2721 (608) 274-0103 (FAX) sales@piketech.com (E-MAIL)
W W W. P I K E T E C H . C O M
FTIR INSTRUMENT CODE

ABB Bomem
XX
FTLA2000-100 (Arid Zone) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80 Michelson 100, MB Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81 MB 3000 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
Analect/Hamilton Sundstrand
Diamond 20 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Bruker Optics
IFS, Vector, Equinox Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 Tensor, Vertex with recognition (Quick-Lock) . . . . . . . . . . . . . . . . . . . . . . . . 51
Buck Scientic
M500. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
Digilab/Bio-Rad/Varian/Agilent
Excalibur, Scimitar, FTS Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Excalibur, Scimitar with recognition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Horiba
7000 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Interspectrum
Interspec 200-X . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
Jasco
300/600 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 400 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 4000/6000 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58 4000/6000 Series w/recognition. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
JEOL
Winspec Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Lumex
INFRALUM FT-02 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
Midac
M Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
PerkinElmer
1700 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70 Spectrum GX, 2000. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71 Spectrum BX/RX, 1600, Paragon 1000 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73 Spectrum ONE, Spectrum 100, 400, FRONTIER . . . . . . . . . . . . . . . . . . . . . . . . . . 74 Spectrum TWO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Shimadzu
8300, 8400 Series, IRPrestige, IRAfnity. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 IRPrestige-21 with recognition (QuickStart). . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Thermo Fisher Scientic/Nicolet/Mattson

Innity, Galaxy, RS Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Genesis, Satellite, IR 300 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Impact 400, Magna, Protg, 500/700 Series, Avatar, Nexus, Nicolet Series, Nicolet iS10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 Nicolet iS5 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 500/700 Series, Avatar, Nexus (Smart) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
TA B L E O F C O N T E N T S
Sampling Kits If You Dont Know Where to Start

Products Overview ..........................................................................................
Pages 1 6
1 2 3 4 5 6
Standard Transmission Sampling Kit (STS)...................................................... Comprehensive Transmission Sampling Kit (CTS)........................................... Educational Transmission Sampling Kit (ETS)................................................. Valu-Line Kit.................................................................................................... Ultima Sampling Kit........................................................................................
Attenuated Total Reectance Liquids, Solids and In-Between

Products Overview ..........................................................................................
Pages 7 30
7 8
MIRacle Fast and Easy IR Sampling ..............................................................
GladiATR Highest Performance Diamond ATR .............................................. 12 GladiATR Vision Diamond ATR with Sample View ........................................ 14 Multiple Reection HATR Maximum Sensitivity and Highly Versatile FTIR Sampling........................ 16 ATRMax II Variable Angle Horizontal ATR Accessory HATR for Inquisitive Minds ....................................................................... 20 VeeMAX II with ATR Variable Angle, Single Reection ATR for Depth Proling Studies............. 23 Classic VATR Variable Angle ATR for Analysis of Solids, Films and Coatings ................. 26 Theory and Applications ................................................................................. 27
Diffuse Reectance From Powders to Plastic Bumpers

Products Overview .......................................................................................... 31
Pages 31 40
EasiDiff Workhorse Diffuse Reectance Accessory ......................................... 32 DiffusIR Research Grade Diffuse Reectance Accessory ................................ 33 UpIR Upward Looking Diffuse Reectance Accessory .................................... 35 AutoDiff Automated Diffuse Reectance Sampling....................................... 36 X, Y Autosampler Transmission and Reectance Automated Sampling in Microplate Format ................................................................. 37 Sample Preparation and Loading Kit The Easiest Way to Work With Powder Samples ....................................... 38 Abrasion Sampling Kit..................................................................................... 38 Theory and Applications ................................................................................. 39
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Specular Reectance Thin Films and More

Pages 41 50
VeeMAX II The Ultimate Specular Reectance Accessory! ............................. 42 30Spec and 45Spec Specular Reectance for Thick Films............................. 44 80Spec Grazing Angle Specular Reectance for Thin Films ........................... 45 AGA Advanced Grazing Angle Specular Reectance for Thin Films with Precise Spot Control ............................................................................ 46 10Spec Near-normal Sample Reectivity Measurements .............................. 47 Absolute Reectance Accessory Measure Absolute Sample Reectivity ........ 48 Theory and Applications ................................................................................. 49
Polarization For Oriented Samples and Research Applications

Pages 51 54
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Polarizers Manual and Automated Versions for Molecular Spectroscopy ..... 52 Theory and Applications ................................................................................. 53
Integrating Spheres Reectance From All Perspectives

Pages 55 62
Mid-IR IntegratIR Integrating Sphere ............................................................ 56 NIR IntegratIR Integrating Sphere ................................................................ 58 Introduction and Theory................................................................................. 60
Remote Sampling Accessories Extending Your Sample Compartment

Pages 63 66
Products Overview .......................................................................................... 63 FlexIR Hollow waveguide Accessory for Remote Infrared Sampling .............. 64 FlexIR NIR Fiber Optic Accessory for Fast and Remote Sample Identication ...... 66
Microsampling Products From Microns to Millimeters

Pages 67 74
MAX Sample Compartment Microscope for FTIR ........................................ 68 Microsampling Tools Compression Cells and Sample Manipulation ............ 71 Micro Diamond Cell For Compressing and Holding Samples for Microanalysis ... 72 Beam Condensers 4X and 6X Versions for FTIR ........................................... 73
Transmission Sampling Automated & Manual Technologies

Pages 75 106
Transmission Multi-SamplIR Automated In-Sample Compartment Accessory .... 76 RotatIR Automated Rotating Sample Stage................................................... 77 Automated Horizontal Transmission Accessories For Films or Pellets ......... 78 X, Y Autosampler Transmission and Reectance Automated Sampling in Microplate Format...... 79
Liquid Samples
Press-On Demountable Cell For Viscous Liquids and Mulls ......................... 80 Demountable Liquid Cells For Versatile Pathlength Liquid Sampling.......... 81 Super-Sealed Liquid Cells For Precision, Fixed Pathlength Liquid Sampling .... 82 Long-Path Quartz Liquid Cells For Analysis of Hydrocarbon Content and Related Measurements ................ 83 Falcon Mid-IR Transmission Accessory For Precise Temperature Control of Demountable Liquid Cells ................ 84 Falcon NIR Transmission Accessory Quantitative and Qualitative Analysis of Liquids under Precise Temperature Control............................ 86
Solid Samples
Bolt Press & Hydraulic Die Low-Cost Pellet Preparation .............................. 87 Hand Press For Making Smaller Pellets ........................................................ 87 Evacuable Pellet Press For Preparation of High Quality Pellets .................. 88 Heated Platens Accessory For Making Thin Films of Polymeric Samples for Transmission FTIR Analysis ................................................................. 89 CrushIR Digital Hydraulic Press .................................................................... 90 Auto-CrushIR Programmable Hydraulic Press............................................... 91 ShakIR Sample Grinder For Optimized Sample Mixing ................................ 92 Sample Preparation Accessories For Solids Materials Analysis .................... 93
Optical and Sampling Components, Polishing Kits

Sample Holders For Transmission FTIR Analysis of Pellets and Films .......... 94 Disks, Windows and Powders For Transmission FTIR Analysis of Solid and Liquid Samples ..................... 95 Crystal Polishing Kit Extending the Life of IR Transparent Windows............ 98
Gas Samples
Short Path Gas Cells For Samples with Higher Vapor Phase Concentration ..... 99 Heated Gas Flow Cell For Streaming Gas Analysis ........................................ 100 Long-Path Gas Cells For Measurement of Low Concentration Vapor Components ................... 101 Theory and Applications ................................................................................. 103
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Special Applications
Pages 107 114
Vertical Wafer Accessory For Analysis of Semiconductor Wafers.................. 108 MappIR and MAP300 For Automated Analysis of Semiconductor Wafers .... 109 TGA/FTIR Accessory Identication and Quantication of Evolved Gases from Thermogravimetric Analyzer ............................................................ 111 External Sample Module Extending Sampling Efciency .............................. 113 Semiconductor Applications FTIR Sampling Techniques Overview .............. 114
UV-Vis Accessories
Pages 115 124
Products Overview .......................................................................................... UV-Vis Cuvettes, Cells, Vials and Holders........................................................ UV-Vis Polarizers Manual and Automated Versions ..................................... UV-Vis Spec Slide Mounted Specular Reectance Accessories ....................... UV-VIS 85Spec Specular Reectance Accessory ............................................. UV-Vis VeeMAX Variable Angle Specular Reectance Accessory .................... Falcon UV-VIS Precise Cell Temperature Control Accessory ........................... Automated XY, R-Theta and Y-rotation Stages for UV-Vis Spectrophotometers .....................................................................
115 116 118 119 120 121 122 123
608-274-2721
Pages 125 132
Standards, Software and Databases

Products Overview .......................................................................................... 125 Reference Standards For Calibrating FTIR Spectrometers ............................ 126 PIKECalc Software For FTIR Sampling Computations ................................... 129 ATR Spectral Databases Optimize Search Results for ATR Spectral Data ...... 130 Transmission Spectral Databases High Quality Spectral Data for Optimized Search Results .......................... 131
Other Useful Information

Catalog Index Alphabetical ........................................................................... 133 Catalog Index Part Number .......................................................................... 136 Fax Order Form ............................................................................................... 144
Sampling Kits
If you are not sure where to start, check out these PIKE Technologies sampling kits. You will immediately nd everything you need for the most basic FTIR experiments, and you will be able to collect your rst spectrum in less than 30 minutes from the time the kit arrives. One of the goals of PIKE Technologies is to make the life of an applications chemist easier. FTIR spectroscopy can be confusing when it comes to sampling techniques, sampling accessories and all the little gadgets required to successfully prepare the sample for analysis especially if you want to obtain good spectra. For this reason, the rst few pages of this catalog are fully dedicated to sampling kits. We hope that this approach will give you a head start and remove confusion when selecting accessories for your applications, especially when you are a rst time user. The kits are carefully designed to include all necessary components. They eliminate guesswork and assure that you have everything you need for immediate productivity.
Page 2
Standard Transmission Sampling Kit Everything you need to run liquid and solid samples by transmission IR spectroscopy
Page 3
Comprehensive Transmission Sampling Kit Complete gas, liquid and solid sampling
Page 4
Educational Transmission Sampling Kit An economical assembly of FTIR sampling tools for transmission sampling
Page 5
Valu-Line Kit High performance set of modern FTIR accessories addressing all solid and liquid sampling needs
Page 6
Ultima Sampling Kit With the highest performance, single-reection ATR and backup accessories to do it all!
Standard Transmission Sampling Kit (STS) Everything You Need to Run Liquid and Solid Samples by Transmission IR Spectroscopy
This general purpose kit contains tools and materials for liquid and solid sampling. A demountable cell (drilled and undrilled windows with precision Teon spacers, plus 2" x 3" standard cell holder) is provided for measurements of liquid samples. Viscous liquids can be measured directly as a thin lm between the KBr windows. The kit includes a hand operated press for the preparation of 7 mm KBr pellets. A mortar with pestle and Nujol/Fluorolube are provided for mull making another popular method for preparation of solid samples. In addition, the kit contains a set of the most popular sample holders including: universal holder for polymer lms, KBr pellet holder and PIKE disposable/storage cardboard cards for pellets and polymer lms. For a complete product listing, please refer to the table below.
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O R D E R I N G I N F O R M AT I O N
PART NUMBER DESCRIPTION
162-1000
Standard Transmission Sampling Kit (STS) Solids and Liquids Includes: Sample preparation tools, mull liquids, cells, windows and cell holders required for preparation and analysis of solid and liquid samples
608-274-2721
F E AT U R E S O F T H E S TA N DA R D TRANSMISSION SAMPLING KIT
Included Parts and Materials

160-8010 161-0510 161-0500 042-3035 042-3050 161-5050 161-1027 161-1010 161-1018 161-6000 162-1100 160-1131 160-1132 162-1290 161-0521 162-3610 162-5600 162-5300 162-5400
KBr Powder, 100 g Fluorolube, 1 oz Nujol, 1 oz Spatula Spoon Spatula Flat Mortar and Pestle, 50 mm PIKE Hand Press (for KBr Pellets) 7 mm Die Set KBr Pellet Holder Finger Cots (12 pcs) Demountable Liquid Cell Assembly Window, KBr 32 x 3 mm, Drilled (6 ea.) Window, KBr 32 x 3 mm, Plain (6 ea.) Teon Spacers Assortment Syringe, 2 mL Press-On Demountable Liquid Cell Holder for 32 mm Windows Universal Sample Holder* Magnetic Film Holder for 13 mm pellets and lm samples Film Sampling Card 20 mm clear aperture, 10 each*
Complete kit for transmission FTIR sampling Make KBr pellets and mulls for solid samples Run liquid samples for qualitative and quantitative analysis
* Note: Cell holders marked * fit all standard slide mounts, but due to their height may not allow for a complete sample compartment door closure on some smaller spectrometers. Please consult PIKE Technologies before placing an order.
Comprehensive Transmission Sampling Kit (CTS) Complete Gas, Liquid and Solid Sampling
The CTS Kit includes a 100 mm long, 38 mm diameter gas cell, in addition to all the sample preparation and mounting tools described in the STS Kit on the previous page. The cell body is made of Pyrex glass and features straight-tube inlet and outlet ports with stopcocks. The gas cell comes with all necessary gaskets, two KBr windows and slide-mounted cell holder, and is designed for gas measurements at ambient temperature and normal atmospheric pressure.
SAMPLING KITS IF YOU DONT KNOW WHERE TO START
162-2000
Comprehensive Transmission Sampling Kit (CTS) Gases, Solids and Liquids Includes: Sample preparation tools, mull liquids, cells, windows and cell holders required for preparation and analysis of gas, solid and liquid samples

160-8010 161-0510 161-0500 042-3035 042-3050 161-5050
KBr Powder, 100 g Fluorolube, 1 oz Nujol, 1 oz Spatula Spoon Spatula Flat Mortar and Pestle, 50 mm PIKE Hand Press (for KBr Pellets) 7 mm Die Set KBr Pellet Holder Finger Cots (12 ea.) Magnetic Film Holder for 13 mm pellets and lm samples Demountable Liquid Cell Assembly Window, KBr 32 x 3 mm, Drilled (6 ea.) Window, KBr 32 x 3 mm, Plain (6 ea.) Teon Spacers Assortment Syringe, 2 mL Press-On Demountable Liquid Cell Holder for 32 mm Windows Universal Sample Holder* 100 mm Gas Cell, 38 mm diameter Window, KBr 38 x 6 mm (2 ea.) Film Sampling Card 20 mm clear aperture, 10 each*
F E AT U R E S O F T H E C O M P R E H E N S I V E TRANSMISSION SAMPLING KIT
161-1027 161-1010 161-1018 161-6000 162-5300 162-1100 160-1131 160-1132 162-1290 161-0521 162-3610 162-5600 162-2200 160-1320 162-5400
Complete sampling kit for analysis of solids, liquids

and gas samples by transmission
Make KBr pellets and mulls for solid samples Run qualitative and quantitative analysis of liquid samples Identify and quantify gas samples
Educational Transmission Sampling Kit (ETS) An Economical Assembly of Sampling Tools

The Educational Sampling Kit contains all necessary tools for the analysis of gas, liquid, and solid samples. It was designed as a low-cost alternative for busy teaching laboratories. The kit offers a smaller (100 mm x 25 mm) gas cell with straight, septa protected tubes, Bolt Press for making KBr pellets and a 35 mm mortar and pestle. Please refer to the table below for the detailed list of all components.
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162-3000
Educational Transmission Sampling Kit (ETS) Gases, Solids and Liquids Includes: Sample preparation tools, mull liquids, cells, windows and cell holders required for preparation and analysis of gas, solid and liquid samples

160-8010
KBr Powder, 100 g Demountable Liquid Cell Assembly Fluorolube, 1 oz Window, KBr 32 x 3 mm, Drilled (6 ea.) Nujol, 1 oz Window, KBr 32 x 3 mm, Plain (6 ea.) Spatula Spoon Teon Spacers Assortment Spatula Flat Syringe, 2 mL Mortar and Pestle, 35 mm Press-On Demountable Liquid Cell Holder for 32 mm Windows Bolt Press (for KBr Pellets) 100 mm Gas Cell, 25 mm diameter Wrench Set for Bolt Press (2 ea.) Window, KBr, 25 x 4 mm (2 ea.) Finger Cots (12 ea.) Magnetic Film Holder for 13 mm pellets and lm samples Film Sampling Card 20 mm clear aperture, 10 each*
608-274-2721
F E AT U R E S O F T H E E D U C AT I O NA L TRANSMISSION SAMPLING KIT
162-1100 161-0510 160-1131 161-0500 160-1132 042-3035 162-1290 042-3050 161-0521 161-5035 162-3610 161-2500 162-2100 161-2511 160-1133 161-6000 162-5300 162-5400
Basic sampling kit for transmission FTIR sampling Perform qualitative and quantitative analysis Economical analysis of solids, liquids and gases
Valu-Line High Performance Set of FTIR Accessories Addressing All Solid and Liquid Sampling Needs
The number of available FTIR accessories is quite overwhelming. It is easy to be confused by multiple, often esoteric choices at typically exuberant prices. Sometimes, it is not easy to decide which accessory will do the job. An answer to this problem is PIKE Technologies Valu-Line Accessory Kit. This Kit, packaged in a durable and convenient storage case, combines the most often used and practical set of FTIR sampling accessories. It includes the following components:
SAMPLING KITS IF YOU DONT KNOW WHERE TO START
HATR Horizontal ATR

Is designed to analyze liquid and semi-liquid samples, pastes, gels, lms, soft powders and multiple solid materials. This accessory comes with trough and at crystal plates to accommodate all types of samples. The HATR is carefully designed to provide excellent results with minimum effort. It can be easily placed in the sample compartment and locked into position on the sample compartment baseplate, or a standard slide holder.
EasiDiff Diffuse Reectance Accessory

Is an ideal accessory for the analysis of powders and intractable solids. With a set of convenient tools for solid sample preparation, this compact, high performance accessory provides outstanding collection efciency.
F E AT U R E S O F T H E VA L U - L I N E S A M P L I N G K I T
Combination of most widely used FTIR accessories including:

Horizontal ATR Diffuse Reectance 30 Degree Specular Reectance
30Spec Specular Reectance Accessory

Is a great accessory for the analysis of thin organic lms deposited on reective surfaces and a myriad of surface coatings and surface treatments. The 30Spec is slide-mounted and comes with a set of three masks which allow for the isolation of small, pre-determined spots on larger samples, and the analysis of small samples. Please refer to the appropriate section of this catalog for more detail about these accessories.
Full range of sampling options and applications Complete set of auxiliary sample preparation tools for
immediate productivity
Pre-aligned, xed-position optical designs offering

reproducible, high quality data
High performance accessories providing excellent

sampling sensitivity O R D E R I N G I N F O R M AT I O N
Economical and logical addition to any FTIR

spectrometer. Excellent starter kit for routine applications, research or teaching
050-10XX
Valu-Line FTIR Reectance Accessories Kit Includes: HATR combined trough and at plate system, including 45 ZnSe crystals; trough plate, volatiles cover, powder press, at plate and sample clamp EasiDiff Accessory with sampling tools, two micro, two macro sample cups, EasiPrep sample preparation kit, alignment mirror, pestle and mortar, KBr 30Spec Specular reectance accessory with a set of three masks for control of the sampling spot size
Note: Select XX FTIR code from foldout on last page of this catalog. Add -GE, -KR, -SI or -AM to the part number to substitute the following HATR crystal plates: Germanium, KRS-5, Silicon or AMTIR.
Ultima Sampling Kit With the Highest Performance, Single-reection ATR and Backup Accessories to Do it All
This is true 80% of the time. The other 20% (especially when dealing with poor absorbers, some powders and lms) still need to be analyzed by other methods. For this reason, PIKE designed an accessory kit built around the MIRacle Single Reection ATR, and also included basic diffuse reectance and specular reectance accessories. This combination offers one of the most complete range of sampling devices used in FTIR and covers a wide variety of sampling needs.The Ultima Sampling Kit contains the following accessories:
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MIRacle Single Reection ATR

Designed to analyze a wide variety of solid and liquid samples. It offers a number of unique features including: a universal sampling plate which accommodates liquids, solids and powders, small (1.8 mm) sampling interface making the analysis of small and/or awkward samples easy, and interchangeable sampling plates. All the above options allow for the best selection of an appropriate spectral range, and a conguration which matches the optical, physical and chemical properties of analyzed samples. The patented optical design of the accessory offers the highest optical throughput and sensitivity. The MIRacle is equipped with a pressure clamp and purge attachments.
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EasiDiff Diffuse Reectance Accessory

Is an ideal product for the analysis of powders and intractable solids. With a set of convenient tools for sample preparation, this compact, high performance accessory provides outstanding collection efciency.
F E AT U R E S O F T H E U LT I M A S A M P L I N G K I T
Complete kit for ATR, diffuse reectance, and specular

reectance
30Spec Specular Reectance Accessory

Is a great accessory for the analysis of thin organic lms deposited on reective surfaces and a myriad of surface coatings and surface treatments. The 30Spec is slide-mounted and comes with a set of three masks which allow for the isolation of small, predetermined spots on larger samples, and the analysis of small samples. Please refer to the appropriate section of this catalog to review the theory and detailed description of kit components.
High-performance accessories eliminate tedious pellet making Analysis of liquids, solids, powders, polymers, and thin
lm samples
In recent years, single-reection ATR measurements have become quite popular for at least two main reasons they further simplify sample preparation and also reduce the complexity of traditional FTIR measurements. This is achieved through the reduction of the sampling area (smaller sample volume/size requirement), ease of cleaning and the introduction of more rigid, diamond-protected sampling interfaces, capable of withstanding higher pressures and harder samples. In many cases the single-reection ATR has become capable of analyzing a wide variety of samples including rigid solids and hard powders which are difcult to achieve with a multi-reection ATR. For these reasons, the single reection ATR has gained the reputation of being a universal sampling device.
050-20XX
Ultima Sampling Kit with: MIRacle Single-reection ATR with ZnSe Crystal, Universal Conguration for solid and liquid analysis, and High Pressure Clamp EasiDiff Accessory with Sampling Tools, two each micro and macro Sample Cups, EasiPrep Sample Preparation Kit, Alignment Mirror, Pestle and Mortar, and KBr 30Spec Specular Reectance Accessory with a set of three masks for control of the sampling spot size
Notes: Select XX FTIR code from foldout on last page of this catalog. Add -DI, -GE, -SI, or -AM to the part number to substitute the following MIRacle crystal plates: Diamond/ZnSe, Germanium, Si or AMTIR.
Attenuated Total Reectance

ATR products successfully replace constant path transmission cells and salt plates used for analysis of liquid and semi-liquid materials. Horizontal ATR are used to analyze lms, pastes, pliable solids and ne powders. Thanks to the reproducible effective pathlength, ATR is well suited for both qualitative and quantitative applications. Several heating options are available
Page 8
MIRacle Single Reection ATR ideal for sample identication
Page 12
GladiATR Single Reection ATR monolithic diamond for intractable samples and temperature studies
Page 14
GladiATR Vision Diamond ATR with sample view monolithic diamond for easy positioning and analysis of intractable samples
Page 16
HATR Multi-Reection ATR highest sensitivity for minor components
Page 20
ATRMax Variable Angle, Multi-Reection ATR research grade HATR
Page 23
VeeMax ATR Variable Angle, Single-Reection ATR for depth proling studies
Page 26
VATR Classic Variable Angle ATR
Page 27
ATR Theory and Applications
MIRacle ATR Fast and Easy IR Sampling

The PIKE MIRacle is a universal ATR sampling accessory for analysis of solids, liquids, pastes, gels, and intractable materials. In its most popular conguration it is a single reection ATR accessory with high IR throughput which makes it ideal for sample identication and QA/QC applications. Advanced options include three reection ATR crystal plates to optimize for lower concentration components. Easily changeable crystal plate design provides analysis of a broad spectrum of sample types while ensuring constant sampling pathlength. Single and three-reection ATR crystals are available to optimize general qualitative analysis or quantitative analysis of minor components. The PIKE MIRacle provides higher throughput saving you time and generating higher quality spectra.
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608-274-2721
F E AT U R E S O F T H E M I R AC L E
Highest IR throughput saving you time and improving your

analysis quality
Complete exibility add options to your MIRacle as your

sampling needs change
Thick Polymer Sample, using MIRacle with AMTIR Crystal and High-Pressure Clamp No Sample Preparation.
Highest value for todays competitive analytical and

research needs
MIRacle Optical Design

In the patented MIRacle optical design the ATR crystal both focuses the IR beam and provides the ATR sampling interface. This technology provides much higher throughput than competitive products and saves you considerable time and provides you higher quality spectra.
Fully congurable ZnSe, Diamond, Ge and Si MIRacle

crystal plates
Pinned-in-place, changeable crystal plates for fast and

easy sampling optimization
Highest purity, type IIa Diamond crystal will not scratch

and is chemically inert to acidic or caustic materials
Optional specular reectance plate for measurement of

coatings on reective surfaces
Choice of pressure clamps high-pressure, digital

high-pressure and micrometric sample clamps
Sampling options heating, temperature control, and ow

through plate
MIRacle High Throughput and Efcient Optical Design
MIRacle Highest IR Throughput ATR
AT TENUATED TOTAL REFLECTANCE LIQUIDS, SOLIDS AND IN-BETWEEN
MIRacle Crystal Options

The MIRacle ATR accessory is available with 4 different crystal types (ZnSe, Diamond, Ge, and Si) and with unique versions of these crystal materials. Crystal plates are pinned in place and easily changeable within seconds with no alignment required. With this exibility, you can change the crystal type to exactly match your sampling requirements. For example, diamond is ideal for brittle samples because it will not scratch, whereas, Ge is ideal for carbon lled samples because of its high refractive index and lower depth of penetration. Three reection crystal plates provide increased sensitivity for minor components in liquid or non-rigid materials. An optional liquids retainer and volatiles cover set is compatible with all crystal plates, eliminating the need to purchase at and trough crystal plates. A high-pressure clamp is required for use with the liquids retainer and the volatiles cover. Table 1 shows MIRacle ATR crystal characteristics including refractive index, spectral range cutoff, pH range and hardness for single reection ATR crystal plates. Still have questions? Please call as we are pleased to discuss your sampling requirements.
Faux Black Pearl with MIRacle using Diamond ATR Crystal
Black Rubber Samples are best run using Ge ATR Crystal
MIRacle ATR Crystal Plates
Table 1: MIRacle Crystal Plate Specications

MIRacle Crystal Plate Diamond/ZnSe Ge Si ZnSe Hardness kg/mm2 5700 550 1150 120 Cutoff cm-1, Spectral Range 525 575 89001500, 47540 520 Refractive Index @ 1000 cm-1 2.4 4.0 3.4 2.4 Depth of Penetration @ 45, 2.00 0.66 0.85 2.00 pH Range of Sample 114 114 112 59
Application Ideal for hard samples, acids or alkaline General purpose and carbon lled or rubber Excellent for far-IR spectral measurement General purpose ATR crystal
MIRacle Crystal plates are covered by PIKE Technologies patent numbers 5,965,889 and 6,128,075 or are manufactured under license of 5,200,609, 5,552,604 and 5,703,366.
MIRacle Pressure Clamp Options

MIRacle pressure clamps are pinned in place and easily changeable within seconds. A high-pressure clamp is recommended for most applications and is available in basic and digital congurations. The digital version includes a high-pressure clamp and the Digital Force Adapter (DFA) that attaches directly to the clamping assembly. The DFAs embedded load cell exhibits high linearity, reproducibility, and exceptional accuracy. The magnitude of applied force is displayed on an external easy-to-read LCD readout. The digital clamp is ideal for applications that require controlled and reproducible pressure. All clamps include tips for hard, soft and pellet shaped samples. High-pressure clamps are calibrated to deliver over 10,000 psi of pressure when used with the single reection crystal plates. Ability to deliver high pressure is very important for achieving spectral quality. In the example below, we demonstrate spectral differences for a porous polymer sample measured with the micrometer clamp and the high-pressure clamp. Clearly the spectrum obtained using the high-pressure clamp is required for a high quality result. MIRacle high-pressure clamps utilize a slip-clutch mechanism to prevent excessive pressure from being applied to the crystal.
Max. lbs. Pressure 40 8 Crystal Diameter, mm 1.8 6.0 1.8 6.0
MIRacle Pressure Clamps are Pinned-in-Place and Easily Upgraded
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MIRacle Digital Clamp Ideal for Controlled Pressure
MIRacle Clamp Pressures
PSI 10,141 913 2,028 183
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High-Pressure Clamps Micrometer Pressure Clamp
Note: All clamps except Micrometer are high-pressure
MIRacle Conned Space Clamp For instruments with limited sampling area
MIRacle High-Pressure MIRacle Micrometer Clamp Ideal for Clamp OK for Low Routine Sampling Pressure Applications
MIRacle ATR Summary

The MIRacle ATR accessory is a high performance FTIR sampling tool for solid, liquid, or polymer samples. Easily changeable crystal plates provide optimized spectral data for unique sample types. With options for single or three reection crystal plates, several pressure clamp styles and heating or cooling the MIRacle is able to address a wide range of FTIR sampling applications.
Porous Polymer Sample Measured Using High and Low-Pressure Clamp
MIRacle Sampling Options

The MIRacle can be congured with optional resistively heated crystal plates using a PIKE temperature control module. Digital and digital with PC control versions are available. The PC control module includes TempPRO software which provides a graphical user interface for temperature control and kinetic measurements.
MIRacle with Optional Heated Crystal Plate and PIKE Temperature Control Module
TempPRO software for graphical setup and control of kinetic measurements
MIRacle Base Optics (must select, insert spectrometer model for XX)
MIRacle Pressure Clamps

(must select 1 or more for solids or polymer analysis)
025-18XX
MIRacle ATR Base Optics/Platform Assembly
Notes: MIRacle Base Optics includes purge tubes, purge kit and spectrometer base mount. Please see the FTIR instrument code sheet.
025-3020 076-6025 025-3050
High-Pressure Clamp Digital Force Adapter for High-Pressure Clamp Micrometric, Low-Pressure Clamp Conned Space Clamp
MIRacle Crystal Plates (must select 1 or more)

025-3035
025-2108 025-2107 025-2118 025-2018 025-2038 025-2058 025-2098 025-2208
Diamond/ZnSe Performance Crystal Plate Diamond/ZnSe/HS Performance Crystal Plate 3 Reection Diamond/ZnSe Performance Crystal Plate ZnSe Performance Crystal Plate 3 Reection ZnSe Performance Crystal Plate Ge Performance Crystal Plate Si Performance Crystal Plate Specular Reection Performance Plate
Notes: The High-Pressure Clamp is recommended for general applications. Pressure clamps include a at tip, a swivel tip and a concave tip. The Digital Force Adapter requires High-Pressure Clamp, PN 025-3020, sold separately.
MIRacle Replacement Parts

025-3095 025-3093 025-3092 025-3096 025-3052 025-3061 025-3054 025-3053
Flat tip for High-Pressure Clamps Swivel tip for High-Pressure Clamps Concave tip for High-Pressure Clamps Sealed Pressure Tip for High-Pressure Clamp Flat tip for Micrometric Clamp Swivel tip for Micrometric Clamp Concave tip for Micrometric Clamp MIRacle Clamp Tip Assortment 7.8 mm ATR Pressure Tip
Notes: MIRacle Crystal Plates are pre-aligned and pinned-in-place. Changing crystal plates is easy and fast to optimize sampling results. Crystal plates are manufactured using polished stainless steel for chemical resistance. The diamond/ZnSe crystal plate is available with optional Hastelloy (HS) metal for exceptionally caustic or acidic samples.
MIRacle Sampling Options

025-3094
025-4018 025-4058 025-4108 026-5012 026-5013 026-3051 026-5010 076-1220 076-1420
Heated ZnSe Performance Crystal Plate Heated Ge Performance Crystal Plate Heated Diamond/ZnSe Performance Crystal Plate (60 C Max) Flow-through Attachment for Performance Plates Liquids Retainer and Volatiles Cover Set Volatiles Cover for Performance Plates Liquids Retainer for Performance Plates Digital Temperature Control Module Digital Temperature Control Module, PC Control
Notes: Please contact PIKE Technologies for items not described in this list. Reconditioning service for used MIRacle crystal plates is available.
M I R A C L E A C C E S S O R Y S P E C I F I C AT I O N S ATR Crystal Choices Crystal Plate Mounting Crystal Plate Mount Angle of Incidence Crystal Dimensions, Surface Pressure Device Diamond/ZnSe, Ge, ZnSe, Si User changeable plates Stainless steel 45 degrees, nominal 1.8 mm Rotating, continuously variable pressure; click stop at maximum
Notes: Flow through attachment, liquids retainer and volatiles cover are compatible with all crystal plate offerings but require High-Pressure Clamp, PN 025-3020, sold separately. Temperature controller selection is required for heated crystal plates. Digital temperature controller with PC control includes TempPRO software.
Digital Force Adapter (option) Load cell sensor for precise and reproducible pressure control. Attaches directly to MIRacle clamp. Digital readout. Maximum Pressure Sample Access Heating Options Accuracy Sensor Type Temperature Control 10,000 psi 55 mm, ATR crystal to pressure mount Ambient to 60 or 130 C maximum +/- 0.5% 3 wire Pt RTD (low drift, high stability) Digital or digital with PC control (up to 10 ramps, automated data collection, USB interface) 90264 VAC, auto setting, external power supply 3 A/24 VDC/30 W Optional, 45 degree nominal angle of incidence Purge tubes and purge line connector included 104 mm wide, 103 mm deep, 210 mm high (excludes FTIR baseplate and mount) Most, specify model and type
Input Voltage Operating Voltage Specular Reection Option Purge Sealing Accessory Dimensions FTIR Compatibility
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GladiATR Highest Performance Diamond ATR

The energy throughput of the GladiATR is exceptional; twice that of other monolithic diamond ATR accessories signicantly improving spectral quality and reducing sampling time.
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ATR/FTIR spectrum of polymer pellet run on GladiATR with diamond crystal. Spectral range in the mid-IR is 4000 400 cm-1.
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F E AT U R E S O F T H E G L A D I AT R
The GladiATR is designed and manufactured using all reecting optics providing full spectral range in the mid-IR and far-IR spectral regions. An optional Ge crystal plate is available for analysis of high refractive index samples. Crystal plates are easily changeable.
Diamond crystal design cannot scratch or fracture Extreme pressure application for hard and demanding
solid samples
Highest energy throughput design for excellent quality FTIR

spectra and minimum scan time
All reective optics full spectral range for mid-IR and far-IR
analysis
Optional Ge crystal plate for high refractive index samples Heated crystal plate options taking ATR temperature
studies up to 210 C
300 C Diamond Version for high temperature/high

pressure materials studies
Spectrum of sulfathiazole using GladiATR with diamond crystal plate and far-IR optics in FTIR
Compatible with most FTIR spectrometers

The GladiATR is an all new optical design from PIKE Technologies providing the highest energy throughput, highest available pressure, widest spectral range and offering optional heated or cooled crystal plates. The GladiATR is a highly durable and rugged design to be used in environments where large numbers of samples are measured, where samples may be intractable solids, where you want the best quality spectrum every time and where you need exibility for new sample types in the future. The GladiATR diamond crystal is a monolithic design which will not scratch or fracture even at extreme pressures. This design permits analysis of hard, intractable objects such as coated metal wires, polymer pellets and geological samples without damage to the ATR crystal. The diamond crystal is brazed into the stainless steel plate, which enables this ATR to be compatible with pressure up to 30,000 psi.
GladiATR with heated diamond crystal plate and temperature controller
Selection of the digital control module, PC control includes PIKE TempPRO software for graphical setup and automated data collection for thermal experiments
GladiATR Base Optics (must select, insert spectrometer model for XX)
026-18XX 026-17XX
GladiATR Single Reection ATR Base Optics, with heating capability up to 210 C GladiATR 300 Single Reection ATR Base Optics, 300 C
Notes: All GladiATRs include purge tubes, purge kit, and selected spectrometer base mount. GladiATR 300 is congured and available only with the Diamond plate. Crystal plates for the basic model (026-18XX) must be selected from the table below. High-Pressure Clamp, Digital Force Adapter and Liquid Retainer/Volatiles Cover are optional and need to be ordered separate, if required.
Temperature controlled crystal plates are available for thermal study of materials. PIKE Technologies offers temperature controllers with digital and PC programmable set points. The GladiATR high performance diamond ATR is available in congurations to t most FTIR spectrometers.
GladiATR Stainless Top (must select one or more)

026-2001 026-2002 026-2003
GladiATR Standard Stainless Top GladiATR Heated Stainless Top GladiATR Liquid Jacketed Stainless Top
GladiATR Crystal Plates for GladiATR (must select one or more)

026-2100 026-2050 026-2200
Diamond Crystal Plate Ge Crystal Plate Specular Reection Plate
Notes: GladiATR Crystal Plates are pre-aligned and pinned-in-place. Changing crystal plates is easy and fast to optimize sampling results.
GladiATR Pressure Clamp, all models (must select for solid or powdered samples)
026-3020 ATR/FTIR spectra from cure of thermoset epoxy using the heated diamond crystal plate on the GladiATR G L A D I AT R A C C E S S O R Y S P E C I F I C A T I O N S Diamond, germanium User changeable plates Monolithic Brazed Stainless steel 45 degrees, nominal 2.2 x 3.0 mm All reective Rotating, continuously variable pressure; click stop at maximum Load cell sensor for precise and reproducible Digital Force Adapter (option) pressure control. Attaches directly to GladiATR clamp. Digital readout. Maximum Pressure 30,000 psi Sample Access 80 mm, ATR crystal to pressure mount Spectral Range, Diamond 4000 to 30 cm-1 (IR optics dependent) Heating Options Diamond, 210 or 300 C maximum Accuracy +/- 0.5% Sensor Type 3 wire Pt RTD (low drift, high stability) Temperature Control Digital or digital with PC control (up to 10 ramps, automated data collection, USB interface) Input Voltage 90264 FAC, auto setting, external power supply Operating Voltage 3 A/24 VDC/75 W 6 A/24 VDC/150 W (300 C version) Cooling Options Liquid jacketed crystal plates available Specular Reection Option Optional, 45 degree nominal angle of incidence Purge Sealing Purge tubes and purge line connector included Accessory Dimensions 140 mm wide, 205 mm deep, 340 mm high (excludes FTIR baseplate and mount) FTIR Compatibility Most, specify model and type ATR Crystal Choices Crystal Plate Mounting Crystal Type Diamond Mounting Crystal Plate Mounts Angle of Incidence Crystal Dimensions, Surface Optics Pressure Device 076-6025
High-Pressure Clamp Digital Force Adapter for High-Pressure Clamp
Notes: The High-Pressure Clamp is required for analysis of solids, powders and use of liquid retainer and/or Digital Force Adapter (Digital Force Adapter cannot be used with heated crystal plates). Pressure clamp includes a at tip, a swivel tip and a concave tip.
GladiATR Temperature Controlled Crystal Plates

026-4102 026-4100 026-4050 026-4110 026-4150 076-1220 076-1420 076-1210 076-1410
Heated Diamond Crystal Plate, 300 C (GladiATR 300 only) Heated Diamond Crystal Plate, 210 C Heated Ge Crystal Plate, 130 C Liquid Jacketed Diamond Crystal Plate Liquid Jacketed Ge Crystal Plate Digital Temperature Control Module (210 C) Digital Temperature Control Module, PC Control (210 C) Digital Temperature Control Module (300 C) Digital Temperature Control Module, PC Control (300 C)
Notes: For heated diamond crystal plates, maximum crystal temperature is 300 or 210 C, depending on the GladiATR model selected. Ge becomes optically opaque at 190 C. Max recommended temperature for this crystal is 130 C. Temperature controller is required for heated crystal plates. Digital temperature controller, PC control includes PIKE TempPRO software. Liquid jacketed crystal plates require customer provided circulator.
GladiATR Sampling Options

026-5012 026-5013 026-5010 026-3051
Flow-Through Attachment Liquids Retainer and Volatiles Cover Set Liquids Retainer for Performance Plates Volatiles Cover for Performance Plates
Notes: Flow-Through Attachment, Liquids Retainer and Volatiles Cover are compatible with all crystal offerings (require High-Pressure Clamp).
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GladiATR Vision Diamond ATR with Sample View

The GladiATR Vision is a novel sampling tool which couples small area infrared analysis with simultaneous viewing. Samples are placed face down and positioned on the diamond crystal while its image is projected in real-time on the LCD screen. Finding and optimizing the sample placement for specic analysis areas is easy and fast! Analysis of thick or non-transparent samples is no problem because viewing is through the diamond crystal. The GladiATR Vision accessory utilizes an innovative optical design with IR beam and visible optical image converging at the sample position ensuring that What you see is what you sample! The 110X magnication of the sample image enables the positioning of even relatively small samples into the center of the diamond crystal for optimized analysis. Analysis of samples as small as 50 microns in size is doable with the GladiATR Vision accessory. Visible images from the GladiATR Vision are of highest quality color rendition because its refractive optics are fully transparent. The GladiATR Vision optical design is all reective, preserving the full spectral range inherent to diamond. For standard mid-IR FTIR spectrometers, the spectral range available with the GladiATR Vision will be 4000 400 cm-1. For FTIR spectrometers equipped with far-IR optics, the spectral range is extended to less than 50 cm-1. The GladiATR Vision diamond ATR is available in congurations to t most FTIR spectrometers.
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F E AT U R E S O F T H E G L A D I AT R V I S I O N
View through diamond crystal easily nd sample point 110X magnication nd and position small sample areas Optional USB image capture document sample image Diamond crystal design cannot scratch or fracture Highest energy throughput design for excellent quality FTIR
spectra and minimum scan time
All reective optics full spectral range for mid-IR and

far-IR analysis
Optional heated, viewing crystal plate Compatible with most FTIR spectrometers
ATR/FTIR spectrum of print area on paper run on GladiATR Vision with diamond crystal. Image of the analysis area is shown in the inset. Spectral range is 4000 400 cm-1 with standard FTIR optics.
Diamond crystal plate of the GladiATR Vision accessory. IR beam and visible illumination meet at the sample position.
ATR / FTIR spectrum of 200 micron ber run on GladiATR Vision with diamond crystal. Compressed ber image is shown with the spectrum.
G L A D I AT R V I S I O N A C C E S S O R Y S P E C I F I C A T I O N S ATR Crystal Choices Crystal Plate Mounting Crystal Type Diamond Mounting Crystal Plate Mounts Angle of Incidence Crystal Dimensions, Surface Optics Pressure Device Diamond, germanium (non-viewing) User changeable plates Monolithic Brazed Stainless steel 45 degrees, nominal 2.2 x 3.0 mm All reective Rotating, continuously variable pressure; click stop at maximum
GladiATR Vision Base Optics (must select one, insert spectrometer model for XX)
026-19XX 026-3510
GladiATR Vision Base Optics USB Interface / Software for GladiATR Vision
Notes: GladiATR Vision Base Optics versions include purge tubes, illumination power supply, purge kit and spectrometer base mount. Please see the FTIR instrument code sheet. Optional USB interface software enables image capture on your PC.
GladiATR Stainless Top (must select one or more)

Digital Force Adapter (option) Load cell sensor for precise and reproducible pressure control. Attaches directly to GladiATR clamp. Digital readout. Maximum Pressure Sample Access Spectral Range, Diamond Viewing Optics Magnication View Area Optional Image Save Viewing Mode Input Voltage Operating Voltage, Wattage Heating Options Accuracy Sensor Type Temperature Control 30,000 psi 80 mm, ATR crystal to pressure mount 4000 to 30 cm-1 (IR optics dependent) Integrated 4" LCD 110X magnication 770 x 590 microns USB image capture Through diamond crystal 90264 V, auto setting, external power supply 12 V, 18 watts Diamond, 200 C maximum +/- 0.5% 3 wire Pt RTD (low drift, high stability) Digital or digital with PC control (up to 10 ramps, automated data collection, USB interface) 90264 V, auto setting, external power supply 3A/24 VDC/75W Optional, 45 degree nominal angle of incidence Purge tubes and purge line connector included 140 mm wide, 225 mm deep, 340 mm high (excludes FTIR baseplate and mount) Most, specify model and type
026-2004 026-2005 026-2006
GladiATR Vision Stainless Top GladiATR Vision Heated Stainless Top GladiATR Vision Liquid Jacketed Stainless Top
GladiATR Vision Crystal Plates (must select one or more)

026-2102 026-2050 026-2200
GladiATR Vision Diamond Crystal Plate Ge Crystal Plate (non-viewing) Specular Reection Plate (non-viewing)
Notes: GladiATR Crystal Plates are pre-aligned and pinned-in-place. Changing crystal plates is easy and fast to optimize sampling results. Only the GladiATR Vision Diamond Crystal Plate is compatible with sample viewing.
GladiATR Vision High-Pressure Clamp (must select for solid or powdered samples)
026-3020 076-6025
High-Pressure Clamp Digital Force Adapter for High-Pressure Clamp
Input Voltage Operating Voltage Specular Reection Option Purge Sealing Accessory Dimensions FTIR Compatibility
Notes: The High-Pressure Clamp is required for analysis of solids, powders and use of liquid retainer and/or Digital Force Adapter (Digital Force Adapter cannot be used heated crystal plates). Pressure clamp includes a at tip, a swivel tip and a concave tip.
GladiATR Vision Temperature Controlled Crystal Plate

026-4101 026-4050 026-4112 076-1220 076-1420
Heated Diamond Crystal Plate, 210 C, Vision Heated Ge Crystal Plate, 130 C (non-viewing) Liquid Jacketed Diamond Crystal Plate Digital Temperature Control Module Digital Temperature Control Module, PC Control
Notes: Digital temperature controller, PC control includes PIKE TempPRO software.
GladiATR Vision Sampling Options

026-5012 026-5013 026-5010 026-3051
Flow-Through Attachment Liquids Retainer and Volatiles Cover Set Liquids Retainer for Performance Plates Volatiles Cover for Performance Plates
Notes: Flow-Through Attachment, Liquids Retainer and Volatiles Cover are compatible with all crystal offerings (require High-Pressure Clamp).
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Multiple Reection HATR Maximum Sensitivity and Highly Versatile FTIR Sampling
HATR Accessory in-compartment HATR for liquid and solid samples Horizontal Attenuated Total Reectance (HATR) accessories successfully replace constant path transmission cells, salt plates and KBr pellets used in the analysis of liquid, semi-liquid materials and a number of solids. HATRs feature a constant and reproducible effective pathlength and are well suited for both qualitative and quantitative applications. In general, sampling is achieved by placing the sample onto the HATR crystal generally eliminating sample preparation. PIKE Technologies HATR products are available in 2 base optic congurations. The HATR is an in-compartment design for samples which t into the FTIR sample compartment. The PIKE Technologies HATRPlus is an out-of-compartment design for samples which are larger and do not t into the FTIR sample compartment. The sampling surface of the HATRPlus extends above the FTIR cover, thereby permitting analysis of very large samples. Applications examples include coatings on large manufactured components, layered composition analysis on large objects, and skin analysis in the health care industry. The PIKE Technologies HATRs are high performance accessories, carefully designed to provide excellent results with minimum effort. The accessories are easily installed in the sample compartment, locking into position on the sample compartment baseplate.
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HATRPlus Accessory out-of-compartment HATR for liquid and extra large solid samples
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ratio and spectral quality concentration components precision and quick cleanup plate options
F E AT U R E S O F T H E H AT R
FTIR spectrum of fuel additive using HATR trough plate with ZnSe crystal
Excellent energy throughput offering high signal-to-noise Up to 20 internal reections for maximum sensitivity for low Removable crystal plates with pinned positioning for high HATR plates with ZnSe, KRS-5, Ge, AMTIR or Si crystals with
selectable face angles to optimize sampling depth
Stable alignment provides excellent analytical precision. Crystal plate changeover is rapid, allowing a wide range of samples to be analyzed with maximum convenience. PIKE Technologies HATRs have been optimized for maximum optical throughput and excellent quality spectra can be obtained from demanding samples. Several high quality crystal materials covering a full spectrum of applications are available. Trough crystal plates are sealed using metallic gaskets, eliminating premature failure and the risk of cross-contamination associated with inferior, epoxy-bonded systems. Flat crystal plates are designed with positive surface relief to aid in improved sample contact. All PIKE HATRs include a purge tube interface for the FTIR spectrometer. This provides full integration of the accessory with the FTIR spectrometers purging system (sealed and desiccated or purged) and removal of water and carbon dioxide artifacts from the FTIR spectra. Thanks to this, purging is very efcient and the spectrometer can be operated with the sample compartment door open.
In-compartment (HATR) and out-of-compartment (HATRPlus)

versions for small and extra large sample sizes
Several temperature controlled and ow-through crystal
HATR Crystal Plate Choices

