NAVAIR 17-20AG-559

TECHNICAL MANUAL

INSTRUMENT CALIBRATION PROCEDURE

PULSE GENERATOR

AGILENT
81101A



















DESTRUCTION NOTICE - FOR UNCLASSIFIED, LIMITED DOCUMENTS, DESTROY BY ANY METHOD
THAT WILL PREVENT DISCLOSURE OF CONTENTS OR “RECONSTRUCTION OF THE DOCUMENT.”
PUBLISHED BY DIRECTION OF COMMANDER NAVAL AIR SYSTEMS COMMAND
DISTRIBUTION STATEMENT C. DISTRIBUTION AUTHORIZED TO U.S. GOVERNMENT AGENCIES AND THEIR
CONTRACTORS TO PROTECT PUBLICATIONS REQUIRED FOR OFFICIAL USE OR FOR ADMINISTRATIVE OR
OPERATIONAL PURPOSES ONLY. OTHER REQUESTS FOR THIS DOCUMENT SHALL BE REFERRED TO
MEASUREMENT SCIENCE DEPARTMENT, CORONA DIVISION, NAVAL SURFACE WARFARE CENTER,
P.O. BOX 5000, CORONA, CA 92878-5000.
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NOTE: On a revised page, with the exception of the Title, the A, and the i pages, the technical changes are indicated by a vertical
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TABLE OF CONTENTS
Section Page
1 Introduction and Description................................................................................................................... 1

2 Equipment Requirements......................................................................................................................... 2

3 Preliminary Operations............................................................................................................................ 3

4 Calibration Process.................................................................................................................................. 4
4.1 Period (PLL Not Active) Test.............................................................................................................. 4
4.2 PLL Period Test................................................................................................................................... 5
4.3 Pulse Width Test.................................................................................................................................. 5
4.4 Delay Test............................................................................................................................................ 6
4.5 Double Pulse Delay Test...................................................................................................................... 8
4.6 Transition Time Test............................................................................................................................ 9
4.7 High and Low Level Tests................................................................................................................... 11

Navy Calibration Checklist...................................................................................................................... 15

Appendix A: 50 Ohm Feedthrough......................................................................................................... A-1

ILLUSTRATIONS
Figure Page
1 Delay Test Configuration......................................................................................................................... 7
2 High and Low Level Test Configuration................................................................................................. 11


TABLES
Table Page
1 Calibration Description............................................................................................................................ 1
2 Equipment Requirements......................................................................................................................... 2


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SECTION 1
INTRODUCTION AND DESCRIPTION
1.1 This procedure describes the calibration of the Agilent 81101A Pulse Generator. The instrument being calibrated is
referred to herein as the TI (Test Instrument).
1.2 All comments concerning this procedure should be directed to the Measurement Science Department, Corona Division,
Naval Surface Warfare Center, P.O. Box 5000, Corona, CA 92878-5000.
1.3 This procedure includes tests of essential performance parameters only. Any malfunction noticed during calibration,
whether specifically tested for or not, should be corrected.
Table 1. Calibration Description
TI
Characteristics
Performance
Specifications
Test
Method
Period (PLL not active) Range: 20 nS to 999.5 s
Tolerance: ±5% of setting
Resolution: 3.5 digits, best case 5 ps
Tested by measuring the TI using a
universal counter.
PPL period Range: 20 nS to 999.5 s
Tolerance: ±0.01% of setting
Resolution: 4 digits, best case 1 ps
Tested by measuring the TI using a
universal counter.
Pulse width Range: 10 nS to (999.5 s - 10 ns)
Tolerance: ±5% of setting ± 250 ps
Resolution: 3.5 digits, best case 5 ps
Tested by a universal counter and
an oscilloscope.
Delay Range: 0 nS to (999.5 s - 20 ns)
Tolerance: ±5% of setting ± 1 ns
Resolution: 3.5 digits, best case 5 ps
Tested by measuring the TI using a
universal counter.
Double pulse delay Range: 20 nS to (999.5 s – width - 10 ns)
Tolerance: ±5% of setting ±500 ps
Resolution: 3.5 digits, best case 5 ps
Tested by a universal counter and
an oscilloscope.
High and low level Range: (50 Ω into 50 Ω)
Level Window, -10 to +10 V
Tolerance: ±(3% of amplitude +75 mV)
Range: (1 kΩ into 50Ω)
Level Window, -20 to +20 V
Tolerance: ±(3% of amplitude +150 mV)
Tested with a digital multimeter.
Transition time Range: 5 nS to 200 ms (10 to 90% of
amplitude)
Tolerance: ±10% of setting ±200 ps
Linearity: typical: ±3% for transitions
>100 ns
Tested with an oscilloscope.


