Magneto-Optical Kramers-Kronig Analysis
Magneto-Optical Kramers-Kronig Analysis
are fixed at 45◦ with respect to each other. Apart from the time-effectiveness, the advantage of this
protocol is that it can be implemented at ultra-high magnetic fields and in other situations, where an
in-situ polarizer rotation is difficult. Overall, the proposed technique can be regarded as a magneto-
optical generalization of the conventional Kramers-Kronig analysis of reflectivity on bulk samples
and the Kramers-Kronig constrained variational analysis of more complex types of spectral data.
We demonstrate the application of this method to the textbook semimetals bismuth and graphite
and also use it to obtain handedness-resolved magneto-absorption spectra of graphene on SiC.
which involves three complex functions, xx , xy and zz , Jahoda found9 that the KK relation can be applied to
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2
p
the function f (ω) = ln r(ω) = ln R(ω) + iθ(ω): many Muller-matrix elements17 . While allowing a num-
ber of independent quantities to be measured separately,
Z ∞ p
1 ln R(x) this experiment unavoidably mixes the xy and z compo-
θ(ω) = − ℘ dx + π, (4) nents of the 3 × 3 MO tensor due to the finite angle of
π −∞ x−ω
incidence and thus adds extra complexity to the analysis.
which can be used to restore the unknown complex phase To our knowledge, a model-independent extraction of the
by a direct integration of the measured reflectivity prop- complex functions + (ω) and − (ω) by this method has
erly extrapolated outside the experimental range. Due to not been demonstrated yet.
the parity relation R(−ω) = R(ω) this formula reduces In this paper we propose a rather simple and fast
to pathway towards a complete broadband magneto-optical
Z ∞ spectroscopy of materials with the MO conductivity de-
ω ln R(x) scribed by Equation (2). It involves the measurement of
θ(ω) = − ℘ dx + π. (5)
π 0 x2 − ω 2 the reflectivity (or transmission) and the Kerr (or Fara-
day) rotation at a normal, or near-normal angle of in-
The knowledge of the phase together with the reflectivity
cidence using two conventional polarizers without the
itself allows, via the Fresnel equations or other boundary-
need to measure other quantities, such as the elliptic-
conditions, the determination of other optical functions,
ity. The treatment of this set of data relies on a general-
including the dielectric function and the optical conduc-
ized magneto-optical KK analysis (MOKKA), which we
tivity.
introduce and mathematically justify in this paper.
In magneto-optics, a complete experiment should al-
To emphasize the basic ideas of the method, we shall
low determination of the real and the imaginary parts
restrict our consideration to materials, where the mag-
for both xx (ω) and xy (ω) or equivalently for both
netic and magneto-electric susceptibility are negligible as
± (ω) = 1+4πiσ± (ω)/ω. Obviously, the number of quan-
compared to the dielectric function, which is valid in a
tities to be measured should be doubled as compared to
vast majority of non-magnetic compounds. In the dis-
the case of B = 0. At a first glance, one should simply
cussion, we shall however speculate on a possible inclu-
work with circular polarized light and apply the zero-field
sion of these electromagnetic terms that play an essential
techniques to each handedness separately. Although con-
role in magnetic materials18 , multiferroics19 and topo-
ceptually appealing, this strategy is difficult to realize in
logical insulators20 . For the sake of simplicity we shall
broadband spectroscopy as it is experimentally challeng-
also assume that the Fresnel equations are satisfied, even
ing to generate circular polarized light in a broad range
though the essential part of MOKKA holds even in the
of frequencies. Standard waveplates, typically made of
non-local limit, where more general electromagnetic re-
quartz, operate at selected wavelengths. There are re-
lations should be used.
