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(L@ Mvq
jndi~n
Standard
TESTING
Section 1
AND MEASUREMENT
TECHNIQUES
Series
First Revision)
ICS 33.100.01;
33.100.20
@ BIS 2008
BUREAU
MANAK
May 2008
OF
BHAVAN,
INDIAN
STANDARDS
9 BAHADUR
SHAH
NEW DELHI 110002
ZAFAR
MARG
Price Group 5
Il!!%!l
Electromagnetic
Compatibility
Sectional
Committee,
LITD 09
.
t
4
NATIONAL FOREWORD
This Indian Standard (Part 4/See 1) (First Revision) which is identical with IEC 61000-4-1 :2006
Electromagnetic compatibility (EMC) Part 4-1: Testing and measurement techniques Overview
of IEC 61000-4 series issued by the International Electrotechnical Commission (1EC) was adopted by
the Bureau of Indian Standards
on the recommendation
of the Electromagnetic
Compatibility
Sectional Committee and approval of the Electronics and Information Technology Division Council.
This standard was originally published in 1999 and was identical to IEC 61000-4-1
standard is being revised to align with the latest IEC publication IEC 61000-4-1 :2006.
: 1992. This
The text of IEC Standard has been approved as suitable for publication
deviations.
Certain conventions
are, however,
Attention is particularly drawn to the following:
not identical
a)
they should
b)
Comma (,) has been used as a decimal marker, while in Indian Standards,
practice isto use a point (.) as the decimal marker.
the current
Standard
: 1990
International
IEC 60050-161
Electrotechnical
Vocabulary
(IEV)
161:
Electromagnetic
Chapter
compatibility
Corresponding
Is
1885
Electrotechnical
Electromagnetic
Indian
Standard
(Part
85)
vocabulary:
compatibility
2003
Part 85
Degree of
Equivalence
Identical
IEC 61000-1-1
: 1992 Electromagnetic
compatibility (EMC) Part 1: General
Section 1: Application and interpretation
of fundamental definitions and terms
IS 14700
(Part
l/See
1) : 2000
Electromagnetic
compatibility
(EMC):
Part 1 General, Section 1 Application
interpretation
and
of
fundamental
definitions and terms
do
IEC 61000-3-2
: 2005 Electromagnetic
compatibility (EMC) Part 3: Limits
Section 2: Limits for harmonic
current
emissions (equipment input currents
16A
per phase)
IS 14700
(Part 3/See
2) : 2008
Electromagnetic
compatibility
(EMC):
Part 3 Limits, Section
2 Limits for
harmonic current emissions (equipment
input current ~ 16A per phase)
do
IEC 61000-3-3
: 2005 Electromagnetic
compatibility (EMC) Part 3: Limits
Limitations
of
voltage
Section
3:
fluctuations
and flicker
in low-voltage
supply systems for equipment with rated
currents 16A
IS 14700
(Part 3/See
3) : 2008
Electromagnetic
compatibility
(EMC):
Part 3 Limits, Section 3 Limitations of
voltage fluctuations and flicker in lowvoltage supply systems for equipment
with rated currents 16A
do
.1
.. . .. .
....-._..-------
..
