MIL-STD-414

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11 blvs7

~M ORfkMOO$-10

MILITARY SAMbLING

STANDARD TABLES

PROCEDURES AND

FOR INSPECTION

BY VARIABLES

FOR PERCENT DEFECTIVE

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mL-sTD-414 11 JEW 1957

OFFICS

OF TEE

~ANT Wuhlngkm

SECRETARY $5, D. c.

OF DE~

Supply and Logi.ti.. Sarnpflng Varl.bl..
MIL-STD-414

11 JUIU lb7 for fa.p. ctlo. by

Procedures and Table. for Pe=cent Ddectlva

1. Thi. .tandard h.. ~en approved and i. mandatory for . . . by the Departm. q ffectivm 11 June 1957. the M. force, ccordance 2. h q Diwl. im k.. d-.ifp.t.d Air For.. , r.. p.ti..ly, .tandard.

by the De Pru’ne.t of Defense rAto of the Army, the Navy. and

rnth e.tabli.bed proc.dur., the Sfandardi.. ticm Bureau of Ordnance. -d tha Chemical -Carp. . . Amp N.v-Air For.. custodian. .1 thi. correction.. sddltlenn, or deletion. .hould be atior. Divi. iom, Of fic. of the As. imta.t Sec... and Logistic.), Wa.hin@an Z5. D. C.

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qddr . . ..d to the Stanbrdi.
aary of Def.a.e (Su@y

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Recommended

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UJlvl-hn-ls

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Esu
INTRODUCTION SECTION A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . GENERAL “ii 1

D&9tiRIPT30N

OF tibfPL3t4G

PL.#JS

. . . . .

Table,: Table Table Table

A-1 A-2 A-3

U3LConveraion Table . . . . Sample Size Code tiNers . . . Char.cteri*tie Curve. Operating Plmm of S.ctiOa# B, C, and D San@. Sise tie Letters B

. . . . . . . . . . . . . . . . . . . . . . 10. Sampfiq (Graphfor
though Q) . .

:

5

SECTION

B J

VAR3ABIL1TY UN3U40WK-STANDARD DEV~TION METHOD SINGLE SPECIFICATION LIMIT . . . . . . . . . . . . . . 35

Par:

Ex8mpl. *: Example Example

B- I B-2

Example of Cdcafattoiw:, sPeciflcatiOn fAmil-Form Example of Calculations: Sp*cificatiea Ltmit-l%rm

Simgle 1 . . . . . . . . . . . Sin~le 2 . . . . . . . . . . .

37 38 39 40 41

Table.: Treble E.- I Table B-Z

nd Tighteoed M..ter Tabie for Normal q 3nmpecti0n (Form l-Sinnle fAmit) . . . . . Maater Table for Redueed impection (sOrrnl-singl. LiJnii) . . . . . . . . . . . . . . SPECIFICATION UhUT . . . . . . . . . . , .

Part 1s

H

DOUBLE B-3 B-4

Examplea: Example Exarn@e
T, blem:

tiample of Cdcrdatiomm: Double Specifi. c8tioa LAnit-Cke AQL vai.4 far Upper . . . and Lawe r Specification Limit Combined Example of Calculatinna: Double Specification Umit-DIfferem AC3L values for Upper sud fmwer Specification Umitm . . . . Mmmter Table for Normal Impecti.n (Double Limit
siIl#le LiInif)

43 44

Table I ... Table

B- 3

qnd Tightened
and f%rm 2-

. . . . . . . . . . . .. . . . . .

. . .

45 46 47

B-4 B-5

I

Table

Mssier Table for R=duced faspectiom . . . (Double LImitmnd Form Z-Single Limit) Table for 3SatimatiaEthe Lot P. rcent De fective . . . . . . . . . . . . . . . . . . . . . . . .

Part

f3J

I
I

EST1MATION OF PROCESS AVZSAGE AND FOR RZDUCEL AND TIGHTENED C3UTEINSPECTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . B-6 B-? L-8 Value. of T for Tigbtenad k#p8!cti011 . . . . . . of Estimated k; P.rcent ~ts Defective far Roduc=d Inspection . . . . . . . . Value. of F for h4asimum Standard Deviafioa.[MBD) . . . . . . . . . . . . . . . . . . .

5?. 54 56 58 59

Table, : Table Table Table

I APP=dk B . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ‘iii

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xlL-mTb414 11 Juts 1097

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coNTmzTa-caitinmd

SECTION Part

C 1

VASliABILfTY

ZINKNOWN-~S LZMIT

METHOD . . . . . . . . . . . . . . . . 61 .

sU40LSSPECZF1CATION

kxmlfb: E8urlph 3hampie Tsblea : Tsbie Tabi*

c-l C-Z

Simsle Eauanph of Ckicniatidm: S~cificatiOa Umit-FOrm i . . . . . . . . . . Exuriplm of Cakuiati0a9: StnSle Specification Limit. Form 2 . . . . . . . . . . Mast-r Tabie for Normal qnd Tightene4 Inspection (Form I_ Siql. Limit) . . . . . . . Msst.r Tabls for Reduced lnapecUorI (FOrml-SiOgl. LImlt) . . . . . . . . . . . . . . SPEC1IVCATION L3M3T . . . . . . , . . . . . . . .

63 64

C-1 c-z

6S 66 b7

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Part

u

DOUBLE C-3 C-4

Exaf+em: Ex.mple Example Table,, Table Table T.ble

Example of Caleulxtioms: Doubl. Sp.eUi catiem LiniIt-Oae AQL value [or Upper and tiwer Spocifieu40m Limit Ckmblaed . , . . Exunple o{ Caiculaiiom: Double Specif{ c-ion Limit-D4ifar8st AQL vahm. for UpPer u8d Lower SPRIcZflcacJon LImitm . . . A.hmI.r Tabl. for fdmnul .md Ti#hte.ed ~P=c~a (-ble Limit 4 Ferm z _ Sias!e Z&nit) . . . . . . . . . . . . . . . . . . . . Maater Tabl@ #or Reduced lmpectiom (Dauble L&nit Fown&Simgle IAnIt) . . . . Ttile for Ectinmiinsthe Lot Percent Dekctive . . . . . . . . . . . . . . . . . . . . . . .

69 70

C-3 C-4 C-5

71 7Z 73

Part Zu

ESTIWTZON OF PROCESS AVIXfAGE AND cRZT3ZRJA PVR REDUCED AND TZOHTSNED INSPECTION . . . . . . . . ., . . . . . . . . . . . . . . . . . . . . c-6 C-7 C-8 Vaium. of T Ior .Tigbtmmd h,pecticm .“. . . . . z-bits Of Eotiated kt S%rcemt . Defective for R.duced Z.cmp.ectioa . , . . . . . Value. of ~ 10, M&um Awe ra~e Rsn#e(w) . . . . . . . . . . . . . . . . . . . . . 80 B2 84 85

Table.: Table Table Tablo

.,.
APWIUUB SEC7WN D C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . WWN . . . . . . . . . . . . . . . .

VARZASZL3TY

P8rt 1

SZNOZ.E SPSCW1GATZON3A3AZT D-l

ST

Exmpleo : Exumple

&urnpZm D-3. Ttbim., Tabic Tmbb

ZZxampta of Caieubtlms: Siasis *c4fkati0n Z.imit-rofm 1 Si+e Example of c+IeuidzioM: Smcification ZAtaia_FOsm Z

. . . . . . . . . . . . . . . . . . . .

89 90 ,9I 9s

D-l D-Z

d Ti#btened Msst*r Table fof Normal Zzmpoeuom {Form 1-Sk+ Umlc) . . . . . . titer Table [or Reducmd tJ1.p~=tiO_ (FOrml-Slr@*LimitJ . . . .. . . . . . . . . . .

1! ~.——

.. . . . .,.— ....=_ “-

comzNls-cOfmffwd

P*T5 u DOUBLE 5PECfF1CAT10N LlhffT . . . . . . . . . . . . . 95

3hampfe*:

3kAmpfe Exunple

D-3 D-4

Esampk af Cdctdationw Double SpecUication L6mit-Oa* AOL vahm UpPar and fmwer Specification. fAmit Combirmd . . . . . Double +pecUi Emmple of .Calculatioms: c-tion L6mit-D3ffereut AOL value- for Limits . . . . UpVr d kwer Specification Master T*le for Normal and Tightened fn. pectim (Double Limit and Form ZSimgleumlt) . . . . . . . . . . . . . . . . . . . . . Master T&ble for Reduced 3nop.ctiom [Ooubk Limit..d Form Z-Single Limit) . . . . T-ble for Estimating the fat Percentage Defective . . . . . . . . . . . . . . . . . . . . . . . .

97

98

Tables: Table T.bla T.ble P*rt Ul

D-3 D-4 D-5

99 101 103

SST1MATION OF PROCB AVESAG!C AND CSJT&R3A FOR REDUCED AND TIGHTENED INSPECTION . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . D-6 D-7 Value. of T for Tightened frt. pection . . . . . . Limit- of Ectinutod IAX Percent Defective for Reduced hmpecfiom . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

104 106 108 110

Tsble#: Table Table

APP*6

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mlL-8’m-414 llhfislm? INTRODUCTION Thi. Stamdardwa. prepmred to meet q growing IIeeo for tbe U. of standard ptmm for Jampection by vari*ble. in ti~rnmatn procurement, DIIpply and .torage, and maintenance ia.pciion opa ratiozm. Tbe variabf.. sampJ&s in@e quality characteristic which can be rnea.tirmd on q coattnplane .pply to q q xpressed in term. cd percent de fectiue. The tm.. scale, and for which quality i. q theory unclerlying the developrne.t of the wari.bte. .aniplim~ plaua, including the oparatiq charact=rimtic curve.. a.awne. that rnea.urem.mt. of tba quattty char. qcteristic q re independent, identicslfy di.tribufed normal random varisblea.

q u’npliq

I

..mpfing pfmn., warlah!es umpfiag plamm 1. comparium with atfributa. dvanta~e of ummfly remdtin~ & cmmide rsble .avinem in #ample q ihave tbe q for .xmnparabl. a..uruice . . to the correctness. of decision. in judging . .in#le quality characteristic, or for the .arne sample size. greater a.mirance is obtained using variable, plan.. Attribute. sampling pfan. have the advantage of greater simplicity, of being applicable to either .ingle or rnuttiple quality characteristi c., and of requiring no knowledge about the distribution of the contlaueu. rn. a.ur. rmenc. of any d the quality cfur. txeridc..
q rm mot to be um.d It 10 imporfsmt to mot. tfut variable. .amptfmp pha. i.di. crirninat.ly, ,impfy bec.u.e. it i. po..ible to obf.in vaxi.bk. tnea.urarnemt q .smnp,data. fn conmlderq appfieatlon. where the rmrmatity or irtde~nde.ce dvi.ed to cm-..ult hi. technical agency to tion. may be que.ticmcd, the user i. q detci-rh in. the fe.. ibility of appfi calion.

Thi8 Srandard 1. divided into four .ectimm. Section A describe. @n. rat procttlur. a of the .amplimg plan.. Secfic.m. B utd C de.crib. .Pcifi. procedure. pplic ation. of the .arnpIing plan. when w.=iability i. unknovr., In Section B and q of lot .%and. rd d.vi.tion i. used .s lh. fn. i. 10. an q .timat. of the the .stirn.te unknc.w. variability, and in Section C the average rams. of the sunpf. 1* used. Section D desc=ibes the plan. when variability is known. Each of Sectiono B. C, and D i. divided into fbree part.: (l) SAMPJIIW PIUM for the Single S~cifieuiom Limit Ca.e, 111)Sampfimg Plans for th. mubl. Spcific. tion Limit Case, and (3JJ) Procedure. JorEsthnation cd Proce.. Average and q rid Reduced Ja. pection. Criteria fer Tighmned ingle s~cification For tba q cceptability trite rio. i. giv=n im two foran.: Form 1 amd Form Z. limit ca. e, Lhe q ii-ici they q rc idettticti a. to .ainple sise -d Either of the fonnc may be u.ed, q cceptability or rejeetabilify. III deciding whether w u.= Form 1 deci ion for lot q or FQrrn Z, the followin~ poiDt . should be bo=n. in mind. Form I provide. the lot qccept ability cri~. rion without q.titn.tirtg 10I percent defective. The Form 2 101 Theme e#li acceptability criterion require. emtirnates of Jot percent defective. verage. mate. at.o .r. ~quimd for e stiznatbn of tha proea q a q Operating Characteristic Curve. fn Table A-3 how fhe r=latioa.ftip betweem for the quality cbaractari.tic quality and percent of lot. expected to be qcce~able inm~et.d. A. stated, the .e Ope rating Characfe ri ‘tic Cur-. are &sed 011tbe raadanalrom a ciorsnti distribution. ..#urnpiari that meam. mment. q re .ekctedat unpfin~ plan. in SectiW. S, C. ~d D w. m mstcbed The corre spending q closely ., po.. ible ~der q .y.tem Of fixed .unpfe .Ise with re. pcct to their Opcraling Characteristic Cu?wes. O~raUng Chsracteristjc Cum. in T.bf. A-3 h..= been computed for the .mpling p]an. b... d orj th. ..timate of lof .tudard deviation ef unknown ..ri.bility, Thy are eqully .pplie.ble ior .arnpllns plan. and theme bam.d hoed on th. averaga range of the .awIpI. of unfmown variability on known variabUity.
q.

C.rtaim cln..cmri.:ic. concerning the sunpliag phm. in S..tiom. B amd C -d tbosa la S9ction D dwufd b, moud. Pkn. baa.d on fba q mtima& ot umk=09m Wariablllty require fe~r .M@e wit. for cm~ra~e . ..”ranca -baa tb q d. Mate of lcM .taadard tiwl.si~ i. “..d than _bg. ib .~..ae rua~. d ffn .-+ in u.ed: on fhe ottwr tid, plan. Vsbg the .W~.gG r~ge of the #AM@. r.quira VII

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mb61v—414 11 June 19s7 compuuttmm. Plarm umlnn bm=variablltty -qutre con*l&rablT f-r sample tmk far comwrabk amUJrMC* tbaI q ich=r of the plans whw =TIabtuty of k#umII -rkbiUty Is q q rtnsent am. 1s uakam: @we wer, tba roquir=mw.t The user 1s. dvised to co.milt MS tectalcal~uc~ bdom WPIYLW cunptiaj piano U.tng bDOwa w8rIAbuuy. Tath B-8 provids q values of tbe f~ctor F to compute tfia maxfmum standard dewiation hfsD. The hfSD se-s M q ~uide for the magnitude of tht eatirnate of lot standard de-scion when u-in Plazm for tbm double spcff ication limit c--e, deviation of un.bn.arimtdUty. SimifArly based on the q intimate of lot .taa~rd Table C-8 provides vmlue- of the Iactor f to com~te the maximum average range ruige of the MAR. The MAR qor.ew m a g de for tbe magnitude of the average .pecific.tia. limit . . . . . ba.ed . . the q rnple wk. usin# planm for “ke do.bfe t wariddlity. Tba edmate of lot qtmdard ave rage range of the cunple of unbam mpk, U it is Iem thm the hfSD or MAR.re. deviation or q verage range of the q q t=ctively. hslps *O immure. but doe. mot guarmt.e, lot accept. bfllty. ymbols and their definition. q re gimn III tha a-ix to Part JU cd the AU q h Ulumtratim of the com~tiom and proc.durma .~ed IIJ applicable #*ctim. uf Part- I and 11 of tbe spplkable the .unpling plans i. give. i. the qnmplec .ection. The computathmm irwolve simple q rithmetic operation. such am .dditina, qubtractio”. multiplicuion, &d dIvimion of mwnbera, or q most, the taking of q .quare root of q number. The user should become funiliarwith the g.neral propplicable sectioa for detailed iawtructiom cedure. of Sectian A. and refer to she q q pccific procedure.. cornpu. ions. md tables for [he Barnpliag plan.. regarding

q imphr

I
I

~14 11 Jmfe 14s7

1,

SECTION GENERAL Al. SCOPE DESCRIPTION

A PLANS

1’

1’

OF SAMPLING

Thi 8 Sammkrd =stablimhes All Pur +’ mmplnng P anm and procedures for inopec ticm by variable q for use in Government P*.c. reme.t. s.ppfyuad stora~., and rnAJltetts.cc inspection op8rati0rIm. when .ppli cabfe this Standard #hall. be referenced in the specification, contrzct, or in8pcctien in.tructic.r. m, and the provision, set forth herein shall #ovem. Al. ? III*PC ction. lnmpeclion i. tiw pro . . . . xamining. testing. gaging. 0. of measur, ns. q othe rwise comparing the “unit of product” (See Al .4) with the appkabfe requirememla.
Inspection by AI.3 lnspcctiby Variables. variables i. inspection wherein r+ specified quality characte-ri. tic (See AI.5) on a unit of proeuct i. measured on . continuous feet per sec.cale. .u. h q . pound-. iwheo, ond, etc., And q rneamtreme. t is recurd. d.

Tfm se pfwm may be used whether pracuremrml inspection i. per. km’rmd at the plant of q prime coatract?r. wbcontractor or vendor. or q t destination, -S90 may be uaod when AppTOPrU1O in -d q ppfy and storage. and main fanaace fL18pection ofm rattom. A3. CLASSIPTCAITO?f OF DEFECTS

unit of product.

AZ. I Mtthodof Cia8sifring~fect@. Asf8m .ificat, c.n al defect- . . the q rmine ratio. of defect. of the unit of product claasifi. d according to their irnporfaace. A defect 19 q deviation of the unit of product fr-am, requirement. of the specifications; drawiags, Purcha.e da~cripfia”., and aay cbu~c Defects the reto in the contract or order. normally belong to one of fhe fOllO*g classes; however. defects may be plkced k other ciao. cs. AZ. 1.1 Critical Defeeto. A criticaf defect i. .“. that iudeme. t and axmrience indicate coule reeult ;.. hazardou. “or unssfe conditions for individual. u.ing or m.imaining the product; or, formajnr end it.rn9 unit~of or famba. q product, such a. ships, aircraft, d.f. ct that could prevent fmrforrnaaco of their tactic-i fumction. A2. I.2 Major Defects. A major defect i8 a defect. other than critical, thaf coutd result in failure, ormateritlly reduce the usability of the unit of product for its intended fmrpobe.
A2. I.3 Minor Defects. A minor defect is on. that doc n not materially reduce the usability of the unit of product for itm intem&d from qstablislmd Purposa. or i- q deprfurc atandard9 hating .0 signUi CUIt bOa CinI OrI the effective u.e or operation of th@ unit.

1’

A1.4 Unit of Product. The unit of product i. the entity of product in.xcted in order to dew rrnine it; measurable quality charq cteristic. Thim may be a single article, a pair. a qet. q component of an end product, or the end product itself. The unil of product may or may K.t be the sune q s the unit of purchame, supply, production, or thipmer.t. A 1.5 Quality Characteristic. The quality charact. riatic for varxablee in. pecti4n is that characteristic ef i unit of p,oduct that is actually m.a. uzed, to determim conformance with q given requirement.
A1. b Specificaticm Limit.. The q peclflcation Iimtt(e) is the requi rerncnt that q quality characleri. tic .hould meet. Thi* q n q . upper req.~rement may be exprenmd q prc~f ication limit; or 6 lower pacification specification limit, called herein q .in~le limit; or bolh upper and lower .~cifieatiem ~cificmion limit., called herein a double q limit.

I

A3.

PERCENT

DE FECTTVE

co. Tti A’3.1 =.PT89.88. Of NO. CMtfO_ of pro dues 9fnff e$fcnt of nonconformance be expre-scd i. terms of percent &faetive. A3.Z Percent f%.feetiwe. Tbe percent d.fectiv-.~acterimtic of q Ii%.

...

A 1.7 Sampli.~ Plans. A sampling pfan 1. peciiies the rmxnber c.< a PrOCedUr* *h*ch q units of product from q lot which q re to h itmpected, arid th. cril. rion Xor aecepfabil ity of the lot. Sampling pfazm desipated in thi. Standard are qpplicable to the insPcof a tfon of q chgfs quality cbaracteri-fke

lox of prodv;t”i. th~ number of unit. of praduct de fectiwe for that cfuractc ri.tic divided by the tataf number of unitm of product And q man multidimd by on. hundred. Expressed Percen: rkfectiv8 .auatiorx Number of Aefectivea x 100 Numbs r of dtm

1

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Mk+m+la lx Jlfffe 1957

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Ad. ACCEPTABLE A4. 1 Acce@abZc

QUALITT Ouaiil bwl.

LEVEL
q

Tba =a CBOmlnaf xpr*s.e.i in farm. of percaat d8f*c value q tive .Pcif ied for q sbigle quUity characteriatic. Grtain numeried vaftws o; AOL r=~img f ram .04 to 1S.00 parce.nt am qhO-a i. Table A- 1. Whe. . ranof AOL VUWi. .pecified. it dull he treated q s if it wore mfa2i0c equal to the WdUC of AQL for which q and which i~ bcluded plms q re lu-whed within the AOL range. When the •~c~ted AOL i- a particular value other tb& tivme for which oamplhg pfanm q re furniched, the pP2yihg the AOL, which i- to be used in q yovi.ions of this Standard, .Itafl be ., .ho~ m Table A- 1. A4.2 Specifying AOL1 c. Tin particular AOL vafue le be used for q q ingle quality charq ctarimtic of a given product must be qpeePcifi.athm ified. fn the CM. of a double q for limit. q ith. r an AOL value it #PcUied the total percent de fecti.. muaida of bath up~r -d lower specification Umita, o. t-e AOL value. are specified. om. for the upper limit and another for the lower Ifmit. AS. SUBJbflmAL OF PRODUCT

A6.2 Choice of SarnfAim Plain. SunpUaB ~D u!d PIWCEOU-9 a:e pro-dad in d8C tion B if Variddlity 10 uabnown amd the .taadamf de rf.uion mathd is !mwd, h Soc ticm C U variability i wunbaewn a?id the range matbod i c uced. and in Secfioa D if .ariabUity is bnown. Urdesa otkrwi.e q pcffied, un. q -d=rd dewiafim method b-n variabiUty, q unF41rtd plans. and the q ceef=ablfifv crl terbr. d Farm 2 (for the 9ic@e specification iimit case) Aaif be used. A7. SAMPLE
A7. I

SELECTION

Determination of Sample Sise. The .Unpl. .,h, tha mm’lfmr of unttm of prodsamph aIws uct drawn frcan q lot. Retati~ q m Aesimated by cute letters. The 8ampf4 sise cod= Iette r“depcitds on the.inq=ticm le.ve: and the lot q1=4. There q m fiva hothe rwhe q pecffiod Ia-fmctien Ieval IV shali unple .i.e cod. letter applik used. The q cable to the .pcifi.d izi.pectim l.wel arid for lots of given sise .hdl be obtained from Table A-2. NOTICE-5P. c ial Reservaticm for Critical CharackrnB1ic8. Tbe Go.errm’i.nt re. e.vo. tbe rmhl to in smct emryunit mbmkkd hy the ;uppfier fos critieti etir.c uad to reject the remainder of the te!rimko, q defect is fouud. Tbo lot Immedlafelyafter GOvemirnent timo rcr:rvee tht right to qampfe fo~ criticmf d. f.ctc evm ry let aubmittad uppUer arid to reject any I-* if A by tk q sample dr.wm thrn refr~ is fo-d to contain ow or more. criticti da fects. A7.2 Dr.wimB of Samples. A sample 10 om. or mere unit. ol product drawn from . lot. UnItc of ttn munfdo Aa2i be, ,al~ct,d withO* re#ard to t?bdr q.safity.
•f=ctiOale=J~: L U. fU. IV. -d v. ff~e-~

I I

A5. I lat. The tsrrn ,,1ov hall nmmn ,virtcpecti~lot, -’ i.e., a collection of unit. of product from which q sample is dram! ad inopec~td to dete rm”me complhrme with fhe acceptability criterion. A5. 1.1 Formation of Lots. Each la; shall, q s far q mla practicable, con.iwt of unit. cd product of q .ingla type, gssde, ~Ass, size, or cornpo. itkn manufactured under e.. enri.Ily the same conditimit. A5.2 Lot Sise. The lot q im 1. tha number of unit. d product in q lot, and may differ f rem the quantity de.i#r.atmd h fbs comtraet q biprnellt. or order a, q lot for prod”ctlar., or Ether Purpo..,. A6. A6. I LOT ACCEPTABILITY Criferien.
material

br imapc:kta ddf be detennh.d byum of ~ of the .ampling plait. a..oeiaf.d~tb. .pec Tbi. Standard ffied value of the AOL{S). ampliag plaa. baaad ombaowa 4 provide 8 q bvariability. fn the Iatfar can q m provitid, two affa mativo met+, bared on the e qtfmaia of im qfattdard dovi. atioa and the die r on lb am rqe range of the t-fate. These .r. r. f.rred to . . the standard dowiatio. method and tbe rinse method. For tha case of a single cpeeifiea tiatl unlit, lb acc.ptabiu~ criterion Iqiknitid

qbility of a lot of

Acce Sabfiity

The

qcca@-

q for q 8tLmatfmg 22n preeomm Proe.dure awrage @ criteria for ticbtaned and re dweed in. fmcftan bared = th Umpacthn romiito of pmeedinc lots are provided in Part uf of dactiorm B. C. and D.

AS. SPECIAL PVOCEOURE POR APPLICATION .F MIXED VARIABLBSAlTT21BLfTES BA?APLJNG PLANS

8

--

I i
i

q lu

q ttrlbcuaa

prwid=d

for

-Wunpumg

tbOM h ,T=tih A-S
I I

tin Miad w8*bl9Dphmm bon18 ad that az-t W#idk.]

Amptm wwI&mc. oximta Condltlon A. W tbm produ ct cubmittod for iaapctioa IS q mhctod by Ch #Upfli, Z tO meat tfM ,IWXiZ creemlng proee q m Ikatlan ltmit(s) by q q f rmn q Iarae r qus.mtity of product which 1. not being produced wltbln tba ,Pclfication

A lot me of mcdm Ui* q ccef%abi the fouo’wln’ Comtitiem. i. .*tL.fic.&. A. 7bo lot com~i4s cca*bllIty variab14 q q terlm of section B, C. or D.

Ilmlt(al.
CodltiaQ B. warrant tb= mttributem •ara~i4is

Camdltkm

ttn apprsprmta

with crl -

tbt

Other condltiorm adst u, . of a .arlablac*-.

tbe A9.2 Definition.. A9.Z. 1 in.pactlom by Attrlbut8s. fnspectioa ttribute. I* inwpectkoa wbardc. tba unit by q of product is Chsdfied simply m defective or mandcfectiwe with reapact to a given re qtiire.mom 07 s.t of nqutrnmentm.
q lnmP8c A9.Z.Z Mind Variabla q -Attrib* tion. tinnd varimhle q -attributes inmp8ction arnfie by stt ributa q . in ~mgpcction of q q q ddition to inspection by variable. mmlready q unple, before . demad. of q previo.a e ki,on .ao ~o.,*: ca~qsi!iv.o r .*I- c-bili~ ~ q M ctihmtie. ‘. ‘-

qcceptabif ity crita rkm
of bAIL-sTD-!05.

Caa6itLm

B.

