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Master Class in 2D Radiography & 3D X-ray Computed Tomography

for Aerospace Applications


12 November 2013, 9am to 5pm

About the course


X-ray radiography is a well-established inspection tool in the Aerospace industry, generally for applications such as
detecting cracks, corrosion, structural deformation, and so on. This technology, in recent years, has become much more
powerful and efficient with the widespread application of digital imaging detectors. The first section of this course will
highlight these advancements and their new applications in aerospace industry.
X-ray computed tomography is a non-destructive inspection technology which can provide information of the 3D internal
features of an object which is generally not available with any other means. While micro-CT has already seen wide
applications in aerospace for detecting defects in the micro- even nano- level, high-energy CT, portable CT are now also
available to address the inspection requirements for large parts of aircraft. The second section of this course will
introduce the theory of X-ray CT, its main advancement in recent years and their applications in aerospace.

Section 1 X-ray Radiography


 General principles of radiography
 Digital radiography
 Dual energy technique
 X-ray modelling and POD
 Advanced Image processing
 Case studies in aerospace applications

Section 2 X-ray Computed Tomography


 Theory of Computed Tomography
 Nano computed tomography
 Volume data evaluation (Discussion of artefacts, feature extraction, image processing),
 Special CT methods (helical, dual energy, tomosynthesis, mobile), some application examples
 CT-based dimensional measurements
 Case studies in Aerospace applications
 Future trends in computed tomography and applications

The course is aimed at engineers, scientists and industrial managers working in applications that demand high-resolution
and high-quality inspection of internal features and defects.

Fees & Registration


The Master Class Course fee is S$1000 per participant. Course material will be provided. Subsidies are available to
qualifying applicants through the Singapore Workforce Development Agency and other sources. Please contact the
Symposium Secretariat for more details.

Lunch and refreshments will be provided.

To attend, please register here.


Course Presenter
Prof Randolf Hanke
Prof Randolf Hanke concurrently holds a Professorial Chair at the University of Würzburg in X-ray Microscopy and is
Deputy Director of the Fraunhofer Institute for Integrated Circuits. He studied Physics at the University Erlangen and
received his diploma in 1988 in the field of Applied Physics and his doctor’s degree in 1996 with an external thesis at the
University Erlangen. In 1989, he started as a Scientist at the Fraunhofer-Institute for Integrated Circuits IIS in Erlangen. In
1991, he became a group leader of the new established group Industrial Radioscopic Image Processing. In 1993, he
became an Assistant Head of department and was jointly responsible for the R&D activities of the department Electronic
Systems. In 1997, he was assumed his position as Managing Director of the new-founded Department for X-ray
Technology. In 2001, he was awarded with the Joseph-von-Fraunhofer-Award for his contributions to the “Automation of
Radioscopic Inspection of Lightweight materials”. Prof Hanke is a member of the Deutschen Gesellschaft für
Zerstörungsfreie Prüfung (DGZFP) and actively committed to different workshops, scientific committees and
commissions. In 2002, he got a university teaching position at the Chair for Materials for Electronics at the University
Erlangen. In 2008, Prof Hanke was the first candidate, who was awarded with the new established Max-Grundig-
Memorial-Award in the field of Research of new Materials and Processes.