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IC MANUFACTURING (CMOS)
Submitted by:
MARCH 10 2016
(DATE OF SUBMISSION)
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Step 4: Doping
To alter the electrical character of silicon, atom with one less electron than silicon such as
boron and atom with one electron greater then silicon such as phosphorous are introduced into
the area. The P-type (boron) and N-type (phosphorous) are created to reflect their conducting
characteristics. Diffusion is defined as the movement of impurity atoms in semiconductor
material at high temperature. In atomic diffusion, p and n regions are created by adding dopants
into the wafer. The wafers are placed in an oven which is made up of quartz and it is surrounded
with heating elements. Then the wafers are heated at a temperature of about 1500-2200F. The
inert gas carries the dopant chemical. The dopant and gas is passed through the wafers and
finally the dopant will get deposited on the wafer. This method can
only be used
for large areas. For small areas it will be difficult and it may not be
accurate.
In
Ion implantation this is also a method used for
adding dopants. In this method, dopant gas
such as phosphine or boron trichloride will be
ionized first. Then it provides a beam of high
energy dopant ions to the specified regions of wafer. It will
penetrate
the wafer. The depth of the penetration depends on the
energy of the beam. By altering the beam energy, it is possible to control the depth of penetration
of dopants into the wafer. The beam current and time of exposure is used to control the amount
of dopant. This method is slower than atomic diffusion process. It does not require masking and
this process is very precise. First it points the wafer that where it is needed and shoot the dopants
to the place where it is required.
Step 5: Metallization
It is used to create contact with silicon and to make interconnections on chip. A thin layer
of aluminum is deposited over the whole wafer. Aluminum is selected because it is a good
conductor, has good mechanical bond with silicon, forms low resistance contact and it can be
applied and patterned with single deposition and etching process. Making successive layers: The
process such as masking,
etching, doping will be repeated
for
each
successive layers until all integrated
chips
are
completed. Between the components,
silicon dioxide is used as
insulator. This process is
called
chemical vapor deposition. To make
contact pads, aluminum is
deposited. The fabrication
includes more than three layers
separated by dielectric layers.
For electrical and physical isolation a
layer of solid dielectric is
surrounded
in
each
component
which provides isolation. It is
possible to fabricate
PNP and NPN transistor in the same silicon substrate. To avoid damage and contamination of
circuit, final dielectric layer (passivation) is deposited. After that, the individual IC will be tested
for electrical function. Check the functionality of each chip on wafer. Those chips are not passed
in the test will be rejected.
Step 6: Assembly and packaging
Each of the wafers contains hundreds of chips. These chips are separated and packaged
by a method called scribing and cleaving. The wafer is similar to a piece of glass. A diamond saw
cut the wafer into single
chips. The diamond tipped
tool is used to cut the lines
through the rectangular grid
which
separates
the
individual chips. The chips
that are failed in electrical
test are discarded. Before
packaging, remaining chips
are
observed
under
microscope. The good chip is
then mounted into a package.
Thin wire is connected using
ultrasonic bonding. It is then
encapsulated for protection. Before delivered to customer, the chip is tested again. There are
three configurations available for packaging. They are metal can package, ceramic flat package
and dual in line package. For military applications, the chip is assembled in ceramic packages.
The complete integrated circuits are sealed in anti static plastic bags.
Mask number four allows the implantation of the n channel region with a high
concentration of n type doping to form the highly conductive source from drain region of the n
channel transistors.
Mask number five uncovers regions in the p channel transistor which are implanted with
a high concentration of Boron a p-type doping to create the source and drain region of the
transistors.
Photolithography and mask number six define the opening of which the metal wiring will
be able to contact the source gate and drain region of each transistor. In mask number 6 contact
holes are created by plasma etching. Then a layer of an aluminum silicon alloy is deposited onto
the wafer to become the first level of
wiring.
In mask number seven, a layer
patterns the aluminum. This is the
first level in which individual
transistors are wind together to form
complex blocks of circuitry. Then
excess aluminum is removed using
dry etching the photoresist is remove.
If the circuitry is very complex
additional masking is provided. The
following are;
1. Deposition of silicon dioxide
2. Photolithography, masking, and
etching to open contact holes between
metal layers.
3. Deposition of tungsten metal into contact holes
4. Deposition and patterning of the new upper level of aluminum alloy.
Finally, after all layers are in place a final layer of silicon nitride is deposited to protect
fragile aluminum interconnects. In the last photolithography step or masking only the nitride is
etched away.
14
2 x 10
to
15
10
cm
. Since the
wells are realized by means of diffusion, they are doped at a higher level than the substrate itself.
16
3
Typical doping levels of the wells are about 10 cm . As a result, the bulk doping level of an
nMOST in a pwell CMOS technology is much higher than in an n-well CMOS technology which
leads to a ratio that is a factor of 10 to 50. These two values of bulk doping levels will give
different values of transistor parameters. In addition, a substrate is always the material just
underneath the gate. For n-well CMOS technology, the p substrate is the substrate for the
NMOS; on the other hand, the n-well is also the substrate for the PMOS as we can see from the
figures above.
The
n-channel
transistor has two heavily
doped electron-rich n-type
regions separated by an
electron core p-type substrate.
The
electron-rich
regions
called the source and drain
become the ends of the
electronic switch which is
normally off. The gate
electrode is closed and
electrically isolated from the p-type region. The application of a small positive voltage creates a
net positive charge on the gate. This charge attracts electrons from the drain and source regions
turning the switch on. When the gate voltage returns to zero, the transistor is again off. In a
normally off p-channel transistor, heavily doped p-type regions are separated by lightly doped ntype substrate. The application of a small negative voltage repels electrons and attracts the
positive carriers turning the switch on. It is possible to fabricate both p and n-channel transistors
on the same wafer by doping sections of the wafer. This is now the complementary MOS because
the gate voltage which turns the p-channel transistor on turns an n-channel transistor off.
To start CMOS fabrication, p-type wafers with specific resistance are selected. All types
of integrated circuits including CMOS are fabricated using four basic techniques which are (1)
formation of thin layers of silicon dioxide, (2) introduction of dopant atoms, (3) deposition of a
variety of insulating and conductive materials, and (4) precision patterning of each of these
layers.