PIKE Technologies HATR crystal plates are available in trough and at plate congurations.
FTIR spectrum of coating on inner wall of food container by HATR with ZnSe at plate and pressure clamp
PIKE Technologies Crystal Plate Choices for the HATR and HATRPlus
The trough plate is designed for easy sampling, with a large, recessed crystal to accommodate the sample generally a liquid, powder, or paste. The trough plate is ideal when samples must be cleaned from the crystal with some type of aqueous or organic solvent.
Trough plate HATR crystal plate ideal for liquids, powders, pastes and gels
HATR with Heated Trough Plate foreground shows Heated Flow-Through Cell
Typically, only a thin layer of the sample needs to be applied onto the crystal surface. For fast evaporating samples, a volatiles cover should be used to cover the sampling area. Soft powders will often produce good spectra when analyzed by HATR, assuming that they can be put in intimate contact with the crystal. A powder press option is used to achieve this. This device is placed directly on top of the sample lled trough and pressed by hand until the desired result is obtained.
All resistively heated HATR plates are controlled by PIKE temperature controllers in digital or digital PC versions. The selection of the digital PC version includes PIKE TempPRO software, which provides a graphical user interface for temperature control and kinetic measurements.
Flat plate HATR crystal plate ideal for solids, polymer lms and coatings
The at plate is used for the analysis of solid materials including polymer and lm samples. It is ideal for solid samples which are too large to t within the trough plate conguration. The crystal is mounted slightly above the surface of the metal plate, which helps to achieve good crystal/sample contact when the at plate press is used (the press attaches easily to the back of the HATR with two thumb screws). The ZnSe 45 at plate is available in a sealed version, which is ideal for sampling of oils and other types of low surface tension liquids.
PIKE TempPRO Software for Kinetic Experiments with our Resistively Heated Crystal Plates
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A large number of temperature-controlled and ow-through sampling plates are available for PIKE Technologies HATRs all are pin-mounted to the HATR with no alignment required. All temperature controlled and ow-through crystal plate options are compatible and interchangeable with HATR and HATRPlus products. PIKE Technologies temperature controllers provide static or ramped temperature control.
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RCPlate for HATR
For special applications where you need to look at coatings on an HATR crystal, PIKE Technologies offers the RCPlate option. The new RCPlate is designed to enable easy removal and reinsertion of the HATR crystal. Applications include analysis of coatings, mono-molecular layers, or bio-lms deposited directly upon the HATR crystal. With these new RCPlates, it is easy to collect the background spectrum on the clean crystal, remove the HATR crystal from the RCPlate, coat the crystal and then reposition it into the RCPlate to collect the sample spectrum.
HATR with Liquid Jacketed Flow Cell (background). Liquid Jacketed trough plate is shown in foreground.
Summary
The PIKE Technologies HATR accessory provides high sensitivity for analysis of low concentration components in liquid, solid, and polymer samples. The highly exible accessory is available for in-compartment and out-of-compartment congurations with complete selection of crystal material, sample format, and temperature and ow-through congurations. Do you need an HATR product or feature not shown here in our catalog? Please contact us to discuss your application.
All PIKE HATR ow cells have removable HATR crystals. The upper and lower part of the crystal plate is removed, and the crystal can be easily taken out of the plate. This feature enables replacement of the crystals and facilitates special cleaning for proteins and other sticky samples.
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Complete HATR Systems

Bundled HATR Systems (must select, insert spectrometer model for XX)
HATR and HATRPlus Crystal Plates (must select 1 or more)

022-2010-45 022-2020-45 022-2024-45 022-2012-45 022-2022-45 022-2030-45 022-2040-45 022-2050-45 022-2060-45 022-2064-45 022-2052-45 022-2062-45 022-2070-45 022-2080-45
Trough Plate, ZnSe, 45 Flat Plate, ZnSe, 45 Sealed Flat Plate, ZnSe, 45 Trough Plate, ZnSe, 45, 2 mm Flat Plate, ZnSe, 45, 2 mm Trough Plate, KRS-5, 45 Flat Plate, KRS-5, 45 Trough Plate, Ge, 45 Flat Plate, Ge, 45 Sealed Flat Plate, Ge, 45 Trough Plate, Ge, 45, 2 mm Flat Plate, Ge, 45, 2 mm Trough Plate, AMTIR, 45 Flat Plate, AMTIR, 45 Trough Plate, Si, 45 Flat Plate, Si, 45
022-10XX 022-11XX 022-12XX
HATR Trough Plate System with 45 ZnSe Crystal Includes: Trough Plate, Volatiles Cover and Powder Press HATR Flat Plate System with 45 ZnSe Crystal Includes: Flat Plate and HATR Pressure Clamp HATR Combined Trough and Flat Plate System with 45 ZnSe Crystals Includes: Trough Plate, Flat Plate, Volatiles Cover, Powder Press and Sample Clamp HATRPlus Flat Plate System with 45 ZnSe Crystal Includes: Flat Plate and HATR Pressure Clamp
024-11XX
Notes: HATR and HATRPlus Systems may be purchased with crystal plates other than ZnSe. Just add Ge for germanium, KR for KRS-5, -AM for AMTIR, or Si for Silicon. Additional plates can be added to an order for any system above. Other congurations may be selected from the options below. Please see the FTIR instrument code sheet.
Congurable HATR Systems

HATR Base Optics (insert spectrometer model for XX)
022-2090-45 022-2100-45
022-19XX 024-19XX
HATR Platform Optics Assembly HATRPlus Platform Optics Assembly
Notes: HATR and HATRPlus Platform Optics Assemblies include volatiles cover, powder press, purge tubes, purge kit and spectrometer base mount. Please see the FTIR instrument code sheet.
Notes: HATR Crystal Plates are pre-aligned and pinned-in-place. Changing crystal plates is easy and fast to optimize sampling results. For all HATR crystal plates, 30 and 60 degree face angles are also available. Due to critical angle ZnSe, KRS-5 and AMTIR are not available in 30 degree face angle. Where not noted, crystals are 4 mm thick and generate 10 internal reections. 2 mm crystals generate 20 reections (45 cut). If you need a crystal not listed here, please contact us.
HATR and HATRPlus Pressure Clamp
(must select for solids, lms or powder analysis)
R E S I S T I V E LY H E AT E D H AT R P L AT E S S P E C I F I C AT I O N S Temperature Range Accuracy Sensor Type Controllers Digital Digital PC Input Voltage +/- 0.5% of set point +/- 0.5% of set point, graphical setup, up to 10 ramps, USB interface 90264 V, auto setting, external power supply 24 VDC/50 W max. Ambient to 130 C +/- 0.5% 3 wire Pt RTD (low drift, high stability)
022-3050 022-3054 024-3050 024-3053
HATR (pivoting) Pressure Clamp HATR High-Pressure Clamp HATRPlus (pivoting) Pressure Clamp HATRPlus High-Pressure Clamp
Notes: The pressure clamp is required for solids, lms, coatings and powdered samples.
HATR and HATRPlus Flow Cells

Output Voltage
022-4010 022-4020 022-4030 022-4040 022-4050
HATR Flow Cell, ZnSe, 45 HATR Flow Cell, AMTIR, 45 HATR Flow Cell, KRS-5, 45 HATR Flow Cell, Si, 45 HATR Flow Cell, Ge, 45
HATR and HATRPlus Liquid Jacketed, Flow-Through Crystal Plates

022-5410 022-5420 022-5430 022-5440 022-5450
HATR Liquid Jacketed Flow-Through Plate, ZnSe, 45 HATR Liquid Jacketed Flow-Through Plate, AMTIR, 45 HATR Liquid Jacketed Flow-Through Plate, KRS-5, 45 HATR Liquid Jacketed Flow-Through Plate, Si, 45 HATR Liquid Jacketed Flow-Through Plate, Ge, 45
Notes: HATR ow cells include Luer-Loc ttings for easy connection with a syringe. A set of 1/16" Swageloc ttings are included with each ow cell for connection with 1/16" tubing. Flow cell volume is 500 l.
HATR and HATRPlus Liquid Jacketed Crystal Plates

022-5310 022-5320 022-5330 022-5340 022-5350
HATR Liquid Jacketed Trough Plate, ZnSe, 45 HATR Liquid Jacketed Trough Plate, AMTIR, 45 HATR Liquid Jacketed Trough Plate, KRS-5, 45 HATR Liquid Jacketed Trough Plate, Si, 45 HATR Liquid Jacketed Trough Plate, Ge, 45
Notes: Liquid jacketed ow-through crystal plates require customer provided circulating water bath. Liquid jacketed ow-through crystal plates enable heating to 130 C and cooling. HATR ow cells include Luer-Loc ttings for easy connection with a syringe. A set of 1/16" Swageloc ttings are included with each ow cell for connection with 1/16" tubing.
HATR RCPlate
022-2300
RCPlate for HATR (for 45 crystals)
Notes: Liquid jacketed crystal plates require customer provided circulating water bath. Liquid jacketed crystal plates enable heating to 130 C and cooling.
Notes: Requires a selection of HATR Crystal see below.
HATR and HATRPlus Heated Crystal Plates

P/N FOR S INGLE RTD DESCRIPTION
HATR and HATRPlus Replacement Parts

022-3051 022-3052 022-3110 022-3111 022-3112 022-3113 022-3114 022-3130 022-3132 022-3040 022-3045 022-3042 022-3047
HATR Volatiles Cover HATR Powder Press Crystal, 45, Trap, 80 x 10 x 4 mm ZnSe Crystal, 45, Trap, 80 x 10 x 4 mm KRS-5 Crystal, 45, Trap, 80 x 10 x 4 mm Ge Crystal, 45, Trap, 80 x 10 x 4 mm AMTIR Crystal, 45, Trap, 80 x 10 x 4 mm Si Crystal, 60, Trap, 80 x 10 x 4 mm ZnSe Crystal, 60, Trap, 80 x 10 x 4 mm Ge Viton O-Ring, HATR Flow Cell, Upper (6 ea.) Viton O-Ring, HATR Flow Cell, Lower (6 ea.) HATR Flow Cell Upper Teon O-Ring HATR Flow Cell Lower Teon O-Ring
022-5110 022-5120 022-5130 022-5140 022-5150

PART NUMBER
HATR Heated Trough Plate, ZnSe, 45 HATR Heated Trough Plate, AMTIR, 45 HATR Heated Trough Plate, KRS-5, 45 HATR Heated Trough Plate, Si, 45 HATR Heated Trough Plate, Ge, 45
DESCRIPTION
022-5210 022-5220 022-5230 022-5240 022-5250

PART NUMBER
HATR Heated Flow-Through Cell, ZnSe, 45 HATR Heated Flow-Through Cell, AMTIR, 45 HATR Heated Flow-Through Cell, KRS-5, 45 HATR Heated Flow-Through Cell, Si, 45 HATR Heated Flow-Through Cell, Ge, 45
DESCRIPTION
076-1420 076-1220
Digital Temperature Control Module, PC Control Digital Temperature Control Module
Notes: Please contact PIKE Technologies for items not described in this list. Reconditioning service for used HATR crystal plates is available.
Notes: Temperature is adjustable to 130 C for heated trough and ow-thru plates. Resistance heated plates require selection of a PIKE Technologies Temperature Controller. PC Control Module includes PIKE Technologies TempPRO software.
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ATRMax II Variable Angle Horizontal ATR Accessory HATR for Inquisitive Minds
The ATRMax II is a high throughput, variable angle horizontal ATR accessory developed for use in FTIR spectrometers. The design employs a unique optical layout (U.S. patent 5,105,196) which enables samples to be analyzed over a range of incident angles (from 25 to 65 degrees). Variable angle of incidence provides experimental control over the depth of penetration of an IR beam into the sample and the number of beam reections in the ATR crystal, which in turn determines the effective IR beam pathlength for a given experiment. Adjustable angle of incidence allows immediate optimization of measurements for otherwise difcult to analyze samples. The ATRMax can be used for depth proling studies where spectral composition can be analyzed relative to depth of penetration as the angle of incidence is changed.
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PIKE TECHNOLOGIES
WWW.PIKETECH.COM
608-274-2721
F E AT U R E S O F T H E AT R M A X I I
Selectable angle of incidence 20 to 70 degrees in one

degree increments
0.5 to 10 micron depth of penetration dependent on crystal

material, angle of incidence, samples refractive index and wavelength of IR beam ideal for depth proling studies
Proprietary beam path within the ATRMax II FTIR sampling accessory.
3 to 12 reections of IR beam dependent upon angle of

incidence ideal for optimizing ATR sampling methods
Flat and trough crystal plates for solids, lms, powders and
liquid samples optional temperature control for all plates
Optional, high-pressure clamp for sampling of lms, coatings

or powdered samples
Motorized option with electronic control module and AutoPRO

software for automated, high-precision experiments
Sealed and purgeable optical design to eliminate water

vapor and carbon dioxide interferences
Depth proling study of silicon release agent using ATRMax II accessory. FTIR spectra collected using Ge crystal at plates at effective angles of incidence from 25 to 65 degrees.
Two crystal congurations, at plate and trough plate, are available for the ATRMax II. The at plate design is used for the analysis of coatings, lms and solids. Typical applications include depth proling studies and optimization of ATR spectral data. A sample clamp is required to provide intimate contact between the sample and crystal surface.
The variable angle of incidence can be controlled manually or with an optional motorized attachment for the ATRMax II. Multiple ATR measurements at different angles of incidence can be fully automated with the motorized version and PIKE Technologies AutoPRO software. Automation streamlines the collection of spectra from multiple angles of incidence. With the automated ATRMax accessory, the entire experiment can be pre-programmed and executed by the computer.
AutoPRO Software control of ATRMax angle of incidence (automated polarizer available) for automated depth proling studies and ATR experiment optimization.
Optimized FTIR spectrum of polymer lm run with the ATRMax II at 60 degree angle of incidence.
The trough crystal plate is recommended for use with liquids, pastes and powdered samples. Typical applications include the analysis of oils, detergents, and other liquid samples. A volatiles cover and powder press are included with the ATRMax II for use with this crystal mount. Advantages of the automated ATRMax II system include: Computer controlled precision, accuracy and repeatability Synchronization of mirror position changes with collection of sample spectra Full integration of the PIKE Technologies AutoPRO software with FTIR spectrometer programs Tailor made, predened experiments Hands-free operation
Optional resistively heated crystal plates are available for the ATRMax II trough, at and ow cell versions. These heated crystal plates are driven using PIKE Technologies Temperature Controllers available in digital and digital PC versions. The digital PC version includes PIKE TempPRO software for graphical setup and data collection for kinetic experiments. Ambient temperature and liquidjacketed ow cells are available for the ATRMax II. With the liquid-jacketed version one can measure samples at heated or cooled temperatures using a circulating water bath.
Liquid cough syrup sample run with the ATRMax II accessory using the ZnSe trough plate and a 40 degree angle of incidence.
The ATR crystals for the ATRMax II are of trapezoidal shape and 56 mm long, 10 mm wide and 4 mm thick. Standard bevel angles at each end of the crystal are available in 30, 45, and 60 degree versions. Coupling the variable angle of incidence of the ATRMax II with the variable crystal face angles, one can select effective angle of incidence ranging from 25 to 65 degrees and the range in number of reections from 3 to 12.
ATRMax II RCPlate
For special applications where you need to look at coatings on an ATR crystal, PIKE Technologies offers the RCPlate option. The new RCPlate is designed to enable easy removal and reinsertion of the ATR crystal. Applications include analysis of coatings, mono-molecular layers, or bio-lms deposited directly upon the ATR crystal. With these new RCPlates, it is easy to collect the background spectrum on the clean crystal, remove the ATR crystal from the RCPlate, coat the crystal and then reposition it into the RCPlate to collect the sample spectrum.
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PIKE TECHNOLOGIES
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ATRMax II System Congurations
PA R T N U M B E R DESCRIPTION
ATRMax II Sampling Options

023-10XX 023-11XX 023-12XX
ATRMax II Trough Plate System with 45 ZnSe Crystal Includes: Trough Plate, Volatiles Cover and Powder Press ATRMax II Flat Plate System with 45 ZnSe Crystal Includes: Flat Plate and HATR Pressure Clamp ATRMax II Combined Trough and Flat Plate System with 45 ZnSe Crystals Includes Trough Plate, Flat Plate, Volatiles Cover, Powder Press and Sample Clamp
023-2800 023-2850 090-1000 090-2000 023-2300 023-4000 023-4100 023-4200 023-4300
Motorized Upgrade for ATRMax II Motorized Option for ATRMax II Manual Polarizer, ZnSe Automated Polarizer, ZnSe RCPlate for ATRMax II ATRMax Flow Cell Assembly (Order crystal separately) ATRMax Liquid-Jacketed Flow Cell Assembly (Order crystal separately) ATRMax Heated Flow Cell Assembly (Order crystal separately) ATRMax Heated Trough Plate Assembly (Order crystal separately) ATRMax Heated Flat Plate Assembly (Order crystal separately) ATR Variable Angle Heating Conversion Plate Digital Temperature Control Module, PC Control Digital Temperature Control Module
Notes: ATRMax II Systems may be purchased with crystal plates other than ZnSe. Just add Ge for germanium, -KR for KRS-5, -AM for AMTIR, or Si for Silicon. Additional plates can be added to an order for any system above. Other congurations may be selected from the options below.
ATRMax II Base Optics (must select, insert spectrometer model for XX)
023-4400 013-4200 076-1420 076-1220
023-19XX
ATRMax II Variable Angle HATR
Notes: ATRMax II Base Optics includes volatiles cover, powder press, purge tubes, purge kit and spectrometer base mount.
ATRMax II Crystal Plates (must select 1 or more)

023-2001 023-2011 023-2021 023-2031 023-2041 023-2051 023-2003 023-2013 023-2023 023-2033 023-2043 023-2053 023-2046 023-2047 023-2002 023-2012 023-2022 023-2032 023-2042 023-2052 023-2044 023-2045
Trough Plate, ZnSe, 45 Flat Plate, ZnSe, 45 Trough Plate, ZnSe, 30 Flat Plate, ZnSe, 30 Trough Plate, ZnSe, 60 Flat Plate, ZnSe, 60 Trough Plate, Ge, 45 Flat Plate, Ge, 45 Trough Plate, Ge, 30 Flat Plate, Ge, 30 Trough Plate, Ge, 60 Flat Plate, Ge, 60 Trough Plate, AMTIR, 45 Flat Plate, AMTIR, 45 Trough Plate, KRS-5, 45 Flat Plate, KRS-5, 45 Trough Plate, KRS-5, 30 Flat Plate, KRS-5, 30 Trough Plate, KRS-5, 60 Flat Plate, KRS-5, 60 Trough Plate, Si, 45 Flat Plate, Si, 45
Notes: Motorized Option includes PIKE Technologies AutoPRO software and controller. Other polarizer options are found in the polarization section of this catalog. The ATR Variable Angle Heating Conversion Plate must be selected with temperature controlled crystal plates. Resistively heated crystal plates require selection of the Temperature Control Module. Maximum crystal temperature is 130 C.
608-274-2721
ATRMax II Crystals
023-3110 023-3130 023-3120 023-3112 023-3132 023-3121 023-3114 023-3134 023-3113 023-3133
Crystal, 45 deg., Trap., 56 x 10 x 4, ZnSe Crystal, 60 deg., Trap., 56 x 10 x 4, ZnSe Crystal, 30 deg., Trap., 56 x 10 x 4, Ge Crystal, 45 deg., Trap., 56 x 10 x 4, Ge Crystal, 60 deg., Trap., 56 x 10 x 4, Ge Crystal, 30 deg., Trap., 56 x 10 x 4, Si Crystal, 45 deg., Trap., 56 x 10 x 4, Si Crystal, 60 deg., Trap., 56 x 10 x 4, Si Crystal, 45 deg., Trap., 56 x 10 x 4, AMTIR Crystal, 60 deg., Trap., 56 x 10 x 4, AMTIR
Notes: Please contact PIKE Technologies for crystals not on this list.
ATRMax II Replacement Parts

023-3051 023-3052
ATRMax II Volatiles Cover ATRMax II Powder Press
Notes: Please contact PIKE Technologies for items not described in this list. Reconditioning service for used ATRMax crystal plates is available.
R E S I S T I V E LY H E AT E D AT R M A X I I P L AT E S S P E C I F I C AT I O N S Temperature Range Accuracy Voltage Sensor Type Controller Digital Digital PC Input Voltage Operating Voltage Ambient to 130 C +/- 0.5% 24 VDC 3 wire Pt RTD (low drift, high stability) +/- 0.5% of set point +/- 0.5% of set point, graphical setup, up to 10 ramps, USB interface 90264 V, auto setting, external power supply 24 VDC/36 W
Notes: ATRMax Crystal Plates are pre-aligned and pinned-in-place. Changing crystal plates is easy and fast to optimize sampling results. If you need a crystal plate not listed here, please contact us.
ATRMax II Pressure Clamp

023-3050
ATRMax Pressure Clamp
Notes: The pressure clamp is required for solids, lms, coatings and powdered samples.
VeeMAX II with ATR Variable Angle, Single Reection ATR for Depth Proling Studies
combination of large crystal diameter (20 mm) and slip-clutch pressure clamp provides sample to crystal contact without altering layered sample composition. The optional liquid retainer may be added to the crystal plate for analysis of liquid samples.
Depth proling study of layered polymer lm. FTIR spectra collected using ZnSe crystal at set angles of incidence from 43 to 65 degrees. IR absorbance band at 1591 cm-1 clearly increases relative to other bands as we probe deeper into the sample.
F E AT U R E S O F T H E V E E M A X I I W I T H AT R
Continuously variable set angle of incidence 30 to 75 degrees 0.4 to 46 micron depth of penetration dependent on crystal
material, angle of incidence, samples refractive index and wavelength of IR beam ideal for depth proling studies
Monolayers and ultra-thin films absorbed on silicon or gold substrate are easily sampled using the VeeMAX II equipped with a high refractive index ATR crystal. Compared to specular reflectance sampling for monolayer analysis, an increase in sensitivity of up to 1-2 orders of magnitude may be realized via ATR sampling. For these applications, the VeeMAX II accessory is configured to include a high-angle Ge flat plate (60 or 65), the VeeMAX II highpressure clamp with a 7.8 mm pressure tip, and a polarizer.
High throughput for excellent quality spectra in a short

time period
Optional, high-pressure clamp for sampling of lms, coatings

or powdered samples
Integrated position for optional manual or automated

polarization
Motorized option with electronic control module and AutoPRO

software for automated, high-precision experiments
VeeMAX II can be used as a variable angle of incidence

specular reection accessory
Congurable for specialized applications monolayer studies

and spectroelectrochemistry
Analysis of monomolecular layer on silicon VeeMAX II with 60 degree Ge crystal, pressure clamp with 7.8 mm tip and p polarization.

The VeeMAX II with ATR offers continuous variable angle of incidence and a variety of crystal plates to selectively control the depth of penetration of the IR beam into the sample. ATR applications include the study of layered samples, coatings, release agents, monolayers on silicon and chemical migration studies. The VeeMAX II with ATR accessory provides exceptionally high throughput (over 50% with 45 degree ZnSe crystal) to minimize sampling time and enable detection of low concentration components in samples of complex composition. The at plate crystals offered for the VeeMAX II are ideal for solid and layered samples and are designed for use with the optional pressure clamp. The A spectroelectrochemical cell option for the VeeMAX II is also available. The innovative design offers a polytetrafluoroethylene cup sealed to an ATR crystal, which is mounted on the VeeMAX. The crystals are interchangeable for optimizing spectral results and are removable to allow electrode coating on the ATR surface. The high throughput of the VeeMAX with ATR provides excellent sensitivity and reduced sampling time. Additionally, a flat IR transparent window may be installed instead to permit specular reflectance sampling. The electrochemistry cell is equipped with a precision micrometer for electrode positioning.
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PIKE TECHNOLOGIES
VeeMAX with ATR optical layout
WWW.PIKETECH.COM
V E E M A X I I W I T H AT R S P E C I F I C AT I O N S ATR Crystal Choice Crystal Plate Mounting Spectroelectrochemical cell with removable and interchangeable crystals mounted on the VeeMAX Crystal Plate Mounts Optics Pressure Device ZnSe, Ge, Si, ZnS User changeable plates Stainless Steel All reflective Rotating, continuous variable pressure; click stop at maximum 130 C +/- 0.5% 3 wire Pt RTD (low drift, high stability) Digital or digital with PC control (up to 10 ramps, automated data collection, USB interface) 90264 V, auto setting, external power supply 24 VDC/36W Purge tubes and purge barb included 74 mm wide, 69 mm tall, 40 mm deep (excludes clamp height and baseplate) 19 mm diameter tapering to 25 mm, 25 mm tall 7.5 mL Polytetrafluoroethylene Most, specify model and type
Crystal Dimension, Surface 20 mm diameter
608-274-2721
VeeMAX spectroelectrochemical cell offers maximum exibility by its interchangeable and removable crystals
Heating Options Accuracy Sensor Type Temperature Control Input Voltage Operating Voltage Purge Sealing Accessory Dimensions Spectroelectrochemical Vessel Dimensions Spectroelectrochemical Vessel Volume Spectroelectrochemical Vessel Material FTIR Compatibility
Motorized control of angle of incidence via personal computer for automated data collection of depth proling studies and ATR measurements is available for the accessory. The motorized VeeMAX II is ideal for depth proling studies as it greatly speeds and improves the precision and reproducibility of the data collection process.
AutoPRO Software control of VeeMAX II angle of incidence (automated polarizer available) for automated depth proling studies, angle of incidence and polarization angle can be set independently.
Temperature controlled crystal plates are available for thermal study of materials. PIKE Technologies offers temperature controllers with digital and PC programmable set points.
Heated crystal plates are available for the VeeMAX II for Temperature Studies
TempPRO software for graphical setup and control of kinetic measurements
VeeMAX II Base Optics (must select, insert spectrometer model for XX)
VeeMAX II Pressure Clamp (must select for solids, lms or powder analysis)
013-10XX
VeeMAX II Variable Angle Specular Reectance Accessory
013-3100 025-3094
VeeMAX ATR Pressure Clamp 7.8 mm ATR Pressure Tip
Notes: VeeMAX II includes specular reectance masks (2", 5/8" and 3/8"), purge tubes, purge kit and spectrometer base mount. Please see the FTIR instrument code sheet.
VeeMAX II ATR Crystal Plates (must select 1 or more for ATR)

Notes: Pressure clamp supplied with 20 mm tip for polymer lms. The 7.8 mm pressure tip is required for monolayers on silicon or small samples. The pressure clamp is required for solids, lms, coatings and powdered samples.
013-4020 013-4030 013-4040 013-4050 013-4060 013-4080 013-4070 013-4090 013-4095 013-3400 013-3500
Flat Plate, ZnSe, 45 Flat Plate, ZnSe, 60 Flat Plate, Ge, 45 Flat Plate, Ge, 60 Flat Plate, Ge, 65 Flat Plate, Si, 45 Flat Plate, Si, 60 Flat Plate, ZnS, 45 Flat Plate, ZnS, 60 Liquid Retainer for VeeMAX II ATR crystals VeeMAX II ATR Flow Cell
VeeMAX II Sampling Options

007-0300 013-2850 013-2800 090-1000 090-2000
PIKECalc Software Motorized Option for VeeMAX II Motorized Upgrade for VeeMAX II Manual Polarizer, ZnSe Automated Polarizer, ZnSe
Notes: PIKECalc software provides easy calculations of depth of penetration, effective angle of incidence and critical angle for ATR measurements. Motorized Option includes PIKE Technologies AutoPRO software and controller. Other polarizer options are found in the polarization section of this catalog.
Spectroelectrochemical Conguration
Notes: VeeMAX II Crystal Plates are pre-aligned and pinned-in-place. Changing crystal plates is easy and fast to optimize sampling results. ZnS crystal plate is excellent for deepest penetration of IR beam. Si crystal plate is excellent for Far IR ATR. If you need a crystal not listed here, please contact us. Reconditioning service for used VeeMAX crystal plates is available.
013-3200 013-3110 013-3130 013-3112 013-3132 013-3114 013-3134 013-3115 013-3135 160-1144 160-1304 013-3245 013-3260
Electrochemical Cell ZnSe Crystal, 45 ZnSe Crystal, 60 Ge Crystal, 45 Ge Crystal, 60 Si Crystal, 45 Si Crystal, 60 ZnS Crystal, 45 ZnS Crystal, 60 CaF2 Flat Window, 20 mm diameter ZnSe Flat Window, 20 mm diameter 45 Alignment Fixture 60 Alignment Fixture
Heated VeeMAX II ATR Crystal Plates (optional)

013-4120 013-4130 013-4140 013-4150 013-4160 013-4170 013-4180 013-4190 013-4195 013-4200 076-1220 076-1420
Heated Flat Plate, ZnSe, 45 Heated Flat Plate, ZnSe, 60 Heated Flat Plate, Ge, 45 Heated Flat Plate, Ge, 60 Heated Flat Plate, Ge, 65 Heated Flat Plate, Si, 60 Heated Flat Plate, Si, 45 Heated Flat Plate, ZnS, 45 Heated Flat Plate, ZnS, 60 ATR Variable Angle Heating Conversion Plate Digital Temperature Control Module Digital Temperature Control Module, PC Control
Notes: The electrochemical conguration requires electrochemical cell and the VeeMAX II Specular Reectance Accessory. Must select one or more crystals. Choose an alignment xture to match the crystal angle. A CaF2 window may be used for specular reectance sampling. Other window types for specular reectance measurements may be found in our listing of transmission windows, 20 mm x 2 mm. Either alignment xture is applicable for mounting a at window. Electrodes supplied by the end-user.
Notes: Heated VeeMAX crystal plates may be heated to 130 C. A temperature controller and the ATR Variable Angle Heating Conversion Plate must be selected.
Replacement Parts
013-4010
Mask Set for VeeMAX
25
Classic VATR Variable Angle ATR for Analysis of Solids, Films and Coatings
The Variable Angle ATR, is a traditional in-compartment accessory with the ATR crystal mounted vertically with respect to the spectrometer baseplate. Its optical layout is based on an optimized Gilby conguration and allows continuous adjustment of the incident beam angle between 30 to 60 degrees. This accessory is suitable for the analysis of solids, lms and coatings, but for obvious reasons, it cannot be used for working with liquids. A unique mirror adjustment mechanism which utilizes mirror placement and proportional pivoting allows precise and repeatable alignment. The PIKE Technologies Variable Angle ATR offers exibility when the frequent replacement of ATR crystals is required. VATR is an excellent, low-cost tool for teaching the principles of internal reection spectroscopy, and for basic research.
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PIKE TECHNOLOGIES
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VATR Base Optics (must select, insert spectrometer model for XX)
021-19XX
VATR Variable Angle, Vertical ATR
F E A T U R E S O F T H E C L A S S I C VA T R
608-274-2721
Notes: VATR Base Optics includes plate for mounting in FTIR spectrometer slide mount.
30 to 60 continuously variable angle of incidence Full control over the number of reections and depth
of penetration
VATR Crystal Options (must select 1 or more)

P/N 50 MM DESCRIPTION P/N 25 MM
Unique mechanism for ne-tuning mirror positions and

precise and repeatable alignment
021-4000 021-4010 021-4040 021-4150 021-4130 021-4060 021-4070 021-4160
KRS-5, 45 Parallelogram KRS-5, 60 Parallelogram ZnSe, 45 Parallelogram ZnSe, 60 Parallelogram Ge, 30 Parallelogram Ge, 45 Parallelogram Ge, 60 Parallelogram Si, 45 Parallelogram
021-4020 021-4030 021-4050 021-4120 021-4100 021-4080 021-4090 021-4110
High energy throughput Stainless steel, easy to remove crystal mounts and anvils Economical introduction to ATR techniques excellent R&D
and teaching tool
Notes: VATR crystals are available in 25 mm and 50 mm lengths all are 3 mm thick and 10 mm wide. Select crystal length and type based upon desired sample absorbance.
VATR Crystal Holder and Clamp (must select 1 or more to hold ATR crystals)
021-5050 021-5020
50 mm VATR Crystal Holder and Clamp 25 mm VATR Crystal Holder, Clamp and Mirror
Notes: The pressure clamp is selected for the ATR crystal length.
VATR Replacement Parts

021-5040 021-5030
25 mm VATR Crystal Holder and Clamp Set of 25 mm and 50 mm Pads
Notes: Please contact PIKE Technologies for items not described in this list.
ATR Theory and Applications

Attenuated Total Reectance (ATR) is today the most widely used FTIR sampling tool. ATR generally allows qualitative or quantitative analysis of samples with little or no sample preparation, which greatly speeds sample analysis. The main benet of ATR sampling comes from the very thin sampling pathlength and depth of penetration of the IR beam into the sample. This is in contrast to traditional FTIR sampling by transmission where the sample must be diluted with IR transparent salt, pressed into a pellet or pressed to a thin lm, prior to analysis to prevent totally absorbing bands in the infrared spectrum. A comparison of transmission versus ATR sampling results for a thick polymer sample is shown below where the sample is too thick for high quality transmission analysis (shown in the lower blue spectrum). In transmission spectroscopy, the IR beam passes through the sample and the effective pathlength is determined by the thickness of the sample and its orientation to the directional plane of the IR beam. Clearly in the example below the sample is too thick for transmission analysis because most of the IR bands are totally absorbing. However, simply placing the thick sample on the ATR crystal (Diamond MIRacle) and applying pressure generates a nearly perfect result (upper red spectrum) identied by library search as a polybutylene terephthalate. The total analysis time for the thick polymer by ATR was less than 1 minute. While the analysis of samples by ATR is easy, it is interesting and useful to be aware of each of the following experimental factors and how they affect the nal spectrum: Refractive indices of the ATR crystal and the sample Angle of incidence of the IR beam Critical angle Depth of penetration Wavelength of the IR beam Effective pathlength Number of reections Quality of the sample contact with ATR crystal ATR crystal characteristics The refractive indices of the crystal and sample are important considerations in the ATR sampling technique by virtue of the following equation,
where n2 is the refractive index of the sample, n1 is the refractive index of the crystal and c is the critical angle. When we exceed the critical angle, we will observe a purely ATR spectral result. If the critical angle is not met, we will observe a combined ATR and external reectance result. This occurs if the angle of incidence of the IR beam is too low, if the refractive index of the crystal is too low, if the refractive index of the sample is too high or a combination of these 3 factors. In most cases this problem is not observed, however, an example of this is shown in the following spectral data for your reference. The sample is a high refractive index liquid (n=1.8) run on a 45 degree accessory using diamond and Ge crystal plates. The spectrum run on the Ge crystal plate exhibits a normal baseline and symmetric absorbance bands critical angle is met. The spectrum run on the diamond crystal plate has a baseline shifted and asymmetric absorbance bands due to non-adherence to the critical angle requirements for this set of analysis parameters.
ATR and Transmission Spectra of a Thick Polymer Sample
How ATR Works

With ATR sampling we direct the IR beam into a crystal of relatively higher refractive index. The IR beam reects from the internal surface of the crystal and creates an evanescent wave, which projects orthogonally into the sample in intimate contact with the ATR crystal. Some of the energy of the evanescent wave is absorbed by the sample and the reected radiation (some now absorbed by the sample) is returned to the detector. This ATR phenomenon is shown graphically in the following representation of a single reection ATR.
Spectra of High Refractive Index Liquid using Ge (upper red) and Diamond (lower blue) ATR Crystals
Another way to correct the spectral artifacts observed (above) in the high refractive index sample spectrum would be to increase the angle of incidence in the ATR accessory to a value above the critical angle. Adjustment or selection of the angle of incidence is available in several of the PIKE Technologies ATR accessories.
Graphical Representation of a Single Reection ATR
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PIKE TECHNOLOGIES
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ATR Sampling for n2 = 1.5 = 1000 cm-1 45 45 45 30 30 30 60 60 60 N 1 3 10 1 3 10 1 3 10 dp 2.0 2.0 2.0 N/A N/A N/A 1.11 1.11 1.11
ZnSe, Diamond n1 = 2.4 c = 38.7 de 4.36 4.36 4.36 N/A N/A N/A 1.53 1.53 1.53 EPL 4.36 13.08 43.60 N/A N/A N/A 1.53 4.59 15.32 dp 1.7 1.7 1.7 N/A N/A N/A 1.02 1.02 1.02
AMTIR n1 = 2.5 c = 36.9 de 3.38 3.38 3.38 N/A N/A N/A 1.30 1.30 1.30 EPL 3.38 10.15 33.84 N/A N/A N/A 1.30 3.91 13.03 dp 0.66 0.66 0.66 1.2 1.2 1.2 0.51 0.51 0.51
Ge n1 = 4.0 c = 22.0 de 0.61 0.61 0.61 1.59 1.59 1.59 0.32 0.32 0.32 EPL 0.61 1.84 6.14 1.59 4.76 15.85 0.32 0.97 3.23
Table 1: Pathlengths (in microns) of ATR Crystals at Various Angles of Incidence and Numbers of Reections
Further useful consideration for ATR analysis is the depth of penetration (dp) of the IR beam into the sample. Technically, this is dened as the distance required for the electric eld amplitude to fall to e-1 of its value at the surface and is further dened by:
An example of the benet of increased number of reections is shown in the following spectral data for the analysis of carbohydrate content in a soft drink sample. The upper red spectrum is run using a 10 reection HATR accessory. The lower blue spectrum is run using a single reection ATR using an identical scaling factor. Clearly the minor carbohydrate bands are more readily apparent in the multi-reection ATR accessory.
608-274-2721
where is the wavelength of light and is the angle of incidence of the IR beam relative to a perpendicular from the surface of the crystal. Typical depth of penetration in ATR ranges from about 0.5 microns up to about 5 microns depending upon these experimental conditions. Shown in the graphical representation of the ATR phenomenon, the strength of the evanescent wave decays rapidly as we progress from the surface of the ATR crystal. If we wish to compare the sample absorbance of the ATR measurement with that of a transmission measurement, we need to calculate the volume of the evanescent wave, known as the effective penetration of the IR beam. The effective penetration (de), is unique for parallel polarization (deII) and perpendicular polarization (d) and these are dened by:
Soft Drink Sample using 10 Reection and 1 Reection ATR
The effective penetration for an unpolarized IR beam is the average of the parallel and perpendicular penetration.
Generally, a single reection ATR is ideal for qualitative analysis, What is my sample? When we need to look at minor components of a sample for qualitative or quantitative analysis, then we need to increase the effective path length (EPL) by increasing the number of reections (N) within the ATR crystal. The effective pathlength in ATR is derived by the following equation:
For your convenience we have calculated theoretical values of depth of penetration, effective penetration, and effective path length for typical combinations of crystal materials, angles of incidence, and number of reections shown in Table 1. With the thin penetration of the evanescent wave into the sample, it is obvious that intimate contact of the sample be made onto the surface of the ATR crystal. For liquid or pliable samples, quality of sample contact with the ATR crystal is generally not a problem. For rigid, irregular shaped or porous samples, high pressure sufcient to deform the sample will increase the extent of sample contact and thereby increase sample absorbance. This is shown in the following spectral data collected for a porous foam polymer using a MIRacle ATR with ZnSe crystal.
Porous Foam Sample with High Pressure (upper red) and Low Pressure (lower blue)
The lower blue spectrum was collected with low pressure applied to the foam sample, whereas the upper red spectrum is produced with high pressure. The ATR absorbance using high pressure is about 10 times greater than with low pressure all other sampling factors are identical. For rigid, crystalline, or hard, irregular surface samples we recommend a single reection Diamond MIRacle ATR because it is relatively easy to apply high pressure onto the small crystal (1.8 mm diameter) with the highpressure clamp, producing over 10,000 PSI. The selection of the ATR crystal characteristics should be matched to the type of samples we run. Selection can be made to control depth of penetration of the IR beam, for hardness to prevent crystal damage, for desired spectral range and for acceptable pH range for acid or caustic samples. No individual crystal type will solve all problems, so PIKE Technologies offers a broad range of choices for ATR. Table 2 will give you some guidelines for selection of your ATR crystal.
n1 AMTIR Diamond/ZnSe Germanium KRS-5 Silicon ZnS ZnSe 2.5 2.4 4.0 2.37 3.4 2.2 2.4
dp, for n2 = 1.5 = 1000 cm-1, 45 deg, microns 1.70 2.01 0.66 2.13 0.85 3.86 2.01
Water Solubility, g/100 g Insoluble Insoluble Insoluble 0.05 Insoluble Insoluble Insoluble
pH Range 1-9 1-14 1-14 5-8 1-12 5-9 5-9
Hardness, Kg/mm 170 5,700 550 40 1,150 240 120
Table 2: ATR Crystal Characteristics for FTIR Sampling
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PIKE TECHNOLOGIES
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608-274-2721
Diffuse Reectance
Diffuse reectance is a highly sensitive technique for the analysis of powdered and solid samples. Typically, a sample is ground with KBr to a ne powder and run without making pellets. Some samples can be run directly without dilution especially, if one is looking for minor components. Diffuse reectance sampling is ideally suited to automation and PIKE offers congurations for high throughput diffuse reectance sampling.
Page 32
EasiDiff Workhorse Diffuse Reectance Accessory
Page 33
DiffusIR Research Diffuse Reectance Applications Optional Heat Chambers
Page 35
UpIR Upward Looking Diffuse Reectance ideal for large samples and easy sample access
Page 36
AutoDiff Automated Diffuse Reectance Sampling up to 60 samples
Page 37
X, Y Autosampler Automated Diffuse Reectance microtiter format
Page 38
Sampling Kits Easing Diffuse Reectance Sample Preparation
Page 39
Diffuse Reectance Theory and Applications
EasiDiff Workhorse Diffuse Reectance Accessory

A spectrum of papaverine hydrochloride (about 1% in KBr powder) was collected using the PIKE Technologies EasiDiff diffuse reectance accessory.
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PIKE TECHNOLOGIES
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A special version of the EasiDiff for NIR measurements (gold coated optics) is also available
608-274-2721
F E AT U R E S O F T H E E A S I D I F F
EasiDiff Accessory (Must Select One)

042-10XX
EasiDiff Accessory with Sample Preparation Kit Includes: Two Micro Sample Cups, Two Macro Sample Cups, EasiPrep Sample Preparation Kit, Alignment Mirror, 35 mm Mortar with Pestle and KBr Powder (100 g) EasiDiff Accessory, NIR Version with Gold Coated Optics Includes: Two Micro Sample Cups, Two Macro Sample Cups, EasiPrep Sample Preparation Kit, Alignment Mirror, 35 mm Mortar with Pestle and KBr Powder (100 g)
Pre-aligned optical components for reproducible, high

quality data
042-50XX
Micrometer controlled sample positioning and focusing High energy throughput providing nanogram sensitivity Precision slide for repeatable sample introduction and efcient
collection of background and sample spectra
Notes: Replace XX with your spectrometer model from code provided on the last page of this catalog.
EasiDiff Options (Optional)

Unique sample preparation and loading kit with two macro

cups, two micro cups, spatulas and necessary tools
042-3010
The PIKE Technologies EasiDiff is an economical, high quality diffuse reectance accessory designed to analyze a wide variety of solid samples. It is most often used in the analysis of pharmaceuticals, illicit drugs, inorganic solids and minerals, and powdered chemicals. The EasiDiff reduces the time required to produce an infrared spectrum compared to KBr pellet techniques. Typically, a small amount of sample (about 1%) is mixed and ground with KBr powder and the spectrum is collected. The EasiDiff employs an elegant, high performance optical design for maximum energy throughput and ease of operation. Optical components critical to achieving this performance are permanently aligned. Focusing is achieved by bringing the sample (not the collection mirror) to the optimum position with a micrometer. A dual position sample holder permits background and sample collection in a simple, two-step process.
Abrasion Sampling Kit Includes: Heavy Duty Sampling Tool and Stainless Steel Sample Support, 25 Diamond Abrasive Disks and 75 Silicon Carbide Abrasive Disks
Notes: Abrasion disks are disposable with each sample analysis order additional disks below.
Replacement Parts and Supplies

042-2010 042-2020 042-2025 042-3020 042-3025 042-3030 042-3040 042-3080 042-3082
Small Sample Cup (micro: 6.0 mm diameter, 1.6 mm deep), 2 per package Large Sample Cup (macro: 10 mm diameter, 2.3 mm deep), 2 per package EasiDiff Sample Slide Silicon Carbide Abrasive Disks (Pack of 100) Diamond Abrasive Disks (Pack of 50) Sample Cup Holder and Base Sample Preparation Kit Alignment Mirror Alignment Mirror Gold
DiffusIR Research Grade Diffuse Reectance Accessory

The PIKE Technologies environmental chambers can be operated at temperatures ranging from -150 to 900 C and at pressures up to 1500 psi. The optional chambers are easily inserted and removed from the DiffusIR using push lock pins. Coupling the DiffusIR and environmental chambers with the PIKE PC Controlled Temperature Module and TempPRO software provides the ability to graphically set up the experiment with up to 10 ramps and data collection initiated at specied time or temperature values. Advanced temperature studies of materials in controlled environments can be done using the PIKE environmental chambers. A special version of the DiffusIR with gold-coated optics is available for maximum mid-IR performance and for NIR diffuse reectance sampling. The DiffusIR and its options are compatible with most FTIR spectrometers.
DIFFUSE REFLECTANCE FROM POWDERS TO PLASTIC BUMPERS
F E AT U R E S O F T H E D I F F U S I R
Large, highly efcient collection optics for maximum sensitivity

and detection limits
Micrometer controlled sample focus to optimize results for

every sample
PIKE Technologies TempPRO software provides a graphical interface for temperature control and kinetic measurements
Optional environmental chambers for heating, cooling,

high vacuum and high pressure applications
Quick release feature of environmental chambers for easy

insertion and removal of sealed chambers
Digital PC controller option for macro control of data

collection at user specied temperatures or times

vapor and carbon dioxide interference
The PIKE Technologies DiffusIR is a research grade diffuse reectance accessory with a large, efcient optical design accommodating the optional PIKE Technologies environmental chambers. These specialized chambers can be used to study thermodynamic properties of materials, determine reaction mechanisms, perform catalytic studies and much more. The heart of the DiffusIR is a unique monolithic ellipsoidal reector permanently Optical geometry of xed in place the DiffusIR accessory eliminating the need for repositioning the focus optics for sample placement. The DiffusIR optical design is optimized to efciently collect diffuse radiation generated from the sample and minimize the effects of the specular radiation component. With the DiffusIR, sample introduction is performed using an integral 2 position slide enabling background and sample spectra to be collected without loss of purge. The sample height can be optimized by using the micrometer sample focusing adjustment. In this manner the sensitivity of the accessory is maximized without sacricing precision. The DiffusIR comes equipped with a Sample Preparation and Loading Kit and a Sample Abrasion Kit for the analysis of intractable samples. The DiffusIR optics are enclosed and equipped with purge tubes for the elimination of atmospheric interferences.
Thermal transformation of hydrated inorganic compound measured with DiffusIR with environmental chamber. Spectra automatically collected between 80 and 160 C at 5 degree increments using PIKE TempPRO software.
Spectrum of Ottawa sand measured with the DiffusIR
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PIKE TECHNOLOGIES
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DiffusIR Accessory (must select one)
Replacement Parts and Supplies (cont.)

