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A Novel Two-Dimensional Changeover GaN MMIC Switch

for Electrically Selectable SPDT Multifunctional Device


Hiroshi Mizutani, Ryo Ishikawa*, and Kazuhiko Honjo*

Salesian Polytechnic, Tokyo, JAPAN, mizutani@salesio-sp.ac.jp


* The University of Electro-Communications, Tokyo, JAPAN

Abstract — This paper presents a novel electrically selectable switch/diplexer/duplexer functions,


frequency/amplitude two-dimensional change-over gallium must be quite useful for achieving joint operation FDD
nitride (GaN) monolithic microwave integrated circuit with TDD. To realize these SPDT multifunctional devices,
(MMIC) switch. A frequency/amplitude two-dimensional
changeover switch is an essential function block for two-dimensional switch function block having change-
electrically selectable single-pole-double-throw (SPDT) over capability between the conventional amplitude
multifunctional devices in reconfigurable radio frequency switching and the frequency pass-band switching is
(RF) front-end, which can change its function to SPDT switch, eagerly desired.
diplexer, duplexer, and so on. The demonstrated two-stage
GaN MMIC indicates two-dimensional switching
characteristics not only of changing the amplitude for
ON/OFF states as the conventional switch but also of 2-D switch 2-D switch
switching two frequency pass-bands between around 8-GHz function function
and around 26-GHz. The insertion losses of lower than 1.6 dB block block
and the isolations with higher than 13.3 dB are obtained for
both pass-bands. The presented two-dimensional changeover Fig. 1. Schematic of SPDT multifunctional device using
switch function block promises to realize electrically two-dimensional changeover switch function block
selectable SPDT multifunctional devices for reconfigurable
broadband RF front-end with low costs. For 5G reconfigurable RF front-end application, since
Index Terms — switch, band-pass-filter, GaN, FET, FETs, as the active devices, must have high power
MMIC, reconfigurable. handling capability of more than several watts, GaN is the
most suitable material for the active device.
In this paper, a novel frequency/amplitude two-
I. INTRODUCTION
dimensional change-over GaN MMIC switch will be
In the 5th generation (5G) of the high-speed wireless proposed and demonstrated for electrically selectable
communications era, frequency sources for the Internet of SPDT multifunctional device.
Things (IoT) tend to run short. Since a lot of sensors and
wireless IoT terminals connect simultaneously to the
II. EXPERIMENTAL
clouds via wireless communications, a wider bandwidth is
essential for realizing tremendous data traffic from IoT
A. Circuit Configuration
terminals to the clouds [1].
To overcome above issues, the improvement of In our previous studies, it has been found that active
bandwidths for radio communications is essential from composite right-/left-handed transmission line (CRLH-TL)
Shannon’s theorem [2]. Carrier Aggregation (CA) is one incorporating field-effect transistors (FETs) have great
of the most efficient technologies to improve the potential to change the operating frequency band
bandwidths for high-speed radio communications by dramatically [4]-[6]. Especially, by exchanging a series
operating multiple existing frequency bands concurrently capacitor in the unit circuit of CRLH-TL to a gate-
[2]. Joint operation of frequency division duplex (FDD) isolating FET, the active CRLH unit circuit indicates
with time division duplex (TDD) can increase further switchable characteristics between a high-pass filter (HPF)
communications data rate for CA [3]. and a low-pass filter (LPF) [5][6]. They were introduced
Generally, FDD CA needs diplexer for combining as an RF switch with low insertion losses in the pass-band
various frequency signals or duplexer for using a single of the LPF and with high isolation in the stopband of the
antenna to both TX/RX signals. On the other hand, SPDT HPF. In this case, the 0th order shunt resonant frequency of
switch for TX/RX is an essential device for TDD CA. CRLH unit circuit is unchanged, because the substrate
SPDT multifunction devices shown in Fig.1, which can be thickness and the depth and diameter of the via-holes are

