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OmniScan PA 1.

4
®

Ultrasound and Phased Array Acquisition and Analysis Software

• Improved speed
• Advanced calibration features
• Group and focal law wizards
• Multiple-group configuration
OmniScan PA Software 1.4 ® • A new option allows you to set automatically the number of
A-scan points that will be stored. This mode will automatically ad‑
This document describes the modified and added features of ver‑ just the point quantity and the compression factor according to the
sion 1.4 of the OmniScan PA software. inspection range in order to keep the number of points between
320 and 640.
New Characteristics • Saving A-scan, C-scan, defect table, screen capture, and re‑
port files can no longer be done on the DiskOnChip. The
General Functions CompactFlash memory card, as well as any USB or network stor‑
• Improved processing speed for focal law (beam) calculation, age, can now be used to store these files.
display presentation, and application of ultrasound parameter • The maximum inspection file size allowed is limited at 160 Mb
modification. instead of previous 200 MB. Note that for 95% of the applications
• The color palette file is now using the XML format. on the market, 160 MB of memory is sufficient. When using a
It is important to note that you must update to the latest version of standard 35°–70° sectorial scan configuration, 160 MB of memory
Eclipse Scientific Products ESPalette in order to use it with the new will allow you to inspect approximately 15 m in one scan. How‑
palette file format. ever, if an extended memory is absolutely needed, an electronic
• The number of alarms has been increased to 8 logical alarms modification can be done to increase it to 300 MB.
instead of the 3 available with the OmniScan PA version 1.0. External Digital Inputs
It is now possible to customize digital inputs (DIN 1 through
DIN 4). Four digital inputs can be defined with the following
parameters:
• Preset Encoder 1
• Preset Encoder 2
• Pause/Resume (acquisition)
• Save Data
• Clear All
S-scan from previous version (left) Predefined Setups
S‑scan interpolation in version
1.4 (right)
The OmniScan PA now offers predefined setups covering the most
common inspections to increase the speed of setup preparation.
How to use RD_FlawDetector_35-70SW.ops

• Improved S‑scan interpolation for better representation of indications.


• When turning off the OmniScan MX unit, if modifications were
2 Setting up the Omniscan

2.1 Connect the probe : the Focal laws will recalculate using your probe configuration

made to the setup, a message box appears to ask if the modifica‑


2.2 Main menu “Probe/Part”, submenu “select” , choose your wedge in “SelectWedge” parameter

2.3 Main menu “Probe/Part”, submenu “Parts” , in “Thickness” parameter, enter the Thickness of
the part to inspect.

tions should be saved before quitting.


· In “Material” drop list, Select material if different than Steel

2.4 Press or Main Menu “UT”, Submenu “General”


- Gain – to visualize reference defect at 80 % FSH on A-scan

• Tracking of the highest amplitude in gate A has been greatly


- Start – from interface
3.11 Move the probe forward and backward to build the green envelope curve that takes the signal position for each
- Range - to visualize the complete thickness of the part to inspect.
beam. (see images below)

2.5 Press or Main Menu “Calibration”, Submenu “Phased array” Perform Wedge delay calibration - Follow
1 Recommended probe and wedge combinations Section 3

improved. The law selector cursor in the S-scan can be linked -


-
-
-
5L16-A1 probe with SA1-N60S wedge
2L16-A1 probe with SA1-N60S wedge
10L32-A1 probe with SA1-N60S wedge
5L64-A2 probe with SA2-N55S wedge
2.6 Press
Section 4
or Main Menu “Calibration”, Submenu “Phased array” Perform Sensitivity calibration Follow

to the A-scan view. Therefore, the signal in the A-scan will be


- 2L64-A2 probe with SA2-N55S wedge

Note: Other probe and shear wave wedges combination can be used 2.7 Press or Main Menu “Gate/Alarm”,4 SubmenuSensitivity
“Gate”,calibration
adjust the A gate to the interest defect zone. This
gate will give you the different information in the 4 top readings (see below for definition).

4.9 Move the probe forward and backward to build the green envelope curve that takes the signal amplitude for each

displayed according to the law on which the law selector cursor in


beam. (see images below) 4.1 Press or Main Menu “Calibration”, Submenu “Phased array” Select Mode: Sensitivity
3 Wedge Delay calibration
4.2 Press Next
4.3 Set the Reference amplitude to 80% and tolerance to 5%
4.4 Press Next
4.5 Put the probe on your calibration bloc firing at the reference reflector (ex. Side drilled hole on IIW block
3.1 Press or Main Menu “Calibration”, Submenua.“Phased array”
To help Select Mode:
the calibration, putWedge delay
the bloc on the side so the probe and wedge do not skew as the calibration is

the S-scan is positioned. The information in reading fields is also


3.2 Press Next performed. (see image below)
3.3 Set Depth A
3.4 Select Echo Type: Depth
3.5 Select Depth and enter the real depth of the indication you will calibrate on
3.6 Select Tolerance = 1mm or 0,04 inch
3.7 Press Next
3.8

linked to that signal.