ports of multilayer waveplates that cover a continuous
range of frequencies, which is however still somewhat The rest of the paper is organized as follows. Section
limited10,11 . Many waveplates must therefore be com- II is devoted to the generalization of the conventional
bined to cover a reasonably broad spectrum of circular Kramers-Kronig reflectivity formalism to the case, where
polarized light, which is especially hard in the range of the magnetic field is set perpendicular to the sample
the phonon absorption in quartz. An alternative solution surface. In section III, the variational KK-constrained
using elliptically polarized light was also demonstrated12 analysis21 is extended to MO experiments. Section IV
that allows reducing the number of waveplates but sig- describes the experimental technique. Three application
nificantly complicates the analysis. A broadband phase- examples are presented in section V. The results are sum-
shifting element (retarder) using an internal reflection in marized in Section VI.
silicon and other materials was fabricated13,14 . Working
with it is however associated with extra light absorption,
the need of a delicate alignment and the penalty (in the II. DIRECT KRAMERS-KRONIG ANALYSIS
case of Si) of not seeing visible light after the retarder. OF MAGNETO-REFLECTIVITY AND KERR
ROTATION
An alternative broadband solution without generating
circular light is based on polarimetry, where one can mea-
sure the MO rotation and ellipticity, or related quanti- We start by considering the magneto-reflectivity and
ties. A rather sensitive polarimetric method is based on a Kerr rotation spectra of a bulk sample at normal inci-
photoelastic modulation (PEM), where one can measure dence. The complex magneto-reflectivity tensor has the
these quantities using a lock-in demodulation at the main same symmetry as the MO tensor (2):
PEM frequency and at its second harmonic15,16 . How-
ever, in order to achieve an experiment that is complete in rxx (ω) rxy (ω)
r̂(ω) = (6)
the sense indicated above, one has to measure addition- −rxy (ω) rxx (ω)
ally the complex reflectivity or transmission. Further-
more, the calibration procedure for the PEM-based mea- Its eigenvalues are given accordingly by:
surement is quite involved. Another relevant technique is p
a spectroscopic magneto-ellipsometry with an access to r± (ω) = rxx (ω) ± irxy (ω) = R± (ω)eiθ± (ω) . (7)
3
In the local limit they are related to the momentum- The sought phases can now be obtained by applying the
independent dielectric function via the Fresnel equations: KK transformation to R+ (ω) and R− (ω):
p
1 − ± (ω) Z ∞ p
r± (ω) = . (8) 1 ln R± (x)
p θ± (ω) = − ℘ dx + π, (15)
1 + ± (ω) π −∞ x−ω
The magneto-reflectivity R(ω), unlike the zero-field re- which can be reduced, using the parity relation
flectivity, depends on the polarization state of the inci- R± (−ω) = R∓ (ω), to:
dent light even if the sample is optically isotropic. For a
circular polarization, it takes one of the values R± (ω) de- θ± (ω) = θ̃(ω) ∓ θK (ω), (16)
pending on the handedness. For the linear polarization,
which can be represented as the sum of the two oppo- where
sitely handed circular waves with equal amplitudes, it is Z ∞
given by the average value: θ+ (ω) + θ− (ω) ω ln R̃(x)
θ̃(ω) = =− ℘ dx+π (17)
2 π 0 x2 − ω 2
R+ (ω) + R− (ω)
R(ω) = . (9)
2 and
For a general (elliptical) polarization, the reflectivity
p
p 2 c(ω)
is an unequally weighted superposition of R− (ω) and R̃(ω) = R+ (ω)R− (ω) = R(ω). (18)
1 + c(ω)
R+ (ω). Notably, many spectrometers, especially of the
Fourier-transform type, generate light with an ill-defined Equations (13)-(18) constitute a self contained recipe
and frequency-dependent polarization. This imposes to extract the complex MO reflectivity for each hand-
placing an extra polarizing element in a magneto-optical edness and Equation (8) allows computing the complex
experiment in order to have a well determined polariza- dielectric functions ± (ω). An important implication of
tion. Below we shall consider the case where the incident this result is that spectra of R(ω) and θK (ω) measured
light is linearly polarized and use Equation (9). in a broad spectral range and supplemented with proper
It is obvious that the standard KK method based on extrapolations, bear sufficient information for complete
Equation (5) does not apply since the reflectivity phases MO spectroscopy.