041-10XX
DiffusIR Accessory Includes Sample Preparation Kit with 2 micro and 2 macro sample cups, sample loading tools, Abrasion Sampling Kit, SiC and Diamond Sampling Disks, Alignment Mirror, 35 mm Mortar with Pestle and KBr Powder (100 g) DiffusIR Accessory with Gold Coated Optics Includes Sample Preparation Kit with 2 micro and 2 macro sample cups, sample loading tools, Abrasion Sampling Kit, SiC and Diamond Sampling Disks, Alignment Mirror, 35 mm Mortar with Pestle and KBr Powder (100 g)
160-1159 162-4210 162-4215 162-4251 162-4270 042-3082
32 x 3 mm Si Disk O-Ring, DiffusIR Chamber, (Pack of 10) O-Ring, DiffusIR Chamber Cooling Line, (Pack of 10) Ceramic Cup, DiffusIR Chamber, porous Alignment Mirror, DiffusIR Chamber Alignment Mirror Gold
041-60XX
Notes: Please see the FTIR instrument code sheet.
D I F F U S I R S P E C I F I C AT I O N S Optical Design Angle of Incidence DiffusIR Dimensions Sample Focus Sample Positions Sample Cups Purge 3X ellipsoidal 30 degrees, nominal 180 mm wide, 230 mm deep, 130 mm high (excluding purge tubes and base plate) Micrometer 2 positions, slide stops for background and sample with no purge loss Macro: 10 x 2.3 mm deep Micro: 6 x 1.6 mm deep Standard purge tubes and purge connection
DiffusIR Options (optional)

162-4150 162-4190 162-4180 162-4140
DiffusIR Environmental Chamber (HTV), ambient to 500 C DiffusIR Environmental Chamber (HTV), ambient to 900 C High Pressure Adaptation for Chambers (HTV) DiffusIR Environmental Chamber (LTV), -150 to 500 C
Notes: DiffusIR Heated Chambers include front plate accommodating environmental Chamber (easily changeable with standard front plate), Pin-Loc Chamber insertion for easy sample exchange, KBr window, ceramic sampling cups compatible with vacuum and reaction formats, ports and 2 shut-off valves for vacuum operation and ports for connection of water cooling. The 500 C and 900 C HTV chambers may be tted with the high pressure adaption and are easily switchable from standard vacuum to high pressure operation. The LTV chamber is not compatible with simultaneous pressurization and low temperature operation. Operation of the LTV at sub ambient temperatures requires customer supplied liquid chilling equipment or PN 162-4160 Liquid Nitrogen Cooled System and Temperature Control Module. The HVT and LVT chambers require the selection of a temperature control module below.
608-274-2721
D I F F U S I R E N V I R O N M E N TA L C H A M B E R S P E C I F I C AT I O N S Temperature Range HTV Temperature Range LTV Accuracy Input Voltage Operating Voltage Temperature Control Heating Rate, Maximum Kinetic Setup (requires Digital PC Controller, includes PIKE TempPRO software) Ambient to 500 or 900 C -150 to 500 C +/- 0.5% 90264 V, auto setting, external power supply 24 VDC/84 W Digital or Digital PC 120 C/minute Up to 10 temperature ramps Individual ramp rate and hold time settings Graphical display of experiment settings Trigger data collection at specified times or temperatures USB interface K Type (for HTV) RTD Type, Pt100 (for LTV) 1 x 10-6 Torr (13 x 10-4 Pa) 32 x 3 mm disk (vacuum) 32 mm ZnSe dome (pressure) < 6.0 x 10-11 Pa m3/sec 1500 psi, with HP adaption (HTV versions only) 14.7 psi (1 atmosphere) without High Pressure Adaptation 6.0 mm OD, 4.0 mm height 4.7 mm ID, 2.0 mm depth Ceramic, porous compatible with powders and gas flow Quick-Fit, 6 mm ID 1/8" Swage Lock
Temperature Control Modules

076-2420
PC Controlled Temperature Module, HTV Chambers Includes: Digital Temperature Selection, TempPRO Software with Integrated Data Collection Digital Temperature Control Module, HTV Chambers Liquid Nitrogen Cooled System and Temperature Control Module DiffusIR Environmental Chamber (LTV) -150 to 500 C
076-2220 162-4160
Notes: PC Controlled Temperature Module with TempPRO software provides a graphical user interface for setting experiment parameters and data collection. Please contact PIKE for PC compatibility. The Temperature Control Modules for the HTV and LTV chambers are not interchangeable.
Sensor
Replacement Parts and Supplies

Vacuum Achievable Window Size Leaking Volume Pressure Maximum
042-2010 042-2020 042-3020 042-3025 042-3030 042-3040 042-3010 042-3080 160-1132 160-1113 160-5049
Small Sample Cup (micro: 6.0 mm diameter, 1.6 mm deep), 2 per package Large Sample Cup (macro: 10 mm diameter, 2.3 mm deep), 2 per package Silicon Carbide Abrasive Disks (Pack of 100) Diamond Abrasive Disks (Pack of 50) Sample Cup Holder and Base Sample Preparation Kit Abrasion Sampling Kit Alignment Mirror 32 x 3 mm KBr Disk 32 x 3 mm ZnSe Disk 32 x 3 mm SiO2 Disk
Sample Cup Size Sample Cup Design Cooling Ports Gas/Vacuum Ports
UpIR Upward Looking Diffuse Reectance Accessory

In the NIR spectral region the UpIR is ideal for the QC analysis of powdered and tablet samples when the gold coated optics version is selected.
Optical geometry for the UpIR
F E AT U R E S O F T H E U P I R
Upward looking optics providing fast and easy analysis of

samples placed face down on the UpIR sample port
Out-of-compartment design for analysis of large samples High optical throughput and exceptional signal-to-noise ratio Analysis of powders, ground solid samples and coatings on
metallic surfaces
Pre-aligned, xed-position optical components for reproducible,

high quality data
The accessory is equipped with an upward-looking, high-performance ellipsoidal mirror which minimizes the effect of specular radiation. The sampling stage provides a sampling port with inserts for diffuse reectance or specular reectance measurements. All mirrors, including the ellipsoidal collection mirror, are permanently mounted. The position of the sampling stage is controlled with the adjustable micrometer to achieve the best possible throughput. Spectral analysis involves collecting a background spectrum with the reference mirror in the sampling position. After this step, the sample is simply placed face down onto the sampling port and data collection is initiated. The gold coated optics version of the UpIR provides highest throughput in the mid-IR spectral region and is recommended for NIR sampling. The UpIR accessory includes a solids sampling plate for at samples, and a ZnSe windowed sampling cup for powdered or small solids analysis. The accessory is equipped with purge tubes for elimination of CO2 and water interferences from infrared spectra. For NIR sampling of solids, powders or tablet samples, the sapphire windowed sampling cup is recommended. In the NIR spectral region samples can be analyzed while contained in a glass vial. For this measurement, the optional 21 mm glass vial holder is recommended.
Micrometer controlled sample stage positioning and focusing Optional gold-coated optics version for highest performance
mid-IR and NIR applications
The UpIR is an innovative FTIR accessory developed to support a wide range of diffuse reectance applications. The UpIR is designed as a tall structured sampling accessory and is used by simply placing large, solid samples face down onto the top plate of the accessory. In the case of powdered or small solids, they can be placed into a suitable sampling cup at the top of the UpIR. This design is uniquely suitable for mid-IR analysis of coatings on metallic surfaces of large or small samples. For this application, analysis is rapid and easy because no sample preparation or cleanup is required. Since the sampling area of the UpIR is above the plane of the FTIR instrument, even large samples that do not t into the sample compartment can be analyzed with this accessory.
PART NUMBER
DESCRIPTION
044-10XX
UpIR Out-of-compartment Diffuse Reectance Accessory Includes solids sampling insert, powders sampling insert with ZnSe window, gold mirror, purge tubes, purge kit and spectrometer base mount. UpIR Out-of-compartment Diffuse Reectance Accessory with Gold-Coated Optics Includes solids sampling insert, powders sampling insert with ZnSe window, gold mirror, purge tubes, purge kit and spectrometer base mount.
044-60XX
Notes: Replace XX in part number with code for your spectrometer model found on the last page of this catalog.
UpIR Options
044-3030 044-3040 044-3010 044-3020 160-1155 160-1307 160-1201 160-5000 Analysis of a large painted metal panel using the UpIR accessory
Solids Sampling Insert Powders Sampling Insert 21 mm Glass Vial Holder Sample Vials with Threaded Caps, 21 mm x 70 mm, (200 per package) 25 x 2 mm ZnSe Window 25 x 2 mm Ge Window 25 x 2 mm AMTIR Window 25 x 2 mm Sapphire Window
Notes: Solids and Powders Sampling Inserts do not include a window please make a selection from the list above.
35
AutoDiff Automated Diffuse Reectance Sampling

The optical design of the AutoDiff utilizes a high efciency xed ellipsoidal reector to collect the maximum amount of diffusely reected energy from the sample. Other optical components important to achieving this high performance are aligned and permanently located. The accessory is baseplate mounted in the FTIR spectrometer sample compartment and can be purged independently or it can use the spectrometers purge. Spectral quality and reproducibility are excellent with the AutoDiff. By programming the collection of spectra at precise time periods and alternating sample and background collection, any effects of atmosphere are greatly reduced. The PIKE AutoDiff fully automates diffuse reectance FTIR spectroscopy. The sample holder contains positions for sixty samples, plus a center position for a background sample, which usually consists of pure KBr powder. The sample plate is marked into six areas, labeled from A to F. Each area has ten sample positions marked from 1 through 10. This sample position numbering scheme is also used within the software for describing and positioning the samples. The AutoDiff is controlled by PIKE AutoPRO software which incorporates multi-operator sample submission. The system is extremely exible and the graphical user interface is intuitive and simple. Multiple operators may independently log samples onto the system. The AutoPRO software integrates easily with most commercially available FTIR software packages. The AutoDiff is also available with gold-coated optics for highest performance mid-IR analysis and for automated NIR diffuse reectance sampling.
36
PIKE TECHNOLOGIES
WWW.PIKETECH.COM
608-274-2721
F E AT U R E S O F T H E AU TO D I F F
Complete automated diffuse reectance accessory and software

package for unattended analysis of up to 60 samples
High-performance optical design-collecting maximum

amount of diffusely reected energy and providing high quality spectra in a short time period
Flexible sample sequencing and background collection to

provide maximum sampling efciency and greatly minimize atmospheric contributions to sample spectra
Easily programmable AutoPRO software providing automated

sample collection and storage
Easily removable sample tray to speed sample loading

and unloading
PART NUMBER
DESCRIPTION
The AutoDiff is a high performance, automated diffuse reectance accessory developed to analyze multiple samples with minimal user intervention. Typical applications include powdered pharmaceutical samples, high throughput forensic sampling, kidney stone analysis, soils analysis and analysis of many other powdered samples where speed and efciency are important. The design employs an automated R-theta sampling stage with positions for up to 60 samples, providing diffuse reectance analysis with greatly reduced operator intervention and increased sample throughput.
043-28XX
AutoDiff Automated Diffuse Reectance System Includes: Motion Control Unit (85/265 VAC), AutoPRO Software, 60 Position Sample Mounting Tray, 60 Macro Sample Cups and Sample Preparation Kit AutoDiff Automated Diffuse Reectance System, Gold-Coated Optics System Includes: Motion Control Unit (85/265 VAC), AutoPRO Software, 60 Position Sample Mounting Tray, 60 Macro Sample Cups and Sample Preparation Kit
043-78XX
Notes: Replace XX code in part number with your spectrometer model see last page of this catalog.
Replacement Parts and Options

043-3090 043-0900 042-2010 042-2020 042-3010 042-3020 042-3025 042-3080 Spectra of pharmaceuticals using the AutoDiff accessory 042-3082
AutoDiff Set of 60 Sampling Cups (macro) AutoDiff, 60 Position Sampling Tray Small Sample Cup (micro: 6.0 mm diameter, 1.6 mm deep), 2 per package Large Sample Cup (macro: 10 mm diameter, 2.3 mm deep), 2 per package Abrasion Sampling Kit Silicon Carbide Abrasive Disks (Pack of 100) Diamond Abrasive Disks (Pack of 50) Alignment Mirror Alignment Mirror Gold
X, Y Autosampler Transmission and Reectance Automated Sampling in Microplate Format

PIKE Technologies have developed a special silicon well plate excellent for transmission analysis. This unique 96 well plate provides full mid-IR transmission spectra and is sufciently durable for extended usage. For diffuse reection measurements a cavity style plate with standard format placement of samples is available. Please contact us for other congurations.
The quality of FTIR spectra collected on the X, Y Autosampler is excellent shown in the spectra above for solvent residue samples
F E AT U R E S O F T H E X , Y AU TO S A M P L E R
X , Y A U T O S A M P L E R S P E C I F I C AT I O N S Optics Resolution Accuracy Backlash Elliptical 3X Beam Demagnification 13 microns per step 25 micrometers per cm < 75 micrometers
Complete hardware and software package for automated

analysis of industry standard 24, 48, or 96 well plates. Special plate congurations are available.
Diffuse reectance of powdered samples or specular

reectance sampling for reaction residues
Gold coated optics version for highest performance mid-IR

and NIR sampling
Optional transmission sampling with integrated InGaAs or

DLaTGS detector and transmission sampling plates
PART NUMBER
DESCRIPTION
In-compartment location, purgeable optical path

The PIKE Technologies X, Y Autosampler is designed around standard 24, 48 or 96 well microplate architectures ideal for high efciency sample loading and FTIR analysis. Applications include high throughput analysis of liquid residues and chemical reactions, powdered samples, and automated diffuse reectance analysis. The X, Y Autosampler is available in standard all reecting optics and with gold-coated optics for highest performance mid-IR and optimized NIR sampling. The autosampler features an X, Y stage with both axes driven by high precision stepper motors for speed and reproducibility. Programming and control of the X, Y Autosampler is done through PIKE Technologies AutoPRO software, and is compatible with current FTIR systems. The optical design is based upon a precision ellipsoidal reector and the size of the spot illuminated at the sample is approximately 2 mm ideal for up to 96 well congurations.
047-20XX
X, Y Autosampler Diffuse Reectance Conguration Includes: Motion Control Unit (85-265 VAC), AutoPRO Software and 96 Well Diffuse Reectance Sampling Plate X, Y Autosampler Diffuse Reectance Conguration with Gold-Coated Optics Includes: Motion Control Unit (85-265 VAC), AutoPRO Software and 96 Well Diffuse Reectance Sampling Plate X, Y Autosampler Diffuse Reectance/Transmission Conguration Includes: Motion Control Unit (85-265 VAC), AutoPRO Software, integrated DLaTGS detector for transmission analysis, 96 Well Diffuse Reectance Sampling Plate and 96 Well Transmission Sampling Plate X, Y Autosampler Diffuse Reectance/Transmission Conguration with Gold-Coated Optics Includes: Motion Control Unit (85-265 VAC), AutoPRO Software, integrated InGaAs detector for transmission analysis, 96 Well Diffuse Reectance Sampling Plate and 96 Well Transmission Sampling Plate
047-60XX
073-90XX
073-60XX
Notes: Replace XX in part number with code for your spectrometer model found on the last page of this catalog. For other options please contact us. Your spectrometer must be capable of interfacing with an external detector.
Options
073-9110 073-9130
96 Well Diffuse Reectance Sampling Plate 96 Well Transmission Sampling Plate
37
Sample Preparation and Loading Kit The Easiest Way to Work With Powder Samples
The Sample Preparation Kit makes the handling of powder samples for diffuse reectance sampling easy. It includes a round mounting base and a matching tray with an opening which accommodates sampling cups. The cup is placed in the assembly and overlled with sample, and then excess powder is leveled-off with a spatula. The overow is retained on the tray and can be easily returned to the sample container or disposed. Two standard sampling cups offer 0.18 and 0.03 cubic centimeter capacities (10 mm diameter/2.3 mm depth and 6.0 mm diameter/1.6 mm depth). The required approximate weight of the sample/KBr mixture is 450 mg for the large cup and 80 mg for the small one. Please note, the Sample Preparation and Loading Kit is included with PIKE Technologies EasiDiff and DiffusIR diffuse reectance accessories.
38
PIKE TECHNOLOGIES
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042-3040
Sample Preparation Kit Includes: two Micro and Macro cups, Alignment Mirror, Sampling Cup Holder and Base, Two Spatulas, Brush Small Sample Cup (micro: 6.0 mm diameter, 1.6 mm deep), 2 per package Large Sample Cup (macro: 10 mm diameter, 2.3 mm deep), 2 per package Delrin Sampling Cup Holder and Base Alignment Mirror (Aluminum) Alignment Mirror Gold Camel Hair Brush Spatula (Spoon) KBr Powder (100 g) Spatula (Flat)
608-274-2721
042-2010 042-2020 042-3030 042-3080 042-3082 042-3070 042-3035 160-8010 042-3050
Abrasion Sampling Kit The Plastic Bumper Sampler

The Abrasion Sampling Kit consists of an abrasion disk holder and a set of silicone carbide (SiC) and diamond disks. Sampling is performed by abrading the surface of the investigated substance with a selected disk. The disk is placed in the accessory and a diffuse reectance spectrum of the material is collected. This method is particularly useful for the analysis of large painted surfaces (e.g. car panels) and other awkward objects. Convenient set of tools for collection of difcult solid samples Rigid construction, diamond and silicon carbide disks
042-3010
Abrasion Sampling Kit Includes: Heavy Duty Sampling Tool and Stainless Steel Disk Support, 75 SiC Disks and 25 Diamond Abrasive Disks Silicon Carbide Abrasive Disks (Pack of 100) Diamond Abrasive Disks (Pack of 50) Abrasion Kit Disk Support Post
042-3020 042-3025 042-3060
Diffuse Reectance Theory and Applications

Diffuse Reectance Ideal for Powdered Samples and Intractable Solids
Diffuse reectance is an excellent sampling tool for powdered or crystalline materials in the mid-IR and NIR spectral ranges. It can also be used for analysis of intractable solid samples. As with transmission analysis, samples to be run by diffuse reectance are generally ground and mixed with an IR transparent salt such as potassium bromide (KBr) prior to sampling. Diffuse reectance is an excellent sampling technique as it eliminates the time-consuming process of pressing pellets for transmission measurements. Diffuse reectance can also be used to study the effects of temperature and catalysis by conguring the accessory with a heating chamber. Perhaps one of the greatest additional benets of diffuse reectance sampling is that it is ideally amenable to automation. Methods can be developed with a manual version diffuse reection accessory and then moved to automation to increase sample throughput. PIKE Technologies offers several diffuse reectance accessory congurations basic, advanced with heat chamber capabilities, upward directed IR beam for easy sampling access, and fully automated for maximum sampling efciency. This is shown below in the spectral data for caffeine, where the upper spectrum is diluted to about 2% by weight in KBr and demonstrates very high quality with sharp, well-dened absorbance bands. The lower spectrum is of undiluted caffeine measured by diffuse reectance and shows derivative shaped bands in the 1700 cm-1 and 1500 cm-1 region of the data. The upper spectrum of diluted caffeine is clearly of higher spectral quality than that of the undiluted caffeine.
How Diffuse Reectance Works

Diffuse reectance relies upon the focused projection of the spectrometer beam into the sample where it is reected, scattered and transmitted through the sample material (shown on the right). The back reected, diffusely scattered light (some of which is absorbed by the sample) is then collected by the accessory and directed to the detector optics. Only the part of the beam that is scattered within a sample and returned to the surface is considered to be diffuse reection. Some powders may be analyzed by diffuse reectance as neat samples (coal samples, soil samples, diffuse coatings on a reective base). Usually, the sample must be ground and mixed with a non-absorbing matrix such as KBr. The sample to matrix ratio should be between 1 to 5% (by weight). Diluting ensures a deeper penetration of the incident beam into the sample which increases the contribution of the scattered component in the spectrum and minimizes the specular reection component. The specular reectance component in diffuse reectance spectra causes changes in band shapes, their relative intensity, and, in some cases, it is responsible for complete band inversions (Restrahlen bands). Dilution of the sample with a non-absorbing matrix minimizes these effects (particle size and sample loading mechanics also play an important role).
Diffuse reective spectra showing greatly improved results from sample dilution
Other factors related to high spectral quality for diffuse reectance sampling are listed below; Particle Size reducing the size of the sample particles reduces the contribution of reection from the surface. Smaller particles improve the quality of spectra (narrow bandwidths and better relative intensity). The recommended size of the sample/matrix particles is 50 micrometers or less (comparable to the consistency of the nely ground our). This ne powder is easily achieved by using a ShakIR mixer. Refractive Index effects result in specular reectance contributions (spectra of highly reecting samples will be more distorted by the specular reectance component). This effect can be signicantly reduced by sample dilution. Homogeneity samples prepared for diffuse reectance measurements should be uniformly and well mixed. Nonhomogenous samples will lack reproducibility and will be difcult to quantify. An ideal way to mix samples for diffuse reectance is by using a ShakIR. Packing the required sample depth is governed by the amount of sample scattering. The minimum necessary depth is about 1.5 mm. The sample should be loosely but evenly packed in the cup to maximize IR beam penetration and minimize spectral distortions.
39
Diffuse reectance can also be used for the analysis of liquid samples. In this application a small amount of the sample is dispensed directly onto the KBr powder and analyzed.
40
PIKE TECHNOLOGIES
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Diffuse reectance spectra of ibuprofen with and without Kubelka-Monk conversion
Even with all these sample preparation practices, the raw diffuse reectance spectra will appear different from its transmission equivalent (stronger than expected absorption from weak IR bands). A Kubelka-Munk conversion can be applied to a diffuse reectance spectrum to compensate for these differences. This conversion is available in most FTIR software packages. The Kubelka-Munk equation is expressed as follows:
Diffuse reectance spectrum using SiC abrasion disk
For the analysis of powders the following procedure is recommended; Place about 200-400 mg of KBr into the ShakIR vial and shake for 30 seconds Fill the background diffuse cup with this KBr Remove excess KBr with a at edge the KBr should be loosely packed Add 1 to 5 mg of the sample to the remaining KBr in the ShakIR vial and shake for 30 seconds
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Where: R is the absolute reectance of the sampled layer, k is the molar absorption coefcient and s is the scattering coefcient. The spectra shown above demonstrate this spectral conversion for ibuprofen collected by diffuse reectance. The sample was diluted to about 1% by weight in KBr and mixed using the ShakIR. The Kubelka-Munk converted spectrum for ibuprofen shows excellent comparison with the transmission spectrum and is easily identied using library search of a transmission spectral data base. The Kubelka-Munk equation creates a linear relationship for spectral intensity relative to sample concentration (it assumes innite sample dilution in a non-absorbing matrix, a constant scattering coefcient and an innitely thick sample layer). These conditions can be achieved for highly diluted, small particle samples (the scattering coefcient is a function of sample size and packing) and a sample layer of at least 1.5 mm. With proper sample preparation diffuse, reectance spectroscopy can provide ppm sensitivity and high quality results.
Fill the sample diffuse cup with this mixed sample/KBr Remove excess sample with a at edge the sample should be loosely packed Place the background and sample diffuse cups into the sample holder Slide the sample holder into the accessory Position the KBr cup in the beam and collect a background Move the holder to the sample position and collect a sample spectrum (the ratio of these two spectra will produce a spectrum of the sample) Convert the raw diffuse reectance spectrum to Kubelka-Munk Under ideal conditions the transmission of the strongest band in the spectrum should be in the 50% range. If the resulting bands are too intense or distorted, further dilute the sample and make sure that all other measurement affecting factors (particle size, homogeneity and packing) are within required limits.
Summary Plastic Bumpers and Tough Samples

Sometimes it is necessary to analyze a sample which simply does not t in a spectrometers sample compartment the analysis of polymer-based automotive components or painted panels are typical examples. A special diffuse reectance technique allows quick and simple analysis of such samples in a relatively non-destructive manner. A small amount of the sample can be collected by abrasion on a diamond or silicon carbide (SiC) abrasion disk and analyzed immediately with the help of a diffuse reectance accessory. The gure above shows the diffuse reectance spectrum of a automotive body component. The PIKE Abrasion Kit with diamond sampling disk was rubbed across the large automotive component which collects some of the polymer material into the web of the sampling disk. Spectra were co-added for a 1 minute time period and ratioed to the diamond disk background spectrum. The resulting spectrum is of excellent quality and is identied as a polypropylene copolymer. Diffuse reectance accessories make the analysis of a wide range of solid samples easier, faster and more efcient. Advanced options for diffuse reectance provide the ability to heat the sample and monitor a reaction process. Automation versions of diffuse reectance accessories provide the ability to greatly increase sample throughput.
Specular Reectance
Specular reectance is an excellent sampling technique for measurement of thin lms on reective substrates and for non-invasive analysis of samples. The specular reectance spectrum may be used for sample identication, for quality control of coated materials, for analysis of monolayers and for lm thickness measurement. PIKE Technologies offers several versions of specular reectance accessories to address applications from research to quality control.
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VeeMAX Research Grade Specular Reectance Accessory with variable angle of incidence
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30Spec Fixed angle Specular Reectance for relatively thick lms
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80Spec Analysis of monolayers and other relatively thin lms
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AGA 80 degree Specular Reectance with precise control of sampling size
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10Spec Fixed 10 degree specular for E1585-93 reectance method
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Absolute Reectance Accessory Specular Reection Accessory to measure sample reectivity
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Specular Reectance Theory and Applications
VeeMAX II The Ultimate Specular Reectance Accessory!

The PIKE Technologies VeeMAX II is a high performance and highly versatile specular reectance accessory designed to analyze a wide range of samples. From monolayers to relatively thick lms, the VeeMAX II with variable angle of incidence can be optimized for all specular applications. The unique optical design of this product (U.S. Patent No. 5,106,196) enables the accessory to be in alignment for all angles of incidence. The angle may be varied continuously from thirty to eighty degrees by the rotation of a single control. The sample is placed face down on the sampling surface. Because of the unrestricted access to the sampling area, large samples may be readily analyzed. To suit different sampling geometries, masks with 2", 5/8" and 3/8" apertures are provided. Thanks to the optical design of this accessory, excellent throughput is available even at high angles of incidence. The VeeMAX II has a built-in polarizer mount to permit selection of polarization angle without disturbing purge. An optional motorized version of the accessory is available. It features a stepper motor with complementary electronics, Motion Control Unit, and PIKE Technologies AutoPRO software. In this combination, operation of the VeeMAX II can be integrated with the spectrometer software, which allows the operator to precisely and reliably control a wide range of angles of incidence and data collection simultaneously from the computer keyboard.
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F E AT U R E S O F T H E V E E M A X I I
Selectable angle of incidence from 30 to 80 degrees in one

degree increments
Measurement of thin lms and monolayers to relatively

thick lms
Optimize specular reectance results with selectable angle

of incidence
Integrated position for IR polarization essential for

monolayer analysis and study of sample orientation
Optional single reection ATR crystals see ATR section Motorized version option with electronic control module and
AutoPRO software for automated, high-precision experiments

Proprietary beam path within the VeeMax II Specular Reectance accessory
Optimization of the analysis of a multi-layered coating on metal substrate using the VeeMAX II
SPECULAR REFLECTANCE THIN FILMS AND MORE
Changing the angle of incidence with the VeeMAX II is very easy. With this research grade specular reectance accessory, one can measure lm thickness ranging from relatively thick to relatively thin, including monolayers, by selecting the optimal angle of incidence for the measurement. The variable angle of incidence can be controlled manually or with an optional motorized attachment for the VeeMax II. Multiple specular measurements at different angles of incidence can be fully automated with the motorized version and PIKE Technologies AutoPRO software. Automation streamlines the collection of spectra from multiple angles of incidence. With the automated VeeMax II accessory, the entire experiment can be pre-programmed and executed by the computer.
VEEMAX II S P E C I F I C AT I O N S Optics Angle of Incidence Range Sample Masks Purge Sealing Accessory Dimensions FTIR Compatibility All reflective 30 to 80 2", 5/8" and 3/8" Purge tubes and purge barb included 74 mm wide, 69 mm tall, 40 mm deep (excludes baseplate) Most, specify model and type
VeeMAX II Accessory
013-10XX
VeeMAX II Variable Angle Specular Reectance Accessory Includes sample masks (2", 5/8" & 3/8"), gold substrate alignment mirror, FTIR base mount, and purge tubes.
Notes: Select FTIR XX code from the last page of this catalog.
VeeMax II Sampling Options

013-2850 013-2800 090-1000 FTIR spectrum of thiol monolayer measured using the VeeMAX II specular reectance accessory set at 80 degrees angle of incidence, ZnSe polarizer and MCT detector. 090-2000
Motorized Option for VeeMAX II Motorized Upgrade for VeeMax II Manual Polarizer, ZnSe Automated Polarizer, ZnSe
Notes: Motorized Option includes PIKE Technologies AutoPRO software and controller. Other polarizer options are found in the polarizer section of this catalog. Modication of the VeeMAX is required for t of the automated polarizer.
Advantages of the automated VeeMax II system include: Computer controlled precision, accuracy and repeatability Synchronization of mirror position changes with collection of sample spectra Full integration of the PIKE Technologies AutoPRO software with FTIR spectrometer programs Tailor made, predened experiments Hands-free operation
AutoPRO Software control of VeeMax II angle of incidence for automated specular reectance studies automated polarizer available
VeeMax II Replacement Parts

013-4010 300-0002
VeeMax II Sample Masks (2", 5/8" & 3/8") Gold Substrate Alignment Mirror (1.25" x 3.0")
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30Spec and 45Spec Specular Reectance for Thick Films

The PIKE Technologies 30Spec is ideal for the measurement of relatively thick lms by specular reectance. Samples are simply laid across the top of the accessory and the spectrum of the lm is measured within a short time period. The 30Spec includes sample masks of 3/8", 1/4" and 3/16" to dene specic sampling areas. The 30Spec provides high quality FTIR spectra for identication of coatings and can also be used to measure coating thickness. IR throughput is high using the 30Spec due to the relatively simple optical design of the product.
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F E AT U R E S O F T H E 3 0 S P E C
Measurement of thick lms Measurement of lm thickness by specular reectance Fixed 30 degree angle of incidence Special version 45Spec for xed 45 degree angle of incidence Sample masks to dene sampling area Slide mount design for easy installation of accessory
ts all FTIR spectrometers
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FTIR spectrum of polymer coating on a food container run with the PIKE 30Spec
30Spec and 45Spec Accessory
011-1000
30Spec Specular Reectance Accessory (30 degree) Includes sample masks (3/8", 1/4", and 3/16"), alignment mirror and slide mount. 45Spec Specular Reectance Accessory (45 degree) Includes sample masks (3/8", 1/4", and 3/16"), alignment mirror and slide mount.
011-4500
Notes: The 30Spec and 45Spec are slide mount accessories.
30Spec and 45Spec Sampling Options

011-2010 300-0039
Sample Masks (3/8", 1/4", and 3/16") Alignment Mirror
Notes: Sample masks and alignment mirror t 30Spec and 45Spec.
Optical geometry for the 30Spec
80Spec Grazing Angle Specular Reectance for Thin Films

The PIKE Technologies 80Spec is ideal for the measurement of relatively thin lms and mono-molecular layers by specular reectance. Samples are simply laid face down across the top of the accessory and the spectrum of the lm is measured. Generally the measurement of ultra-thin lm samples, especially monolayers, is signicantly enhanced by using P-polarized light, with the electric eld vector perpendicular to the sample surface. The 80Spec includes polarizer mounts on both incoming and outgoing beams for positioning optional manual or automated IR polarizers from PIKE Technologies. The 80Spec is available in two versions. The basic conguration features a at sampling surface with xed sampling port. This version is ideal for analysis of larger, uniform samples. The second version includes 3 sample masks to dene smaller areas on a sample. This version is recommended for smaller samples or for measurement of variations in thin lm coatings.
Measurement of thin lms and mono-molecular layers Fixed 80 degree angle of incidence Gold-coated reective optics for highest throughput grazing
angle analysis
Dual polarizer mounts for incoming and outgoing IR beam Optional sample masks version to dene unique sampling areas Baseplate mount design for stable operation and collection
of high quality spectra ts all FTIR spectrometers
FTIR spectrum of an ultra-thin lm on a reective substrate using P-polarized IR beam
80Spec Accessory
012-10XX
80Spec Specular Reectance Accessory Includes a gold substrate alignment mirror, dual polarizer mount and FTIR base mount 80Spec Specular Reectance Accessory with Sample Masks (3/8", 5/8" and 2") Includes a gold substrate alignment mirror, dual polarizer mount and FTIR base mount
012-11XX
Beam path within the 80Spec Specular Reectance accessory
80Spec Replacement Parts and Options

010-3010 300-0002 090-1000 090-1200
80Spec Sample Masks (3/8", 5/8" and 2") Gold Substrate Alignment Mirror (1.25" x 3.0") Manual Polarizer, ZnSe Manual Polarizer, KRS-5
Notes: For other polarizer options see PIKE Technologies polarizer section of this catalog.
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AGA Advanced Grazing Angle Specular Reectance for Thin Films with Precise Spot Control
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Beam path within the AGA Grazing Angle Specular Reectance accessory
F E AT U R E S O F T H E AG A
Quantitative measurement of small areas of thin lms and

mono-molecular layers
The beam from the spectrometer is focused onto the pin mirror. The angle of incidence is equal to 80 degrees. The portion of the beam that is reected from this mirror is imaged at unit magnication onto the sample, striking it at the same 80 degrees. Thus, the beam at the sample position is uniform and circular in dimension providing excellent quantitative results for the dened sample area.
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Fixed 80 degree angle of incidence Measurement of lubricants on hard disks Sampling dimensions selectable from 1/8", 3/16", 1/4", 3/8"
and 1/2" sizes
Polarizer mount for optional polarizer Baseplate mount design for stable operation and collection
The PIKE Technologies AGA Advanced Grazing Angle specular reectance accessory is a novel instrument designed for quantitative measurement of spatially dened areas of thin lms on reective substrates. Traditional grazing angle accessories produce a sampling area which is elliptical in shape and non-uniformly illuminates the sample area. This large asymmetrical sampling area causes problems when quantitative analysis are to be performed on small sample areas.
FTIR spectrum of an 18 angstrom thick lubricant on hard disk measured in 15 seconds using a MCT detector
AGA Accessory
015-10XX
AGA Grazing Angle Specular Reectance Accessory Includes: 5 selectable spot sizes of (1/8", 3/16" 1/4", 3/8" and 1/2"), gold substrate alignment mirror, polarizer mount and FTIR base mount.
AGA Replacement Parts and Sampling Options

Sampling image on a hard disk surface produced by (A) the spatially resolved AGA and (B) a traditional grazing angle accessory
300-0002 090-1000
Gold Substrate Alignment Mirror (1.25" x 3.0") Manual Polarizer, ZnSe Manual Polarizer, KRS-5
The Advanced Grazing Angle (AGA) accessory has been designed to overcome this deciency. The size and shape of the illuminated spot on the sample is dened by the optics contained in the accessory. The AGA optical design uses primary imaging from one of 5 user dened, slide-mounted pin mirrors selectable from 1/8" to 1/2".
090-1200
Notes: For other polarizer options see PIKE Technologies polarizer section of this catalog.
10Spec Near-normal Sample Reectivity Measurements

The PIKE Technologies 10Spec is an optimized specular reectance accessory designed to make high performance measurements of sample reectivity. The 10Spec produces a collimated beam to illuminate the sample area such that the reectivity measurement is uniformly 10 degrees and not an average of angles produced by a focused beam accessory design. The 10Spec specular reectance accessory is recommended to measure the reectivity of glass per ASTM Standard E1585-93. The 10Spec may also be used to measure near-normal reectivity of a wide variety of surfaces including military devices, reecting optics, anti-reective (AR) coated surfaces, and other reecting and non-reecting materials.
Measure sample reectance Fixed 10 degree angle of incidence Measure glass reectivity per ASTM Standard E1585-93 Sample illumination using collimated beam precisely xed
at 10 degrees
Sampling mask sizes of 3/8", 5/8" and 2" Purge covers and purge tubes for removal of atmospheric
interferences
FTIR spectrum measuring the reectively of glass with the 10Spec
Baseplate mount design for stable operation and collection

10Spec Accessory
PART NUMBER
DESCRIPTION
010-10XX
10Spec 10 Degree Specular Reectance Accessory Includes: 3 sample masks (3/8", 5/8" and 2"), gold substrate alignment mirror and FTIR base mount.
10Spec Replacement Parts and Sampling Options

010-3010 300-0002
10Spec Sample Masks (3/8", 5/8" and 2") Gold Substrate Alignment Mirror (1.25" x 3.0")
Beam path within the 10Spec Specular Reectance accessory
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Absolute Reectance Accessory Measure Absolute Sample Reectance
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Beam Path for V and W Positions for PIKE Absolute Reectance Accessory 12 Angle of Incidence
F E AT U R E S O F T H E A B S O LU T E R E F L E C TA N C E AC C E S S O RY
For the measurement of
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absolute reectance of optical surfaces, windows and metallic surfaces
Performance evaluation of optical elements Evaluation of test plates in medical, industrial and military
applications
Fixed 12 degree angle of
incidence
Sample reectance is usually measured in comparison to a high reectance diffuse gold or a high reectance gold mirror. The sample reectance is measured and calculated against these standards that have 94-99% reectance in the infrared region. Absolute reectance measurement has to be even more accurate than measured by other accessories. Unfortunately, no standards exist today that have guaranteed 100% reectance, against which unknown samples could be compared. PIKE Technologies have developed a Absolute Reectance accessory which does not require reectance standards due to its unique V / W optical arrangement. The beam in the V position reects from the reference mirror. In the W position it is reecting from the sample twice and the same reference mirror at 12. The absolute reectance of a sample is then the square root of the measured value at a given wavenumber or wavelength. The two congurations are easily selected by rotating the sample holder 180 degrees with its pinned-in-place mount and the sample is held by a quick-release mount.
Spectrum of a Silicon Plate Measured in the PIKE Absolute Reectance Accessory
Absolute Reectance Accessory
014-10XX
Absolute Reectance Accessory Includes: V / W sample holder, gold substrate alignment mirror and FTIR base mount
Absolute Reectance Parts and Sampling Options

300-0002 162-5460
Gold Substrate Alignment Mirror (1.25" x 3.0") Specular Reectance Standard
Specular Reectance Theory and Applications

Specular reectance sampling in FTIR represents a very important technique useful for measurement of thin lms on reective substrates, analysis of bulk materials and measurement of monomolecular layers on a substrate material. Often the specular reectance technique provides a means of sample analysis with no sample preparation keeping the sample intact for other measurements. The basics of the sampling technique involve measurement of the reected energy from a sample surface at a given angle of incidence. The electromagnetic and physical phenomena which occur at and near the surface are dependent upon the angle of incidence of the illuminating beam, refractive index and thickness of the sample and other sample and experimental conditions. A discussion of all of the physical parameters and considerations surrounding the specular reectance sampling technique is beyond the scope of this overview. We will present the specular reectance sampling technique from an applications oriented perspective. Types of specular reectance experiments Reection-Absorption of relatively thin lms on reective substrates measured at near normal angle of incidence Specular Reectance measurements of relatively thick samples measured at near normal angle of incidence Grazing Angle Reection-Absorption of ultra-thin lms or monolayers deposited on surfaces measured at high angle of incidence In the case of a relatively thin lm on a reective substrate, the specular reectance experiment may be thought of as similar to a double-pass transmission measurement and can be represented as shown in the following illustration;
Spectrum of thin lm coating on a metal surface measured at 30 degrees angle of incidence using the VeeMAX II specular reectance accessory
At the reective substrate, the beam reects back to the surface of the thin lm. When the beam exits the thin lm it has geometrically passed through the lm twice and is now represented as IA. Infrared energy is absorbed at characteristic wavelengths as this beam passes through the thin lm and its spectrum is recorded. The specular reectance spectra produced from relatively thin lms on reective substrates measured at near-normal angle of incidence are typically of high quality and very similar to spectra obtained from a transmission measurement. This result is expected as the intensity of IA is high relative to the specular component, IR.
For relatively thick samples, the specular reectance experiment produces results which require additional considerations as the specular component of the total reected radiation is relatively high. Again, the incident FTIR beam represented by I0 illuminates the sample of a given refractive index, n2 and at an angle of incidence, 1. Some of the incident beam is reected from the sample surface, represented by IR at the incident angle, 1. Some of the incident beam is transmitted into the sample represented by IT at an angle of 2. As predicted by Fresnel equations, the percent of reected vs. transmitted light increases with higher angles of incidence of the illuminating beam. Furthermore, the refractive index of the sample, surface roughness and sample absorption coefcient at a given wavelength all contribute to the intensity of the reected beam.
Beam path for Reection-Absorption of a relatively thin lm measured by Specular Reectance
The incident FTIR beam represented by I0 illuminates the thin lm of a given refractive index, n2 and at an angle of incidence, 1. Some of the incident beam is reected from the sample surface, represented by IR at the incident angle, 1 and is also known as the specular component. Some of the incident beam is transmitted into the sample represented by IT at an angle of 2 calculated from Snells Law. n1sin1 = n2sin2
Beam path for a relatively thick sample measured by Specular Reection
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At wavelengths where the sample exhibits a strong IR absorption, the reectivity of the sample increases. The superposition of the extinction coefcient spectrum with the refractive index dispersion results in a spectrum with derivative shaped bands. This specular reection spectrum can be transformed using a Kramers-Kronig conversion to a transmission-like spectrum as shown in the example below.
Because of the orientation of the electro-magnetic eld at the surface for grazing angle measurements, the use of an IR polarizer greatly improves the sampling result. By collecting the spectrum at grazing angle of incidence with P-polarization, we only examine the enhanced portion of the electromagnetic eld at the sample surface, thereby producing a stronger absorbance spectrum.
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Spectrum (upper original) of a relatively thick polymer sample measured at 30 degrees angle of incidence using the VeeMAX II. The lower spectrum has been transformed using the Kramers-Kronig software algorithm and is very similar to a transmission spectrum of the polymer polyethylene.
Grazing angle specular reection analysis of a thiol mono-molecular layer deposited on a gold surfaced mirror using the PIKE VeeMAX II at 80 degrees and P-polarization. The FTIR was equipped with an MCT detector.
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Our third application of specular reectance is the measurement of relatively thin lms and mono-molecular layers at grazing angle of incidence. At high angles of incidence, between 60 and 85 degrees, the electromagnetic eld in the plane of the incident and reected radiation is greatly increased relative to a near normal angle of incidence. The perpendicular component of the electromagnetic eld of the reecting radiation is not enhanced.
Specular reectance is a valuable FTIR sampling technique for the analysis of thin lms on reective substrates, for the analysis of relatively thick lms on reective materials and for analysis of bulk materials where no sample preparation is preferred. PIKE Technologies offers a complete line of specular reectance accessories and options to do these analysis and perform these experiments.
Grazing angle specular reection analysis produces a strong electromagnetic eld oriented in the plane of the incident and reected radiation
Polarization
Polarizers may be used to detect oriented samples and for measurement of thin lms on reective substrates. PIKE Technologies offers several crystal forms of polarizers and automated versions for transmission, reection and ATR sampling.
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Manual Polarizers 6 different offerings for mid-IR, NIR, and far-IR spectroscopy
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Automated Polarizers 6 different automated versions for mid-IR, NIR, and far-IR spectroscopy
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Infrared Polarizers Theory and Applications
Polarizers Manual and Automated Versions for Molecular Spectroscopy

Automated Polarizers There are two manual polarizer types available. The short form with the 5 degree scale resolution and the long form with the more precise, 1 degree scale. The short and long versions of the automated polarizer are also available to address various sample compartment and accessory congurations. The automated polarizers offer the added benet of increased setting reproducibility with accuracy of +/- 0.5 degree.
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Manual Polarizers
(select based upon spectral range and performance requirements)
090-1000 Manual Polarizer, ZnSe 090-1200 Manual Polarizer, KRS-5 090-1500 Manual Polarizer, Ge 090-1400 Manual Polarizer, BaF2 090-1600 Manual Polarizer, Polyethylene 090-1300 Manual Polarizer, CaF2
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Manual Polarizers
090-3000 Precision Manual Polarizer, ZnSe 090-3200 Precision Manual Polarizer, KRS-5 090-3500 Precision Manual Polarizer, Ge 090-3400 Precision Manual Polarizer, BaF2 090-3600 Precision Manual Polarizer, Polyethylene 090-3300 Precision Manual Polarizer, CaF2
Notes: All manual polarizers are mounted into a 2" x 3" plate for mounting into the FTIR spectrometer slide sample holder or the appropriate sampling accessory.
Automated Polarizers
F E AT U R E S O F P O L A R I Z E R S
(select based upon spectral range and performance requirements)

Convenient, slide-mount design for all FTIR spectrometers Also compatible with many PIKE Technologies accessories Available in manual and automated versions Available for mid-IR, NIR and far-IR applications
090-2000 Automated Polarizer, ZnSe 090-2200 Automated Polarizer, KRS-5 090-2500 Automated Polarizer, Ge 090-2400 Automated Polarizer, BaF2 090-2600 Automated Polarizer, Polyethylene 090-2300 Automated Polarizer, CaF2
PIKE Technologies offers polarizers for a wide variety of spectroscopy applications which are available in manual or automated versions. The polarizers are mounted in a standard 2" x 3" slide mount and are compatible with all FTIR spectrometers. Polarizer elements are 25 mm in diameter and, with mount, have a 20 mm clear aperture. The polarizers are also compatible with many PIKE Technologies accessories including the 80Spec, VeeMAX, and AGA specular reectance accessories. If you would like to add mounting to any of our accessories, please contact us. PIKE Technologies automated polarizers provide specications identical to our manual versions, plus they are fully computer controlled, making many previously labor-intensive applications feasible. With the automated polarizer an analysis program can be set up through AutoPRO software to automatically collect all spectra.
090-4000 Precision Automated Polarizer, ZnSe 090-4200 Precision Automated Polarizer, KRS-5 090-4500 Precision Automated Polarizer, Ge 090-4400 Precision Automated Polarizer, BaF2 090-4600 Precision Automated Polarizer, Polyethylene 090-4300 Precision Automated Polarizer, CaF2
Notes: All automated polarizers are mounted into a 2" x 3" plate for mounting into the FTIR spectrometer slide sample holder or the appropriate sampling accessory. The automated polarizers include the PIKE Technologies Motion Control Unit and AutoPRO software for fully automated operation.
Infrared Polarizers Theory and Applications

Polarizers are valuable tools used for spectroscopic analysis of sample orientation and for measuring thin lms on reective surfaces. This overview presents basic polarization theory and highlights some useful polarization applications. For the purposes of discussing polarizers, light is considered an electric eld with a magnitude oscillating in time. Light propagating along the z axis can be described as a combination of electric vectors in x and y axis. Linearly polarized light may be thought of as consisting of an x and a y component with different relative magnitudes. For example, if the y component is close to zero, the light is considered fully polarized in the x direction. Polarizers are devices that split unpolarized light into two orthogonal components; one of the linearly polarized components is transmitted, the other is reected, redirected or absorbed. The most important features of a good polarizer are brightness, contrast and durability. Brightness and contrast can be described by two main parameters; K1 and K2. K1 = Transmission efciency for normally incident polarized light whose electric eld vector is perpendicular to the wire direction. K2 = Transmission efciency for normally incident polarized light whose electric eld vector is parallel to the wire direction. For a perfect polarizer K1 = 1, which means full transmission of polarized light whose electric eld vector is in the preferred direction and K2 = 0, which means complete blockage of a beam of polarized light whose electric vector is perpendicular to the former. Other measures of performance deduced from K1 and K2 are Degree of polarization = Extinction Ratio = Principal transmittance ratio or contrast = Polarizers may be made from very ne conducting parallel elements or grid placed upon a suitable transparent base material. When the grid spacing is much smaller than the wavelength of light, the light with the electric vector parallel with the grid will be reected and only the component with perpendicular electric vector will be transmitted (shown graphically on the right). The overall transmission characteristic of the polarizer depends upon the substrate, but the polarization efciency depends upon the period, line width and other design parameters of the polarizer. In the mid-infrared range, the most practical and commonly used polarizers are ruled or holographic wire grid structures. The polarization effect comes from the same principle as the free standing wire grid, except the ne wires are formed on the surface of an infrared transmitting optical window material.
Cutoff, cm-1 Spectral Range 460 200 5500 570 500 10 800 840
P O L A R I Z AT I O N F O R O R I E N T E D S A M P L E S A N D R E S E A R C H A P P L I C AT I O N S
Polarization efciency depends on smaller grid spacing than the wavelength and on the conductivity of the wires. In the case of a ruled polarizer, the surface of the optical element is created by a diamond needle to form very ne parallel lines, such as 1200 lines/mm, on the surface. The optical element is then placed into a vacuum chamber and this pattern is partially coated with aluminum or other evaporated metallic layer. The spacing between the evaporated thin lines has to be very small, typically a fraction of the wavelength. Ruled polarizers have good performance and are durable at high laser powers, but can only be made on hard, non-granular materials that can be ruled, such as ZnSe. Holography is another method used to form the ne metallic wire pattern on the surface of the polarizer element. Two coherent laser beams are directed onto the surface of the optical element which is coated with a very thin layer of photo resist. The interference pattern formed at the intersection of the two beams is allowed to expose the photo resist. The lines in between the exposed photo resist are removed and then coated in a vacuum chamber similar to the ruled grating type. The advantage of holographic polarizers is that a wider variety of materials can be used such as the softer KRS-5. As mentioned earlier, the efciency of the polarizer depends on the grid spacing formed among the wires. Holographic techniques allow more uniform grid patterns because the spacing is produced optically. Light scatter due to imperfections of ruled grooves are also reduced. If the grid spacing is smaller, the polarizer is more efcient. The spacing errors have also much less effect on the efciency if the grid is much smaller than the wavelength. The trade-off with tighter grid is the reduction of the optical throughput. These parameters are carefully optimized in the design of the polarizer elements and the right polarizer can be selected for specic experimental conditions. Specications and performance characteristics of polarizers offered by PIKE Technologies are shown in Table 1.
Graphical representation of the polarization effect
Polarizer Type ZnSe KRS-5 Ge Polyethylene CaF2 BaF2 Table 1
Application Mid-IR, General Purpose Mid-IR, Wide-range Mid-IR, Highest Efciency Far-IR, Widest Range NIR Applications Mid-IR
Transmission Efciency, K1 70% 75% 90% 80% 85% 70%
Undesired Transmission, K2 1% 0.25% 0.25% 4% 1% 0.1%
Degree of Polarization, (K1-K2)/(K1+K2) 97% 99% 99% 93% 98% 99%
Notes: Efciency values reported at 1000 cm-1 for mid-IR, at 3300 cm-1 for NIR and 100 cm-1 for far-IR. All polarizers are holographic, wire grid for maximum performance.
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The optical material substrate used to create the polarizers determines the wavelength range of the polarizer such as ZnSe or KRS-5. Table 1 shows the K1 values of PIKE Technologies polarizers. The maximum transmitted light is affected by the transmission of the materials and the scattering of the ruled and evaporated surfaces. Fresnel losses are determined by the refractive index and the performance of the anti-reection coating on the element. The maximum transmission compared to a fully depolarized open beam is typically less than 50%. However, FTIR spectrometers produce slightly polarized beams, which in most cases are oriented in the vertical direction in the sample compartment. Thus the apparent transmission of a single polarizer oriented vertically and compared to open beam can be over 50%. The other critical parameter of polarizers, the contrast, can be measured by crossing two polarizers and recording the throughput signal. For efcient polarizers in a practical spectroscopy setting, such as using a converging infrared beam in the sample compartment of an FTIR spectrometer, it is expected that the light level should be less than 1%. For selected high performance polarizers it can be better than 0.5%. Polarizers are usually mounted in a plastic disc and placed in a rotating holder with an angle scale. This way, the angle of the polarizer orientation can be positioned with approximately 1 degree repeatability. Motorized polarizers are available with much better angular accuracy and precision. The automated polarizers are also very useful for conducting a series of experiments with different angle settings under complete computer control. One of the main uses of infrared polarizers is to monitor molecular orientation in samples such as lms and bers. During manufacture polymers tend to orient along the axis of the mechanical stretching and this preferred orientation is retained after the material stops owing. In some cases, polymers are a mixture of crystalline, more polarized, and amorphous, less polarized, forms of the material. In order to study orientation, polarized light is directed on the lm or ber. The polarized light electrical vector coinciding with the dipole of the infrared active moiety increases in absorption intensity, thereby revealing the band assignment and the orientation of the molecular group. Single crystals placed in the focus of polarized light also absorb selectively, depending on the orientation of the crystal.
Polarizers can also be used in conjunction with attenuated total reection (ATR). Even without polarizers, for any ATR that retains the orientation relative to the incoming infrared beam, there could be spectral differences noted when an oriented sample is placed with its direction along the optical axis or perpendicular to it. The phenomenon is related to penetration depth differences for the light components polarized parallel or perpendicular with the reective surface (see ATR Theory and Applications). Another important application of polarizers is the enhancement of the signal measuring thin lms on polished semiconductors, metallic mirrors and other reective surfaces. Using large angle reectance optics, the grazing angle reectance of the thin lms can be measured. Substantial signal enhancement can be achieved by using polarized light in conjunction with a grazing angle accessory. As an example, a thin oily deposit on a gold mirror can be measured with good signal-to-noise ratio by using polarized light with a specular reectance accessory set at 80 degrees. Background spectra for each result were collected at the identical polarization angle as the sample. As seen in the spectra below, the light polarized such that the electric vector is perpendicular to the metallic mirror surface is enhanced. The spectrum measured with the polarization perpendicular to the surface (electric vector parallel with the surface) is not detected. The non-polarized light measurement is a combination of the two polarized measurements, showing a signal with less contrast than the red trace.
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FTIR spectra with vertical and horizontal polarization
Summary
Polarizers are highly useful spectroscopy sampling tools for the measurement of samples with molecular orientation, for measuring thin lms on reective surfaces and for molecular spectroscopic research.
Spectra for high density polyethylene (HDPE) with parallel and perpendicular polarization demonstrate that this sample is oriented
Integrating Spheres
Integrating spheres are useful for qualitative and quantitative measurement of sample composition when morphology, particle size, surface roughness or sample atness varies from sample to sample. PIKE Technologies offers fully integrated accessories for mid-IR and NIR applications.
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Mid-IR IntegratIR For advanced measurements in the mid-IR spectral region
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NIR IntegratIR For qualitative and quantitative analysis in the NIR spectral region
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Integrating Spheres Introduction and Theory
Mid-IR IntegratIR Integrating Sphere

