Transmission Electron
Microscope
(TEM)
(A presentation under the course of Probes Of Condensed Matter)
Alisha Samal
22PHMP58
What is Electron Microscope?
Light microscopes are limited by the physics of light to 500x or 1000x magnification and a resolution of about 0.2 micrometers.
To see the fine details of the interior structures of organic cells it required 10,000x plus magnification which was not possible using light
microscopes.
An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination. It is a special type of
microscope having a high resolution of images, able to magnify objects in nanometres, which are formed by controlled use of electrons in
a vacuum captured on a phosphorescent screen.
Electron microscopes use signals arising from the interaction of an electron beam with the sample to obtain information about structure, morphology,
and composition.
There are two types of electron microscopes, with different operating styles:
Transmission Electron Microscope (TEM)
Scanning Electron Microscope (SEM)
Transmission Electron Microscope
Transmission electron microscopy (TEM) is a
microscopy technique in which a beam of electrons is
transmitted through a specimen to form an image.
The specimen is most often an ultrathin section less than
100 nm thick or a suspension on a grid.
An image is formed from the interaction of the electrons
with the sample as the beam is transmitted through the
specimen.
The image is then magnified and focused onto an
imaging device, such as a fluorescent screen, a layer of
photographic film, or a detector
TEM(School of chemistry)
TEM is analogous to slide projector
Components of TEM:
Evacuated metal cylinder within which are
aligned, one under another
Electron source
A number of magnetic lenses
A fluorescent screen
Electron Source: Specimen Chamber:
Electron Gun: This is where the electrons are Specimen Holder: A platform where the specimen is
generated. It typically includes a filament that emits mounted for examination.
electrons when heated.
Vacuum System: Maintains a vacuum within the
Cathode: The cathode emits electrons when heated microscope to prevent electron scattering and ensure
by the electron gun. optimal imaging conditions.
Detectors:
Filament: A thin wire within the electron gun that Imaging Detectors: Capture the electron beam
emits electrons when heated. transmitted through the specimen to form an image.
Energy-Dispersive X-ray Spectroscopy (EDS): Detects
Electron Optics: characteristic X-rays emitted by the specimen,
providing information about its elemental composition.
Condenser Lens: Focuses the electron beam onto Electron Energy-Loss Spectroscopy (EELS): Analyzes
the specimen. the energy lost by the electrons as they pass through
the specimen, providing information about its electronic
Objective Lens: Forms the magnified image of the structure.
specimen.
Projector Lens: Further magnifies and projects the
image onto the viewing screen or camera.
Imaging
The image of the specimen is formed selectively, allowing only
the transmitted beam(Bright Field Imaging) or one of the
diffracted beams(Dark Field Imaging) down to the microscope
column by means of an aperture. A) BF image
B) DF image
C) CDF image
BF and corresponding DF image
APPLICATIONS OF TEM
Material Science:
Nanomaterial characterization
Crystallography
Defect analysis
Biology and Medicine:
Ultrastructural analysis of cells and tissues
Virus structure determination
Drug delivery system characterization
Nanotechnology:
Nanoparticle characterization
Nanostructure analysis
Nanofabrication inspection
ADVANTAGES AND LIMITATIONS
Advantages:
High resolution
Detailed structural information
Wide range of applications
Limitations:
Sample preparation challenges
Vacuum requirement
Thank you