Set the gate A on each side of the reference signal and set threshold to 10%

3.12 Press Calibrate


- Redo the Movement to see if the Green envelope curve under tolerance

• The OmniScan PA no longer boots from a program located on the


- If the envelope curve is between the tolerances lines (red doted lines) press Accept. If not, you can press Restart
and redo the calibration until it becomes acceptable

3.9 Press Next


4.6 crossing
Set thethe
gate A onfor
each side of the reference signal and set threshold to 10%

DiskOnChip® (OmniScan PA versions 1.0 through 1.4). It boots


3.10 Adjust the Gain to have the indication signal A-gate each beams

from a program located either on the CompactFlash® memory 4.10


4.11
4.12
Press Calibrate
Redo the Movement to see if the Green envelope curve under tolerance
If the envelope curve is between the tolerances lines (red doted lines) press Accept. If not, you can press restart and

card installed in the card reader of the OmniScan MX or installed


redo the calibration until it becomes acceptable 4.7 Press Next
4.8 Adjust the Gain to see your signal around 75% of full screen height.
5 How to use the Flaw detector configuration

- The A-scan is following the highest peak in the A-gate from any angles of the S-scan and giving the information b. Make sure to press Accept after a gain change
from the 4 readings:

in an external card reader connected to any OmniScan MX USB


o A%: Maximum amplitude in A gate
o PA: Surface distance from front of the wedge to the indication in gate A
o DA: Depth of indication in gate A
o Um-r: Ultrasound measure cursor minus reference cursor (height of indication)
- The indications should appear in the S-scan as with a color code related to amplitude (white 0%, Yellow 50%, red
80% and higher). The A-scan will follow the highest signal in A-gate of any beam from the Sectorial scan

port (USB 1.0 only). It is important to note than the boot option - At anytime to take a measurement point, the Freeze button can be pressed this will stop the refresh of the
A-scan and S-scan. To restart scanning press on Freeze a second time

from a external card reader connected to USB port is only avail‑


- Each time an indication is found pressing on the save button will save an entry into the indication table
with the 4 readings and a print screen of this indication

- At the end of inspection, in Main Menu “File”, Submenu “Report”, press on “build” to preview the report
of all the indication found.

able with PA software version 1.4.


Data Storage • Flaw detection: Sectorial scanning from 35° through 70° SW, for
• In the encoder synchronization inspection mode, it is possible to manual inspection using the indication table for the data storage.
store the scan with different parameters: • Corrosion or composite inspection: Linear (electronic) scanning,
- Last: Saves the last data. normal beam (0°), using a one-axis encoder.
- A%: Saves data for the signals detected in gate A, with the highest • Weld inspection: Linear (electronic) scanning, 60° SW, using a
amplitude. one-axis encoder.
- Max. Thickness: Saves data based on the maximum thickness • Weld or component inspection: Sectorial scanning from 35°
calculation. through 70° SW, using a one-axis encoder.
- Min. Thickness: Saves data based on the minimum thickness All these setups are accompanied with online help. Step-by-step in‑
calculation. structions appear on screen to help the user customize the settings.


C-Scan Overlap Reading Fields and Inspection Information
Two kinds of electronic linear scans are now available: There are now two groups of four reading fields available instead of
• Electronic Linear Angle only one group. Only one group can be displayed at a time, but all
eight reading fields are added into the report and/or defect table.

New reading fields are added to place the indication at the correct
volumetric position from a reference point in the part:
• ViA: Volumetric position of the indication detected in gate A with
regard to the 0 position on the index axis. (For gate B, ViB.)
• VsA: Volumetric position of the indication detected in gate A with
regard to the 0 position on the scan axis. (For gate B, VsB.)
• %(Ur): Signal amplitude at the position of the reference ultra‑
sound cursor. Value not computed in analysis mode. (For measure‑
ment cursor, %(Um)
Wizards for Groups and Focal Laws
This option allows setting an angle from 0° to 90°, but without
overlap area in a raster scan inspection.
• Electronic Linear 0 Degree
Active group
16
1 128

Scanning direction

Example of the Focal Law Wizard

• The Group Wizard allows you to enter all probe, part, and beam
parameters, and generate all focal laws in one step instead of
generating them with each change.
• The step-by-step approach prevents the user from missing a pa‑
rameter change.
The only angle available with this option is 0° but it allows the • Online help gives general information on parameters to be set.
possibility to obtaining an overlap area in a raster scan inspection. The Group Wizard includes the Focal Law Wizard for the creation
Note that this scan mode is not available in the multiple-group of focal laws.
configuration option.

Ultrasound Ruler Units


The default unit of the ultrasound ruler has been changed to a
true‑depth ruler to improve the visualization of the indication geo‑
metric position in the S‑scan.