Standard
Corresponding
Indian
Standard
Degree
of
Equivalence
II
:I
I
1
,
,:
I
IEC 61000-4-2
: 2001 Electromagnetic
compatibility
(EMC) Part4:
T&ting
and measurement techniques Section
2: Electrostatic discharge immunity test
IS 14700
(Part
4/See
2) : 2008
Electromagnetic
compatibility
(EMC):
Part
4 Testing
and
measurement
techniques,
Section
2
Electrostatic
discharge immunity test
Identical
IS 14700
(Part
4/See
3) : 2008
Electromagnetic
compatibility
(EMC):
Part
4 Testing
and
measurement
techniques,
Section 3 Radiated
radioelectromagnetic
frequency,
field
immunity test
do
IS 14700
(Part
4/See
4) : 2008
(EMC):
Electromagnetic
compatibility
Part
4 Testing
and
measurement
techniques,
Section
4 Electrical
fast
transient/burst immunity test
do
IS 14700
(Part
4/See
7) : 2006
Electromagnetic
compatibility
(EMC):
Part
4 Testing
and
measurement
techniques, Section 7 General guide on
harmonics
and
interharmonics
measurements
and instrumentation
for
power supply systems and equipment
connected thereto
do
IS 14700
(Part
4/See
8) : 2008
Electromagnetic
compatibility
(EMC):
Part
4 Testing
and
measurement
techniques, Section 8 Power frequency
magnetic field immunity test
do
IS 14700
(Pati
4/See
9) : 2008
Electromagnetic
compatibility
(EMC):
Part
4 Testing
and
measurement
techniques,
Section 9 Pulse magnetic
field immunity test
do
IS 14700
(Part 4/See
12) : 2008
Electromagnetic
compatibility
(EMC):
Part
4 Testing
and
measurement
techniques, Section 12 Oscillatory waves
immunity test
do
IS 14700
(Part 4/See
15) : 2008
Electromagnetic
compatibility
(EMC):
Part
4 Testing
and
measurement
techniques, Section 15 Flickermeter
Functinal and design specifications
do
IS 14700
(Part 4/See
16) : 2008
Electromagnetic
compatibility
(EMC):
Part
4 Testing
and
measurement
techniques, Section 16 Test for immunity
to
conducted
common
mode
disturbances in the frequency range O Hz
to 150 kHz immunity test
do
ii
;,
4,
Standard
Corresponding
Indian
Degree of
Equivalence
Standard
IS 14700
(Part 4/See
24) : 2007
Electromagnetic
compatibility
(EMC):
Part
4 Testing
and
measurement
techniques, Section 24 Test methods for
protective devices for HEMP conducted
disturbance
Identical
The technical committee responsible for the preparation of this standard has reviewed the provisions
of the following International Standards referred in this adopted standard and has decided that they
are acceptable for use in conjunction with this standard:
International
Standard
Title
IEC 61000-2-5:1995
r
Electromagnetic
compatibility
Classification of electromagnetic
(EMC) Part
environments
2-5:
Environment
IEC 61000-3-4:1998
Electromagnetic
compatibility (EMC) Part 3-4: Limits Limitation of
emission of harmonic currents in low-voltage power supply systems for
equipment with rated current greater than 16A
IEC 61000-3-5:1994
Electromagnetic
compatibility (EMC) Part 3-5: Limits Limitation of
voltage fluctuations and flicker in low-voltage power supply systems for
equipment with rated current greater than 16A
IEC 61000-3-6:2008
IEC 61000-3-11:2000
Electromagnetic
compatibility (EMC) Part 3-11: Limits Limitation of
voltage changes, voltage fluctuations and flicker in public low-voltage
supply systems Equipment with rated current s 75A and subject to
conditional connection
IEC 61000-3-12:2004
Electromagnetic
compatibility (EMC) Part 3-12: Limits Limits for
harmonic currents produced by equipment
connected to public lowvoltage systems with input current > 16A ands 75A per phase
IEC 61000-4-5:2005
Electromagnetic
compatibility
(EMC)
Part
measurement techniques Surge immunity test
IEC 61000-4-6:2006
Electromagnetic
compatibility
(EMC)
Part
4-6:
Immunity
to conducted
measurement
techniques
induced by radio-frequency fields
Testing
and
disturbances,
lEC 61000-4-10:2001
Electromagnetic
compatibility
(EMC)
Part 4-10:
measurement techniques Damped oscillatory magnetic
test
Testing
and
field immunity
IEC 61000-4-11:2004
Electromagnetic
compatibility
(EMC)
Part 4-11: Testing
and
measurement techniques Voltage dips, short-interruptions
and voltage
variations immunity test
IEC 61000-4-13:2002
Electromagnetic
compatibility
(EMC)
Part 4-13: Testing
and
measurement
techniques Harmonics and interharmonics
including
mains signaling at a.c. power
port, low frequency immunity tests
...