The

Ist cmIPU*s
of

+tb

pragrapb

11.1.2

A9.4. 1 U Condition A ia not qatiefied, pro. coed iri accordance with tk q tt tibute q oM’l plirig plan to meet Condition B. A9.4.2 lf Condition B ia not cati;lied, the lot doe # not meet the 8ccepabilicy crlte rian. A9.5 Se=rltY of Iaaopaetion. The proceu f m.pecti.m rel=rred to dures for .everity in ~rarraph A8 are net qppficsbl. for mixed Vaziable..attribum. inm~ction. NOTICEWhen Gouerrmtemt drawin#.. SPedfiCatiOmn, or othc.r data q re u.e4 tar UIY prmme other than In connection wltb a definitely relamd Government procurement opa ratloa. thm Lbit.d States Gow rrunent tbe=aby imzur, no re. pm. ibility or my obligation wbtcoevcr; and the fact that the Co.ernnteztt may have form.latd. f.rnimbed. pplied the qaid Lrswiags, or In uIy way q q wcificationa, or other data (* II@ t. ‘= rm~arded by implication or otherwime q in mY m-e r licerming the tilde r or any otha r pcr*On or corporation, or conveying any u**. rights or p rmis. ion to m-nufbctufe, or qell aay patented invention thu may in mn7 =*T h ra~-td tbreto.

of Samplirtc Plans. The A9.3 Selection miaad *arlable.. att YiS -plmg plan qelected in UCOdUICe with thn stall h fcdlovim~

A9.3.1 Select M q ccorduaca

the vsrlableo #vnpliag plm with Section B, C, O, b.

I I

a

ror spd56d A03. va3u.eI a236q WiIhin mmu r-got — 0.050 0.070 O.lloto 0.165 to to to to 0.049 0.069 0.109 0.164 0.Z19 0.439 0.699 1.09 1.64 2.79 4.39 6.99

Use thh AQl Vazue 0.04 0,O65 0.10 0.15 0.Z5 0.40 0.65 1.0 1.5

0.Z80 to 0.440 to 0.700 Ie 1.10 ).65 2.80 4.40 7,00 11.00 to to to to

m
““”
6610

m
Be&c

1JOIB35DF31

111 to

180

I

181 to 301 to Z.5 501 to 4.0 801 t“ 6.5 1.301 to to 10.9 to 16.4 10.0 3.ZO1 to 15.0 8.001 to

300 500 800 1.300 3.200 8.000 2z,000

Et

DFH_j

C32GIK DFHJL

I

EGIKL FHJLM Gl HJMNO Lhi N

ample .i;e code letter. given in body of Uble q re appli. abze when the indicated inq ptctim levelw are to be “med.

m

4

. - --,-

I

mL-sm-414 11 Smn 1*

TABOpraCinC Clmr.ete.si.tic

A-S
CtMW9.

for

Sun@iD* D

Plan.

of t%cti~m

B, C, 4

I

-.

TABLE CHARACTERISTIC CURVES FOR SAMPLING PLANS BASEO ON STANOARO OEVIATIOM METHOO SAMPLE SIZE COl)E LETTER B I Cures * m?l~s p-i bed ml,. +ti 0“4!..V1.wlty “. “.o.lld* iq.k.llnl ) ii! ;f W 4:

A.3

OPERAllNG

!!

a

I

.——. .—— ——. .— ..

.

TABLE

A.3

oPERAnNo

WARAC7ERISTIC CURVES FOR SAMPLING PUJ49 SASEO ON STANOARO OEVIATION METHOO

.4

-0 so

10

30

40

w

M

‘m

00

w

100

U%RATINO CW#fWTERISTIC ii~

CURVES FOR SAMPUNO PLANS BASEO ON STANOARO OEVIATION METHOO

.

-----

.—. _— _

._

TABLE

h .3

IYERATINO CHARACTERISTIC CURVES FOR SAMPLING PLANS BASEO ON STANDARD 0EVIA710N METMOD SAMFI-E SIZE CODE LETTER E I b, * t9#wq pm, bed m mm,.dti
q *9k“-

..I.W,

m

“.”l*

+.do”t

1

w

bo

‘0

#
10

-0
IQ 30

40

w

w

!m

a

40

loo

M,I., rq!lmo m

Ut Is#.ul

44,1, 1“1, I., -

I“tpn, ”,

t!

7ASU BASEO ON STANOARO OWIATION SWR_E SIZE cow LETTER METHOO

A.3

OPERAnNG CHARAC~RISTIC CURVES FOR SAMPLING PL;NS

[ corm f“ S*,

F :, ,, ,19.1, ,,,d m .,”,. 9A,4 9.#t“b ?wI.bm, “

* “,”(++
,,uk,td )

1

.-

.-

.-

hl-,tWllrdcfhh-lMhh

-rw. -94

nM-#An.u.O..,o . d Iuo9 k , m,t”b.+”,

! OUAU1’V W3Mt?lC0LOTS I 1.,.md 4./.,!1.. 0? )

*

TASU QASED ON STANDAm OEVIATION ME I MOO

A.3

OPETiATING CHARACTERISTIC CURVES FO+7 SAMPLING PIANS wu F I Cenfh.edI , SIZE COW $lTER

TABLE

A .3

OPERATING CHARAC7ER15TfCCU17VESFOR SAMPLING PLANS 8ASEC ON STfi?!DLRD DEVIIITION METHOD ii SiMFLE G I C.*.B IV ..v96, p!ru b.n.d w <a’. ..IM •.~ l..W1.bflllr w. “...lld+ ~.i..l.nl ) S1ZE COOE LETTER :~ *

loo

Ri

10

0

_—

-.

TMLE 8ASE0 ON STANOARO OWIATION METMOD

A. ;

OPERATING CHARACTERISTIC CURVES FOR SAMPUNQ PL+W SAMFLE SIZE CODE LETTER G ( Con!lnwd)

Ii

x

w

OUUllY Or SWMlllfO 10U %.k.+.bl.

( h pod

tihdb, I B-m, 1“910 -d 1. hv., m”,

I

l___

*

----TABLE A-3

WERATINQ CHARACTERISTIC CURVES FOR SAMPLING PLANS BASED ON STANDARD OEVIATION METHOO SAMFtE H I tiwl & ,@h, ,h., b.sd m ,,”,, 44 W4 know,“i,blll!, “, . ,,,,d,+ wI.,IA ) SIZE CODE LETTER

.

TABLE

A.3

OPERATI NO CHARACTERISTIC CURVES FOR SAMPLIN6 PLANS BASEO ON STANDARD OWIATION METHOO

TASLE CURVES FOR SAMF1.lNO PLANS SASEO ON STANDARD DEVIATIDN METHOD SAMP.-E S1ZE CODE LETTER I I hi la st+q tlmt k.d m rm~. AA -t h.wI*WI, u. .m..lhlb H.1..lrd )

A.3

OPERAllNO CIWACTERISTIC

-a

.

m e

.,

TABLE ON STANOARD OEVIATION METHOD

A -3

OPERATINO CHARACTERISTIC CURVES FOR SAMPLIN13PLANS BASED SAMPLE SIZE COOE LETTEfi I ( Contllwl )

?s

TAME y

A-3

OPERATINO CNAIIACTERISTICCURVES FOR SAMPUNO PLANS BASED ON STANOARO OEVIATII?N METMOD E!j SAMW J SIZE COOE LETTER ?& * O..* k-l .“lMI, “, “Al+ b+’.w I

f Cnns for ‘u#l., ph. h,,d m m,,
qw

.- .——

I

TASK CHARACTERISTIC CURVES FOR SAMPLINIJ PL~NS SAMRE J lb.., k M@”, ,1.., b.).t Is.,. AM##Lu.n,O-l.bill* Um “,-II* Iqwdmf ) (Conm.td) SIZE CODE LETTER 8ASErI ON STANDARD DEVIATION METNOD

A .,3

O~RATINO

I

I

I

.,,.
2

TABLE y 3 Sf+@LE K { C-w, * ,1.@q ,1,., b,,d m ,..,; 4.* “a h.W,bdll, w, ,,,,”1;4$ qulw.1”1 j SIZE CODE LETTER

A. 3

OPERhTINQ CHARACTERISTICCURVES FOR SAMPLING PLANS BASEO ON STANOARD OEVIATION METHOD

g“ !! +

!3

.,

TABLE

h .3

OPERATINO CMbRACTERISTICCURVES FOR SAMPLING PLANS BASED 0:1 STANDARD DEVIATION METHOO SAMFLE SIZE COOE LETTER K ( Cennn.t~) { -t b *I p-t h-i m lul\s “4 i.ul.w~ .9

q ***W+ +!”.1-1 I

ht.,

~,,

m-

“ bm+tl.

dmltt,1“,!, 1- -d

,“,,o,wz

TA9LE =!5 CHARACTERISTIC CURVES F(XI SAMPUNG PLANS BASED ON STANDARO DEVIATION METHOO :x SAMFtE S1ZE CODE LETTER L t *8 fWt }1b-d m m,, dn4 -8 invul,blhtj w, cud!+ WIV,lon!I

A-3

c@ERAnNo

1

f

o

TASLE CMbRACTERNWICCURVES FOR SAMPLING PLANS BASED ON STANDAR5 DEVIATION METHOD SAMFtE SIZE COOE LETTER L t Con!h..d )

A.3

cmmo

TABLE :!E ~f gln

A -3

OIWMTINO ChARACTERISTIC CUfWES FOR SAMPLING PLANS BASED ON ST.ANOAROOEVIATION METHOD SAMPLE SIZE CO@E LE TTEII !4” ,: ,,nwdl,ll, ,,u(v,M } I h,,, 1“ ,,q,!h, ,hns b,,,d m ,,.9, ,A,b
,,* hnwm vwl,blhl,w,

~y Cm$ a

Tli+n*d -W!* 9! 91UW * -

*

mmaItofbl,npwl,* $.h h “01...19 ul - s 4 419!?IM-.

ou4m

of WBulmo ?& f,~,,, m,-, I,%

Lois

[ h ,,remtW.nil,. ) “, 8.,,,!,,,, O@,, c“.,, f- w,,, ,“,,,,,,..

,

TABLE

A -3’

OPERATING CHARACTERISTIC CURVES FOR SAMPLING PLANS BASEO ON STANDARD DEVIATION METHOO SAMPLE SIZE CODE LETTER M ( Contln..d ) I W-.sa ?0?snplhl, ,19.s b-d
m ““,0 604 “d i.-

..rl.bnll, “.

“m!h!lf @!mlWd)

,.

. ... ..

il “ q lnwm Wm m,, ~., of WSM171C0 .079 { 1.ptm! 4.1..! .,I 1 1 * ..9 k+. 0“.l,t, L“.1. 4- W.*I h+.,llo...

m+dall?--dtiwr-eh etiti—rti-1, mb9md d b- * -

I

TASLE

A .3

OPERATING CHARACTERISTIC CURVES FIX? SAMPLING PLANS BASEO ON STANOARD OEVIAilON METHOO SAMFtE SIZE CODE LETTER N f I&w, b ,udq ,!,”, b,,.d m ,,”,, “Ihd -4 t..“l.b.t,l, “. ,,, ”l,tq ~.,.di,,, )

thl*. dm#w9*s!h**-t.4 bh -=@-nM-h.b9..9wwnl8 . -d 94e h , 4 4M”MI.,

aumm or woumo w., nw, -

LOU

I I I. ,,,,”1 ..h.th. I “. Auvl.bl. 0“.!1!,1“,1, t. “-”, M*,*,*).”

m

TAGLE

A. S

OPERAllNQ CHARACTERISTIC CURVES FOR SAMPUNG PLANS GASED ON STANOARO OEVIATION METHOO_..

-. .. .

TABLE ON STANDARD DEVIATION METHOD

A.3

DPERATING CHARACTERISTICCURVES FOR SAMPUNG PLANS BASED SAMPLE SIZE COOE LETTER o i G“, 1“ a+, ,Im, $,,,4 m ,,.,. 44 W, t-mm.ar,.bdlt,w

.— -—-—-—.

-——

TASLE

A .3

OPERAnNG CHARACTERISTIC CURVES FOR SAMPLINO PLANS BhSED ON STANDARD DEVIATION METHOO SAMPtE SIZE CODE LETTER O I Contln.*d) I Cnrm fw “w-q PIM1bm.d m r9ng.4M -4 k.v“i.bill!, “. .,,,.lhl~ qll.,1-l I

r5

.i

TABLE ~15 gi SAMFtE S! 2E COOE LETTER P t C4WW8 ,qll., t,Im, b.,.d m rq. ..fbti .,, &.cu vwl.btit+,,, , ,,,.”1,+ ,,.,..1”1 ) : !/ d:

A. 3

OPERATING CHARACTERISTIC CURVES FOR SAhiPLINQ PLANS BASED ON STANOARO oEVIATION METHOO

B

W +., d lb ,Wcmld It, *ml*4 1,“ -w. **ti .,-,, . *4 d M k , 4M”MI*

9UALIT7 9u9Ul~D LOTS I 1.,,,w,TI d,f,,l),, I Of MA) f,~,,,
0!

unu

“.

kr@.b!. Owl,!, L,.,t, t- w.,+ b!,,.,,,o”,

.——

_

_

TABLE CURVES FOR SAMPLING PLANS BASED ON STANOARO OEVIATION METHOO SAMPLE SIZE COOE LETTER P ( e--m 1- -I )Iul W m Ire,, d -4 i“.“kbllllj “, “oatId+ tq.lnl.! ) I Conllnwd1

A .3

lbdat?l-wddbf,-?-abb ---**”O--*, Wdd-b@--dak$*Mm

OUALIW SWUl17t0 101S I 1.,.r.m$ #.1..lh.1 Or lb,,, nw,., -. “. k~,.,,. 0,.1!,, L“.1, I- -..1 In,,,,,,..l.

,.$,

TASK
RA5E0 ON 5T,ANDAR0DEVIATION METHOC

A -3

opERATING CHARACTERISTIC CURVES ,FOR SAMPLING PLY SAMFtE SIZE cooE LETTER

Q I Cuml fw t.wh”, 01,”,},,.4 m f.”,, ..*W .. . b..“i,blmy “, ,,,m,, d,, _“,.,!M! )

a

mmkuilm~tibl,~,,bb
-,,.

-.woM*ubal

-04

d a

k

* d

41,+.MI..

1 OUAUW OP $uBMITrCo LOTS ( h ,.,,,”9 ,.1,,1,.,) W., flpt .I W. k.pl.bl. IWI~ L...l, l,, f.x.,1 I,TV,,,W I

., .,

TASLE BASED ON STANDARO DEVIATION METHOD

A.3

OPERAllNQ CHARACTERli~lC CURVES FOR SAMPLING PIANS SAMPLE S1ZE COOE LETTER Q ‘( Cm fln.,d I h,
b.,d 01 ,,.,. dti mm,bin.., .whb,hly “. ,,,4+ w@vdcd I

)

f-

,+*,

,S..,

SSCTIW VARIABIIJTY uNKNowN-sTANDAmf Parf SINGLE S1. SAMPIJNG PLAN FOR SPECIFICATION LXM!’T I

B DEvlAnoN

SPEUF3CAT10N

LUA3T

SINGLE

Thi. pArl Of the Standard deocribe. the procedure* for us. whh plani for q oingle ape .ifiution limit when variability y of fhe lot with re.pect to the quality charae%eri. deviation tic i. unknown q nd the .tandard method ia u#ed. The acceptability criterion i. given in two equivalent iorm9. Tbeoe are identified as Form 1 -d Form.2. B1.1 Use of SamPtinfl PlaJw. To determin. whsther the lot me=t. the q ccept ability criterion with respect to q particular quality cfuracteristic a.ud AQL. -Iue. the applicable campling plan shafJ be uced with lb. proviaionm of S.c in q ccordance uc.n A, Generai Description of Samplmg Plan. .-d th.. e in %hi, part Of th. Standard. B 1.2 Drawi..qof Samplem. AfI .amplew q hall be drawn in accordance -’th paragraph A7. Z. of Sample Size Code B1. 3 Determination qzce cod q letter q ~. Th e .smpla ha be selected from Table A-Z in q ccordance with parasraph A7. 1. B2 SELSCTING THE SAMPLING WHEN FORhf 1 IS USED PM

BS. Z.2 Accepu bility brmant. The acc.pc.gtotbemundility corutaaf k. correewmt ple size mentioned ia pnagraph B2.2.1, ia indicmed in the column of the nuster table cor re~pmxling to tbe applicable A(2L value. Table B-1 i. entered from the fop for normal inopecfion q nd from the bottom for tightened inspection. Sampling plum for reduced inspection are providd_ in Table B-2. B3. LOT-BY-WT ACCEPTABILITY PROCEDURES WHEN PURIM 1 LS USEI?

B3. 1 Acceptability Criterion. Tbe degree of conformance of q q uafit y cb8ractericti c limit with respecf lo q single specification .W1 be judg.d by th~, qusntity (u-XJI* or fl-L)/i.. B 3.2. Corn tatien. TtIt following quantity .haff b(“-X)/’ ., (x-L)/., d,pendiagon whether the specification limit i, ~ qper or lower limit, +ere U L X . i. ii. i. tk upper specification limit. tbe lower specification limit, the sample mean. and de.rlatioa. the q .tirnate of lot qsn&rd Acc ability Crite rfon. Cumpare the

B3.3

BZ. 1 Maater sampling Tables. Th= muter qanmlmn tables for mlana based or. -riaingle specification bilit~ -MI for ~ q limit vben using the ctaadard deviation Table B- I method q re Tables B-1 .nd B-Z, in .m=d ler norm.] and tighter.ed iriapection art< Table B - Z for reduced imspeetioit. B 2. Z Obtaining the Sa?nPlinK PIan. The .mnpl.tig plan cons.st. .1 q .unple .i.e 8d Cc. m q ~nociafed q eptability COtI.unt. 1 The sampling plan i. obtained from Mater Table B-1 -, B-.?. B2.2.1 Sam Ie Sise. The #ample .ise qhoum m t e ma.,.. tabl - eo.-.. p-.fing ~ .-.1. ..cnple qice cute tetter. Z* *O

abifttywmst-nt k. ff (u-x)/m or (x- f.)/a ia equal to .ar gre8ter tlun k, the lot meets the =cc~tiIf.fty criterion: if (U-X)1.** (X-f-)1~ ia l.mm Uu8 k or nerative, 3hrm the M &es not meef the •=e~llity criterion. M. t31JM3tMRY FOR ~~MNG PLAN OPXRATION WREN FORM OF s m

The foLIowfnr ‘soP* =~u... t.. . . mllowed:

•~marise

‘he PrO -

(1) Daterrnirw the sxmple .i.ecode lti ter from Table A-2 by uming the let sise and in.pccfion leeel.

MIL-m-414 11 Jt333e 1957 (2) Obfai. Pk. from Mamer or B-z by .eleeting the sample the ac..ptabill$y constant k.
unit.

Tab)= B-1 size n and

cpecifteation limit. The percentage of Macoaforming product is cstimattd by wiieria’ T~le B-5 with the quglity index and the sample q ize.
B6. Z GE-I utatio” of Qtufit ~-lity~-X)~rnpE~ if the specification limit i. q a upper limit U, or OL . (X- L)/t if it is a Io-er Jimit L. arnpl. Th* quaatitie.. X q md s. q re the q mean q nd e.timm e of lot standard deviation. respectively.

of n (3) Select at random the sampl= lrorn the let; inspect q nd record the mea. urernem of she quality characteristic fer each utiit of the sample.

(4) Cmnp.te the s.mpIe mean ~ and dcvistic.n . . and estimate of lot sts”dard q ISO compute the quantity (u-X)1. for an u per specification limit V or the q~ntity lids 3.. A-L)/. for q k.wer .peciticatio~ 15) M the quantity (u-X)/s or (X-W. i. equal co or greater than k, the 10I meets c.ept.bilicy criterion: it’ (u-X)/. or the q thes the (X-L)/. i. [e.. (ha--- k or negative, lot doe’ rwtmeel Iheaccepttii lily criterion. B5. SELECTING THE SAMPL3NG WNEN FOfUd Z 5S USED P2AN

-ii-t-d P.,. em d.f=~tiin d the upper specification limit, or by ?z.. th. estimated percent defective below the lower .pecifi catian limit. Tbe q stimated Pc*.=.: defective PU or PL i. obtained by enterina Tabk B-5 with Ou or QL and the q ppropriate q anple size. W. lot
qbove

~e

S35.1 h4asccr Sampling Table.. Th. ma. ter .ampJmg tables for plans based onvariabil ity unknown for a single specification limit when using the m~nd-rd deriatitm method sre Table. B-3 q nd B-4 of Part If. Tsble B-3 is used for normal a“dai~htened inmpec eion and Table B-4 .fc.r reduced.inspection. the Sampling Plan. B 5.Z Oblainin~ The sarnpli”~ plan co. ss.ts of . .unpl. ,Ize and maximum alk.w=ble percent sn q ssociated da$eclive. The samplin~ plm i. obtained from MaDter Table B-3 or B-4. mnple mice n is 65.2.1 Sample Size. T)M q q hewn m the ma. tcr table cortespendin~ 10 each sam>le .iz. code letter. 135..?. Maxim. mAllow8ble Z Percent De feeq llowable p.=. ent det$ve. The rrmxim.tn q stimate. correspond. =live M for ample img to the .unple size m=nt ioned in pa:agrmph 95.2.1 is ittdicated in the column of the nm.ter table .xxre.pondiytg to the qPplic=ble AOL value. Tabl. B-3 i. =nt=,.d from tbe top for normal inspection -d from the bottom lo, lsghter.ed in. peetion. Sam -li>g plan. lcIr reduced inspection q rm prov-l ea ,. ~a~,e ~-,. d

336.4 Acceptability Criterion. Gmpare the estimated lot pereent deIectivepU or pL with the maximum allowable percent defective M. U PU Or Pl, 1. eqUf to or leas thn U, the if Pu lot rneets the acceptability criterion; or p~ is greaier than M or if Qu or Q is ,negative, then the 10: does not meet \he acceptability criterion. B7. SIJ71SMARY FOR OPERATION SAMPL3NG PL.AN WHEN PORM USED The fellc.rnng step. .umrnariz.e cedure. to be fallc.u.ed,
OF

2 3S

the pro-

mple .i=e code let (1) Determine the q ter from Table A-2 byu. ing the lot size md the inspection level. (Z) Obtain plan from Master T=ble B-3 or B-d by .elecfi.~ the .unple .ixa n attd the maximum allowable percent defective M. (3) Select q t random the #ample of n unit. frmn the Iof; inspect UId record the m.asurernemt of the quality charact. rimic ample. cm each .unh of the q (4) Cmnpute3h= sample mean X arid the ectimale of lot .ta”dard devfatian . . (5) Compute the quality index Q Jfi: limit (U-X)/ * if q n upp. r .pe.ific.tie,. q P.*ified. or OL = (x. L)/. if q lctwerspec iiication 1;...;. L <. snecif; ed. (6) Det~rmb-Ic the estimated lot pereent de fecnive pu er pL from Table B-5.

B6.1 Acceptability Criterion. The dc~ree of conformance Of a quallty characteristic limit with respect m q ai.ngle specification hall b, judged hy the percent of rmnem-, Iorm,ng product outsidt the upper or low+r

%.

Ex_pie

B. z for .a cemplete

q xample of thb. prOc*dure.
:38

Mu.-sm4l4 11 Juoe 19S7 fi) ff the e.timated lot percerndefective PU Or PL i. ~ud to or 1... than the maxi. mum .dlowable percent defective M. the lot cc.pt~bil$ty criteriom if PU Or PL meet. the q is~reatertl.an U Orif QuOr C3~ is aepti e, ccepmbi r IIY then the lot doe. ml meet the q criterion.

EXAMPLS Exmnple Single Variability ExAmple

B-1

of Calcufatio.s Limit-Form Deviation I Method

Speci!icatlon

Unknown

- Standard

of operation for q cer:aindevic. i. .pecifi.d q . .?09” F. The rn.timum temperature A lot of 40 item. i. submitted for inspection. Zn. pection Z-evel IV, normal inspection, with AQL = 1-% i. to be u, cd. From Tables A-2 q nd B-1 i! i. aee : that a marnplc 01 sise 5 i. required. Suppose the measurement. obtained are q . <c.11ow.: 197.. 188-, 184” ,205-, and ZOl ‘: and compliance wfth the acceptability criterion i. 10 be determ%nea.

Line .— 1 ~ 3 4 5 6 Sample Si. e:

Information n IX

Needed

Value

Obta{ned 5 975

Explanation

Sum of Z.@.ur.m..t.: Sum of Squared Correction Corrected Variance Estimate Sample Me,,

ureznentn:

XX2

190,435 190,125 310

Factor

(CF):

(I X)z/n (SS): s“X~CF

(975)2/5 190,435 - 190,125 310/4 -s 97515

Sum of Sqmre. (V): SS/(n-1)

77.5 Deviation .: fi 8.S.1 I 95 u 209 1.5.9 k f2mpare w-X)/O with k 1.53 1.59> 1.s3

1
8 9 10 II
lZ

of Lat Standard Mean X: ZXln Limit

Specification The quantit~ Aecept~iIity Acceptiility

(upper):

w-X)/c &natant: Criteriozx

[209 - 195)/S .81 S.. Table B-1

See Par&. B3.3

The lot rneetm the .cceptabiltty NOTE:

criterion.

mince (U. ~)/s

is ~remt=r than k. the q~ntilY ~-~)f~ *rii=.iQn. if (~-Ll/* in is

ingle lower spcffieat{on limit L is given. fhen compufe If q s Iin. 10 -d com~re il with k, the lot meet. the =ccept8bility equal to or greafer than k.

!.

M2~-414 11 June 1957

Single Specification Variability Unknown

Limit-Form

,? Method

- Standard Detiation

I

CUmple

I

The maximum temperature of operation for q certain device is specified q s 209” F. 2nspection Uvel IV, normal inspecA JOI of 40 items is qubmilted for inspection. tion, with AOL = 1% in 10 be u.ed. From Table- A-2 and B-1 it i. .een that a sample of .ize 5 is required. S.ppome the measurements obtained art q . follow.: 197., 188-, 184.,205-, and 201 ‘; and compliance with the acceptability criterion in to be deter rnitied. Inforrntiion Sample Size: n XX 1X2 Needed Vmlue Ob:.ined 5 975 190,435 190,125 lX~CF 310 77.5 Deria:icm .: fl 8.81 195 u Z09 1.59 % De:.: M Pu vilh
q6nce

Lime —

tkpl .nati.n

J z 3 4 5 6 7

Sum .3[ Mea. urcme.ta: Sum ef Squared Correction Corrected .V.4@I<. Estimate Sample

Measurement.: (CFh (IX)zln (SS):

F=ctor

(975)2/5 190.435 - 190,1Z5 310/4 J-7X5 97515

Sum of Squares (v): of b: SS/(n-11. Standard ZXln (upPer): . (u-x),, D’*”’

8
9 10 11 1?, 13

Mean X:

Specification O~lity ‘“t” Mu. ‘f

Limit au

2ndmc b’

(Z09-195]/8.81 S.. Table B -5 B-3 B6.4

‘ercen’

.Z.19% 3.32% M 2.19% < 3.32% M.

A21mv=ble Percent Criterion:

.%. Table See Para.

Acceptability T3U let rmet. the

Compare

qcccptablzsty critarion,

pu is 1.-0 tti

NOTE:

U a sin@. lower specification limit L is Siven, then compute the quality index OL = PL rnth (X-L)/s i“ line 10andobuLn the q .timate of lot percent defective p . Compar. M; the lot meets the acceptability criterion. it pL is equal to 0? 1C*S lbn M.

!

- -- -—--M

...

I
B-1 Standard Deviatiom Methc.d Unknown

I
TABLE

MIster Table Far Normal &.d Ti~htened fn. pectlo. for PlaIJs Based on Variability [Single Specification Limit– Form 1) Acceptable ( Sample size
code letter

Gik

,10

,15 k

.25 kk

.40

allty .— .65 T

-

.CVCIS (normal m k 7 1.45 — 1.53 1,62 1.72 t.79 1.8.? 1.85 1.86 1..99 1.50 k

inspection) 4.00 k .958 1.01 I .07 1,;l 5 1.23 1.30 1.3) 1.35 1.36 1.39 1.39 1.42 1.46 1.48 1.51 1.51 6.50

2.s0 k 1.12 1,17 1.24 1.33 1.41 1.47 1,51 1.53 1.55 1.57 1.58 . 1.61 1.65 1.67 1,70 1,70 4.00

m
k .765 .814 .874 .955 1.03 1.09 1.12 1.14 1.1s 1.18 1.18 I.ZI 1.Z4 i.26 1.29 1.29 ,0.00

10.00
k

15.00
k

+k

B c D 5 7 10 15 20 25 30 35 40 50 75 100 150

E F
G 34

t —
2.64 2.69 2.72 — 2.73
1.17 2.77 — 2.83

i —
2.53 2.58 2.61 2,61 .?.65 ?.,66 — 2.71 2.77 2.80 Z.84 2.85 .10

l-k
$ 2.00 2.11 2.2o k 1.88 1.98
1

v
1.34 1.40 1.50 1.58 — 1,65 1.69 1.72 1.73 1.76 1:76 1.80 1.84 1.86 — 1.89 1.89 Z.50

1.65

).15 1.04 1.91 1.96

.?.24

2.42 2.47

I

2.3?. 2.36

2.06

g

I

2.24 3..26 ! 2.2.9 2.31

,?,11 2.14 2,15 2.18

T
.566

. .