The upward looking Mid-IR IntegratIR features an 8 degree illumination of the sample with an optional specular exclusion optical path. Reflectance samples are placed directly onto the sample port located on the top portion of the sphere. This sphere is ideal for large and/or thick solid samples. For powder samples, a standard ZnSe window is available. If preferred, a KBr window can also be used with the sample plate to minimize the reflection loss compared to the ZnSe.
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F E AT U R E S O F T H E M I D - I R I N T E G R AT I R
3 inch sphere gold coated, Lambertian scatterer for

high-performance measurements
Optical diagram of the upward looking IntegratIR Sphere
8 degree hemispherical diffuse reectance measurement

collecting full reectivity from the sample
Diffuse transmission station for measurement of highly

scattering samples in transmission mode
Integrated, high-performance detector MCT or DTGS choice

for ultimate congurability
Upward and downward-looking optical congurations to

accommodate a wide range of sample sizes and types
The downward looking Mid-IR IntegratIR allows the sample to be placed underneath the sphere. This configuration is desirable for measurements of powders and particulate materials because an incidence beam strikes the sample directly, without passing through an IR transparent window. A specular exclusion port is a standard feature on this accessory.
In-sample compartment design to minimize laboratory

space requirements
Congurations available for most FTIR spectrometers
The integrating sphere is very often an accessory of choice when studying reflectance properties of solids, analyzing light scattering and/or highly absorbing samples and collecting spectra difficult to obtain with standard sampling techniques. PIKE Technologies offers two Mid-IR integrating spheres, designed for research and standard applications that require high sensitivity and ability to collect high quality data from difficult to analyze samples. The PIKE IntegratIR spheres are available in the upward and downward looking configurations and are suitable for the measurements of absolute and relative diffuse reflectance of solids, powders and opaque liquids. Both feature 3 inch diameter highly reflective gold coated integrating spheres. The accessories mount in the sample compartment of the FTIR spectrophotometer, but use a dedicated detector for maximum performance.
Downward looking IntegratIR Sphere
INTEGRATING SPHERES REFLECTANCE FROM ALL PERSPECTIVES
For both spheres, the selection of light illumination onto the sample or onto the reference surface is done via a flipper mirror. This allows the background to be collected using either the substitution method or the Taylor method. Diffuse transmittance of partially transmitting materials can be measured with either sphere. This is done by placing the sample on a standard 2" x 3" sample holder and siding it in the mount located in front of the transmission port.
I N T E G R AT I R A C C E S S O R Y S P E C I F I C AT I O N S Optical Design Sphere Size and Surface Sample Port Size Specular Exclusion Port, Upward Looking Sphere Upward or downward looking sample spheres 3" (76.2 mm) gold coated Lambertian surface 23.5 mm Optional
Specular Exclusion Port, Standard Downward Looking Sphere Accessory Dimensions Detector Choice Spectral Range, MCT Detectors Spectral Range, Extended DTGS Detectors with CsI Window 175 mm wide, 165 mm tall, and 195 mm deep (excludes baseplate) DTGS or MCT Wide-band: 5000 500 cm-1 Mid-band: 5000 650 cm-1 Narrow-band: 5000 800 cm-1 5000 250 cm-1
IntegratIR Spheres
Absolute reectance spectrum of painted black panel measured using the PIKE Mid-IR IntegratIR.
048-10XX 048-11XX
Upward Sample Positioning Mid-Infrared IntegratIR Integrating Sphere Accessory Downward Sample Positioning Mid-Infrared IntegratIR Integrating Sphere Accessory
Notes: The IntegratIR spheres include the sphere, purge enclosure and tubing, one diffuse gold reference. The Upward IntegratIR also includes a sample plate with a ZnSe window. The Downward IntegratIR includes a powder sample cup. Your FTIR spectrometer must be capable of interfacing with an external detector.
IntegratIR Detector Choice (must select one)

048-3300 048-3200 048-3100 048-3400
Wide-band MCT Detector Mid-band MCT Detector Narrow-band MCT Detector DTGS detector with CsI detector window
Notes: The detector includes the preamplier electronics. MCT detectors require liquid nitrogen for cooling.
Comparison of transmission spectrum of paper collected using the integrating sphere to a spectrum collected in transmission mode without a sphere.
Replacement Parts and Sampling Options

A selection of Mercuric cadmium telluride (MCT) or deuterated triglycine sulfate (DTGS) detectors is offered with the IntegratIR spheres. This allows the accessory to be optimized for the application and sample type. The wide band MCT is the commonly configured detector while the less sensitive DTGS is an option for users who require the convenience of a room temperature detector. The accessory comes with built-in detector electronics and can be interfaced to most FTIR spectrometers.
048-2010 048-0100 048-0200 048-3000 048-2020 048-3150
Specular Exclusion Port for Upward Sample Positioning IntegratIR Sample Plate with 18 mm x 2 mm ZnSe Window Sample Plate with 18 mm x 2 mm KBr Window Diffuse Gold Reference Powder Sample Cup for Downward IntegratIR MCT Detector Reconditioning
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NIR IntegratIR Integrating Sphere

The PIKE Technologies NIR IntegratIR is a near-infrared (NIR) Integrating Sphere for quantitative and qualitative measurements of a wide variety of solids and paste materials. The NIR IntegratIR collects reected energy from a spherical perspective and thereby captures complete and quantitative response from the sample. Using near-infrared chemometrics, qualitative product identication and quantitative analysis may be performed on pharmaceutical, nutraceutical, chemical, polymer, textile, food, agricultural and other samples. The NIR IntegratIR accessory features a 2" high reectivity gold-coated integrating sphere and a high-speed, low-noise indium-gallium-arsenide (InGaAs) detector, transfer optics and interface electronics. The NIR IntegratIR ts into the sample compartment of most commercial FTIR spectrometers and its electronics interface as an internal detector of the spectrometer. A 10 mm diameter horizontal sampling port makes the placement of samples onto the accessory very easy. An optimized borosilicate window serves as a sampling port at the top of the integrating sphere. The window is bonded and sealed to protect the sphere from corrosive materials and contamination. Sampling of tablets, packaging materials and plastics is easily accomplished by placing the sample directly on the window of the upward facing sphere. Powders, creams, pastes or liquids containing reective particles may be placed in disposable atbottom vials eliminating the need for any sample cleanup. The vials may be held in place by a sample-positioning vial holder, resulting in more repeatable measurements.
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Optimized 2" gold-coated integrating sphere with high

signal-to-noise ratio
Fully integrated InGaAs detector, detector electronics

and transfer optics
Optional automated transmission analysis stage for

pharmaceutical analysis
10 mm horizontal sampling port for easy sample placement Excellent qualitative and quantitative NIR analysis tool Economical alternative to dedicated near-infrared analyzers Optional Rotating Stage for averaging of heterogeneous samples Spectral range 12200-3850 cm-1 In-Sample Compartment design, compatible with most
commercial FTIR spectrometers
Qualitative analysis of steroids using the PIKE Technologies NIR IntegratIR. Samples are measured within glass vials.
High quality spectra are produced quickly using the NIR IntegratIR making qualitative and quantitative analysis of a wide variety of sample types efcient and reliable. For heterogeneous samples, PIKE Technologies offers a Rotating Stage for the NIR IntegratIR. With this option, one obtains an averaged result to eliminate variations in quantitative results for the chosen sample area.
Optical diagram of the NIR IntegratIR Sphere
048-60XX
NIR IntegratIR Integrating Sphere Accessory Includes 2" diffuse gold coated integrating sphere, InGaAs detector, detector preamplier, cable and baseplate for the specic model spectrometer. The accessory also includes a gold reference standard, vial holder, and 25 glass vials.
Notes: Please see the FTIR instrument code sheet. Your spectrometer must be capable of interfacing with an external detector.
Sampling Options for NIR IntegratIR

048-2999 048-3000 048-3070 048-3071 Quantitative measurement of active ingredient in a mixture of magnesium stearate, lactose, Emcompress, cellulose and CaboSil 044-3010 048-0150 048-0151 048-0060
Glass Sample Vials (Pack of 25), 19 x 65 mm Diffuse Gold Reference NIST Traceable NIR Reference Standard NIST Traceable NIR Reference Standard Recertication Glass Vial Holder (for 19 mm vials) Rotating Stage for Petri Dish (for heterogeneous samples) Includes 100 x 20 mm Petri Dish Rotating Stage Adapter for 500 mL beaker Automated Transmission Tablet Analysis Stage for NIR IntegratIR Includes 3 tablet plates for 7.5, 8.5 and 10 mm tablets
Note: Please contact us for other options. Stage rotates counterclockwise.
NIR IntegratIR with optional transmission tablet analyzer
The NIR IntegratIR comes complete with diffuse gold reference, sample holders and a removable general-purpose sample mounting plate. The NIR IntegratIR is congured for each specic FTIR spectrometer and includes a pre-aligned mount for your instrument. The NIR IntegratIR is a cost-effective, high-performance sampling option for laboratories with a standard FTIR spectrometer equipped with a near-infrared light source and beam splitter. The optional transmission tablet analysis stage for the NIR IntegratIR provides an automated tool for sampling 10 tablets of a variety of sizes. With this option you can measure formulation reproducibility or verify pharmaceutical composition.
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Integrating Spheres Introduction and Theory

Measuring Sample Reectance
Reectance sampling accessories rely upon a light beam coming from the spectrometer to be focused upon the sample. In order to achieve the best signal-to-noise ratio (SNR), the smaller the focus is, the easier it is to refocus the illuminated sample spot back onto the detector. In order to measure light reected at a larger angle, optical designs will allow only a small area of the sample to be projected onto the detector. This arrangement serves well if the sample is microscopically homogeneous, but will result in a larger sample position error. When the sample is moved, the focused beam will see a different portion of the sample resulting in measurement-to-measurement differences. This is called insertion error because the spectrum will be slightly different each time the sample is inserted. Some industrial or natural samples are inhomogeneous either because they are mixtures of different substances or because they have a particle size comparable to the probing beam diameter. Clearly, if the probing beam could be larger and the reected light could all be collected, a more representative spectrum could be measured. Some other samples develop a directional scattering. For example, bers wound on a mandrel are highly oriented, not just macroscopically as parallel, unidirectional laments, but also in many cases the molecules of the drawn bers are oriented within the ber itself. Such a sample, when placed in a reectance accessory will generate different results depending on the angle from which the detector is viewing the sample. When the overall reectance needs to be measured reproducibly, for example to measure the concentration of a minor ingredient in the sample, only isotropic optical systems, insensitive to such directionalities could be utilized. Furthermore, in some cases, not just the reectance in a small solid angle but the reectance in all angles is sought. Most reectance accessories measure at xed or variable angles, narrower or wider collection angles, but there is a need for a device that uniformly collects all reected light from a sample. In other words it measures the total reectance of the sample. Therefore the main reasons for using integrating spheres for the measurement of sample reectance are the following: Efcient measurement of combined diffuse and specular reectance Uniform detection of reectance even when sample is inhomogeneous Isotropic detection of reectance even on samples that reect in preferred directions Reduction of polarization effects from the illuminating beam and the sample Measurement of absolute reectance (with special integrating spheres) All of the above concerns are addressed with integrating sphere based reectometers.
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Integrating Sphere Optics

Integrating spheres are highly reective enclosures that are placed in close proximity to the sample, such that the reected light enters the sphere, bounces around the highly reective diffuse surface of the sphere wall and nally impinges upon the detector usually part of the integrating sphere assembly. The name, integrating sphere, refers to one of the main functions of the device, namely that it spatially integrates the light ux, in our application the light reected from a sample. In spite of the long history of engineering and development of the sphere, the applications and further developments continue to this day. Advances in the theory, detector and electronics development and most of all, new applications, drive the progress. As the name implies, the main part of the device is a sphere with a very highly reecting inner surface. The surface should approach the ideal Lambertian scatterer, which means that the light falling on the surface is evenly scattered in all directions and the scattered light intensity is proportional to the cosine of the angle of observation.
Sample w
Sample Port (As) Bafe Detector Port (Ad)
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Entrance Port (Ae) Area of Surface (As)
F.O.V.
Optical geometry of an integrating sphere
In an upward sample positioning sphere the infrared beam from the interferometer is directed through an entrance port onto the sample placed behind the sample port (shown above). Samples can be directly touching the sphere or separated from the sphere by a thin, infrared transparent window. The detector is placed close to the sphere, so that it can view the integrating sphere with a large solid angle. In order to improve the isotropy (non-directionality) of the detection, the detector is not directly in the line of sight of the sample. A small, also highly reective and scattering bafe is placed in the sphere such that it blocks the rst reection of the sample from reaching the detector.
A well-designed sphere has the sample close to the sphere geometry so that the sphere will collect close to the full available hemispherical reectance (2 steradians). A window to separate the sphere and sample may be important in some cases, but it will place the sample a small distance from the sphere, thereby somewhat reducing the collected high-angle reectance. The PIKE Technologies integrating spheres are coated with the highest possible reective surface for the desired wavelength region. The coating of the surface of the sphere has to be uniform and close to being a perfect Lambertian scatterer. These characteristics allow the light falling in the sphere to be uniformly distributed over the entire surface of the sphere. It is also important how much of this light is actually collected on the detector surface.
The brightness of the sphere, using the same amount of input light ux, is dependent on the wall reectivity, the port-tosphere surface ratio and the size of the sphere surface.
where i is the input light ux and As is the area of the sphere wall surface. For the sphere the area of the sphere obviously depends on the sphere diameter, and thus the formula shows that a smaller sphere is brighter than a larger diameter one.
Sphere Throughput
The throughput of the sphere is dened as the ratio of the incoming light impinging on the detector. The closer the sphere surface is to ideal reectance, the higher the throughput. The detector, the sample and the illumination require that a portion of the wall of the complete sphere be removed. Smaller cutouts for beam input and output result in higher energy throughput. Due to other considerations, such as reduction of light scatter from the edges of the sphere cutouts, called ports, these have to be optimized and cannot be too small. The throughput can be expressed with these sphere design parameters:
The sphere diameter cannot be reduced too far however, because the sample diameter will also have to be decreased proportionally when the sphere is smaller. For typical spectroscopic applications the optimum sphere diameter is inuenced by the beam size coming from the FTIR spectrometer and the typical sample size of 3-25 mm. Most integrating sphere modules use a 2-4 inch diameter sphere to accommodate the above design parameters. In a practical design, the openings of the sphere need to be kept around 5% for optimum throughput. Wall reectance is usually between 95-99% and results in a sphere gain of 10-30.
Integrating Spheres for Mid-IR and NIR

Where Ad is the detector area, As is the sphere area, w is the sphere wall hemispherical reectance, w, avg is the average sphere wall reectance. The sphere throughput is higher if the light falling on the detector is increased by the multiple reections of the light. Another way of looking at the integrating sphere is that it enhances the detector signal by collecting the light, and if the wall surface is reective enough, bounce it around until it illuminates the detector. The factor that is used to express this gain is called the sphere multiplier (M), which is a function of the wall reectance (w), the proportion of the total area of ports to the surface of the sphere (f). Integrating spheres, although much more efcient than an optical system with an equivalent detector position, still have lower throughput than the direct imaging optics. In the visible and NIR spectral region, where there are very good sources and excellent, high-speed detectors are readily available, the SNR is usually not limited by the reduced light level. In the mid-IR spectral region, in order to utilize the above discussed advantages and benets of integrating spheres, the reduced throughput needs to be offset by the use of the high sensitivity, cooled detectors, such as the liquid nitrogen cooled MCT detector utilized by PIKE Technologies. The near-infrared and mid-infrared measurements using integrating sphere optics have different analytical and measurement goals as well as different features. PIKE Technologies offers both mid-IR and NIR versions.
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Remote Sampling Accessories

Hollow waveguide and ber optic sampling accessories provide a new dimension of exibility expanding the reach of the sample compartment. The sampling probe now is exible and may be taken to the sample; maybe an unwieldy sample too large to be t onto an accessory. PIKE Technologies offers NIR and Mid-IR versions of remote sampling probes.
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FlexIR Mid-IR Hollow Waveguide Accessory for remote and exible sampling in the Mid-IR spectral region
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FlexIR NIR Fiber Optic Accessory for remote sampling in the NIR spectral region
FlexIR Hollow Waveguide Accessory for Remote Infrared Sampling

The new FlexIR Hollow Waveguide Accessory is designed for high throughput, ruggedness and wide spectral range. The FlexIR utilizes a customized optical design with diamond turned focus optics providing exceptional IR throughput. The new hollow waveguides are very durable and free from the typical fracture problems encountered with polycrystalline core fibers. The highly reflective hollow waveguides transmit maximum energy through the full mid-IR spectral region eliminating the need for multiple fibers for a complete spectrum coverage when chalcogenide or halide probes are used.
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Fast, easy identication of solids and liquid samples outside

of the sample compartment
1 or 2 meter, hollow waveguide (HWG) offers exceptional

durability and high throughput
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Full mid-IR spectral range coverage ATR, specular and diffuse reectance probes for a complete
array of sampling applications
Permanent alignment of sampling probe to the hollow

waveguide for consistent analysis results
Visible defect on manufactured product FlexIR HWG Accessory with ATR probe
MCT or DTGS detector choice for maximum sensitivity

and convenience
Compatible with most FTIR spectrometers
The PIKE FlexIR Hollow Waveguide Accessory is an excellent tool for remote and specific area analysis of a wide variety of samples. Visible surface contamination, small area material identification and bulky materials too large to fit into the FTIR sample compartment are a few of the many samples and application types for the FlexIR accessory.
Two FlexIR bases are available for maximum configurability. The MCT version comes with an integrated detector which offers high sensitivity and fast data collection rates. Three detector options are available to best optimize the signal-to-noise ratio (SNR) against the required spectral range and the application needs. The mid-band MCT is the most versatile and common detector offered with this version of the accessory. A DTGS FlexIR base is available for those applications that do not require a high SNR, and benefit from the flexibility and convenience of a room temperature detector. To optimize its performance, the DTGS detector is integrated into the probe. This probe is equipped with a short handle for ease of positioning and sampling.
FlexIR with DTGS Accessory
Coating on metal substrate FlexIR HWG Accessory with specular reectance probe
The PIKE Technologies FlexIR Hollow Waveguide Accessory is built and tested for optimum performance for your FTIR spectrometer.
REMOTE SAMPLING ACCESSORIES EXTENDING YOUR SAMPLE COMPARTMENT
F L E X I R A C C E S S O R Y S P E C I F I C AT I O N S Optical Design Probe Design Bend Radius, Minimum HWG Dimensions Sampling Probes ATR, Crystal Type ATR Sampling Diameter Specular Reectance Diffuse Reectance Detector Choice Spectral Range Diffuse and Specular Reectance, MCT Model Spectral Range ATR, Mid Band MCT Model Spectral Range and Specular Reectance, DTGS Model (CsI window) Spectral Range ATR, DTGS Model Accessory Dimensions, MCT Model Accessory Dimensions, DTGS Model All reflective, diamond turned focus optics Hollow waveguide (HWG), full mid-IR reflective 150 mm 1 or 2 m long, 1.6 mm OD, 1.0 mm ID Precision fixed to fibers excellent reproducibility Diamond/ZnSe composite, ZnSe, and Ge 4.4 mm diameter Gold coated, 20 degree AOI Gold coated, 2.5 mm port DTGS or MCT Mid-band: 5000 650 cm-1 Narrow-band: 5000 800 cm-1 ZnSe: 5000 650 cm-1 Ge: 5000 700 cm-1 Diamond/ZnSe: 5000 650 cm-1 5000 500 cm-1
FlexIR Hollow Waveguide Base with MCT Detector
045-30XX
FlexIR Hollow Waveguide Base with MCT Detector
Notes: The FlexIR is provided with base optics mounting for the sample compartment of your FTIR spectrometer and an onboard MCT detector. Your FTIR spectrometer must be capable of interfacing with an external detector.
Hollow Waveguide MCT Detector Choice (select one or more)

045-3200 045-3100
Mid-band MCT Detector Narrow-band MCT Detector
Probe Choices for Hollow Waveguide with MCT Detector (select one or more)
045-4100 045-4102 045-4010 045-4012
Diamond/ZnSe ATR Probe, 1 m Diamond/ZnSe ATR Probe, 2 m ZnSe ATR Probe, 1 m ZnSe ATR Probe, 2 m Ge ATR Probe, 1 m Ge ATR Probe, 2 m Specular Reectance Probe, 1 m Specular Reectance Probe, 2 m Diffuse Reectance Probe, 1 m
ZnSe: 5000 525 cm-1 Ge: 5000 600 cm-1 Diamond/ZnSe: 5000 525 cm-1 178 mm wide, 190 mm deep, 160 mm high (excludes FTIR baseplate and mount) 110 mm wide, 90 mm deep, 120 mm high (excludes FTIR baseplate and mount)
045-4050 045-4052 045-4030 045-4032 045-4020
Notes: Sampling probes are xed to the Hollow Waveguides for maximum sampling reproducibility. Diffuse and specular probes are open tipped and are not suitable for powder sampling.
Adjustable Probe Holder
FlexIR Hollow Waveguide Base with DTGS Detector

045-35XX
FlexIR Hollow Waveguide Base with DTGS Detector
Notes: The FlexIR is provided with base optics mounting for the sample compartment of your FTIR spectrometer. Your FTIR spectrometer must be capable of interfacing with an external detector. The DTGS detector is integrated into the probe.
Probe Choices for Hollow Waveguide with DTGS Detector (select one or more)
045-5100 045-5010 045-5050 045-5030
Diamond/ZnSe ATR Probe, 1 m ZnSe ATR Probe, 1 m Ge ATR Probe, 1 m Specular Reectance Probe, 1 m
Notes: Sampling probes are xed to the Hollow Waveguides for maximum sampling reproducibility. DTGS detector integrated into the probe. Diffuse and specular probes are open tipped and are not suitable for powder sampling.
Standard Probe Holder
Adjustable and standard Hollow Waveguide probe holders
Hollow Waveguide Probe Holders

045-3400 045-3410
Adjustable Probe Holder Standard Probe Holder
Notes: Probe holders may be used with all Hollow Waveguide probes.
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FlexIR NIR Fiber Optic Accessory for Fast and Remote Sample Identication
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Spectra of incoming pharmaceutical materials measured and veried with the FlexIR NIR Fiber Optic Accessory
608-274-2721
F E AT U R E S O F T H E F L E X I R
Fast, easy identication of solids and liquid samples in situ 2 meter, low-OH bers providing exceptional throughput and
excellent spectral data with short analysis time
Spectral range from 1.0 to 2.5 microns (10000 to 4000 cm-1) Integrated, high sensitivity InGaAs detector with electronics
connection for your FTIR spectrometer
Standard SMA connectors providing maximum exibility

with ber probes
Standard diffuse reectance sampling tip with inert sapphire

window for solid samples
Spectra of incoming liquid materials measured and veried with the FlexIR NIR Fiber Optic Accessory
Optional transectance sampling tip for liquid samples Compatible with most FTIR spectrometers congured for
NIR operation
The PIKE FlexIR near-IR (NIR) Fiber Optic Accessory is an excellent tool for remote and speedy analysis of a wide variety of materials. Powders, plastics, coatings, and liquid samples are readily measured typically within 30 seconds. The FlexIR accessory is ideal for performing incoming QC of materials used in pharmaceutical, polymer, and chemical manufacturing. NIR sampling is fast and efcient as it eliminates the need for sample preparation. The FlexIR accessory further speeds the analysis since the probe tip is simply touched onto the sample, often in drums, and the spectrum is collected. Powdered samples packaged within a plastic bag can be analyzed without removal from the bag and this further speeds analysis time and eliminates analyst exposure to chemical materials. The PIKE Technologies FlexIR NIR Fiber Optic Accessory is designed for maximum throughput and performance. The ber optic cable is directly coupled to the integrated indium gallium arsenide (InGaAs) detector eliminating energy loss due to additional transfer optics and beam divergence. With the optional Liquids Sampling Tip, it is easy to identify incoming liquids by inserting the wand tip into the liquid sample and collecting its spectrum. The PIKE Technologies FlexIR NIR Fiber Optic Accessory is built and tested for optimum performance for your FTIR spectrometer.
FlexIR NIR Fiber Optic Accessory
045-10XX
FlexIR NIR Fiber Optic Accessory
Notes: The FlexIR is provided with base optics mounting for the sample compartment of your FTIR spectrometer and includes electronic cabling and diffuse reectance probe. Your FTIR spectrometer must be congured with NIR beamsplitter and NIR source for optimum performance of the FlexIR accessory. Your FTIR spectrometer must be capable of interfacing with an external detector. Please see the FTIR code sheet for your instrument designation.
FlexIR NIR Fiber Optic Accessory, Sampling Options

045-2001 045-2000 045-2002
Liquids Sampling Tip for FlexIR, 1.0 mm pathlength Liquids Sampling Tip for FlexIR, 1.5 mm pathlength Liquids Sampling Tip for FlexIR, 2.0 mm pathlength
Notes: The Liquids Sampling Tip is screw mounted and easily exchanged with the solids sampling tip on the FlexIR sampling wand.
Replacement Parts
045-2010
Diffuse Reectance Tip for FlexIR NIR Probe
Microsampling
Microsampling accessories make an ideal addition to an FTIR spectrometer when you need to do analysis of samples which are considerably smaller than the IR beam size typically 8-10 mm. PIKE Technologies offers microsampling accessories which demagnify the FTIR beam to a smaller dimension and thereby increase IR throughput for small samples.
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MAX FTIR Microscope For transmission, reection and ATR analysis of micro samples
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Microsampling Tools Sample handling tools for microanalysis
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Micro Diamond Cell For compressing and holding samples for microanalysis
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4X and 6X Beam Condensers For a wide variety of transmission measurements of micro samples
MAX Sample Compartment Microscope for FTIR

The MAX is an all new optical design for IR microanalysis, providing high performance sampling at low-cost with exceptional ease of use. The MAX is designed to t into the sample compartment of most FTIR spectrometers. The compact, planar optical layout minimizes the pathlength of the IR beam and thereby maximizes IR throughput. All operations with the MAX are intuitive and made even easier with standard Dichroic Optics which provides full viewing of the sample while collecting IR spectra. With Dichroic Optics you can view the sample area and simultaneously search for appropriate IR spectral content greatly speeding microanalysis. The fully variable X, Y, See Thru aperture for transmission provides optimized sample dimensioning for getting the maximum IR signal from every sample. The MAX IR microscope uses 7.45X Schwartzchild objective and condenser to focus the IR beam onto the sample and provide excellent sample visualization better than 1 micron visible image resolution. An optional CCD camera enables video image projection onto the PC. With the Dichroic Optics of the MAX and spectral preview of the FTIR software one can view changing IR spectra and sample position in real-time on the PC. The MAX is the rst sample compartment IR microscope accessory capable of all microsampling modes transmission, reection and ATR. The MAX ts into the sample compartment, using the spectrometers detector for convenience and sampling exibility. For relatively larger micro samples (100 microns and greater) the DTGS detector provides excellent performance with the MAX and enables full mid-IR spectral range coverage to 450 cm-1. For smaller micro samples to 20 microns in size an MCT detector is recommended.
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608-274-2721
F E AT U R E S O F T H E M A X
Compact sample compartment design to save lab space Uses FTIR detectors DTGS or MCT Available with transmission, reection and ATR High throughput optical design Simultaneously view and collect spectrum Easy-to-use, robust design Available for most FTIR spectrometers Low-cost
PIKE Technologies Micro Compression Cell
Transmission spectra of polystyrene lm at aperture sizes of 200 x 200, 100 x 100, and 50 x 50 microns using the MAX IR Microscope using the DTGS detector of the FTIR spectrometer. Spectra were collected using 4 cm-1 spectral resolution and 2 minute collection time.
Transmission spectra of polymer laminate sample using DTGS detector. Samples held in PIKE Micro Compression Cell.
MICROSAMPLING FROM MICRONS TO MILLIMETERS
Switching from transmission to reection on the MAX is easy with a thumb wheel selection. Reection sampling area is dened by use of the aperture slide with pre-dened sizes from 40 to 1000 microns. Micro reection analysis of small areas of interest on reective surfaces is made easy with the PIKE Technologies MAX. Just focus and position the sampling stage, select the sample area with the aperture slide and collect the spectrum. The background spectrum is collected using the same dimension aperture using the gold surfaced reference slide.
The Micro Diamond Cell is an excellent option for use with the MAX IR Microscope. Tiny chips or ber segments can be attened to obtain excellent transmission spectra.
PIKE Technologies Micro Diamond Cell
Micro reection spectrum of a coating on a reective base metal, 200 x 200 micron sampling area using DTGS detector
ATR is an excellent sampling option for the MAX IR microscope. The RotATR is a unique, rugged pivot designed germanium ATR providing easy and precise operation and excellent micro ATR spectra. Focus and select the sample area, rotate the ATR crystal into sample position, make sample contact and collect the IR spectrum.
Single drug crystal identied as benzocaine attened in Micro Diamond Cell. Data collected using DTGS detector M A X S P E C I F I C AT I O N S Sampling Modes Objective Optional Condenser Micro ATR Transmission, Reflection and ATR 7.45X Schwartzchild, N.A. 0.64, fixed for sturdy, permanent alignment 7.45X Schwartzchild, N.A. 0.64, Z-adjust to optimize sample focus RotATR with 100 micron tip, pivot pinned-in-place and easily removable for maximum sample area access. Universal Ge crystal for analysis of all micro samples. Z focus including X, Y slide sample holder, with 20 x 50 mm travel Dichroic Optics reflect IR energy and transmit visible, providing continuous view of the sample during data collection. Dichroic Optics eliminate the need to switch optics from view sample to collect spectrum. X, Y, variable Glass Aperture for transmission sampling to view sample and surrounding sample area. Standard pinhole aperture slide for reflection sampling. Khler, variable intensity, 50 watt Binocular or Trinocular Viewer with 10X eyepieces. Standard eyepiece reticule for sample dimensioning, optional Video Camera with USB interface. 1600 microns In sample compartment, fits most FTIR spectrometers. Mounted on a baseplate for the FTIR spectrometer. Uses standard detectors of the FTIR, typically DTGS and MCT Includes purge tubes and purge inlet for additional purge. Compatible with sealed and desiccated FTIR spectrometers. RoHS and CE Mark compliant
Sample Stage IR Collection/Sample Viewing
Sample Masking Micro ATR spectra of a 40 micron carpet ber (upper blue) and a 50 micron caffeine crystal (lower red) using DTGS detector
Micro ATR works exceptionally well with the MAX IR microscope. The 100 micron at-tipped micro ATR crystal makes intimate contact with the sample easily achieved, providing high spectral quality as seen in the data above.
Illumination Sample Viewing
Visible Field of View Station
Visible Image Contrast Better than 1 micron
Detector Purge
Regulatory
Please contact PIKE Technologies for additional product detail.
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O R D E R I N G I N F O R M AT I O N Bundled MAX Packages

Sampling Options, Upgrades and Replacement Parts

Micro Sampling Options
034-21XX 034-22XX 034-41XX 034-42XX
Complete MAX Sample Compartment IR Microscope with Transmission, Reection, ATR and video camera MAX Sample Compartment IR Microscope with Transmission, Reection and ATR Complete MAX Sample Compartment IR Microscope for Reection, ATR and video camera MAX Sample Compartment IR Microscope with Reection and ATR
034-3060 160-1135 162-0030 162-0040 162-0010 162-0020
Micro Compression Cell for 13 mm IR Transparent Windows 13 mm x 2 mm KBr Window Micro Plane with Carbide Blade Micro Plane with Diamond Blade Micro Diamond Cell 1.6 mm Micro Diamond Cell 2.0 mm
Notes: All bundled MAX Packages include a trinocular viewer, slide aperture for reection, X, Y sample stage, micro sampling kit, spectrometer base mount, purge tubes and storage case. The transmission versions include the X, Y Variable See Thru aperture. Please see the FTIR instrument code sheet.
MAX IR Microscope Upgrades

034-0090
MAX IR Microscope Transmission Upgrade
Congurable MAX Systems

MAX Base Optics
Notes: The Transmission Upgrade requires shipment of the accessory to PIKE Technologies. The upgrade includes the MAX condenser, the X, Y Variable See Thru Aperture, and all additional optics required for transmission, reection and optional ATR sampling.
034-20XX 034-40XX
MAX Sample Compartment IR Microscope for Transmission and Reection (ATR optional) MAX Sample Compartment IR Microscope for Reection (ATR optional)
MAX IR Microscope Replacement Parts

608-274-2721
300-0025 034-3070 162-6401 300-0002 034-3080
13 mm Gold Surfaced Disk for Reection Analysis IR Microsampling Kit (3 position sample slide with gold mirror, 2 KBr windows, scalpel, tweezers and probes) 3-position Sample Slide for 13 mm Windows Gold Surfaced Sample Slide Replacement Illumination Bulb for MAX
Notes: The MAX Sample Compartment IR Microscope is available in versions for transmission and reection sampling or refection only both versions are also compatible with ATR sampling. RotATR MAX ATR must be purchased separately. Both versions include the slide aperture for reection, X, Y sample stage, micro sampling kit, spectrometer base mount, purge tubes, and storage case. The transmission version includes the X, Y Variable See Thru aperture. Please see the FTIR instrument code sheet.
Notes: For options not listed here, please contact PIKE Technologies.
Sample Viewing Options (must select 1 or more)

034-3020 034-3030 034-3010
Binocular Viewer for MAX Trinocular Viewer for MAX Video Camera for MAX
Notes: Trinocular Viewer is required for selection of the Video Camera option. Binocular and Trinocular Viewers include adjustable reticule to assist with sample dimensioning.
Micro ATR (optional)

034-3040
RotATR, MAX ATR, Ge Crystal
Notes: The RotATR micro ATR is compatible with the MAX Sample Compartment IR Microscope.
Microsampling Tools Compression Cells and Sample Manipulation

PIKE Technologies Micro Compression Cell
The Micro Compression Cell is an excellent sampling tool for supporting small samples for transmission analysis with the PIKE MAX IR microscope. Single crystals, attened bers, multi-layer polymer micro samples are rmly supported between salt windows typically KBr for transmission analysis. The cell uses 13 x 2 mm windows and has a clear aperture of 10 mm. Compression of the sample is achieved by rotation of the knurled retainer.
Microsampling Tools
034-3060 160-1135 160-1008 162-0030 162-0040 162-6401 300-0025
Micro Compression Cell (requires selection of two 13 x 2 mm windows) 13 x 2 mm KBr Window, 1 each 13 x 2 mm KBr Windows, 6 pack Micro Plane with Carbide Blade Micro Plane with Diamond Blade 3-Position Sample Slide (recommended selection of window or disk) 13 x 2 mm Gold-Surfaced Disk
Notes: For items not in this list please contact PIKE Technologies.
Micro Plane with either Carbide or Diamond Blade

The Micro Plane is a useful tool for preparation of thin slices of multi-layered samples for transmission microanalysis. The Micro Plane is available with either carbide or diamond blade. The carbide blade is recommended for general polymer materials. The diamond blade is recommended when the multi-layered sample has metallic content. The Micro Plane features an adjustable knife edge to control the thickness of the sample.
PIKE Technologies 3-Position Sample Slide

The PIKE 3-Position Sample Slide is designed for placement of 13 mm windows for transmission analysis or the 13 mm goldsurfaced disk for reection analysis when using the MAX IR Microscope. An open port of the 3-Position Sample Slide is used conveniently to support a attened free-standing ber for transmission analysis.
71
Micro Diamond Cell For Compressing and Holding Samples for Microanalysis
Small samples are easily held in place and attened to ideal thicknesses for FTIR analysis using the PIKE Technologies Micro Diamond Cell. The diamond windows in this cell are Type IIA synthetic for excellent transmission from the UV through Far-IR spectral regions. The hardness of diamond enables maximum pressure to be applied to all types of crystalline, ber, or amorphous materials. Typical samples include bers, paint chips, rubbers, and plastic materials including laminates. The large clear aperture of the PIKE Technologies Micro Diamond Cell (either 1.6 or 2.0 mm) makes it easy to place the micro sample into position while viewing under a stereomicroscope. The large thumb wheels provide easy means of tightening and attening the samples. The thumb wheels include a hex wrench tightening capability for application of maximum pressure. The PIKE Technologies Micro Diamond Cell is mounted on a standard 2" x 3" plate compatible with your FTIR spectrometer sample compartment. However, it performs best with a beam condenser or IR microscope.
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F E AT U R E S O F T H E M I C RO D I A M O N D C E L L
Compression and positioning for micro samples 1.6 or 2.0 mm clear aperture versions Easy thumb wheel or hex wrench mechanism for application
of pressure
608-274-2721
Compatible with UV to Far-IR spectral regions Compatible with PIKE MAX IR microscope and PIKE
beam condensers
14,000 psi pressure (10 kgf/mm 2)
Human hair sample attened in the PIKE Diamond Cell and analyzed using the MAX IR microscope
Micro Diamond Cell
162-0010 162-0020
Micro Diamond Cell, 1.6 mm Micro Diamond Cell, 2.0 mm
Notes: The Micro Diamond Cell is easily laid onto the X, Y stage of the PIKE MAX IR microscope. Mounting the Micro Diamond Cell into the PIKE beam condensers requires the optional slide holder.
Beam Condensers 4X and 6X Versions for FTIR

Beam condensers offer easy transmission sampling with minimal sample preparation. The PIKE Technologies beam condensers are available in 4 and 6 times beam de-magnication. Each offer a large working area to accept many types of transmission sampling accessories, including high pressure diamond cells, liquid cells, mull cells, and miniature micro holders. The sample area uses pins to ensure accurate and reproducible accessory alignment requiring no further adjustment.
F E AT U R E S O F B E A M C O N D E N S E R S
4X and 6X versions providing improved spectral data for

micro sampling
High optical throughput beam condensing optics provide

higher signal-to-noise ratio for small samples
Wing of fruit y within 1 mm aperture with and without use of a beam condenser
Standard pin mounting for sample holders providing a

precise, reproducible mount for samples
Standard sample holder block and alignment pinhole (1.5 mm) Optional universal spring sample holder, X, Y, Z adjustable
stage, micro pellet and mull holder, and magnetic sample holder
Purge enclosed accessory includes purge tubes and purge

inlet for additional purge.
For the most demanding applications, a precision X, Y, Z Sampling Stage is available as an option, which accommodates all sampling accessories to achieve the highest possible optical throughput and allows a point-by-point surveying an extended sample. The system design incorporates a layout of six mirrors, adjustable input and output mirrors and two matched 4:1 (or 6:1) ellipsoidal mirrors.
Compatibility with most FTIR spectrometers
Sample Holders for the PIKE Technologies Beam Condensers. Left to right; Universal Spring Sample Holder ideal for small spheres and gems, Magnetic Sample Holder ideal for 1 or 3 mm pellet die, and the Micro KBr Pellet and Mull Holder ideal for very small volume solids, liquids and paste samples (holds 13 mm windows). Either the 4X or 6X beam condensers are available in standard or gold-coated optics for high performance mid-IR for near-IR operation.
B E A M C O N D E N S E R S S P E C I F I C AT I O N S Beam Condenser Optical Diagram Optics Congurations Sampling Options All reflective, aluminum standard gold coated optional 4X and 6X de-magnifications Standard sample holders XYZ adjustable stage Pressure diamond cells and micro holders Yes 140 mm wide, 100 mm or 125 mm tall, 315 mm deep Most, specify model and type
Basic beam condenser products have been available for many years. The PIKE Technologies Beam Condenser Accessories provide all the functionality of these basic systems with exceptional optical design and easy access to the sampling area. The unique enclosed optics provide a purged environment.
Purgeable Accessory Dimensions FTIR Compatibility
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PIKE TECHNOLOGIES
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Beam Condensers
Micro Diamond Cell (optional)

031-40XX
4X Beam Condenser Includes the Non-Adjustable Sample Position, 1.5 mm alignment aperture, purge tubes and mount for the FTIR of your selection. 6X Beam Condenser Includes the Non-Adjustable Sample Position, 1.5 mm alignment aperture, purge tubes and mount for the FTIR of your selection.
162-0010 162-0020 031-2070
Micro Diamond Cell, 1.6 mm Micro Diamond Cell, 2.0 mm Holder for Micro Diamond Cell
031-60XX
Notes: The Micro Diamond Cell includes the anvil pressure cell assembly, and Type IIa diamonds. Holder is required for use with beam condenser.
Beam Condenser Replacement Parts

Notes: Please select the XX code from the fold-out on the last page of this catalog.
031-2020
Non-Adjustable Sample Position
Adjustable Sample Position (optional)

Notes: For options not listed here, please contact PIKE Technologies.
031-2010
X, Y, Z Adjustable Sample Position
Notes: The X, Y, Z Adjustable Sample Position can be easily exchanged with the Non-Adjustable Sample Position.
Sample Holders (optional)

031-2030 031-2040 031-2050
Universal Spring Sample Holder Magnetic Sample Holder Micro KBr Pellet and Mull Holder
608-274-2721
Notes: All of these Sample Holders t to the pin position of either the NonAdjustable Sample Position or the X, Y, Z Adjustable Sample Position.
Transmission Sampling
Transmission sampling techniques may be applied to a very wide range of sample types including liquids, solids and gases. Application of automation technology to traditional transmission sampling can improve sample throughput and improve sampling precision.
Page 76
Automated Vertical Accessories Multi-SamplIR and RotatIR
Page 78
Automated Horizontal Multi-Sample System High capacity sampling
Page 79
X, Y Autosampler For high throughput micro-titer format sampling
Page 80
Liquid Cells For comprehensive liquids sampling
Page 87
Dies, Presses, Grinders and Accessories For comprehensive solids analysis
Page 94
Holders, Windows and Polishing Kit For optimizing transmission sampling
Page 99
Short-Path, Long-Path, and Heated Gas Cells For comprehensive gas sampling
Page 103
Transmission Sampling Techniques Theory and Applications
Transmission Multi-SamplIR Automated In-Sample Compartment Accessory

The PIKE Technologies Transmission Multi-SamplIR accessory is designed to speed FTIR analysis. The accessory accommodates up to 18 samples (depending on sampling plate conguration) for unattended analysis. Flexible test sequences are easily dened and automatically implemented. This Multi-SamplIR is ideal for analyzing a wide range of materials, including lms, slides, pellets, windows and large area samples like multilayer coated substrates. Samples are conveniently mounted onto a sampling plate and held in place during the analysis. The plates can be congured for different sample quantities, types and geometries. The system can be set to perform automated mapping of the sample, producing transmission spectra as a function of position. Sampling plates are easily mounted on the support ring with spring-loaded clips, ensuring that the plate remains precisely located and correctly registered. The support ring mounts on the accessorys drive and is rotated and translated laterally through a distance of 75 mm to produce an R-theta motion covering the entire sampling range of the accessory. Each system incorporates two precision stepper motors for rotation and translation of the plate. The motors are driven by the PIKE Motion Control Unit. The operation is managed by PIKE Technologies AutoPRO software which provides full user programmability and easy to learn point-and-click environment. Polar or X, Y coordinates may be used to dene test points. AutoPRO software allows complex test sequences to be set up, stored as methods and implemented with full exibility. The Motion Control Unit incorporates a smart power supply and works with 85-265 VAC, 47-63 Hz power lines. The Transmission Multi-SamplIR accessory is designed to t most FTIR spectrometers. Please contact us for more product details.
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F E AT U R E S O F T H E M U LT I - S A M P L I R
In-compartment automated transmission sampling Selectable number of samples, size, conguration

and placement
608-274-2721
Multiple point analysis on single sample Custom sampling plates and blanks Fully automated and manual versions available
Transmission Multi-SamplIR (select one)
074-26XX
Automated Transmission Multi-SamplIR for FTIR Includes: AutoPRO Software and a Motion Control Unit (85-265 VAC), and a Standard Sampling Plate for 13 mm pellets (18 positions)
Notes: This accessory requires a minimum FTIR beam height of 3.5". Insert FTIR code found on fold-out on last page of this catalog.
Transmission Multi-SamplIR Options

074-3661
Additional Standard Sampling Plate
Notes: If you need options not described here, please contact us.
RotatIR Automated Rotating Sample Stage

The PIKE Technologies RotatIR is designed for automated selection of the angle of transmission of the sample relative to the IR beam in the FTIR sample compartment. Applications include the study of sample thickness and sample reectivity. Selection of the angle of transmission is automated through the use of PIKE Technologies AutoPRO software, the Motor Control Unit and the integrated stepper motor. A full set of spectra may be collected automatically by pre-dening the angles from AutoPRO software. The RotatIR features a standard 2" x 3" slide mount for easy positioning of different types of transmission sample holders. AutoPRO software is written in Visual BASIC and allows complex test sequences to be setup, stored as methods and implemented with full exibility. The Motion Control Unit incorporates a smart power supply and works with 85-265 VAC, 47-63 Hz power lines. The PIKE RotatIR accessory is designed to t most FTIR spectrometers. Please contact us for more product details.
T R A N S M I S S I O N S A M P L I N G AU TO M AT E D A N D M A N UA L T E C H N O LO G I E S
AutoPRO software provides interface for automated collection of spectral data
F E AT U R E S O F T H E ROTAT I R
Automated selection of angle of sample transmission Programmable from 0 to 360 degrees with resolution
of 0.2 degrees
Automated collection of spectra at the dened angle of

transmission via AutoPRO software
Compatible with most FTIR systems

RotatIR Automated Rotating Sample Stage
091-20XX
RotatIR Automated Rotating Sample Stage Includes: AutoPRO Software and a Motion Control Unit (85-265 VAC)
Notes: Insert FTIR XX code found on the fold-out on the last page of this catalog.
RotatIR Options
162-5400
Film Sampling Card 20 mm clear aperture, 10 each
Notes: If you need options not described here, please contact us.
77
Automated Horizontal Transmission Accessories For Films or Pellets

PIKE Technologies offers Automated Horizontal Transmission Accessories for increasing sample throughput for analysis of lms and pellet samples. The Automated Horizontal Transmission Accessories are available in an 8" or a 12" version depending upon sample loading requirements. The 8" version will accommodate up to 3725 mm diameter samples. The 12" version will accommodate up to 8325 mm diameter samples. PIKE Technologies custom manufactures sampling plates to meet your exact sampling needs. Please contact us for other congurations. Both the 8" and 12" versions of the Automated Horizontal Transmission Autosamplers also can do specular reection analysis if your applications require. PIKE Technologies Automated Horizontal Transmission Accessories are compatible with most FTIR spectrometers.
The PIKE Autosamplers are controlled by AutoPRO software, with a pointand-click user environment to dene sampling positions
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608-274-2721
F E AT U R E S O F T H E AU TO M AT E D H O R I Z O N TA L TRANSMISSION ACCESSORY
Fully automated transmission analysis of polymer lms,

pellets or other transmission samples for FTIR
Standard specular reectance sampling Sampling capacity of up to 114 samples, depending upon size Continuous operation with multiple plates Purgeable optical design for high quality FTIR spectra
075-28XX
Automated 8" Horizontal Transmission Accessory Includes: Motion Control Unit (85-265 VAC), AutoPRO Software and one 83 Position Sampling Plate Automated 12" Horizontal Transmission Accessory Includes: Motion Control Unit (85-265 VAC), AutoPRO Software and one 91 Position Sampling Plate
076-28XX
Notes: Please select XX code from the fold-out on the last page of this catalog.
Options
075-3881 076-3881
Additional Sampling Plate for 8" Automated Horizontal Transmission Accessory Additional Sampling Plate for 12" Automated Horizontal Transmission Accessory
Notes: For options not shown here, please contact PIKE Technologies.
X, Y Autosampler
Transmission and Reectance Automated Sampling in Microplate Format
PIKE Technologies has developed a special silicon well plate excellent for transmission analysis. This unique 96 well plate provides full mid-IR transmission spectra and is sufciently durable for extended usage. For diffuse reection measurements, a cavity style plate with standard format placement of samples is available. Please contact us for other congurations. The quality of FTIR spectra collected on the X, Y Autosampler is excellent shown in the spectra below for solvent residue samples.
Automated analysis of solvent residues in the transmission sampling mode
X , Y A U T O S A M P L E R S P E C I F I C AT I O N S
F E AT U R E S O F T H E X , Y AU TO S A M P L E R
Optics Resolution Accuracy Backlash
Elliptical 3X Beam Demagnification 13 microns per step 25 micrometers per cm < 75 micrometers
Complete hardware and software package for automated

analysis of industry standard 24, 48, or 96 well plates. Special plate congurations are available.
Diffuse reectance of powdered samples or specular

reectance sampling for reaction residues O R D E R I N G I N F O R M AT I O N
Gold-coated optics version for highest performance mid-IR

and NIR sampling
Optional transmission sampling with integrated detector and

transmission sampling plates
047-20XX
X, Y Autosampler Diffuse Reectance Conguration Includes: Motion Control Unit (85-265 VAC), AutoPRO Software and 96 Well Diffuse Reectance Sampling Plate X, Y Autosampler Diffuse Reectance Conguration with Gold-Coated Optics Includes: Motion Control Unit (85-265 VAC), AutoPRO Software and 96 Well Diffuse Reectance Sampling Plate X, Y Autosampler Diffuse Reectance/Transmission Conguration Includes: Motion Control Unit (85-265 VAC), AutoPRO Software, integrated DLaTGS detector for transmission analysis, 96 Well Diffuse Reectance Sampling Plate and 96 Well Transmission Sampling Plate X, Y Autosampler Diffuse Reectance/Transmission Conguration with Gold-Coated Optics Includes: Motion Control Unit (85-265 VAC), AutoPRO Software, integrated InGaAs detector for transmission analysis, 96 Well Diffuse Reectance Sampling Plate and 96 Well Transmission Sampling Plate
In-compartment location, purgeable optical path
047-60XX
The PIKE Technologies X, Y Autosampler is designed around standard 24, 48 or 96 well microplate architectures ideal for high efciency sample loading and FTIR analysis. Applications include high throughput analysis of liquid residues and chemical reactions, powdered samples and automated diffuse reectance analysis. The X, Y Autosampler is available in standard all reecting optics and with gold-coated optics for highest performance mid-IR and optimized NIR sampling. The autosampler features an X, Y stage with both axes driven by high precision stepper motors for speed and reproducibility. Programming and control of the X, Y Autosampler is done through PIKE Technologies AutoPRO software, and is compatible with current FTIR systems. The optical design is based upon a precision ellipsoidal reector and the size of the spot illuminated at the sample is approximately 2 mm ideal for up to 96 well congurations.
073-90XX
073-60XX
Notes: Replace XX in part number with code for your spectrometer model found on the last page of this catalog. An InGaAs detector is an option for 073 versions of the Autosampler. Your FTIR spectrometer must be capable of interfacing with an external detector. For other options for reection or transmission well plates, please contact us.
X,Y Autosampler Options

