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Topdownandbottomupfabrication
Photolithography
2( NA)
NA=numerical aperture
Electron-beam Lithography
4. Development: resist-covered wafer is placed in contact with developer solution. solution Different dissolution rates of exposed and masked resist regions 5. Hard b k Hardens d l d resist l d bake: d developed layer ~12hr at 150 C h 6. Etching or deposition of material in regions of removed resist. Etching g p g g should remove the underlying layer more quickly than the resist 7. 7 Resist strip: combination of oxygen plasma etching and wet chemicals are used to remove the resist from the wafer
Resist materials
Etching
1. Wet etching: i.e., removal of SiO2 layers using HF/H2O Wet etching tends to be isotropic Some etchants preferentially etch certain crystallographic a p a y a y a g ap planes faster than others 2. 2 Dry etching: Aniosotropic etching (vertical etch) Bombardment by energetic particles from the gas phase
1 m
1 m
1857: Faraday - Reduction of [AuCl4]- with P in carbon disulfide produces a deep red solution
Nature, 1973
20 nm
Reflection 2 nm
Transmission
Lycergus Cup (Roman), 4th century AD: Excitation of metal nanoparticles in goblet makes glass appear red
20 m
J. Muller et al. Nano Letters 5 (2005), K. Becker et al. Nature Materials 5 (2006)
20 nm