.341

.617

.393

.67S .7s5

.4s5

.516

.82n .886

.611

.664

.917 .936 .946

.69s

,1 J K L

2.50 11.40 2.51 2,54 2.5s 2.41

1.98 — 2.00 2.03

.71,? .723 .145 .746 .774 .ao4 .819 .841 .845

I

2.45 .3.44 2.5o 2.55 2.58 2.61 2.6.? .25

L
5.4 N o P Q

2.31’ — 2.35

+

2.6o 2.66 2.69
2.13

2.90 2.92 2.96 2.97 — .065

L

--t2.73

zoo

-t.15

A21AOL wdue8 ye knpercent de-a. [Irst tunpllq plan belcw q rrow, that is, both sample OIZ.S well ao k va2ue. When nample sise equdt er e=ceedo lot as ,V.V ,tern hth. lot must be inspected.

1:::,

1
2.18 2.03 2.22 2.27 2.29
a.33

.969

2,08

1.89 — 1.93 1.98

+ .971
1.00 1.03 1.05 I .07 1.07

2.41 2.43

2.12

2.14 7,1!

2.00

2.47 2.47

2.03 2.04

2.33

2,1[

.4o i .65 I ,0( — AcceptableC alit,

1.50 — ,fVela

i

I 5.00

lightened inspectio! ~~

TABLE

23-2

“Standard Deviallm

Method ~E

Maater Table for Reduced lnmc.ectimfor Plana Breed On Varlabilitv Unkmwm (Single Sp’c.ifi..tl.n Litnit-F. rm I ) I I
SampIe

I

“Ac Sunple size .04

uality Levelo .40 —. k —.

size I

m
D E T G H

Code latter

I

.06S I .10

.15 k

-L

3 3 4

x .—
k —

EEE
l.lz I,lz 1,45 —. 1.51 t 1.62 1.7Z . 1.72 1.79 1.50 1,58 k 1.50 1.6S 1.34 — 1.40

Z.50 k .— .958

4,00 k .165 .765 ,76$ ,165

6.50 k .566 .566 .564 ,566 ,617 ,675 .755 .828 .828 ..986 .91? .917 .936 .946 1.00 1.01

i65i
k .141 .141 _— .141 .341 .393 — ,455 .536 .611 II .664


5 7 10 10 15 Zo Zo 25 10 Z.53 Z.58 — 2.58 z.61 t-t Z.4Z Z.47 Z.47 Z.50 z i Zoo Z.11 Z.11 Lzo Z.Z4 — .LZ4 2.Z6 2.Z8 — Z.Y5

-i1 J

*

K L u

I

Z.Z4 Z.)z z.16 Z.36 2.40

1.9a — 1.9a

I
1.$8 2.06 Z.11 — Z.11 2.14 2.ZZ 2.27

J+~~
1.12 1.12 .958 .958 .95.9 1.17 1.Z4 1.33 1.41 1.41 1.47 1.01 1.07 1.15 1.23 1.23 1.30 1.11 1.33

I .— 1,65 i.75 1.84 !.84 1.91 :.96 1.96 1.90

..914 .874 .955 1:01 1.03 1.09 I.lz I.lz 1.14 1.15 — I.zl 1.24

All AQLvm3ues q re in percent defective. f2rotdunplln,g plmbelowtrrow. that it, both mm-qde nize no well •~ kvalue. ~~;;, e,:,, ,,,m i“ the ,0, lll”,t t., ,mpetted.

T
N 0 P Q

.?.!5 —

2.00 — Z.08 2.IZ —

50

*
Z.41

75

-1-d
1.8Z 1.8z 1.69 1.51 1.69 I,7Z 1.51 1.85 I 1.86 1.51 1.73 — 1.80 1.55 —1.61 1.91 1.98 (.84 —— 1.65

.695 .695 .712 .72J
,114

1.35

1,36 .— 1.4Z 1.46

.80$ .—

I

Whertaemple oize equal, or exceed.

lot

Part DOUBLE S8. SAbfPLLNG PLAN SPECIFICATION ~ FOR

n
3XM3’I

SPEC337CATZ034

DOUBLE

This part of the Stan-dard describe. the procedures for use with plain for q double specification limit when variability of the lot with re.p. ct to the quality cluracteristic i. unknown and the standard deviation method is used. Bfl.1 use of Sampling Phm.. TCI determine whether the lot meets the qcceptability criterion with respect to a particular quality characteristic a“d AQL value (.) the applicable campli”g plan qha31 be used in accordanc. with the provisions of Section A, General Description of Sampling Plans, and those in this part of the Stamdard. B9. SEIJ2CTI?JG THE SAMPLING PLAN

the maxfzmIM tiowable percent de fecfivc by ML for the lower limit, mad by M for fhe upper limft. If one AOL is asci~e 3 to both IiAt. contbi.ed. designate the timum Ulowable percerd d-f% by ht. Table B -3 i. q ntered from 3be 30p for marnul flupection and from the bottom for tisbtaaed fLlWpecffon. Samp3fng pfuu for reduced fnspect.ien q re provided io Table B -4. B 10. DRAwU?G OF SAMPLES be elected A7.2. T in accord-

I

Sample# shall ance with paragraph B11. ;:&-.o;&O

ACCEPTABILITY .

A sampling pJa. for each AOZ. value .hall. be q elected from Table B-3 or B-4 m [C.;J”WS:

B9. 1 Determination of Sample .Stze Code ktter. The .arnple i.. cone letter .hal; be selected imm Table A-Z in q ccordance with paragraph A7.1. B9. Z Maater Sampling Table.. The master satnplmg table. for plum based on variability .“kt-mwn for a double specification limit when using the standard deviation mctbod are Tables B-3 and B-4. Table B-3 i. u.ed 10. normal and tighlened ir.spection amd T=ble B-4 for reduced impectiom B9. 3 Obtaining Sampling Plan. A sampling da” consists of a .arrml. ..ze and the as.— soeiated maximum allowable perceni defecpplied i. tive(s). The sampling plan to be q inspection shtil be ob-iaed from WSter Table B-3 or B-4. B9.3.1 Sample Size. The .unple #ize o is tablas correape=ding show” in the mater tO each sunple size cod. letter. B9.3.2 M-.imum Allowable Percent Defec. percem *. T h. maximum allowable defective for #ample estinuLe. of pert.mt de fe. civ. for the Icxmr. upper, or both .pec. ificatiori limit. combined, corresponding to the sample .ize mentioned ia paragraph f39.3.10 in shown in the COhmm of the masto the applicable ter table corresponding AQL value(s). U different AOL, S q re a.sign=d to each .pe cification limit, de.ignmfe

B 11.1 Acceptability Criterion. The degree 01 Conformaa Ce or a WlA3ity elaaractcria3fc with re. pect to m doubje m pacification limit .hafl be judged by the percent of r.onconform% P.tiuct. The percentage of manconforrn img product i. e.timated by entering Table B-5 with the quality index and fhe’.ample .ize.

U L X s

is ia is is

the upper specification limit, the lower sp.cificacion limit, the sample mea., and tkm estimate of lot standard deviation.

B 11.3 Pere=nt Defective i. the Lat. The aualitv. of a lot shall be cx~r.a~terms . of the lot perc=nt deiecti~c. Ita estimate +33 be de.i~ted by p~. PUO Or P. me iadicsten cmifornunce with :::;52ptL upper .Pe.tllctiorl limit, PF w.ilh .e. pee: to fbe lowez .pecifiutio. lima . -d P for both .Pecifiati.n limiteombimed. The emtimstea p mid p r=.pec be determined by wIterins + q ble B- Y . ‘w’ tively +f.h QL and f)” md the sample q isc. dding The eotinute p Zhmfzbe determined by q the corresponding ectinuted percent defective- pL and p“ found in the tible. B12. ACCEPTABILITY CRITERION SUMMARY FOR OPERATION SAMPLING PLANS both Upper umd. AND OF

B 12.1 be AOL value for Lower s’ ecxlncatson Lwm

and

MI L-STD-414 11 JurIe 1957 B 12.1. I Acceptability Criterion. 4 Carapare the q stimated lot pe.rcatt delective P = PW + q llowable p=rcent PL with the maximum qual to or less tfun M, d. fective M. 11p in q the lot meets the accepmb{lity criterion: if p is grcatertban Mor ii eifher Qu or QLor ,then the lot does not meet both q re n.@ive cceptability criterion. the q B 12.1.2 Summary lor Operation of Samplin# m.glc ACfl. value is Plan. In cases where a q ~lished for the .tmer and lower .pccifi cation limit combined for q .in81e quality characteristic, the following mtep. summa rize the procedures to be used (1 ) Delerminc the ample size code letter [rem Table A-2 by “sing the let .i%e q nd the iriap. ction level. (2) Select plan from Master Table B-3 or 8-4. Oblain the ample size “ q nd the maximum allowable percent defective M. (3) Select q t random the sample .af “ unit. Imrn the lot: i.sp. ct and r-cord the mea. ur. merit of the quality characteristic on each unit O( the amp]=. mple rnesn X (4) Compute the q and c.timltc Of lc. .tand=rd t dcviatic.n s. (5) Compute the quality QU = (u-X)/. and QL= (X. L)/,. indices tdu, the lot meets the q ccepubi.fityc riteria; otberwimm, the lot doe. not nwet the ace~. abf3ity criteria. U .mither QL or Qv or botb are me~tiive, then the 101does not meet the acceptability criteria. BIZ.Z.2 SurnmaryfOr Opertiianal Sampffrt& Plan. 3n ca. eg where q t erenf AOl. walue ~stablished le. the upper and lawer .pec ification limit for q single quality cfuract=r istic, the following steps sunururi’e the procedures to be US=CL (1) Deterrninethe ample .izecod= letter from Table A-2 by twin, the lot size and fnspectimt level. ‘(.?) Select the sampling plan from Master Table B-3 arB-4. Obtain the.ampfe .ize . and the maximum allowable percent defective Mu and M’. corr=apondi.g to the AOf. va2ues for the upper and lower specification limft., respectively.
of (3) Select .1 random the ..ntple fr.rn tie lot; ia. pe.t and =ecord the meas”remerd of the quality cfur. cterimtic on each unit in the .mrIple. n unite

(4) Compute the sample mean X and estimate . 10I .tamlard deviation s’. ,, (5) Compute the quality Qff = (u-X)1. and OL = (x- L)/a. ittdice.

p.,r.n: B-5.

(6) Determine the estimated lot d. fecfiv. P = PU + PL from Table

(7) lf the e.tirnated lot percent defective p i. equal tc. or 1,.. than the maximq llowable ptzcen% defective M, the )ot um cceptability criterion; if p is meet, the q ur.~t=, th=n M Or if either W or QL bolhar. ne~.tive, then the 101doe. not met cceptability criterion. the q B] 2.2 Different AOL Valueo Lower specification Limit. for Upper and

(6) Deterrniae tbe estimsted lot percent defective ~ and p~, correspandiag \othe percent defective* shove fhe upper and below the lower .peciIscaticm limit-. A2eodetermi”e the combin.d percent delec tive p = pu 4 p~. (7) 11all tbre=of dition.: (a) ~ % ‘L.
q

the f.dlowin~ corlt. 0? 1... thll t3UII

i.

equal

~] PL !9 =LNJ81tO 0, h..

B 12.2.1 Accernability Crit’eria.5 Gmpare th. e.tirnated 1 fJC,C.llt dd ectives pL and 01 PU with the cm? c.pn.ding rntimum allow. able p.rcem defective. M compare p = F.L + Pu wfth tke%~#~fa?L qual to or Iesn than htL, and Mu. If pf, i. q PO i. =qu*: to or le.. than MII. and P im .@al to or 1.*s than the larger ‘of ML “and

larger

of ML

(c) p is equal to orlemmthanfbe q nd btU,

cceptabifhy are sati. fied, fh= lot meet. the q criteria; ofhe=wi. e the lot does mat meet the acceptability criteria. ff either OL or Gff or both q re negatiwe, then the lot does not tne=t tbe acceptability e=iter ia.

+S.. *W

Etimple Example

xample of ibis proc.dure. B. 3 {or . cmnplete q B.4 lot a cmmpl=te exatnple of thfs procedmre. 42

Z41L-STD-414 Ii June 1$S7

I

3SXAZ4PLC Example Double VariabiNty 0..

E-+

i
I I

of Cdcu3ati0nm Ltmtt Zkuiaticm M.thod Specification. Limit Cmmbined

spa Mlutino

?.bbnamn . Stutdard and Lower

AQ L Value far both Upper

E-de

1’

1’
Line — 1 2 3 4 5 6 7 s 9 10 II 12 13 14 15 16 17

Tbc minimum temperature of operation for a c=rtAtn device 48 speetfied 8.180- F. The masimwnt.mprst.re h 209” F. A lot of 40 item. i- submitted for imopection. 3nmpection Level 3V. normal in.pect(on, wtth AOL. s 1% im to be ..d. From Tablam Suppo*e the rne...re. A-2 and B-3 it is neen that s sample of qi=e 5 is zequird 197”, 188”, 1M., 205”, md 201 -; q nd cmnpliuw. mcntm obtained q re 8. fof30w.: with the acceptability criterion i. w b. determined. Znforrnatian Sample Sise: n mant.: SX XX2 Needed Value Obtained s 975 190,435 190,125 310 77.5 Deviation s: & 8.81 195 Limit: LitnAt: U L 209 180 1.59 1.?0 % PL 2.1 9% .64% 2.85% 3.32% P . Pu + 2.85% < 3.3.2% (zo9-1951/a.nl (195-180)/8.81 .%Table B-5 (975)2/5 190,435-190.125 310/4 m 9?5)5 Explanation

Sum 01 Measu.. Sum of Squared Correction Corrected Variance Estimate Sample Upper

Measurement: ICF): (2x)z/n

Factor

Sum of Squarca (V): SS/(n1\

(SS): XX~C~

of Lot St&rd ~1.

Mean ~:

Specification

Lowe r Specification QtuIity Index:

Qu - (U-X)/s OL = & hf. L)I. Ab0V8 U: L

C3udity tid=:

Eat. of L9t Percen5 Est. Tataf Max. of Lot Percent

Z)ef. below & La& Da f.:

See Tablm B-5 2.19% + .66% See Table B-3

E81. Pe.rcm13 hf. Nlowable Percent Criterion:

p = pu + pL 3.4

Acceptability p~ with M

Compare

See Para. 812.1.2 (7)

‘3&

lot meet.

the

qcceptability

criterion.

Ante

P s Pu + PL i. 1=. s t~

M.

I

,..
43

m&6w14 11 Jone 1957 EXAMPLE Exampl* B-4

of cazcU2Mf0m Z.imtt Deviation Method l.imitc

DOnbla Spcffiuti.=n Vari&i3fty Different Uakm ior - 5tsadard Upper

AQ3. Value.

and Luwer

Specification

Example

The minimum temparamre of optra3foa for q certiin dewice i. .pecified q - 180- F. The rnu5mumtempQ=a3ure ii 209” F. A lot of 40 items in subrnkted for inmpm=3ion. f.mp=ctic.n L=v=l Iv, normal imW=CCICQI.--I* ACZL = 1% foI *= upper -d ~~ = From Tables A-Z and 23-3 it 2.5% for tha 10uer specification limit is to be used. Suppcme the measurements obtained is q.en that . sample of sise 5 ia required. are aa follows: 197. , 188. , 184”. 205”, and ZOI. ; and compliuce with the acccpt ability criteria i. 10 be determined. Information Needed Vat.. Obtain. d 5 ZX XXZ 975 190.435 190.125 lX~CF 310 71.5 Deviation s: fi 8.61 195 w L Z09 ,1s0” 1.s9 1.70 U: ~ PL 2..19% .64% 2.85S [209 -195) /6.s1 (195 -180) /n.81 See see Table B-5 Table B-S W75)215 190.435-190,125 31OI4 m 97515 Explanation

~
1 z 3 4 5
b 7 k

Sample

Size:

n

Sum of Mesmmements: Sum of Squared Correction Corrected Variance Estimate

Meaour.m.mta: (CF): (ZX)2/n (SSh

Factor

Sum of Squares (V): SS/(n-1)

of Z.ot Stam&rd X XXln Limit:

Sample Me=

9 10 11 lZ 13 14 is lb 17 la

Upp=r Specification Lower Specification Q“

Limit: . (u-X)/o

CluaIity 3ndex: OAity index:

(ZL = (X. fJ/. DA
q hove

Est. of z.&4 Percenf

Eat. of f..of Percent Def. Total E.;. Mu. Mu. P. rcent &f.

belsw k.

in Lot,: p . PU q pL Def. •bov~ U: Def. below (s) Comp-rc @) ;;;p;f (c) Compare Wifh ML & MU ML PU pL p
qbe

2.19% + .6W See Table T*1. B-3 B-3

Allowfahlc Pereent Allowable Percent Criteria:

9.00% 2.19%. .bf+ Z.esn 18(s), 3.3.?% < 9.80% c 9.80% (c)are

See

Acceptability

See Para. Blz. z.z(7 )(a) see Psra. BIZ. Z.2(7)(bj S.. Para. BIZ..2.Z(7)IC) •ati~fied; i.-.. PU ~

~e lot meet. tbE pL<MLsndp<LtL.

qcceptability

criteria.

(b); ad

44

TABLE Minter Tsble for Norm81 and Tightened tnapcction for Plms Blsed on Variability Unknown (Double Specification Limit and F.rm2-Single Specification Limit) Acceptable ~ .04 M M 7.59 v 1.53 10.9Z 9.80 8.40 1.Z9 6.56 4.09 3.97 z,03 Z,68 1.87 1.88 1.71 1.07 I.oz 0.63 8 0.41 4 “.25 0.63 7 .40 0.949 0.945 x 1.60 1.53 0.68 9 1.43 0.41 3 1.4Z I .00 z.71 Z.49 2,Z9 3.91 3.70 3.72 3.45 1.17 3.ZO 3,07 2..?0 — Z.05 0.447 Z.04 1.50 AcceMabilitv Qualitv Levelt (
qre inpercent defective.

B-3

S1and*rd Devittlon Method

t Inorm.1 in! qctim
I.00 iii~ ~ 1.50 M

Sample cite code letter .065 .10 M M M M .15 .2s .40

B 4 5 ; 7 10 v 0.099 0.13s 2.o5 Zoo 1.98 Z,86 0.155 0.119 0.110 0.17 9 0.16 3 0.14 7 0.14 s 0.13 4 0. ;3 5 .06 5 .10 .15 O.zo 4 0..294 O.zo 3 0.Z9 3 O.zzo 0.31 7 O.zze 0.33 0 0.467 0.7.20 0.Z50 0.36 3 0.503 0.789 0.275 0.401 0.566 0.873 1.z6 0,264 0.388 0.5}5 0,847 1.23 0.280 0.413 0.581 0.079 I ..?9 0.250 0.380 0.:51 0.017 1,29 o.2zn 0.165 0.544 0,846 1.Z9 Z.95 0.186 0.31Z 0.503 0.818 1.31 Z.11 v v 15 Zo Z5 30 35 40 50 75 I00 150 zoo 0.349 0.716 1.30 Z,17 3.26 — 3.0s 4.77 —. 4.31 Z.14 3.5s 5.35 - i + 0.422 1.o6 1.31 3.3Z 5.83 v 5.50 16.45 14.39

3

c

ZZ.8b ZO.19

29.45 Zb.56

36.90 33.99

D

E

‘Zzo
10.54 9.46 6,17 5.97 5.06 5.57 5.5B 5.20 4.87 4.69 8.9Z

I““l 4
15.11 13.71

‘0$0
ZO.14 18.94 Z1. S7 z5.61 12.99 “12..03 Z4.53 13.6311Z.571 17.511 ZL97

r

G

H

I

J

’47I

‘2’61 I “s’ “024
8.10111.871 16.651 Z2.91 s.091 11.85[ 16.61 Iz2.86 7.61 11.Z3 15.87 7.15 10.63 15.13 6.91 z.#9
Z.nl

K

L

M

ZZ.00 21.11 [0.32 4.43 4.40 Z.50 — ;htem 4.00 14.75 6.57 9.86 14.ZO 6.53 9.81 14. IZ 6.5o 10.00 15.00 insrmcticml -5 -. ZO.66 Zo.oz 19.9Z

N

o

P

Q

All AQLandtablcvsluet

a

,—

TABLE Muter Table far Reduced fnvpecclm [m Plan. Bared o Vsrlablllty thkn.awn (Double SpecU{cation Limit -d Form 2- StttgteS !clfic atim Limit) Acceptab = ..?5 1.50 3.4 7.59 7.59
1.59 7.59

23A

~
1.00

10

ample cite :xI* Iettsr .40 , -ii— I
M --

sample 81;0 ziI — 3 }.( t.. .— —

-j

7 —

=2
18,06 16.45 26.94

B

c
3 3 4 — — 1.33 3.32 3.5s 3.26 3.z6 3.05 1.95 — 2.95 ,?.00 ,1.9s 1.17 I .07 0.720 2.86 2.83 4.77 4.31 4.09 — 4.09 3.97 3.91 4.71 5.15 8.40 1.Z9 7.Z9 6,56 6.17 6.17 5.97 3.86 1.Z9 5.83 9.80 0.412 2,14 Z,17 “Z.17 Z.11 “~2.a5 2.05 — , 1.30 1.11 1.29 1.Z9 I,zv 0. I 0.228 0.365 0.365 0.380 0.413 0.363 0.467 0.503 0.789 0.581 0.879 0.551 0..977 0.544 0.946 0.ZZ8 O<Z50 0.280 0.544 0.846 ( 2 i. fllfl 0.s03 0.349 0.716 0.349 1.30 0.716 v 1.06 s 7 10 10 15 Zo Zo Z5 30 v S.50 10.9Z t 1.53 —

3

D

E

F

!
3.45 5.20 3,20 — 4.87
1.15 10.63

G

14.39 I 20.19 I Z6.Sb I 33.99

I

H

A a

1.

J

K

4-4-4-=
9.46 I 13.11 I 18.94 ] Z5.bl

L

I

M.

N

o

1.11
1.6o

Z.49 Z..?9 —

-=l=t+t1s.13 21.11

All AQL and t-ble values qre {a percent defective.

_l-1-LK

0,330

Jy:a,

first ounpllng PIU bdow qrrow, that is, both #unple oize a. well m M value. “When cunplo sise equa2@or exceeds lot e.e~y item in tha lot mumtb. in#pecled,

I

— .—— —. _____ _

TABLE TSWO for Eotkmtlq M#thedl th~ &t Pe, CCIII Defective U#lnS Standard Devl.ilon

B-5

.- .

TABLE EZ k!’ Thblofor E!tim.tlng the tit Percent D*(ectlve U#lng S;mdard Devlaiion MQ~hod

B-5-Conthed

1

-.
.,,

TABLE B-5-Conllm.wd Deviation Mathod Table for Eotlmatlag tbo bt Percent Deltctive Usln@ S1-d~?d

. ,.. .

,.

J

TABLE E Deflation Method k F Tmblcfor Eotlmatln[tho lmt PcrcerIt D6fecllve Uc@Stmdard

B-5-ContlnueU

s

.

i.

I

.—.

. .—

TABLE Tatdo for Eattnutlq tho kt Poreant Def*ctlwe UOlag Standard Derlatien ,Mothod

B-5-Cadimed

a

-“ “.

E

ML-rm-414 11 J5fffa 1957 Pmrt m C5TZMATZON Or PBOC= AV~E REDUCED A35D TIONTU4CD B13. ESITbfATfON AGE OF PR~ AVBRAND ~TER3A =PECTION FOR

The qverage percent defectiwa. b-cd for origfnd = group of let- submitted inspection. i. cafled the proceoq voragc. Originaf imspectimi i. the firm im*pecfiOn Of qbmttted ~ -~cb? ety of p~ cceptability a. dfotiaguf.kd from f3M for q immpe c;ie. of product wbfch ti. been remtbmifted after prior re&cftcm. 3%. pro-.. average .fuU be ..timated from flm r..uft. of in. peetic.. of samples dr.wmfmrn a .peelot. for the purified number of precedfq up. d.rin~ the c..r.e of . cmdr.cf in accordance with ~rag,.ph B14.3. AD, 1- sM1 b- iustinuffag lb pxocem. cIuded only once in q qwr.verqe. The ..ti_t. ef Uw prw.. =K= i. d=. i~t=d by PU -be. eompufed wifh pee fficatier. lisnit, by re. pect to an upper q PL w.h=. c,.mpyte,d w+fh rc.pecf to q lower .P=c,f,.~t*I.mtt. md by p when computed with re. peet to a double .pecfficatio. fimit. .-. B 1~.1 Ahn.rmA R.muft.. l%. r.. ult. of inspection ef product _ufaetured under . ..”diti... mot” typfcd of ..IuI p.odmeficm pre.3u15 be exeluded frmn the q .tinnted ce.. avera~e. (hnputmtion of the Est5nuted %0. . estimated procem- q =ratm t. t e q r thmetic mean of fhe .atfmafed ‘~ ‘h l~t percent defective. computed from b .amptia~ iit.p. ction *..uft. d the pxecedtms ten (10) lcIt. .M a. may be othetwf. e decig. nated. b order to e.tirnate tbe lot percent dal.etive, tba quality Ucea QU tiler QL shaff be cmn~ted for q ub lot. Tbom ~e: C3U = (u-X)/c md QL= (X. L)/a. @em pus. Sr*pb 3511.2.) B 13.2
~.= Of d=~=rdaiag

and the ~rremmondtnsedmtid 1c4 +rcud &fOcfiw ~ & p=,-respectively. iw mad from tfm fable. Tbe ectinuted proceco q vcrage ~ i* * ~ifhnwfic meaaef fbe fad3vtdual e.ttrnmted tot perce.t defective- pu’ c. 6tmitarly. the etiimated procem q q =rage $L it tbe arithmetic mean of the individual q ctfaut9d 30t pareemt &facUwa pL’8. B 13.L2 Uoubl. SpecW. UtImI Limtc. The c &timated Iof percent defecfive q . q .termIned from Table B-5 for the pfaim ba.ed on the standard deviation method. The qtuf It, imdf... Qu d 0= sti ba e-vu-f. epar.tely wlfh ~ and Tabfe B-5 i- enzered q the eor--mpmdQL d the -unP5e qiae, d fag ~ and PL us read f mm the t8ble. Th. eatitrmt.d lot percent defecfive t. p = p .+ PL. The eatimuted proc. qS a=rage p is se q rifbm.fic mea. of the individtuf c..tinuted lot ~rcenf defectivep’.. D 13.Z.3 S cfal Cam. It the qtulity index OIJ or C3L< a negative ‘numb=.. the. Table B-5 i. entered bvdimrenardins the negative .ip. f-i---, ‘i. tbi.- a., ‘h. c.. fi&ated lc.t percent de fecfive above ftm uppa r limit or below fbe lo=. Zimit i. obtafned br mzbtractiq the PCrcenuge found i m the” table from 100%.7 .BIL. NORMAL TIGHTENED, DUCED IkBP33CTfON AND m-

q.v9rity

of iacp.cfian

Thts S-*rd pfam for normal, iMpactiOn.

esti5fah*d campfiag tightened, and reduced

B 14.2 -as Of hmcuon.

