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adapted from the world wide web page at http://www.di.com Digital Instruments, Santa Barbara, CA
Multimode SPM
Used for Contact Mode, Non-contact and TappingMode AFM Laser light from a solid state diode is reflected off the back of the cantilever and collected by a position sensitive detector (PSD). This consists of two closely spaced photodiodes. The output is then collected by a differential amplifier Angular displacement of the cantilever results in one photodiode collecting more light than the other. The resulting output signal is proportional to the deflection of the cantilever. Detects cantilever deflection <1A
Piezoelectric Scanners
SPM scanners are made from a piezoelectric material that expands and contracts proportionally to an applied voltage. Whether they expand or contract depends upon the polarity of the applied voltage. Digital Instruments scanners have AC voltage ranges of +220 to -220V. 0V
+V
-V
No applied voltage
Extended
Contracted
In some versions, the piezo tube moves the sample relative to the tip. In other models, the sample is stationary while the scanner moves the tip. AC signals applied to conductive areas of the tube create piezo movement along the three major axes.
Advantages:
High scan speeds The only mode that can obtain atomic resolution images Rough samples with extreme changes in topography can sometimes be scanned more easily
Disadvantages:
Lateral (shear) forces can distort features in the image The forces normal to the tip-sample interaction can be high in air due to capillary forces from the adsorbed fluid layer on the sample surface. The combination of lateral forces and high normal forces can result in reduced spatial resolution and may damage soft samples (i.e. biological samples, polymers, silicon) due to scraping
The probe is scanned sideways. The degree of torsion of the cantilever is used as a relative measure of surface friction caused by the lateral force exerted on the probe.
Polished polycrystalle silicon carbide film. Grain structures 30 micron scan Magnetic recording head Al oxide grains and contamination 800nm scan
Phase Imaging
Accessible via TappingMode Oscillate the cantilever at its resonant frequency. The amplitude is used as a feedback signal. The phase lag is dependent on several things, including composition, adhesion, friction and viscoelastic properties.
Identify two-phase structure of polymer blends Identify surface contaminants that are not seen in height images Less damaging to soft samples than lateral force microscopy
Phase Imaging
Image/photo taken with NanoScope SPM, courtesy Digital Instruments, Santa Barbara ,CA
LiftMode
Two passes are made over the sample. The first measures topography while the second measures a material property (magnetic, electric, etc.) Eliminates cross-contamination of the images.
Oscillate the cantilever vertically at a rate that is significantly faster than the scan rate. The amplitude of the oscillations changes in response to the sample stiffness. Used in conjunction with LiftMode to separate topography and elasticity data.
Other Techniques
Image/photo taken with NanoScope SPM, courtesy Digital Instruments, Santa Barbara ,CA
Scanning capacitance microscopy Apply a constant amplitude sine wave voltage to the sample. The image is then reconstructed from the changes in the amplitude of the capacitance oscillations. Location of defects in wafers (pinning of electrical carriers) Image carrier concentration Scanning thermal microscopy Uses a temperature sensitive probe with a special holder. Location of hot-spot defects in semiconductor wafers
90 micron scan size
Other Techniques
Nanoindenting and scratching A diamond tip is mounted on a metal cantilever and scanned either with contact or TappingMode. Indenting mode presses the tip into the sample Scratch mode drags the tip across the sample at a specific rate and with a specified force. The use of TappingMode makes it possible to simultaneously image soft samples.