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SECTION 2
EQUIPMENT REQUIREMENTS
NOTES
Minimum use specifications are the principal parameters required for performance of the calibration, and are
included to assist in the selection of alternate equipment, which may be used at the discretion of the using
laboratory. Satisfactory performance of alternate items shall be verified prior to use. All applicable
equipment must bear evidence of current calibration.
The instruments utilized in this procedure were selected from those known to be available at Navy calibration
facilities and the listing by make or model number carries no implication of preference, recommendation, or
approval for use by other agencies. It is recognized that equivalent equipment produced by other
manufacturers may be capable of equally satisfactory performance in this procedure.
Table 2. Equipment Requirements
Item Minimum Use
Specifications
Calibration
Equipment
2.1 Universal counter Frequency range: 0.19 Hz to 50 MHz
Uncertainty: ±0.0025% of indication
Period: 10 ns to 1 s
Uncertainty: 1.25%
Hewlett Packard 53132A
2.2 Fixed coax attenuator #1 Attenuation: 6 dB
Frequency range: 2 to 200 MHz
Uncertainty: NA
Weinschel 44-6
2.3 Oscilloscope Range: 5 to 500 ns (2 to 200 MHz)
Uncertainty: 0.13%
Hewlett Packard 54825N
2.4 Fixed coax attenuator #2
(3 required)
Attenuation: 20 dB
Frequency range: 2 to 200 MHz
Uncertainty: NA
Weinschel 44-20
2.5 Pulse/Function generator Range: period, 0 to 1 µs
Width: 0 to 100 ns
Amplitude: 0 to 1 Vp-p
Offset: 0 to +1 V dc
Uncertainty: NA
Hewlett-Packard 8116A
2.6 Digital multimeter
(DMM)
Range: 70 mV to 20.1 V dc
Uncertainty: 0.94% of reading
Resistance range: 50 Ω
Uncertainty: 0.025% of reading
Hewlett-Packard 3458A
2.7 Feedthrough termination Resistance: 50 Ω, 10 W
Uncertainty: ±0.1% of nominal
Local manufacture (see
Appendix A)