Wetfon 31W
Mrnuz

tirncttan

D9rtm, tba c0ur9* qhaff be

fisbtmnd er ‘r.duc8d LrJsp.cficm 1. ~ mrquir9d b •ccor~ wttb pr.sr.~ B 14.3 d n14.4. B14.3 Tishtaa8d 311spectioa. TI~btarnd h. q poetfon qbalf b- fmtitmad whn tha c cti wmpidmd from tfm matid pro- qa .nragm When Form I -Sfngl. Spectff~tfon ~ 1. rm.d for tba acmptabfflty criterion. tbe “octl mafe of 101percextl &feetfve pu.or pL 10 mot obta.lmed;fmordertoewtimate the proc.am q v8r ~s=. it i* n=c=a~=rr to complete paragrapba B6.2 uuf B6.3 of Form L 7FOraXUnP18. U ~ . -.50-0 q SMPZO SCM SO,PU = 100% - 30.93% = 69.071b, = 1.60. us~ P1. 9 ~-n -P* 69.07s + S.sk . 74*. 52

. ..-

I

II preceding ten (101 108. (Ot ..& 04h*r rlwn bar of lat. de. i~ted) 1. =crnrduue with Kr=zr&pb BIXZ i- srestcr than the AQL, -d when more than A c=rta~ number T of of flx percent dethem lots have e.timafes fective sxceediq the AQL. The T vdttbs q re given in Table B-6 far the procea. .verage computed from 5. 10. Or 15 Iots.e NormmI inspection shall he reinstated if the q ver-ge of lots und=r ..tinut.d preces. tightened i..prction is cqud to or 1..8 tkmn the AQL. B 14.4 Reduced Im.pectiom. Reduced ilI.pection may be inmitumd prc.vid. d that q ll of the following conditionare qatiofied: Condition A. The preceding ten [10) lot. (or .uch other mmnber cd lm. de. igruted) and nom have been under nornul ia.peclio. has been rejected. Condition B. The e ctimated percent defective for each of theme preceding lot. io 1=.. Uthe appUcable lower limit shown in Table B-7; or km =ertak .arnplirIg plan. ,

XIL-STD414 11 June 19S7 b estimated lot percent defective is eqtnt to =ero for a q pedfied number of conmeeutiwe tot, (gee Table B-?).

I

q teady

Cad6tfon
rata.

c.

PrOdnctiM

is

qt

a

Normal impaction qhall he r.in.tated if any oaac of the following condition. occ. ra undc r reduced inspection. Condition
q .eragc

D.

A lot i. rejected.

q Condition E. TM emtimated prc.cem is greater tham tbe AQL.

Condition F. irreguI~r or delayed.

Production

become.

Qther condition. .. . Condition G. ~? ~brrmt that normal inspection .hould be reinstated. B 14.5 Sampling P18m. 1.. Tightened Or Reduced lmpecthm. Sunplu-ig plan. ior tightene d and reduced in.pecticm .re provibd in Section B, Part. 1 and U.

I:

I

..

MIfA3TD-414 11 Jwm 1SS7

Cuve] Z.5 4 6 8 4

10.0 15.0
4 : 9 4 1 10 4 1: 4 1! 4 1: 4 1: 4 1; 4 1: 4 1: 4 a 11 4 a 11 4 1: 4 8 11 4 8 11 4 1: 4 a 11 4 8 11 -4 a 11

t49mbar Of bta 5 ‘0 5 10 15 5 10 15 5 10 . 5 10 1s 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 io 15 5 10 15 5 10 15 5 10 15 15 i5

1
9 4 1: 4

I

I

1: .: 11 4 a 11 : 11

1: 4 a 11 4 a 11 4 8 11 4 e 11 : 11 4 1: 4 8 11 4 8 11

,

4 8 11 4 a 11 4 8 11 L 4 6 a 4 6 9 4 6. 999910 44 7 : 4 8 11 4 8 11 4 s 11

..

/

M

I 10 I
mm
q re m

4- — 4-a “8 11 11 pluu prwuad la thio Staa&rd M far Unse code lctirs

9mp31a#

dAO1.wshm9.

..-.

—-

unmlTP514 11 Jrmd 19s7 TAB= vdtms of T [or B-6<0nfif=d TiKhtaud Impaction

sUmdard D8dmnua U8fbd

Th. top figure ia ..ch ilock refers t. fbe preced~g 5 10C~. the ~ddfe preceding 10 let. and the boftom fipre to the preceding 15 let-.

fi-re

~ ‘e

Ti@encd ia.pection i. required whom tbe numb. r of lnta wltb e~tfmates of percent 5. 10. Or 15 Lets is srester tbmn th= xiveri wdue defective qbove tbm AQL from the precediq of T in lhe table. ad tbe pro.en~ average from them. 10t@ .=.=.da tba AQf-. N1 estirnatew of the tot percent defective are c.btained f rem T8ble B-5.

-.

— —.

TABLE Slmdtrd
DevIa440n M!thod

B-7 I“ ::

Llmlt# 01 &#tim~ttd Lut Percent Defective for Reduced Za.pection

sample tll* code letter .063 1 .10 I .15 I .40 T5.25 Acceptable Ouili!y Level. I .65 [ 1.0 [ 1,5 I 2,5

.04

I
q

23 [ZB]** [IO]** [lZ]** ( 9]**

*

*

q

*

I

c [15]** [IO]**

q

q

q

q

* [45]** [II]**

q

q

5

[22]**

[ 7]0.

.77 15.00 &

10

15

5

D * [ 9]**

q

q

q

*
q

[31]**

[25]**

[18]*.

[13]*O

0.00 4.40 6.S0

.74 9.96 10.00

6.06 15.00 &

10

15

5

E

q

q

*

q

[25]** [18]**

[14]**

[11]..

.00 ,10 .es .11 z.65 4.00

.00 .88 2.49

1.38 5.96 6.50

4.24 10.00 i

9.09 15.00 &

10

15

? .000
.001 q ,000 .002 q

=
.029 .000 .016 .123 .000 .101 .369 .044 .74 1.50 .003 .317 .81 .>06 1.80 2.50 1.05 3.56 4.00

tool

5

F

q

6.50 &

5.19 10.00

10

I
.84 2,23 2.50 1.64 3.94 4.00

i

iO.47 15,00 4

Is

v .000 .003. ,010 .000 .006 .02s .000 .018 .062 .011 .143 .315 .041 .310 .6.?6 .136 ,643 1.00 .002 .057 .151

5

G

,000 .003

.123 1.14 1.s0

),s0 6.50 &

6,06 I0.00 A

11.51 15.00 L

10

15

H

7.40 10.00 .266 .78s too .521 1.31 1.50 1,14 2.40 2,50 Z.24 4.00 ,&

5

10

.000 .004 .013

.000 .010 .029

.002 .03.3 ,0s0

.005 ,040 .10!! .04.s ,2.3s .396 ,121 .445 .65

.017 .111 .?.1s

. $ -14.29 6.5o 1
A

1
.185 .509 .65 .36o ..963 I .00 .653 1.39 1.50 1.33 2.48 2,50 Z.49 4.00 A .231 .550 .65 .431 .909 1.00 .750 1.44 1.50 -.. 1.47 Z.50 A Z.66 4.00 A

12.07 15,00 A

15

s

1

.001 .002 .009 ,020 ,03.1 .043 .005
.021 .0s2 .050 .089 .087 .146 .169 .2s

.006 .039 .077 .012 .023 .054

.014 ,071 .133 .083 .214 .40

,037 .146 .248

4.59 6.50 1

7.74 10.00 A

lZ.4> 15.00 &

10 15

,002

1.98
10.00 h

5 10

J

,011

.027

.113 .306 .40

4,81 6.50 ,A

+

lz.69 15.00 -+- A

1

15

q Th=i* mrc no mmpliag plain provided Anth!o Standard for these code Ieltero and AOL vduei.

.—— —.-—___—_ ,._

,.

TABLE Standard DevlaIkIn M,t~d Limlto of Cctimalcd Lx P~rcetN Delectl}e for Reduced hwpectim

B-’f-ConUnued

Sunple OIZR code letter .10 4.0 6.5 5 10 10.0 15.0 .1s .25 .40

.04

.065

Levels Acceptable @di}y .65 2.5 1,0 ! 1,5

Numha r of &to

2.19
4.00 h 4,96 6.5b a 8.1s 10.00 1 12.08 15,00 &

K

.004 .017 .012 .069 .186 .25 .137 .3Z.9 .40 .8.?1 1.47 1.50 .210 .577 ..65 ,483 .940 1.00 1.57 2.50 L

.008 .033 .058

.017 .059 .091

.03.? ,099 .15

15 5 10 Is 5 10 15 5 10 15 5

L

.005 .020 .035 .022 .065 .10 .157 .343 ,40 2.88 4.00 A 5.08 6,50 4 a.z9 I 0.00 h .300 .596 .65 .5, ?5 .876 .961 1.49 1.00 1.50 1.64 2.50 6 .040 .108 .15 .082 .199 .25

.011 .038 .ObJ

13.03 15.00 A

M

.008 .025 .04 .102 .215 .25 .187 .36{ .40 .959 1.50 b 1.76 2.50 1 5.21 6,50 & .345 .621 .65 ,507 .989 1.00 3.01 4.00 A

.016 .045 .065

.030 .075 .10

.05?. .120 .15

8.50 10.00 &

13.2s 1S.oo &

N

.014 .0)1 .04 .134 .2)6 .25 .235 .389 .40 .414 .65 A 1.082 1.50 1 1.92 2.50 k 3.24 4.00 A

.026 .054 ,065

.044 .081 .10

.0?2 .136 .1s

.6.91 1.00 A

S.!iz 6.50 A

8.01 10.00 &

13.60 15.00 &

0

.01s .014 .04 .0s3 .091 .10 .085 .14J .15 .153 .245 .25 .261 .40 b .453 .65 ‘ A .733 1.00 k 1.[49 1.50 ,

.032 .058 ,065

,?.01 ,?.50 ,

3.36 4.00 ,

5.67 6.50 ,

10 1$ 5

8.98 10.00 &

11.00 15.00 L

P
A

.799 1.00
b

1.Z31 1.50

2.13 2.50
&

3.52 4.00
A

5.87 6.50
a

9:22 Io.oo
&

14.07 1s.00
A

10 15 5 1,276 1.50 8 ~.59 4.00 1 9. N. 10.00 1 10 15

.023 .038 .04

.039 .064 .065

.064 .10 b

.101 .1$ A

.177 .25 1

.296 .40 A

.501 .65 A

Q

.025 .04 &

.044 .065 A

.069 .10 &

.108 .15 i

.1!38 .25 A .525 .65 A

.312 .40 b

.830 I .00 &

2.19 2.50 i

5.96 6,50 i

14.19 15.00 A

Ml AQL sad t~blo values,

q xe*pt three in the brackets, 8re in percent defectlvo.

VAf3methe flrot figura In dlraetZom o{ qrrow and corresponding number of Iotm. fa qach block tha top (Igure rofcrc to the prccedlos 5,10ts, the m5dd2* figure to tho preceding 10”lott, snd the bottom figure to the prteedlng 15 loto. “ ~ F r? s ~g

q ttlrmtd lot P rcsnt defcctivc!from the preccdins S, 10, or 1S leto it Reduced 6nspectlea IIWY ba Sr@itoted when wary atlmtiod bdow tha flpr* civm tn the tabl*; rcducod inspection for sampling PIMC mmk.d (**) la fho tlblc raquireo that tha q lot po?cent dcfoctlvo 10 eqttafto saro for the number of conteeulive lots Indicated In bracketo. la sddltlon, q other cendltlont ll for roduead Inspection, in Pmt 223 Section B. mutt be ostitfi.d. of

N1

q aih’natem of the lot parcent defectIv* are Obtained from Table B-5.

,:

sample tiaa ‘ .04 .0b5 .65 I .00 .Io z — T -. .15

Sample leOudity L.cvelo (in ercec

tepll

code Imttr 3 4 — . .346 .)73. .345 .5Z4 .309 .302 ,291 .Z95 .?bb .Z66 .245 .241 .ZZJ .Z20 .208 Z06 .191 ;,Z03 .21b .215 .Z35 ,Zbl .Z5S .Z91 .290 .Z84 .Z79 .Z7b .z71 ..?Z8 .Z48 .Zb9 .359 .344 .3)6 .331 .320 .323 .3Z3 .317 .310 .307 . 30Z 30Z ,M31 .408 .45Z .4Z5 .403 ,386 .371 .372 .369. .364 .363 .156 .348 .345 .341 .338 .318 .Z98 — ,Z84 .Z17 ,27) .?70 ,Z94 .Jz) .Z9S .Zlb .262 .255 .251 ..?49 “,245
.24z

Oise

1.50 —

34 .319 ,399 .4JZ .47Z .108 .Z80
.Zbl

c 5 7 .Zb6 .248 .,215 .ZZ9 .Zzs ,22J .Zzo ‘.Z19 .Z14 .Zll ,ZZ7 ,232 .ZJZ .236 .238 .Z42 .248 10
.2Z4

,)53 .374

.S28 .s11 .489 .4b0 .442 .43Z .4z6 .4Z3 .416 .416 .408 .399 .393 )81 .386

D ,Z53 .23s
,Zzz

I
.214 .18?. .I.521 .18J .180 .119 .176 .198 .190 — .207 —. ,ZOJ .199 ,197 ,191 .194 .189 .la7 .185 .183 — .Ilb .112 .1613
.lb6

E

F 15 Zo Z5 30 .173 .170 .Z08 .169 .166 ,lb2 .160 .1s0 .Ibl .163
.lb8

G .177 .114 ,185 .192 .Zlo .189 .IE.5 .184 ,181 .179 .175 .175 .201 .183 .182 .178 .174 .172 ,170 .190 .197 .193 ,Zlz .203 .z06 .z16

.19s .202 .211

H

I

.181

m m J5 40 50 75

J

K

L

M

N

0

100

P

150

.Z31 — .Z30

.2S3 — .Z49

L

Q

200

.151

The MSD msy b, obtalmdby muh’iplylmg the factor F by the diNereace balwoen the uppr spaclflc~tlcm Ilmil U and lower spee5fictiian limit L Tha formula lt MSD = F{ U-L). The MSD s+met m I gulda for the magnitud- of the qoiimatc of let otaad~rd deviation whtnu81a[ plmc for th* double specification Ilmh came, bm.td en the eatlmat. of 108ctandard davlatlea of umbown v~riability. The estimua of lot otaadard deviation, if it Ic IF-o Ihm the MSD, helps 10 imure, but doe- not uuar MIee, Ipt acceptability. of F. For reduced lnopectlen. find

NOTE: Therm Is s corr*opondlng acccptablllty constud In Tikle 6.1 for qachvdue tbmaccc~tabil!ty commnt of Table B-Z In Table B-1 and u,e the corresponding vahe of ~.

Mx~14 11 Juno 10S7 APP@Du ~efinitkons B

,

5!!!!9!
m

Red Sample
X bsr qix. for q .i=~le

Definition lot. mean Of .mup3m me.surememm i~~m

x .

~P1. M==. q .Ixl.qlc lot.

Arithmetic

E.tinute cd lot ctandmrd deviation- Standard deviation of qun insle lot. (See &xmpIe* iaSect40n ple measurement [mm a q 33. ) Upp=r Lower The Q qub U Q qub L p sub U

u
L k

q pecffic~tiOm limit. q pecificalfiOn limit.
eon. tant @ven with Table i~ Table. B-5. B- 1 and B-2.

qcceptability

t
I I

Qu QL

Quality Ouality

index for u.. index for u..

with Treble B-5. .. above below U from L from

!
I

%
‘L

Sample q .tirnale Table B- 1.. Sampl. estimate Table B-S. Total .ampl.

of the lot percent defece of the 101 percent

p s“b L

defective

P I ,, M

e.timate

of the lot percent percent defective and B-4.

defective for .-pie

P = PU + P~ eatinutea

Maximum q llowable ~iven in Table. B-3 M sub U

%

Mtimum allowmblc Pcrceat defective q bove U given B-3 and B-4. (For uoe when differeot AOL valuea L are specified. ]

i. Table. for U and

ML

M sub L

Maximum Alowable percexaf dcfecfive below L given in TableB-3 and B-4. (For we when differenl AQL vtiuea for U & L q re #pacified. ) Bamp3e q intimate of the proceem estinuted procea q qve rage. percemf defectivw i.e., the

P

p bar

% Pf, T 1’
F

p bar p b-r

sub U
qub L

Tbe estimated proce. m8varage far u The eslimatad procenm sv.rqe

upper specification

limit. Mmft.

for q 10W* r

q pacification

The maximum number of eattnnted prece. s sveragam wbkb BlverI in Table B-6. (For u.e in determay q xceed tb#AQL pplication O! ti~hteaed inspection. ) mining q A lactez ua.d in d.te rmim.i~ the ~um (hLSD). The F valu=s are given In Table Greater ham than Standard B-8. Deviation

i I

> <

than

I

.x

sum of Ml

MZL-STD-414 11 JufM2 19s9

SEC’ITON VARIABILITY

c METBOD

UNSNOW7J-3LMJGE

Part 1 sZNG LE SPECIFICATION Cl. SASIPLUJG PLAN FOR SPECIP3CATZON LDdIT SINGLE
UT

I

I

‘This part d the SUmZ. rd describes the prO.y@ur=~ fOr. u*e wilh PlaM for s Si=ule rep..c1ficati0n knit whcri variability O{ cbe lot with rempecl 10 the qtmlily cbarseteri. tic M u.knowm and the ZWC nmtlmd i. used. The -cceptability criteric.ti i# give= in lwo equivalent form.. Th. mc arc identified as Fo,rm 1 d Form Z.

CZ.2.2 Accep-ility Comstit. The acceptability COa.t-t k. correspo~w tithe sunple mi. e mentioned in paragraph CZ. Z. 1. is indicated in the column of the master t.ble corre. poading m the applicable AQL value. Table C-1 i. enmred lrom the 10P lo. nc.r rn.1 impection qmd from th. bottom for tightened inspection. Sampling plans for reduced inspection a*e provided in Treble C-Z. C3. WT-BY-L&fT ACCEPTA=ITY PROZ CEDURES WffEN FORM 1 IS USED

use of SUnpliag Plan.. To deterC1.1 mine whether the. 10C meet, tbe ACCCptability criterion wJth respect to a particu. lar quality characteristic •~d AQL vaZue. amplih~ PIq hall be treed the .“pplic~ble q in .ccordance with the provisions of Section A, General Demcripciou of Sampling pl.m.. b the... in thi. part of the Sc.ndard.
Cl.2 Drawing of Sarnp3e.. AN .armples sbdl

C3. 1 AccepUbiZity Criterion. The degree of coaormance of a quazmy characteristic :imit with re8pect to q #ingle specification qhaZl be judged by the quantity (u-X)/R or {X- f.)lsi.

:/::1
be draw. m accordance wltb paragr@iA7.2. Cl.3 Determination of Sample Size Code Letter. T he sample sme cod e letter •hd~ =ected from Table A-2 in q ccordance with par~raph A7. 1. CZ SELECT3NG THE wHEN FORM 1 ls SAMPLINO USED PLAN

-i:

‘iw%”%(ilwz
Iimi!

I

depending on whether the specification is = upper or q lower lirnis. where U L X ~ im the is fhe is the i. the upper specification limit. lower specification IimIt. sample mean, and qverage range of the #ample.

Samplin~ Tmblec. The matter C* co r DlaM b- ed on varia peef.fieation blIity u---n for ~ single q Tables limit wbenuakg & raag. unfkodaro C-1 qnd C-Z. Tabia C-1 b .u..d for normal q nd ti~htened inspecfi.m uuf Table C-2
for reduced izupoction.

CZ.1 Master qmplmfi tal

CZ.Z Obtining the SunptinS P3an. The q X q -d .unp3im~ plain ccmsastm . .unple O{ f The q m q sociated accepIAbUiv Ctaut. .unplimg plain ia obtain.d from Maater Table C-1 or C-Z. size CZ. Z.1 Sam le Si=e. Tbe sample .homa ,n 1 e nla’ter table CC4rrm#p0~ ~ mple .1== e-de Iater. each q a it tO

3n this Standaqd. K ia the average range of ,.bKrmip ranges. 32ach d die subSro.p. consists of 5 mea*u*emenl.. except for tbOa* unple qke 3, 4, or 7 in which plans with q kgroup q im 19 fh sum as i.h u** fbe q sanw3e sise. Zm wanpufiq K 338= Ord=r Of c=u*t b= Ihc sample meam=rem=iits u .-de rer.-iimd. Smkgrwpa af cnumcrmive nn.. urements must ba formed d the range of .xh .ubgroup obtalwd. X is the qweraae of bgroup nngea. tbe individnaZ q C3. 3 AeceptsbIlltY Crite Finn. compare the q.mtity (u - m (X- L1 ‘Kwithtbe qbilitv cor.8cant LOrZf (u-XI/X or (X- “C’%% L) equal “to or Creater than k. the lot meats tbe q.ccptab13icy c rito rloix u (u-X)/R or (X- 2.)1X ia less tbm k or m.’afiva. tbea the lot deem not met the .c..ptability e ritoricm.
pl~o

ampllng 1Se. Appendix C for definitions of afl cymbolo us id b tbe q uak90wm- raaga mmbod. xunple of tbi. procedure. %we f+ample C-1 f.r q cmIIp3eto q

bac.d

on varIablltty

al

._ . ..-

I
3A1L-m-414 11 June 1957 CL f3uMM~Y FOR OP3IRATION SNAP LANG PLAN WHEN FORM USED OF 1 LS CO. f.CfT-BY-LOT ACCEPTABI w P% CEDU3432S WNEN FOR3A 2 3S USED c6. 1 AcceptabUity Criteric.n. The degree of conformance of q qutilty characteristic with respeet CC.q q imgle .pecificstimi limit .hafl be judged by tbc p.r. mit of notlccmfomnirt~ p.od. ct out. ide the upper er lower specific aticm limit. The percentage of rmnconforming product i. estimated by emtering Table C-5 with the quality iadex and the #ample qi*e. c6. ?. Computation c.f Quality Index. The quality izidex Or, . (U- ZC)CIR hall be com puted “if the sp%cificaticm limit i. an IIppcr limit U, O= QL = (X- L)c/K if it is a lower limit L. Tbe q“amitie., X q nd R, q re the sample mean and qverage ran~e of tbe sample, respectively. The compmatioa of K i. qxplairted in paragraph C3.2. The facbar c is provided in Master Tabl=s C- 3 an& C-4 corresponding to the .unple size code letter. Defective in bt. C6.3 fhtimate of Percent The quditv of a 1.s1 hall be expre.. ed by PU. the =.timated percent de fe~tive in the limit, or lot q bov= the upper specification p.r. =ntd=fectiv= beloby PL. the q .ti-@d pccificatiort lirnii. The q .tima~ed thc lower q Percent de f=cti~. PU O, PL i. mbt~im=d by .mteri+j Table C-5 with Qu or QL .nd the q pp. Opri~t= q AMPlt qi*e. C6.4 Acceptability Criterion. Compare the e.timated 1 percent defective PU or pL with m the m~imutn aZlew.hle perceM defective M. U .pU or pL is equml to or le.. Uun M. cceptmbitity criterion, if the lot meet. the’ q pu or pL is grekter than M or U QU Or QL i~ negative. then the lot does not meet the acceptability criterion. Cl. SUMMARY OF OPERATTON OF SAMPLING PLAN WHEN FOR3d 2 IS USED
qun’unar 3s9

8tepm umun.riz. Th$ following cedure. fn be followed:

the pro-

ample .i, c cede let(1) Determine the q ter from Table A-Z byu. iq the 101.ize and the in. pecti.an level. (2) Obtain plan from Mater or C-Z by .elecfin~ the sample the acceptability ccm.taat k. Table C-1
qize n and

(3) select *1 random the .;rnpl. of m “nit. from the lot: in. pect .nd record the meamurernenx of the quality charactari. tic for q=ch uait of the sample. (4) Compute the .;rnple mean X and the range of the .arnple ~, .md q l.o compute the quantity (u- X)IR for am upper qpe. ificatiomlirnit V or thequamtity (X- L)/R for . lower specification limit L.
qvera~e

(u-X)/R c.r (X. L)/R i. equal to or greater thas k, the lot meet. cceptability criteriow if (u. X)/11 or the q (X- L)llf i. I.*9 than k or negative, then the cceptability criterion. lot doe. not meet the q
(5) ff th= quantity

C5. C5.1

SELECTING THE SAMPLING WHEN FOR64 2 3S USED

PLAN

Ma#ler Samplinj? Table.. The ma. ter for plana ba. ed o= varisbil ity unka&n for a single specification litit when u.iq the rang. method ar= Taidec C- 3 q nd C-4 of Part IL Table C-3 is used for nc.n’nal and tightened inspection qnd Table C-4 for reduced inmpectimi.

qamplmx table.

the Sampltng C5. Z Obtaininz Pllrl. Th q sampling ptan con. i.t~ of m .UIWI]e .ize and an aooo~ik.d maximum a310w&le percent amplfq ptam ic obtdncd def qctive . The q from Ma.t=r Table C-3 or c-4.

Tha fellowinK ,tep~ ptwedures to be fallowed:

the

C5. Z.Z Maxd8mtm AIIc.wable Pereent Defective. The madrnwn allowable percemt de=ive M for s-pie eotim.tes corres~ndtied in ing 10 tbe sample qiz= me~tie paragraph C5.Z.1 i. indicated tn tbe COIUMII Of the rnmms.r tabte correa pending to the applicable AfZL value. Table C-3 ii entered from lb. top f-r ~orrnal iaapectian mad from the botfom for ti~htened in. pecticm. SunP~ Plaru for reduced inspecticm are pr.a vided in Table C-4. 3See 3cxAmple c-z tar a complete example

(1) Demwime ihe -ample .ise code lel from Table A-S ~u~inn the lot dae and the iriapecttosi Iov@l.
ter

(Z) Obtmi. plan from t.mater Iable C-3 or C-4 by .electirg the -ample sk= n. the factor c, and tbe maximum qllowable pw. ceat defective M. (3) Select qt random the sample of n unit. {ram the 10C inopect and record the meamm.mem al the quazity characteristic on each nut; of the 8sMple.

of thim pru..dur.. 62

MI L-sin-414 11 June 1057 unple me-m X 4 (4) timpute the q ample K. av.ra~c raaSe of the q the (7) Uthe q .timaled lot pcrcentdelective PU or PL i. eqtml to or Ie*. thaa the mdmum azlowable percent defective M. 3he lot meets the acceptability criterion; it PU or pL img.eater than M or U Ou or O’i.%=_~ -i”.. them the lot doe. W1 meet the q cceptqbiliw criterion.

I

the q.=lity “ index QU = (5) Comp@= (U-X)c/K M the upper speckfieation limit U iripecified, or QL = (X- L)CIK i3 the lower .pccificatirm limit L ia .pecif ied.

10s m.rc.r.. 161Decermirie the q .limaled .-, ——— defective PU or pi. from Table C- 5.-

~PLJl Example Single

c-1

of Ca3culati0n* Limit-Form 1

Specification

Variability EXarnple

Unknown - Range Method

The lower .pecifie.tion limit for electrical r.miataace of q certtim qlectricti comInspection ponent is 620 ohm.. A lot of 100 item. is submitted for inspection. Level IV, normal inspection, tith AOL = .4% i. to be used. From Tablet A-2 ud C- 1 it i. ..en that a sample of size 10 i. required. Suppose that value. of the’ sample resistances in the order reading from left to right q re . . follow-: 643. 651, 67o, 673, and compliance with the 619, 641, 627. 650, (R, = 658 - 619 = 39) 538, 650, (Rz = 673 - 638 = 15) i. to be determined. EXP1anatiom

qccept ability criterion

.

