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CD4081BM/CD4081BC Quad 2-Input AND Buffered B Series Gate

CD4071BM/CD4071BC Quad 2-Input OR Buffered B Series Gate
February 1988

CD4071BM/CD4071BC
Quad 2-Input OR Buffered B Series Gate
CD4081BM/CD4081BC
Quad 2-Input AND Buffered B Series Gate
General Description Features
These quad gates are monolithic complementary MOS Y Low power TTL Fan out of 2 driving 74L
(CMOS) integrated circuits constructed with N- and P-chan- compatibility or 1 driving 74LS
nel enhancement mode transistors. They have equal source Y 5V – 10V – 15V parametric ratings
and sink current capabilities and conform to standard B se- Y Symmetrical output characteristics
ries output drive. The devices also have buffered outputs Y Maximum input leakage 1 mA at 15V over full tempera-
which improve transfer characteristics by providing very ture range
high gain.
All inputs protected against static discharge with diodes to
VDD and VSS.

Connection Diagrams
CD4071B Dual-In-Line Package

TL/F/5977 – 3
Top View

CD4081B Dual-In-Line Package

TL/F/5977 – 6
Top View

Order Number CD4071B or CD4081B

C1995 National Semiconductor Corporation TL/F/5977 RRD-B30M105/Printed in U. S. A.

5V 3.25 0.0V 3. VO e 0.5 V Input Voltage VDD e 10V.05 0.25 b 0.25 7.0 V VIH High Level VDD e 5V.2 3.0 V VDD e 15V.4V 0.8 b 2.10 b 10 b 5 b 0.3 2.0V 7. VO e 9. VIN e 0V b 0.2 b 3.05 0. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device operation.5V Operating Conditions Power Dissipation (PD) Operating Range (VDD) 3 VDC to 15 VDC Dual-In-Line 700 mW Operating Temperature Range (TA) Small Outline 500 mW CD4071BM.004 0.0 6 7. Lead Temperature (TL) please contact the National Semiconductor Sales (Soldering.5 3 3.95 V Output Voltage VDD e 10V lIOl k 1 mA 9. 10 seconds) 260§ C Office/Distributors for availability and specifications.50 15 mA VDD e 15V 1.95 V VDD e 15V 14.0 V VDD e 15V.10 1.4 8.10 b 1. VO e 4.05 0 0.0 7.0 0.0 4.6 1.0 6 4.95 5 4.95 10 9.3 b 2.4 mA IIN Input Current VDD e 15V.88 b 0.51 0.5V 1.5V 1. CD4081BC b 40§ C to a 85§ C Storage Temperature (TS) b 65§ C to a 150§ C DC Electrical Characteristics CD4071BM/CD4081BM (Note 2) b 55§ C a 25§ C a 125§ C Symbol Parameter Conditions Units Min Max Min Typ Max Min Max IDD Quiescent Device VDD e 5V 0.9 mA (Note 3) VDD e 15V.5V b 4. VIN e 15V 0.64 0. Except for ‘‘Operating Temperature Range’’ they are not meant to imply that the devices should be operated at these limits.0 9 11.8 2. VO e 1.64 b 0. VO e 1. Absolute Maximum Ratings (Notes 1 & 2) If Military/Aerospace specified devices are required.0 mA VDD e 15V. VO e 9.0 4 3. VO e 13.95 4.5V b 1.50 0. VO e 0. VO e 1.5 mA Current VDD e 10V 0.005 0.5 VDC to a 18 VDC CD4071BC.5 1. VO e 0.05 V VDD e 15V 0.05 0 0.6V b 0.6 b 1.0 mA Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed.4 b 8.5 2 1.5V 11.95 9.95 15 14. VO e 4.36 mA Current VDD e 10V. 2 .0 V IOL Low Level Output VDD e 5V.88 0.4 mA IOH High Level Output VDD e 5V. Voltage at Any Pin b 0.0 30 mA ( VOL Low Level VDD e 5V 0.10 10b5 0.0 11.9 mA (Note 3) VDD e 15V.5V to VDD a 0. VO e 13.95 14.51 b 0.05 0 0.5V 4.05 V Output Voltage VDD e 10V lIOl k 1 mA 0.25 0.36 mA Current VDD e 10V.95 V VIL Low Level VDD e 5V.5V 4. Note 3: IOH and IOL are tested one output at a time.05 0.5 V Input Voltage VDD e 10V. CD4081BM b 55§ C to a 125§ C VDD Range b 0.006 1.05 V ( VOH High Level VDD e 5V 4. Note 2: All voltages measured with respect to VSS unless otherwise specified.5 3.0 3.

