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Potential Failure Modes and

Effects Analysis
(Information Sheet)

PFMEA Number:

Process Name:

Process Responsibility:

Prepared By:

Affected Product(s):

PFMEA Key Date:

PFMEA Origination Date:

PFMEA Revision Date:

Core Team Members:


Potential Failure S Potential O Current D R Responsible S O D R
Process Potential Failure Recommend Taken
Modes (process E Causes of C Process E P Person & E C E P
Function (Step) Effects (KPOVs) N Actions Actions
defects) V Failure (KPIVs) C Controls T Target Date V C T N

Part Failure during No Control after Transfer to


8 Assembly & Aging 4 circuit despatch 10 320 Design Philips

Input Wire Dry Visual Inspection Six Sigma


Project to be
register for
#VA
Solder Defects
2 8 3 9 216 LUE
Suneel Singh- !
Closer March
End
Elacap Dry Touch and Visual
8 3 Inspection 8 192

Input Wire Long Visual Inspection


Lead Shorting

1 Packing
person will
check for I/P
Long lead. Sudha /
8 4 5 160 2. Dixon will Pramod - 15
explore to have Feb
less strip length
at PCB side of
1 Lamp Dead Loss of Product Input wire

Track Broken ATE & Visual


8 2 Inspection 5 80

SMD Missing Non Visual Inspection


8 ATE 2 4 64

Wire Wrong Visual Inspection


8 Mounting 1 7 56

Component Missing Visual Inspection


8 Non ATE 3 2 48

DT Defective
8

Loose Wrapping
8
Potential Failure S Potential O Current D R Responsible S O D R
Process Potential Failure Recommend Taken
Modes (process E Causes of C Process E P Person & E C E P
Function (Step) Effects (KPOVs) N Actions Actions
defects) V Failure (KPIVs) C Controls T Target Date V C T N

Solder Short ATE & Visual


8 1 Inspection 2 16

#VA
3 Flickering LUE
!
#VA
4 High Input Power LUE
!
#VA
Not Glowing on Min.
5 LUE
Voltage
!
#VA
Lamp Abnormal
6 LUE
Behave
!
Reverse of Polarity ATE inspection
component

Loss of Resource &


Circuit Assembly
1 Low Lumens Material, may be 6 1 1 6
with DT scrap

#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
Potential Failure S Potential O Current D R Responsible S O D R
Process Potential Failure Recommend Taken
Modes (process E Causes of C Process E P Person & E C E P
Function (Step) Effects (KPOVs) N Actions Actions
defects) V Failure (KPIVs) C Controls T Target Date V C T N

#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
Potential Failure S Potential O Current D R Responsible S O D R
Process Potential Failure Recommend Taken
Modes (process E Causes of C Process E P Person & E C E P
Function (Step) Effects (KPOVs) N Actions Actions
defects) V Failure (KPIVs) C Controls T Target Date V C T N

#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
Potential Failure S Potential O Current D R Responsible S O D R
Process Potential Failure Recommend Taken
Modes (process E Causes of C Process E P Person & E C E P
Function (Step) Effects (KPOVs) N Actions Actions
defects) V Failure (KPIVs) C Controls T Target Date V C T N

#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
Potential Failure S Potential O Current D R Responsible S O D R
Process Potential Failure Recommend Taken
Modes (process E Causes of C Process E P Person & E C E P
Function (Step) Effects (KPOVs) N Actions Actions
defects) V Failure (KPIVs) C Controls T Target Date V C T N

#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
Potential Failure S Potential O Current D R Responsible S O D R
Process Potential Failure Recommend Taken
Modes (process E Causes of C Process E P Person & E C E P
Function (Step) Effects (KPOVs) N Actions Actions
defects) V Failure (KPIVs) C Controls T Target Date V C T N

#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
Potential Failure S Potential O Current D R Responsible S O D R
Process Potential Failure Recommend Taken
Modes (process E Causes of C Process E P Person & E C E P
Function (Step) Effects (KPOVs) N Actions Actions
defects) V Failure (KPIVs) C Controls T Target Date V C T N

#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
#VA
#RE
LUE
F!
!
Severity of Effect
Extreme

May endanger machine or operator. Hazardous without warning

May endanger machine or operator. Hazardous with warning

Major disruption to production line. Loss of primary function, 100% scrap. Possible jig lock and
High

Major loss of Takt Time


Reduced primary function performance. Product requires repair or Major Variance.
Noticeable loss of Takt Time
Medium disruption of production. Possible scrap. Noticeable loss of takt time.
Moderate

Loss of secondary function performance. Requires repair or Minor Variance


Minor disruption to production. Product must be repaired.
Reduced secondary function performance.
Minor defect, product repaired or "Use-As-Is" disposition.
Fit & Finish item. Minor defect, may be reprocessed on-line.
Low

Minor Nonconformance, may be reprocessed on-line.


None

No effect
Rating
warning 10

warning 9
Possible jig lock and
8
Major Variance.
7
of takt time.
Variance 6
ed.
5
sition. 4
on-line. 3
ine. 2

1
Failure
Very High
Likelihood of Occurrence Rate
1 in 2
Failure is almost
inevitable 1 in 3
1 in 8
High

Process is not in statistical


Similar processes have experienced
control. 1 in 20
problems.
1 in 80
Moderate

Process is in statistical control but with isolated


Previous processes have experienced
failures. 1 in 400
failures or out-of-control
occasional
conditions. 1 in 2000
Process is in statistical 1 in 15k
control.
Low

Process is in statistical control. Only 1 in 150k


failures associated with almost identical
isolated
processes.
Remote

Failure is unlikely. No known failures 1 in 1.5M


with almost identical
associated
processes.
Failure Capability
Rate (Cpk) Rating
1 in 2 < .33 10
1 in 3 > .33 9
1 in 8 > .51 8
1 in 20 > .67 7
1 in 80 > .83 6
1 in 400 > 1.00 5
1 in 2000 > 1.17 4
1 in 15k > 1.33 3

1 in 150k > 1.50 2

1 in 1.5M > 1.67 1


Very Low Likelihood that control will detect failure Rating

No known control(s) available to detect failure 10


mode.

9
Low

Controls have a remote chance of detecting the


failure. 8
7
Moderate

Controls may detect the existence of a 6


failure
5
Controls have a good chance of detecting the 4
High

existence
of a failure
3
Very High

The process automatically detects 2


failure.
Controls will almost certainly detect the
existence of 1
a failure.
Rating