Using the Multi-Mode Scanning Probe Microscope (MM SPM)

Magnetic Force Microscopy

This manual describes the steps of everyday use of the SPM, specifically in its capacity
as a Magnetic Force Microscope (MFM) in TappingMode. This is meant to be read and
used after working and becoming comfortable with the microscope in TappingMode, and
it can be used in conjunction with the manual specifically addressing that mode of usage.
Two topics are covered that must be handled slightly differently than in TappingMode:

1. Setting up for Microscope Usage…………. Pg 2

2. Taking an Image………………………………… Pg 3

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Setting up for Microscope Usage

1.1 Turn on the Equipment

• Turn on the computer, access the program “Nanoscope v4.43r8,” and turn
on the microscope.

1.2 Place the Sample in the Microscope

• Remove the tipholder from the head and, using the Scienscope stereoscope,
make sure that the correct tip is in the tipholder. The MFM tip is shinier than
the TM tip, and it has writing (“NANOSENSOR”) on it. (By now you should
have learned how to change the tip, but if not, learn now.)
• The MFM tips are located in the Dry Keeper in a plastic case (containing
black foam) that is labeled “Magnetic Force Microscopy Probes, Magnetizer,
and Sample.”
• Magnetize the tip by placing the magnetizer (which can be found in the
“Multimode Magnet Holder”) and the tipholder together so that the circular
region of the magnetizer is in the region under the tip where the samples go.
• Put the sample on the magnetic stage and return the tipholder to the head of
the microscope as usual. (A generic sample that is good to practice scanning
is also in the case with the MFM tips.)

1.3 Adjust the Microscope (see SPMI Ch. 8; 8.3.2)

• Adjust the probe, laser beam, mirror, and photodetector just as you would
for normal usage of the microscope in TappingMode. The only difference is
that when the tilt mirror lever is adjusted so that the signal sum display reads a
maximum signal, the maximum is a little over the 6.0 V level (rather than near
3.6 V).

1.4 Tune the Cantilever (see SPMI Ch. 13; 13.2)

• Look at the bottom of the “Nanoscope Control” window and make sure that
“Tapping AFM” is written to the right of “Extended Multimode.” If it isn’t
written (perhaps “Contact AFM” is there instead), then click on “Microscope”
at the top of the “Nanoscope Control” window and select “Profile.” Select “!
Tapping AFM” and click on “Load.”
• Look in the “Other Controls” sub-window to make sure that the “Microscope
mode” is set to Tapping.
• Click on the tuning icon to access the cantilever tuning controls.
• In the “Cantilever Tune” sub-window set the following parameters to their
associated values, if they are not already:
o Start frequency: 50 kHz
o End frequency: 100 kHz
o Target amplitude: 2 V
o Peak offset: 0 %

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• Complete the tuning process. (The drive frequency should be 69 – 91 kHz.)

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2. Taking an Image

2.1 Enter the Initial Settings (see SPMI Ch. 13; 13.2.1)
• Enter the initial settings as you would for normal tapping mode, except for the
following settings:
• “Interleave Controls” sub-window
o Make sure that “Input feedback,” “Drive frequency,” “Drive phase,”
and “Drive amplitude” are set to the main controls values by setting
the bullets to “off” or gray, rather than green. (In regular tapping
mode, the bullets are also gray.)
o Interleave mode: “Disabled” should be selected, for now.
o Lift start height: 0 nm
o Lift scan height: 100 nm
• “Channel 1” sub-window
o Data type: “Height” should be selected.
o Line direction: “Retrace” should be selected.
o Scan line: “Main” should be selected.
o Realtime planefit: “Line” should be selected.
o Offline planefit: “None” should be selected.
• “Channel 2” sub-window
o Data type: “Phase” should be selected.
o Data scale: The value should be 3°.
o Line direction: “Retrace” should be selected.
o Realtime planefit: “Line” should be selected.
o Offline planefit: “None” should be selected.

2.2 Engage
• Look at the base of the microscope and check that the light is green and the
lower display reads a vertical difference between –1.00 V and 1.00 V.
• Engage. If an “Engage” sub-window appears that asks, “Interleave mode is
enabled – continue?” then click on “No” and set “Interleave mode” to
“Disabled” in the “Interleave Controls” sub-window and re-engage.
• Once engaged, change the “Interleave mode” to “Lift” and make sure “Scan
line” in the “Channel 2” sub-window is set to “Interleave.”

2.3 Adjust the Settings

• As usual, decrease the “Channel 1” “Data scale” so features become clear, and
adjust the “Channel 2” “Data scale,” when or if it needs adjusting.
• The “Amplitude setpoint” should be set low enough to get a good plot of the
surface features, but set to the highest value possible. However, it shouldn’t
be so high as to allow the magnetic field pattern to show up in the height
image. (The less the tip is in contact with the surface, the more the magnetic
field will affect its path.)

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 • The integral and proportional gains will probably need to be adjusted as well.
2.3 Capture Images and Disengage
• Use the same procedures as usual to capture images and disengage.
• Don’t forget to add notes to your images and to correct (modify, flatten) them.
And remember to clean up after yourself.