θ+ (ω) and θ− (ω) are different. Moreover, it does not use It is worth noting that the described algorithm relies
the essential information coming from the Kerr angle: on the non-trivial assumption that the functions ln r± (ω)
1
r− (ω)
θ− (ω) − θ+ (ω) are analytical, i.e. they do not exhibit poles or other
θK (ω) = arg = . (10) singularities in the upper complex semiplane =ω > 0.
2 r+ (ω) 2 While this holds for normal reflectance from a bulk sam-
Here we prove mathematically that the complex re- ple, the analyticity can break down, for example, for a
flectivities r± (ω) can be model-independently extracted partially transparent sample. In this case, the variational
from R(ω) and θK (ω) if these function are known on the KK constrained analysis21 should instead be applied. In
entire real-frequency axis. We first introduce an auxiliary the next section we describe the application of the varia-
complex function: tion approach to a much broader set of magneto-optical
experiments.
r− (ω) 1
f (ω) = ln = ln c(ω) + 2iθK (ω), (11)
r+ (ω) 2
III. VARIATIONAL KRAMERS-KRONIG
where ANALYSIS OF MAGNETO-OPTICAL SPECTRA
R− (ω)
c(ω) = (12) First we remind the basic idea of the KK constrained
R+ (ω)
variational analysis in zero field21 . The measured spectra
is the circular-dichroism ratio. As the imaginary part such as reflectivity, transmission or any combination of
of f (ω) is the Kerr angle known from experiment, them are initially fitted with a KK consistent and sum-
the circular dichroism can be computed via the KK rule satisfying model dielectric function. Most typically,
transformation26 : this is a sum of a limited number of Drude-Lorentz oscil-
Z ∞ lators:
8ω θK (x)
c(ω) = exp ℘ dx . (13)
π 0 x2 − ω 2
2
X ωp,k
Combining this result with Equation (9) we can extract mod (ω) = ∞ + 2 − ω 2 − iγ ω , (19)
separately the reflectivity for each handedness: ω0,k k
k
the linewidth γk and the plasma frequency ωp,k . The with the following structure:
parameter ∞ is the contribution from the high-energy
N −1 h
optical transitions. Once a reasonable fit is achieved, i
Ai± 4 4∗
X
these parameters are fixed, and a so-called variational var± (ω) = i (ω) + A i∓ i (−ω) (26)
dielectric function (VDF) is added to the model: i=2
to the detector apart from the sample. It may depend on B. Fast protocol
the analyzer angle due to depolarization effects in the de-
tection channel and on the field because of the changes in The measurement scheme described above is rigorous
detector sensitivity and all mechanical movements that but quite slow as it involves measuring the raw intensity
it may induce. spectra at dozens of analyzer angles for the sample and
If we replace the sample by a reference with R = R̃ = 1 the reference. Fortunately, in many situations one can
and θK = 0 then the detector intensity will be given by use an alternative protocol, which requires much fewer
the Malus law: spectra to be measured. This method is accurate if the
rotation angle is small (for example θK < 0.2 rad), so
IA,ref (ω, B) = CA (ω, B) cos2 A. (28) that sin θK ≈ θK and cos θK ≈ 1. Since for small rota-
tions the dichroism is also weak, |c − 1| 1, the ratio
Thus the reference measurement allows us to determine R̃(ω)/R(ω) = 1 + O((c − 1)2 ) and hence we can ignore
CA (ω, B).23 . Since the choice of the best reference proce- the small difference between R(ω) and R̃(ω).