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SECTION 3
PRELIMINARY OPERATIONS
3.1 Ensure that all power switches are set to off, and set all auxiliary equipment controls as necessary to avoid damage to the
equipment and so that dangerous voltages will not be present on output terminals when the power switches are turned on.
3.2 Connect the auxiliary equipment and the TI to the appropriate power source.
3.3 Turn all power switches on and allow sufficient warm-up time for the equipment (the TI requires 30 minutes warm-up
time).
3.4 DMM (item 2.6) AUTO CAL
NOTES
Prior to performing an AUTO CAL, a 4 hour warm-up time must be allowed and the DMM must be in a
thermally stable environment. Ensure that any external inputs to the DMM front and rear terminals have been
disconnected before performing an AUTO CAL.
To achieve the TI manufacturer’s specifications, AUTO CAL must be performed <24 hours prior to making
any measurements. In addition, at the time of test, the DMM’s internal temperature must be within ±1 °C of
when the previous AUTO Cal was performed. The AUTO CAL function removes measurement errors caused
by component temperature and time drift. To monitor internal temperature changes, the DMM provides the
TEMP? command, which is found in the Command Menu. The AUTO CAL constants are stored in
nonvolatile memory, and will remain unaltered even if the power is cycled. The time required to perform an
AUTO CAL for all functions is 11 minutes.
3.4.1 Turn all power switches to on, and allow sufficient warm-up time for the equipment (the DMM requires a 4 hour
warm-up time).
3.4.2 Ensure that the DMM is in the MENU FULL mode by pressing the DMM keys in the following sequence:
[Shift (blue key)] [NUMERIC / USER – MENU] [↓] [↓] [ENTER]
3.4.3 Perform the TI AUTO CAL “ALL” function by pressing the TI keys in the following sequence:
[AUTO CAL] [↓] [↓] [↓] [↓] [ENTER]
3.4.4 If no ERR indicator appears on the DMM display then skip to step 4.1.
3.4.5 If an ERR indicator appears on the TI display immediately after pressing the [ENTER] key, then the AUTO CAL
function is secured. Un-secure the AUTO CAL function by performing steps 3.4.6 and 3.4.7.
3.4.6 If an ERR indicator is present on the display of the DMM, then clear this indicator by entering:
[Shift] [ERROR] [ENTER]
3.4.7 Remove the security code from the AUTO CAL function by executing the SECURE command. Press the DMM keys
in the following sequence:
[Shift] [S] [↓] [↓] [→] [8] [6] [3] [3] [,] [8] [6] [3] [3] [,] [0] [ENTER]
3.4.8 Repeat steps 3.4.3 and 3.4.4.
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SECTION 4
CALIBRATION PROCESS
NOTE
Unless otherwise specified, verify the results of each test and take corrective action whenever the test
requirement is not met before proceeding.
4.1 PERIOD (PLL NOT ACTIVE) TEST
4.1.1 Connect the TI TRIGGER OUT to the universal counter (item 2.1) CHANNEL 1 input ensuring that the channel is set
to 50 Ω.
4.1.2 Set the universal counter to measure period.
4.1.3 Select the TI [MODE/TRG], setting it to the following:
Continuous pulses
Single-Pulses at Out 1
Pulse-Period:internal Osc
4.1.4 Press the TI OUTPUT and set the TI to the following:
Per 20.00ns
Normal ON
Delay Ops
DtyCyc 50.00%
LeadE 5.00ns
TraiE =LeadE
Offset +0.0mV
Amplit 1.00V
50Ω into 50.0Ω
4.1.5 Verify that the universal counter indication is between 19.00 to 21.00 ns.
4.1.6 Set the TI Per to the values in the following table. Verify that the universal counter indication is within the tolerance
limits listed.
TI Per
(s)
Universal Counter
Tolerance Limits
50.00 ns 47.50 to 52.50 ns
99.900 ns 94.905 to 104.895 ns
100 ns 95 to 105 ns
500 ns 475 to 525 ns
1 µs 950 to 1050 ns
500 µs 475 to 525 µs
500 ms 475 to 525 ms

4.1.7 Set the TI Amplit to minimum and leave the test setup connected.
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4.2 PLL PERIOD TEST
4.2.1 Press the TI MODE/TRG and set the Pulse-Period to internal PLL.
4.2.2 Press the TI OUTPUT and set Per to 20.00 ns and Amplit to 1.00 V.
4.2.3 Set the universal counter to measure frequency and verify that the indication is between 49.995 to 50.005 MHz.
4.2.4 Set the TI Per to the values in the following table. Verify that the universal counter indication is within the tolerance
limits listed.
TI Per
(s)
Universal Counter
Tolerance Limits
50.00 ns 19.998 to 20.002 MHz
100 ns 9.999 to 10.001 MHz
500 ns 1,999,800 to 2,000,200 Hz
1 µs 999,900 to 1,000,100 Hz
50 µs 19,998 to 20,002 Hz
5 ms 199.98 to 200.02 Hz
500 ms 1.9998 to 2.0002 Hz
5 s 0.19998 to 0.20002 Hz

4.2.5 Set TI Amplit to minimum. Disconnect the setup.

4.3 PULSE WIDTH TEST
4.3.1 Select the TI [MODE/TRG], setting it to the following:
Continous pulses
Single-Pulses at Out 1
Pulse-Period:internal Osc
4.3.2 Connect the TI OUTPUT 1 through the fixed coax attenuator #1 (item 2.2) to the oscilloscope (item 2.3) CH1 input
connector. Ensure that the oscilloscope impedance is set to 50 Ω.
4.3.3 Connect the TI TRIGGER OUT through the fixed coax attenuator #2 (item 2.4) to the oscilloscope trigger input.
4.3.4 Press the TI OUTPUT and set the TI to the following:
Per 200ns
Normal ON
Delay Ops
Width 10.00 ns
LeadE 5.00ns
TraiE =LeadE
Offset +0.0mV
Amplit 1.00V
50Ω into 50.0Ω
4.3.5 Set the oscilloscope as required to measure the displayed pulse width using the oscilloscope markers as appropriate.
4.3.6 Verify that the oscilloscope indication is between 9.25 to 10.75 ns.
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4.3.7 Set the TI Pulse Width and Period to the values listed in the following table. Verify that the oscilloscope indication is
within the tolerance limits listed.
TI Pulse Width
(ns)
TI Period
Oscilloscope Tolerance Limits
(ns)
50.0 200 ns 47.25 to 52.75
100 1 µs 94.75 to 105.25
500 1 µs 474.75 to 525.25