Line — 1 .? 3 4 5 6 7 8 Speckfieatio. The qu~tl~ Accep3AZZity Acceptability with k The lot doe. = Sample Site:

3nf. rrn.ti.. n

Needed

Value

Obtained 10

Sum 01 Measurements: Sample Mean X: XXI.

I X

647o 647 37 6470/10 (39+35)/2

Limit (LOwer~ (X- L)/It

L

620

.7s0 k Compmm (X- L)/l! .710< .811 .811

(647-620)/37 &q &e

Camsmt:
Criterion

Tabla’ C-1 ParaLc3.3

not meet tbe

qcceptability

criterion.

.irIce (X- k.)f~

is 1c99 than k. kn i-

limit U im give., then compute tb. quantity (u-Xl/X U q .imK1e .PP=r .Pecificati.. line 6 q ad cmmpar= it with k the lot meet. the acceptabUitY criteriom, if (U- rnf~ equal 10 Or greater [ham k.

.-—

MIL-ST13-414 11 June 1957 EXAMPLS c-2

12xample 01 Calculation. Single Specification Variability Limit-Form Z

U.knowmi - Rang.

Method

Ex. mple

comA lo.ver specification limit for electrical re. i.tan.e of q certain electrical Zaspection ponent i. 620 duns. A 10 of 100 item. i. submitl.d I for inspection. Level lV. normal in. Dection. wish AQL - .4% i. m be used. From Table. A-2 mad Suppo. e lh. v*Iu=. Of the C- 1 is is seen thal ; sunple of qizc 10 i. required. sample reaiatance. in the order readimg from left m. right are as follows: 643. 651, 619. 627. 6S8. (R, = 658 - 619 = 39) 670. 673. 641. 638, 650. (R2 = 673 - 638 = 35)
qnd compliance

with the acceptability Needed

criterioo

i. 10 be determined. Value Obtained 10

Line — I z 3 4 5 6 7 8 9 10 Sample Size:

Inlorrnati.n m

Sum of Measurememtm: sample Average Factor c Limit M,.. x: ZXJ.

IX

6470 647 of subgroup. 37 2.405 6470110 (39.3S)12 See Table C-?

Range ~:

XRlne.

Sp=. ific*tiO. Q.a2ity ‘ct. Max. ‘f Zndex bt

(~we.

):

L

620 1.76 2.54S (647-620)2.405/37 See Table See Table See Para. than M. C-5 C-3 C6.4

C3L = IX- L)CIX “f.’ PL De f.: M pL with M criterion.

‘ercent

Allowable

PerceIIt Criterion:

1.14% 2.54%>
since pL

Acceptability The jot doe.

Compare

1.14%

mat meet the acceptability

is gr=ate.

-E:

U . .ingl. upper specification limit u i. Rive., th=. compute the quaii3y frufax QU ~ fU-X)c/3! in line 7 d obtain the eotimate of lot percent defe.tive PU. -mpr= PU cceptability criterion, U p“ ia q qu~ io or i’z*. ~hn M. with M: the let meet. the q

M

. .. ——.

_.

TABLE RmIrn Method

C-1

Master Ttble far Normat and Tightened Zn$ptctlon for Plans Based an V~riabIllty unknown (Single Specification Llmlt - rarm I I ml in pectiml

-

1 15,00 T

sample t 1se code letter K 2.50 Y.587 k

B

v
.s’38 — .!325 — .498 .465 .431 .405 .307 .450 .565 .SZ5 .65o .684 .7,?3

. 50?,
.364 .)52 .336 .424

.401

.296 .Z?b — ,2?2 .266 .~41

.178 .116 .184 .189 ..?5?.

c

D

E

F

.519
.610 .647 .654 — .658

G

.516 .371 .577 .581

.452 .484 .490

.360 .398 .403 — .494
.406

.216 .105

H

1

J

.730 — ,734 .746 .754 — .1b8 .780

,310 .~lj .668 .616 — .689 .701 .591 .598 .s03 .510 .s15 .421 — .43Z .321 .327

K

L

M

+ .610
,621

.!21 .530

.336 .441 .34s

24

0’

.111 —
.7z6 1,,06 I .996 .932 .87o

,631 .791 — .807 .644 --1-.646

,539 .552 .5s3

P 1.21 I .063 I .10 .15 1,21 1,16 1.)2 .25

.449 — .460 .46z — 15.00 .309 — 2.90 ,40 .65 1.00 1.50 I I Accepmble Oualify Levels (tlgl med .728 — 4.00 6.50 + Impec m) — S* well as k value. When sunplt 10,0[

.3SB x .364 #2

Q

230

[

4

AU AC2Lv~ueo qre in gercent defeciivo. amplln$ plan below qrrew, that {s, both sample -lie ,“:: tir,t & a q, 9wory Item 2a tha lot mnmtbn ln#pected.

#its equa.loor qxceed@ let

i$! 4s

‘i

-—

.—

TABLE :6 Mantar Table for Reduced Tnnpeclion for Plan~ Based on VariabLllty Unknown (Siogle SpeciflcalIon Llmi!-Form i} :ept&l J 1.50 6,S0 k k .178 .178 ,178 .296 .216 .663 .61J .569 ,703 .650 ,650 .684 .723 .723 .179 .707 .E43 .E4e .E85 .94.9 ,962 .899 .791 — .826 .8J9 — I.oz .130 .734 — .768 .7E0 — .579 I ,50? I .424 .703 .738 .179 — .s2s .614 .565 .498 I .43, 1,.3s2 .27?. .266 .141. .341 .178 .176 .184 .189 .252 .2s2 ,610 5J6 ,452 .360 .276 ,647 .s71 .404 .398 .30$ .196 .296 10.00 k .581 ,502 ,401 k k 2.50 4.00 7 .

C-2

Raa[e

Mtthod

Sample iiaa code latter .15 -i-

I

Sarnpls q{SC

B

3

EEE
* *
,296

c

3

--1-I
.861 .8[[ — .75s ,7s5 .192 .B35 .815 .811 .850 .896 — .896 .904 .900 . .916 ..963 .90J .951 .951 ,959 .964 1.00 9 1.10 1.01 1.10 1.10 1.11 1,07 I ,0.? 1.o6 1.02 1.05 ;.01 1.0s

D

3

E

1

;

4

G

5

33

7

1

10

J .958

10

K

15

L.

25

T
1.06 1.08

M

23

+

N

JO

-u-.647

,s11

.484

.398

.10s

.654

.371

.490

.40~

.Jlo

,658

.5s1

.494

.406 .6.99 .610 .521 .4J2 .701 .621 .5)0 .441

.JIJ . JJ6 ,34s

P 1.17 I.IJ

60 1.16 1.11

Q

I

8s

E

M

i

xf~14 11 Jfffw 19s? Parf 1I DOUBLE SPECIFKATION Lf3d3T

C8.

SAAfPLDfG PLAN POR SPECIFICATION LtMIT

DOUBLE

This part Of the Sf-rd describes the procedures for tue with plain [or q double cpecificafioa Iimft when variabttify Of the let with respect to tbe quality characteristic ia u.knc. wm q nd the range method is umed.
cA. 1 u.. a{ —— .. —”.Plan.. .—-— determine -------. S-.11.. ...—— Tc, ~hethe r the 8.x meet. tbc .C eept.bility c rite rion *ith rcapeet to a partiastar quality char.eteristic .~d AQL. vtiue(. ), the .ppli ampliag F.lao q U be used in accordcabl. q atxe with the pre. i.imm of Section A, Genq wJ eral De.eription d SunplinS PIMa, the. e in thi. part of the Staadard.

mmtimum q llowable ~rcemt defectively ML for the lower Iindt. ad by MU for the upper limit. If ~ AOL i8 88sinmd to bofh limits c.mbiaed. designate tbc -urn aflo.able percemtdelecfiveby M. Table C-3 is entered tram fhe cop for aornul inspection and from tbe bottma for tAIhtamd inspection. Samq re pr. plim8 P1W9 .Sor roduce!ttmpaction — . vialed iii Table G-4. C1O. DRAW7NG
aace

OF SAMPLES
be q lected

sample. .fmfl with ~raarapb ;~~OT-~;~O

in

q ccord -

A7. Z. T ACCEPTAB1_

C1l.

C9. .N1

SE LECITNG unplhg A q be .clectcd
,

THE

SAMPLING

PLAN

plaa for q ach AQI. .tiue from Table C- 3 or C-4 q m
.. .... ... . . .

10 UOU..

-..

C9. 1 Determination of Sunple Size Code .s. code letter =hfi ~. Th q .unple b. q elected from Table A-Z in accord-ee with paragra~ A7.1. C9. Z hta-tor SamIIlimX Tabla-. The master munnlinn tablem [or mlam hmed On variabil ity ~fca~wu for a d~ble specification limit wbeo uming the range rn.tbod q re Tablea C-3 q nd C-4. Tsble C-3 is used for norrnaf and tightened im.pectiom and Table C-4 for ra duced Lrup.ccfion. C9. 3 Obtaintng Sampling Plan. A q sM@in4 plm Comai,ts of q qampfe sise the sl qoctatad maximum attowablo percent dafac pplied in tiw-e(. ). The cunplin3 plan to be q kn#pect&a stmfl be ~btied from Maater Table c-3 or c-4. C9.3. I Sun .bownbiitdl,.. unple each q 10 Si=e.
qice

Cl 1.1 Acceptability Criterion. The degree of c.nfo~aracteristi. with re. peel to . doub_fe .~cific. tion limit hall be Judg.d by tbc percent ei wnco. ICr.rni.g producL The per.enta~e of no.Cwderming product is estimated by entering Table C-5 with the quafity imd=x q nd the ‘ample :Ue. Cf 1.2 timputatioa of Ouality bdicei. The qualify inchcea Q {u .C xl [R and QL= (X- L)c/R cbdl be !o&uted. -here limit, u im the upper specification limit, L ia the lower .peeificalion c is q iacfor provided in Tables C-3 C-4, x i. fbe q mple mean, and u i- the qverage range of the sample.

and

The

q antple sise
.Orr..pmdiag

m Is to

code

letfer.

C9. 3.2 Maximum Allowable Percent DeIe c five. The maximum-t allowable PC rcrnnt dee.tirnatec of percent ~tive for cunple
def q etiv. for the lower, qpsr, or botb
q p.c -

b tbh Standard. R is the >verage rmge of bsroup rauKc& ~cb of tie sti#*0Up9 tba q ex’c=pt for those consimt. of 5 meuurement$. rnple qis. 3, 4, or 7 in which pduu dtb q ubaro.p qis. h th= q ame q e the case flu q q ~e. 3a computing R, the Order Of s-pfa fbe .unple meamtrernemm q s nude mat be ratahad. subgroup of co-ecutive meu urementi mnot be formed and tbe range of ubgreup obtahed. K ia the q -erase etch q qubgroup ranges. of the individud Cf 1.3 Percent Defective In the Lint. The qualify of q lot qhall be exprew~ed SrImrmof the lot ~rc.nt dof=cfi.=. Its •c~~** W~ be dosipawed bY P L, PUO 0? P. The q gtiwta PU iadic*eD contmrmca ~tb respect to tbe UPPG r spockfieatien Mnait. p with resp.ef to the lower .peckfi.atim lAU. P fOr b o t h spaekfieation limlta combined. TIM 67

.

=.cirnatc. p.Laad pU q baJl be determined by entering Table C-5. r.mpacti..l~ ‘iJb Qt. q nd Qu q nd the q ampl* q i=.. The =~tim~te ddin~ the co rres p shall he dew rmined by q pcmdimg estimated percent defective. PL amd PU found iii the table. C12. ACCEPTAB1~ CRZTER20N SUMMARY FOR 0PE2tAlTUN SAMPLING PLANS AND OF
q nd

Cl 2.1 O!ie AQt- value for both Upper b-e r + Cit,catmm Limit Cmnbmed.

CIZ. Z.1 A.c=ptabitity Critdria. 5 timp8re the estimated lot Per.cenc de fcctive~ Pt. ~ P with the corresponding maximum aTiowq nd Mu q lso 8e Ie percent defective M compar. p . pL + Pu with tk e larcer Of ML q nd Mu. 2f pL ia equal to or 1=6s ~h~ Mb PU is equal to or lees than b4u. d P is equal to or 1=0s than the larger of btL ~ c ritcri=, Mu. Ihc lot meet8 the *cceplability otheruase.7be lot does not meet the scce Pl ability criteria. 33 q ither QL or OU or both q re negative, then the lot does not meet the aeceptabitity c riteri& Cl 2.2.2 “Summary far O~~atic.n -f ~mPliWf PJan. & ~.ses m.h.re q cliffere.t AQL value ~tmblished (or the upper qnd k.wcr .Pec ificatio” limit fc.r a sim~ie quality characterthe istic, the fol Jmnimg steps qm-.mari=e procedures to be used: (1 I Dcternai~e letter from Table A-2 and inspection Jewel. the sample ai.e &d. by using the lot q i=c

Cl 2.1.1 Acceptability Criterion. 4 Compare P . p“ + che eetimamd lot percent delectlve q l10-abl* Prc=nt PL -ilh the maximum dcfcc:ive M. U p is equal to or less than M. cceptability criterion, if $h. lot meets the q P i. e,e*t=, th*n MOr if either QU ‘r ‘Lor both .re negative, Ihenthe Jot does not meet cceptability criterion. the q C12.1.2 Summary for Operation of Sampliag Plain In came. where q .ingle AQL value 1. =blished forth. um~er and lower s~ecifi i=gle quality C~t;ori limit cornbin;~ for a q .haracleristic. the following steps summa=i.. lh. procedure. to be used: . ll)”Dctcrminc the sample si. ecode letter from T.ble A-2 by using ‘the Jot sic and the in, pe. tie. level. (2} Select plan from Maater Table C-3 or C-4. Obtain the sample ttie n. th= factor c, and the maximum mfloumble percent defective M. 13) n unit. from mea. urem.. or. q .ch unit average ample of Select m random, the q the lot; respect and record tbe t of the quality characteristic of the sample.
q nd

(2) Select the sampJitig plan from Master Table C-3 or C-4. Oblain the ampthe m~mum le size K.. the factor c. -d q llowabJe percent defective. MU and ML. corre. pondi=g to AOL VaIUeS fo, the uPP=r q nd lower Specific atiec. limit., respectively.
ample of (3) Select q t random lhe q from the 10C inspect and record the measurement or the quality characteristic on each unil in the .UTIPIC. a utit.

q.er.~e

ample mea. {4) Ckmpute the q rams-k of tbe q unpJe R.

X

q .d

(5) Compute the qualiJy imdicec QfJ . (u- X)c/R. and OL =(X-L)CfU. (6) Determine the q .timm~ed lot percent defective. pU amd pL. corresponding to the p.r. em defective. above the upper and below the lower specificticw limitt. AJSO determine lbe combined percent detectiV= p - ~ + pL. (7) 32atl three of the lollowlris dbt~ons: (a) PU is =q-~ ~u. MLl.rger tO Or lEM tbu (b) P,. ia aqtml co or I=*w th*m {c) p is equal toor Jesmtin of ML and Mu. the cos-

(4) Compute the sample mean X rmge of tbe q ample R.

IS) -mpt tbe quality indite. . IU. X)c/K arid QL, F (X. L)C/R. = y-fi=nt

OU

(6) Determim the emtimtiad lot d= f=ctiv= P * PU + pL frOm T~bl=

(7) 2f the eotinuted lot percent defective pi. equal to erlem. thui the maximum d20wable percent defective M. fbe 10Jmeets the acceptability criterion, if p ia graatar lIIM M or U either Ou or QL Or both am negative, then the lot doe. awt meet tbe acceptability trite rion. C#w.~r Different
4tie ~pk

AOL
for

va.luet for Upper
LamIL. . campl,ete

a~d
d tbi.

p8cuLcmU0m

fh lot m.mtm tbe accepfAbi21ty criteria; otherdse the lot hew not meet the scc=ptability criteria. If either Oz., or QU or fba. *h. lot dw* tit UI**C both q re =gative. the acceptability criteria. of Ma proc.dure. PrO=~ur*.

q re qaticfied.

SW

*PI=

c.4

C-3

for . =om**t*

exunpZe

q xample

-. -—..

. .

MIL-STD4M llJunelDS7 EXAUPIX Example Double Variability One AQL C-3

of Calculations Ltrnit Method Combined

Specification

Unknown and

- Aver age Rsnge
Lower

Value for Both Upper

Specification. Limit

peclficstioni [or elec:riea2 recisfaace -f a certaiu electrical cOrnponeu5 * The q is qibmitt.d for In*petiiar& fmspecfi.. Uwe2 65o.o q 30 ohm.. A lot of 100 item. IV, normal intpectiea, wftb AOL . .4% ii to be used. From Tuble. A-2 and C-3 it of size 10 1. required. Suppose the vafuea of the q mnp2e is q eer. that q samfle resistance in the order reading frm-n left to ri~ht are q s follows: 643, 651, 619, 627, 65B. (Rl 67o. 673. 64). 630, 65o. (R2 and compliance with the acceptability criterion . 658 - 619. = 39) s 673 - 638 c 35) i. m be determined. Obtti~md 10 xx 6470 647 37 .?.405 680 fawer Ctudity Ouality Specification Index Zndex: Ltmit: L c/R 620 2.15 1.76 u: L (680 -64Y)z.405/37 (647-620)2.405/37 See Table see Tsble .s5s C-5 C-5 6470/10 (39 + 35)/2 See Table C-3 Zcxpla.atien

*.
1 2 3 4 5 6 7 8 9 10 11 Sunpl.

Znf.armatiom Ne.ded Sise: .

V .lu.

sum of Mea. u,. m.clt.: .%mpl.
U...

X:

XXI.

Cfu . (U-X)

C3L = IX- L)e/11

~-t.

of

Lut p--t
Percent

D=f. q bDef. baleu

w
pL

.35s ..2.54% : 2.89% 1.14%

Est. of 3A

I

12 13 14

Tota2 Est. Parcant Def. h fak Max. A210wable Acceptab12ify
Pff + PL titb

P = Pu + PL M
p -

+ 2.54s C-S

Percent

Def.:

SOe Table See P*ra. CIZ.1.Z(7) + pL 1~ greater ~

Crtterloa: 64

Carnpare

2.e98

>1.14s

Tbe lot dtm. nut meet

tbe

q cceptabifify

crilerlOn.

since

p = p“

M.

de

xm.-sTD-4l4 11 Jute 1957

I
I ~ph

EXAMPLE

c+

of Cakuhuom
Specfficatlom LimI1

Doub3e

I
Different

V.riab33ity AQL Values

Unknown

- ~we

ra~e

Range Method Specification Limit-

for Upper

and Lwer

I

ZZ.unple

The q pecifi.aticm. f.r electrical reaiscance of q certain electrical cmnpone~t iZn.pectimi 3AV.1 650.0 q 30 darns. A J*1 of 100 items im q ubmitted for inspection IV, rmrmmz impecziou, vifb AQ3. . 2.5$ far the upper and AQL E 1% far tbc lower specification limit i. Ie be used. From Tablet A-z and C-3 it i. q ce= that q .am P1. of size 10 is reauired. SuPrmse the values of the sample resistances in the irder reading fmm left to right “a-re a. follows: 643. 651. 619, 627, 658. (R, = 6S8 - 619 = 39) 670, 673, 641, 638. 650, (Rz = 673 - 638 = 35) and compliance with the

q cceptability

c*iteria

i. co be determined. Obtained 10

Intc.rrnation Sample Six.: n

Needed

Value

Sum of Me.. urcment.: 3 4 5 6 7 .%rnplc Mean X:

1X

647o 647 37 2.405 6470/10 (39 + 351/2 See Table C-3

IXf.
~:

Average
Factor Wp=r kwer c

Z4.nge

X3tlno. of .ubgroups

specificatio~ Specification

Limit: Limit:

U L c/R /R FU PL

680 620 Z.15 1.76 .35% 2.s4%
2.89% 1.42s 3.23%

I
I

8 9 10 11 lZ 13 14

0ua2ity index OuaIity fndex:

Qu = (u-X) QL = fX-L).

(680-647)2.405137 (647-620)2.405137 See Table See Table C-5 C-5

~s~. Of ~t ~.t. Tad ‘=f kt

Perce=: p=c.mt

Dcf. =bOv= u: D=f. belOw Del. in tit: Def. Def. fA

Ems. Per.emt

p = PU + PL
q bove

.3s% + 2.54% S.. Table C- 3 C-3

MAX. A130wab1= Percent A330wabla Percent

U: Mu 3A M’

below

See Table

I

15

Acceptability

Criteria:

(a) CDmpmre PU with Mu (b) Compare PL with ML (c) ~t~p~ue p

.3s% <7.42% 2.54s 2.898 . 3.Z3U <7.42s

See Pars. clz.z.z(7)(d See Para. C12.Z. Z(7)lb) See Pars. CIZ.Z.Z(7)(C)

cceptability The 10t rtmetm ttm q MfJ. pL<M~uldp <Mu.

criter&,

slats

15(-).

(b) and (cJ

q re

satisfied;

i.e..

PU <

.

.

,______

———— .. —_. —

.

Rtrme Mcihc.d TABLE lIA.,w. ‘“””’---” C-3

Mamer Tbbl. fer Nermal .nd Tlthtencd fnsmctionf.r Plan. B.nedmv..i.hlltt.. ndf;r Form Z-Single ~peciflc”~fion Limit; (Double Speclficatlon ~lmlt q 4cceptable C mlity Levels (normal in#pectlon] fa:to? MMM M M Z6.94 lfI.86 .04 4.00 M 1 .06S .10

Sumplc *IS* cede Icller .25 .40 .65 1.00 1.50 Z.50

Ssmple *11*

mZE-1

10.00

1s.00

T
\b.45 ‘ 22.S6 14.47 12,]s 10.79

M

M

MM

M

M

B .7.59 ~vv z.a34 t.sl 5.50 10.91 2.474 1.42 ‘3.44 9.90 2.8)0 .89 I .9q 8.47 2.405 .58 1.14 Z.05 3.Z3 4.77 LJ79 .061 .786 1.]0 Z.lo .125 .5o6 .827 1.27 (.95 Z,8Z .147 .53? .856 .883 .842 .818 .1.51 .755 .718 .65S .43Z — .23 — parcant dafactlve. .661 .40 1.25 1.16 I.lz 1.06 .972 .q76 .65 ,ceeptable (3 1.Z5 1.31 1.98 1,B8 1,60 1.74 1.61 1.58 1.46 1.z9 1.q6 .564 .539 .391 .375 .)81 .s42 — .356 .504 .493 .240 .366 ,?.81 2.82 2.69 Z.b3 2.41 2.37 Z.zs 1.0s .214 ,>36 Z.358 2.353 2.349 .lbS .261 .232 .Zbl .244 .136 .2s3 .ZJ — .430 3.11 4.44 7.42 v .28 3.46 5.JZ 5.93

3— G

31.6q

40,47

c

4

29.43

3b,90

D

5

ZO.Z7 26.S9 11,s4 I 5.4q

33.95

E

7

2).s0

30.66

r

10

B I
6.76 9.76 5.98 8.65 14.09 12. s9 5.88 s. 50 12.36 5.85 8,42 12,24 5.61 0.11 11,04 S.47 7.91 12.57 5,17 1.s4 11.10 4.q7 1.17 10,73 4.76 6,99 10.37 4.47 6.60 9.89 I 4.461 6.511 9.!34

G

15 3.96

T I
21.06 2?.90 19.36’ 2%92 17.40 23,79 17.19 23.41 17.03 z3. zi 16.55 22.38 16.20 +?.2.26 I $.64 ,?1.63 15.11 21.0$ t4.14 20.31 14.i5 19.88

4 w

34

2s

iiir!t
3.q2 3.90 3.73 3.64 3.44 3.30 3.14 2.93 1.471 2.0.5 lz.q2 .230 .210 .313 .468 — .303 .4Z7

1

30

It

J

35

-tt.)60 .169 .13S

m 2.342 2.339

4b

2.346

L

50

M

60

++2.335 2.333 2.111 .133 .1561.Z4Z I .350

N

85

0’

115

P

113

-t-t

.z3q

0.

230 z,j30

1$.00 -!Asl.& 4OOI6JOI1OJO dlty Levelo (N:htemd Inspection)

-L
I4.1O

19.02

Ran[a Method C-4 ~$

TABLE
Maamr Table #or Redueed Zmpecticmfor Plan, Baoedon VSrlabillty Umkmwn (Doubl* Speclficalion kltand Form ?-Single SptcUicttion LlmII] Acmptablo OuaZ{t IAVCI1 1.50 2.$0
M

~

-!5

I

Smnpl* 81SC Samp10 cede letter q IX* .065 .10 M .15

I 1.910 1.99 18.06 26.94 33.69

*

MM

I ..?5 I ,40 I .65 I L M[hI’l MIM

in-ii40.47

10.00

MM

1,
1.?10 7.59 18.86 26.94 1.910 7.59 18.86 Z6.94

33.69

40.47

33.69

40.47

1.910

1!59

1.s.86

26.94

3J069

40.47

2.234

1.53

10.92

16.’5

2Z.8b

29,45

36,90 20.Z7 G33.95

i
Z.474 1.42 3.44 !.93 9.90

G

5

14.47

:

H .58 l,i’ 2.05 1.23 4.77 —

7

2..530

,

Z8

1.99

3.46

5.3Z

8.47

If?.Js

17.S4

Z3.SO.

JO.66 10.79 15.49 z1.06 21.90

I

10

2.4o5

7.42

J
.253 .430 .786 I,JO Z.10 3.11

10” 1.14 Z.05 ).Z3

Z.405

K .336 .506 .S27 l.z7 1.95

15

z. 379

v

.21

. I1!
4.77 7,42 10.79 G G 4.44 6.76 9.16 14.09 3.96 S.9.3 8.65 IZ. S9 3.96 5.98 8.65 IZ.S9 3.92 5.88 8.50 12.36 5.85 8.42 la.z4 3.90 — 3.44 S.17 7.54 11.10 3.30

.58

Z7.90 19,30 Z5.9Z 17.48 Z3.T9

L“ZS .136 .506 .827 1.21 1.95

Z,MB

.214

Z.8Z

M .366 .537 ,S56 1,29

25

2.358

,214

2.82

17.48

Z3,79

4 -1-Z.353 .240 1.96 2.81 z.349 .261 ,391 .564 .883 1.33 1.98 2,82 Z.339 .144 .356 .504 .75.1 1.16 1.74 2.47 Z.J3S .242 .350 .493 ;755 l.l Z 1.67 2.37 4.97

N

I

30

17.19

2>,42

17.03

Z3,ZI

15.64

21.63 1.Z7 10.13 15.17 21.05

Q

I

05

ML bad table waluec tra in pcrcmt d. f.ctlve. %deZ3rdt #ampNnszdmb.kw’.rrtmr, that,,, betb ccmple,l.ea~

$ $ II
weNa* MvsJu*. ‘ WI..SamPle

&

S1S. OqU~C or ,xc.,do

10,

... .. —-. —

—.—

TABLE Tabh for EcUmatInI lha Lot Percent Defective USIIIg Rans* Methedl

C-5

I

I

I
. ..-

L-...

TABLE Ttbh Method for E#timatln# tba Let Percent Defective Ualng Rune

C-5-ConUINed

.

,.
.- ... ,.. . .
,.”
.“

.“ . .,
..
. .

,..
.

;,. .. .. ..
I..
,-

.

,.”

. t.. .“ ,,.
,..

.“ . ,,,* ,,.
,.”

,.a ml 9..,= ,*“ .
. . . .

,..

,,.

6..
. . . ..

0,” ,. ..

4..

.“ . . ,..

,,.

.,” .. . “ . . ... “ ,.- ** .“ ,.9 .s
4.. . ,.. .*

i

t.”
a
)..

..”

*
,.*

..
..

i

,,.
,.. ,.. ,.0 ,,..

