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FrCT3.

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A novel method of EEG data acquisition, feature
extraction and feature space creation for Early
Detection of Epileptic Seizures
Sylvia Bugeja, Lalit Garg, and Eliazar E. Audu

Problem:
The proposed method creates a simple, yet very
effective training set acquisition for epileptic sei-
zure detection making the classifiers training
phase faster.
The proposed method was tested using CHB-MIT
database[2], a dataset of 977 hours of EEG data
containing 192 seizure instances from 22 pediat-
ric patients collected at the Childrens Hospital,
Boston.

Method: Results:
Table of Results
The proposed method creates a simple, yet
very effective training set acquisition for epi- 10-Minute 20-Minute 30-Minutes Shoeb et
Subsets Subsets Subset al. [2]
leptic seizure detection making the classifiers
SVM ELM SVM ELM SVM ELM results
training phase faster. Sensitivity(%) 95.33 99.48 95.42 99.48 97.98 98.99 96%
The proposed method was tested using CHB- Specificity(%) 87.11 74.21 89.90 77.16 83.73 81.39 -
MIT database[2], a dataset of 977 hours of Latency(Seconds) 3.18 0.97 2.88 0.97 2.95 1.26 3

EEG data containing 192 seizure instances Seizure detection Sensitivity


from 22 pediatric patients collected at the 100%
99% ELM ELM
ELM
Childrens Hospital, Boston. 98%
97% SVM
96%
95% Shoeb et
SVM SVM al. [2]
94%
93%
CHB-MIT
10-Minute Subsets 20-Minute Subsets 30-Minutes Subset Shoeb et al. [2]
SVM ELM Shoeb et al. [2]
Download Patient European Data Format (EDF )Files
Figure 2. Seizure detection Sensitivity: SVM vs ELM and Shoeb et al. [2].
Data Pre-Processing

Extract Seizure Data and save it into a more easy to read format Seizure detection Specificity
Set number and location of channels consistent throughout the entire patients
100%
EDF files. Also, eliminate artifact channels and save this data
80% SVM SVM
Transform all EDF files into two second epoched EEG data SVM ELM
ELM ELM
If an EDF file contains multiple seizures than divide each EDF file into multiple 60%
EDF files such that each subset contains exactly one seizure data. 40%

20%
Feature Vector Design
0%
10-Minute Subsets 20-Minute Subsets 30-Minutes Subset
Simple Training Set Acquisition SVM ELM

Fetch N number of Epochs/Minutes training subsets from EDF files containing Figure 3. Seizure detection Specificity: SVM vs ELM performance metrics.
Seizure Data
Save remaining data (i.e. data not part of the N number of Epochs/Minutes train-
ing subsets) as Non Seizure EDF files. Seizure detection latency (in seconds)
3.50
3.00
SVM Shoeb et
2.50 SVM SVM
Testing Set Acquisition 2.00 al. [2]
1.50
Fetch all Non Seizure EDF files created in the Training Set Acquisition 1.00 ELM
Fetch all the EDF files which did not have any Seizure Data 0.50 ELM ELM
0.00
10-Minute 20-Minute 30-Minutes Shoeb et al. [2]
Subsets Subsets Subset

Feature Selection SVM ELM Shoeb et al. [2]

Extract 1 to 10 frequency waveforms from Training and Testing sets Multilevel Figure 4. Seizure detection Latency: SVM vs. ELM and Shoaib et al. [2].
Wavelet Decomposition
Calculate Mean Frequencies of energy falling within the waveforms
Get Time-Evolution features
Conclusions
The proposed method provides a very good
Feature Vector Classification
foundation for simple and effective epileptic
Input Space Creation Classify Fea- seizure detectors to be built in the near fu-
ture Vectors
Create SeizureVectors
Create SeizureClass
using SVM/ ture.
ELM
Create NonSeizureVectors Albert Supercomputer
Create NonSeizureClass Execute Feature Vectors
The 10-minutes training subsets, perform
Classification Process
Create 10 Minutes 20 Minutes and as good as lengthier training subsets.
30 Minutes Training Subsets

The ELM classification technique performs


Figure 1. Flowchart illustrating the steps involved in the proposed method
better than the SVM classification tech-
nique.

References:
[1]Epilepsy, Fact sheet, WHO. February 2016. Available: http://www.who.int/mediacentre/
factsheets/fs999/en/.
[2] A. H. Shoeb and J. V. Guttag, Application of machine learning to epileptic seizure detection,
Proceedings of the 27th International Conference on Machine Learning (ICML-10), pp.~975-982,
2010.