Ill
4-5:
Testing
of
and
Standard
Title
IEC 61000-4-14:2002
compatibility
(EMC)
Parl
4-14:
Testing
Electromagnetic
measurement techniques Voltage fluctuation immunity test
IEC 61000-4-17:2002
compatibility
(EMC)
Parl
4-17:
Testing
and
Electromagnetic
measurement techniques Ripple on d.c. input power port immunity test
IEC 61000-4-18:2006
compatibility
(EMC)
Part
4-18:
Testing
Electromagnetic
measurement techniques Damped oscillatory wave immunity test
IEC 61000-4-20:2007
compatibility
(EMC)
Part
4-20:
Testing
and
Electromagnetic
measurement techniques Emission and immunity testing in transverse
electromagnetic
(TEM) waveguides
IEC 61000-4-21:2003
Electromagnetic
compatibility
(EMC)
Part
4-21:
Testing
and
and
and
Part
4-23:
Testing
and
Electromagnetic
compatibility (EMC)
measurement techniques Test methods for protective devices for HEMP.
and other radiated disturbances
IEC 61000-4-25:2001
Electromagnetic
compatibility
(EMC)
IEC 61000-4-27:2000
compatibility
(EMC)
Part
4-27:
Electromagnetic
measurement techniques Unbalance, immunity test
IEC 61000-4-28:2002
compatibility
(EMC)
Electromagnetic
Part
4-28:
Testing
and
measurement techniques Variation of power frequency, immunity test
IEC 61000-4-29
Electromagnetic
compatibility
(EMC)
Part
4-29:
Testing
and
measurement techniques Voltage dips, short interruptions and voltage
variations on d.c. input power ports, immunity tests
:/2000
Part
4-25:
test methods
Testing
and
for equipment
Testing
IEC 61000-4-30:2006
compatibility
(EMC)
Part
4-30:
Testing
Electromagnetic
measurement techniques Power quality measurement methods
IEC 61000-4-32:2002
Electromagnetic
compatibility
(EMC)
Part
4-32:
measurement techniques High-altitude electromagnetic
simulator compendium
lEC 61000-4-33:2005
compatibility
Electromagnetic
measurement
techniques
transient parameters
IEC 61000-4-34:2005
(EMC)
Measurements
and
and
Testing
and
pulse (HEMP)
Part
4-33:
Testing
and
methods for high power
Part
4-34:
Testing
and
Electromagnetic
compatibility
(EMC)
Only the English text of the International Standard has been retained while adopting it as an Indian
Standard, and as such the page numbers given here are not the same as in the IEC I%blication.
iv
is published
in several
parts according
to the following
structure:
Part 1: General
General
consideration
Definitions,
(introduction,
fundamental
principles)
terminology
Part 2: Environment
Description
of the environment
Classification
of the environment
Compatibility
levels
Part 3: Limits
Emission limits
Immunity test levels (in so far as they do not fall under the responsibility
committees)
Part 4: Testing
and measurement
Measurement
Testing
of the product
techniques
techniques
techniques
Part 5: Installation
and mitigation
guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as International Standards,
technical specifications or technical reports, some of which have already been published as
sections. Others will be published with the part number followed by a dash and completed by a
second number identifying the subdivision (example: 61000-6-1).
Indian Standard
ELECTROMAGNETIC COMPATIBILITY (EMC)
PART 4
Section 1
Revision )
(First
1
This
covers
testing
and measuring
techniques
for electric
and electronic
environment.