Calibration Procedures and Parameters
All calibration procedures are guided by a step-by-step menu using
Software Options
Next and Back navigation. You have now access to optional software features, which can be
ordered through the Olympus NDT customer service.
These options are:
• Multiple-group configuration (requires version 1.4)
• TOFD inspection for modules equipped with the separate conven‑
tional ultrasound channel

TOFD Configuration
Time-of-Flight Diffraction (TOFD) Testing
TOFD is a technique that uses two probes in pitch-and-catch
mode. TOFD detects and records signals diffracted from defect
tips for both detection and sizing. The TOFD data is displayed in a
grayscale B-scan. TOFD offers wide coverage and amplitude-inde‑
pendent sizing compliant with ASME‑2235 code.
• One-line scan for full-volume inspection
• Setup independent of weld configuration
• Very sensitive to all kinds of defects and insensitive to defect ori‑
entation
Example of sensitivity calibration

More calibration parameters:


• Calibration for wedge delay on radius, depth, or thickness
• Calibration for sound velocity on radius, depth, or thickness
• Calibration for sensitivity on radius or depth

TOFD data display

TOFD Option
• A B-scan encoded data imaging and storage
• Adjustable for brightness and contrast grayscale color palette
• 100 MHz A‑scan digitizing
• TOFD calibration wizard online and offline
• Hyperbolic cursor and reading for TOFD sizing
• Lateral wave resynchronization


Multiple-Group Configuration Option Multiple-Group Configuration Examples
It is now possible to manage more than one probe with two differ‑ Use one single phased array probe of 64 or more
ent configurations: different skews, different scanning types, differ‑ elements and create two different groups:
ent inspection areas, and other parameters.
Display Menu
The selection of view configurations has been decreased to keep
the preferred and most useful ones and to add some configurations
to display multiple groups.
■ Linear scan at 45º to cover the upper part
View configuration Number of groups using skips on the bottom surface

A-scan up to eight ■ Linear scan at 60º to cover the lower part

B-scan one
C-scan one
S-scan up to three
A-scan and B-scan one Use one single phased array probe of 64 or
A-scan, B-scan, and C-scan one 128 elements and create two different groups:
A-scan, B-scan, and S-scan one
A-scan, and one or two C-scans up to three
A-scan, S-scan, and possible C-scan up to three
You can now display both amplitude and thickness C‑scan views
simultaneously.

■ Linear scan at 0º at low gain


■ Linear scan at 0º at higher gain

Use one 64- or 128-element phased array probe and


create three different groups:

■ Linear scan at 45º to cover the upper part


using skips on the bottom surface
■ Linear scan at 60º to cover the lower part
Views for three inspection groups ■ Sectorial scan from 35º to 70º to increase
probability of detection

Use two 16- or 64-element phased array probes and


create two different groups:

■ Sectorial scan from 35º to 70º for inspection


from left side of the part using skips on the
bottom surface
■ Sectorial scan from 35º to 70º for inspection
from right side of the part using skips on the
bottom surface

Six A‑scan views for six inspection groups


Related Software Olympus NDT
Some software packages are available to extend the functions of
the OmniScan. Training Academy
Olympus NDT has organized a Training Academy with selected
NDT Remote Control Library training companies to offer a wide variety of courses in phased
• Remote control of a number of commands. array, application techniques and related technologies. The partners
NDT Data Access Library in the Olympus NDT Training Academy are:
• Read data files generated by the OmniScan. Lavender International (UK)
TomoVIEWER

Tel.: 44 1226 765769
TomoVIEWER is Olympus NDT free software for phased array and
ultrasonic data viewing. This software gives you the capability to
Davis NDE (USA)
load data files generated by TomoView™ or OmniScan® PA and UT Tel.: 1 (205) 733-0404
software.
Eclipse Scientific Products (Canada)
PC-Based Analysis Software: TomoView

Tel.: 1 (519) 886-6717


R/D Tech® TomoView™ PC-based software offers:
Test NDT (USA)
Tel.: 1 (714) 255-1500
Vinçotte Academy (Belgium)
Tel.: 32 (0)2 674 58 57
DGZfP (Germany)
Tel.: 49 (030) 67807-0

OmniScan data can easily be imported


in TomoView.

• Offline analysis of A, B, C, D, and sectorial scans (S-scan)


• Measurement utilities, zooming, and customizable color palette
• Compatible with advanced focal law calculator
• Complete support of all skews and offsets to have the real position
of defects
• Predefined layouts built for all OmniScan PA configurations
• Analysis improvements using the data cursor
Note that you need version 2.6 of TomoView software to support
data files generated by the multiple-group configuration.

A support and discussion forum has been set up at www.olympusNDT.com/pa-forum/


This forum aims at providing the UT practitioners with a comprehensive source of
information pertaining to ultrasound phased array.
It also presents the latest information on OmniScan software.

Olympus ND
505, boul. du Parc-Technologique
Québec (Québec) G1P 4S9
Canada
OmniScan_SW1.4_EN_0604 • Printed in Canada • Copyright © 2005–2006 by Olympus NDT. All Rights Reserved.
All specifications are subject to change without notice.
Olympus and the Olympus logo are registered trademarks of Olympus Corporation. rdtech@olympusndt.com
R/D Tech, the R/D Tech logo, OmniScan, and the OmniScan logo are registered trademarks, and “Innovation in NDT”, TomoView, and TomoVIEWER
are trademarks of Olympus NDT Corporation in Canada, the United States, and/or other countries. www.olympusNDT.com
Other company or product names mentioned in this document may be trademarks or registered trademarks of their respective owners.