4.3.8 Set the TI Amplit to minimum and disconnect the setup.
4.3.9 Connect the TI OUTPUT 1 to the universal counter CHANNEL 1 input.
4.3.10 Set the counter to the following settings:
Time Interval: (TI 1 to 2) function
COMMON1: ON
CHANNEL 1 & 2 50Ω
CHANNEL 2 negative slope.
4.3.11 Set the TI pulse width and period to the values listed in the following table. Verify that the counter indication is within
the tolerance limits listed.
TI Pulse Width TI Period Counter Tolerance Limits
50 µs 100 µs 47.5 to 52.5 µs
5 ms 10 ms 4.75 to 5.25 ms
500 ms 999 ms 475 to 525 ms

4.3.12 Set the TI Amplit to minimum and disconnect the test setup.

4.4 DELAY TEST
4.4.1 Connect the equipment as shown in Figure 1.
4.4.2 Select the TI [MODE/TRG], setting it to the following:
Triggered pulses
Single-Pulses at Out 1
Trg'd by: EXT-IN
4.4.3 Set the pulse generator to the following:
Frequency 1 MHz
Width 100 ns
Amplitude 1 V
Offset +1.0 V
Output Enable
4.4.4 Press the TI TRG-LEV, setting it to the following:
EXT-IN: Threshold +1.0 V 50Ω
CLK-IN: Threshold +1.0 V 50Ω
TRIGGER-OUT: TTL
STROBE-OUT: TTL
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Figure 1. Delay Test Configuration
4.4.5 Press the TI OUTPUT, setting it to the following:
Per -------
Normal ON
Delay 0 ps
Width 100 ns
LeadE 5.00 ns
TraiE =LeadE
Offset +0.0 mV
Amplit 1.00 V
50Ω into 50.0Ω
4.4.6 Set the oscilloscope to the following:
AUTOSCALE
TIME/DIV 10 ns/div
Center the positive-going edges of the two signals
Set averages to 32
Turn voltage markers ON and assign marker A to channel 3 and marker B to channel 4
Set Preset levels to 50% - 50%
Turn the time markers ON
4.4.7 Using the markers on the oscilloscope note the time between the leading edges of the TI OUTPUT 1 and the TRIGGER
OUT pulses at the 50% points. The delta time indication is typically about 17 ns fixed delay.
4.4.8 Using the markers on the oscilloscope, verify that the TI delay is within the tolerance limits listed in the following table.
Set the oscilloscope time base as appropriate for each TI delay.
2.5
PULSE GENERATOR
TRIG
OUT
OUT 1
TRIG
OUT
EXT
IN
OUT 1
1 2 3 4 TRIG
2.4
20 DB
ATTENUATOR
2.3
OSCILLOSCOPE
TI
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TI Delay
(ns)
Oscilloscope Tolerance Limits
(ns)
5.00 3.75 to 6.25
10.00 8.50 to 11.50
50.00 46.50 to 53.50
100.0 94.0 to 106.0
500.0 474.0 to 526.0

4.4.9 Set the TI Amplit to minimum and disconnect the setup.
4.4.10 Connect the TI TRIGGER out to the counter's CHANNEL 1 and the TI OUTPUT 1 to the universal counter
CHANNEL 2.
4.4.11 Press the TI MODE/TRG and set pulses to continuous pulses.
4.4.12 Set the universal counter to time interval (TI 1 to 2) function, CHANNEL 1 & 2 50Ω.
4.4.13 Press the TI OUTPUT and set AMPLIT to 1.00 V. Set the TI period and delay to the values listed in the following
table and measure the time between the leading edges of the TI OUTPUT 1 and the TRIGGER OUT pulses at the 50% point.
4.4.14 Subtract the value noted in step 4.4.7 from that measured in the previous step (4.4.13), and verify the result is within
the tolerance limits listed in the following table.
TI Period TI Delay
Universal Counter
Tolerance Limits
100 µs 50.00 µs 47.50 to 52.50 µs
10 ms 5.00 ms 4.75 to 5.25 ms
999 ms 500 ms 475 to 525 ms