Normative references
Electrotechnical
Vocabulary
I EC 61000-1-1,
Electromagnetic
Compatibility
(EMC)
interpretation
of fundamental/ definitions
and terms
IEC 61000-2-5,
electromagnetic
Electromagnetic
environments
Compatibility
Part
(IEV)
Chapter
1-1: General
IEC 61000-3-2,
Electromagnetic
compatibility
(EMC) - Part
current emissions (equipment
input current -s 6 A per phase)
3-2:
Limits
161:
Electro-
- Application
- Classification
-Limits
and
of
for harmonic
IEC61000-3-3,
Electromagnetic
compatibility
(EMC) - Parf 3-3: Limits -Limitation
of voltage
changes, voltage fluctuations
and flicker in public low-voltage
supply systems, for equipment
with rated current 46 A per phase and not subject to conditions/
connection
IECITS 61000-3-4,
Electromagnetic
compatibility
(EMC) - Part 3-4: Limits - Limitation
of
emission of harmonic
currents in low-voltage
power supply systems for equipment
with rated
current graater than 16A
IEC/TR 61000-3-5,
Electromagnetic
compatibility
(EMC) - Part 3-5: Limits - Limitation
of
voltaga fluctuations
and flicker in 10w-voltage power supply systems for equipment
with rated
current greater than 16 A
IEC 61000-3-6,
Electromagnetic
of emission limits for distorting
compatibility
(EMC) - Parf 3; Limits
loads in M V and HV power systems
- Section
6: Assessment
,.,
compatibility
(EMC) - Part 3-12:
connected
to public low-voltage
IEC 61000-4-2,
Electromagnetic
compatibility
techniques Electrostatic
discharge immunity
(fMC)
test
Testing
and
measurement
lEC 61000-4-3,
Electromagnetic
compatibility
(EMC) - Part 4-3: Testing
techniques Radiated, radio-frequency,
electromagnetic
fieid immunity test
and
measurement
IEC 61000-4-4,
Electromagnetic
compatibility
(EMC) Part
techniques Electrical fast transient/burst
immunity test
4-4:
Testing
and
measurement
IEC 61000-4-5,
Electromagnetic
compatibility
techniques Surge immunjty test
4-5:
Testing
and
measurement
(EMC)
Part
Part
4-2:
IEC 61000-4-6,
Electromagnetic
compatibility
{fMC)
- Part 4-6: Testing
techniques Immunity to conducted disturbances,
induced by radio-frequency
IEC 61000-4-7,
techniques
instrumentation,
Electromagnetic
compatibility
(EMC) and
General
guide
on harmonics
for power supply systems and equipment
and measurement
fields
IEC 61000-4-8,
Electromagnetic
compatibility
(EMC)
techniques Power frequency magnetic field immunity
- Part
test
4-8:
Testing
and
measurement
IEC 61000-4-9,
Electromagnetic
compatibility
(EMC)
techniques Pulse magnetic field immunity test
Part
4-9:
Testing
and
measurement
IEC 61000-4-10,
Electromagnetic
techniques Damped oscillatory
compatibility
(EMC) - Part 4-f O: Testhg
m agnetjc field immunity test
IEC 61000-4-11,
Electromagnetic
compatibility
(f MC) Part 4-11:
techniques Voltage dips, short interruptions
and voltage variations
IEC 61000-4-12,
Electromagnetic
compatibility
techniques Oscillatory
waves immunity test
(EMC)
- Part 4-12:
and measurement
and measurement
IEC 61000-4-13,
Electromagnetic
compatibility
(EMC)
techniques
- Harmonics
and interharmonics
including
frequency immunity tests
IEC 61000-4-14,
Electromagnetic
techniques - Voitage fluctuation
Part 4-14:
Testing
and measurement
IEC 61000-4-15,
Electromagnetic
compatibility
(EMC) - Part 4-15:
techniques - Flickermeter
- Functional and design specifications
1
Testing
and measurement
compatibility
immunity test
IEC 61000-4-16,
Electromagnetic
compatibility
to conducted
techniques
- Test for immunity
range O Hz to 150 kHz immunity test
(EMC)
and measurement
in the frequency
Testing
and measurement
IEC 61000-4-18,
Electromagnetic
Compatibility
techniques Oscillatory
wave immunity test
Testing
and measurement