,A ,a l.. ,.”
1..
.

,.”
,.94 . .

,,.
*..

*..I ,,. ,.n *.S “ ,. . . ,.= D.. s.. ,.” . ,. ,- !..
,.” A.

,s ,.

9,.. m “

1

I

.

TABLE Tabh for Estimating tbo Let Par.ml t3ef@c11veUcla: Ilmte Method

C-5-ConUnursl

,

I

I


—TABLE :! Table fer Eotlmatlng the l-al Percrn! Defective Uolnc Range Method C-5-Continued

‘--

I

_—

TABLE T*Mo for Estimatlq ttm Lot Percm! Defective U#inS Raa[t Method

C-5-Contlaued

.. .\. .

. . ..

ESTIMATION OF R=UCED

PROCUS AV~GfZ AN(3 T1Gf4TENE0

AND

CRfTERfA

f=OR

3NSPECTION

C 13. fig~MATION

OF

PROCESS

AVER-

corresponding e.limated lot prcent dcf. cor p . rempecfivel~, is red from Uve p the ta~)e. Tk ..tirnated proce.. .ver.~e

Tbe .verag. percent defective, based ~POa q group of lot. .ubmttted for c.ri~iii.l In. pectmn. i. called [be prc.ce. a q verase. OrigiM1 im. pectiert imthe fir.t inspection of . particular quantity Of product .ubmitted from the le. qcceptability . . diati~uiah.d ia. pe. tion of praducl which hambeen re. ub rnisted after prior rejection. The pr.acc.. q vera~e shall be e.timated from the remdtm drawn from . .pec of im. peetion of qmple. Uied numb. t of pr. ceditq lot. for the pur PO.. of delerminiag .everity of imapection durimg the .our. e cd q co=t?.ct in aecordaace with paragraph C14.3. Ay lot .bdl be incitided md, ante (m rt.dnutfri~ chm proc... avera~c. The e.timate of thepmcc.. average i. de. igriated by p“ wbem cwnpuc.d with rempect tc. q n upper .pecific.tion limit, by (JL -b.. ..mP.ted rnth respect to a lower .p. cifi..tic.n limit, and by p when computed with respect to q double .pecifi..t ion Ilmft. . C13.1 Abnormal R.. uft.. Th. ra.ult. of ic!. pectitin of product rnamuf. cmred under ccanditions aot typica3 of u.tmf production hall b. excluded from the emtimaled proctm. q verage. Cl 3.2 Compufatio. of tbe EsUnmted ProCe.. Average. Th e estmuted pracemm q vmr .;. 18 the a%hrnetic mean of 4(I. e-hated lot percent d. fecti.=m computed from tbe qampliag i.. pectioa re. ufto of the precedlmg ten ( 10) lot. er q . may be otberwi. e de. ig matad. & order to eatim.t. the lot p.rcem defective, the qua3ity hdie.. Q“ andlcw OL 9ball be Coin q d for aach lot. Tb... ua: Ou = (u-X)C r X and Ot, = (X- L)c/IL (See parwraph Cl 1.2. ) C13.7..1 S&l* Specific& 3An& Tbe emilmuea lot percent d q 1 eetlva qbQ b. d.Iarmin.d from Tabl. C-S forth #_ ti.d tuetbod. T& qdity M-x Ou on the r~c 6

% i~ the -it f-=*ic M-= Of thepu’s. Sim individu~ -.titn.ted lot percent d. fectiva.
q.=r8ge PL itarly. tbe estimti.d proces8 i. fbe srifhmetic mean of the individual estimated lot perceot defective. pL’..

Spccificatioa Umit. The C13..?.2 Dc.uble e.timateii lot pe,=.nl de fcct, ve shall be determi~ed {mm Table C-5 fc.r the Plan. baaed cm the rmt~. method. The quality iridice. OU and OL shall be computed. Table C-5 is cmter.d #.parately with Cfu ad QL q nd the .ampfe .izc, and the c.rrespohdi:g Pu PL q re read from the table. The q sti-d m.ted lot percem defective i. P . PU + P . q verage p i. ct+ q Tb. e.lirnated proce.. q rithmetic mea. of the i.divid.af ..tinuted 10I percemt defective. p,..

C13. Z.3 Special C.. e. If the quality iade. Ou or 01. i. . aegativ. amber, lhen Table C-5 i. entered bydi. regarding the negative .iar.. Howcwer , ii. thi. c-.. the ..timat=d lot perce.m defective above the uppar limit or below the lower limit i. obthic.ed by .ub Cr.cting fh~ percentage lc.und in the table from 100%. C14. NORMAL TIGHTENED, “DUCED IkSPECTION AND RE-

qu’nplfng Tbia Standard esmblisbed P(U far normal, tightened. and reduced IEmpectk.n.
C14. 1 At Start of fa. pectiom. Normal inspection .hd3 be used q t the start of ias PeeU& uateoc otb.rwise dacignated. C14. Z ZturirIg 3aspection. Qurimgfhe courm &xctio. sbdl be of iwrnctiim, normal Coaiitimms are quch UDd vba. imspoctian (&85 tibteaed or reduced iMmcc?ion io not -itb” paragrmpfu r.4dTd Lm q ccordume C14.3 d C14.4. Cl 4.3 Tisbtened fxukmcfion. Tishw..d ia9D0ct10m 91M31 be ttmtituted wbem tbe estj J td &t&f procemi qverage computed from

tb8 cu. d . tir q p.cuictiom ulmlL T&l* c-s b tirti dfb C)uor QL q nd (h* qrnfla qti=. d ~*
Ific.tlmi Mrnft er Q~ ler

q bd

k

uood

for

tbae~e

ti

u-r

•~.

prec.di.# t.. ( 10) lots (or quch other aember of lot. de.i~nat.dl in q ccmrdaoee .ith para~raph Cl 3-Z is greater than th= AQL, T of sod when mere than q cc.rlaln ~r theme hats have emtimatea O! the percem delecctve .xecedisg the AQL. Tba T-values qr.give. ln Table c-6 for tbeprocem qwer,r age compted from 5, 10 or 15 101*.8 r40rmal in. p.ctioa hall be reiiut.ted i[ the q verane of Iota her e.tinuted proces. Cightea.d im.pecxic.n is qqtd to or le.. tkn the AQ t.. Iled=ced inCl 4.4 Reduced ln9PccUon. qpecti.a rrmy b. uutitutad providd that all of the following conditions q rc catiafied: Conditioa A. The preceding ten {10) lot8 (or .uch other number of Iota deaigrmted) have bee. under norm81 inspection and non. ha. be.m rejected. thmdicioa B. The ecttnu:ed pereemt defective for each d theme preceding Ietm ile.. than tbe applicable lower limit #bow. in Table C-7; or for certain qampiius plar.a.

the q stimat.d lot percent defective i- ~ vclfied ~r of towauto sero for b q tiv. 10CC(see Table C-?). COmdItkl c.
Production

i-

qt q

qteady rata.
Normal Iaspectlen one of the following reduced ia.~ctiOU. Cmditbm
qva q hall

be reinstated cooditiea. eccvra A M k rejected.

M ‘my ti.r

D.

condition E. Tbe q ettmatad procema age 1. greater tbao tite ML tkmditi.. F. or delayed.

1.

Prehcttom
Dtber

become,

irregular

Camdittc.a G.
may warrant b. r.ltwtated.

Umt normal

condition. w impaetio. . bauld

Cl 4.5 SPling PIUIO for Tfuhta.d or Re dimed LompeCroon. Sam #w P~ i or tightened -d reduced in@p@ctioa q re provided in Sectio. C, Partm 1 aad U.

... ,...

..

.. ..

.. .. .

I

Qa

MIL-sTD-414 11 Jme 19s7 TABLE VA.e. Sample code #ix. .04 . .065 . C-6 k.spcction
‘ectke]

Range

Me3b0d

of T for Ti~ht.ned Sy Lewd .6s .

letter B

.10 .

Acceptable DIM .15 .25 .4( .
q

.

c

q

.

.

q

q

.

T?.
1.0 .

Number 10.0 44 15.0 of Wm

6.5 : 8 : 9 4 1 F10 4 ‘7 10 44 78 10 4

: :8 10 .4 7 10 4 7 10

1: 4 11 4 8 11 4 8 11 : 11 4 5 10 1: 4 8 11 4 8 11 4 8 11 4 8 11 4 a 11 4 8 11 4 8 11 5 10 5 10 15 5 10 15 5 1s 5 10 15 5 10 15 5 10 15 5 10 15

D

q

.

.

q

.

.

E

.

q

.

.

z > 4 3 4 5

z 4 s 3 5 6

F

.

.

.

z 4 5

T -L
q

3 5

2 4 6 3 5 7

23 44 56

3 5 7

4

:7 89

2
8 — 4 6 9 44 77 99 44 7 :9 4 7 +9 4 7 10 — 4 7 10 — 4 7 10 — ; 10 — 4 1! — 4 7 10 — 4 7 10 4 7 10 — 4 1: — 4 7 10 — 4 e 11 4 a L1 — 4 ,?

d4,4 44 7 10 44 7 10 1: 1: 4 78 10, 4 11 44 80 11

44 67 99

11 : 11 4 8 11 4 8 11

G ,H

1: 3 :

! “3’ ; 3 :

; -3 5 7 3 b 7 4 6 0 4 6 8 4 6 9 4 7 9 4 7 91 4 1:1

: 3 b 7 4 6 8 4 6 8 4 6 8 4 6 9 4 : 4 7 01 .4 :1

! 4 6 e 4 6 8 4 6 9 4 : 4 7 9 4 ;1 4 7 0, 4 :1

: 4 6 s ,4 6 9 4 : 4 ; 4 7 9 4 7 0 4 7 10 4 :

1; -t--t 4

n

11 4 -8 11

.1

3 5 7

J

; 7

: 7 4 6 8 4 6 a 4 6 9 4 7 9 4 Ii

: 10 4 1: — 4 7 JO — : 10 — 4 a 11 — 4 8 11 —

K

: 7 4 6 a 4 6 a 4 7 9 4 7 9

$
11 44 a 11 1: 44 88 11 4 8 11 11 : 11

: 11

: 11 4 8 11 4 a 11 4 8 11 4 a 11

10
15 10 15

L

M

N

$
4 8 11 4 8 11 4 8 11

4 8 11

5

5 10 15 5 10 15

0

*

44 80 11

11

15 uid MLvm3umm.

m

----

MlL%Tn414 11 Juna 10S7 TABLE C-6-CooUfoJad Lmspcuoa R.-g. Method

Q-lx
Aff estimates

‘=%!7
.10 .15 44 77 10 10 4 7 10 : 10
of the lot

The S-D fiiwm in each block refers to the precedim 5 lot., .preceding 10 lots and lhc bottom figure to the pre&ding I S-lot..

z m z IT
Vale.
d T for Ti@t-.d A. ce ble Ouatit .40 5A ,.1s [ill 1.0 ..?5 .6s 4 1.5 “4 4 788 10 11 w 11 44 f5a 11 11 44 a8 II 11 I I 1 44 laa 11 11

:

:

11

11

11

4 a !1 +

: 11

4 a 11

4 a 11

45

10 15 to the

1:

the middle

li~rc

of percent Tightened inspection i. required when the number of lots with q .timatem defective above th= AOL from the precedin~ 5, 10. or 15 lots i. ~rester fhan the given vtiue of T in the table, and the pr-.e=m averaae from these lat. exceeds the AQL. percem defective are obtained from Table C-5.

al

TABLE RWISQMethod Llmit# of htimxcd Acceptable Oudity .065 !
q q q q

C-7

Lot Percent Defective (or f2educcdfn,pectk Levels 1.5 4.0 [28]** [18]** [121.. [ 9]** 6.5 15,0 [42]*. .?.5 10.0 or z.ato Number

Ssrnple *ize .10 o
q q

code letter *

,04 .1$ .40 I ,0 .25 .b5

B

q

s 10 & s Is

c

q q

q

4
q q q

[45]**

(31)**

[221..

[15j**

[[O]**

( 7]**

.17 I S.oo

D
q

q

q

q

*
q

[)1]**

[25].*

[18].*

[II]**

[ 9]**

0.00 4.40 6.50

.74 9.96 10.00

6.06 15.00 ,

10 15 5 Jo Is
9.66

E

q q

q

q

[JO]**

[23]**

[17/..

[13]..

[IO}**

.00 .35 1.84 0.00 1.84 4.00

.19 5.74 b. 50

3.s2 10,00 b

8.45 J5.OO A

5 4.92 10.00 & 10 I 5.00 i 5 15

r * [191** [141**

q

a [II]**

.000 .008 .158

.000 .104 .50

,00 .40 1.14 .061 1.37. ,2.30

.s3 3.01’ 4.00

.?.04 6.06 6.50

G [loI**

[12]**

[ 8)**

.000 .002 .0.?0 .000 .015 .014 .006 .19z .466 .040 .449 .90 .000 ..060 .199

.148 .90 1.50

.5)6 1.94 2.s0

1.41 3.63 4.00

3.27 6.50 A

6.30 to.oo &

11.01 15.00 1

10 15 5 2.20 4.00 , 4.27 ..50 , 10 15 5

H

.000 .003 .011 .000 .009 .025

.002 .020 .052

.004 .047. .096 .014 .101 .199 .04Z .209 .174

.112 .422 .65

.Z48, .498 .755 1.26 1,00 1.50

1,12 2.)4 2.s0

1.40 10.00 A

12.13 I 5.00 &

I

.001 .006 .017 .002 .015 ,037 .004 .032 .067

.010 .061 .118 .028 .110 .230 .069 ..?52 ,40

.16.2 .478 .65

.326 ..522 I ,00

.600 1.34 1.50

1.27 2.42 2.s0

2.42 4.00 L

4.52 6.50 a

7.68 I 0.00 A

12.43 15.00 A

10 15 5

1

.001 .010 .0.?2 .004 ,021 ,044

.007 .042 .079

.017 .075 .131 ,042 .151 .24B

.094 .281 .40

.202 .51b .65

.Jsb .861 I ,00

.691 1.39 1.50

1.39 ?..47 2.s0

2.S7 4.00 b

4.11 6,50 A

7.91 10,00 i

12.65 15.00 A

10 15

q Th-rc ~rc no tunpllng plmo provided In this Standard for the-e code Iettera and A(3L vduos.

.
I

TABLE RUIIO Method Llmltc of ZZctlm~tedLX Pereent Defective for Reduced fmpectimi

C-’I-C.mthtued

,04 2.5 .0Z4 .087 .144 1.40 2.50 & 4:00 i
.076

,06S

,10

T
y

TF
.012 .049 .088

.002 .013 .0Z6

,00s ,021 ,010

5.01
8.11 10.00 k

11.o~
19.00 b

5 10 15 5 10 15

L .190 .Z5 6.50 A

.004 .010 .033 .036 .1OZ .1s ,509 .94.? 1.00 .857 1.47 1.s0 1.6,? 2.s0 & 2.86 4.00 k’

.010 .016 .0s9

.020 .062 .09?

.140 .332 .40

.Z88 .581 .65

5.5

.007 .023 .036 .046 ,112 .15 .09Z .z06 .Z5 ,326 .6o4 .65 .562 .968 1.09 .92i 1.50 b 1,7Z Z,50 A 2.99 4.00 b

.014 .041 .064

.07.6 ,069 .10

.174 .35Z .40

5.2Z 6.5o 1 tt-t-

8.48 10,00 bd

13. z7 15.00

N

.Olz .Ozfl #.04Z .064 .1Z9 .15 .Izz .2Z6 .25 ,389 .636 .65 .648 1.00 i l.o4l 1.50 A 1,87 2<50 A .434 ,65 .109 1.00 1.119 1.50 1.90 Z.so b .z16 .378 .40

.Ozz .051 .065

.0)8 .0 z .1)

,015 .013 .04 .078 .139. .15 .144 .Z)a .25 .093 .146 .246 .391 .4044A

/.oz9 .056 .06s

.0 It .08 .10

333
3.19 4.00 A — 1.32 4.00 1 & AA

15

.?.08
Z.50 &

P

.1s”

3.46 4.00 1

5.BO 6.5o l&A

9.15 10.00

14.OZ 5 15.00 10

1s 14.15 1S.00 Z.15 2,50 & 3.54 4.00 A 5

Q k

,103 1 .149

El&E!!
Ipt tholI In the bracketm,
q re q re

5.90 6.50 A h percent clef, :tke,

9.Z7 10.00 11

10

Is

N]

AQ

T#

Wm. tht (Irml flsu?o In diractlon O( arrow aad corree~adin~ number of Iotn. in e~eh bl~ck tho top (Inure prccodkng 3 Iota, the mlddlo Npre ‘to tho preceding 10 Iott, and the bottom figure to the precedlal 15 lots.

ref. r# to the

:! !,g g$ obtained from T.ble C-5.

Reduc~d Impaction may bo Inotltuted when every emtlmmed lot percent defectlv~ from the preceding 5, 10, or 15 IotmIc bdew the figure @iven la the labl~ raduced impectlea (or sunpllng plum marked I*.) in tbe table requires that the e8tImated lot percent defecllve la equa2to -ero, for the number of comecutive Io!* iadlcsted !n br~cket~. in tddltlam. dt other condltiom for r-ducad lnapection, In Part 221 Sactlom C, mumtbe q attmii*d. et

btlnmtem of tbe lot percent defective ~1 q

1

,
TABLE Vducs Of f for h{dmum :ceptable Ouallty Le !It (in perct .04 .065 2.50 ’77 .756 — .764 .78.9 .816 .891 .96S .923 .857 !801 1.0s6 .811 + .907 .958 .865 6.50 de/cctive) 4.00 I 10.00 115,00 Average Range (hfARl C-8

$ample #lz*

Slrnple

CO* 3 4 5

Ienor

91s*

B

1,028 I
1.180

c

D

--t-% +
.910 I .985

1.011 I 1.118 I 1.26j

E 1

695 727 765
.804 ,64z .19) .748 .572 .6OZ .68.9 ,637 .677 .846

r 15 .49J .444 .460 ,477 .517 ,542

10

.529

I I 442!3
.730
-t.486 ,509 .537 .531 .527 .519 .503 .505 .542 .533 .525 .517 .481 .300 .455 ,454 .480 .507 .548 .556 .588 ,580 ,573 .564 .555 .540 .5)8 .516 .56o .593 .6OO .503 .49? .567 ,480 ,416 .469 ,463 .486 .478 .649 I .707 .642 I .699 .6)7 j .694 .628 I .684 .621 .676

G 15 30 35 40 50 60 .190 .419 .434 .405 .396 .411 .426 .441 .402 .4JZ .441 .417 .408 .4?.3 .438 .454 .411 .442 .457 .426 .4[6 .412 .447 .463

n

.785 I

.879

I 1.004
*

I

1

%

K

.4’?2

L

,752

.843

.96)

M

it-

,455

+

.608

.666 .6OZ I .656 .594 .64S

,740 .129 I .720 I .504 .637 .708 I

.830
.618

I
I ,s08 ] .194 I

.949 ,934 ,923 .908

N 115

85

.J8Z .398 .)92 .384 .399 .197 .41z .43.? .384 .434 .406 .421 — ,411 .442 ,464 .412 .427

44’I 470I 497
.490

0’ 175 230 .369 .371

.318

P

-1+
For

a

i--l--

The MAR may ba obtdaod by multlplyin~ the factor f by the difference between the upper .pecificati.an limit u .nd lew. r speciflcallon Ilmif L. The formuh 1- MAR . lIU-L). The htAR serveB as a guide for the magnitude Of the average rang, of Iha ounpla when uaia# plant for the double opecUicatian Ilmit .ca#e, based on the average range of the munpla of .mbm.wn varlabUity. Tha werap ruge of the .smple, tl It.ls Ieoo than the 5dAR, helpc to inoure, bd doe- not [utrantee, lot accept. abiflty. reduced hirpection, find

NOT&: There h t eorreopoadkg occepfablllty constant In Table C. I for eqch .aZue of f. ccepttbillty comtant of T-ble C-Z in T~ble C- I md u-e the corre~pmtding value or f. tht q

f

mL-SlW414 .11 June 19s7 APPENDIX C

mMlmitfO.s

SY@.?!
m

Read

Definition.

sample
X bar

q ike far

q

single

lot. meam of

x
R

%rnple mean. Arithmetic from . .ingle lat.

qmple

mea..

r.m.rm

Range. The difference betweer. the Iarge. t and qrnalle.t mea.ur. mests in . .. bgroup. & this Smitdard, the #ubg.o.p site <s 5 except for them= plan. in which m . 3. 4: er 7. in size. which ea.. the qubgroup i. the same a. ths .ampl. Range e: the fir. t subgroup.
Range d

the

qecond

subgroup.

R bar

Aver.~e ruag.. The arifhn-.etic mean of the rug. values of the subgroups ef tbc sample measurcm.nta [ram q single lat. Upper faumx spec Uication apecificstien limit. limit. conctanr given in Tables C- 1 nc.d C-Z

I

u L k
c O Q
qub q.b

The acc.pcability

A factor u.ed in determinizi~the quality index when using the range method. The c values q re given is Table.. C-3 and C-4. U L Ouafiry Ouafiry fmdex for “.= wijh Table C-5. C-5. defective above U from

Qu QL

fndex for use with Table

I
I

Pu

p .ub U

Sample estimate Table C-5. Sample q.tixnale Table C-5.

of the let percent

‘L P

p

qub

f.

cd the lot percent of the 101percenl percent and C-4.

defective defective
for

below

L from

Totti SUTIple estimate M&imum
given
q llowable

p = Pu + PL.
q mtimam.

I

M

defective

sample

in Tablmm C-3

%

M,ub.

U

Mtitun allowable C-> scuf C-4. (For L q re specified.)

percent d. fecfive above U gi.em in Tables use wbem differenf AOL valuca for U and

ML

de f.cti.. blew f. Siv.m in Tabfe. ~uxn mflowmble pert..t C-3 and C-4. fF~r u.e -ha. different AQL value. for U ad f. q re cp=dfied.) p bar p bar #ub V p bar suh L

P $U FL T

..tinut. @f the p.ece.. S-pi. estinmt=d prc.ee.. average.
The estimumd The
q stimated

p.rc.m

defective.

i.e..

Cbe

proce..

..era~e
q verage

for UI upper qpecUication
for a lower

lf-mit. limit.

pro . . . .

.pecific.tion

um number of emtin’tated proces. a.er4ea w~cb The mmay exceed the AOL given in Table C-6. (For use in deffr_ WW+fiCafiL= U fi~ht=aod Ampeefloa) 8s

.—.

MIL-STD-414 11 Jffffa 10s?

SECTfON vARIABIIJ’I-s Part 1 SINGLE

D
KNOWN

SPEC1fICATION Dz.2.2

LIMIT Acceptability

01.

SAMPLfNG PLAN FOR sPEC1 nCATfON LfhffT

SINGLE

This part of the Stand~rd de.tribes tbe prOc=<u, =* fer u*= with plan- fOr q qin81= .peciftcac ion limit whe. variability of the lot with rcapecl to the quality chbracteri. tic Tbc acceptability criterion i. i. known. givcm in two equivalent form.. The.. are identified am Form 1 q nd Form 2. D1. 1 U.c of Samplinu Plan.. To determine the qcceptability whether the lot meets criterion with respect to q particular qtmtity chsracteristi. and ACIL value, the applicable .ampling plan shall be umed in accordance with the prcwi. iom of Sectic. n A. General Plan.. q nd lhose in Description of S.mpling thi. psrt of the Standard. D1.2 Drawing of Sag. be dramt i. qccarrJa.ce “All -ample. with para#rmph

Com.tant. Th= q=c=Ptto the SUTIple is. mentioned in paracraph DV..2. I, im i-dicated in the column of the maater tabl* pplicable AOf.. vafue. corre. p.amding to the q Table D-1 i- .ntered from the t.pf. r normal i.. peetion q nd from tbe bottom for tightened im.pection. Sampling plan. for reduced ic.apectioo q re provided in Table D-Z.

qbility comstaut k. corrcapOd@f

D3.

WT-BY-~T CEDURES

ACCEPTAEfl-~ PROWNEN FORM 1 IS fJSEf#

D3. 1 Acceptability
of conformance

(x- L.)/..

Criterion. The dearof a quality characseri. tic with re. pect to a •in~le specification limit hall be judged by lb. quantity {u-X)/_ or

qhail
A7.2.

I
D1.3 Determination of Sample Size Cod. T he m-pie Letter. 91ZC code,letter .hdf ~.cted from Table A-2 tn 8ce.rdmce with paragraph A7.1. D2. SELECTING THE SAMPLING wHEN FORM 1 IS USED DZ.1 PLAN

D3.2 timputation. The folio witas qu~tifY q ball be compute& (u-X)1. or (X- I.)l. . dependins on whether the .p..fficatiom limit i. u upper Or q 10wer limit, where U .L X e

i- the upper specification qpecKicatioa is the low-r
i. the sample mean. q nd is the bnown variability.

Mntlt, llmit.

Master Sampliq Table-. The rzm. t.r fabJe. Ior planm ba. =d on v8ria imsle qeetfkattc$m ltmlt bttlcy ~ k? q q q re Tables D-1 and D-z. Tablo D-1 i- omd (m -rmsl Ind tightened tnapectiom and T&l. D-z for rod.ced icupectioa.

qamplms

btlltv Criterion. timpar. the - L)I. with tba qcceptqmantity qbifity coaatant L M (U-X)1. or (X- L)le i. tbb. tfmbg=-e~ ~ .quf ’te ox sroater qcc*pfabfflfy crtsertcud If (U-w. or ~- L)/. Is 18** tbn k or Decative. tin tbe lot dOa* mt mat tbo 8cc*pfAbtltty c rlterioa. D4. SUMMARY PUR 8mAuNGm..Az4wmz OPERATION’ N?onu OF 12s

8ampffnR PtM. Tbo Qu81i.a, wd M pli8* ph. C.nmmtm 01 q ,unpl* Tbe s~moclated qcceptability conmtant. from k.te r samplimg plan ia ebtahed
DZ. Z Obtdmimr

q

Table DLL,

D-I

q nd D-Z.

~pfe

Sise.