dure is setup- and sample-dependent, we do not discuss The fast method hinges on the fact that the intensity
this issue here24 . is most sensitive to the MO rotation when the polarizers
Below we discuss two measurement protocols, both are oriented at +45◦ or −45◦ with respect to each other
based on Equation (27) but adapted for different experi- and is almost insensitive to it for A = 0, i.e. when they
mental situations. are parallel. Within the approximations made above,
Equation (27) gives the following detector intensity for
these analyzer positions:
1 ± 2θK (ω, B)
A. Complete protocol I±45 (ω, B) ≈ C±45 (ω, B)R(ω, B) , (31)
2
I0 (ω, B) ≈ C0 (ω, B)R(ω, B). (32)
As it is common in polarimetric experiments, the most
rigorous approach involves measuring the raw spectra and for the reference:
IA (ω, B) for a large number of analyzer angles spread C±45 (ω, B)
I±45,ref (ω, B) ≈ , (33)
equidistantly between 0◦ and 360◦ . The same should 2
be done for the reference, in order to obtain the prefac- I0,ref (ω, B) ≈ C0 (ω, B). (34)
tor CA (ω, B) as discussed above. For each frequency and An obvious way to determine the reflectivity is to use
each field value one can fit the function F (A) = IA /CA by the measurement in the parallel polarizer configuration:
the formula α + β cos(2A − 2Am ) with the fitting param-
eters α, β and Am . The reflectivity can be determined I0 (ω, B)
R(ω, B) ≈ , (35)
by the relation R(ω, B) = 2α(ω, B). The parameter Am I0,ref (ω, B)
formally corresponds to the Kerr angle. However, using which has the additional advantage that the optical signal
the relation θK (ω, B) = Am (ω, B) may result in a con- is at maximum.
siderable systematic error due to polarizer imperfections. In order to obtain the magneto-optical rotation, we
This problem is easily removed by subtracting the zero- first we assume that CA (ω, +B) = CA (ω, −B). Then we
field value: θK (ω, B) = Am (ω, B) − Am (ω, 0). have:
Our experience shows that measuring at the two po- I±45 (ω, +B)
larities of the magnetic field improves both the system- ρ±45 (ω, B) = ≈ 1 ± 4θK (ω, B), (36)
I±45 (ω, −B)
atic accuracy and the signal-to-noise ratio. Based on the
parity relations R(ω, −B) = R(ω, B) and θK (ω, −B) = where again we used that θK (ω, −B) = −θK (ω, B). This
−θK (ω, B) the following equations can be derived: suggests that the rotation can be obtained based on the
measurement for only one of the angles +45◦ or −45◦ ,
R(ω, B) = α(ω, B) + α(ω, −B), (29) without reference:
Am (ω, B) − Am (ω, −B) ρ±45 (ω, B) − 1
θK (ω, B) = . (30) θK (ω, B) ≈ ± . (37)
2 4
In this way the rotation can be measured even in exper-
that we actually recommend to use. p imental setups, where in situ rotation of the analyzer is
The value of β/α = R̃(ω)/R(ω) = 2 c(ω)/(1 + c(ω)) not possible as one can simply place the sample between
can in principle be utilized to determine the circular two fixed polarizers mounted at 45◦ with respect to each
dichroism ratio c(ω). However, this only works well if other.