IEC 61000-4-20,
Electromagnetic
compatibility
(fMC) - Part 4-20: Testing and measurement
techniques Emission and immunity testing in transverse electromagnetic
(TEM) waveguides
IEC 61000-4-21,
Electromagnetic
compatibility
(EMC) - Part 4-21:
techniques - Reverberation
chamber test methods
Testing
and measurement
IEC 61000-4-23,
Electromagnetic
compatibility
(fMC) - Part 4-23: Testing and measurement
techniques - Test methods for protective devices for HEMP and other radiated disturbances
IEC 61000-4-24,
Electromagnetic
compatibility
(EMC) - Part 4: Testing and measurement
techniques Section 24: Test methods for protective devices for HEMP conducted disturbance
IEC 61000-4-25,
techniques
EIecfrornagnefic
HEMP immunity
test methods
for equipment
IEC 61000-4-28,
Electromagnetic
compatibility
{EMC) - Part 4-28:
techniques Variation of power frequency, immunity test
IEC 61000-4-29,
Electromagnetic
techniques
Vo/tage dips, short
immunity tests
compatibility
interruptions
and measurement
and systems
Testing
and measurement
Testing
and measurement
IEC 61000-4-30,
Electromagnetic
compatibility
(fMC)
techniques Power quality measurement
methods
- Part 4-30:
Testing
and measurement
IEC 61000-4-32,
Electromagnetic
compatibility
(EMC) - Part 4-32: Testing and measurement
techniques High-altitude
electromagnetic
pulse (HEMP) simulator compendium
IEC 61000-4-33,
Electromagnetic
compatibility
(EMC) - Part 4-33: Testing
techniques Measurement
methods for high power transiant parameters
and measurement
IEC 61000-4-34,
Electromagnetic
compatibility
(EMC) - Part 4-34: Testing and measurement
techniques
Voltage
dips, short interruptions
and voltage
variations
immunity
tests for
equipment with input current more than 16 A per phase
Terms
and definitions
apply.
E,
.
i;
General
Structure
The structure
in IEC Guide
of standards within the IEC 61000-4 series in general follows the guidance given
107. For the basic testing standards of the series, that structure is as follows:
1. Scope
2.
Normative
3.
Terms
references
4.
General
5.
Test levels/limits
6.
Test equipment
7.
Test set-up
8.
Test procedures
9,
Evaluation
and definitions
of test results
(for
and
Selection of tests
to equipment
type tests;
acceptance
production
for example
tests;
tests.
Equipment should be subjected to all tests necessary to provide the required reliability,
but, for
economic
reasons,
the number
of tests may be limited to a reasonable
minimum.
It is
acceptable
that the number
of tests for acceptance
or production
testing
is reduced
in
comparison
with type tests.
.,-.
n!!!
IS 14700 (Part 4/See 1): 2008
IEC 61000-4-1:2006
The selection
such as
types of disturbances
environmental
required
economic
equipment
affecting
to a particular
equipment
depends
on several
factors,
the equipment;
conditions;
reliability
and behaviour;
constraints;
characteristics.
dedicated
product
family
product
generic
standard.
generic standard,
have the following
standard;
standard;
If it is considered that these standards are not applicable to a particular type of equipment,
the
following short explanation
of each part of the IEC 61000-4 series may be helpful. A summary
is also given in Tables 1 and 2.
Test according
to IEC 61000-4-2
(Electrostatic
discharge
immunity
test)
Test according
immunity test)
to IEC 61000-4-3
(Radiated,
radio-frequency,
electromagnetic
field
In general, the radiated immunity test is applicable to all products, where radio-frequency
fields are present.
Exclusions
may include equipment
limited for use in electromagneticcontrolled conditions or low electromagnetic
field environment and non-electrical
or electronic
prod ucts..