4.4.15 Set the TI Amplit to minimum. Disconnect the test setup.

4.5 DOUBLE PULSE DELAY TEST
4.5.1 Connect the TI OUTPUT 1 through attenuator #1 to the oscilloscope CH 1. Connect the TI TRIGGER OUT through
attenuator #2 to the oscilloscope's Aux Trig In.
4.5.2 Select the TI [MODE/TRG], setting it to the following:
Cntinuous pulses
Double-Pulses at Out 1
Pulse-Period:internal Osc
4.5.3 Select the TI OUTPUT and set the controls to the following:
Per 200.0 ns
Normal ON
DblDel 20.00 ns
Width 10.00 ns
LeadE 5.00 ns
TraiE =LeadE
Offset +0.0 mV
Amplit 1.00 V
50Ω into 50.0Ω
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4.5.4 Use the Oscilloscope time markers to measure the time between the leading edges of the TI OUTPUT 1 pulses at the
50% points. Verify that the results are within the tolerance limits for each of the TI settings in the following table.
TI Double Delay
(ns)
Oscilloscope Tolerance Limits
(ns)
20.0 18.5 to 21.5
50.0 47.0 to 53.0
100.0 94.5 to 105.5

4.5.5 Set the TI Amplit to minimum. Disconnect the test setup.
4.5.6 Connect the TI OUTPUT1 to the universal counter CHANNEL 1.
4.5.7 Select the TI [MODE/TRG], setting it to the following:
Triggered pulses
Double-Pulses at Out 1
Trg'd by: MAN Key
4.5.8 Select the TI OUTPUT and set the controls to the following:
Per -----
Normal ON
DblDel 500.0 ms
Width 20.00 ns
LeadE 5.00 ns
TraiE =LeadE
Offset +0.0 mV
Amplit 1.00 V
50Ω into 50.0Ω
4.5.9 Set the universal counter to period on CHANNEL 1 and an impedance of 50 Ω.
4.5.10 Verify that the universal counter indication is within the tolerance limits listed for each TI double delay in the
following table. Note you will have to press the TI MAN to trigger each delay.
TI Double Delay Universal Counter
Tolerance Limits
500 ms 475 to 525 ms
1.00 s 0.95 to 1.05 s

4.5.11 Set the TI Amplit to minimum. Disconnect the test setup.

4.6 TRANSITION TIME TEST
4.6.1 Connect the TI OUTPUT 1 through the attenuator #2 to the oscilloscope CH1. Connect the TI TRIGGER OUT through
another attenuator #2 to the oscilloscope Aux Trig In.
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4.6.2 Select the TI [MODE/TRG], setting it to the following:
Continuous pulses
Single-Pulses at Out 1
Pulse-Period:internal Osc
4.6.3 Select the TI OUTPUT and set the controls to the following:
Per 1.0 µs
Normal ON
Delay 0 ps
Width 500 ns
LeadE 5.00 ns
TraiE =LeadE
Offset +0.0 mV
Amplit 5.00 V
50Ω into 50.0Ω
4.6.4 Set the oscilloscope controls to measure the transition time of the leading edge between the 10% and 90% points of the
displayed pulse.
4.6.5 Verify that the transition time for each of the TI settings in the following table are within the tolerance limits listed.
Oscilloscope Time/div TI Period
TI Leading
Edge
Oscilloscope Tolerance
Limits (Leading Edge)
2 ns/div 1.0 µs 5.00 ns <5 to 5.7 ns
5 ns/div 1.0 µs 10.0 ns 8.8 to 11.2 ns
10 ns/div 1.0 µs 50.0 ns 44.8 to 55.2 ns
100 ns/div 5.0 µs 500.0 ns 449.8 to 550.2 ns
1 µs/div 50 µs 5.0000 µs 4.4998 to 5.5002 µs
10 µs/div 500 µs 50.0 µs 45 to 55 µs
100 µs/div 5 ms 500 µs 450 to 550 µs
10 ms/div 500 ms 50.0 ms 45 to 55 ms