073-9110 073-9130
96 Well Diffuse Reectance Sampling Plate 96 Well Transmission Sampling Plate
79
Press-On Demountable Cell For Viscous Liquids and Mulls

The PIKE Technologies Press-On Demountable Liquid Cell is recommended for fast and convenient qualitative analysis of viscous liquids and mull samples. Simply spot the sample onto the middle of the transparent IR window and slip the second window over the top. The windows are conveniently held in place by the friction t of the Demountable Cell Holder. The Press-On Demountable Cell is available in 2 sizes 25 mm and 32 mm and has optional Teon spacers to assist with sampling pathlength. A wide variety of window types and spacer pathlengths are available to cover mid-IR, NIR, and far-IR spectral regions and sample composition from organic to aqueous. The PIKE Technologies Press-On Demountable Liquid Cell is designed with a standard 2" x 3" plate for use with all FTIR spectrometers.
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608-274-2721
F E AT U R E S O F T H E P R E S S -O N D E M O U N TA B L E C E L L
Flexible window selection for optimizing spectral range

and sample compatibility
Demountable cell design for optimal cleaning of

difcult samples
Compatible with all FTIR spectrometers
Press-On Demountable Liquid Cell Holders
Press-On Demountable Liquid Cell Spacers (Optional)

PART NUMBER PATHLENGTH (MM) 25 MM 32 MM
162-3600 162-3610
Press-On Demountable Liquid Cell Holder for 25 mm Windows Includes: cell holder, and o-ring Press-On Demountable Liquid Cell Holder for 32 mm Windows Includes: cell holder, and o-ring
0.015 0.025 0.050 0.100
162-1110 162-1120 162-1130 162-1140 162-1150 162-1160 162-1170 162-1190
162-1210 162-1220 162-1230 162-1240 162-1250 162-1260 162-1270 162-1290
Press-On Demountable Liquid Cell Windows (select minimum of 2)

DESCRIPTION PART NUMBER 25 X 4 MM 32 X 3 MM
0.200 0.500 1.000 Assortment
BaF2 CaF2 Ge KBr KRS-5 NaCl Polyethylene Si ZnSe
160-1217 160-1211 160-1138 160-1133 160-1127 160-1124 160-5214 160-1116 160-1114
160-1147 160-1143 160-1137 160-1132 160-1126 160-1122 160-5216 160-1159 160-1113
Notes: Spacer pathlength packages above include 12 each of the spacers. The assortment package includes 2 each of the different pathlengths.
Press-On Demountable Liquid Cell Replacement Parts

162-3621 162-1330
Viton O-Rings, 25 mm (12 each) Viton O-Rings, 32 mm (12 each)
Notes: For other options for the Press-On Demountable Liquid Cell, please contact PIKE Technologies.
Notes: For window compatibility please consult the Materials Properties information on page 105 of this catalog. For additional window selections please see the windows page of this catalog.
Demountable Liquid Cells For Versatile Pathlength Liquid Sampling

The PIKE Technologies Demountable Liquid Cell is ideal for qualitative and quantitative analysis of liquid samples where it is desirable to optimize the pathlength for varying samples. Furthermore the Demountable Liquid Cell is well suited for samples where it is useful to disassemble the cell for cleaning. A wide variety of window types and spacer pathlengths are available. Window types are available to cover mid-IR, NIR, and far-IR spectral regions and sample composition from organic to aqueous. The PIKE Technologies Demountable Liquid Cell is designed with a standard 2" x 3" plate for use with all FTIR spectrometers. The needle plate includes Luer-Lok ttings for easy syringe lling of the sample. The window size is 32 x 3 mm and the clear aperture of the cell is 13 mm.
F E AT U R E S O F T H E D E M O U N TA B L E L I Q U I D C E L L
Flexible window selection for optimizing spectral range and

sample compatibility
Flexible pathlength to optimize sample absorbance Demountable cell design for optimal cleaning of
difcult samples
Compatible with all FTIR spectrometers Heated version available (see page 84)
Demountable liquid cell assembly layout
Demountable Liquid Cell Holder
Demountable Liquid Cell Spacers (Optional)

PATHLENGTH (MM) PART NUMBER
162-1100
Demountable Liquid Cell Holder Includes: cell holder, gaskets, and one complete set of spacers select windows below
0.015 0.025 0.050 0.100 0.200
162-1210 162-1220 162-1230 162-1240 162-1250 162-1260 162-1270 162-1290
Notes: Requires selection of windows below. Please select 2 syringes below for lling the demountable liquid cell.
Demountable Liquid Cell Windows

(must select minimum of 1 Plain and 1 Drilled)
PART NUMBER DESCRIPTION PLAIN DRILLED
0.500 1.000 Assortment
BaF2 CaF2 Ge KBr KRS-5 NaCl Polyethylene Si ZnSe
160-1147 160-1143 160-1137 160-1132 160-1126 160-1122 160-5216 160-1159 160-1113
160-1146 160-1142 160-1136 160-1131 160-1125 160-1121 160-5215 160-1158 160-1112
Notes: Spacer pathlength packages above include 12 each of the spacers. The assortment package includes 2 each of the different pathlengths.
Demountable Liquid Cell Replacement Parts

162-1104 162-1300 162-1310 162-1320 161-0520 161-0521 161-0522
Demountable Liquid Cell Needle Plate Teon Stoppers for Needle Plate (12 each) Teon Gaskets (12 each) Teon O-Rings (12 each) Glass Syringe, 1 mL Glass Syringe, 2 mL Glass Syringe, 5 mL
Notes: Above windows are 32 x 3 mm disks. For window compatibility please consult the Materials Properties information on page 105 of this catalog. For additional window selections please see page 96.
Notes: For other options for the Demountable Liquid Cell, please contact PIKE Technologies.
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Super-Sealed Liquid Cells For Precision, Fixed Pathlength Liquid Sampling

The PIKE Technologies Super-Sealed Liquid Cells are ideal for quantitative analysis of liquid samples, especially where precise, reproducible pathlength is required. The PIKE Technologies Super-Sealed Liquid Cells are designed to be leak-proof for long-lasting sampling and cost efciency. The Super-Sealed Liquid Cells are amalgamated, further sealed with epoxy, and held rmly within the standard 2" x 3" slide mount card compatible with all FTIR spectrometers. The PIKE Technologies Super-Sealed Liquid Cells include Luer-Lok ttings for easy syringe lling of the sample. The clear aperture of the assembled cell is 13 mm. The PIKE Technologies Super-Sealed Cells are available in a wide variety of window materials and sampling pathlengths.
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608-274-2721
Permanently mounted cell with xed pathlength to provide

maximum reproducibility of sample absorbance
Flexible window selection for optimizing spectral range

and sample compatibility
Full range of cell pathlengths for optimized quantitative

measurements
Compatible with all FTIR spectrometers

Super-Sealed Liquid Cells Window Options (select 1 or more)
Path (mm) Volume (mL) BaF2 CaF2 CsI KBr KRS-5 NaCl SiO2 ZnSe ZnS 0.015 0.054 162-1640 162-1630 162-1680 162-1620 162-1660 162-1610 162-1609 162-1650 162-1670 0.025 0.090 162-1641 162-1631 162-1681 162-1621 162-1661 162-1611 162-1601 162-1651 162-1671 0.050 0.18 162-1642 162-1632 162-1682 162-1622 162-1662 162-1612 162-1602 162-1652 162-1672 0.10 0.36 162-1643 162-1634 162-1683 162-1623 162-1663 162-1613 162-1603 162-1653 162-1673 0.15 0.54 162-1649 162-1635 162-1689 162-1624 162-1669 162-1614 162-1609 162-1659 162-1679 0.20 0.72 162-1644 162-1636 162-1684 162-1625 162-1664 162-1615 162-1604 162-1654 162-1674 0.50 1.8 162-1645 162-1633 162-1685 162-1626 162-1665 162-1616 162-1605 162-1655 162-1675 1.0 3.6 162-1646 162-1637 162-1686 162-1627 162-1666 162-1617 162-1606 162-1656 162-1676 5.0 18 162-1647 162-1638 162-1687 162-1628 162-1667 162-1618 162-1607 162-1657 162-1677 10.0 36 162-1648 162-1639 162-1688 162-1629 162-1668 162-1619 162-1608 162-1658 162-1678
Notes: All PIKE Technologies Super-Sealed Cells include Teon stoppers. Please select 2 syringes (below) for lling the Super-Sealed Cell.
Super-Sealed Liquid Cell Replacement Parts

162-1300 161-0520 161-0521 161-0522
Teon Stoppers (12 each) Glass Syringe, 1 mL Glass Syringe, 2 mL Glass Syringe, 5 mL
Notes: For other options please contact PIKE Technologies.
Long-Path Quartz Liquid Cells For Analysis of Hydrocarbon Content and Related Measurements
The PIKE Technologies Long-Path Quartz Liquid Cells are ideal for the quantitative analysis of hydrocarbons in water and soil samples or for the analysis of additive content in polymers after extraction. Sample extracts are easily transferred to the quartz cells for infrared analysis. Pathlengths ranging from 10 mm to 100 mm are available for optimization of the sample absorbance. The cells are manufactured of special grade IR quartz which is fully transparent in the hydrocarbon absorbance region. The quartz cells are compatible with organic and aqueous solvents and are suitable for use with new D7066-04 ASTM method. A 2" x 3" slide mount holder is available for the cells.
F E AT U R E S O F T H E LO N G - PAT H Q UA RT Z LIQUID CELLS
For the analysis of hydrocarbon content of water, soil, and

other environmental samples
For analysis of polymer additives after extraction Highest quality quartz cells for clear infrared spectral
transmission and optimized result
Spectrum of 10 mm Long-Path Quartz Cell
Long-Path Quartz Liquid Cells
162-1801 162-1802 162-1805 162-1810
Long-Path Quartz Cell, 10 mm Long-Path Quartz Cell, 20 mm Long-Path Quartz Cell, 50 mm Long-Path Quartz Cell, 100 mm
Notes: Cells include Teon stoppers. Select slide sample holder below.
Long-Path Quartz Liquid Cell Parts and Sampling Options

161-2530 161-2540 161-2550
Slide Sample Holder, Quartz Cell, 10 20 mm Slide Sample Holder, Quartz Cell, 50 mm Slide Sample Holder, Quartz Cell, 100 mm
Notes: Please contact PIKE Technologies for replacement Teon stoppers and items not described on this list.
83
Falcon Mid-IR Transmission Accessory For Precise Temperature Control of Demountable Liquid Cells
F A L C O N M I D - I R T R A N S M I S S I O N A C C E S S O R Y S P E C I F I C AT I O N S Temperature Control Temperature Range Accuracy Sensor Type Temperature Controllers Digital Digital PC Input Voltage +/- 0.5% of set point +/- 0.5% of set point, graphical setup, up to 10 ramps, USB interface 90264 V, auto setting, external power supply Variable 315 VDC/50 W max. width 120 mm, depth 175 mm, height 90 mm (without FTIR baseplate and mount) Peltier (cooling and heating) 5 C to 105 C +/- 0.5% 3 wire Pt RTD (low drift, high stability)
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PIKE TECHNOLOGIES
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F EATURES O F T HE FALCON M ID -IR A CCESSORY
Output Voltage Dimensions
Peltier temperature control from 5 C to 105 C Wide selection of windows for optimizing spectral range and
sample compatibility
Notes: Peltier device must be water cooled for proper operation this is achieved by running cold tap water through the water jacket integrated into the accessory shell, or by the use of an external liquid circulator.
Flexible pathlength to control sample absorbance Demountable cell design for optimal cleaning of
difcult samples O R D E R I N G I N F O R M AT I O N
Falcon Mid-IR Transmission Accessory
608-274-2721
Available for most FTIR spectrometers
111-40XX
The PIKE Technologies mid-IR Falcon accessory is recommended for qualitative and quantitative analysis of liquids where it is necessary to control the temperature of the sample. Temperature range of the accessory is 5 C to 105 C with +/- 0.5% accuracy. Heating and cooling is controlled by a built-in Peltier device providing for reproducible ramping and for reaching target temperatures quickly and reliably. The system is driven by a Digital Temperature Controller directly, or via PC. A wide variety of window types and spacer pathlengths are available for this product. Windows offered cover mid-IR, NIR, and far-IR spectral regions and sample compositions from organic to aqueous. A complete heatable transmission cell set-up for use with the mid-IR Falcon accessory consists of two 32 mm x 3 mm size windows (drilled and undrilled), a spacer, the needle plate with Luer-Lok fittings, two gaskets and a proprietary cell mount. The full Falcon configuration requires the accessory base with cell holder, user selected windows, and one of the available temperature controllers. The Falcon accessory is compatible with most brands of FTIR spectrometers.
Mid-IR Falcon Base with Cell Holder Includes: Temperature controlled base, demountable cell, gaskets, and one complete set of spacers. Select windows and the Digital Temperature Controller from the tables on the next page for complete system.
Notes: Please insert XX code found on the fold-out on the last page of this catalog. Please select 2 syringes (next page) for lling the demountable liquid.
Temperature Controllers
076-1230 076-1430
Digital Temperature Control Module for Falcon Accessory Digital Temperature Control Module, PC Control for Falcon Accessory
Notes: Digital Temperature Control Module is required to control temperature via PC and includes PIKE TempPRO software.
Demountable Liquid Cell Windows
(must select minimum of 1 Plain and 1 Drilled)
PART NUMBER DESCRIPTION PLAIN DRILLED
Demountable Liquid Cell Replacement Parts

162-1600 162-1104 162-1300 162-1310 162-1320 161-0520 161-0521 161-0522
Demountable Liquid Cell for the mid-IR Falcon Accessory Demountable Liquid Cell Needle Plate Teon Stoppers for Needle Plate (12 each) Teon Gaskets (12 each) Teon O-Rings (12 each) Glass Syringe, 1 mL Glass Syringe, 2 mL Glass Syringe, 5 mL
BaF2 CaF2 Ge KBr KRS-5 NaCl Si ZnSe
160-1147 160-1143 160-1137 160-1132 160-1126 160-1122 160-1159 160-1113
160-1146 160-1142 160-1136 160-1131 160-1125 160-1121 160-1158 160-1112
Notes: For other options for the Demountable Liquid Cell, please contact PIKE Technologies.
Notes: Above windows are 32 x 3 mm disks. For window compatibility please consult the Materials Properties information on page 105 of this catalog. For additional window selections please see the windows page of this catalog.
Demountable Liquid Cell Spacers (Optional)

DESCRIPTION PART NUMBER
0.015 mm 0.025 mm 0.050 mm 0.100 mm 0.200 mm 0.500 mm 1.000 mm Assortment
162-1210 162-1220 162-1230 162-1240 162-1250 162-1260 162-1270 162-1290
Notes: Spacer pathlength packages above include 12 spacers. The assortment package includes 2 each of the different pathlengths.
85
Falcon NIR Transmission Accessory Quantitative and Qualitative Analysis of Liquids under Precise Temperature Control
The complete NIR Falcon configuration requires the accessory base, cell holder, and one of the available temperature controllers. The Falcon accessory is compatible with most brands of FTIR spectrometers.
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PIKE TECHNOLOGIES
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F A L C O N N I R T R A N S M I S S I O N A C C E S S O R Y S P E C I F I C AT I O N S Temperature Control Temperature Range Accuracy Sensor Type Temperature Controllers Digital Digital PC Input Voltage Output Voltage Dimensions Peltier (cooling and heating) 5 C to 105 C +/- 0.5% 3 wire Pt RTD (low drift, high stability) +/- 0.5% of set point +/- 0.5% of set point, graphical setup, up to 10 ramps, USB interface 90264 V, auto setting, external power supply Variable 315 VDC/50 W max. width 120 mm, depth 175 mm, height 90 mm (without FTIR baseplate and mount)
F E AT U R E S O F T H E FA LC O N N I R AC C E S S O RY
Fast, easy quantitative and qualitative analysis of samples

under precise Peltier temperature control
Choice of cuvette and vial adapters Compatible with disposable 5 mm vials Excellent thermal accuracy and precision Available for most FTIR spectrometers
608-274-2721
The PIKE Technologies NIR Transmission Accessory is an excellent choice for quantitative and qualitative analysis of liquid samples in the NIR spectral region. Temperature range of the accessory is 5 C to 105 C with +/- 0.5% accuracy. Heating and cooling is controlled by a built-in Peltier device. The Peltier element provides for reproducible ramping and for reaching target temperatures quickly and reliably. The system is driven by a Digital Temperature Controller directly, or via PC. Individual sample holders are designed to accommodate standard 5 mm, 8 mm and 12 mm glass vials and 1 cm cuvettes. Sample Holders are pin positioned to ensure maximum reproducibility.
Heated NIR Transmission Accessory
110-60XX
NIR Falcon Base Includes: Temperature controlled base. Digital Temperature Controller and sample holder need to be selected from the tables below for complete system.
Notes: Please insert XX code found on the fold-out on the last page of this catalog.
076-1230 076-1430
Digital Temperature Control Module Digital Temperature Control Module PC Control
Notes: Digital Temperature Control Module is required to control temperature via PC and includes PIKE TempPRO software.
Sample Holders (must select one)

111-3610 111-3620 111-3630 111-3640
5 mm Vial Holder 8 mm Vial Holder 12 mm Vial Holder 1 cm Cuvette Holder
Falcon NIR Accessory Options

NIR transmission spectra of cooking oils in 8 mm glass vials measured at 32 C with the Falcon NIR Transmission Accessory
162-0205 162-0208 162-0212 162-0255
5 mm Disposable Glass Vials, 6 mm x 50 mm (200/pk) 8 mm Glass Vials (200/pk) 12 mm Glass Vials (200/pk) Falcon 1 cm Quartz Cuvette
Notes: Please see more cuvette options on page 116.
Bolt Press & Hydraulic Die Low-Cost Pellet Preparation

Pellet Press
161-2500 161-3500
Bolt Press for 13 mm pellets Hydraulic Die for 13 mm pellets
Notes: The Bolt Press includes evacuable barrel, 2 anvil bolts, 2 15/16" wrenches, and Bolt Press Holder. The Hydraulic Die includes evacuable barrel, 2 rams and Hydraulic Die Holder. The maximum force limit 5 ton.
The PIKE Technologies Bolt Press and Hydraulic Die are low-cost tools for making KBr pellets for transmission FTIR analysis. The press and die consist of a stainless steel barrel with two hardened and polished 13 mm rams. The barrels are equipped with a tting which allows evacuation of air while the pellet is formed. For the Bolt Press, the pressure is applied to the sample by tightening the bolts against each other with standard 15/16" wrenches included. For the Hydraulic Die the pressure is applied to the sample by placing in a hydraulic press up to 10,000 psi. Once a clear pellet is formed, the rams are removed and the sample is analyzed while still in the barrel (barrel is placed directly in the beam using the Press Holder with a standard 2" x 3" slide mount). Both accessories form a 13 mm pellet. The PIKE Technologies Bolt Press and Hydraulic Die are both equipped with a holder for your FTIR sample compartment.
Pellet Press Options and Replacement Parts

160-8010 161-5050 161-2511 161-2520
KBr Powder, 100 g Agate Mortar and Pestle, 50 mm Wrench Set for Bolt Press (2 ea.) Bolt Press Holder
Notes: For other options for the Pellet Presses, please contact PIKE Technologies.
Hand Press For Making Smaller Pellets

Hand Press
161-1100
Hand Press for 7 mm, 3 mm, and 1 mm pellets Includes: 7 mm, 3 mm, and 1 mm die sets, anvils, die collars, anvil ejectors and Dual Pellet Holder
Hand Press Options and Replacement Parts

The PIKE Technologies Hand Press is an ideal solution for laboratories that require only occasional preparation of KBr pellets and cannot justify the expense of a hydraulic press. The Hand Press is an efcient, reliable and inexpensive tool which simplies making small pellets. It consists of a long stainless steel barrel and movable stage controlled by a lever capable of applying high pressure to the KBr/powder mixture. The Hand Press comes complete with three standard die sets (7, 3 and 1 mm). The pellet preparation involves loading of the powdered sample into the die chamber, placement of the upper anvil in the press and application of hand pressure to the lever (this is sufcient to provide clear, high quality KBr disks). The Die Collar with the formed pellet is removed from the press and in most cases it can be placed directly in the beam of the spectrometer for analysis. The Hand Press is equipped with a platen position dial for adjustment of the force applied to the die and reproducible sample preparation.
161-5700 161-1018 160-8010 161-5050 161-1027 161-1028 161-1024 161-1010
Dual Pellet Holder for 7 mm, 3 mm, and 1 mm pellets Single Pellet Holder for 7 mm pellets KBr Powder, 100 g Agate Mortar and Pestle, 50 mm Hand Press Body 1 mm die set 3 mm die set 7 mm die set
Notes: For other options for the Hand Press, please contact PIKE Technologies.
87
Evacuable Pellet Press For Preparation of High Quality Pellets

The PIKE Technologies Evacuable Pellet Press is the preferred accessory for making pellets for FTIR analysis. Preparation of KBr pellets with a 13 mm die and a hydraulic press is the most popular method used for generation of samples for transmission measurements. It is also required by a number of standardized procedures, including some USLP and ASTM methods. The advantages of this approach include the generation of high quality pellets, reproducibility, and the ability to deal with relatively difcult samples, thanks to a wide range of pressures available. The PIKE Evacuable KBr Die Kit features the following components: a stainless steel base with vacuum outlet, the main die block with a 13 mm cylinder, two anvils and a plunger. All components are made of hardened stainless steel and surfaces that come in contact with the sample are highly polished. Two O-rings are used to seal the base/die assembly and the plunger. Pellet preparation involves placement of the anvil in the die chamber and covering it up with the pre-measured amount of KBr/sample mix. The sample is covered with the second anvil and the plunger is inserted into the chamber. The entire assembly is placed in a hydraulic press and compressed (a vacuum line can be connected to the base to remove moisture from the sample). For analysis, the formed pellet is ejected from the die with an extractor and mounted onto a standard 2" x 3" sample holder. The PIKE Technologies Evacuable pellet press assembly layout Evacuable Pellet Press comes complete with anvils and vacuum connector.
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PIKE TECHNOLOGIES
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F E AT U R E S O F T H E E VA C UA B L E P E L L E T P R E S S
Ideal for making high-quality KBr pellets Apply up to 20,000 lbs. (9,071 kg) of pressure Evacuable to prevent cloudy pellets Requires hydraulic press
608-274-2721
Evacuable Pellet Press
161-1900
Evacuable Pellet Press for 13 mm pellets Includes: Die Block, Anvils and pellet extracting tool.
Evacuable Pellet Press Options and Replacement Parts

160-8010 161-5050 162-5300 162-5410 161-1908 161-1903 161-1906 161-1907 430-1110 430-1120
KBr Powder, 100 g Agate Mortar and Pestle, 50 mm Magnetic Film Holder for 13 mm pellets and lm samples Sample Card for 13 mm pellets (10 each) Pellet Extracting Tool Anvils (2 each) for PIKE Evacuable Pellet Press Piston O-Rings (2 each) Base O-Rings (2 each) Vacuum Pump, 110V Vacuum Pump, 220V
Notes: For other options for the Evacuable Pellet Press, please contact PIKE Technologies.
Heated Platens Accessory For Making Thin Films of Polymeric Samples for Transmission FTIR Analysis
the quality of the spectra produced from the pressed films. This is achieved by holding the temperature at the melting point of the polymer during the film making process. Flattening the polymer below its melting point produces a cloudy film. Pressing the polymer film when it is above its melting point may cause polymer degradation. The PIKE Heated Platens Accessory is compatible with the PIKE CrushIR Hydraulic Press and other hydraulic presses (please inquire).
F E AT U R E S O F T H E H E AT E D P L AT E N S AC C E S S O RY
H E AT E D P L AT E N S A C C E S S O R Y S P E C I F I C AT I O N S Composition Temperature Range Temperature Stability Input Voltage Operating Voltage Sensor Type Heating Time Cooling Chamber Pressing Height Spacer Thickness Spacer ID Dimensions Maximum Force Stainless steel platens, mirrored surfaces Ambient to 300 C Insulated, < 3 C loss at 125 C set point during press of film 90264 V, auto setting, external power supply 24 VDC/75 W 3 wire Pt RTD (low drift, high stability) Ambient to 100 C, less than 7 minutes Standard, conduction via liquid circulation (not supplied) 3.3 cm 15, 25, 50, 100, 250 and 500 microns 25 mm 26.4 cm long, 6.4 cm wide, 5.2 cm high 10 US tons
Fast, efcient means of making thin lms for transmission

spectroscopy
Temperature range ambient to 300 C Standard stainless steel spacer set (15, 25, 50, 100, 250 and
500 microns all with 25 mm ID) included with accessory
Integral design for easy insertion and removal of heated

platens into the hydraulic press
Included insulating disks to minimize heat loss during

lm pressing
Standard cooling chamber included with accessory
The PIKE Heated Platens Accessory is designed to efficiently make thin films of polymer materials for infrared transmission spectroscopy. Thin films are easily made from pellets or other plastic sample forms. Typically a 2-5 milligram portion of polymer is cut from the pellet or other plastic sample and placed between aluminum disks within the heated base of the platens. The temperature of the platens is chosen to match the melting point of the polymer material. The top plate of the heated platens accessory is placed over the assembly and the unit is placed into the hydraulic press. A low force (2 tons) is generally applied to the sample in the heated platens accessory to make excellent films. The PIKE Heated Platens Accessory includes insulating disks to maintain the desired temperature set point when making thin polymer films. The insulating disks improve the quality of thin films, by making them more IR transmissive and thereby improving
PIKE Heated Platens Accessory
181-2000
PIKE Heated Platens Accessory
Notes: The heated platens accessory includes spacer set, thermal insulating disks, cooling chamber, aluminum disks and magnetic lm holder. Requires selection of temperature controller below.
Temperature Controller for Heated Platens (must select)

076-1220
Digital Temperature Control Module
Notes: The digital temperature controller is required for operation of the Heated Platens Accessory.
Options and Replacement Parts (optional)

181-3000 181-3020 181-3010 181-3011 181-3012 181-3013 181-3014 181-3015 162-5300 Transmission Spectrum of Thin Film of high-density polyethylene (HDPE) produced from PIKE Heated Platens Accessory
Spacer Set (15, 25, 50, 100, 250, 500 microns) Aluminum Disks, 50 each Spacer, 15 micron Spacer, 25 micron Spacer, 50 micron Spacer, 100 micron Spacer, 250 micron Spacer, 500 micron Magnetic Film Holder for 13 mm pellets and film samples
89
CrushIR Digital Hydraulic Press
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PIKE TECHNOLOGIES
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FTIR spectrum of caffeine in KBr pellet made using the PIKE CrushIR Hydraulic Press and Evacuable Pellet Press
P I K E C R U S H I R S P E C I F I C AT I O N S Metric Clamp Force (max) Platen Size (round) Ram Stroke Range Die Size 13.6 metric ton 100 mm 12 mm 5 11.5 mm 30.5 x 24.9 x 34.3 cm 44 kg English 15 US ton 3.94" 0.45" 2" 4.5" 12 x 9.8 x 13.5" 98 lbs.
608-274-2721
F E AT U R E S O F T H E P I K E C RU S H I R
Size (w x d x h) Weight Input Voltage Output Voltage
Up to 15 ton of force Digital force readout for exceptional reproducibility Adjustable maximum force Small footprint Transparent safety shield
90264 V, auto setting, external power supply 9 VDC/18 W
Hydraulic Press (select one) PIKE Technologies introduces a new and advanced hydraulic press for making excellent quality KBr pellets for transmission FTIR analysis. The CrushIR provides excellent reproducibility with its combination of digital pressure reading and adjustable maximum pressure setting thus preventing damage to the pellet die. The new PIKE CrushIR includes a transparent protective shield making it safe for operation in a busy laboratory environment. Access for vacuum hose and other utilities is made through a port in the rear of the press. The adjustable top screw provides exibility for die designs of short and longer dimensions yielding an open stand range from 2" to 4.5" (5 to 11.5 cm). The efcient sized ram stroke of 0.45" (12 mm) and adjustment screw speeds pellet making by minimizing the time required to achieve the desired force. The PIKE Evacuable Pellet Press and 13 mm pellet holder are an excellent addition to the PIKE CrushIR. A packaged version of these 3 products is available in the list below. All mechanical components of the press are enclosed in a safety metal cabinet. The access area is protected by a high-impact polymer shield.
181-1100 181-1110 181-1120
PIKE CrushIR Hydraulic Press PIKE CrushIR Hydraulic Press, Evacuable Pellet Press and Magnetic Holder PIKE CrushIR Heated Platens Package
Notes: The PIKE CrushIR Hydraulic Press includes an integrated safety shield. Please specify voltage and country destination.
Hydraulic Press Options and Replacement Parts (optional)

161-1900 160-8010 161-5050 162-5300 162-5410 430-1110 430-1120
Evacuable Pellet Press for 13 mm pellets KBr Powder, 100 g Agate Mortar and Pestle, 50 mm Magnetic Film Holder for 13 mm pellets and lm samples Sample Card for 13 mm pellets (10 each) Vacuum Pump, 110V Vacuum Pump, 220V
Auto-CrushIR Programmable Hydraulic Press
FTIR Spectrum of cocaine in KBr pellet made with PIKE Auto CrushIR Programmable Hydraulic Press and Evacuable Pellet Press
P I K E A U T O - C R U S H I R S P E C I F I C AT I O N S Metric Clamp Force (max) 13.6 ton 100 mm 12 mm 5 11.5 mm 35.6 x 29.2 x 34.3 cm 36.3 kg 110 or 220 V, 50-60 Hz Platen Size (round) Ram Stroke Range Die Size Size (w x d x h) Weight Voltage English 15 US ton 3.94" 0.45" 2" 4.5" 14.0 x 11.5 x 13.5 80 lbs. 110 or 220 V, 50-60 Hz
F E AT U R E S O F T H E P I K E AU TO - C RU S H I R
Variable force from 1 to 15 US tons Microprocessor controlled, consistent and reproducible force
application for quality pellet making
Easy to use touch-screen programming Small footprint Transparent safety shield
The PIKE Auto-CrushIR microprocessor controlled automated hydraulic press, introduces an element of consistency into hydraulic press applications such as pellet and thin film making. Pressure and corresponding hold time are easily entered through its integrated touch-screen control panel. Up to five pressure hold time ramps may be programmed and performed within a run. During operation the force measurement is shown on the bright color display. The pressure is released automatically after the prescribed time. This level of control enhances the uniformity and quality of transmission samples. The Auto-CrushIR hydraulic press is equipped with a transparent protective safety shield. Vacuum and other utilities can be conveniently connected to the panel located in the back of the unit. The adjustable screw at the top of the press provides flexibility for short and tall die designs, yielding an open stand range from 2 to 4.5" (5 to 11.5 cm). The optimal ram stroke of 0.45" (12 mm) and easy top screw adjustment speed-up pellet making by reducing time required to achieve the desired force. PIKE offers several products that may accompany the Auto-CrushIR including a pellet press and heated platens. Auto-CrushIR Automated Programmable Hydraulic Press (select one)
181-1300 181-1302 181-1310 181-1312
PIKE Auto-CrushIR Hydraulic Press (110V) PIKE Auto-CrushIR Hydraulic Press (220V) PIKE Auto-CrushIR, with Evacuable Pellet Press, and Magnetic Holder (110V) PIKE Auto-CrushIR, with Evacuable Pellet Press, and Magnetic Holder (220V)
Hydraulic Press Options and Replacement Parts (optional)

161-1900 160-8010 161-5050 162-5300 162-5410 181-2000
Evacuable Pellet Press for 13 mm pellets KBr Powder, 100 g Agate Mortar and Pestle, 50 mm Magnetic Film Holder for 13 mm pellets and lm samples Sample Card for 13 mm pellets (10 each) Heated Platen Accessory including 15, 25, 50, 100, 250, and 500 micron spacers
91
ShakIR Sample Grinder For Optimized Sample Mixing

The ShakIR accessory provides a fast, simple and inexpensive method of mixing and grinding samples for diffuse reectance sampling and in preparation for making KBr pellets. A small amount of sample and the IR transparent diluent (typically KBr) are simply scooped into a vial with mixing ball. The ShakIR thoroughly mixes and pulverizes the sample within seconds. The reciprocating motion of the vial holder follows a gure 8 path. The vial is swung through a 5 arc at high RPM, causing the ball to strike the end of the vial, which is sufcient to grind most materials into a powder. The accessory provides electronic control for precise and reproducible setting of grinding time up to 95 seconds. The protective shield provides security to grinder operation. The ShakIR construction and weight offer long-term, reliable operation, minimized vibration and noise. The ShakIR offers a small footprint. The base is 14.4 cm x 17.2 cm with a height of 27.3 cm.
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PIKE TECHNOLOGIES
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608-274-2721
Sample Grinder
161-1070
ShakIR, Heavy Duty Sample Grinder, 110/220V Includes mount for 1" vials
Sample Grinder Vials (required)
F E AT U R E S O F T H E S H A K I R S A M P L E G R I N D E R
PART NUMBER
DESCRIPTION
Produces nely powdered mix of sample and diluent ideal

for clear pellets and excellent diffuse reectance spectra
161-1035
Stainless Steel Vial with Ball, 1" long x 0.5"
Options and Replacement Parts for Sample Grinders

Minimizes exposure of sample to atmospheric moisture

a chief cause of cloudy pellets
161-1037 160-8010
Spare Stainless Steel Ball KBr Powder, 100 g
Sample Preparation Accessories For Solids Materials Analysis (powders, mull agents, grinding tools and more)
Preparation of samples for FTIR analysis by diffuse reection or transmission analysis requires a number of tools and accessories for convenient and high quality results. PIKE Technologies has assembled these tools to make your FTIR sampling easier. IR transparent powders and chunks, manual sample grinding tools with a complete selection of Agate Mortar and Pestle selection and mulling agents are in stock and ready for immediate delivery.
IR Transparent Powders
160-8010
KBr Powder, 100 g
F E AT U R E S O F S A M P L E P R E PA R AT I O N A C C E S S O R I E S
Accessories for analysis of solids by transmission

and diffuse reectance
IR Transparent Chunks
Materials for pellets and mulls
160-8015
KBr Chunks, 100 g
Agate Mortar and Pestles

161-5035 161-5040 161-5050 161-5065 161-5095 161-5100
35 mm Agate Mortar and Pestle 40 mm Agate Mortar and Pestle 50 mm Agate Mortar and Pestle 65 mm Agate Mortar and Pestle 95 mm Agate Mortar and Pestle 100 mm Agate Mortar and Pestle
Notes: The 50 mm Agate Mortar and Pestle is our most popular size and recommended for most applications.
Solids and Mulls Spatulas

042-3035 042-3050
Spatula Spoon Style Spatula Flat Style
Mulling Agents
161-0500 161-0510
Nujol Fluorolube
Notes: For other options for Sample Preparation Tools, please contact PIKE Technologies.
93
Sample Holders For Transmission FTIR Analysis of Pellets and Films

The Magnetic Film/Pellet Holder is used to mount KBr pellets and thin polymer lms. Its components include a steel plate and exible magnetic strip. The holder is designed to support 13 mm KBr pellets and lms less than 0.5 mm thick. The PIKE Technologies Sampling Cards are inexpensive sample holders for analysis of lms, polymers, 13 mm KBr pellets and other materials. Self-adhesive treated sides make sample preparation easy. The cards also offer compact and convenient means of sample storage. A Dual Pellet Holder for 1, 3 and 7 mm KBr pellets is available. The holder features semi- circular mounts with slots accommodating specied size pellets as made using the PIKE Technologies Hand Press. The Single Pellet Holder for 7 mm KBr pellets is designed for use with the PIKE Technologies Hand Press. If you just make 7 mm pellets, this version is more convenient than the Dual Pellet Holder. Bolt Press and Gas Cell Holders three different sizes are available. Each holder has detachable support rods for different sized accessories. The holders can also be used for placing salt plates and other large samples. Press-On Demountable Cell Holders are used for the analysis of smears and mulls. Available in 25 mm and 38 mm versions, both include mounting plates and pressure cups. Windows and spacers must be ordered separately.
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Universal Sample Holder
Heavy-Duty Magnetic Film Holder
608-274-2721
Magnetic Film/Pellet Holder
Sampling Cards
162-5600 162-5610 162-5500 162-5300 162-5400 Dual Pellet Holder Single Pellet Holder 162-5410 161-5700 161-1018 161-2520 162-2105 162-2115 162-2205 162-2215 162-3600 162-3610 Bolt Press and Gas Cell Holders Press-On Demountable Cell Holders
Universal Sample Holder, 20 mm aperture* Universal Sample Holder, 10 mm aperture* Heavy-Duty Magnetic Film Holder Magnetic Film Holder for 13 mm pellets and lm samples Film Sampling Card 20 mm clear aperture, 10 each* Sample Card for 13 mm pellets (10 each)* Dual Pellet Holder* Single Pellet Holder Bolt Press Holder 25 mm x 100 mm Gas Cell Holder 25 mm x 50 mm Gas Cell Holder 38 mm x 100 mm Gas Cell Holder 38 mm x 50 mm Gas Cell Holder Press-On Demountable Cell Holders for 25 mm windows Press-On Demountable Cell Holders for 32 mm windows
All PIKE Technologies transmission holders are constructed of high quality materials and feature a 2" x 3" standard slide mount compatible with all FTIR spectrometers. The Universal Sample Holders feature a spring-loaded mechanism which conveniently keeps in place lms, salt plates, KBr pellets and other materials. The clear aperture of the holder are 20 mm and 10 mm. This universal holder offers great sample mounting exibility. Heavy-Duty Magnetic Film Holder is designed to hold thick polymer materials and other transmission samples. The holder features a large size magnet and steel plate with a 20 mm aperture.
Notes: For other options for Sample Holders, please contact PIKE Technologies. Cell holders marked * fit all standard 2" x 3" slide mounts, but due to their height may not allow for a complete sample compartment door closure on some smaller spectrometers. Please consult PIKE Technologies before placing an order.
Replacement Parts
162-5611 162-5612
25 mm O-Rings for Universal Sample Holder (6 each) 10 mm O-Rings for Universal Sample Holder (6 each)
Disks, Windows and Powders For Transmission FTIR Analysis of Solid and Liquid Samples
PIKE Technologies offer Premier Stock window and crystal materials a carefully selected range of IR transparent materials most often used by IR spectroscopists. They t PIKE accessories and cell holders available from other vendors. All windows, crystals and powders are made from the best quality material. The optical components are individually packaged and silica gel is included with those materials which are affected by humidity. The products highlighted in Red are in stock and available for immediate delivery. Please refer to the next pages for full range of IR optical materials, windows and crystals. Note, save on price and shipping cost by selecting 6 pack versions of popular crystals.
O R D E R I N G I N F O R M AT I O N Powders
Disks, 13 mm Diameter
1 mm Thickness
2 mm Thickness
160-8010
KBr Powder, 100 g
160-5003
13 x 1 mm KBr 13 x 1 mm NaCl
160-1148 160-1144 160-1197
20 x 2 mm BaF2 20 x 2 mm CaF2 20 x 2 mm CsI 20 x 2 mm Ge 20 x 2 mm KBr 20 x 2 mm KRS-5 20 x 2 mm NaCl 20 x 2 mm Polyethylene 20 x 2 mm SiO2 20 x 2 mm Si 20 x 2 mm ZnS 20 x 2 mm ZnSe
Chunks
160-5004
160-8015
KBr Chunks, 100 g
2 mm Thickness
160-1139 160-1134 160-1128 160-1169 160-5211 160-5119 160-1118 160-5118 160-1304
160-1301 160-1218 160-1213 160-1198 160-1191 160-1135 160-1008 160-1173 160-1170 160-1005 160-5201 160-1160 160-1241 160-1115 160-1001
13 x 2 mm AMTIR 13 x 2 mm BaF2 13 x 2 mm CaF2 13 x 2 mm CsI 13 x 2 mm Ge 13 x 2 mm KBr 13 x 2 mm KBr (6 pack) 13 x 2 mm KRS-5 13 x 2 mm NaCl 13 x 2 mm NaCl (6 pack) 13 x 2 mm SiO2 13 x 2 mm Si 13 x 2 mm ZnS 13 x 2 mm ZnSe 13 x 2 mm ZnSe (6 pack)
Note: The products highlighted in Red are in stock and available for immediate delivery.
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O R D E R I N G I N F O R M AT I O N Disks, 25 mm Diameter
2 mm Thickness
5 mm Thickness
Disks, 32 mm Diameter (continued)

3 mm Thickness
160-1201 160-1306 160-1212 160-1002 160-1308 160-1307 160-1305 160-1172 160-1168 160-1004 160-5213 160-5086 160-1117 160-5084
25 x 2 mm AMTIR 25 x 2 mm BaF2 25 x 2 mm CaF2 25 x 2 mm CaF2 (6 pack) 25 x 2 mm CsI 25 x 2 mm Ge 25 x 2 mm KBr 25 x 2 mm KRS-5 25 x 2 mm NaCl 25 x 2 mm NaCl (6 pack) 25 x 2 mm Polyethylene 25 x 2 mm SiO2 25 x 2 mm Si 25 x 2 mm ZnS 25 x 2 mm ZnSe 25 x 2 mm ZnSe (6 pack)
160-1311 160-1210 160-1316 160-1313 160-1189 160-1003 160-1312 160-1123 160-1011 160-5100 160-5090 160-1154
25 x 5 mm BaF2 25 x 5 mm CaF2 25 x 5 mm CsI 25 x 5 mm Ge 25 x 5 mm KBr 25 x 5 mm KBr (6 pack) 25 x 5 mm KRS-5 25 x 5 mm NaCl 25 x 5 mm NaCl (6 pack) 25 x 5 mm SiO2 25 x 5 mm ZnS 25 x 5 mm ZnSe
160-1121 160-1014 160-5216 160-5215 160-5049 160-5052 160-1159 160-1158 160-5047 160-5048 160-1113 160-1112
32 x 3 mm NaCl, drilled 32 x 3 mm NaCl, drilled (6 pack) 32 x 3 mm Polyethylene 32 x 3 mm Polyethylene, drilled 32 x 3 mm SiO2 32 x 3 mm SiO2, drilled 32 x 3 mm Si 32 x 3 mm Si, drilled 32 x 3 mm ZnS 32 x 3 mm ZnS, drilled 32 x 3 mm ZnSe 32 x 3 mm ZnSe, drilled
3 mm Thickness
3 mm Thickness
608-274-2721
160-1155 160-1007
160-1200
32 x 3 mm AMTIR 32 x 3 mm AMTIR, drilled 32 x 3 mm BaF2 32 x 3 mm BaF2, drilled 32 x 3 mm CaF2 32 x 3 mm CaF2, drilled 32 x 3 mm CsI 32 x 3 mm CsI, drilled 32 x 3 mm Ge 32 x 3 mm Ge, drilled 32 x 3 mm KBr 32 x 3 mm KBr (6 pack) 32 x 3 mm KBr, drilled 32 x 3 mm KBr, drilled (6 pack) 32 x 3 mm KRS-5 32 x 3 mm KRS-5, drilled 32 x 3 mm NaCl 32 x 3 mm NaCl (6 pack)
4 mm Thickness
160-1349 160-1350 160-5220 160-1344 160-5218 160-1233 160-1353 160-1315 160-5025
38 x 3 mm BaF2 38 x 3 mm Ge 38 x 3 mm KBr 38 x 3 mm KRS-5 38 x 3 mm Polyethylene 38 x 3 mm SiO2 38 x 3 mm Si 38 x 3 mm ZnS 38 x 3 mm ZnSe
160-1199 160-1147 160-1146 160-1143 160-1142 160-1195 160-1194 160-1137 160-1136 160-1132 160-1010 160-1131 160-1015 160-1126 160-1125 160-1122 160-1013
160-1217 160-1211 160-1196 160-1138 160-1133 160-1009 160-1127 160-1124 160-1012 160-5214 160-5089 160-1116 160-5087 160-1114
25 x 4 mm BaF2 25 x 4 mm CaF2 25 x 4 mm CsI 25 x 4 mm Ge 25 x 4 mm KBr 25 x 4 mm KBr (6 pack) 25 x 4 mm KRS-5 25 x 4 mm NaCl 25 x 4 mm NaCl (6 pack) 25 x 4 mm Polyethylene 25 x 4 mm SiO2 25 x 4 mm Si 25 x 4 mm ZnS 25 x 4 mm ZnSe
6 mm Thickness
160-1357 160-1322 160-1342 160-1326 160-1323 160-1320 160-1343 160-1321 160-5219 160-1355 160-1324 160-1329
38 x 6 mm AMTIR 38 x 6 mm BaF2 38 x 6 mm CaF2 38 x 6 mm CsI 38 x 6 mm Ge 38 x 6 mm KBr 38 x 6 mm KRS-5 38 x 6 mm NaCl 38 x 6 mm Polyethylene 38 x 6 mm SiO2 38 x 6 mm Si 38 x 6 mm ZnSe
O R D E R I N G I N F O R M AT I O N Disks, 41 mm Diameter
3 mm Thickness
Windows, 29 mm x 14 mm
4 mm Thickness
3 mm Thickness
160-1216 160-1209 160-1188 160-1167 160-5217 160-5157 160-1341
41 x 3 mm BaF2 41 x 3 mm CaF2 41 x 3 mm KBr 41 x 3 mm NaCl 41 x 3 mm Polyethylene 41 x 3 mm ZnS 41 x 3 mm ZnSe
160-1215 160-5010 160-1207 160-5011 160-5007 160-5012 160-1185 160-1184
29 x 14 x 4 mm BaF2 29 x 14 x 4 mm BaF2, drilled 29 x 14 x 4 mm CaF2 29 x 14 x 4 mm CaF2, drilled 29 x 14 x 4 mm Ge 29 x 14 x 4 mm Ge, drilled 29 x 14 x 4 mm KBr 29 x 14 x 4 mm KBr, drilled 29 x 14 x 4 mm KRS-5 29 x 14 x 4 mm KRS-5, drilled 29 x 14 x 4 mm NaCl 29 x 14 x 4 mm NaCl, drilled
160-1277 160-1279 160-1111 160-1280
41 x 23 x 3 mm ZnS 41 x 23 x 3 mm ZnS, drilled 41 x 23 x 3 mm ZnSe 41 x 23 x 3 mm ZnSe, drilled
6 mm Thickness
160-5146 160-5152 160-5147 160-5153 160-1183 160-1182 160-1120
41 x 23 x 6 mm BaF2 41 x 23 x 6 mm BaF2, drilled 41 x 23 x 6 mm CaF2 41 x 23 x 6 mm CaF2, drilled 41 x 23 x 6 mm KBr 41 x 23 x 6 mm KBr, drilled 41 x 23 x 6 mm NaCl 41 x 23 x 6 mm NaCl, drilled
3 mm Thickness
160-5009 160-5014 160-1164 160-1163
160-5161 160-1153
49 x 3 mm ZnS 49 x 3 mm ZnSe
6 mm Thickness
2 mm Thickness
160-1119
Notes: For disk and window sizes other than shown here, please contact PIKE Technologies.
160-5027 160-5206 160-5029 160-1187 160-5205 160-1166 160-5164
49 x 6 mm BaF2 49 x 6 mm CaF2 49 x 6 mm CsI 49 x 6 mm KBr 49 x 6 mm KRS-5 49 x 6 mm NaCl 49 x 6 mm SiO2
160-1269 160-1270 160-1157 160-1156 160-1275 160-1276 160-1151
38 x 19 x 2 mm AMTIR 38 x 19 x 2 mm AMTIR, drilled 38 x 19 x 2 mm Si 38 x 19 x 2 mm Si, drilled 38 x 19 x 2 mm ZnS 38 x 19 x 2 mm ZnS, drilled 38 x 19 x 2 mm ZnSe 38 x 19 x 2 mm ZnSe, drilled
3 mm Thickness
160-1150
4 mm Thickness
160-5030 160-1208 160-5173 160-1186 160-1171 160-1165 160-5177 160-1152
50 x 3 mm BaF2 50 x 3 mm CaF2 50 x 3 mm CsI 50 x 3 mm KBr 50 x 3 mm KRS-5 50 x 3 mm NaCl 50 x 3 mm ZnS 50 x 3 mm ZnSe
160-1214 160-1145 160-1141 160-1140 160-1193 160-1192 160-1190 160-5032 160-1130 160-1129 160-5031 160-5016 160-1162 160-1006 160-1161 160-1292 160-1293
38 x 19 x 4 mm BaF2 38 x 19 x 4 mm BaF2, drilled 38 x 19 x 4 mm CaF2 38 x 19 x 4 mm CaF2, drilled 38 x 19 x 4 mm CsI 38 x 19 x 4 mm CsI, drilled 38 x 19 x 4 mm Ge 38 x 19 x 4 mm Ge, drilled 38 x 19 x 4 mm KBr 38 x 19 x 4 mm KBr, drilled 38 x 19 x 4 mm KRS-5 38 x 19 x 4 mm KRS-5, drilled 38 x 19 x 4 mm NaCl 38 x 19 x 4 mm NaCl (6 pack) 38 x 19 x 4 mm NaCl, drilled 38 x 19 x 4 mm SiO2 38 x 19 x 4 mm SiO2, drilled
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Crystal Polishing Kit Extending the Life of IR Transparent Windows