Test according
to IEC 61000-4-4
(E/ectrica/
fast tr&msient/burst
Test according
to IEC 61000-4-5
(Surge immunity
to products
which
immunity
test)
which
are connected
are connected
to networks
to mains or
test)
leaving
the
to IEC 61000-4-6
fields)
(Immunity
test to conducted
disturbances
induced
by
and
This technical
report defines the measurement
method of harmonics
and interharmonics.
It compares
the characteristics
of an analogue
measuring
equipment
and of a digital
measuring
equipment.
It provides
also the accuracy awaited and the test set-up. It is
applicable
to voltage or current measurements
in the d.c. frequency
range up to 2500 Hz,
especially
with
regard
to the emission
requirements
according
to IEC 61000-3-2,
IEC 61000-3-4,
IEC 61000-3-6,
IEC 61000-3-12
and IEC 61000-4-30.
(Power frequency
magnetic
fie/d immunity
test)
Test according
to IEC 61000-4-9
(Pulsa magnetic
field immunity
Test according
to IEC 61000-4-10
to products
(Damped
osci//atory
to be installed
(Vo/tage
test)
in electrical
magnetic
plants
(for example
field immunity
in high-voltage
test)
substations.
and vo/fage
variations
test)
This document
defines
the test methods
to evaluate
the immunity
of an equipment
connected to the LV system, to voltage dips, short interruptions
and voltage variations.
This
test is applicable
to equipment
with a rated input current of less than 16 A per phase,
connected
to a.c. mains. The standard
describes
also different
levels of tests, four
performance
criteria, the operating condition when the equipment
is tested and the test setup. It is a basic standard which can be used as a tool for the product committees
which are
defining their own EMC immunity standard.
Test according
to IEC 61000-4-12
(Osci//atory
wave immunity
test)
Test according
to IEC 61000-4-13
(Harmonics,
at a. c, power port, low-frequency
immunity tests)
This test may be applied to equipment
sensitive
mains or to specific harmonic components.
interharmonics
to precise
including
zero crossing
mains
signaling
2,
(Vo/tage
fluctuation
immunity
test)
most
In general, voltage fluctuations
have an amplitude
not exceeding
10 ?40; therefore,
equipment
is not disturbed by voltage fluctuations.
However, this teat may be applicable to
equipment intended to be installed at locations where the mains have larger fluctuations.
c
Test according
to I EC 61000-4-15
(Flickermeter
Functional
and design
specifications)
This is a specification
for a flickermeter,
intended to indicate correct flicker perception level
for all practical
voltage
fluctuation
waveforms,
especially
with regard to the emission
IEC 61000-3-5 and IEC 61000-3-11.
requirements
according to IEC 61000-3-3,
Test
according
disturbances
to IEC 61000-4-16
in the frequency
to
conducted,
common
mode
Test according
to IEC 61000-4-17
(Ripple
Test
to I EC 61000-4-20
(TEM) waveguides)
(Emission
and
electromagnetic
This
standard
electromagnetic
specifies
equipment
fields in TEM cells.
and
procedures
according
to IEC 61000-4-23
immunity
testing
in
batteries
transverse
for
testing
to
radiated
for
testing
to
radiated
chambers)
and test
chambers.
(Test
with external
procedures
methods
for protective
devices
for HEMP
and
disturbance)
Test
devices
according
conducted
to IEC 61000-4-24
(Test
methods
for
protective
for
HEMP
disturbance)
This standard
covers testing
HEMP protective devices
test
(Reverberation
specifies
equipment
fields in reverberation
Test according
other radiated
systems
test)
Test according
of voltage
to IEC 61000-4-25
breakdown
(HEMP
immunity
and voltage-limiting
characteristics
of
for equipment
and systems)
This standard specifies the basic HEMP test methods and levels appropriate
and conducted
immunity
testing. It is applicable
for equipment
and systems
survive a HEMP.
(Unbalance
immunity
for radiated
intended to
test)
Test according
tolEC61000-4-28
(Variation
ofpower
frequency,
immunity
test)
In general, the test for variation of the power frequency is not applicable.