4.6.6 Set the oscilloscope to the time/div and the delay listed in the following table.
4.6.7 Ensure the TI delay is set to 0 ps. Set the TI to the period and leading edge listed in the following table. Using the
oscilloscope time markers, verify that the trailing edge between the 10% and 90% points is within the tolerance limits listed.
Oscilloscope
Time/div
Delay
(Oscilloscope)
TI Period TI Leading Edge Oscilloscope Tolerance
Limits (Trailing Edge)
2 ns/div 529 ns 1.0 µs 5.00 ns <5 to 5.7 ns
5 ns/div 529 ns 1.0 µs 10.0 ns 8.8 to 11.2 ns
10 ns/div 529 ns 1.0 µs 50.0 ns 44.8 to 55.2 ns
100 ns/div 25 µs 5.0 µs 500.0 ns 449.8 to 550.2 ns
1 µs/div 25 µs 50 µs 5.0000 µs 4.4998 to 5.5002 µs
10 µs/div 250 µs 500 µs 50.0 µs 45 to 55 µs
100 µs/div 2.5 ms 5 ms 500 µs 450 to 550 µs
10 ms/div 250 ms 500 ms 50.0 ms 45 to 55 ms

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4.6.8 Set the TI Amplit to minimum. Disconnect the test setup.

4.7 HIGH AND LOW LEVEL TESTS
4.7.1 High Level, 50 Ω into 50 Ω.
4.7.1.1 Connect the equipment as shown in Figure 2.

Figure 2. High and Low Level Test Configuration
4.7.1.2 Select the TI [MODE/TRG], setting it to the following:
Continuous pulses
Single-Pulses at Out 1
Pulse-Period:internal Osc
4.7.1.3 Select the TI OUTPUT and set the controls to the following:
Per 100.0 ms
Normal ON
Delay 25.00 ms
Width 50.00 ms
LeadE 5.00 ns
TraiE =LeadE
High +10.0 V
Low +0.0 mV
50Ω into 50.0Ω
4.7.1.4 Set the DMM (item 2.6) to measure DCV, Trigger to TRIG EXT, range to auto, and NPLC to 0.1.
4.7.1.5 Set the TI High Level to the values listed in the following table and verify that the DMM indication is within the
tolerance limits listed.
TRIGGER
OUT
OUT 1
2.7
50 OHM
FEEDTHROUGH
BNC-DUAL
BANANA
EXT.
TRIGGER
INPUT
TI
2.6
DMM
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TI High Level
DMM
Tolerance Limits
10.000 V 9.625 to 10.375 V
5.000 V 4.775 to 5.225 V
3.000 V 2.835 to 3.165 V
1.000 V 0.895 to 1.105 V
500 mV 410 to 590 mV
100 mV 22 to 178 mV

4.7.2 Low Level, 50 Ω into 50 Ω.
4.7.2.1 Select the TI OUTPUT and set the controls to the following:
Per 100.0 ms
Normal ON
Delay 75.00 ms
Width 50.00 ms
LeadE 5.00 ns
TraiE =LeadE
High +0.0 mV
Low -10.00V
50Ω into 50.0Ω
4.7.2.2 Set the TI Low Level to the values listed in the following table and verify that the DMM indication is within the
tolerance limits listed.
TI Low Level
DMM
Tolerance Limits
-10.000 V -9.625 to -10.375 V
-5.000 V -4.775 to -5.225 V
-3.000 V -2.835 to -3.165 V
-1.000 V -0.895 to -1.105 V
-500 mV -410 to -590 mV
-100 mV -22 to -178 mV

4.7.3 High Level, 1 kΩ into 50 Ω.
4.7.3.1 Select the TI OUTPUT and set the controls to the following:
Per 100.0 ms
Normal ON
Delay 25.00 ms
Width 50.00 ms
LeadE 5.00 ns
TraiE =LeadE
High +10.0 V
Low +0.0 mV
1kΩ into 50.0Ω
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4.7.3.2 Set the TI High Level to the values listed in the following table and verify that the DMM indication is within the
tolerance limits listed.
TI High Level
DMM
Tolerance Limits
19.0 V 17.9 to 20.1 V
10.00 V 9.35 to 10.65 V
5.00 V 4.60 to 5.40 V
1.00 V 0.80 to 1.20 V
200 mV 40 to 360 mV

4.7.4 Low Level, 1 kΩ into 50 Ω.
4.7.4.1 Select the TI OUTPUT and set the controls to the following:
Per 100.0 ms
Normal ON
Delay 75.00 ms
Width 50.00 ms
LeadE 5.00 ns
TraiE =LeadE
High +0.0 mV
Low +19.0 V
1kΩ into 50.0Ω
4.7.4.2 Set the TI High Level to the values listed in the following table and verify that the DMM indication is within the
tolerance limits listed.
TI Low Level DMM Tolerance Limits
-19.0 V -17.9 to -20.1 V
-10.00 V -9.35 to -10.65 V
-5.00 V -4.60 to -5.40 V
-1.00 V -0.80 to -1.20 V
-200 mV -40 to -360 mV

4.7.4.3 Set the TI Amplit to minimum.
4.7.5 Unless other measurements are to be performed, turn all power switches to off or standby and disconnect the equipment
from the TI.