Scratched and fogged windows diminish the quality of transmission FTIR spectra. Their continuous replacement can be impractical and quite expensive. A number of standard infrared windows can be quickly restored to perfect condition with the Pike Technologies Crystal Polishing Kit. The Kit includes all the necessary components to re-polish KBr, NaCl and CsI windows quickly and effectively. Note: We do not recommend polishing KRS-5 windows without exceptional safety precautions and for this reason do not include materials for polishing KRS-5 windows.
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F E AT U R E S O F T H E C RY S TA L P O L I S H I N G K I T
162-4000
Complete kit for polishing IR transparent windows Reduces cost of transmission analysis by extending KBr,
NaCl and CsI window lifetime
PART NUMBER
Crystal Polishing Kit Includes: Wooden base, glass plates, polishing pads, brushes and Polishing Compounds
Crystal Polishing Kit Replacement Parts

DESCRIPTION
608-274-2721
162-4010 162-4011 162-4015 162-4012 162-4013 162-4014
Glass Plate Polishing Pads (6 each) Brushes (6 each) Grinding Compound (400 grit) Grinding Compound (600 grit) Polishing Compound
Notes: For other options for window polishing, please contact PIKE Technologies.
Short Path Gas Cells For Samples with Higher Vapor Phase Concentration
Short Path HT Cell PIKE Technologies offers several choices for analysis of gas samples with component concentrations generally above 1% by weight. Our Short-Path HT Gas Cells provide high throughput by virtue of their greater inside diameter providing more energy at the FTIR detector. The Short Path HT Gas Cells also include glass stopcocks for ow input of the gas sample and sealing. The PIKE Technologies Short-Path EC Gas Cells are recommended for use with occasional gas sampling and offer an economical choice with standard septum-styled sealing of the vapor phase sample. Both our Short Path HT and EC Gas Cells are available in 50 mm and 100 mm versions. The complete gas cell requires your selection of the appropriate IR transparent windows. Both HT and EC Gas Cells are slide mount accessories, compatible with all FTIR spectrometers.
Short Path EC Gas Cell
F E AT U R E S O F T H E S H O RT PAT H G A S C E L LS
Gas cells for measuring higher vapor phase concentration High throughput and economy versions 100 mm and 50 mm pathlength versions Fits all FTIR spectrometers
Short-Path Gas Cell
Short-Path Gas Cell Replacement Parts

DESCRIPTION HT GAS CELL PART NUMBER EC GAS CELL
162-2200 162-2250 162-2100 162-2150
Short-Path HT Gas Cell, 100 mm pathlength Short-Path HT Gas Cell, 50 mm pathlength Short-Path EC Gas Cell, 100 mm pathlength Short-Path EC Gas Cell, 50 mm pathlength
Viton O-Rings (2 each) Cell Window Cap Gas Cell Holder Glass Body for 100 mm Cell Glass Body for 50 mm Cell Septa (12 each)
162-2209 162-2202 162-2205 162-2201 162-2255 NA
162-2109 162-2102 162-2105 162-2101 162-2155 162-2106
Notes: The Short-Path Gas Cells include the glass body, o-rings and cell holder. The HT Gas Cells require selection of 38 mm x 6 mm windows. The EC Gas Cells require selection of 25 mm x 4 mm windows.
Short-Path Gas Cell Windows (must select minimum of 2)

DESCRIPTION 38 X 6 MM PART NUMBER 25 X 4 MM
Notes: For options not shown here, please contact PIKE Technologies.
BaF2 CaF2 KBr NaCl ZnSe
160-1322 160-1342 160-1320 160-1321 160-1329
160-1217 160-1211 160-1133 160-1124 160-1114
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Heated Gas Flow Cell For Streaming Gas Analysis

The PIKE Technologies Heated Gas Flow Cell is recommended for high-performance FTIR sampling of owing gas samples. The beam-conforming design of the Heated Gas Flow Cell provides for minimum cell volume (38.5 mL) and a 100 mm pathlength, compatible with most FTIR spectrometers. This beam-conforming design also provides maximum IR throughput with no vignette of the IR beam. The gas cell may be heated up to 300 C to prevent condensation of higher molecular weight gas species. The PIKE Technologies Heated Gas Flow Cell includes standard Swageloc ttings for connection to 1/8" tubing and its stainless steel composition is compatible with pressurized applications up to 100 psi. Temperature control is provided by either digital or digital PC controllers from PIKE Technologies. Complete specication of the Heated Gas Flow Cell requires selection of your choice of IR transparent windows 38 mm x 6 mm.
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F E AT U R E S O F T H E H E AT E D G A S F LOW C E L L
High IR throughput, minimum cell volume ideal for preserving

owing gas composition
Temperature control to 300 C Your choice of IR transparent windows user changeable Compatible with most FTIR spectrometers
608-274-2721
H E AT E D G A S F L O W C E L L S P E C I F I C AT I O N S Temperature Range Accuracy Voltage Sensor Type Controllers Input Voltage Output Voltage 110/220 V, switchable 10 A/24 VAC Ambient to 300 C +/- 0.5% 24 VAC 3 wire Pt RTD (low drift, high stability) Optical geometry for PIKE Technologies Heated Gas Flow Cell
Heated Gas Flow Cell
IR Transparent Windows for Heated Gas Flow Cell (select minimum of 2)

DESCRIPTION 38 X 6 MM PART NUMBER
162-20XX
Heated Gas Flow Cell Includes: Cell, Viton O-Rings, and FTIR mounting plate
BaF2 KBr KRS-5 ZnSe
160-1322 160-1320 160-1343 160-1329
Notes: Please select the XX code for your FTIR found on the fold out on the last page of this catalog.
Temperature Controllers (must select one)

076-1410 076-1210
Digital Temperature Control Module, PC Control Digital Temperature Control Module
Heated Gas Flow Cell Replacement Parts

Notes: Digital Temperature Control Module, PC Control includes PIKE TempPRO software.
162-2009 162-2309
Viton O-Rings, (2 each), max temp. 200 C High Temperature O-Rings, (1 each), max temp. 325 C
Notes: For other options for the Heated Gas Flow Cell, please contact PIKE Technologies. Gas Cell requires 4 O-rings.
Long-Path Gas Cells For Measurement of Low Concentration Vapor Components

Long-Path Gas Cells PIKE Technologies offers several Long-Path Gas Cells for analysis of trace components in gas samples typical concentrations may range from the percent to ppb levels. The long-path cells feature a folded path design providing an extended pathlength within a compact dimension. The FTIR beam enters the cell through an IR transparent window and reects a number of times between the accessory mirrors before exiting to the detector. The number of reections is determined by the optical conguration of the cell and may be selected as a permanently aligned version or adjustable by the user (variable path cells). Typical applications of the long-path gas cells include air pollution studies, gas purity determinations, monitoring of industrial processes, exhaust gas analysis and many others. All long-path gas cells offered by PIKE Technologies are manufactured by Infrared Analysis, Inc., pioneers in the development of gas analysis technology. Permanently aligned long-path gas cells. All cell assemblies include a heavy wall borosilicate glass tube mounted on a corrosionresistant anodized aluminum base. The base includes spectrometerspecic transfer optics allowing placement of the accessory in the sample compartment of the FTIR. Infrared transparent windows serve as beam entry and exit ports (windows are easily replaceable and different window materials are available). The top of the cell is enclosed by the valve/gauge assembly with all the valves made of stainless steel. The accessory mirrors are mounted permanently with chemically inert cement at the bottom of the cell and the facing part of the top enclosure. The gold coated mirrors have protected surfaces and the gas cells can be cleaned with detergent and water without loss of cell throughput or alignment. Variable-Path gas cells. The construction and main components of the variable-path gas cells are identical with those described above, with an exception of the internal mirror assembly. The cell has two adjustable mirrors located at the top of the enclosure (controlled with a calibrated dial) and one stationary mirror cemented to the cell base. Adjustments to mirror positions allow selection of different pathlengths supported by the cell. Some gas measurement applications require temperature control for higher precision or to prevent condensation of specic components. PIKE Technologies offer heated versions of our xed and variable path gas cells.
2.4 Meter Gas Cell
F E AT U R E S O F T H E LO N G - PAT H G A S C E L LS
Base Path Body Material Optics Coatings Window Material Window Dimension # Window Cell Volume
2.4 m Fixed 5" Glass Gold KCI
1-16 m Variable 10" Glass Gold KCI

25 x 4 mm
Long-path gas cells for measurements of vapor species to

ppb levels
Fixed and variable pathlength versions Heated versions available For most FTIR spectrometers
37.5 x 4 mm 25 x 4 mm
25 x 4 mm 25 x 4 mm
1 0.1 liter
2 2.3 liter
2 8.5 liter
2 8.5 liter
2 2.3 liter
Specications for Long-Path Gas Cells from PIKE Technologies
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Long-Path Gas Cells (select one or more)
Replacement Windows for Long-Path Gas Cells

DESCRIPTION 25 X 4 MM PART NUMBER 37.5 X 4 MM
162-2510 162-26XX 162-28XX 162-29XX 162-31XX
2.4 Meter Long-Path Gas Cell 10.0 Meter Long-Path Gas Cell 22.0 Meter Long-Path Gas Cell 33.0 Meter Long-Path Gas Cell 1-16 Meter Variable Long-Path Gas Cell
BaF2 CaF2 KBr KCl KRS-5 NaCl ZnSe
160-1217 160-1211 160-1133 160-1289 160-1127 160-1124 160-1114
160-1287 160-1288 160-1178 160-1290 160-1291
Notes: The Long-Path Gas cells include windows as specied in the table on page 101. Please select the baseplate mount for your FTIR spectrometer model. Additional window materials can be ordered from the table in the next column.
Heated Long-Path Gas Cells (select one or more)

162-2504 162-32XX 162-33XX 162-34XX 162-35XX
Heated 2.4 Meter Long-Path Gas Cell Heated 10.0 Meter Long-Path Gas Cell Heated 22.0 Meter Long-Path Gas Cell Heated 33.0 Meter Long-Path Gas Cell Heated 1-16 Meter Variable Long-Path Gas Cell
Replacement Parts for Long-Path Gas Cells

162-2511 162-2601 162-2801 162-2509 162-2505 162-3700 162-3800 162-3900
O-Rings and Gaskets for 2.4 Meter Gas Cell O-Rings and Gaskets for 10 Meter and 16V Gas Cells O-Rings and Gaskets for 22 Meter and 33 Meter Gas Cells Digital Temperature Controller for Heated Long-Path Gas Cells Heating Jacket for 2.4 Meter Long-Path Gas Cell Heating Jacket for 10.0 Meter Long-Path Gas Cell Heating Jacket for 22.0 and 33.0 Meter Long-Path Gas Cell Heating Jacket for 1-16 Meter Variable Long-Path Gas Cell
Notes: The Heated Long-Path Gas cells include windows as specied in the table on page 101. Please select the baseplate mount for your FTIR spectrometer model. Additional window materials can be ordered from the table in the next column. The Heated Long-Path Gas Cells include a digital temperature controller and heating jacket. The Heated Long-Path Gas Cells may be heated to 200 C.
608-274-2721
H E AT E D L O N G P AT H G A S C E L L S S P E C I F I C AT I O N S Temperature Range Accuracy Voltage Sensor Type Controllers Digital Input Voltage Output Voltage +/- 0.1 C 115 or 230 V, specify 115 or 230 VAC/10A, specify Ambient to 200 C +/- 0.5% 115 or 230 VAC K type
Transmission Sampling Techniques Theory and Applications

FTIR sampling by transmission is a very popular method for collection of infrared spectra. Its use is easy to explain the methods are intuitive and do not require sophisticated sampling accessories. In many cases, the sample can be placed directly into the path of the infrared beam (with the help of sample holder) and scanned. Further benets of transmission sampling techniques include compatibility with automated sampling and microsampling techniques such as IR Microscopy. Transmission techniques are well documented and have been successfully used for many years. A large number of spectral libraries contain transmission spectra and are often used as references for the purpose of qualitative analysis. Transmission techniques offer many advantages and should be used whenever possible, unless reliable sample preparation becomes too difcult, too time consuming or impossible. Transmission is also widely used for quantitative applications, as signicant numbers of basic measurements adhere to the Beer-Lambert law. The law provides a mathematical relationship between the infrared radiation absorbed by the sample and the sample concentration: A=abc Where: A = absorbance a = absorptivity b = pathlength c = sample concentration The Beer-Lambert law states that absorbance is linearly proportional to sample concentration (with sample pathlength and absorptivity constant). The actual measurements are generated in percent transmittance (which is not a linear function of concentration), however, they can be converted in real time to absorbance by all modern FTIR instrumentation. As mentioned before, transmission measurements are intuitive and simple. However, the majority of samples are too thick to be measured directly and they have to be processed in some way before meaningful data can be collected. Some of the sample preparation techniques are time consuming and can be destructive. Liquids and pastes are generally the easiest samples to run. A large number of liquid cells and windows are available for liquid measurements. Solid samples (with the exception of thin lms) require sample preparation making a pellet (typically potassium bromide KBr) or a mull. Gas samples require a suitable gas cell with a pathlength sufcient to detect the desired component.
Sample Preparation and Analysis

Liquids
Most liquids and dissolved solids are easy to measure by transmission. Viscous liquids or pastes can be simply pressed between 2 IR transparent windows and measured by FTIR.
FTIR Spectrum of 1 drop of Extra Virgin Olive Oil pressed between 25 mm KBr windows and held in the IR beam using the PIKE Universal Sample Holder.
Thin liquids or samples in solvent may be best run by using a demountable liquid cell or a sealed cell, consisting of two windows with a precision spacer in-between. One of the windows has two drilled holes for the introduction and evacuation of the sample. A large number of cell options are available these include permanently sealed cells and demountable cells with different window materials and a wide selection of spacers. The pathlength of liquid cells can be easily measured with your FTIR spectrometer. Just place the empty cell into the FTIR and collect its spectrum. The frequency of the sine wave spectrum (produced by back reection within the cell) provides the pathlength using the following equation; P = (10 N) / (2 cm-1) Where: P = pathlength of cell in mm N = number of fringes within cm-1 cm-1 = wavenumber range of fringe count It is very important to select compatible IR transparent windows for your liquid samples. Please refer to the chart on the last page of this note to select your windows. If you still have questions, please call us.
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Solids
The easiest to analyze are lm and polymer samples less than 200 micrometers thick (ideal thickness for the major component of a polymer lm is about 20 microns). These samples can be simply placed into a sample holder and immediately scanned.
However, the majority of solid materials must be prepared before their infrared spectra can be collected. In many cases sample preparation involves grinding of the sample and mixing it with an IR transparent material such as KBr and then pressing a pellet. While this method of solids analysis is time consuming, it produces an excellent result.
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Polymer Film from Product Packaging Material held in place with the PIKE Universal Sample Holder. Polymer is identied as Atactic Polypropylene and the lm is determined to be 27.1 microns thick.
FTIR Spectrum of Caffeine prepared as a 13 mm KBr Pellet and held in position with the PIKE Sampling Card.
The thickness of the polymer lm can be calculated from the fringe pattern in the spectrum using the following equation; T = (10000 N) / (2 n cm-1) Where: T = thickness of polymer lm in microns N = number of fringes within cm-1 cm-1 = wavenumber range of fringe count n = refractive index of polymer The same procedure can be used for samples which can be sliced and pressed to an appropriate thickness especially for IR microsampling. For IR microsampling, one can place a small sliced sample into a sample compression cell and apply pressure to hold the sample and to thin it to a useable thickness as shown in the following spectral data.
Solid Sample Preparation Tips

The best method for preparation of solid samples involves mixing the sample (about 5% by weight) with an IR transparent material (typically KBr) and pressing a pellet. The mixing is best done with the ShakIR accessory which produces a fully mixed and pulverized sample in about 30 seconds. The mixing can also be done with a mortar and pestle but not as well. Generation of a pellet involves pressing the prepared mixture with a hydraulic or hand press into a hard disk. The pellet, ideally 0.5 to 1 mm thick is then placed in a transmission holder and scanned. Typically, the pellet technique provides good quality spectra with a wide spectral range and no interfering absorbance bands. Samples which do not grind well and/or are affected by solvents and mulling agents can be analyzed with high pressure techniques. Typical samples include bers and paint chips. The accessory used for such applications utilizes two diamond anvils. Difcult samples are placed between the diamonds and crushed, compressed and attened to the thickness necessary to obtain good quality FTIR spectra. Diamond cells are transparent to IR radiation except in the region of 2400 cm-1 to 1700 cm-1. The high pressure diamond cells require the use of a beam condenser or an infrared microscope.
608-274-2721
Micro Spectrum of a Layered Polymer using a PIKE MAX IR Microscope and Compression Cell with KBr windows. FTIR Spectrum of Methanol Vapor measured with the PIKE 100 mm gas cell using 0.50 cm-1 spectral resolution.
An alternate method for analysis of solid materials involves making a mull. Mulls are sample suspensions in Nujol (rened mineral oil) or Fluorolube (peruorohydrocarbon). The process is based upon mixing 1 to 2 drops of the mulling agent with a ground sample until a uniform paste is formed. The paste is transferred onto a KBr or other IR transparent disk, placed in the sample compartment of the spectrometer and scanned. The advantage of this technique is that it is a relatively quick and simple procedure; disadvantages include interference from mulling agent absorption bands. (Both Nujol and Fluorolube have characteristic spectral features and in most cases have to be used as a pair in order to generate a complete mid IR spectrum. Nujol is used below 1330 cm-1, Fluorolube above 1330 cm-1).
Simple demountable cells (50 mm to 100 mm) are recommended for samples in a 1 10% by weight concentration range. For highly dilute samples (ppm to ppb concentrations), longpath cells are required. The long-path cell reects the IR beam several times through the sample using a set of mirrors positioned on the opposite ends of the cell, producing a pathlength to 10 to 30 meters or more. It is important to select window materials compatible with the investigated sample. Gas sampling accessories can be tted with different windows to accommodate the physical and chemical characteristics of the measured gas. Special designs for high pressure and temperature controlled experiments are also available.
Summary
Transmission sampling by FTIR provides an excellent means for sample identication and quantication of sample components. Most samples measured by transmission techniques require some sample preparation, however, the quality of the results and amenability to automation and microsampling offer signicant advantages.
Gases
Analysis of gas samples is a unique form of transmission sampling by FTIR as the identied sample does not need to be of pure composition. At high spectral resolution, most gas mixtures can be identied and quantied since absorbance bands can be selected within the spectrum, which are resolved and distinct from other components within the sample.
Properties of Select Infrared Transmitting Materials For Transmission Spectroscopy

Material AMTIR BaF2 CaF2 CsI Diamond Ge KBr KRS-5 NaCl Polyethylene SiO2 Si ZnS ZnSe Comments GeAsSe glass, brittle Barium Fluoride Calcium Fluoride Cesium Iodide, very hygroscopic, Somewhat Toxic Type IIa, strong IR absorbance between 2700-1800 cm-1, costly Germanium, brittle, becomes opaque at elevated temperatures Potassium Bromide, most widely used for mid-IR applications Thallium Bromide/Thallium Iodide, Extremely Toxic! Sodium Chloride For Far-IR, swells with some organic solvents Silicon Dioxide Silicon, strong IR absorbance between 624-590 cm-1 Zinc Sulde Zinc Selenide SWL cm-1 11000 66600 79500 42000 30000 5500 48800 17900 52600 625 50000 8900 17000 15000 LWL cm-1 593 691 896 172 <2 432 345 204 457 <4 2315 624, 30 690 461 RI 2.50 1.45 1.40 1.73 2.40 4.00 1.52 2.37 1.49 1.52 1.53 3.41 2.20 2.40 Solubility g/100 g 0.00 0.17 0.0017 44 0.00 0.00 53 0.05 36 0.00 0.00 0.00 0.00 0.00 460 1150 240 120 Hardness kg/mm2 170 82 158 20 5700 780 6 40 18 MP C 370 1280 1360 621 550 ash point 936 730 414 801 110 1713 1420 1830 1526 pH Range 19 58 58 NA 1 14 1 14 NA 58 NA 1.5 14 1 14 1 12 59 59
Notes: The above table is meant to be a general guide brief and concise. For more information about these materials, consult appropriate reference books and Material Safety Data Sheets (MSDS).
SWL Shortest wavelength for transmission, 1 mm, 50% transmission LWL Longest wavelength for transmission, 1 mm, 50% transmission RI Refractive Index, at relevant wavelength MP Melting point
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Special Applications
PIKE Technologies offers several FTIR accessories specially designed for use in a dedicated sampling environment. Our semiconductor sampling accessories highlight our dedication to providing tools to ease and streamline FTIR sampling technology. If you have special sampling needs not shown in our catalog, please contact us we may be able to help.
Page 108
Vertical Wafer Accessory For Analysis of Semiconductor Wafers
Page 109
MappIR For Fully Automated Analysis of 200 mm Semiconductor Wafers
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MAP300 For Fully Automated Analysis of 300 mm Semiconductor Wafers
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TGA/FTIR Accessory Identication and Qualication of Evolved Gases from Thermogravimetric Analyzer
Page 113
External Sample Module Auxiliary Sample Compartment for Added Flexibility and Custom Applications
Page 114
Semiconductor Applications FTIR Sampling Techniques Overview
Vertical Wafer Accessory For Analysis of Semiconductor Wafers

PIKE Technologies offers the Vertical Wafer Accessory for analysis of semiconductor wafers. The Vertical Wafer Accessory is an in-compartment tool for transmission analysis of semiconductor wafers for Carbon, Oxygen and BPSG. The accessory accommodates wafers up to 6 inches (150 mm) in diameter. Wafers are located in a demountable ring. Dimensional tolerances conform to SEMI standards. Delrin (hard polymer) mounting clips eliminate contact between the wafer and metal surfaces during the analysis. The clip mechanism facilitates convenient and repeatable wafer placement. The wafer support ring may be rotated through 360 and translated laterally through a distance of over 3" (75 mm) to produce an R-theta motion covering the entire surface of the wafer. The ring may be rotated and translated manually or automatically under stepper motor control using PIKE Technologies AutoPRO software. A scale is provided for each motion, providing verication of sample position. The automated system incorporates two precision stepper motors for rotation and translation of the plate. The motors are driven by the Motion Control Unit connected to a PC. The operation is managed by PIKE AutoPRO software which provides full user programmability and an easy to learn point-and-click environment. Polar or Cartesian (X, Y) coordinates may also be used to dene test points. The AutoPRO software is written in Visual BASIC and allows complex test sequences to be setup, stored as methods and implemented with full exibility. The Motion Control Unit features a smart power supply and operates at 85-265 VAC, 47-63 Hz. The PIKE Technologies Vertical Wafer Accessory requires minimum 3.5" beam height FTIR spectrometers. Please contact us for more product details.
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F E AT U R E S O F T H E V E R T I C A L W A F E R A C C E S S O RY
Transmission analysis of semiconductor wafers for Carbon,

Oxygen and BPSG
Manual and/or fully-automated operation R-theta (rotation/translation) motion control providing

complete wafer analysis
608-274-2721
Contamination-free wafer mount 6", 5", 4", 3" and 2" wafer sizes and custom mounts
and blanks
Vertical Wafer Accessory
073-16XX 073-26XX
Vertical Wafer Accessory, Manual Version Includes mount for your FTIR Vertical Wafer Accessory, Automated Version Includes the Motion Control Unit and AutoPRO software
Notes: Please insert FTIR XX code found on the fold-out on the last page of this catalog. Requires 3.5" beam height or greater in FTIR.
Options for Vertical Wafer Accessory

073-3600 073-3660 073-3650 073-3640 073-3630 073-3620
6" Wafer Mount, Blank Additional Wafer Mount Insert to Support 5" Wafer Insert to Support 4" Wafer Insert to Support 3" Wafer Insert to Support 2" Wafer
Notes: For options not describe here, please contact PIKE Technologies.
MappIR and MAP300 For Automated Analysis of Semiconductor Wafers

PIKE Technologies MappIR Accessory PIKE Technologies offers fully automated accessories for the analysis of semiconductor wafers. Our MappIR and MAP300 accessories provide for analysis of EPI, BPSG, Oxygen and Carbon in wafer sizes ranging from 2 to 12 inches (50 to 300 mm). The MappIR and MAP300 have been developed to provide the semiconductor industry with reasonably priced, automated tools for research and quality control of silicon wafers. The MappIR was developed for the analysis of 8 inch (200 mm) and smaller semiconductor wafers. The MAP300 is a larger version of this original design and it is capable of handling the newer 12 inch (300 mm) wafer formats. The operation, electronics and software are identical for both systems. The MappIR and MAP300 accessories mount in the sample compartment of the FTIR spectrometer. Semiconductor wafers are held in place by spring-loaded Delrin retaining clips and are never in contact with the aluminum stage of the accessory. A standard size slot for a vacuum or mechanical wand is provided for ease of wafer handling. Individual wafers are rotated and/or translated by stepper motors in a sequence pre-programmed by the system operator. A sample purge box is optional. To minimize interferences of water vapor and carbon dioxide with infrared measurements, the optical path of the accessories are equipped with purging lines and can be purged with dry air or nitrogen. The accessories are controlled by AutoPRO software which provides a simple user interface for multiple point wafer analysis (mapping). Up to 320 points with 8 mm beam and 5 mm edge exclusion can be measured on a 12 inch wafer. The software provides ample exibility in setting up various experiments. The following are advantages of the AutoPRO package: Graphical and intelligent user interface for setting-up mapping patterns Selection of wafer size, IR beam diameter, and edge exclusion Operator selectable or pre-dened multiple point maps Polar and/or Cartesian coordinates options Real-time display of the experiment status Ability to save and recall various experimental patterns Flexible, COM enabled interface KLA and CSV le importer
SPECIAL APPLICATIONS
PIKE Technologies MAP300 Accessory
F E AT U R E S O F M A P P I R A N D M A P 3 0 0
Complete hardware and software package for automated,

multi-position measurements and mapping of semiconductor wafers
8 inch (200 mm) and 12 inch (300 mm) semiconductor wafer

handling. Optional inserts for wafer sizes from 2 to 12 inches
EPI, BPSG, Oxygen and Carbon determination Specular reectance and transmission sampling standard Purgeable accessory for removal of atmospheric interferences
Data collection and processing is provided by the spectrometer software. A number of FTIR manufacturers offer dedicated packages which fully integrate the accessory with the spectrometer. If such an option is not available, AutoPRO can be controlled by the spectrometers program via macros. AutoPRO is Windows compliant and when run separately, it allows conguration, programming and control of the accessory. The automated wafer testing systems are compatible with most commercial FTIR spectrometers and software packages.
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MappIR and MAP300 Automated Semiconductor Wafer Accessories
Options for the MappIR and MAP300 Accessories

016-28XX
MappIR Automated Semiconductor Wafer Accessory for 8" Wafers Includes: Wafer mount, Motion Control Unit, AutoPRO software and mount for your FTIR. MAP300 Automated Semiconductor Wafer Accessory for 12" Wafers Includes: Wafer mount, Motion Control Unit, AutoPRO software and mount for your FTIR. Insert to support 8" wafers is also included.
073-3880 073-3800 017-3912 017-3980 073-3860 073-3850 073-3840 073-3830 073-3820
Additional 8" Wafer Mount (MappIR only) Blank Support for custom wafers (MappIR only) Additional 12" Wafer Mount (MAP300 only) Insert to Support 8" Wafer (MAP300 only) Insert to Support 6" Wafer Insert to Support 5" Wafer Insert to Support 4" Wafer Insert to Support 3" Wafer Insert to Support 2" Wafer
017-28XX
Notes: Please insert FTIR XX code found on the fold-out on the last page of this catalog.
Notes: For options not described here, please contact PIKE Technologies.
2" 3" 4" 5" 6"
608-274-2721
8"
12"
MAP300
MappIR
TGA/FTIR Accessory Identication and Quantication of Evolved Gases from Thermogravimetric Analyzer
The PIKE Technologies TGA/FTIR Accessory is designed to be an interface for evolved gas analysis from a thermogravimetric analyzer (TGA) to your FTIR spectrometer. Evolved gases from the TGA pass through a heated transfer line into the beam conforming ow cell in the FTIR sample compartment. As these evolved gases travel through the ow cell, FTIR spectra are collected and stored for further processing. Qualitative and quantitative measurements are doable from sample masses typically in the low milligram range. The PIKE TGA/FTIR Accessory is compatible with most FTIR spectrometers and most TGA instruments.
F E AT U R E S O F T H E TG A / F T I R AC C E S S O RY
IR beam conforming ow cell design maximizes IR

throughput
100 mm IR beam pathlength for maximized FTIR sensitivity Baseplate mounted in your FTIR for exible sampling Temperature control settable up to 300 C for ow cell
and transfer line
User changeable IR transparent windows to minimize cost

of operation
Heated, glass lined stainless steel transfer line for inert

transfer of TGA efuent
TGA/FTIR Data for Cured Rubber Sample. Upper trace is the Gram-Schmidt Reconstruct of the TGA evolved gases. Lower trace is a carbonyl reconstruction and a FTIR spectrum from this data set.
Purge tubes provide stable purge environment for the

FTIR system
During the TGA analysis sample mass is lost through a combination of volatilization and degradation of the sample material. The heated TGA/FTIR system maintains the vapor state of the evolved gases throughout the FTIR analysis. The FTIR spectrometer is set to collect spectra at 10 second intervals during the evolved gas analysis using the kinetics software package for your FTIR. With this software you can generate reconstructions of total IR response vs. time or temperature (Gram-Schmidt) or specic IR band reconstructions to isolate points of unique component evolutions. FTIR spectra are extracted from the data set and an identication is made by comparing these unknown spectra to vapor phase spectral libraries.
IR Beam Conforming Optical Design of PIKE Technologies TGA/FTIR Accessory
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TGA/FTIR Accessory Flow Cell
TGA/FTIR Accessory Temperature Controllers (must select one)

162-24XX
TGA/FTIR Accessory Flow Cell
076-1120 076-1130
Dual Digital Temperature Control Module 4 Zone Digital Temperature Control Module for Shimadzu TGA
Notes: Please see the FTIR instrument code sheet. TGA/FTIR Accessory includes mount for your FTIR, exhaust line and purge tubes. Complete accessory requires selection of IR transparent windows, heated transfer line and temperature controller. The TGA/FTIR accessory requires installation by a trained service representative please consult with your FTIR manufacturer.
Notes: These temperature controllers provide setting for the heated gas cell and the heated transfer line.
IR Transparent Windows for TGA/FTIR Accessory (must select 2 or more)

TG A / F T I R A C C E S S O R Y S P E C I F I C AT I O N S Temperature Range Accuracy Voltage Sensor Type Controllers Input Voltage Output Voltage 110/220 V, switchable 10 A/24 VAC Ambient to 300 C +/- 0.5% 24 VAC 3 wire Pt RTD (low drift, high stability)
160-1320 160-1329
KBr window, 38 x 6 mm ZnSe window, 38 x 6 mm
Notes: For window compatibility please consult our Materials Properties information.
TGA/FTIR Accessory Heated Transfer Line (must select one)

115-0001 115-0005 115-0006 115-0007 115-0008 115-0009 115-0010 115-0011 115-0012 115-0013 115-0014
Heated Transfer Line for Shimadzu TGA Includes take-off valve modications Heated Transfer Line for Mettler 851 TGA Heated Transfer Line for Mettler TGA Heated Transfer Line for TA Instruments TGA Heated Transfer Line for TA Instruments Q5000R TGA Heated Transfer Line for TA Instruments Q50/Q500 TGA Heated Transfer Line for TA Instruments 2050 TGA Heated Transfer Line for Netzsch TGA Heated Transfer Line for /PESTA6/4000 110V TGA Heated Transfer Line for SETARAM Heated Transfer Line for PESTA6/4000 220VTGA
TGA/FTIR Accessory Replacement Parts

162-2309
High Temperature O-Rings, (1 each), max temp, 325 C
608-274-2721
Notes: 4 o-rings are required for the gas cell.
Notes: We will need to know the make and model number of your TGA. Please consult your TGA supplier to ensure compatibility with evolved gas analysis. Please contact us about interface to other TGA instruments.
External Sample Module Extending Sampling Efciency

The External Sample Module (ESM) from PIKE Technologies is a versatile sampling station for FTIR spectrometers. It provides an additional sample compartment to keep the main sample compartment of the FTIR free for routine sampling and also provides a location for a more complex sampling setup. Examples of experiments ideally suited to using the External Sample Module include a long-path gas cell, PIKE TGA/FTIR accessory, MappIR and the AutoDiff (PIKEs automated diffuse reectance accessory). The sample compartment of the ESM is full sized, and compatible with all PIKE Technologies accessories. In addition to being a traditional sample compartment, the ESM has a screw-hole grid for customized optical layouts with removable inner and outer walls. The External Sample Module is compatible with either sealed and desiccated or purged FTIR spectrometers. The PIKE ESM may be paired with most FTIR spectrometers with an external beam.
EXTERNAL SAMPLE MODULE S P E C I F I C AT I O N S Dimensions (W x D x H) Weight FTIR Placement Beam Height Sample Compartment Size (W x D x H) Detector Options Screw Hole Grid Sample Compartment EFL Purge Inner, Outer Walls FTIR Compatibility 615 mm x 490 mm x 205 mm 19 kg Right or Left Side Specic for FTIR 190 mm x 265 mm x 155 mm DTGS, MCT, others inquire 1" OC, 1/4-20, sealed 6" Purgeable Removable Most
F E AT U R E S O F T H E EXTERNAL SAMPLE MODULE (ESM)
Utilizes external beam of FTIR keeps main sample

compartment free for general sampling
Right and left side external beam versions Full sized dimensions for all sample compartment accessories Choice of integrated detector Ideal accessory for heated applications or a difcult experimental setup saving time and improving reproducibility
Customizable conguration removable sample compartment

walls for specic optical layouts
Vibration isolated design providing highest spectral quality Compatible with most FTIR spectrometers Requires installation by your FTIR spectrometer provider
External Sample Module (must select, insert spectrometer model for XX)
155-10XXR 155-10XXL
External Sample Module, Right Side External Sample Module, Left Side
Notes: External Sample Module includes optics, mounting hardware, electrical cabling for FTIR and purge tubing and ttings to connect to purge air supply. Please see the FTIR instrument code sheet for XX.
Detector for External Sample Module (must select one or more)

155-2010 155-2020
DLaTGS Detector for External Sample Module MCT Detector (mid band) for External Sample Module
Notes: Detectors for the External Sample Module may be exchanged by the customer and are pin-mounted for easy exchange without alignment. Please ask us about other detector options.
Optical geometry for right side ESM
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Semiconductor Applications FTIR Sampling Techniques Overview

FTIR spectroscopy has established itself as a method of choice in several areas of industrial manufacturing. One of them is the quality control of semiconductor wafers. Here, the FTIR spectrometers are commonly used to measure Phosphosilicate glass (PSG) and Borophosphosilicate glass (BPSG) lms, epitaxial lm (EPI) thickness and interstitial oxygen and substitution carbon content. Addition of boron and phosphorus to silicate glass during manufacturing improves the nal product uniformity and reduces glass forming temperatures. Borophosphosilicate glass (BPSG) melts 100 degrees lower than Phosphosilicate glass (PSG) and offers better ow characteristics. To maintain and optimize production processes, evaluation and verication of doping levels is required. FTIR allows simultaneous measurements of boron and phosphorus as well as the thickness of the glass in a quick and nondestructive procedure. The measurements are based on the interpretation of transmission spectra and quantication of boron, phosphorus and Si-O bands. K-matrix or Partial Least Squares (PLS) methods are used for concentration/thickness calculations. The epitaxial lm (EPI) is a grown crystal layer having the same crystallographic orientation as the substrate crystal wafer. The epitaxial lm differs from the substrate base as it is modied with various additives. Accurate, fast and precise determination of the EPI lm thickness is important in the manufacturing process since lm thickness and uniformity play a critical role in etching time and device yield across the wafer surface. Specular reectance is used in FTIR measurements of the epitaxial layer thickness. The infrared beam enters the EPI layer, reects off the substrate surface and makes another pass through the lm when exiting. The lm thickness calculations are based on one of the following methods: Interference measurements also called Constant Angle Reection Interference Spectroscopy or CARIS. This method uses the interference fringe pattern obtained in the specular reectance experiment. Interferogram subtraction based on the measurement of the primary and secondary interferogram of the sample and subtraction of this signal from that of the reference material. Second Fourier Transform of spectral response data (CEPSTRUM). This method takes the difference of two spectral response curves and performs a second Fourier transform which provides signal intensity vs. sample thickness information.
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FTIR spectrum of BPSG on silicon wafer transmission sampling mode
Oxygen and carbon may be introduced to the molten silicon during the manufacturing process. These impurities can be trapped in the crystal lattice and affect nal product characteristics. For these reasons, both need to be monitored and quantied. FTIR spectroscopy (transmission measurements) provides excellent means to perform this analysis. The application uses the absorption bands of Si-C and Si-O-Si to calculate concentration levels of substitution carbon and interstitial oxygen. Beers law is typically used to determine their concentrations.
608-274-2721
UV-Vis Accessories
This is the most recent addition to the PIKE accessory catalog addressing the growing need for more sophisticated UV-Vis accessories. It includes research-style specular reectance, polarizers, and automated sampling stages. To simplify your shopping experience, we also include a selection of most used UV-Vis cuvettes and cuvette holders. It is our intention to signicantly increase this UV-Vis offering in the near future therefore, please contact us if you do not nd an accessory you need, or are searching for a customized product or solution. In most likelihood, we will be able to assist you with your special requests.
Page 116
UV-Vis Cuvettes, Cells, Vials and Holders
Page 118
UV-Vis Polarizers Manual and Automated Versions
Page 119
UV-Vis Spec Slide Mounted Specular Reectance Accessories
Page 120
UV-Vis 85Spec Specular Reectance Accessory
Page 121
UV-Vis VeeMAX Variable Angle Specular Reectance Accessory
Page 122
Falcon UV-Vis Precise Cell Temperature Controlled Accessory
Page 123
Automated XY, R-Theta and Y-rotation Stages for UV-Vis Spectrophotometers
UV-Vis Cuvettes, Cells, Vials and Holders

PIKE Technologies offers a selection of most popular cuvettes, vials and cell holders used in the field of UV-Vis spectrophotometry. The cuvettes are manufactured using a heat fusing method which ensures that they are fused into a single homogeneous unit. Cuvettes are carefully annealed to remove any residual strain for maximum cell integrity and physical strength. The cells can be used with most solvents and acidic solutions. Hydrofluoric acid (HF) and strong bases (pH >9) will negatively affect the cell surfaces.
UV-V I S C U V E T T E S S P E C I F I C AT I O N S Window Thickness Beam Height (Z-dimension) Optical Glass Spectral Range Far UV Quartz Spectral Range NIR Quartz Spectral Range 1.25 mm 8.5 mm and 11 mm 334 to 2500 nm 170 to 2700 nm 220 to 3800 nm
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Standard Rectangular Cuvettes
PATHLENGTH mm VOLUME mL
OPTICAL GLASS (334-2500 nm) WITH PTFE COVER P/N WITH PTFE STOPPER P/N
FAR UV QUARTZ (170-2700 nm) WITH PTFE COVER P/N WITH PTFE STOPPER P/N
NIR QUARTZ (220-3800 nm) WITH PTFE COVER P/N WITH PTFE STOPPER P/N
1 2 5 10 20 40 50 100
0.40 0.70 1.70 3.50 7.00 14.00 17.50 35.00
162-0220 162-0221 162-0222 162-0223 162-0224 162-0225 162-0226 162-0227
162-0228 162-0229 162-0230 162-0231 162-0232 162-0233 162-0234 162-0235
162-0236 162-0237 162-0238 162-0239 162-0240 162-0241 162-0242 162-0243
162-0244 162-0245 162-0246 162-0247 162-0248 162-0249 162-0250 162-0251
162-0252 162-0253 162-0254 162-0255 162-0256 162-0257 162-0258 162-0259
162-0260 162-0261 162-0262 162-0263 162-0264 162-0265 162-0266 162-0267
608-274-2721
Semi-micro Rectangular Cuvettes 4 mm Opening

PATHLENGTH mm VOLUME mL WITH PTFE COVER/CLEAR PART NUMBER WITH PTFE COVER/BLACK WALLED PART NUMBER WITH PTFE STOPPER/CLEAR PART NUMBER WITH PTFE STOPPER/BLACK WALLED PART NUMBER
OPTICAL GLASS (320-2500 nm)
5 10 20 40 50 5 10 20 40 50
0.70 1.40 2.80 5.60 7.00 0.70 1.40 2.80 5.60 7.00
162-0268 162-0269 162-0270 162-0271 162-0272 162-0288 162-0289 162-0290 162-0291 162-0292
162-0273 162-0274 162-0275 162-0276 162-0277 162-0293 162-0294 162-0295 162-0296 162-0297
162-0278 162-0279 162-0280 162-0281 162-0282 162-0298 162-0299 162-0300 162-0301 162-0302
162-0283 162-0284 162-0285 162-0286 162-0287 162-0303 162-0304 162-0305 162-0306 162-0307
FAR UV QUARTZ (170-2700 nm)
Micro Rectangular Cuvettes 2 mm Opening

PATHLENGTH mm VOLUME mL WITH PTFE COVER/CLEAR PART NUMBER WITH PTFE COVER/BLACK WALLED PART NUMBER WITH PTFE STOPPER/CLEAR PART NUMBER WITH PTFE STOPPER/BLACK WALLED PART NUMBER
OPTICAL GLASS (320-2500 nm)
5 10 20 40 50 5 10 20 40 50
0.35 0.70 1.40 2.80 3.50 0.35 0.70 1.40 2.80 3.50
162-0308 162-0309 162-0310 162-0311 162-0312 162-0328 162-0329 162-0330 162-0331 162-0332
162-0313 162-0314 162-0315 162-0316 162-0317 162-0333 162-0334 162-0335 162-0336 162-0337
162-0318 162-0319 162-0320 162-0321 162-0322 162-0338 162-0339 162-0340 162-0341 162-0342
162-0323 162-0324 162-0325 162-0326 162-0327 162-0343 162-0344 162-0345 162-0346 162-0347
FAR UV QUARTZ (170-2700 nm)
UV-VIS ACCESSORIES
10 mm Cuvette Holder
Adjustable Cuvette Holder
Cylindrical Cells with Teon Stoppers 22 mm Diameter

PATHLENGTH mm VOLUME mL OPTICAL GLASS 320-2500 nm FAR UV QUARTZ 170-2700 nm NIR QUARTZ 220-3800 nm
10 20 50 100
2.80 5.60 14.10 28.20
162-1831 162-1832 162-1835 162-1840
162-1841 162-1842 162-1845 162-1850
162-1801 162-1802 162-1805 162-1810
Vials and Disposable Cuvettes

162-0205 162-0208 162-0212 162-0348 162-0349
5 mm Disposable Glass Vials, 6 mm x 50 mm (200/pk) 8 mm Glass Vials (200/pk) 12 mm Glass Vials (200/pk) Polystyrene, Disposable Cuvettes, 10 mm pathlength, 4.5 mL (100/pk) Polystyrene, Semi-micro Disposable Cuvettes, 10 mm pathlength, 1.5 mL (100/pk)
Cylindrical Cell Holder
Spacers for 1, 2 and 5 mm cells
Cell Holders, Spacers and Stoppers

111-3650 111-3660 161-2530 161-2540 161-2550 162-1201 162-1202 162-1205
Cuvette Holder, 10 mm Adjustable Cuvette Holder 10-100 mm Slide Sample Holder, Cylindrical Cell, 10 20 mm Slide Sample Holder, Cylindrical Cell, 50 mm Slide Sample Holder, Cylindrical Cell, 100 mm Spacer for 1 mm Pathlength Cuvette Spacer for 2 mm Pathlength Cuvette Spacer for 5 mm Pathlength Cuvette
Notes: Please contact PIKE Technologies for replacement Teflon stoppers, covers, and for items not described on this list.
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UV-Vis Polarizers Manual and Automated Versions
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Glan-Taylor field of view
F EATURES O F T HE UV-V IS P OLARIZERS
UV Glan-Thompson field of view
Glan-Taylor and UV Glan-Thompson designs High grade calcite High extinction ratio Manual versions 1 degree settable scaling Automated version 0.1 degree scaling resolution Fits in a standard 2 inch x 3 inch mount
608-274-2721
The sample material and sampling configuration dictate the need for a UV-Vis polarizer. Typical materials that may require a polarizer during sampling are often crystals, films, paints, beam splitters, coated glass, and anti-reflective, and anti-glare coatings. Additionally, we recommend using a polarizer for specular reflectance sampling at an angle of incidence greater than 15 degrees where the reflectivity becomes polarization dependent.
U V- V I S P O L A R I Z E R S S P E C I F I C A T I O N S
PIKE Technologies offers Glan-Taylor and Glan-Thompson UV-Vis polarizers. These take advantage of the birefringent properties of UV-quality calcite. An air interface is assembled between two right angle calcite prisms in the Glan-Taylor polarizer whereas a UV-transparent cement separates the calcite prisms in the Glan-Thompson polarizer. In both styles, the polarized extraordinary ray passes through both prisms and the ordinary ray is internally reected and absorbed. The spectral range of these polarizers is 250 nm 2300 nm. Due to the natural origin of calcite the achievable minimum wavelength uctuates from polarizer to polarizer. However, at 250 nm the transmission throughput is no less than 25%.
Wavelength (nm) Minimum Transmission (%) 250 25 300 40 400 65 > 500 85
Glan-Taylor Material Calcite Spectral Range 250 2300 nm Clear Aperture 12 mm Extinction Ratio 5 x 10-5 Manual Polarizer Dimensions Width 29 mm Depth 50 mm Height 146 mm Automated Polarizer Dimensions Width 56 mm Depth 50 mm Height 146 mm Angular Resolution, Manual 1 Angular Resolution, Automated 0.1
UV Glan-Thompson Calcite 250 2300 nm 14 mm 1 x 10-4 49 mm 50 mm 146 mm 56 mm 50 mm 146 mm 1 0.1
Each polarizer type has a different field of view where the UV-Vis beam is polarized. The UV Glan-Thompson field of view is wider compared to the Glan-Taylor as shown in the figure. Enhanced angular resolution of 0.1 is gained with the automated version of the PIKE UV-Vis polarizer. This automated feature is advantageous where highly precise angular settings are required and for increasing the measurement simplicity for determining the polarized orientation of a sample. By evaluating the transmission or reflectance of a sample as a function of the automated polarizer angle at a given wavelength, parallel and perpendicular orientation of the sample relative to the polarizer degree setting may be determined. The automated version includes integrated data collection with some commercial UV-Vis spectrophotometer software packages.
UV-Vis Polarizers Accessories
198-1623 198-1624 198-1625 198-1626
Manual Glan-Taylor Manual UV Glan-Thompson Automated Glan-Taylor Automated UV Glan-Thompson
Note: Polarizers may not fit in the sample compartments of some smaller spectrophotometers. Please consult PIKE Technologies before placing an order.
UV-Vis Spec Slide Mounted Specular Reectance Accessories

PIKE Technologies relative xed angle specular reectance accessories for UV-Vis spectrophotometers span from near normal to grazing angle. This product sheet highlights our specular reectance accessories featuring slide mount design. These cover mid-range angles of incidence, between 15 60, and may be aligned to maximize throughput. In specular reectance sampling, the light source is directed to contact the sample at a given angle of incidence. Measured light is collected from the equivalent angle. Typical samples include semiconductors, anti-reective coatings, color lters, semi-transparent and highly reective mirrors, optical materials, reection lters, multiple layers, solar mirrors, and solar controlling lms on glass. Measured parameters of interest include lm thickness, material reectivity, and coating uniformity and homogeneity.
UV-VIS ACCESSORIES
F E AT U R E S A N D A P P L I C AT I O N S O F F I X E D A N G L E S P E C U L A R R E F L E C TA N C E AC C E S S O R I E S
Fixed angle reectance accessories including

15, 20, 30, 45, and 60 degrees
Slide mount design for easy installation Optical and anti-reective coatings testing Gloss measurements Determining reectivity of mirrors Film thickness calculations
Anti-reective optics coating spectrum collected using the PIKE UV-Vis 60Spec
S P E C U L A R R E F L E C TA N C E A C C E S S O R Y S P E C I F I C A T I O N S Mounting Method Accessory Dimensions Slide Mount Length Mask Aperture Optical Mirrors Slide mount 2" x 3" 3.75" 4 mm x 7 mm UV optimized aluminum
Optical geometry schematic for mid-range xed angle specular reectance accessory
Fixed Angle Specular Reectance Accessories

121-1500 121-2000 121-3000 121-4500 121-6000 300-0300 121-0500
UV-Vis 15Spec UV-Vis 20Spec UV-Vis 30Spec UV-Vis 45Spec UV-Vis 60Spec UV Aluminum Mirror (25.4 mm x 25.4 mm) Aperture Mask (4 mm x 7 mm)
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UV-VIS 85Spec Specular Reectance Accessory
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AR coated ZnSe crystal measured using the 85Spec Specular Reectance Accessory.
U V- V I S 8 5 S P E C S P E C I F I C A T I O N S
F EATURES O F T HE UV-V IS 85S PEC
Small footprint, compact design Fixed 85 degree angle of incidence Baseplate mount for stable operation and collection of
high quality spectra
Mounting Method Accessory Dimensions Width Height Depth Mask Aperture Optical Mirrors
Baseplate 105 mm 76 mm 84 mm 35 mm x 3 mm UV optimized aluminum
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Thin lms and coatings measurements

UV-Vis Specular Reectance Accessory
121-85XXX
UV-Vis 85Spec Specular Reectance Accessory Includes an Al substrate alignment mirror and sample mask
Note: XXX are instrument codes listed in the table below.
UV-Vis 85Spec Replacement Parts

300-0301 121-0501
UV Aluminum Mirror (38.1 mm x 38.1 mm) Aperture Mask (35 mm x 3 mm)
XXX Spectrophotometer Codes

CODE SPECTROPHOTOMETER
Optical diagram of the UV-Vis 85Spec Specular Reflectance Accessory.
100 110 120
Agilent/Varian Cary 50 Agilent/Varian Cary 100, 300 Agilent/Varian Cary 4000, 5000, 6000i Jasco 600 series PerkinElmer Lambda 650, 750, 850, 950 and 1050 PerkinElmer Lambda 25, 35, 45 Shimadzu 1600 and 1700 Shimadzu 1800 Series Thermo Fisher Scientic Evolution 300/600 Thermo Fisher Scientic Evolution 200
The 85Spec is an 85 degree specular reectance accessory developed for UV-Vis applications. The accessory is used to analyze mirror-like planar surfaces and thin lms on planar surfaces. The grazing angle (85) measurements give the longest possible pathlength through coated samples. Pre-mounted on a baseplate specific to your UV-Vis spectrophotometer, the 85Spec is an easy-to-use accessory. The mounting allows the 85Spec to be inserted and removed from the sample compartment without alignment.
600 700 730 200 210 400 410
Note: Contact PIKE Technologies if you do not nd your spectrophotometer code listed.

are reectors, bandpass lters, and hot and cold mirrors. The UV-Vis VeeMAX makes an ideal accessory used to replicate real-world situations such as the effect of a rising and setting sun on absorbance efciency of solar collectors and architectural glass performance.
UV-VIS ACCESSORIES
F EATURES AND A PPLICATIONS O F T HE UV-V IS V EE MAX VARIABLE A NGLE S PECULAR R EFLECTANCE A CCESSORY
Selectable angle of incidence from 30 to 80 degrees in one

degree increments
Specular reectance collected at two different angles of incidence (AOI) for an anti-reective coating U V- V I S V E E M A X S P E C I F I C A T I O N S Mounting Method Baseplate Nominal Accessory Dimensions (w, h, d vary with spectrophotometer type) Width 145 mm Height 158 mm Depth 135 mm Minimum Beam Height 50 mm Mask Aperture 7 mm x 4 mm 13 mm x 4 mm 25 mm x 4mm Optical Mirrors UV optimized aluminum
Film and coating thickness measurements at optimized angle

of incidence
Grazing angle measurements for the longest path through an

ultra-thin lms
Characterization of variable reectivity materials
UV-Vis VeeMAX Accessory
013-10XXX
Note: Contact PIKE for the XXX spectrophotometer code.
UV-Vis VeeMAX Replacement Parts

Optical geometry schematic for UV-Vis VeeMAX variable angle specular reectance accessory
300-0300 013-4015
UV Aluminum Mirror (25.4 mm x 25.4 mm) Aperture Mask Set (7 mm, 13 mm, and 25 mm x 4 mm)
In specular reectance sampling, the light source is directed to contact the sample at a given angle of incidence. Measured light is collected from the equivalent angle. Typical samples include semiconductors, anti-reective coatings, spectral wavelength lters, semi-transparent and highly reective mirrors, optical materials, reection lters, multiple layers, solar mirrors, and solar controlling lms on glass. Measured parameters of interest include lm thickness, material reectivity, and coating uniformity and homogeneity. With the UV-Vis VeeMAX accessory nd versatility for specular reectance measurements. The angle of incidence from 30 to 80 is easily changed by turning the angle setting dial. This exibility allows for optimization of spectra quality for lm and coating measurements. In other applications where it is desirable to study the effect of incident angle upon reected radiation, the UV-Vis VeeMAX offers a sampling solution. Typical sample materials

100 110 120 600 700 730 200 210 400 410
121
Falcon UV-VIS Precise Cell Temperature Control Accessory

Heated UV-Vis Transmission Accessory
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110-60XXX
UV-Vis Falcon Base Includes: Temperature controlled base. Digital Temperature Controller and sample holder need to be selected from the tables below for complete system.
Note: Please insert XXX code found at the spectrophotometer table at the bottom of this page.
F EATURES O F T HE F ALCON UV-V IS
Fast and easy analysis of samples under precise Peltier

temperature control
076-1230 076-1430
Digital Temperature Control Module Digital Temperature Control Module PC Control (USB)
Choice of cuvette and vial adapters Compatible with 1 mm to 10 mm pathlength cuvettes and
disposable 5 mm to 12 mm vials
Sample Holders and Spacers

111-3610 111-3620 111-3630 111-3640
5 mm Vial Holder 8 mm Vial Holder 12 mm Vial Holder 1 cm Cuvette Holder Spacer for 1 mm Cuvette Spacer for 2 mm Cuvette Spacer for 5 mm Cuvette
Excellent thermal accuracy and precision Available for selected UV-Vis spectrophotometers
The PIKE Technologies UV-Vis Cell Temperature Control Accessory is an excellent choice for analysis of liquid samples that require precise temperature control. The accessory is well suited for pharmaceutical, life science and general industrial applications. Temperature range of the accessory is 5 C to 105 C with +/- 0.5% accuracy. Heating and cooling is controlled by a built-in Peltier device. The Peltier element provides for reproducible ramping and for reaching target temperatures quickly and reliably. The system is driven by a Digital Temperature Controller directly, or via PC. Individual sample holders are designed to accommodate standard 1 mm to 10 mm cuvettes (1, 2 and 5 mm cuvettes require use of spacers) and 5 mm, 8 mm and 12 mm glass vials. Sample holders are pin positioned to ensure maximum reproducibility. The complete Falcon UV-VIS conguration requires the accessory base, cell holder, and one of the available temperature controllers. The Falcon accessory is compatible with a selected range of UV-Vis spectrophotometers.
F A L C O N U V- V I S S P E C I F I C A T I O N S Temperature Control Temperature Range Accuracy Voltage Sensor Type Temperature Controllers Digital Digital PC Input Voltage Output Voltage Dimensions Width Depth Height Peltier (cooling and heating) 5 C to 105 C +/- 0.5% 15 VDC 3 wire Pt RTD (low drift, high stability) +/- 0.5% of set point +/- 0.5% of set point, graphical setup, up to 10 ramps, USB interface 90264 V, auto setting, external power supply variable 312 VDC/50 W max. 120 mm, 175 mm, 90 mm (without the spectrophotometer baseplate and mount)
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162-1201 162-1202 162-1205
Notes: Spacers for short pathlength cuvettes are designed to work only with 1 cm Cuvette Holder. Please refer to pages 116 117 of this catalog for the selection of cuvettes and vials available for this accessory.

