MEMS 5603-Project Topics

Experimental
1.Fiber-matrix interactions in a titanium -Sic Composite.
2. Correlation of dimple size to grain size in samples
fractured in tension.
3. Origin of fracture initiation sites in an Al-fly ash
composite fractured in tension.
4. Size and distribution of oxide dispersoids in a
dispersion strengthened titanium /aluminum alloy.
5. Slip line morphology in Cu single crystals deformed in
tension/fatigue.
6. Characterization of Oxide dispersoids in a copperAlumina alloy.
7. Characterization of ductile and brittle fracture in steel
samples fractured at different temperatures.
8. Characterization of oxide film in a Ti-Al-Nb alloy.

MEMS 5603-Project Topics

Literature Survey
1. In-Situ fracture study of inter granular fracture using Auger
electron signals.
2. Crystallographic information from Electron Channeling
Patterns in SEM.
3. Soft ware for indexing diffraction patterns in Transmission
Electron Microscopy.
4. Scanning Transmission Electron Microscopy.
5. High Voltage Transmission Electron Microscopy.
6. High Resolution Electron Microscopy.
7. In-situ studies of deformation and fracture in Transmission
Electron Microscopy.
8. In-situ studies of phase transformations in TEM.

Scanning System of the SEM

Characteristics of Detectors

Main Considerations:
Location of the detector relative to the beam and the specimen
Size of the detector
Efficiency of the detector (for converting radiation into a useful signal)
band width of the detector/amplification system
range of signal frequencies that the detector can process.

Everhart-Thornley Detector

Secondary electrons and line of sight BSE are collected.

At the photo cathode photon flux is converted back into an electron current.
-gain of 105-106

Line Scan

One to one correspondence between a series of points in the specimen sapce

and on the CRT
M = L CRT/L spec
Y deflection of the CRT is proportional to the amount of a specific element
present at each location.

Image Display by Area Scanning

A correspondence is established between a set of locations on the specimen and

one on the CRT.
Two displays.
Slow scan CRT scan speeds of 0.0033/s.
Construct an intensity map.

Intensity Modulation

No true image exists in the SEM.

Not possible to place a film in the SEM and record the image.

Shape Correspondence

Magnification

Magnification is changed by adjusting the length of the scan on the specimen for
a constant length of scan on the CRT.
M depends on excitation of the scan coils of the objective.
When the objective is adjusted at higher magnifications, the specimen is in focus
At lower magnifications.

Picture element (Pixel) size

Size of the area on the specimen from which information is transferred to the CRT
DPE = Lspec/NPE (NPE = number of discrete locations along the scan line)

Depth of Field

tan = r/(D/2)
D = 2r/
For a spot size 0.1 mm, pixel size = 0.1/M
D = 0.2/ M

Dependence of depth of field on aperture

Dependence of depth of field on working distance

Effect of aperture size and working

distance on depth of field

A 15 mm working distance, 600 m aperture, B 15 mm working distance, 200 m aperture

C 15 mm working distance, 100 m aperture, D 39 mm working distance, 100 m aperture

Effect of aperture size and working

distance on resolution

A 15mm, 100 m, B 15 mm, 200 m, C 15 mm, 600 m, D 39 mm, 200 m

Depth of field ( m)
(radians)