NAVAIR 17-20AG-559
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CALIBRATION CHECKLIST
TEST INST (S) Agilent 81101A Pulse Generator



PROC. NO. NA 17-20AG-559 MFR MODEL SER. NO.
PROCEDURE MEASURED VALUES OUT
STEP FUNCTION TESTED NOMINAL FIRST RUN SECOND RUN OF CALIBRATION TOLERANCES
NO. TOL
(1) (2) (3) (4) (5) (6) (7)
4.1 Period (PLL not active) Test
4.1.5 20.00 ns 20.00 ns 19.00 to 21.00 ns
4.1.6 50.00 ns 50.00 ns 47.50 to 52.50 ns
” 99.900 ns 99.900 ns 94.905 to 104.895 ns
” 100 ns 100 ns 95 to 105 ns
” 500 ns 500 ns 475 to 525 ns
” 1 µs 1000 ns 950 to 1050 ns
” 500 µs 500 µs 475 to 525 µs
” 500 ms 500 ms 475 to 525 ms

4.2 PLL Period Test
4.2.3 50.000 MHz 50.000 MHz 49.995 to 50.005 MHz
4.2.4 20.000 MHz 20.000 MHz 19.998 to 20.002 MHz
” 10.000 MHz 10.000 MHz 9.999 to 10.001 MHz
” 2,000,000 Hz 2,000,000 Hz 1,999,800 to 2,000,200 Hz
” 1,000,000 Hz 1,000,000 Hz 999,900 to 1,000,100 Hz
” 20,000 Hz 20,000 Hz 19,998 to 20,002 Hz
” 200.00 Hz 200.00 Hz 199.98 to 200.02 Hz
” 2.0000 Hz 2.0000 Hz 1.9998 to 2.0002 Hz
” 0.20000 Hz 0.20000 Hz 0.19998 to 0.20002 Hz

4.3 Pulse Width Test
4.3.6 10.00 ns 10.00 ns 9.25 to 10.75 ns
4.3.7 50.00 ns 50.00 ns 47.25 to 52.75 ns
” 100.00 ns 100.00 ns 94.75 to 105.25 ns
” 500.00 ns 500.00 ns 474.75 to 525.25 ns
4.3.11 50.0 µs 50.0 µs 47.5 to 52.5 µs
” 5.00 ms 5.00 ms 4.75 to 5.25 ms
” 500 ms 500 ms 475 to 525 ms

4.4 Delay Test
4.4.8 5.00 ns 5.00 ns 3.75 to 6.25 ns
Page 1 of 3
NAVAIR 17-20AG-559
16
CALIBRATION CHECKLIST
TEST INST (S) Agilent 81101A Pulse Generator



PROC. NO. NA 17-20AG-559 MFR MODEL SER. NO.
PROCEDURE MEASURED VALUES OUT
STEP FUNCTION TESTED NOMINAL FIRST RUN SECOND RUN OF CALIBRATION TOLERANCES
NO. TOL
(1) (2) (3) (4) (5) (6) (7)
4.4.8 10.00 ns 10.00 ns 8.50 to 11.50 ns
” 50.00 ns 50.00 ns 46.50 to 53.50 ns
” 100.0 ns 100.0 ns 94.0 to 106.0 ns
” 500.0 ns 500.0 ns 474.0 to 526.0 ns
4.4.14 50.00 µs 50.00 µs 47.50 to 52.50 µs
” 5.00 ms 5.00 ms 4.75 to 5.25 ms
” 500 ms 500 ms 475 to 525 ms

4.5 Double Pulse Delay Test
4.5.4 20.0 ns 20.0 ns 18.5 to 21.5 ns
” 50.0 ns 50.0 ns 47.0 to 53.0 ns
” 100.0 ns 100.0 ns 94.5 to 105.5 ns
4.5.10 500 ms 500 ms 475 to 525 ms
” 1.00 s 1.00 s 0.95 to 1.05 s