100 110 120 600 700 730 200 210 400 410
Automated XY, R-Theta and Y-rotation Stages for UV-Vis Spectrophotometers

Vertical XY Sampling Stage
Designed for research type UV spectrophotometers and typically used for precision mapping of large, flat samples. Suitable for thin coating studies and material quality control. Uses similar to R-Theta accessory sample mount, but samples are translated vertically and horizontally by precision stepper motors.
UV-VIS ACCESSORIES
Horizontal XY Stage In Sample Compartment or Fiber Optic Configurations

The XY stage is designed to work with standard 24, 48 or 96 well microplates but can be also modified to accommodate other sample shapes. The unit features a horizontal XY stage with both axes driven by high precision stepper motors for speed and reproducibility.
RotatIR, for %T/A Measurements at Various Beam of Incidence Angles

This accessory is designed for automated selection of the transmission angle of the UV-Vis beam that enters the sample. This is achieved by mounting and rotating the sample in the adjustable angle holder. A full set of spectral data may be collected by predefining the required measurement angles from the software. The RotatIR features a standard 2" x 3" slide mount for easy positioning of different types of transmission samples and sample holders. All motorized accessories are driven by the PIKE Motion Control Unit. The operation is managed by the AutoPRO software which provides full user programmability and easy to learn point-andclick environment. Polar or X and Y coordinates may be used to define test points. The AutoPRO software allows complex test sequences to be set up, stored as methods and implemented for full flexibility. The Motion Control Unit offers RS 232 or USB interfaces, and incorporates a smart power supply and works with 85-265 VAC, 47-63 Hz power lines. Each automated accessory is tailored to meet specific sampling needs. This includes adjustments for sample shape/size, and the type of spectroscopic data required. Please contact PIKE Technologies to verify that the selected stage can be integrated into your spectrophotometers sample compartment and produce desired information.
PIKE Technologies offers a wide range of computer controlled accessories for translating and rotating samples in the spectrophotometer beam. These tools enable mapping of sample surfaces and generating spectroscopy data as a function of sample position. Suitable for determination of film and coating thickness, multilayer film analysis, reflectivity studies, and characterization of optical materials. Applications include transmittance and specular reflectance measurements at normal and variable incident light angles. XY control for microplate type configurations (in-sample compartment and with optical fibers) is also available.
Vertical and Horizontal R-Theta, Translation/Rotation

These accessories are suitable for analyzing small and large size samples including coated and uncoated glass, optical filters, solar panels and similar materials. The support ring mounts on the accessorys drive and is rotated and translated laterally to produce an R-theta motion covering the entire sampling range of the accessory. Each system incorporates two precision stepper motors for rotation and translation of the plate.
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Standards, Software and Databases

We strive to provide you with useful sampling tools for spectroscopy and offer these additional products and information to serve your laboratory requirements. If you have not found the exact sampling tool or information within our catalog, please contact us. Your spectroscopy sampling requirements may become one of our product offerings of the future.
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Reference Standards For Calibrating Your Spectrometers
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PIKECalc Software For FTIR sampling computations
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Spectral Databases ATR and Transmission Versions for Your FTIR
Reference Standards For Calibrating FTIR Spectrometers

F E AT U R E S O F R E F E R E N C E S TA N DA R D S
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Mid-IR and NIR spectral regions products Transmission, reection and ATR versions Traceable versions available
The Specular Reectance Standard is compatible with the following PIKE Technologies products; VeeMAX II, 30Spec, 45Spec and 10Spec.
FTIR spectrometers are highly accurate and reliable measurement tools. Their internal referencing laser (Connes advantage) is a great leap forward in wavenumber accuracy and repeatability. Still it is often required by regulatory agencies and operating procedures, to calibrate the spectrometer. PIKE Technologies offers several new products to assist in this task. PIKE Technologies offers several versions of polystyrene reference materials for FTIR spectrometer calibration. The 1.5 mil and 55 micron thick polystyrene are generally specied for calibrating wavenumber accuracy. PIKE also offers a NIST traceable polystyrene version of these products which includes the reference material, calibration result for the material and its traceability documentation. The 3.0 mil polystyrene reference is generally used to calibrate the FTIR zeroes or linearity.
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Specular Reectance Standard for calibrating reectance measurement system
Polystyrene Reference Standards for calibrating FTIR wavenumber accuracy
The Specular Reectance Standard is a unique material for calibration of your reectance measurement system. The standard is a specially treated germanium element which only allows reection from its front surface thereby providing a reection value which can be calculated relative to Fresnel equations. The Specular Reectance Standard includes documentation to trace the specular reectance to published refractive index data.
Comparison of measured and calculated reectance for the Specular Reectance Standard using the PIKE 10Spec accessory
Polystyrene Reference Standards
Specular Reectance Standard

162-5420 162-5430 162-5440 162-5450
1.5 mil Polystyrene Reference Standard 3.0 mil Polystyrene Reference Standard 55 micron Polystyrene Reference Standard NIST Traceable Polystyrene Reference Standard
162-5460
Specular Reectance Standard
Notes: Compatible with 10Spec, 30Spec, 45Spec and VeeMAX II.
Notes: Polystyrene reference standards are mounted in a 2" x 3" card and are compatible with all FTIR spectrometers.
STANDARDS, SOFTWARE AND DATABASES
For diffuse reflectance measurements in the NIR and UV-Visible spectral region, it is often desirable to measure against the highest possible reflectance material. The NIR and UV-Vis Diffuse Reectance Standards are available in highly reflective diffuse gold and PTFE. Each standard is certified against a National Research Council of Canada traceable plaque standard.
Diffuse reflectance sampling in the mid-infrared region is used to measure the reflectance of powders, films, painted panels, and other samples. Exhibiting sharp peaks throughout the mid-IR spectral region, the Mid-IR Diffuse Reectance Wavelength Standard is used to verify and calibrate for wavelength accuracy for diffuse reflectance measurements. This standard is NIST traceable to NIST 1921b and an analysis certificate is included.
Diffuse Gold Reference Standard
Mid-IR Diffuse Reectance Wavelength Standard
Measured reflectivity of Diffuse Gold Reference standard
Mid-IR Diffuse Reflectance Standard spectrum
NIR and UV-Vis Diffuse Reectance Standards
Mid-IR Diffuse Reectance Standards

162-5480 162-5481 162-5482
Diffuse PTFE Reference (1" optical area) Diffuse Gold Reference (1" optical area) Diffuse Gold Reference (1.7" optical area)
162-5485 162-5486
Mid-IR Diffuse Reectance Wavelength Standard (1.65" optical area) Mid-IR Diffuse Reflectance Wavelength, recertification
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ATR spectra are somewhat different than those produced by transmission sampling techniques both in relative intensity of the absorbance bands and also the position of the bands. To assist with calibrating your ATR/FTIR system, PIKE Technologies offers a new ATR Reference Standard. The ATR Reference Standard is available as a standard material and also in a version which includes a recommended validation procedure for your ATR/FTIR system.
In the near infrared (NIR) spectral region, PIKE Technologies offers its NIR Wavelength Standard for calibrating a NIR spectrometer. The NIR Wavelength Standard meets USP wavelength requirements, provides calibration beyond 2.0 m and is NIST traceable. This standard is compatible with NIR analysis in the diffuse reectance sampling mode. The NIR Wavelength Standard includes analysis certicate and traceability documentation.
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ATR Reference Standard
NIR Wavelength Standard
ATR Reference Standard Spectrum
NIR Wavelength Standard Spectral Data. (Upper green spectrum) PIKE NIR Wavelength Standard. (Lower red spectrum) NIR standard from another supplier.
ATR Reference Standard
NIR Wavelength Standard

162-5470 162-5475 162-5476
ATR Reference Standard ATR Reference Standard with Recommended Validation Procedure and Validation Certicate ATR Reference Standard, recertification
048-3070 048-3071
Traceable NIR Reference Standard Traceable NIR Reference Standard, recertication
Notes: Includes traceability measurement documentation.
Notes: Compatible with MIRacle, GladiATR and VeeMAX II with ATR.
PIKECalc Software For FTIR Sampling Computations

PIKECalc software is easy-to-use just select the type of computation, enter values from your spectral data and click on the calculate button. An instant calculation is performed. PIKECalc eliminates the need to search through literature references to nd the correct conversions and formulae and gives you immediate results. All formulae and equations are documented in the software, if you wish to reference our mathematics. Help and how to use PIKECalc is included within the software. PIKECalc is compatible with current versions of Microsoft operating systems and is a free-standing program which can be used with all FTIR spectral data. Please ask us about other FTIR spectroscopy calculations you may need.
007-0300
PIKECalc Software
F E AT U R E S O F P I K E C A LC
Notes: PIKECalc is loaded on a CD disk for upload to your PC and operates with current versions of Microsoft operating systems.
Convert from wavelength (microns and nanometer)

to wavenumber
Calculate depth of penetration, critical angle, effective

pathlength, effective angle of incidence and number of reections for ATR
Calculate cell pathlength, thickness of free-standing lm

and thickness of coating
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ATR Spectral Databases Optimize Search Results for ATR Spectral Data
ATR Spectral Databases
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008-1000 008-2000 008-3000
Aldrich ATR Spectral Database (18,513 spectra) IChem ATR Spectral Database (13,557 spectra) Aldrich-IChem ATR Spectral Database Package (36,639 spectra)
Notes: The spectral databases include a USB based device dongle for copy protection. Please designate either 2 cm-1 or 4 cm-1 spectral data format.
ATR Application Specic Spectral Databases

008-3002 008-3003
ATR Applications Polymers and Polymer Additives (4,520 spectra) ATR Applications Food Additives and Food Packaging (2,762 spectra) ATR Applications Solvents (667 spectra) ATR Applications Organometallics and Inorganics (2,149 spectra) ATR Applications Biochemicals (5,343 spectra) ATR Applications Aldehydes and Ketones (3,482 spectra) ATR Applications Alcohols and Phenols (2,671 spectra) ATR Applications Esters and Lactones (4,170 spectra) ATR Applications Hydrocarbons (1,175 spectra) ATR Applications Flavors, Fragrances and Cosmetic Ingredients (2,716 spectra) ATR Applications Pesticides (1,820 spectra) ATR Applications Semiconductor Chemicals (919 spectra) ATR Applications Forensic (3,579 spectra) ATR Applications Dyes, Pigments and Stains (2,857 spectra) ATR Applications Sulfur and Phosphorus Compounds (5,336 spectra) ATR Applications Hazardous Chemicals (3,730 spectra) ATR Applications Hazardous and Toxic Chemicals (8,136 spectra) ATR Applications Pharmaceuticals, Drugs and Antibiotics (2,715 spectra) ATR Applications High Production Volume (HPV) Chemicals (1,315 spectra) ATR Applications Coatings (1,809 spectra) ATR Applications Paints (2,507 spectra)
F E AT U R E S O F AT R S P E C T R A L DATA B A S E
Select from databases with over 32,100 ATR spectra All spectra collected using FTIR spectrometers and a single
reection ATR
008-3004 008-3005 008-3006 008-3007 008-3008 008-3009 008-3010 008-3011 008-3012 008-3013 008-3014 008-3015 008-3016 008-3017 008-3018 008-3020 008-3021 008-3025 008-3026
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Complete collections and applications databases available Compatible with most FTIR software
Spectral search is greatly improved when using databases collected using the same sampling mode especially when the sampling mode is ATR. PIKE Technologies offers a large selection of ATR spectral databases. The Aldrich ATR Spectral Database contains 18,513 spectra produced by the Aldrich Chemical Company. The collection includes organic and inorganic compounds and also includes polymers and industrial chemicals. Spectral range is 4000 650 cm-1. The IChem ATR Spectral Database contains 13,557 spectra produced by Fine Chemical manufacturers in Japan. This collection includes organic and inorganic compounds, basic polymers and industrial chemicals. Spectral range is 4000 650 cm-1. The Aldrich-IChem ATR Spectral Database Package includes 36,639 spectra, a combination of all ATR spectra from both databases with no duplicate entries. A wide variety of applications spectral Database packages are formed from the Aldrich ATR and the IChem ATR databases. All spectral databases are supplied on a CD and operate with Windows 2000 and Windows XP. These spectral databases are compatible with ABB-Horizon MBTM, ACD/Labs, Bruker Opus, Jasco-Spectra Manager Suite, Lumex-Spectralum, PerkinElmer Spectrum, Mattson WinFirst, Shimadzu IRSolution and HyperIR, LabControl Spectacle, Thermo OMNIC, Varian Resolutions, Grams 32 and SpectralID software packages. A USB port is required on your PC where a dongle is installed for copy protection.
Notes: The spectral databases include a USB based device dongle for copy protection. Please designate either 2 cm-1 or 4 cm-1 spectral data format. Specify your FTIR software for correct format.
Transmission Spectral Databases High Quality Spectral Data for Optimized Search Results
Transmission Spectral Databases
008-4001 008-4004 008-4005
SDBS Transmission by KBr Pellet Spectral Database (22,995 spectra) SDBS Transmission by Liquid Film Spectral Database (7,018 spectra) SDBS Transmission by Nujol Mull Spectral Database (21,127 spectra)
Notes: The spectral databases include a USB based device dongle for copy protection. Please designate either 2 cm-1 or 4 cm-1 spectral data format.
Application Based Spectral Databases

F E AT U R E S O F T R A N S M I S S I O N S P E C T R A L D ATA B A S E
008-5002 008-5003 008-5004 008-5005 008-5006 008-5007
Transmission Applications Polymers and Polymer Additives (1,273 spectra) Transmission Applications Food Additives and Food Packaging (1,684 spectra) Transmission Applications Solvents (668 spectra) Transmission Applications Organometallics and Inorganics (1,445 spectra) Transmission Applications Biochemicals (4,590 spectra) Transmission Applications Aldehydes and Ketones (4,226 spectra) Transmission Applications Alcohols and Phenols (2,744 spectra) Transmission Applications Esters and Lactones (4,335 spectra) Transmission Applications Hydrocarbons (1,417 spectra) Transmission Applications Flavors, Fragrances and Cosmetic Ingredients (1,912 spectra) Transmission Applications Pesticides (958 spectra) Transmission Applications Semiconductor Chemicals (664 spectra) Transmission Applications Forensic (1,555 spectra) Transmission Applications Dyes, Pigments and Stains (1,473 spectra) Transmission Applications Sulfur and Phosphorus Compounds (5,025 spectra) Transmission Applications Hazardous Chemicals (2,664 spectra) Transmission Applications Hazardous and Toxic Chemicals (6,604 spectra) Transmission Applications Pharmaceuticals, Drugs and Antibiotics (2,806 spectra) Transmission Applications High Production Volume (HPV) Chemicals (1,123 spectra)
Select from databases with over 50,000 transmission spectra All spectra collected using FTIR spectrometers and transmission
sampling mode
Complete collections and applications databases available Compatible with most FTIR software
PIKE Technologies offers a large collection of high quality, spectral databases collected in the transmission sampling mode. The SDBS Transmission Spectral Databases include over 50,000 spectra produced by Fine Chemical manufacturers in Japan. All spectra were collected at the Japanese National Laboratories under highly controlled conditions with secondary verication of the materials by NMR and MS. Data is measured using several sample preparation methods. Spectral range is 4000 400 cm-1. The SDBS Transmission by KBr Pellet Spectral Database contains 22,995 spectra. This collection includes organic and inorganic compounds, basic polymers and industrial chemicals. The SDBS Transmission by Liquid Film Spectral Database contains 7,018 spectra. This collection includes organic compounds and industrial chemicals. The SDBS Transmission by Nujol Mull Spectral Database contains 21,127 spectra. This collection includes organic and inorganic compounds and industrial chemicals. A wide variety of applications spectral Database packages are formed from the KBr Pellet and Liquid Film Spectral databases. All spectral databases are supplied on a CD and operate with Windows 2000 and Windows XP. These spectral databases are compatible with ABB-Horizon MBTM, ACD/Labs, Bruker Opus, Jasco-Spectra Manager Suite, Lumex-Spectralum, PerkinElmer Spectrum, Mattson WinFirst, Shimadzu IRSolution and HyperIR, LabControl Spectacle, Thermo OMNIC, Varian Resolutions, Grams 32 and SpectralID software packages. A USB port is required on your PC where a dongle is installed for copy protection.
008-5008 008-5009 008-5010 008-5011 008-5012 008-5013 008-5014 008-5015 008-5016 008-5017 008-5018 008-5020 008-5021
Notes: The spectral databases include a USB based device dongle for copy protection. Please designate either 2 cm-1 or 4 cm-1 spectral data format. Specify your FTIR software for correct format.
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Alphabetical Index
A
10Spec, specular reectance 30Spec, specular reectance 45Spec, specular reectance 4X Beam Condenser 6X Beam Condenser 80Spec, specular reectance 85Spec, UV-Vis Abrasion Sampling Kit Abrasion Sampling Disks, SiC Abrasion Sampling Disks, Diamond Absolute reectance accessory AGA, specular reectance Alignment mirror, 10Spec, 30Spec Alignment mirror, 80Spec Alignment mirror, VeeMAX II Alignment mirror, diffuse reectance 32, 34, 36, 38 AMTIR crystal plate, ATRMAX AMTIR crystal plate, HATR AMTIR crystal plate, MIRacle AMTIR, properties Analysis of powders, diffuse reectance Angle of incidence Anvils for Die Kit ATR, cooled ATR crystal properties ATR crystals, refractive index ATR crystals, spectral range ATR, GladiATR ATR, GladiATR Vision ATR, heated ATR, products ATR, single reection ATR, Theory and Applications ATR, variable angle ATRMax II, ATR accessory ATRMax II, motorized ATRMax II, variable angle ATR ATR, MIRacle ATR, VeeMAX Auto-CrushIR hydraulic press AutoDiff, automated diffuse reectance Automated diffuse reectance Automated transmission Automated specular reectance Automated Wafer Analysis 22 18 11 105 39 49 87, 88 13, 15, 19, 21, 22 28, 29 28, 29 9, 28, 29 12 14 13, 15, 22 7 8, 12 27 26 20 22 22 8 23 91 36 36 58, 76, 78 43 109 Delivery terms Degree of polarization Demountable liquid cell Depth of penetration Diamond blade, Micro Plane Diamond compression cell Diamond crystal plate, MIRacle Diamond, properties Diffuse reectance, heating Diffuse reectance, products Diffuse reectance, automated Dilution, KBr Disks, IR materials 47 44 44 74 74 45 120 32 32, 36 32, 36 48 46 44, 47 45 43
INDEX
B
BaF2, disks, windows 80, 81, 82, 85, 95, 96, 97, 99, 100, 102 BaF2, properties Beam condensers Beer-Lambert Law Bolt Press Boron BPSG 105 73 103 4, 87, 94 114 108, 109, 114
F
Falcon Mid-IR transmission accessory Falcon NIR transmission accessory Falcon UV-Vis temperature control FAX order form Fiber optic accessories Film thickness Flat plate, ATRMAX Flat plate, HATR FlexIR, Mid-IR ber optic accessory FlexIR, NIR ber optic accessory Flow-through plate, HATR Flow-through plate, MIRacle Fluorolube Fringe pattern FTIR model codes 84 86 122 144 66 21, 22 17, 18 64 66 19 11 2, 3, 4, 93, 105 104, 114 Fold out ap 27, 42, 44, 45, 46, 49, 50, 53
C
CaF2, disks, windows 25, 80, 82, 85, 95, 96, 97, 102 CaF2, properties Carbide blade, Micro Plane Card, sample holder Catalytic heat chambers Cell holders Cells, long-path, quartz Chunks, KBr Comprehensive Transmission Kit Compression cells Compression cells, diamond Constant path cells Critical angle CrushIR Crystal polishing kit Crystals, properties CsI, disks, windows CsI, properties 105 70,71 94 33 4, 80, 94, 116, 117 101 93, 95 3 71 72 82 27 90, 91 98 28, 29, 105 82, 95, 96, 97 105
G
Gas analysis Gas cells, ow through Gas cells, heated Gas cell, holders Gas cells, long path Gas cells, short path Ge, crystal plate, HATR Ge, crystal plate, MIRacle Ge crystal plate GladiATR Ge, disks, windows Ge, properties GladiATR 100, 101, 111 99, 101, 102 100 94, 99 101 99 19 11 13 95, 96, 97 105 12, 13
Applications, semiconductor wafers 108, 109, 114
D
145 28, 53, 54 2, 3, 4, 80, 81, 84, 85 20, 23, 26, 27, 28 70, 71 72 9, 11 105 33 31 36 105 95, 96, 97
Grazing angle, specular reectance 45, 46, 49, 50, 54 Grazing angle, applications Grinder, SkakIR sample Grinding, samples Guarantee 49 92 92, 93, 104 145
H
Hand Press HATR HATRPlus HATR, out-of-compartment Heated, ATR Heated, diffuse reectance Heated platens accessory High pressure clamps Holders, sample, cell Holder, universal 87, 104 16, 17, 18, 19 16, 17, 18 16 21 33 89 10, 11 73, 74, 77, 86, 94 74, 94 94 94 16, 17, 18, 19, 20 145 87 90, 91
Diffuse reectance, theory and applications 39
E
EasiDiff, diffuse reectance Educational Sampling Kit Effective pathlength EPI Evanescent wave External sample module Extinction ratio, polarizers 5, 6, 32 4 27 109, 114 27, 28 113 53, 118
AutoPRO software 20, 21, 23, 25, 36, 37, 42, 43, 52, 76, 77, 78, 79, 108, 109, 110
Holder, pellets Holder, sample cards Horizontal ATR (HATR) How to order Hydraulic die Hydraulic presses
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I
Index of refraction Infrared reference materials Inserts for auto samplers Inserts for wafer holders Integrating sphere, products Integrating sphere, mid-IR Integrating sphere, NIR International distribution IR disks, windows 39, 49 105 108, 110 108, 110 55 56 58 145 85, 95, 96, 97
Microscope, MAX Microtiter plates Mid-IR, Falcon MIRacle, ATR accessory MIRacle, crystal plates MIRacle, ow through options MIRacle, heating options MIRacle, pressure clamps Mirror, alignment, 10Spec, 30Spec Mirror, alignment, 80Spec Mirror, alignment, AGA Mirror, alignment, VeeMAX Monolayer analysis Mortar and pestle Motorized VeeMAX Mull cell Mull cell, holders Mull cell, spacers Mull cell, windows Mull agents Multi-reection ATR Multi-SamplIR, transmission
68, 69, 70 37 84 8, 11 9, 11 11 11 11 44, 47 45 46 43 23, 42, 43, 45, 49 2, 3, 4, 5, 6, 32, 34, 87, 88, 90, 91, 93, 104 43 80 74, 80 80 80 93 16 76
Polyethylene, properties Powder, KBr P-polarization Press tips, MIRacle Press, hydraulic Press-On mull cell holders Pressure clamp, ATRMax Pressure clamp, GladiATR Pressure clamps, HATR Pressure clamps, MIRacle Pressure clamps, VeeMAX Properties, IR materials
105
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2, 3, 4, 5, 6, 32, 34, 38, 87, 88, 90, 91, 92, 93, 95 50 11 90, 91 2, 3, 4, 80 22 13, 15 19 10, 11 25 105
K
KBr, chunks, powder 2, 3, 4, 5, 6, 32, 34, 38, 87, 88, 90, 91, 92, 93, 95 KBr, dilution ratio KBr, disks, windows KBr, pellet KBr, properties Kit, abrasion Kit, crystal polishing Kit, sample preparation 105 57, 70, 71, 74, 80, 81, 82, 85, 99, 100, 102, 112 74, 87, 88, 90, 91, 131 105 32, 34, 36, 38 98 5, 6, 32, 34, 36, 38 5 2, 3, 4 50 95, 96, 97 22 18, 19 26 40 40
Q
Quantitative analysis 27, 28, 46, 58, 81, 82, 83, 84, 86, 103, 111 Quartz liquid cells, long-path 83
R
Reference materials, for FTIR Reference standards Reectance sampling Reection-absorption Returns, product Rotating Stage, IntegratIR RotatIR RotATR 126 126 49 49 145 59 77 69, 70
608-274-2721
Kit, reectance sampling Kit, transmission sampling Kramers-Kronig transform KRS-5, disks, windows KRS-5, ATRMAX plates KRS-5, HATR plates KRS-5, VATR crystal Kubelka-Munk conversion Kubelka-Munk equation
N
NaCl disks and windows 80, 81, 82, 85, 95, 96, 97, 99, 102 NaCl properties Needle plate NIR, AutoDiff NIR, Heated Transmission NIR, diffuse reectance NIR, Falcon NIR, X,Y Autosampler 105 81, 85 36 33 39 86 37 59 126 2, 3, 4, 93, 131 27
S
Sample cup, diffuse Sample grinder Sample holders, transmission Sample preparation kit Sample preparation, diffuse Sample preparation, transmission Sample vials, UpIR Sample cards Sample cup holder, diffuse Sample cups, diffuse 32 ,34, 36, 38 92 94 32, 34, 38 38, 104 93 35 77, 94 38 32, 34, 36, 38 113 1 82 114 108, 109, 110 99 92 80, 81, 85, 95, 96, 97 22 18 9, 11 105 8, 12 12 8 23 82, 95, 96, 97 105 49
L
Lambertian scatterer Library spectra Liquid cells Liquid cells, demountable Liquid cells, holder Liquid cells, sealed Liquids plate, MIRacle Liquid sampling, transmission Long path gas cells Long-path quartz liquid cells 56, 57, 60, 61 130, 131 80, 81, 82, 83, 85 80, 81, 85 80, 81, 83, 84 82 11 80, 81, 82, 83 101 83
NIST Traceable NIR Standard NIST Traceable Polystyrene Nujol Number of reections
O
Optical materials Order form O-rings die kit O-rings, liquid cells O-rings mull cells Out-of-compartment ATR 95, 96, 97, 98 144, 145 88 80, 81, 94 80, 81, 94 16
Sample module, external Sampling kits Sealed liquid cells Semiconductor applications Semiconductor wafers Septa for gas cells ShakIR sample grinder Si, disks, windows
M
Magnetic lm holder MAP300, wafer analysis MAP300 inserts MappIR, wafer analysis MappIR inserts Masks, 10Spec Masks, 30Spec Masks, 80Spec Masks, VeeMAX Materials, IR properties Micro ATR Micro Compression Cell Micro Diamond Cell MAX, IR microscope Micro Plane Microscope, IR 2, 3, 4, 89, 94 109 110 109 110 47 5, 6, 44 45 43 105 68, 69, 70 71 72 68, 69, 70 71 68
P
Pads, crystal polishing kit Payment terms Pellet preparation Pellet press Pestle PIKECalc Software Polarization, thin lms Polarizers Polarizers, automated Polarizers, manual Polarizers, UV-Vis 98 145 87, 88 88, 90, 91 2, 3, 4, 5, 6, 32, 34, 87, 88, 90, 91, 93, 104 129 53 51 52 52 118
Si crystal plate for ATRMAX Si crystal plate for HATR Si crystal plate for MIRacle Si, properties Single reection ATR Single reection ATR, GladiATR Single reection ATR, MIRacle Single reection ATR, VeeMAX SiO2, disks, windows SiO2, properties Snells Law
Polyethylene, disks and windows 80, 81, 95, 96, 97
Software, AutoPRO 20, 21, 23, 24, 36, 37, 42, 43, 52, 76, 77, 78, 79, 108, 109, 110, 123 Solid sampling, ATR 26, 27
Solid sampling, diffuse Solid sampling, transmission Spacers, demountable cells Spacers, mull cells Special applications Spectral data bases Specular reectance, absolute Specular reectance, 10Spec Specular reectance, 30Spec Specular reectance, 80Spec Specular reectance, 85Spec, UV-Vis Specular reectance, automated Specular reectance, theory, applications Specular reectance, VeeMAX S-polarization Standard Transmission Kit
39 103 80, 81, 85 80 107 125 48 47 44 45 120 42 49 42 50 2
Thin lm sampling Trademarks Transmission auto samplers Transmission cells Transmission cells, heated Transmission cells, NIR Transmission efciency, polarizers Transmission sampling products Transmission sampling kits Transmission sampling, gas Transmission, theory and applications Trough plate, ATRMAX Trough plate, HATR
89 145 70 80, 99 99 86 53 75 2, 3, 4 99 103 22 18
Viewer Pressure Clamp, MIRacle Volatiles cover, ATRMAX Volatiles cover, HATR Volatiles cover, MIRacle
10 22 18 11
INDEX
W
Wafer holders Website, PIKE Technologies Windows, drilled Windows, gas cells Windows, liquid cells Windows, mull cells Windows, transmission Windows, UpIR Wire-grid polarizers 108, 110 145 2, 3, 4, 81, 85, 96, 97 99, 100, 101, 102 81, 82, 83, 85 80 94 35 51
U
Ultima Sampling Kit Universal sample holder UpIR, diffuse reectance 6 74, 94 35 115 116 118 119 120 121 5 20, 23, 26 26 23 24, 25 121 23 35 35
X
X, Y Autosampler X, Y Autosampler, diffuse X, Y Autosampler, transmission X,Y,R-Theta,and Y Autosampler for UV-Vis 37, 79 37 79 123
T
Teon gaskets, demountable cell Teon gaskets, liquid cell Teon o-rings, demountable cell Teon o-rings, liquid cell Temperature control, diffuse Temperature control, HATR Temperature control, MIRacle Temperature control, transmission Terms and conditions TGA/FTIR accessory Theory, ATR Theory, diffuse reectance Theory, polarization Theory, specular reectance Theory, transmission 81, 85 81, 85 81, 85 81, 85 81, 85 19 11 84, 86 145 111 27 39 53 49 103
UV-Vis Accessories UV-Vis cuvettes, cells, vials, and holders UV-Vis polarizers UV-Vis Spec UV-Vis 85Spec UV-Vis VeeMAX Valu-Line Reectance Sampling Kit Variable angle ATR VATR VeeMAX, ATR VeeMAX, motorized VeeMAX, UV-Vis VeeMAX, variable angle specular Vial holder, UpIR Vials, UpIR
Z
ZnS, disks, windows ZnS, properties 82, 95, 96, 97 105
ZnSe, disks, windows 80, 81, 82, 85, 95, 96, 97, 99, 102 ZnSe, ATRMAX crystal plates ZnSe, HATR crystal plates ZnSe, MIRacle crystal plate ZnSe, properties ZnSe, VeeMAX, ATR crystal 22 18 11 105 25
NOTES
135
Part Number Index