44 b 0.0 4 3.30 1.3 b 1. DC Electrical Characteristics CD4071BC/CD4081BC (Note 2) b 40§ C a 25§ C a 85§ C Symbol Parameter Conditions Units Min Max Min Typ Max Min Max IDD Quiescent Device VDD e 5V 1 0.0 3.25 0. VO e 0.30 b 1.5V b 3.5 1. Note 2: All voltages measured with respect to VSS unless otherwise specified.005 2 15 mA VDD e 15V 4 0.95 4.004 1 7. tTLH Transition Time VDD e 5V 90 200 ns VDD e 10V 50 100 ns VDD e 15V 40 80 ns CIN Average Input Capacitance Any Input 5 7.5V 3.30 b 10 b 5 b 0.95 14.0 11.9 mA (Note 3) VDD e 15V.36 mA Current VDD e 10V.0 V VIH High Level VDD e 5V.5 mA Current VDD e 10V 2 0.5V 4. VIN e 0V b 0.5V 11. VO e 1.6 3.0 4.4V 0.5V 1.8 b 2.05 0.95 15 14. VDD e 5V 90 250 ns Low-to-High Level VDD e 10V 40 100 ns VDD e 15V 30 70 ns tTHL.95 9. VO e 1. VDD e 5V 100 250 ns High-to-Low Level VDD e 10V 40 100 ns VDD e 15V 30 70 ns tPLH Propagation Delay Time.9 mA (Note 3) VDD e 15V.05 V Output Voltage VDD e 10V lIOl k 1 mA 0.4 mA IOH High Level Output VDD e 5V.95 5 4.5 3.52 0. Typical temperature coefficient is 0. VO e 13.52 b 0.05 0.4 mA IIN Input Current VDD e 15V.5 pF CPD Power Dissipation Capacity Any Gate 18 pF *AC Parameters are guaranteed by DC correlated testing.95 10 9.3%/§ C Symbol Parameter Conditions Typ Max Units tPHL Propagation Delay Time. VO e 0.0 mA VDD e 15V.0 7.6 b 3.36 mA Current VDD e 10V.5V 3. CL e 50 pF.0 8.05 0 0.0 b 8.95 V VDD e 15V 14.05 V ( VOH High Level VDD e 5V 4.95 V Output Voltage VDD e 10V lIOl k 1 mA 9. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device operation.0 mA AC Electrical Characteristics* CD4071BC/CD4071BM TA e 25§ C.44 0.5 V Input Voltage VDD e 10V.0V 7. RL e 200 kX.6V b 0.0 V VDD e 15V.05 0 0.5V b 1. VO e 4.5 3 3.95 V VIL Low Level VDD e 5V.05 0 0.1 2. VIN e 15V 0.0 6 7.88 b 0. VO e 13. VO e 9.5 V Input Voltage VDD e 10V.5V 1.0 9 11. VO e 0.5 2 1.0 V VDD e 15V.0 6 4. Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. VO e 9.8 2. Note 3: IOH and IOL are tested one output at a time. VO e 4. tf e 20 ns.006 4 30 mA ( VOL Low Level VDD e 5V 0. 3 .0 V IOL Low Level Output VDD e 5V.88 0.05 0.3 1.05 V VDD e 15V 0.25 b 0. VO e 1.30 10b5 0. Except for ‘‘Operating Temperature Range’’ they are not meant to imply that the devices should be operated at these limits.0V 3. Input tr.1 b 2.