the dicroism, and therefore the ellipticity of the reflected If CA (ω, +B) is not equal to CA (ω, −B) then the pro-
light, is strong enough, which is often not the case25 . cedure should be modified. The most obvious modifica-
Fortunately, the implementation of MOKKA does not tion is to take the same measurement with a reference:
require c(ω) since it is computed via a KK transforma- I±45,ref (ω, +B)
ρ±45,ref (ω, B) = (38)
tion of θK (ω). I±45,ref (ω, −B)
6
1.0
and to use the corrected formula: (a) (b)
0.8 holes
1 ρ±45 (ω, B) 0T z
Re σ (10 Ω cm )
4
-1
Reflectivity
θK (ω, B) ≈ ± −1 . (39) 0.6
4 ρ±45,ref (ω, B)
-1
electrons
3
0.4 2
If the analyzer can be rotated then a more accurate
0.2
result can be obtained by combining measurements at 0T
+45◦ and −45◦ . One can use the formula: 0.0 0
0 200 400 600 0 100 200 300
-1 -1
Wavenumber (cm ) Wavenumber (cm )
ρ+45 (ω, B) − ρ−45 (ω, B)
θK (ω, B) ≈ (40) 1.0
8 (c) (d)
0.10
Re σ+/- (10 Ω cm )
0.8
-1
+
if CA (ω, +B) = CA (ω, −B) or
Reflectivity
-1
0.6
0.05 -
3
1 ρ+45 (ω, B) ρ−45 (ω, B)
θK (ω, B) ≈ − (41) 0.4 2
8 ρ+45,ref (ω, B) ρ−45,ref (ω, B) 0.00
0.2
7T
otherwise. Equations (40) and (41) are less sensitive 0.0 -0.05 0
0 200 400 600 0 100 200 300
to polarizer imperfections than Equations (37) and (39). -1 -1
Wavenumber (cm )
Wavenumber (cm )
Additionally, one can show that Equation (40) provides
a more accurate result than Equation (37) when a weak
FIG. 1. Far-infrared optical and magneto-optical infrared
field asymmetry of CA (ω, B) is present. This allows a spectra of bismuth at 10 K for the polarization perpendicular
reference-free measurement of the MO rotation without to the trigonal (z) axis. Panels (a) and (b) show the zero-
imposing stringent conditions on the stability of the op- field reflectivity and optical conductivity respectively. Panel
tical elements with respect to the field. (c) presents magneto-reflectivity (in blue) and Kerr rotation
(in red) at 7 T. (d) The real (absorptive) part of the optical
conductivity for the two circular polarizations obtained using
V. APPLICATION EXAMPLES MOKKA. The inset of panel (b) depicts the electron and hole
Fermi pockets (adapted From Ref.38 ).
A. Bismuth
Bismuth is a canonical semimetal with a low car- bolometric detector were used. A crystal of 99.9999%
rier density (∼1017 cm−3 ), a long mean-free path and a pure Bi had a surface of 3 × 5 mm2 and a thickness of 1
small cyclotron mass. These properties, combined with mm. Free standing wire-grid gold polarizers were used.
a strong spin-orbit interaction, give rise to spectacular The magnetic field was applied along the trigonal axis
magneto-optical effects27–31 . While some classical phe- and therefore almost parallel to the propagation of light.
nomena, such as quantum oscillations32,33 , were first dis- The noise in the reflectivity spectra was less that 0.5 %.
covered in bismuth, a number of new phenomena were The accuracy of the Kerr angle was better than 1 mrad.
recently found in it and in related compounds, such as a The zero-field reflectivity, shown in Figure 1a, features
transition to a 3D topological insulating state upon Sb a sharp plasma edge at around 150 cm−1 due to highly
substitution34 , a valley-ferromagnetic state36 , a valley- mobile charge carriers and it is in good agreement with
nematic Fermi liquid state37 and avoided Lifshitz-type previous works39,40 . The optical conductivity obtained
semimetal-semiconductor transition35 . Therefore this by the usual KK analysis, is presented in Figure 1b. It
material makes an excellent case for applying MOKKA. has a low-energy Drude peak and a linearly growing con-
Bismuth has a rhombohedral (or trigonal) crystal lat- tribution from low-lying interband transitions.