The ..niph

she

qhowa in t e mamter table correspoadhs AOL. each qampl. qhe code leffer &
lS.a Appcadis

m i. fo

[1) Determine [be sample sise coda letter from Table A-Z by u-lr.I Ibc lot qiM ad tba tipecftoa lee:. used in tba sunptiQz prO=eda.e. PIUU bned oavar~U~

D for d= finicia=u al all qpnbals D. I fo,
q

Z~-~PIe

COmpfete .sunpf’e

Of tti 67

mL-snb414 11 June 1957 (21 Obtain PI*. from Master Table 33-I or D-Z by sel=ctitag the qample .i%e rI qnd the .Cceptabitity Coti.ta-t k.

q Pecificalion limit. The p.rc.mtag. ef nomc.nferming product i’ q .;imamd b~ qnfcrTablt D-5 with the quality index.
lade-. The of Oualilv D6. Z Computation quality ic.de= QtI . [U-X) VI. .h.lf be corn. limit im u. upper puted if the 8pe; ification limit U, or C3L = fX-L) v/. if il is s lower limit L. The quzc.litie.. ~ and . . q re the ..mplc mean and known variability. respectively. The laclor v i. provided in Tables D-3 and D-4 corre. pc.ading to the .unpfe size. D6.3 Estimnte of Pert.nt Defective in Lot. The quality of q lot qhall be exprem. ed by Pu. the estimated percent delective in the lot q bove the upper .pecificstmn limit, or the qstimated percetit defective below by P ih. l-” owcr specific alior. limit. The citimated by percent de~ective PU or pL i. obtaizted cmte. img Table D-5 with OU or Cfti D6.4 Acceptability Criterion. Compare the” estimated 101 p=rcent defective p~ or pL llowable percent de fcc with th. maximum q ti. e M. lf pu or pL i’ equal to or le.. than M, the lot meet. the acceptability criteriotx if PU or PL is ~reater than M or U QU or ‘L ~S negative. ~h=n th= 10t do= C@ IIWCt cn. acceptability crxterior.. .137. SUMMARY SAMPLZNG USED FOR OPERATION PLAN WNEN FOffhf the OF 2 IS

at random ~ha .unple ef u (3) Seleti units from the lot: inspect q nd record the tn. amur. merit of the quality characteristic Ior each unit of the q ample.
[4) Cornput. the .unpl. me.. X, qnd the quantity (u-X)/e for an u per specification limit U or the quamtity L)/. for q lower .peciiicatiaa limit L {f-

qlso compute

(5) lf the quatitity (U-X)/. O. (x- L)/a i. equal to or greater lhas k, the lC.I meet. the acceptability criterion; U (u-X)1. or (X- L)/W is Icaa :han k c.r eesative, them the 101do=. not meal the acc.ptabillty criserbn. D5. SELECTING THE SAMPL3NG WHEN FORM 2 3S USED PLAN

D5. I Master Samplirm T. bles. The ma.t.r m.rnpling tables for plans ba. ed on vari. Iirnil bilily knc.un (~r q .ingle specification q rc Table. D-3 qnd D-4 of Part IL Table D-3 is used {or normal .ad tightened inspection and Table D-4 for reduced inspection.
The D5. Z Obtainin~ the Samplinff Plan. sampl.ug plan .onsi. ts c.{ q ample .iz. qnd maximum qllowable perccnl an qssociated defective. The .amplimg plan is obtained from Master Table O-3 or D-4.

cedures

D5. Z.1 Sample Sise. The .ampl. .i=e ~ i. .hown in the rnasler table .x. rreaportdine to each s~mple .i=e code letter, D5.2. Z Maximum Allnr.. able P.rcecIt De~ereent fe<tive. The rnaxirnum q llowable corr.. i~ve M for 9UTIP1. q.timalc. poadkmg b tbe sample qi.e meatlomed i. r-wr~pb D5.z. 1 I* irtdicated in the Colwn. of the mseter table corrempoadiag to the ~PP1ic~hle AOL value. Tabl. D. 1 is acte, ed from tbe t.pfar .armaf inopecfioh and frc.m tbc bottom let tight.md tip.cuon. Sunplirig plans for reduced Iamfmctima.are provided io Table D-4. DE. ~T-BY-WT CEDURES ACCEPTABILITY PROWNEN FORM Z IS USED 3

steps summarice The following tO be followed:

Pro-

(1) Dele. rninethe .m’nple size code cer from TabIe A-Z by ..ing the lot .ise the in. pecliem level.

141and

(2) Obtaia plmr. from Mater Table D-3 i=e U. fbe or D-4 by qelecting lhe qunple q df.wable perfbctor ., qnd the mulmum cent defeefiwe M. (3) S4ect st ramdom tbe .unple of n umits from the 10G irs. pect and record the nma.ur.nmnt 01 the qualhty charutari9tic on each umit of tbe qempl.. (4) Compute tbe sample meX.

[5) Compute the ( U- X}v/U q . upper ;F%%%$; %ai%

Db. 1 Acceptability Criterion. The de~ree of con>ormae.ce c.f q quality eha~aeterimtic .pecifi. atio~ limit with respect m q .iagi. .hdl be judpd by the prc=a of ~~conformimg producl nutside tbe upper Or lm.er ‘S=. EXamPI. D-2
far . complete

quality index f2u . t cificatimn limit U = (FL)v/. If q ,-* i, .peeified.,

16) Determine the qmtimsted lot prcasd defective PU or pL fram Table D-5. of thl. 88 precedure.

exunple

I

-——

MUA7D-414 11 Juoa 1SS7 (7) U the emthrmtcd lot percent de f.c UW* pU or pL im eqtml W or Ie*a ttmo tbe maximum atlowable percent defective M, cricerla~ the lot meata thm qccaptabiii.~ u “ ‘QL‘u h ‘r “ nesattve, ““”=’ thea the let M “ ad ‘4Z deem ‘f the =ccopMbUitY criterion.

EXAMPLE &Ample

D-1

of Ca3ctiiiam
Form 1

SiaCle Spec51ictii0a L%iitVariabiIlfy t(cw-n

Example

The qpecif ied minimum yield point for certain qt4el c~-ttags is 50,000 psi. A lot of 500 item. im wubmicted for inspection. lo bpection Level IV. normal Ia.poction. The variability . i. knowm te be 3000 p-i. From with AOL . 1.5S i. to be u..d. SUPW9C fhe Table. A-Z and D-1 it i- seen that q mample of qkc iO io re.autred. yield point. of the qunple specimen, q re: 6Z,500; 6z.000; and rompliame 60,500; 68,00(h 59.000; 65.500; 61 ,000; 69.000; S6.000; 64.500; criterion i- to be determined. Expluulion

with the acce?tabilitv Ne.ded

Lint — 1 Sample Sise:

Information n .

Value Obtained

io
3.000
IX 630,000

I

2 3
4 5

Known V.riabitity: Sum af Mes..rcmcnt.: Sample Mm. X:

ZXln
L

63.000
58,000 1.67 k Compare (X- L)/. 1.70 1.67 c 1.70

6J,000110

Speeificatioo The Quantity: Acceptability Acceptability with k The lot does

Llmlc (Luwer): (X- L)le CoLI. taat: Criter-

I I I ..

b 7 8

(63,000-5.5.000)/3000 See T-ble see Para. D- I D>.3

mot meet

the =eceptabi3ity

critmriom, dnce

(X-L)!.

is le..

th=

~ tm i.

I I

NOTE: —

ksie upper specUiCatiOn ltrrdt u i. SWen. tbeh compute If q q b d compu~ it with k the 10C meet. the .cceptabiiify lbequal to or greater tbui k.

tbe quaatlfy (U-X)1. crit=rio. if ( u-X)k

I I I

89

54flL-sl’13-414 11 Jumd 1957 E~LE
fkampfe

D-2 of Cafcuhtfonm L4mit - Form Known 2

Single Specification VariabUity

Example

The specified mimimum yield poiuf f-r certain .teel casting. . . .in S8.000 psi. A lot or 500 item. is submitted ror inspection. inspection Level Iv, normal lnspectlon, with AQL = 1.5% is to be u.ed. The variability e is known to be 3000 psi. From Table, A-2 and D-1 it is . ..cI that q sample of q ize 10 i. required. .SuPpa. e the are: yield points of the sample mpecimen. 62.500; 60.500: 68,000; 59.000; 65,500: 62,000; 61 ,000; 69,000; 58.000; 64,500; and compliance with the qcceptability criterion is m be determined. Explanation

Line — I 2 3
4

biforr?mtirm Needed sample size: n c xx

Value Obtaimed 10 3.000 6>0.000 63.000 1.054

Know. Variability:

sun-l of Mr.a.urerncIll’: sample MeFactor, v X: TXln

630,000/10

5 b 7 8 9 10

sp=cific aliOn ~mi, Ouality fnder: ‘m’” ‘f “

ltiwe r):

f-

S8.000 !.76 3.927. (63.000-58.000)1 3,000 Se. Table D-5 D-3 D6.4 .054

OL : (X- L)v/o ‘“1 ‘L M pL

‘Crcent

Max. A1l.awabl, Percem Def.: Acceptability with M Critcrian:

3.63% 3.92% a 3.63%

See Table S=. Par..

Compare

The lot d~es not rn. e$ the qccepf.abifity criterion,
~E

since PL is great=r

than M.

ff . sin 1. upper .pecific.tion Iii-nit ff i. given. the. compute the qu~lity index Qu = defective PU. compare PU (U. XIV . m lme 7 and ebtain the sstimale -f $he perceml if pu i. q qual 10.0. 1.*S than Mwith W. the 1.s rn. et. the qcceptability criterion

F-

90

I

-------

. .

..-

.-

TABLE D-1 Matter Table for Normal and Tlghtenad Inspection for Planr Baoed on Varlablllty Known (Single Specification Lkmlt-Form 1) ccepttble Ouallty Level? (norma2 Inopaction] .04 I [ I ak .25 .40 n k k n a k .1s [ [nklnklnkl .06S .10 ,65

Sample 91*c code letter

B

c

D

E F

F


2.58 3 4 2.5s S 2.46. 49 2.63 4 2.39 4 2.30 4 2,14

.

1

1

,
I
I I

,
5
2.05 6Z.0* I I 5 1,25 ?.‘“ 1,95

G’ 4

3

++”
I
I 1 ‘? 10
1

H 5 6 6 7 8 9 11 16 22 31 42 2.69 2.72 2,71 .15 2.65 I 2.59 12 1? 2)34 45 2.54 11 15 20 .?.80 2,77 2.12 1.64 2.63 8 2.54 2.4s 2.45
t

5,.,4 6 2.3s 2.37 I ? 8 9 II 2.49 2.S4 2.57 2.62 2.62 .29 I I 13 19 25 31 49

I

62.2, 2.25 2.26 2.29 2.31 2.35 Z.41 Z.4J 2,41 2.48 ~o

1 6

.?,69 2.59 2.58 -1 2.s0

6

2.49

8 9 10 12 14 I I I 21 27 40 %4

2.13 2,13 2.16 2.la 2.21 2.21 2.29 2.33 2,34 .65

I

8 10

1.96 1.99 11 “2,01 13 26 I I I 23 30 44 59 2.03 2.o7 2.12 2.14 2,11 2.18 i ,00

J“

2,12
2.7? 2.7? 2.81 2.88 2.92

x 8 10 14 19

1

5.,

M

N

o 27 2.96 10 2..94

,’
37 2.97 ~ .063 .10

‘E

r1=

Acceptable Oua21ty Levalo (tightened lnopectlon)

. ---

TABLE D-1-Conl[nud Maoler Table [or Normal and Ti~htenid Znopectionfor PlarJI Based On Variablllty l(nown (Single Speclflc.tlon Limit-Form II =s ?1 ;. Acceptable I 1.50 Z.50 4<00 I I I k]ak 3 n 1 1 kink 6.5o 15.00 10.00 n .— nk 31ty Level# (normal Inmpeetim)

Sample q Ic* code Ietlar I .00 n k

l==
v
2 z z 3 4 5“ 1.$9 .991 I 7 9 12 Is lZI 20 1.13 1.15 1.11 1.11 I [ 9 11 13 IS 1.57 1.61 1.65 t 1.67 1.69 1.70 4.00 Acceptable O 36 48 25 20 1.38 J,42 1.46 1,48 1.56 I 18 1.38 1.53 Is 1.35 1.51 13 1.34 1.49 10 1.31 1.45 8 1.28 5 1.20 6 7 1.28 4 ,.,, I , .9,9 I , 1.17 .,.28 .197 I , 8 .,,, .S84 1.09 ,? J 4 6 B 1.68 1.10 1.72 1.75 1.62 1.53 1.44 1.33 1.25 2 1,42 1.36

d z ~~ *

B

c

I

v v
Vlvlvlvl

D

I

E

3

1.s6

I

I --+-H%1.01 11
14 17 21 7 9 II 12 14 10 17 25 31 2.00 49 65 2.04 ?1 1.89 El 36 1.86 42 1.97 28 1.84 32 1.93 39 3.79 22 [.09 Is 1.75 1.88 14 1.S6 12 1.83

.877 .906 ,924 ,942 I I

12 lb ..20 24

.649 .685 .706 .719

H

1.s0 10

1

I
“1

f

l--

K

Ill

24

.964

27

.737

L,

M

N

——

o

=-b-t=-,
55 I.Z~ ] 64 1.05 ] , 75 .8I9 I

P

2.03
54 1.89 61

t--I

70 93

1.51 1.51 6.50

82 109

1.29 1.29

95

1.07

Ill

.841

Q

,

I t

I
127 1.07 I , 147 .045 I

1.50
2,50

I

10.00
!ty Lavelo (tightened Incpeclhm)

15.00

I
I When S~ptO site equa20or q xctads tot

I

AI

I!fi::v,r,

AQL VdUS* q?E In Bercent dafectlve. at cunplkag plm baZowqrrow, that ln, both aunple site *8 well amk value, item in nzuat be kmpected.

idol

k

.

I

TABLE Msomr ~nbte for Reduced Zn8pectionfmr Plant Baiedon Variability bon (Sinlle SpecUicaIlon Limit- Form 1) ble Quality Levelo— .10 .15 I k n k n knk n knk .25 .40 .b5 1

D-2

Sample aico coda Inttmr

.04

.065

}

8

k

m

25

c

D

E —

r

Z

1.3b

G z 1.94

z

,.581,

z

1.42

I

34

z

1.01

3

1.b9

II

3

1.S.6

1 3 4 Y..3O 2.34 2.34 2.37 7 la I 17 2.65 Z.J8 2.49 2.s4 5 5 6 4 6 ‘k 7 2.19 3

I

1
3 2.19 1 2.07 2.07 2.14 2.23 2.23 2.25

I

3

1.91

J’ 39

I
2.46 2.46 2.49 2.50 2.59

F1 R
3 1.91 s b b 8 2.05 2.0% 2.08 2.13 5 l.aa b 1.7a II

K

132.’

914

L

4

2.ss

5

r
a
13

a
4 2.55 5 6 6 11 2.12 2.77 16 11 2.58 7 2.59 b 2.26 2.35 9 14 Z.13 2.21 10 [.99 I II

M

-=-H-i =-l-=-i
*
19

N

0

1.86

I

P

Q

I
15

z.41

21

2.21

4*

:.

.

TABLE :s :8 Masltr Table {m Reduced kicpectbn f.? I?lan. Breed On Variability IGI.Wm (Sin@Speciflcatlon Limit -F.atm 1)

D-2-ConUnued

..—
Acecptable C2uaIityLevelt 1.00 I n ! ! I k n n k n k k m k 1.50 4.0 6.5 2.50 “ n k

‘Smple Siso code letter

1

B

c

D,

E

F 1.2s .936 1.01 .8.35 .919 .991 .991 9 11 12 15 1.34 1.35 25 I 36 1.65 1.42 1.46 18 29 42 1.01 1.11 1.11 1.13 1.15 1.21 1.24 1.11 5 6 6 1.20 3 .755 1.33 1.44 t.5j 5 I 7 1.45 1.49 1.49 1.51 I 1.53 1.61 \s 13 10 1.31 10 1.31 8 1.28 5,1.39 I 51.ZO 1.39 5 4 1.28 4 1 3 1.17 2 1.09

a a
9 4 41.53 b 1.62 4 5

1

I

2

I

3

I

J

.573 .641 .1?.8

G

53

=--l
6 ,515

z

.1

1 1
11 14 14 17 21 33 49

.797 .797 .877 .906 .906 .9?.4 .942 .995 1.03

0 8 !2 16 16 20 2.4 18 56

.584 ,584 .649 ,685 ,685 .706 .719 .770 .803

I

J

K

II
1.60 1.60 1.70 9 9

L S 10

a
11
13 22 I 32

M

N

I

o
12 19 28 1.84 1.79 1.?2

P

E

Q

kUL-sm-414 llJums 106?

Psrt n DOUBLE
SP3ZC3SXATZON Lfb4ZT

DE. sAM’PU?JG PLAN sPECIF3CAT10N _

FOR

DO CfBCE

This part Of the Standard describma the procedures f.r use with pftis for q double Specific-tiom limit when variabttlty of the lot =ith reopact to the qtmfky c~rscteristic i. known. DE. 1 U.* Of SUnplimc Plan,. TO determine w%the r the lot meets the qcceptability cri qu~i~ le.-ion with ?=*PCCX co q XrtiCtIISr characleri~ tic and AOL v’azuels). the applicable qampliag plan shall bc u.ed in accordance with the prwimic.nm cd .$ection A, Gea eral DeacriptiOm of SkrqdiW Plmns, md those in this part of the Standard. D9. SELECTWG A sampling .h.11 be selected [0110-s: THE fMkfPLfNG PLAN

the lover Itrnlt. M4 by MU for tb= UPWr limit. u one AOZ. i- qssigned to bath l~ltc combined. demipte tbe maximum A31.wable p-rcerd defective by M. Table D. 3 is entered tipeczton and from from the zop for uornuz tbe bosom for ttghtened imopectdon. Sampli.s plans for redoced imcpeczion sre prOvided in Table D-4. D1O. DRAWING OF SWLES be selected A7. Z. T In accord-

I

q nce

Samples #ball with parasraph #.&-T-Y~O

I

D1l.

ACC~PTABIIXl%’

plan for esch AQI. .ake from Tab)e D-3 or D-4 q

D! 1.1 Accepi.bility criterion. Tbe degree r.cleri~ tic et conformance al q qutiltY c with respect to a do~le sF&c Ification limit al ~con.ihll be judged .by tbe perce~ The ~TCeIIUSS Of Wafarmiog product.
.IJaforzniq product La estimated by enterkg

I

...”

--

D9. i Determination Of S=mple Sise Code Letter. T he qample q ma cade letter .bfi b~.cte.d [ram Treble A-Z in mecordamce with paragraph A7. 1. D9. Z Master SamPlinE Table.. The maater SUnpl-es ier w bs. ed on wuiabi3Itit q r= ity known for q double cpecific-tti T=bleD-3 and D-4. Table D-3 11 u~ed for .O rmal amd tightened izupection ud Tmblc D-4 for reduced inspect.ion. D9. > Obtaining .sunpli.g P1_ A qunpliag q 2*, d M q s80plaa Celia, mt, 01 q qmple .dated maximum aflowsble ~rc=m defecPIti be qpp3Aed Jo tively). The quf@ins inspection shall be ebtahed from 3dmcter Table D-3 or D-4.
D9.3. 1 Sun 1. Si.e. The q unple qi.e #how. = t e master ~ ZAb3e. eorrecpondlag each qunple qtxe code letter -d AOL. m ito

Table

D-5 wAzh Z& quality

M-x.

D 11.2 Computation of Quality lndice s . The . (U-xwi e and OL= qua3ity iadices Q (X- L)v/c. qball be ~omputed, where U L “ X . is iis is ia the upper specification limit, limit, the 10wer qpeeificmion a facsor providsd in Table* D- 3 ~d tk .unple mean. and zbe ksowm wariabifizy.

D-4.

.

..:

~Iv*

.unpte .8Unut.* percent th4 Imr. nppe?. 0rb04b cp*ctfication limits co~ta.d. eerr*mpOndbs fa qize memfiomed in parasrmpb tb. sample D9.3. 1. i. #ho_ in the cdunm of the W18mter
for

.of

dafeectwe

for

table eorreaponding co tba wdte(s]. K dKferemtAQLos

applicable

AQ3.

m aa~isad w qxb speckficatlon Umlt. demtsuua th8 -tmmm tile-able percent defective by ULIOZ

es

nlL-s’nk414 11 JuIIe 1957
t, tbe 10I doe. rat meet tb. qce.pl ability .rit. ria. Zf either OL O* O“ or both ar. ae*.U.e, UMrI the 10; &e. 03%rpe.t the qccep3abUtty criteria. athrwi.

+b *= s-Am .Uew*Ie ‘P~z~ti delceuve M. 25 p u equaf to or lea- 3baa U ff the Id meeb the qccep3abUIty crUeri~ p ic ‘re=ter tbm M or if Of) or Of. or both ml meet the .,* Itapfive. Umn the lot &es acceptabffity criteriam D12.1. Z Suna~ryef OP erati.n of Sunplia Plan. la caoe. where a .ingle AOLvtiue ~ ~bliohed for tbe upper and lower qpacififwle quality cation limit cornbim.d (or a q characterimtlc. the tolZowinS steps 8umma. ri. e th.. procedtwe. to be u.ed: (1) Determine the sunple qise code letter from Table A-2 by u.ing the lot .ize and the in. pectioa level. Table (Z) Select plan fr.am Mater D-3 or D-4. Obtti tbe .unpla si.e n. the factor ., and the rruximurn allowable perced defective M. of (3) .%], ct q l ra=dem the .am~le n unit. from the lot; in. pect and record the m... ttmeatat of tbe quality characcerimtic on q .cb unit of the sample. (4) COmpute the .unple (s) compute the quality ad QL . (X. L)v/.. mean X. indicem Qu

Pi

: D12.Z. Z summaryc.f operation ef sPlan. Za em=. wtmre q diflereot AOL -d lower t~c. ~ctabliched f., the “p-r Aficatiom limit for a •in~le qtmii17 character .tcp. . urnnmrime imtic, tbe ;dfowtbe prmcedurem fn be u.ed: (1) Determlae letter from Table A-Z d in.peetio. level. k. code the qunple q by uefa, the 105.&e

{Z] Select tbe san-tpliag plan front Mate. Table D-3 or D-4. Obtaio tb. ample .ise tI .ad the I.cter ., eorre.podirq to the lar~erof lb. two AQLva3ue.. dal. o the maximum .U.Ywable percerit delecgive. qnd M corresponding to the AOL va ue. for 1# e apper and lower specificatiea ‘Y limit., respectively. mple of 13) Select at random the q n unit. from tbe 10C irIap. ct qmd record the mcaauremcm of the quality characteristic on each unit in the .arrtple. (4)

compute

tie .8mpIe

mean indiee.

x.
QU

..

= (U-x)vl.

(5) Compute the q~ty = (U- fov/. and CZL = (X- L)v/&,.

percent D-5.

lot (6) Determine the q.tinmxed defective p . pu + pL from TabIe

(7) M tbe e. f.inuted lot percent dequal to er le.. than the maxi. fective p i. q mum allowable p.rceas defective M. tbe lot me. t. tbe acceptability criterion: if p is sreater than M or if Qu or OL o, both q xe =S~~V~. tfI*n *let doa - not meet ~e mccapc-bility criterion. DIz. z
&w.r Dlff8remt AOL Values .Sp.eUi.aUOO LiInlL for Upper and

@t (6) Determine the q.tImued p“ mud pL, correspond p.rceat de fectl.es ins to tha pa rc.af d. f.ctivec tie tb. upper and b.lmw the lower .pecific.tkm limit.. Afmo d.te rmine th. combined percent de f.c tive p = p“ + p~ . (7) u all three of tbe fallowing diuolta : l.) %. (b) pL i. mquaf 1. or lR.8 Mu
larger
~u

cc,ntbma

i’ equaf

to or 1...

ffun

D1 2-2; 1 Aceap4abflUy Crit9ria. 5 COirtfu*e the qstdnuted 1 pmrc~t defeetivem m.. h ot the cerro@omd4ng PU dth ~ -a..=bI= Perta=t de f==ttvew M d Mfj alao =Omi=r. P . Pfi + PU wittt k larger d ML mmdMu. lf pL sequmt taarle*attmm ML. P ic 9qtmf to or Ie*m tbul Mu. ad p i. q A to or lam than the larger of ML aad Mu, criterk the lot meat. tbe qecepbility

(CJ p b equaf of ML and Mu,

ts Or Ie*#fzlamthe

u. satiaficd, th. lot umato the ~C~tdiii~ criterk other+se. the lot does MC meet the “’=~ or both am “’’”’A’* aesativ~ tbeo ‘*’ * criterb lot%::%

m..t tbe acc.ptiifiiy

—---

. .

.

bn~14 11*2ES7 EXAMP= D-S

fsxanlpze of Cdcufat,ioms DOEbh sp4c3d&az10a ZAm2t XmOwm &w.r
SpeeUiea320a 2AMA1 Combined

varhbmfy Dm. AC3L Vahie for Seth Upper E.mtple @

mitdmnun yield 3,0311u[m cemd. steel rutimzN are The qpeclfie.d maximum ad 67.000 p. i and 58,000 psi, rucpceUvel y. A lot of 500 items is q tbmitted for impec tloa. 3nop.ct30n &val ZV. aornd insPct3aa, W3UI AQL = 1.5% 1- to be ..4. T& ?abka A-2 qnd D-> it i. seem fzut a variability c is &o-n to be 3,000 psi. Frati .unpl. of q i.e 10 i. required. SuPpu. e the yi.ld point. of the qample specimens q re: 6z, SOO; 60,500; 68.000; s9,000; 65.500; 6z.000; 61 ,000; 69.000: 58.000; 64.500;

qnd compliance
Lb. — 1 ?. 3 4 Sample Know. lnIornutio. Size: n

with the qcceptability Needed

criteriom V. I.e

is to b, determined.

Obtaim.d

Explanation,

10
o ZX 3,000 630,000 63, o0O 1.054 Untie: Limiti U L 67,000 56,OOO 1.41 l.?b U: pu 7.93% 1.92% 11.85% D.[.: M n . . 3.63S 11.85% > 3.63% criterion. da..
p = pu

Variability:

Sum of Meaaurem6ats: Sample Factor, Upper Mean X: v Specification sXln

630,000/10 See Table D-3

I

5 6 7 8 9 10

Zmwer Specific=cion QuaIity Quality Index: Lufex:

Qu = fU-X)V/. Z3L . (~- Z.).1. Def. Above D*I. D-fBelow ~ ~~

(67,000-61,000)1.054/3,000 (63,000-58.000)1.054/3.000 See Table See Table D-5 D-5

Est. of Lot Percen: 12tc. of &t TelaJ ~*t. Pu + P~ Max. PerccnI P=r=e=t

..:
11 J2 13 14 IA P& P -

7.93% + 3.92% Seo T*1c See Para. D-3 D13.4 than ~

A310w~ble Percent

AcceotablI1tv C.ite rioa: pu + “pL with M The 3ot doe not met

cmn~r= .

q

the qccepzcbiflty

+ PL io sreater

97

------

.. .

-—

um=slv-414 11 Jnne 19S7 EXAMPLK
Exampte ml=
of

D-4

Cafcutatimu ZAmtt

sp0dfka3A9n

V.rkatduty
Difiere.t

KaOwt!

AQL. Vti.ss

for Upp.r

&

lmwer

SpeeUicDtinm ZAmlt.

q re The .pecified maximum and minintum yield p0&39 for cer3mim oteel ca.tl~o psi -d 58,000 psi. reapectivdy. A lot d S00 item, is submitted for inspeeknspctinn with ML = 1%. for the uPP8r aad UO.. znspctko. *CI IV, uarnuf The vari.bilicy . is AOZ. . 2.5% for the lower tipecificuiom lkmit im m. be u..d. Frern Table. A-Z qd D.> it i. .... that q .unple cd ais. kcuaw. m be 3.000 pi. 11 c~rre. poridir..g to the s.rnple .ise code letter, 1, qnd the AQL value Of 2.S% i. mple specimenq re: required. S.ppc.. e the yield Pc.itis d the q

67.000

6Z.500; 60.500: 64.000; 59,000; 65.500: 6Z.000; 61.000; 60.631; 68.000; 62.000; 63,000 and cmnplisnce Lime —
I ~ 3 Sample

with the qcceptability Needed

criteria Value

1. to be determined. Obtained 11 Expl-ation

Information Size-: n o

Kn~wn Variability: Sum .f Me...

3,000 Ix 67.9,131 61,64.9 1.049 u L 67,000 58,000 1.07 1.28 u: Pu pL 3.07% 10.01% 13.10% Del. Abo.e U: % ‘L 3.07s
-

rernen:.: XXIC.

4 5, 6 7 8 9 10 11 17. 11 14 15

.%rnple Mean X: Factc. r: v

678.131/11 See Table D-3

UPPe r Specific atiort Lirnic faw. r Speci[ieatiea Index htdex: ‘t au QL Limit: = (u-X)v/.

Quslity Ou-lity =.~ ‘f

(67,000-61,648)1.049/3,000 (61.648 -SB.000)l.0491J. See Table See T-ble D-5 D-5 oOO

= (X- L)*/a Def” -’e

‘“’cent

E.1. of bt

Percent Def. Selow b Del. h bt:

T.atal Cat. Percent Pz.
Mu.

p = pu + 3.07% + 10.03%
Se.

Allowabi. A31.wable

Pe r..mt Pe rcest

2.59% s.60% ~ 2.59s

Tabl.