978-1-5090-6069-6/17/$31.00 ©2017 IEEE


fixed by its fabricated structure. In other words, the shunt capacitor for the pinched-off state and with a resistor for
capacitance and shunt inductance are constant. Thus, the the open-channel state.
resonant frequency doesn’t change. If discrete frequency
bands such as low-band and high-band need to be switched,
the range of resonant frequency change must be magnified.
It can be achieved by adding FETs to the shunt circuits
which makes a change of the 0th order shunt resonance
frequency.
Fig.2 shows the generalized circuit diagram of the
proposed frequency/amplitude two-dimensional change- Fig. 3. Simplified gate-isolated FET model
over switch. This circuit has a periodic structure. The unit If all FETs in Fig.2 are in the pinched-off state (State1
cell incorporates FET in the shunt circuit of CRLH-TL, is symbolized by ONHI), then all FETs are exchanged with
which consist of two series gate-isolated FETs and two capacitors. In such a case, the equivalent circuit of two-
inductors with a shunt gate-isolated FET and a shunt dimensional changeover switch for state1 (ONHI) can be
inductor connected in the middle of two series inductors. expressed as the same circuit of the CRLH-TL shown in
The unit cell is indicated by dashed lines in Fig.2. Fig.4. Both series and shunt LC resonant frequencies of
the CRLH-TL are the coincidence to each end frequencies
of the electromagnetic band gap (EBG) region [7].
Ce Le

Ch Lh

Fig. 4. Equivalent circuit of two-dimensional changeover


Fig. 2. Generalized frequency/amplitude two-dimensional switch for state1 (ONHI)
changeover switch circuit diagram

B. Gate Bias States


Rh
Table I shows the summary of gate bias states for Vg1
and Vg2. Vg1 and Vg2 stand for the gate bias voltages for
series FETs and shunt FETs, respectively. As shown in
Table I, there are four bias states with the combination of Fig. 5. Equivalent circuit of two-dimensional changeover
switch for state2 (ONLO)
Vg1 and Vg2.
TABLE I Re
SUMMARY OF GATE BIAS STATES
Gate Series FET Shunt FET
Bias State Symbol Gate Bias Voltage Gate Bias Voltage
Vg1 Vg2
State1 ONHI Low Low
State2 ONLO Low High
State3 OFF1 High Low
Fig. 6. Equivalent circuit of two-dimensional changeover
State4 OFF2 High High
switch for state3 (OFF1)

C. Circuit Theory
Fig.3 shows the simplified gate-isolated FET model.
Since the gate bias circuit must be set to have the high
impedance in order to suppress RF gate leak power, the
gate-isolated FET can be considered a two-terminal device
for higher frequencies such as microwave and millimeter- Fig. 7. Equivalent circuit of two-dimensional changeover
wave. In this model, a FET can be exchanged with a switch for state4 (OFF2)
Generally, for a frequency lower than the EBG region, a 1 for the pinched-off state.
Z e ,h
left-handed Bandpass filter (BPF) will be obtained. For a jZC e,h
frequency higher than the EBG region, right-handed BPF The calculated S21 curves based on the abovementioned
will be observed. State1 provides on-state characteristics. equivalent circuit models are shown in Fig.8.
If the bias voltages change from low to high, LC
resonances will disappear, because the equivalent element D. MMIC Design and Fabrication
of two-terminal FET model shown in Fig.3 changes from a Since this study was for feasibility check of two-
capacitor to a resistor. Fig.5 is the disappearance case of dimensional switch function block having change-over
the shunt resonance, which is shown as state2 (ONLO). capability between the conventional amplitude switching
State2 also indicates on-state characteristics. State3 (OFF1), and the frequency pass-band switching, the design targets
in which no series resonance occurs, is shown in Fig.6. It were insertion losses of about 1.5 dB with isolations of
indicates off-state characteristics, like the lossy BPF. about 15 dB, for both low-band such as 8 GHz and high-
Further, there is no resonance in state4 (OFF2), which is band such as 26 GHz.
shown in Fig.7. It also presents off-state characteristics, Fig.9 shows the schematic diagram of the demonstrated
because the equivalent circuit is the same as a lossy two-stage frequency/amplitude two-dimensional change-
transformer. over single-pole single-throw (SPST) switch circuit. This
The transmission characteristics S21 of the demonstrated circuit is constructed by two unit circuits.
two-stage two-dimensional changeover switch circuit can The proposed two-dimensional SPST GaN MMIC
be calculated using the following equations: switch has been successfully developed by using of WIN
Z0 semiconductor foundry process PP25-00 for 0.25 Pm GaN
S 21 high electron mobility transistor (HEMT). The model