4.6 Transition Time Test
4.6.5 Leading Edge
” 5.0 ns 5.0 ns <5 to 5.7 ns
” 10.0 ns 10.0 ns 8.8 to 11.2 ns
” 50.0 ns 50.0 ns 44.8 to 55.2 ns
” 500.0 ns 500.0 ns 449.8 to 550.2 ns
” 5.0000 µs 5.0000 µs
4.4998 to 5.5002 µs

50 µs 50 µs

45 to 55 µs

500 µs 500 µs

450 to 550 µs
” 50 ms 50 ms 45 to 55 ms
4.6.7 Trailing Edge
” 5.0 ns 5.0 ns <5 to 5.7 ns
” 10.0 ns 10.0 ns 8.8 to 11.2 ns
” 50.0 ns 50.0 ns 44.8 to 55.2 ns
” 500.0 ns 500.0 ns 449.8 to 550.2 ns
” 5.0000 µs 5.0000 µs
4.4998 to 5.50002 µs

50 µs 50 µs

45 to 55 µs
Page 2 of 3
NAVAIR 17-20AG-559
17
CALIBRATION CHECKLIST
TEST INST (S) Agilent 81101A Pulse Generator



PROC. NO. NA 17-20AG-559 MFR MODEL SER. NO.
PROCEDURE MEASURED VALUES OUT
STEP FUNCTION TESTED NOMINAL FIRST RUN SECOND RUN OF CALIBRATION TOLERANCES
NO. TOL
(1) (2) (3) (4) (5) (6) (7)
4.6.7
500 µs 500 µs

450 to 550 µs
” 50 ms 50 ms 45 to 55 ms

4.7 High and Low Level Tests
4.7.1 High Level, 50 Ω into 50 Ω
4.7.1.5 10.000 V 10.000 V 9.625 to 10.375 V
” 5.000 V 5.000 V 4.775 to 5.225 V
” 3.000 V 3.000 V 2.835 to 3.165 V
” 1.000 V 1.000 V 0.895 to 1.105 V
” 500 mV 500 mV 410 to 590 mV
100 mV 100 mV 22 to 178 mV
4.7.2 Low Level, 50 Ω into 50 Ω
4.7.2.2 -10.000 V -10.000 V -9.625 to -10.375 V
” -5.000 V -5.000 V -4.775 to -5.225 V
” -3.000 V -3.000 V -2.835 to -3.165 V
” -1.000 V -1.000 V -0.895 to -1.105 V
” -500 mV -500 mV -410 to -590 mV
” -100 mV -100 mV -22 to -178 mV
4.7.3 High Level, 1 kΩ into 50 Ω
4.7.3.2 19.0 V 19.0 V 17.9 to 20.1 V
” 10.00 V 10.00 V 9.35 to 10.65 V
” 5.00 V 5.00 V 4.60 to 5.40 V
” 1.00 V 1.00 V 0.80 to 1.20 V
200 mV 200 mV 40 to 360 mV
4.7.4 Low Level, 1 kΩ into 50 Ω
4.7.4.2 -19.0 V -19.0 V -17.9 to -20.1 V
” -10.00 V -10.00 V -9.35 to -10.65 V
” -5.00 V -5.00 V -4.60 to -5.40 V
” -1.00 V -1.00 V -0.80 to -1.20 V
” -200 mV -200 mV -40 to -360 mV


Page 3 of 3
NAVAIR 17-20AG-559
A-1
APPENDIX A
50 OHM FEEDTHROUGH
A.1 This appendix is to be used to construct and test a 50 Ω, 10 W, 0.1% feedthrough termination.
A.2 The following parts will be required to build the termination.
• Case (must provide shielding and grounding)
• R1 =53.6 Ω, 1%, 10 W, Agilent P/N: 0699-0146
• R2 =200 Ω, 10%, 0.5 W, VAR. Trimmer, Agilent P/N: 2100-3350
• R3 =681 Ω, 1%, 0.5 W, Agilent P/N: 0757-0716
• BNC(m), Agilent P/N: 1250-0045
• BNC(f), Agilent P/N: 1250-0083
A.3 Using the DMM, verify the 50 Ω, 10 W feedthrough termination indicates within 49.95 to 50.05 Ω. Adjust R2 as
required.

R1
R2
R3
BNC
(f)
BNC
(m)

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