You are on page 1of 100

PURPOSE.

To interface and associated verification requirements for the control of the electromagnetic interference (emission and susceptibility) characteristics of electronic, electrical, and electromechanical equipment and subsystems designed or procured for use by activities and agencies of the Department of Defense. Such equipment and subsystems may be used independently or as an integral part of other subsystems or systems.

STRATEGY OF EMC RISK

UK Defence Standardization

TEST METHODS

Military Test System

for Transient

Transient Category

External Transient
Internal Transient

A.
1. 2. 3.

B.
1. 2. . .

OTHER SOURCE

HEMP=High-altitude EM Pulse

NATURE

NATURE
IMPULSE EXCITATION

*********IMPULSE EXCITATION..HOW?**********
Impulse Excitation

*********IMPULSE EXCITATION..HOW?**********
Impulse Excitation

*********IMPULSE EXCITATION..HOW?**********
Impulse Excitation

*********IMPULSE EXCITATION..HOW?**********
Impulse Excitation

*********IMPULSE EXCITATION..HOW?**********
Impulse Excitation

CS115-CS116 TEST

CS115-CS116 TEST

CS115-CS116 TEST

CS115-CS116 TEST

CS115-CS116 TEST
generator

CS115-CS116 TEST
generator

generator

GENERATOR

GENERATOR

Bandwidths.

For susceptibility measurements, the entire frequency range for each applicable test shall be scanned frequency scan rates and frequency step sizes of signal sources shall not exceed the values listed in Table III. The rates and step sizes are specified in terms of a multiplier of the tuned frequency (fo) of the signal source.

These bandwidths are specified at the 6 dB down points for the overall selectivity curve of the receivers.

If a controlled video bandwidth is available on the measurement receiver, it shall be set to its greatest value. Larger receiver bandwidths may be used; however, they may result in higher measured emission levels. NO BANDWIDTH CORRECTION FACTORS SHALL BE APPLIED TO TEST DATA DUE TO THE USE OF LARGER BANDWIDTHS.

Analog scans refer to signal sources which are continuously tuned. Stepped scans refer to signal sources which are sequentially tuned to discrete frequencies.

RF absorber loading diagram

RF absorber loading diagram

General test setup

Test setup for non-conductive surface mounted EUT

Test setup for free standing EUT in shielded enclosure

Test setup for free standing EUT

LISN schematic.

LISN impedance.

CE101 limit for submarine applications, DC

CE101 limit for submarine applications, 50 Hz

CE101 limit for submarine applications, 400 Hz

CE101:Measurement system check

CE101: Measurement setup

RS103:Test equipment configuration

RS103-2. Multiple test antenna locations for frequency > 200 MHz.

Multiple test antenna locations for N positions,D>3 meters

Test setup for RS101

Field Strength Frequency range Modulation Dwell time

Frequency Step

As specified in Standard (Fig.RS101-1) 30 Hz to 100 kHz nil 3 Sec Step Frequency Size 30 Hz to 100 3 Hz Hz 100 Hz to 10 1kHz Hz 1kHz to 100 100 kHz Hz

Test setup for RS103

Frequency 10 kHz to 100 kHz 100 kHz to 1MHz 1MHz to 5 MHz 5 MHz to 30 MHz 30 MHz to 100 MHz 100 MHz to 200 MHz 200 MHz to 400 MHz 400 MHz to 1 GHz 1 GHz to 3 GHz

Step Size 1kHz

Antenna

10 kHz
20 kHz 100 kHz 300 kHz 1 MHz

Parallel element E-Field Generator

Biconilog

2 MHz
4 MHz 5 MHz Double Ridged Waveguide Horn

Test setup for RE101

Subrange 30Hz - 1kHz 1kHz - 10kHz 10kHz - 100kHz

Detectors MaxPeak MaxPeak MaxPeak

IF Bandwidth 10 Hz 100 Hz 1 kHz

Step Size 4 Hz 40 Hz 400 Hz

Antenna Comments Sensor

Meas. Time 0.2s 0.02 s

Test setup for RE102

Subrange 10 kHz 150 kHz 150 kHz 30 MHz 30 MHz 200 MHz 200 MHz 1 GHz 1GHz 7 GHz

IF Bandwidth 1 kHz 10 kHz 100 kHz

Step Size 400 Hz 4 kHz 40 kHz

Antenna Comments Monopole Antenna Monopole Antenna Biconical

100 kHz
1 MHz

40 kHz
400 kHz

Log Periodic
Double Ridged Waveguide Horn

Test set up for RS105

Test for RS105