However, it may
apply to equipment
intended to be installed at locations where the power frequency
has
large variations (for example equipment connected to an emergency
power supply).
Test according
to IEC 61000-4-32
Test accord
parameters)
variations
on
parameters)
of power quality
(HEMP simulator
information
and vo/tage
of power quality
on the measurement
dips, interruptions
tests)
This standard
(Voltage
parameters.
compendium)
(Measurement
methods
for
and applicability
high
power
of
transient
This standard provides a basic description of the methods snd means of measuring
responses
electromagnetic
and conducted
disturbances
of the various
standards
greater
is given in Table
radiated
than
variations
16 A per phase,
1.
the corresponding
Test report
necessary
identification
of the EUT and any associated
type, serial number;
identification
any special
environmental
shielded enclosure;
any specific
conditions
necessary
performance
level defined
performance
criterion
for example,
brand name,
in which
the
test
product
was
the test.
brand
In particular,
name,
type, serial
performed,
for
product
number;
example,
by the manufacturer,
specified
equipment,
for example,
conditions
to reproduce
in the generic,
requestor
product
or purchaser;
or product-family
standard;
and
I!!B
Table 1- Applicability
or
Basic standard
or grounding,
Description
Special (e.g.
power plant)
m
61000-4-2
! ESD
aa
fr.a.
g.a.
61000-4-3
g.a.
g.a.
g.a.
61000-4-4
EFT/Burst
g.a.
g.a.
g.a.
61000-4-5
Surge
g.a.
g:a.
g.a.
61000-4-6
g.a,
g.a.
61000-4-7
n.i.s.
n,i.s.
n.i.s.
61000-4-8
may
may
g.a.
61000-4-9
g.n.a.
g.n.a.
61000-4-10
g.n.a.
g.n.a.
----1
a.a.
!.
g.a,
61000-4-11
g.a.
g.a.
61000-4-12
mav
may
may
61000-4-13
may
may
61000-4-14
Voltage fluctuations
may
may
-JN.--l
may
61000-4-15
Flickermeter
nis
n.i. s.
61000-4-16
g.n.a.
may
61000-4-17
g.n.a.
may
g.n,a,
61000-4-18
g.n,a.
may
may
61000-4-19
Free
61000-4-20
TEM waveguides
61000-4-21
Reverberation chambers
6fOO0-4-22
Free
61000-4-23
g.n.a.
g.n.a,
g.n.a.
61000-4-24
g.n.a.
g.n.a.
g.n.a.
61000-4-25
g.n.a.
g.n.a,
g.n.a.
g.a.
1
61000-4-27
61000-4-28
n.i.s.
g.n.a.
,-
may
may
may
g.n.a.
g.n.a.
g.n.a.
Applicability
Description
Basic standard
I
4
51000-4-29
51000-4-30
51000-4-32
31000-4-33
51000-4-34
n
Special (e.g.
power plant)
may
n.i, s.
n.i.s.
n.i.s.
g.a.
Applicability explanation:
n.i.s.
g.a,
10
g.a.
g.a.
!ll
Bureau of Indian Standards
established
under the Bureau
BIS is a statutory institution
harmonious
development
of the activities of standardization,
and attending to connected
matters in the country.
Copyright
BIS has the copyright
form without
implementing
designations.
No part of these
of BIS.
publications
may be reproduced
in any
the free use, in course of
and sizes,
type or grade
(Publications),
BIS.
details,
such as symbols
be addressed
to the Director
Amendments
Amendment
No.
BUREAU
OF INDIAN
Text Affected
STANDARDS
Headquarters:
Manak Bhavan, 9 Bahadur Shah Zafar Marg, New Delhi 110002
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9402
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{ 2323 384i
160022
2603843
{ 2609285
600113
{
23378499,23378561
23378626,23379120
22541216, 22541442
22542519,22542315
28329295,28327858
{ 28327891, 28327892