D-3 D-3

-

De[. B=lmu k (al Compare

See Table

Acceptabilit~

Criteriw

PLI PI. 0

with Mu
(b] Compare with ML (c) Cemoare with “ML The 10: dins. not meet fied; i.e.. pu q64U. pL > Mb

10.05% > 5.60% 13.10% >5.609 crIterl.. .tnce 15(a), (b) -

see Par*. DIZ..Z. Z(7)(a) see Para. 1312. Z(7)lb) Z, s.. P.**. D12. Z. Z17)(C) (c)
q re

the mccep~bUity qnd p wM~

Dot q*-

08

,: -. -.. .—

..— ..—. .—.

—,.

TABLE nd Tightened Ioapectlon ~or Plain Bamadon Known Vtriabllity Table for Normti q (Doubla 5pec{flcatlon Llmlt and Form Z-Single Specification Llmlt]

D-fl;

Matter

ImpI* -I*E ode letter —.

B

c

D

E

I

r

a

n

a

1

J

K

L

M

N

o

,.

P

Q

I l!

J!LJ__
When q ample q Is* equdo or q xe*sd*

IJ 1

AU AQ L id tabl~ who q m In pmcaat defective. q firm sunpllq plan balow arrow. that Id, bath mmpsa 01*4 as well as M valua. I:la., @v*r, ‘Mm ,. tba 10, rnu,tb. SrIlpocied.

lot

I

... ,.

TABLE Tcble for Normal and TI$ht~ned hmpectlon for Plma Baaed on Known VarlabIllty (Doubl. Specllic8tl.m Umit -nd 5’orm Z-Single Speci[icztlm Limit) Acceptable Quality Level# [normal In#pectio,

D-3-Con(lnued

MmIar

mpl* 01: oda ldtt

1.00 1.s0 10.00 13,00 m M v n 64 v Mv v ?. 6.11 1.414 6 3 Z4.2Z 1.225 4 22.91 1.IJ5 5 Zo.ao 1,118 7 19.46 1.080’ 3 10.79 1..?Z5 3 15.60 1.ZZ5 5 15,21 1.118 6 13,s9 1,095 9 12.88 1.061 12 12.35 1.04s 15 12.04 1.03s la I l,n8 1.029 20 11.57 1.o26 z] 11.5b 1.023 39 10.93 1.018 42 I,).40 1.012 5s 10.17 1.Ooq 6,48 I .007 82 6.46 1.00s 109 9.76 1,006 4 5 B 8.43 1.054 e.13 1.041 8,13 1.035 1.72 1,029 7.80 l.OZb 7.34 1.021 6.9S 1.014 6.75 1.011 8.62 1.069 B.9Z l.lia 9.97 1.155 v 9.27 1.414 v 3 {1.14 1.ZZ5 3 1.56 1.225 4 6.99 1.155 5 6.05 1.110 n he v n M v n M v m


2.50 4.00 6,50

I

1
v 1.15s

m M

B

c 1.414 1.U5 1.155 4 1 2

1 .?.13 1.414

v
v
?. 3.90 1.414

D

t Z.23

T
4 33.67

v

~
4 31.01 1.155 6 28.64 1.095 f5 2b.b4 1.0b9

E

3 2.76

r

4 2.s8

*
7 5,83 1.080 9 5.68 1.061 10 5,60 1.049 13

G s }.b@ 1.069

b 2.s7 1.093

6 1.77 1.095

11 I 7.88 1.049 14 17.36 1,038 17 17.03 21 16.71 Z4 16.23 Z1 16.z7 3~ 1S.61 49 14.81 64 14.s8 95 14.09 1,031 1.025 1.022 1.019 1.016 1.010 1<008 1.00s

12 24.88 I .04s 16 23.96 1.033 20 23,43 24 23,13 21 u;i) 31 Z2,51 30 21.77 56 20,90 ?5 20.48 [11 19.90 1,026 1.022 1.019 1,011 1.013 1.009 1.001 1.00s

54

1 2.’bZ 1.000

1 Iz 3.61 1$ 5.34 1.035 18 18 5,29 1.0,?9 Zo z?. 4.98 1.024 25 32 4.68 1.016 36 42 4.s5 1,012 48 61 4.35 1.008 70 81 4.34 1.006 93 I 4.00 1.045 14 3.43 1.038 13 5.50 1.041 15

9 2.s9 1.061 10 ),63 1.054 II

J 1.045

I 2.51 1.049

K

z 2.49

L

4 2.51

M
2a 3.0! 1.OIE

1.038 1! 1.54 1.03s — — 1 2.3s 1.031 19 3.2$ 1,027

N

s 2.19 1.02!

o
I.ooq 1.007

3 2.12 1.o16 31 2.9~ 1.014

P

9 7..00 1.010 54 2,s2

Q I 2.50

5 2.00 1.008 11 ‘1.82

9.73 1.003 I Z7 14.02 15.00

I ,004 I

I 47 19.84

1.003

1.50

10.00 6.50 I I I Accepluble Qu4Zlty Zmvela (tichtened 10spQcll.onl

A33ML ,~c::it

hd tabla vaheo qrt 18 percmt defective. sampling plan bet.- .rrc$w, that f., both .unp,e v-ry item In the 101muot bs hmpecled.

ct..

. . well .S M WIZ..

IS6 Cqualc or •xceod~ lot When *ample q

. .. ——.

TABLE Matter Table for Reduced Znopectlonfar Plan@ Based on Known Varhbllliy fDmhlo Specillcmion Limit and Form 2–Single Specllicatl.m Limit) Acceptable (lualhy I .065 [ .10 I .1s I .25 I .40 I .&< Levels

D-4

mph Dim ode letter

.04

B

c

D

E

r

a

H

i

J

2(

L

M

1!

o

?

Q

k
qs

AU AOL Ad Iabh VdUCi i?o in PO?CQ84 dafactlvc. I US* flrol mmPlkIs Plan hlOW qrrow, that I*, both mnv.le slsa T*?F Itim k~ha lot mutt ba inspected, {DISC, q

well

qs

M vahie.

When mmplo tlse q quala o? azewdc lot

.-. .

.

TABLE .Mmter Tsb2e for Redue.d Zn*p.ctl.n lor PlarM Bated on Known Vsrisbllity (Doub18 Specillcmtion Umit and Form Z-Single Specl{~cItiOn Umit] ACCI 1.06 1.50 v

II

D-4-Continued

Ssmplo BI*9 cod- lqtt@r 2,50 v n M a M

n

M

B

~.
1

D

12

t
1.414 17.74 15.bO 1.ZZ3 1.118 1.095 ? 5 4 15.Z1 11.89 13..59 1,095 9 Iz IZ 15 12.88 IZ.35 12.35 12.04 11..58 I.oz 1 .?9 10.93 lZ.91 1.Z?.5 3 1.2z5 1.155 1.118 1.116b 1.069 1.054 1.05i 1.041 6 5 ) J

k 1.414 1.414 1.ZZ5 1.15s 1.155 6.05 5.0) 5.68 5.b8 11 13 22 32 4.68 1.01 6 36 4.98 1.02 4 7.5 7.34 6.95 5.58 1.04 1 15 8.13 5.6o 1.04 9 13 8.13 1.061 10 8.43 1.061 10 8.43 1.080 8 8.62 1.118 1.095 1.0699 1.0699 1.05 4 1.04 s 1.02 7 1.01 8 1 $ 5 .9.92 5 6.05 1.118 5 8.92 4 6.99 1.1s5 4 9.97 3 7.5b 1.225 3 10.79 1 1.414 2

1

v 3.90 T 9.27

v 6.11

1.Z25 i

4

IJ.67

1.225

G

2

3.00

1.155

4

)l.O1

1.155

H

3

3.85

ZO.80 ).11.3

6

28.64

1.095

1

4

1.87

19.46

1.080

8

zi.b4

1.069

J

4

3.81

7 I 19.46

1.080

8

t4.64

1.0$9

K

b

5.77

F T
1.061 11 17.88 1.049 1z 24.08 1.045 1.045 14 1,045 1,035 14 17 1,029 z! 17.lb 17.36 17,05 16.71 1.o38 1.038 1.031 16 16 Zo 1.0,?$ Z4 z3.96 Z3.96 23.43 23.13 + 1.033 1.033 1.026 1.022 1,018 31 1S.61 1.016 M 21.77 1,013 I.olz 49 14.81 I.O1O 56 ?.0.90 1.009

L,

a

l.be

M

8

3.68

N

10

3.63

0

1z

L61

1.035 “18

P

19

3.26

0

28

3.05

1.014

4Z

10.40 —

i

i

. —— . __

——

–-—

——-

TABLE

D-5

TabIc for CotlmstInS the lat Percentage Defective for Plans Bared on tiowa Varllbilityl

1

Part Ill ESTIMATION OF PROCESS AVDLAOE REDuCED AND TIGNTENW A34D CRfTER3A 1NSPECTION ~31

D 13.

~:S#fATfON

OF

PROCESS

AVER-

!. with Q or QL 4 muted Y et perce,att

the corr.

spondin~

.mti-

Th. q ve rage percent defecti*e. baoed tbmitmd for or~imal UPOn A 8r0.P 0[ 10U q in. pecticm, i. called Sbc proceaa average. OrlgirIal inspection is the fir-t Inope.tion Of q prticular quantity 01 product .ubmitted from the [or .eceptahslity q . di.tfngui.hed in. pectian of product which ba. b=cm re. ub after prior rajectimm. Th. procea. shall be ..tinuted frc. rn tbe re. ult. of i.. pe. tion of wampl. mdrawn from . q peeifi.d murnber of preceding lot. for the pur-

defective Pu 0. P L. ?*spectively, is read from #he ~bIe. The qverage pu i. the arithe.tinuted proces. metic m-u. of the Itidi.idual e.timated lot the e.ti percent defective. Pu’ q. Sinaihrly. nuted procems average p is the arithmetic meof tbeiadividdemt~atcd lot percemt de fect%ve. PL’..

q.eragc

rnirted

pose of decermis.img severity cd inspection during lhe tour. e of q contract in accordance with paragraph D14. J. Any Iot. .htil be included OUZY once io e.timatitig tbe proce. a q ver average. The estimate of the prec... qt?. is designated by $u what computed with pecific.tion limit, by r.. pect to q n upper q PL wb=n cOmp~t=d rnth r=~p=ct tO q 10w=r specification Iirnit, and by p when cmnput=d with re. pect W. a dc.uble .pecificaciOm Iimit. D13.1 Abtmrrr,a) Remult,. Th. re. ult. 0[ irmpectior. of product manufactured umdcr conditions not typical cd tmual production. shall be excluded from the estitrmted pre cemm’ average. D1 3.2 Ccmputatiem d the Esf.inuted prcaverce. a Avers e. Th q e.tmuted proce.. qge M the qr~thrnetic mean of tbe estimated from the 10t pe rcem def qctive computed .unpling itt*pecti.ma re.. tit. of the preceding tea (10) low or S* may be .alhenvi. e d.miS uated. In order to estimate the lot percerat dsf.cti.e, the quality kdicem Ou &\.ar QL q lmfl be computed for each lot. Theme q re: (3u . (U-X)WI. and QL = (X- LWIO. (S8. paragraph D] I. Z.)
D13.?.. I SiI@. Sp.cifieatlon Z.lml% 6 The estimated 1ot percent dof ecu-e q bal-1 b deCennined frarn Table D. 5 ter the plum hawed O. bnowa varbbi3ity. Tbe q-am3ityiadex Q“

D13. Z.Z Double Specification lAmit. Tbe e.cim.ced lot percent dciectzve qhall be .determim.d from Table D-5 for the pluI. bm. ed on variability b.swa. The quality Indic.s 0 and QL shall b. computed. Table D-5 ien ered separately Y with QU and OL ad- the carre.pomding pu snd pLare read frOm the The e.timtied ict percemt defective fable. is p = pU + pL. The e.tirnat.d pro . . . . a.er qge p i. th= qrithmetic rn.a.mof the individual =atimsced lot percent defective. p’.. D13. Z.3 Special Case. U the quazity index 0,, or Q, ,s a nt~atm.e number. them Table DY5 i..~~ter=d by-di. regarding the negative si~n. However. io thi. case the e.timated iot q bove the upper limit or P. TC.nt defective below the Jow.r limit i* obtained by q ubtract ~~~~ Per==at=ge found in the table from

1,

‘“ %%% dWPECITC)N
i-peetioa.

AL

TXGZiTENED,

AND

RE-

This S$azidard e.tabli. ha. wampling pl*rsh for normal, tightened, and reduced
D14. 1 At Start of Inspection. Normal in.pectiom SW b. wed q t the qtart of inapec. UOa IU13C.*S ecberwim de#$gm4ted.

D14.Z OuriaS fn.xctiou During the co.r q e uumction shall be of In9puctia, -rmal used when taapeecio. cmaditioo. q re much tbt t6sht.nod O. redncad iaapection is not rqufred fn accordance with prmS.aphs D14.3 and D14.4. pecttoa. Tiuhtermd tnD1 4.3 Tight=imd 31W Spectltl. .W1 be in. ututed wb. n the emti naat.d proce. m qverage computed from’<he

hall be us.d far tbe ea.. of aocJppr .pec iiic.tiom limit c,r QLlor the c.. e of a 10X. qpecifi..ticm limit. Table D-5 ii entered 6Wbem Form
rnste Of

crltariO=, ~h= a~tis~di=utia d.tmit ti a-cd (0? Czu ue*ptabi3~ty defective pzz or pL i. u m ebtaiaed, 10 order to emtinmte the procems qveraga, it ia aecea.~y to eornpiete paragraphs D6. Z d D6. S af hrm 2. ‘ra, .m~e. ifQ . -.50and O = 1.60, thenpu = 100IL - 30.854% = 69. J46%. pL = %4g% ~ P “ 69.146% + &S . 74.6z6&. lot percent

~_~l.

..-—

----

!’
prece4iag [e. (1OJ Iot# (.r much other smmwith ber of lma demig=atedl in qccordmce paragraph D1 3.2 i. greaur thaa the AQL. and when more thao q certAn number T Of these 10ta ‘have qstimmen of the percent deiective exceeding ctaeADL. Tb* T-value. are SiWeaI in Table D-b when tbe pr.acua average is computed from 5, 10. or 15 lots. 8 Normal inspection still be reimtmted if the .stinnted pro . . . . ..erage of Iota under c., tightemed iiwpectio. i, equaf tc. lem. than the AQ L. D14.4 Reduced fnsp=ctior.. Reduce4 bcpectien may be instituted provided that all of the following cOndiliOn. q re satisf ied: Condition A. The preceding tea (10) lots designated) lc.ts (or such other mmnberof have be.- under r.c.rrnsl i.. pecti.m -d no.e has been rejected. Condition B. The e.linuted percent lots is defective for qach of these preceding
Iesm than

MUAID-414 11 Jftfld 10s7 the qpplicable D-7. loumr limit cbown
q

i- Table

Caufitiom qtcD4y rak.

c.

Pr0dmct50n

is

t

q

Nonnsf impecthm *baff be retostate4 eondftiom occurm one of tbe foIlowing redueed tic wctlon:

U my tiad~r

Condition
. ..erage

D.

A Iot-ic rejected.
plwJce~-

fkradiiinm E. The estiunkd i. ~re.ter tbn the AQL. Comditiom F. or delay=d.

P.oductiom

be=om.a

irregular

Dthe r ccmditiom u COtisti.n G. that normti inspection should may wtarrwt be reinstated. D1 4.5 Sarnplin~ Plans for Tightened or Reduced k,C.~=CtLOIl. S~PIIDS Pl~S fOr *lghl e~ed and reduced inspection q re provided in Section D, Parts I and 11

I 10s

..

I

TABLE
v.iu. Sample code size
.J-t Acceptable

D-U
k+spsctbon

mof
.25
q

T for Ti+t.oed
tavels


OustIty

letter B

.065 .

.10 .

.15
q

.40 .

.65 .

(in percent deft!, 1.0 1.5 2.5 q-o
q q q q

i.e —
,.5 —
q

.

c

q

.

q

q

.

.

q

3 5 6 3 : 3 6 7 4 6 8 4 ‘1 ,9 4 7 9

3 5 6 3 :

3 5 7 4 6 a 4 6 9 4 ; 4 7 10 4 7 10

: 7 4 b 9 4 7 9 4 7 9 4 7 la 4 7 10

D

q

q

q

.

.

q

3 4 b 3 5 7 4 6 8 4 6 8 4 7 9 4 7 !

4 7 9 — 4 7 9 4 7 10

7F
10.0
q

15.0 *

Nu13160r of bm

w
445 88 11 11 445 88 II 11 -++445 88 11 11

E

.

q

.

q

2 4 5 3 :

3 4 6 3 : 4 6 8

: 8 4 6 8 4 7 9 4 7 10

3 F . . . : 3 4 b 3 5 b 3 5 7 : 8 : 8 4 b a 3 4 6 3 5 7 4 6 a 3 5 7 3 b 7 4 b 8 3 5 7 3 6 8 4 6 b 8

G

: 7 4 6 a 4 6 9

H

2 9 4 7 99

1

4 4 7 7 9 I.101

4 4 7 7 10110

4 7 10 — 4 8 11 — 4 8 11 4 8 11 — 4 a 11 — 4 8 11 — 4 8 11 — 4 a II

10 15

10 15

10 15

J

4 4 4 b b b : a 181819119101 4 b 8 4 6 q

444444 77 :1:1:

K

u
44= a

9 4 6 9 9 t 1:

9 4 7 9 4 7 9

9 4 7 9 4 1:

9 4 7 10 4 1:

10 4 7 10 4 1:

10 4 7 10 4 1:

10 ; 10 4 1:

10 44 88 11 4 1!

II

445 en 11 11 445 88 11 11

10 1s 10

L I

I

I

11 4 l.:

44d

-l-J-15


.There
are no .antplimg

44’5 4 8 8 8 11 11 .11

plMM provided

in this Standard fer these code letters 8nd AOL.a3nOS. I&

+E
10 Is 10’ 15

445 88 11 11

hfnATD-414 11 June 1951

TABLE VAM.,
Sample code

D4-CmtJmd
f519~Cti00 (in PC rcemt ttefe
1.5 2.5

v qriab.bMc7 ~

of T for Tl@umd Ouatlty .25 4 If< 4 8 11 .40 4 1: 4 s 11 Lavelo .b5 4 i! 4 8 11

qL.
.04 4 7 10 4 1 10 .065 4 7 10 4 7 10

Accepmkle .10 .4 1 10 4“ 8 lJ .15 4 7 10 4 s 11

letter P

I .0 4 17 .4 1:

4.0 4 1: 4 1: 4445 888 11 11 10 11 15 m the

4 1: 4 1: J:

4

.4 1;

Q

I

The top rigure in cacb block refer. to tbe precedi~ 5 lot., 15 lots. preceding 10 lot. qnd the bottom figure to the precedi~~

the rniddlc figure

Tightemed i.. pectiom i. rquir.d wbem the aurnber af lotm with .stirn.tea of percent defective qbove the AQL from the preceding 5, 10, or 15 Iotm i. greater thaa the Eiven value Of T iu tbe t.ble, and the proceos qverage from th.. e lat. e=c=ed. th= AOL. N] estinutea of the lot p.rcemt de fectiws
q re

Obtaimed from

Table D-5.

I

107

TABLE Llmlto o{ Estimated Lot PerceIII D. f.c!Ivr ior Reduced Inspection *r Acceptable .065 15.0 *
q q q

D.7

V. fIablllI~ Known

~~

Sample size ,10 . . . ,15 ,,?5 1.0 ,40 .b5

C1. &litv Levels

code letter

.04

* — *

35

q

J
.
5 10 Is .021 .2, ?2 .558 ! 1.714 14.z91 I 5.00 .027 .222 .558 .369 I,Z48 2.145 I I z.q37 5.69? 6.50 4.386 8.049 10.00 .769 Z.354 3.850 1.645 4.496 6.50 I 5.00 5 5.154 9.330 I 0,00 9.419 15.00 A 1$ ,16b .62Z 1.124 .631 1.64J 2.50 1.225 2.9z4 4.00

c

q

*
q q q q

*

.011 .109 ,209

D

q

*
q q q q

.003 .050 .144 .011 .109 .290

E

q

*
q

*

.001 .009 .029

.002 .021 .064

.045 .197 .384 .086 .)57 .669

I

~ 4 *

J-

q

.005 .025 .056 .010 ,052 .110 .046 1.880 2.50 1.560 3.250 4.00 .021 .100 .204 .311 .874 1.194

.09n .309 .5.22

.178 .5Z8 .867

1.3Z5 5.958 6.50

6.114 9.806 10.00

10.436 5 15.00 10 b 1$
5 t.166 3.698 4.00 4.o45 6.342 6.50 1.093 10.00 J 10 IS 5 7.s02 10.00 A 11.470 15.00 A

G

:

.001 .004 .010

.001 .008 .01.9

l-l .-1007 027 055 .013 .049 .090 .0Z6 .093 .167 .078 .Z17. .347 .53J I,IJ9 1.50 .147 .385 .6OZ .Jz Z .718 .00 013 041 071 .02.? .0b7 .114 ,057 .147 .227 .103 .252 .382 ,ZZ3 .418 .65 .375 ,773 ,.00 .677 1.Z70 1.s0

1.1)6 Z.141 2.50

53”

.002 .009 .018

.004 .017 .033

1.326 z.Z17 2.50 %

Z.40J 3.8JI 4.00

4,453 6.5o A

12.054 I 5.00 &

10 Is 12.427 15.00 5

.451
.847 ,.00 .

I

.004 .014 .025

.011 .011 .051

018 0s1 082 .070 ,164 .244 —

.030 .081 .129

.142 .298 .40 — .252 .508 .65

.718 1.346 1.50

1.461 Z.J59 2.50

Z,643 J.94z 4.00

4.719 6.5o A

1,786 10.00 i

-L
~ [’015 5 .316 .892 1.00 .85J 1.J94 1.50 1.562 2.412 2.50 2.758 3.987 4.00 4.909 b.50 A 8.05s 10.00 a 12,693 15.00 A

J

10’ 15 5 10
1

.006 .016 .030

.011 .011 .051

OZJ 0s8 090 .08Z ,177 .2s

.038 .092 .140

.298 .549, .b5

TF
.15.9 .J13 .40 — .171 .JZ6 .40 .3!7 .564 .b5 .540 .908 1.00 .910 1.4z7 1.50 1.641 2.449 2.50 2.89! ,4.00 A 1 5.009 6.50 A
1

2( plant provided

.008 .021 .033

.014 .036 .056

,028 ,064 ,09b +

.051 .10’9 .1S

,09 I .18B .25

8.205 10.00 A in lhh Standard far lhe. e :ode letter,

12.848 15.00 A and AQL va5ue#.

1$

I 4

q There

q re

no aampllng

_——

.

TABLE V~rIabIllty Knows Llmlto of thtimited Lat Percent Defective lor Reduced fnnpectim

D-7-Conllnued

.,
we u“alftv 2.5 4.0 6.S — 10.0 1 .0 La C19

.-.

.

.

Numb-r of I/As

“X
.40 .107 ,203 .Z5 .501 .934 I ,00 .934 1.440 1.50 1.732 Z.406 2.50 z.96Q 4.00 b 5.131 b.io A 8.3Z8 ko.oo h 3.093 4.00 5.310 6.50 .191 .344 .40 .348 .586 .65 — .383 .608 .65 .6zl .959 I .00 1.821 2.50 ha, I,o1O 1.415 1.50 8.516 10.00 A 13,017 I 5.03 +

5

10

1115

5

.120 .Z14 .Z5

.211 .557 .40

T ---1I -1_
13-238 I S.00 A 10

15 s

T
8.0z2 10.00 A 13.588 15.00 1 13.801 I 5.00 & 14.034 I S,oo & 14.173 15.00 A

N
A A

1,959 2.50
*

.017 .030 .049 .080 .146 .03Z ,054 ,086 .134 .232 .15 .04 .06S .10 .25 ?
.Z51 .38Z .40 .435 .635 .b5 .705 .994 1.00 1.113 1.50 i .(41 .241 .2s .277. .392. .40

3.Z7Z 4,00

5.546 6,5o

-

3u15 — 5 10 15 5 10 14 5 10 15

-1-

5
.191 .25 h .316 .40 b

.1s0 .249 .25

.299 .41Z‘ b

*

,. *

m

1

nd All A(3L q tsble vduec ~r; In percent defective.

bUmethe flrot fl#ure In dlrectlon of arrow and correepondin~ number of 10M. In each block the top (Igura reform to the precedlm[ 5 lott. the middle figure to the preceding IO lots. and Ihe bottom figure 10 the preceding 15 lots.

Rw!uc813 impectkon may b- tnalituled when every emtlmaled lot percent defective from the preceding 5, 10, or 15 lot- in of bdow the flsure glvon In the table. fn addition, III c.ther conditiom for reduced impection, In Part 323 Sectloa D, must bc dtiltfled.
q re

AN entknmteoof the lot percent defective

Obtained lrom ‘Table D-5. =H

II

baL-sTD-414 11 June 1957 APPENDIX Defhiflmu D

Sz@!s!!
n

Read

Def intt.io.s Sunple site for + qingle lot. mean of
q unple

x
.

X

bar

S-pie rnemn. Arithmetic 8 tingle lot.

rneawaremento

from

Sigma

fbowa variability. The predetermined variability of the quaf bow. ify cbaract.ristic which vill be u.ed rntb the .ariabifify qcceptabfltfy plus. Upper specification Lawmr spectficatian The .ceeptabi3ity Iimtit. limit. givem in Table. D. 1 and D-z. indices when ua ing The v vafues., q re

u
1. k

constant

v

A factor tw.d in determining the quality the bnowLI variability acceptability plan, giv== in T~b10. D-3 -d D-4.
Q O

Q“

,ub U .ub L

Quality

Index for use with Table

D-5. D-5. defective @ef.ctive

QL

C3uality Index for use with Table Sample estinute .Table D-5. Sample escinute Table D-5. Total qunple 0[

m PL
P M“

p sub U ub 1. p q

the Iot percent

qbove
below

U front L fr.am

of the lot percent

em firnsfe .af tbe 101percent defective percent and D-4. defective

p = p“ + PL. eatimatea

Maxdmum dfowable given in T@bles D-3 M q.b u

lor sample

Mu

Maxfmum allowable percent defective qbove U ~ivem h Table. D-3 and D-4. IForuce when different AQf- v81uec for W and L q re spactfjed. ) llow.blcpercent defective below Maximum q D-3 and D-4. (For usawhen different Mf) L qre q~edfted. Sunpfe ewtdnnte Of the procemw merceut amfimated procema average. Tbe qmfimuod pw..s. The estimated Tbe maximum
may exceed

‘L

ub L M q

1. @em value.

for

ia Table. U =d

P P“ ‘L T

p bar
ub U p bar q p bo

defective,

i. e., the unlit. Umit.

.Verq. average

[*.

-n upper Spectficstlom

qub L

process number

for a lower

q pecf3icatlon

tbe AQL

=1< > I Less Greater than

applic~t~a

pr.xeoa q veragewhich of emttnuted given in Table D-6. {For u.e indetnr Of ti8bt=n=d i=~p=ctiOa. )

L.eom than. Greater than.

tbM

SLunof

110

.—.——

.-

----

----

I I

-.

,FOM d.m# thb lhn,

lFOM k-, DEPARTMENT OF THE NAVY

Ih”

It”. )

111111
UNITED

OFFKIAL q ENALTV

qkrJNE5 FOm q RIv ATC USC E.100

n

No PGE?AOe

wscE!EEAmv
1S UAILEO

1947MC

STATU

BUSINE:SNOR~,P;~M,M,fi[&, rlnsl CLAW
POSfAGE WILL BE PAID BY THE DEPARTMENT OF THE NAVY

Co@xuanding Officer Naval Ordcmce Station
StandardizationlDocumen tatiop Divieion

(Code

524

Indian

had

, KO

20660

I

,.

DDa??”1426
. . ..
--?r

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