Typical Transfer FIGURE 3. Typical Transfer Characteristics 4 . VDD e 5V 100 250 ns High-to-Low Level VDD e 10V 40 100 ns VDD e 15V 30 70 ns tPLH Propagation Delay Time. Input tr.3%/§ C Symbol Parameter Conditions Typ Max Units tPHL Propagation Delay Time. Typical Transfer Characteristics Characteristics Characteristics TL/F/5977 – 11 TL/F/5977 – 12 FIGURE 5 FIGURE 6 TL/F/5977–10 FIGURE 4. RL e 200 kX. tf e 20 ns.5 pF CPD Power Dissipation Capacity Any Gate 18 pF *AC Parameters are guaranteed by DC correlated testing. Typical temperature coefficient is 0.AC Electrical Characteristics* CD4081BC/CD4081BM TA e 25§ C. Typical Performance Characteristics TL/F/5977–7 TL/F/5977 – 8 TL/F/5977 – 9 FIGURE 1. tTLH Transition Time VDD e 5V 90 200 ns VDD e 10V 50 100 ns VDD e 15V 40 80 ns CIN Average Input Capacitance Any Input 5 7. Typical Transfer FIGURE 2. CL e 50 pF. VDD e 5V 120 250 ns Low-to-High Level VDD e 10V 50 100 ns VDD e 15V 35 70 ns tTHL.

Typical Performance Characteristics (Continued) TL/F/5977–13 TL/F/5977 – 14 TL/F/5977 – 15 FIGURE 7 FIGURE 8 FIGURE 9 TL/F/5977–16 TL/F/5977 – 17 TL/F/5977 – 18 FIGURE 10 FIGURE 11 FIGURE 12 TL/F/5977 – 19 TL/F/5977 – 20 FIGURE 13 FIGURE 14 5 .

TL/F/5977 – 5 TL/F/5977–4 6 .Schematic Diagrams CD4071B (/4 of device shown JeAaB Logical ‘‘1’’ e High Logical ‘‘0’’ e Low *All inputs protected by standard CMOS protection circuit. TL/F/5977 – 2 TL/F/5977–1 CD4081B (/4 of device shown JeA#B Logical ‘‘1’’ e High Logical ‘‘0’’ e Low *All inputs protected by standard CMOS protection circuit.

Physical Dimensions inches (millimeters) Ceramic Dual-In-Line Package (J) Order Number CD4071BMJ. CD4071BCJ CD4081BMJ or CD4081BCJ NS Package Number J14A 7 .

Life support devices or systems are devices or 2. Straight Block. . (a) are intended for surgical implant support device or system whose failure to perform can into the body. 5 Canton Rd. CD4071BM/CD4071BC Quad 2-Input OR Buffered B Series Gate CD4081BM/CD4081BC Quad 2-Input AND Buffered B Series Gate Physical Dimensions inches (millimeters) (Continued) Molded Dual-In-Line Package (N) Order Number CD4071BMN. can effectiveness. 1111 West Bardin Road Fax: (a49) 0-180-530 85 86 13th Floor. no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications. and whose be reasonably expected to cause the failure of the life failure to perform. when properly used in accordance support device or system. be reasonably expected to result in a significant injury to the user. As used herein: 1. CD4071BCN CD4081BMN or CD4081BCN NS Package Number N14A LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. TX 76017 Email: cnjwge @ tevm2. National Semiconductor National Semiconductor National Semiconductor National Semiconductor Corporation Europe Hong Kong Ltd. Tel: 81-043-299-2309 Arlington. Japan Ltd. Fax: 81-043-299-2408 Tel: 1(800) 272-9959 Deutsch Tel: (a49) 0-180-530 85 85 Tsimshatsui. A critical component is any component of a life systems which. or (b) support or sustain life.nsc. or to affect its safety or with instructions for use provided in the labeling. Kowloon Fax: 1(800) 737-7018 English Tel: (a49) 0-180-532 78 32 Hong Kong Fran3ais Tel: (a49) 0-180-532 93 58 Tel: (852) 2737-1600 Italiano Tel: (a49) 0-180-534 16 80 Fax: (852) 2736-9960 National does not assume any responsibility for use of any circuitry described.com Ocean Centre.

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