007-0300 PIKECalc Software 25, 129 130 017-28XX 131 017-3912 47 45, 47 44 44 44 45 45 25, 43 017-3980 021-19XX 021-4000 021-4010 021-4020 021-4030 021-4040 021-4050 021-4060 021-4070 021-4080 021-4090 021-4100 021-4110 021-4120 021-4130 021-4150 021-4160 021-5020 021-5030 021-5040 021-5050 022-10XX 022-11XX 022-12XX 022-19XX 016-28XX 008-1000 to ATR Spectral Data Bases 008-3026 008-4001 to Transmission Spectral Data Bases 008-5021 010-10XX 010-3010 011-1000 011-2010 10Spec 10 Degree Specular Reectance Accessory Sample Masks (3/8", 5/8" and 2") 30Spec Specular Reectance Accessory (30 degree) Sample Masks (3/8", 1/4", and 3/16") 45Spec Specular Reectance Accessory (45 degree) 80Spec Specular Reectance Accessory 80Spec Specular Reectance Acc. with Sample Masks (3/8", 5/8" & 2") VeeMAX II Variable Angle Specular Reectance Accessory MappIR Automated Semiconductor Wafer Accessory for 8" Wafers MAP300 Automated Semiconductor Wafer Accessory for 12" Wafers Additional 12" Wafer Mount (MAP300 only) Insert to Support 8" Wafer (MAP300 only) VATR Variable Angle, Vertical ATR KRS-5, 45 Parallelogram, 50 mm KRS-5, 60 Parallelogram, 50 mm KRS-5, 45 Parallelogram, 25 mm KRS-5, 60 Parallelogram, 25 mm ZnSe, 45 Parallelogram, 50 mm ZnSe, 45 Parallelogram, 25 mm Ge, 45 Parallelogram, 50 mm Ge, 60 Parallelogram, 50 mm Ge, 45 Parallelogram, 25 mm Ge, 60 Parallelogram, 25 mm Ge, 30 Parallelogram, 25 mm Si, 45 Parallelogram, 25 mm ZnSe, 60 Parallelogram, 25 mm Ge, 30 Parallelogram, 50 mm ZnSe, 60 Parallelogram, 50 mm Si, 45 Parallelogram, 50 mm 25 mm VATR Crystal Holder, Clamp and Mirror Set of 25 mm and 50 mm Pads 25 mm VATR Crystal Holder and Clamp 50 mm VATR Crystal Holder and Clamp HATR Trough Plate System, with 45 ZnSe Crystal HATR Flat Plate System, with 45 ZnSe Crystal HATR Combined Trough and Flat Plate System with 45 ZnSe Crystals HATR Platform Optics Assembly 110 110 110 110 26 26 26 26 26 26 26 26 26 26 26 26 26 26 26 26 26 26 26 26 26 18 18 18 18 18 18 18 18 18 18 18 18 18 18 18 18 18 18 18 18 19 19 19 19 19 19 19
136
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011-4500 012-10XX 012-11XX 013-10XX 013-10XXX 013-2800 013-2850 013-3100 013-3110 013-3112
UV-Vis VeeMAX Variable Angle Specular Reectance Accessory 121 Motorized Upgrade for VeeMAX II Motorized Option for VeeMAX II VeeMAX ATR Pressure Clamp ZnSe Crystal, 45 Ge Crystal, 45 Si Crystal, 45 ZnS Crystal, 45 ZnSe Crystal, 60 Ge Crystal, 60 Si Crystal, 60 ZnS Crystal, 45 Electrochemical Cell 45 Alignment Fixture 60 Alignment Fixture Liquid Retainer for VeeMAX II ATR crystals VeeMAX II ATR Flow Cell Mask Set for VeeMAX VeeMAX II Sample Masks (2", 5/8" & 3/8") Aperture Mask Set (7 mm, 13 mm, and 25 mm x 4 mm) Flat Plate, ZnSe, 45 Flat Plate, ZnSe, 60 Flat Plate, Ge, 45 Flat Plate, Ge, 60 Flat Plate, Ge, 65 Flat Plate, Si, 60 Flat Plate, Si, 45 Flat Plate, ZnS, 45 Flat Plate, ZnS, 60 Heated Flat Plate, ZnSe, 45 Heated Flat Plate, ZnSe, 60 Heated Flat Plate, Ge, 45 Heated Flat Plate, Ge, 60 Heated Flat Plate, Ge, 65 Heated Flat Plate, Si, 60 Heated Flat Plate, Si, 45 Heated Flat Plate, ZnS, 45 Heated Flat Plate, ZnS, 60 ATR Variable Angle Heating Conversion Plate Absolute Reectance Accessory AGA Grazing Angle Specular Reectance Accessory 25, 43 25, 43 25 25 25 25 25 25 25 25 25 25 25 25 25 25 25 43 121 25 25 25 25 25 25 25 25 25 25 25 25 25 25 25 25 25 25 22, 25 48 46
608-274-2721
013-3114 013-3115 013-3130 013-3132 013-3134 013-3135 013-3200 013-3245 013-3260 013-3400 013-3500 013-4010 013-4010 013-4015 013-4020 013-4030 013-4040 013-4050 013-4060 013-4070 013-4080 013-4090 013-4095 013-4120 013-4130 013-4140 013-4150 013-4160 013-4170 013-4180 013-4190 013-4195 013-4200 014-10XX 015-10XX
022-2010-45 Trough Plate, ZnSe, 45 022-2012-45 Trough Plate, ZnSe, 45, 2 mm 022-2020-45 Flat Plate, ZnSe, 45 022-2022-45 Flat Plate, ZnSe, 45, 2 mm 022-2024-45 Sealed Flat Plate, ZnSe, 45 022-2030-45 Trough Plate, KRS-5, 45 022-2040-45 Flat Plate, KRS-5, 45 022-2050-45 Trough Plate, Ge, 45 022-2052-45 Trough Plate, Ge, 45, 2 mm 022-2060-45 Flat Plate, Ge, 45 022-2062-45 Flat Plate, Ge, 45, 2 mm 022-2064-45 Sealed Flat Plate, Ge, 45 022-2070-45 Trough Plate, AMTIR, 45 022-2080-45 Flat Plate, AMTIR, 45 022-2090-45 Trough Plate, Si, 45 022-2100-45 Flat Plate, Si, 45 022-2300 022-3040 022-3042 022-3045 022-3047 022-3050 022-3051 RCPlate for HATR (for 45 crystals) Viton O-ring, HATR Flow Cell, Upper (6 ea.) HATR Flow Cell Upper Teon O-Ring Viton O-ring, HATR Flow Cell, Lower (6 ea.) HATR Flow Cell Lower Teon O-Ring HATR (pivoting) Pressure Clamp HATR Volatiles Cover
INDEX
022-3052 022-3054 022-3110 022-3111 022-3112 022-3113 022-3114 022-3130 022-3132 022-4010 022-4020 022-4030 022-4040 022-4050 022-5110 022-5120 022-5130 022-5140 022-5150 022-5210 022-5220 022-5230 022-5240 022-5250 022-5310 022-5320 022-5330 022-5340 022-5350 022-5410 022-5420 022-5430 022-5440 022-5450 023-10XX 023-11XX 023-12XX 023-19XX 023-2001 023-2002 023-2003 023-2011 023-2012 023-2013 023-2021 023-2022 023-2023 023-2031 023-2032 023-2033 023-2041 023-2042 023-2043
HATR Powder Press HATR High-Pressure Clamp Crystal, 45, Trap, 80 x 10 x 4 mm ZnSe Crystal, 45, Trap, 80 x 10 x 4 mm KRS-5 Crystal, 45, Trap, 80 x 10 x 4 mm Ge Crystal, 45, Trap, 80 x 10 x 4 mm AMTIR Crystal, 45, Trap, 80 x 10 x 4 mm Si Crystal, 60, Trap, 80 x 10 x 4 mm ZnSe Crystal, 60, Trap, 80 x 10 x 4 mm Ge HATR Flow Cell, ZnSe, 45 HATR Flow Cell, AMTIR, 45 HATR Flow Cell, KRS-5, 45 HATR Flow Cell, Si, 45 HATR Flow Cell, Ge, 45 HATR Heated Trough Plate, ZnSe, 45 HATR Heated Trough Plate, AMTIR, 45 HATR Heated Trough Plate, KRS-5, 45 HATR Heated Trough Plate, Si, 45 HATR Heated Trough Plate, Ge, 45 HATR Heated Flow-Through Cell, ZnSe, 45 HATR Heated Flow-Through Cell, AMTIR, 45 HATR Heated Flow-Through Cell, KRS-5, 45 HATR Heated Flow-Through Cell, Si, 45 HATR Heated Flow-Through Cell, Ge, 45 HATR Liquid Jacketed Trough Plate, ZnSe, 45 HATR Liquid Jacketed Trough Plate, AMTIR, 45 HATR Liquid Jacketed Trough Plate, KRS-5, 45 HATR Liquid Jacketed Trough Plate, Si, 45 HATR Liquid Jacketed Trough Plate, Ge, 45 HATR Liquid Jacketed Flow-Through Plate, ZnSe, 45 HATR Liquid Jacketed Flow-Through Plate, AMTIR, 45 HATR Liquid Jacketed Flow-Through Plate, KRS-5, 45 HATR Liquid Jacketed Flow-Through Plate, Si, 45 HATR Liquid Jacketed Flow-Through Plate, Ge, 45 ATRMax II Trough Plate System with 45 ZnSe Crystal ATRMax II Flat Plate System with 45 ZnSe Crystal ATRMax II Combined Trough & Flat Plate System with 45 ZnSe Crystals ATRMax II Variable Angle HATR Trough Plate, ZnSe, 45 Trough Plate, KRS-5, 45 Trough Plate, Ge, 45 Flat Plate, ZnSe, 45 Flat Plate, KRS-5, 45 Flat Plate, Ge, 45 Trough Plate, ZnSe, 30 Trough Plate, KRS-5, 30 Trough Plate, Ge, 30 Flat Plate, ZnSe, 30 Flat Plate, KRS-5, 30 Flat Plate, Ge, 30 Trough Plate, ZnSe, 60 Trough Plate, KRS-5, 60 Trough Plate, Ge, 60
19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 19 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22
023-2044 023-2045 023-2046 023-2047 023-2051 023-2052 023-2053 023-2300 023-2800 023-2850 023-3050 023-3051 023-3052 023-3110 023-3112 023-3113 023-3114 023-3120 023-3121 023-3130 023-3132 023-3133 023-3134 023-4000 023-4100 023-4200 023-4300 023-4400 024-11XX 024-19XX 024-3050 024-3053 025-18XX 025-2018 025-2038 025-2058 025-2098 025-2107 025-2108 025-2118 025-2208 025-3020 025-3035 025-3050 025-3052 025-3053 025-3054 025-3061 025-3092 025-3093 025-3094 025-3095
Trough Plate, Si, 45 Flat Plate, Si, 45 Trough Plate, AMTIR, 45 Flat Plate, AMTIR, 45 Flat Plate, ZnSe, 60 Flat Plate, KRS-5, 60 Flat Plate, Ge, 60 RCPlate for ATRMax II Motorized Upgrade for ATRMax II Motorized Option for ATRMax II ATRMax Pressure Clamp ATRMax II Volatiles Cover ATRMax II Powder Press Crystal, 45 deg., Trap., 56 x 10 x 4, ZnSe Crystal, 45 deg., Trap., 56 x 10 x 4, Ge Crystal, 45 deg., Trap., 56 x 10 x 4, AMTIR Crystal, 45 deg., Trap., 56 x 10 x 4, Si Crystal, 30 deg., Trap., 56 x 10 x 4, Ge Crystal, 30 deg., Trap., 56 x 10 x 4, Si Crystal, 60 deg., Trap., 56 x 10 x 4, ZnSe Crystal, 60 deg., Trap., 56 x 10 x 4, Ge Crystal, 60 deg., Trap., 56 x 10 x 4, AMTIR Crystal, 60 deg., Trap., 56 x 10 x 4, Si ATRMax Flow Cell Assembly (Order crystal separately) ATRMax Liquid-Jacketed Flow Cell Assembly (Order crystal separately) ATRMax Heated Flow Cell Assembly (Order crystal separately) ATRMax Heated Trough Plate Assembly (Order crystal separately) ATRMax Heated Flat Plate Assembly (Order crystal separately) HATRPlus Flat Plate System, with 45 ZnSe Crystal HATRPlus Platform Optics Assembly HATRPlus (pivoting) Pressure Clamp HATRPlus High-Pressure Clamp MIRacle ATR Base Optics/Platform Assembly ZnSe Performance Crystal Plate 3 Reection ZnSe Performance Crystal Plate Ge Performance Crystal Plate Si Performance Crystal Plate Diamond/ZnSe/HS Performance Crystal Plate Diamond/ZnSe Performance Crystal Plate 3 Reection Diamond/ZnSe Crystal Plate Specular Reection Performance Plate High-Pressure Clamp Conned Space Clamp Micrometric, Low-Pressure Clamp Flat Tip for Micrometric Clamp MIRacle Clamp Tip Assortment Concave Tip for Micrometric Clamp Swivel Tip for Micrometric Clamp Concave Tip for High-Pressure Clamps Swivel Tip for High-Pressure Clamps 7.8 mm ATR Pressure Tip Flat Tip for High-Pressure Clamps
22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 18 18 19 19 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11, 25 11
137
025-3096 025-4018 025-4058 025-4108 026-17XX 026-18XX 026-19XX 026-2001 026-2002 026-2003 026-2004
Sealed Pressure Tip for High-Pressure Clamp Heated ZnSe Performance Crystal Plate Heated Ge Performance Crystal Plate Heated Diamond/ZnSe Performance Crystal Plate (60 C Max) GladiATR 300 Single Reection ATR Base Optics GladiATR Single Reection ATR Base Optics GladiATR Vision Base Optics GladiATR Standard Stainless Top GladiATR Heated Stainless Top GladiATR Liquid Jacketed Stainless Top GladiATR Vision Stainless Top GladiATR Vision Heated Stainless Top GladiATR Vision Liquid Jacketed Stainless Top Ge Crystal Plate (non-viewing) Diamond Crystal Plate GladiATR Vision Diamond Crystal Plate Specular Reection Plate (non-viewing) High-Pressure Clamp Volatiles Cover for Performance Plates USB Interface / Software for GladiATR Vision Heated Ge Crystal Plate, 130 C (non-viewing) Heated Diamond Crystal Plate, 210 C Heated Diamond Crystal Plate, 210 C, Vision Heated Diamond Crystal Plate, 300 C Liquid Jacketed Diamond Crystal Plate Liquid Jacketed Diamond Crystal Plate Liquid Jacketed Ge Crystal Plate Liquids Retainer for Performance Plates Flow-Through Attachment Liquids Retainer and Volatiles Cover Set X, Y, Z Adjustable Sample Position Non-Adjustable Sample Position Universal Spring Sample Holder Magnetic Sample Holder Micro KBr Pellet and Mull Holder Holder for Micro Diamond Cell 4X Beam Condenser 6X Beam Condenser MAX IR Microscope Transmission Upgrade MAX Sample Compartment IR Microscope for Transmission and Reection (ATR optional) Complete MAX Sample Compartment IR Microscope with Transmission, Reection, ATR and video camera MAX Sample Compartment IR Microscope with Transmission, Reection and ATR Video Camera for MAX Binocular Viewer for MAX Trinocular Viewer for MAX RotATR, MAX ATR, Ge Crystal
11 11 11 11 13 13 15 13 13 13 15 15 15 13, 15 13 15 13, 15 13, 15 11, 13, 15 15 13, 15 13 15 13 13 15 13 11, 13, 15 11, 13, 15 11, 13, 15 74 74 74 74 74 74 74 74 70 70 70 70 70 70 70 70
041-10XX 041-60XX 042-10XX 042-2010 042-2020 042-2025 042-3010 042-3020 042-3025 042-3030 042-3035 042-3040 042-3050 042-3060 042-3070 042-3080 042-3082 042-50XX 043-0900 043-28XX 043-3090 043-78XX 044-10XX 044-3010 044-3020 044-3030 044-3040 044-60XX 045-10XX 045-2000 045-2001 045-2002 045-2010 045-30XX 045-3100 045-3200 045-3300 045-3400 045-3410 045-35XX 045-4010 045-4012 045-4020 045-4030 045-4032 045-4050 045-4052 045-4100 045-4102
DiffusIR Accessory DiffusIR Accessory with Gold Coated Optics EasiDiff Accessory with Sample Preparation Kit
34 34 32
138
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WWW.PIKETECH.COM
Small Sample Cup (micro: 6.0 mm diam., 1.6 mm deep), 2 per package 32, 34, 36, 38 Large Sample Cup (macro: 10 mm diam., 2.3 mm deep), 2 per package 32, 34, 36, 38 EasiDiff Sample Slide Abrasion Sampling Kit Silicon Carbide Abrasive Disks (Pack of 100) Diamond Abrasive Disks (Pack of 50) Sample Cup Holder and Base Spatula Spoon Style Sample Preparation Kit Spatula Flat Style Abrasion Kit Disk Support Post Camel Hair Brush Alignment Mirror Alignment Mirror Gold 32 32, 34, 36, 38 32, 34, 36, 38 32, 34, 36, 38 32, 34, 38 2, 3, 4, 38, 93 32, 34, 38 2, 3, 4, 38, 93 38 38 32, 34, 36, 38 32, 34, 36, 38 32 36 36 36 36 35 35, 59 35 35 35
026-2005 026-2006 026-2050 026-2100 026-2102 026-2200 026-3020 026-3051 026-3510 026-4050 026-4100 026-4101 026-4102 026-4110 026-4112 026-4150 026-5010 026-5012 026-5013 031-2010 031-2020 031-2030 031-2040 031-2050 031-2070 031-40XX 031-60XX 034-0090 034-20XX 034-21XX 034-22XX 034-3010 034-3020 034-3030 034-3040 034-3060 034-3070 034-3080 034-40XX 034-41XX 034-42XX
EasiDiff Accessory, NIR Version with Gold Coated Optics AutoDiff, 60 Position Sampling Tray AutoDiff Automated Diffuse Reectance System AutoDiff Set of 60 Sampling Cups (macro) AutoDiff Automated Diffuse Reectance System, Gold-Coated Optics System UpIR Out-of-compartment Diffuse Reectance Accessory Glass Vial Holder Sample Vials with Threaded Caps, 21 mm x 70 mm, (200 per pkg.) Solids Sampling Insert Powders Sampling Insert
608-274-2721
UpIR Out-of-compartment Diffuse Reectance Accessory with Gold-Coated Optics 35 FlexIR NIR Fiber Optic Accessory Liquids Sampling Tip for FlexIR, 1.5 mm pathlength Liquids Sampling Tip for FlexIR, 1.0 mm pathlength Liquids Sampling Tip for FlexIR, 2.0 mm pathlength Diffuse Reectance Tip for FlexIR NIR Probe FlexIR Hollow Waveguide Accessory for MCT Detector Narrow-band MCT Detector Mid-band MCT Detector Wide-band MCT Detector Adjustable Probe Holder Standard Probe Holder FlexIR Hollow Waveguide Accessory for DTGS Probes ZnSe ATR Probe, 1 m ZnSe ATR Probe, 2 m Diffuse Reectance Probe, 1 m Specular Reectance Probe, 1 m Specular Reectance Probe, 2 m Ge ATR Probe, 1 m Ge ATR Probe, 2 m Diamond/ZnSe ATR Probe, 1 m Diamond/ZnSe ATR Probe, 2 m ZnSe ATR Probe, 1 m Specular Reectance Probe, 1 m Ge ATR Probe, 1 m Diamond/ZnSe ATR Probe, 1 m X, Y Autosampler Diffuse Reectance Conguration 66 66 66 66 66 65 65 65 65 65 65 65 65 65 65 65 65 65 65 65 65 65 65 65 65 37, 79
Micro Compression Cell for 13 mm IR Transparent Windows 70, 71 IR Microsampling Kit (3 position sample slide with gold mirror, 2 KBr windows, scalpel, tweezers and probes) Replacement Illumination Bulb for MAX MAX Sample Compartment IR Microscope for Reection (ATR optional) Complete MAX Sample Compartment IR Microscope for Reection, ATR and video camera MAX Sample Compartment IR Microscope with Reection and ATR 70 70 70 70 70
045-5010 045-5030 045-5050 045-5100 047-20XX
047-60XX 048-0060 048-0100 048-0150 048-0151 048-0200 048-10XX 048-11XX 048-2010 048-2020 048-2999 048-3000 048-3070 048-3071 048-3100 048-3150 048-3200 048-3300 048-3400 048-60XX 050-10XX 050-20XX 073-16XX 073-26XX 073-3600 073-3620 073-3630 073-3640 073-3650 073-3660 073-3800 073-3820 073-3830 073-3840 073-3850 073-3860 073-3880 073-60XX 073-90XX 073-9110 073-9130 074-26XX 074-3661 075-28XX 075-3881 076-1120 076-1130 076-1210 076-1220 076-1230 076-1410 076-1420
X, Y Autosampler Diffuse Reectance Conguration with Gold-Coated Optics Automated Transmission Tablet Analysis Stage for NIR IntegratIR Sample Plate with 18 mm x 2 mm ZnSe Window Rotating Stage for Petri Dish (for heterogeneous samples) Rotating Stage Adapter for 500 mL beaker Sample Plate with 18 mm x 2 mm KBr Window Upward Sample Positioning Mid-Infrared IntegratIR Integrating Sphere Accessory (complete) Downward Sample Positioning Mid-Infrared IntegratIR Integrating Sphere Accessory Specular Exclusion Port for Upward Sample Positioning IntegratIR Powder Sample Cup for Downward IntegratIR Glass Sample Vials (Pack of 25), 19 x 65 mm Diffuse Gold Reference NIST Traceable NIR Reference Standard NIST Traceable NIR Reference Standard Recertication Narrow-band MCT Detector MCT Detector Reconditioning Mid-band MCT Detector Wide-band MCT Detector DTGS Detector with CsI Detector Window NIR IntegratIR Integrating Sphere Accessory Valu-Line FTIR Reectance Accessories Kit Ultima Sampling Kit Vertical Wafer Accessory, Manual Version Vertical Wafer Accessory, Automated Version 6" Wafer Mount, Blank Insert to Support 2" Wafer Insert to Support 3" Wafer Insert to Support 4" Wafer Insert to Support 5" Wafer Additional Wafer Mount Blank Support for custom wafers (MappIR only) Insert to Support 2" Wafer Insert to Support 3" Wafer Insert to Support 4" Wafer Insert to Support 5" Wafer Insert to Support 6" Wafer Additional 8" Wafer Mount (MappIR only) X, Y Autosampler Diffuse Reectance/Transmission Conguration with Gold-Coated Optics X, Y Autosampler Diffuse Reectance/Transmission Cong. 96 Well Diffuse Reectance Sampling Plate 96 Well Transmission Sampling Plate Automated Transmission Multi-SamplIR for FTIR Additional Standard Sampling Plate Automated 8" Horizontal Transmission Accessory Additional Sampling Plate for 8" Automated Horizontal Transmission Accessory Dual Digital Temperature Control Module
076-1430 37, 79 076-2220 59 57 59 59 57 57 57 57 57 59 57, 59 59, 128 59, 128 57 57 57 57 57 59 5 6 108 108 108 108 108 108 108 108 110 110 110 110 110 110 110 37, 79 37, 79 37, 79 37, 79 76 76 78 78 112 076-6025 090-1000 090-1200 090-1300 090-1400 090-1500 090-1600 090-2000 090-2200 090-2300 090-2400 090-2500 090-2600 090-3000 090-3200 090-3300 090-3400 090-3500 090-3600 090-4000 090-4200 090-4300 090-4400 090-4500 090-4600 091-20XX 110-60XX 110-60XXX 111-3610 111-3620 111-3630 111-3640 111-3650 111-3660 111-40XX 115-0001 115-0005 115-0006 115-0007 115-0008 115-0009 115-0010 115-0011 115-0012 115-0013 115-0014 121-0500 121-0501 076-2420 076-28XX 076-3881
Digital Temperature Control Module, PC Control for Falcon Accessory Digital Temperature Control Module, HTV Chambers PC Controlled Temperature Module, HTV Chambers Automated 12" Horizontal Transmission Accessory
INDEX
84, 86, 122 34 34 78 78 11, 13, 15
Additional Sampling Plate for 12" Automated Horizontal Transmission Accessory Digital Force Adapter for High-Pressure Clamp Manual Polarizer, ZnSe Manual Polarizer, KRS-5 Manual Polarizer, CaF2 Manual Polarizer, BaF2 Manual Polarizer, Ge Manual Polarizer, Polyethylene Automated Polarizer, ZnSe Automated Polarizer, KRS-5 Automated Polarizer, CaF2 Automated Polarizer, BaF2 Automated Polarizer, Ge Automated Polarizer, Polyethylene Precision Manual Polarizer, ZnSe Precision Manual Polarizer, KRS-5 Precision Manual Polarizer, CaF2 Precision Manual Polarizer, BaF2 Precision Manual Polarizer, Ge Precision Manual Polarizer, Polyethylene Precision Manual Polarizer, ZnSe Precision Manual Polarizer, KRS-5 Precision Manual Polarizer, CaF2 Precision Manual Polarizer, BaF2 Precision Manual Polarizer, Ge Precision Manual Polarizer, Polyethylene RotatIR Automated Rotating Sample Stage NIR Falcon Base UV-Vis Falcon Base 5 mm Vial Holder 8 mm Vial Holder 12 mm Vial Holder 1 cm Cuvette Holder Cuvette Holder, 10 mm Adjustable Cuvette Holder 10-100 mm Mid-IR Falcon Base with Cell Holder Heated Transfer Line for Shimadzu TGA Heated Transfer Line for Mettler 851 TGA Heated Transfer Line for Mettler TGA Heated Transfer Line for TA Instruments TGA Heated Transfer Line for TA Instruments Q5000R TGA Heated Transfer Line for TA Instruments Q50/Q500 TGA Heated Transfer Line for TA Instruments 2050 TGA Heated Transfer Line for Netzsch TGA Heated Transfer Line for /PESTA6/4000 110V TGA Heated Transfer Line for SETARAM Heated Transfer Line for PESTA6/4000 220VTGA Aperture Mask (4 mm x 7 mm) Aperture Mask (35 mm x 3 mm) UV-Vis 15Spec UV-Vis 20Spec UV-Vis 30Spec
22, 43, 45, 46, 52 45, 46, 52 52 52 52 52 22, 25, 43, 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 52 77 86 122 86, 122 86, 122 86, 122 86, 122 117 117 84 112 112 112 112 112 112 112 112 112 112 112 119 120 119 119 119
4 Zone Digital Temperature Control Module for Shimadzu TGA 112 Digital Temperature Control Module (300 C) Digital Temperature Control Module Digital Temperature Control Module for Falcon Accessory Digital Temperature Control Module, PC Control (300 C) 13, 100
11, 13, 15, 19, 22, 25, 89 84,86,122 13,100
121-1500 121-2000 121-3000
Digital Temperature Control Module, PC Control 11, 13, 15, 19, 22, 25
139
121-4500 121-6000 121-85XXX 155-10XXL 155-10XXR 155-2010 155-2020 160-1001 160-1002 160-1003 160-1004
UV-Vis 45Spec UV-Vis 60Spec UV-Vis 85Spec Specular Reectance Accessory External Sample Module, Left Side External Sample Module, Right Side DLaTGS Detector for External Sample Module MCT Detector (mid band) for External Sample Module 13 x 2 mm ZnSe (6 pack) 25 x 2 mm CaF2 (6 pack) 25 x 5 mm KBr (6 pack) 25 x 2 mm NaCl (6 pack) 13 x 2 mm NaCl (6 pack) 38 x 19 x 4 mm NaCl (6 pack) 25 x 2 mm ZnSe (6 pack) 13 x 2 mm KBr Windows(6 pack) 25 x 4 mm KBr (6 pack) 32 x 3 mm KBr (6 pack) 25 x 5 mm NaCl (6 pack) 25 x 4 mm NaCl (6 pack) 32 x 3 mm NaCl (6 pack) 32 x 3 mm NaCl, Drilled (6 pack) 32 x 3 mm KBr, Drilled (6 pack) 41 x 23 x 3 mm ZnSe Demountable Liquid Cell Windows ZnSe, Drilled 32 x 3 mm ZnSe Disk Short-Path Gas Cell Windows ZnSe (25 X 4 mm) 13 x 2 mm ZnSe Press-On Demountable Liquid Cell Windows Si (25 X 4 mm) 25 x 2 mm Si 20 x 2 mm Si 41 x 23 x 6 mm NaCl, Drilled 41 x 23 x 6 mm NaCl 32 x 3 mm NaCl, Drilled Demountable Liquid Cell Windows NaCl, Plain 25 x 5 mm NaCl 25 x 4 mm NaCl Demountable Liquid Cell Windows KRS-5, Drilled Demountable Liquid Cell Windows KRS-5, Plain 25 x 4 mm KRS-5 20 x 2 mm KRS-5 38 x 19 x 4 mm KBr, drilled 38 x 19 x 4 mm KBr Window, KBr, 32 x 3 mm, Drilled, (6 ea.) Window, KBr, 32 x 3 mm, Plain (6 ea.) Window, KBr, 25 x 4 mm (2 ea.) 20 x 2 mm KBr 13 x 2 mm KBr Window (1 ea.) Demountable Liquid Cell Windows Ge, Drilled Demountable Liquid Cell Windows Ge, Plain
119 119 120 113 113 113 113 95 96 96 96 95 97 96 71, 95 96 96 96 96 96 96 96 97 81, 85, 96 34, 80, 81, 85, 96 80, 96, 99, 102 95 80, 96 96 95 97 97 81, 85, 96 80, 81, 85, 96 96 80, 96, 99, 102 81, 85, 96 80, 81, 85, 96 80, 96, 102 95 97 97 2, 3, 4, 81, 85, 96 2, 3, 4, 34, 80, 81, 85, 96 4, 80, 96, 99, 102 95 70, 71, 95 81, 85, 96 80, 81, 85, 96
160-1146 160-1147 160-1148 160-1150 160-1151 160-1152 160-1153 160-1154 160-1155 160-1156 160-1157 160-1158 160-1159 160-1160 160-1161 160-1162 160-1163 160-1164 160-1165 160-1166 160-1167 160-1168 160-1169 160-1170 160-1171 160-1172 160-1173 160-1178 160-1182 160-1183 160-1184 160-1185 160-1186 160-1187 160-1188 160-1189 160-1190 160-1191 160-1192 160-1193 160-1194 160-1195 160-1196 160-1197 160-1198 160-1199 160-1200 160-1201 160-1207 160-1208 160-1209 160-1210 160-1211 160-1212 160-1213 160-1214 160-1215
Demountable Liquid Cell Windows BaF2, Drilled Demountable Liquid Cell Windows BaF2, Plain 20 x 2 mm BaF2 38 x 19 x 2 mm ZnSe, Drilled 38 x 19 x 2 mm ZnSe 50 x 3 mm ZnSe 49 x 3 mm ZnSe 25 x 5 mm ZnSe 25 x 2 mm ZnSe Window 38 x 19 x 2 mm Si, Drilled 38 x 19 x 2 mm Si Demountable Liquid Cell Windows Si, Drilled 32 x 3 mm Si Disk 13 x 2 mm Si 38 x 19 x 4 mm NaCl, Drilled 38 x 19 x 4 mm NaCl 29 x 14 x 4 mm NaCl, Drilled 29 x 14 x 4 mm NaCl 50 x 3 mm NaCl 49 x 6 mm NaCl 41 x 3 mm NaCl 25 x 2 mm NaCl 20 x 2 mm NaCl 13 x 2 mm NaCl 50 x 3 mm KRS-5 25 x 2 mm KRS-5 13 x 2 mm KRS-5 37.5 x 4 mm KCl 41 x 23 x 6 mm KBr, Drilled 41 x 23 x 6 mm KBr 29 x 14 x 4 mm KBr, Drilled 29 x 14 x 4 mm KBr 50 x 3 mm KBr 49 x 6 mm KBr 41 x 3 mm KBr 25 x 5 mm KBr 38 x 19 x 4 mm Ge 13 x 2 mm Ge 38 x 19 x 4 mm CsI, Drilled 38 x 19 x 4 mm CsI 32 x 3 mm CsI, Drilled 32 x 3 mm CsI 25 x 4 mm CsI 20 x 2 mm CsI 13 x 2 mm CsI 32 x 3 mm AMTIR, Drilled 32 x 3 mm AMTIR 25 x 2 mm AMTIR Window 29 x 14 x 4 mm CaF2 50 x 3 mm CaF2 41 x 3 mm CaF2 25 x 5 mm CaF2 25 x 4 mm CaF2 25 x 2 mm CaF2 13 x 2 mm CaF2 38 x 19 x 4 mm BaF2 29 x 14 x 4 mm BaF2
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81, 85, 96 80, 81, 85, 96 95 97 97 97 97 96 35, 96 97 97 81, 85, 96 34, 80, 81, 85, 96 95 97 97 97 97 97 97 97 96 95 95 97 96 95 102 97 97 97 97 97 97 97 96 97 95 97 97 96 96 96 95 95 96 96 35, 96 97 97 97 96 80, 96, 99, 102 96 95 97 97
160-1005 160-1006 160-1007 160-1008 160-1009 160-1010 160-1011 160-1012 160-1013 160-1014 160-1015 160-1111 160-1112 160-1113 160-1114 160-1115 160-1116 160-1117 160-1118 160-1119 160-1120 160-1121 160-1122 160-1123 160-1124 160-1125 160-1126 160-1127 160-1128 160-1129 160-1130 160-1131 160-1132 160-1133 160-1134 160-1135 160-1136 160-1137 160-1138 160-1139 160-1140 160-1141 160-1142 160-1143 160-1144 160-1145
608-274-2721
Press-On Demountable Liquid Cell Windows Ge (25 X 4 mm) 80, 96 20 x 2 mm Ge 38 x 19 x 4 mm CaF2, drilled 38 x 19 x 4 mm CaF2 Demountable Liquid Cell Windows CaF2, Drilled Demountable Liquid Cell Windows CaF2, Plain CaF2 Flat Window, 20 mm diameter 38 x 19 x 4 mm BaF2, drilled 95 97 97 81, 85, 96 80, 81, 85, 96 25, 95 97
160-1216 160-1217 160-1218 160-1233 160-1241 160-1269 160-1270 160-1275 160-1276 160-1277 160-1279 160-1280 160-1287 160-1288 160-1289 160-1290 160-1291 160-1292 160-1293 160-1301 160-1304 160-1305 160-1306 160-1307 160-1308 160-1311 160-1312 160-1313 160-1315 160-1316 160-1320 160-1321 160-1322 160-1323 160-1324 160-1326 160-1329 160-1341 160-1342 160-1343 160-1344 160-1349 160-1350 160-1353 160-1355 160-1357 160-5000 160-5003 160-5004 160-5007 160-5009 160-5010 160-5011 160-5012 160-5014 160-5016 160-5025
41 x 3 mm BaF2 25 x 4 mm BaF2 13 x 2 mm BaF2 38 x 3 mm SiO2 13 x 2 mm ZnS 38 x 19 x 2 mm AMTIR 38 x 19 x 2 mm AMTIR, Drilled 38 x 19 x 2 mm ZnS 38 x 19 x 2 mm ZnS, Drilled 41 x 23 x 3 mm ZnS 41 x 23 x 3 mm ZnS, Drilled 41 x 23 x 3 mm ZnSe, Drilled 37.5 x 4 mm CaF2 37.5 x 4 mm KBr 25 x 4 mm KCl 37.5 x 4 mm NaCl 37.5 x 4 mm ZnSe 38 x 19 x 4 mm SiO2 38 x 19 x 4 mm SiO2, Drilled 13 x 2 mm AMTIR ZnSe Flat Window, 20 mm diameter 25 x 2 mm KBr 25 x 2 mm BaF2 25 x 2 mm Ge Window 25 x 2 mm CsI 25 x 5 mm BaF2 25 x 5 mm KRS-5 25 x 5 mm Ge 38 x 3 mm ZnS 25 x 5 mm CsI Window, KBr 38 x 6 mm (2 ea.) 38 x 6 mm NaCl 38 x 6 mm BaF2 38 x 6 mm Ge 38 x 6 mm Si 38 x 6 mm CsI 38 x 6 mm ZnSe 41 x 3 mm ZnSe 38 x 6 mm CaF2 38 x 6 mm KRS-5 38 x 3 mm KRS-5 38 x 3 mm BaF2 38 x 3 mm Ge 38 x 3 mm Si 38 x 6 mm SiO2 38 x 6 mm AMTIR 25 x 2 mm Sapphire Window 13 x 1 mm KBr 13 x 1 mm NaCl 29 x 14 x 4 mm Ge 29 x 14 x 4 mm KRS-5 29 x 14 x 4 mm BaF2, Drilled 29 x 14 x 4 mm CaF2, Drilled 29 x 14 x 4 mm Ge, Drilled 29 x 14 x 4 mm KRS-5, Drilled 38 x 19 x 4 mm KRS-5, Drilled 38 x 3 mm ZnSe
97 80, 96, 99, 102 95 96 95 97 97 97 97 97 97 97 102 102 102 102 102 97 97 95 25, 95 96 96 35, 96 96 96 96 96 96 96 3, 96, 99, 100, 112 96, 99 96, 99, 100 96 96 96 96, 99, 100, 112 97 96, 99 96, 100 96 96 96 96 96 96 35 95 95 97 97 97 97 97 97 97 96
160-5027 160-5029 160-5030 160-5031 160-5032 160-5047 160-5048 160-5049 160-5052 160-5084 160-5086 160-5087 160-5089 160-5090 160-5100 160-5118 160-5119 160-5146 160-5147 160-5152 160-5153 160-5157 160-5161 160-5164 160-5173 160-5177 160-5201 160-5205 160-5206 160-5211 160-5213 160-5214 160-5215 160-5216 160-5217 160-5218 160-5219 160-5220 160-8010 160-8015 161-0500 161-0510 161-0520 161-0521 161-0522 161-1010 161-1018 161-1024 161-1027 161-1028 161-1035 161-1037 161-1070 161-1100 161-1900 161-1903 161-1906
49 x 6 mm BaF2 49 x 6 mm CsI 50 x 3 mm BaF2 38 x 19 x 4 mm KRS-5 38 x 19 x 4 mm Ge, Drilled 32 x 3 mm ZnS 32 x 3 mm ZnS, Drilled 32 x 3 mm SiO2 Disk 32 x 3 mm SiO2, Drilled 25 x 2 mm ZnS 25 x 2 mm SiO2 25 x 4 mm ZnS 25 x 4 mm SiO2 25 x 5 mm ZnS 25 x 5 mm SiO2 20 x 2 mm ZnS 20 x 2 mm SiO2 41 x 23 x 6 mm BaF2 41 x 23 x 6 mm CaF2 41 x 23 x 6 mm BaF2, Drilled 41 x 23 x 6 mm CaF2, Drilled 41 x 3 mm ZnS 49 x 3 mm ZnS 49 x 6 mm SiO2 50 x 3 mm CsI 50 x 3 mm ZnS 13 x 2 mm SiO2 49 x 6 mm KRS-5 49 x 6 mm CaF2 20 x 2 mm Polyethylene 25 x 2 mm Polyethylene 25 x 4 mm Polyethylene 32 x 3 mm Polyethylene, Drilled 32 x 3 mm Polyethylene 41 x 3 mm Polyethylene 38 x 3 mm Polyethylene 38 x 6 mm Polyethylene 38 x 3 mm KBr KBr Powder, 100 g KBr Chunks, 100 g Nujol, 1 0z. Fluorolube, 1 0z. Glass Syringe, 1 mL Glass Syringe, 2 mL Glass Syringe, 5 mL 7 mm Die Set KBr Single Pellet Holder 3 mm Die Set PIKE Hand Press Body 1 mm die set Stainless Steel Vial with Ball, 1" long x 0.5" Spare Stainless Steel Ball ShakIR, Heavy Duty Sample Grinder, 110/220V Hand Press for 7 mm, 3 mm, and 1 mm pellets Evacuable Pellet Press for 13 mm pellets Anvils (2 each) for PIKE Evacuable Pellet Press Piston O-Rings (2 each)
INDEX
141
97 97 97 97 97 96 96 34, 96 96 96 96 96 96 96 96 95 95 97 97 97 97 97 97 97 97 97 95 97 97 95 96 80, 96 81 ,96 80, 81, 96 97 96 96 96 2, 3, 4, 38, 87, 88, 90, 91, 92, 93, 95 93, 95 2, 3, 4, 93 2, 3, 4, 93 81, 82 2, 3, 4, 81, 82 82, 82 2, 3, 87 2, 3, 87, 94 87 2, 3, 87 87 92 92 92 87 88, 90, 91 88 88
161-1907 161-1908 161-2500 161-2511 161-2520 161-2530 161-2540 161-2550 161-3500 161-5035 161-5040
Base O-Rings (2 each) Pellet Extracting Tool Bolt Press (for KBr pellets) Wrench Set for Bolt Press (2 ea.) Bolt Press Holder Slide Sample Holder, Quartz/Cylindrical Cell, 10 20 mm Slide Sample Holder, Quartz/Cylindrical Cell, 50 mm Slide Sample Holder, Quartz/Cylindrical Cell, 100 mm Hydraulic Die for 13 mm pellets 35 mm Agate Mortar and Pestle 40 mm Agate Mortar and Pestle 50 mm Agate Mortar and Pestle 65 mm Agate Mortar and Pestle 95 mm Agate Mortar and Pestle 100 mm Agate Mortar and Pestle Dual Pellet Holder for 7 mm, 3 mm, and 1 mm pellets Finger Cots (12 ea.) Micro Diamond Cell, 1.6 mm Micro Diamond Cell, 2.0 mm Micro Plane with Carbide Blade Micro Plane with Diamond Blade 5 mm Disposable Glass Vials, 6 mm x 50 mm (200/pk) 8 mm Glass Vials (200/pk) 12 mm Glass Vials (200/pk)
88 88 4, 87 4, 87 87, 94 83, 117 83, 117 83, 117 87 4, 93 93 2, 3, 87, 88, 90, 91, 93 93 93 93 87, 94 2, 3, 4 70, 72, 74 70, 72, 74 70, 71 70 ,71 86, 117 86, 117 86, 117 116 116 116
162-1330 162-1600
Viton O-Rings, 32 mm (12 each) Demountable Liquid Cell for the mid-IR Falcon Accessory
80 85 82 83, 117 83, 117 83, 117 83, 117 117 117 117 117 117 117 117
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162-1601 to Super-Sealed Liquid Cells 162-1689 162-1801 162-1802 162-1805 162-1810 162-1831 162-1832 162-1835 162-1840 162-1841 162-1842 162-1845 162-1850 162-2000 162-2009 162-20XX 162-2100 162-2101 162-2102 162-2105 162-2106 162-2109 162-2115 162-2150 162-2155 162-2200 Long-Path Quartz Cell, 10 mm Long-Path Quartz Cell, 20 mm Long-Path Quartz Cell, 50 mm Long-Path Quartz Cell, 100 mm Cylindrical Cells with Teon Stoppers, Optical Glass, 10 mm Cylindrical Cells with Teon Stoppers, Optical Glass, 20 mm Cylindrical Cells with Teon Stoppers, Optical Glass, 50 mm Cylindrical Cells with Teon Stoppers, Optical Glass, 100 mm Cylindrical Cells with Teon Stoppers, Far UV Quartz, 10 mm Cylindrical Cells with Teon Stoppers, Far UV Quartz, 20 mm Cylindrical Cells with Teon Stoppers, Far UV Quartz, 50 mm
161-5050 161-5065 161-5095 161-5100 161-5700 161-6000 162-0010 162-0020 162-0030 162-0040 162-0205 162-0208 162-0212
Cylindrical Cells with Teon Stoppers, Far UV Quartz, 100 mm 117 Comprehensive Transmission Sampling Kit (CTS) Gases, Solids and Liquids Viton O-Rings, (2 each), max temp, 200 C Heated Gas Flow Cell Short-Path EC Gas Cell, 100 mm pathlength EC Gas Cell Glass Body for 100 mm Cell EC Gas Cell Window Cap EC Gas Cell Holder, 25 mm x 100 mm Septa (12 each) EC Viton O-Rings (2 each) Gas Cell Holder, 25 mm x 50 mm Short-Path EC Gas Cell, 50 mm pathlength EC Gas Cell Glass Body for 50 mm Cell HT Gas Cell, 100 mm Gas Cell, 38 mm diameter HT Glass Body for 100 mm Cell HT Cell Window Cap HT Gas Cell Holder, 38 mm x 100 mm HT Viton O-Rings (2 each) Gas Cell Holder,38 mm x 50 mm Short-Path HT Gas Cell, 50 mm pathlength Glass Body for 50 mm Cell High Temperature O-Rings, (1 each), max temp, 325 C TGA/FTIR Accessory Flow Cell Heated 2.4 Meter Long-Path Gas Cell Heating Jacket for 2.4 Meter Long-Path Gas Cell 3 100 100 4, 99 99 99 94, 99 99 99 94 99 99 3, 99 99 99 94, 99 99 94 99 99 100, 112 112 102 102
608-274-2721
162-0220 to Standard Rectangular Cuvettes 162-0267 162-0268 to Semi-micro Rectangular Cuvettes 4 mm Opening 162-0307 162-0308 to Micro Rectangular Cuvettes 2 mm Opening 162-0347 162-0348 162-0349 162-1000 162-1100 162-1104 162-1110 162-1120 162-1130 162-1140 162-1150 162-1160 162-1170 162-1190 162-1201 162-1202 162-1205 162-1210 162-1220 162-1230 162-1240 162-1250 162-1260 162-1270 162-1290 162-1300 162-1310 162-1320 Polystyrene, Disposable Cuvettes, 10 mm pathlength, 4.5 mL (100/pk) Polystyrene, Semi-micro Disposable Cuvettes, 10 mm pathlength, 1.5 mL (100/pk) Standard Transmission Sampling Kit (STS) Solids and Liquids Demountable Liquid Cell Assembly/Holder Demountable Liquid Cell Needle Plate Press-On Demountable Liquid Cell Spacers 0.015 (25 mm) Press-On Demountable Liquid Cell Spacers 0.025 (25 mm) Press-On Demountable Liquid Cell Spacers 0.050 (25 mm) Press-On Demountable Liquid Cell Spacers 0.100 (25 mm) Press-On Demountable Liquid Cell Spacers 0.200 (25 mm) Press-On Demountable Liquid Cell Spacers 0.500 (25 mm) Press-On Demountable Liquid Cell Spacers 1.000 (25 mm)
117 117 2
162-2201 162-2202 162-2205 162-2209 162-2215 162-2250 162-2255 162-2309 162-24XX 162-2504 162-2505 162-2509 162-2510 162-2511 162-2601 162-26XX 162-2801 162-28XX 162-29XX 162-3000 162-31XX 162-32XX 162-33XX 162-34XX 162-35XX 162-3600
2, 3, 4, 81 81 80 80 80 80 80 80 80
Digital Temperature Controller for Heated Long-Path Gas Cells 102 2.4 Meter Long-Path Gas Cell O-Rings & Gaskets for 2.4 M Gas Cell O-Rings & Gaskets for 10 M & 16V Gas Cells 10.0 Meter Long-Path Gas Cell O-Rings & Gaskets for 22 M & 33 M Gas Cells 22.0 Meter Long-Path Gas Cell 33.0 Meter Long-Path Gas Cell Educational Transmission Sampling Kit (ETS) Gases, Solids and Liquids 1-16 Meter Variable Long-Path Gas Cell Heated 10.0 Meter Long-Path Gas Cell Heated 22.0 Meter Long-Path Gas Cell Heated 33.0 Meter Long-Path Gas Cell Heated 1-16 Meter Variable Long-Path Gas Cell Press-On Demountable Liquid Cell Holder for 25 mm Windows 102 102 102 102 102 102 102 4 102 102 102 102 102 80, 94
Press-On Demountable Liquid Cell Spacers Assortment (25 mm) 80 Spacer for 1 mm Pathlength Cuvette Spacer for 2 mm Pathlength Cuvette Spacer for 5 mm Pathlength Cuvette Demountable Liquid Cell Spacers 0.015 (32 mm) Demountable Liquid Cell Spacers 0.025 (32 mm) Demountable Liquid Cell Spacers 0.050 (32 mm) Demountable Liquid Cell Spacers 0.100 (32 mm) Demountable Liquid Cell Spacers 0.200 (32 mm) Demountable Liquid Cell Spacers 0.500 (32 mm) Demountable Liquid Cell Spacers 1.000 (32 mm) Teon Spacers Assortment Teon Stoppers for Needle Plate (12 each) Teon Gaskets (12 each) Teon O-Rings (12 each) 117, 122 117, 122 117, 122 80, 81, 85 80, 81, 85 80, 81, 85 80, 81, 85 80, 81, 85 80, 81, 85 80, 81, 85 2, 3, 4, 80, 81, 85 81, 82 81 81
162-3610 162-3621 162-3700 162-3800 162-3900 162-4000 162-4010 162-4011 162-4012 162-4013 162-4014 162-4015 162-4140 162-4150 162-4160 162-4180 162-4190 162-4210 162-4215 162-4251 162-4270 162-5300 162-5400 162-5410 162-5420 162-5430 162-5440 162-5450 162-5460 162-5470 162-5475 162-5476 162-5480 162-5481 162-5482
Press-On Demountable Liquid Cell Holder for 32 mm Windows Viton O-Rings, 25 mm (12 each) Heating Jacket for 10.0 Meter Long-Path Gas Cell
162-5485 2, 3, 4, 80, 94 80 102 102 102 98 98 98 98 98 98 98 34 34 34 34 34 34 34 34 34 181-1312 181-2000 181-3000 181-3020 181-3010 181-3011 181-3012 181-3013 181-3014 181-3015 198-1623 198-1624 198-1625 198-1626 300-0002 300-0025 300-0039 300-0300 300-0301 430-1110 430-1120 181-1120 181-1300 181-1302 181-1310 162-5486 162-5500 162-5600 162-5610 162-5611 162-5612 162-6401 181-1100 181-1110
MidIR Diffuse Reectance Wavelength Standard (1.65" optical area) MidIR Diffuse Reectance Wavelength, recertication Heavy-Duty Magnetic Film Holder Universal Sample Holder, 20 mm aperture Universal Sample Holder, 10 mm aperture 25 mm O-Rings for Universal Sample Holder (6 each) 10 mm O-Rings for Universal Sample Holder (6 each) 3-position Sample Slide for 13 mm Windows PIKE CrushIR Hydraulic Press PIKE CrushIR Hydraulic Press, Evacuable Pellet Press and Magnetic Holder PIKE CrushIR Heated Platens Package PIKE Auto-CrushIR Hydraulic Press (110V) PIKE Auto-CrushIR Hydraulic Press (220V) PIKE Auto-CrushIR, with Evacuable Pellet Press, and Magnetic Holder (110V) PIKE Auto-CrushIR, with Evacuable Pellet Press, and Magnetic Holder (220V) PIKE Heated Platens Accessory Spacer Set (15, 25, 50, 100, 250, 500 microns) Aluminum Disks, 50 each Spacer, 15 micron Spacer, 25 micron Spacer, 50 micron Spacer, 100 micron Spacer, 250 micron Spacer, 500 micron Manual Glan-Taylor Manual UV Glan-Thompson Automated Glan-Taylor Automated UV Glan-Thompson Gold Substrate Alignment Mirror (1.25" x 3.0")
INDEX
127 127 94 2, 3, 94 94 94 94 70, 71 90 90 90 91 91 91 91 89, 91 89 89 89 89 89 89 89 89 118 118 118 118
Heating Jacket for 22.0 and 33.0 Meter Long-Path Gas Cell Heating Jacket for 1-16 Meter Variable Long-Path Gas Cell Crystal Polishing Kit Glass Plate Polishing Pads (6 each) Grinding Compound (400 grit) Grinding Compound (600 grit) Polishing Compound Brushes (6 each) DiffusIR Environmental Chamber (LTV), -150 to 500 C DiffusIR Environmental Chamber (HTV), ambient to 500 C Liquid Nitrogen Cooled System and Temperature Control Module DiffusIR Environmental Chamber (LTV) -150 to 500 C High Pressure Adaptation for Heated Chambers (HTV) DiffusIR Environmental Chamber (HTV), ambient to 900 C O-Ring, DiffusIR Chamber, 10 ea. O-Ring, DiffusIR Chamber Cooling Line, 10 ea. Ceramic Cup, DiffusIR Chamber, Porous Alignment Mirror, DiffusIR Chamber Magnetic Film Holder for 13 mm pellets and lm samples
2, 3, 4, 88, 89, 90, 91, 94 2, 3,4, 77, 94 88, 90, 91, 94 126 126 126 126 48, 126 128 128 128 127 127 127
Film Sampling Card 20 mm clear aperture, 10 each Sample Card for 13 mm pellets (10 each) 1.5 mil Polystyrene Reference Standard 3.0 mil Polystyrene Reference Standard 55 micron Polystyrene Reference Standard NIST Traceable Polystyrene Reference Standard Specular Reectance Standard ATR Reference Standard
43, 45, 46, 47, 48, 70 13 mm Gold Surfaced Disk for Reection Analysis Alignment Mirror UV Aluminum Mirror (25.4 mm x 25.4 mm) UV Aluminum Mirror (38.1 mm x 38.1 mm) Vacuum Pump, 110V Vacuum Pump, 220V 70, 71 44 119 120 88, 90 88, 90
ATR Reference Standard with Recommended Validation Procedure ATR Reference Standard, recertication Diffuse PTFE Reference (1" optical area) Diffuse Gold Reference (1" optical area) Diffuse Gold Reference (1.7" optical area)
143
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Part Numbers and Price
The PIKE price list includes accessories that may be used with a variety of makes and models of spectrometers. Please specify the part number and description when ordering, including your instrument type and model number. The table listed on the last page fold-out of this catalog summarizes instrument codes for most FTIR manufacturers. These codes are substituted for the nal two digits (XX) in the accessory part number. PIKE Technologies is continually extending the accessory product range. If you are unable to nd a required item, please contact us to discuss your needs. We will be glad to assist.
Delivery
Most items are available ex-stock, and can be shipped to you without delay. PIKE will notify you if the required item is temporarily out of stock. The delivery/shipment date is conrmed upon receipt of an order. Special requirements and custom accessories are subject to different lead times. Please contact us for price quotes and delivery information on these products.
Guarantee
All PIKE products are guaranteed to be free from defects in material and workmanship for a period of 12 months from the date of shipment. Should you be dissatised, or have any queries, please contact us immediately and we will promptly repair or replace the product at no charge.
Payment Terms
Purchase Order Number, C.O.D, Letter of Credit, Cash in advance, MasterCard and Visa are acceptable. Payment is net 30 days, and shipments are FOB Madison, WI USA. Freight charges are prepaid and added to your invoice. If you wish to pay freight charges, please specify this on your order.
Product Returns
Please contact PIKE to receive your Return Material Authorization (RMA) number if you wish to return any of our products. Customers are responsible for shipping charges for all returned products. For products under warranty, back to customer shipping charges will be covered by PIKE. Please do not return any products without obtaining the RMA number rst.
International Handling Fee

For orders placed from outside the United States or Canada, a handling fee of $40 will apply per order to cover the costs associated with the additional documentation and bank charges required for international shipments.
Technical Assistance
PIKE Technologies offers comprehensive technical assistance. Please contact us via mail, phone, fax or e-mail with your questions.
Ways to Order
Please include the following information for all orders: your name, phone number, product part number, quantity, ship to address, bill to address, purchase order number or credit card number with expiration date and name as they appear on the card, and spectrometer model on which the accessory will be used. You can place your orders via mail, phone, fax, e-mail or internet. For your convenience, an order form is printed on the previous page. A copy of this form can be used for mail and fax orders. An electronic order form is available on our web page (for P.O. Numbers only do not use this form for credit card orders). There is no minimum order requirement. Please use the following addresses and phone/fax numbers when placing your orders: PIKE Technologies, Inc. 6125 Cottonwood Drive Madison, WI 53719 (608) 274-2721 (608) 274-0103 (FAX) sales@piketech.com (E-MAIL) www.piketech.com
International Distribution
PIKE Products are available worldwide. Call or send us an e-mail and we will provide you with an address of the sales ofce closest to your location. All exports are handled in accordance with the US Export Administration Regulations.
PIKE Technologies on the Web

Visit our web site to nd out more information about new products, up-to-date PIKE news, pricing, and to see the latest copy of the PIKE Reections Newsletter! www.piketech.com info@piketech.com Customer satisfaction is very important to all of us here at PIKE Technologies, Inc. We have hopefully made the ordering process very fast and simple for you. If you have any questions or concerns about our products or services, please dont hesitate to contact us. We will be happy to make adjustments to t your needs. Products and prices are subject to change without notication.
2011 PIKE Technologies, Inc. Spectrum belongs to PerkinElmer, Inc.; IRPrestige belongs to Shimadzu Corporation; Winspec belongs JOEL; Luer-Lok belongs to Becton Dickenson; Equinox, IFS, Quick-Lock, Tensor, Vector and Vertex belongs to Bruker Optics Inc.; Cabosil belongs to Cabot Corporation; Pyrex belongs to Corning Glass Works; Delrin, Kalrez, Teflon, and Viton belong to E.I. du Pont de Nemours and Company; Emcompress belongs to JRS Pharma; Visual BASIC belongs to Microsoft Corporation; Fluorolube belongs to OxyChem Corporation; Nujol belongs to Schering-Plough; Avatar, Genesis, Impact, iS5, iS10, Nexus, Nicolet, and Protg belong to Thermo Fisher Scientific; Excalibur and Scimitar belong to Varian, Inc; INFRALUM belongs to Lumex Ltd; Interspec belongs to Interspectrum OU. All other trademarks are the property of PIKE Technologies.
FTIR INSTRUMENT CODE

ABB Bomem
XX
FTLA2000-100 (Arid Zone) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80 Michelson 100, MB Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81 MB 3000 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
Analect/Hamilton Sundstrand
Diamond 20 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Bruker Optics
IFS, Vector, Equinox Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 Tensor, Vertex with recognition (Quick-Lock) . . . . . . . . . . . . . . . . . . . . . . . . 51
Buck Scientic
M500. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
Digilab/Bio-Rad/Varian/Agilent
Excalibur, Scimitar, FTS, 600-IR Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Excalibur, Scimitar, 600-IR with recognition . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Horiba
7000 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Interspectrum
Interspec 200-X . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
Jasco
300/600 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 400 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 4000/6000 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58 4000/6000 Series w/recognition. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
JEOL
Winspec Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Lumex
INFRALUM FT-02, FT-08 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
Midac
M Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
PerkinElmer
1700 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70 Spectrum GX, 2000. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71 Spectrum BX/RX, 1600, Paragon 1000 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73 Spectrum ONE, Spectrum 100, 400, FRONTIER . . . . . . . . . . . . . . . . . . . . . . . . . . 74 Spectrum TWO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Shimadzu
8300, 8400 Series, IRPrestige, IRAfnity. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 IRPrestige-21 with recognition (QuickStart). . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Thermo Fisher Scientic/Nicolet/Mattson

Innity, Galaxy, RS Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Genesis, Satellite, IR 300 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Impact 400, Magna, Protg, 500/700 Series, Avatar, Nexus, Nicolet Series, Nicolet iS10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 Nicolet iS5 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 500/700 Series, Avatar, Nexus (Smart) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
W W W. P I K E T E C H . C O M
6125 Cottonwood Drive Madison, WI 53719 (608) 274-2721 (608) 274-0103 (FAX) sales@piketech.com (E-MAIL)

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COMPREHENSIVE CATALOG OF

FTIR and UV-Vis Accessories and Supplies

FTIR INSTRUMENT CODE

Thermo Fisher Scientic/Nicolet/Mattson

Sampling Kits If You Dont Know Where to Start

Attenuated Total Reectance Liquids, Solids and In-Between

MIRacle Fast and Easy IR Sampling ..............................................................

Diffuse Reectance From Powders to Plastic Bumpers

Specular Reectance Thin Films and More

Polarization For Oriented Samples and Research Applications

Integrating Spheres Reectance From All Perspectives

Remote Sampling Accessories Extending Your Sample Compartment

Microsampling Products From Microns to Millimeters

Transmission Sampling Automated & Manual Technologies

Optical and Sampling Components, Polishing Kits

115 116 118 119 120 121 122 123

Standards, Software and Databases

Other Useful Information

Included Parts and Materials

SAMPLING KITS IF YOU DONT KNOW WHERE TO START

Included Parts and Materials

160-8010 161-0510 161-0500 042-3035 042-3050 161-5050

F E AT U R E S O F T H E C O M P R E H E N S I V E TRANSMISSION SAMPLING KIT

Complete sampling kit for analysis of solids, liquids

Educational Transmission Sampling Kit (ETS) An Economical Assembly of Sampling Tools

Included Parts and Materials

SAMPLING KITS IF YOU DONT KNOW WHERE TO START

HATR Horizontal ATR

EasiDiff Diffuse Reectance Accessory

Combination of most widely used FTIR accessories including:

30Spec Specular Reectance Accessory

Pre-aligned, xed-position optical designs offering

High performance accessories providing excellent

Economical and logical addition to any FTIR

MIRacle Single Reection ATR

EasiDiff Diffuse Reectance Accessory

Complete kit for ATR, diffuse reectance, and specular

30Spec Specular Reectance Accessory

Attenuated Total Reectance

MIRacle Single Reection ATR ideal for sample identication

HATR Multi-Reection ATR highest sensitivity for minor components

ATRMax Variable Angle, Multi-Reection ATR research grade HATR

VATR Classic Variable Angle ATR

ATR Theory and Applications

MIRacle ATR Fast and Easy IR Sampling

Highest IR throughput saving you time and improving your

Complete exibility add options to your MIRacle as your

Highest value for todays competitive analytical and

MIRacle Optical Design

Fully congurable ZnSe, Diamond, Ge and Si MIRacle

Pinned-in-place, changeable crystal plates for fast and

Highest purity, type IIa Diamond crystal will not scratch

Optional specular reectance plate for measurement of

Choice of pressure clamps high-pressure, digital

Sampling options heating, temperature control, and ow

MIRacle High Throughput and Efcient Optical Design

MIRacle Highest IR Throughput ATR

AT TENUATED TOTAL REFLECTANCE LIQUIDS, SOLIDS AND IN-BETWEEN

MIRacle Crystal Options

Faux Black Pearl with MIRacle using Diamond ATR Crystal

Black Rubber Samples are best run using Ge ATR Crystal

MIRacle ATR Crystal Plates

Table 1: MIRacle Crystal Plate Specications

MIRacle Pressure Clamp Options