FA FC Z io2  Z 02  2 FA FC Z 0 Z io  FB FC  FA2 Z io  Z 0  FA FB
parameters of the gate-isolated GaN FET for series
Ze L § ZL Z · configuration have been extracted in advance and
FA  e 1 j ¨¨ e  e ¸¸,
2Z h Lh © Z h 2ZLh ¹ subsequently used for circuit design of the two-stage two-
dimensional change-over switch.
Z 2 L2e Z e2 Z e Le § ZZ L ZL2 Z2 ·
FB     Z e  j¨¨ e e  e  2ZLe  e ¸¸,
Zh 4Z h Lh © Zh Lh 4ZLh ¹

1 1 Ze
FC j , Z io .
Zh ZLh 2

Fig. 9. Schematic diagram of demonstrated two-stage


two-dimensional changeover SPST switch circuit

Fig. 8. Calculated frequency response of S21 for all states

The impedances for the series FET, Ze, and shunt FET, Zh,
change with respect to the gate bias voltages between the
pinched-off state and the open-channel state. Hence, the
Fig. 10. Microphotograph of developed GaN MMIC switch
FET impedance can be expressed as follows:

Z e,h Re,h for the open-channel state, The microphotograph of the demonstrated GaN MMIC
switch is shown in Fig.10. The chip size was 1.3 mm ×
1.75 mm. The gate widths of series FETs and shunt FETs using of optimized FET with lower on-resistance and
were 125×6 Pm and 50×2 Pm, respectively. And the line lower off-capacitance.
widths, diameter, line spacing and turn number of the
shunt inductors were 11 Pm, 100 Pm, 5 Pm and 3 turns, III. CONCLUSION
respectively.
A novel frequency/amplitude two-dimensional change-
E. Measurement over switch circuit was presented. A two-stage GaN
Fig.11 shows the measured S21 frequency response of MMIC switch was successfully demonstrated by using of
the demonstrated two-dimensional change-over SPST GaN foundry process, which indicated 8-GHz/26-GHz
MMIC switch for all states. In this case, the low voltages band-switchable characteristics with on-state insertion loss
were set at -8 V. The high voltages were 0 V. of lower than 1.6 dB. For each frequency band, isolation
For state1 (ONHI), the on-state S21 of lower than 1.6 dB of greater than 13.3 dB was obtained. The band-switching
was measured for the frequency band between 25.1 GHz operation can be controlled by changing the bias of shunt
and 27.5 GHz. Insertion losses of lower than 1.2 dB were FETs. The demonstrated two-dimensional change-over
obtained between 7.1 GHz and 9.9 GHz for state2 (ONLO). GaN MMIC switch successfully showed either the
At 8.5 GHz, insertion loss of ONHI increased by 4.2 dB conventional amplitude switching characteristics or band-
than one of ONLO. At 26.6 GHz, insertion loss of ONLO switchable characteristics. The proposed two-dimensional
increased by 0.9 dB than one of ONHI. Thus, 8-GHz/26- change-over GaN MMIC switch function blocks will
GHz two frequency-bands change-over characteristics promise to realize electrically selectable SPDT
were successfully demonstrated. For the off-state, isolation multifunctional devices for 5G reconfigurable RF front-
characteristics of higher than 14.1 dB were obtained below end with low costs.
9.9 GHz for state3 (OFF1). Isolation of higher than 13.3
dB was observed for state4 (OFF2) below 27.5 GHz. ACKNOWLEDGMENT
This work was supported by JSPS KAKENHI Grant
Number 17K06407.

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For diplexer and duplexer, higher isolation with low
insertion loss is needed. Multiple cells would provide
higher isolation with relatively lower insertion loss by

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