tice and therefore it is optically anisotropic. However, it The magneto-reflectivity and the Kerr angle spectra at
is optically isotropic within the plane, which is perpen- 7 T are shown in Figure 1c. One can note that the plasma
dicular to the trigonal axis and therefore the described edge is significantly blue-shifted by the field, which is
technique applies when the propagation of light and the a magnetoplasma effect41 . The reflectivity also shows a
magnetic field are along the trigonal axis. Fortunately, strong decrease below 100 cm−1 , which can be attributed
the material cleaves easily (in liquid nitrogen) in the same to the enhancement of the penetration depth and there-
plane, making it possible to prepare a high-quality atom- fore an enhanced optical absorption below the cyclotron
ically flat surface of the needed orientation. frequency. The Kerr rotation has a strong spectral struc-
Infrared magneto-reflectivity and Kerr angle spectra at ture clearly associated with the plasma edge at 200 cm−1
nearly normal incidence (' 8◦ ) were measured between and a weaker feature at 100 cm−1 , close to the frequency
20 and 650 cm−1 with the resolution of 1 cm−1 at 10 below which the reflectivity starts to decrease. Remark-
K in a split-coil superconducting magnet attached to an ably, the Kerr angle is essentially zero above 250 cm−1 .
FTIR spectrometer. Both protocols described in Section Figure 1d presents the optical conductivity σ± (ω) for
IV were used for comparison and they gave almost iden- the left- and right-handed circular polarized light ob-
tical results. A Hg light source and a liquid He cooled tained by the variational magneto-optical KK analysis,
7
1.0
where a Drude-Lorentz model with only a few terms was (a) 20 z (b)
used as a starting point. Applying the direct integration
Re σ (10 Ω cm )
-1
Reflectivity
procedure described in Section II provided essentially the 0T
0.9
-1
same conductivity curves. The most prominent spectral
3
10
structure in both polarizations is a absorption band at
80-110 cm−1 , which consists of several peaks. The spec- 0.8 0T
tral shape of this absorption is quite different for the two 0
light helicities. The Fermi surface in bismuth is highly 0 200 400
-1
600 0 200 400
-1
600
Wavenumber (cm ) Wavenumber (cm )
anisotropic. It features one hole pocket and three elec-
1.0 0.10
tron pockets with a Dirac-like band dispersion as shown (c) 20 (d)
in the inset of Figure 1b. The presence of multiple cy-
Re σ+/- (10 Ω cm )
7T
-1
+ -
-1
0.9
structure. -
3
0.05
10
7T
The physical interpretation of this data is beyond the
scope of this paper and will be presented elsewhere42 . 0.8
T(B)/T(0)
2.5
MOKKA to a combination of magneto-transmission and 1.5 T
0.4
Faraday rotation. Figures 3a and 3b present far-infrared 2.0 1T
spectra of T (B)/T (0) and θF of multilayer graphene 0.75 T
0.2
grown on the C-face of 6H-SiC51 for several fields be- 1.5
0.5 T
tween 0.25 and 4 T at 5 K. The Fabry-Perot oscillations 0.25 T
1.0 0.0
in the substrate were intentionally suppressed by reduc-
ing the spectral resolution to 5 cm−1 . 0.5
0 200 400 600 0 200 400 600
The two-dimensional (sheet) optical conductivities Wavenumber (cm-1)
Wavenumber (cm-1)
σ± (ω) of graphene (Figures 3c and 3d)) were calculated
model-independently using the variational MOKKA in- En 2 En 2
+ 1 (c) - 1 (d)
troduced in section III and the Fresnel formulas for the 300
B 0 300
B 0
case of incoherent internal substrate reflections as de- -1 -1
-2 -2
tailed in Appendix B.
Re σ+ (units of σ0)
Re σ- (units of σ0)
The transmission features several absorption dips
200 200
(marked by arrows for B=0.25 T) corresponding to opti-
cal transitions between Landau levels, in agreement with
52,53
previous measurements
√ . The transition energies are
proportional to B and match almost perfectly the ex- 100 100
pected values in monolayer graphene, where the LL en-
ergies are given by the formula:
0→1 -1→2 -1→0 -2→1
0 0
q 0 200 400 600 0 200 400 600
En = sign(n) 2~evF2 |nB|. (42) Wavenumber (cm-1) Wavenumber (cm-1)
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